Chip tray kit and chip testing equipment

Abstract

The present invention provides a chip tray kit and a chip testing device. The chip testing device includes a chip tray kit. The chip tray kit includes a tray, a plurality of chip fixing parts and a plurality of auxiliary inserting parts. The tray has a plurality of tray through-holes. The plurality of chip fixing parts are detachably fixed on the tray, and each chip fixing part is located in each tray through-hole. Each auxiliary inserting part is detachably fixed on one side of each chip fixing part, and a part of each auxiliary inserting part is located in the fixing through-hole of each chip fixing part. Each auxiliary inserting part can limit the range of movement of a chip located in a chip containing groove of the chip fixing part.

Description

Technical Field

[0001] The present invention relates to a chip tray kit and a chip testing device, and in particular to a chip tray kit and a chip testing device suitable for performing high-frequency testing on a chip. Background Art

[0002] In common IC chip testing equipment, especially testing equipment used for high-frequency testing of IC chips, during the installation of IC chips, due to various factors, some IC chips may not be properly electrically connected to the relevant probes of the testing equipment, thereby the improperly installed IC chips cannot be properly tested.

[0003] Since the existing IC chip testing equipment basically does not check again whether the IC chips have been correctly installed in the testing equipment after installing the IC chips in the testing equipment, relevant personnel often have to wait until the entire batch of IC chips is tested before discovering that some IC chips have not been correctly tested because they were not correctly installed.

[0004] In addition, the existing tray for carrying multiple IC chips is easy to be separated from the tray due to various factors during the process of being transferred by related equipment, which causes trouble to related personnel. Summary of the invention

[0005] The invention discloses a chip tray kit and a chip testing device, which are mainly used to improve the existing IC chip testing device, in which the IC chip is easily not correctly installed in the testing device, resulting in the problem that the IC chip is not correctly tested.

[0006] One embodiment of the present invention discloses a chip tray kit, which includes: a tray having a plurality of tray through-holes, each of which is arranged through the tray; a plurality of chip fixing members, which are detachably fixed to the tray, and each chip fixing member is located in each tray through-hole; each chip fixing member includes a plurality of fixing through-holes, a plurality of accommodating grooves and a plurality of chip accommodating grooves, each fixing through-hole is arranged through the chip fixing member, each accommodating groove, each chip accommodating groove and each fixing through-hole are interconnected, each chip accommodating groove is used to accommodate a chip, each chip fixing member is also formed with at least one limiting structure in each chip accommodating groove, and the limiting structure is used to limit the range of movement of the chip arranged in the chip accommodating groove relative to the chip fixing member; a plurality of auxiliary inserts, which are detachably fixed to one side of the plurality of chip fixing members, each auxiliary insert includes: a main body, a plurality of protrusions and a plurality of insertion through-holes, a plurality of protrusions The part is formed by protruding outward from one side of the main body, and each insertion through-hole passes through the main body and a protruding part; the outer diameter of each protruding part is smaller than the aperture of each accommodating groove, and the outer diameter of each protruding part is larger than the aperture of each chip accommodating groove, and the aperture of each insertion through-hole is smaller than the aperture of each chip accommodating groove; wherein, when each auxiliary insert is fixedly arranged on one side of the chip fixing part, each protruding part is correspondingly located in the accommodating groove, and a gap is formed between each protruding part and the chip arranged in the chip accommodating groove; wherein, the chip tray kit is used to be fixedly arranged on a test machine, and the multiple chips carried by the chip tray kit can be electrically connected to the test machine, and the test machine can test the multiple chips; each insertion through-hole is used to provide a pressing member to penetrate, and a part of the pressing member passing through the insertion through-hole is used to press the surface of the chip arranged in the chip accommodating groove, so that each chip can be stably connected to the test machine.

[0007] Preferably, the chip tray kit further comprises a plurality of auxiliary fixings, each of which is detachably fixed to the tray, and a plurality of auxiliary fixings are arranged around each tray through-hole, and the plurality of auxiliary fixings are used to limit the range of motion of the chip fixings located in the plurality of tray through-holes relative to the tray.

[0008] Preferably, the chip tray kit further comprises a plurality of elastic members, and the plurality of elastic members are arranged between each chip fixing member and the side wall forming each tray through hole.

[0009] Preferably, the chip tray kit further comprises a plurality of quick-release components, and each auxiliary insert can be detachably connected to each chip fixing component through at least one set of quick-release components.

[0010] Preferably, each chip fixing part has at least one groove, and each groove is used to set a group of quick-release components. The quick-release components set in the groove include: two limit members and two elastic members, one end of each elastic member is fixed to the side wall forming the groove, and the other end of each elastic member is fixed to a limit member, and a gap is formed between the two limit members; at least two engaging members are set on one side of each auxiliary insert; the two engaging members of each auxiliary insert can engage with the two limit members of each chip fixing part.

[0011] Preferably, each auxiliary insert has at least one through hole, and when each auxiliary insert is fixedly arranged on one side of each chip fixing part, the through hole and the gap are interconnected; each gap is used to provide a push rod to pass through, and the push rod passing through the through hole can push against the two limit members, so that the two limit members no longer engage with the two engaging members.

[0012] Preferably, each limiting member has a slot, and each limiting member is divided into a pushing portion and a locking portion by the slot, and the locking portion has a locking slope; each locking member has a locking slope; when the locking slope of each locking member contacts the locking slope of each limiting member, the movable range of each locking member relative to the limiting member will be limited.

[0013] One embodiment of the present invention discloses a chip testing device, which includes: a chip tray kit, which includes: a tray, which has a plurality of tray through-holes, each of which is arranged through the tray; a plurality of chip fixing members, which are detachably fixed to the tray, and each chip fixing member is located in each tray through-hole; each chip fixing member includes a plurality of fixing through-holes, a plurality of accommodating grooves and a plurality of chip accommodating grooves, each fixing through-hole is arranged through the chip fixing member, each accommodating groove, each chip accommodating groove and each fixing through-hole are interconnected, each chip accommodating groove is used to accommodate a chip, and each chip fixing member is also located in each chip accommodating groove. At least one limiting structure is formed, and the limiting structure is used to limit the range of movement of the chip arranged in the chip receiving groove relative to the chip fixing member; a plurality of auxiliary inserts are detachably fixedly arranged on one side of the plurality of chip fixing members, and each auxiliary insert comprises: a main body, a plurality of protrusions and a plurality of insertion holes, the plurality of protrusions are formed by protruding outward from one side of the main body, and each insertion hole passes through the main body and a protrusion; the outer diameter of each protrusion is smaller than the aperture of each receiving groove, and the outer diameter of each protrusion is larger than the aperture of each chip receiving groove, and the aperture of each insertion hole is smaller than the aperture of each chip receiving groove; wherein, each When the auxiliary insert is fixedly arranged on one side of the chip fixing member, each protrusion is correspondingly located in the receiving groove, and a gap is formed between each protrusion and the chip arranged in the chip receiving groove; wherein, the chip tray kit is used to be fixedly arranged on a test machine, and the multiple chips carried by the chip tray kit can be electrically connected to the test machine, and the test machine can test the multiple chips; each insertion through-hole is used to provide a pressing piece to penetrate, and a part of the pressing piece passing through the insertion through-hole is used to press the surface of the chip arranged in the chip receiving groove, so that each chip can be stably connected to the test machine; a cover body, one of which A groove is formed in the side concave, and the cover body is used to cover one side of the tray; a plurality of pressing components are arranged on the cover body, and each pressing component is located in the groove of the cover body, and the plurality of pressing components are used to press the plurality of chips carried by the plurality of chip fixing parts of the chip tray kit; a test machine is used to be connected to the chip tray kit, the test machine is used to electrically connect the plurality of chips carried by the chip tray kit, and the test machine is used to test the plurality of chips arranged in the plurality of chip grooves; a temperature regulating device is connected to the plurality of pressing components, and the temperature regulating device is used to make the temperature of each pressing part reach a predetermined temperature.

[0014] Preferably, each pressing component includes: a base, which is fixedly set on the cover body; a pressing member, which includes a contact portion, the contact portion has a contact surface, a part of the contact portion can extend into one of the fixed through holes, and the contact surface is used to press a surface of a chip set in one of the chip receiving grooves; at least one elastic member, both ends of which are fixed to the base and the pressing member; when the pressing member presses against the surface of the chip, the elastic member will be elastically deformed, and when the pressing member no longer presses against the surface of the chip, the elastic restoring force generated by the pressure on the elastic member will cause the pressing member to return to a state where it is not pressing against the chip.

[0015] Preferably, when the cover is covered on one side of the tray, the cover, the tray, multiple chip fixings and multiple chips together form a closed space; the chip testing equipment also includes a vacuum device, which is used to extract air in the closed space to make the closed space in a negative pressure state.

[0016] Preferably, the cover body includes a main body and a conductive structure, the temperature regulating device is connected to the conductive structure, the temperature regulating device is used to increase or decrease the temperature of the conductive structure, each base is detachably fixed to the conductive structure, and the conductive structure can transfer heat energy with multiple pressing parts through multiple bases and multiple elastic parts so that the temperature of each pressing part reaches a predetermined temperature.

[0017] Preferably, each pressing assembly further comprises a heat conductive member, which is connected to the pressing member and the base, and is located between the pressing member and the base, and is used to assist in the transfer of heat energy between the pressing member and the base.

[0018] Preferably, each pressing member also includes a resting portion, and each pressing assembly also includes at least one fixed structure and at least one limiting member, the fixed structure is fixed to the base, the limiting member is detachably fixed to the fixed structure, a portion of the limiting member is used to rest against the resting portion of the pressing member, and the limiting member and the fixed structure can jointly limit the range of movement of the pressing member relative to the base; each limiting member includes an accommodating notch, and the accommodating notch is used to accommodate a portion of the contact portion.

[0019] Preferably, when the cover is covered on one side of the tray, the cover, the tray, multiple chip fixings, multiple auxiliary inserts and multiple chips together form a closed space; the chip testing equipment also includes a vacuum pumping device, which is used to extract the air in the closed space to make the closed space in a negative pressure state.

[0020] Preferably, the chip tray kit further comprises a plurality of auxiliary fixings, each of which is detachably fixed to the tray, and a plurality of auxiliary fixings are arranged around each tray through-hole, and the plurality of auxiliary fixings are used to limit the range of motion of the chip fixings located in the plurality of tray through-holes relative to the tray.

[0021] Preferably, the chip tray kit further comprises a plurality of elastic members, and the plurality of elastic members are arranged between each chip fixing member and the side wall forming each tray through hole.

[0022] Preferably, the chip tray kit further comprises a plurality of quick-release components, and each auxiliary insert can be detachably connected to each chip fixing component through at least one set of quick-release components.

[0023] Preferably, each chip fixing part has at least one groove, and each groove is used to set a group of quick-release components. The quick-release components set in the groove include: two limit members and two elastic members, one end of each elastic member is fixed to the side wall forming the groove, and the other end of each elastic member is fixed to a limit member, and a gap is formed between the two limit members; at least two engaging members are set on one side of each auxiliary insert; the two engaging members of each auxiliary insert can engage with the two limit members of each chip fixing part.

[0024] Preferably, each auxiliary insert has at least one through hole, and when each auxiliary insert is fixedly arranged on one side of each chip fixing part, the through hole and the gap are interconnected; each gap is used to provide a push rod to pass through, and the push rod passing through the through hole can push against the two limit members, so that the two limit members no longer engage with the two engaging members.

[0025] Preferably, each limiting member has a slot, and each limiting member is divided into a pushing portion and a locking portion by the slot, and the locking portion has a locking slope; each locking member has a locking slope; when the locking slope of each locking member contacts the locking slope of each limiting member, the movable range of each locking member relative to the limiting member will be limited.

[0026] In summary, the chip tray kit of the present invention and the chip tray kit included in the chip testing equipment of the present invention are mainly used to carry multiple chips, and through the setting of the auxiliary insert, the chip set in the chip fixing part will not easily leave the chip fixing part during the process of the chip tray kit being moved. BRIEF DESCRIPTION OF THE DRAWINGS

[0027] Figure 1 It is a schematic diagram of the chip testing equipment of the present invention.

[0028] Figure 2 for Figure 1 A partial enlarged schematic diagram of .

[0029] Figure 3 and Figure 4 It is a partially enlarged schematic diagram of the chip tray kit of the present invention from different viewing angles.

[0030] Figure 5 and Figure 6It is a partial exploded schematic diagram of the chip tray kit of the present invention from different viewing angles.

[0031] Figure 7 It is a partial cross-sectional exploded schematic diagram of the chip tray kit of the present invention.

[0032] Figure 8 The chip tray kit of the present invention is a partial cross-sectional schematic diagram of a chip.

[0033] Fig. 9 It is a partial exploded schematic diagram of the chip tray kit of the present invention.

[0034] Figure 10 to Figure 12 The figure is a schematic diagram of the operation of the auxiliary inserting member and the chip fixing member of the chip tray kit of the present invention being fixed to each other.

[0035] Fig.13 for Figure 1 A partial enlarged schematic diagram of .

[0036] Fig.14 It is a partial exploded schematic diagram of the pressing assembly of the present invention.

[0037] Fig.15 It is a partial cross-sectional schematic diagram of the pressing component of the present invention.

[0038] Fig.16 It is a cross-sectional schematic diagram of the cover body and the chip tray assembly of the present invention being separated from each other.

[0039] Fig.17 It is a cross-sectional schematic diagram of the combination of the cover body and the chip tray kit of the present invention.

[0040] Fig.18 for Fig.17 A partial enlarged schematic diagram of .

[0041] Fig.19 Schematic cross-sectional views of different embodiments of the pressing assembly of the present invention. DETAILED DESCRIPTION

[0042] In the following description, if it is indicated to refer to a specific figure or as shown in a specific figure, it is only used to emphasize that most of the related contents described in the subsequent description appear in the specific figure, but it does not limit the subsequent description to only refer to the specific figure.

[0043] Please also read Figures 1 to 8 The chip testing device A of the present invention is used to test a plurality of chips C (such as Figure 8The chip C referred to in the figure can be any IC chip, memory, etc. The chip testing device A comprises: a testing machine 2, a cover 3, a plurality of pressing components 4 and a temperature adjustment device 5. The testing machine 2 and the cover 3 are used to hold a chip tray kit 1 together.

[0044] like Figure 1 and Figure 2 As shown, the test machine 2 can be connected to the chip tray kit 1, and the test machine 2 is used to test multiple chips C (such as Figure 8 The test machine 2 is electrically connected to the chip C to be tested, and the test content of each chip C can be designed according to the type and demand of the actual chip C, and is not limited here. In actual application, the test machine 2 can include a machine body 21, a control module 22 and a plurality of probe seats 23. The control module 22 is arranged on the machine body 21. Each probe seat 23 includes a plurality of probes (not shown in the figure), and the plurality of probes of each probe seat 23 are used to electrically connect with the chip C to be tested. The control module 22 can execute relevant test programs to test the plurality of chips C to be tested (such as Figure 8 In practical applications, the machine body 21 may have a structure or mechanism (not shown) for fixing with the chip tray kit 1, and the machine body 21 or each probe seat 23 may have a structure or mechanism (not shown) for assisting in limiting the chip C, which is not limited here. The control module 22 may include, for example, a circuit board, a microprocessor, a control circuit, etc.

[0045] like Figure 1 , Figures 3 to 8 As shown, the chip tray kit 1 may include a tray 11 and 24 chip fixing members 12. The tray 11 includes 24 tray through-holes 111, and each tray through-hole 111 penetrates the tray 11. The number of tray through-holes 111 of the tray 11, the shape of the plurality of tray through-holes 111, the arrangement method, etc., are not limited to those shown in the figure. The number of chip fixing members 12 corresponds to the number of tray through-holes 111. Each chip fixing member 12 is detachably fixed to the tray 11, and each chip fixing member 12 is correspondingly fixed in the tray through-hole 111.

[0046] In practical applications, the chip tray kit 1 may also include a plurality of auxiliary fixings 13, a portion of the auxiliary fixings 13 may be detachably fixed (for example, with at least one screw) to one side of the tray 11, and another portion of the auxiliary fixings 13 may be detachably fixed to the other side of the tray 11. In the drawings of this embodiment, each chip fixture 12 may be fixed to the tray 11 by 10 auxiliary fixings 13, and the two opposite sides of the tray 11 are respectively provided with 4 auxiliary fixings 13 and 6 auxiliary fixings 13. With the provision of 10 auxiliary fixings 13, the chip fixture 12 will be fixed in the tray through hole 111. The appearance of the auxiliary fixings 13 and the number of auxiliary fixings 13 by which a single chip fixture 12 is fixed to the tray 11 are not limited to those shown in the drawings.

[0047] like Figures 5 to 8 As shown, each chip fixing component 12 includes 16 fixing through holes 121, 16 chip receiving grooves 122 and a plurality of limiting structures 123. The number of fixing through holes 121, chip receiving grooves 122 and limiting structures 123 included in each chip fixing component 12 is not limited to that shown in the figure. Each fixing through hole 121 is arranged through the chip fixing component 12, the chip receiving groove 122 is connected to the fixing through hole 121, and each chip receiving groove 122 is used to carry a chip C to be tested, and a plurality of electrical connection parts (not shown in the figure, such as various pins) of the chip C arranged in the chip receiving groove 122 are exposed on the chip fixing component 12, and the plurality of electrical connection parts can be connected to a plurality of probe seats 23 of the test machine 2, thereby, the test machine 2 (such as Figure 1 As shown) can be electrically connected to chip C.

[0048] The side walls forming the chip groove 122 extend in the direction of the chip groove 122 to form various limiting structures 123. The limiting structures 123 located in the same chip groove 122 are used to jointly limit the range of movement of the chip C located in the chip groove 122, so as to limit the chip C disposed in the chip groove 122 from leaving the chip groove 122. In this embodiment, the chip C disposed in the chip groove 122 is limited by four limiting structures 123 as an example, but the number, formation position, and appearance of the limiting structures 123 are not limited to those shown in the figure. Of course, the limiting structures 123 cannot prevent the electrical connection portion of the chip C disposed in the chip groove 122 from being connected to the probe seat 23 of the test machine 2.

[0049] like Figure 7As shown, in actual application, the chip fixing member 12 may further include a guiding structure 124, and the guiding structure 124 may be, for example, an inclined surface inclined toward the chip receiving groove 122. Through the design of the guiding structure 124, when the chip C is disposed in the chip receiving groove 122 through the fixing through hole 121, even if the placement position of the chip C has a slight deviation, the chip C will still be guided by the guiding structure 124 and smoothly disposed in the chip receiving groove 122.

[0050] As described above, by making the chip fixing member 12 detachably fixed to the tray 11, the user can selectively replace the chip fixing member 12 with chip receiving slots 122 and fixing holes 121 of different shapes and sizes according to the type, shape and size of the chip C to be tested.

[0051] like Figure 5 and Figure 6 As shown, in a preferred application, the chip tray kit 1 may also include a plurality of elastic members 14, one end of each elastic member 14 is fixedly disposed in a first receiving groove 1121 of the side wall 112 forming each tray through hole 111, and the other end of each elastic member 14 is correspondingly disposed in a second receiving groove 1251 of the side wall 125 of the chip fixture 12. In the embodiment where the chip fixture 12 is substantially rectangular in shape, at least one of the elastic members 14 may be disposed between each side wall 125 of the chip fixture 12 and the side wall 125 forming the tray through hole 111.

[0052] When the chip fixing member 12 is fixedly disposed in the tray through-hole 111, the plurality of elastic members 14 will be in a compressed state, and the elastic force generated by the compression of each elastic member 14 will push against the chip fixing member 12, so that the chip fixing member 12 can be firmly disposed in the tray through-hole 111. Since the plurality of elastic members 14 are disposed between the side wall 125 of the chip fixing member 12 and the side wall 112 forming the tray through-hole 111, and the plurality of auxiliary fixing members 13 are fixed to two opposite wide sides of the tray 11, when the user removes the plurality of auxiliary fixing members 13 from the tray 11, the chip fixing member 12 will continue to be disposed on the tray 11 due to the push of the plurality of elastic members 14, so that the problem of the chip fixing member 12 falling to the ground when the plurality of auxiliary fixing members 13 are detached from the tray 11 can be avoided. In addition, by providing the plurality of elastic members 14, when the chip tray kit 1 is fixed to the test machine 2 (such as Figure 1 When the chip holder 12 is on one side of the test platform 2 (as shown in FIG. 1 ), the chip holder 12 can be slightly moved relative to the tray 11, thereby making it easier for the multiple chips C carried by the chip holder 12 to contact the multiple probe seats 23 (as shown in FIG. 1 ) of the test platform 2. Figure 2 shown) are connected.

[0053] like Figure 1 , Figures 5 to 9 As shown, the chip tray kit 1 can also include 24 auxiliary inserts 15. The number of auxiliary inserts 15 corresponds to the number of chip fixtures 12, and the number of auxiliary inserts 15 is not limited to that shown in the figure. Each auxiliary insert 15 is detachably arranged on one side of each chip fixture 12.

[0054] Each auxiliary insert 15 includes a body 151 and a plurality of protrusions 152. The protrusions 152 are formed by protruding outward from one side of the body 151. The number of the protrusions 152 corresponds to the number of the fixing through holes 121 of each chip fixing member 12. The chip fixing member 12 may also be formed with a plurality of receiving grooves 126. Each receiving groove 126 is connected to each chip receiving groove 122. The aperture W1 of the receiving groove 126 is larger than the aperture W2 of the chip receiving groove 122. The receiving groove 126 is used to receive the protrusions 152 of the auxiliary insert 15.

[0055] The auxiliary insert 15 has an insertion hole 153, which passes through the body 151 and the protruding portion 152. The diameter W3 of the insertion hole 153 is larger than the contact portion 421 (eg, Fig.18 As shown in FIG. 1 and described in detail later), a portion of the contact portion 421 can pass through the insertion hole 153 and be exposed on one side of the auxiliary insert 15 (eg, Fig.18 The diameter W3 of the insertion hole 153 is smaller than the diameter W2 of the chip receiving groove 122. The height of the protrusion 152 can be substantially equal to the depth of the receiving groove 126. When the protrusion 152 is located in the receiving groove 126, the body 151 of the auxiliary insert 15 is correspondingly against the top surface 128 of the chip fixing member 12 (as shown in FIG. Figure 8 shown).

[0056] like Figure 7 and Figure 8 As shown, in order to facilitate the protrusion 152 to quickly and correctly enter the fixing through hole 121, the protrusion 152 may also include a plurality of guiding inclined surfaces 1521, and the plurality of guiding inclined surfaces 1521 are used to make it easier for the protrusion 152 to enter the fixing through hole 121. Figure 8 As shown, in actual application, when the chip receiving groove 122 is provided with a chip C, and the protrusion 152 is located in the receiving groove 126, a gap G is formed between the protrusion 152 and the surface C1 of the chip C, and the protrusion 152 does not contact the surface C1 of the chip C. When the chip fixing member 12 and the auxiliary inserting member 15 are fixedly arranged on the tray 11, the chip C arranged in the chip receiving groove 122 of the chip fixing member 12 will be restrained by the chip fixing member 12 and the auxiliary inserting member 15 at the same time, and each chip C is basically difficult to be separated from the chip fixing member 12.

[0057] The manner in which each auxiliary insert 15 is detachably disposed on one side of each chip fixture 12 is not limited here, and any manner in which each auxiliary insert 15 can be detachably disposed on each chip fixture 12 is within the scope of the implementation of this embodiment. For example, in one embodiment, each auxiliary insert 15 and each chip fixture 12 can be disposed together in the tray through hole 111 of the tray 11, and the aforementioned multiple auxiliary fixtures 13 can be used to limit the range of movement of each auxiliary insert 15 and each chip fixture 12 relative to the tray 11, that is, each auxiliary insert 15 and each chip fixture 12 are fixedly disposed in the tray through hole 111 of the tray 11 through multiple auxiliary fixtures 13.

[0058] As above, Figure 1 , Figure 5 , Figure 6 , Figures 9 to 12 As shown, in one of the preferred embodiments, the chip tray kit 1 may also include a plurality of quick-release components 16, at least one quick-release component 16 is provided between each auxiliary insert 15 and each chip fixture 12, and each auxiliary insert 15 can be quickly installed on one side of the chip fixture 12 through at least one quick-release component 16, or quickly removed from one side of the chip fixture 12. For example, each chip fixture 12 may be provided with two quick-release components 16, and each quick-release component 16 may include: two limit members 161 and two elastic members 162. The chip fixture 12 may also have a groove 127, one end of the two elastic members 162 is fixedly provided on the side wall forming the groove 127, the other end of each elastic member 162 is fixed to one of the limit members 161, and the two limit members 161 of each quick-release component 16 are provided in one of the grooves 127.

[0059] Each of the stoppers 161 can be pushed and moved in the groove 127, and correspondingly squeeze the elastic member 162 connected thereto, and the squeezed elastic member 162 can generate an elastic restoring force accordingly; when the stopper 161 is no longer pushed, the elastic restoring force generated by the pressure on the elastic member 162 will restore the stopper 161 to a position where it is not pushed. When two stoppers 161 are disposed in the groove 127, a gap P is formed between the two stoppers 161.

[0060] Each limiting member 161 may have a slot 1611, and each slot 1611 divides the limiting member 161 into a pushing portion 16A and a locking portion 16B. The pushing portion 16A has an end opposite to the elastic member 162 and has a guiding inclined surface 16A1, and the locking portion 16B has an end facing the pushing portion 16A and has a locking inclined surface 16B1.

[0061] like Fig.10 As shown, each auxiliary insert 15 may be formed with a through hole 155, and each auxiliary insert 15 is provided with two engaging members 154, the two engaging members 154 are located at both ends of the through hole 155, and each engaging member 154 is formed with an engaging inclined surface 1541 at one end opposite to the through hole 155. The through hole 155 of the auxiliary insert 15 is used to provide an insert R to extend into. The insert R is used to push against two stoppers 161 provided on the chip fixing member 12. In practical applications, the insert R can be fixed to a related mechanical arm or other equipment used to fix the auxiliary insert 15 on the chip fixing member 12.

[0062] like Figure 10 to Figure 11 As shown, the auxiliary insert 15 cooperates with the insert R, and the process of fixing it to the chip fixing member 12 can be: first, the insert R passes through the through hole 155 of the auxiliary insert 15 and enters the gap P formed between the two limit members 161. Since the outer diameter of the insert R is greater than the width of the gap P, when the insert R enters the groove 127, the insert R will push against the pushing parts 16A of the two limit members 161, and each limit member 161 will move toward the direction of the elastic member 162 accordingly, and each elastic member 162 will be elastically deformed under pressure.

[0063] As above, Fig.11 As shown in FIG. 1 , when the end of the insert R abuts against the bottom of the groove 127, each engaging member 154 will be correspondingly disposed in the engaging groove 1611 of each stopper 161, and the engaging inclined surface 1541 of each engaging member 154 is disposed facing the engaging inclined surface 16B1 of the engaging portion 16B of the adjacent stopper 161, and each engaging inclined surface 1541 does not contact the adjacent engaging inclined surface 16B1. Fig.12 As shown, when the insert R is moved out of the groove 127, the elastic restoring force generated by the pressure on the two elastic members 162 located in the groove 127 will cause the two limit members 161 to move towards each other. Finally, the engaging slope 16B1 of the engaging portion 16B of each limit member 161 will abut against the engaging slope 1541 of the adjacent engaging member 154, and the auxiliary insert 15 is thereby engaged and fixed to the chip fixing member 12.

[0064] like Fig.12 As shown, when the auxiliary insert 15 is fixed to the chip fixing member 12 through the engaging member 154 and the quick release assembly 16, the relevant mechanical arm or other mechanism can pass the insert R through the through hole 155 of the auxiliary insert 15 and enter the gap P between the two stoppers 161 to push against the two stoppers 161. At this time, the two stoppers 161 will be Fig.12 The status changes to Fig.11 state, in Fig.11In this state, the engaging bevel 16B1 of each limiting member 161 will no longer contact the engaging bevel 1541 of the adjacent engaging member 154, and the relevant mechanical arm and other mechanisms can hold the auxiliary inserter 15 and pull the auxiliary inserter 15 away from the chip fixing member 12, so that the auxiliary inserter 15 and the chip fixing member 12 are separated from each other.

[0065] like Figure 3 and Figure 5 As shown, it is worth mentioning that in the embodiment where each auxiliary insert 15 is fixed to one side of the chip fixing part 12 by a quick release assembly 16, each auxiliary insert 15 can be formed with a plurality of avoidance holes 156, and each avoidance hole 156 is used to avoid the auxiliary fixing part 13 so that the auxiliary fixing part 13 will not limit the range of movement of the auxiliary insert 15.

[0066] Please also read Figure 1 , Fig.13 and Fig.16 The cover 3 may include a body 31 and a conductive structure 32. A groove 311 is formed inwardly on one side of the body 31. The conductive structure 32 is formed on one side of the body 31 and is located in the groove 311. A plurality of pressing components 4 are disposed on the cover 3, and each pressing component 4 is located in the groove 311 of the cover 3. It should be noted that in this embodiment, Fig.16 In the embodiment, the plurality of pressing components 4 protrudes from one end of the cover body 3, but the present invention is not limited thereto. In different embodiments, the plurality of pressing components 4 may not protrude from the cover body 3, and each pressing component 4 is completely located in the receiving groove 311 of the cover body 3. In other words, the sum of the thickness of the conductive structure 32 and the height of each pressing component 4 may be greater than, equal to, or less than the depth of the receiving groove 311 of the cover body 3.

[0067] The cover 3 is used to cover one side of the tray 11. When the cover 3 is covered on one side of the tray 11, the plurality of pressing components 4 disposed on the cover 3 will press the surface C1 (such as Fig.18 In different embodiments, when the cover 3 is covered on one side of the tray 11, the plurality of pressing components 4 may not be in contact with the plurality of chips C until the closed space formed by the cover 3 and the tray 11 is evacuated, and then the plurality of pressing components 4 press against the surfaces C1 of the plurality of chips C. The size and shape of the cover 3 and the number of pressing components 4 provided on the conductive structure 32 of the cover 3 are not limited to those shown in the figure.

[0068] In practical applications, the cover 3 and the tray 11 may respectively have guide structures 33 and 113 that can engage with each other. For example, each guide structure 33 of the cover 3 may have a blind hole, and each guide structure 113 of the tray 11 may be a columnar structure. When the cover 3 is covered on one side of the tray 11, the columnar structure of the tray 11 will be correspondingly engaged in the blind hole of the cover 3. Through the design of the guide structure 33 of the cover 3 and the guide structure 113 of the tray 11, the cover 3 can be quickly and correctly covered on one side of the tray 11, and each pressing assembly 4 can be quickly and correctly located on one side of the chip C in the chip receiving groove 122. The number and appearance of the guide structures 33 of the cover 3 and the guide structures 113 of the tray 11 are not limited to those shown in the figure.

[0069] like Figures 13 to 18 As shown, each pressing assembly 4 includes: a base 41, a pressing member 42 and two elastic members 43. In this embodiment, 16 pressing assemblies 4 share the same base 41 as an example, but it is not limited to this. In different embodiments, multiple pressing assemblies 4 may not share the same base 41. The base 41 may be a conductive structure 32 that is detachably fixed to the cover body 3. In different embodiments, the base 41 may also be integrally formed with the conductive structure 32. In the embodiment where the base 41 is detachably fixed to the cover body 3, relevant personnel can easily replace and repair the pressing assembly 4.

[0070] Each pressing member 42 includes a contact portion 421 and a supporting portion 422. The contact portion 421 has a contact surface 4211. The outer diameter W4 of the contact portion 421 is smaller than the hole diameter W3 of the insertion hole 153 (eg, Figure 8 As shown), a portion of the contact portion 421 can extend into the insertion hole 153 (as shown Fig.18 The contact portion 421 is mainly used to press the surface C1 of the chip C so that the chip C can be stably connected to the test machine 2 (such as Figure 1 ) is connected, thereby preventing the chip C from contacting the probe seat 23 (as shown) during the test of the test machine 2. Figure 2 The probes are separated from each other.

[0071] The abutting portion 422 is connected to the contact portion 421, and is used to limit the movement range of the pressing member 42 relative to the auxiliary insert 15, thereby preventing the contact portion 421 from excessively pressing the chip C. Fig.18 As shown, when the cover body 3 is covered on one side of the tray 11, the abutment portion 422 of each pressing member 42 will be located on one side of the auxiliary insert 15, and the contact portion 421 of the pressing member 42 will be correspondingly located in the insertion hole 153, and the contact surface 4211 will be correspondingly located on the side of the surface C1 of the chip C.

[0072] Both ends of each elastic member 43 are fixed to the base 41 and the pressing member 42. When the contact surface 4211 of the pressing member 42 contacts the uneven surface C1 of the chip C, at least one elastic member 43 will be in a compressed state, and the elastic restoring force generated by the compression of the elastic member 43 can make the contact surface 4211 still closely contact the surface C1 of the chip C. The number of elastic members 43 included in each pressing assembly 4 is not limited to two. In different embodiments, a single pressing assembly 4 may include only one elastic member 43 or more than three elastic members 43.

[0073] like Fig.14 and Fig.15 As shown, in actual application, the elastic member 43 may be, for example, a compression spring. The pressing assembly 4 may include two compression springs (elastic members 43), and the pressing assembly 4 may also include two guide members 44 and two fixing kits 45. The abutting portion 422 of the pressing member 42 may have two first grooves 4221, and the base 41 may have two second grooves 411, each first groove 4221 is arranged facing a second groove 411, and the two ends of each compression spring are respectively engaged with the first groove 4221 and the second groove 411.

[0074] The abutting portion 422 of the pressing member 42 may also have two through holes 4222, each through hole 4222 is interconnected with each first groove 4221, two fixing kits 45 are fixedly disposed in the two through holes 4222, each fixing kit 45 has a through hole 451, one end of each guide member 44 is fixed to the base 41, and the other end of each guide member 44 passes through the through hole 451 of each fixing kit 45. When the pressing member 42 moves relative to the base 41, each fixing kit 45 can move relative to each guide member 44, and the two guide members 44 and the two fixing kits 45 can jointly limit the moving direction of the pressing member 42 relative to the base 41. Through the design of the two guide members 44 and the fixing kit 45, it is possible to effectively limit the pressing member 42 to move approximately along the axis L (such as the axis L) perpendicular to the surface of the base 41. Fig.18 As shown in the figure, when the pressing member 42 is pressed against the surface C1 of the chip C, the entire contact surface 4211 of the pressing member 42 will be in contact with the surface C1 of the chip C.

[0075] Please refer to Fig.14Each pressing assembly 4 may further include at least one fixed structure 46 and at least one stopper 47. The stopper 47 is detachably fixed to the fixed structure 46. A portion of the stopper 47 abuts against the abutting portion 422 of the pressing member 42. The stopper 47 and the fixed structure 46 can jointly limit the range of motion of the pressing member 42 relative to the base 41. For example, the base 41 may have 24 fixed structures 46, with every 4 fixed structures 46 arranged in a row on the base 41, every 6 fixed structures 46 and 2 stoppers 47 jointly limit 4 pressing members 42, and the 24 fixed structures 46 cooperate with 8 stoppers 47, so that 16 pressing members 42 are arranged on the base 41. Among them, each fixing structure 46 can have a locking hole 461, and each limiting member 47 has three through holes 471, and three screws S can cooperate with the three fixing structures 46 and the three through holes 471 of a limiting member 47, so that a single limiting member 47 and the three fixing structures 46 are fixed to each other, and the single limiting member 47 is pressed against the supporting portion 422 of the four pressing members 42.

[0076] In practical applications, the stopper 47 may further include a receiving notch 472, and the receiving notch 472 is used to receive a portion of the contact portion 421. In the drawings of this embodiment, therefore, a single stopper 47 is simultaneously against the abutting portions 422 of four stoppers 47, and therefore, the stopper 47 may have four corresponding receiving notches 472, and the four receiving notches 472 are portions of the contact portions 421 that receive the four stoppers 47. The design of the receiving notch 472 can help limit the movable direction of the pressing member 42 relative to the base 41, so that the pressing member 42 is roughly along the axis L perpendicular to the base 41 (such as Fig.18 Move in the direction shown).

[0077] In the embodiment where each pressing component 4 has a guide member 44, the limiting member 47 has at least one avoidance through hole 473. Each avoidance through hole 473 is used to provide a guide member 44 to pass through. That is, when the pressing component 42 moves toward the base 41, a portion of the guide member 44 will pass through the avoidance through hole 473. The shape of the avoidance through hole 473 is not limited to that shown in the figure.

[0078] Please also read Figure 1 , Fig.13 , Figures 16 to 18 The temperature regulating device 5 can be connected to the plurality of pressing components 4 through the cover 3, and the temperature regulating device 5 is used to make the temperature of each pressing member 42 reach a predetermined temperature. By setting the temperature regulating device 5, when the chip C set on the chip fixing member 12 is connected to the test machine 2 and the test machine 2 is tested, the pressing member 42 reaching the predetermined temperature will press against the chip C (such as Figure 8Surface C1 (as shown) Figure 8 As shown in FIG. 1 , the chip C can be tested under a predetermined temperature environment. In a preferred embodiment, the pressing member 42 can be made of a metal material with a high thermal conductivity.

[0079] In the conventional chip testing operation, multiple chips are placed in a large freezer or oven for testing. Since the temperatures of the various areas of the freezer or oven are difficult to be exactly the same, multiple chips cannot be tested at the same temperature, thus resulting in unreliable test results. In contrast, the chip testing device A of the present invention allows the contact surface 4211 of each pressing member 42 that has reached a predetermined temperature to press against the surface C1 of each chip C during the process of the chip C being tested by the test machine 2. In this way, multiple chips C will be tested at approximately the same temperature.

[0080] In practical applications, the temperature regulating device 5 can be used to make the temperature of each pressing member 42 reach a predetermined temperature in any way according to the needs, and there is no limitation here. For example, the temperature regulating device 5 can be connected to the conductive structure 32 of the cover body 3, and each base 41 is fixed to the conductive structure 32. The temperature regulating device 5 can make the temperature of the conductive structure 32 rise or fall, and the conductive structure 32 can transfer heat energy to each other with the multiple pressing members 42 through multiple bases 41 and multiple elastic members 43, so that the temperature of each pressing member 42 reaches a predetermined temperature. The conductive structure 32 referred to here refers to a structure made of a material with a high thermal conductivity. In the embodiment where the body 31 of the cover body 3 and the conductive structure 32 are integrally formed, the temperature regulating device 5 transfers heat energy to each other through the cover body 3 and the multiple pressing components 4. In the embodiment where the conductive structure 32 and the body 31 of the cover body 3 are not integrally formed, the temperature regulating device 5 can be directly connected to the conductive structure 32.

[0081] In one embodiment, the conductive structure 32 may include at least one flow channel (not shown), and the temperature regulating device 5 may provide a fluid to the flow channel to increase or decrease the temperature of the conductive structure 32. The fluid may be, for example, various high-temperature fluids or low-temperature fluids. In one embodiment, the temperature regulating device 5 may include a temperature controller (not shown) and a heating coil (not shown), the temperature controller is electrically connected to the heating coil, the heating coil is disposed in the conductive structure 32, and the temperature controller can activate the heating coil to increase the temperature of the conductive structure 32. In the embodiment where the temperature regulating device 5 includes the temperature controller, the temperature regulating device 5 may also include a cooling chip (not shown), the temperature controller is electrically connected to the cooling chip, the cooling chip is disposed in the conductive structure 32, and the temperature controller can activate the cooling chip to decrease the temperature of the conductive structure 32. In practical applications, the conductive structure 32 may also be provided with a cooling chip and a heating coil at the same time, which is not limited here.

[0082] like Fig.14 As shown, in order to make the temperature of the pressing member 42 reach the predetermined temperature more easily, each pressing assembly 4 may further include a heat conducting member 48. The heat conducting member 48 is located between the pressing member 42 and the base 41, and the heat conducting member 48 is connected to the pressing member 42 and the base 41, and the heat conducting member 48 is used to assist the heat energy between the pressing member 42 and the base 41 to be transferred to each other. The heat conducting member 48 may, for example, include two elastic arms 481, one end of which is connected to each other. When the pressing member 42 moves toward the base 41, the two elastic arms 481 will be elastically deformed by the pressing member 42, and when the pressing member 42 moves away from the base 41, the elastic restoring force generated by the compression of the elastic arms 481 will restore the elastic arms 481 to a non-pressed state, so that no matter when the pressing member 42 is stationary or moves relative to the base 41, the heat energy between the pressing member 42 and the conductive structure 32 can be well transferred to each other through the heat conducting member 48. It is worth mentioning that the guide member 44 and the fixing assembly 45 may also be made of materials with high thermal conductivity, and the guide member 44 and the fixing assembly 45 may also be used to conduct heat energy between the pressing member 42 , the base 41 and the conducting structure 32 .

[0083] Please also read Figure 1 , Figures 16 to 19 In practical applications, the chip testing device A may also include a vacuum device 6, a mobile device 7, and a processing device 8. The processing device 8 is electrically connected to the test machine 2, the vacuum device 6, and the mobile device 7, and the processing device 8 can control the operation of the test machine 2, the vacuum device 6, and the mobile device 7. The processing device 8 is, for example, various computers, various servers, etc.

[0084] The moving device 7 is connected to the cover 3, and the moving device 7 can drive the cover 3 to move closer to or away from the tray 11. The moving device 7 referred to here is mainly used to make the cover 3 and the tray 11 approach each other or move away from each other. Therefore, in different embodiments, the moving device 7 can also be connected to the tray 11, and the moving device 7 drives the tray 11 to move closer to or away from the cover 3.

[0085] When the moving device 7 drives the cover 3 to move toward the tray 11, and the cover 3 is covered on one side of the tray 11, and the tray 11 is fixed to the test machine 2 on the side opposite to the cover 3, the contact surface 4211 of each pressing member 42 will be pressed against the surface C1 of the chip C, and one side of the chip C is connected to the probe seat 23 of the test machine 2, and the cover 3, the chip fixing member 12, the tray 11 and the plurality of chips C will form a closed space SP together. At this time, the processing device 8 will control the vacuum device 6 to operate, so that the vacuum device 6 extracts the air in the closed space SP, so that the closed space SP presents a negative pressure state.

[0086] It is worth mentioning that the chip testing equipment A may also include at least one detector (not shown), which is electrically connected to the processing device 8. The detector is used to detect whether the cover body 3 is covered on one side of the tray 11. When the processing device 8 determines that the cover body 3 is covered on one side of the tray 11 through the detection result of the detector, the processing device 8 will control the vacuum device 6 to operate.

[0087] The design of extracting the gas in the closed space SP to the outside through the vacuum device 6 to make the closed space SP present a negative pressure state can also effectively prevent the temperature in the closed space SP from being affected by the environment outside the closed space SP, thereby effectively controlling the humidity of the closed space SP, thereby greatly reducing the problem of condensation on the surface C1 of the low chip C.

[0088] Please also read Figure 8 and Fig.18Since the aperture W3 of the insertion through hole 153 of each auxiliary insert 15 is smaller than the aperture W2 of the chip receiving groove 122, when the closed space SP is converted from the negative pressure state back to the normal pressure state and the moving device 7 moves in the direction away from the tray 11, if the chip C and the pressing member 42 are stuck, the chip C will be pushed by the end of the protrusion 152 of the auxiliary insert 15 close to the chip receiving groove 122 and separated from the contact portion 421 during the process of the contact portion 421 leaving the auxiliary insert 15 along the insertion through hole 153. In other words, by providing the auxiliary insert 15 on the tray 11 and making the aperture W3 of the insertion through hole 153 smaller than the aperture W2 of the chip receiving groove 122, it can be ensured that when the cover 3 and the plurality of pressing components 4 move in the direction away from the tray 11, the chip C will not be stuck to the contact portion 421.

[0089] The chip testing device A of the present invention may include a testing machine 2, a cover 3, a plurality of pressing components 4, a temperature adjustment device 5 and a processing device 8 when manufactured and sold, but it is not limited thereto. In different embodiments, the chip testing device A of the present invention may also include at least one of a chip tray kit 1, a vacuum device 6 and a moving device 7 when manufactured and sold. In addition, the chip tray kit 1 of the present invention may also be manufactured and sold separately.

[0090] See also Fig.19 , which shows a cross-sectional schematic diagram of different embodiments of the pressing assembly of the present invention. The biggest difference between the pressing assembly of this embodiment and the aforementioned embodiment is that: the heat conductive member 48 can be a columnar structure, one end of the heat conductive member 48 is fixed in a groove 423 of the pressing member 42, and one end of the heat conductive member 48 is movably disposed in a receiving groove 412 of the base 41, and the other end of the heat conductive member 48 is fixed to the pressing member 42. When the pressing member 42 moves relative to the base 41, the heat conductive member 48 moves in the receiving groove 412 of the base 41, and the heat conductive member 48 is in contact with the side wall forming the receiving groove 412 at any time, and the temperature regulating device 5 transfers heat energy to the pressing member 42 through the base 41 and the heat conductive member 48 which is a columnar structure.

[0091] In summary, the pressing component of the present invention can be applied to chip testing equipment, and the pressing component can press the surface of the chip being tested, so that the chip can be firmly connected to the relevant electrical connection seat during the test process; the pressing component of the present invention can also be connected to a temperature regulating device, and the temperature of the pressing member can reach a predetermined temperature, whereby the pressing member pressing on the surface of the chip being tested can make the chip be tested at a predetermined temperature. The chip testing equipment of the present invention, through the design of the pressing component and the temperature regulating device, can make the chip firmly connected to the testing machine by being pressed by the pressing member during the test of the testing machine, and the pressing member reaching the predetermined temperature can also make the chip be tested by the testing machine at the predetermined temperature; the chip testing equipment of the present invention can also have a vacuum pumping device, and through the setting of the vacuum pumping device, the chip and the pressing member reaching the predetermined temperature can be less susceptible to the external environment.

[0092] The above description is only a preferred embodiment of the present invention, and does not limit the patent scope of the present invention. Therefore, all equivalent technical changes made using the contents of the present invention description and drawings are included in the protection scope of the present invention.

Claims

1. A chip tray kit, characterized in that: The chip tray kit contains: A tray having a plurality of tray through-holes, each of the tray through-holes being arranged through the tray; A plurality of chip fixing members, which are detachably fixed to the tray, and each of the chip fixing members is located in each of the tray through holes; each of the chip fixing members comprises a plurality of fixing through holes, a plurality of accommodating grooves and a plurality of chip accommodating grooves, each of the fixing through holes is arranged through the chip fixing member, each of the accommodating grooves, each of the chip accommodating grooves and each of the fixing through holes is interconnected, each of the chip accommodating grooves is used to accommodate a chip, and each of the chip fixing members is further formed with at least one limiting structure in each of the chip accommodating grooves, and the limiting structure is used to limit the range of movement of the chip arranged in the chip accommodating groove relative to the chip fixing member; A plurality of auxiliary inserts, which are detachably fixedly arranged on one side of the plurality of chip fixing members, each of the auxiliary inserts comprises: a body, a plurality of protrusions and a plurality of insertion through holes, the plurality of protrusions are formed by protruding outward from one side of the body, and each of the insertion through holes penetrates the body and one of the protrusions; the outer diameter of each of the protrusions is smaller than the aperture of each of the accommodating grooves, and the outer diameter of each of the protrusions is larger than the aperture of each of the chip accommodating grooves, and the aperture of each of the insertion through holes is smaller than the aperture of each of the chip accommodating grooves; Wherein, when each of the auxiliary inserts is fixedly disposed on one side of the chip fixing member, each of the protrusions is correspondingly located in the accommodating groove, and a gap is formed between each of the protrusions and the chip disposed in the chip accommodating groove; Among them, the chip tray kit is used to be fixedly set on a test machine, and the multiple chips carried by the chip tray kit can be electrically connected to the test machine, and the test machine can test the multiple chips; each of the insertion holes is used to provide a pressing piece to penetrate, and a part of the pressing piece passing through the insertion hole is used to press the surface of the chip set in the chip receiving groove, so that each of the chips can be stably connected to the test machine.

2. The chip tray kit according to claim 1, characterized in that: The chip tray kit also includes a plurality of auxiliary fixing members, each of which is detachably fixed to the tray, and a plurality of the auxiliary fixing members are arranged around each of the tray through-holes, and the plurality of the auxiliary fixing members are used to limit the range of movement of the chip fixing members located in the plurality of tray through-holes relative to the tray.

3. The chip tray kit according to claim 2, characterized in that: The chip tray kit further comprises a plurality of elastic members, and the plurality of elastic members are arranged between each of the chip fixing members and the side walls forming each of the tray through holes.

4. The chip tray kit according to claim 1, characterized in that: The chip tray kit further comprises a plurality of quick-release components, and each of the auxiliary inserts can be detachably connected to each of the chip fixing components through at least one set of the quick-release components.

5. The chip tray kit according to claim 4, characterized in that: Each of the chip fixing parts has at least one groove, and each of the grooves is used to set a group of quick-release components. The quick-release components set in the grooves include: two limiting parts and two elastic parts, one end of each of the elastic parts is fixed to the side wall forming the groove, and the other end of each of the elastic parts is fixed to a limiting part, and a gap is formed between the two limiting parts; at least two engaging parts are set on one side of each of the auxiliary inserts; the two engaging parts of each of the auxiliary inserts can be engaged with the two limiting parts of each of the chip fixing parts.

6. The chip tray kit according to claim 5, characterized in that: Each of the auxiliary inserts has at least one through hole. When each of the auxiliary inserts is fixedly arranged on one side of each of the chip fixings, the through hole and the gap are interconnected. Each of the gaps is used to provide a push rod to pass through. The push rod passing through the through hole can push against the two limit members, so that the two limit members are no longer engaged with the two engaging members.

7. The chip tray kit according to claim 6, characterized in that: Each of the limiting members has a slot, and each of the limiting members is divided into a pushing portion and a locking portion by the slot, and the locking portion has a locking slope; each of the locking members has a locking slope; when the locking slopes of each of the locking members contact the locking slopes of each of the limiting members, the range of movement of each of the locking members relative to the limiting members will be limited.

8. A chip testing device, characterized in that: The chip testing equipment comprises: A chip tray kit comprising: A tray having a plurality of tray through-holes, each of the tray through-holes being arranged through the tray; A plurality of chip fixing members, which are detachably fixed to the tray, and each of the chip fixing members is located in each of the tray through holes; each of the chip fixing members comprises a plurality of fixing through holes, a plurality of accommodating grooves and a plurality of chip accommodating grooves, each of the fixing through holes is arranged through the chip fixing member, each of the accommodating grooves, each of the chip accommodating grooves and each of the fixing through holes is interconnected, each of the chip accommodating grooves is used to accommodate a chip, and each of the chip fixing members is further formed with at least one limiting structure in each of the chip accommodating grooves, and the limiting structure is used to limit the range of movement of the chip arranged in the chip accommodating groove relative to the chip fixing member; A plurality of auxiliary inserts, which are detachably fixedly arranged on one side of the plurality of chip fixing members, each of the auxiliary inserts comprises: a body, a plurality of protrusions and a plurality of insertion through holes, the plurality of protrusions are formed by protruding outward from one side of the body, and each of the insertion through holes penetrates the body and one of the protrusions; the outer diameter of each of the protrusions is smaller than the aperture of each of the accommodating grooves, and the outer diameter of each of the protrusions is larger than the aperture of each of the chip accommodating grooves, and the aperture of each of the insertion through holes is smaller than the aperture of each of the chip accommodating grooves; Wherein, when each of the auxiliary inserts is fixedly disposed on one side of the chip fixing member, each of the protrusions is correspondingly located in the accommodating groove, and a gap is formed between each of the protrusions and the chip disposed in the chip accommodating groove; The chip tray kit is used to be fixedly arranged on a test machine, and the multiple chips carried by the chip tray kit can be electrically connected to the test machine, and the test machine can test the multiple chips; each of the insertion holes is used to provide a pressing member to penetrate, and a part of the pressing member passing through the insertion hole is used to press the surface of the chip arranged in the chip receiving groove, so that each of the chips can be stably connected to the test machine; A cover body, one side of which is concave to form a receiving groove, and the cover body is used to cover one side of the tray; A plurality of pressing components, which are disposed on the cover body, and each of the pressing components is located in the receiving groove of the cover body, and the plurality of pressing components are used to press the plurality of chips carried by the plurality of chip fixing members of the chip tray kit; a test machine connected to the chip tray kit, the test machine being electrically connected to the plurality of chips carried by the chip tray kit, and the test machine being used to test the plurality of chips disposed in the plurality of chip receiving slots; and A temperature regulating device is connected to the plurality of pressing components, and the temperature regulating device is used to make the temperature of each pressing component reach a predetermined temperature.

9. The chip testing device according to claim 8, characterized in that: Each of the pressing components comprises: A base, which is used to be fixedly mounted on the cover; A pressing member, comprising a contact portion, the contact portion having a contact surface, a portion of the contact portion being able to extend into one of the fixing through holes, and the contact surface being used to press a surface of the chip disposed in one of the chip receiving grooves; At least one elastic member has its two ends fixed to the base and the pressing member; when the pressing member presses against the surface of the chip, the elastic member will be elastically deformed, and when the pressing member no longer presses against the surface of the chip, the elastic restoring force generated by the pressure on the elastic member will restore the pressing member to a state where it is not pressing against the chip.

10. The chip testing device according to claim 9, characterized in that: When the cover is covered on one side of the tray, the cover, the tray, the plurality of chip fixing parts and the plurality of chips together form a closed space; the chip testing equipment further comprises a vacuum pumping device, which is used to extract the air in the closed space so that the closed space is in a negative pressure state.

11. The chip testing device according to claim 9, characterized in that: The cover body includes a main body and a conductive structure. The temperature regulating device is connected to the conductive structure. The temperature regulating device is used to increase or decrease the temperature of the conductive structure. Each of the bases is detachably fixed to the conductive structure. The conductive structure can transfer heat energy with the plurality of pressing members through the plurality of bases and the plurality of elastic members so that the temperature of each of the pressing members reaches the predetermined temperature.

12. The chip testing device according to claim 9, characterized in that: Each of the pressing components also includes a heat conductive member, which is connected to the pressing component and the base, and is located between the pressing component and the base, and is used to assist in the mutual transfer of heat energy between the pressing component and the base.

13. The chip testing device according to claim 9, characterized in that: Each of the pressing members also includes a resting portion, and each of the pressing assemblies also includes at least one fixed structure and at least one limiting member, wherein the fixed structure is fixed to the base, and the limiting member is detachably fixed to the fixed structure, and a portion of the limiting member is used to rest against the resting portion of the pressing member, and the limiting member and the fixed structure can jointly limit the range of movement of the pressing member relative to the base; each of the limiting members includes an accommodating notch, and the accommodating notch is used to accommodate a portion of the contact portion.

14. The chip testing device according to claim 8, characterized in that: When the cover is covered on one side of the tray, the cover, the tray, the plurality of chip fixings, the plurality of auxiliary inserts and the plurality of chips together form a closed space; the chip testing equipment also includes a vacuum pumping device, which is used to extract the air in the closed space to make the closed space in a negative pressure state.

15. The chip testing device according to claim 8, characterized in that: The chip tray kit also includes a plurality of auxiliary fixing members, each of which is detachably fixed to the tray, and a plurality of auxiliary fixing members are arranged around each of the tray through-holes, and the plurality of auxiliary fixing members are used to limit the range of movement of the chip fixing members located in the plurality of tray through-holes relative to the tray.

16. The chip testing device according to claim 8, characterized in that: The chip tray kit further comprises a plurality of elastic members, and the plurality of elastic members are arranged between each of the chip fixing members and the side walls forming each of the tray through holes.

17. The chip testing device according to claim 8, characterized in that: The chip tray kit further comprises a plurality of quick-release components, and each of the auxiliary inserts can be detachably connected to each of the chip fixing components through at least one set of the quick-release components.

18. The chip testing device according to claim 17, characterized in that: Each of the chip fixing parts has at least one groove, and each of the grooves is used to set a group of quick-release components. The quick-release components set in the grooves include: two limiting parts and two elastic parts, one end of each of the elastic parts is fixed to the side wall forming the groove, and the other end of each of the elastic parts is fixed to a limiting part, and a gap is formed between the two limiting parts; at least two engaging parts are set on one side of each of the auxiliary inserts; the two engaging parts of each of the auxiliary inserts can be engaged with the two limiting parts of each of the chip fixing parts.

19. The chip testing device according to claim 18, characterized in that: Each of the auxiliary inserts has at least one through hole. When each of the auxiliary inserts is fixedly arranged on one side of each of the chip fixings, the through hole and the gap are interconnected. Each of the gaps is used to provide a push rod to pass through. The push rod passing through the through hole can push against the two limit members, so that the two limit members are no longer engaged with the two engaging members.

20. The chip testing device according to claim 19, characterized in that: Each of the limiting members has a slot, and each of the limiting members is divided into a pushing portion and a locking portion by the slot, and the locking portion has a locking slope; each of the locking members has a locking slope; when the locking slopes of each of the locking members contact the locking slopes of each of the limiting members, the range of movement of each of the locking members relative to the limiting members will be limited.

Images