The utility model provides an electrical parameter measuring circuit, an electrical parameter measuring unit comprises a plurality of
signal driving ends and a plurality of
voltage output ends, each
signal driving end corresponds to one
voltage output end, and the measuring
signal output end of each analog switch is correspondingly connected with one signal driving end; each sampling output end of the
multiplexer is connected with the input end of the
signal conditioning unit, and the
voltage input end corresponding to the sampling output end is connected with one voltage output end in the electrical parameter measuring unit; the input end of the analog-to-
digital conversion unit is connected with the output end of the
signal conditioning unit, and the output end of the analog-to-
digital conversion unit is connected with the input end of the main controller. In the scheme, a discrete scheme is replaced by the
chip for measuring the electrical parameters, a
single chip realizes the functions of voltage and current conversion and amplification, digital-to-analog conversion, clamping, calibration and the like, and an external analog switch circuit is matched to realize single-board multi-channel test, so that the reliability of
chip test is improved, and the
test efficiency is improved. And the board occupation area is reduced.