Embedded touch organic light emitting diode display device and testing method thereof

Abstract

The present invention relates to an embedded touch organic light emitting diode display device and a test method thereof. The display device includes: a pixel array, including a data line, a gate line, a plurality of pixels and a plurality of touch blocks; a plurality of test pads, arranged in a frame area outside the pixel array and selectively performing pixel tests and touch block tests; a plurality of pixel test lines and touch block test lines connected to the plurality of test pads and arranged inside the pixel array; a switch unit is arranged between the plurality of test pads and the plurality of pixel test lines and touch block test lines and applies a test signal to any one of the pixel test lines and the touch block test lines; a pixel test switch pad, arranged in the frame area and providing the switch unit with a control signal for testing pixel operations in the pixel array; a touch block test switch pad, arranged in the frame area and providing the switch unit with a control signal for testing touch blocks inside the pixel array.

Description

Technical Field

[0001] The present invention relates to an organic light emitting diode display device and a testing method thereof, and more particularly, to a display device and a testing method thereof that can realize a narrow frame by sharing a signal applying pad for a pixel test and a signal applying pad for a touch block test. Background Art

[0002] A touch screen panel is an input device that inputs a user command by selecting an instruction displayed on a screen of an image display device, etc., using a user's hand or an object. To this end, the touch screen panel may be provided on the front of the image display device to convert a contact point directly contacted by the user's hand or the object into an electrical signal so that an instruction selected at the contact point may be received as an input signal.

[0003] The touch screen panel does not require an additional input device such as a keyboard or a mouse, and thus is increasingly used. Recently, the touch screen panel has been widely used in flat panel displays such as liquid crystal displays and OLED display devices.

[0004] As methods of implementing a touch screen panel, there are known resistive overlay type, light sensing type, capacitive type, etc. Among them, a capacitive touch screen panel can convert a contact point into an electrical signal through a conductive detection pattern that detects a change in capacitance formed together with other surrounding detection patterns or a ground electrode when a human hand or an object touches the touch screen panel.

[0005] Such a touch screen panel is usually manufactured in a manner that it is attached to the outer surface of a flat panel display. However, when the touch screen panel is attached to the outer surface of the flat panel display, that is, when an add-on type touch screen panel is manufactured, an adhesive layer must be provided between the touch screen panel and the flat panel display, which ultimately leads to degradation of optical properties. In addition, a touch screen panel manufacturing process separated from a flat panel display manufacturing process is required, thereby increasing manufacturing time and cost. Therefore, in order to solve this problem, a flat panel display in which a touch screen panel and a display panel are integrated has recently been developed.

[0006] Meanwhile, in the touch screen panel manufacturing process, unlike a general display element, a touch detection electrode for detecting a touch input is additionally provided to the display element, and thus a process of testing whether the touch detection electrode is faulty as well as a process of testing the display element is performed.

[0007] Here, in the panel manufacturing process according to a conventional external hang-on method in which a touch screen panel is attached to the outer surface of a flat panel display, in order to determine the touch detection function, a step of testing whether the touch detection electrode is faulty is usually performed after the step of forming a final module or the step of manufacturing the touch screen panel in units of cells. Summary of the invention

[0008] An object of the present invention is to provide an in-cell touch OLED display device and a test method thereof, which can reduce the space for forming a frame for multiple lines that test not only display elements but also electrodes for detecting touch.

[0009] Another object of the present invention is to provide an in-cell touch OLED display device and a test method thereof, which can reduce the number of pads used to test defects of display elements and to test defects of a plurality of electrodes used to detect touch.

[0010] Another object of the present invention is to provide an in-cell touch OLED display device and a testing method thereof, which can increase the chamfering efficiency of a glass substrate on which a plurality of cells are formed.

[0011] To achieve these objectives, an in-cell touch organic light emitting diode (OLED) display device according to the present invention includes: a pixel array, the pixel array including data lines, gate lines crossing the data lines, a plurality of pixels corresponding to a plurality of sub-pixels and arranged in a matrix, and a plurality of touch blocks arranged to correspond to the plurality of pixels, respectively; a plurality of test pads, the plurality of test pads being arranged in a border area outside the pixel array and used to selectively perform pixel testing and touch block testing; a plurality of pixel test lines and a plurality of touch block test lines connected to the plurality of test pads and arranged inside the pixel array; a switch unit, the switch unit being arranged between the plurality of test pads and the plurality of pixel test lines and the plurality of touch block test lines and applying a test signal to any one of the pixel test lines and the touch block test lines; a pixel test switch pad, the pixel test switch pad being arranged in the border area and providing the switch unit with a control signal for testing pixel operation in the pixel array; and a touch block test switch pad, the touch block test switch pad being arranged in the border area and providing the switch unit with a control signal for testing a touch block inside the pixel array.

[0012] In the in-cell touch OLED display device according to the present invention, the plurality of touch block test lines may be arranged in parallel with the plurality of pixel test lines.

[0013] The in-cell touch OLED display device according to the present invention may further include a substrate including a driving circuit for driving the pixel array and a plurality of test pads, a switch unit, a pixel test switch pad, and a touch block test switch pad formed in the frame area.

[0014] In the in-cell touch OLED display device according to the present invention, the test signal applied to each of the plurality of touch block test lines may be a constant current.

[0015] In the in-cell touch OLED display device according to the present invention, the electrical characteristics of the touch block measured by the plurality of test pads may include any one of a capacitance value, a frequency, and a resistance voltage of a capacitor formed in the touch block.

[0016] A testing method for an embedded touch OLED display device according to the present invention includes: applying the same test signal to a plurality of pixel test lines connected to a plurality of pixel electrodes arranged in a matrix inside a pixel array; detecting information related to defects of pixels to which the test signal is applied; providing a switching signal to a switching unit to connect a plurality of touch block test lines formed in the pixel array to a plurality of test pads formed in a border area; applying the same test signal to the touch block test lines; and detecting information related to defects of the touch blocks to which the test signal is applied.

[0017] The in-cell touch OLED display device and the testing method thereof according to the present invention can achieve the following effects.

[0018] First, a pad for a TFT test and a pad for a touch block test can be shared.

[0019] Second, by reducing the number of required test pads, the degree of freedom in design can be increased.

[0020] Third, the frame size can be reduced to reduce the cell size, and the chamfering efficiency of the glass substrate can be improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0021] Figure 1 The active and inactive areas of a display device are illustrated.

[0022] Figure 2 Zoomed in Figure 1 'A' of FIG. 1 and illustrates a test line arrangement for testing an in-cell touch OLED display device according to the present invention.

[0023] Figure 3 Illustrated Figure 2 Arrangement of the test pads, switch units, pixel test switch pads and touch block test switch pads.

[0024] Figure 4 is a cross-sectional view of a touch sensor embedded organic electroluminescent device according to an embodiment of the present invention.

[0025] Figure 5A and Figure 5B is a schematic cross-sectional view for describing the operation of a touch sensor in a touch sensor-embedded organic electroluminescent device.

[0026] Fig. 6A is along Figure 2 A cross-sectional view taken along line I-I' of Figure 6B is along Figure 2 A cross-sectional view taken along line II-II'.

[0027] Figure 7 is a flow chart showing a method for testing an in-cell touch OLED display device according to the present invention.

[0028] Fig. 8A Illustration of the glass substrate of a common in-cell touch OLED display device. Figure 8B A glass substrate of an in-cell touch OLED display device according to the present invention is illustrated. DETAILED DESCRIPTION

[0029] For the embodiments of the present invention disclosed in the specification, for the purpose of describing the embodiments of the present invention, specific structural and functional descriptions are exemplified, but the embodiments of the present invention can be implemented in various forms and should not be considered as limiting the present invention.

[0030] The present invention can be modified in various ways and has various forms, and specific embodiments will be described in detail with reference to the accompanying drawings. However, the present invention should not be interpreted as being limited to the embodiments set forth herein, but on the contrary, the present invention is intended to cover all modifications, equivalents and substitutions falling within the spirit and scope of these embodiments.

[0031] Although terms such as "first" and "second" may be used to describe components, these components are not necessarily limited by the above terms. The above terms are only used to distinguish one component from other components. For example, a first component may be referred to as a second component, and a second component may be referred to as a first component without departing from the scope of the present invention.

[0032] When an element is "engaged" or "connected" to another element, it should be understood that, although it may be directly engaged or connected to another element, a third element may be present between the two elements. When an element is "directly engaged" or "directly connected" to another element, it should be understood that there is no element between the two elements. Other expressions used to describe the relationship between elements, i.e., "between...", "immediately between...", "close to...", "directly close to...", etc. should be interpreted in the same manner.

[0033] The terms used in the specification of the present invention are used only for describing specific embodiments, and these terms are not intended to limit the scope of the present invention. In the specification of the present invention, it will be further understood that the terms "include" and "comprise" specify the existence of the described features, wholes, steps, operations, elements, parts and / or their combinations, but do not exclude the existence or addition of one or more other features, wholes, steps, operations, elements, parts and / or their combinations.

[0034] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as those commonly understood by those skilled in the art to which the exemplary embodiments belong. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with the meaning in the context of the relevant art and should not be interpreted with an idealized or overly formalized meaning unless explicitly defined herein.

[0035] At the same time, when a certain embodiment can be implemented in different ways, the functions or operations specified in the specific blocks can be performed in an order different from the order specified in the flow chart. For example, two consecutive blocks can be performed simultaneously or oppositely according to related functions or operations.

[0036] Hereinafter, an in-cell touch OLED display device and a testing method thereof according to the present invention will be described with reference to the accompanying drawings.

[0037] Figure 1 The active and inactive areas of a display device are illustrated.

[0038] As shown in the figure, the display device includes an active area A / A (or pixel area) for displaying an image, and a non-active area N / A (or border area) in which an integrated circuit for driving the pixel circuit set in the active area A / A is provided.

[0039] Figure 2 Zoomed in Figure 1 'A' of FIG. 1 and illustrates a test line arrangement for testing an in-cell touch OLED display device according to the present invention.

[0040] As shown in the figure, the embedded touch OLED display device according to the present invention includes: a pixel array 200, the pixel array 200 has data lines, gate lines crossing the data lines, a plurality of pixels P11 ... Pmn (where m and n are integers greater than 1, respectively) corresponding to a plurality of sub-pixels and arranged in a matrix, and a plurality of touch blocks arranged to correspond to the plurality of pixels, respectively; a plurality of test pads 220, the plurality of test pads 220 are arranged in a border area outside the pixel array and are used to selectively perform pixel testing and touch block testing; a plurality of pixel test lines 250 and a plurality of touch block test lines connected to the plurality of test pads 220 and arranged in the pixel array; test line 260; a switch unit 240, which is arranged between a plurality of test pads 220 and a plurality of pixel test lines 250 and a touch block test line 260 and applies a test signal to any one of the pixel test lines and the touch block test line; a pixel test switch pad 210, which is arranged in a border area and provides a control signal for testing pixel operation in the pixel array 200 to the switch unit 240; and a touch block test switch pad 230, which is arranged in a border area and provides a control signal for testing the touch block in the pixel array 200 to the switch unit 240.

[0041] A plurality of touch block test lines 260 are arranged in parallel with the pixel test lines 250 .

[0042] The in-cell touch OLED display device includes a substrate including a driving circuit for driving a pixel array 200 and a plurality of test pads 220 , a switch unit 240 , a pixel test switch pad 210 , and a touch block test switch pad 230 formed in a bezel area.

[0043] Figure 3 Illustrated Figure 2 2. The arrangement of the test pads 220, the switch unit 240, the pixel test switch pads 210 and the touch block test switch pads 230 in FIG.

[0044] As shown in the figure, the switch unit 240 includes: a plurality of first switch transistors T1, which receive an operation signal provided from the pixel test switch pad 210 through its gate electrode; and a plurality of second switch transistors T2, which receive an operation signal provided from the touch block test switch pad 230 through its gate electrode. When a gate-on voltage is provided to the gate electrode of the first switch transistor T1 through the pixel test switch pad 210, a gate-off voltage is provided to the gate electrode of the second switch transistor T2 through the touch block test switch pad 230. When a gate-on voltage is provided to the gate electrode of the first switch transistor T1 through the pixel test switch pad 210 to turn on the first switch transistor T1, the test pads 220-1, 220-2, 220-3, ..., 220-n are connected to the pixel test line 250. Here, the plurality of second switch transistors T2 are turned off. On the other hand, when the gate-on voltage is provided to the gate electrodes of the plurality of second switch transistors T2 through the touch block test switch pad 230, the plurality of second switch transistors T2 are turned on, and thus the test pads 220-1, 220-2, 220-3, ..., 220-n are connected to the touch block test line 260. Here, the plurality of first switch transistors T1 are turned off.

[0045] Figure 4 1 is a cross-sectional view of a touch sensor embedded organic electroluminescent device according to an embodiment of the present invention. Here, for the convenience of description, the region where a switching thin film transistor (TFT) is to be formed is defined as a switching region, and the region where a driving TFT is to be formed is defined as a driving region DA.

[0046] As shown in the figure, the touch sensor embedded organic electroluminescent device 101 according to the present invention includes: a first substrate 110 on which a driving TFT DTr, a switching TFT (not shown), an organic light emitting diode (OLED) E and a touch sensor are formed; and a second substrate 170 for packaging. First, the configuration of the first substrate 110 will be described.

[0047] A semiconductor layer 113 is formed on the first substrate 110 in each pixel region P. The semiconductor layer 113 is formed of pure polysilicon, and the semiconductor layer 113 is composed of a first region 113a located at the center and serving as a channel, and second regions 113b located at both sides of the first region 113a and doped with impurities at a high concentration. A gate insulating layer 116 is formed on the entire surface of the first substrate 110 to cover the semiconductor layer 113, and a gate electrode 120 corresponding to the first region 113a of the semiconductor layer 113 is formed on the gate insulating layer 116.

[0048] Semiconductor contact holes 125 for respectively exposing the second regions 113 b located at both sides of the first region 113 a are formed in the interlayer insulating layer 123 and the gate insulating layer 116 formed thereunder.

[0049] The source electrode 133 and the drain electrode 136 are formed to respectively contact the second region 113b exposed through the semiconductor contact hole 125. The source electrode 133 and the drain electrode 136, the semiconductor layer 113 including the second region 113b contacting the source electrode 133 and the drain electrode 136, the gate insulating layer 116 formed on the semiconductor layer 113, and the gate electrode 120 constitute the driving TFT DTr.

[0050] The first electrode 147 connected to the drain electrode 136 of the driving TFT DTr functions as an anode or a cathode according to the type of the driving TFT DTr. In the present embodiment, the first electrode 147 connected to the driving TFT DTr functions as an anode.

[0051] The first passivation layer 140 is formed on the entire surface of the driving TFT DTr. A drain contact hole 143 for exposing the drain electrode 136 of the driving TFT DTr is formed in the first passivation layer 140.

[0052] A first electrode 147 connected to the drain electrode 136 of the driving TFT DTr through the drain contact hole 143 is formed on the first passivation layer 140 including the drain contact hole 143 in each pixel region P. A buffer pattern 150 is formed on the first electrode 147 at the boundary of each pixel region P in such a manner that the buffer pattern 150 surrounds each pixel region P while overlapping on the edge of the first electrode 147. In each pixel region P surrounded by the buffer pattern 150, an organic light emitting layer 155 is formed on the first electrode 147, and a second electrode 158 is formed on the organic light emitting layer 155 in the entire active region. The first and second electrodes 147 and 158 and the organic light emitting layer 155 formed therebetween constitute an OLED E.

[0053] The second electrode 158 formed on the organic light emitting layer 155 may be formed of a metal material having a relatively low work function value, for example, one of aluminum (Al), aluminum alloy (AlNd), silver (Ag), magnesium (Mg) and aluminum-magnesium alloy (AlMg), thereby serving as a cathode.

[0054] The second passivation layer 160 is formed of an inorganic insulating material or an organic insulating material on the second electrode 158 formed in the entire active region to improve the optical efficiency of the organic light emitting layer 155 , protect the second electrode 158 , and prevent penetration of moisture.

[0055] The touch second electrodes 165 in the form of separated bars are formed at predetermined intervals on the second passivation layer 160. Here, the touch second electrodes 165, the second passivation layer 160 located under the touch second electrodes 165, and the second electrode 158 (touch first electrode) formed in the entire active area constitute the touch sensor TS.

[0056] The second electrode 158 is characterized in that it functions as a component of the OLED E and a component of the touch sensor TS.

[0057] The second substrate 170 for encapsulation formed of a transparent glass material or a transparent plastic material is disposed on the second touch electrode 165, and an inert gas, an organic insulating material, or a face seal is interposed between the second substrate 170 and the second touch electrode 165. A polarizer 175 may be disposed on an outer surface of the second substrate 170 to improve the efficiency of light emitted from the organic light emitting layer 155.

[0058] Meanwhile, in the touch sensor embedded organic electroluminescent device 101 having the above-described configuration according to the present invention, the touch sensor TS is configured as a capacitor composed of the second electrode 158, the second passivation layer 160, and the touch second electrode 165. When a finger touches the capacitor, the capacitor recognizes a capacitance change due to a change in its fringe field, and thus functions as the touch sensor TS.

[0059] Figure 5A and Figure 5B 1 is a schematic cross-sectional view for describing the operation of the touch sensor in the touch sensor embedded organic electroluminescent device according to the present invention. For ease of description, the driving TFT, the switching TFT and the OLED are omitted, and only the touch sensor included in the first substrate and the second substrate for packaging are briefly shown.

[0060] like Figure 5A As shown in , when the surface of the second substrate 170 is not touched by the user's finger 195 in the touch sensor embedded organic electroluminescent device 101, the fringe field formed between the second electrode 158 and the touch second electrode 165 remains consistent and the capacitance does not change, so the touch operation is not performed. Figure 5B As shown in , when the surface of the second substrate 170 is touched by the user's finger 195, the fringe field between the second electrode 158 (touch first electrode) and the touch second electrode 165 changes due to the touch of the finger 195, so that the touch sensor TS detects the touch and performs a touch operation.

[0061] Reference Figure 4The touch sensor embedded organic electroluminescent device 101 having the above-mentioned structure according to the present invention is obtained by forming a second electrode 158 as a component of the OLED E as a touch first electrode of the touch sensor TS, forming a second passivation layer 160 as a dielectric layer to prevent moisture penetration on the second electrode 158, separately forming a second touch electrode 165 in the form of separated strips on the second passivation layer 160, and then attaching a second substrate 170 for encapsulation thereto.

[0062] Fig. 6A is along Figure 2 A cross-sectional view taken along line I-I' of Figure 6B is along Figure 2 The cross-sectional view taken along the line II-II'. Fig. 6A As shown in FIG. 1 , a control signal for testing pixel operation in the pixel array 200 is provided to the switch unit 240 through the pixel test switch pad 210 and via the pixel test signal transmission line 211. A plurality of switch transistors T1 in the switch unit 240 connect the test pad signal line 221 to a plurality of pixel test lines 250 formed in the pixel array 200.

[0063] like Figure 6B As shown in , a control signal for testing a touch block in the pixel array 200 is provided to the switch unit 240 through the touch block test switch pad 230 and via the touch block test signal transmission line 231. A plurality of switch transistors T2 in the switch unit 240 connect the test pad signal line 221 to a plurality of touch block test lines 260 formed in the pixel array 200. The touch area includes: a touch metal layer 303 disposed on a touch buffer layer 301, an interlayer insulating layer 302 sandwiched between the touch buffer layer 301 and the touch metal layer 303, and a passivation layer 304 disposed on the touch metal layer 303. In the peripheral area of ​​the active area, 401 represents a material used as a dam, and 402 represents a material used as a spacer. As shown in FIG. Figure 6B As shown in FIG. 3 , the touch metal layer 303 contacts the source / drain regions of the TFT in region “B”.

[0064] Figure 7 is a flow chart showing a method for testing an in-cell touch OLED display device according to the present invention.

[0065] The same pixel test signal is provided to a plurality of pixel test lines connected to a plurality of pixel electrodes arranged in a matrix in the pixel array. That is, a control signal for testing the pixel operation in the pixel array 200 is provided to the switch unit 240 through the pixel test switch pad 210 and via the pixel test signal transmission line 211. Therefore, the switch transistor T1 in the switch unit 240 connects the test pad signal line 221 to the pixel test line 250 (step S1).

[0066] The same operating power is supplied to all pixels through all data lines, so that all pixels of the pixel array 200 emit light. Here, a defective pixel that does not operate despite application of a test signal is detected (step S2).

[0067] After the pixel test is completed, a control signal (or switch signal) for testing the touch block in the pixel array 200, i.e., a switching test signal, is provided to the switch unit 240 through the touch block test switch pad 230 and via the touch block test signal transmission line 231. Therefore, the switch transistor T2 in the switch unit 240 connects the test pad signal line 221 to the plurality of touch block test lines 260 formed in the pixel array (step S3).

[0068] Therefore, a constant current is applied from the test pad 220 to the plurality of touch block test lines through the test pad signal line 221 , that is, a touch block test signal is provided (step S4 ).

[0069] After applying a test signal to a touch block of the pixel array through a touch block test line, an electrical characteristic of the touch block is measured through a test pad to detect a defect of the touch block or a defective touch block. Here, the measured electrical characteristic of the touch block may include any one of a capacitance value, a frequency, and a resistance voltage of a capacitor formed in the touch block (step S5).

[0070] Fig. 8A Illustration of the glass substrate of a common in-cell touch OLED display device. Figure 8B A glass substrate of an in-cell touch OLED display device according to the present invention is illustrated.

[0071] In the display panel of a common embedded touch OLED display device, a pad for applying a test signal is formed in an area around the cell to test by lighting after the cell is manufactured. Therefore, a space for forming a touch test pad, a touch block test line, a pixel test pad, and a pixel test line is required in the frame. Since the size of each cell provided in the glass substrate C is large, the number of cells that can be formed in a single glass substrate C is reduced. Therefore, the efficiency of the glass substrate forming the panel is reduced.

[0072] On the other hand, in the in-cell touch OLED display device according to the present invention, the touch test pads and the pixel test pads used for the touch block test can be shared, so the number of required test pads can be reduced and the unit size will not increase. Therefore, a larger number of units can be formed in the glass substrate C of the in-cell touch OLED display device according to the present invention.

[0073] For example, when the area of ​​the glass substrate is "C", since the cell size increases, 20 cells (1A to 5D) may be formed on the glass substrate in the case of a conventional in-cell touch OLED display device. Fig. 8A as shown in .

[0074] In the case of the in-cell touch OLED display device according to the present invention, the unit size does not increase, and thus 30 units (1a to 6e) can be formed on the glass substrate C. Figure 8B Therefore, design efficiency can be improved and manufacturing cost can be reduced.

[0075] The features, structures and effects described in the foregoing examples of the present application are included in at least one example of the present application and are not limited to only one example. In addition, the features, structures and effects illustrated in at least one example of the present application may be combined with other examples or modified by a person skilled in the art. Therefore, the present invention is intended to cover such combinations and modifications.

[0076] It is obvious to those skilled in the art that various modifications and changes can be made in the present invention without departing from the spirit or scope of the present invention. Therefore, the present invention is intended to cover modifications and changes to the present invention that fall within the scope of the appended claims and their equivalents.

Claims

1. An embedded touch organic light emitting diode (OLED) display device, comprising: a pixel array including data lines, gate lines crossing the data lines, a plurality of pixels corresponding to a plurality of sub-pixels and arranged in a matrix, and a plurality of touch blocks arranged to correspond to the plurality of pixels, respectively; a plurality of test pads arranged in a frame area outside the pixel array and used to selectively perform a pixel test and a touch block test; a plurality of pixel test lines and a plurality of touch block test lines connected to the plurality of test pads and arranged inside the pixel array; a switch unit disposed between the plurality of test pads and the plurality of pixel test lines and the plurality of touch block test lines and applying a test signal to any one of the pixel test lines and the touch block test lines; a pixel test switch pad, the pixel test switch pad being disposed in the frame region and providing a control signal for testing pixel operation in the pixel array to the switch unit; and a touch block test switch pad, wherein the touch block test switch pad is disposed in the frame area and provides a control signal for testing a touch block inside the pixel array to the switch unit, The test pad is located between the pixel test switch pad and the touch block test switch pad. After the test signal is applied to the touch block of the pixel array through the touch block test line, the electrical characteristics of the touch block are measured through the test pad to detect defects of the touch block or a defective touch block. 2 . The in-cell touch organic light emitting diode display device according to claim 1 , wherein the plurality of touch block test lines are arranged in parallel with the plurality of pixel test lines.

3. The embedded touch organic light emitting diode display device according to claim 1, further comprising a substrate, wherein the substrate comprises a driving circuit for driving the pixel array and the plurality of test pads, the switch unit, the pixel test switch pad and the touch block test switch pad formed in the border area. 4 . The in-cell touch OLED display device according to claim 1 , wherein the test signal applied to each of the plurality of touch block test lines is a constant current. 5 . The in-cell touch OLED display device according to claim 1 , wherein the electrical characteristics of the touch block measured by the plurality of test pads include any one of a capacitance value, a frequency, and a resistance voltage of a capacitor formed in the touch block.

6. The embedded touch organic light emitting diode display device according to claim 5, wherein the embedded touch organic light emitting diode display device is divided into a pixel area and the frame area, the pixel array is located in the pixel area, an organic light emitting diode is also arranged in the pixel area, and the organic light emitting diode shares an electrode with the capacitor. 7 . The in-cell touch OLED display device according to claim 6 , wherein the other electrode of the capacitor is in the form of separated strips.

8. A method for testing an embedded touch organic light emitting diode display device, comprising: applying the same test signal to a plurality of pixel test lines connected to a plurality of pixel electrodes arranged in a matrix inside a pixel array through a switch unit, wherein a control signal for testing pixel operation in the pixel array is provided to the switch unit via a pixel test switch pad; detecting information related to a defect of a pixel to which a test signal is applied; providing a switch signal to the switch unit via a touch block test switch pad to connect a plurality of touch block test lines formed in the pixel array to a plurality of test pads formed in a frame area; applying the same test signal to the touch block test line; and detecting information related to a defect of a touch block to which a test signal is applied, The test pad is located between the pixel test switch pad and the touch block test switch pad. After the test signal is applied to the touch block of the pixel array through the touch block test line, the electrical characteristics of the touch block are measured through the test pad to detect defects of the touch block or a defective touch block. 9 . The testing method according to claim 8 , wherein the plurality of touch block test lines are arranged in parallel with the plurality of pixel test lines. 10 . The testing method according to claim 8 , wherein the test signal applied to the plurality of touch block test lines is a constant current. 11 . The testing method according to claim 8 , wherein the electrical characteristics of the touch block measured by the plurality of test pads include any one of a capacitance value, a frequency, and a resistance voltage of a capacitor formed in the touch block.

12. The testing method according to claim 11, wherein the embedded touch organic light emitting diode display device is divided into a pixel area and the frame area, the pixel array is located in the pixel area, an organic light emitting diode is also arranged in the pixel area, and the organic light emitting diode shares an electrode with the capacitor.

13. The testing method of claim 12, wherein the other electrode of the capacitor is in the form of spaced-apart strips. 14 . The testing method according to claim 8 , wherein the plurality of testing pads are used to selectively perform a pixel test and a touch block test.

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