Method, device and equipment for testing graphic processor power interface and storage medium

Abstract

The present application relates to the method, device, equipment and storage medium of graphic processor power interface test, the method comprises: obtaining each group voltage data information on the graphic processor;Obtain the state information of each load line LED lamp corresponding to each group voltage data information;Detect whether each group voltage data information and the state information of each load line LED lamp meet the set requirement;If it meets, the test result is passed.The present application does not need to install graphic processor card, avoids the loss of graphic processor card, reduces the test cost, also does not need to pressure test, saves the test time, and can better meet the demand.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of graphic processor power interface test, in particular to a graphic processor power interface test method, device, equipment and storage medium. BACKGROUND

[0002] At present, the server mainboard will test the function of the interface on the mainboard in the production test process to ensure that the function of each interface of the mainboard is normal. The function test of the graphic processor power interface will install the graphic processor card on the mainboard to be tested, use the graphic processor power interface on the mainboard to power the graphic processor card, then start the mainboard to be tested, enter the test system, and check the basic information of the graphic processor through the test instruction. In order to ensure that the load of the power supply circuit reaches the design requirement, the graphic processor needs to be tested, and the graphic processor is removed after the test is completed. The traditional test scheme needs expensive graphic processor cards, and the operation steps are many. Each test of the mainboard needs to plug and unplug the graphic processor card, which increases the loss of the graphic processor card. Moreover, the pressure test time needs to be at least 15 minutes to reach the full load effect. No matter from the equipment cost or the test efficiency, the overall production test cost is too high. SUMMARY

[0003] The present application aims at overcoming the deficiencies of the prior art, and provides a graphic processor power interface test method, device, equipment and storage medium.

[0004] In order to solve the above technical problems, the present application adopts the following technical scheme:

[0005] The graphic processor power interface test method comprises the following steps:

[0006] Obtain each group of voltage data information on the graphic processor;

[0007] Obtain the state information of each load circuit LED lamp corresponding to each group of voltage data information;

[0008] Detect whether each group of voltage data information and the state information of each load circuit LED lamp meet the set requirement; if yes, the test result is passed.

[0009] Further technical scheme is that in the step of obtaining each group of voltage data information on the graphic processor, the USB-to-serial line is used to obtain each group of voltage data information on the graphic processor.

[0010] Further technical scheme is that in the step of obtaining the state information of each load circuit LED lamp corresponding to each group of voltage data information, the programmable device is used to send instructions to obtain the state information of each load circuit LED lamp corresponding to each group of voltage data information.

[0011] A further technical solution is as follows: the setting requirement is that each group of voltage data information is 90%-110% of the rated voltage, and the status information of each load circuit LED lamp is 85%-100% of the light source value.

[0012] A device for testing a graphics processor power interface includes: a first acquisition unit, a second acquisition unit, and a detection unit;

[0013] The first acquisition unit is used to acquire voltage data information of each group on the graphics processor;

[0014] The second acquiring unit is configured to acquire status information of each load circuit LED lamp corresponding to each set of voltage data information;

[0015] The detection unit is used to detect whether each group of voltage data information and the status information of each load circuit LED lamp meet the set requirements.

[0016] A further technical solution is as follows: in the first acquisition unit, each group of voltage data information on the graphics processor is acquired through a USB to serial port cable.

[0017] A further technical solution is as follows: in the second acquisition unit, an instruction is sent through a programmable device to acquire the status information of each load circuit LED lamp corresponding to each group of voltage data information.

[0018] A further technical solution is as follows: the setting requirement is that each group of voltage data information is 90%-110% of the rated voltage, and the status information of each load circuit LED lamp is 85%-100% of the light source value.

[0019] A device for testing a power interface of a graphics processor comprises a memory and a processor. The memory stores a computer program. When the processor executes the computer program, the method for testing a power interface of a graphics processor as described above is implemented.

[0020] A storage medium stores a computer program, wherein the computer program includes program instructions. When executed by a processor, the program instructions can implement the method for testing a graphics processor power interface as described above.

[0021] Compared with the prior art, the present invention has the following advantages: no graphics processor card needs to be installed, thus avoiding graphics processor card loss and reducing testing costs; no stress testing is required, thus saving testing time and being able to better meet the needs.

[0022] The present invention will be further described below with reference to the accompanying drawings and specific embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0023] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0024] Figure 1 A schematic flow chart of a method for testing a graphics processor power interface according to an embodiment of the present invention;

[0025] Figure 2 A schematic diagram of an application scenario of the method for testing the power interface of a graphics processor provided by an embodiment of the present invention;

[0026] Figure 3 A schematic block diagram of a device for testing a graphics processor power interface according to an embodiment of the present invention;

[0027] Figure 4 A schematic block diagram of a device for testing a graphics processor power interface according to an embodiment of the present invention. DETAILED DESCRIPTION

[0028] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of them. All other embodiments obtained by ordinary technicians in this field based on the embodiments of the present invention without making any creative efforts shall fall within the scope of protection of the present invention.

[0029] It will be understood that when used in this specification and the appended claims, the terms “comprises” and “comprising” indicate the presence of described features, integers, steps, operations, elements and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components and / or groups thereof.

[0030] It should also be understood that the terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the present invention. As used in the specification and appended claims, the singular forms "a," "an," and "the" are intended to include the plural forms unless the context clearly indicates otherwise.

[0031] It should be further understood that the term "and / or" used in the present description and the appended claims refers to and includes any and all possible combinations of one or more of the associated listed items.

[0032] See also Figures 1 to 4The specific embodiment shown, wherein see Figures 1 to 2 As shown, the present invention discloses a method for testing a graphics processor power interface, comprising the following steps:

[0033] S1, obtaining voltage data information of each group on the graphics processor;

[0034] Among them, in this embodiment, before step S1, it also includes: placing the mainboard to be tested on the fixture carrier, and then the MCU (single-chip microcomputer) controls the graphics processor power interface fixture automatic module to press and connect with the graphics processor power interface of the mainboard to be tested, and then the MCU (single-chip microcomputer) turns on the mainboard by pulling down the switch signal to start the test.

[0035] In this embodiment, each set of voltage data information on the graphics processor is obtained through a USB-to-serial cable, which is simple, efficient and accurate.

[0036] S2, obtaining status information of each load circuit LED lamp corresponding to each set of voltage data information;

[0037] In this embodiment, the status information of each load circuit LED lamp corresponding to each set of voltage data information is obtained by sending instructions through a programmable device, which is simple, efficient and accurate.

[0038] S3, detecting whether each group of voltage data information and the status information of each load circuit LED light meet the set requirements; if they do, the test result is passed; if not, the test result is failed.

[0039] The failure condition includes failure to meet one or both of the voltage data information for each group and the status information for each load circuit LED. If the conditions are not met, the MCU (single-chip microcomputer) controls the automatic module of the graphics processor power interface fixture to separate from the graphics processor power interface of the motherboard under test, and the motherboard under test is sent to a repair station for repair.

[0040] In this embodiment, the setting requirements are that each group of voltage data information is 90%-110% of the rated voltage, for example: the rated voltage is 10-15V; the status information of each load circuit LED light is 85%-100% of the light source value, for example: the light source value is 100.

[0041] Among them, see Figure 2 As shown, the present invention discloses a specific application scenario: testing the graphics processor power interface of the motherboard to be tested through a voltage detection board, a load test module and a fixture control module.

[0042] Among them, the MCU (single-chip microcomputer) serves as the main control, sending instructions to control the pressing and separation of the "graphics processor power interface fixture automatic module" and the "graphics processor power interface of the mainboard to be tested". The power detection board communicates data with the "mainboard to be tested" through the "USB to TTL (serial port) line". Its main function is to detect the output voltage of the graphics processor power interface. The detection point is the back-end voltage of the "self-recovery fuse" device of the load line; the programmable device forms a test intranet with the mainboard to be tested through the network cable through the switch to realize data communication. The light source (LED lamp) of each load line is guided to the light guide plate through the optical fiber light guide column. The distance between each light source is 1 cm, and the distance between the camera and the light guide plate is 10 cm. The programmable device (FPGA) controls the camera to take pictures of the light source on the light guide plate through the test instructions. The test instructions automatically judge and detect to realize the current test of the load line; the performance and parameter selection of the "self-recovery fuse" and LED lamp of the load line are based on the circuit design specifications of the graphics processor power interface. Figure 2 The GPU power connector is designed for a 12V operating voltage, with each pin supporting a maximum current of 8 amps. The maximum power consumption per pin is 96 watts. To achieve full load testing, five 12V, 20W LEDs were used as loads for each pin. A resettable fuse with a maximum operating voltage of 12.6V (105% of the designed operating voltage of 12V) and a maximum fault current of 8.4A (105% of the designed maximum current of 8A) was used. The test results indicate that the voltages on each load circuit are normal (a voltage between 11.4 and 12.6V is considered normal), and the LED brightness is normal (a brightness close to the normal value). The test results indicate a pass if both the voltage and brightness are normal. When the GPU power connector output voltage is short-circuited or overloaded, the resettable fuse activates, limiting and protecting the circuit. At this point, the detected load circuit voltage is 0V, and the LEDs on the load circuits will not operate, resulting in a fail test result.

[0043] Among them, in this embodiment, the voltage detection board includes a main control chip and a digital-to-analog converter; information exchange is realized between the main control chip and the digital-to-analog converter through SPI; the test instructions of the load test module are secondary development of open source code; the MCU (microcontroller) test board and test instructions are developed according to demand.

[0044] The present invention implements power-on testing of each output voltage interface of a graphics processor power interface without installing a graphics processor card, thereby avoiding loss of the graphics processor card and reducing testing costs. Furthermore, the present invention eliminates the need for stress testing, saves testing time, and can better meet requirements.

[0045] See also Figure 3As shown, the present invention also discloses a device for testing a graphics processor power interface, comprising: a first acquisition unit 10, a second acquisition unit 20 and a detection unit 30;

[0046] The first acquisition unit 10 is used to acquire voltage data information of each group on the graphics processor;

[0047] The second acquiring unit 20 is configured to acquire status information of each load circuit LED lamp corresponding to each set of voltage data information;

[0048] The detection unit 30 is used to detect whether each group of voltage data information and the status information of each load line LED lamp meet the set requirements.

[0049] The first acquisition unit 10 acquires each set of voltage data information on the graphics processor via a USB to serial port cable.

[0050] The second acquiring unit 20 acquires the status information of each load circuit LED lamp corresponding to each set of voltage data information by sending instructions via a programmable device.

[0051] The setting requirements are that each group of voltage data information is 90%-110% of the rated voltage, and the status information of each load circuit LED lamp is 85%-100% of the light source value.

[0052] It should be noted that those skilled in the art will clearly understand that the specific implementation process of the device and each unit of the graphics processor power interface test can be referred to the corresponding description in the aforementioned method embodiment. For the convenience and brevity of description, it will not be repeated here.

[0053] The above-mentioned device for testing the power interface of the graphics processor can be implemented in the form of a computer program. The computer program can be used in Figure 4 The graphics processor power interface is shown running on the device tested.

[0054] See also Figure 4 , Figure 4 This is a schematic block diagram of a device for testing a graphics processor power interface, as provided in an embodiment of the present application. The device 500 for testing a graphics processor power interface can be a terminal or a server. The terminal can be a smartphone, tablet computer, laptop computer, desktop computer, personal digital assistant, wearable device, or other electronic device with communication capabilities. The server can be a standalone server or a server cluster consisting of multiple servers.

[0055] See Figure 4The graphics processor power interface test device 500 includes a processor 502 , a memory, and a network interface 505 connected via a system bus 501 , wherein the memory may include a non-volatile storage medium 503 and an internal memory 504 .

[0056] The non-volatile storage medium 503 can store an operating system 5031 and a computer program 5032. The computer program 5032 includes program instructions, which, when executed, can enable the processor 502 to perform a method for testing a graphics processor power interface.

[0057] The processor 502 is used to provide computing and control capabilities to support the operation of the entire graphics processor power interface test device 500.

[0058] The internal memory 504 provides an environment for running the computer program 5032 in the non-volatile storage medium 503 . When the computer program 5032 is executed by the processor 502 , the processor 502 can execute the method for testing the power interface of the graphics processor.

[0059] The network interface 505 is used to communicate with other devices through the network. Figure 4 The structure shown in the figure is merely a block diagram of a portion of the structure related to the solution of the present application, and does not constitute a limitation on the device 500 for testing the power interface of a graphics processor to which the solution of the present application is applied. The specific device 500 for testing the power interface of a graphics processor may include more or fewer components than shown in the figure, or combine certain components, or have a different arrangement of components.

[0060] It should be understood that in the embodiment of the present application, the processor 502 may be a central processing unit (CPU), and the processor 502 may also be other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. The general-purpose processor may be a microprocessor or any conventional processor, etc.

[0061] Those skilled in the art will appreciate that all or part of the steps in the method of the above-described embodiment can be implemented by instructing the relevant hardware through a computer program. The computer program includes program instructions, which can be stored in a storage medium that is computer-readable. The program instructions are executed by at least one processor in the computer system to implement the steps in the method of the above-described embodiment.

[0062] Therefore, the present invention further provides a storage medium. The storage medium may be a computer-readable storage medium. The storage medium stores a computer program, wherein the computer program includes program instructions that, when executed by a processor, implement the aforementioned method for testing a graphics processor power interface.

[0063] The storage medium may be any computer-readable storage medium that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a magnetic disk, or an optical disk.

[0064] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two. In order to clearly illustrate the interchangeability of hardware and software, the above description has generally described the composition and steps of each example according to function. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0065] In the several embodiments provided herein, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of the various units is merely a logical functional division, and actual implementation may employ other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be omitted or not implemented.

[0066] The steps in the methods of the embodiments of the present invention may be adjusted in order, combined, or deleted as needed. The units in the devices of the embodiments of the present invention may be combined, divided, or deleted as needed. Furthermore, the functional units in the various embodiments of the present invention may be integrated into a single processing unit, each unit may exist physically separately, or two or more units may be integrated into a single unit.

[0067] If this integrated unit is implemented as a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on this understanding, the technical solution of the present invention, or the portion that contributes to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. This computer software product, stored in a storage medium, includes instructions for causing a graphics processor power interface test device (such as a personal computer, terminal, or network device) to perform all or part of the steps of the method described in various embodiments of the present invention.

[0068] The above embodiments are preferred implementation schemes of the present invention. In addition, the present invention can also be implemented in other ways. Any obvious replacement without departing from the concept of the present technical solution is within the scope of protection of the present invention.

Claims

1. A method for testing a graphics processor power interface, characterized in that: The following steps are involved: Get each group of voltage data information on the graphics processor; Obtaining status information of each load circuit LED lamp corresponding to each set of voltage data information; Check whether the voltage data information of each group and the status information of each load circuit LED light meet the set requirements; if so, the test result is passed; Before the step of obtaining each set of voltage data information on the graphics processor, the method further includes: placing the motherboard to be tested on a fixture carrier, then controlling the MCU to press-connect the graphics processor power interface fixture automatic module to the graphics processor power interface of the motherboard to be tested, and then the MCU turns on the motherboard by pulling down a switch signal to start the test; In the step of obtaining the status information of each load circuit LED lamp corresponding to each set of voltage data information, the programmable device sends an instruction to obtain the status information of each load circuit LED lamp corresponding to each set of voltage data information; If not satisfied, the test result is failed; wherein, the non-satisfaction includes that one of the voltage data information of each group and the status information of the LED lights of each load circuit is not satisfied or both are not satisfied; when not satisfied, the MCU controls the automatic module of the graphics processor power interface fixture to separate from the graphics processor power interface of the motherboard to be tested.

2. The method for testing the power interface of a graphics processor according to claim 1, wherein: In the step of obtaining each group of voltage data information on the graphics processor, each group of voltage data information on the graphics processor is obtained through a USB to serial port cable.

3. The method for testing a graphics processor power interface according to claim 1, wherein: The setting requirements are that each group of voltage data information is 90%-110% of the rated voltage, and the status information of each load circuit LED lamp is 85%-100% of the light source value.

4. A device for testing the power interface of a graphics processor, characterized in that: include: A first acquiring unit, a second acquiring unit and a detecting unit; The first acquisition unit is used to acquire voltage data information of each group on the graphics processor; The second acquiring unit is configured to acquire status information of each load circuit LED lamp corresponding to each set of voltage data information; The detection unit is used to detect whether the voltage data information of each group and the status information of each load circuit LED lamp meet the set requirements; if so, the test result is passed; The device further includes: a placement and connection unit for placing the motherboard to be tested on the fixture carrier, and then the MCU controls the graphics processor power interface fixture automatic module to press and connect with the graphics processor power interface of the motherboard to be tested, and then the MCU turns on the motherboard by pulling down the switch signal to start the test; In the second acquisition unit, a programmable device is used to send an instruction to acquire the status information of each load circuit LED lamp corresponding to each group of voltage data information; If not satisfied, the test result is failed; wherein, the non-satisfaction includes that one of the voltage data information of each group and the status information of the LED lights of each load circuit is not satisfied or both are not satisfied; when not satisfied, the MCU controls the automatic module of the graphics processor power interface fixture to separate from the graphics processor power interface of the motherboard to be tested.

5. The device for testing the power interface of a graphics processor according to claim 4, characterized in that: In the first acquisition unit, each group of voltage data information on the graphics processor is acquired through a USB to serial port cable.

6. The device for testing the power interface of a graphics processor according to claim 4, characterized in that: The setting requirements are that each group of voltage data information is 90%-110% of the rated voltage, and the status information of each load circuit LED lamp is 85%-100% of the light source value.

7. Graphics processor power interface test equipment, characterized in that: The device for testing the power interface of a graphics processor includes a memory and a processor. The memory stores a computer program. When the processor executes the computer program, the method for testing the power interface of a graphics processor according to any one of claims 1 to 3 is implemented.

8. A storage medium, characterized in that: The storage medium stores a computer program, which includes program instructions. When executed by a processor, the program instructions can implement the method for testing a graphics processor power interface according to any one of claims 1 to 3.

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