Scintillator afterglow testing system, method, apparatus and electronic equipment

By using frame rotation to drive the X-ray shield block to periodically cut off the detector in the scintillator afterglow test system, the problems of low accuracy and high cost in the prior art are solved, and high accuracy and low cost are achieved Afterglow test.

CN114296124BActive Publication Date: 2025-01-07SHANGHAI UNITED IMAGING HEALTHCARE
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Patent Information

Application Number
CN202111661130.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2021-12-30
Publication Date
2025-01-07
Estimated Expiration
2041-12-30

AI Technical Summary

Technical Problem

The existing scintillator afterglow testing methods have problems of low accuracy and high cost, making it difficult to effectively measure short- and long-term afterglows, and a complex system is required to drive the motion of the shield block.

Method used

By setting up an X-ray source and scintillator detector on the rack, and using the rack rotation to drive the X-ray shield block to perform periodic cut-off control on the detector, the test of scintillator afterglow is achieved, reducing the testing cost.

Benefits of technology

Afterglow tests from submilliseconds to second levels are realized, which improves the test accuracy and meets different application needs without the need to build a complex test system to drive the motion of the shielded block.

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Abstract

The present application relates to a scintillator afterglow test system, method, device and electronic device, wherein the system comprises: a frame, which can be rotatably arranged, and a detection channel is formed in the middle of the frame; an X-ray source and a scintillator detector, which are fixed on the frame and symmetrically arranged along the rotation axis of the frame, and the scintillator detector is used to detect the X-ray signal emitted by the X-ray source; an X-ray shielding block, which is arranged in the detection channel; when the frame rotates, it can drive the X-ray source and the scintillator detector to rotate relative to each other around the X-ray shielding block, so that the X-ray shielding block periodically cuts off the X-ray irradiation of the scintillator detector to the test area. Through the present application, the test cost is reduced and the accuracy of the afterglow test is improved.
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Citation Information

Patent Citations

  • Data acquisition and visualization mode for low dose intervention guidance in computed tomography

    CN102427767A

  • Afterglow testing device of scintillator

    CN107861146A