An automated testing method, device, medium and electronic device for MOCA equipment

Abstract

The present invention discloses a method, device, medium and electronic device for automatic testing of MOCA devices, which perform initialization settings on a test system when the instrument and the product are in a communication state; calculate a corresponding compensation loss value when obtaining a predetermined frequency value to be tested; perform control testing on the compensation loss value to form a special test signal value; and output the special test signal value and / or the basic test signal value. The method, device, medium and electronic device for automatic testing of MOCA devices reduce the calibration workload when there are a large number of test points, have a high degree of automation, reduce labor costs, and ensure the consistency of test results.

Description

Technical Field

[0001] The present invention relates to the technical field of automated testing, and specifically provides an automated testing method, device, medium, and electronic device for MOCA devices. Background Art

[0002] Currently, in the industry, testing tools provided by various chip manufacturers are generally used for testing. However, these testing platforms cannot meet the testing requirements of various chip manufacturers and models, have poor consistency, and involve relatively many platform installations. Although some automated testing methods have been introduced, they do not include all the test items in the MOCA technical indicators. At the same time, their automated testing methods cannot be compatible with all chip solutions. During the testing process, the test compensation loss value is often involved. Traditional loss compensation is achieved through instrument calibration. For example, to test the MOCA indicators at the following frequencies, it is necessary to calibrate the loss corresponding to each frequency on a network analyzer: 1200 MHz, 1250 MHz, 1300 MHz, 1350 MHz..., and then fill these calibration values into the corresponding positions in the configuration file, and call the compensation values one by one through the program for testing. When testing dozens or even hundreds of sets of compensation loss values, it leads to a large workload, and there are frequent operations when exporting the measurement results, which are prone to errors. Summary of the Invention

[0003] Aiming at the deficiencies of the prior art, the present invention provides an automated testing method for MOCA devices, which solves the problems of large workload and low automation degree when testing the compensation loss value of the existing automated testing method for MOCA devices.

[0004] To achieve the above objectives, the present invention is realized through the following technical solutions:

[0005] In a first aspect, an embodiment of the present invention provides an automated testing method for MOCA devices, including,

[0006] Performing initialization settings on the test system when the instrument is in communication with the product;

[0007] Calculating the corresponding compensation loss value when obtaining a predetermined frequency value to be tested;

[0008] Controlling and testing the compensation loss value to form a special test signal value;

[0009] Outputting the special test signal value and / or the basic test signal value.

[0010] Preferably, calculating the corresponding compensation loss value when obtaining a predetermined frequency value to be tested specifically includes,

[0011] Obtaining the standard compensation loss values corresponding to at least 3 frequency values to be tested under the action of a network analyzer;

[0012] Determine the function model of the standard compensation loss value according to the frequency value to be tested and the corresponding standard compensation loss value;

[0013] Calculate the compensation loss values corresponding to the remaining frequencies to be tested according to the function model of the standard compensation loss value.

[0014] Preferably, conduct a control test on the compensation loss value to form a special test signal value, specifically including obtaining the compensation loss value corresponding to the tested frequency value;

[0015] Calculate the corresponding special test signal value according to the compensation loss value corresponding to the tested frequency value, and the special test signal value includes the transmit power and the minimum receive sensitivity value;

[0016] Output the transmit power value and the minimum receive sensitivity value.

[0017] Preferably, output the special test signal value and / or the basic test signal value, specifically including,

[0018] Traverse the special test signal value and / or the basic test signal value to be output by the tree structure method in the state of establishing the corresponding new test item list;

[0019] Write the special test signal value and / or the basic test signal value to be output into the new test item list to form a first matrix;

[0020] Perform a transpose transformation on the first matrix to form a second matrix for output.

[0021] In a second aspect, an embodiment of the present invention provides a MOCA device automatic test device, including,

[0022] An initialization unit for initializing the test system in the state where the instrument communicates with the product;

[0023] A compensation unit for calculating the corresponding compensation loss value in the state of obtaining the predetermined frequency value to be tested;

[0024] A control unit for conducting a control test on the compensation loss value to form a special test signal value;

[0025] An output unit for outputting the special test signal value and / or the basic test signal value.

[0026] Preferably, the compensation module includes,

[0027] The function preprocessing module is used to obtain the standard compensation loss values corresponding to at least 3 to-be-tested frequency values under the action of a network analyzer; determine the function model of the standard compensation loss values according to the to-be-tested frequency values and the corresponding standard compensation loss values; calculate the compensation loss values corresponding to the remaining to-be-tested frequency values according to the function model of the standard compensation loss values.

[0028] In a third aspect, an embodiment of the present invention provides a computer-readable storage medium, on which a computer program is stored, and when the program is executed by a processor, the above-mentioned MOCA device automation test method is implemented.

[0029] In a fourth aspect, an embodiment of the present invention provides an electronic device, including a memory, a processor, and a computer program stored on the memory and executable on the processor. When the processor executes the computer program, the above-mentioned MOCA device automation test method in the electronic device is implemented.

[0030] The present invention has the following beneficial effects:

[0031] By collecting and calibrating a small number of characteristic frequency values, a linear regression model of line loss compensation is obtained by means of curve fitting, and the compensation loss values corresponding to the to-be-tested points are calculated, reducing the calibration workload when testing a large number of points. It has a high degree of automation, requires little manual intervention, ensures the consistency of test results, is suitable for batch testing, and reduces labor costs. By adopting the deep traversal algorithm of the tree structure, it is both flexible and time-saving. Description of the Drawings

[0032] Figure 1 It is a flowchart of a MOCA device automation test method provided by Embodiment 1 of the present invention;

[0033] Figure 2 It is a schematic diagram of the algorithm of a MOCA device automation test method provided by Embodiment 1 of the present invention;

[0034] Figure 3 It is a diagram of a MOCA device automation test device provided by Embodiment 1 of the present invention;

[0035] Figure 4 It is a schematic structural diagram of an electronic device provided by Embodiment 4 of the present invention. Detailed Embodiments

[0036] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only a part of the embodiments of the present invention, rather than all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0037] Please refer to Figure 1-2 , the present invention provides a technical solution: an automatic testing method for MOCA devices, including,

[0038] S110. Initialize the test system when the instrument and the product are in a communication state;

[0039] In this embodiment, the instrument and the product are made to communicate and initialized. Specifically, first, it is judged whether there is a folder for storing log and report files under the program root directory. If there is, it is ignored, or the files in the folder are cleared by setting parameters before each test starts. Otherwise, the log and result folders are automatically created.

[0040] S120. Calculate the corresponding compensation loss value when obtaining the predetermined frequency value to be tested;

[0041] In this embodiment, under the action of a network analyzer, the standard compensation loss values corresponding to at least 3 frequency values to be tested are obtained; the function model of the standard compensation loss value is determined according to the frequency value to be tested and the corresponding standard compensation loss value; the compensation loss values corresponding to the remaining frequency values to be tested are calculated according to the function model of the standard compensation loss value. For example, when obtaining a series of MOCA indicators corresponding to frequencies such as 400 MHz, 450 MHz... 1200 MHz, 1250 MHz, 1300 MHz, 1350 MHz... 1675 MHz, some characteristic frequency values can be selected from the beginning, middle, and end of a series of points. Assume the characteristic frequency values are x1, x2, x3... x m , calibrate the compensation loss value of the environment on the network analyzer according to the characteristic frequency values, and the compensation loss values are y1, y2, y3... y m , fill these x and y values into the line loss file in the common component module.

[0042] Using the least squares method to deduce, the model of the fitting function y = kx + b (the coefficients k and b can be obtained) can be determined. x is the frequency point to be tested, and the value of x needs to be filled in the configuration file in advance. The value of x in the configuration file is called through the code, and then y can be obtained through the algorithm. y is the compensation loss value corresponding to the frequency point, and the compensation loss value is set in the instrument control module in the control module for testing.

[0043] The principle of the least squares method involved in this embodiment is as follows,

[0044] Objective function = Σ(observed value - theoretical value)2

[0045] Observed value: multiple groups of samples

[0046] Theoretical value: fitting function

[0047] Objective function: loss function

[0048] To minimize the objective function.

[0049] The basic idea is as follows.

[0050] f(x) = a1φ1(x) + a2φ2(x) +... + a m φ m (x)

[0051] where φ k (x) is a set of linearly independent functions selected in advance, and a k are undetermined coefficients (k = 1, 2, 3... m). The goal of the least squares method is to find a set of a k such that:

[0052] (the sum of squared residuals) is minimized, that is, to find

[0053] In this embodiment, the selected characteristic frequency values and compensation loss values are calibrated on a network analyzer to form a series of paired data (x1, y1), (x2, y2)... (x m , y m ). Plot these data in the x-y rectangular coordinate system. If it is found that these points are near a straight line, the equation of this straight line can be set as:

[0054] y = kx + b (Equation 1-1)

[0055] where: k and b are arbitrary real numbers.

[0056] To establish this straight line equation, k and b need to be determined. Applying the "Principle of Least Squares", the deviation (y i -y) between the measured value y i and the calculated value (y = kx + b) using (Equation 1-1) is squared and summed [∑(y i -y) 2 and minimized as the "optimization criterion".

[0057] Let: φ = ∑(y i -y) 2 (Equation 1-2)

[0058] Substitute (Equation 1-1) into (Equation 1-2) to get:

[0059] φ = ∑(y i -b - kx i ) 2 (Equation 1-3)

[0060] When ∑(y i -y) 2When it is the smallest, the partial derivatives of \(k\) and \(b\) can be obtained using the function \(\varphi\), and these two partial derivatives are set to zero.

[0061] Two systems of equations with \(k\) and \(b\) as unknowns are obtained, and by solving these two systems of equations, we get:

[0062]

[0063] Then \(b\) can be obtained using the method of undetermined coefficients.

[0064] The coefficients \(k\) and \(b\) can be obtained, and then the fitting formula can be determined.

[0065] S130. Conduct a control test on the compensation loss value to form a special test signal value;

[0066] In this embodiment, the compensation loss value corresponding to the tested frequency value is obtained; the corresponding special test signal value is calculated according to the compensation loss value corresponding to the tested frequency value, and the special test signal value includes the transmit power and the minimum receive sensitivity value; wherein, the special test signal value also includes test items such as center frequency offset, transmit spectrum template, in-band spurious, out-of-band spurious, etc.

[0067] S140. Output the special test signal value and / or the basic test signal value.

[0068] In this embodiment, the special test signal value and / or the basic test signal value to be output are traversed by the tree structure method in the state of establishing a corresponding new test item list; wherein, the special signal value includes test items such as transmit power, minimum sensitivity value, center frequency offset, transmit spectrum template, in-band spurious, out-of-band spurious, etc., and the basic test signal value includes the IP value of MOCA itself, etc. The special test signal value and / or the basic test signal value to be output are written into the new test item list to form a first matrix; the first matrix is transposed to form a second matrix for output.

[0069] For example, before the traversal starts, open the csv file, write the title, store it, and close the file.

[0070] Before the traversal starts, create an empty list for each test item in the title. After the traversal starts, each time a traversal is performed, the data obtained from the test is written into the corresponding empty list, such as power output signal, MASK signal, in-band spurious signal, out-of-band spurious signal, and frequency offset value, etc.

[0071] After the traversal is completed, the data lists of each test item are merged into a new list list1 in the order from left to right in the title; the new list list1 is converted into a matrix matrix1; the matrix matrix1 is converted into a new matrix matrix2 through the matrix transpose algorithm.

[0072] Finally, open the csv file where the title was written before, and write the matrix matrix2 into the csv report file on a new line below it, store it, and close the file.

[0073] The advantage of this logic is that it only needs to open, write, store, and close the csv file twice, avoiding frequent operations, saving time, and reducing the probability of errors.

[0074] In this embodiment, the depth-first traversal algorithm under the tree structure is adopted. Figure 2 It is a schematic diagram of the algorithm for this tree structure.

[0075] m: mode, the root node;

[0076] m1, m2: two forms of mode. mode1&mode2 are the left subtree and the right subtree respectively;

[0077] c01, c00, c10: chain01, chain00, chain10. Three forms of chain;

[0078] f1, f2…fn: frequency1, frequency2, frequencyn;

[0079] The traversal order is: root node - left subtree - right subtree, that is, m - m1 - c01 - f1 - f2 - … fn - c00 - f1 - f2 - … fn - c10 - f1 - f2 - … fn - m2 - c01 - f1 - f2 - … fn - c00 - f1 - f2 - … fn.

[0080] There are three subtrees under m1, and the subtrees under each chain are also uncertain. Therefore, the traversal below this level cannot be called root node - left subtree - right subtree. Just for the tree itself, the order of chain can be disordered, and the order of frequency can also be disordered. So if you want to make this tree ordered, it is by the user rewriting the configuration file in the common component module. Once the mode, chain, and frequency are filled in the configuration file, it means that the elements in it are ordered, and in the logical execution, it is traversed and executed according to the ordered tree. Whether starting from m1 or m2, the time complexity of this algorithm is O(n), so the mode, chain, frequency, etc. are changed by the user to make the operation more flexible.

[0081] By collecting and calibrating a small number of characteristic frequency values, a linear regression model for line loss compensation is obtained through curve fitting, so as to calculate the compensation loss value corresponding to the point to be tested, reducing the calibration workload when testing a large number of points, and the least squares fitting method makes the data more accurate. By adopting the deep traversal algorithm of the tree structure, the traditional test process is optimized. Through matrix transformation, it only needs to open, write, store, and close the csv file twice, avoiding frequent operations.

[0082] Schematically,

[0083] Calculate the corresponding compensation loss value in the state of obtaining the predetermined frequency value to be tested. For example, assume that a series of frequencies such as 400 MHz, 450 MHz... 1200 MHz, 1250 MHz, 1300 MHz, 1350 MHz... 1675 MHz need to be tested to calculate the compensation loss value of the MOCA index. When selecting the frequency values, try to be as average as possible. Some points need to be selected as characteristic points in the low, medium, and high frequency points (the front, middle, and back of a series of frequency points to be tested) for calibrating the standard compensation loss value.

[0084] Conduct a control test on the compensation loss value to form a special test signal value. During the MOCA device test, the special test signal value is a test item existing in both TX and RX. Among them, TX belongs to the category of the signal generation unit and is used to test the quality of the signal transmitted to the device under test, including test items such as transmit power, center frequency offset, transmit spectrum template, in-band spurious, out-of-band spurious, etc. The transmit power value is the basis and prerequisite for TX testing. Only by ensuring that the transmit power is correct can it be determined that the most basic index of the TX of the device under test is normal, and then continue with other subsequent tests. Otherwise, the subsequent TX tests are meaningless.

[0085] RX belongs to the signal analysis unit and is used to analyze and test the quality of the signal received by the device under test, such as the received minimum sensitivity value, etc.

[0086] Figure 3This is a diagram of an automated test device for a MOCA device provided in Embodiment 1 of the present invention. During the testing process, the logic control unit is mainly called. In the logic control unit, the initialization unit is called to determine whether the storage folder is empty and initialize the device under test, instruments, etc. In the logic control unit, the device under test control unit is called to control the device under test to configure the basic MOCA test parameters. Then, the instrument control unit is called to configure parameters such as frequency and bandwidth. During this process, a configuration file and an instruction file are used, and the common component unit needs to be called. In the logic control unit, the compensation unit is called to compensate the compensation loss value corresponding to the frequency into the instrument. During this process, a line loss file is needed, and the common component unit needs to be called. If it is a TX test, the signal generation unit is called. If it is an RX test, the signal analysis unit is called.

[0087] Debug a suitable waveform for reading. In the logic control unit, the report generation unit is called to perform corresponding calculations using the read data, compare with the specifications in the protocol, and determine the result. Write the data and the result into the report.

[0088] For example, when testing the transmit power, the transmit power value is read 5 times. The maximum value is compared with the upper limit of the transmit power specified in the protocol, which is 7 dB, and the minimum value is compared with the lower limit of the transmit power specified in the protocol, which is -1 dB. Only when both the maximum value and the minimum value are between -1 and 7 dB is the transmit power determined to pass. The method of collecting data multiple times can not only make the test results more accurate but also better detect abnormal data.

[0089] The instrument control unit and the device under test control unit are units that control the instrument, MOCA device, and computer. The logic control unit controls the logic of the entire test system. For example, to test the transmit power value, in the logic control unit, the initialization unit is first called to perform some actions, and then the device under test control unit and the instrument control unit are called to perform some actions.

[0090] Embodiment 2

[0091] An automated test device for a MOCA device provided in an embodiment of the present invention specifically includes:

[0092] An initialization unit for performing initialization settings on the test system when the instrument and the product are in a communication state;

[0093] A compensation unit for calculating the corresponding compensation loss value when obtaining a predetermined frequency value to be tested;

[0094] A control unit for controlling the test of the compensation loss value to form a special test signal value;

[0095] An output unit for outputting a special test signal value and / or a basic test signal value.

[0096] The compensation module includes

[0097] A function preprocessing module for obtaining standard compensation loss values corresponding to at least 3 to-be-tested frequency values under the action of a network analyzer; determining a function model of the standard compensation loss value according to the to-be-tested frequency values and the corresponding standard compensation loss values; calculating compensation loss values corresponding to the remaining to-be-tested frequency values according to the function model of the standard compensation loss value.

[0098] The initialization unit initializes the test system in a state where communication is established between the instrument and the product. The compensation unit obtains a linear regression model of line loss compensation by collecting and calibrating a small number of characteristic frequency values and using curve fitting, thereby calculating the compensation loss value corresponding to the to-be-tested point, reducing the calibration workload when testing a large number of points, and the least squares fitting method makes the data more accurate. The control unit controls and tests the compensation loss value to form a special test signal value. The output unit outputs the special test signal value and / or the basic test signal value. The entire automated system uses a depth-first traversal algorithm of a tree structure to optimize the traditional test process and uses matrix transformation. The output unit only needs to open, write, store, and close the csv file twice, avoiding frequent operations.

[0099] Embodiment III

[0100] The embodiment of the present application further provides a storage medium containing computer-executable instructions, and the computer-executable instructions are used to execute when executed by a computer processor:

[0101] Initializing the test system in a state where communication is established between the instrument and the product;

[0102] Calculating the corresponding compensation loss value in a state of obtaining a predetermined to-be-tested frequency value;

[0103] Controlling and testing the compensation loss value to form a special test signal value;

[0104] Outputting the special test signal value and / or the basic test signal value.

[0105] Obtaining standard compensation loss values corresponding to at least 3 to-be-tested frequency values under the action of a network analyzer; determining a function model of the standard compensation loss value according to the to-be-tested frequency values and the corresponding standard compensation loss values; calculating compensation loss values corresponding to the remaining to-be-tested frequency values according to the function model of the standard compensation loss value.

[0106] Storage medium - Any of various types of memory devices or storage devices. The term "storage medium" is intended to include: installation media such as CD-ROMs, floppy disks or magnetic tape devices; computer system memory or random access memory such as DRAM, DDR RAM, SRAM, EDO RAM, Rambus RAM, etc.; non-volatile memory such as flash memory, magnetic media (such as hard disks or optical storage); registers or other similar types of memory elements, etc. The storage medium may also include other types of memory or combinations thereof. Additionally, the storage medium may be located in the computer system in which the program is executed, or may be located in a different second computer system that is connected to the computer system via a network (such as the Internet). The second computer system may provide program instructions to the computer for execution. The term "storage medium" may include two or more storage media that may reside in different locations (e.g., in different computer systems connected via a network). The storage medium may store program instructions (e.g., embodied as a computer program) executable by one or more processors.

[0107] Of course, for a storage medium containing computer-executable instructions provided by an embodiment of the present application, the computer-executable instructions are not limited to the MOCA device automation test method as described above, and may also perform related operations in the MOCA device automation test method provided by any embodiment of the present application.

[0108] Embodiment 4

[0109] An embodiment of the present application provides an electronic device, and the MOCA device automation test device provided by the embodiment of the present application can be integrated in the electronic device. Figure 4 It is a schematic structural diagram of an electronic device provided by Embodiment 4 of the present application. As Figure 4 shown, this embodiment provides an electronic device 400, which includes: one or more processors 420; a storage device 410 for storing one or more programs, and when the one or more programs are run by the one or more processors 420, the one or more processors 420 are caused to implement:

[0110] Performing initialization settings on the test system when the instrument is in a state of establishing communication with the product;

[0111] Calculating a corresponding compensation loss value when in a state of obtaining a predetermined frequency value to be tested;

[0112] Performing a control test on the compensation loss value to form a special test signal value;

[0113] Outputting the special test signal value and / or the basic test signal value.

[0114] Obtain standard compensation loss values corresponding to at least three frequency values to be tested under the action of a network analyzer; determine a function model of the standard compensation loss values according to the frequency values to be tested and the corresponding standard compensation loss values; calculate the compensation loss values corresponding to the remaining frequency values to be tested according to the function model of the standard compensation loss values.

[0115] As Figure 4 shown, the electronic device 400 includes a processor 420, a storage device 410, an input device 430, and an output device 440; the number of processors 420 in the electronic device can be one or more, Figure 4 and one processor 420 is taken as an example herein; the processor 420, the storage device 410, the input device 430, and the output device 440 in the electronic device can be connected through a bus or other means, Figure 4 and connection through the bus 450 is taken as an example herein.

[0116] The storage device 410, as a computer-readable storage medium, can be used to store software programs, computer-executable programs, and module units, such as program instructions corresponding to the MOCA device automation test method in the embodiments of the present application.

[0117] The storage device 410 mainly includes a storage program area and a storage data area. Among them, the storage program area can store an operating system and application programs required for at least one function; the storage data area can store data created according to the use of the terminal, etc. In addition, the storage device 410 can include a high-speed random access memory, and can also include a non-volatile memory, such as at least one magnetic disk storage device, a flash memory device, or other non-volatile solid-state storage devices. In some instances, the storage device 410 can further include a memory remotely set relative to the processor 420, and these remote memories can be connected through a network. Examples of the above network include but are not limited to the Internet, an enterprise intranet, a local area network, a mobile communication network, and combinations thereof.

[0118] The input device 430 can be used to receive input digital, character information, or voice information, and generate key signal inputs related to the user settings and function control of the electronic device. The output device 440 can include devices such as a display screen and a speaker.

[0119] Note that the above is only a preferred embodiment of the present invention and the applied technical principles. Those skilled in the art will understand that the present invention is not limited to the specific embodiments described herein, and various obvious changes, re-adjustments, and substitutions can be made by those skilled in the art without departing from the protection scope of the present invention. Therefore, although the present invention has been described in more detail through the above embodiments, the present invention is not limited to the above embodiments. Without departing from the concept of the present invention, more other equivalent embodiments can be included, and the scope of the present invention is determined by the scope of the appended claims.

Claims

1. An automated test method for a MOCA device, characterized in that including performing initialization settings on the test system when the instrument establishes communication with the product; calculating the corresponding compensation loss value when obtaining a predetermined frequency value to be tested; performing a control test on the compensation loss value to form a special test signal value; outputting the special test signal value and / or the basic test signal value, specifically including, traversing the special test signal value and / or the basic test signal value to be output by the tree structure method when establishing a corresponding new test item list; writing the special test signal value and / or the basic test signal value to be output into the new test item list to form a first matrix; performing a transpose transformation on the first matrix to form a second matrix for output.

2. The automated testing method for a MOCA device according to claim 1, characterized in that, calculating the corresponding compensation loss value when obtaining a predetermined frequency value to be tested, specifically including, obtaining the standard compensation loss values corresponding to at least 3 frequency values to be tested under the action of a network analyzer; determining the function model of the standard compensation loss value according to the frequency value to be tested and the corresponding standard compensation loss value; calculating the compensation loss values corresponding to the remaining frequency values to be tested according to the function model of the standard compensation loss value.

3. The automated test method for a MOCA device according to claim 1, characterized in that, performing a control test on the compensation loss value to form a special test signal value, specifically including, obtaining the compensation loss value corresponding to the tested frequency value; calculating the corresponding special test signal value according to the compensation loss value corresponding to the tested frequency value, and the special test signal value includes the transmit power and the received minimum sensitivity value; outputting the transmit power value and the received minimum sensitivity value.

4. An automated test device for a MOCA device, characterized in that, including an initialization unit for performing initialization settings on the test system when the instrument establishes communication with the product; a compensation unit for calculating the corresponding compensation loss value when obtaining a predetermined frequency value to be tested; a control unit for performing a control test on the compensation loss value to form a special test signal value; an output unit for outputting the special test signal value and / or the basic test signal value, specifically for, traversing the special test signal value and / or the basic test signal value to be output by the tree structure method when establishing a corresponding new test item list; writing the special test signal value and / or the basic test signal value to be output into the new test item list to form a first matrix; performing a transpose transformation on the first matrix to form a second matrix for output.

5. The automated test device for a MOCA device according to claim 4, characterized in that, The compensation module includes a function preprocessing module for obtaining the standard compensation loss values corresponding to at least 3 frequency values to be tested under the action of a network analyzer; determining the function model of the standard compensation loss value according to the frequency value to be tested and the corresponding standard compensation loss value; calculating the compensation loss values corresponding to the remaining frequency values to be tested according to the function model of the standard compensation loss value.

6. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by a processor, it implements the MOCA device automatic test method according to any one of claims 1 to 3.

7. An electronic device, comprising a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that, When the processor executes the computer program, it implements the MOCA device automatic test method according to any one of claims 1 to 3.

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