Automatic chip testing method

A chip testing and chip technology, which is applied in the field of FPGA development and mutual cooperation to realize chip automatic testing, can solve the problems of increasing system reliability, stability, duplication of labor efficiency, and high testing efficiency, so as to save testing time, reduce personnel participation, The effect of high test efficiency

Inactive Publication Date: 2015-10-28
CHIPSEA TECH SHENZHEN CO LTD
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  • Abstract
  • Description
  • Claims
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Problems solved by technology

[0005] Another object of the present invention is to provide an automatic chip testing method, which can quickly test the chip, has high testing efficiency, solves the problems of repetitive labor and low efficiency of personnel; and increases the reliability, stability and saving of the system. hardware cost

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  • Automatic chip testing method
  • Automatic chip testing method
  • Automatic chip testing method

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Embodiment Construction

[0033] In order to make the object, technical solution and advantages of the present invention more clear, the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, not to limit the present invention.

[0034] The hardware system composition of the automatic chip testing method realized by the present invention is divided into instrument and equipment drive part, PC, command analysis control execution information reporting and test item function configuration part, single board system, wherein the hardware is to utilize the existing hardware The facilities are completed, the following is a brief introduction as follows:

[0035] 1. Instrument and device driver, as attached figure 1 As shown, the main completion:

[0036] (1) Communication interface The communication module uses windows api to...

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Abstract

The invention discloses a automatic chip testing method, which is characterized by comprising the steps that: the system is powered on, and initialization is completed; the configuration is carried out, a test thread needs to be started is determined according to chip types, and an instrument transceiving end is configured; a test command is generated, test items and test parameter setting in a chip integrated test case configuration file are read and analyzed, and a command frame is generated and transmitted to a single-board system through a communication interface; and the command is analyzed, and setting and testing steps are carried out. The automatic chip testing method can achieve the automatical test and data storage of chips, can be used for testing the chips quickly, is high in test efficiency, saves test time to a certain extent, can achieve the purposes of automatic configuration of a tested DUT chip, automatic configuration of instruments, automatic recovery of test results and automatic generation of test reports, automatic generation of test case reports and automatic switching of test cases through the development of an automatic chip testing platform.

Description

technical field [0001] The invention belongs to the technical field of chips, and in particular relates to a chip automatic testing method realized by utilizing a linux operating system and an FPGA embedded with an ARM processor hard core to cooperate with each other. Background technique [0002] At present, most of the chip testing equipment is developed by low-speed single-chip microcomputer and implemented in a bare-metal mode without an operating system. The versatility is poor. High-speed communication requires an external dedicated chip and the communication stability is poor. There are low communication rates between the chip testing equipment and the computer. High hardware cost, single development model and other bottlenecks, and PC software development is limited by the API functions provided by the manufacturer, with poor operability and portability; chip testing efficiency is very low, and it takes several hours for long-term testing for high and low temperature,...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28
Inventor 庞新洁
Owner CHIPSEA TECH SHENZHEN CO LTD
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