Display substrate, detection method thereof and display device

By setting multiple conductive coils on the display substrate and using resistance changes to detect substrate cracks, the problem of difficult detection of edge cracks in OLED display substrates has been solved, thus improving the yield of display products.

CN114497152BActive Publication Date: 2026-02-03BOE TECHNOLOGY GROUP CO LTD +1
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Patent Information

Application Number
CN202210064827.3
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-01-20
Publication Date
2026-02-03
Estimated Expiration
2042-01-20

AI Technical Summary

Technical Problem

Cracks are prone to appear on the edges of OLED display substrates, resulting in black spots or defects at the edges or holes of the display products. Existing technologies make it difficult to effectively detect these cracks.

Method used

Multiple conductive coils are placed on the display substrate. The two ends of the conductive coils are connected to detection terminals. The change in resistance is used to determine whether the coil is broken, thereby detecting whether the substrate has cracks.

Benefits of technology

The increased detection range and accuracy enable effective detection of cracks in multiple locations on the display substrate, thereby improving the yield of display products.

✦ Generated by Eureka AI based on patent content.

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Abstract

The application provides a display substrate, a detection method thereof and a display device, and belongs to the technical field of display. The display substrate comprises: at least two turns of conductive coils surrounding a preset area of the display substrate; a first detection terminal and a second detection terminal; a switch control unit configured to control a first end of the conductive coil to be disconnected or connected with the first detection terminal, and control a second end of the conductive coil to be disconnected or connected with the second detection terminal; and a detection unit configured to determine whether the conductive coil is broken according to the resistance between the first detection terminal and the second detection terminal. The technical scheme of the application can effectively detect whether the display substrate is cracked.
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Description

Technical Field

[0001] This invention relates to the field of display technology, and in particular to a display substrate, its testing method, and a display device. Background Technology

[0002] OLED (Organic Light-Emitting Diode) display devices have been listed as a promising next-generation display technology due to their advantages such as being thin, light, having a wide viewing angle, being actively emitting light, having continuously adjustable emission colors, having low cost, fast response speed, low energy consumption, low driving voltage, wide operating temperature range, simple manufacturing process, high luminous efficiency, and being flexible in display.

[0003] However, due to process and material reasons, cracks are prone to appear on the edges of OLED display substrates, which eventually leads to black spots or defects on the edges or holes of the display products. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a display substrate and its detection method and display device, which can effectively detect whether cracks appear in the display substrate.

[0005] To address the aforementioned technical problems, embodiments of the present invention provide the following technical solutions:

[0006] On one hand, a display substrate is provided, comprising:

[0007] At least two turns of conductive coils surrounding a predetermined area of ​​the display substrate;

[0008] First detection terminal and second detection terminal;

[0009] A switch control unit is used to control the first end of the conductive coil to disconnect or connect with the first detection terminal, and to control the second end of the conductive coil to disconnect or connect with the second detection terminal;

[0010] The detection unit is used to determine whether the conductive coil is broken based on the resistance between the first detection terminal and the second detection terminal.

[0011] In some embodiments, the at least two turns of conductive coil include:

[0012] A first conductive coil and a second conductive coil surround the display area of ​​the display substrate, wherein the first conductive coil surrounds the second conductive coil.

[0013] In some embodiments, the display substrate comprises a display functional layer, an encapsulation layer, and a touch functional layer sequentially located on a substrate.

[0014] The first conductive coil is located between the display functional layer and the encapsulation layer;

[0015] The second conductive coil is located on the side of the touch function layer away from the substrate.

[0016] In some embodiments, the at least two turns of conductive coil further include:

[0017] A third conductive coil surrounding the trace area of ​​the display substrate.

[0018] In some embodiments, the switch control unit includes a control module corresponding to each of the conductive coils, the control module comprising:

[0019] A first switching transistor and / or a second switching transistor, wherein the first terminal of the first switching transistor is connected to the first end of the conductive coil, and the second terminal of the first switching transistor is connected to the first detection terminal; the first terminal of the second switching transistor is connected to the second end of the conductive coil, and the second terminal of the second switching transistor is connected to the second detection terminal;

[0020] The control terminal is connected to the control electrode of the first switching transistor and / or the second switching transistor, and is used to control the first switching transistor and / or the second switching transistor to turn off or on.

[0021] In some embodiments, the control module includes a first switching transistor and a second switching transistor, and the control terminal includes a first control terminal and a second control terminal, wherein the first control terminal is connected to the control electrode of the first switching transistor, and the second control terminal is connected to the control electrode of the second switching transistor.

[0022] In some embodiments, the non-display area of ​​the display substrate includes a PAD area, and the first detection terminal and the second detection terminal are located in the PAD area for contact connection with an external probe.

[0023] Embodiments of the present invention also provide a display device, including a display substrate as described above.

[0024] Embodiments of the present invention also provide a method for detecting a display substrate, comprising:

[0025] During the first time period, the first end of the first conductive coil in the at least two-turn conductive coil is connected to the first detection terminal and the second end of the first conductive coil is connected to the second detection terminal by the switch control unit; the resistance between the first detection terminal and the second detection terminal is detected by the detection unit, and the first conductive coil is determined to be broken based on the detection result.

[0026] In some embodiments, the first switching transistor and / or the second switching transistor are N-type thin-film transistors, and the detection method includes:

[0027] During the first time period, the first control terminal corresponding to the first conductive coil is controlled to input a low-level signal to the control electrode of the first switching transistor and / or the second switching transistor corresponding to the first conductive coil.

[0028] The control terminals other than the first control terminal are controlled to input high-level signals to the control electrodes of the corresponding first and / or second switching transistors.

[0029] In some embodiments, the first switching transistor and / or the second switching transistor are P-type thin-film transistors, and the detection method includes:

[0030] During the first time period, the first control terminal corresponding to the first conductive coil is controlled to input a high-level signal to the control electrode of the first switching transistor and / or the second switching transistor corresponding to the first conductive coil.

[0031] Control other control terminals besides the first control terminal to input low-level signals to the control electrodes of the corresponding first and / or second switching transistors.

[0032] The embodiments of the present invention have the following beneficial effects:

[0033] In the above solution, multiple conductive coils are provided on the display substrate. The two ends of the conductive coils are connected to the first detection terminal and the second detection terminal, respectively. The resistance between the first detection terminal and the second detection terminal can be used to determine whether the conductive coil is broken, and thus whether a crack has appeared at the position of the conductive coil on the display substrate. Since this embodiment provides multiple conductive coils on the display substrate, the range of conductive coils is increased, and multiple positions on the display substrate can be detected to detect whether cracks have appeared, thus increasing the detection range and ensuring the yield of the display product. Attached Figure Description

[0034] Figure 1 This is a schematic diagram of the structure of the display substrate according to an embodiment of the present invention;

[0035] Figures 2-4 This is a timing diagram illustrating the detection process of the display substrate according to an embodiment of the present invention.

[0036] Figure Labels

[0037] 01 The edge of the display substrate

[0038] 11 First Conducting Coil

[0039] 12 Second Conductive Coil

[0040] 13 Third Conducting Coil

[0041] 31 First control terminal

[0042] 32 Second control terminal

[0043] 33 Third control terminal Detailed Implementation

[0044] To make the technical problems, technical solutions and advantages of the embodiments of the present invention clearer, a detailed description will be given below in conjunction with the accompanying drawings and specific embodiments.

[0045] The embodiments of the present invention provide a display substrate and a detection method and display device thereof, which can effectively detect whether cracks appear in the display substrate.

[0046] An embodiment of the present invention provides a display substrate, comprising:

[0047] At least two turns of conductive coils surrounding a predetermined area of ​​the display substrate;

[0048] First detection terminal and second detection terminal;

[0049] A switch control unit is used to control the first end of the conductive coil to disconnect or connect with the first detection terminal, and to control the second end of the conductive coil to disconnect or connect with the second detection terminal;

[0050] The detection unit is used to determine whether the conductive coil is broken based on the resistance between the first detection terminal and the second detection terminal.

[0051] In this embodiment, multiple conductive coils are provided on the display substrate. The two ends of the conductive coils are connected to a first detection terminal and a second detection terminal, respectively. The resistance between the first detection terminal and the second detection terminal can be used to determine whether the conductive coil is broken, and thus whether a crack has appeared at the position of the conductive coil on the display substrate. Since multiple conductive coils are provided on the display substrate in this embodiment, the range of conductive coils is increased, and multiple positions on the display substrate can be detected to detect whether cracks have appeared, thus increasing the detection range and ensuring the yield of the display product.

[0052] In the manufacturing process of display substrates, the cutting process may cause cracks in the display substrate, scratches or breaks in the signal lines on the display substrate, affecting the yield of display products. The resistance of the conductive coil is fixed. The resistance between the first and second detection terminals can be measured by applying an electrical signal to the first and second detection terminals. If a crack appears at the location of the conductive coil, the conductive coil will also break, and the resistance between the first and second detection terminals will be greater than the resistance of the conductive coil. Therefore, based on the resistance between the first and second detection terminals, it can be determined whether the conductive coil is broken, and thus whether a crack has appeared at the location of the conductive coil on the display substrate.

[0053] In this embodiment, the conductive coil can be arranged at the edge of the display substrate to detect whether cracks appear at the edge of the display substrate; wherein, the preset area can be any area on the display substrate, such as the display area, the wiring area, the PAD area, etc. Setting the conductive coil at the edge of the preset area can detect whether cracks appear at the edge of the preset area.

[0054] In this embodiment, multiple turns of conductive coils, such as 2 turns, 3 turns, 4 turns, or more, can be disposed on the display substrate. One turn or more turns of conductive coils can be disposed around each preset area.

[0055] In this embodiment, the conductive coil can be a rectangular conductive coil or a ring-shaped conductive coil, and the shape of the conductive coil can match the shape of the preset area.

[0056] In some embodiments, the at least two turns of conductive coil include:

[0057] A first conductive coil and a second conductive coil surround the display area of ​​the display substrate, wherein the first conductive coil surrounds the second conductive coil.

[0058] In this way, the first and second conductive coils can detect whether cracks appear at different locations on the edge of the display area. The second conductive coil can detect whether cracks appear on the inner edge of the display area, while the first conductive coil can detect whether cracks appear on the outer edge of the display area. Of course, it is not limited to setting two conductive coils around the display area; more conductive coils can be set.

[0059] In this embodiment, the conductive coil disposed on the display substrate can be made of the same material as the original film layer of the display substrate. This allows the conductive coil to be formed simultaneously with the original film layer through the same patterning process, eliminating the need for a dedicated patterning process and simplifying the display substrate manufacturing process. When the display substrate is a liquid crystal display substrate, it includes pixel electrodes. The conductive coil and the pixel electrodes of the display substrate can be made of the same layer structure formed from the same transparent conductive film, further simplifying the manufacturing process.

[0060] When the display substrate also includes a common electrode, the conductive coil can also be a co-layer structure made of the same transparent conductive film as the common electrode to simplify the manufacturing process.

[0061] The display substrate in this invention can be not only a liquid crystal display substrate, but also other display substrates such as an organic light-emitting diode display substrate. For example, when the display substrate is an organic light-emitting diode display substrate, the conductive coil can be made of the same layer structure as the cathode or anode of the organic light-emitting diode, which is made of the same conductive film, so as to simplify the manufacturing process.

[0062] In this embodiment, when multiple conductive coils are provided on the display substrate, different conductive coils can be located in different film layers of the display substrate, which can be used to detect whether cracks appear in different film layers of the display substrate.

[0063] In some embodiments, the display substrate comprises a display functional layer, an encapsulation layer, and a touch functional layer sequentially located on a substrate.

[0064] The first conductive coil is located between the display functional layer and the encapsulation layer;

[0065] The second conductive coil is located on the side of the touch function layer away from the substrate.

[0066] In this way, the first conductive coil can detect whether there are cracks at the edge of the display functional layer of the display substrate, and the second conductive coil can detect whether there are cracks at the edge of the touch functional layer, thus identifying the film layer with cracks and improving detection accuracy.

[0067] In some embodiments, the at least two turns of conductive coil further include:

[0068] A third conductive coil surrounding the trace area of ​​the display substrate.

[0069] In this way, the third conductive coil can be used to detect whether cracks appear at the edge of the trace area of ​​the display substrate.

[0070] In some embodiments, the switch control unit includes a control module corresponding to each of the conductive coils, the control module comprising:

[0071] A first switching transistor and / or a second switching transistor, wherein the first terminal of the first switching transistor is connected to the first end of the conductive coil, and the second terminal of the first switching transistor is connected to the first detection terminal; the first terminal of the second switching transistor is connected to the second end of the conductive coil, and the second terminal of the second switching transistor is connected to the second detection terminal;

[0072] The control terminal is connected to the control electrode of the first switching transistor and / or the second switching transistor, and is used to control the first switching transistor and / or the second switching transistor to turn off or on.

[0073] In this embodiment, only one conductive coil is detected within a time period, while multiple conductive coils are detected sequentially by the control module. For example, if N conductive coils are disposed on the display substrate, in the first time period, the first switching transistor and / or the second switching transistor of the first conductive coil are turned on, while the first switching transistors and / or the second switching transistors of the other conductive coils are turned off. The resistance of the first conductive coil is detected using the first detection terminal and the second detection terminal. In the second time period, the first switching transistor and / or the second switching transistor of the second conductive coil are turned on, while the first switching transistors and / or the second switching transistors of the other conductive coils are turned off. The resistance of the second conductive coil is detected using the first detection terminal and the second detection terminal. And so on, in the Nth time period, the first switching transistor and / or the second switching transistor of the Nth conductive coil are turned on, while the first switching transistors and / or the second switching transistors of the other conductive coils are turned off. The resistance of the Nth conductive coil is detected using the first detection terminal and the second detection terminal, thus completing the detection of all conductive coils.

[0074] In some embodiments, the control module may include a first switching transistor and a second switching transistor, and the control terminal includes a first control terminal and a second control terminal. The first control terminal is connected to the control electrode of the first switching transistor, and the second control terminal is connected to the control electrode of the second switching transistor. Of course, to simplify the structure of the display substrate, the control module may also include only one switching transistor, and the control terminal may also include only one control terminal.

[0075] In some embodiments, the non-display area of ​​the display substrate includes a PAD area, and the first detection terminal and the second detection terminal are located in the PAD area for contact connection with an external probe.

[0076] To facilitate obtaining the resistance of the conductive coil, a first detection terminal and a second detection terminal are located in the PAD area for contact and connection with an external probe, through which the resistance value of the conductive pattern is obtained.

[0077] In a specific example, such as Figure 1 As shown, a first conductive coil 11 and a second conductive coil 12 are disposed on the display substrate surrounding the display area. The first conductive coil 11 is located between the second conductive coil 12 and the edge 01 of the display substrate. A third conductive coil 13 is also disposed on the display substrate surrounding the wiring area. A first detection terminal 21 and a second detection terminal 22 are disposed on the display substrate. The first detection terminal 21 is connected to the first conductive coil 11 through a thin-film transistor T1. The first electrode of T1 is connected to the first detection terminal 21, the second electrode of T1 is connected to the first conductive coil 11, and the control electrode of T1 is connected to the first control terminal 31. The second detection terminal 22 is connected to the first conductive coil 11 through a thin-film transistor T2. The first electrode of T2 is connected to the second detection terminal 22, the second electrode of T2 is connected to the first conductive coil 11, and the control electrode of T2 is connected to the first control terminal 31. The first detection terminal 21 is connected to the second conductive coil 12 via a thin-film transistor T3. The first electrode of T3 is connected to the first detection terminal 21, the second electrode of T3 is connected to the second conductive coil 12, and the control electrode of T3 is connected to the second control terminal 32. The second detection terminal 22 is connected to the second conductive coil 12 via a thin-film transistor T4. The first electrode of T4 is connected to the second detection terminal 22, the second electrode of T4 is connected to the second conductive coil 12, and the control electrode of T4 is connected to the second control terminal 32. The first detection terminal 21 is connected to the third conductive coil 13 via a thin-film transistor T5. The first electrode of T5 is connected to the first detection terminal 21, the second electrode of T5 is connected to the third conductive coil 13, and the control electrode of T5 is connected to the third control terminal 33. The second detection terminal 22 is connected to the third conductive coil 13 via a thin-film transistor T6. The first electrode of T6 is connected to the second detection terminal 22, the second electrode of T6 is connected to the third conductive coil 13, and the control electrode of T6 is connected to the third control terminal 33.

[0078] Among them, thin-film transistors T1-T6 can be either N-type or P-type thin-film transistors.

[0079] In a specific example, thin-film transistors T1-T6 are N-type thin-film transistors, such as... Figure 2 As shown, during time period T2, the driving circuit provides a high-level electrical signal through the first control terminal 31 and the second control terminal 32, and a low-level electrical signal through the third control terminal 33. T1-T4 on the first conductive coil 11 and the second conductive coil 12 are turned off, and T5 and T6 on the third conductive coil 13 are turned on. The resistance value tested between the first detection terminal 21 and the second detection terminal 22 is the resistance value of the third conductive coil 13. The resistance value obtained by this test can determine whether the third conductive coil 13 is broken.

[0080] like Figure 3As shown, during time period T2, the driving circuit provides a high-level electrical signal through the first control terminal 31 and the third control terminal 33, and a low-level electrical signal through the second control terminal 32. T1, T2, T5 and T6 on the first conductive coil 11 and the third conductive coil 13 are turned off, and T3 and T4 on the second conductive coil 12 are turned on. The resistance value tested between the first detection terminal 21 and the second detection terminal 22 is the resistance value of the second conductive coil 12. The resistance value obtained by this test can be used to determine whether the second conductive coil 12 is broken.

[0081] like Figure 4 As shown, during time period T2, the driving circuit provides a high-level electrical signal through the second control terminal 32 and the third control terminal 33, and a low-level electrical signal through the first control terminal 31. T3, T4, T5 and T6 on the second conductive coil 12 and the third conductive coil 13 are turned off, and T1 and T2 on the first conductive coil 11 are turned on. The resistance value tested between the first detection terminal 21 and the second detection terminal 22 is the resistance value of the first conductive coil 11. The resistance value obtained by this test can determine whether the first conductive coil 11 is broken.

[0082] When T1-T6 are P-type thin-film transistors, a high-level electrical signal at the control terminal can control the TFT to turn on, and a low-level electrical signal at the control terminal can control the TFT to turn off.

[0083] The technical solution in this embodiment can achieve comprehensive detection of cracks at the edge of the display substrate.

[0084] Embodiments of the present invention also provide a display device, including the display substrate described above. This display device includes, but is not limited to, components such as: a radio frequency unit, a network module, an audio output unit, an input unit, a sensor, a display unit, a user input unit, an interface unit, a memory, a processor, and a power supply. Those skilled in the art will understand that the structure of the above-described display device does not constitute a limitation on the display device; the display device may include more or fewer of the aforementioned components, or combine certain components, or arrange different components. In embodiments of the present invention, the display device includes, but is not limited to, a monitor, a mobile phone, a tablet computer, a television set, a wearable electronic device, a navigation display device, etc.

[0085] The display device can be any product or component with display function, such as a television, monitor, digital photo frame, mobile phone, or tablet computer. The display device also includes a flexible circuit board, a printed circuit board, and a backplate.

[0086] Embodiments of the present invention also provide a method for detecting a display substrate, comprising:

[0087] During the first time period, the first end of the first conductive coil in the at least two-turn conductive coil is connected to the first detection terminal and the second end of the first conductive coil is connected to the second detection terminal by the switch control unit; the resistance between the first detection terminal and the second detection terminal is detected by the detection unit, and the first conductive coil is determined to be broken based on the detection result.

[0088] In this embodiment, multiple conductive coils are provided on the display substrate. The two ends of the conductive coils are connected to a first detection terminal and a second detection terminal, respectively. The resistance between the first detection terminal and the second detection terminal can be used to determine whether the conductive coil is broken, and thus whether a crack has appeared at the position of the conductive coil on the display substrate. Since multiple conductive coils are provided on the display substrate in this embodiment, the range of conductive coils is increased, and multiple positions on the display substrate can be detected to detect whether cracks have appeared, thus increasing the detection range and ensuring the yield of the display product.

[0089] In the manufacturing process of display substrates, the cutting process may cause cracks in the display substrate, scratches or breaks in the signal lines on the display substrate, affecting the yield of display products. The resistance of the conductive coil is fixed. The resistance between the first and second detection terminals can be measured by applying an electrical signal to the first and second detection terminals. If a crack appears at the location of the conductive coil, the conductive coil will also break, and the resistance between the first and second detection terminals will be greater than the resistance of the conductive coil. Therefore, based on the resistance between the first and second detection terminals, it can be determined whether the conductive coil is broken, and thus whether a crack has appeared at the location of the conductive coil on the display substrate.

[0090] In this embodiment, the conductive coil can be arranged at the edge of the display substrate to detect whether cracks appear at the edge of the display substrate; wherein, the preset area can be any area on the display substrate, such as the display area, the wiring area, the PAD area, etc. Setting the conductive coil at the edge of the preset area can detect whether cracks appear at the edge of the preset area.

[0091] In this embodiment, multiple turns of conductive coils, such as 2 turns, 3 turns, 4 turns, or more, can be disposed on the display substrate. One turn or more turns of conductive coils can be disposed around each preset area.

[0092] In this embodiment, the conductive coil can be a rectangular conductive coil or a ring-shaped conductive coil, and the shape of the conductive coil can match the shape of the preset area.

[0093] In this embodiment, the conductive coil disposed on the display substrate can be made of the same material as the original film layer of the display substrate. This allows the conductive coil to be formed simultaneously with the original film layer through the same patterning process, eliminating the need for a dedicated patterning process and simplifying the display substrate manufacturing process. When the display substrate is a liquid crystal display substrate, it includes pixel electrodes. The conductive coil and the pixel electrodes of the display substrate can be made of the same layer structure formed from the same transparent conductive film, further simplifying the manufacturing process.

[0094] When the display substrate also includes a common electrode, the conductive coil can also be a co-layer structure made of the same transparent conductive film as the common electrode to simplify the manufacturing process.

[0095] The display substrate in this invention can be not only a liquid crystal display substrate, but also other display substrates such as an organic light-emitting diode display substrate. For example, when the display substrate is an organic light-emitting diode display substrate, the conductive coil can be made of the same layer structure as the cathode or anode of the organic light-emitting diode, which is made of the same conductive film, so as to simplify the manufacturing process.

[0096] In this embodiment, when multiple conductive coils are provided on the display substrate, different conductive coils can be located in different film layers of the display substrate, which can be used to detect whether cracks appear in different film layers of the display substrate.

[0097] In this embodiment, only one conductive coil is detected within a time period, while multiple conductive coils are detected sequentially by the control module. For example, if N conductive coils are disposed on the display substrate, in the first time period, the first switching transistor and / or the second switching transistor of the first conductive coil are turned on, while the first switching transistors and / or the second switching transistors of the other conductive coils are turned off. The resistance of the first conductive coil is detected using the first detection terminal and the second detection terminal. In the second time period, the first switching transistor and / or the second switching transistor of the second conductive coil are turned on, while the first switching transistors and / or the second switching transistors of the other conductive coils are turned off. The resistance of the second conductive coil is detected using the first detection terminal and the second detection terminal. And so on, in the Nth time period, the first switching transistor and / or the second switching transistor of the Nth conductive coil are turned on, while the first switching transistors and / or the second switching transistors of the other conductive coils are turned off. The resistance of the Nth conductive coil is detected using the first detection terminal and the second detection terminal, thus completing the detection of all conductive coils.

[0098] In some embodiments, the control module may include a first switching transistor and a second switching transistor, and the control terminal includes a first control terminal and a second control terminal. The first control terminal is connected to the control electrode of the first switching transistor, and the second control terminal is connected to the control electrode of the second switching transistor. Of course, to simplify the structure of the display substrate, the control module may also include only one switching transistor, and the control terminal may also include only one control terminal.

[0099] In some embodiments, the first switching transistor and / or the second switching transistor are N-type thin-film transistors, and the detection method includes:

[0100] During the first time period, the first control terminal corresponding to the first conductive coil is controlled to input a low-level signal to the control electrode of the first switching transistor and / or the second switching transistor corresponding to the first conductive coil.

[0101] The control terminals other than the first control terminal are controlled to input high-level signals to the control electrodes of the corresponding first and / or second switching transistors.

[0102] In some embodiments, the first switching transistor and / or the second switching transistor are P-type thin-film transistors, and the detection method includes:

[0103] During the first time period, the first control terminal corresponding to the first conductive coil is controlled to input a high-level signal to the control electrode of the first switching transistor and / or the second switching transistor corresponding to the first conductive coil.

[0104] Control other control terminals besides the first control terminal to input low-level signals to the control electrodes of the corresponding first and / or second switching transistors.

[0105] In a specific example, such as Figure 1As shown, a first conductive coil 11 and a second conductive coil 12 are disposed on the display substrate surrounding the display area. The first conductive coil 11 is located between the second conductive coil 12 and the edge 01 of the display substrate. A third conductive coil 13 is also disposed on the display substrate surrounding the wiring area. A first detection terminal 21 and a second detection terminal 22 are disposed on the display substrate. The first detection terminal 21 is connected to the first conductive coil 11 through a thin-film transistor T1. The first electrode of T1 is connected to the first detection terminal 21, the second electrode of T1 is connected to the first conductive coil 11, and the control electrode of T1 is connected to the first control terminal 31. The second detection terminal 22 is connected to the first conductive coil 11 through a thin-film transistor T2. The first electrode of T2 is connected to the second detection terminal 22, the second electrode of T2 is connected to the first conductive coil 11, and the control electrode of T2 is connected to the first control terminal 31. The first detection terminal 21 is connected to the second conductive coil 12 via a thin-film transistor T3. The first electrode of T3 is connected to the first detection terminal 21, the second electrode of T3 is connected to the second conductive coil 12, and the control electrode of T3 is connected to the second control terminal 32. The second detection terminal 22 is connected to the second conductive coil 12 via a thin-film transistor T4. The first electrode of T4 is connected to the second detection terminal 22, the second electrode of T4 is connected to the second conductive coil 12, and the control electrode of T4 is connected to the second control terminal 32. The first detection terminal 21 is connected to the third conductive coil 13 via a thin-film transistor T5. The first electrode of T5 is connected to the first detection terminal 21, the second electrode of T5 is connected to the third conductive coil 13, and the control electrode of T5 is connected to the third control terminal 33. The second detection terminal 22 is connected to the third conductive coil 13 via a thin-film transistor T6. The first electrode of T6 is connected to the second detection terminal 22, the second electrode of T6 is connected to the third conductive coil 13, and the control electrode of T6 is connected to the third control terminal 33.

[0106] Among them, thin-film transistors T1-T6 can be either N-type or P-type thin-film transistors.

[0107] In a specific example, thin-film transistors T1-T6 are N-type thin-film transistors, such as... Figure 2 As shown, during time period T2, the driving circuit provides a high-level electrical signal through the first control terminal 31 and the second control terminal 32, and a low-level electrical signal through the third control terminal 33. T1-T4 on the first conductive coil 11 and the second conductive coil 12 are turned off, and T5 and T6 on the third conductive coil 13 are turned on. The resistance value tested between the first detection terminal 21 and the second detection terminal 22 is the resistance value of the third conductive coil 13. The resistance value obtained by this test can determine whether the third conductive coil 13 is broken.

[0108] like Figure 3As shown, during time period T2, the driving circuit provides a high-level electrical signal through the first control terminal 31 and the third control terminal 33, and a low-level electrical signal through the second control terminal 32. T1, T2, T5 and T6 on the first conductive coil 11 and the third conductive coil 13 are turned off, and T3 and T4 on the second conductive coil 12 are turned on. The resistance value tested between the first detection terminal 21 and the second detection terminal 22 is the resistance value of the second conductive coil 12. The resistance value obtained by this test can be used to determine whether the second conductive coil 12 is broken.

[0109] like Figure 4 As shown, during time period T2, the driving circuit provides a high-level electrical signal through the second control terminal 32 and the third control terminal 33, and a low-level electrical signal through the first control terminal 31. T3, T4, T5 and T6 on the second conductive coil 12 and the third conductive coil 13 are turned off, and T1 and T2 on the first conductive coil 11 are turned on. The resistance value tested between the first detection terminal 21 and the second detection terminal 22 is the resistance value of the first conductive coil 11. The resistance value obtained by this test can determine whether the first conductive coil 11 is broken.

[0110] When T1-T6 are P-type thin-film transistors, a high-level electrical signal at the control terminal can control the TFT to turn on, and a low-level electrical signal at the control terminal can control the TFT to turn off.

[0111] The technical solution in this embodiment can achieve comprehensive detection of cracks at the edge of the display substrate.

[0112] It should be noted that the various embodiments in this specification are described in a progressive manner, and the same or similar parts between the various embodiments can be referred to mutually. Each embodiment focuses on describing the differences from other embodiments. In particular, since the embodiments are basically similar to the product embodiments, the descriptions are relatively simple, and the relevant parts can be referred to the descriptions of the product embodiments.

[0113] Unless otherwise defined, the technical or scientific terms used in this disclosure shall have the ordinary meaning understood by one of ordinary skill in the art to which this disclosure pertains. The terms “first,” “second,” and similar terms used in this disclosure do not indicate any order, quantity, or importance, but are merely used to distinguish different components. Terms such as “comprising” or “including” mean that the element or object preceding the word encompasses the elements or objects listed following the word and their equivalents, without excluding other elements or objects. Terms such as “connected” or “linked” are not limited to physical or mechanical connections, but can include electrical connections, whether direct or indirect. Terms such as “upper,” “lower,” “left,” and “right” are used only to indicate relative positional relationships, and these relative positional relationships may change accordingly when the absolute position of the described objects changes.

[0114] It is understandable that when a component such as a layer, film, region, or substrate is referred to as being "above" or "below" another component, the component may be "directly" located "above" or "below" the other component, or there may be intermediate components present.

[0115] In the description of the above embodiments, specific features, structures, materials, or characteristics may be combined in any suitable manner in one or more embodiments or examples.

[0116] The above description is merely a specific embodiment of this disclosure, but the scope of protection of this disclosure is not limited thereto. Any variations or substitutions that can be easily conceived by those skilled in the art within the scope of the technology disclosed in this disclosure should be included within the scope of protection of this disclosure. Therefore, the scope of protection of this disclosure should be determined by the scope of the claims.

Claims

1. A display substrate, characterized in that, include: At least two turns of conductive coil surrounding a preset area of ​​the display substrate, a first detection terminal and a second detection terminal; A switch control unit is used to control the first end of the conductive coil to disconnect or connect with the first detection terminal, and to control the second end of the conductive coil to disconnect or connect with the second detection terminal; The detection unit is used to determine whether the conductive coil is broken based on the resistance between the first detection terminal and the second detection terminal; In this process, only one conductive coil is detected within a certain time period, while multiple conductive coils are detected sequentially by the control module. The switch control unit includes control modules corresponding one-to-one with the conductive coils, and the control modules include: A first switching transistor and a second switching transistor, wherein the first terminal of the first switching transistor is connected to the first end of the conductive coil, and the second terminal of the first switching transistor is connected to the first detection terminal; the first terminal of the second switching transistor is connected to the second end of the conductive coil, and the second terminal of the second switching transistor is connected to the second detection terminal. The control terminal includes a first control terminal and a second control terminal. The first control terminal is connected to the control electrode of the first switching transistor, and the second control terminal is connected to the control electrode of the second switching transistor. It is used to control the first switching transistor and the second switching transistor to turn off or on. The non-display area of ​​the display substrate includes a PAD area, and the first detection terminal and the second detection terminal are located in the PAD area for contact and connection with external probes.

2. The display substrate according to claim 1, characterized in that, The at least two turns of conductive coil include: A first conductive coil and a second conductive coil surround the display area of ​​the display substrate, wherein the first conductive coil surrounds the second conductive coil.

3. The display substrate according to claim 2, characterized in that, The display substrate consists of a display functional layer, an encapsulation layer, and a touch functional layer, which are sequentially located on the substrate. The first conductive coil is located between the display functional layer and the encapsulation layer; The second conductive coil is located on the side of the touch function layer away from the substrate.

4. The display substrate according to claim 1, characterized in that, The at least two turns of conductive coil also include: A third conductive coil surrounding the trace area of ​​the display substrate.

5. A display device, characterized in that, Includes the display substrate as described in any one of claims 1-4.

6. A method for detecting a display substrate, characterized in that, The display substrate used in any one of claims 1-4 comprises: During the first time period, the first end of the first conductive coil in the at least two-turn conductive coil is connected to the first detection terminal and the second end of the first conductive coil is connected to the second detection terminal by the switch control unit; the resistance between the first detection terminal and the second detection terminal is detected by the detection unit, and the first conductive coil is determined to be broken based on the detection result.

7. The method for detecting a display substrate according to claim 6, characterized in that, Applied to the display substrate as described in claim 1, wherein the first switching transistor and / or the second switching transistor are N-type thin-film transistors, the detection method includes: During the first time period, the first control terminal corresponding to the first conductive coil is controlled to input a low-level signal to the control electrode of the first switching transistor and / or the second switching transistor corresponding to the first conductive coil. The control terminals other than the first control terminal are controlled to input high-level signals to the control electrodes of the corresponding first and / or second switching transistors.

8. The method for detecting a display substrate according to claim 7, characterized in that, Applied to the display substrate as described in claim 1, wherein the first switching transistor and / or the second switching transistor are P-type thin-film transistors, the detection method includes: During the first time period, the first control terminal corresponding to the first conductive coil is controlled to input a high-level signal to the control electrode of the first switching transistor and / or the second switching transistor corresponding to the first conductive coil. Control other control terminals besides the first control terminal to input low-level signals to the control electrodes of the corresponding first and / or second switching transistors.

Citation Information

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