The application provides a multifunctional test
chip and method based on a PXI architecture, and relates to the technical field of test chips; the
chip comprises a
bus interface, a
functional module group and an address controller; the
bus interface interacts with an upper computer through a PXI
bus; the
functional module group comprises pulse sending, detection, analog quantity acquisition / output,
serial communication, a storage controller and a temperature acquisition module, and can realize pulse
signal transceiving, analog quantity
processing,
serial communication, data storage and temperature acquisition; the address controller divides an
address space into eight subspaces, and precise control is realized. The control method comprises the steps of initializing an interface circuit, executing pulse sending and detection, analog quantity output and acquisition,
EEPROM operation, UART communication and temperature acquisition and the like. The application integrates special modules, replaces traditional
FPGA design, improves performance and reliability, reduces resource waste, reduces cost, shortens the development cycle, and is suitable for complex test scenes such as
spaceflight measurement and control.