Spliceable detector array, imaging system and imaging method

Abstract

The present invention discloses a spliceable detector array, an imaging system and an imaging method. The detector array includes at least two flat panel detectors. Each flat panel detector includes an upper cover plate, a lower cover plate, an imaging unit and a circuit board disposed between the upper cover plate and the lower cover plate. The circuit board is electrically connected to the imaging unit. The imaging unit is configured to convert a ray signal into a charge signal, and the circuit board converts the charge signal into a digital signal. The first flat panel detector has a first inclined side surface that inclines inward from the upper cover plate to the lower cover plate, and the second flat panel detector has a second inclined side surface that inclines outward from the upper cover plate to the lower cover plate. The imaging unit of the second flat panel detector has a flexible substrate, and its imaging unit extends from the upper cover plate to the second inclined side surface. The two flat panel detectors are spliced face to face, so that the imaging units of the two flat panel detectors are partially arranged one above the other at the splicing position of the two inclined side surfaces. The detector of the present invention enables multiple detectors to work cooperatively and perform seamless splicing imaging.

Description

Technical Field

[0001] The present invention relates to the field of detector imaging, and particularly to a spliceable detector array, an imaging system, and an imaging method. Background Art

[0002] Digital flat panel detectors are key components in digital X-ray imaging systems. In a digital X-ray imaging system, the flat panel detector converts X-rays carrying information into digital signals that can be detected and expressed.

[0003] Most of the current digital X-ray flat panel detectors on the market are independent individuals. Except for data transmission and sharing between detectors, there are no other collaborative working functions. By collaborative working, it means that without changing the original interface and synchronization mechanism, several detectors are spliced and work together, and it seems to the application side that they are operating a detector with a larger imaging area.

[0004] In order to obtain a larger imaging area, in the prior art, a flat panel detector is usually used to change positions for multiple exposures, and it is impossible to perform one-time exposure imaging. Summary of the Invention

[0005] In order to overcome the deficiencies of the prior art, the present invention provides a spliceable detector array, an imaging system, and an imaging method. The specific technical solutions are as follows:

[0006] On the one hand, a spliceable detector array is disclosed, which at least includes a first flat panel detector and a second flat panel detector. Both the first flat panel detector and the second flat panel detector include an upper cover plate, a lower cover plate, an imaging part, and a circuit board disposed between the upper cover plate and the lower cover plate. The circuit board is electrically connected to the imaging part. The imaging part is used to convert ray signals into charge signals, and the circuit board converts the charge signals into digital signals;

[0007] The first flat panel detector has a first inclined side surface that inclines inward from the upper cover plate to the lower cover plate, and the second flat panel detector has a second inclined side surface that inclines outward from the upper cover plate to the lower cover plate. The imaging part of the second flat panel detector is disposed in the area opposite to the upper cover plate and the area opposite to the second inclined side surface;

[0008] The first inclined side surface of the first flat panel detector is spliced with the second inclined side surface of the second flat panel detector, so that the imaging parts of the first flat panel detector and the second flat panel detector are partially arranged one above the other at the splicing position.

[0009] Further, each flat panel detector in the array has at least one first inclined side surface that inclines inward from the upper cover plate to the lower cover plate and at least one second inclined side surface that inclines outward from the upper cover plate to the lower cover plate.

[0010] Further, the inclination angles of the first inclined side surface and the second inclined side surface on the same flat panel detector are supplementary angles to each other, and / or the inclination angles of the first inclined side surface of the first flat panel detector and the second inclined side surface of the second flat panel detector are supplementary angles to each other.

[0011] Further, the upper cover plate and the lower cover plate of the flat panel detector are both N-sided polygons, and the flat panel detector further includes n1 first inclined side surfaces and n2 second inclined side surfaces, where n1 and / or n2 are positive integers, N is a positive integer greater than or equal to 3, and the sum of n1 and n2 is less than or equal to N.

[0012] Further, contacts and / or sensors for communicating with adjacent flat panel detectors are provided on the first inclined side surface and / or the second inclined side surface of each flat panel detector in the array.

[0013] Further, the upper cover plate of each flat panel detector in the array is made of a material that allows rays to penetrate.

[0014] On the other hand, a detector array for three-dimensional imaging is disclosed, including a plurality of vertically arranged flat panel detectors, and an optical machine for emitting rays can be arranged between adjacent flat panel detectors, so that after each optical machine emits a beam, an image is formed on the corresponding flat panel detector on the opposite side.

[0015] On the other hand, an imaging system is disclosed, including a ray source, an imaging display unit, and the spliceable detector array as described above. The rays emitted by the ray source are directed towards the upper cover plates of the flat panel detectors in the array, and the imaging display unit is electrically connected to the circuit boards of all or part of the flat panel detectors, and each flat panel detector operates synchronously according to a timing sequence.

[0016] On yet another aspect, an imaging method based on the spliceable detector array as described above is disclosed, including the following steps:

[0017] S1. Splice the first flat panel detector and the second flat panel detector in the detector array forward, turn on the ray source, and the ray source is directed towards the upper cover plates of the two flat panel detectors;

[0018] S2. Obtain first image information using the first flat panel detector, and obtain second image information using the second flat panel detector;

[0019] S3. Perform image feature matching on the first image information and the second image information to obtain a first feature matching region;

[0020] S4. Stitch the remaining part of the first image information after removing the first feature matching region with the second image information, or stitch the remaining part of the second image information after removing the first feature matching region with the first image information to obtain a first stitched image.

[0021] Further, after obtaining the first stitched image in step S4, the following steps are further included:

[0022] S5. Use the third flat panel detector in the detector array to obtain third image information, where the third flat panel detector is stitched forward with the second flat panel detector;

[0023] S6. Perform image feature matching on the third image information and the first stitched image information to obtain a second feature matching region;

[0024] S7. Stitch the remaining part of the first stitched image information after removing the second feature matching region with the third image information, or stitch the remaining part of the third image information after removing the second feature matching region with the first stitched image information to obtain a second stitched image.

[0025] Further, step S3 includes: Extract feature points from the first image and the second image using the SIFT algorithm, describe the feature points using feature vectors, and then calculate the distance between the feature vectors to achieve feature matching. The distance between the feature vectors is the Euclidean distance, Hamming distance, or cosine distance.

[0026] The beneficial effects brought by the technical solution of the present invention include:

[0027] (a) The entire detector array can be operated and imaged as a single detector. Several flat panel detectors work together, and it seems like operating a detector with a larger imaging area at the application end;

[0028] (b) The appropriate detector stitching method can be flexibly selected according to the application scenario, enhancing the system adaptability. The stitched detector array can increase the imaging area;

[0029] (c) The imaging regions of the stitched flat panel detectors have overlapping projections at the stitching location, and seamless stitching can be achieved through image processing. Description of the Drawings

[0030] To more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the drawings required for the description of the embodiments. Obviously, the following drawings are only some embodiments of the present invention. For those of ordinary skill in the art, other drawings can be obtained based on these drawings without creative efforts.

[0031] Figure 1 It is a partial enlarged schematic diagram of the spliceable detector array provided by an embodiment of the present invention;

[0032] Figure 2 It is a schematic diagram of the single structure of the flat panel detector provided by an embodiment of the present invention;

[0033] Figure 3 It is a schematic diagram of the splicing state of three forward-spliced flat panel detectors provided by an embodiment of the present invention;

[0034] Figure 4 It is a splicing schematic diagram of the detector array for three-dimensional imaging provided by an embodiment of the present invention.

[0035] Among them, the reference numerals include: 1 - upper cover plate, 2 - imaging part, 3 - circuit board, 4 - support frame, 5 - lower cover plate, 6 - flat panel detector, 61 - first flat panel detector, 611 - first inclined side, 62 - second flat panel detector, 621 - second inclined side. Detailed implementation manners

[0036] In order to enable those skilled in the art to better understand the solution of the present invention, and to more clearly understand the purpose, technical solution and its advantages of the present invention, the technical solutions in the embodiments of the present invention are clearly and completely described below in conjunction with specific embodiments and with reference to the accompanying drawings. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention. In addition, the terms "including" and "having" and any variations thereof in the description and claims of the present invention are intended to cover non-exclusive inclusion. For example, a process, method, apparatus, product or device including a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but may include other steps or units not clearly listed or inherent to these processes, methods, products or devices.

[0037] In an embodiment of the present invention, a spliceable detector array is provided. Refer to Figure 1, the detector array includes at least a first flat panel detector 61 and a second flat panel detector 62. Both the first flat panel detector 61 and the second flat panel detector 62 include an upper cover plate 1, a lower cover plate 5, an imaging part 2, a support frame 4, and a circuit board 3 disposed between the upper cover plate 1 and the lower cover plate 5. The upper cover plate 1 of each flat panel detector 6 in the array is made of a material that can penetrate rays. Taking X-rays as an example, in this embodiment, the upper cover plate 1 is made of an X-ray highly transparent material (this is prior art); the support frame 4 is used to support the imaging part 2, the circuit board 3 is optionally mounted on the support frame 4, and the support frame 4 is fixed to the inner wall of the detector by means of snap connection, bonding, or locking parts (such as screws, bolts, or nuts), or the support frame 4 can be integrally formed with the inner wall of the detector; the specific position of the circuit board 3 mounted on the support frame 4 is not limited. The circuit board 3 is electrically connected to the imaging part 2. The imaging part 2 is used to convert ray signals into charge signals, and the circuit board 3 converts the charge signals into digital signals. The technologies for realizing the above conversion of ray signals into charge signals include, but are not limited to, amorphous silicon indirect conversion technology or amorphous selenium direct conversion technology;

[0038] The first flat panel detector 61 has a first inclined side surface 611 that inclines inward from the upper cover plate 1 of the first flat panel detector 61 towards the lower cover plate 5. The second flat panel detector 62 has a second inclined side surface 621 that inclines outward from the upper cover plate 1 of the second flat panel detector 62 towards the lower cover plate 5. In this embodiment, the inclination angles of the first inclined side surface 611 of the first flat panel detector 61 and the second inclined side surface 621 of the second flat panel detector 62 are complementary angles; the imaging part 2 of the second flat panel detector 62 has a flexible substrate. Since the imaging part 2 is a flexible structure, the imaging part 2 of the second flat panel detector 62 can extend from the upper cover plate 1 to the second inclined side surface 621, so that imaging can be performed on both the horizontal plane and the inclined plane. Obviously, at least the first inclined side surface 611 and the second inclined side surface 621 of the second flat panel detector 62 are also made of a material that can penetrate rays; it should be noted that the above imaging part 2 being a flexible structure is only a preferred embodiment. In an embodiment of the present invention, the imaging part 2 of the second flat panel detector 62 may include a first part disposed opposite to its upper cover plate 1 and a second part disposed opposite to the second inclined side surface 621. The technical solution of splicing these two parts of the above imaging part 2 can be used as an alternative to the flexible structure imaging part 2. Whether the imaging part 2 of the detector is a flexible structure or not, the present invention claims protection.

[0039] The first inclined side surface 611 of the first flat panel detector 61 is spliced with the second inclined side surface 621 of the second flat panel detector 62, so that the imaging parts 2 of the first flat panel detector 61 and the second flat panel detector 62 are arranged partially one above the other at the splicing position. "Partially one above the other" should be understood as that the projections of the imaging parts 2 of the first flat panel detector 61 and the second flat panel detector 62 on the lower cover plate 5 at the splicing position have an overlapping part, so as to realize seamless splicing of subsequent image splicing. At the same time, as a pre-compensation mechanism, the thickness of the X-ray photon absorption material (such as the scintillator that converts X-rays into visible light in the amorphous silicon indirect conversion technology) of the imaging part 2 can be adjusted at the main plane and extending to the inclined plane, so that the sensitivities of the main plane and the inclined plane are basically the same, and the uniformity of the images obtained on the above-mentioned main plane and inclined plane is improved. The specific thickness adjustment data can be obtained through experiments.

[0040] Figure 2 For one of the flat panel detectors 6 in the detector array, in an embodiment of the present invention, each flat panel detector 6 in the array has at least one first inclined side surface 611 that inclines inward from the upper cover plate 1 to the lower cover plate 5 and at least one second inclined side surface 621 that inclines outward from the upper cover plate 1 to the lower cover plate 5. The inclination angles of the first inclined side surface 611 and the second inclined side surface 621 on the same flat panel detector 6 are set to be complementary angles, and can be arranged on the opposite sides as shown in Figure 2 One of the forward splicing methods of multiple flat panel detectors 6 is as shown in Figure 3 shown. In addition, it can also be set that both the upper cover plate and the lower cover plate of the flat panel detector are N-sided polygons. The flat panel detector further includes n1 (an integer) first inclined side surfaces and n2 (an integer) second inclined side surfaces, where n1 and / or n2 are positive integers, that is, n1 and n2 cannot be zero at the same time. For example, one flat panel detector 6 only has a first inclined side surface, and another flat panel detector 6 only has a second inclined side surface, then these two flat panel detectors 6 can be spliced. Obviously, n1 and n2 can both be non-zero; N is a positive integer greater than or equal to 3, and the sum of n1 and n2 is less than or equal to N, that is, the present invention does not limit that each surface is an inclined side surface. Among them, n1 can be equal to n2 or not equal. The first inclined side surface 611 and the second inclined side surface 621 on the same detector can be arranged on adjacent sides or non-adjacent sides (not shown). The present invention also does not limit that different flat panel detectors in the array have the same shape and size. For example, a detector array can be obtained by splicing a regular octagon and a square (not shown).

[0041] It should be noted that the present invention does not limit the inclination angles of the first inclined side surface 611 and the second inclined side surface 621 (i.e., the angles between the inclined side surfaces and the horizontal plane) to be supplementary angles. On the premise that the part of the imaging unit 2 of the second flat panel detector 62 extending to the second inclined side surface 621 can partially overlap with the projection of the imaging unit 2 of the first flat panel detector 61 in projection, even if the inclination angles of the first inclined side surface 611 and the second inclined side surface 621 (i.e., the angles between the inclined side surfaces and the horizontal plane) are not complementary, such a structure should be considered to fall within the protection scope required by the present invention as well.

[0042] In an embodiment of the present invention, a detector array for three-dimensional imaging is provided, which is used in a static CT application scenario, such as Figure 4 As shown, the detector array includes a plurality of vertically arranged flat panel detectors 6, and an optical machine for emitting rays can be arranged between adjacent flat panel detectors 6, so that after the beam of each optical machine is emitted, it forms an image on the corresponding flat panel detector 6 on the opposite side.

[0043] Specifically, five flat panel detectors 6 can be arranged in a circle, the first inclined side surface 611 on any one flat panel detector 6 is spliced with the second inclined side surface 621 on the adjacent flat panel detector 6, and the second inclined side surface 621 on any one flat panel detector 6 is spliced with the first inclined side surface 611 on the adjacent flat panel detector 6. As Figure 4 shown, they are sequentially numbered ①-⑤. The object to be imaged is placed in the middle area. A light machine (not shown) is provided between each adjacent two flat panel detectors 6. After the light machine between the ①st and ②nd detectors emits a beam, it forms an image on the ④th detector. After the light machine between the ②nd and ③rd detectors emits a beam, it forms an image on the ⑤th detector. After the light machine between the ③rd and ④th detectors emits a beam, it forms an image on the ①st detector. After the light machine between the ④th and ⑤th detectors emits a beam, it forms an image on the ②nd detector. After the light machine between the ⑤th and ①st detectors emits a beam, it forms an image on the ③rd detector. If all the X-ray machines emit light simultaneously, all the detectors in the three-dimensional array work together, that is, synchronously acquire images. Finally, the images on the five detectors can be used for three-dimensional reconstruction. Obviously, the present invention does not limit the specific number of detectors in the three-dimensional detector array. If the X-ray machine is in the ping-pong mode, that is, only one X-ray machine can emit light at a certain moment, and then the X-ray machines emit light in sequence, and the detector opposite the emitting X-ray machine must acquire images. In this case, other detectors do not necessarily have to work together. Even if they work together and synchronously acquire images, they only collect scattered rays.

[0044] In an embodiment of the present invention, an imaging system is provided, which includes a radiation source, an imaging display unit, and the spliceable detector array as described above. The radiation emitted by the radiation source is directed towards the upper cover plate 1 of the flat panel detector 6 in the array, and the imaging display unit is electrically connected to the circuit boards 3 of all or part of the flat panel detectors 6. Specifically, in this embodiment, a contact and / or a sensor for communicating with an adjacent flat panel detector 6 are provided on the first inclined side surface 611 and / or the second inclined side surface 621 of each flat panel detector 6 in the array, so that each flat panel detector 6 operates synchronously according to a timing sequence. Among them, the functions of the physical contact and / or the sensor include at least the following two aspects:

[0045] First, the positional relationship between the spliced flat panel detectors 6 can be determined to determine the splicing method of their respective imaging (the images collected by each of the flat panel detectors 6 can be spliced accordingly according to the relative positions of the flat panel detectors 6).

[0046] Second, the coordinated operation of all the flat panel detectors 6 in the sensor array is realized, that is, each of the flat panel detectors in the detector array operates synchronously according to a time sequence (referred to as a timing sequence), ensuring the synchronous timing of each subsequent spliced imaging and improving the imaging accuracy after splicing.

[0047] Based on the above imaging principle, the imaging unit 2 outputs a charge signal converted from visible light. After the charge signal is converted into a digital signal by the circuit board 3, it is displayed by the imaging display unit. A central timing control unit can be set. Under the control of the central timing control unit, each of the flat panel detectors in the detector array operates synchronously according to a time sequence (referred to as a timing sequence). Correspondingly, the images collected by each flat panel detector can be marked with a timing sequence by the circuit board. Specifically, the timing sequence of the flat panel detectors in the detector array can interact with the external timing through the central timing control unit and a so-called single interface. In the case of the coordinated operation of multiple flat panel detectors, the imaging display unit can be electrically connected only to the circuit board 3 of one flat panel detector 6 (which becomes the main detector) (the other flat panel detectors 6 become slave detectors and communicate with this main detector). Obviously, it can also be electrically connected to the circuit boards 3 of multiple or even all flat panel detectors 6.

[0048] The characteristics and splicing methods of the detectors in the detector array are as described in the above embodiments. By reference, the structural characteristics and array splicing methods of the detector array in the above embodiments are incorporated into this embodiment of the imaging system, and will not be described in detail again.

[0049] It should be noted that the above-mentioned electrical connections should be considered to include both wired electrical connection methods and wireless electrical connection methods.

[0050] In an embodiment of the present invention, an imaging method based on the spliceable detector array as described above is provided, including the following steps:

[0051] S1. Splice the first flat panel detector and the second flat panel detector in the forward direction in the detector array (for the specific structure and splicing method of the detector, refer to the above embodiment and will not be elaborated here), and turn on the radiation source, and the radiation source irradiates the upper covers of the two flat panel detectors.

[0052] S2. Obtain first image information by using the first flat panel detector, and obtain second image information by using the second flat panel detector.

[0053] S3. Perform image feature matching on the first image information and the second image information to obtain a first feature matching region.

[0054] Specifically, in the case where the first flat panel detector and the second flat panel detector communicate through side physical contacts or sensors, the positional relationship of the left-right splicing of the first flat panel detector and the second flat panel detector can be known. Correspondingly, the first image information and the second image information are also spliced according to the left-right splicing positional relationship. Since the imaging regions of the respective imaging parts 2 of the first flat panel detector and the second flat panel detector overlap in projection (refer to the above specifically), therefore, the first image information and the second image information obtained by imaging have the same image features at the splicing position. The region of the same image features should be strip-shaped parallel to the inclined side of the detector, and the strip width depends on the width of the overlapping region in projection. Image feature matching can adopt conventional image recognition algorithms in the prior art. For example, key points (or feature points, corner points) are extracted from the image by using the SIFT (Scale Invariance Feature Transform) algorithm, the feature points are described by using mathematical vectors, and then the distance between the feature vectors (such as Euclidean distance, Hamming distance, cosine distance) is calculated to achieve feature matching. The present invention does not specifically limit the specific algorithm of image feature matching to the SIFT algorithm. Other well-known algorithms such as ORB (Oriented Fast and Rotated Brief) algorithm, method based on gray level matching, etc.

[0055] S4. Splice the remaining part of the first image information after removing the first feature matching region and the second image information, or splice the remaining part of the second image information after removing the first feature matching region and the first image information to obtain a first spliced image.

[0056] Since directly splicing the first image information and the second image information will result in duplicate imaging at the splicing location (i.e., the image of the first feature matching region that exists in both the first image information and the second image information), the purpose of the above two splicing methods is to remove the redundant copy of the image information from the simply directly spliced images, that is, the image information of the first feature matching region.

[0057] The above is the image imaging method corresponding to the splicing of two detector panels. For the detector array formed by splicing three detector panels, after obtaining the first spliced image information according to S4, the following steps can be carried out:

[0058] S5. Use the third flat panel detector in the detector array to obtain the third image information, where the third flat panel detector is spliced forward with the second flat panel detector;

[0059] S6. Perform image feature matching on the third image information and the first spliced image information to obtain the second feature matching region;

[0060] S7. Splice the remaining part of the first spliced image information after removing the second feature matching region with the third image information, or splice the remaining part of the third image information after removing the second feature matching region with the first spliced image information to obtain the second spliced image. The specific method for obtaining the second spliced image information is the same as that of S4.

[0061] For the detector array formed by splicing four or more detector panels, similarly, repeatedly perform the feature matching (see S3) between the already spliced images and the imaging of the unspliced detectors and the de-duplication splicing (see S4). Obviously, the timing synchronization of each detector in the detector array is necessary, especially when the object to be imaged is a non-static object, it is necessary to ensure that the local images formed by each detector are formed at the same time.

[0062] The above are only the preferred embodiments of the present invention and are not intended to limit the present invention. Any modifications, equivalent replacements, improvements, etc. made within the spirit and principle of the present invention shall be included in the protection scope of the present invention.

Claims

1. A spliceable detector array, characterized in that, it includes at least a first flat panel detector (61) and a second flat panel detector (62). Both the first flat panel detector (61) and the second flat panel detector (62) include an upper cover plate (1), a lower cover plate (5), an imaging part (2) and a circuit board (3) arranged between the upper cover plate (1) and the lower cover plate (5). The circuit board (3) is electrically connected to the imaging part (2). The imaging part (2) is used to convert ray signals into charge signals, and the circuit board (3) converts the charge signals into digital signals; the first flat panel detector (61) has a first inclined side surface (611) that inclines inward from the upper cover plate (1) to the lower cover plate (5). The second flat panel detector (62) has a second inclined side surface (621) that inclines outward from the upper cover plate (1) to the lower cover plate (5). The imaging part (2) of the second flat panel detector (62) is arranged in the area opposite to the upper cover plate (1) and the area opposite to the second inclined side surface (621); the first inclined side surface (611) of the first flat panel detector (61) is spliced with the second inclined side surface (621) of the second flat panel detector (62), so that the imaging parts (2) of the first flat panel detector (61) and the second flat panel detector (62) are arranged partially one above the other at the splicing position; the imaging part (2) is a flexible structure, or the imaging part (2) is a non-flexible structure and the imaging part (2) includes a first part arranged opposite to its upper cover plate (1) and a second part arranged opposite to the second inclined side surface (621).

2. The spliceable detector array according to claim 1, characterized in that, each flat panel detector (6) in the array has at least one first inclined side surface (611) that inclines inward from the upper cover plate (1) to the lower cover plate (5) and at least one second inclined side surface (621) that inclines outward from the upper cover plate (1) to the lower cover plate (5).

3. The spliceable detector array according to claim 2, characterized in that, the inclination angles of the first inclined side surface (611) and the second inclined side surface (621) on the same flat panel detector (6) are complementary angles to each other, and / or the inclination angles of the first inclined side surface (611) of the first flat panel detector (61) and the second inclined side surface (621) of the second flat panel detector (62) are complementary angles to each other.

4. The spliceable detector array according to claim 2, characterized in that, the upper cover plate (1) and the lower cover plate (5) of the flat panel detector (6) are both N-sided polygons. The flat panel detector (6) further includes n1 first inclined side surfaces (611) and n2 second inclined side surfaces (621), where n1 and / or n2 are positive integers, N is a positive integer greater than or equal to 3, and the sum of n1 and n2 is less than or equal to N.

5. The spliceable detector array according to claim 1, characterized in that, On the first inclined side surface (611) and / or the second inclined side surface (621) of each flat panel detector (6) in the array, there are provided contacts and / or sensors for communicating with adjacent flat panel detectors (6).

6. A detector array for three-dimensional imaging, characterized in that it includes a plurality of vertically arranged flat panel detectors (6), and between adjacent flat panel detectors (6), an optical machine for emitting rays can be arranged, so that after the beam of each optical machine is emitted, it forms an image on the corresponding flat panel detector (6) opposite; One of two adjacent flat panel detectors (6) is the first flat panel detector (61) in the spliceable detector array as described in any one of claims 1-5, and the other of the two adjacent flat panel detectors (6) is the second flat panel detector (62) in the spliceable detector array as described in any one of claims 1-5.

7. An imaging system, characterized in that it includes a ray source, an imaging display unit and the detector array as described in any one of claims 1-6. The rays emitted by the ray source are directed towards the upper cover plate (1) of the flat panel detector (6) in the array, the imaging display unit is electrically connected to the circuit boards (3) of all or part of the flat panel detectors (6), and each flat panel detector (6) operates synchronously according to a timing sequence.

8. An imaging method based on the spliceable detector array as described in claim 1, characterized in that it includes the following steps: S1. Splice the first flat panel detector and the second flat panel detector in the detector array forward, and turn on the ray source, and the ray source is directed towards the upper cover plates of the two flat panel detectors; S2. Use the first flat panel detector to obtain first image information, and use the second flat panel detector to obtain second image information; S3. Perform image feature matching on the first image information and the second image information to obtain a first feature matching area; S4. Splice the remaining part of the first image information after removing the first feature matching area with the second image information, or splice the remaining part of the second image information after removing the first feature matching area with the first image information to obtain a first spliced image.

9. The imaging method according to claim 8, characterized in that after obtaining the first spliced image in step S4, it further includes the following steps: S5. Use the third flat panel detector in the detector array to obtain third image information, wherein the third flat panel detector is spliced forward with the second flat panel detector; S6. Perform image feature matching on the third image information and the first spliced image information to obtain a second feature matching area; S7. Splice the remaining part of the first spliced image information after removing the second feature matching area with the third image information, or splice the remaining part of the third image information after removing the second feature matching area with the first spliced image information to obtain a second spliced image.

10. The imaging method according to claim 8, characterized in that Step S3 includes: extracting feature points from the first image and the second image by using the SIFT algorithm, describing the feature points by using feature vectors, and then calculating the distance between the feature vectors to achieve feature matching, where the distance between the feature vectors is Euclidean distance, Hamming distance or cosine distance.

Images