Test equipment and control method for TE board of DC ice melting device

Abstract

The present invention relates to a test device for a TE board of a DC ice melting device and a control method thereof. The test device for the TE board of a DC ice melting device comprises: a simulated load, which is equivalent to the load of the power transmission line connected to the DC ice melting device; the topological structure of the simulated valve group is consistent with the valve group topological structure of the DC ice melting device, and the simulated valve group is respectively connected to the simulated load and the TE board to be tested; a control device is connected to the TE board to be tested, and is used to obtain and determine a trigger signal according to the set active power and the actual active power of the DC side of the simulated valve group, and output the trigger signal to the TE board to be tested. The test device provides a test environment for the TE board to be tested, and there is no need to install the TE board to be tested in the actual valve group for testing, thereby reducing the safety risk of the test.

Description

Technical Field

[0001] The present invention relates to the technical field of power system automation and intelligent equipment detection, and in particular to a testing device for a TE board of a direct current ice melting device and a control method thereof. Background Art

[0002] DC ice melting is achieved by applying DC voltage to the transmission line and short-circuiting at the end of the transmission line to heat the conductors to melt the ice in the transmission line, thereby preventing the line from collapsing due to ice.

[0003] TE board is one of the key equipment of DC ice melting equipment. Each DC ice melting equipment needs to be equipped with a large number of TE boards. Before replacing the TE board, the TE board needs to be tested. In addition, according to relevant operation and maintenance requirements, important spare parts such as TE board should also be tested regularly. However, the current conventional testing method is to install the TE board in the actual valve group and test the quality of the TE board through a low-pressure trigger test, which poses a safety risk. Summary of the invention

[0004] Based on this, it is necessary to provide a test device for a TE board of a DC ice melting device with low safety risk and a control method thereof.

[0005] In a first aspect, a test device for a TE board of a DC ice melting device is provided, comprising: a simulated load, which is equivalent to the load of a transmission line to which the DC ice melting device is connected; a simulated valve group, the topology of which is consistent with the valve group topology of the DC ice melting device, and the simulated valve group is respectively connected to the simulated load and the TE board to be tested; a control device, which is connected to the TE board to be tested, and is used to obtain and determine a trigger signal according to the set active power and the actual active power of the DC side of the simulated valve group, and output the trigger signal to the TE board to be tested.

[0006] In one embodiment, a switching module is further included, wherein the switching module includes a first interface and at least one second interface, the first interface of the switching module is connected to the simulation valve group, and the second interface is used to connect to the TE board to be tested.

[0007] In one of the embodiments, a fixing module is further included, which is mechanically connected to the switching module.

[0008] In one of the embodiments, an adjustable transformer is further included, which is connected to the switching module and is used to provide a working voltage to the TE board to be tested.

[0009] In one of the embodiments, it further includes: a current acquisition module for acquiring a current signal on the DC side of the analog valve group; and a voltage acquisition module for acquiring a voltage signal on the DC side of the analog valve group.

[0010] In one embodiment, the control device includes: an AD conversion module, connected to the current acquisition module and the voltage acquisition module, for converting the current signal and the voltage signal into a current digital signal and a voltage digital signal respectively; a conditioning module, connected to the AD conversion module, for converting the current digital signal and the voltage digital signal into a code value current and a code value voltage respectively;

[0011] In one of the embodiments, a power supply device is further included, which is connected to the simulation valve group and is used to provide AC power to the simulation valve group.

[0012] In one of the embodiments, a circuit breaker is further included, which is connected to the power supply device and the simulation valve group and is used to control the on-off of the circuit formed by the power supply device and the simulation valve group.

[0013] In a second aspect, a control method for a test device for a TE board of a DC ice melting device is provided, comprising: obtaining a set active power and an actual active power on a DC side of a simulated valve group; wherein a topological structure of the simulated valve group is consistent with a valve group topological structure of the DC ice melting device, the simulated valve group is respectively connected to a simulated load and a TE board to be tested, and the simulated load is equivalent to a load of a transmission line to which the DC ice melting device is connected; determining a trigger signal according to the set active power and the actual active power on the DC side of the simulated valve group; and outputting the trigger signal to the TE board to be tested.

[0014] In one embodiment, the step of determining a trigger signal based on the set active power and the actual active power on the DC side of the analog valve group includes: determining the difference between the set active power and the actual active power; determining a trigger angle of the analog valve group through a PI control loop based on the difference; determining a trigger moment based on the trigger angle; and determining a trigger signal based on the trigger moment and a trigger coding logic.

[0015] The above-mentioned test equipment for the TE board of the DC ice melting device includes a simulated load, a simulated valve group and a control device. The test equipment provides a test environment for the TE board to be tested. There is no need to install the TE board to be tested in the actual valve group for testing, thereby reducing the safety risk of the test. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the conventional technology, the drawings required for use in the embodiments or the conventional technology descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without creative work.

[0017] Figure 1 It is a structural schematic diagram of the testing equipment for the TE board of the DC ice melting device in the first embodiment;

[0018] Figure 2 It is a structural schematic diagram of the testing equipment for the TE board of the DC ice melting device in the second embodiment;

[0019] Figure 3 is a schematic diagram of the structure of a control device in one embodiment;

[0020] Figure 4 It is a structural schematic diagram of the testing equipment for the TE board of the DC ice melting device in the third embodiment;

[0021] Figure 5 It is a flow chart of a control method for a test device of a TE board of a DC ice melting device in one embodiment;

[0022] Figure 6 is a flow chart of a method for determining a trigger signal in an embodiment;

[0023] Figure 7 FIG. 1 is a structural block diagram of a control device for testing equipment of a TE board of a DC ice melting device in an embodiment. DETAILED DESCRIPTION

[0024] In order to facilitate understanding of the present application, the present application will be described more fully below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive.

[0025] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which this application belongs. The terms used herein in the specification of this application are only for the purpose of describing specific embodiments and are not intended to limit this application.

[0026] It is understood that the terms "first", "second", etc. used in this application may be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish a first element from another element. For example, without departing from the scope of this application, a first resistor may be referred to as a second resistor, and similarly, a second resistor may be referred to as a first resistor. Both the first resistor and the second resistor are resistors, but they are not the same resistor.

[0027] It can be understood that the “connection” in the following embodiments should be understood as “electrical connection”, “communication connection”, etc. if the connected circuits, modules, units, etc. have electrical signals or data transmission between each other.

[0028] When used herein, the singular forms "a", "an", and "said / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" etc. specify the presence of stated features, wholes, steps, operations, components, parts or combinations thereof, but do not exclude the possibility of the presence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof.

[0029] DC ice melting technology directly disconnects the frozen transmission line from the main grid, short-circuits the end of the transmission line, and forms a loop by inputting a DC circuit at the head end of the transmission line. When a larger current passes through, the conductor will generate greater heat, causing the ice on the conductor to melt and fall off. When the ice is completely melted, the DC power supply is removed and the transmission line returns to normal state and normal operation can be resumed.

[0030] The DC ice melting device mainly includes a converter transformer, a thyristor converter valve, and a thyristor electronic board (TE board). The converter transformer is used to convert the operating voltage on the high-voltage side into the AC voltage required by the thyristor converter valve. The thyristor converter valve generally adopts a 6-pulse rectifier bridge or a 12-pulse rectifier bridge. Each rectifier bridge includes multiple thyristor components, which are used to change the trigger angle of multiple valve groups to control the DC current input to the transmission line. The TE board corresponds to the thyristor one by one, and is used to trigger the thyristor and receive the status signal of the thyristor.

[0031] Please refer to Figure 1 , which shows that the testing equipment for the TE board of the DC ice melting device provided in the first embodiment of the present application includes a simulated load 102 , a simulated valve group 104 and a control device 106 .

[0032] The simulated load 102 is a load equivalent resistance of a power transmission line connected to the DC ice melting device. Optionally, the simulated load 102 may be a secondary equivalent resistance for simulating a power transmission line load. It is understandable that the rated power of the simulated load 102 may be set according to the maximum power corresponding to the rated trigger angle of the simulated valve group 104.

[0033] The topological structure of the simulated valve group 104 is consistent with the valve group topological structure of the DC ice melting device to simulate the valve group of the DC ice melting device. It should be noted that the simulated valve group 104 is respectively connected to the simulated load 102 and the TE board 108 to be tested. The simulated valve group 104 is used to convert the AC voltage into a DC voltage under the control of the TE board to be tested, and output it to the simulated load 102. The AC voltage input end of the simulated valve group 104 is the AC side of the simulated valve group 104, and the DC voltage output end of the simulated valve group 104 is the DC side of the simulated valve group 104. In one embodiment, the valve group of the DC ice melting device includes an actual thyristor and an actual RC circuit, and the actual RC circuit is connected in parallel to the anode and cathode of the actual thyristor. In one embodiment, the simulated valve group 104 includes a simulated thyristor and a simulated RC circuit, and the simulated RC circuit is connected in parallel to the anode and cathode of the simulated thyristor. The control characteristics of the simulated valve group 104 and the valve group of the DC ice melting device are consistent. In one embodiment, the trigger voltage of the simulated thyristor is lower than the trigger voltage of the actual thyristor, so that trigger detection can be performed even under low voltage conditions, thereby improving safety.

[0034] The control device 106 is connected to the TE board 108 to be tested, and is used to obtain the set active power and the actual active power on the DC side of the simulated valve group 104, and is also used to determine the trigger signal according to the set active power and the actual active power, and output the trigger signal to the TE board 108 to be tested. When the TE board 108 to be tested is normal, the TE board 108 to be tested triggers the simulated valve group 104 to work according to the trigger signal, so that the actual active power on the DC side of the simulated valve group 104 is consistent with the set active power. When the TE board 108 to be tested is abnormal, it is impossible to make the actual active power on the DC side of the simulated valve group 104 consistent with the set active power. Therefore, the quality of the TE board (normal or abnormal) can be determined according to the triggering condition of the TE board on the simulated valve group 104.

[0035] In one embodiment, the control device can also be used to receive a check signal of the TE board to be tested, and determine whether the check is correct according to the check signal. The control device provided in this embodiment can detect the triggering and check function of the TE board to be tested, so as to determine whether the TE board is good or bad according to the check signal of the TE board.

[0036] The test equipment for the TE board of the DC ice melting device provided in the above embodiment includes a simulated load, a simulated valve group and a control device, the control device is connected to the TE board to be tested, the TE board to be tested is connected to the simulated valve group, and the quality of the TE board to be tested is determined according to the triggering condition of the simulated valve group under the control of the trigger signal of the TE board to be tested. It can be seen that the above test equipment provides a test environment for the TE board to be tested, and there is no need to use the actually running DC ice melting device as a test device, which reduces the complexity of operation and safety issues.

[0037] Please refer to Figure 2 , which shows a test device for a TE board of a DC ice melting device according to a second embodiment of the present application. The test device provided in the above embodiment may also include an adapter module 202. The adapter module 202 includes a first interface and at least one second interface. The first interface of the adapter module 202 is connected to the simulation valve group 104, and the second interface of the adapter module 202 is used to connect to the TE board 108 to be tested. Each second interface is electrically conductive with the first interface. Optionally, the plurality of second interfaces include at least two interface sizes, so that the test device can adapt to TE boards of different sizes and interface definitions, thereby improving the adaptability of the test device. Optionally, the first interface of the adapter module 202 is connected to the gate of the thyristor of the simulation valve group, and is used to output the valve group trigger signal generated by the TE board 108 to be tested according to the trigger signal to the simulation valve group 104, so as to control the operation of the simulation valve group 104.

[0038] In one embodiment, the test equipment provided in the above embodiment may further include a fixing module. The fixing module is used to better fix the TE board to be tested on the second interface. In one embodiment, the fixing module is mechanically connected to the adapter module. Optionally, the fixing module is used to carry the TE board to be tested so that the TE board to be tested is fixed on the second interface. Optionally, the fixing module is used to fix the hanging TE board, and the TE board to be tested is fixed on the second interface.

[0039] Please continue to refer to Figure 2 The test equipment provided in the above embodiment may further include an adjustable transformer 204. The adjustable transformer 204 is connected to the adapter module 202 and is used to provide a working voltage to the TE board 108 to be tested. The working voltages of different types of TE boards 108 to be tested are inconsistent. By setting the adjustable transformer 204, this embodiment can provide a target working voltage according to different types of TE boards 108 to be tested, meet the working requirements of the TE board 108 to be tested, and improve the adaptability of the test equipment.

[0040] In an optional embodiment of the present application, the testing device provided in the above embodiment may further include a current acquisition module and a voltage acquisition module.

[0041] The current acquisition module is used to acquire the current signal of the DC side of the analog valve group, and the voltage acquisition module is used to acquire the voltage signal of the DC side of the analog valve group. It can be understood that the current acquisition module can include any existing device that can realize the current acquisition function, and the voltage acquisition module can include any existing device that can realize the voltage acquisition function.

[0042] Please refer to Figure 3 , which shows a control device provided by an embodiment of the present application, such as Figure 3 As shown, the control device may include an AD conversion module 302 and a conditioning module 304 .

[0043] The AD conversion module 302 is connected to the current acquisition module and the voltage acquisition module, and is used to convert the current signal and the voltage signal into a current digital signal and a voltage digital signal, respectively. It can be understood that the current signal and the voltage signal are analog signals, the current digital signal is a digital signal corresponding to the current signal, and the voltage digital signal is a digital signal corresponding to the voltage signal.

[0044] The conditioning module 304 is connected to the AD conversion module, and is used to convert the current digital signal and the voltage digital signal into code value current and code value voltage respectively. It can be understood that the code value is an ASCII code, the code value current is the ASCII code corresponding to the current digital signal, and the code value voltage is the ASCII code corresponding to the voltage digital signal.

[0045] Please continue to refer to Figure 3 The control device may also include a first processor 306, a second processor 308 and a third processor 310.

[0046] Among them, the first processor 306 is connected to the AD conversion module 304, and is used to receive and send a current digital signal, a voltage digital signal, and set active power. In one embodiment, the first processor 306 can be used to adjust the current digital signal according to the crystal oscillator signal, and send the adjusted current digital signal to the second processor 308, and the first processor 306 can also be used to adjust the voltage digital signal according to the crystal oscillator signal, and send the adjusted voltage digital signal to the second processor 308. The adjusted current digital signal corresponds to the voltage signal, and prepares for the next step of calculating the actual active power. It should be noted that the crystal oscillator signals of the control device are the same, which facilitates the synchronization of various parts. In one embodiment, the test equipment may also include a man-machine device, which is connected to the first processor 306 and is used to send a control command to the first processor 306, and the control command includes setting active power. In one embodiment, the first processor 306 includes a first serial communication interface and a second serial communication interface, and the first processor 306 receives the set active power through the first serial communication interface, and is connected to the second processor 308 through the second serial communication interface, and sends the set active power, the current digital signal, and the voltage digital signal to the second processor 308. Optionally, the first processor 306 may be an FPGA.

[0047] The second processor 308 is connected to the first processor 306, and is used to receive the set active power, current digital signal and voltage digital signal sent by the first processor 306, and determine the actual active power according to the current digital signal and the voltage digital signal. The second processor 308 is also used to calculate the difference between the actual active power and the actual active power. The second processor 308 is also used to determine the trigger angle of the analog valve group according to the difference. In one embodiment, the trigger angle of the analog valve group is calculated using the PI algorithm according to the difference. The second processor 308 is also used to determine the triggering moment according to the triggering angle. In one embodiment, the second processor 308 is also used to limit the triggering angle and determine the triggering moment according to the triggering angle after limiting. Avoid the triggering angle exceeding the processing range of the second processor. In one embodiment, according to the triggering angle, a synchronization algorithm is used to determine the triggering moment. Among them, the synchronization signal is a reference signal for triggering the thyristor, which is calculated by applying the AC voltage to the thyristor. In one embodiment, the first processor obtains the AC voltage signal applied to the thyristor and determines the synchronization signal corresponding to the AC voltage signal. Optionally, the synchronization signal used for triggering is calculated by a phase-locked loop algorithm according to the AC voltage signal applied to the thyristor. In one embodiment, the second processor 308 may include an HPI interface, and receives the set active power, current digital signal and voltage digital signal sent by the first processor 306 through the HPI interface. Optionally, the second processor 308 may be a floating-point DSP.

[0048] The third processor 310 is connected to the second processor 308 for receiving the trigger moment and determining the trigger signal according to the trigger moment and the trigger coding logic. It should be noted that the trigger coding logic should match the TE board to be tested to correctly trigger the TE board to be tested to work. In one embodiment, the third processor 310 is connected to the first processor 306 for sending the trigger signal to the first processor 308, and the first processor 308 sends the trigger signal to the TE board to be tested. In one embodiment, the first processor 308 sends the trigger signal to the TE board to be tested via an optical coupler IO. Optionally, the first processor 306 is connected to the TE board to be tested via an optical fiber. Optionally, the third processor 308 can be a fixed-point DSP.

[0049] In one embodiment, the first processor can also be used to receive a check signal of the TE board to be tested, and send the check signal to the third processor for decoding, and receive the decoded check signal after being decoded by the third processor, and determine whether the check of the TE board to be tested is correct according to the decoded check signal. In one embodiment, the third processor can also be used to receive the check signal sent by the first processor and decode the check signal. In one embodiment, the first processor is also used to send the check result to the human-machine device to report to the staff whether the TE board to be tested is normal.

[0050] In one embodiment, the second processor is used to convert the trigger angle by the ice-melting DC current and send the trigger angle to the third processor. The third processor compares the trigger angle with the theoretical trigger angle. When the deviation between the trigger angle and the theoretical trigger angle is less than the deviation threshold, it is considered that the trigger angle is calculated correctly. Otherwise, it is considered that the trigger angle is calculated incorrectly and recalculated to avoid the trigger signal output to the TE board to be tested due to the error in the calculation of the trigger angle, thereby obtaining an erroneous detection result. Optionally, the deviation threshold is 1%. The trigger angle can be obtained according to the following formula:

[0051]

[0052] The theoretical trigger angle can be obtained according to the following formula:

[0053]

[0054] Among them, U v0 is the AC voltage on the AC side of the simulated valve group, I d is the DC current on the DC side of the simulated valve group, U d is the DC voltage on the DC side of the simulated valve group, α is the trigger angle, Xc is the short-circuit impedance of the rectifier transformer low-voltage side system, and R is the resistance value of the simulated load.

[0055] Please refer to Figure 4 , which shows a test device for a TE board of a DC ice melting device provided in the third embodiment of the present application, such as Figure 4 As shown, the test equipment provided in the above embodiment may further include a power supply device 402. The power supply device 402 is connected to the simulation valve group 104 and is used to provide AC power to the simulation valve group 104. The power supply device 402 applies a forward voltage to the anode of the thyristor. When the TE board 108 to be tested connected to the simulation valve group 104 can correctly receive the trigger signal, under normal working conditions, the simulation valve group 104 works and the simulation load 102 passes current. In one embodiment, the power input device 402 is connected to the control device 106 and is used to provide AC power to the control device 106 so that the control device 106 calculates the synchronization signal. In one embodiment, the control device 106 outputs a trigger signal according to the control command of the human-machine device, in combination with the synchronization signal, the trigger moment and the trigger coding logic, and determines the return detection state according to the return detection signal of the TE board 108 to be tested. In one embodiment, the power supply device 402 is connected to the adjustable transformer 202, and the adjustable transformer 202 performs a step-up or step-down process on the AC voltage provided by the power supply device 402 to provide the TE board 108 to be tested with the working voltage required by the TE board 108 to be tested. In one embodiment, the power supply device 402 is used to input an AC 220V power supply.

[0056] Please continue to refer to Figure 4 , the test equipment provided by the above embodiment may also include a circuit breaker 404. The circuit breaker 404 is connected to the power supply device 402 and the simulation valve group 104, and is used to control the on-off of the circuit formed by the power supply device 402 and the simulation valve group 104. In one embodiment, the circuit breaker 404 is connected to the power supply device 402 and the control device 106, and is used to control the on-off of the circuit formed by the power supply device 402 and the control device 106. In one embodiment, the circuit breaker 404 is connected to the power supply device 402 and the adjustable transformer 202, and is used to control the on-off of the circuit formed by the power supply device 402 and the adjustable transformer 202. The above test equipment is provided with a circuit breaker 404, which is used to cut off the circuit in the event of a failure of the test device to prevent the accident from expanding. Optionally, the circuit breaker 404 may include an air switch.

[0057] Please continue to refer to Figure 4 , the test equipment provided in the above embodiment may further include a voltage transformer 406. In one embodiment, the voltage transformer 406 is connected in series in the loop formed by the power supply device 402 and the control device 106, and is used to adjust the magnitude of the voltage provided by the power supply device 106 so that the voltage signal input to the control device 106 meets the voltage processing range of the control device 106. In one embodiment, the voltage transformer 406 is connected in series in the loop formed by the power supply device 402 and the adjustable transformer 202, and is used to adjust the magnitude of the voltage provided by the power supply device 402.

[0058] Please continue to refer to Figure 4 , the test equipment provided in the above embodiment may further include at least one current transformer 408. In one embodiment, the current transformer 408 is respectively connected to the power supply device 402 and the simulated valve group 104, and is used to adjust the input current applied to the simulated valve group 104. The current transformer 408 is used to adjust the input current applied to the anode of the thyristor of the simulated valve group 104. In one embodiment, the current transformer 408 may also be respectively connected to the simulated load 102 and the simulated valve group 104, and is used to adjust the current input to the simulated load 102.

[0059] Please refer to Figure 5 , which shows a control method for a test device for a TE board of a DC ice melting device provided in an embodiment of the present application, such as Figure 5 As shown, the control method may include steps S502 to S506.

[0060] S502, obtaining the set active power and the actual active power of the DC side of the simulated valve group.

[0061] The topological structure of the simulated valve group is consistent with the valve group topological structure of the DC ice melting device, the simulated valve group is respectively connected to the simulated load and the TE board to be tested, and the simulated load is equivalent to the load of the transmission line connected to the DC ice melting device. It should be noted that the description of the simulated valve group and the simulated load is detailed in the above embodiment and will not be repeated here.

[0062] In one embodiment, the step of obtaining the actual active power of the DC side of the analog valve group may include: receiving the current signal of the DC side of the analog valve group and the voltage signal of the DC side of the analog valve group, and determining the actual active power of the DC side of the analog valve group according to the current signal and the voltage signal. In one embodiment, after receiving the current signal of the current side of the analog valve group and the voltage signal of the DC side of the analog valve group, it also includes: performing signal conditioning processing on the current signal and the voltage signal to obtain a standard current signal and a standard voltage signal; performing analog-to-digital conversion processing on the standard current signal and the standard voltage signal to obtain a current digital signal and a voltage digital signal; and determining the actual active power according to the current digital signal and the voltage digital signal. In one embodiment, after obtaining the current digital signal and the voltage digital signal, it may also include: adjusting the current digital signal and the voltage digital signal according to the crystal oscillator information; and calculating the actual active power using the adjusted current digital signal and the adjusted voltage digital signal.

[0063] S504: Determine a trigger signal according to the set active power and the actual active power of the DC side of the analog valve group.

[0064] S506, output a trigger signal to the TE board to be tested.

[0065] In one embodiment, the control method for testing equipment for TE boards of DC ice melting devices provided in the above embodiment may further include: receiving a check signal of the TE board to be tested, and determining whether the check is correct according to the check signal.

[0066] Please refer to Figure 6 , which shows a method for determining a trigger signal provided in an embodiment of the present application, and also shows an exemplary technical process of "determining a trigger signal according to a set active power and the actual active power of the DC side of the simulated valve group", such as Figure 6 As shown, the method for determining the trigger signal may include steps S602 to S608.

[0067] S602: Determine the difference between the set active power and the actual active power.

[0068] S604, determining the trigger angle of the analog valve group through a PI control loop according to the difference.

[0069] The trigger angle of the analog valve group is calculated according to the difference using the PI algorithm. In one embodiment, the step of determining the trigger angle of the analog valve group according to the difference through the PI control loop may further include the step of limiting the trigger angle.

[0070] S606: Determine a triggering time according to the triggering angle.

[0071] In one embodiment, a synchronization algorithm is used to determine the triggering time of the analog valve group.

[0072] S608, determining a trigger signal according to the trigger time and the trigger coding logic.

[0073] It should be understood that although Figure 5-Figure 6 The steps in the flowchart are shown in sequence as indicated by the arrows, but these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise specified in this document, there is no strict order restriction for the execution of these steps, and these steps can be executed in other orders. Moreover, Figure 5-Figure 6 At least part of the steps may include multiple steps or multiple stages. These steps or stages are not necessarily performed at the same time, but can be performed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed in turn or alternately with other steps or at least part of the steps or stages in other steps.

[0074] In one embodiment, Figure 7 As shown, a control device 700 for testing equipment of a TE board of a DC ice melting device is provided, comprising: an acquisition module 702, a determination module 704 and an output module 706. Among them, the acquisition module 702 can be used to obtain the set active power and the actual active power of the DC side of the simulation valve group. The determination module 704 can be used to determine a trigger signal according to the set active power and the actual active power of the DC side of the simulation valve group. The output module 706 can be used to output a trigger signal to the TE board to be tested. It should be noted that the topological structure of the simulation valve group is consistent with the valve group topological structure of the DC ice melting device, and the simulation valve group is respectively connected to the simulated load and the TE board to be tested, and the simulated load is equivalent to the load of the transmission line to which the DC ice melting device is connected.

[0075] In one embodiment, the determination module can also be used to determine the difference between the set active power and the actual active power. The determination module can also be used to determine the trigger angle of the analog valve group according to the difference. The determination module can also be used to determine the trigger time according to the trigger angle. The determination module can also be used to determine the trigger signal according to the trigger time and the trigger coding logic.

[0076] For the specific definition of the control device of the test equipment for the TE board of the DC ice melting device, please refer to the definition of the control method of the test equipment for the TE board of the DC ice melting device mentioned above, which will not be repeated here. Each module in the above-mentioned control device of the test equipment for the TE board of the DC ice melting device can be implemented in whole or in part by software, hardware and a combination thereof. The above-mentioned modules can be embedded in or independent of the processor in the computer device in the form of hardware, or can be stored in the memory of the computer device in the form of software, so that the processor can call and execute the operations corresponding to the above modules. It should be noted that the division of modules in the embodiment of the present application is schematic and is only a logical function division. There may be other division methods in actual implementation.

[0077] In one embodiment, a test device for a TE board of a DC ice melting device is provided, which also includes a memory, in which a computer program is stored. When a control device executes the computer program, the steps in the above-mentioned control method embodiments for the test device for the TE board of a DC ice melting device are implemented.

[0078] In one embodiment, a computer-readable storage medium is provided, on which a computer program is stored. When the computer program is executed by a processor, the steps in the above-mentioned control method embodiments for the test device of the TE board of the DC ice melting device are implemented.

[0079] Those of ordinary skill in the art can understand that all or part of the processes in the above-mentioned embodiment methods can be completed by instructing the relevant hardware through a computer program, and the computer program can be stored in a non-volatile computer-readable storage medium. When the computer program is executed, it can include the processes of the embodiments of the above-mentioned methods. Among them, any reference to memory, storage, database or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory or optical memory, etc. Volatile memory can include random access memory (RAM) or external cache memory. As an illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM).

[0080] In the description of this specification, the description with reference to the terms "some embodiments", "other embodiments", "ideal embodiments", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic descriptions of the above terms do not necessarily refer to the same embodiment or example.

[0081] The technical features of the above-described embodiments may be arbitrarily combined. To make the description concise, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0082] The above-mentioned embodiments only express several implementation methods of the present invention, and the descriptions thereof are relatively specific and detailed, but they cannot be understood as limiting the scope of the invention patent. It should be pointed out that, for ordinary technicians in this field, several variations and improvements can be made without departing from the concept of the present invention, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention shall be subject to the attached claims.

Claims

1. A test device for a TE board of a DC ice melting device, characterized in that: include: A simulated load, which is equivalent to the load of the power transmission line to which the DC ice melting device is connected; The simulated load is a secondary equivalent resistance used to simulate the load of the transmission line; A simulation valve group, the topological structure of which is consistent with the valve group topological structure of the DC ice melting device, and the simulation valve group is respectively connected to the simulation load and the TE board to be tested; A control device is connected to the TE board to be tested, and is used to obtain and determine a trigger signal according to the set active power and the actual active power on the DC side of the analog valve group, and output the trigger signal to the TE board to be tested; the trigger signal is used to trigger the operation of the analog valve group when the TE board to be tested is normal, so that the actual active power on the DC side of the analog valve group is consistent with the set active power.

2. The testing device for the TE board of a DC ice melting device according to claim 1, characterized in that: It also includes a switching module, which includes a first interface and at least one second interface. The first interface of the switching module is connected to the simulation valve group, and the second interface is used to connect to the TE board to be tested.

3. The testing equipment for TE board of DC ice melting device according to claim 2, characterized in that: It also includes a fixing module, which is mechanically connected to the switching module.

4. The testing device for the TE board of a DC ice melting device according to claim 2, characterized in that: It also includes an adjustable transformer connected to the switching module and used for providing a working voltage to the TE board to be tested.

5. The testing equipment for TE board of DC ice melting device according to claim 1, characterized in that: Also includes: A current acquisition module, used for acquiring the current signal of the DC side of the analog valve group; The voltage acquisition module is used to acquire the voltage signal of the DC side of the analog valve group.

6. The testing device for the TE board of a DC ice melting device according to claim 5, characterized in that: The control device comprises: An AD conversion module, connected to the current acquisition module and the voltage acquisition module, and used to convert the current signal and the voltage signal into a current digital signal and a voltage digital signal respectively; The conditioning module is connected to the AD conversion module and is used to convert the current digital signal and the voltage digital signal into a code value current and a code value voltage respectively.

7. The testing equipment for TE board of DC ice melting device according to claim 1, characterized in that: It also includes a power supply device connected to the simulation valve group and used for providing AC power to the simulation valve group.

8. The testing device for the TE board of a DC ice melting device according to claim 7, characterized in that: It also includes a circuit breaker connected to the power supply device and the simulation valve group, and is used to control the on-off of the circuit formed by the power supply device and the simulation valve group.

9. A control method for testing equipment of a TE board of a DC ice melting device, characterized in that: include: Acquire the set active power and the actual active power of the DC side of the simulated valve group; wherein the topological structure of the simulated valve group is consistent with the valve group topological structure of the DC ice melting device, the simulated valve group is respectively connected to the simulated load and the TE board to be tested, the simulated load is equivalent to the load of the transmission line connected to the DC ice melting device; the simulated load is a secondary equivalent resistance used to simulate the load of the transmission line; Determining a trigger signal according to the set active power and the actual active power of the DC side of the analog valve group; The trigger signal is output to the TE board to be tested; the trigger signal is used to trigger the operation of the simulation valve group when the TE board to be tested is normal, so that the actual active power on the DC side of the simulation valve group is consistent with the set active power.

10. The control method for testing equipment for TE board of DC ice melting device according to claim 9, characterized in that: The step of determining the trigger signal according to the set active power and the actual active power of the DC side of the analog valve group comprises: Determining a difference between the set active power and the actual active power; Determine the trigger angle of the analog valve group through a PI control loop according to the difference; Determine a triggering moment according to the triggering angle; A trigger signal is determined according to the trigger moment and the trigger coding logic.

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