Replaceable modular electrical test head and its test pins
Through modular design and stamping process, the hollow cap-shaped thin shell structure and a replaceable electrical detection head with deformation recovery notch are adopted, which solves the high cost and inconvenience of replacement of electrical detection needles, and achieves low-cost and efficient electrical Sexual testing.
Patent Information
- Application Number
- CN202010285539.1
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2020-04-13
- Publication Date
- 2024-12-13
- Estimated Expiration
- 2040-04-13
AI Technical Summary
The existing electrical detection needles have high manufacturing costs and are inconvenient to replace, which leads to an increase in the application cost of the detection device and the joints are easily damaged and require frequent replacement.
The modularly designed replaceable electrical detection head is made of a hollow cap-shaped thin-shell conductive structure and deformation recovery notch, and is made by stamping to achieve rapid assembly and disassembly, reducing production costs and replacement difficulties.
It greatly reduces the replacement cost of the test needle, improves replacement convenience and assembly stability, reduces manufacturing labor hours and material costs, and enhances conduction efficiency and oxide layer scraping ability.
Smart Images
Figure CN113533803B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to the field of electrical testing products, and in particular to a replaceable modular electrical testing head and a test pin having a replaceable modular electrical testing head, which can quickly replace damaged components and significantly reduce the cost of the test pin. Background Art
[0002] In the production process of electronic devices, an important step is to test the electrical conductivity and signal transmission status of the electronic device after assembly. This procedure is to ensure that the components of the electronic device meet the product specifications after assembly, and avoid various possible factors affecting the status of the terminal product.
[0003] In electrical testing operations, different electrical testing devices are selected according to different test objects. Currently, electrical test needles are used as the main components of the test, and the electrical or signal conduction status of the object to be tested is obtained by allowing the electrical test needles to contact the object to be tested. Generally speaking, the electrical test needles are installed on the base corresponding to the distribution of the electrical contacts of the object to be tested, and each electrical test needle has a connector for contacting and electrically conducting with the object to be tested. During testing, the base moves toward the object to be tested so that the connector of the electrical test needle contacts the electrical contacts of the object to be tested and conducts with them to detect whether the object to be tested meets the required electrical state.
[0004] The current electrical test pin connector is machined into the required structure by turning according to the different types of the DUT, so it has a very high manufacturing cost and takes a long time to process. On the other hand, the connector of the electrical test pin is very easy to be damaged due to long-term or multiple contact with the DUT test application, and it must be replaced at this time. In this necessary replacement process, the production cost of the connector is too high, which also causes the application cost of the detection device to increase accordingly, and there are also many inconveniences in replacement.
[0005] In view of this, the present inventor conceives and proposes a replaceable modular electrical testing head and a test pin having the replaceable modular electrical testing head, so as to effectively reduce product cost and improve the convenience of replacement. Summary of the invention
[0006] One purpose of the present invention is to provide a replaceable modular electrical detection head and a test pin having a replaceable modular electrical detection head. The invention concept is to produce a modular component that can be quickly assembled and disassembled, thereby greatly reducing the inconvenience of connector replacement. At the same time, the use of stamping can also reduce production costs and required time, effectively improving the various deficiencies of existing test pins.
[0007] To achieve the above-mentioned purpose, the present invention proposes a replaceable modular electrical detection head in one embodiment, characterized in that: the replaceable modular electrical detection head is a hollow cap-shaped thin shell-like conductive structure, and has a hollow cap-shaped sheath portion, an annular cap brim portion and a deformation recovery notch, the hollow cap-shaped sheath portion is a tubular structure, the annular cap brim portion is a portion provided for electrical contact and is a sheet-like structure, and the annular cap brim portion is formed by extending outward from one end of the hollow cap-shaped sheath portion and has a plurality of protruding structures on the surface, which is bent from one end of the hollow cap-shaped sheath portion through the annular cap brim portion and extends to the edge of the annular cap brim portion; through the change of the deformation recovery notch between force engagement and non-force recovery, the replaceable modular electrical detection head can be used for replacement and installation. By modularizing the structure of the test needle connector component, replacement and assembly operations are facilitated. By utilizing the cap-shaped thin shell structure and the deformation recovery notch thereon, the modular electrical detection head can be quickly and firmly assembled on the test needle used for electrical detection without the need for fixing by other components, and it is also extremely convenient in replacement.
[0008] In another embodiment, the present invention proposes a test needle with a replaceable modular electrical detection head, comprising: a test needle body, which is hollow to accommodate a probe, one end of the test needle body has a test portion, and the test portion has a through hole; a replaceable modular electrical detection head, assembled to the through hole, the replaceable modular electrical detection head is a hollow cap-shaped thin shell-shaped conductive structure, and has a hollow cap-shaped sheath portion, an annular cap brim portion and a deformation recovery notch, the hollow cap-shaped sheath portion is a tubular structure, the annular cap brim portion is a portion for electrical contact and is a sheet-like structure, and the annular cap brim portion is formed by the hollow cap One end of the sheath portion extends outward and is provided with a plurality of protruding structures on the surface, and the one end of the hollow cap-shaped sheath portion is bent through the annular cap brim portion and extends to the edge of the annular cap brim portion; wherein the deformation recovery notch is forced to fit so that the hollow cap-shaped sheath portion is placed on the through-hole of the test needle body, and when the deformation recovery notch is not forced and returns, the hollow cap-shaped sheath portion can be supported against the inner surface of the through-hole to be fixed, and the annular cap brim portion is against the test portion; and an insulating member, which is a tubular structure, is arranged in the through-hole and is located in the hollow area of the replaceable modular electrical detection head, and one end of the probe passes through the insulating member. Accordingly, when the test needle causes damage to the multiple protruding structures after multiple contacts with the object to be tested, the modular electrical test head can be quickly removed and replaced with a new one, which is more convenient to replace than previous products. At the same time, the process cost of the replaceable modular electrical test head is relatively low, which can greatly reduce the component cost required for parts replacement.
[0009] Based on the above two embodiments, preferably, the replaceable modular electrical detection head is made by stamping, and at least one side of the plurality of protruding structures is connected to the annular cap brim, and the annular cap brim has an opening corresponding to each protruding structure position, and a deformation air gap space is formed between the opening and the protruding structure, so that the protruding structure has a margin for deformation under force, thereby allowing the plurality of protruding structures to more easily pierce or scrape off the oxide layer attached to the surface of the object to be tested when contacting the surface of the object to be tested, and at the same time, the plurality of protruding structures can be better protected. In addition, the component cost and manufacturing time can be greatly reduced by stamping. In response to the existing and unavoidable loss in the application of the test needle, the present invention can indeed greatly reduce the application cost of the detection device.
[0010] Furthermore, a preferred implementation state is that the two sides of each of the protruding structures are connected to the annular cap brim and have a triangular structure with a sharp ridge, and the opening is located on the bottom side of the protruding structure, so that the deformed air gap space is a gradually widening triangular shape, thereby improving the conduction performance of the multiple protruding structures.
[0011] Alternatively, in one embodiment, the replaceable modular electrical detection head is made by stamping, and the plurality of protruding structures are symmetrically arranged in pairs, and one side of each of the protruding structures is connected to the annular brim portion, and the annular brim portion forms an opening at a position between any two of the plurality of symmetrically arranged protruding structures, so that a deformed air gap space is formed between the opening and the protruding structure, and the deformed air gap space is gradually widened triangular, so that the protruding structure has a margin for deformation under force, which can also enhance the sliding scraping performance relative to the surface of the object to be tested, and prevent the problem of damage to the plurality of protruding structures under force. And further, any two of the plurality of symmetrically arranged protruding structures are tilted toward each other, so that each of the protruding structures is an inclined structure with a curved surface or a plane, and accordingly, the plurality of protruding structures can have better conduction performance when contacting the plane of the object to be tested.
[0012] In addition, in order to increase the contact area of the plurality of protruding structures with the object to be tested and the oxide layer scraping efficiency, preferably, the plurality of protruding structures are arranged in a single row or multiple rows in a ring shape.
[0013] In summary, the replaceable modular electrical detection head and the test needle with the replaceable modular electrical detection head proposed in the present invention are modularly designed for the connector part of the electrical test needle, so that the test needle connector has better convenience in replacement. The replaceable modular electrical detection head is made by stamping, which can have lower component manufacturing cost and required process time, and the replaceable modular electrical detection head has a special structural design, using a hollow cap-shaped thin shell structure and the deformation recovery notch thereon. During assembly, it only needs to be squeezed to temporarily close the deformation recovery notch and place the hollow cap-shaped sheath part in the perforation, and then released to allow the deformation recovery notch to return to its original shape in response to elasticity, so that the hollow cap-shaped sheath part is firmly against the inner surface of the perforation, so that the replaceable modular electrical detection head has better assembly stability. BRIEF DESCRIPTION OF THE DRAWINGS
[0014] Figure 1 It is a three-dimensional schematic diagram of a modular electrical testing head according to a preferred embodiment of the present invention.
[0015] Figure 2 FIG. 2 is a three-dimensional schematic diagram of a modular electrical testing head from another perspective of a preferred embodiment of the present invention.
[0016] Figure 3 Schematic diagram of the protruding structure of the modular electrical detection head according to a preferred embodiment of the present invention.
[0017] Figure 4 It is a three-dimensional schematic diagram of another implementation of the modular electrical testing head of the preferred embodiment of the present invention.
[0018] Figure 5 It is a schematic diagram of the protruding structure of another implementation of the modular electrical testing head of the preferred embodiment of the present invention.
[0019] Figure 6 Schematic diagram of the detection needle decomposition of a preferred embodiment of the present invention.
[0020] Figure 7 It is a schematic cross-sectional diagram of the detection needle assembly according to a preferred embodiment of the present invention.
[0021] Explanation of the accompanying drawings: 1-replaceable modular electrical detection head; 10-hollow cap-shaped sheath; 11-annular cap brim; 111-protruding structure; 1111-side; 112-opening; 12-deformation recovery notch; 2-test needle; 20-test needle body; 201-test part; 202-perforation; 2021-stop part; 21-insulating part; 3-probe; A-deformation air gap space. DETAILED DESCRIPTION
[0022] In order to enable a person having ordinary knowledge in the art to clearly understand the contents of the present invention, the following description is provided with reference to the drawings.
[0023] See also Figure 1 , Figure 2 , Figure 3 and Figure 6 , which is a three-dimensional schematic diagram of a modular electrical detection head of a preferred embodiment of the present invention, a three-dimensional schematic diagram from another perspective, a schematic diagram of a protruding structure, and a schematic diagram of a detection needle decomposition. The present invention discloses a modular electrical detection head 1, which is provided for installation on a test needle 2, and the test needle 2 is provided for electrical or signal detection of various electronic devices such as batteries and semiconductor components. The replaceable modular electrical detection head 1 is characterized in that it is a hollow cap-shaped thin shell-like conductive structure, and has a hollow cap-shaped sheath portion 10, an annular cap brim portion 11 and a deformation recovery notch 12, the hollow cap-shaped sheath portion 10 is a tubular structure, the annular cap brim portion 11 is a portion for electrical contact and is a sheet-like structure, and the annular cap brim portion is formed by extending outward from one end of the hollow cap-shaped sheath portion 10 and has a plurality of protruding structures 111 on the surface. The deformation recovery notch 12 is bent from one end of the hollow cap-shaped sheath portion 10 through the annular cap brim portion 11 and extends to the edge of the annular cap brim portion 11, that is, the deformation recovery notch 12 extends from the end of the hollow cap-shaped sheath portion 10 that is not connected to the annular cap brim portion 11 to the edge of the annular cap brim portion 11, so that the deformation recovery notch 12 passes through the hollow cap-shaped sheath portion 10 and the annular cap brim portion 11. In this way, the replaceable modular electrical detection head 1 can achieve the effects of quick replacement and stable installation through the change of the deformation recovery notch 12 being forced to fit and not forced to return. In other words, through the deformation recovery notch 12, the replaceable modular electrical detection head 1 can automatically form an installation clamp due to the structural elasticity. When the replaceable modular electrical detection head 1 is to be installed, the replaceable modular electrical detection head 1 can be slightly pressed to make the deformation recovery notch 12 close and thus make the hollow cap-shaped sheath portion 10 slightly shrink. At this time, the hollow cap-shaped sheath portion 10 can be placed at a through-hole 202 of the test needle 2, and when the replaceable modular electrical detection head 1 is released, the deformation recovery notch 12 will automatically return to its original position due to the elasticity. At this time, an outward supporting force will be formed relative to the through-hole 202, so that the replaceable modular electrical detection head 1 will naturally form a firmly supported installation state relative to the test needle 2.
[0024] Accordingly, for users and providers of electrical detection devices, the use of the replaceable modular electrical detection head 1 can greatly improve the convenience of replacement and assembly, while reducing the production cost and working hours of components. In the face of the inevitable problem of joint damage, compared with the traditional joints that have to be made by turning in the past, the present invention can greatly reduce the manufacturing cost and also have a better molding qualification rate, and there is no need to replace the entire test needle through complicated disassembly and assembly procedures. In addition, the thin shell product structure also effectively reduces the cost of component materials. In addition, the replaceable modular electrical detection head 1 has a special structural design, and its overall structure is a thin shell structure, such as a cap-shaped structure with a hollow area formed by bending or folding a sheet, and the two ends of the sheet are not connected to each other, and the annular cap brim 11 has a plurality of protruding structures 111 that can improve the conduction performance, which is indeed a new structural technical feature in this field. The reserved deformation recovery notch 12 allows the replaceable modular electrical test head 1 to be mounted on the test pin 2 through the through hole 202, and to be pressed against the inner surface of the through hole 202 in response to the reverse elastic force, thereby improving its assembly stability, so that the replaceable modular electrical test head 1 can be firmly fixed in the through hole without any external fixing elements, achieving the effect of quick and easy assembly. The plurality of protruding structures 111 on the annular cap brim 11 can scrape or pierce the oxide layer on the surface of the object to be tested when in contact with the object to be tested, thereby improving the conduction strength.
[0025] In order to improve the conductive contact effect of the annular brim 11 with the object to be tested, the plurality of protruding structures 111 can be arranged in a single row or multiple rows in a ring shape, so that when the annular brim 11 contacts the object to be tested, the plurality of protruding structures 111 can scrape off the oxide layer on the surface of the object to be tested as much as possible. In addition, since the replaceable modular electrical detection head 1 is a thin shell structure, the plurality of protruding structures 111 are arranged in a ring shape, which can take into account the structural rigidity of the annular brim 11.
[0026] Preferably, the replaceable modular electrical detection head 1 is made by stamping. It is particularly worth mentioning that the starting point of the present invention is to improve the inconvenience and defects of existing electrical connectors. Based on the development direction of how to effectively reduce the process and material costs, it is proposed to produce a single product that can be quickly assembled and replaced by stamping. Compared with the existing technical structure in the relevant field, the material and manufacturing costs are greatly reduced, which really jumps out of the common process solutions and choices in this technical field. At the same time, the multiple protruding structures 111 are also formed by stamping. Compared with the micro-protruding structures on the connectors that are currently seen to be made by turning, the present invention is more conducive to greatly reducing working hours and manufacturing costs, and will not be easily affected by waste like turning and reduce the structural qualification rate. The multiple protruding structures 111 can be adapted to the type of object to be tested and the test requirements.
[0027] The design is based on the premise of being able to reliably electrically conduct with the object to be tested. In this embodiment, it is preferably that the multiple protruding structures 111 are symmetrically arranged in pairs, and a side edge 1111 of each of the protruding structures 111 is connected to the annular brim 11, so that the annular brim 11 is formed with an opening 112 at a position between any two of the multiple symmetrically arranged protruding structures 111. At the same time, a deformed air gap space A is formed between the opening 112 and the protruding structure 111, and the deformed air gap space A is a gradually widening triangular shape, so that the protruding structure 111 has a margin for deformation under force. Accordingly, during testing, after the annular brim 11 contacts the object to be tested, the symmetrically arranged multiple protruding structures 111 can more easily pierce the oxide layer, effectively reducing the influence of the oxide layer on electrical conductivity. At the same time, through the multiple openings 112 and the deformable air gap space A, the multiple protruding structures 111 can have space to deform and displace when subjected to the reaction force of the plane of the object to be tested, so that the multiple protruding structures 111 can also have the effect of sliding and scraping. That is, the deformable air gap space A can provide the multiple protruding structures 111 with a deformation margin allowance space, preventing the multiple protruding structures 111 from interfering with and colliding with the annular brim 11 and causing damage when they are pressed by force, so as to increase the space in which the multiple protruding structures 111 can be deformed. For example, refer to Figure 3 As shown in the figure, (a) shows the state of the plurality of protruding structures 111 before being subjected to force, and (b) shows the state of the plurality of protruding structures 111 after being subjected to force. When a group of the plurality of protruding structures 111 is deformed by pressure, it can be seen that each of the protruding structures 111 is displaced toward the opening 112, and the spacing between the plurality of protruding structures 111 on the bottom side is increased accordingly. The deformed air gap space A is reduced due to the displacement of the plurality of protruding structures 111. The deformed air gap space A allows the plurality of protruding structures 111 to receive the applied force in the above-mentioned deformation manner, thereby preventing the plurality of protruding structures 111 from being offset or damaged. Preferably, the plurality of protruding structures 111 can be thin sheet structures. Furthermore, any two symmetrically arranged plurality of protruding structures 111 are inclined toward each other, so that each protruding structure 111 is an inclined structure with a curved surface or a flat surface, which is more helpful to pierce and scrape off the oxide layer on the object to be tested. When each protruding structure 111 is an inclined structure, the plurality of protruding structures 111 can have an inclined plane, or an inclined curved surface so that each protruding structure 111 is an arc-shaped inclined structure. Here, each protruding structure 111 has an inclined curved surface as an example. Figure 1As shown, in this way, when scraping off the oxide layer, it can have a better force-slip effect. Furthermore, the multiple protruding structures 111 can be of equal size, so that the deformed air gap space A is formed into an isosceles gradually widening triangular space, so that the effect of average support pressure can be achieved, so that the multiple protruding structures 111 are not easily damaged by force, causing extreme damage. In addition, when the multiple protruding structures 111 are arranged symmetrically in pairs, the multiple protruding structures 111 are arranged in a single row or multiple rows in a ring, which means that each symmetrically arranged pair of protruding structures 111 is arranged one by one to form a ring, as shown in the figure.
[0028] In addition to the aforementioned state of the multiple protruding structures 111, the multiple protruding structures 111 may also be arranged in a state where they are not symmetrically arranged in pairs, but rather are arranged so that at least one side 1111 is connected to the annular brim 11, and the annular brim 11 has an opening 112 corresponding to the position of each protruding structure 111, and a deformation air gap space is formed between the opening 112 and the protruding structure 111, so that the protruding structure 111 has a margin for deformation under force, and the replaceable modular electrical detection head 1 is also made by stamping. In this way, the plurality of protruding structures 111 are convex relative to the annular brim 11, like a sheet lifted relative to the annular brim 11, which is beneficial to improve the conduction performance, and the annular brim 11 has the opening 112 at the position below the protruding structure 111, and the deformed air gap space formed by the opening 112 and the protruding structure 111 can reserve space for the plurality of protruding structures 111 to slide or move due to force, so as to reduce the loss probability. Figure 4 , Figure 5 , which is a three-dimensional schematic diagram and a protruding structure schematic diagram of another embodiment of the modular electrical detection head of the preferred embodiment of the present invention. The plurality of protruding structures 111 can also be as Figure 4 As shown, the two side edges 1111 of each protruding structure 111 are connected to the annular brim 11 and have a triangular structure with a sharp ridge. The opening 112 is located on the bottom side of the protruding structure 111, so that the deformed air gap space A is a gradually widening triangular shape. Accordingly, when the plurality of protruding structures 111 contact the surface of the object to be tested, they can pierce the oxide layer on the surface of the object to be tested and truly achieve conduction with the object to be tested. Similarly, the deformed air gap space A on the bottom side of the protruding structure 111 can also reserve space for the protruding structure 111 to be displaced under force, thereby providing the plurality of protruding structures 111 with an allowable space for deformation margin, thereby preventing the plurality of protruding structures 111 from interfering with and colliding with the annular brim 11 and causing damage when the plurality of protruding structures 111 are pressed under force. See. Figure 5As shown in the figure, (a) shows the state of the protruding structure 111 before being stressed, and (b) shows the state of the protruding structure 111 after being stressed. During the test, when the protruding structure 111 is pressed, it can move toward the opening 112, and the deformed air gap space A can make the protruding structure 111 have a deformation margin to avoid damage to the protruding structure 111 after being stressed. Similarly, the protruding structure 111 can be an isosceles triangle structure to make its force distribution more uniform and reduce the probability of damage.
[0029] Please also refer to Figure 6 and Figure 7, which is a schematic diagram of the test needle decomposition and partial assembly cross-sectional diagram of a preferred embodiment of the present invention, and please refer to Figures 1 to 5 again. The present invention also discloses a test needle 2 with a replaceable modular electrical detection head, comprising a test needle body 20, a replaceable modular electrical detection head 1 and an insulating member 21. The test needle 2 is a component for performing electrical or signal detection on electronic devices such as batteries and semiconductor components as mentioned above, and the test needle 2 can be assembled on the base of the test device according to the distribution pattern of the electrical contacts of the object to be tested, so a large number of test needles are generally provided on a base. The test needle body 20 is hollow to accommodate the probe 3, and one end of the test needle body 20 has a test portion 201, and the test portion 201 is provided with a through hole 202. The replaceable modular electrical detection head 1 is inserted into the through hole 202, and as mentioned above, the replaceable modular electrical detection head 1 is a hollow cap-shaped thin shell-shaped conductive structure, and has a hollow cap-shaped sheath portion 10, an annular cap brim portion 11 and a deformation recovery notch 12, the hollow cap-shaped sheath portion 10 is a tubular structure, the annular cap brim portion 11 is a portion for electrical contact and is a sheet-like structure, and the annular cap brim portion 11 is formed by extending outward from one end of the hollow cap-shaped sheath portion 10 and has a plurality of protruding structures on the surface. The structure 111 is provided for contacting with the object to be tested, and the deformation recovery notch 12 is bent from one end of the hollow cap-shaped sheath portion 10 through the annular cap brim portion 11 and extends to the edge of the annular cap brim portion 11; wherein when the deformation recovery notch 12 is close due to force, the hollow cap-shaped sheath portion 10 can be placed in the through hole 202, and after the deformation recovery notch 12 is not force-restored, the hollow cap-shaped sheath portion 10 is supported outwardly against the inner surface of the through hole 102 to form a fixation, and the annular cap brim portion 11 is against the test portion 101. The insulating member 21 is a tubular structure, which is arranged in the through hole 202 and located in the hollow area of the replaceable modular electrical detection head 1, and one end of the probe 3 passes through the insulating member 21, preferably protruding out of the insulating member 21, and the insulating member 21 can prevent the probe 3 and the replaceable modular electrical detection head 1 from contacting each other and short-circuiting. Preferably, a stopper 2021 may be provided in the through hole 202, so that when the insulating member 21 is set in the through hole 202, the stopper 2021 can achieve a positioning effect, and the hollow cap-shaped sheath portion 10 of the replaceable modular electrical detection head 1 is located between the inner surface of the through hole 202 and the insulating member 21, so as to effectively achieve the insulation and short-circuit prevention effect.
[0030] Through the replaceable modular electrical detection head 1, the overall cost of the test needle 2 can be effectively reduced. At the consumables level, the manufacturing cost of the replaceable modular electrical detection head 1 is low, the manufacturing time is short, and the material cost is also low. Therefore, in the face of the problem of the connector being damaged due to contact with the object to be tested and needing to be replaced, the test needle 2 using the replaceable modular electrical detection head 1 can greatly reduce the cost caused by consumables. In addition, at the assembly level, because the replaceable modular electrical detection head 1 is a thin shell structure and has the deformation recovery notch 12, when assembling, it is only necessary to squeeze the replaceable modular electrical detection head 1 so that the deformation recovery notch 12 is close to allow the hollow cap-shaped sheath portion 10 to be placed in the perforation 202, and then release it to allow the deformation recovery notch 12 to recover due to the elasticity of the material. At this time, the hollow cap-shaped sheath portion 10 is firmly supported against the inner surface of the perforation 202, so that the replaceable modular electrical detection head 1 is stably installed on the test needle body 20. On the contrary, during disassembly, the replaceable modular electrical testing head 1 can be quickly removed from the through hole 202 by using a jig, for example. Therefore, the replacement operation can be faster, simpler and more convenient, saving time and effort.
[0031] A preferred assembly process may be to first place the insulating member 21 in the through hole 202 and position it by the stopper 2021. At this time, the insulating member 21 and the inner surface of the through hole 202 are sandwiched to form a gap, and then the replaceable modular electrical test head 1 is installed in the through hole 202 in the aforementioned manner, that is, at the aforementioned gap. At this time, the insulating member 21 is located in the hollow area of the replaceable modular electrical test head 1, and the probe 3 can be inserted from the end of the test needle body 20 relative to the test part 201 until it passes through the hollow area of the insulating member 21. During testing, the annular cap brim 11 against the test part 201 is provided for contacting the object to be tested. At this time, the oxide layer attached to the surface of the object to be tested can be effectively pierced or scraped off by the plurality of protruding structures 111 to ensure electrical conduction.
[0032] Likewise, the plurality of protruding structures 111 may be arranged in a single row or multiple rows in an annular shape, so that when the annular brim 11 contacts the object to be tested, the plurality of protruding structures 111 can scrape off the oxide layer on the surface of the object to be tested as much as possible. Furthermore, the plurality of protruding structures 111 can be designed based on the type or requirements of the object to be tested, on the basis of ensuring electrical conduction with the object to be tested. Preferably, the replaceable modular electrical detection head 1 is made by stamping, and the plurality of protruding structures 111 are symmetrically arranged in pairs, and a side edge 1111 of each of the protruding structures 111 is connected to the annular brim 11, so that the annular brim 11 forms an opening 112 at a position between any two of the plurality of symmetrically arranged protruding structures 111, and a deformed air gap space A is formed between the opening 112 and the protruding structure 111, and the deformed air gap space A is a gradually widening triangular shape, so that the protruding structure 111 has a margin for deformation under stress. Furthermore, any two of the plurality of symmetrically arranged protruding structures 111 can be further inclined toward each other, so that each of the protruding structures 111 is an inclined structure with a curved surface or a plane, which is more helpful for piercing the oxide layer on the object to be tested, such as Figures 1 to 3 The structural state shown in the figure, when the plurality of protruding structures 111 are symmetrically arranged in pairs, the plurality of protruding structures 111 are arranged in a single row or multiple rows in a ring shape, which means that each symmetrically arranged pair of protruding structures 111 are arranged one by one to form a ring, as shown in the figure, and the other related detailed technical features and functions are combined with the aforementioned corresponding content, which will not be repeated here.
[0033] Alternatively, the plurality of protruding structures 111 may also be in a structural state in which at least one side 1111 is connected to the annular brim 11, and the annular brim 11 has an opening 112 at the position corresponding to each of the protruding structures 111, and a deformation air gap space A is formed between the opening 112 and the protruding structure 111, so that the protruding structure 111 has a margin for deformation under force. In this way, the plurality of protruding structures 111 are convex relative to the annular brim 11, which is beneficial to improving the conduction performance, and the annular brim 11 has the opening 112 at the position below the protruding structure 111, so that space can be reserved for the plurality of protruding structures 111 to slide or shift under force. For further information, please refer to Figure 4 , Figure 5 As shown, the two side edges 1111 of each protruding structure 111 are connected to the annular brim 11 and have a triangular structure with a sharp ridge, and the opening 112 is located at the bottom of the protruding structure 111, so that the deformed air gap space A is a gradually widening triangular shape. The other related detailed technical features and their functions are referred to in conjunction with the above corresponding contents, and will not be repeated here.
[0034] In summary, the replaceable modular electrical detection head 1 and the test needle 2 with the replaceable modular electrical detection head proposed in the present invention are modularly designed for the connector part of the electrical test needle, so that the test needle connector has excellent replaceability and convenience in operation. The replaceable modular electrical detection head 1 is made by stamping, which can have lower component manufacturing cost and required process time, and at the same time reduce the consumable cost of the detection device. And the replaceable modular electrical detection head 1 has a special structural design. By using the deformation recovery notch 12, during assembly, it is only necessary to squeeze the deformation recovery notch 12 to temporarily close the hollow cap-shaped sheath part 10 and place it in the perforation. Then, the deformation recovery notch 12 can be released to allow the elastic recovery of the material, so that the hollow cap-shaped sheath part 10 can be firmly against the inner surface of the perforation 202, so that the replaceable modular electrical detection head 1 has better assembly stability, and does not need to be assisted by other workpieces to achieve the fixing effect. With respect to the annular cap brim 11 and the plurality of protruding structures 111 thereon, the present invention also discloses further technical features, such as providing the plurality of protruding structures 111 with an allowable space for deformation when subjected to force through the deformation air gap space A. In addition to enhancing the piercing and scraping performance of the plurality of protruding structures 111 with respect to the oxide layer of the object to be tested, it can also effectively prevent the plurality of protruding structures 111 from being damaged after being subjected to force, thereby greatly improving the structural strength and application performance of the replaceable modular electrical detection head 1.
[0035] The above description is only illustrative rather than restrictive of the present invention. Those skilled in the art will understand that many modifications, changes or equivalents may be made without departing from the spirit and scope defined by the claims, but all will fall within the scope of protection of the present invention.
Claims
1. A replaceable modular electrical test head, Features: The replaceable modular electrical detection head is a hollow cap-shaped thin shell-shaped conductive structure, and has a hollow cap-shaped sheath portion, an annular cap brim portion and a deformation recovery notch, the hollow cap-shaped sheath portion is a tubular structure, the annular cap brim portion is a portion for electrical contact and is a sheet-shaped structure, the annular cap brim portion is formed by extending outward from one end of the hollow cap-shaped sheath portion and has a plurality of protruding structures on the surface, the deformation recovery notch is bent from one end of the hollow cap-shaped sheath portion through the annular cap brim portion and extends to the edge of the annular cap brim portion; through the change of the deformation recovery notch being forced to fit and not being forced to return, the replaceable modular electrical detection head can be used for replacement and installation; At least one side of the plurality of protruding structures is connected to the annular brim portion, and the annular brim portion has an opening at the position corresponding to each of the protruding structures, and a deformable air gap space is formed between the opening and the protruding structure, so that the protruding structure has a margin for deformation under force; or, the plurality of protruding structures are symmetrically arranged in pairs, and one side of each of the protruding structures is connected to the annular brim portion, and the annular brim portion has an opening at a position between any two of the plurality of symmetrically arranged protruding structures, so that a deformable air gap space is formed between the opening and the protruding structure, and the deformable air gap space is a gradually widening triangular shape, so that the protruding structure has a margin for deformation under force.
2. The replaceable modular electrical test head according to claim 1, It is characterized in that The replaceable modular electrical detection head is manufactured by stamping.
3. The replaceable modular electrical test head according to claim 2, It is characterized in that The two sides of each protruding structure are connected to the annular cap brim and have a triangular structure with a sharp ridge. The opening is located at the bottom side of the protruding structure, so that the deformed air gap space is a gradually widening triangular shape.
4. The replaceable modular electrical test head according to claim 1, It is characterized in that The replaceable modular electrical detection head is made by stamping.
5. The replaceable modular electrical test head according to claim 4, It is characterized in that Any two of the plurality of symmetrically arranged protruding structures are inclined toward each other, so that each of the protruding structures is an inclined structure with a curved surface or a flat surface.
6. A replaceable modular electrical test head as claimed in any one of claims 1 to 5, It is characterized in that The plurality of protruding structures are arranged in a single row or multiple rows in a ring shape.
7. A test needle with a replaceable modular electrical test head, It is characterized in that Include: A test needle body, which is hollow to accommodate the probe, has a test portion at one end, and the test portion has a through hole; A replaceable modular electrical detection head is assembled to the perforation. The replaceable modular electrical detection head is a hollow cap-shaped thin shell-shaped conductive structure and has a hollow cap-shaped sheath portion, an annular cap brim portion and a deformation recovery notch. The hollow cap-shaped sheath portion is a tubular structure. The annular cap brim portion is a portion for electrically contacting the object to be tested and is a sheet-shaped structure. The annular cap brim portion is formed by extending outward from one end of the hollow cap-shaped sheath portion and has a plurality of protruding structures on the surface. The deformation recovery notch is bent from one end of the hollow cap-shaped sheath portion through the annular cap brim portion and extends to the edge of the annular cap brim portion; wherein when the deformation recovery notch is forced to fit and the hollow cap-shaped sheath portion is placed on the perforation of the test needle body, when the deformation recovery notch is not forced and returns, the hollow cap-shaped sheath portion can be supported outward against the inner surface of the perforation to be fixed, and the annular cap brim portion is against the test portion; and An insulating member, which is a tubular structure, is disposed in the through hole and is located in the hollow area of the replaceable modular electrical testing head, and one end of the probe passes through the insulating member; At least one side of the plurality of protruding structures is connected to the annular brim portion, and the annular brim portion has an opening at the position corresponding to each of the protruding structures, and a deformable air gap space is formed between the opening and the protruding structure, so that the protruding structure has a margin for deformation under force; or, the plurality of protruding structures are symmetrically arranged in pairs, and one side of each of the protruding structures is connected to the annular brim portion, and the annular brim portion has an opening at a position between any two of the plurality of symmetrically arranged protruding structures, so that a deformable air gap space is formed between the opening and the protruding structure, and the deformable air gap space is a gradually widening triangular shape, so that the protruding structure has a margin for deformation under force.
8. The test needle with replaceable modular electrical test head as claimed in claim 7, It is characterized in that The replaceable modular electrical detection head is made by stamping.
9. The test needle with replaceable modular electrical test head as claimed in claim 8, It is characterized in that The two sides of each protruding structure are connected to the annular cap brim and have a triangular structure with a sharp ridge. The opening is located at the bottom side of the protruding structure, so that the deformed air gap space is a gradually widening triangular shape.
10. The test needle with replaceable modular electrical test head as claimed in claim 7, It is characterized in that The replaceable modular electrical detection head is made by stamping.
11. The test needle with replaceable modular electrical test head as claimed in claim 10, It is characterized in that Any two of the plurality of symmetrically arranged protruding structures are inclined toward each other, so that each of the protruding structures is an inclined structure with a curved surface or a flat surface.
12. A test needle with a replaceable modular electrical test head as claimed in any one of claims 9 to 11, It is characterized in that The plurality of protruding structures are arranged in a single row or multiple rows in a ring shape.