A quantum field strength probe and a microwave field strength measurement method

Abstract

The present application discloses a quantum field strength probe, which includes a first dark box, a second dark box, and a third dark box connected in sequence; the first dark box and the second dark box are connected through a first light hole; the second dark box and the third dark box are connected through a second light hole; the first dark box contains a first collimating lens, a second collimating lens, and a first dichroic mirror; the first dark box wall is equipped with a first fiber optic flange and a second fiber optic flange; the third dark box contains a third collimating lens, a fourth collimating lens, and a second dichroic mirror; the second dark box wall is equipped with a third fiber optic flange and a fourth fiber optic flange; the second dark box contains a first half-wave plate, an atomic vapor cell, and a second half-wave plate. The present application also includes a method for microwave measurement using the above-mentioned quantum field strength probe.

Description

Technical Field

[0001] This application relates to the field of microwave metrology, and particularly to a novel quantum field strength probe and a microwave field strength measurement method. Background Art

[0002] Microwave field strength measurement is of great significance in aspects such as microwave communication, remote sensing, and antenna calibration. Especially recently, with a wide variety of wireless devices in use and the high popularity of civilian radars, there is a high demand for the accuracy and sensitivity of microwave measurement. Compared with traditional microwave field strength measurement schemes, the quantum field strength method has high-sensitivity detection and also avoids the measurement errors introduced by the antennas of metal devices that are inevitably used in traditional schemes. Quantum field strength measurement is based on the large electric polarizability of Rydberg atoms. Currently, the microwave field strength measurement schemes based on the interaction between light and atoms are in the principle design stage, and there is no field strength measurement probe with specific executability based on industrial stabilization design. Summary of the Invention

[0003] Embodiments of this application provide a quantum field strength probe and a microwave field strength measurement method to solve the problem that there is no product of a field strength measurement probe in the prior art.

[0004] Embodiments of this application propose a quantum field strength probe, including a first dark box, a second dark box, and a third dark box connected in sequence;

[0005] The first dark box and the second dark box are connected through a first light hole; the second dark box and the third dark box are connected through a second light hole;

[0006] In the first dark box, there are a first collimating lens, a second collimating lens, and a first dichroic mirror; the first dark box wall is equipped with a first fiber optic flange and a second fiber optic flange; the optical path in the first dark box is: the light entering from the first fiber optic flange passes through the first collimating lens, the first dichroic mirror, and the first light hole and enters the second dark box; the light entering the first dark box from the first light hole passes through the first dichroic mirror, the second collimating lens, and the second fiber optic flange and is output to an external fiber optic;

[0007] In the third dark box, there are a third collimating lens, a fourth collimating lens, and a second dichroic mirror; the second dark box wall is equipped with a third fiber optic flange and a fourth fiber optic flange; the optical path in the second dark box is that the light entering from the third fiber optic flange passes through the third collimating lens, the second dichroic mirror, and the second light hole and enters the second dark box; the light entering the third dark box from the second light hole passes through the second dichroic mirror, the fourth collimating lens, and the fourth fiber optic flange and is output to an external fiber optic;

[0008] In the second dark box, there are a first half-wave plate, an atomic vapor cell, and a second half-wave plate. The light entering the second dark box from the first light hole passes through the first half-wave plate, the atomic vapor cell, the second half-wave plate, and the second light hole and then enters the third dark box. The light entering the second dark box from the second light hole passes through the second half-wave plate, the atomic vapor cell, the first half-wave plate, and the first light hole and then enters the first dark box.

[0009] Preferably, the first dark box, the second dark box, and the third dark box are made of non-metallic materials. Optimally, the casings of the first dark box, the second dark box, and the third dark box are made of polytetrafluoroethylene materials.

[0010] Preferably, a support structure for fixing the atomic vapor cell is included in the second dark box.

[0011] Further preferably, a transfer rod is included in the second dark box for fixedly connecting the first half-wave plate and the second half-wave plate to the support structure respectively.

[0012] In any embodiment of the present application, the first light hole, the first half-wave plate, the atomic vapor cell, the second half-wave plate, and the second light hole are concentric.

[0013] In any embodiment of the present application, the first dark box, the second dark box, and the third dark box are integrally formed and include a non-metallic material casing and a cover plate.

[0014] In any embodiment of the present application, the atomic vapor cell used is a cesium atomic vapor cell.

[0015] In any embodiment of the present application, when the detection light is accessed from the first fiber optic flange and the coupling light is accessed from the fourth fiber optic flange, the detection light enters the third dark box from the second light hole and the coupling light enters the first dark box from the first light hole. The first dichroic mirror is a dichroic mirror with high transmittance for the detection light and high reflectivity for the coupling light; the second dichroic mirror is a dichroic mirror with high reflectivity for the detection light and high transmittance for the coupling light.

[0016] The present application also proposes a method for measuring microwave field strength. Using the quantum field strength probe described in any embodiment of the present application, it includes the following steps:

[0017] Access the detection light from the first fiber optic flange and output it through the third fiber optic flange;

[0018] Access the coupling light from the fourth fiber optic flange and output it through the second fiber optic flange;

[0019] Perform microwave field strength measurement through the atomic vapor cell by utilizing the quantum effect of Rydberg atoms.

[0020] The above at least one technical solution adopted in the embodiments of the present application can achieve the following beneficial effects:

[0021] To address the deficiencies of traditional electrical and optical measurement solutions, the present invention can achieve the plug-and-play performance of the probe through a fiber optic interface. Additionally, its atomic-based measurement solution can trace its quantity value directly to the fundamental constants of metrology, offering the advantage of self-calibration. A novel quantum field strength probe design provided by this application is made of non-metallic materials insensitive to microwaves, significantly reducing the interference to the measured microwave field strength. At the same time, the internal mirrors and lenses of the probe adopt an integrated design, effectively reducing the volume of the probe. This probe has a high degree of integration and low interference to the measured microwave field strength. Using this novel quantum field strength probe, the field strength quantity value can be directly traced to the fundamental constants of metrology, with advantages such as low measurement uncertainty and self-calibration. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] The drawings described herein are used to provide a further understanding of this application and form a part of this application. The illustrative embodiments of this application and their descriptions are used to explain this application and do not constitute an improper limitation of this application. In the drawings:

[0023] Figure 1 Shows a schematic structural diagram of a novel quantum field strength probe of the present invention.

[0024] Reference numerals: 1, first fiber optic flange; 2, non-metallic material housing; 3, first collimating lens; 4, first dichroic mirror; 5, second collimating lens; 6, second fiber optic flange; 7, first 1 / 2 wave plate; 8, atomic vapor cell; 9, atomic vapor cell support structure; 10, adapter rod; 11, second 1 / 2 wave plate; 12, second dichroic mirror; 13, third collimating lens; 14, third fiber optic flange; 15, fourth collimating lens; 16, fourth fiber optic flange; 17, upper cover plate. DETAILED DESCRIPTION OF THE EMBODIMENTS

[0025] To make the objectives, technical solutions, and advantages of this application clearer, the technical solutions of this application will be clearly and completely described below in conjunction with specific embodiments of this application and the corresponding drawings. Obviously, the described embodiments are only a part of the embodiments of this application, rather than all of them. Based on the embodiments in this application, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the scope of protection of this application.

[0026] The following will describe in detail the technical solutions provided by each embodiment of this application in conjunction with the drawings.

[0027] An embodiment of this application provides a quantum field strength probe, including a first dark box, a second dark box, and a third dark box connected in sequence;

[0028] The first dark box and the second dark box are connected through a first light hole; the second dark box and the third dark box are connected through a second light hole;

[0029] The first dark box includes a first collimating lens 3, a second collimating lens 5, and a first dichroic mirror 4; the wall of the first dark box is provided with a first fiber optic flange 1 and a second fiber optic flange 6; the optical path in the first dark box is as follows: the light received from the first fiber optic flange enters the second dark box through the first collimating lens, the first dichroic mirror, and the first light hole; the light entering the first dark box from the first light hole passes through the first dichroic mirror, the second collimating lens, and the second fiber optic flange and is output to the external optical fiber;

[0030] The third dark box includes a third collimating lens 13, a fourth collimating lens 15, and a second dichroic mirror 12; the wall of the second dark box is provided with a third fiber optic flange 14 and a fourth fiber optic flange 16; the optical path in the second dark box is that the light received from the third fiber optic flange enters the second dark box through the third collimating lens, the second dichroic mirror, and the second light hole; the light entering the third dark box from the second light hole passes through the second dichroic mirror, the fourth collimating lens, and the fourth fiber optic flange and is output to the external optical fiber;

[0031] The second dark box includes a first 1 / 2 wave plate 7, an atomic vapor chamber 8, and a second 1 / 2 wave plate 11; the light entering the second dark box from the first light hole passes through the first 1 / 2 wave plate, the atomic vapor chamber, the second 1 / 2 wave plate, and the second light hole to enter the third dark box; the light entering the second dark box from the second light hole passes through the second 1 / 2 wave plate, the atomic vapor chamber, the first 1 / 2 wave plate, and the first light hole to enter the first dark box.

[0032] Preferably, the first dark box, the second dark box and the third dark box are made of non-metallic materials, and most preferably, the shells of the first dark box, the second dark box and the third dark box are made of polytetrafluoroethylene. The structural material of the fixed optical lens and the vapor chamber is selected from microwave-insensitive polytetrafluoroethylene material, which will greatly reduce the interference to the microwave field strength to be measured and greatly improve the accuracy of the measurement.

[0033] Preferably, the second dark box contains a support structure for fixing the atomic vapor chamber. Optimally, the support structure is an atomic vapor chamber fixture made of a polytetrafluoroethylene shell, which is convenient for installing and replacing atomic vapor chambers of different types.

[0034] Further preferably, the second dark box includes a transfer rod for fixing the first 1 / 2 wave plate and the second 1 / 2 wave plate to the support structure respectively. The first 1 / 2 wave plate and the second 1 / 2 wave plate each include a fixed portion and a rotating portion, and the transfer rod is fixedly connected to the fixed portion; the rotating portion is manually turned or driven by a motor, so that the first 1 / 2 wave plate and the second 1 / 2 wave plate can rotate around the axis of the atomic vapor chamber perpendicular to the optical path.

[0035] In any one embodiment of the present application, the first optical aperture, the first half-wave plate, the atomic vapor cell, the second half-wave plate, and the second optical aperture are concentric. Here, the atomic vapor cell is a cylindrical cavity structure.

[0036] In any one embodiment of the present application, the first dark box, the second dark box, and the third dark box are integrally formed and include a non-metallic material housing 2 and a cover plate 17. The cover plate 17 is used to seal the novel quantum field strength probe.

[0037] In any one embodiment of the present application, preferably, the atomic vapor cell used is a cesium atomic vapor cell.

[0038] In any one embodiment of the present application, when the probe light is accessed from the first fiber optic flange and the coupling light is accessed from the fourth fiber optic flange, the probe light enters the third dark box through the second optical aperture, and the coupling light enters the first dark box through the first optical aperture. The first dichroic mirror is a dichroic mirror with high transmittance for the probe light and high reflectance for the coupling light; the second dichroic mirror is a dichroic mirror with high reflectance for the probe light and high transmittance for the coupling light.

[0039] The present application also proposes a microwave field strength measurement method using the quantum field strength probe described in any one embodiment of the present application, including the following steps:

[0040] Step 10: Access the probe light from the first fiber optic flange and output it through the third fiber optic flange;

[0041] Step 20: Access the coupling light from the fourth fiber optic flange and output it through the second fiber optic flange;

[0042] As Figure 1 shown, after the probe light is input into the first fiber optic flange 1, it is collimated and output through the first collimating lens 3, and then passes through the first dichroic mirror 4 and the first half-wave plate 7 and enters the atomic vapor cell 8. The probe light and the coupling light are transmitted in opposite directions, and the atoms in the atomic vapor cell 8 are excited to the Rydberg state through two-photon excitation. Subsequently, the probe light passes through the second half-wave plate 11, and then is reflected by the second dichroic mirror 12 and enters the third collimating lens 13 to be coupled into the third fiber optic flange 14 for output.

[0043] After the coupling light is input into the fourth fiber optic flange 16, it is collimated and output through the fourth collimating lens 15, and then passes through the second dichroic mirror 12 and the second half-wave plate 11 and enters the atomic vapor cell 8. The coupling light and the probe light are transmitted in opposite directions, and the atoms in the atomic vapor cell 8 are excited to the Rydberg state through two-photon excitation. Subsequently, the coupling light passes through the first half-wave plate 7, and then is reflected by the first dichroic mirror 4 and enters the second collimating lens 5 to be coupled into the second fiber optic flange 6 for output.

[0044] Step 30: Pass through the atomic vapor cell and use the quantum effect of Rydberg atoms to measure the microwave field strength.

[0045] Further, this step further includes rotating the first half-wave plate and / or the second half-wave plate concentrically with the axis of the cylindrical cavity structure of the atomic vapor cell, so as to enhance the reaction intensity of the atomic vapor cell.

[0046] The structural designs of the first darkroom, the second darkroom, and the third darkroom of this application prevent the first darkroom and the third darkroom from being affected by the scattered light of the atomic vapor cell, reducing the monitoring errors of the detection light and the coupling light output. At the same time, the structural design of this application enables the integrated installation of each component, improving the precision of the device.

[0047] It should also be noted that the term "comprises", "comprising", or any other variation thereof is intended to cover a non-exclusive inclusion, such that a process, method, commodity, or device that comprises a series of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such process, method, commodity, or device. Without further limitation, an element defined by the phrase "comprising an..." does not exclude the presence of additional identical elements in the process, method, commodity, or device that comprises the element.

[0048] The above are only the embodiments of this application and are not used to limit this application. For those skilled in the art, various changes and modifications can be made to this application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of this application shall be included within the scope of the claims of this application.

Claims

1. A quantum field strength probe, characterized in that, Including a first light-tight box, a second light-tight box, and a third light-tight box connected in sequence; The first light-tight box and the second light-tight box are connected through a first light hole; the second light-tight box and the third light-tight box are connected through a second light hole; In the first light-tight box, there are a first collimating lens, a second collimating lens, and a first dichroic mirror; on the wall of the first light-tight box, there are a first fiber optic flange and a second fiber optic flange; the optical path in the first light-tight box is as follows: the light entering from the first fiber optic flange passes through the first collimating lens, the first dichroic mirror, and the first light hole and enters the second light-tight box; the light entering the first light-tight box from the first light hole passes through the first dichroic mirror, the second collimating lens, and the second fiber optic flange and is output; In the third light-tight box, there are a third collimating lens, a fourth collimating lens, and a second dichroic mirror; on the wall of the second light-tight box, there are a third fiber optic flange and a fourth fiber optic flange; the optical path in the second light-tight box is as follows: the light entering from the third fiber optic flange passes through the third collimating lens, the second dichroic mirror, and the second light hole and enters the second light-tight box; the light entering the second light-tight box from the second light hole passes through the second dichroic mirror, the fourth collimating lens, and the fourth fiber optic flange and is output; In the second light-tight box, there are a first half-wave plate, an atomic vapor cell, and a second half-wave plate; the light entering the second light-tight box from the first light hole passes through the first half-wave plate, the atomic vapor cell, the second half-wave plate, and the second light hole and enters the third light-tight box; the light entering the third light-tight box from the second light hole passes through the second half-wave plate, the atomic vapor cell, the first half-wave plate, and the first light hole and enters the first light-tight box; The shells of the first light-tight box, the second light-tight box, and the third light-tight box are made of polytetrafluoroethylene material.

2. The quantum field strength probe according to claim 1, characterized in that, Inside the second light-tight box, there is a support structure for fixing the atomic vapor cell.

3. The quantum field strength probe according to claim 2, wherein Inside the second light-tight box, there is a transfer rod for fixedly connecting the first half-wave plate and the second half-wave plate to the support structure respectively.

4. The quantum field strength probe according to any one of claims 1 to 3, characterized in that The first light hole, the first half-wave plate, the atomic vapor cell, the second half-wave plate, and the second light hole are concentric.

5. The quantum field strength probe according to any one of claims 1 to 3, characterized in that, The first light-tight box, the second light-tight box, and the third light-tight box are integrally formed, including a non-metallic material shell and a cover plate.

6. The quantum field strength probe according to any one of claims 1 to 3, characterized in that, The atomic vapor cell uses a cesium atomic vapor cell.

7. For the quantum field strength probe according to any one of claims 1 to 3, when the detection light is accessed from the first fiber optic flange and the coupled light is accessed from the fourth fiber optic flange, the detection light enters the third dark box through the second light hole and the coupled light enters the first dark box through the first light hole, characterized in that The first dichroic mirror is a dichroic mirror with high transmittance for detection light and high reflectance for coupling light.

8. The quantum field strength probe according to any one of claims 1 to 3, characterized in that ,, when the detection light is accessed from the first fiber optic flange and the coupling light is accessed from the fourth fiber optic flange, the detection light enters the third light-tight box from the second light hole and the coupling light enters the first light-tight box from the first light hole. It is characterized in that the second dichroic mirror is a dichroic mirror with high reflectance for detection light and high transmittance for coupling light.

9. A method for measuring microwave field strength, using the quantum field strength probe described in any one of claims 1 to 8, characterized in that, Including the following steps: Access the detection light from the first fiber optic flange and output it from the third fiber optic flange; Access the coupling light from the fourth fiber optic flange and output it from the second fiber optic flange; Through the atomic vapor cell, use the quantum effect of Rydberg atoms to measure the microwave field strength.

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