A first article inspection method before SIP module mounting

Abstract

The present invention discloses a first-article inspection method before SIP module placement, based on an inspection system including an LCR tester, a device fixture, and a terminal control device; the method includes: S1, placing the first SIP module on a test bench; S2, the device fixture clamps the components thereon, and the LCR tester performs detection and transmits the detection data to the control terminal device; S3, determining whether the detection data is within a first threshold range; if yes, the component is normal and executing S5; if no, executing S4; S4, when the component is a capacitor and the dielectric is X5R or X7R; the capacitor accuracy is compensated and a second threshold range is obtained, and the detection data is determined to be within the second threshold range; if yes, the component is normal; if no, the component is abnormal; executing S5; S5, determining whether there are other components to be tested; if yes, returning to S2; if no, ending the verification. The present invention can quickly and effectively inspect capacitors with aging characteristics, thereby improving inspection efficiency and the overall progress of the process.

Description

Technical Field

[0001] The present invention belongs to the technical field of product inspection, and in particular relates to a first-article inspection method before SIP module mounting. Background Art

[0002] With the rapid development of various smartphones, smart bracelets, smart watches, and TWS earphones, market demand is increasing year by year. The demand for small component assembly is also gradually increasing, and the demand for accuracy of various devices is becoming increasingly higher. Currently, SIP modules generally require first-article inspection before assembly. This mainly tests the values of components such as resistors, capacitors, and inductors on the SIP module to ensure that each component meets the values set in the R&D design. However, in actual measurements, especially when the components are capacitors, it is common to encounter capacitance values that are outside the specification limits or even lower. This phenomenon is called capacitor aging. For example, the capacitance of capacitors with X5R or X7R dielectrics tends to stabilize after 100,000 hours, with a maximum deviation of less than 10%. This characteristic is reversible: heating at around 150°C for one hour can restore the capacitance to its initial value. In actual applications, if this type of capacitor is heated before testing each time, it will undoubtedly reduce the inspection efficiency and affect the overall progress of the process. If the same type of capacitor is tested multiple times after an abnormality is detected, it will undoubtedly cause material waste, increase costs, reduce inspection efficiency, and affect the overall progress of the process.

[0003] In view of this, there is an urgent need to develop a first-article inspection method before SIP module mounting that can quickly and effectively inspect capacitors with aging characteristics; avoid the increased cost caused by multiple capacitor inspections and the trouble of heating and then inspecting, save time, improve inspection efficiency, and ensure the overall progress of the process. Summary of the Invention

[0004] In order to overcome at least one of the shortcomings of the above-mentioned prior art, the present invention provides a first-article inspection method before SIP module mounting, which can quickly and effectively inspect capacitors with aging characteristics, improve inspection efficiency, and accelerate the overall progress of the process.

[0005] To address the problems existing in the above-mentioned prior art, an embodiment of the present invention provides a first-article inspection method before SIP module placement, based on an inspection system; the inspection system includes an LCR tester, a device fixture electrically connected to the LCR tester, and a terminal control device electrically connected to the LCR tester; the method includes an LCR verification step, which includes:

[0006] S1. Place the first SIP module that has completed the patch process on the test bench next to the LCR tester;

[0007] S2. Clamp a component of the SIP module using the component fixture, test the clamped component using the LCR tester, and transmit the test data to the control terminal device;

[0008] S3, the terminal control device determines whether the detection data is within a first threshold range corresponding to the component; if so, the component is normal and step S5 is executed; if not, step S4 is executed;

[0009] S4. When the terminal control device determines that the component is a capacitor and the dielectric information of the capacitor is X5R or X7R, the terminal control device compensates for the accuracy of the capacitor and obtains a second threshold range, and continues to determine whether the detection data is within the second threshold range. If so, the component is normal and step S5 is executed; if not, the component is abnormal and step S5 is executed;

[0010] S5. Determine whether there are any components on the SIP module that need to be tested; if so, return to step S2; if not, end the LCR verification.

[0011] Furthermore, step S4 further includes:

[0012] When the terminal control device determines that the component is not a capacitor; or when the terminal control device determines that the component is a capacitor but the dielectric information of the capacitor is not X5R or X7R;

[0013] The device fixture is used to clamp a supply component that is consistent with the component from the material tape, and the LCR tester detects the clamped supply component and transmits the detection data to the terminal control device; the terminal control device determines whether the detection data is within the corresponding first threshold range; if so, execute step S5, if not, execute step S6.

[0014] Furthermore, the terminal control device obtains the corresponding first threshold range according to the pre-stored accuracy and typical value of the component.

[0015] Furthermore, in step S4, “the terminal control device compensates for the accuracy of the capacitor and obtains a second threshold range” is specifically as follows:

[0016] The terminal control device performs compensation based on the pre-stored accuracy (A, B) of the capacitor and the compensation coefficient a, and the accuracy of the capacitor after compensation is (Aa, B+a); the second threshold range is equal to (C, D), where C=K×(Aa), D=K×(B+a), A is a positive number less than 1, B is a positive number greater than 1, a is a positive number less than 1, Aa is greater than 0 and less than 1, and K is the typical value of the capacitor.

[0017] Furthermore, a is equal to 0.1.

[0018] Furthermore, the method further comprises:

[0019] After all the components on the SIP module have completed LCR verification, the terminal control device determines whether all the components are normal. If so, it prompts to proceed to the next step of patch work; if not, it prompts an abnormality.

[0020] Furthermore, the method further comprises an appearance inspection step performed before the LCR verification step;

[0021] The appearance inspection step includes: using an electron microscope to confirm the polarity and silk screen information of the IC device on the SIP module that has completed the first piece of the patch process. If all are correct, the LCR verification step is performed; if not, exception processing is required.

[0022] Furthermore, the method further comprises an information pre-storage step performed before the LCR verification step;

[0023] The information pre-storage step includes: importing the patch program according to the designed drawings and selected components; the content imported into the terminal control device includes the position information, capacitance / resistance / inductance value, typical value and accuracy of the components, and dielectric information when the components are capacitors.

[0024] Furthermore, the terminal control device includes a main control module; a data storage module, a detection data acquisition module, a judgment module, a calculation module and a human-computer interaction module electrically connected to the main control module;

[0025] The data storage module is used to store the location information, capacitance / resistance / inductance values, typical values and accuracy of all the components on the SIP module, as well as the dielectric information when the components are capacitors.

[0026] The detection data acquisition module is used to acquire the detection data transmitted by the LCR tester;

[0027] The calculation module is used to calculate the first threshold range and the second threshold range according to the information stored in the data storage module;

[0028] The judgment module is used to determine whether the detection data is within the corresponding first threshold range, whether the component that is not within the first threshold range is a capacitor, whether the dielectric information of the capacitor is X5R or X7R, and whether the detection data of the capacitor with dielectric information of X5R or X7R is within the second threshold range.

[0029] Furthermore, the terminal control device includes a PC and a keyboard electrically connected to the PC; when a confirmation key on the keyboard is triggered, the LCR tester detects the clamped components and transmits the detection data to the PC.

[0030] Due to the adoption of the above technical solution, the present invention has the following beneficial effects:

[0031] The first-article inspection method for SIP modules before mounting is based on an inspection system; the inspection system includes an LCR tester, a device fixture electrically connected to the LCR tester, and a terminal control device electrically connected to the LCR tester; the method includes an LCR verification step, which includes: S1, placing the first SIP module that has completed the mounting process on a test bench next to the LCR tester; S2, using the device fixture to clamp a component of the SIP module, the LCR tester detects the clamped component, and transmits the detection data to the control terminal device; S3, the terminal control device determines whether the detection data is Is it within the first threshold range corresponding to the component? If so, the component is normal and step S5 is executed. If not, step S4 is executed. S4. When the terminal control device determines that the component is a capacitor and the dielectric information of the capacitor is X5R or X7R, the terminal control device compensates for the accuracy of the capacitor and obtains a second threshold range, and continues to judge whether the detection data is within the second threshold range. If so, the component is normal and step S5 is executed. If not, the component is abnormal and step S5 is executed. S5. Judge whether there are other components on the SIP module that need to be tested. If so, return to step S2. If not, end LCR calibration.

[0032] The present invention automatically compensates for the capacitance accuracy of capacitors with aging characteristics, widens the accuracy range to obtain a second threshold range, and makes reasonable and effective judgments on the capacitance within the second threshold range (that is, the capacitance remains unchanged and the threshold range used for judgment is changed; this is equivalent to heating and restoring the capacitance). This avoids the increased cost caused by multiple capacitance tests and the trouble of re-testing after heating, saves time, improves inspection efficiency, and ensures the overall progress of the process. BRIEF DESCRIPTION OF THE DRAWINGS

[0033] Figure 1 It is a schematic structural diagram of the inspection system of the present invention;

[0034] Figure 2 The present invention is a flow chart of the first article inspection method before SIP module mounting.

[0035] In the figure: 1-LCR tester, 2-device fixture, 3-PC, 4-keyboard. DETAILED DESCRIPTION

[0036] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0037] Depend on Figure 1 As shown, this embodiment discloses a testing system; the testing system includes an LCR meter 1 (for detecting resistance / inductance / capacitance), a device fixture 2 electrically connected to the LCR meter 1, and a terminal control device electrically connected to the LCR meter 1. The terminal control device includes a PC 3 and a keyboard 4 connected to the PC 3. The HDMI computer interface of the LCR meter 1 is connected to the communication port of the PC 3 via a data cable.

[0038] Depend on Figure 2 As shown, this embodiment discloses a first-article inspection method before SIP module placement, based on the above-mentioned inspection system. Specifically, it includes an LCR verification step, which includes:

[0039] S1. Place the first SIP module that has completed the patch process on the test bench next to LCR tester 1.

[0040] S2. Use the device fixture 2 to clamp a component (resistor / inductor or capacitor) of the SIP module. The LCR tester 1 tests the clamped component and transmits the test data to the PC 3.

[0041] If the size of the component is small, it is necessary to use a microscope to align the component when the component fixture 2 is used to clamp the component.

[0042] In this embodiment, after the confirmation key on the keyboard 4 is triggered, the LCR tester 1 detects the clamped components and transmits the detection data to the PC 3 .

[0043] S3. PC 3 determines whether the detection data is within the first threshold range corresponding to the component; if so, the component is normal and step S5 is executed; if not, step S4 is executed.

[0044] When the detected component is resistor R1, the corresponding first threshold range is the resistor R1 threshold range, which is obtained by multiplying the typical value of the resistor R1 by the precision; for example, if the typical value of the resistor R1 is 2Ω and the precision is (0.9, 1.2), then the resistor R1 threshold range is (1.8, 2.4). When the detected component is inductor L1, the corresponding first threshold range is the inductor L1 threshold range, which is obtained by multiplying the typical value of the inductor L1 by the precision; for example, if the typical value of the inductor L1 is 2H and the precision is (0.8, 1.1), then the resistor L1 threshold range is (1.6, 2.2). When the detected component is capacitor C1, the first threshold range is the capacitor C1 threshold range, which is obtained by multiplying the typical value of the capacitor C1 by the precision; for example, if the typical value of the capacitor C1 is 3F and the precision is (0.9, 1.1), then the capacitor C1 threshold range is (2.7, 3.3). Similarly, the first threshold range corresponding to resistance Ri is the resistance Ri threshold range, the first threshold range corresponding to inductance Li is the inductance Li threshold range, and the first threshold range corresponding to capacitance Ci is the capacitance Ci threshold range. i is a natural number greater than or equal to 1.

[0045] Step S4 specifically includes:

[0046] S41. When the PC 3 determines that the component is a capacitor and the dielectric information of the capacitor is X5R or X7R, the PC 3 compensates for the accuracy of the capacitor and obtains a second threshold range, and then continues to determine whether the detection data is within the second threshold range. If so, the component is normal and the process proceeds to step S5. If not, the component is abnormal and the process proceeds to step S5.

[0047] S42: When the PC 3 determines that the component is not a capacitor, or when the PC 3 determines that the component is a capacitor but the dielectric information of the capacitor is not X5R or X7R, a component fixture is used to clamp a feed component that is consistent with the component to be tested from the material strip (for example, if the component is resistor R2, then the feed component is another resistor R2 on the material strip). The LCR meter 1 tests the clamped feed component and transmits the test data to the PC 3. The PC 3 determines whether the test data is within the corresponding first threshold range. If so, the component is normal and the process proceeds to step S5; if not, the component is abnormal and the process proceeds to step S6. This is mainly used to prevent accidental events and improve the accuracy of the test.

[0048] S5: Determine whether there are any components on the SIP module that need to be tested. If so, return to step S2; if not, end the LCR verification. That is, return to step S2 to continue testing the next component until all components have completed LCR verification.

[0049] It should be noted that the display of the PC 3 will display the judgment result of each judgment step and provide prompts (text prompts, red prompts of a step in the flowchart or voice prompts, etc.). The operator controls the component fixture 2 to clamp another component based on the judgment structure and prompts.

[0050] In this embodiment, in step S4, "the PC compensates for the accuracy of the capacitor and obtains the second threshold range" is specifically: the PC compensates based on the pre-stored accuracy (A, B) of the capacitor and the compensation coefficient a, and the accuracy of the capacitor after compensation is (Aa, B+a); the second threshold range is equal to (C, D), where C=K×(Aa), D=K×(B+a), A is a positive number less than 1, B is a positive number greater than 1, a is a positive number less than 1, Aa is greater than 0 and less than 1, and K is a typical value of the capacitor.

[0051] In this embodiment, a is preferably equal to 0.1. For example, the typical value of capacitor C1 is 3F, the accuracy of capacitor C1 is (0.9, 1.1), and the first threshold range is (2.7, 3.3); the accuracy after capacitor compensation is (0.8, 1.2), which widens the accuracy range, and the second threshold range is (2.4, 3.6), which also widens the threshold range for comparison detection. The detection data of capacitor C1 after aging is 2.6F, which is not within the first threshold range but within the second threshold range. It is determined that capacitor C1 is normal. This method is not only equivalent to "the method of "keeping the threshold range for comparison detection unchanged, increasing the capacitance by heating and then detecting"; it is also simple and saves trouble.

[0052] In addition, the first article inspection method before SIP module mounting in this embodiment further includes:

[0053] After all components on the SIP module have completed LCR verification, PC 3 determines whether all components are normal based on the judgment structure stored for each component. If so, it prompts to proceed to the next step of patch work; if not, it prompts an abnormality (tracing back and checking the components on the SIP module and the material strip).

[0054] In addition, the first-article inspection method before SIP module mounting in this embodiment also includes an appearance inspection step performed before the LCR verification step; the appearance inspection step includes: using an electron microscope to confirm the polarity and silk screen information of the IC device on the SIP module that has completed the first-article mounting process. If all are correct, the LCR verification step is performed; if not, exception handling is required.

[0055] In addition, the first-article inspection method before SIP module mounting in this embodiment also includes an information pre-storage step performed before the LCR verification step; the information pre-storage step includes: importing the patch program according to the designed drawings and selected components (consistent with the method of importing the patch program in the existing SMT process, which will not be repeated here); the content imported into the PC 3 includes the position information of the component, capacitance / resistance / inductance value, typical value and accuracy, and dielectric information when the component is a capacitor.

[0056] In some other embodiments, the terminal control device is an electrically programmable ROM, an electrically erasable programmable ROM, a single-chip microcomputer or a processor, etc., and the terminal control device includes a main control module; a data storage module electrically connected to the main control module, a detection data acquisition module, a judgment module, a calculation module and a human-computer interaction module (for inputting parameters or sending detection instructions, etc.); the data storage module is used to store the position information, capacitance / resistance / inductance values, typical values and accuracy of all components on the SIP module, and dielectric information when the components are capacitors. The detection data acquisition module is used to obtain the detection data transmitted by the LCR tester 1; the calculation module is used to calculate the first threshold range and the second threshold range based on the information stored in the data storage module; the judgment module is used to determine whether the detection data is within the corresponding first threshold range, whether the component not within the first threshold range is a capacitor, whether the dielectric information of the capacitor is X5R or X7R, and whether the detection data of the capacitor with dielectric information of X5R or X7R is within the second threshold range.

[0057] The steps of the method or algorithm described in the embodiments disclosed above can be implemented directly using hardware, a software module executed by a processor, or a combination of the two. The software module can be placed in any other form of storage medium known in the technical field such as an electrically programmable ROM, an electrically erasable programmable ROM, a single-chip microcomputer or a processor. In order to clearly illustrate the interchangeability of hardware and software, the composition and principle of the control module of the terminal control device have been generally described in terms of function in the above description; for example, the data storage module, the detection data acquisition module, the judgment module and the calculation module can be a processing chip that integrates algorithms; or they can be program codes stored in a storage medium; whether these functions are executed in hardware or software depends on the specific application and design constraints of the technical solution; no restrictions are made here.

[0058] In summary, the present invention can automatically compensate for the capacitance accuracy of capacitors with aging characteristics, widen the accuracy range to obtain a second threshold range, and make reasonable and effective judgments on their capacitance within the second threshold range (that is, the capacitance remains unchanged, and the threshold range used for judgment is changed; it is equivalent to heating and restoring its capacitance), avoiding the increased cost caused by multiple capacitance tests and the trouble of re-inspection after heating, saving time, improving inspection efficiency, and ensuring the overall progress of the process.

[0059] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the scope of protection of the present invention.

Claims

1. A first article inspection method before SIP module placement, based on an inspection system; characterized in that: The inspection system includes an LCR tester, a device fixture electrically connected to the LCR tester, and a terminal control device electrically connected to the LCR tester; the method includes an LCR verification step, which includes: S1. Place the first SIP module that has completed the patch process on the test bench next to the LCR tester; S2. Clamp a component of the SIP module using the component fixture, test the clamped component using the LCR tester, and transmit the test data to the terminal control device; S3, the terminal control device determines whether the detection data is within a first threshold range corresponding to the component; if so, the component is normal and step S5 is executed; if not, step S4 is executed; S4. When the terminal control device determines that the component is a capacitor and the dielectric information of the capacitor is X5R or X7R, the terminal control device compensates for the accuracy of the capacitor and obtains a second threshold range, and continues to determine whether the detection data is within the second threshold range. If so, the component is normal and step S5 is executed; if not, the component is abnormal and step S5 is executed; S5. Determine whether there are any components on the SIP module that need to be tested. If so, return to step S2; if not, end the LCR verification.

2. The first article inspection method before SIP module mounting according to claim 1, characterized in that: Step S4 further includes: When the terminal control device determines that the component is not a capacitor; or when the terminal control device determines that the component is a capacitor but the dielectric information of the capacitor is not X5R or X7R; The device fixture is used to clamp a supply component that is consistent with the component from the material tape, and the LCR tester detects the clamped supply component and transmits the detection data to the terminal control device; the terminal control device determines whether the detection data is within the corresponding first threshold range; if so, execute step S5, otherwise execute step S5.

3. The first article inspection method before SIP module mounting according to claim 1, characterized in that: The terminal control device obtains the corresponding first threshold range according to the pre-stored accuracy and typical value of the component.

4. The first article inspection method before SIP module mounting according to claim 1, characterized in that: In step S4, "the terminal control device compensates for the accuracy of the capacitor and obtains a second threshold range" is specifically: The terminal control device performs compensation based on the pre-stored accuracy (A, B) of the capacitor and the compensation coefficient a, and the accuracy of the capacitor after compensation is (Aa, B+a); the second threshold range is equal to (C, D), where C=K×(Aa), D=K×(B+a), A is a positive number less than 1, B is a positive number greater than 1, a is a positive number less than 1, Aa is greater than 0 and less than 1, and K is the typical value of the capacitor.

5. The first article inspection method before SIP module mounting according to claim 4, characterized in that: a is equal to 0.

1.

6. The first article inspection method before SIP module mounting according to claim 3, characterized in that: The method further comprises: After all the components on the SIP module have completed LCR verification, the terminal control device determines whether all the components are normal. If so, it prompts to proceed to the next step of patch work; if not, it prompts an abnormality.

7. The first article inspection method before SIP module mounting according to claim 1, characterized in that: The method further comprises an appearance detection step performed before the LCR verification step; The appearance inspection step includes: using an electron microscope to confirm the polarity and silk screen information of the IC device on the SIP module that has completed the first piece of the patch process, and if all are correct, performing the LCR verification step; If not, exception handling is required.

8. The first article inspection method before SIP module mounting according to claim 1, characterized in that: The method further comprises an information pre-storage step performed before the LCR verification step; The information pre-storage step includes: importing the patch program according to the designed drawings and selected components; The content imported into the terminal control device includes the location information, capacitance / resistance / inductance value, typical value and accuracy of the component, and dielectric information when the component is a capacitor.

9. The first article inspection method before SIP module mounting according to claim 1, characterized in that: The terminal control device includes a main control module; a data storage module, a detection data acquisition module, a judgment module, a calculation module and a human-computer interaction module electrically connected to the main control module; The data storage module is used to store the location information, capacitance / resistance / inductance values, typical values and accuracy of all the components on the SIP module, as well as the dielectric information when the components are capacitors; The detection data acquisition module is used to acquire the detection data transmitted by the LCR tester; The calculation module is used to calculate the first threshold range and the second threshold range according to the information stored in the data storage module; The judgment module is used to determine whether the detection data is within the corresponding first threshold range, whether the component that is not within the first threshold range is a capacitor, whether the dielectric information of the capacitor is X5R or X7R, and whether the detection data of the capacitor with dielectric information of X5R or X7R is within the second threshold range.

10. The first article inspection method before SIP module mounting according to claim 1, characterized in that: The terminal control device includes a PC and a keyboard electrically connected to the PC; when a confirmation key on the keyboard is triggered, the LCR tester detects the clamped components and transmits the detection data to the PC.

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