Aging test circuit, aging test system and aging test method

Abstract

The present invention discloses an aging test circuit, an aging test system and an aging test method. The aging test circuit includes an interface module, a switch module and a main control module. The interface module is used to electrically connect with a plurality of devices to be tested, and the devices to be tested are used to generate an access status signal; the third port of the main control module is used to obtain the access status signal, and the main control module is used to generate a card reading signal and a switching signal according to the access status signal; the device to be tested is used to generate a test signal according to the card reading signal, and the switch module is used to switch the connection status between the first port of the main control module and the plurality of devices to be tested respectively according to the switching signal, and the main control module is used to perform an aging test operation according to the test signal. The aging test circuit of the present invention can simultaneously connect a plurality of devices to be tested to perform an aging test operation, which simplifies the test operation process and thus improves the test efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of aging test, and in particular to an aging test circuit, an aging test system and an aging test method. Background Art

[0002] At present, read / write devices (such as ultra-high frequency radio frequency identification (UHF RFID) devices) may experience aging failures such as freezing or disconnection after working at high power for a long time. Therefore, it is necessary to perform aging tests on the read / write devices.

[0003] In the related art, the aging test of the read / write device needs to be connected to a computer for testing. However, the above method requires the read / write device to be connected to the computer in sequence, which makes the test operation process complicated, thereby affecting the test efficiency of the read / write device. Summary of the invention

[0004] The present invention aims to solve at least one of the technical problems existing in the prior art. To this end, the present invention provides an aging test circuit that can simultaneously connect multiple devices to be tested to perform aging test operations, simplifying the test operation process and thus improving test efficiency.

[0005] The present invention also provides an aging test system having the aging test circuit, and an aging test method applied to the aging test system.

[0006] According to the first aspect of the present invention, an aging test circuit includes:

[0007] An interface module, the interface module is used to be electrically connected to a plurality of devices under test; wherein the devices under test are used to generate access status signals;

[0008] A switch module, the switch module is used to be electrically connected to the interface module;

[0009] A main control module, wherein the first port of the main control module is used to be electrically connected to the switch module, the second port of the main control module is used to be electrically connected to the switch module, and the third port of the main control module and the fourth port of the main control module are respectively used to be electrically connected to the interface module; wherein the third port of the main control module is used to obtain the access status signal, and the main control module is used to generate a card reading signal and a switching signal according to the access status signal;

[0010] Among them, the device under test is used to generate a test signal according to the card reading signal, the switch module is used to switch the connection status between the first port of the main control module and multiple devices under test according to the switching signal, and the main control module is used to perform an aging test operation according to the test signal.

[0011] According to the aging test circuit of the embodiment of the present invention, at least the following beneficial effects are achieved: the device to be tested generates an access status signal, the third port of the main control module obtains the access status signal, the fourth port of the main control module generates and sends a card reading signal according to the access status signal, the device to be tested generates a test signal according to the card reading signal, and the second port of the main control module generates a switching signal according to the access status signal; the switch module switches the connection status between the first port of the main control module and multiple devices to be tested respectively according to the switching signal, so that the main control module obtains the test signal and completes the aging test operation according to the test signal. The aging test circuit of this embodiment can simultaneously connect multiple devices to be tested to perform aging test operations, simplifying the test operation process and thus improving the test efficiency.

[0012] According to some embodiments of the present invention, the switch module includes:

[0013] A switch chip, wherein the first pin of the switch chip is used to be electrically connected to the first port of the main control module, the first pin group of the switch chip is used to be electrically connected to the interface module, and the second pin group of the switch chip is used to be electrically connected to the second port of the main control module.

[0014] According to some embodiments of the present invention, the first pin group includes a plurality of second pins, and the interface module includes:

[0015] A plurality of connectors, one of the connectors is used to be electrically connected to one of the devices under test, a first pin of the connector is used to be electrically connected to one of the second pins of the switch chip, and a second pin of the connector is used to be electrically connected to a fourth port of the main control module.

[0016] According to some embodiments of the present invention, the interface module comprises eight of the connectors.

[0017] According to some embodiments of the present invention, the further comprising:

[0018] A sound-generating component, the sound-generating component being used to be electrically connected to the fifth port of the main control module;

[0019] The main control module is used to generate a first feedback signal according to the aging test result, and the sound-generating component is used to perform a sound-generating operation according to the first feedback signal.

[0020] According to some embodiments of the present invention, the further comprising:

[0021] a light emitting element, the light emitting element being used to be electrically connected to the fifth port of the main control module;

[0022] The main control module is used to generate a second feedback signal according to the aging test result, and the light-emitting element is used to perform a light-emitting operation according to the second feedback signal.

[0023] According to the second aspect of the present invention, the aging test system includes:

[0024] An aging test circuit according to the first embodiment of the present invention;

[0025] Multiple devices under test;

[0026] Wherein, the aging test circuit is used to perform aging test operations on a plurality of the devices under test respectively.

[0027] The aging test system according to the embodiment of the present invention has at least the following beneficial effects: the aging test system realizes simultaneous connection of multiple devices under test for aging test operation by adopting the above-mentioned aging test circuit, simplifies the test operation process, and thus improves the test efficiency.

[0028] The aging test method according to the third aspect of the present invention is applied to the aging test system according to the second aspect of the present invention, and the aging test method includes:

[0029] The main control module obtains the access status signal;

[0030] The main control module sends a card reading signal according to the access status signal, and the interface module sends the card reading signal to the device under test;

[0031] The main control module generates a switching signal according to the access status signal, and the switch module switches the connection status between the first port of the main control module and the plurality of devices under test according to the switching signal;

[0032] The main control module obtains the test signal sent by the device under test, and generates a judgment result according to the test signal;

[0033] If the determination result indicates that the device under test is normal, the main control module is executed again to generate the switching signal according to the access status signal.

[0034] According to the aging test method of the embodiment of the present invention, there are at least the following beneficial effects: the main control module obtains the access status signal to determine that the device under test is connected. After the device under test is connected, the main control module sends a card reading signal to control the device under test to generate a test signal. At the same time, the main control module generates a switching signal to control the switch module to switch the connection status between the first port of the main control module and multiple devices under test, so that the main control module can obtain the test signal and generate a judgment result according to the test signal. If the judgment result indicates that the device under test is normal, the main control module is executed again to generate a switching signal according to the access status signal. The aging test method of this embodiment realizes the simultaneous connection of multiple devices under test to perform aging test operations, simplifies the test operation process, and thus improves the test efficiency.

[0035] Additional aspects and advantages of the present invention will be given in part in the following description and in part will be obvious from the following description, or will be learned through practice of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0036] The present invention will be further described below with reference to the accompanying drawings and embodiments, wherein:

[0037] Figure 1 A module block diagram of a specific embodiment of the aging test circuit of the present invention;

[0038] Figure 2 A circuit diagram of a specific embodiment of the switch module of the present invention;

[0039] Figure 3 A circuit schematic diagram of a specific embodiment of the main control module of the present invention;

[0040] Figure 4 A circuit schematic diagram of a specific embodiment of the interface module of the present invention;

[0041] Figure 5 It is a flowchart of a specific embodiment of the aging test method of the present invention.

[0042] Reference numerals:

[0043] The device under test 100 , the interface module 200 , the switch module 300 , the main control module 400 , and the connector 210 . DETAILED DESCRIPTION

[0044] Embodiments of the present invention are described in detail below, examples of which are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are only used to explain the present invention, and cannot be understood as limiting the present invention.

[0045] In the description of the present invention, it should be understood that descriptions involving orientations, such as up, down, front, back, left, right, etc., and orientations or positional relationships indicated are based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as a limitation on the present invention.

[0046] In the description of the present invention, "several" means more than one, "many" means more than two, "greater than", "less than", "exceed", etc. are understood to exclude the number itself, and "above", "below", "within", etc. are understood to include the number itself. If there is a description of "first" or "second", it is only used for the purpose of distinguishing the technical features, and cannot be understood as indicating or implying the relative importance or implicitly indicating the number of the indicated technical features or implicitly indicating the order of the indicated technical features.

[0047] In the description of the present invention, unless otherwise clearly defined, terms such as setting, installing, connecting, etc. should be understood in a broad sense, and technicians in the relevant technical field can reasonably determine the specific meanings of the above terms in the present invention based on the specific content of the technical solution.

[0048] In the description of the present invention, the description with reference to the terms "one embodiment", "some embodiments", "illustrative embodiments", "examples", "specific examples", or "some examples" means that the specific features, structures, materials or characteristics described in conjunction with the embodiment or example are included in at least one embodiment or example of the present invention. In this specification, the schematic representation of the above terms does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described may be combined in any one or more embodiments or examples in a suitable manner.

[0049] like Figure 1 As shown, an embodiment of the present invention provides an aging test circuit, including: an interface module 200, a switch module 300 and a main control module 400. The interface module 200 is used to be electrically connected to a plurality of devices under test 100, and the devices under test 100 are used to generate access status signals; the switch module 300 is used to be electrically connected to the interface module 200; the first port of the main control module 400 is used to be electrically connected to the switch module 300, the second port of the main control module 400 is used to be electrically connected to the switch module 300, the third port of the main control module 400 and the fourth port of the main control module 400 are respectively used to be electrically connected to the interface module 200, the third port of the main control module 400 is used to obtain the access status signal, and the main control module 400 is used to generate a card reading signal and a switching signal according to the access status signal; wherein, the device under test 100 is used to generate a test signal according to the card reading signal, the switch module 300 is used to switch the connection status between the first port of the main control module 400 and the plurality of devices under test 100 according to the switching signal, and the main control module 400 is used to perform an aging test operation according to the test signal.

[0050] Specifically, the device under test 100 includes a read / write device such as an ultra-high frequency radio frequency identification (UHF RFID) device. The following is a specific description taking the device under test 100 as a UHF RFID device as an example.

[0051] After the device under test 100 is connected to the interface module 200, the device under test 100 generates an access status signal, and the third port of the main control module 400 obtains the access status signal. The main control module 400 generates a card reading signal and a switching signal according to the access status signal, and the fourth port of the main control module 400 sends a card reading signal, and the second port of the main control module 400 sends a switching signal. The device under test 100 obtains the card reading signal, and generates a test signal for aging test according to the card reading signal; the switch module 300 obtains the switching signal, and respectively switches the connection status of different devices under test 100 and the first port of the main control module 400, that is, the switch module 300 can switch the signal channel between different devices under test 100 and the first port of the main control module 400. Among them, the switch module 300 performs a signal channel switching operation every preset time, so as to switch between the signal channels of multiple devices under test 100 and the first port of the main control module 400 in turn, so as to ensure that only one device under test 100 can send a test signal to the first port of the main control module 400 at the same time.

[0052] In addition, the main control module 400 pre-saves the label data information of the device under test. After obtaining the test signal at the first port of the main control module 400, the main control module 400 compares the test signal with the label data information. If the comparison result indicates that the test signal is consistent with the label data information, it indicates that the device under test is in a normal state; if the comparison result indicates that the test signal is inconsistent with the label data information, it indicates that an aging failure has occurred in the device under test.

[0053] According to the aging test circuit of the embodiment of the present invention, the device under test 100 generates an access status signal, and the main control module 400 generates and sends a card reading signal and a switching signal according to the access status signal. The device under test 100 obtains the card reading signal, and generates a test signal according to the card reading signal; the switch module 300 obtains the switching signal, and switches the connection status between the first port of the main control module 400 and multiple devices under test 100 respectively according to the switching signal, so that the main control module 400 obtains the test signal, and the main control module 400 completes the aging test operation according to the test signal. It can be seen that the aging test circuit of this embodiment can connect multiple devices under test at the same time, and perform aging test operations on multiple devices under test in turn. Therefore, the aging test circuit provided in the embodiment of the present application simplifies the test operation process, thereby improving the efficiency of the aging test.

[0054] like Figures 1 to 3 As shown, in some specific embodiments of the present invention, the switch module 300 includes a switch chip U2. The first pin (i.e. Figure 2 The "3" pin of the switch chip U2 in the middle) is used to be electrically connected to the first port of the main control module 400, and the first pin group of the switch chip U2 (ie Figure 2The "1" pin, "2" pin, "4" pin, "5" pin, "12" pin, "13" pin, "14" pin and "15" pin of the switch chip U2 are used to be electrically connected to the interface module 200, and the second pin group of the switch chip U2 (i.e. Figure 2 The "6" pin, the "9" pin, the "10" pin and the "11" pin of the middle switch chip U2 are used to be electrically connected to the second port of the main control module 400 respectively.

[0055] Specifically, refer to Figure 3 , the first port of the main control module 400 is the "31" pin of the main control chip U1, and the second port of the main control module 400 is the "25" pin, "26" pin, "27" pin and "28" pin of the main control chip U1. The second pin group of the switch chip U2 is electrically connected to the second port of the main control module 400, wherein the "9" pin of the switch chip U2 is electrically connected to the "25" pin of the main control chip U1, the "10" pin of the switch chip U2 is electrically connected to the "26" pin of the main control chip U1, the "11" pin of the switch chip U2 is electrically connected to the "27" pin of the main control chip U1, and the "6" pin of the switch chip U2 is electrically connected to the "28" pin of the main control chip U1. The main control module 400 generates a set of switching signals through a combination of high level and low level. The second pin group of the switch chip U2 obtains the switching signal and switches the conduction state of the first pin group of the switch chip U2 and the first pin of the switch chip U2, that is, the switch chip U2 switches the connection state of multiple devices under test 100 and the "31" pin of the main control chip U1.

[0056] Table 1:

[0057] INH C B A Select the pin to be turned on 0 0 0 0 13 0 0 0 1 14 0 0 1 0 15 0 0 1 1 12 0 1 0 0 1 0 1 0 1 5 0 1 1 0 2 0 1 1 1 4 1 X X X None

[0058] As shown in Table 1, "INH" corresponds to the "6" pin of the switch chip U2, "C" corresponds to the "9" pin of the switch chip U2, "B" corresponds to the "10" pin of the switch chip U2, and "A" corresponds to the "11" pin of the switch chip U2. In the first four columns of Table 1, "0" indicates that the corresponding pin is in a low level state, "1" indicates that the corresponding pin is in a high level state, and "X" indicates that the corresponding pin is in a high level or low level state. For example, when "INH", "C", "B", and "A" are 0, 0, 0, and 0, the corresponding "13" pin of the switch chip U2 is connected to the "3" pin of the switch chip U2; when "INH", "C", "B", and "A" are 0, 1, 0, and 0, the corresponding "1" pin of the switch chip U2 is connected to the "3" pin of the switch chip U2; when "INH", "C", "B", and "A" are 1, X, X, and X, the first pin group of the switch chip U2 and the "3" pin of the switch chip U2 are disconnected.

[0059] like Figures 2 to 4 As shown, in some specific embodiments of the present invention, the first pin group includes a plurality of second pins (ie Figure 2 The interface module 200 includes: a plurality of connectors 210. One connector 210 is used to electrically connect to one device under test 100. The first pin of the connector 210 (i.e., Figure 4 The "9" pin of the connector 210 is used to be electrically connected to a second pin of the switch chip U2. The second pin of the connector 210 (i.e. Figure 4 The “10” pin of the middle connector 210 is used to be electrically connected to the fourth port of the main control module 400.

[0060] Specifically, refer to Figure 3 The third port of the main control module 400 is the "18" pin, "19" pin, "20" pin, "39" pin, "40" pin, "41" pin, "42" pin and "43" pin of the main control chip U1, and the fourth port of the main control module 400 is the "30" pin of the main control chip U1. Among them, pin "18" of the main control chip U1 is electrically connected to pin "13" of the switch chip U2, pin "19" of the main control chip U1 is electrically connected to pin "14" of the switch chip U2, pin "20" of the main control chip U1 is electrically connected to pin "15" of the switch chip U2, pin "39" of the main control chip U1 is electrically connected to pin "12" of the switch chip U2, pin "40" of the main control chip U1 is electrically connected to pin "1" of the switch chip U2, pin "41" of the main control chip U1 is electrically connected to pin "5" of the switch chip U2, pin "42" of the main control chip U1 is electrically connected to pin "2" of the switch chip U2, and pin "43" of the main control chip U1 is electrically connected to pin "4" of the switch chip U2.

[0061] After the device under test 100 is connected to the interface module 200, the device under test 100 generates an access status signal, the first pin of the connector 210 outputs the access status signal, the first pin of the connector 210 is electrically connected to a second pin of the switch chip U2, and the third port of the main control module 400 receives the access status signal through the first pin group of the switch chip U2. After the third port of the main control module 400 obtains the access status signal, the main control module 400 generates a card reading signal, the second pin group of the switch chip U2 obtains the card reading signal, and sends it to the input end of the device under test 100 to control the output end of the device under test 100 to generate a test signal.

[0062] like Figures 2 to 4As shown, in some specific embodiments of the present invention, the interface module 200 includes eight connectors 210 .

[0063] Specifically, each connector 210 is electrically connected to a device under test 100, and a first pin of a connector 210 is electrically connected to a second pin of the switch chip U2. The switch chip U2 switches the conduction state of the first pin group of the switch chip U2 and the first pin of the switch chip U2 according to the switching signal, that is, the switch chip U2 can switch the connection state between the first port of the main control module 400 and the first pins of multiple connectors 210, so as to control the main control module 400 to sequentially obtain the test signals sent by eight different devices under test 100.

[0064] like Figure 3 As shown, in some specific embodiments of the present invention, the aging test circuit further includes: a sound generator. The sound generator is used to communicate with the fifth port (i.e. Figure 2 The "11" pin, "12" pin, "13" pin, "14" pin, "15" pin, "16" pin, "17" pin and "29" pin of the middle switch chip U2 are electrically connected; wherein, the main control module 400 is used to generate a first feedback signal according to the aging test result, and the sounding component is used to perform a sounding operation according to the first feedback signal.

[0065] Specifically, the sounding component includes a buzzer and other sounding devices. The main control module 400 performs an aging test operation, and the main control module 400 generates a first feedback signal according to the aging test result. The fifth port of the main control module 400 sends the first feedback signal, and the first feedback signal consists of eight high and low level signals. The sounding component performs a sounding operation according to the first feedback signal to prompt that the device under test 100 has an aging fault.

[0066] like Figure 3 As shown, in some specific embodiments of the present invention, the aging test circuit further includes: a light emitting element. The light emitting element is used to communicate with the fifth port (i.e. Figure 2 The "11" pin, "12" pin, "13" pin, "14" pin, "15" pin, "16" pin, "17" pin and "29" pin of the middle switch chip U2 are electrically connected; wherein, the main control module 400 is used to generate a second feedback signal according to the aging test result, and the light-emitting component is used to perform a light-emitting operation according to the second feedback signal.

[0067] Specifically, the light-emitting element includes a light-emitting device such as an LED lamp. The main control module 400 performs an aging test operation, and the main control module 400 generates a second feedback signal according to the aging test result. The fifth port of the main control module 400 sends the second feedback signal, and the second feedback signal consists of eight high and low level signals. The sound-emitting element performs a light-emitting operation according to the second feedback signal to prompt that the device under test 100 has an aging fault.

[0068] The embodiment of the present invention further provides an aging test system, which comprises: a plurality of devices to be tested and an aging test circuit as described in the above embodiment, wherein the aging test circuit is used to perform aging test operations on the plurality of devices to be tested respectively.

[0069] According to the aging test system of the embodiment of the present invention, by adopting the above-mentioned aging test circuit, multiple devices under test can be connected simultaneously to perform aging test operations, which simplifies the test operation process and improves the test efficiency.

[0070] like Figure 1 , Figure 5 As shown, an embodiment of the present invention further provides an aging test method, which is applied to the aging test system described in the above embodiment, and the aging test method includes the steps of:

[0071] S100, the main control module obtains an access status signal;

[0072] S200, the main control module sends a card reading signal according to the access status signal, and the interface module sends the card reading signal to the device under test;

[0073] S300, the main control module generates a switching signal according to the access status signal, and the switch module switches the connection status between the first port of the main control module and the multiple devices under test according to the switching signal;

[0074] S400, the main control module obtains a test signal sent by the device under test, and generates a judgment result according to the test signal;

[0075] S500: If the judgment result indicates that the device under test is normal, execute step S300 again.

[0076] Specifically, the third port of the main control module 400 obtains the access status signal generated by the device under test 100 to determine the access status of the device under test 100. After the device under test 100 is connected, the main control module 400 generates a card reading signal, and the interface module 200 sends the card reading signal to the device under test 100 to control the device under test 100 to generate a test signal. After the main control module 400 generates a switching signal, the switch module 300 switches the connection status between the first port of the main control module 400 and the multiple devices under test 100 according to the switching signal, and opens the signal channel between the device under test 100 that is first connected and the first port of the main control module 400, so that the first port of the main control module 400 can obtain the test signal. The main control module 400 pre-stores the label data information of the device under test. After obtaining the test signal at the first port of the main control module 400, the main control module 400 compares the test signal with the label data information. If the comparison result indicates that the test signal is consistent with the label data information, it indicates that the device under test is in a normal state; if the comparison result indicates that the test signal is inconsistent with the label data information, it indicates that an aging failure has occurred in the device under test.

[0077] If the judgment result indicates that the device under test 100 is normal, the main control module 400 generates a switching signal to switch the connection state between another device under test 100 and the first port of the main control module 400, so as to perform the aging test cyclically among the multiple devices under test 100. If the judgment result indicates that the device under test 100 has an aging failure, the fifth port of the main control module 400 sends a feedback signal, the sounding component or the light-emitting component obtains the feedback signal, and performs an alarm operation to prompt that the device under test 100 has an aging failure.

[0078] According to the aging test method of the embodiment of the present invention, the main control module 400 obtains the access status signal to determine that the device under test 100 is connected. After the device under test 100 is connected, the main control module 400 sends a card reading signal to control the device under test 100 to generate a test signal. At the same time, the main control module 400 generates a switching signal to control the switch module 300 to switch the connection status between the first port of the main control module 400 and multiple devices under test 100, so that the main control module 400 can obtain the test signal and generate a judgment result according to the test signal. If the judgment result indicates that the device under test 100 is normal, the main control module 400 is executed again to generate a switching signal according to the access status signal. The aging test method of this embodiment realizes the simultaneous connection of multiple devices under test to perform aging test operations, simplifies the test operation process, and thus improves the test efficiency.

[0079] The embodiments of the present invention are described in detail above in conjunction with the accompanying drawings, but the present invention is not limited to the above embodiments. Various changes can be made within the knowledge of ordinary technicians in the relevant technical field without departing from the purpose of the present invention. In addition, the embodiments of the present invention and the features in the embodiments can be combined with each other without conflict.

Claims

1. Aging test circuit, characterized in that, include: An interface module, the interface module is used to be electrically connected to a plurality of devices under test; wherein the devices under test are used to generate access status signals; A switch module, the switch module is used to be electrically connected to the interface module; A main control module, wherein the first port of the main control module is used to be electrically connected to the switch module, the second port of the main control module is used to be electrically connected to the switch module, and the third port of the main control module and the fourth port of the main control module are respectively used to be electrically connected to the interface module; wherein the third port of the main control module is used to obtain the access status signal, and the main control module is used to generate a card reading signal and a switching signal according to the access status signal; Among them, the device under test is used to generate a test signal according to the card reading signal, the switch module is used to switch the connection status between the first port of the main control module and multiple devices under test according to the switching signal, and the main control module is used to perform an aging test operation according to the test signal.

2. The aging test circuit according to claim 1, characterized in that: The switch module comprises: A switch chip, wherein the first pin of the switch chip is used to be electrically connected to the first port of the main control module, the first pin group of the switch chip is used to be electrically connected to the interface module, and the second pin group of the switch chip is used to be electrically connected to the second port of the main control module.

3. The aging test circuit according to claim 2, characterized in that: The first pin group includes a plurality of second pins, and the interface module includes: A plurality of connectors, one of the connectors is used to be electrically connected to one of the devices under test, a first pin of the connector is used to be electrically connected to one of the second pins of the switch chip, and a second pin of the connector is used to be electrically connected to a fourth port of the main control module.

4. The aging test circuit according to claim 3, characterized in that: The interface module includes eight of the connectors.

5. The aging test circuit according to any one of claims 1 to 4, characterized in that: Also includes: A sound-generating component, the sound-generating component being used to be electrically connected to the fifth port of the main control module; The main control module is used to generate a first feedback signal according to the aging test result, and the sound-generating component is used to perform a sound-generating operation according to the first feedback signal.

6. The aging test circuit according to any one of claims 1 to 4, characterized in that: Also includes: a light emitting element, the light emitting element being used to be electrically connected to the fifth port of the main control module; The main control module is used to generate a second feedback signal according to the aging test result, and the light-emitting element is used to perform a light-emitting operation according to the second feedback signal.

7. Aging test system, characterized in that, include: The aging test circuit as claimed in any one of claims 1 to 6; Multiple devices under test; Wherein, the aging test circuit is used to perform aging test operations on a plurality of the devices under test respectively.

8. Aging test method, characterized in that: Applied to the aging test system as claimed in claim 7, the aging test method comprises: The main control module obtains the access status signal; The main control module sends a card reading signal according to the access status signal, and the interface module sends the card reading signal to the device under test; The main control module generates a switching signal according to the access status signal, and the switch module switches the connection status between the first port of the main control module and the plurality of devices under test according to the switching signal; The main control module obtains the test signal sent by the device under test, and generates a judgment result according to the test signal; If the determination result indicates that the device under test is normal, the main control module is executed again to generate the switching signal according to the access status signal.

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