Method and apparatus for calculating service life of equipment

Abstract

The embodiment of the present application provides a kind of equipment service life calculation method and device.The method comprises the following steps: obtaining the M replacement records of the equipment of target type at target position;Wherein, M is the positive integer greater than 1, and each replacement record includes the time information of the equipment of target type being replaced to target position;According to the M replacement records, at least one life value is determined;The at least one life value is screened;Using each life value obtained after screening, the service life of the equipment of target type at target position is calculated.The present application can improve the accuracy of the calculated equipment service life.

Description

TECHNICAL FIELD

[0001] One or more embodiments of the present specification relate to electronic information technology, and particularly relate to a method and apparatus for calculating the service life of a device. BACKGROUND

[0002] Each device has a service life, and after reaching the service life, the device will fail or even be unable to work. Therefore, it is necessary to know the service life of a device, so as to carry out subsequent coping processing, such as failure warning and replacement of a new device when the service life of the device is about to be reached.

[0003] At present, the service life of a device is usually marked at the time of factory shipment. In the prior art, the service life marked at the time of factory shipment is used as the service life of a device, which will result in inaccurate service life.

[0004] Therefore, it is necessary to provide a method capable of more accurately calculating the service life of a device. SUMMARY

[0005] One or more embodiments of the present specification describe a method and apparatus for calculating the service life of a device, which can more accurately calculate the service life of a device.

[0006] According to a first aspect, a method for calculating the service life of a device is provided, comprising:

[0007] obtaining M replacement records of a device of a target type at a target location;

[0008] wherein M is a positive integer greater than 1, and each of the replacement records comprises time information of the device of the target type being replaced to the target location;

[0009] determining at least one service life value according to the M replacement records;

[0010] obtaining a high-probability distribution interval of a statistical distribution of historical service life values of the device of the target type at the target location according to the statistical distribution of the historical service life values;

[0011] screening the at least one service life value by using the high-probability distribution interval;

[0012] calculating the service life of the device of the target type at the target location by using each service life value obtained after screening.

[0013] The obtaining of the M replacement records of the device of the target type at the target location comprises:

[0014] acquire M pieces of replacement records of the target type of equipment at the target position within a preset time period; or, acquire the latest M pieces of replacement records of the target type of equipment at the target position whenever a preset number of replacement records are added;

[0015] and / or,

[0016] The replacement record is an outbound record.

[0017] The method comprises the following steps:

[0018] acquire N pieces of replacement records of the target type of equipment at the target position; wherein, N is a positive integer, and N is greater than M;

[0019] determine at least two historical life values according to the N pieces of replacement records;

[0020] calculate a historical average life value by using the at least two historical life values;

[0021] calculate a root mean square error of the historical life values by using the at least two historical life values;

[0022] form a probable distribution interval of the statistical distribution of the historical life values; the lower limit value of the probable distribution interval is the historical average life value minus the root mean square error of the first preset number of historical life values, and the upper limit value of the probable distribution interval is the historical average life value plus the root mean square error of the second preset number of historical life values;

[0023] The method comprises the following steps:

[0024] The first preset number and the second preset number are both 1.

[0025] The method comprises the following steps:

[0026] sort each time information included in each replacement record according to the chronological order;

[0027] For each time information obtained after sorting, determine a time interval between each two adjacent time information as a life value.

[0028] The at least two devices of the target type are replaced to K different target positions; wherein, K is a positive integer greater than 1;

[0029] performing the step of obtaining M replacement records of the target type of device at the target position until the step of calculating the service life of the target type of device at the target position, obtaining K service lives of the target type of device at K target positions;

[0030] The method further comprises:

[0031] calculating a replacement probability corresponding to each of the K target positions;

[0032] calculating the service life of the target type of device in the system comprising K target positions by using the following formula:

[0033]

[0034] wherein AT represents the service life of the target type of device in the system, P(j) represents the replacement probability corresponding to the jth target position, and AT j represents the service life of the target type of device at the jth target position.

[0035] The step of calculating a replacement probability corresponding to each of the K target positions comprises:

[0036]

[0037] wherein M j represents the number of replacement records of the target type of device at the jth target position obtained.

[0038] After the step of calculating the service life of the target type of device at the target position, the method further comprises:

[0039] obtaining a difference between the current time and the most recent time included in each replacement record;

[0040] subtracting the difference from the calculated service life of the target type of device at the target position to obtain a remaining service life of the target type of device currently used at the target position;

[0041] performing a failure warning according to the obtained remaining service life;

[0042] and / or,

[0043] calculating the reliability of the target type of device currently used at the target position by using the following calculation formula:

[0044]

[0045] wherein R represents the reliability of the target type device currently in use, T represents the time length for which the target type device currently in use has been used at the target location, AT j represents the service life of the target type device at the target location, and δ represents the life value indicated at the time of factory shipment of the target type device; and NORMDIST represents a normal distribution function.

[0046] According to a second aspect, there is provided a device service life calculation apparatus, comprising:

[0047] a replacement record acquisition module configured to acquire M replacement records of the target type device at the target location; wherein M is a positive integer greater than 1, and each of the replacement records comprises time information for which the target type device was replaced to the target location;

[0048] an individual life value determination module configured to determine at least one life value according to the M replacement records;

[0049] a screening module configured to acquire a high-probability distribution interval of the statistical distribution of the historical life values of the target type device at the target location according to the statistical distribution of the historical life values of the target type device at the target location, and to screen the at least one life value using the high-probability distribution interval;

[0050] a service life calculation module configured to calculate the service life of the target type device at the target location using each of the life values obtained after screening.

[0051] The replacement record acquisition module is configured to perform: acquiring M replacement records of the target type device at the target location within a current preset time period; or, whenever a preset number of replacement records are added, acquiring the latest M replacement records of the target type device at the target location;

[0052] and / or,

[0053] The replacement record is an outbound record.

[0054] The screening module is configured to perform:

[0055] acquiring N replacement records of the target type device at the target location; wherein N is a positive integer, and N is greater than M;

[0056] determining at least two historical life values according to the N replacement records;

[0057] calculating a historical average life value using the at least two historical life values;

[0058] calculating a root mean square error of the historical life values using the at least two historical life values;

[0059] obtain a probable distribution interval of the statistical distribution of the historical lifetime values; a lower limit value of the probable distribution interval is the historical average lifetime value minus a root mean square error of a first preset number of historical lifetime values, and an upper limit value of the probable distribution interval is the historical average lifetime value plus a root mean square error of a second preset number of historical lifetime values;

[0060] screen each lifetime value falling within the probable distribution interval from the at least one lifetime value.

[0061] The first preset number and the second preset number are both 1.

[0062] The individual lifetime value determination module is configured to perform: sorting each time information included in the M replacement records in chronological order; determining a time interval between each two adjacent time information as a lifetime value for the M time information obtained after sorting.

[0063] and / or,

[0064] The screening module is configured to perform: sorting each time information included in the N replacement records in chronological order; determining a time interval between each two adjacent time information as a lifetime value for the N time information obtained after sorting.

[0065] The at least two devices of the target type are replaced to K different target positions; wherein K is a positive integer greater than 1.

[0066] The service life calculation module is further configured to perform:

[0067] obtain K service lives of the devices of the target type at the K target positions;

[0068] calculate a replacement probability corresponding to each of the K target positions;

[0069] calculate the service life of the devices of the target type in the system including the K target positions by using the following formula:

[0070]

[0071] wherein AT represents the service life of the devices of the target type in the system, P(j) represents the replacement probability corresponding to the jth target position, and AT j represents the service life of the devices of the target type at the jth target position.

[0072] The service life calculation module is configured to perform the following calculation formula:

[0073]

[0074] wherein M j represents the number of replacement records of the target type of device at the jth target position.

[0075] Further comprising:

[0076] a failure warning module configured to obtain a difference between the current time and the most recent time included in each replacement record; obtain a remaining service life of the target type of device currently used at the target position by subtracting the difference from the calculated service life of the target type of device at the target position; and perform failure warning according to the obtained remaining service life.

[0077] and / or,

[0078] a reliability calculation module configured to calculate the reliability of the target type of device currently used at the target position by using the following calculation formula:

[0079]

[0080] wherein R represents the reliability of the target type of device currently used, T represents the length of time for which the target type of device currently used has been used at the target position, AT j represents the service life of the target type of device at the target position, and δ represents the life value indicated at the time of factory shipment of the target type of device; and NORMDIST represents a normal distribution function.

[0081] According to a third aspect, a computing device is provided, comprising a memory and a processor, the memory storing executable code, and the processor executing the executable code to implement the method described in any of the embodiments of the present specification.

[0082] The method and device for calculating the service life of the equipment provided in the embodiments of the present application utilize the replacement records of the target type of device at the target position, and obtain multiple life values through multiple replacement records. Since the replacement records reflect the use of the target type of device at the target position, for example, if the replacement is frequent, it indicates that the service life of the equipment at the target position will be relatively small, and if the replacement is infrequent, it indicates that the service life of the equipment at the target position will be relatively high. Therefore, the multiple life values obtained all reflect the actual use of the target type of device at the target position, and the use of such life values for subsequent calculation of the service life of the equipment can improve the accuracy of the calculated service life. BRIEF DESCRIPTION OF DRAWINGS

[0083] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or prior art description. Obviously, the drawings in the following description are some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained based on these drawings without creative labor.

[0084] Figure 1 is a schematic diagram of the system architecture to which the embodiments of the present application are applied.

[0085] Figure 2 is a flowchart of a method for calculating the service life of equipment in an embodiment of the present application.

[0086] Figure 3 is a flowchart of screening a plurality of life values in an embodiment of the present application.

[0087] Figure 4 is a flowchart of calculating the replacement probability of equipment at a position in a system in an embodiment of the present application.

[0088] Figure 5 is a structural schematic diagram of a device for calculating the service life of equipment in an embodiment of the present application.

[0089] Figure 6 is a structural schematic diagram of a device for calculating the service life of equipment in another embodiment of the present application.

[0090] Figure 7 is a structural schematic diagram of a device for calculating the service life of equipment in another embodiment of the present application.

[0091] List of reference signs:

[0092] 101: warehouse management system 102: device service life calculation device

[0093] 201: obtaining M replacement records of a target type of equipment at a target position

[0094] 203: determining at least one life value according to the M replacement records

[0095] 205: obtaining a high-probability distribution interval of the statistical distribution of the historical life value of the target type of equipment at the target position according to the statistical distribution of the historical life value, and screening the at least one life value by using the high-probability distribution interval

[0096] 207: calculating the service life of the target type of equipment at the target position by using each life value obtained after screening

[0097] 301: Obtain N replacement records of the target type of equipment at the target location, N is a positive integer and N is greater than M

[0098] 303: Determine at least two historical life values according to the N replacement records

[0099] 305: Calculate a historical average life value S0 using the at least two historical life values

[0100] 307: Calculate a root mean square error S1 of the historical life values using the at least two historical life values

[0101] 309: Form a probable distribution interval

[0102] 311: Screen each life value from the at least one life value to fall within the probable distribution interval

[0103] 401: Obtain K service lives of the target type of equipment at K target locations

[0104] 403: Calculate a replacement probability corresponding to each of the K target locations

[0105] 405: Calculate a service life of the target type of equipment in a system including the K target locations

[0106] 501: Replacement record obtaining module 502: Individual life value determining module 503: Screening module

[0107] 504: Service life calculating module 601: Failure warning module 701: Reliability calculating module DETAILED DESCRIPTION

[0108] As mentioned above, the life value marked at factory is used as the service life of a device in the prior art. However, the service life of a device is greatly related to the location where it is installed, that is, it is affected by the business environment where it is applied. For example, when a motor is installed at a location where the motor needs to be used excessively frequently, the actual life value of the motor is usually less than the life value marked at factory, and when the motor is installed at a location where the motor is less likely to be used, the actual life value of the motor is usually greater than the life value marked at factory. It can be seen that the location where a device is installed reflects the business environment where the device is applied, and greatly affects the service life of the device. Therefore, if a more accurate service life of a device is to be obtained, the location where the device is installed must be considered.

[0109] When considering the location where the device is installed, i.e. the business environment where the device is applied, one way to calculate the service life is to acquire various running parameters generated by the device when running, such as voltage value, current value, temperature value, etc., and calculate the service life based on the running parameters. However, this way requires the installation of various sensors to collect these running parameters respectively. The hardware cost of installing various sensors is high, and for some locations where the device is applied, it is impossible to install sensors at all.

[0110] Therefore, other more convenient ways to calculate the service life of the device can be considered. Considering that after a device is installed at a location, there is usually a replacement record of the device at the location, and the replacement record actually reflects the use of the device at the location. The more frequent the replacement is, the shorter the service life of the device at the location will be. The less frequent the replacement is, the longer the service life of the device at the location will be. Therefore, the replacement record can be used to calculate the service life of the device, so as to improve the accuracy of the calculated service life.

[0111] The specific implementation of the above concept is described below.

[0112] For the convenience of understanding the present application, the system architecture to which the embodiments of the present application are applied is described first. As shown in Figure 1 The system architecture mainly includes a warehouse management system 101 and a device service life calculation device 102.

[0113] The warehouse management system 101 saves the replacement record of each device for each location, which can include the time when the device is replaced, such as the time of leaving the warehouse, the location information where the device is replaced, and the name of the device. The device service life calculation device 102 is used to calculate the service life according to the replacement record saved by the warehouse management system 101.

[0114] The warehouse management system 101 and the device service life calculation device 102 can interact through a network to enable the device to acquire the replacement record. The network can include various connection types, such as wired, wireless communication link or optical cable, etc.

[0115] Figure 2 A flowchart of the method for calculating the service life of the device in an embodiment of the present application is shown. The execution subject of the method is the device service life calculation device. The device can be located in any device, platform or device cluster with computing and processing capability. Referring to Figure 2 The method includes:

[0116] Step 201: Acquire M replacement records of the target type of device at the target location;

[0117] Wherein, M is a positive integer greater than 1, and the replacement record includes time information when the target type of equipment is replaced at the target location.

[0118] Step 203: Determine at least one lifespan value based on the M replacement records.

[0119] Step 205: Obtain a high probability distribution interval of the statistical distribution of the historical life values ​​of the target type of equipment at the target location according to the statistical distribution of the historical life values, and use the high probability distribution interval to screen the at least one life value.

[0120] Step 207: Calculate the service life of the target type of equipment at the target location using the life values ​​obtained after screening.

[0121] exist Figure 2 In the method shown, the replacement records of the target type of equipment at the target location are utilized. Multiple life values ​​are obtained through multiple replacement records. This is because the replacement records reflect the usage of the target type of equipment at the target location. For example, frequent replacement indicates that the service life of the equipment at the target location will be relatively short. Infrequent replacement indicates that the service life of the equipment at the target location will be relatively long. Therefore, the multiple life values ​​obtained reflect the actual usage of the target type of equipment at the target location. Using such life values ​​for subsequent calculation of the equipment service life can improve the accuracy of the calculated service life.

[0122] And, in Figure 2 In the process shown, a large probability distribution interval of the statistical distribution of historical life values ​​is obtained, which more accurately reflects the true range of historical life values. Therefore, based on the large probability interval, life values ​​that are more in line with historical realities can be screened out, so that a more accurate service life can be calculated based on the screened life values.

[0123] Below Figure 2 Each step is explained separately.

[0124] First, in step 201 , M replacement records of a target type of device at a target location are obtained, where M is a positive integer greater than 1, and the replacement record includes time information when the target type of device is replaced at the target location.

[0125] In one embodiment of the present application, the method of calculating the service life of the equipment can be performed in a certain time period, for example, the service life of the motor used in the T3 terminal of the Capital International Airport is calculated every half year, so that the subsequent response can be made according to the newly calculated service life. In this case, the step 201 is to obtain M replacement records of the equipment of the target type at the target location in the current preset time period, for example, in the last half year.

[0126] In another embodiment of the present application, the method of calculating the service life of the equipment can also be performed according to the number of replacements, for example, the service life of the motor used in the T3 terminal of the Capital International Airport is calculated every time a replacement record of the motor is added, so that the subsequent response can be made according to the newly calculated service life. In this case, the step 201 is to obtain the latest M replacement records of the equipment of the target type at the target location every time a preset number of replacement records of the equipment of the target type at the target location are added.

[0127] Next, in step 203, at least one life value is determined according to the M replacement records.

[0128] Since the time information of the replacement is included in each replacement record, the life value of the individual equipment replaced can be determined by the time interval between the adjacent two time information. The specific implementation process includes:

[0129] The time information included in the M replacement records is sorted according to the chronological order;

[0130] For the M time information obtained after sorting, the time interval between each two adjacent time information is determined as a life value.

[0131] For example, if M is equal to 60, i.e., 60 replacement records are obtained, the first replacement record represents that the motor used in the T3 terminal of the Capital International Airport is replaced in February 2000 (T 11 represents the time), the second replacement record represents that the motor used in the T3 terminal of the Capital International Airport is replaced in January 2003 (T 12 represents the time), the third replacement record represents that the motor used in the T3 terminal of the Capital International Airport is replaced in November 2003 (T 13 represents the time), and the last replacement record represents that the motor used in the T3 terminal of the Capital International Airport is replaced in December 2020 (T 1M represents the time). Thus, a time sequence {T 11 , T 12 , T13 ,..., T 1M}. Calculate the time interval between each two adjacent times in the time series, and obtain M-1 life values, for example, use T 12 T 11 , obtain the life value of the individual motor replaced at T 11 , use T 13 T 12 , obtain the life value of the individual motor replaced at T 12 , and so on, and a total of M-1 life values of the motors are obtained.

[0132] Next, in step 205, according to the statistical distribution of the historical life values of the target type of equipment at the target location, a high-probability distribution interval of the statistical distribution of the historical life values is obtained; and the determined at least one life value is screened by using the high-probability distribution interval.

[0133] In actual business applications, the life probability of each equipment used is generally a life value, such as 2 years, and a small probability is a life value with a very long life, such as 5 years, or a very short life, such as half a year. Therefore, in order to further improve the accuracy of the calculated service life of the equipment, the M life values obtained can be screened to screen out those life values that are likely to occur, and those life values that are unlikely to occur are removed.

[0134] In an embodiment of the present application, the specific implementation process of the present step 205 can refer to Figure 3 , including:

[0135] Step 301: Obtain N replacement records of the target type of equipment at the target location; wherein N is a positive integer, and N is greater than M.

[0136] In the present step 301, all historical replacement records of the target type of equipment at the target location can be obtained, such as all replacement records of the motor from the time when the above T3 terminal building was built to the present time. Obtaining all historical replacement records can make the subsequent replacement record samples more sufficient, and more balancedly consider the different service lives of the equipment at each time point due to different business loads.

[0137] Of course, in the present step 301, the method of obtaining M replacement records in step 201 can also be referred to, for example, in the present step 301, N replacement records of the target type of equipment at the target location in the current 3 preset time periods (such as in the last 1.5 years) are obtained. Only need to ensure that the number N of replacement records obtained in the present step 301 is greater than the number M of replacement records obtained in step 201.

[0138] Step 303: determining at least two historical life values according to the N replacement records.

[0139] The implementation of this step 303 is the same as the implementation of the above step 203, only the number of replacement records is different, and more historical life values can be obtained in this step. That is, the specific implementation process of this step 303 includes:

[0140] sorting each time information included in the N replacement records according to the chronological order;

[0141] determining the time interval between each two adjacent time information as a historical life value for the N time information obtained after sorting.

[0142] For example, if N is 200, 199 historical life values can be obtained.

[0143] Step 305: calculating a historical average life value S0 using the at least two historical life values.

[0144] For example, calculating the historical average life value of the 199 historical life values obtained above.

[0145] Step 307: calculating a root mean square error S1 of the historical life values using the at least two historical life values.

[0146] The calculation is performed using the following calculation formula:

[0147]

[0148] Wherein, T i is the i-th historical life value in the at least two historical life values determined in step 303.

[0149] Step 309: forming a high probability distribution interval; the lower limit value of the high probability distribution interval is the historical average life value minus the root mean square error of the first preset number of historical life values, and the upper limit value of the high probability distribution interval is the historical average life value plus the root mean square error of the second preset number of historical life values.

[0150] In an embodiment of the present application, the first preset number is equal to the second preset number, both of which are 1. Then, the formed high probability distribution interval is [(S0-S1), (S0+S1)].

[0151] Step 311: screening each life value falling within the high probability distribution interval from the at least one life value.

[0152] When all the historical replacement records are obtained in step 301, because the historical replacement records are increasing, the historical average life value in step 305 is calculated according to the historical replacement records, and the historical average life value will be closer to the truth, and the root mean square error of the historical life values calculated in step 307 reflects the deviation between the historical life values and the historical average life value, i.e., the truth. The probable distribution interval defined by the historical average life value and the root mean square error of the historical life values can reflect the probable life value of the target type of equipment at the target position, and the life values selected in this way are closer to the truth.

[0153] In other embodiments of the present application, the process shown in FIG. 2 can also be used to implement the processing in step 205. For example, in another embodiment of the present application, the five life values with the largest life values and the five life values with the smallest life values can be deleted according to the size of the life values, and the remaining life values are the selected life values. Figure 3

[0154] Next, in step 207, the use life of the target type of equipment at the target position is calculated according to the selected life values.

[0155] In step 207, the average of the selected life values can be calculated, and the average is taken as the use life of the target type of equipment at the target position.

[0156] At this point, the use life of the target type of equipment at the target position is calculated.

[0157] In some embodiments of the present application, a position refers to a specific position where an equipment is installed. For example, for the Capital International Airport, position 1 of T2 terminal can be taken as the target position in the above embodiment, and the use life of the target type of equipment, such as a motor, used at position 1 of T2 terminal is calculated.

[0158] In an embodiment of the present application, the overall life value of a type of equipment in a large system can be calculated. For example, for the Capital International Airport, motors are installed at position 1 and position 2 of T2 terminal, and motors are also installed at position 3 and position 4 of T3 terminal. Each of the four positions has replacement records of the motors, and the number of replacement records of the four positions is usually different due to different loads. Therefore, the use life of the motors of this type of equipment in the Capital International Airport system considering the four positions can be calculated. See FIG. 3. Figure 4 ​In one embodiment of the present application, at least two devices of the target type are replaced at K different target positions in a system; where K is a positive integer greater than 1, the implementation process of the service life of the device in the system comprises:

[0159] Step 401: perform the calculation method of the service life of the device in any embodiment of the present application for each of the K target positions (such as performing the method described in combination with the above Figure 2 process description) to obtain K service lives of the device of the target type at the K target positions.

[0160] Step 403: calculate the replacement probability corresponding to each of the K target positions.

[0161] Step 405: calculate the service life of the device of the target type in the system including the K target positions by using the following formula:

[0162]

[0163] Wherein, AT represents the service life of the device of the target type in the system, P(j) represents the replacement probability corresponding to the jth target position, and AT j represents the service life at the jth target position.

[0164] In one embodiment of the present application, the method for calculating the replacement probability corresponding to each of the K target positions in step 403 above comprises:

[0165]

[0166] Wherein, M j represents the number of replacement records of the device of the target type at the jth target position obtained, and K is the number of target positions included in the above system. For example, there are 50 replacement records of the motor at position 1 of the above T2 terminal, and the above 4 positions of the Capital International Airport have a total of 300 replacement records, so the replacement probability corresponding to position 1 is 50 / 300.

[0167] In one embodiment of the present application, the calculated service life of the device of the target type at the target position can be used for subsequent various coping processes, such as:

[0168] Process I, fault warning.

[0169] The process I can include the following steps:

[0170] Calculate the difference between the current time and the most recent time included in each replacement record;

[0171] Subtracting the difference from the service life of the target type of device at the target position, the remaining service life of the target type of device currently used at the target position is obtained;

[0172] According to the obtained remaining service life, a fault warning is performed.

[0173] Processing two, calculating the reliability of the target type of device currently used at the target position.

[0174] The calculation is performed by using the following calculation formula:

[0175]

[0176] Wherein, R represents the reliability of the target type of device currently used, T represents the time length that the target type of device currently used has been used at the target position, AT j represents the service life of the target type of device at the target position, and delta represents the life value indicated at the factory of the target type of device, that is, the characteristic life; NORMDIST represents a normal distribution function, and according to the above calculation formula, the normal distribution function NORMDIST includes four input parameters, that is, AT j , delta and false.

[0177] In various embodiments of the present application, the replacement record can be an outbound record. For example, the warehouse management system in the Capital International Airport includes an outbound record, and each outbound record includes the time when a device of a certain type is replaced at a certain position. After obtaining each outbound record from the warehouse management system, the device service life calculation method in the above embodiments of the present application can be performed.

[0178] The various embodiments of the present application at least have the following beneficial effects:

[0179] 1. The replacement record of the target type of device at the target position is used, and through multiple replacement records, multiple individual device life values are obtained. Because the replacement record reflects the use of the target type of device at the target position, for example, frequent replacement indicates that the service life of the device at the target position will be relatively small, and infrequent replacement indicates that the service life of the device at the target position will be relatively high. Therefore, the obtained multiple life values all reflect the actual use of the target type of device at the target position, and using such life values for subsequent device service life calculation can improve the accuracy of the calculated service life.

[0180] 2. Because the replacement records of a device are very easy to obtain, that is, in the embodiment of the present invention, the data used to calculate the service life comes from simple records. During the implementation process, the replacement records are obtained and filtered, and the service life is calculated using the filtered values ​​without the need for various complex processing, such as the need for various modeling (such as establishing a life prediction model algorithm). For example, there is no need to install sensors and no need to perform complex calculations based on various operating parameters. Therefore, the implementation method of the embodiment of the present invention is simpler and more practical.

[0181] 3. When equipment is installed in different locations, the service life of the equipment will be different due to different load conditions and environmental conditions at each location. The embodiment of the present invention uses the replacement record of the target type of equipment at the target location to calculate the service life of the target type of equipment at the specific target location. Therefore, the calculated service life is more targeted and can more truly reflect the actual service life of the equipment at a specific location.

[0182] 4. When the same type of equipment is used at multiple locations in a system, the embodiments of the present invention derive the service life of the equipment of this type when applied to the system based on the service life and failure probability of the equipment obtained at the multiple locations. This is specifically applicable to the system and can more truly reflect the actual service life of the equipment in a specific system.

[0183] 5. In an embodiment of the present invention, the large probability distribution interval formed by the historical average life value and the root mean square error of the historical life value can be used to screen the life values ​​of multiple individuals as samples, so as to screen out the life values ​​of individuals that are closer to the true value, and the service life can be calculated more accurately based on the screened life values.

[0184] The present invention also provides a device for calculating the service life of equipment. Figure 5 ,include:

[0185] A replacement record acquisition module 501 is configured to acquire M replacement records of a target type of device at a target location; wherein M is a positive integer greater than 1, and each replacement record includes time information when the target type of device is replaced at the target location;

[0186] an individual lifespan value determination module 502, configured to determine at least one lifespan value based on the M replacement records;

[0187] A screening module 503 is configured to obtain a high probability distribution interval of the statistical distribution of historical life values ​​of the target type of equipment at the target location based on the statistical distribution of the historical life values; and screen the at least one life value using the high probability distribution interval;

[0188] A service life calculation module 504 is configured to calculate the service life of the target type of device at the target location by using the filtered service life values.

[0189] In an embodiment of the device, the replacement record acquisition module 501 is configured to perform: acquiring M replacement records of the target type of device at the target location within a preset time period; or, acquiring the latest M replacement records of the target type of device at the target location whenever a preset number of replacement records are added.

[0190] In an embodiment of the device, the replacement record is an outbound record.

[0191] In an embodiment of the device, the filtering module 503 is configured to perform:

[0192] acquiring N replacement records of the target type of device at the target location; wherein N is a positive integer and N is greater than M;

[0193] determining at least two historical service life values according to the N replacement records;

[0194] calculating a historical average service life value by using the at least two historical service life values;

[0195] calculating a root mean square error of the historical service life values by using the at least two historical service life values;

[0196] forming a high-probability distribution interval of the statistical distribution of the historical service life values; the lower limit value of the high-probability distribution interval is the historical average service life value minus the root mean square error of the first preset number of historical service life values, and the upper limit value of the high-probability distribution interval is the historical average service life value plus the root mean square error of the second preset number of historical service life values;

[0197] filtering each service life value falling within the high-probability distribution interval from the at least one service life value.

[0198] In an embodiment of the device, the first preset number and the second preset number are both 1.

[0199] In an embodiment of the device, the individual service life value determination module 502 is configured to perform: sorting each time information included in the M replacement records according to the chronological order; and determining the time interval between each two adjacent time information as a service life value for the M time information after sorting.

[0200] In one embodiment of the device of the present application, the screening module 503 is configured to perform: sorting each time information included in the N replacement records according to the chronological order; determining the time interval between each two adjacent time information as a life value for the N time information after sorting.

[0201] In one embodiment of the device of the present application, at least two devices of the target type are replaced to K different target positions; wherein K is a positive integer greater than 1.

[0202] The service life calculation module 504 is further configured to perform:

[0203] obtaining K service lives of the devices of the target type at the K target positions;

[0204] calculating the replacement probability corresponding to each of the K target positions;

[0205] calculating the service life of the devices of the target type in the system including the K target positions by using the following formula:

[0206]

[0207] wherein AT represents the service life of the devices of the target type in the system, P(j) represents the replacement probability corresponding to the jth target position, and AT(j) represents the service life of the devices of the target type at the jth target position. j

[0208] In one embodiment of the device of the present application, the service life calculation module 504 is configured to perform the following calculation formula:

[0209]

[0210] wherein M j represents the number of replacement records of the devices of the target type at the jth target position obtained.

[0211] In one embodiment of the device of the present application, referring to Figure 6 the device further comprises a failure warning module 601 configured to obtain the difference between the current time and the latest time included in each replacement record; obtain the remaining service life of the device of the target type currently used at the target position by subtracting the difference from the calculated service life of the device of the target type at the target position; and perform failure warning according to the obtained remaining service life.

[0212] In one embodiment of the device of the present application, referring to Figure 7 ​The device further comprises a reliability calculation module 701 configured to calculate the reliability of the target type device currently used at the target location by using the following calculation formula:

[0213]

[0214] wherein R represents the reliability of the target type device currently used, T represents the time length for which the target type device currently used has been used at the target location, AT j represents the service life of the target type device at the target location, and δ represents the life value indicated at the factory for the target type device, i.e., the characteristic life; and NORMDIST represents a normal distribution function, which, according to the above calculation formula, comprises four input parameters, i.e., AT j , δ and false.

[0215] One embodiment of the present specification provides a computer readable storage medium, which stores a computer program, and when the computer program is executed in a computer, the computer program causes the computer to execute the method in any one of the embodiments of the present specification.

[0216] One embodiment of the present specification provides a computing device, which comprises a memory and a processor, the memory stores executable code, and when the processor executes the executable code, the method in any one of the embodiments of the present specification is implemented.

[0217] It can be understood that the structure shown in the embodiments of the present application does not constitute a specific limitation on the device service life calculation device. In other embodiments of the present specification, the device service life calculation device can include more or fewer components than the illustration, or combine certain components, or split certain components, or different component arrangements. The components shown can be implemented in hardware, software, or a combination of software and hardware.

[0218] The information interaction, execution process, and the like between the modules in the above device and system are based on the same concept as the method embodiments of the present specification, and the specific content can be referred to in the description of the method embodiments of the present specification, which will not be described here.

[0219] Each of the embodiments in the present specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other. Each embodiment mainly describes the differences from other embodiments. Especially, for the device embodiments, since they are basically similar to the method embodiments, the description is relatively simple, and the relevant parts can be referred to the part of the description of the method embodiments.

[0220] Those skilled in the art will appreciate that in one or more of the above examples, the functions described in the present invention may be implemented using hardware, software, widgets, or any combination thereof. When implemented using software, these functions may be stored in a computer-readable medium or transmitted as one or more instructions or codes on a computer-readable medium.

[0221] The specific implementation methods described above further illustrate the objectives, technical solutions and beneficial effects of the present invention in detail. It should be understood that the above description is only a specific implementation method of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent replacements, improvements, etc. made on the basis of the technical solution of the present invention should be included in the scope of protection of the present invention.

Claims

1. Calculation method for equipment service life, including: Obtaining M replacement records of a target type of device at a target location, where M is a positive integer greater than 1, and each replacement record includes time information when the target type of device is replaced at the target location; Determining at least one lifespan value based on the M replacement records; Obtaining a high probability distribution interval of the statistical distribution of historical life values ​​of a target type of equipment at a target location based on the statistical distribution of the historical life values; Using the large probability distribution interval, screening the at least one lifespan value; Calculate the service life of the target type of equipment at the target location using the life values ​​obtained after screening; wherein at least two devices of the target type are replaced to K different target locations; wherein K is a positive integer greater than 1; For each of the K target locations, performing the steps of obtaining M replacement records of the target type of equipment at the target location until the step of calculating the service life of the target type of equipment at the target location, thereby obtaining K service lives of the target type of equipment at the K target locations; The method further comprises: Calculate the replacement probability corresponding to each of the K target positions; The service life of a target type device in a system consisting of K target locations is calculated using the following formula: Where AT represents the service life of the target type of equipment in the system, P(j) represents the replacement probability corresponding to the jth target position, and AT j Represents the service life of the equipment of the target type at the jth target location.

2. The method according to claim 1, wherein The acquiring M replacement records of a target type of device at a target location includes: Obtaining M replacement records of a target type of device at a target location within a current preset time period; or, whenever a preset number of replacement records are added, obtaining the latest M replacement records of a target type of device at a target location; and / or, The replacement record is a warehouse-out record.

3. The method according to claim 1, wherein The obtaining a high probability distribution interval of the statistical distribution of the historical life values ​​of the target type of equipment at the target location according to the statistical distribution of the historical life values ​​includes: Obtain N replacement records of the target type of device at the target location; where N is a positive integer and N is greater than M; Determine at least two historical life values ​​based on the N replacement records; Calculating a historical average lifespan value using the at least two historical lifespan values; Calculating a root mean square error of the historical life values ​​using the at least two historical life values; A high probability distribution interval for the statistical distribution of historical life values ​​is formed; the lower limit of the high probability distribution interval is the historical average life value minus the root mean square error of a first preset number of historical life values, and the upper limit of the high probability distribution interval is the historical average life value plus the root mean square error of a second preset number of historical life values; The screening of the at least one lifespan value by using the high probability distribution interval includes: screening out each lifespan value that falls within the high probability distribution interval from the at least one lifespan value.

4. The method according to claim 3, wherein: The first preset number and the second preset number are both 1.

5. The method according to claim 1 or 3, wherein: Methods for determining life values ​​based on replacement records include: Sort the time information included in each replacement record in chronological order; For each piece of time information obtained after sorting, the time interval between every two adjacent pieces of time information is determined as a lifespan value.

6. The method according to claim 1, wherein Calculating the replacement probability corresponding to each of the K target positions includes: Among them, M j Indicates the number of replacement records of the target type of equipment at the j-th target location.

7. The method according to claim 1, wherein After calculating the service life of the target type of equipment at the target location, the method further includes: Get the difference between the current time and the latest time included in each replacement record; Subtracting the difference from the calculated service life of the target type device at the target location to obtain the remaining service life of the target type device currently in use at the target location; According to the remaining service life obtained, fault warning is issued; and / or, Calculate the reliability of the target type of equipment currently in use at the target location using the following formula: Where R represents the reliability of the target type device currently in use, T represents the length of time the target type device currently in use has been in use at the target location, and AT j represents the service life of the target type of equipment at the target location, δ represents the service life value of the target type of equipment marked at the factory; NORMDIST represents the normal distribution function.

8. Device for calculating the service life of equipment, including: a replacement record acquisition module configured to acquire M replacement records of a target type of device at a target location; wherein M is a positive integer greater than 1, and each replacement record includes time information when the target type of device is replaced at the target location; an individual life value determination module, configured to determine at least one life value based on the M replacement records; a screening module configured to obtain a high-probability distribution interval of the statistical distribution of historical life values ​​of a target type of equipment at a target location based on the statistical distribution of the historical life values; and screen the at least one life value using the high-probability distribution interval; a service life calculation module configured to calculate the service life of a target type of equipment at a target location using the life values ​​obtained after screening; wherein at least two devices of the target type are replaced to K different target locations; wherein K is a positive integer greater than 1; The service life calculation module is further configured to execute: Obtain K service lives of target type equipment at K target locations; Calculate the replacement probability corresponding to each of the K target positions; The service life of a target type device in a system consisting of K target locations is calculated using the following formula: Where AT represents the service life of the target type of equipment in the system, P(j) represents the replacement probability corresponding to the jth target position, and AT j Represents the service life of the equipment of the target type at the jth target location.

9. The device according to claim 8, wherein The replacement record acquisition module is configured to: acquire M replacement records of a target type of device at a target location within a current preset time period; or, whenever a preset number of replacement records are added, acquire the latest M replacement records of the target type of device at the target location; and / or, The replacement record is a warehouse-out record.

10. The device according to claim 8, wherein The screening module is configured to perform: Obtain N replacement records of the target type of device at the target location; where N is a positive integer and N is greater than M; Determine at least two historical life values ​​based on the N replacement records; Calculating a historical average lifespan value using the at least two historical lifespan values; Calculating a root mean square error of the historical life values ​​using the at least two historical life values; A high probability distribution interval for the statistical distribution of historical life values ​​is formed; the lower limit of the high probability distribution interval is the historical average life value minus the root mean square error of a first preset number of historical life values, and the upper limit of the high probability distribution interval is the historical average life value plus the root mean square error of a second preset number of historical life values; The lifespan values ​​falling within the high probability distribution interval are screened out from the at least one lifespan value.

11. The device according to claim 10, wherein The first preset number and the second preset number are both 1.

12. The device according to claim 10, wherein The individual life value determination module is configured to execute: sorting the time information included in the M replacement records in chronological order; for the M time information obtained after sorting, determining the time interval between each two adjacent time information as a life value; and / or, The screening module is configured to execute: sorting the time information included in the N replacement records in chronological order; and for the N time information obtained after sorting, determining the time interval between every two adjacent time information as a life value.

13. The device according to claim 9, wherein The service life calculation module is configured to perform the following calculation formula: Among them, M j Indicates the number of replacement records of the target type of equipment at the j-th target location.

14. The apparatus according to claim 9, further comprising: a fault warning module configured to obtain a difference between a current time and a latest time included in each replacement record; The calculated service life of the target type of equipment at the target location is subtracted from the difference to obtain the remaining service life of the target type of equipment currently in use at the target location; and a fault warning is issued based on the obtained remaining service life; and / or, A reliability calculation module is configured to calculate the reliability of a target type device currently used at a target location using the following calculation formula: Where R represents the reliability of the target type device currently in use, T represents the length of time the target type device currently in use has been in use at the target location, and AT j represents the service life of the target type of equipment at the target location, δ represents the service life value of the target type of equipment marked at the factory; NORMDIST represents the normal distribution function.

15. A computing device comprising a memory and a processor, wherein the memory stores executable code, and when the processor executes the executable code, the method according to any one of claims 1 to 7 is implemented.

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