Test device and method of operation thereof

Abstract

A testing device and its operation method, the testing device includes a reference test board, a first storage unit, a component to be tested and a control unit. The first storage unit stores preset testing parameters. The control unit has a second storage unit. The control unit performs a first test on the reference test board to obtain a first test result generated by the reference test board and stores the first test result in the second storage unit. The control unit reads the preset testing parameters of the first storage unit and the identification code of the component to be tested to determine whether to perform a second test on the component to be tested. The application can effectively increase the testing safety, the testing yield and the convenience in use.

Description

Technical Field

[0001] This invention relates to a testing apparatus, and more particularly to a testing apparatus and its operating method. Background Technology

[0002] Generally, test specifications in testing equipment are set and stored manually by the tester. However, manual input is prone to errors, and incorrect test specifications can reduce the yield rate of tested products. On the other hand, test specifications in testing equipment may also be modified or relaxed for various reasons (such as poor yield rate), resulting in compromised product quality and raising concerns about test safety.

[0003] Therefore, how to effectively increase the testing safety, test yield, and ease of use of testing equipment is an important current issue. Summary of the Invention

[0004] This invention provides a testing device and its operating method, thereby increasing testing safety, test yield, and ease of use.

[0005] This invention provides a testing apparatus, including a benchmark test board, a first storage unit, a device under test (DUT), and a control unit. The first storage unit stores preset test parameters. The control unit has a second storage unit. The control unit performs a first test on the benchmark test board to obtain a first test result generated by the benchmark test board and stores the first test result in the second storage unit. The control unit reads the preset test parameters and the identification code of the DUT from the first storage unit to determine whether to perform a second test on the DUT.

[0006] This invention provides an operating method for a testing device, comprising the following steps: providing a benchmark test board; providing a first storage unit for storing preset test parameters; providing a component under test (DUT); performing a first test on the benchmark test board via a control unit to obtain a first test result generated by the benchmark test board, and storing the first test result in a second storage unit; and reading the preset test parameters and the identification code of the DUT from the first storage unit to determine whether to perform a second test on the DUT.

[0007] The testing apparatus and its operating method disclosed in this invention perform a first test on a benchmark test board through a control unit to obtain a first test result generated by the benchmark test board. The first test result is then stored in a second storage unit of the control unit. The control unit reads preset test parameters and the identification code of the component under test from the first storage unit to determine whether to perform a second test on the component under test. This effectively increases test safety, test yield, and ease of use. Attached Figure Description

[0008] Figure 1 This is a schematic diagram of a testing apparatus according to an embodiment of the present invention.

[0009] Figure 2 This is a schematic diagram of a test apparatus according to another embodiment of the present invention.

[0010] Figure 3 This is a flowchart of the operation method of a testing apparatus according to an embodiment of the present invention.

[0011] Figure 4 This is a flowchart of an operation method of a testing apparatus according to another embodiment of the present invention.

[0012] [Symbol Explanation]

[0013] 100, 200: Testing equipment

[0014] 110: Benchmark Board

[0015] 120: First storage unit

[0016] 130: Component under test

[0017] 140: Control Unit

[0018] 141: Second storage unit

[0019] 210: Data Collection Unit

[0020] 220: Test Host

[0021] S302~S312, S402~S406: Steps Detailed Implementation

[0022] In the embodiments listed below, the same or similar elements or components will be represented by the same reference numerals.

[0023] Figure 1 This is a schematic diagram of a testing apparatus according to an embodiment of the present invention. Please refer to... Figure 1 The test apparatus 100 may include a reference test board 110, a first storage unit 120, a device under test 130, and a control unit 140.

[0024] A benchmark test element can be set on the benchmark test board 110, and the test results of the benchmark test element can be used as the test specification standard of the component under test 130.

[0025] The first storage unit 120 can store preset test parameters. In this embodiment, the first storage unit 120 can be a random access memory, flash memory, hard disk, USB flash drive, or solid-state drive, etc., but the embodiments of the present invention are not limited to these. In addition, the preset test parameters include, for example, a preset test time, a preset number of test passes, and a preset identification code. Furthermore, the preset identification code can be stored in a lookup table, for example.

[0026] The control unit 140 may have a second storage unit 141. In this embodiment, the control unit 140 may be a microcontroller (MCU), but the embodiments of the present invention are not limited thereto. The second storage unit 141 may be random access memory, flash memory, etc., but the embodiments of the present invention are not limited thereto.

[0027] The control unit 140 can perform a first test on the benchmark board 110 to obtain a first test result generated by the benchmark board 110, and store the first test result in the second storage unit 141. For example, the control unit 140 can execute a first test program to perform a first test on the benchmark element on the benchmark board 110. Then, the benchmark board 110 can generate a first test result corresponding to the benchmark element. Afterwards, the control unit 140 can obtain the first test result from the benchmark board 110 and store the first test result in the second storage unit 141.

[0028] In this embodiment, the first test result may include, for example, temperature, humidity, and electrical characteristic parameters, but the embodiments of the present invention are not limited thereto. Furthermore, in some embodiments, the control unit 140 may directly store the first test result in the second storage unit 141. In some embodiments, the control unit 140 may perform calculations on the first test result (e.g., add a preset error amount to the first test result) and store the calculated first test result in the second storage unit 141.

[0029] For example, assuming the first test result is a temperature of 25 degrees Celsius, the control unit 140 stores the first test result of 25 degrees Celsius in the second storage unit 141, or the control unit 140 adds a preset error amount (e.g., ±2 degrees Celsius) to the first test result of 25 degrees Celsius and stores the calculated first test result (e.g., 23 to 27 degrees Celsius) in the second storage unit 141. Assuming the first test result is a temperature of 30 degrees Celsius, the control unit 140 stores the first test result of 30 degrees Celsius in the second storage unit 141, or the control unit 140 adds a preset error amount (e.g., ±2 degrees Celsius) to the first test result of 30 degrees Celsius and stores the calculated first test result (e.g., 28 to 32 degrees Celsius) in the second storage unit 141. The rest follow the same logic.

[0030] Furthermore, the storage method for the first test result, which is a humidity or electrical characteristic parameter, can be referred to the above description, and therefore will not be repeated here. In addition, the first test result stored in the second storage unit 141 can be used as the test specification standard for the device under test 130. This effectively avoids human error in inputting test specification standards or human modification of test specification standards, thereby increasing test safety, yield rate, and ease of use.

[0031] After storing the first test result generated by the benchmark test board 110 in the second storage unit 141, the control unit 110 can read the preset test parameters of the first storage unit 120 and the identification code of the component under test 130, and decide whether to perform a second test on the component under test 130 based on the preset test parameters of the first storage unit 120 and the identification code of the component under test 130.

[0032] In this embodiment, the control unit 140 can further obtain the current test time and the current number of test successes from the first storage unit 120. The current test time is, for example, the actual standard time for the test device 100 to prepare to test the component under test 130, and the current number of test successes is, for example, the number of times the test device 100 has tested the component under test 130 and the number of components under test 130 that have passed the test.

[0033] Next, the control unit 140 can compare whether the current test time exceeds the preset test time, compare whether the current number of passed tests reaches the preset number of passed tests, and compare whether the identification code matches the preset identification code, in order to decide whether to perform a second test on the component 130 under test.

[0034] For example, suppose the preset test time is "23:59:59 on December 5, 2020", the preset number of successful tests is "1000", and the preset identification code is "K1", but this embodiment of the invention is not limited to this. Users can also adjust the preset test time, preset number of successful tests, and preset identification code according to their needs, all of which fall within the protection scope of this invention. When the control unit 140 obtains the current test time, the control unit 140 can compare the current test time with the preset test time to determine whether the current test time exceeds the preset test time. Suppose the current test time is "10:30:05 on December 3, 2020", the control unit 140 can determine that the current test time has not exceeded the preset test time. Suppose the current test time is "14:05:10 on December 7, 2020", the control unit 140 can determine that the current test time has exceeded the preset test time.

[0035] When the control unit 140 obtains the current number of passed tests, it can compare the current number with the preset number to determine whether the current number has reached the preset number. For example, if the current number of passed tests is "800", the control unit 140 can determine that the previous number of passed tests has not reached the preset number. If the current number of passed tests is "1000", the control unit 140 can determine that the current test time has exceeded the preset number.

[0036] When the control unit 140 obtains the identification code of the component under test 130, it can compare the identification code with a preset identification code to determine whether the identification code of the component under test 130 matches the preset identification code, that is, whether the component under test 130 meets the requirements for legitimate identification testing. This prevents the testing device 100 from testing an illegitimate component under test 130. For example, if the identification code of the component under test 130 is "A2", the control unit 140 can determine that the identification code does not match the preset identification code. Conversely, if the identification code of the component under test 130 is "K1", the control unit 140 can determine that the identification code matches the preset identification code.

[0037] Next, when the control unit 140 determines that the current test time exceeds the preset test time, the current number of passed tests reaches the preset number of passed tests, or the identification code does not match the preset identification code, the control unit 140 decides not to perform a second test on the component 130 under test. In other words, if the control unit 140 confirms that one of the current test time, the current number of passed tests, or the identification code has failed, the control unit 140 will not perform the test. In this way, the test time, the number of components tested, and the validity of the components can be effectively controlled by the testing device 100, thereby increasing ease of use.

[0038] On the other hand, when the control unit 140 determines that the current test time has not exceeded the preset test time, the current number of passed tests has not reached the preset number of passed tests, and the identification code of the component under test 130 matches the preset identification code, the control unit 140 decides to perform a second test on the component under test 130. In other words, the control unit 140 will only perform a second test on the component under test 130 when it confirms that the current test time, the current number of passed tests, and the identification code have all passed.

[0039] Subsequently, when the control unit 140 determines that a second test can be performed on the device under test 130, the control unit 140 may, for example, execute a second test procedure to perform a second test on the device under test 130. Then, the device under test 130 can generate a corresponding second test result. Afterwards, the control unit 140 can obtain the second test result from the device under test 130.

[0040] After obtaining the second test result, the control unit 140 can read the first test result from the second storage unit 141. Then, the control unit 140 can compare the second test result with the first test result to determine the test status of the component under test 130.

[0041] For example, assuming a temperature test, the first test result stored in the second storage unit 141 is 25 degrees Celsius, or the first test result after processing stored in the second storage unit 141 is 23-27 degrees Celsius. Then, when the control unit 140 obtains the second test result, it can compare the second test result with the first test result (e.g., 25 degrees Celsius or 23-27 degrees Celsius) to determine the test status of the component under test 130. When the control unit 140 determines that the temperature corresponding to the second test result is 25 degrees Celsius or falls within the range of 23-27 degrees Celsius, the control unit 140 can determine that the test status of the component under test 130 is "pass". When the control unit 140 determines that the temperature corresponding to the second test result is not 25 degrees Celsius or does not fall within the range of 23-27 degrees Celsius, the control unit 140 can determine that the test status of the component under test 130 is "fail". Furthermore, the comparison method between the first and second test results for humidity or electrical characteristic parameters can be referred to the above explanation, and will not be repeated here.

[0042] In this embodiment, the first storage unit 120 and the benchmark test board 110 are, for example, detachably disposed in the test apparatus 100. That is, the user can replace the first storage unit 120 and / or the benchmark test board 110 in the test apparatus 100 as needed to update the preset test parameters and / or the first test results, thereby testing various types of components under test 130, which can effectively increase the convenience of use.

[0043] In some embodiments, the user may also store a preset test specification in the first storage unit 120. Furthermore, after the control unit 140 obtains the first test result and stores it in the second storage unit 141, the control unit 140 can compare the preset test specification with the first test result to determine whether the preset test specification is appropriate.

[0044] When the control unit 140 compares the preset test specifications with the first test result, the control unit 140 determines that the preset test specifications are appropriate. When the control unit 140 compares the preset test specifications with the first test result, the control unit 140 determines that the preset test specifications are inappropriate and can issue an alarm signal to inform the user that the preset specifications are inappropriate. In other words, if the control unit 140 still tests the component under test 130 according to the inappropriate preset test specifications, it may cause all test states of the component under test 130 to be unsuccessful, resulting in a low test yield.

[0045] Therefore, the control unit 140 can test the component under test 130 based on the first test result generated by the benchmark test board 110. In this way, no matter how the test environment changes, the test specifications (such as the first test result generated by the benchmark test board 110) can be dynamically changed to meet the current situation, thereby effectively increasing the yield rate of the test and the convenience of use.

[0046] Figure 2 This is a schematic diagram of a testing apparatus according to another embodiment of the present invention. Please refer to... Figure 2 The testing apparatus 200 may include a benchmark test board 110, a first storage unit 120, a device under test (DUT) 130, a control unit 140, a data collection unit 210, and a test host 220. In this embodiment, the benchmark test board 110, the first storage unit 120, the DUT 130, and the control unit 140 are connected to the test host 220. Figure 1 The components including the benchmark board 110, the first storage unit 120, the device under test 130, and the control unit 140 are the same or similar, and can be referenced. Figure 1 The embodiments are described in detail here, so they will not be repeated here.

[0047] The data collection unit 210 can collect production data of the device under test 130. In this embodiment, the data collection unit 210 may include a sorting machine (handler) or a probe tester (prober), but the embodiments of the present invention are not limited to these. In addition, the production data may include information such as the quantity, number, pass or fail of the device under test 130, but the embodiments of the present invention are not limited to these.

[0048] The test host 220 can obtain production data from the data collection unit 210 and store the production data in the first storage unit 110 via the control unit 140. The user can then read the production data from the first storage unit 110 to obtain relevant information about the component under test 130. Alternatively, the user can remove the first storage unit 110 and install it in another electronic device, and then read the production data from the first storage unit 110 through that other electronic device to obtain relevant information about the component under test 130.

[0049] exist Figure 1 or Figure 2 In the illustration, the number of components under test 130 is shown as one, but the embodiments of the present invention are not limited to this. The number of components under test 130 may also be two or more, and the testing methods for two or more components under test can be referred to Figure 1 or Figure 2 The embodiments are described in detail here, so they will not be repeated here.

[0050] Based on the above description, the present invention provides a method for operating a testing device. Figure 3 This is a flowchart of an operation method of a testing apparatus according to an embodiment of the present invention. In step S302, a reference test board is provided. In step S304, a first storage unit is provided to store preset test parameters. In step S306, the device under test is provided.

[0051] In step S308, a control unit is provided, which has a second storage unit. In step S310, the control unit performs a first test on the reference test board to obtain a first test result generated by the reference test board, and stores the first test result in the second storage unit. In step S312, the control unit reads the preset test parameters and the identification code of the component under test from the first storage unit to determine whether to perform a second test on the component under test. In this embodiment, the preset test parameters include a preset test time, a preset number of test passes, and a preset identification code. The first test result includes temperature, humidity, and electrical characteristic parameters. The first storage unit and the reference test board are pluggably disposed in the testing device.

[0052] Figure 4 This is a flowchart of an operation method of a testing apparatus according to another embodiment of the present invention. In this embodiment, steps S302 to S312 are... Figure 3 Steps S302 to S312 are the same or similar, and can be referred to Figure 3 The embodiments are described in detail here, so they will not be repeated here.

[0053] In step S402, when the control unit decides to perform a second test on the component under test, the control unit performs the second test on the component under test to obtain the second test result. In step S404, the control unit compares the second test result with the first test result to determine the test status of the component under test. In step S406, when the control unit decides not to perform a second test on the component under test, the control unit does not perform the second test on the component under test.

[0054] It is worth noting that, Figure 3 and Figure 4The order of the steps described is for illustrative purposes only and is not intended to limit the order of steps in the embodiments of the present invention. The order of the steps described above can be changed by the user as needed. Furthermore, additional steps can be added or fewer steps can be used without departing from the spirit and scope of the present invention.

[0055] In summary, the testing apparatus and its operating method disclosed in this invention perform a first test on a benchmark test board through a control unit to obtain a first test result generated by the benchmark test board. This first test result is then stored in a second storage unit of the control unit. The control unit reads preset test parameters and the identification code of the component under test (DUT) from the first storage unit to determine whether to perform a second test on the DUT. Furthermore, the control unit in this embodiment can further perform a second test on the DUT to obtain a second test result, and compare this second test result with the first test result to determine the test status of the DUT. This effectively increases test safety, test yield, and ease of use.

[0056] Although the present invention has been disclosed above with reference to embodiments, it is not intended to limit the scope of the present invention. Any person skilled in the art can make some modifications and refinements without departing from the spirit and scope of the present invention. Therefore, the scope of protection of the present invention shall be determined by the claims.

Claims

1. A testing device, characterized in that, include: A benchmark test board; The first storage unit stores a preset test parameter; One device under test; as well as A control unit has a second storage unit. The control unit performs a first test on the benchmark test board to obtain a first test result generated by the benchmark test board and stores the first test result in the second storage unit. The control unit reads the preset test parameters in the first storage unit and an identification code of the component under test to determine whether to perform a second test on the component under test.

2. The testing apparatus according to claim 1, characterized in that, When the control unit decides to perform the second test on the device under test, the control unit performs the second test on the device under test to obtain a second test result of the device under test, and compares the second test result with the first test result to determine a test state of the device under test.

3. The testing apparatus according to claim 1, characterized in that, The preset test parameters include a preset test time, a preset number of test passes, and a preset identification code.

4. The testing apparatus according to claim 3, characterized in that, The control unit further obtains a current test time and a current number of test passes. The control unit compares whether the current test time exceeds the preset test time, compares whether the current number of test passes reaches the preset number of test passes, and compares whether the identification code matches the preset identification code, in order to decide whether to perform the second test on the component under test.

5. The testing apparatus according to claim 4, characterized in that, When the current test time does not exceed the preset test time, the current number of passed tests does not reach the preset number of passed tests, and the identification code matches the preset identification code, the control unit decides to perform the second test on the component under test. When the current test time exceeds the preset test time, the current number of passed tests reaches the preset number of passed tests, or the identification code does not match the preset identification code, the control unit decides not to perform the second test on the component under test.

6. The testing apparatus according to claim 1, characterized in that, The first test result includes a temperature, a humidity, and an electrical characteristic parameter.

7. The testing apparatus according to claim 1, characterized in that, Including: A data collection unit collects production data of the component under test; and A test host acquires the production data and stores the production data in the first storage unit.

8. The testing apparatus according to claim 1, characterized in that, The first storage unit and the benchmark test board are pluggably disposed in the test device.

9. A method for operating a testing device, characterized in that, include: Provide a benchmark board; Provide a first storage unit to store a preset test parameter; Provide a device under test; A control unit is provided, having a second storage unit; The control unit performs a first test on the benchmark test board to obtain a first test result generated by the benchmark test board, and stores the first test result in the second storage unit; as well as The control unit reads the preset test parameters from the first storage unit and an identification code of the component under test to determine whether to perform a second test on the component under test.

10. The method of operating the testing device according to claim 9, characterized in that, Including: When the control unit decides to perform the second test on the component under test, the control unit performs the second test on the component under test to obtain a second test result for the component under test; and The control unit compares the second test result with the first test result to determine a test state of the component under test.

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