An infrared probe structure for a forehead thermometer

Abstract

The present invention relates to the technical field of forehead thermometers, and particularly to an infrared probe structure for a forehead thermometer, which includes an outer housing, a measurement port integrally formed on the outer housing, a refraction sleeve installed on the measurement port, a placement bracket integrally formed on the outer housing on one side of the measurement port, a PCB circuit board installed on the placement bracket, and a measurement probe installed on the PCB circuit board and corresponding to the refraction sleeve; The present invention adopts a simplified structure, which is more convenient in the production and assembly process. At the same time, it has better temperature measurement and stability, and can effectively improve the measurement accuracy. Compared with the traditional multi-component structure, it saves costs and avoids measurement parameter deviations caused by excessive and cumbersome parts.

Description

Technical Field

[0001] The present invention relates to the technical field of forehead thermometers, and particularly to an infrared probe structure for a forehead thermometer. Background Art

[0002] A thermometer gun is a temperature measuring device that uses infrared rays as the emitted light signal to measure temperature without contacting the surface of an object. In the past 20 years, non-contact infrared temperature measurement has developed rapidly in technology, with continuously improved performance, enhanced functions, increased varieties, and expanded application ranges. Compared with the contact temperature measurement method, infrared temperature measurement has the advantages of fast response time, non-contact, safe use, and long service life.

[0003] The existing installation structure of the probe of the thermometer gun is complex, requiring multiple accessories for installation, and the structure is far from the temperature measurement muzzle, making it difficult to master the test accuracy, resulting in problems such as high structural cost and high assembly difficulty that need to be solved. Summary of the Invention

[0004] To solve the above problems, the present invention provides an infrared probe structure for a forehead thermometer that adopts a simplified structure, is more convenient in the production and assembly process, can measure temperature with better stability, and can effectively improve the test accuracy. Compared with the traditional multi-accessory structure, it saves costs and avoids measurement parameter deviations caused by excessive and cumbersome parts.

[0005] The technical solution adopted by the present invention is: an infrared probe structure for a forehead thermometer, including an outer housing, a measurement port integrally formed on the outer housing, a refraction sleeve installed on the measurement port, a placement frame integrally formed on the outer housing on one side of the measurement port, a PCB circuit board installed on the placement frame, and a measurement probe installed on the PCB circuit board and corresponding to the refraction sleeve.

[0006] Further improvement of the above solution is that the measurement port includes an open end and a connection end for fixing the refraction sleeve. The inner diameter of the connection end is provided with a connection groove, and the refraction sleeve is fixedly installed in the connection groove.

[0007] Further improvement of the above solution is that the open end is provided with a flared opening.

[0008] Further improvement of the above solution is that the open end is provided with a plurality of stepped ports that gradually expand from the inside to the outside.

[0009] Further improvement of the above solution is that the refraction sleeve is an optical refraction aluminum sleeve.

[0010] Further improvement of the above solution is that the refraction sleeve includes a refraction groove opened in a flared shape and a probe groove communicating with the refraction groove. The probe groove is used for installing the measurement probe.

[0011] A further improvement to the above solution is that the inner wall surface of the refraction groove is provided as a mirror surface.

[0012] A further improvement to the above solution is that an avoidance groove is provided near the position of the probe groove close to the PCB circuit board.

[0013] A further improvement to the above solution is that the placement rack extends from the outer shell, and it is provided with a mounting table, and the mounting table is provided with a flat surface.

[0014] A further improvement to the above solution is that the PCB circuit board is attached to the mounting table, and the measuring probe is provided as an infrared probe.

[0015] The beneficial effects of the present invention are as follows:

[0016] Compared with the infrared probe structure of traditional forehead thermometers, the present invention adopts a simplified structure, which is more convenient in the production and assembly process. At the same time, it can measure temperature with better stability, and can effectively improve the measurement accuracy. Compared with the traditional multi-component structure, it saves costs and avoids measurement parameter deviations caused by excessive and cumbersome parts. Specifically, an outer shell, a measurement port integrally formed on the outer shell, a refraction sleeve installed on the measurement port, a placement rack integrally formed on the outer shell on one side of the measurement port, a PCB circuit board installed on the placement rack, and a measurement probe installed on the PCB circuit board and corresponding to the refraction sleeve are provided. The measurement port and the placement rack integrally formed by the outer shell can directly install the measurement structure on the shell, with a simple structure and convenient assembly, which is suitable for mass production. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is a three-dimensional structure schematic diagram of the infrared probe structure of the forehead thermometer of the present invention;

[0018] Figure 2 is a schematic diagram of the infrared probe structure of a traditional forehead thermometer;

[0019] Figure 3 is an internal structure schematic diagram of the infrared probe structure of the forehead thermometer of the present invention;

[0020] Figure 4 is an internal structure schematic diagram of the infrared probe structure of the forehead thermometer of the present invention.

[0021] Description of the reference numerals: outer shell 100, measurement port 110, open end 111, connection end 112, connection groove 113, refraction sleeve 120, refraction groove 121, probe groove 122, avoidance groove 123, placement rack 130, mounting table 131, PCB circuit board 140, measurement probe 150. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0022] The present invention will be further described below in conjunction with the accompanying drawings.

[0023] As Figures 1 to 4 shown, an infrared probe structure of a forehead thermometer includes a housing 100, a measurement port 110 integrally formed on the housing 100, a refraction sleeve 120 installed on the measurement port 110, a placement bracket 130 integrally formed on the housing 100 on one side of the measurement port 110, a PCB circuit board 140 installed on the placement bracket 130, and a measurement probe 150 installed on the PCB circuit board 140 and corresponding to the refraction sleeve 120.

[0024] The measurement port 110 includes an open end 111 and a connection end 112 for fixing the refraction sleeve 120. The inner diameter of the connection end 112 is provided with a connection groove 113. The refraction sleeve 120 is fixedly installed in the connection groove 113. Through the open end 111, the measurement probe 150 can conveniently transmit infrared rays for testing. Through the connection end 112, it is used to connect the refraction sleeve 120, with good fixing effect and convenient structure.

[0025] In this embodiment, the open end 111 is arranged in a flared opening. The open end 111 arranged in a flared opening has a reliable structure and is convenient to use.

[0026] In this embodiment, the open end 111 is a plurality of stepped ports that gradually expand from the inside to the outside. The stepped structure has the same function as the flared shape.

[0027] The refraction sleeve 120 is an optical refraction aluminum sleeve. The use of an aluminum sleeve facilitates infrared refraction measurement.

[0028] The refraction sleeve 120 includes a refraction groove 121 opened in a flared shape and a probe groove 122 communicating with the refraction groove 121. The probe groove 122 is used to install the measurement probe 150. Through the refraction groove 121, it is used for infrared refraction. Through the probe groove 122, it is used for the installation of the measurement probe 150. The installation is convenient and the structure is compact.

[0029] The inner wall surface of the refraction groove 121 is a mirror surface. The mirror surface formed by polishing can further improve the use of wide refraction and enhance the measurement effect.

[0030] A clearance groove 123 is opened at a position of the probe groove 122 close to the PCB circuit board 140. The clearance groove 123 can be used for clearance to facilitate the installation and use of the measurement probe 150.

[0031] The mounting bracket 130 extends from the outer housing 100 and is provided with a mounting table 131. The mounting table 131 is provided with a flat surface. Further improved, the PCB circuit board 140 is attached to the mounting table 131. The measuring probe 150 is an infrared probe. Through the mounting table 131, it is used for the installation of the PCB circuit board 140, with convenient installation and reliable structure.

[0032] The present invention adopts a simplified structure, which is more convenient in the production and assembly process. At the same time, it can measure temperature with better stability and effectively improve the accuracy of the test. Compared with the traditional multi-component structure, it saves costs and avoids measurement parameter deviations caused by excessive and cumbersome parts. Specifically, an outer housing 100 is provided, a measuring port 110 integrally formed on the outer housing 100, a refraction sleeve 120 installed on the measuring port 110, a mounting bracket 130 integrally formed on the outer housing 100 on one side of the measuring port 110, a PCB circuit board 140 installed on the mounting bracket 130, and a measuring probe 150 installed on the PCB circuit board 140 and corresponding to the refraction sleeve 120. By using the measuring port 110 and the mounting bracket 130 integrally formed on the outer housing 100, the measuring structure can be directly installed on the housing, with a simple structure and convenient assembly, suitable for mass production.

[0033] The above embodiments only represent several implementation manners of the present invention. The description is relatively specific and detailed, but it cannot be construed as a limitation on the scope of the present invention patent. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can still be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the present invention patent shall be subject to the appended claims.

Claims

1. An infrared probe structure for a forehead thermometer, characterized in that: it includes an outer housing, a measurement port integrally formed on the outer housing, a refraction sleeve installed on the measurement port, a placement bracket integrally formed on the outer housing on one side of the measurement port, a PCB circuit board installed on the placement bracket, and a measurement probe installed on the PCB circuit board and corresponding to the refraction sleeve; the refraction sleeve includes a refraction groove opened in a trumpet shape and a probe groove communicated with the refraction groove, and the probe groove is used for installing the measurement probe; the inner wall surface of the refraction groove is set as a mirror surface; a clearance groove is opened at a position of the probe groove close to the PCB circuit board; the placement bracket extends inwards from the outer housing and is provided with a mounting table, the mounting table is set as a flat surface, and the PCB circuit board is attached to the mounting table.

2. The infrared probe structure for a forehead thermometer according to claim 1, characterized in that: the measurement port includes an open end and a connection end for fixing the refraction sleeve, a connection groove is arranged in the inner diameter of the connection end, and the refraction sleeve is fixedly installed in the connection groove.

3. The infrared probe structure for a forehead thermometer according to claim 2, characterized in that: the open end is arranged with a trumpet-shaped opening.

4. The infrared probe structure for a forehead thermometer according to claim 2, characterized in that: the open end is a plurality of stepped ports that expand in sequence from the inside to the outside.

5. The infrared probe structure for a forehead thermometer according to claim 1, characterized in that: the refraction sleeve is set as an optical refraction aluminum sleeve.

Images