Method for providing antenna probe array in compact anechoic chamber for over-the-air testing of active and passive antennas

Abstract

The disclosed exemplary apparatus, systems, and methods provide at least two implementations of synchronized antenna probe arrays. These antenna probe arrays can be used to generate and receive RF signals in a compact anechoic chamber for over-the-air antenna testing or other applications such as a far-field antenna test chamber. A compact anechoic chamber for over-the-air antenna testing may include at least: a chamber housing; an interchangeable radiation test panel that is integral to the chamber; a plurality of absorbent materials that at least partially line the interior of the chamber and are capable of directing the radiation; at least one movable cart that is suitable for moving and removing the antenna from the chamber; at least one panel interface for interconnecting the antenna with a test device, wherein the antenna's response to the radiation is transmitted to the test device via the panel interface; and at least one switch matrix for multiplexing portions of the test signal.

Description

[0001] CROSS-REFERENCE TO RELATED APPLICATIONS

[0002] This application claims the benefit of priority to U.S. Application No. 16 / 362,409, filed on March 22, 2019, entitled “METHOD FOR PROVIDING A COMPACT ANECHOIC CHAMBER FOR ACTIVE AND PASSIVE ANTENNA OVER-THE-AIR TESTING,” which claims the benefit of priority to U.S. Provisional Application No. 62 / 729,687, filed on September 11, 2018, entitled “METHOD FOR PROVIDING A COMPACT ANECHOIC CHAMBER FOR ACTIVE AND PASSIVE ANTENNA OVER-THE-AIR TESTING,” the entire contents of which are incorporated herein by reference as if set forth in their entirety. Technical Field

[0003] The present disclosure relates to antenna testing, and more particularly, to apparatus, systems, and methods for providing antenna probe arrays for over-the-air testing of active and passive antennas in compact anechoic chambers. Background Art

[0004] A Remote Radio Head (RRH) in a wireless network is a remote radio transceiver that is connected to an operator radio control panel, for example, via a wireless interface such as a passive antenna. In wireless systems such as GSM / CDMA, UMTS, LTE, and 5G New Radio (NR) systems, the RRH devices are located remotely from a base transceiver station (BTS) / NodeB / eNodeB, respectively. BTS / NodeB / eNodeB (hereinafter collectively referred to as "BTS") is a device that facilitates wireless communication between user equipment and the corresponding wireless network. RRH devices are used to extend the coverage of the BTS.

[0005] The RRH is an important subsystem of many current distributed BTSs. The RRH contains the RF circuitry of the BTS, analog-to-digital / digital-to-analog converters, up / down converters, operation and management processing capabilities, and standardized interfaces, as well as various other parts. In contrast to most passive antennas used in wireless networks, active antenna systems (AAS) are antennas that contain active electronic components. AAS allow antennas of limited size to have a specific frequency range (i.e., bandwidth) and antenna pattern compared to passive antennas.

[0006] Beamforming for the antenna may be provided by active antenna components. For example, the active components may include at least an impedance transformation stage and an optional amplification stage.

[0007] For example, the wireless industry has recently moved from RRH to AAS. In December 2017, the 3GPP standards body released the official AAS standard. The differences between typical RRH and AAS antenna systems refer to Figure 1 Provide explanation. Summary of the invention

[0008] The disclosed exemplary apparatus, systems, and methods provide at least two implementations of synchronized antenna probe arrays. These antenna probe arrays can be used to generate and receive RF signals in a compact anechoic chamber for aerial antenna testing, or for other applications such as a far-field antenna test chamber. A compact anechoic chamber for aerial antenna testing may include at least: a chamber housing; an interchangeable radiation test panel that is integral to the chamber; a plurality of absorbent materials that at least partially line the interior of the chamber and are capable of directing the radiation; at least one movable cart that is suitable for moving and removing the antenna from the chamber; at least one panel interface for interconnecting the antenna with the test equipment, wherein the antenna's response to the radiation is transmitted to the test equipment via the panel interface; and at least one switch matrix for multiplexing some of the test signals. BRIEF DESCRIPTION OF THE DRAWINGS

[0009] The disclosed non-limiting embodiments are discussed with respect to the accompanying drawings, which form a part hereof, wherein like reference numerals represent like elements, and wherein:

[0010] Figure 1 are illustrations of various aspects of an embodiment;

[0011] Figure 2 are illustrations of various aspects of an embodiment;

[0012] Figure 3 are illustrations of various aspects of an embodiment;

[0013] Figure 4 are illustrations of various aspects of an embodiment;

[0014] Figure 5 are illustrations of various aspects of an embodiment;

[0015] Figure 6 are illustrations of various aspects of an embodiment;

[0016] Figure 7 are illustrations of various aspects of an embodiment;

[0017] Figure 8 are illustrations of various aspects of an embodiment;

[0018] Fig. 9are illustrations of various aspects of an embodiment;

[0019] Fig.10 are illustrations of aspects of embodiments; and

[0020] Fig.11 An exemplary computing system is shown. DETAILED DESCRIPTION

[0021] The accompanying drawings and descriptions provided herein may have been simplified to illustrate the aspects related to the device, system and method described herein, and for the sake of clarity, other aspects that can be found in typical similar equipment, system and method have been eliminated. Therefore, those skilled in the art will recognize that other elements and / or operations may be desirable and / or necessary for realizing the device, system and method described herein. But because such elements and operations are known in the art, and because they do not promote a better understanding of the present disclosure, for the sake of brevity, the discussion of such elements and operations may not be provided herein. However, the present disclosure is considered to still include all such elements, variations and modifications to the described aspects known to those of ordinary skill in the art.

[0022] Embodiments are provided throughout the text so that the present disclosure is fully thorough and the scope of the disclosed embodiments is fully conveyed to those skilled in the art. Many specific details, such as examples of specific parts, devices and methods, are set forth to provide a thorough understanding of the embodiments of the present disclosure. However, it is apparent to those skilled in the art that certain specific disclosed details do not need to be adopted, and embodiments may be provided in different forms. Therefore, the embodiments should not be construed as limiting the scope of the present disclosure. As described above, in some embodiments, known processes, known device structures and known technologies may not be described in detail.

[0023] The terms used herein are only for the purpose of describing specific embodiments, rather than being intended to be limiting. For example, as used herein, the singular forms "one", "an" and "the" may also be intended to include plural forms unless the context clearly indicates otherwise. The terms "include", "comprise", "contain", and "have" are inclusive, and therefore specify the presence of the features, integers, steps, operations, elements and / or parts, but do not exclude the presence or addition of one or more other features, integers, steps, operations, elements, parts and / or their groups. Unless specifically determined to be a preferred or required execution order, the steps, processes and operations described herein should not be interpreted as necessarily requiring them to be performed in the specific order discussed or shown. It should also be understood that additional or alternative steps may be used to replace the disclosed aspects or to be combined with the disclosed aspects.

[0024] When an element or layer is referred to as being "on," "engaged to," "connected to," or "coupled to" another element or layer, unless otherwise clearly indicated, it may be directly on, engaged to, connected to, or coupled to another element or layer, or there may be intermediate elements or layers. Conversely, when an element is referred to as being "directly on," "directly engaged to," "directly connected to," or "directly coupled to" another element or layer, there may be no intermediate elements or layers. Other words used to describe the relationship between elements should be interpreted in a similar manner (e.g., "between" versus "directly between," "adjacent" versus "directly adjacent," etc.). In addition, as used herein, the term "and / or" includes any and all combinations of one or more associated listed items.

[0025] In addition, although the term first, second, third etc. can be used to describe various elements, components, regions, layers and / or parts here, these elements, components, regions, layers and / or parts should not be limited by these terms. These terms are only used to distinguish an element, component, region, layer or part from another element, component, region, layer or part. Unless the context clearly indicates, the terms such as "first", "second" and other numerical terms do not imply order or sequence when used in this article. Therefore, without departing from the teaching of the embodiment, the first element, component, region, layer or part discussed below can be referred to as the second element, component, region, layer or part.

[0026] As mentioned above, an AAS has greater complexity than an RRH system using passive antennas. For example, an AAS may have 10-20 times more transmit / receive paths than an RRH; may include an integrated lower physical layer design with decision feedback equalization for the cellular radio channel, as well as radio equipment and antennas in a single unit - all of which require complex soldering and assembly; must use a large printed circuit board (PCB); requires testing of antenna radiation and beamforming patterns; uses significant supply power; and requires calibration for specific use cases. Regarding the PCB 202, antenna 204, and power supply 206 in a typical AAS 200, Figure 2 Several of these complexities are illustrated, however, despite the adoption of AAS in the recently finalized antenna specifications for 5G and 3GPP as described above, there is currently no solution that can conveniently test many of the complexities unique to AAS as described above.

[0027] Over-the-air (OTA) testing of antennas is designed to test the radiation characteristics of antennas through the air. Although for most wireless communication applications, such as those used in BTS, the far-field characteristics of antennas are of primary concern, for reasons of cost and efficiency, many of the complexities mentioned above are typically chosen to be tested in the near field, and the far-field characteristics are only derived and approximated from the near-field test data. This is largely due to the lack of suitable far-field test systems as described above.

[0028] More specifically, the chamber size required for testing far-field antenna characteristics in the known art is about 10 times larger than the near-field chamber, and about 10 times larger than the far-field test chamber disclosed in the current embodiment. The occupied area alone may make such testing inoperable in the fast production line technology of existing radio products, which is a shortcoming remedied in the embodiments.

[0029] Furthermore, to the extent available, the more compact test chambers of the known art typically include only one type of measurement probe or very few measurement probes. As will be appreciated by those skilled in the art, testing in such compact chambers of the known art is therefore very slow, is grossly inadequate for many test characteristics, is inadequate for measuring most of the complexities in the far-field characteristics mentioned above, and requires manual movement of the antenna under test.

[0030] Due to the above-mentioned deficiencies in available testing, antenna system manufacturers often completely avoid testing antennas for OTA performance during production. Not to mention, this leads to a high probability of failure of the antenna, or at least unacceptably poor performance, upon installation, especially in unique usage scenarios and environments. This, of course, increases the likelihood of costly product recalls and / or removal and replacement after deployment.

[0031] Figure 3 The far field 302 of an AAS antenna array 308 having a maximum size D is shown in relation to the induced near field 304 and the radiated near field 306. Figure 3 , λ=c / f is the wavelength of the antenna's transmitted / received signal, and R is the radiation field range.

[0032] More specifically, embodiments provide a test chamber, such as a compact anechoic test chamber, suitable for testing at least the above-described characteristics of AAS and passive antennas within a test frequency range of approximately 1.8 GHz-6 GHz. Embodiments include at least near-field and far-field test chambers that are small enough in overall footprint to allow installation of multiple groups along a conventional radio product production line.

[0033] As an example, the tests provided in the disclosed test chamber may include: echo-free radiation and beamforming coverage tests for: 3D far-field directivity (co-polar and cross-polar); directivity; half-power beamwidth; boresight direction; peak sidelobe level distribution and RMS sidelobe level; parasitic signal generation; switching time-scanned beams; and effective radiated power (ERP). The test chamber may include multiple probes suitable for testing the above characteristics, and these multiple probes may be organized into an array and linked to a multi-channel instrument platform (e.g., an arbitrary waveform generator, a spectrum analyzer, and / or a network analyzer).

[0034] The test chamber may include, for example, a planar or cylindrical test array assembly structure. More specifically, the size and shape of the chamber may be designed to accommodate one or more mechanisms to move an antenna under test (AUT) having a weight of or greater than 100 Kg and a performance within a range of approximately 1.5 m*0.8 m*0.3 m into and out of the chamber for testing. The mechanism may also optionally be included to lock the relative position between the AUT and the multi-channel probe applied as mentioned above.

[0035] Figure 4 A side view of an exemplary test chamber 400 with a planar probe array 402 is shown. The inner walls of the chamber may be covered with RF absorbing material 404, which may be anechoic, for example. The RF signal probes (and other types of probes for that matter) are arranged in a 2D probe array 402, which may be larger than the AUT 408.

[0036] The AUT 408 can be located on a cart 410 that slides in and out of the chamber 400 on at least two cart tracks 412, an arrangement that allows the AUT 408 to be physically placed under the probe array. The AUT 408 can be moved in and out along the cart tracks 412 and can be easily and accurately locked in a fixed position.

[0037] The cable trough / interface 414 allows the cables of the antenna 408 to be led out of the chamber 400 to external test equipment, and / or may allow the test equipment cables to be permanently attached to the chamber. Thereafter, the cables of the antenna 408 may be simply associated with the test equipment, such as through a plurality of ports within the chamber as part of the cable trough 414 shown, so that the test data generated by the actuation of the probe array 402 may be passed from the antenna or from the sensor within the chamber to the test equipment outside the chamber.

[0038] Movement of the cart along the track, actuation of the probe array, and / or monitoring of the cable tray test data may be performed by one or more software programs 1190, as discussed herein, for example, under the control of one or more control systems 1100. The control system 1100 may store or transmit data locally or remotely for accumulation, as will be appreciated by those skilled in the art.

[0039] Figure 5 A top view of a planar test chamber 400 is shown. As shown, the probe array 402 may include at least partially removable and / or interchangeable panels 402a. Thus, replaceable probe array panels 402a and / or portions thereof may be switched in and out of the chamber 400 to appropriately test a variety of different antennas 408, such as by having different probe spacings or probe types on each probe panel for different AUTs.

[0040] Figure 6 A rear view of an embodiment of a planar test chamber 400 is shown. Note that while the movement and locking of the carts / AUTs 410, 408 may be automated or manual as described above, doors 610 may be included at either or both ends of the chamber 400, as shown. These doors 610 may allow for easy access and loading / unloading of the AUTs 408 and / or circuitry within the chamber, including the panels / cable troughs 414.

[0041] Figure 7 FIG. 7 is a diagram of a cylindrical test chamber 700 according to an embodiment. Figure 7 As shown, the cylindrical test chamber 700 may also provide a cart 710 and cart tracks 712 for the AUT 408, but with a probe array 702 in a semicircular / spherical / cylindrical arrangement provided in a manner surrounding the AUT 408. The cylindrical test chamber 700 may allow the AUT to be tested over a wide range of characteristics and frequencies and with greater accuracy. Figure 8 It is shown that a test chamber 800 according to an embodiment may be movable, for example via wheels 802 and axles 804 associated therewith, for example at its lower portion.

[0042] Existing solutions for OTA antenna testing are typically based on a single or a few measurement probes, as described above, and / or based on a single test source / receiver. As a result, testing of antenna radiation characteristics at least typically involves extensive movement of the AUT around and under various antenna probes, which results in long AUT test times and large and expensive mechanical equipment required to perform the tests. In contrast, as described throughout, embodiments provide an antenna test probe array with the ability to simultaneously capture / transmit various RF signals in a single coverage area.

[0043] More specifically, the disclosed antenna probe array (APA) discussed throughout the text may include a collection (or various interchangeable subsets) of radio frequency radiating elements arranged in an array on a 2D surface or a 3D surface. The disclosed APA elements transmit or receive electromagnetic waves through the air at multiple locations in the geometric space covered by the APA. These transmissions and receptions may be asynchronous, selected probes may be synchronized, or all probes may be synchronized, such as in response to an algorithm 1190 executed by a control system 1100 described throughout the text.

[0044] An APA control system 1100, according to an embodiment: can allow all probes to be connected to an RF transmitter or receiver, for example through an RF switch, for antenna radiation or reception performance testing; can have two (or more) RF switch matrices between the APA and the signal generation and signal measurement instruments (which can be interconnected to or connected through the interface panel / slot described throughout the text), which switch matrix can allow the test system to activate only a portion of the APA at a time, or activate all probes at the same time; can use a calibration path from the control system through all probes to synchronize the transmission and reception of the probes; and can connect the probes to a multi-channel arbitrary waveform generator (AWG) or a signal analyzer that is capable of generating and capturing RF signals from an orthogonal (IQ) baseband waveform and / or generating and capturing RF signals to an orthogonal baseband waveform, or can connect the probes to an array of low-cost noise sources and power meters.

[0045] The equipment to produce such tests may be at least partially external to the test chamber, as discussed herein. Likewise, data indicative of test results for the antenna may be produced external to the chamber, such as using an interface slot as discussed herein.

[0046] The above operations are generally performed by a processor-based control system 1100 in communicative association with the APA. As non-limiting examples, the electrical functions of the APA may be implemented using a separate signal generating and analyzing device or using an integrated multi-channel transceiver.

[0047] Fig. 9 900 is a block diagram of an APA test system 900 having separate signal generators 902 and receivers / analyzers 904. In this exemplary embodiment, there are N probes in the array. The N probes are connected to N RF switches for transmit (Tx) and receive (Rx) test options. The switches connect the probes to a signal generating instrument for receiver performance testing of the AUT or to a signal analyzing instrument for transmitter performance testing of the AUT, for example, which may be located on opposite sides of the interface slot.

[0048] Fig. 9Two RF switch matrices 906a, b are shown between the probes and the signal generation and analysis instruments. The M input and N output (M×N) switch matrix allows M signals from the signal generator to be routed to any selected M probes in the N probe arrays. Similarly, the N input and L output (N×L) matrix allows selected L signals from the probe array to be routed to L signal analyzers. The aforementioned switching, generation, and capture actions can be controlled by the aforementioned processor-based control system 1100.

[0049] In order to realize synchronous signal transmission or reception for active probes, a serial feedback network can couple the signals at all probes. The feedback network can be connected to the signal generation module and the signal analysis module through a series of, for example, four calibration ports. Each transmission path from the AWG to the probe and through the feedback coupling network to the two ports on the signal digital converter can form two closed loops. In some embodiments, by controlling the transmission start time and the capture start time, the time required for the transmission signal to pass through the loop can be estimated by utilizing the correlation between the transmitted data and the captured data. Since the transmission signal passes through the same feedback path, the difference between the transmission paths can be estimated and compensated in the signal generator.

[0050] Similarly, the signals from the two Rx calibration ports on the AWG through the feedback coupling network to each probe and to the receive path on the signal digitizer can form two closed loops. In an exemplary embodiment, by sending calibration data from the Rx calibration port and capturing the data at the digitizer, the time required for the signal to travel through the loop can be estimated. Since the calibration data reaches the probe array through the same calibration path, the differences between the receive paths can be estimated and compensated in the signal digitizer. It is worth noting that in some embodiments, the foregoing may require the AWG and the signal digitizer to share the same reference clock to allow the foregoing synchronization of data transmission and capture.

[0051] Fig.10 is a block diagram of an APA tester 1000 with a multi-channel transceiver 1002 as its signal generation and analysis module. In this case, the N probes in the array are connected to an M×N RF switch matrix 1004 to allow M signals to be transmitted from the transceiver to any selected M probes in the probe array. In the transceiver module, there are M RF switches to connect external signals with the transmitter or receiver for Rx or Tx performance testing of the AUT. The aforementioned switching, generation and capture actions can be controlled by a processor-based control system. Synchronization and calibration of the Tx and Rx paths can be performed as described above.

[0052] Fig.11An exemplary computing system 1100 for use in conjunction with the systems and methods described herein is depicted. The computing system 1100 is capable of executing software, such as an operating system (OS) and / or one or more computing applications / algorithms 1190, such as an application that applies the testing algorithms discussed herein, and can execute such applications 1190 using data, such as material and process-related data, which can be stored locally or remotely 1115.

[0053] More particularly, the operation of the exemplary computing system 1100 is primarily controlled by an algorithm 1190 that includes computer-readable instructions, such as instructions stored in a computer-readable storage medium, such as a hard disk drive (HDD) 1115, an optical disk such as a CD or DVD (not shown), a solid-state drive such as a USB "thumb drive" (not shown), etc. These instructions may be executed within a central processing unit (CPU) 1110 to cause the computing system 1100 to perform the operations discussed throughout this document. In many known computer servers, workstations, personal computers, etc., the CPU 1110 is implemented in an integrated circuit called a processor.

[0054] It will be appreciated that although exemplary computing system 1100 is shown as including a single CPU 1110, this description is merely illustrative, as computing system 1100 may include multiple CPUs 1110. Additionally, computing system 1100 may utilize resources of a remote CPU (not shown), such as via communications network 1170 or some other data communications means.

[0055] In operation, the CPU 1110 obtains, decodes and executes instructions from a computer-readable storage medium, such as an HDD 1115. Such instructions may be included in software, such as an operating system (OS), executable programs such as the above-mentioned related applications, etc. Information such as computer instructions and other computer-readable data is transmitted between components of the computing system 1100 via the system's main data transmission path. The main data transmission path can use the system bus architecture 1105, although other computer architectures (not shown) can be used, such as an architecture that uses serializers and deserializers and crossbar switches to transmit data between devices through a serial communication path. The system bus 1105 may include data lines for sending data, address lines for sending addresses, and control lines for sending interrupts and for operating the system bus. Some buses provide bus arbitration, which regulates access to the bus through expansion cards, controllers, and CPU 1110.

[0056] Memory devices coupled to the system bus 1105 may include random access memory (RAM) 1125 and / or read-only memory (ROM) 1130. Such memory includes circuits that allow information to be stored and retrieved. ROM 1130 typically contains stored data that cannot be modified. Data stored in RAM 1125 can be read or changed by CPU 1110 or other hardware devices. Access to RAM 1125 and / or ROM 1130 can be controlled by memory controller 1120. Memory controller 1120 can provide an address translation function that converts virtual addresses into physical addresses when executing instructions. Memory controller 1120 can also provide a memory protection function that isolates processes within the system and isolates system processes from user processes. Therefore, a program running in user mode can typically only access memory mapped by its own process virtual address space; in this case, the program cannot access memory within the virtual address space of another process unless memory sharing between processes has been established.

[0057] In addition, computing system 1100 may include a peripheral communication bus 1135, which is responsible for transmitting instructions from CPU 1110 to peripheral devices and / or receiving data from peripheral devices, such as peripheral devices 1140, 1145, and 1150, which may include a printer, keyboard, and / or sensors discussed throughout this document. An example of a peripheral bus is a peripheral component interconnect (PCI) bus.

[0058] The display 1160 controlled by the display controller 1155 can be used to display visual output and / or other presentations generated by or at the request of the computing system 1100 in response to the operation of the above-mentioned computing program, such as in the form of a GUI. Such visual output may include, for example, text, graphics, animated graphics and / or video. The display 1160 can be implemented with a CRT-based video display, an LCD or LED-based display, a gas plasma-based flat panel display, a touch panel display, etc. The display controller 1155 includes the electronic components required to generate the video signal sent to the display 1160.

[0059] In addition, the computing system 1100 may include a network adapter 1165, which may be used to couple the computing system 1100 to an external communication network 1170, which may include or provide access to the Internet, an intranet, an extranet, etc. The communication network 1170 may provide the computing system 1100 with a means for users to access, communicate and transfer software and information electronically. In addition, the communication network 1170 may provide distributed processing involving several computers and the sharing of workload or collaborative work in performing tasks. It will be appreciated that the network connections shown are exemplary, and other means of establishing a communication link between the computing system 1100 and a remote user may be used.

[0060] The network adapter 1165 may use any available wired or wireless technology to communicate with the network 1170. As non-limiting examples, such technologies may include cellular, Wi-Fi, Bluetooth, infrared, etc.

[0061] It is understood that the exemplary computing system 1100 only illustrates a computing environment in which the systems and methods described herein can operate, and does not limit the implementation of the systems and methods described herein in computing environments with different components and configurations. That is, the inventive concepts described herein can be implemented in various computing environments using various components and configurations.

[0062] In the foregoing detailed description, various features may be grouped together in various embodiments for the purpose of streamlining the disclosure. This method of disclosure should not be interpreted as reflecting an intention that any subsequently claimed embodiment requires more features than expressly recited.

[0063] In addition, the description of the present disclosure is provided to enable any person skilled in the art to make or use the disclosed embodiments. Various modifications to the present invention will be readily apparent to those skilled in the art, and the general principles defined herein may be applied to other variations without departing from the spirit or scope of the present invention. Therefore, the present disclosure is not intended to be limited to the examples and designs described herein, but should conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A compact anechoic chamber for aerial antenna testing, comprising: a chamber housing; at least two interchangeable radiation test board arrays for providing radiation signals for testing, interchangeably integrated into the chamber; a plurality of absorbing materials lining at least the interior of the chamber and capable of guiding the radiation signal; at least one panel interface for interconnecting at least two interchangeable radiation test board array antennas with a multi-channel signal generation system of a test device located outside the chamber housing through at least one RF signal switch to provide said radiation signal; and for interconnecting the antenna with a multi-channel signal analysis system of the test equipment through the at least one RF signal switch, wherein the multi-channel signal analysis system is synchronized with the multi-channel signal generation system to enable evaluation of a response of the antenna to the radiated signal; as well as a feedback loop in communication with both the multi-channel signal generation system and the multi-channel signal analysis system and capable of controlling the synchronization; The at least one RF signal switch includes two RF signal switches, and wherein a first RF signal switch of the two RF signal switches interconnects the multi-channel signal generation system with the at least two interchangeable radiation test board array antennas, and a second RF signal switch of the two RF signal switches connects the antenna with the multi-channel signal analysis system; The compact anechoic chamber further includes at least one movable cart adapted to move and remove the antenna from the chamber.

2. The compact anechoic chamber according to claim 1, wherein: The chamber housing includes a planar upper interior surface, and the radiation testing panel array is conformal to the planar upper interior surface.

3. The compact anechoic chamber according to claim 1, wherein: The chamber housing includes a curved upper interior surface, and the array of radiation testing panels conforms to the curved upper interior surface.

4. The compact anechoic chamber of claim 1, wherein: Interchangeable portions of the radiation testing board array include variations in the dimensions of the radiation testing board array.

5. The compact anechoic chamber of claim 1, wherein: Interchangeable portions of the radiation testing board array include variations in characteristics of the radiation signal.

6. The compact anechoic chamber of claim 1, wherein: The absorbent material includes a sound-deadening material.

7. The compact anechoic chamber of claim 1, wherein: The physical width of the radiation test board array corresponds to the width of the antenna.

8. The compact anechoic chamber of claim 1, wherein: The physical length of the radiation test board array corresponds to the length of the antenna.

9. The compact anechoic chamber of claim 1, wherein: The testing includes near field pattern testing.

10. The compact anechoic chamber of claim 1, wherein: The testing includes far field pattern testing.

11. The compact anechoic chamber of claim 1, wherein: The at least one movable cart also includes cart tracks.

12. The compact anechoic chamber of claim 11, wherein: Movement of the at least one movable cart along the cart track is automated.

13. The compact anechoic chamber of claim 12, wherein: The moving includes pulling an actuation drive cable of the cart.

14. The compact anechoic chamber of claim 11, wherein: Movement of the at least one movable cart along the cart track is manual.

15. The compact anechoic chamber of claim 1, wherein: The panel interface includes a receptacle in the chamber housing.

16. The compact anechoic chamber of claim 15, wherein: The socket comprises a plug and play socket for receiving data from an antenna.

17. The compact anechoic chamber of claim 16, wherein: The plug and play socket is proprietary.

18. The compact anechoic chamber of claim 1, wherein: The test apparatus also includes at least one computer control system.

19. The compact anechoic chamber of claim 18, wherein: The control system also includes a control algorithm for actuating the array of radiation testing panels.

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