Object inspection device and object inspection method using the same

Abstract

According to a disclosed embodiment, an object inspection apparatus includes: a first flipping device that rotates a first object; a second flipping device that rotates a second object; and an imaging device that is configured to move from a position corresponding to one of the first flipping device and the second flipping device to a position corresponding to the other, and inspects an object surface of the first object and the second object. The first flipping device and the second flipping device each include at least one flipping unit.

Description

Technical Field

[0001] The present disclosure relates to a flipping device for grasping and rotating an object and a method for inspecting the object using the flipping device. Background Art

[0002] When manufacturing various items and distributing them directly or assembling them with other items, inspecting the manufactured or assembled state of the items (objects) is a necessary process to improve product reliability. While inspections have traditionally been performed visually, recent developments have enabled the use of inspection equipment to increase precision and speed.

[0003] With the introduction of process automation, this type of inspection process has adopted an automated method for transporting inspection objects. The most common method is to use a conveyor belt to transport items. When automatically transported items are inspected by inspection equipment, after inspecting the top side of the item, the top and bottom sides of the item must be reversed to inspect the bottom side. This is usually done manually or with a separate inverting device (flipping device). Summary of the Invention

[0004] In the past, in order to inspect the top and sides of an object while it was being transported on a transport track, a camera was required on each of the top and sides of the object. However, since camera equipment is very expensive, the cost of the inspection device is quite high. The embodiments of the present disclosure solve the above-mentioned problems of the prior art.

[0005] Conventionally, when an imaging device inspects the surface of an object while the object is rotating, loss time occurs during which the imaging device cannot inspect the object, delaying the inspection of the object.

[0006] One aspect of the present disclosure provides an embodiment of an object inspection device. According to a representative embodiment, the object inspection device includes: a first flipping device, the first flipping device is configured to grasp a first object and rotate the first object; a second flipping device, the second flipping device is configured to grasp a second object and rotate the second object; and a camera device, the camera device is configured to move from a position corresponding to one of the first flipping device and the second flipping device to a position corresponding to the other, and inspect the object surfaces of the first object and the second object facing the +Z axis direction. The first flipping device and the second flipping device each include at least one flipping unit, and the at least one flipping unit is configured to grasp the object along a predetermined axial direction and rotate the object around the predetermined axis.

[0007] Another aspect of the present disclosure provides an embodiment of a method for inspecting an object. According to a representative embodiment, the method for inspecting an object utilizes a first flipping device, a second flipping device, and a camera device. The first flipping device grasps a first object and rotates the first object, the second flipping device grasps the two objects and rotates the second object, and the camera device inspects the object surfaces of the first object and the second object facing the +Z axis. The method for inspecting an object includes: a first object inspection step in which the first flipping device rotates the first object and the camera device inspects the object surface of the first object; and a second object inspection step in which, during the first object inspection step, the second flipping device rotates the second object and the camera device inspects the object surface of the second object. During the first object inspection step and the second object inspection step, the camera device moves from a position corresponding to one of the first flipping device and the second flipping device to a position corresponding to the other at least once.

[0008] According to one embodiment of the present disclosure, a surface of an object at multiple angles can be inspected by using a single imaging device.

[0009] According to the embodiment of the present disclosure, one imaging device alternately inspects an object, thereby reducing loss time when the imaging device cannot inspect the object due to rotation of the object.

[0010] According to the embodiments of the present disclosure, two objects can be inspected at the same time while efficiently utilizing space, and the inspection time required for each object can be shortened. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 FIG. 1 is a perspective view of an object inspection apparatus 1 according to an embodiment of the present disclosure.

[0012] Figure 2 As Figure 1 1 is a plan view of the object inspection device 1 , in which the imaging device 30 and parts 44 , 46 , and 47 of the imaging device frame are omitted.

[0013] Figure 3a is based on Figure 1 A perspective view of a flip device 10 according to an embodiment of the present invention.

[0014] Figure 3b is a perspective view of a turning device 10 ′ according to another embodiment.

[0015] Figure 4 and Figure 5 yes Figure 3aA three-dimensional diagram of the Y-axis flip unit 100, the transfer unit 200 and the driving parts 160, 170, 180, 260, 270, and 380.

[0016] Figure 6 yes Figure 3a A three-dimensional view of the X-axis flip unit 300 and the driving parts 360 and 370.

[0017] Figure 7 and Figure 8 yes Figure 3a A three-dimensional view of the Z-axis lifting unit 500 and the Z-axis lifting drive unit 560.

[0018] Figures 9 to 16 As three-dimensional views sequentially showing the operation process of the flip device 10 according to one embodiment, for the convenience of explanation, the X-axis flip unit 300 and the Z-axis lifting unit 500 are omitted in some figures.

[0019] Figure 17a Observed along the X-axis Figure 12 10 is a vertical elevation view of the flip device 10 in the state.

[0020] Figure 17b Observed along the X-axis Figure 14 10 is a vertical elevation view of the flip device 10 in the state.

[0021] Figure 17c Observed along the X-axis Figure 15a An elevation view of the flip device 10 in the state of FIG.

[0022] Figures 18 to 26 As the sequential display flip device 10 Figure 16 The three-dimensional diagram of the operation process according to one embodiment is shown after the state. For the convenience of explanation, the Y-axis flip unit 100 and the Z-axis lifting unit 500 are omitted in some figures.

[0023] Figure 27a FIG. 1 is a flowchart of a method S1 for inspecting an object according to an embodiment.

[0024] Figure 27b FIG. 1 is a flowchart of a method S1 ′ for inspecting an object according to another embodiment.

[0025] Figure 28 FIG. 1 is a flowchart of a method S0 for inspecting an object according to an embodiment of the present disclosure.

[0026] Figure 29 FIG. 4 is a flowchart of an object inspection method S0 ′ according to another embodiment of the present disclosure. DETAILED DESCRIPTION

[0027] The embodiments of the present disclosure are provided for the purpose of illustrating the technical concept of the present disclosure. The scope of rights according to the present disclosure is not limited to the following embodiments or the specific description of these embodiments.

[0028] Unless otherwise defined, all technical and scientific terms used in this disclosure have the meanings commonly understood by those skilled in the art to which this disclosure belongs. All terms used in this disclosure are selected for the purpose of more clearly describing this disclosure and are not selected to limit the scope of rights according to this disclosure.

[0029] Expressions such as “including,” “having,” and “having” used in the present disclosure should be understood as open-ended terms that have the possibility of including other embodiments, unless otherwise mentioned in a sentence or article containing the corresponding expression.

[0030] Unless otherwise mentioned, singular expressions described in the present disclosure may include plural expressions, and the same applies to singular expressions described in the claims.

[0031] The expressions “first”, “second”, etc. used in this disclosure are used to distinguish multiple components from each other, and do not limit the order or importance of the corresponding components.

[0032] In the present disclosure, when it is mentioned that a certain component is "connected to" or "accessed to" other components, it should be understood that the certain component can be directly connected to or accessed to the other components, or can be connected or accessed through new other components.

[0033] In order to illustrate the present disclosure with reference to the accompanying drawings, the spatial rectangular coordinate system based on the mutually perpendicular X-axis, Y-axis and Z-axis is used as a reference for description. That is, the various configurations of the embodiments can be described on the XYZ rectangular coordinate system. The directions of each axis (X-axis direction, Y-axis direction, Z-axis direction) mean the directions on both sides of the axis extension. Adding a "+" sign before each axis direction (+X-axis direction, +Y-axis direction, +Z-axis direction) means the positive direction, that is, one of the directions on both sides of the axis extension. Adding a "-" sign before each axis direction (-X-axis direction, -Y-axis direction, -Z-axis direction) means the negative direction, that is, the remaining direction of the directions on both sides of the axis extension. After all, this is used to enable a clear understanding of the benchmark required for the present disclosure. Of course, the directions can be defined differently depending on where the benchmark is set.

[0034] As used herein, directional terms such as "above" and "upper" refer to the +Z axis direction, and directional terms such as "below" and "lower" refer to the -Z axis direction. The flip device 10 shown in the accompanying drawings may also be oriented differently, and the directional terms may be interpreted accordingly.

[0035] The "object" used in this disclosure means an object that is to be inspected. In this disclosure, a mobile phone case is shown as an example of the object, but it is not limited to this. For example, the object can be a spool valve having a cylindrical shape as a whole, etc., which has various types and shapes. The surface facing a certain direction on the outer surface of the object that is to be inspected can be called the "object surface". In the drawings of this disclosure, the object M and the object surfaces A, B1, B1a, B1b, B2, B3, B3a, B3b, B4, and C are illustrated.

[0036] The following describes embodiments of the present disclosure with reference to the accompanying drawings. In the accompanying drawings, identical or corresponding components are assigned the same reference numerals. Furthermore, in the following descriptions of the embodiments, repeated descriptions of identical or corresponding components may be omitted. However, even if a description of a component is omitted, it does not mean that such component is not included in a particular embodiment.

[0037] Figure 1 FIG. 1 is a perspective view of an object inspection apparatus 1 according to an embodiment of the present disclosure. Figure 2 As Figure 1 1 is a plan view of the object inspection device 1 , in which the imaging device 30 and parts 44 , 46 , and 47 of the imaging device frame are omitted.

[0038] refer to Figure 1 and Figure 2 The object inspection device 1 is a device for inspecting multiple objects M. The object inspection device 1 inspects the object surface of the object M. The object inspection device 1 includes multiple flipping devices 10A and 10B. The multiple flipping devices 10A and 10B include a first flipping device 10A configured to grasp a first object M1 and rotate it; and a second flipping device 10B configured to grasp a second object M and rotate it. The object M rotated by the first flipping device 10A is referred to as the first object M1, and the object M rotated by the second flipping device 10B is referred to as the second object M2.

[0039] The first reversing device 10A and the second reversing device 10B may be arranged in the Y-axis direction. The first reversing device 10A and the second reversing device 10B may be configured as the same device or may be configured with some differences.

[0040] The object inspection device 1 may include a conveyor belt device (not shown in the figure) and / or a robot arm device for moving the object M to the flipping device 10. The conveyor belt device and / or the robot arm device may be provided so that the object can be moved from one of the conveyor belt device and the transfer unit 200 to the other. For example, a conveyor belt (not shown in the figure) may be provided at the entrance and exit of the transfer unit 200. The object M can flow into the transfer unit 200 (see FIG. 2 ) via the conveyor belt. Figure 2 The arrow In) flows out to the conveyor belt via the transfer unit 200 (refer to Figure 2 Arrow Out).

[0041] The object inspection apparatus 1 includes an imaging device 30 for inspecting an object surface facing the +Z axis direction of the object M. The imaging device 30 may be provided above the reversing apparatus 10. The imaging device 30 may face the -Z axis direction to inspect the object surface.

[0042] The object inspection apparatus 1 includes a single imaging device 30 for inspecting the inspection surfaces of the first object M1 and the second object M2. The imaging device 30 inspects the inspection surfaces of the first object M1 and the second object M2 facing the +Z axis direction.

[0043] The imaging device 30 is configured to move from a position corresponding to one of the first reversing device 10A and the second reversing device 10B to a position corresponding to the other. The position corresponding to the first reversing device 10A indicates a position where the first object M1 grasped by the first reversing device 10A can be inspected, while the position corresponding to the second reversing device 10B indicates a position where the second object M2 grasped by the second reversing device 10B can be inspected.

[0044] The imaging device 30 is configured to be movable in the Y-axis direction. Thus, the imaging device 30 can move between positions corresponding to the first reversing device 10A and the second reversing device 10B arranged in the Y-axis direction.

[0045] The imaging device 30 may be configured to move in the X-axis direction. Thus, the imaging device 30 can inspect various portions of the target surface of the object M while moving in the X-axis direction and the Y-axis direction.

[0046] The imaging device 30 includes an imaging device frame 40 that movably supports the imaging device 30. The imaging device frame 40 movably supports the imaging device 30 so that the imaging device 30 can move in the X-axis direction and the Y-axis direction.

[0047] The camera frame 40 includes a base frame 41 supported on an external environment (eg, the ground, a wall, or other structures). The first flip device 10A and the second flip device 10B can be supported on the base frame 41.

[0048] The camera frame 40 may include a Y-axis guide 43 extending in the Y-axis direction and a Y-axis slider 44 movable in the Y-axis direction along the Y-axis guide 43. When the Y-axis slider 44 moves along the Y-axis guide 43, the camera 30 supported by the Y-axis slider 44 can move in the Y-axis direction together with the Y-axis slider 44.

[0049] The camera frame 40 may include an X-axis guide 46 extending in the X-axis direction and an X-axis slider 47 movable in the X-axis direction along the X-axis guide 46. When the X-axis slider 47 moves along the X-axis guide 46, the camera 30 supported by the X-axis slider 47 can move in the X-axis direction together with the X-axis slider 47.

[0050] Figure 3a is a perspective view of a flip device 10 according to an embodiment of the present disclosure, Figure 3b is a perspective view of a turning device 10 ′ according to another embodiment.

[0051] refer to Figure 3a and Figure 3b The first flipping device 10A and the second flipping device 10B each include at least one flipping unit (100 and / or 300), each configured to grasp an object along a predetermined axis and rotate the object about the predetermined axis. The predetermined axis may be the X-axis or the Y-axis. The following description of the flipping device 10 applies to both the first flipping device 10A and the second flipping device 10B.

[0052] The at least one flipping unit may include a Y-axis flipping unit 100 configured to grasp the object M along the Y-axis and rotate the object M about the Y-axis. The flipping device 10 may include a Z-axis lifting unit 500 that supports the at least one flipping unit. The Z-axis lifting unit 500 is configured to lift and lower the at least one flipping unit along the Z-axis. The flipping device 10 may include a transfer unit 200 configured to transfer the object M along the X-axis.

[0053] refer to Figure 3aAccording to one embodiment, the at least one flipping unit of the flipping device 10 includes an X-axis flipping unit 300. The X-axis flipping unit 300 is configured to grasp the object M along the X-axis direction and rotate the object M around the X-axis. The at least one flipping unit of the flipping device 10 includes the Y-axis flipping unit 100 and the X-axis flipping unit 300.

[0054] refer to Figure 3a , the Z-axis lifting unit 500 can support the X-axis flip unit 300. The Z-axis lifting unit 500 can be constructed in a manner to lift the X-axis flip unit 300 along the Z-axis direction. In the present disclosure, the so-called first component "supporting" the second component not only refers to the situation where the second component is directly in contact with and supported by the first component, but also includes the situation where the first component supports the second component through a third component arranged between the first and second components. In this embodiment, the Z-axis lifting unit 500 is constructed in a manner to support the Y-axis flip unit 100 and the X-axis flip unit 300, and to lift the Y-axis flip unit 100 and the X-axis flip unit 300 along the Z-axis direction.

[0055] refer to Figure 3b According to another embodiment, the at least one flipping unit of the flipping device 10 ′ does not include the X-axis flipping unit. The at least one flipping unit of the flipping device 10 ′ includes a Y-axis flipping unit 100 .

[0056] In another embodiment (not shown), the first flipping device and / or the second flipping device may include a Y-axis flipping unit, an X-axis flipping unit, and a transfer unit. The transfer unit may be configured to move an object in a specific direction (e.g., the X-axis direction), and a first object position, which is pre-set so that the Y-axis flipping unit can grasp the object, and a second object position, which is pre-set so that the X-axis flipping unit can grasp the object, may be spaced apart from each other along the specific direction on the transfer unit. For example, an object flowing into the flipping device via the transfer unit may be grasped by the Y-axis flipping unit at the first position, rotated about the Y-axis, and inspected, and then placed at the first position. Subsequently, an object moved from the first position to the second position by the transfer unit may be grasped by the X-axis flipping unit, rotated about the X-axis, and inspected, and then placed at the second position. The object may then be discharged from the flipping device via the transfer unit.

[0057] In addition, the first flipping device and the second flipping device can be embodied in various structures. Figure 3a The structure of the flip device 10 according to one embodiment is described in detail, but this is only an example, and part of the following description can also be applied to Figure 3band various other embodiments.

[0058] Figure 4 and Figure 5 yes Figure 3a A three-dimensional diagram of the Y-axis flip unit 100, the transfer unit 200 and the driving units 160, 170, 180, 260, 270, and 380. Figure 4 , the Y-axis Y is shown as the rotation axis of the Y-axis bracket 130. The combination of the Y-axis flip unit 100 and the transfer unit 200 can be referred to as a Y-axis flip assembly 100, 200. The Y-axis flip assembly 100, 200 can include at least one driving unit 160, 170, 180, 260, 270.

[0059] refer to Figure 4 and Figure 5 The Y-axis flip unit 100 can be supported by the Z-axis lifting unit 500 so as to be movable relative to the Z-axis in the Z-axis direction. The Y-axis flip unit 100 is configured to be able to rotate the object about the Y-axis. The Y-axis flip unit 100 is configured to be able to narrow or expand the pair of Y-axis supports 130a and 130b in the Y-axis direction. The Y-axis flip unit 100 is configured to be able to narrow or expand the pair of auxiliary clamping parts 137 in the Y-axis direction.

[0060] The Y-axis flip unit 100 includes a Y-axis flip base 110 supported by the Z-axis lifting unit 500. The Y-axis flip base 110 is arranged on the Z-axis lifting unit 500 so as to be movable in the Z-axis direction. The Y-axis flip base 110 supports a pair of main body frames 120a and 120b.

[0061] The Y-axis flip unit 100 includes a main frame 120 supported by a Y-axis flip base 110. The main frame 120 is supported by the Y-axis flip base 110 so as to be movable along the Y-axis direction.

[0062] The Y-axis flip unit 100 includes a pair of main frames 120a and 120b, which are configured to move in a manner that allows them to converge or expand relative to each other along the Y-axis. The pair of main frames 120a and 120b includes a first main frame 120a positioned in the +Y-axis direction and a second main frame 120b positioned in the -Y-axis direction. The Y-axis flip base 110 supports the pair of main frames 120a and 120b.

[0063] The Y-axis flip unit 100 includes a rotary joint 121 that rotatably supports a Y-axis bracket 130. A Y-axis shaft 131 of the Y-axis bracket 130 may be supported by the rotary joint 121 so as to be rotatable about the Y-axis.

[0064] The Y-axis flip unit 100 includes a Y-axis support 130 configured to grasp the object in the Y-axis direction. The Y-axis flip unit 100 includes a pair of Y-axis supports 130a and 130b supported by a corresponding pair of main body frames 120a and 120b. The pair of Y-axis supports 130a and 130b includes a first Y-axis support 130a positioned in the +Y-axis direction and a second Y-axis support 130b positioned in the -Y-axis direction.

[0065] The pair of Y-axis supports 130a and 130b are configured to rotate about the Y-axis relative to the pair of main frames 120a and 120b. The pair of Y-axis supports 130a and 130b are configured to be able to grasp the object between them. The pair of Y-axis supports 130a and 130b are configured to be able to grasp the object along the Y-axis direction.

[0066] The Y-axis flip unit 100 includes a Y-axis shaft 131, which is supported on the main frame 120 so as to be rotatable about the Y-axis. The Y-axis shaft 131 can be arranged to pass through the corresponding main frame 120 along the Y-axis direction. The Y-axis shaft 131 can be rotatably supported by the rotary joint 121 of the main frame 120.

[0067] The following is a detailed description based on one of the pair of Y-axis brackets 130. In one Y-axis bracket 130, the first direction refers to the direction toward the other Y-axis bracket, and the second direction refers to the opposite direction of the first direction Y1.

[0068] The Y-axis bracket 130 includes a Y-axis shaft 131, which is supported on the main frame 120 so as to be rotatable about the Y-axis. A support clamp 133 may be fixed to the first end of the Y-axis shaft 131. The Y-axis shaft 131 is coupled to the rotating rod 182c.

[0069] The Y-axis bracket 130 includes a support clamp 133 supported by a Y-axis rod 131. The support clamp 133 projects in the Y-axis direction Y1 and is configured to engage one end of an object. The support clamp 133 projects in the Y-axis direction on the -Z-axis side relative to the elastic clamp 135, forming a support surface in the +Z-axis direction capable of contacting the object M. The support clamp 133 has a distal end that protrudes in the first direction.

[0070] A Y-axis shaft 131 is fixed to the second direction side of the support clamping portion 133. The support clamping portion 133 can guide the moving direction of the elastic clamping portion 135. The support clamping portion 133 can also guide the moving direction of the auxiliary clamping portion 137.

[0071] The Y-axis bracket includes an elastic clamping portion 135 , which generates an elastic force when pressed by contact with an object M. The elastic clamping portion 135 is configured to compress an elastic member (not shown) when in contact with the object M. The elastic clamping portion 135 can be supported on the Y-axis shaft 131 via the support clamping portion 133 .

[0072] The Y-axis bracket 130 includes an auxiliary clamping portion 137, which moves along the Y-axis direction on the +Z-axis direction side with the elastic clamping portion 135 as a reference. The auxiliary clamping portion 137 is constructed in a manner that can move along the Y-axis direction relative to the support clamping portion 133. The auxiliary clamping portion 137 is constructed in a manner that can rotate integrally with the Y-axis shaft 131. In the present disclosure, the so-called "integrated rotation" means that multiple components rotate together without changing their relative positions to each other. The auxiliary clamping portion 137 forms a protruding end toward the first direction.

[0073] The auxiliary clamping portion 137 is configured to move along the Y-axis direction to engage or disengage the other end of the object M. One end of the object M is engaged with the supporting clamping portion 133. The one end and the other end of the object M referred to herein refer to the ends in two directions perpendicular to the Y-axis (the Z-axis direction).

[0074] The flipping device 10 includes an auxiliary clamping unit driving unit 180 that provides a driving force for the auxiliary clamping unit 137 to move along the Y-axis relative to the Y-axis shaft 131. The auxiliary clamping unit driving unit 180 may include a cylinder 181 that provides the driving force and a driving force transmitting unit 182 that transmits the driving force of the cylinder 181 to the Y-axis bracket 130.

[0075] In one embodiment, the driving force transmission unit 182 may include a cylinder rod 182a that receives the driving force from the cylinder 181 and moves along the Y-axis. The driving force transmission unit 182 may include a connecting rod 182b fixed to the cylinder rod 182a and moving integrally with the cylinder rod 182a. The driving force transmission unit 182 may include a rotating rod 182c connected to the connecting rod 182b. The rotating rod 182c is connected to the connecting rod 182b so as to move along the Y-axis as the connecting rod 182b moves along the Y-axis and is rotatable about the Y-axis.

[0076] The auxiliary clamping unit driver 180 includes a rotating rod 182c, one end of which is secured to the auxiliary clamping unit 137. The auxiliary clamping unit 137 can be secured to the distal end of the rotating rod 182c in the first direction. The rotating rod 182c is configured to transmit the driving force of the auxiliary clamping unit driver 180 to the auxiliary clamping unit 137. The rotating rod 182c can move along the Y-axis relative to the support clamping unit 133, along with the auxiliary clamping unit 137.

[0077] The rotating rod 182c is configured to rotate integrally with the Y-axis shaft 131 and to be movable in the Y-axis direction relative to the Y-axis shaft 131. The rotating rod 182c may be disposed to penetrate the Y-axis shaft 131 in the Y-axis direction.

[0078] The Y-axis flip unit 100 may include an X-axis flip guide 140 that guides the Z-axis movement of the X-axis flip unit 300. The X-axis flip unit 300 may include a transfer unit guide 145 that guides the Z-axis movement of the transfer unit 200. The Y-axis flip unit 100 may include a Z-axis slider 150 that is configured to slide in the Z-axis direction along the Z-axis guide 530 of the Z-axis lifting unit 500.

[0079] The Y-axis flip unit 100 may include a Y-axis rotation slot sensor (not shown in the figure) that senses a predetermined rotation angle position of the Y-axis bracket 130. The Y-axis flip unit 100 may include an auxiliary clamping portion sensor (not shown in the figure) that generates a sensing signal when the auxiliary clamping portion 137 moves to a predetermined relative position relative to the support clamping portion 133. The Y-axis flip unit 100 may include a Y-axis movement sensor (not shown in the figure) that generates a sensing signal when the main frame 120 moves to a predetermined relative position relative to the Y-axis flip base 110. The Y-axis movement sensor can sense the narrowing and opening states of the pair of main frames 120a and 120b along the Y-axis direction.

[0080] The Y-axis flip unit 100 may include a Y-axis contactor sensor (not shown in the figure), which generates a sensing signal when the object contacts the Y-axis contactor and the Y-axis contactor moves a predetermined distance along the Y-axis direction relative to the support clamping portion 133. The Y-axis contactor sensor can sense a signal when the Y-axis contactor compresses at least one elastic member 135b described later. The Y-axis movement drive unit 160 described later can be configured to interrupt the provision of driving force when a signal is sensed by the Y-axis contactor sensor during the period of providing driving force in the direction in which the pair of main frames 120a and 120b approach each other.

[0081] The transfer unit 200 is supported by the Y-axis inversion unit 100. The transfer unit 200 is configured to move in the Z-axis direction relative to the Y-axis inversion unit 100. The transfer unit 200 is configured to move the transfer belt 210 and transfer the object placed on the transfer belt 210 in the X-axis direction.

[0082] In this embodiment, the transfer unit 200 includes a conveyor belt structure for placing objects. However, in other embodiments (not shown), the transfer unit may include a slider having a groove for placing objects and a track structure for guiding the movement of the slider. Furthermore, the transfer unit can be implemented in various ways, but the following description will be based on this embodiment.

[0083] The transfer unit 200 may include a pair of transfer units 200a and 200b. The transfer units 200a and 200b are supported by the corresponding pair of main frames. The transfer units 200a and 200b include a first transfer unit 200a supported by the first main frame 120a and a second transfer unit 200b supported by the second main frame 120b. The transfer units 200a and 200b are configured to transfer the object along the X-axis direction.

[0084] The transfer unit 200 includes a transfer belt 210 configured to support the object and transfer the object along the X-axis direction. The transfer unit 200 includes a transfer pulley 220 configured to rotate to move the transfer belt 210. The transfer unit 200 includes a transfer frame 230 on which the transfer pulley 220 is disposed. The transfer frame 230 is supported by the main frame 120.

[0085] The Y-axis flip assemblies 100 and 200 may include a transfer unit lift sensor (not shown). When the transfer unit 200 moves to a predetermined relative position relative to the Y-axis flip unit 100, the transfer unit lift sensor (not shown) generates a sensing signal. The transfer unit lift sensor can sense the rise and fall of the transfer unit 200 along the Z-axis. A pair of transfer unit lift sensors may be provided, corresponding to the pair of transfer sections 200a and 200b.

[0086] The flip device 10 includes a Y-axis movement drive unit 160 that provides a driving force for the pair of main frames 120a and 120b to move along the Y-axis direction relative to the Y-axis flip base 110. The Y-axis movement drive unit 160 is supported by the Y-axis flip unit 100. The Y-axis movement drive unit 160 may include a motor 161 and a driving force transmission unit 163 that transmits the driving force of the motor 161 to the pair of main frames 120a and 120b.

[0087] In one embodiment, the driving force transmission unit 163 may include a pulley 163a fixed to the rotating shaft of the motor 161 for rotation, a belt 163b wound around the pulley 163a to receive the rotational force, and a pulley 163c connected to the belt 163b to receive the rotational force. The driving force transmission unit 163 may include a lead screw 163d, which is coupled to the pulley 163c and rotates integrally with the pulley 163c. When the lead screw 163d rotates in one direction, the pair of main frames 120a and 120b can move along the lead screw 163d and narrow toward each other in the Y-axis direction. When the lead screw 163d rotates in the other direction, the pair of main frames 120a and 120b can move along the lead screw 163d and move away from each other in the Y-axis direction.

[0088] The flipping device 10 includes a Y-axis support rotation driving unit 170, which provides a driving force for rotating the Y-axis support 130 relative to the main frame 120. The Y-axis support rotation driving unit 170 can provide a driving force for rotating the Y-axis shaft 131. The Y-axis support rotation driving unit 170 is supported by the Y-axis flip unit 100. The Y-axis support rotation driving unit 170 can include a motor 171 and driving force transmission units 173a, 173b, and 173c for transmitting the driving force of the motor 171 to the pair of Y-axis supports 130a and 130b.

[0089] The driving force transmission components 173a, 173b, and 173c may include a basic driving force transmission component 173a that transmits the rotational force of the motor 171 to the first driving force transmission component 173b and the second driving force transmission component 173c. The driving force transmission components 173a, 173b, and 173c may include a first driving force transmission component 173b that receives the rotational force from the basic driving force transmission component 173a and transmits it to the first Y-axis bracket 130a; and a second driving force transmission component 173c that receives the rotational force from the basic driving force transmission component 173a and transmits it to the second Y-axis bracket 130b.

[0090] In one embodiment, the basic driving force transmission unit 173a may include a pulley 173a1 fixed to the rotating shaft of the motor 171 for rotation, a belt 173a2 wrapped around the pulley 173a1 to receive the rotational force, and a pulley 173a3 connected to the belt 173a2 to receive the rotational force. The basic driving force transmission unit 173a may include a serrated shaft 173a4 coupled to the pulley 173a3 for integral rotation. The motor 171 and the basic driving force transmission unit 173a may be supported by the Y-axis flip base 110.

[0091] In one embodiment, the first driving force transmission unit 173b may include a pulley 173b1 coupled to a gear shaft 173a4 to receive rotational force and configured to be movable along the Y-axis along the gear shaft 173a4. The first driving force transmission unit 173b may include a belt 173b2 wound around the pulley 173b1 to receive rotational force, and a pulley 173b3 attached to the belt 173b2 to receive rotational force and rotate the first Y-axis bracket 130a. The first driving force transmission unit 173b may include a guide wheel 173b4 that contacts the belt 173b2 to guide the position of the belt 173b2. The first driving force transmission unit 173b is supported by the first main frame 120a.

[0092] In one embodiment, the second driving force transmission unit 173c may include a pulley 173c1 coupled to a gear shaft 173a4 to receive rotational force and configured to be movable along the gear shaft 173a4 in the Y-axis direction. The second driving force transmission unit 173c may include a belt 173c2 wound around the pulley 173c1 to receive rotational force, and a pulley 173c3 attached to the belt 173c2 to receive rotational force and rotate the second Y-axis bracket 130b. The second driving force transmission unit 173c may include a guide wheel 173c4 that contacts the belt 173c2 to guide the position of the belt 173c2. The second driving force transmission unit 173c is supported by the second main frame 120b.

[0093] The turning device 10 includes an auxiliary clamping unit driving unit 180 that provides driving force for operating the auxiliary clamping unit 137. A pair of auxiliary clamping unit driving units 180a and 180b may be provided to provide driving force for operating the pair of auxiliary clamping units. The auxiliary clamping unit driving unit 180 may be supported by the main frame 120.

[0094] The flipping device 10 includes a transfer unit lift drive 260 that provides a driving force for moving the transfer unit 200 along the Z-axis relative to the Y-axis flipping unit 100. The transfer unit lift drive 260 may be supported by the main frame 120. For example, the transfer unit lift drive 260 may include a cylinder that drives a cylinder rod in the vertical direction.

[0095] The transfer unit lifting drive unit 260 includes a pair of transfer unit lifting drive units 260a and 260b that respectively operate the pair of transfer units 200a and 200b. The transfer unit lifting drive units 260a and 260b are supported by the main frame 120. The transfer unit lifting drive units 260a and 260b provide a driving force to move the transfer units 200a and 200b in the Z-axis direction relative to the main frame 120. The pair of transfer unit lifting drive units 260a and 260b includes a first transfer unit lifting drive unit 260a that lifts the first transfer unit 200a and a second transfer unit lifting drive unit 260b that lifts the second transfer unit 200b.

[0096] The reversing device 10 includes a belt drive unit 270 that provides driving force for the transfer belt 210. The belt drive unit 270 may be supported by the transfer frame 230. For example, the belt drive unit 270 may include a motor 271, a belt that transmits the driving force of the motor 271 to the transfer belt 210, and a pulley 272.

[0097] The belt drive unit 270 includes a pair of belt drive units 270a and 270b that respectively drive the transfer belts 210 of the pair of transfer units 200a and 200b. The pair of belt drive units 270a and 270b includes a first belt drive unit 270a that drives the transfer belt 210 of the first transfer unit 200a and a second belt drive unit 270b that drives the transfer belt 210 of the second transfer unit 200b.

[0098] The flip device 10 may include an X-axis flip lift drive unit 380 that provides a driving force for the X-axis flip unit 300 to move relative to the Y-axis flip unit 100 along the Z-axis direction. The X-axis flip lift drive unit 380 may be supported by the Y-axis flip base 110. The X-axis flip lift drive unit 380 may include a motor 381 and a driving force transmission unit 383 that transmits the driving force of the motor 381 to the X-axis flip unit 300.

[0099] In one embodiment, the driving force transmission unit 383 may include a pulley 383a fixed to the rotating shaft of the motor 381 for rotation, a belt 383b wound around the pulley 383a to receive the rotational force, and a pulley 383c attached to the belt 383b to receive the rotational force. The driving force transmission unit 383 may include a lead screw 383d coupled to the pulley 383c for integral rotation therewith. When the lead screw 383d rotates in one direction, the X-axis flip base 310 can move along the lead screw 383d in the +Z-axis direction. When the lead screw 383d rotates in the other direction, the X-axis flip base 310 can move along the lead screw 383d in the -Z-axis direction.

[0100] Figure 6 yes Figure 3aA three-dimensional diagram of the X-axis flip unit 300 and the driving parts 360 and 370. Figure 6 , an X-axis (X) serving as a rotation axis of the X-axis support 330 is illustrated.

[0101] refer to Figure 6 The X-axis flip unit 300 can be supported by the Y-axis flip unit 100 so as to be movable in the Z-axis direction relative to the Y-axis flip unit 100. The X-axis flip unit 300 is configured to rotate the object about the X-axis. The X-axis flip unit 300 is configured such that a pair of X-axis supports 330a and 330b can be narrowed or expanded in the X-axis direction. The X-axis flip unit 300 is configured to be movable in the Z-axis direction relative to the Y-axis flip unit 100.

[0102] The X-axis flip unit 300 includes an X-axis flip base 310 supported by the Z-axis lifting unit 500. The X-axis flip base 310 can be supported by the Z-axis lifting unit 500 via the Y-axis flip unit 100. The X-axis flip base 310 can be supported by the Y-axis flip base 110. The X-axis flip base 310 can be arranged to be movable in the Z-axis direction relative to the Y-axis flip unit 100.

[0103] The X-axis flip unit 300 includes a side frame 320 supported by the X-axis flip base 310. The side frame 320 is supported relative to the X-axis flip base 310 so as to be movable in the X-axis direction.

[0104] The X-axis flip unit 300 includes a pair of side frames 320, which are configured to move in a manner that allows them to converge or expand relative to each other along the X-axis. The side frames 320 include a first side frame 320a disposed in the +X-axis direction and a second side frame 320b disposed in the -X-axis direction. The X-axis flip base 310 supports the pair of side frames 320.

[0105] The X-axis flip unit 300 includes a rotary joint 321 that rotatably supports an X-axis bracket 330. An X-axis shaft 331 of the X-axis bracket 330 may be supported by the rotary joint 321 so as to be rotatable about the X-axis.

[0106] The X-axis flip unit 300 includes an X-axis support 330 configured to grasp the object in the X-axis direction. The X-axis flip unit 300 includes a pair of X-axis supports 330a and 330b supported by a corresponding pair of side frames 320a and 320b. The pair of X-axis supports 330a and 330b includes a first X-axis support 330a positioned in the +X-axis direction and a second X-axis support 330b positioned in the -X-axis direction.

[0107] The pair of X-axis supports 330a and 330b are configured to rotate about the X-axis relative to the pair of side frames 320a and 320b and to be able to grasp an object between the pair of X-axis supports 330a and 330b.

[0108] The X-axis flip unit 300 includes an X-axis shaft 331, which is supported on the side frame 320 so as to be rotatable about the X-axis. The X-axis shaft 331 can be arranged to pass through the corresponding side frame 320 along the X-axis direction. The X-axis shaft 331 is rotatably supported by the rotary joint 321 of the side frame 320.

[0109] The X-axis support 330 is supported on the side frame 320 so as to be rotatable about the X-axis. The X-axis support 330 includes an X-axis contactor 335 having a contact surface 335a configured to contact the object along the X-axis direction. The X-axis contactor 335 is supported on the X-axis shaft 331. The X-axis contactor 335 is disposed on the X-axis. The X-axis contactor 335 is disposed so that the X-axis passes through the X-axis contactor 335.

[0110] The X-axis bracket 330 may include a first clamping portion 336. The +Z-axis portion of the first clamping portion 336 is formed to protrude in the X-axis direction relative to the -Z-axis portion. The first clamping portion 336 is supported by the X-axis shaft 331. The first clamping portion 336 is disposed on one side of the X-axis contactor 335. The first clamping portion 336 is disposed in a direction perpendicular to the X-axis with respect to the X-axis contactor 335.

[0111] The +Z-axis portion of the first clamping portion 336 protrudes along the X-axis direction, forming a first protruding surface 336a. The -Z-axis portion of the first clamping portion 336 is recessed along the X-axis direction, forming a first recessed surface 336c. The first clamping portion 336 forms a first inclined surface 336b connecting the first protruding surface 336a and the first recessed surface 336c. A pair of first clamping portions 336 can be provided on both sides of the X-axis contactor 335.

[0112] The X-axis bracket 330 may include a second clamping portion 337 formed so that its -Z-axis portion protrudes in the X-axis direction relative to its +Z-axis portion. The second clamping portion 337 is supported by the X-axis shaft 331. The second clamping portion 337 is disposed on one side of the first clamping portion 336. The second clamping portion 337 is disposed in a direction perpendicular to the X-axis with respect to the first clamping portion 336.

[0113] The X-axis contactor 335 , the first clamping portion 336 , and the second clamping portion 337 may be arranged along a direction perpendicular to the X-axis. The X-axis contactor 335 , the first clamping portion 336 , and the second clamping portion 337 may be arranged along the Y-axis direction.

[0114] The +Z-axis portion of the second clamping portion 337 protrudes along the X-axis direction, forming a second protruding surface 337a. The -Z-axis portion of the second clamping portion 337 is recessed along the X-axis direction, forming a second recessed surface 337c. The second clamping portion 337 forms a second inclined surface 337b connecting the second protruding surface 337a and the second recessed surface 337c. A pair of second clamping portions 337 may be provided on both sides of the X-axis contactor 335.

[0115] The X-axis flip unit 300 may include a transfer stopper 340 that limits the movement of the object being moved by the transfer unit 200. The transfer stopper 340 may be disposed on only one of the pair of X-axis brackets 330a and 330b. In this embodiment, the transfer stopper 340 is fixed to the first X-axis bracket 330a. The transfer stopper 340 may protrude from the first X-axis bracket 330a in the +Z-axis direction to form a surface facing the -X-axis direction. The object being moved along the X-axis by the transfer unit 200 is stopped by the transfer stopper 340, thereby stopping its movement along the X-axis direction.

[0116] The X-axis flip unit 300 may include an X-axis flip slider 350 configured to slide in the Z-axis direction along the X-axis flip guide 140 of the Y-axis flip unit 100. A pair of X-axis flip sliders 350 may be configured to face each other in the X-axis direction.

[0117] The X-axis flip unit 300 may include an X-axis rotation slot sensor (not shown) that senses the position of the X-axis bracket 330 at a predetermined rotation angle. The X-axis flip unit 300 may include an X-axis contactor sensor (not shown) that generates a sensing signal when the object contacts the X-axis contactor 335. The X-axis flip unit 300 may include an X-axis movement sensor (not shown) that generates a sensing signal when the side frame 320 moves to a predetermined relative position relative to the X-axis flip base 310. The X-axis movement sensor can sense the narrowing and expansion states of the pair of side frames 320a and 320b along the X-axis direction.

[0118] The X-axis flip unit 300 may include Z-axis motion sensors 391a, 391b (refer to Figure 5), when the X-axis flip base 310 moves to a predetermined relative position relative to the Y-axis flip base 110, the Z-axis motion sensors 391a and 391b generate a sensing signal. If the X-axis flip base 310 is positioned relative to the Y-axis flip base 110, a target (not shown) affixed to the X-axis flip base 310 is sensed by the Z-axis motion sensors 391a and 391b.

[0119] The flip device 10 includes an X-axis movement drive unit 360 that provides a driving force for the pair of side frames 320a and 320b to move along the X-axis direction relative to the X-axis flip base 310. The X-axis movement drive unit 360 is supported by the X-axis flip unit 300. The X-axis movement drive unit 360 may include a motor 361 and a driving force transmission unit 363 that transmits the driving force of the motor 361 to the pair of side frames 320a and 320b.

[0120] In one embodiment, the driving force transmission unit 363 may include a pulley (not shown) fixed to the rotating shaft of the motor 361 and rotating, a belt 363b wound around the pulley to receive the rotational force, and a pulley 363c connected to the belt 363b to receive the rotational force. The driving force transmission unit 363 may include a lead screw 363d, which is coupled to the pulley 363c and rotates integrally with the pulley 363c. When the lead screw 363d rotates in one direction, the pair of side frames 320a and 320b can move along the lead screw 363d and narrow toward each other in the X-axis direction. When the lead screw 363d rotates in the other direction, the pair of side frames 320a and 320b can move along the lead screw 363d and move away from each other in the X-axis direction.

[0121] The flipping device 10 includes an X-axis support rotation driving unit 370, which provides a driving force for rotating the X-axis support 330 relative to the side frame 320. The X-axis support rotation driving unit 370 can provide a driving force for rotating the X-axis shaft 331. The X-axis support rotation driving unit 370 is supported by the X-axis flip unit 300. The X-axis support rotation driving unit 370 can include a motor 371 and driving force transmission units 373a, 373b, and 373c for transmitting the driving force of the motor 371 to the pair of X-axis supports 330a and 330b.

[0122] The driving force transmission parts 373a, 373b, and 373c may include a basic driving force transmission part 373a that transmits the rotational force of the motor 371 to the first driving force transmission part 373b and the second driving force transmission part 373c. The driving force transmission parts 373a, 373b, and 373c may include a first driving force transmission part 373b that receives the rotational force from the basic driving force transmission part 373a and transmits it to the first X-axis bracket 330a, and a second driving force transmission part 373c that receives the rotational force from the basic driving force transmission part 373a and transmits it to the second X-axis bracket 330b.

[0123] In one embodiment, the basic driving force transmission unit 373a may include a pulley 373a1 fixed to the rotating shaft of the motor 371 for rotation, a belt 373a2 wound around the pulley 373a1 to receive the rotational force, and a pulley 373a3 connected to the belt 373a2 to receive the rotational force. The basic driving force transmission unit 373a may include a gear shaft 373a4 coupled to the pulley 373a3 for integral rotation therewith. The motor 371 and the basic driving force transmission unit 373a may be supported by the X-axis flip base 310.

[0124] In one embodiment, the first driving force transmission unit 373b may include a pulley 373b1 coupled to a gear shaft 373a4 to receive rotational force and configured to be movable along the gear shaft 373a4 in the X-axis direction. The first driving force transmission unit 373b may include a belt 373b2 wound around the pulley 373b1 to receive rotational force, and a pulley 373b3 attached to the belt 373b2 to receive rotational force and rotate the first X-axis bracket 330a. The first driving force transmission unit 373b may include a guide wheel 373b4 that contacts the belt 373b2 to guide its position. The first driving force transmission unit 373b is supported by the first side frame 320a.

[0125] In one embodiment, the second driving force transmission unit 373c may include a pulley (not shown) coupled to the gear shaft 373a4 to receive rotational force and configured to be movable along the gear shaft 373a4 in the X-axis direction. The second driving force transmission unit 373c may be configured similarly to the first driving force transmission unit 373b to rotate the second X-axis bracket 330b. The second driving force transmission unit 373c is supported by the second side frame 320b.

[0126] Figure 7 and Figure 8 yes Figure 3a 3D diagram of the Z-axis lifting unit 500 and the Z-axis lifting drive unit 560. Figure 7 and Figure 8The Z-axis lifting unit 500 can be supported in an environment outside the flipping device 10 (eg, an external ground or wall). The Y-axis flipping unit 100 can be lifted and lowered along the Z-axis direction relative to the Z-axis lifting unit 500.

[0127] The Z-axis lifting unit 500 may include a support frame 510 supported by an external environment. The Z-axis lifting unit 500 may include a Z-axis guide 530 formed on the support frame 510. The Z-axis guide 530 guides the Y-axis flip unit 100 to move in the Z-axis direction.

[0128] The Z-axis lifting unit 500 may include lifting sensors 591a and 591b. When the Y-axis flip base 110 moves to a predetermined relative position relative to the Z-axis lifting unit 500, the lifting sensors 591a and 591b generate sensing signals. If the Y-axis flip base 110 is positioned at a predetermined relative position relative to the Z-axis lifting unit 500, the target 591t fixed to the Y-axis flip base 110 is sensed by the Z-axis movement sensors 391a and 391b (see FIG. Figure 3a ).

[0129] The flipping device 10 may include a Z-axis lift drive unit 560 that provides a driving force for moving the Y-axis flip unit 100 and the X-axis flip unit 300 along the Z-axis direction relative to the Z-axis lift unit 500. The Z-axis lift drive unit 560 may be supported by the Z-axis lift unit 500. The Z-axis lift drive unit 560 may include a motor 561 and a driving force transmission unit 563 that transmits the driving force of the motor 561 to the Y-axis flip unit 100.

[0130] In one embodiment, the driving force transmission unit 563 may include a pulley 563a fixed to the rotating shaft of the motor 561 and rotating therefrom, a belt 563b wound around the pulley 563a to receive the rotational force, and a pulley 563c attached to the belt 563b to receive the rotational force. The driving force transmission unit 563 may include a lead screw 563d coupled to the pulley 563c and rotating therewith. When the lead screw 563d rotates in one direction, the Y-axis flip base 110 can move along the lead screw 563d in the +Z-axis direction. When the lead screw 563d rotates in the other direction, the Y-axis flip base 110 can move along the lead screw 563d in the -Z-axis direction.

[0131] Figures 9 to 16 As three-dimensional views sequentially showing the operation process of the flipping device 10 according to one embodiment, for the convenience of explanation, the X-axis flipping unit 300 and the Z-axis lifting unit 500 are omitted in some figures.

[0132] refer to Figure 9The object M enters the inverting device 10. The upper side of the transfer belt 210 of the transfer unit 200 moves in the +X axis direction (see arrow Mc1). As a result, the object M placed on the transfer belt 210 moves in the +X axis direction (see arrow In).

[0133] refer to Figure 9 and Figure 10 The X-axis flip unit 300 is in a state of being lowered by a predetermined range relative to the Y-axis flip unit 100. When the object M is being transferred to the correct position in the flip device 10, it is not stuck on the X-axis flip unit 300. When the flip device 10 reaches the correct position, it is stuck on the transfer limiter 340 of the X-axis flip unit 300. Figure 10 The object M is stopped at a predetermined, correct position by the transfer stopper 340 and cannot move further in the +X-axis direction. The pair of side frames 320a, 320b then expand in the X-axis direction and move in the +Z-axis direction relative to the Y-axis flip unit 100, maintaining a distance from the object M.

[0134] refer to Figure 11 The pair of main frames 120a and 120b of the Y-axis flip unit 100 are narrowed from each other along the Y-axis direction (see arrow Dy1).

[0135] refer to Figure 12 The transfer units 200a and 200b move in the -Z axis direction along the main frame 120 (see arrow Dc1). This prevents the transfer units 200 from being disturbed when the object M rotates.

[0136] refer to Figure 12 The support clamp 133 of the Y-axis bracket 130 supports the underside of the object M. With the elastic clamp 135 in contact with both sides of the object M in the Y-axis direction, the imaging device inspects the object surface A of the object M facing the +Z-axis direction. The pair of auxiliary clamps 137 are further apart than the pair of support clamps 133. The auxiliary clamps 137 do not block the +Z-axis direction of the object surface A, allowing all surfaces of the object surface A to be inspected. Inspection of the object surface A can be performed while the transfer units 200a and 200b are descending in the -Z-axis direction, thereby shortening inspection time.

[0137] refer to Figure 13 After inspecting the target surface A, the pair of auxiliary clamps 137 are moved to inspect the target surfaces B1 and B2, further narrowing relative to the pair of support clamps 133 (see arrow Ds1). The support clamps 133 and auxiliary clamps 137 grip the upper and lower sides of the object M, allowing the object M to rotate stably.

[0138] refer to Figure 14 The Y-axis support 130 rotates the object M in a certain rotation direction Ry1 around the Y-axis while holding the object M, so that the object surface B1 perpendicular to the object surface A faces the +Z-axis direction. The object surface B1 is inspected by the imaging device.

[0139] refer to Figure 15a and Figure 15b , the Y-axis support 130 rotates the object M less than 90 degrees around the Y-axis, and the object surfaces B1a and B1b that are tilted less than 90 degrees relative to the object surface B1 can also be inspected. This inspection method is very useful when the corners of the object M have curvature. For example, refer to Figure 15a , rotate the Y-axis bracket 130 in a certain rotation direction Ry2, and the target surface B1a can be inspected. Figure 15b By rotating the Y-axis support 130 in the opposite rotation direction Ry3, the target surface B1b can be inspected.

[0140] refer to Figure 16 The Y-axis support 130 rotates the object M in a certain rotation direction Ry4 about the Y-axis so that the target surface B2 opposite to the target surface B1 faces the +Z-axis direction.

[0141] Figure 17a Observed along the X-axis Figure 12 An elevation view of the flip device 10 in the state of FIG. Figure 17b Observed along the X-axis Figure 14 An elevation view of the flip device 10 in the state of FIG. Figure 17c Observed along the X-axis Figure 15a An elevation view of the flip device 10 in the state of FIG.

[0142] refer to Figures 17a to 17c The imaging device 30 is disposed on a horizontal plane Io at a predetermined distance (Lo + Lg) from the ground surface GL in the Z-axis direction, and the inspection direction Id of the imaging device 30 is the -Z-axis direction. The imaging device 30 can move in the X-axis direction and the Y-axis direction to inspect the target surface of the object M.

[0143] The imaging device 30 maintains a predetermined distance Lo from the target surface of the object M, which faces the +Z axis. To this end, the distance between the target surface and the ground GL can be maintained at a predetermined distance Lg. The Z-axis lifting unit 500 moves the Y-axis flip unit 100 in the Z-axis direction to maintain the predetermined distance Lg.

[0144] refer to Figure 17a, illustrates the distance L1 between the reference point of the Y-axis flip unit 100 and the ground surface GL during the inspection of the target surface A.

[0145] refer to Figure 17b The relative position of the target surface B1 relative to the Y-axis flip unit 100 is higher than the relative position of the target surface B1 relative to the Y-axis flip unit 100. Therefore, the Z-axis lifting unit 500 can move the Y-axis flip unit 100 downward by a predetermined distance (see arrow Dz1). The distance L2 between the Y-axis flip unit 100 and the ground GL is shorter than the distance L1.

[0146] refer to Figure 17c The relative position of the target surface B1a relative to the Y-axis flip unit 100 is lower than the relative position of the target surface B1 relative to the Y-axis flip unit 100. Therefore, the Z-axis lifting unit 500 can move the Y-axis flip unit 100 upward by a predetermined distance (see arrow Dz2). The distance L3 between the Y-axis flip unit 100 and the ground GL is longer than the distance L2 but shorter than the distance L1.

[0147] Figures 18 to 26 As the display according to the flip device 10 Figure 16 For the convenience of explanation, the Y-axis flip unit 100 and the Z-axis lifting unit 500 are omitted in some figures.

[0148] refer to Figure 18 The Y-axis support 130 rotates the object M (see arrow Ry5) and positions the object so that the object surface A faces the +Z-axis direction. The pair of side frames 320a and 320b remain open in the X-axis direction. At this time, the pair of X-axis supports 330a and 330b converge in the X-axis direction to grasp the object M (see arrow Dx1).

[0149] refer to Figure 19 The auxiliary clamping portion 137 moves in the second direction relative to the supporting clamping portion 133, entering the decoupled state (see arrow Ds2). The pair of main frames 120a and 120b are then separated from each other, and the pair of Y-axis supports 130a and 130b are spaced apart from the object M (see arrow Dy2). As a result, when the X-axis support 330 rotates the object M, the Y-axis support 130 does not interfere.

[0150] refer to Figure 20 The X-axis support 330 rotates the object M in a certain rotation direction Rx1 around the X-axis while holding the object M, so that the object surface B3 perpendicular to the object surface A faces the +Z-axis direction. The object surface B3 is inspected by the imaging device.

[0151] refer to Figure 21a and Figure 21b , the X-axis support 330 rotates the object M less than 90 degrees around the X-axis, and the object surfaces B3a and B3b that are tilted less than 90 degrees relative to the object surface B3 can also be inspected. This inspection method is very useful when the corners of the object M have curvature. For example, refer to Figure 21a , rotate the X-axis support 330 in a certain rotation direction Rx2, and the object surface B3a can be inspected. Figure 21b , rotating the X-axis support 330 in the opposite rotation direction Rx3, the target surface B3b can be inspected.

[0152] refer to Figure 22 The X-axis support 330 rotates the object M in a certain rotation direction Rx4 about the X-axis so that the target surface B4 opposite to the target surface B3 faces the +Z-axis direction.

[0153] Although not shown, when the X-axis flip unit 300 rotates the object M, the camera device 30 can maintain a predetermined distance Lo from the object surface of the object M facing the +Z-axis direction. For example, the Z-axis lifting unit 500 moves the Y-axis flip unit 100 and the X-axis flip unit 300 in the Z-axis direction in order to maintain the predetermined distance Lo. The specific mechanism of this is the same as described above. Figures 17a to 17c The mechanism is the same.

[0154] refer to Figure 23 The X-axis support 330 rotates the object M (see arrow Rx5) and positions the object so that the target surface C, which is opposite the target surface A, faces the +Z axis direction. The pair of side frames 320a and 320b are narrowed in the Y axis direction, so that the pair of Y-axis supports 130a and 130b grasp the object M (see arrow Dy1).

[0155] refer to Figure 24 The pair of side frames 320a and 320b are spread apart from each other, and the pair of X-axis supports 330a and 330b are spaced apart from the object M (see arrow Dx2). The object surface C, which is the opposite surface of the object surface A, can be inspected.

[0156] refer to Figure 25 The X-axis flip unit 300 moves a predetermined distance in the -Z-axis direction relative to the Y-axis flip unit 100 (see arrow De1). The X-axis flip unit 300 is fully lowered relative to the Y-axis flip unit 100, and the transfer stopper 340 is positioned below the object's path. Furthermore, the transfer unit 200 moves a predetermined distance in the +Z-axis direction relative to the Y-axis flip unit 100 (see arrow Dc2). The transfer belt 210 of the transfer unit 200 supports the lower side of the object M.

[0157] refer to Figure 26 The pair of main frames 120a and 120b are spread apart in the Y-axis direction, with only the transfer unit 200 supporting the object M. The upper surfaces of the transfer belts 210 of the pair of transfer units 200a and 200b move in the +X-axis direction (see arrow Mc1). As a result, the object M is ejected from the inverting device 10 by the transfer unit 200 (see arrow Out).

[0158] exist Figures 27a to 29 In the flowchart shown, process steps, method steps, algorithms, etc. are described in sequence, but these processes, methods and algorithms can be operated in any suitable order. In other words, the steps of the processes, methods and algorithms described in the various embodiments of the present disclosure do not need to be executed in the order described in the present disclosure. In addition, although the description describes a situation where some steps are performed in a non-simultaneous manner, in other embodiments, these some steps can be performed simultaneously. In addition, the process examples described in the accompanying drawings do not mean that the exemplified processes exclude different variations and revisions thereto, nor do they mean that the exemplified processes or any one of their steps are necessary for one or more of the various embodiments of the present disclosure, nor do they mean that the exemplified processes are preferred.

[0159] Figure 27a is a flowchart of a method S1 for inspecting an object according to an embodiment. Figure 27b 1 is a flow chart of a method S1' according to another embodiment of inspecting a certain object. The so-called certain object refers to one of the first object M1 and the second object M2. Figure 27a and Figure 27b This flowchart is created based on the object M rotated by either the first reversing device 10A or the second reversing device 10B.

[0160] refer to Figure 27a , a method S1 according to one embodiment of the present invention for inspecting a certain object (M1 or M2) may be used Figure 3a The flip device 10 and Figure 1 The method S1 includes an initial transfer step S10 (refer to the initial transfer step S10) in which the transfer unit 200 of the flip device 10 transfers the object M along the X-axis direction before the initial inspection step S20. Figure 9 and Figure 10 In the initial transfer step S10, the object M is transferred along the X-axis direction so that the object M is placed in the correct position. The correct position may be a position where the Y-axis support 130 can grasp the object M along the Y-axis direction. In the initial transfer step S10, the object M is clamped by the transfer stopper 340, and the object M can be placed in the correct position. In the initial transfer step S10, the object M can be transferred in the +X-axis direction.

[0161] The method S1 includes, after the initial transfer step S10, an initial inspection step S20 in which the Y-axis support 130 grasps the object M along the Y-axis direction and the camera device inspects the object surface A of the object M (see FIG. Figure 11 and Figure 12 In the initial inspection step S20, the Y-axis support 130 grasps the object M while the auxiliary clamping portion 137 is in the detached state from the target surface A. The detached state refers to a state in which the auxiliary clamping portion 137 is not detached from a portion of the target surface A. This allows the imaging device to inspect the entire area of ​​the target surface A without interference. The initial inspection step S20 can be referred to as the first inspection step S20.

[0162] In the initial inspection step S20, the transfer unit 200 moves in the -Z direction relative to the Y-axis flip unit 100. In the initial inspection step S20, after the Y-axis support 130 grasps the object M, the transfer unit 200 can move in the -Z direction relative to the Y-axis support 130. The transfer unit 200 descends relative to the Y-axis flip unit 100 without interfering with the rotation of the object M. While the transfer unit 200 is descending, the imaging device can also inspect the object surface A.

[0163] After the initial inspection step S20, the method S1 includes a rotation inspection step S30 for rotating the object M to inspect an object surface perpendicular to the object surface A. In the rotation inspection step S30, the Y-axis support 130 can rotate the object M about the Y-axis, and the imaging device can inspect an object surface B1 perpendicular to the object surface A and an object surface B2 opposite to the object surface B1. The rotation inspection step S30 can be referred to as a second inspection step S30.

[0164] In the rotation inspection step S30 , the Y-axis support 130 grips the object with the auxiliary clamping portion 137 hooked on the target surface A. Thus, the object M can be stably gripped by the Y-axis support 130 .

[0165] In the method S1 using the flipping device 10 according to one embodiment including the Y-axis flipping unit 100 and the X-axis flipping unit 300 , the rotation checking step S30 includes a Y-axis rotation checking step S31 and an X-axis rotation checking step S36 .

[0166] In the Y-axis rotation inspection step S31, the Y-axis support 130 rotates the object M around the Y-axis, and the imaging device inspects the object surface B1 perpendicular to the object surface A and the object surface B2 opposite to the object surface B1 (see FIG. Figures 13 to 16 In the Y-axis rotation inspection step S31 , the auxiliary clamping portion 137 may be moved relative to the supporting clamping portion 133 in the first direction to be in a hooked state.

[0167] In the Y-axis rotation inspection step S31, the Y-axis support 130 rotates the object M around the Y-axis, and the imaging device can inspect at least one of the object surfaces B1a and B1b that are tilted less than 90 degrees relative to the object surface B1 and the object surface (not shown) that is tilted less than 90 degrees relative to the object surface B2. In the Y-axis rotation inspection step S31, the Y-axis support 130 can be moved along the Z-axis direction so that the object surfaces B1 and B2 are at the same height as the object surface A (refer to FIG. Figures 17a to 17c The Y-axis support 130 is moved along the Z-axis direction by the Z-axis lifting unit 500 .

[0168] The X-axis rotation inspection step S36 may be performed after the Y-axis rotation inspection step S31. In the X-axis rotation inspection step S36, the X-axis support 330 grasps the object M along the X-axis direction and rotates the object M around the X-axis. The camera device inspects the object surface B3 perpendicular to the object surface A and the object surface B4 opposite to the object surface B3 (see FIG. Figures 18 to 22 ).

[0169] The X-axis rotation inspection step S36 includes the steps of grasping the object M by the X-axis support 330, lowering the object M by the Y-axis support 130, and rotating the object M. With the Y-axis support 130 positioned with the target surface A of the object M facing the +Z axis, the pair of side frames 320a and 320b are narrowed relative to each other in the X-axis direction, thereby grasping the object M. In another embodiment (not shown), the pair of side frames 320a and 320b can be narrowed relative to each other in the X-axis direction, thereby grasping the object M, while the Y-axis support 130 is positioned with the target surface C of the object M facing the +Z axis. After the X-axis support 330 grasps the object M, the pair of main frames 120a and 120b are expanded relative to each other in the Y-axis direction, the auxiliary clamp 137 is moved relative to the support clamp 136 in the second direction, and the Y-axis support 130 lowers the object M. After the step of placing the object M on the Y-axis support 130 , the step of rotating the object M on the X-axis support 330 is performed.

[0170] In the X-axis rotation inspection step S36, the X-axis support 330 rotates the object M about the X-axis, and the imaging device inspects at least one of the target surfaces B3a and B3b that are tilted less than 90 degrees relative to the target surface B3, and a target surface (not shown) that is tilted less than 90 degrees relative to the target surface B4. In the X-axis rotation inspection step S36, the X-axis support 330 can be moved along the Z-axis direction so that the target surfaces B3 and B4 are at the same height as the target surface A. The X-axis support 330 is moved along the Z-axis direction by the Z-axis lifting unit 500.

[0171] The method S1 may include a back side inspection step S40 (see FIG. Figures 23 to 25 In the back inspection step S40, the Y-axis support 130 grasps the object M along the Y-axis direction, and the imaging device inspects the object surface C, which is the opposite side of the object surface A. The back inspection step S40 may be referred to as a third inspection step S40.

[0172] In the backside inspection step S40, the Y-axis support 130 grips the object M while the auxiliary clamping portion 137 is released from the target surface C. The "released" state refers to a state in which the auxiliary clamping portion 137 does not cover a portion of the target surface C. This allows the imaging device to inspect the entire area of ​​the target surface C without interference.

[0173] Backside inspection step S40 includes rotating the object M so that the object surface C faces the +Z-axis direction. In an embodiment including X-axis rotation inspection step S36, backside inspection step S40 includes rotating the object M so that the object surface C faces the +Z-axis direction by the X-axis support 330 and grasping the object M by the Y-axis support 130.

[0174] In the back surface inspection step S40, the transfer unit 200 moves in the +Z axis direction relative to the Y axis flip unit 100. In the back surface inspection step S40, the transfer unit 200 rises in the +Z axis direction relative to the Y axis support 130 to support the object M. While the transfer unit 200 is rising, the object surface C can also be inspected.

[0175] In the backside inspection step S40, after the Y-axis support 130 grasps the object M, the X-axis support 330 can move relative to the Y-axis support 130 in the -Z-axis direction. Specifically, after the Y-axis support 130 grasps the object M, the pair of X-axis supports 330 can be separated from each other along the X-axis direction and moved relative to the Y-axis support 130 in the -Z-axis direction. The X-axis supports 330 are fully lowered relative to the Y-axis flip unit 100. In the subsequent transfer step S50, when the object M is transferred, the transfer stopper 340 can be spaced away from the object M in the -Z-axis direction. Furthermore, the object surface C can be inspected while the X-axis support 330 is lowered.

[0176] The method S1 includes a post-transfer step S50 (see FIG. 1 ) in which the transfer unit 200 transfers the object M along the X-axis direction after the back side inspection step S40. Figure 26 ) In the post-transfer step S50, the object M may be transferred in the +X axis direction.

[0177] refer to Figure 27b, a method S1' according to another embodiment of inspecting a certain object (M1 or M2) can be used Figure 3b The turning device 10' and Figure 1 Next, the camera device 30 is used. Figure 27a The differences of the embodiments are centered on the following Figure 27b Method S1' of an embodiment.

[0178] In the method S1' using the flipping device 10' according to another embodiment that does not include the X-axis flipping unit 300 but includes the Y-axis flipping unit 100, the rotation inspection step S30 may not include the X-axis rotation inspection step S36. After the target surfaces B1 and B2 are inspected in the Y-axis rotation inspection step S31, the back surface inspection step S40 may be performed. In the back surface inspection step S40, with the Y-axis supports 130 positioned with the target surface C of the object M facing the +Z axis, the pair of transfer units 200a and 200b are raised to support the object M. The pair of Y-axis supports 130 then open to lower the object M. After opening to lower the object M, the pair of Y-axis supports 130 rotate 180 degrees about the Y-axis, converge to re-grip the object M, and then inspect the target surface C.

[0179] For the convenience of explanation, the following Figure 27a The object inspection method will be described based on the method S1 of one embodiment, but is not limited thereto. Figure 28 is a flowchart of an object inspection method S0 according to one embodiment of the present disclosure. Figure 29 FIG. 1 is a flowchart of a method S0′ for inspecting an object according to another embodiment of the present disclosure. Figure 28 and Figure 29 The object inspection methods S0 and S0 ′ can be performed using the first inverting device 10A, the second inverting device 10B, and an imaging device 30 .

[0180] refer to Figure 28 and Figure 29 The object inspection methods S0 and S0' include: a first object inspection step S1a in which the first flipping device 10A rotates the first object M1 and the camera device 30 inspects the object surface of the first object M1; and during the first object inspection step S1a, the second flipping device 10B rotates the second object M2 and the camera device 30 inspects the object surface of the second object M2.

[0181] During the first object inspection step S1a and the second object inspection step S1b, the imaging device 30 moves at least once from a position corresponding to one of the first and second flipping devices 10A, 10B to a position corresponding to the other. During the first and second object inspection steps S1a, S1b, the imaging device 30 can alternately inspect the target surface of the first object M1 and the target surface of the second object M2. Thus, while the flipping device 10 is performing preparatory operations to position the target surface of one object (M1 or M2) at a predetermined position, the imaging device can inspect the other object (M2 or M1), thereby reducing the time lost by the imaging device 30.

[0182] In the present disclosure, the situation in which the imaging device 30 moves from one of the position corresponding to the first reversing device 10 and the position corresponding to the second reversing device 10B to the other may be referred to as “transition movement”. Figure 28 M11 to M21 and Figure 29 M31 to M37 serve as arrows representing the conversion movement of the camera device 30, the arrow from the first object inspection step S1a toward the second object inspection step represents the conversion movement from the first flipping device 10A to the second flipping device 10B, and the arrow from the second object inspection step S1b toward the first object inspection step represents the conversion movement from the second flipping device 10B to the first flipping device 10A.

[0183] refer to Figure 28 and Figure 29The first object inspection step S1a and the second object inspection step S1b can each be understood as the aforementioned method S1. However, in another embodiment, the first object inspection step S1a and the second object inspection step S1b can each be the aforementioned method S1'. The first object inspection step S1a and the second object inspection step S1b can each include initial transfer steps S10a and S10b. The first object inspection step S1a and the second object inspection step S1b can each include initial inspection steps S20a and S20b, in which the corresponding Y-axis bracket grasps the corresponding object along the Y-axis direction, and the camera device 30 inspects the corresponding object surface A. The first object inspection step S1a and the second object inspection step S1b can each include a Y-axis rotation inspection step S31, in which the corresponding Y-axis bracket rotates the corresponding object about the Y-axis, and the camera device 30 inspects the object surface B1 perpendicular to the corresponding object surface A and the object surface B2 opposite to the corresponding object surface B1. The first object inspection step S1a and the second object inspection step S1b may each include an X-axis rotation inspection step S36 in which the corresponding X-axis support grasps the corresponding object M along the X-axis direction, rotates the corresponding object M about the X-axis, and inspects the object surface B3 perpendicular to the corresponding object surface A and the object surface B4 opposite to the corresponding object surface B3 using the imaging device 30. The first object inspection step S1a and the second object inspection step S1b may each include a backside inspection step S40 in which the corresponding Y-axis support grasps the corresponding object M along the Y-axis direction, and inspects the object surface C opposite to the corresponding object surface A using the imaging device. The backside inspection step S40 may be performed after the X-axis rotation inspection step S36, but depending on the embodiment, it may also be performed after the Y-axis rotation inspection step S31. The first object inspection step S1a and the second object inspection step S1b may each include a post-transfer step S50a or S50b in which the corresponding object M is transferred along the X-axis direction after the backside inspection step S40. Here, the so-called "corresponding objects" refer to the objects inspected in the first object inspection step S1a and the second object inspection step S1b, respectively, and the so-called "corresponding" configurations refer to the configurations used in the first object inspection step S1a and the second object inspection step S1b, respectively.

[0184] refer to Figure 28 and Figure 29During the initial inspection step S20a of the first object M1 and the Y-axis rotation inspection step S31 of the first object M1, the initial inspection step S20b of the second object M2 can be performed. After the initial inspection step S20a is performed while the imaging device 30 is in the position corresponding to the first reversing device 10A, the imaging device 30 can perform transfer movements M11 and M31 toward the second reversing device 10B and perform the initial inspection step S20b. After the initial inspection step S20b is performed while the imaging device 30 is in the position corresponding to the second reversing device 10B, the imaging device 30 can perform transfer movements M12 and M32 toward the first reversing device 10A and perform the inspection processes S311Qa and S31Qa of the Y-axis rotation inspection step S31.

[0185] During the Y-axis rotation inspection step S31 of the first object M1, the imaging device 30 may be moved at least once between the position corresponding to the first reversing device 10A and the position corresponding to the second reversing device 10B. Figure 28 In the example of FIG. 1 , during the Y-axis rotation inspection step S31 of the first object M1, the camera device 30 performs three conversion movements M12, M13, and M14. Figure 29 In the example of FIG. 5 , during the Y-axis rotation inspection step S31 of the first object M1 , the imaging device 30 performs one conversion movement M32 .

[0186] During the Y-axis rotation inspection step S31 and the X-axis rotation inspection step S36 of the second object M2, the imaging device 30 may move at least once between the position corresponding to the first reversing device 10A and the position corresponding to the second reversing device 10B. Figure 28 In the example of FIG. 1 , during the Y-axis rotation inspection step S31 and the X-axis rotation inspection step S36 of the second object M2, the camera device 30 performs seven conversion movements M13, M14, M15, M16, M17, M18, and M19. Figure 29 In the example shown in FIG. 1 , during the Y-axis rotation inspection step S31 and the X-axis rotation inspection step S36 of the second object M2 , the imaging device 30 performs three conversion movements M33 , M34 , and M35 .

[0187] During the X-axis rotation inspection step S36 of the first object M1, the imaging device 30 may be moved at least once between the position corresponding to the first reversing device 10A and the position corresponding to the second reversing device 10B. Figure 28 In the example of FIG. 1 , during the X-axis rotation inspection step S36 of the first object M1, the camera device 30 performs three conversion movements M16, M17, and M18. Figure 29In the example of FIG. 5 , during the X-axis rotation inspection step S36 of the first object M1 , the imaging device 30 performs one conversion movement M34 .

[0188] During the X-axis rotation inspection step S36 and the backside inspection step S40 of the second object M2, the backside inspection step S40 of the first object M1 can be performed. With the imaging device 30 positioned relative to the second reversing device 10B, after performing the inspection steps S362Qb and S36Qb of the X-axis rotation inspection step S36 of the second object M2, the imaging device 30 can perform transfer movements M20 and M36 toward the first reversing device 10A and perform the inspection step S40Qa of the backside inspection step S40 of the first object M1. With the imaging device 30 positioned relative to the second reversing device 10B, after performing the inspection step S40Qa, the imaging device 30 can perform transfer movements M21 and M37 toward the second reversing device 10B and perform the inspection step S40Qb of the backside inspection step S40 of the second object M2.

[0189] During the back surface inspection step S40 of the first object M1 and the subsequent transfer step S50a of the first object M1, the imaging device 30 may be moved at least once between the position corresponding to the first reversing device 10A and the position corresponding to the second reversing device 10B. Figure 28 In the example of FIG. 1 , during the backside inspection step S40 of the first object M1 and the subsequent transfer step S50a of the first object M1, the camera device 30 performs at least two conversion movements M20 and M21. Figure 29 In the example of FIG. 5 , during the back surface inspection step S40 of the first object M1 and the post-transfer step S50 a of the first object M1 , the imaging device 30 performs at least two conversion movements M36 and M37 .

[0190] refer to Figure 28 The Y-axis rotation inspection step S31 may include: a first Y-axis rotation inspection step S311 of disposing the target surface B1 at a preset position for inspection; and a second Y-axis rotation inspection step S312 of disposing the target surface B2 at a preset position for inspection. The X-axis rotation inspection step S36 may include: a first X-axis rotation inspection step S361 of disposing the target surface B3 at a preset position for inspection; and a second X-axis rotation inspection step S362 of disposing the target surface B4 at a preset position for inspection.

[0191] refer to Figure 28 and Figure 29The Y-axis rotation inspection step S31 of a certain object (M1 or M2) includes: the camera device 30 stays at a position corresponding to the other object (M2 or M1), and performs a preparation process for conversion movement to the position corresponding to the certain object (M1 or M2) ( Figure 28 S311Pa, S312Pa, S311Pb, S312Pb and Figure 29 The Y-axis rotation inspection step S31 of a certain object (M1 or M2) includes: an inspection process in which the camera device 30 stays at a position corresponding to the certain object (M1 or M2) ( Figure 28 S311Qa, S312Qa, S311Qb, S312Qb and Figure 29 S31Qa, S31Qb).

[0192] The X-axis rotation inspection step S36 of a certain object (M1 or M2) includes: the camera device 30 stays at a position corresponding to the other object (M2 or M1), and performs a preparation process for conversion movement to the position corresponding to the certain object (M1 or M2). Figure 28 S361Pa, S362Pa, S361Pb, S362Pb and Figure 29 The X-axis rotation inspection step S36 of a certain object (M1 or M2) includes: the inspection process ( Figure 28 S361Qa, S362Qa, S361Qb, S362Qb and Figure 29 S36Qa, S36Qb).

[0193] The backside inspection step S40 of a certain object (M1 or M2) includes: the imaging device 30 is stopped at a position corresponding to the other object (M2 or M1), and a preparatory process S40Pa and S40Pb is performed to transfer to the position corresponding to the certain object (M1 or M2). The backside inspection step S40 of a certain object (M1 or M2) includes: the imaging device 30 is stopped at the position corresponding to the certain object (M1 or M2) and an inspection process S40Qa and S40Qb.

[0194] In the preparation process ( Figure 28 and Figure 29During the process (indicated by P in the figure), the camera device 30 is shifted. Furthermore, during the preparation process of a certain object (M1 or M2), the target surface of another object (M2 or M1) is inspected. Furthermore, during the preparation process of a certain object (M1 or M2), the turning device 10 of the certain object (M1 or M2) is operated so that the target surface of the certain object (M1 or M2) is positioned at a predetermined position.

[0195] In the inspection process ( Figure 28 and Figure 29 ), an object surface inspection of the object (M1 or M2) is performed. In addition, during the inspection of the object (M1 or M2), the flipping device 10 of the object (M1 or M2) can be operated to arrange the other object surface of the object (M1 or M2) at a preset position.

[0196] Table 1 below is Figure 28 Table 1 shows an experimental example of object inspection method S0. The action Na on the first object M1 and its required time Ta are measured, as well as the action Nb on the second object M2 and its required time Tb, measured in seconds (sec). When actions Na and Nb are performed simultaneously on the first and second objects M1 and M2, the net required time To is measured in seconds (sec).

[0197]

Table 1

[0198]

[0199]

[0200] Here, N1 refers to the action of transferring the object M so that the object surface A is positioned at a preset position, and N2 refers to the action of inspecting the object surface A. N3 refers to the action of transferring the object surface B2 to a preset position, and N4 refers to the action of inspecting the object surface B2. N5 refers to the action of transferring the object surface B3 to a preset position, and N6 refers to the action of inspecting the object surface B3. N7 refers to the action of transferring the object surface B4 to a preset position, and N8 refers to the action of inspecting the object surface B4. N9 refers to the action of transferring the object surface C to a preset position, and N10 refers to the action of inspecting the object surface C. N11 refers to the action of transferring the object M so that it flows out of the flipping device 10. The required times Ta and Tb also reflect the time it takes for the camera device 30 to perform the conversion movement.

[0201] Referring to Table 1, the total time Ta required for one cycle of the operation on the first object M1 is 25.48 seconds, and the total time Tb required for one cycle of the operation on the second object M2 is also 25.48 seconds. Therefore, if one cycle of the operation on the first object M1 is followed by one cycle of the operation on the second object M2, a total of 66.23 seconds is required. However, by reducing this lost time through the switching operation of the imaging device 30, the total time To actually required for one cycle of the operation on the first object M1 and the second object M2 is 34.75 seconds, significantly less than 66.23 seconds. During this 34.75-second period, two inspection cycles are performed on the two objects M, resulting in a single inspection cycle of approximately 17.38 seconds for one object M, significantly less than 25.48 seconds. This demonstrates that, according to the disclosed embodiments, inspection efficiency can be significantly improved using only a single, expensive imaging device 30.

[0202] The inspection method is described by way of specific embodiments, but the method can also be embodied in a computer-readable recording medium in the form of a computer-readable code. Computer-readable recording media include all types of recording devices that store data that can be read by a computer system. Examples of computer-readable recording media include ROM (read-only memory), RAM (random access memory), CD-ROM (read-only optical disk drive), magnetic tape, floppy disk, optical data storage device, etc. In addition, the computer-readable recording medium can be distributed among computer systems connected to a network to store and run computer-readable codes in a distributed manner. Moreover, the functional programs, codes, and code fragments required to embody the embodiments can be easily derived by programmers in the technical field to which the present disclosure belongs.

[0203] The technical concepts of the present disclosure have been described above based on some embodiments and examples illustrated in the accompanying drawings. However, those skilled in the art will appreciate that various substitutions, modifications, and variations are possible without departing from the technical concepts and scope of the present disclosure. Furthermore, such substitutions, modifications, and variations should be considered as encompassed by the accompanying claims.

Claims

1. An object inspection device, comprising: a first turning device configured to grasp the first object and rotate the first object in an XYZ rectangular coordinate system; a second flipping device, the second flipping device being configured to grasp the second object and rotate the second object in an XYZ rectangular coordinate system, and the second flipping device and the first flipping device being arranged along the Y-axis direction; and an imaging device configured to move from one of a position capable of inspecting the first object grasped by the first flipping device and a position capable of inspecting the second object grasped by the second flipping device to the other in an XYZ rectangular coordinate system, and to inspect object surfaces of the first object and the second object facing the +Z axis direction; The first flipping device and the second flipping device respectively include: at least one turning unit configured to grasp the object along a predetermined axis and to rotate the object around the predetermined axis. The at least one flip unit comprises: a Y-axis flipping unit configured to grasp an object along the Y-axis direction and rotate the object around the Y-axis; and An X-axis flip unit is configured to grasp an object along the X-axis direction and rotate the object around the X-axis. The object inspection device further includes: a transfer unit that moves in the Z-axis direction relative to the Y-axis flip unit, is configured to support the object grasped by the Y-axis flip unit, and transfers the object in the X-axis direction; An X-axis flip lift driving unit, which can move the X-axis flip unit relative to the Y-axis flip unit along the Z-axis direction. The Y-axis flip unit includes: a pair of Y-axis supports, wherein the pair of Y-axis supports are configured to grasp the object in the Y-axis direction; The pair of Y-axis supports respectively include: a supporting clamping portion, the supporting clamping portion being configured to protrude in the Y-axis direction and to engage one end of the object in the Z-axis direction; and The auxiliary clamping portion is configured to be movable in the Y-axis direction relative to the supporting clamping portion, and the auxiliary clamping portion moves in the Y-axis direction to hook or release the other end of the object.

2. The object inspection device according to claim 1, wherein: The imaging device is configured to move along the Y-axis direction.

3. The object inspection device according to claim 1, wherein: The Y-axis flip unit also includes: a pair of main body frames, the pair of main body frames being configured to move toward each other in a narrowing or expanding manner along the Y-axis direction; and A Y-axis flip base, the Y-axis flip base supports the pair of main frames, The pair of Y-axis brackets are supported by the corresponding pair of main body frames and are configured to rotate around the Y-axis relative to the pair of main body frames. The X-axis flip unit includes: a pair of side frames configured to move toward or away from each other along the X-axis direction; An X-axis flip base, the X-axis flip base supporting the pair of side frames; and A pair of X-axis brackets are supported by the corresponding pair of side frames and are configured to rotate relative to the pair of side frames around the X-axis and to be able to grasp the object therebetween.

4. The object inspection device according to claim 1, wherein: The first flipping device and the second flipping device respectively include: A Z-axis lifting unit is configured to support the at least one flip unit and to lift the at least one flip unit along the Z-axis direction.

5. The object inspection device according to claim 1, wherein Also included is a camera frame that movably supports the camera.

6. A method for inspecting an object, the method utilizing the object inspection apparatus according to claim 1, the method comprising: a first object inspection step in which the first turning device rotates the first object and the imaging device inspects an object surface of the first object; and a second object inspection step in which the second flipping device rotates the second object and the imaging device inspects an object surface of the second object during the first object inspection step; During the first object inspection step and the second object inspection step, the imaging device moves from one of a position capable of inspecting the first object grasped by the first flipping device and a position capable of inspecting the second object grasped by the second flipping device to the other at least once.

7. The object inspection method according to claim 6, wherein: During the first object inspection step and the second object inspection step, the imaging device inspects the target surface of the first object and the target surface of the second object alternately.

8. The object inspection method according to claim 6, wherein: The first object inspection step and the second object inspection step each include: An initial inspection step in which the pair of Y-axis supports grasp the corresponding object along the Y-axis direction, and the camera device inspects the object surface (A) of the corresponding object; and The pair of Y-axis brackets rotate the corresponding object around the Y-axis, and the camera device inspects the object surface (B1) perpendicular to the corresponding object surface (A) and the object surface (B2) on the opposite side of the corresponding object surface (B1); During the initial inspection step of the first object and the Y-axis rotation inspection step of the first object, the initial inspection step of the second object is performed.

9. The object inspection method according to claim 8, wherein: During the Y-axis rotation inspection step of the first object, the imaging device moves at least once between a position capable of inspecting the first object grasped by the first flipping device and a position capable of inspecting the second object grasped by the second flipping device.

10. The object inspection method according to claim 6, wherein: The first object inspection step and the second object inspection step each include: An initial inspection step in which the pair of Y-axis supports grasp corresponding objects along the Y-axis direction, and the camera device inspects an object surface (A) of the corresponding object; The pair of Y-axis brackets rotate the corresponding object around the Y-axis, and the camera device inspects the Y-axis rotation inspection step of the object surface (B1) perpendicular to the corresponding object surface (A) and the object surface (B2) which is the surface on the opposite side of the corresponding object surface (B1); and The corresponding X-axis bracket grasps the corresponding object along the X-axis direction and rotates the corresponding object around the X-axis, and the camera device inspects the object surface (B3) perpendicular to the corresponding object surface (A) and the object surface (B4) opposite to the corresponding object surface (B3); During the Y-axis rotation inspection step and the X-axis rotation inspection step of the second object, the camera device moves at least once between a position where the first object grasped by the first flipping device can be inspected and a position where the second object grasped by the second flipping device can be inspected.

11. The object inspection method according to claim 10, wherein: During the X-axis rotation inspection step of the first object, the imaging device moves at least once between a position capable of inspecting the first object grasped by the first inverting device and a position capable of inspecting the second object grasped by the second inverting device.

12. The object inspection method according to claim 10, wherein: The first object inspection step and the second object inspection step each include: After the X-axis rotation inspection step, the pair of Y-axis supports grasp the corresponding object along the Y-axis direction, and the camera device inspects the back surface of the object surface (C) which is the surface opposite to the corresponding object surface (A); During the X-axis rotation inspection step of the second object and the back surface inspection step of the second object, the back surface inspection step of the first object is performed.

13. The object inspection method according to claim 6, wherein: The first object inspection step and the second object inspection step each include: An initial inspection step in which the pair of Y-axis supports grasp corresponding objects along the Y-axis direction, and the camera device inspects an object surface (A) of the corresponding object; The pair of Y-axis brackets rotate the corresponding object around the Y-axis, and the camera device inspects the object surface (B1) perpendicular to the corresponding object surface (A) and the object surface (B2) on the opposite side of the corresponding object surface (B1); The pair of Y-axis supports grasp the corresponding object along the Y-axis direction, and the camera device inspects the back surface of the object surface (C) which is the surface opposite to the corresponding object surface (A); and a post-transferring step of transferring the corresponding object along the X-axis direction after the backside inspection step; During the back side inspection step of the first object and the subsequent transfer step of the first object, the camera device moves at least once between a position where the first object grasped by the first flipping device can be inspected and a position where the second object grasped by the second flipping device can be inspected.

Images