Gate inspection portion and display device including the same

Abstract

A gate inspection portion and a display device including the same are provided. The gate inspection portion includes a plurality of compound pads electrically connected to a plurality of gate lines. The plurality of gate lines extends in a first direction and is arranged along a second direction crossing the first direction. Each of the plurality of compound pads includes an antistatic pad, a first inspection pad spaced apart from the antistatic pad and providing a gate inspection signal to each of the plurality of gate lines, and a second inspection pad overlapping the antistatic pad and the first inspection pad. The second inspection pad electrically connects the antistatic pad and the first inspection pad.

Description

Technical Field

[0001] This disclosure generally relates to display devices. More specifically, this disclosure relates to display devices including a gate inspection section having composite pads. Background Technology

[0002] Typically, a display device includes a display panel for displaying images and a panel driver for providing signals to the display panel. The display panel may include lines for transmitting signals. To increase the yield rate of the display device, an inspection device for checking for defects in the lines can be added during the manufacturing process. An inspection unit can be additionally arranged in the display device to perform the inspection. Furthermore, since static electricity may be generated during the manufacturing process or during use of the display device, an anti-static unit can be additionally arranged in the display device to protect the display panel and / or panel driver from overcurrent caused by static electricity.

[0003] However, when the inspection section and the anti-static section are arranged separately in the display device, the display area of ​​the display device decreases, while the non-display area increases. Therefore, there is a need to develop a novel display device that can perform defect inspection and protect the display device from electrostatic effects without reducing the display area.

[0004] The information disclosed in this background section is only for understanding the background of this disclosure, and therefore may contain information that does not constitute prior art. Summary of the Invention

[0005] Some implementations provide a gate inspection section that includes a composite pad.

[0006] Some implementations provide a display device that includes a gate inspection section.

[0007] The gate inspection section according to an embodiment may include a plurality of composite pads electrically connected to a plurality of gate lines, and the plurality of gate lines may extend in a first direction and be arranged along a second direction intersecting the first direction. Each of the plurality of composite pads may include an anti-static pad, a first inspection pad spaced apart from the anti-static pad and providing a gate inspection signal to each of the plurality of gate lines, and a second inspection pad overlapping the anti-static pad and the first inspection pad. The second inspection pad may be electrically connected to the anti-static pad and the first inspection pad.

[0008] According to the implementation method, multiple composite pads can be connected to multiple gate lines respectively.

[0009] According to the implementation method, the composite pads can be arranged alternately in a Z-shaped pattern along the second direction.

[0010] According to the implementation method, the second inspection pad can be arranged on the antistatic pad and the first inspection pad.

[0011] According to an embodiment, the antistatic pad may include the same material as the first inspection pad.

[0012] According to the implementation, the length of the second inspection pad in the first direction and the length in the second direction can be approximately 100 μm.

[0013] According to the implementation method, the area of ​​the antistatic pad may be smaller than the area of ​​the first inspection pad.

[0014] According to the implementation method, the length of the antistatic pad in the second direction may be equal to the length of the first inspection pad in the second direction.

[0015] According to the implementation method, the length of the antistatic pad in the first direction may be less than the length of the first inspection pad in the first direction.

[0016] According to the implementation method, the second inspection pad can contact the antistatic pad through a plurality of first contact holes, and can also contact the first inspection pad through a second contact hole.

[0017] According to the implementation method, the area of ​​each of the plurality of first contact holes may be smaller than the area of ​​the second contact hole.

[0018] The display device according to an embodiment may include a display panel comprising a plurality of gate lines, a gate driver adjacent to the display panel and providing gate signals to the plurality of gate lines, and a gate inspection section comprising a plurality of composite pads, wherein the plurality of composite pads are electrically connected to the plurality of gate lines. Each of the plurality of composite pads may include an anti-static pad, a first inspection pad spaced apart from the anti-static pad and providing gate inspection signals to each of the plurality of gate lines, and a second inspection pad overlapping the anti-static pad and the first inspection pad, the second inspection pad being electrically connected to the anti-static pad and the first inspection pad.

[0019] According to an embodiment, the gate inspection section may be arranged between the display panel and the gate driver.

[0020] According to an embodiment, the display panel may further include pixel electrodes disposed on the gate lines, and the second inspection pad may include the same material as the pixel electrodes.

[0021] According to an embodiment, the antistatic pad and the first inspection pad may comprise the same material as the gate line.

[0022] According to an embodiment, the display panel may further include an active layer disposed on a gate line, a source electrode disposed on the active layer, and a drain electrode disposed on the active layer and spaced apart from the source electrode.

[0023] According to the implementation method, the area of ​​the antistatic pad may be smaller than the area of ​​the first inspection pad.

[0024] According to an embodiment, a plurality of gate lines may extend in a first direction and may be arranged along a second direction intersecting the first direction, and the length of the antistatic pad in the second direction may be equal to the length of the first inspection pad in the second direction.

[0025] According to the implementation method, the length of the antistatic pad in the first direction may be less than the length of the first inspection pad in the first direction.

[0026] According to the implementation method, the second inspection pad can contact the antistatic pad through a plurality of first contact holes, and can contact the first inspection pad through a second contact hole.

[0027] Therefore, the gate inspection unit according to the embodiment may include a plurality of composite pads. Each of the plurality of composite pads may include an antistatic pad, a first inspection pad, and a second inspection pad. The second inspection pad may be electrically connected to the antistatic pad and the first inspection pad. Since the first inspection pad is connected to the gate line and the second inspection pad has sufficient area, the gate inspection unit can accurately inspect whether the gate line is short-circuited and / or the short-circuit location.

[0028] Furthermore, since the anti-static pads and the first inspection pads are spaced apart from each other, the gate inspection section can protect the display panel and / or gate driver from electrostatic effects.

[0029] Furthermore, since the second inspection pad overlaps with the antistatic pad and the first inspection pad, the non-display area where the gate inspection section is located can be reduced.

[0030] It will be understood that the foregoing general description and the following detailed description are illustrative and explanatory, and are intended to provide a further explanation of the claimed disclosure. Attached Figure Description

[0031] The accompanying drawings, which are included to provide a further understanding of the present disclosure and are incorporated in and constitute a part of this specification, illustrate embodiments of the present disclosure and, together with the description, serve to explain the present disclosure.

[0032] Figure 1 This is a plan view showing a display device according to an embodiment.

[0033] Figure 2 It is shown Figure 1 A block diagram of the display device.

[0034] Figure 3 and Figure 4 It is shown Figure 1 A plan view of the gate inspection section included in the display device.

[0035] Figure 5 It is shown Figure 1A cross-sectional view of the gate inspection section and the display panel included in the display device.

[0036] Figure 6 It shows the inspection Figure 1 A plan view of a method for including gate lines in a display device.

[0037] Figure 7 It shows protection Figure 1 A plan view of a method for protecting a display panel included in a display device from overcurrent caused by static electricity. Detailed Implementation

[0038] The illustrative, non-limiting embodiments will become clearer from the following detailed description taken in conjunction with the accompanying drawings.

[0039] Figure 1 This is a plan view showing a display device according to an embodiment. Figure 2 It is shown Figure 1 A block diagram of the display device.

[0040] Reference Figure 1 and Figure 2 The display device 1000 according to the embodiment may include a display panel 10 disposed in a display area DA and a panel driver disposed in a non-display area NDA. The panel driver may include a gate driver 20, a data driver 30, a timing controller 40, and a gate checking unit 50. The panel driver may provide voltage and signals to the display panel 10. The display panel 10 may receive voltage and signals to display an image.

[0041] When viewed on a flat surface, the non-display area NDA can be arranged to surround the display area DA. For example, the non-display area NDA can be arranged to surround the left edge, right edge, and bottom edge of the display area DA. In an embodiment, the gate driver 20 and the gate inspection section 50 can be arranged at the left edge and / or right edge of the display area DA. Since the display device 1000 includes the gate inspection section 50 containing a plurality of composite pads, the area of ​​the gate inspection section 50 can be reduced compared to the prior art. Accordingly, the display device 1000 can secure the area of ​​the display panel 10. In addition, in order to improve the display quality of the display device 1000, the display device 1000 can secure the area of ​​the gate driver 20 or add a separate component to the non-display area NDA.

[0042] Display panel 10 may include a plurality of gate lines GL, a plurality of data lines DL, and a plurality of pixels PX. Pixels PX may be electrically connected to the gate lines GL and the data lines DL. For example, the gate lines GL may extend in a first direction D1 and may be arranged along a second direction D2 intersecting the first direction D1. The data lines DL may extend in the second direction D2 and may be arranged along the first direction D1. Pixels PX may be arranged at the points where the gate lines GL and data lines DL intersect. In one embodiment, display panel 10 may be a liquid crystal display (“LCD”) panel. In another embodiment, display panel 10 may be an organic light-emitting display (“OLED”) panel or any other display panel.

[0043] Gate driver 20 may receive a gate control signal GCTRL from timing controller 40. For example, the gate control signal GCTRL may include a vertical start signal and a scan clock signal. Gate driver 20 may generate a gate signal GS based on the gate control signal GCTRL. The gate signal GS may be provided to pixel PX via gate line GL. For example, gate driver 20 may provide the gate signal GS sequentially to gate line GL on a row-by-row basis. In an embodiment, gate driver 20 may be integrated or formed in a non-display area NDA. For example, gate driver 20 may be arranged adjacent to the left and right edges of display panel 10. Alternatively, gate driver 20 may be arranged adjacent only to the left edge of display panel 10.

[0044] The data driver 30 may receive a data control signal DCTRL and output image data ODAT from the timing controller 40. For example, the data control signal DCTRL may include a horizontal start signal, an output data enable signal, and a load signal. The data driver 30 may generate a data voltage DS based on the data control signal DCTRL and the output image data ODAT. The data voltage DS may be provided to the pixel PX via the data line DL. In an embodiment, the data driver 30 may be formed on a first printed circuit board 35. For example, the first printed circuit board 35 may be a flexible printed circuit board. The first printed circuit board 35 may be arranged adjacent to the bottom edge of the display area DA and may be flexible.

[0045] The timing controller 40 can receive a control signal CTRL and input image data IDAT from an external device. For example, the control signal CTRL may include a vertical synchronization signal, a master clock signal, a horizontal synchronization signal, and an input data enable signal. For example, the input image data IDAT may be RGB image data including red image data, green image data, and blue image data. The timing controller 40 can control the gate driver 20 and the data driver 30 based on the control signal CTRL and the input image data IDAT. In an embodiment, the timing controller 40 may be formed on a second printed circuit board 45. For example, the second printed circuit board 45 may contact the first printed circuit board 35. When the first printed circuit board 35 is bent, the second printed circuit board 45 may face the rear surface of the display panel 10.

[0046] The gate inspection unit 50 may be arranged in the non-display area NDA between the display panel 10 and the gate driver 20. For example, the gate inspection unit 50 may be arranged adjacent to the left edge of the display panel 10 between the display panel 10 and the gate driver 20, and may be arranged adjacent to the right edge of the display panel 10 between the display panel 10 and the gate driver 20.

[0047] The gate inspection unit 50 can be electrically connected to the display panel 10 and the gate driver 20. For example, the gate inspection unit 50 can provide the gate signal GS generated in the gate driver 20 to the gate line GL.

[0048] In this embodiment, the gate inspection unit 50 can inspect each of the gate lines GL for defects. (See reference...) Figure 6 This will be described in detail.

[0049] In this embodiment, the gate inspection section 50 prevents overcurrent caused by static electricity from flowing into the display panel 10 and / or the gate driver 20. For example, static electricity can be generated during the manufacturing process of the display device 1000 or during use of the display device 1000. (Refer to...) Figure 7 This will be described in detail.

[0050] Figure 3 and Figure 4 It is shown Figure 1 A plan view of the gate inspection section included in a display device. For example, Figure 3 and Figure 4 Can be Figure 1 A magnified view of region A.

[0051] Reference Figure 1 , Figure 3 and Figure 4The display device 1000 may include a display panel 10, a gate driver 20 disposed adjacent to the left edge and / or right edge of the display panel 10, and a gate inspection section 50 disposed between the display panel 10 and the gate driver 20.

[0052] The gate inspection section 50 may include multiple composite pads CP. For example, such as Figure 4 As shown, the composite pad CP may include a first composite pad CP1 and a second composite pad CP2. The composite pad CP may be connected to the gate line GL, respectively.

[0053] The display panel 10 may include gate lines GL. Each of the gate lines GL may receive a gate signal GS from the gate inspection unit 50. For example, the gate line GL may include a first gate line 310 and a second gate line 320. For example, a first composite pad CP1 may be connected to the first gate line 310, and a second composite pad CP2 may be connected to the second gate line 320. A first gate signal may be provided to the first gate line 310, and a second gate signal may be provided to the second gate line 320. For example, the first gate signal may be a storage voltage, and the second gate signal may be a control signal having an on-level pulse or an off-level pulse.

[0054] The gate driver 20 may include a first line 330 and a second line 340. In one embodiment, the first line 330 may provide a first gate signal to a first gate line 310, and the second line 340 may provide a second gate signal to a second gate line 320.

[0055] For example, the first line 330 can contact the first connection pattern 440 disposed on the first line 330 by means of contact holes exposing the upper surface of the first line 330. The first connection pattern 440 can contact the protrusion of the antistatic pad 200 included in the first composite pad CP1 by means of contact holes exposing the protrusion of the antistatic pad 200.

[0056] For example, the second line 340 can contact the second connection pattern 450 disposed on the second line 340 by means of contact holes exposing the upper surface of the second line 340. The second connection pattern 450 can contact the antistatic pad protrusions included in the second composite pad CP2 by means of contact holes exposing the protrusions of the antistatic pads.

[0057] In this embodiment, the first composite pad CP1 and the second composite pad CP2 are arranged alternately along the second direction D2. That is, the first composite pad CP1 and the second composite pad CP2 can be arranged in a Z-shaped pattern along the second direction D2. For example, the first composite pad CP1 can overlap each other in the second direction D2 and can be arranged repeatedly along the second direction D2. The second composite pad CP2 can not overlap with the first composite pad CP1 in the second direction D2, and can overlap each other in the second direction D2. Since the first composite pad CP1 and the second composite pad CP2 are arranged in a Z-shaped pattern, the length of the gate inspection section 50 in the second direction D2 can be reduced. For example, the first composite pad CP1 and the second composite pad CP2 can partially overlap in the first direction D1.

[0058] The first composite pad CP1 may include an antistatic pad 200, a first inspection pad 300, and a second inspection pad 400. The structure of the second composite pad CP2 may be substantially the same as that of the first composite pad CP1. Therefore, a detailed description of the second composite pad CP2 is omitted.

[0059] For example, electrical signals can be transmitted through the paths of the anti-static pad 200, the second inspection pad 400, and the first inspection pad 300. The electrical signals may include a first gate signal, a gate inspection signal, and overcurrent caused by static electricity.

[0060] In an embodiment, the antistatic pad 200 may have a rectangular shape. For example, the antistatic pad 200 may have a first length 201 in a first direction D1 and a second length 202 in a second direction D2. The first length 201 of the antistatic pad 200 may be less than the second length 202, and the second length 202 of the antistatic pad 200 may be approximately equal to the second length 402 of the first composite pad CP1 in the second direction D2.

[0061] In this embodiment, the antistatic pad 200 can contact the second inspection pad 400 through a plurality of first contact holes CNT1. When the antistatic pad 200 contacts the second inspection pad 400 through the first contact holes CNT1, the loss of electrical signals (e.g., the first gate signal) can be avoided.

[0062] In one implementation, the first inspection pad 300 may be separated from and spaced apart from the antistatic pad 200.

[0063] In an implementation, the first inspection pad 300 may have a rectangular shape. For example, the first inspection pad 300 may have a first length 301 in a first direction D1 and a second length 302 in a second direction D2. The first length 301 of the first inspection pad 300 may be less than the second length 302, and the second length 302 of the first inspection pad 300 may be approximately equal to the second length 402 of the first composite pad CP1.

[0064] In this implementation, the area of ​​the antistatic pad 200 may be smaller than the area of ​​the first inspection pad 300. For example, the first length 201 of the antistatic pad 200 may be smaller than the first length 301 of the first inspection pad 300. The second length 202 of the antistatic pad 200 may be approximately equal to the second length 302 of the first inspection pad 300. As the area of ​​the first inspection pad 300 increases, the first inspection, which will be described later, can be performed relatively easily.

[0065] In this implementation, the first inspection pad 300 can contact the second inspection pad 400 through the second contact hole CNT2. The area of ​​the second contact hole CNT2 can be larger than the area of ​​each of the first contact holes CNT1. Therefore, loss of electrical signals (e.g., gate inspection signals) can be avoided.

[0066] In one embodiment, the second inspection pad 400 may be disposed on the antistatic pad 200 and the first inspection pad 300, and may overlap with the antistatic pad 200 and the first inspection pad 300. As described above, the second inspection pad 400 may be electrically connected to the antistatic pad 200 and the first inspection pad 300 through the first contact hole CNT1 and the second contact hole CNT2.

[0067] In an embodiment, the second inspection pad 400 may have a square shape. For example, the second inspection pad 400 may have a first length 401 in a first direction D1 and a second length 402 in a second direction D2. The first length 401 may be approximately equal to the second length 402. The second length 402 of the second inspection pad 400 is approximately equal to the second length 302 of the first inspection pad 300, and the first length 401 of the second inspection pad 400 is greater than the first length 301 of the first inspection pad 300. The area of ​​the second inspection pad 400 is greater than the sum of the areas of the antistatic pad 200 and the first inspection pad 300. In an embodiment, the second inspection pad 400 may have a predetermined size or larger area to perform the second inspection, which will be described later. However, as the area of ​​the second inspection pad 400 increases, the area of ​​the gate inspection portion 50 may increase. Therefore, the first length 401 and the second length 402 of the second inspection pad 400 may each be approximately 100 μm.

[0068] Figure 5 It is shown Figure 1 A cross-sectional view of the gate inspection section and the display panel included in the display device. For example, Figure 5 It is along Figure 4 A sectional view taken by line I-I'.

[0069] Reference Figure 1 , Figure 3 , Figure 4 and Figure 5 The display panel 10 may include a substrate 100, a first gate line 310, a second gate line 320, a first insulating layer ILD1, an active layer ACT, a second insulating layer ILD2, a source electrode SE, a drain electrode DE, a via insulating layer VIA, a pixel electrode 410, a liquid crystal layer 420, a counter electrode 430, a planarization layer OC, a color filter CF, a black matrix BM, and a window WIN.

[0070] Substrate 100 may include a glass substrate, a quartz substrate, a plastic substrate, etc. For example, when substrate 100 includes a glass substrate, display device 1000 may be a rigid display device. As another example, when substrate 100 includes a plastic substrate, display device 1000 may be a flexible display device. In this case, substrate 100 may have a structure in which at least one organic film layer and at least one barrier layer are alternately stacked. For example, the organic film layer may include an organic material, and the barrier layer may include an inorganic material.

[0071] The first gate line 310 and the second gate line 320 may be disposed on the substrate 100. For example, a storage voltage may be provided to the first gate line 310, and a control signal may be provided to the second gate line 320. The first gate line 310 and the second gate line 320 may include metals, alloys, conductive metal oxides, transparent conductive materials, etc. For example, the first gate line 310 and the second gate line 320 may include silver (“Ag”), silver-containing alloys, molybdenum (“Mo”), molybdenum-containing alloys, aluminum (“Al”), aluminum-containing alloys, aluminum nitride (“AlN”), tungsten (“W”), tungsten nitride (“WN”), copper (“Cu”), nickel (“Ni”), chromium (“Cr”), chromium nitride (“CrN”), titanium (“Ti”), tantalum (“Ta”), platinum (“Pt”), scandium (“Sc”), indium tin oxide (“ITO”), indium zinc oxide (“IZO”), etc.

[0072] The first insulating layer ILD1 may cover the first gate line 310 and the second gate line 320, and may be disposed on the substrate 100. The first insulating layer ILD1 may include an insulating material. For example, the first insulating layer ILD1 may include silicon oxide, silicon nitride, titanium oxide, tantalum oxide, etc.

[0073] The active layer ACT may be disposed on the first insulating layer ILD1. For example, the active layer ACT may include amorphous silicon, polycrystalline silicon, or oxide semiconductor. Ions may be selectively implanted into the active layer ACT. For example, ions may not be implanted into regions overlapping with the second gate line 320, and ions may be implanted into regions not overlapping with the second gate line 320.

[0074] In one embodiment, the second insulating layer ILD2 may cover the active layer ACT and may be disposed on the first insulating layer ILD1. For example, the second insulating layer ILD2 may include an insulating material. In another embodiment, the second insulating layer ILD2 may be omitted.

[0075] The source electrode SE and drain electrode DE can be disposed on the second insulating layer ILD2. In one embodiment, the source electrode SE and drain electrode DE can contact the active layer ACT through contact holes formed in the second insulating layer ILD2. In another embodiment, the second insulating layer ILD2 can be omitted, and the source electrode SE and drain electrode DE can directly contact the active layer ACT without contact holes. The source electrode SE and drain electrode DE can include metals, alloys, conductive metal oxides, transparent conductive materials, etc.

[0076] The second gate line 320, the active layer ACT, the source electrode SE, and the drain electrode DE can constitute a transistor. For example, in response to a control signal provided to the second gate line 320, a data voltage DS can be provided to the source electrode SE and transmitted to the active layer ACT and the drain electrode DE.

[0077] The via insulating layer VIA may cover the source electrode SE and the drain electrode DE, and may be disposed on the second insulating layer ILD2. The via insulating layer VIA may have a generally flat top surface. For example, the via insulating layer VIA may include an organic insulating material. The via insulating layer VIA may include photoresist, polyacrylate resin, polyimide resin, acrylic resin, etc.

[0078] Pixel electrode 410 may be disposed on via insulating layer VIA. Pixel electrode 410 may contact drain electrode DE through contact holes formed in via insulating layer VIA. Pixel electrode 410 may include metal, alloy, conductive metal oxide, transparent conductive material, etc.

[0079] A liquid crystal layer 420 may be disposed on a pixel electrode 410. Multiple liquid crystal molecules may be disposed within the liquid crystal layer 420. The arrangement of each liquid crystal molecule may be changed according to the electric field formed by the pixel electrode 410 and the opposing electrode 430. For example, when no electric field is formed, each liquid crystal molecule may be arranged in the vertical direction. On the other hand, when an electric field is formed, each liquid crystal molecule may be arranged in the horizontal direction.

[0080] The counter electrode 430 may be disposed on the liquid crystal layer 420. The counter electrode 430 may receive a common voltage, and thus an electric field may be formed between the pixel electrode 410 and the counter electrode 430. The counter electrode 430 may include a metal, alloy, conductive metal oxide, transparent conductive material, etc.

[0081] A planarization layer OC can be disposed on the opposing electrode 430. The planarization layer OC can have a generally flat top surface. Therefore, the planarization layer OC can remove the step difference generated by the above configuration.

[0082] A color filter CF and a black matrix BM can be arranged on the planarization layer OC. The color filter CF selectively transmits light with a predetermined wavelength. The black matrix BM blocks light. The color filter CF can be arranged in the emitting region of the display area DA, and the black matrix BM can be arranged in the non-emitting region of the display area DA. For example, because the black matrix BM is arranged to overlap with the transistor, the transistor may not be visually perceptible to the user.

[0083] The window WIN can be arranged on the color filter CF and the black matrix BM. The window WIN can prevent foreign objects and / or moisture from penetrating into the display device 1000. In addition, the window WIN can prevent external impacts from being transmitted to the interior of the display device 1000. For example, the window WIN can be formed of rigid glass.

[0084] The gate inspection section 50 may include a substrate 100, a first composite pad CP1, a planarization layer OC, a black matrix BM, and a window WIN. The first composite pad CP1 may include an antistatic pad 200, a first inspection pad 300, and a second inspection pad 400.

[0085] Antistatic pads 200 and first inspection pads 300 may be disposed on substrate 100. In an embodiment, antistatic pads 200 and first inspection pads 300 may comprise the same material as the first gate line 310 and the second gate line 320. For example, antistatic pads 200 and first inspection pads 300 may be formed together with the first gate line 310 and the second gate line 320.

[0086] The second inspection pad 400 may be disposed on the via insulating layer VIA. In an embodiment, the second inspection pad 400 may comprise the same material as the pixel electrode 410. For example, the second inspection pad 400 may be formed together with the pixel electrode 410.

[0087] In one implementation, the second inspection pad 400 may include indium tin oxide (“ITO”). Therefore, the resistance of the second inspection pad 400 may be relatively small.

[0088] In one embodiment, the second inspection pad 400 can contact the antistatic pad 200 through the first contact hole CNT1. The first contact hole CNT1 can be formed in the first insulating layer ILD1, the second insulating layer ILD2, and the through-hole insulating layer VIA, and can expose the upper surface of the antistatic pad 200.

[0089] In one embodiment, the second inspection pad 400 can contact the first inspection pad 300 through the second contact hole CNT2. The second contact hole CNT2 can be formed in the first insulating layer ILD1, the second insulating layer ILD2, and the through-hole insulating layer VIA, and can expose the upper surface of the first inspection pad 300.

[0090] Meanwhile, the cross-sectional structure of the display panel 10 and the gate inspection section 50 may not be limited to... Figure 5 The cross-sectional structure is shown in the diagram. For example, the display panel 10 may also include a thin film encapsulation disposed on the opposing electrode 430 and a sensing structure disposed on the thin film encapsulation. The thin film encapsulation prevents the penetration of oxygen and moisture. The sensing structure can detect the operator's touch or proximity. Additionally, the second inspection pad 400 may be formed in a different layer than the layer on which the pixel electrode 410 is formed. For example, the second inspection pad 400 may be formed together with the source electrode SE and the drain electrode DE.

[0091] Figure 6 It shows the inspection Figure 1 A plan view of a method for including gate lines in a display device. Figure 7 It shows protection Figure 1 A plan view of a method for protecting a display panel included in a display device from overcurrent caused by static electricity.

[0092] Reference Figure 1 and Figure 6 The gate inspection unit 50 can inspect the gate lines GL. For example, the inspection may include a first inspection to check whether each of the gate lines GL is short-circuited and a second inspection to check the location where the short circuit occurs. A gate inspection signal TS for performing the inspection can be provided to each of the gate lines GL. The gate inspection signal TS may include a first gate inspection signal for performing the first inspection and a second gate inspection signal for performing the second inspection.

[0093] When performing the first check, such as Figure 1 As shown, the gate inspection unit 50 adjacent to the left edge of the display panel 10 can provide a first gate inspection signal to the gate line GL, and the gate inspection unit 50 adjacent to the right edge of the display panel 10 can receive the first gate inspection signal. Depending on whether the first gate inspection signal is received, the gate inspection unit 50 can check whether each of the gate lines GL is short-circuited.

[0094] When performing the second check, such as Figure 6 As shown, the gate inspection section 50, which is adjacent to the left edge of the display panel 10, can provide a second gate inspection signal to the gate line that has been determined to be defective through the first inspection.

[0095] To perform the inspection accurately, an inspection feed sensor TS_P and an inspection receive sensor TS_S can be used. In this case, the inspection feed sensor TS_P, which provides the gate inspection signal TS to the composite pad CP, can contact the composite pad CP. When the inspection feed sensor TS_P contacts the composite pad CP, the gate inspection signal TS can be provided stably. Specifically, when performing the second inspection, since the gate inspection unit 50 needs to check the location of the short circuit, the gate inspection signal TS should be provided stably. Because the composite pad CP has a sufficient area to contact the inspection feed sensor TS_P, the inspection can be performed accurately.

[0096] Reference Figure 1 and Figure 7 The gate inspection section 50 protects the display panel 10 and / or the gate driver 20 from overcurrent caused by static electricity. For example, static electricity may be generated during the manufacturing process of the display device 1000 or during the use of the display device 1000. Overcurrent may be generated due to static electricity.

[0097] Simultaneously, current can be supplied to the display panel 10 through the path of the antistatic pad 200, the second inspection pad 400, and the first inspection pad 300. When an overcurrent is transmitted through this path, the second inspection pad 400 is damaged, preventing the overcurrent from being supplied to the display panel 10. Therefore, the gate inspection section 50 can protect the display panel 10 from overcurrent. In this case, the second inspection pad 400 may include a metal material with relatively low resistance. For example, the second inspection pad 400 may include indium tin oxide (“ITO”). In a similar manner, the gate inspection section 50 can protect the gate driver 20.

[0098] The display device 1000 according to an embodiment may include a gate inspection section 50 comprising composite pads CP. Each of the composite pads CP may include an antistatic pad 200, a first inspection pad 300, and a second inspection pad 400. Therefore, the gate inspection section 50 can inspect whether the gate line GL is short-circuited and / or at a short-circuit location, and can protect the display panel 10 and / or the gate driver 20 from overcurrent caused by static electricity. In addition, since the second inspection pad 400 overlaps with the antistatic pad 200 and the first inspection pad 300, the non-display area NDA where the gate inspection section 50 is arranged can be reduced.

[0099] While certain implementations and methods have been described herein, other implementations and modifications will become apparent from this description. Accordingly, it will be apparent to those skilled in the art that this disclosure is not limited to these implementations, but rather to the broader scope of the appended claims and various apparent modifications and equivalent arrangements.

Claims

1. A gate inspection section, comprising a plurality of composite pads electrically connected to a plurality of gate lines, wherein, The plurality of gate lines extend in a first direction and are arranged along a second direction that intersects the first direction. Each of the plurality of composite pads includes: Antistatic pads; A first inspection pad, spaced apart from the antistatic pad, provides a gate inspection signal to each of the plurality of gate lines; and A second inspection pad overlaps with the antistatic pad and the first inspection pad, and the second inspection pad is electrically connected to the antistatic pad and the first inspection pad. The area of ​​the antistatic pad is smaller than the area of ​​the first inspection pad. The second inspection pad contacts the antistatic pad through multiple first contact holes and contacts the first inspection pad through second contact holes. The area of ​​each of the plurality of first contact holes is smaller than the area of ​​the second contact hole.

2. The gate inspection unit according to claim 1, wherein, The plurality of composite pads are respectively connected to the plurality of gate lines.

3. The gate inspection unit according to claim 1, wherein, The second inspection pad is arranged on the antistatic pad and the first inspection pad.

4. The gate inspection unit according to claim 1, wherein, The antistatic pads are made of the same material as the first inspection pads.

5. The gate inspection unit according to claim 1, wherein, The length of the antistatic pad in the second direction is equal to the length of the first inspection pad in the second direction.

6. The gate inspection unit according to claim 1, wherein, The length of the antistatic pad in the first direction is less than the length of the first inspection pad in the first direction.

7. A display device, comprising: The display panel includes a plurality of gate lines; A gate driver, which is adjacent to the display panel and provides gate signals to the plurality of gate lines; as well as A gate inspection section includes a plurality of composite pads, wherein the plurality of composite pads are electrically connected to the plurality of gate lines. Each of the plurality of composite pads includes: Antistatic pads; A first inspection pad, spaced apart from the antistatic pad, provides a gate inspection signal to each of the plurality of gate lines; and A second inspection pad overlaps with the antistatic pad and the first inspection pad, and the second inspection pad is electrically connected to the antistatic pad and the first inspection pad. The area of ​​the antistatic pad is smaller than the area of ​​the first inspection pad. The second inspection pad contacts the antistatic pad through multiple first contact holes and contacts the first inspection pad through second contact holes. The area of ​​each of the plurality of first contact holes is smaller than the area of ​​the second contact hole.

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