System and method for evaluating the life of an electrical switch with dual variables of overtravel and pull-in time

Abstract

The present invention belongs to the technical field of electrical switch life assessment system, and in particular, relates to a dual variable electrical switch life assessment system and method for overtravel and pull-in time. The system is composed of a display unit and a data storage unit connected to a PIC respectively, and a control panel connected to the PIC; the output ends of the power supply, reset circuit, clock circuit, and crystal oscillator circuit are connected to the PIC respectively, and the PIC is connected to the electrical switch through a drive module; the electrical switch is connected to the signal processing circuit through a current sensor and a voltage transformer respectively, and the output end of the signal processing circuit is connected to the input end of the PI; the electrical switch is connected to the PIC through a travel sensor and an analog-to-digital conversion unit; the input end of the PIC is connected to an industrial computer via a communication circuit. The system has the characteristics of simple structure and easy operation, and can improve the accuracy of electrical switch life prediction, ensure the quality of electrical switch products, save power resources, and improve the safety level of electrical switches.

Description

Technical Field

[0001] The invention belongs to the technical field of electrical switch life assessment systems, and in particular relates to an overtravel and pull-in time dual variable electrical switch life assessment system and method. Background Art

[0002] Electrical switches are commonly used electrical equipment. They can effectively control the working status of electrical equipment by connecting and disconnecting them. They are widely used in industrial production, military, aerospace and other fields. Electrical switches currently use the method of fault inspection and replacement, which has certain safety hazards and brings accident hazards to safe production and people's lives.

[0003] Life assessment technology uses electrical switch parameter detection and intelligent algorithms to determine the operating status of the equipment, and alarms when a fault or failure occurs, which is conducive to scientifically arranging maintenance and improving the utilization rate of electrical equipment. Most of the existing electrical switch life assessments use fuzzy comprehensive diagnosis methods, and the accuracy of the model factor weights based on experience is not guaranteed, and the status of the electrical switch cannot be effectively diagnosed. Summary of the invention

[0004] In view of the shortcomings of the above-mentioned prior art, the present invention provides a system and method for evaluating the life of an electrical switch with dual variables of overtravel and pull-in time. The purpose is to improve the safety and reliability of electrical switches and related equipment and lay the foundation for the development of intelligent electrical technology.

[0005] The technical solution adopted by the present invention to achieve the above-mentioned purpose is:

[0006] The overtravel and pull-in time dual variable electrical switch life assessment system comprises a display unit, a control panel power supply and an industrial computer, and is characterized in that: the input ends of the display unit and the data storage unit are respectively connected to the output ends of the PIC, and the output end of the control panel is connected to the input end of the PIC; the output ends of the power supply, the reset circuit, the clock circuit and the crystal oscillator circuit are respectively connected to the PIC, and the PIC is connected to the electrical switch through a drive module; the electrical switch is respectively connected to the signal processing circuit through a current sensor and a voltage transformer, and the output end of the signal processing circuit is connected to the input end of the PIC; the electrical switch is connected to the PIC through a travel sensor and an analog-to-digital conversion unit; and the input end of the PIC is connected to the industrial computer via a communication circuit.

[0007] Furthermore, the signal input end of the display unit is connected to the display signal output end of the PIC, and the signal output end of the control panel is connected to the control signal input end of the PIC; the signal output ends of the power supply, reset circuit, clock circuit, and crystal oscillator circuit are respectively connected to the power supply terminal, reset signal terminal, clock signal input terminal, and crystal oscillator signal input terminal of the PIC.

[0008] Furthermore, the control signal output end of the PIC is connected to the control signal input end of the drive module, and the control signal output end of the drive module is connected to the control signal input end of the electrical switch; the signal test end of the current sensor is connected to the current test part of the electrical switch, the signal test end of the voltage sensor is connected to the voltage test part of the electrical switch, the signal output ends of the current transformer and the voltage transformer are respectively connected to the signal input end of the signal processing circuit, and the signal output end of the signal processing circuit is connected to the voltage and current signal input end of the PIC.

[0009] Furthermore, the signal test end of the stroke sensor is connected to the stroke test part of the electrical switch, the signal output end of the stroke sensor is connected to the signal input end of the analog-to-digital conversion unit, and the signal output end of the analog-to-digital conversion unit is connected to the counting signal input end of the PIC.

[0010] Furthermore, the communication signal output terminal of the industrial computer is connected to the communication signal input terminal of the PIC via a communication circuit.

[0011] Furthermore, the signal input terminal of the data storage unit is connected to the storage signal output terminal of the PIC.

[0012] Furthermore, the circuit of the driving module includes a power supply VCC, a driving chip M57962L, a diode VD1, a diode VD2, a diode VD3, a diode VD4, a diode VD5, a resistor R1, a resistor R2, a capacitor C1, a capacitor C2, and an IGBT; the power supply VCC and the driving chip M57962L are connected. The pins are connected, and the control signal of the PLC is connected to the drive chip M57962L The pins are connected, the two ends of the diode VD1 are respectively connected to the ① pin of the driving chip M57962L and one end of the IGBT and one end of the input of the electrical switch control, the ⑧ pin of the driving chip M57962L is connected to one end of the diode VD2, the other end of the diode VD2 is connected to one end of the resistor R3, the other end of the resistor R3 is connected to the power supply VCC1 and the ④ pin of the driving chip M57962L, the ⑥ pin of the driving chip M57962L is connected to one end of the capacitor C1, one end of the capacitor C2, and the ground terminal GND, the other end of the capacitor C2 is connected to one end of VD4, one end of the resistor R2, the other end of the IGBT, and one end of the switching power supply, the other end of the resistor R1 is connected to one end of the diode VD3, the other end of the resistor R2, and the control end of the IGBT, the other end of the diode VD3 is connected to the other end of the diode VD4, the two ends of the diode VD5 are connected to the two ends of the IGBT, and the other end of the switching power supply is connected to the other end of the electrical switch control.

[0013] The life evaluation method of an electrical switch with dual variables of overtravel and pull-in time comprises the following steps:

[0014] Step 1. Calculate the overtravel time and pull-in time of the electrical switch;

[0015] Step 2. Calculate the life of the electrical switch based on the obtained overtravel time and pull-in time;

[0016] Step 3: Evaluate the life of the electrical switch. When the overtravel time is shortened to the allowable limit value, the electrical switch fails.

[0017] Furthermore, in step 1, the overtravel time and the pull-in time of the electrical switch are calculated, and the pull-in time is the time from when the electrical switch receives the action command and starts to move to when the moving and static contacts contact; the overtravel time is the time from when the moving and static contacts of the electrical switch start to contact to when they are fully closed; the overtravel time and pull-in time dual variable electrical switch life assessment system collects the current signal of the electrical switch action coil and the voltage signal between the contacts, and obtains the overtravel time and the pull-in time by calculation;

[0018] In the electrical switch voltage and current curve, t a is the pull-in time, t b It is the time from the start of the action command to the full closure of the moving and static contacts. The overtravel time calculation formula is:

[0019] t c =t b -t a (1)

[0020] In the formula, t c is the pull-in time;

[0021] Step 2. Calculate the life of the electrical switch based on the obtained overtravel time and pull-in time.

[0022] The overtravel time of the electrical switch is shortened as the number of operations increases, and the closing time of the electrical switch is prolonged as the number of operations increases; the overtravel time has a greater impact on the life of the electrical switch than the closing time, so the weight of the overtravel time is greater than the closing time when evaluating the life of the electrical switch; the formula for calculating the life of the electrical switch is:

[0023]

[0024] Where, T s is the life of the electrical switch; T c Estimation of electrical switch life for overtravel time; T xis the pull-in time to evaluate the life of the electrical switch; m is the proportional coefficient for the overtravel time to evaluate the life of the electrical switch; n is the proportional coefficient for the pull-in time to evaluate the life of the electrical switch; p is the proportional coefficient for the life of the electrical switch;

[0025] Step 3. Evaluate based on the life of the electrical switch;

[0026] Overtravel time assessment The life of electrical switches is assessed through the overtravel speed change rate. During the operation of electrical switches, the overtravel time is continuously shortened due to contact wear, insulation aging and other issues. When the overtravel time is shortened to the allowable limit, the electrical switch will fail.

[0027] When evaluating, it is assumed that the timeout time is shortened according to a linear law, then T c The calculation formula is:

[0028]

[0029] Where, T q is the initial overtravel time of the electrical switch, T j is the allowable limit value of the electrical switch overtravel time, and k is the rate at which the electrical switch overtravel time is shortened.

[0030] A computer storage medium stores a computer program, which, when executed by a processor, implements the steps of the life assessment method of an overtravel and pull-in time dual variable electrical switch.

[0031] The present invention has the following beneficial effects and advantages:

[0032] The present invention proposes a system and method for evaluating the life of an electrical switch based on a dual variable of overtravel and pull-in time. The test system has the characteristics of simple structure and easy operation. Based on the dual variable bilateral quantity prediction technology of overtravel and pull-in time, the present invention improves the prediction accuracy of the life of the electrical switch, ensures the product quality of the electrical switch, saves power resources, improves the safety level of the electrical switch, provides a new idea for the evaluation of the operating process status of the electrical switch, and promotes the sustainable and healthy development of the field of electrical switches. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] The above and / or additional aspects and advantages of the present invention will become apparent and easily understood from the description of the embodiments in conjunction with the following drawings, in which:

[0034] Figure 1 It is a structural diagram of the overtravel and pull-in time dual variable electrical switch life evaluation system of the present invention;

[0035] Figure 2 is a graph of voltage and current of an electrical switch of the present invention;

[0036] Figure 3It is a circuit diagram of a driving module of the overtravel and pull-in time dual variable electrical switch life evaluation system of the present invention;

[0037] Figure 4 It is a flow chart of the life evaluation system of the overtravel and pull-in time dual variable electrical switch of the present invention.

[0038] In the figure:

[0039] Display unit 1, control panel 2, power supply 3, reset circuit 4, clock circuit 5, crystal oscillator circuit 6, PIC 7, drive module 8, electrical switch 9, signal processing circuit 10, current sensor 11, analog-to-digital conversion unit 12, travel sensor 13, voltage sensor 14, communication circuit 15, industrial computer 16, data storage unit 17. DETAILED DESCRIPTION

[0040] In order to more clearly understand the above-mentioned objectives, features and advantages of the present invention, the present invention will be further described in detail below in conjunction with the accompanying drawings and specific embodiments. It should be noted that the embodiments of the present application and the features in the embodiments can be combined with each other without conflict.

[0041] In the following description, many specific details are set forth to facilitate a full understanding of the present invention. However, the present invention may also be implemented in other ways different from those described herein. Therefore, the protection scope of the present invention is not limited to the specific embodiments disclosed below.

[0042] Refer to the following Figure 1-Figure 4 The technical solutions of some embodiments of the present invention are described.

[0043] Example 1

[0044] The present invention provides an embodiment, which is a life evaluation system for an electrical switch with dual variables of overtravel and pull-in time, such as Figure 1 As shown, Figure 1 It is a structural diagram of the overtravel and pull-in time dual variable electrical switch life evaluation system of the present invention.

[0045] The overtravel and pull-in time dual variable electrical switch life assessment system of the present invention mainly includes the following components: a display unit 1, a control panel 2, a power supply 3, a reset circuit 4, a clock circuit 5, a crystal oscillator circuit 6, a PIC 7, a drive module 8, an electrical switch 9, a signal processing circuit 10, a current sensor 11, an analog-to-digital conversion unit 12, a travel sensor 13, a voltage sensor 14, a communication circuit 15, an industrial computer 16, and a data storage unit 17.

[0046] Among them, the signal input end of the display unit 1 is connected to the display signal output end of PIC7, and the signal output end of the control panel 2 is connected to the control signal input end of PIC7; the signal output ends of the power supply 3, the reset circuit 4, the clock circuit 5, and the crystal oscillator circuit 6 are respectively connected to the power supply terminal, the reset signal terminal, the clock signal input terminal, and the crystal oscillator signal input terminal of PIC7.

[0047] The control signal output end of the PIC7 is connected to the control signal input end of the drive module 8, and the control signal output end of the drive module 8 is connected to the control signal input end of the electrical switch 9; the signal test end of the current sensor 11 is connected to the current test part of the electrical switch 9, and the signal test end of the voltage sensor 14 is connected to the voltage test part of the electrical switch 9. The signal output ends of the current transformer 11 and the voltage transformer 14 are respectively connected to the signal input ends of the signal processing circuit 10, and the signal output end of the signal processing circuit 10 is connected to the voltage and current signal input ends of the PIC7.

[0048] The signal test end of the stroke sensor 13 is connected to the stroke test part of the electrical switch 9, the signal output end of the stroke sensor 13 is connected to the signal input end of the analog-to-digital conversion unit 12, and the signal output end of the analog-to-digital conversion unit 12 is connected to the counting signal input end of the PIC7.

[0049] The communication signal output terminal of the industrial computer 16 is connected to the communication signal input terminal of the PIC 7 via the communication circuit 15 .

[0050] The signal input terminal of the data storage unit 17 is connected to the storage signal output terminal of the PIC7.

[0051] like Figure 3 As shown, Figure 3 This is a circuit diagram of a drive module of the overtravel and pull-in time dual variable electrical switch life assessment system of the present invention. In order to ensure the reliability and anti-interference capability of the overtravel and pull-in time dual variable electrical switch life assessment system, a drive module circuit is designed based on IGBT and a drive chip.

[0052] The circuit of the driving module 8 is mainly composed of a power supply VCC, a driving chip M57962L, a diode VD1, a diode VD2, a diode VD3, a diode VD4, a diode VD5, a resistor R1, a resistor R2, a capacitor C1, a capacitor C2, and an IGBT.

[0053] The power supply VCC and the driver chip M57962L The pins are connected, and the control signal of the PLC is connected to the drive chip M57962L The pins are connected, the two ends of the diode VD1 are respectively connected to the ① pin of the driving chip M57962L and one end of the IGBT and one end of the input of the electrical switch control, the ⑧ pin of the driving chip M57962L is connected to one end of the diode VD2, the other end of the diode VD2 is connected to one end of the resistor R3, the other end of the resistor R3 is connected to the power supply VCC1 and the ④ pin of the driving chip M57962L, the ⑥ pin of the driving chip M57962L is connected to one end of the capacitor C1, one end of the capacitor C2, and the ground terminal GND, the other end of the capacitor C2 is connected to one end of VD4, one end of the resistor R2, the other end of the IGBT, and one end of the switching power supply, the other end of the resistor R1 is connected to one end of the diode VD3, the other end of the resistor R2, and the control end of the IGBT, the other end of the diode VD3 is connected to the other end of the diode VD4, the two ends of the diode VD5 are connected to the two ends of the IGBT, and the other end of the switching power supply is connected to the other end of the electrical switch control.

[0054] Example 2

[0055] The present invention further provides an embodiment, which is a method for evaluating the life of an electrical switch with two variables of overtravel and pull-in time. When implemented, Figure 4 As shown, Figure 4 It is a flow chart of the life evaluation system of the overtravel and pull-in time dual variable electrical switch of the present invention.

[0056] The present invention provides a life evaluation method for an electrical switch with dual variables of overtravel and pull-in time, which specifically comprises the following steps:

[0057] Step 1. Calculate the overtravel time and pull-in time of the electrical switch.

[0058] The time from when an electrical switch receives an action command and starts to move to when the moving and static contacts come into contact is called the pull-in time.

[0059] The time taken for the moving and static contacts of an electrical switch to start contacting and fully close is called the overtravel time.

[0060] The overtravel time and pull-in time dual variable electrical switch life assessment system collects the current signal of the electrical switch action coil and the voltage signal between the contacts, and then obtains the overtravel time and pull-in time by calculation.

[0061] like Figure 2 As shown, Figure 2 t is a graph of the voltage and current of the electrical switch of the present invention. a is the pull-in time, t b It is the time from the start of the action command to the full closure of the moving and static contacts. The overtravel time calculation formula is:

[0062] t c=t b -t a (1)

[0063] In the formula, t c The pull-in time.

[0064] Step 2. Calculate the life of the electrical switch based on the obtained overtravel time and pull-in time.

[0065] The overtravel time of the electrical switch is shortened as the number of operations increases, and the closing time of the electrical switch is extended as the number of operations increases. The overtravel time has a greater impact on the life of the electrical switch than the closing time. Therefore, when evaluating the life of the electrical switch, the weight of the overtravel time is greater than the closing time. The formula for calculating the life of the electrical switch is:

[0066]

[0067] Where, T s is the life of the electrical switch; T c Estimation of electrical switch life for overtravel time; T x is the pull-in time to evaluate the life of the electrical switch; m is the proportional coefficient for the overtravel time to evaluate the life of the electrical switch, generally m is taken as 6.5; n is the proportional coefficient for the pull-in time to evaluate the life of the electrical switch, generally n is taken as 3.5; p is the proportional coefficient for the life of the electrical switch, generally p is taken as 12.

[0068] Step 3. Evaluate based on electrical switch life.

[0069] Overtravel time assessment The life assessment of electrical switches is mainly assessed by the overtravel speed change rate. Due to contact wear, insulation aging and other issues during the electrical switch operation, the overtravel time continues to shorten. When the overtravel time is shortened to the allowable limit, the electrical switch will fail. When assessing, it is assumed that the overtravel time shortens according to a linear law, then T c The calculation formula is:

[0070]

[0071] Where, T q is the initial overtravel time of the electrical switch, T j is the allowable limit value of the electrical switch overtravel time, and k is the rate at which the electrical switch overtravel time is shortened.

[0072] Example 3

[0073] Based on the same inventive concept, an embodiment of the present invention also provides a computer storage medium, on which a computer program is stored. When the computer program is executed by a processor, the steps of the overtravel and pull-in time dual-variable electrical switch life assessment method described in Example 1 or 2 are implemented.

[0074] In the present invention, the terms "connection" and "fixation" should be understood in a broad sense. For example, "connection" can be a fixed connection, a detachable connection, or an integral connection. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0075] In the description of the present invention, it is necessary to understand that the indicated orientation or positional relationship is based on the orientation or positional relationship shown in the accompanying drawings, and is only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or unit referred to must have a specific direction, be constructed and operated in a specific orientation. Therefore, it cannot be understood as a limitation on the present invention.

[0076] In the description of this specification, the description of the terms "one embodiment", "some embodiments", etc. means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any one or more embodiments or examples in a suitable manner.

[0077] Those skilled in the art will appreciate that the embodiments of the present application may be provided as methods, systems, or computer program products. Therefore, the present application may adopt the form of a complete hardware embodiment, a complete software embodiment, or an embodiment in combination with software and hardware. Moreover, the present application may adopt the form of a computer program product implemented in one or more computer-usable storage media (including but not limited to disk storage, CD-ROM, optical storage, etc.) that include computer-usable program code.

[0078] The present application is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present application. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to generate a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 A process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.

[0079] These computer program instructions may also be stored in a computer-readable memory capable of directing a computer or other programmable data processing device to operate in a specific manner, so that the instructions stored in the computer-readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 A process or multiple processes and / or boxes Figure 1 A function specified in one or more boxes.

[0080] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operating steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing instructions for implementing the process. Figure 1 A process or multiple processes and / or boxes Figure 1 The steps for the functions specified in one or more boxes.

[0081] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, ordinary technicians in the relevant field should understand that the specific implementation methods of the present invention can still be modified or replaced by equivalents. Any modification or equivalent replacement that does not depart from the spirit and scope of the present invention should be covered within the scope of protection of the claims of the present invention.

Claims

1. Overtravel and pull-in time dual variable electrical switch life assessment system, characterized by: The invention comprises a display unit (1), a control panel (2), a power supply (3) and an industrial computer (16), and is characterized in that: the input ends of the display unit (1) and the data storage unit (17) are respectively connected to the output end of the PIC (7), and the output end of the control panel (2) is connected to the input end of the PIC (7); the output ends of the power supply (3), the reset circuit (4), the clock circuit (5) and the crystal oscillator circuit (6) are respectively connected to the PIC (7), and the PIC (7) is connected to the electrical switch (9) through a drive module (8); the electrical switch (9) is respectively connected to the signal processing circuit (10) through a current sensor (11) and a voltage transformer (14), and the output end of the signal processing circuit (10) is connected to the input end of the PIC (7); the electrical switch (9) is connected to the PIC (7) through a travel sensor (13) and an analog-to-digital conversion unit (12); and the input end of the PIC (7) is connected to the industrial computer (16) through a communication circuit (15).

2. The overtravel and pull-in time dual variable electrical switch life assessment system according to claim 1 is characterized by: The signal input end of the display unit (1) is connected to the display signal output end of the PIC (7), and the signal output end of the control panel (2) is connected to the control signal input end of the PIC (7); the signal output ends of the power supply (3), the reset circuit (4), the clock circuit (5), and the crystal oscillator circuit (6) are respectively connected to the power connection terminal, the reset signal connection terminal, the clock signal input terminal, and the crystal oscillator signal input terminal of the PIC (7).

3. The overtravel and pull-in time dual variable electrical switch life assessment system according to claim 1 is characterized by: The control signal output end of the PIC (7) is connected to the control signal input end of the drive module (8), and the control signal output end of the drive module (8) is connected to the control signal input end of the electrical switch (9); the signal test end of the current sensor (11) is connected to the current test part of the electrical switch (9), the signal test end of the voltage sensor (14) is connected to the voltage test part of the electrical switch (9), the signal output ends of the current transformer (11) and the voltage transformer (14) are respectively connected to the signal input end of the signal processing circuit (10), and the signal output end of the signal processing circuit (10) is connected to the voltage and current signal input end of the PIC (7).

4. The overtravel and pull-in time dual variable electrical switch life assessment system according to claim 1 is characterized by: The signal test end of the stroke sensor (13) is connected to the stroke test part of the electrical switch (9), the signal output end of the stroke sensor (13) is connected to the signal input end of the analog-to-digital conversion unit (12), and the signal output end of the analog-to-digital conversion unit (12) is connected to the counting signal input end of the PIC (7).

5. The overtravel and pull-in time dual variable electrical switch life assessment system according to claim 1 is characterized by: The communication signal output terminal of the industrial computer (16) is connected to the communication signal input terminal of the PIC (7) via the communication circuit (15).

6. The overtravel and pull-in time dual variable electrical switch life assessment system according to claim 1 is characterized by: The signal input terminal of the data storage unit (17) is connected to the storage signal output terminal of the PIC (7).

7. The overtravel and pull-in time dual variable electrical switch life assessment system according to claim 1 is characterized by: The circuit of the driving module (8) comprises a power supply VCC, a driving chip M57962L, a diode VD1, a diode VD2, a diode VD3, a diode VD4, a diode VD5, a resistor R1, a resistor R2, a capacitor C1, a capacitor C2, and an IGBT; the power supply VCC and the driving chip M57962L are connected to each other. The PLC control signal is connected to the driver chip M57962L The pins are connected, the two ends of the diode VD1 are respectively connected to the ① pin of the driving chip M57962L and one end of the IGBT and one end of the input of the electrical switch control, the ⑧ pin of the driving chip M57962L is connected to one end of the diode VD2, the other end of the diode VD2 is connected to one end of the resistor R3, the other end of the resistor R3 is connected to the power supply VCC1 and the ④ pin of the driving chip M57962L, the ⑥ pin of the driving chip M57962L is connected to one end of the capacitor C1, one end of the capacitor C2, and the ground terminal GND, the other end of the capacitor C2 is connected to one end of VD4, one end of the resistor R2, the other end of the IGBT, and one end of the switching power supply, the other end of the resistor R1 is connected to one end of the diode VD3, the other end of the resistor R2, and the control end of the IGBT, the other end of the diode VD3 is connected to the other end of the diode VD4, the two ends of the diode VD5 are connected to the two ends of the IGBT, and the other end of the switching power supply is connected to the other end of the electrical switch control.

8. A method for evaluating the life of an electrical switch using dual variables of overtravel and pull-in time, characterized by: The following steps are involved: Step 1. Calculate the overtravel time and pull-in time of the electrical switch; Step 2. Calculate the life of the electrical switch based on the obtained overtravel time and pull-in time; the overtravel time of the electrical switch is shortened as the number of actions increases, and the pull-in time of the electrical switch is prolonged as the number of actions increases; the overtravel time has a greater impact on the life of the electrical switch than the pull-in time, so when evaluating the life of the electrical switch, the weight of the overtravel time is greater than the pull-in time; the formula for calculating the life of the electrical switch is: Where, T s is the life of the electrical switch; T c Estimation of electrical switch life for overtravel time; T x is the pull-in time to evaluate the life of the electrical switch; m is the proportional coefficient for the overtravel time to evaluate the life of the electrical switch; n is the proportional coefficient for the pull-in time to evaluate the life of the electrical switch; p is the proportional coefficient for the life of the electrical switch; Step 3. Evaluate the life of the electrical switch. When the overtravel time is shortened to the allowable limit, the electrical switch fails. The evaluation is based on the life of the electrical switch, where: Overtravel time assessment The life of electrical switches is assessed through the overtravel speed change rate. During the operation of electrical switches, the overtravel time is continuously shortened due to contact wear, insulation aging and other issues. When the overtravel time is shortened to the allowable limit, the electrical switch will fail. When evaluating, it is assumed that the timeout time is shortened according to a linear law, then T c The calculation formula is: Where, T q is the initial overtravel time of the electrical switch, T j is the allowable limit value of the electrical switch overtravel time, and k is the rate at which the electrical switch overtravel time is shortened.

9. The method for evaluating the life of an electrical switch based on the overtravel and pull-in time dual variables according to claim 8 is characterized by: Step 1 calculates the overtravel time and the pull-in time of the electrical switch, wherein the pull-in time is the time taken for the electrical switch to receive an action command and start to move until the moving and static contacts touch; the overtravel time is the time taken for the moving and static contacts of the electrical switch to start to touch and be fully closed; the overtravel time and pull-in time dual variable electrical switch life assessment system collects the current signal of the electrical switch action coil and the voltage signal between the contacts, and obtains the overtravel time and the pull-in time by calculation; In the electrical switch voltage and current curve, t a is the pull-in time, t b It is the time from the start of the action command to the full closure of the moving and static contacts. The overtravel time calculation formula is: t c =t b -t a (1) Where, t c The pull-in time.

10. A computer storage medium, characterized in that: The computer storage medium stores a computer program, which, when executed by a processor, implements the steps of the method for evaluating the life of an overtravel and pull-in time dual-variable electrical switch as described in claims 8-9.

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