527results about How to "Improve test quality" patented technology

The invention provides a method for automatically testing embedded software, and aims to provide a method which is not separated in design and execution and is capable of improving the testing efficiency and the testing quality of the embedded software. The method is realized through the following technical schemes of integrating interface design, test planning, test design, test execution, defect management and regression test in a unified platform for management by adopting software engineering; allocating the grades between a data element and a data block according to difference of items, and designing an interface control file; establishing a test cross-linking environment diagram, formulating test types, and designing test items or test sub-items, the name of test cases and the description of test cases; designing independent test cases, forming a scene/business flow test case by linking the independent test cases together through a flow diagram, and saving data of the test design in a database; jointly forming a test platform by enabling the test execution to be combined with the test environment diagram, the test cases and an interface route; automatically recording a test result by a system.

The invention provides an application program testing method and system based on service process control. According to the method, distribution type automated testing is conducted on application programs through the steps of defining a test case, obtaining automatic testing script, setting up a corresponding relation, defining the testing process, defining the test plan and executing the test task. Correspondingly, the invention provides a system. The system comprises a data storage unit, a process management unit, a task establishing unit, a task executing unit and the like. The method and system are designed for the highly-procedural application programs and are the method and system based on the testing process control. According to the application program testing method and system based on service process control, the testing coverage rate can be effectively improved, the testing quality is improved, the testing cost is reduced, the staff efficiency is improved, the environment maintaining cost is reduced, and the time spent on traditional automated testing is shortened.

The invention provides an automatic interface test system, which comprises an interface code acquisition unit used for acquiring the codes of tested interface programs; an interface element information read unit used for reading interface element information including interface element names, interface element types and service function requirement information from the codes of the tested interface programs; a test case generation unit used for generating interface test cases according to the business function requirement information; a test case execution unit used for running the test cases and responding to the functional requirements in the running of the test cases as well as acquiring the responding results of the functional requirements; a test result output unit used for acquiring expected verification results of the test cases from the running test cases, comparing the responding results of the functional requirements with the expected verification results for uniformity, and outputting uniform or nonuniform test results. The test efficiency of the automatic interface test system is significantly improved by comparing the test with the automatic interface test system with manual test.

The invention discloses an automatic test system for a digital integrated circuit. The automatic test system is composed of a tested chip, a test interface board, an integration module, a test module, a control module, a display module and an upper computer. The control module is connected with the upper computer. The test module is connected with the control module. A base pin of the tested chip is connected with the test interface board which is connected with the test module. The integration module is connected with the test module and the upper computer. The display module is connected with the control module and displays a waveform after final comparison by the aid of upper computer software, so that the automatic test for functions and performance of the chip is completed. The automatic test system is low in cost, easy to implement under laboratory conditions, easy and convenient to operate, high in development rate and capable of meeting the test requirements of small-batch products. According to the system, through an automatic test, the problem that operation is complex due to the fact that the number of test items is large in a manual test is solved, the test efficiency is enhanced, a misjudgment caused by artificial factors in the manual test is avoided, and therefore test quality is improved.

This invention discloses an automatic testing method for system product including picking up various parameters set for test instruments, designing a database for maintaining text examples designing a test parameter entry interface recording and editing a test general script to replay the test process. The method is to mask the test examples with parameters necessary for apparatus in testing, utilizing database for storage and management, generalizing the written of script for operating equipment, separating operation with data, providing a graphic interface tool based on the instrument, utilizing capture/ replay test method to create and rectify the test examples and increase test effect.

The present invention provides a semiconductor integrated circuit capable of testing a high-speed memory at the actual operation speed of the memory even when the operation speed of the BIST circuit of the integrated circuit is restricted.

In order to test a memory operating on a first clock, the integrated circuit is provided with a first test pattern generation section, operating on a second clock, for generating test data, and a second test pattern generation section, operating on a third clock, the inverted clock of the second clock, for generating test data. Furthermore, the integrated circuit is provided with a test data selection section for selectively outputting either the test data output from the first test pattern generation section or the test data output from the second test pattern generation section depending on the signal value of the second clock, thereby inputting the test data to the memory as test data. The frequency of the second clock is half the frequency of the first clock.

A probe for high frequency signal transmission includes a metal pin, and a metal line spacedly arranged on and electrically insulated from the metal pin and electrically connected to grounding potential so as to maintain the characteristic impedance of the probe upon transmitting high frequency signal. The maximum diameter of the probe is substantially equal to or smaller than two times of the diameter of the metal pin. Under this circumstance, a big amount of probes can be installed in a probe card for probing a big amount of electronic devices, so that a wafer-level electronic test can be achieved efficiently and rapidly.

The invention is applied in the field of test technology and provides a method and a system for controlling a power supply test and a power supply test method. The method comprises the following steps of: reading preconfigured power supply test process information which comprises power supply test standard parameters and power supply test item information; according to the power supply test item information, sending a power supply test item testing command to power supply test auxiliary equipment and controlling the power supply test auxiliary equipment to test all parameters of a power supply to be tested; receiving test result parameters fed back by the power supply test auxiliary equipment; comparing the test result parameters which are fed back by the power supply test auxiliary equipment with the power supply test standard parameters and judging whether power supply test items pass the test or not; and when the power supply test items pass the test, generating and storing a test report. The method and the system for controlling the power supply test and the power supply test method perfect the conventional power supply test process, reduce the test leakage and the wrong judgment and improve the test quality and efficiency.

The invention relates to automatic test control system and method in the production of a POS machine, which belongs to the technical field of computer tests, reduces the human misjudgment rate of a function test, enhances the test speed and ensures the test quality. The automatic test control system in the production of the POS machine comprises a tooling test jig, an automatic test control circuit and corresponding control software, wherein the tooling test jig is provided with an automatic test control circuit board and a device elastically connected with a tested single board; and the tooling test jig is also provided with a device used for controlling the electrification of the tested single board and the automatic test control circuit so as to supply electricity for the tested single board and the automatic test control circuit. The invention also provides the automatic test method in the production of the POS machine. The invention is mainly suitable for the function test in the production of the POS machine.

The disclosed testing tool for program-controlled exchange device comprises: a speech card calling platform, a testing tool platform, a speech card paralleled last two platforms, and the communication network. This invention can test the whole process of using speech card, catches the interaction between the analog user and objective program-controlled exchange device, records testing script, edits and tests the script for testing. This invention needs no people anticipating, improves regression testing accuracy, and has wide application for program-controlled exchange device.

The invention provides a unit test system which comprises a server end device and a client end device, wherein the server end device is connected with the client end device by a computer network; the server end device is used for generating and storing a test specification document, a test case template and a test event foundation library for calling the client end device; an event in the test event foundation library contains different information which is relevant to the test case executing condition in a packaging way, and the information is supplied to the client end device when the event is triggered; and the client end device is used for presenting the test specification document and the test case template for a user, compiling the test case document generated on the basis of the test case template by the user into a dynamic link library file and automatically filling a test result back to the corresponding position of the matched test case document by using a preset parameter as an index value. The system can realize accurate, rapid and high-quality unit test and prevent the influence of bug of a Visual Studio development environment on test case compiling.

The invention discloses a multi-point accessed interface test method and test system for testing a to-be-tested system including a plurality of interfaces. The test system comprises a plurality of interface test modules, a test data storage module, and a central control module connected with the plurality of interface test module and the test data storage module. Firstly, the plurality of interfaces of a system to be tested is determined, and the test system is accessed to the plurality of interfaces to be tested. Then, a portion of the plurality of interfaces to be tested is selected as the input sources, and the test system transmits test data to other interfaces through the selected input source interfaces. Finally, the test system collects the data of the plurality of interfaces to be tested responding to the test data, and analyzes the collected response data to obtain the test result. The invention can test a plurality of interfaces once, and can discover the data treatment fault existing in different interfaces and the matching problem between the interfaces rapidly and on a real-time basis, thereby improving the test efficiency.

The invention discloses a model-based automated test method for a spacecraft system and belongs to the field of system testing. The method comprises the steps of firstly building a window tree model of a tested spacecraft system through a formalization method, classifying behavior states of the tested spacecraft system during operation according to business processes, and constructing a system behavior state transition diagram; secondly traversing a window tree to generate a test case set, running the test case set in a tested spacecraft digital model and validation prototype system, setting tracking points, obtaining system behavior states and recording a state transition sequence; and finally checking whether the obtained state transition sequence obeys a state transition rule or not through a model detection algorithm, thereby automatically validating overall design of the tested spacecraft system and interface design among modules. According to the method, the test cost of the spacecraft system and the whole research and development cycle of the spacecraft system are reduced and shortened by adopting a model-based test technology; and the quality and accuracy of spacecraft system testing are improved by adopting the formalization method and the model detection algorithm.

The invention discloses a method for testing the performance of a vibrating motor. The method comprises the following steps: driving the vibrating motor to vibrate at various frequencies in a specified frequency band; acquiring vibrating amplitudes of the vibrating motor at various frequencies, and selecting the frequency corresponding to the maximal vibrating amplitude as the resonant frequency of the vibrating motor; driving the vibrating motor to the resonant frequency, and testing the performance of the vibrating motor. The situation of a relatively big measurement data error caused by low work efficiency and a relatively big error in case of regulating the driving frequency of the vibrating motor artificially is avoided; the vibrating motor is driven to reach the resonant frequency quickly and accurately, so that human resources are saved, and the testing quality and the efficiency are improved. The invention also provides a system and a single chip microcomputer for testing the performance of the vibrating motor, which have above beneficial effects.

A probe card is provided. The probe card detaches or separates a probe assembly and a test signal generator which generates test signals from the tester and the printed circuit board, so as to form a probe system module. The probe system module is secured into a probe card module by one or more securing unit. The probe card module includes the printed circuit board. Control signals from the tester are wirelessly transmitted to the probe system module and drive the probe system module to generate the corresponding test signals. Therefore, the loss or distortion of the test signals due to having longer transmitting distances will be reduced and thus the test quality can be improved.

A high-frequency probe card includes a circuit board having signal circuits and grounding circuits, transmission lines each having a bi-wire structure including a first lead wire for transmitting high-frequency signal and a second lead wire connected to the grounding circuits, and signal probes. High-frequency test signal provided by a test machine to the signal circuits can be transmitted to the signal probes through the first lead wires. Since the grounding circuits and second lead wires are provided adjacent to the signal circuits and first lead wires respectively, the high-frequency signal can be efficiently transmitted and the characteristic impedance matching can be maintained during high-frequency signal transmission. The bi-wire structure of the transmission lines has a diameter equal to or less than 1 millimeter, thereby allowing installation of a big number of the transmission lines such that the high-frequency test for a big number of electronic elements can be realized.

The invention discloses a rapid configuration and test method for a programmable logic device in system programming. According to the method, ISP (in-system programmable) state machine configuration codes are acquired by one-time programming and four-time transcoding. The rapid configuration and test method includes the steps of conducting test configuration program development in a corresponding development environment of the programmable logic device to acquire original configuration codes; converting the original configuration codes into an SVF (serial vector format) file through a conversion tool; converting the SVF file into a PCF (portable compiled format) file; generating an ATP file by a C-language transcoding program; converting the ATP file into a Pattern file, and using an ATE (automatic test equipment) automatic test system for rapid configuration and test. The rapid configuration and test method for the programmable logic device in system programming has the advantages that the ISP state machine configuration codes can be generated automatically, and multi-time configuration and test operation can be conducted, so that test fault coverage rate is increased greatly, and the test problem of the programmable logic device is solved; the rapid configuration and test method is universal.