Time delay calibration device, oscilloscope, time delay calibration system and time delay calibration method

Abstract

An embodiment of the present application provides a time delay calibration device, an oscilloscope, a time delay calibration system, and a time delay calibration method. The time delay calibration device includes: a source signal supply module, a source signal processing module, and a fan-out module. The source signal supply module is connected to the source signal processing module and is used to provide a source signal to the source signal processing module. The source signal processing module is used to generate a time delay calibration signal based on the source signal and output the time delay calibration signal to the fan-out module. The fan-out module is used to perform fan-out processing on the time delay calibration signal to obtain a plurality of output signals for output to the outside of the time delay calibration device. In this way, time delay calibration can be achieved simultaneously for multiple probes, facilitating user operation and saving time delay calibration time. Compared with using a general signal source for time delay calibration, it can better meet the time delay calibration requirements and improve the accuracy of time delay calibration.

Description

Technical Field

[0001] The present invention relates to the technical field of oscilloscopes, and in particular to a time delay calibration device, an oscilloscope, a time delay calibration system and a time delay calibration method. Background Art

[0002] In the application of oscilloscopes, except for some radio frequency (RF) or high-speed digital applications where cables are used to directly measure the signal to be tested, most of the debugging work on the board is done with the help of probes. The probe is a device that connects and inputs the signal to be tested to the oscilloscope, and its performance is crucial to the accuracy of the measurement results.

[0003] One end of the probe is connected to the signal to be measured, and the other end is connected to the channel of the oscilloscope. When multiple signals need to be tested at the same time, multiple probes need to be connected to the multiple channels of the oscilloscope respectively. When different types of probes are used to connect multiple channels of the oscilloscope, or when the delay requirements for the multiple signals to be measured displayed on the oscilloscope are high, it is necessary to calibrate the delay of multiple probes before use. At present, the probe delay is generally calibrated through an oscilloscope. The oscilloscope itself has a signal source. One signal detects the signal source through the probe and is transmitted to one channel of the oscilloscope, and the other signal is directly connected from the signal source to another channel of the oscilloscope. If the probe has a delay, the waveforms of the two signals displayed on the oscilloscope are not aligned. By comparing the waveforms of the two signals displayed on the oscilloscope, the signal detected and transmitted by the probe is calibrated.

[0004] However, the oscilloscope's own signal source is very limited, with few signal source channels, and cannot achieve simultaneous calibration of multiple probes, making it increasingly difficult to meet users' actual calibration needs. Summary of the invention

[0005] In view of this, embodiments of the present application provide a delay calibration device, an oscilloscope, a delay calibration system and a delay calibration method to solve at least one problem existing in the background technology.

[0006] In a first aspect, an embodiment of the present application provides a delay calibration device, comprising: a source signal supply module, a source signal processing module, and a fan-out module; wherein:

[0007] The source signal supply module is connected to the source signal processing module and is used to provide a source signal to the source signal processing module;

[0008] The source signal processing module is used to generate a delay calibration signal based on the source signal, and output the delay calibration signal to the fan-out module;

[0009] The fan-out module is used to perform fan-out processing on the delay calibration signal to obtain a multi-channel output signal for outputting to the outside of the delay calibration device.

[0010] In combination with the first aspect of the present application, in an alternative embodiment, the source signal supply module includes a voltage-controlled oscillator and / or a source signal input interface; wherein,

[0011] The voltage-controlled oscillator is used to generate the source signal;

[0012] The source signal input interface is used to connect to an external signal source disposed outside the delay calibration device to provide the source signal generated by the external signal source to the source signal processing module.

[0013] In combination with the first aspect of the present application, in an alternative embodiment, the source signal supply module includes the voltage-controlled oscillator and the source signal input interface; the delay calibration device further includes:

[0014] A first control switch, configured to select, based on a user instruction, to provide the source signal generated by the voltage-controlled oscillator to the source signal processing module, or to provide the source signal generated by the external signal source accessed through the source signal input interface to the source signal processing module.

[0015] In combination with the first aspect of the present application, in an alternative embodiment, the source signal processing module includes a frequency division circuit and a shaping circuit; wherein,

[0016] The frequency division circuit is used to divide the frequency of the source signal to generate a frequency-divided signal;

[0017] The shaping circuit is used to shape the frequency-divided signal to generate the delay calibration signal.

[0018] In combination with the first aspect of the present application, in an alternative embodiment, the delay calibration signal is a square wave signal, and the rising edge time of the square wave signal is less than a preset duration threshold; wherein, the preset duration threshold is set according to the delay calibration requirement.

[0019] In combination with the first aspect of the present application, in an alternative embodiment, the delay calibration device further includes:

[0020] A second control switch, configured to control, based on a user instruction, the frequency division circuit to operate in a single-frequency calibration mode or a multi-frequency calibration mode;

[0021] In the single-frequency calibration mode, the frequency division ratio of the frequency division circuit remains unchanged during one delay calibration of the delay calibration device;

[0022] In the multi-frequency calibration mode, the frequency division ratio of the frequency division circuit is switched at least once during one delay calibration of the delay calibration device.

[0023] In combination with the first aspect of the present application, in an alternative embodiment, the obtained multi-channel output signals include at least a pair of differential signals;

[0024] The fan-out module is specifically configured to convert a single-ended delay calibration signal into at least a pair of differential signals through fan-out processing.

[0025] In combination with the first aspect of the present application, in an alternative embodiment, the delay calibration device further includes: a delay calibration communication module and a delay calibration control module; wherein,

[0026] The delay calibration communication module is configured to receive delay data sent by an oscilloscope;

[0027] The delay calibration control module is configured to determine whether the delay calibration is completed according to the delay data.

[0028] In combination with the first aspect of the present application, in an alternative embodiment, the delay calibration control module is specifically configured to: determine that the delay calibration is completed when the delay data meets a preset condition; determine that the delay calibration is not completed when the delay data does not meet the preset condition;

[0029] After determining that the delay calibration is not completed, the delay calibration control module is further configured to: control the delay calibration communication module to send information to the oscilloscope, where the information is used to instruct the oscilloscope to perform delay calibration again; after the delay calibration communication module receives the delay data corresponding to the repeated delay calibration sent by the oscilloscope, determine whether the delay calibration is completed according to the delay data corresponding to the repeated delay calibration.

[0030] In a second aspect, an embodiment of the present application provides an oscilloscope, including: a plurality of channels for connecting to a probe, an oscilloscope communication module for communicating with the delay calibration device in any of the foregoing embodiments, and an oscilloscope control module; wherein,

[0031] The oscilloscope control module is configured to obtain a calibration instruction sent by the delay calibration device through the oscilloscope communication module and control the progress of the delay calibration process, and control the oscilloscope communication module to send delay data to the delay calibration device.

[0032] In a third aspect, an embodiment of the present application provides a delay calibration system, including: an oscilloscope, a probe, and a delay calibration device in any of the foregoing embodiments.

[0033] In a fourth aspect, an embodiment of the present application provides a delay calibration system, including: an oscilloscope and a delay calibration device in any of the foregoing embodiments; wherein,

[0034] The time delay calibration device and the oscilloscope are encapsulated in the same housing; a port of the time delay calibration device for connecting to one end of the probe and a socket of the channel of the oscilloscope for connecting to the other end of the probe are provided on the housing.

[0035] In a fifth aspect, an embodiment of the present application provides a time delay calibration method applied to a time delay calibration device. The method includes:

[0036] Generating a time delay calibration signal based on a source signal;

[0037] Performing a fan-out process on the time delay calibration signal to obtain multiple output signals and outputting the multiple output signals outside the time delay calibration device;

[0038] Receiving time delay data sent by an oscilloscope;

[0039] Determining whether the time delay calibration is completed according to the time delay data.

[0040] Combined with the fifth aspect of the present application, in an optional implementation manner, before generating the time delay calibration signal based on the source signal, the method further includes:

[0041] Generating a source signal based on a voltage-controlled oscillator provided inside the time delay calibration device; or,

[0042] Receiving a source signal generated by an external signal source provided outside the time delay calibration device.

[0043] Combined with the fifth aspect of the present application, in an optional implementation manner, before generating the time delay calibration signal based on the source signal, the method further includes:

[0044] Selecting, based on a user instruction, to provide the source signal generated by the voltage-controlled oscillator to the source signal processing module, or to provide the source signal generated by the external signal source accessed through the source signal input interface to the source signal processing module.

[0045] Combined with the fifth aspect of the present application, in an optional implementation manner, generating the time delay calibration signal based on the source signal includes:

[0046] Dividing the source signal to generate a divided-frequency signal;

[0047] Shaping the divided-frequency signal to generate the time delay calibration signal.

[0048] Combined with the fifth aspect of the present application, in an optional implementation manner, the time delay calibration signal is a square wave signal, and the rising edge time of the square wave signal is less than a preset duration threshold; wherein, the preset duration threshold is set according to the time delay calibration requirement.

[0049] In connection with the fifth aspect of the present application, in an alternative embodiment, determining whether to complete the delay calibration based on the delay data includes:

[0050] In response to receiving a first instruction from the user, determining whether to complete the delay calibration based on the delay data corresponding to the first output signal sent by the oscilloscope; wherein the first output signal is a signal obtained by performing frequency division with an unchanged frequency division ratio on the source signal and then undergoing the shaping and fan-out processing;

[0051] In response to receiving a second instruction from the user, determining whether to complete the delay calibration based on at least the delay data corresponding to the second output signal sent by the oscilloscope in a first time period and the delay data corresponding to the third output signal sent by the oscilloscope in a second time period; wherein the second output signal is a signal obtained by performing frequency division on the source signal with a first frequency division ratio and then undergoing the shaping and fan-out processing, the third output signal is a signal obtained by performing frequency division on the source signal with a second frequency division ratio and then undergoing the shaping and fan-out processing, the second frequency division ratio is different from the first frequency division ratio, and the second time period starts after it is determined that the delay data corresponding to the second output signal meets a preset condition.

[0052] In connection with the fifth aspect of the present application, in an alternative embodiment, the obtained multiplexed output signals include at least a pair of differential signals; performing the fan-out processing on the delay calibration signal includes:

[0053] Converting a single-ended delay calibration signal into at least a pair of differential signals through fan-out processing.

[0054] In connection with the fifth aspect of the present application, in an alternative embodiment, determining whether to complete the delay calibration based on the delay data includes:

[0055] If the delay data meets the preset condition, it is determined that the delay calibration is completed;

[0056] If the delay data does not meet the preset condition, it is determined that the delay calibration is not completed;

[0057] After it is determined that the delay calibration is not completed, the method further includes:

[0058] Sending information to the oscilloscope, the information being used to instruct the oscilloscope to perform delay calibration again;

[0059] Receiving the delay data corresponding to performing delay calibration again sent by the oscilloscope;

[0060] Determining whether to complete the delay calibration based on the delay data corresponding to performing delay calibration again.

[0061] Sixth aspect, an embodiment of the present application provides a time delay calibration method, which is applied to an oscilloscope. The method includes:

[0062] Obtain a calibration instruction sent by a time delay calibration device, and perform time delay calibration on multiple received signals according to the calibration instruction; wherein, the multiple signals are output by the time delay calibration device and transmitted to the oscilloscope, and at least one of the multiple signals is detected by a probe and transmitted to the oscilloscope;

[0063] Send time delay data to the time delay calibration device, where the time delay data represents the time delay situation of the at least one signal received via the probe after time delay calibration.

[0064] Combined with the sixth aspect of the present application, in an optional implementation manner, the multiple received signals are square wave signals, and the rising edge time of the square wave signals is less than a preset duration threshold; wherein, the preset duration threshold is set according to time delay calibration requirements.

[0065] Combined with the sixth aspect of the present application, in an optional implementation manner, the multiple received signals include at least a pair of differential signals.

[0066] Combined with the sixth aspect of the present application, in an optional implementation manner, the method further includes:

[0067] Obtain information sent by the time delay calibration device, and perform time delay calibration again according to the information;

[0068] Send time delay data corresponding to performing time delay calibration again to the time delay calibration device.

[0069] Combined with the sixth aspect of the present application, in an optional implementation manner, the method further includes:

[0070] In a first time period, receive multiple signals, and perform time delay calibration on each channel of the received multiple signals to obtain time delay data corresponding to a second output signal, and send the time delay data corresponding to the second output signal to the time delay calibration device; wherein, the multiple signals received in the first time period are signals input to the oscilloscope after being transmitted from the second output signal output by the time delay calibration device, and the second output signal is a signal obtained by frequency dividing a source signal by a first frequency division ratio and then performing shaping and fan-out processing by the time delay calibration device;

[0071] In a second time period, multiple signals are received, and time delay calibration is performed on each channel of the received multiple signals to obtain time delay data corresponding to a third output signal, and the time delay data corresponding to the third output signal is sent to the time delay calibration device; wherein, the multiple signals received in the second time period are signals that the third output signal output by the time delay calibration device is input to the oscilloscope after transmission, the third output signal is a signal obtained by frequency dividing a source signal by a second frequency division ratio by the time delay calibration device and then performing shaping and fan-out processing, and the second frequency division ratio is different from the first frequency division ratio;

[0072] The second time stage starts after it is determined that the time delay data corresponding to the second output signal meets a preset condition.

[0073] The time delay calibration device, oscilloscope, time delay calibration system and time delay calibration method provided by the embodiments of the present application. Among them, the time delay calibration device includes: a source signal supply module, a source signal processing module, and a fan-out module; wherein, the source signal supply module is connected to the source signal processing module and is used to provide a source signal to the source signal processing module; the source signal processing module is used to generate a time delay calibration signal based on the source signal and output the time delay calibration signal to the fan-out module; the fan-out module is used to perform fan-out processing on the time delay calibration signal to obtain multiple output signals for output to the outside of the time delay calibration device; thus, by outputting multiple output signals to the outside, multiple probes can be simultaneously used for time delay calibration, which is convenient for users to operate and saves time delay calibration time; by the source signal processing module processing the source signal to generate a time delay calibration signal, and the multiple output signals are obtained by performing fan-out processing on the time delay calibration signal, compared with using a general signal source for time delay calibration, the above multiple output signals can better meet the time delay calibration requirements and improve the accuracy of time delay calibration.

[0074] Additional aspects and advantages of the present application will be given in part in the following description, become apparent in part from the following description, or be understood through the practice of the present application. BRIEF DESCRIPTION OF THE DRAWINGS

[0075] The drawings described herein are used to provide a further understanding of the present application, and constitute a part of the present application. The illustrative embodiments and descriptions thereof of the present application are used to explain the present application and do not constitute an improper limitation of the present application. In the drawings:

[0076] Figure 1 is a schematic structural diagram of a time delay calibration device provided by an embodiment of the present application;

[0077] Figure 2 is a schematic structural diagram of a source signal supply module provided by an embodiment of the present application;

[0078] Figure 3Schematic structural diagram of the time delay calibration device provided by another embodiment of the present application;

[0079] Figure 4 Schematic structural diagram of the source signal processing module provided by an embodiment of the present application;

[0080] Figure 5 Waveform schematic diagram of a square wave signal;

[0081] Figure 6 Schematic structural diagram of the time delay calibration device provided by another embodiment of the present application;

[0082] Figure 7 Schematic structural diagram of the time delay calibration device provided by another embodiment of the present application;

[0083] Figure 8 Schematic structural diagram of the oscilloscope provided by an embodiment of the present application;

[0084] Figure 9 Schematic structural diagram of the time delay calibration system provided by an embodiment of the present application;

[0085] Figure 10a and Figure 10b Schematic diagram of the single-ended probe time delay calibration of the time delay calibration system in a specific example of the present application;

[0086] Figure 11a and Figure 11b Schematic diagram of the differential probe time delay calibration of the time delay calibration system in a specific example of the present application;

[0087] Figure 12 Schematic flow diagram of the time delay calibration method provided by an embodiment of the present application;

[0088] Figure 13 Schematic flow diagram of the time delay calibration method provided by another embodiment of the present application. Detailed implementation manners

[0089] To make the technical solutions and beneficial effects of the present invention more obvious and understandable, the technical solutions in the embodiments of the present application are clearly and completely described below by way of listing specific embodiments. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments in the present application without making creative efforts belong to the scope of protection of the present application.

[0090] It should be noted that in this application, words such as "for example" or "exemplary" are used to give examples, illustrations or explanations. Any embodiment or design solution described as "for example" or "exemplary" in this application should not be construed as being more preferred or having more advantages than other embodiments or design solutions. Rather, the use of words such as "for example" or "exemplary" is intended to present relevant concepts in a specific manner.

[0091] In this application, the terms "first", "second", "third", etc. are only used for descriptive purposes, to distinguish the indicated technical features, and cannot be understood as indicating or implying relative importance or order, nor can it be understood as implicitly indicating the quantity of the indicated technical features. Thus, the technical features defined with "first", "second", "third", etc. may include one or more of such technical features. In the description of this embodiment, unless otherwise specified, the meaning of "a plurality" is two or more (including two). It should also be understood that the terms "comprise" and "include" indicate the presence of defined features, steps, operations, elements and / or components, but do not exclude the presence or addition of one or more other features, steps, operations, elements and / or components. When used herein, the term "and / or" includes any and all combinations of the related listed items.

[0092] First, please refer to Figure 1 . As shown in the figure, an embodiment of this application provides a time delay calibration device 100, including: a source signal supply module 110, a source signal processing module 120, and a fan-out module 130. The source signal supply module 110 is connected to the source signal processing module 120 and is used to provide a source signal to the source signal processing module 120. The source signal processing module 120 is used to generate a time delay calibration signal based on the source signal and output the time delay calibration signal to the fan-out module 130. The fan-out module 130 is used to perform fan-out processing on the time delay calibration signal to obtain a plurality of output signals for output to the outside of the time delay calibration device 100. It can be understood that the time delay calibration device provided by the embodiment of this application outputs a plurality of output signals to the outside, so that multiple probes can perform time delay calibration simultaneously, which is convenient for users to operate and saves time delay calibration time; by processing the source signal through the source signal processing module to generate a time delay calibration signal, the plurality of output signals are obtained by performing fan-out processing on the time delay calibration signal. Therefore, compared with using a general signal source for time delay calibration, using the above-mentioned plurality of output signals can better meet the time delay calibration requirements and improve the accuracy of time delay calibration.

[0093] Here, the time delay calibration device 100 is a device for calibrating the time delay of the probe of an oscilloscope. Please refer to Figure 10b and Figure 11b, during use, one end of the probe is connected to the port of the delay calibration device 100 to detect the output signal of the delay calibration device 100; the other end is connected to the channel of the oscilloscope 400 to transmit the detected output signal to the oscilloscope 400.

[0094] To meet the delay calibration requirements, the source signal processing module 120 processes the source signal, such as shaping, to generate a delay calibration signal. It can be understood that the delay calibration signal is a signal that those skilled in the art can judge according to common knowledge in the field and is applicable to the delay calibration operation.

[0095] Optionally, the delay calibration signal is a square wave signal, and the rising edge time T of the square wave signal rise is less than a preset duration threshold; wherein, the preset duration threshold is set according to the delay calibration requirements. Figure 5 The figure shows a square wave signal. The square wave signal includes a rising edge that changes from a low level to a high level and a falling edge that changes from a high level to a low level. Among them, the rising edge time T rise is the time duration for the pulse amplitude to rise from the 10% threshold to the 90% threshold. It can be understood that if the rising edge time T of the square wave signal rise is long and the rising edge is slow, it will be difficult to achieve good results for the delay calibration of high-bandwidth probes. Therefore, if the delay calibration requirements are high, such as when calibrating high-bandwidth probes with a bandwidth above 4 GHz, the preset duration threshold should be set as small as possible.

[0096] The multi-channel output signal refers to two or more output signals. In practical applications, the number of output signals fanned out by the fan-out module 130 is, for example, two, four, eight, sixteen, etc.

[0097] Next, please refer to Figure 2 . As an optional implementation manner, the source signal supply module 110 includes a voltage-controlled oscillator 111 and / or a source signal input interface 112; wherein, the voltage-controlled oscillator (VCO) 111 is used to generate a source signal; the source signal input interface 112 is used to connect to an external signal source 200 disposed outside the delay calibration device 100 to provide the source signal generated by the external signal source 200 to the source signal processing module 120.

[0098] It can be understood that although Figure 21 shows that the source signal supply module 110 includes both a voltage-controlled oscillator 111 and a source signal input interface 112, but in the embodiment of the present application, the source signal supply module 110 may include only the voltage-controlled oscillator 111, or only the source signal input interface 112. If the source signal supply module 110 includes only the voltage-controlled oscillator 111, the source signal supply module 110 can only provide the source signal generated by the voltage-controlled oscillator 111 to the source signal processing module 120. If the source signal supply module 110 includes only the source signal input interface 112, the source signal supply module 110 can only provide the source signal generated by the external signal source 200 connected to the source signal input interface 112 and arranged outside the delay calibration device 100 to the source signal processing module 120. If the source signal supply module 110 includes both the voltage-controlled oscillator 111 and the source signal input interface 112, the source signal supply module 110 can provide a suitable source signal according to user needs.

[0099] It can be understood that the voltage-controlled oscillator 111 is arranged inside the time delay calibration device 100, and is the signal source of the time delay calibration device 100, so that the time delay calibration device 100 can independently provide output signals without additional assistance. The user only needs to connect the probe and turn on the switch of the time delay calibration device 100 to use it, which is convenient for calibration. However, it is precisely because the voltage-controlled oscillator 111 is arranged inside the time delay calibration device 100, the frequency of the source signal it can provide is fixed, and there may be a situation that does not meet the user's calibration requirements. In addition, there may be a situation where the voltage-controlled oscillator 111 is damaged and cannot provide a source signal. The source signal input interface 112 can introduce the source signal generated by the external signal source 200 into the delay calibration device 100, thereby solving the above problems well.

[0100] like Figure 3 As shown, the source signal supply module 110 includes a voltage-controlled oscillator 111 and a source signal input interface 112; the delay calibration device 100 also includes: a first control switch 181, which is used to select, based on user instructions, to provide the source signal generated by the voltage-controlled oscillator 111 to the source signal processing module 120, or to provide the source signal generated by the external signal source 200 connected through the source signal input interface 112 to the source signal processing module 120.

[0101] In practical applications, one end of the first control switch 181 can be arranged on the outer surface of the time delay calibration device 100 to receive the pressing or toggling operation of the user, and the other end is connected to the inside of the time delay calibration device 100, and switches to the corresponding source signal providing mode after the user presses or toggles. The first control switch 181 can also be completely arranged inside the time delay calibration device 100 to receive the indication information input by the user through various man-machine interaction methods. For example, the time delay calibration device 100 first receives the user's indication through the physical buttons / knobs arranged on the outer surface or the virtual buttons on the display screen, or through remote control and other methods, and then transmits the user's indication to the first control switch 181 so that the first control switch 181 performs the corresponding selection. The first control switch 181 can be directly controlled by the user or by the time delay calibration control module of the time delay calibration device 100; when the first control switch 181 is controlled by the time delay calibration control module, the user's indication information is first transmitted to the time delay calibration control module, and then judged and processed by the time delay calibration control module and sent to the first control switch 181.

[0102] The first control switch 181 can be connected to both the voltage-controlled oscillator 111 and the source signal input interface 112. For example, the first control switch 181 can be connected on the connection path between the voltage-controlled oscillator 111 and the source signal processing module 120 to connect or disconnect the two, and is also connected on the connection path between the source signal input interface 112 and the source signal processing module 120 to disconnect or connect the two. In addition, this application does not exclude the case where the first control switch 181 is only connected to the voltage-controlled oscillator 111. For example, the first control switch 181 can control the opening and closing of the voltage-controlled oscillator 111. When the first control switch 181 controls the voltage-controlled oscillator 111 to open, the voltage-controlled oscillator 111 generates a source signal and outputs it to the source signal processing module 120; when the first control switch 181 controls the voltage-controlled oscillator 111 to close and the user connects the external signal source 200, the source signal generated by the external signal source 200 is transmitted to the source signal processing module 120.

[0103] Next, please refer to Figure 4 . As an optional implementation manner, the source signal processing module 120 includes a frequency division circuit 121 and a shaping circuit 122; wherein, the frequency division circuit 121 is used for dividing the source signal to generate a frequency division signal; the shaping circuit 122 is used for shaping the frequency division signal to generate a time delay calibration signal.

[0104] By setting the frequency division circuit 121, frequency division signals of multiple frequencies can be obtained. For example, if the frequency of the source signal generated by the voltage-controlled oscillator 111 is 10 MHz, without setting the frequency division circuit 121, only the 10 MHz signal can be shaped into a delay calibration signal; while by setting the frequency division circuit 121, the 10 MHz source signal can be divided into frequency division signals such as 1 MHz and 100 KHz, and then the frequency division signals are shaped to obtain a delay calibration signal with a frequency different from that of the source signal. Among them, the frequency division circuit 121 divides the source signal by 10, 100, etc. This application does not make specific limitations on this. In addition, the frequency division of the source signal by the frequency division circuit 121 may also include dividing the source signal with a frequency division ratio of 1, that is, the frequency of the frequency division signal is the same as that of the source signal. In this way, even if the source signal processing module 120 includes the frequency division circuit 121, in the case of no need for frequency division, the frequency division ratio can be set to 1, so as not to change the frequency of the output signal.

[0105] As Figure 6 shown, the delay calibration device 100 may further include a second control switch 182. The second control switch 182 is used to control the frequency division circuit 121 to operate in a single-frequency calibration mode or a multi-frequency calibration mode based on a user instruction.

[0106] In the single-frequency calibration mode, the frequency division ratio of the frequency division circuit 121 remains unchanged during one delay calibration of the delay calibration device 100. In the multi-frequency calibration mode, the frequency division ratio of the frequency division circuit 121 is switched at least once during one delay calibration of the delay calibration device 100.

[0107] It can be understood that the delay calibration device 100 provides at least two calibration modes for the user. The user selects the required calibration mode by operating, for example, physical buttons / knobs set on the outer surface or virtual buttons on the display screen, or by means of remote control, etc.

[0108] For the convenience of description, here the user's selection of the single-frequency calibration mode is referred to as the user's "first instruction", and the user's selection of the multi-frequency calibration mode is referred to as the user's "second instruction".

[0109] In actual use, when the delay calibration device 100 receives the first instruction from the user, the frequency division circuit 121 divides the source signal by a fixed ratio including 1 to generate a frequency division signal; the shaping circuit 122 shapes the frequency division signal to generate a delay calibration signal; and then, through the fan-out processing of the fan-out module 130, multiple output signals are obtained. For the sake of distinction, the obtained multiple output signals are referred to as "first output signals"; the first output signals are output to each port of the delay calibration device 100. Some or all of the multiple ports of the delay calibration device 100 are connected to the probes, and the output signals are transmitted to the oscilloscope 400 via the probes. After receiving the signals, the oscilloscope 400 detects the delay data between the probes and sends the delay data to the delay calibration device 100 through the oscilloscope communication module 440; after receiving the delay data, the delay calibration device 100 sends a calibration instruction to the oscilloscope 400 through the delay calibration communication module 140, thereby instructing the oscilloscope 400 to perform delay calibration on each channel and feedback the calibrated delay data to the delay calibration device 100. The delay calibration device 100 determines whether the latest received delay data meets the preset conditions; when the preset conditions are not met, an information is sent to the oscilloscope 400 to instruct the oscilloscope 400 to perform delay calibration again, and after receiving the delay data corresponding to the repeated delay calibration sent by the oscilloscope 400, it is determined again whether the preset conditions are met until the received delay data meets the preset conditions; when the preset conditions are met, it is determined that the delay calibration is completed.

[0110] When the latency calibration device 100 receives the user's second instruction, first, the frequency division circuit 121 divides the source signal with a first frequency division ratio, and the first frequency division ratio is also a fixed ratio including 1. Next, the steps of obtaining multiple output signals and performing latency calibration on the oscilloscope 400 are basically the same as those when receiving the user's first instruction, which will not be elaborated here; however, for the sake of distinction, the signal obtained after dividing the source signal with the first frequency division ratio, followed by shaping and fan-out processing, is referred to as the "second output signal". The latency calibration device 100 determines whether the latest received latency data meets the preset conditions; similarly, when the preset conditions are not met, it sends information to the oscilloscope 400 to instruct the oscilloscope 400 to perform latency calibration again. After receiving the latency data corresponding to the repeated latency calibration sent by the oscilloscope 400, it determines again whether it meets the preset conditions until the received latency data meets the preset conditions; different from when receiving the user's first instruction, when the latency calibration device 100 determines that the latest received latency data meets the preset conditions, it has not truly completed all latency calibrations and needs to perform frequency division and calibration again. It can be understood that during this stage (hereinafter referred to as the "first time stage"), the latency data received by the latency calibration device 100 are all latency data corresponding to the second output signal, and its meeting the preset conditions only indicates that the phased latency calibration for the frequency corresponding to the second output signal has been completed, and the entire latency calibration of the user's second instruction has not been completed. Therefore, when the latest received latency data in the first time stage meets the preset conditions, the frequency division circuit 121 divides the source signal with a second frequency division ratio, and the second frequency division ratio is also a fixed ratio including 1, but the second frequency division ratio is different from the first frequency division ratio. Next, shaping and fan-out processing are also performed to obtain multiple output signals. For the sake of distinction, the obtained output signal is referred to as the "third output signal" here. The oscilloscope 400 performs latency calibration on the signal transmitted via the probe in the third output signal and feeds back the corresponding latency data. The latency calibration device 100 determines whether the latest received latency data meets the preset conditions; similarly, when the preset conditions are not met, it sends information to the oscilloscope 400 to instruct the oscilloscope 400 to perform latency calibration again. After receiving the latency data corresponding to the repeated latency calibration sent by the oscilloscope 400, it determines again whether it meets the preset conditions until the received latency data meets the preset conditions, completing the phased latency calibration for the frequency corresponding to the third output signal (for the sake of distinction, this stage is referred to as the "second time stage"). Determine whether the latency calibration is completed at least based on the latency data corresponding to the second output signal sent by the oscilloscope 400 in the first time stage and the latency data corresponding to the third output signal sent by the oscilloscope 400 in the second time stage.It can be understood that the multi-frequency calibration mode refers to a mode in which the frequency division circuit switches the frequency division ratio at least once during the period when the time delay calibration device completes one time delay calibration, that is, during the multi-frequency calibration mode, the calibration of the output signals for at least two different frequencies is performed in at least two time stages; the number of times of switching the frequency division ratio is related to the pre-stored instructions in the time delay calibration device 100. For example, if the number of times of switching the frequency division ratio in the pre-stored instructions is 1, and the calibration of the output signals of two different frequencies is performed during one time delay calibration, then after the time delay calibration in the second time stage is completed, it is determined that the time delay calibration is completed. If the number of times of switching the frequency division ratio in the pre-stored instructions is n (n is a positive integer greater than 1), and the calibration of the output signals of n + 1 different frequencies is performed during one time delay calibration, then after the time delay calibration in the (n + 1)-th time stage is completed, it is determined that the time delay calibration is completed.

[0111] In this way, time delay calibration of multiple frequencies can be provided for users, further meeting the time delay calibration requirements; when the user selects the multi-frequency calibration mode, more accurate calibration of the phase can be achieved, the time delay calibration accuracy can be improved, and a better time delay calibration effect can be obtained.

[0112] The shaping circuit 122 can shape the frequency division signal to generate a time delay calibration signal. Specifically, for example, it generates a single-ended time delay calibration signal. The frequency division signal generated after the frequency division circuit 121 divides the source signal may be a sine wave signal or a square wave signal. By setting the shaping circuit 122, the frequency division signal can be shaped into a time delay calibration signal that meets the time delay calibration requirements. The shaping circuit 122 can play a role in shortening the rising edge time and realizing the time delay calibration of a high-bandwidth probe.

[0113] The fan-out module 130 is specifically used to convert a single-ended time delay calibration signal into at least a pair of differential signals through fan-out processing. Thus, the time delay calibration device 100 can not only calibrate a single-ended probe, but also calibrate a differential probe, and even can simultaneously calibrate a single-ended probe and a differential probe. In practical applications, the fan-out module 130 can specifically be a fan-out buffer circuit.

[0114] Figures 10a to 11b The situation where the fan-out module 130 converts a single-ended time delay calibration signal into two pairs of differential signals is shown. Two pairs of differential signals are actually 4 single-ended signals to ground. Taking the multi-path output signals as 4 signals and the 4 signals as two pairs of differential signals as an example, the time delay calibration device 100 can simultaneously calibrate two differential probes (please refer to Figure 11a and Figure 11b ), and the time delay calibration device 100 can simultaneously calibrate four single-ended probes (please refer to Figure 10a and Figure 10b) Although not shown in the figure, it can be understood that the time delay calibration device 100 can also achieve simultaneous calibration of a differential probe and one or two single-ended probes. In addition, it can also achieve simultaneous calibration of two or three single-ended probes.

[0115] A pair of differential signals are output from two ports associated with each other, such as Figure 10b and Figure 11b In, the first pair of differential signals are output from port P1 and port N1, and the second pair of differential signals are output from port P2 and port N2; where P represents the positive port and N represents the negative port, and ports with the same number represent the output ports corresponding to the same pair of differential signals.

[0116] Such as Figure 10b As shown, if four single-ended probes (probe A, probe B, probe C, and probe D in the figure) are simultaneously calibrated, then one end of probe A, probe B, probe C, and probe D are respectively connected to 4 ports of the time delay calibration device, and the other end is connected to 4 channels of the oscilloscope. It can be understood that if the number of probes for simultaneous time delay calibration is less than the number of output signals generated by the fan-out module, only select to connect some ports and some channels; in actual applications, on the side of the time delay calibration device, each probe can preferably select ports with the same positive and negative; for example, when two single-ended probes need to be simultaneously calibrated, the two single-ended probes can be respectively connected to port P1 and port P2 on the side of the time delay calibration device, so that the phases of the detected output signals are the same, and the calibration process is more convenient.

[0117] It should be noted that the time delay calibration device provided by the embodiments of the present application can also achieve time delay calibration of a single-ended probe. In use, the two ends of a single-ended probe can be respectively connected to one port of the time delay calibration device and one channel of the oscilloscope, and then another port of the time delay calibration device and another channel of the oscilloscope are connected through a cable, so that the oscilloscope receives a signal detected by the probe and transmitted to the oscilloscope and a signal directly transmitted to the oscilloscope through the cable, and based on the signal directly transmitted to the oscilloscope through the cable, the signal detected by the probe and transmitted to the oscilloscope is time delay calibrated.

[0118] Such as Figure 11b As shown, if two differential probes (probe E and probe F in the figure) are simultaneously calibrated, then probe E is respectively connected to a pair of associated ports (such as port P1 and port N1) on the side of the time delay calibration device and connected to one channel (such as channel 1) on the side of the oscilloscope; probe F is respectively connected to another pair of associated ports (such as port P2 and port N2) on the side of the time delay calibration device and connected to another channel (such as channel 2) on the side of the oscilloscope.

[0119] For the connection methods of other quantities and types of probes during time delay calibration, as well as the connection methods of other time delay calibration devices except for the 4-channel output signals when implementing the time delay calibration of the probes, they are basically similar to the above methods and will not be elaborated one by one here.

[0120] In addition, in Figure 10a and Figure 11a In the specific example shown, the main control module is, for example, the same as the aforementioned time delay calibration control module 150. On the one hand, the human-computer interaction module is used to receive user instructions through physical buttons / knobs provided on the outer surface of the time delay calibration device or virtual buttons on the display screen, or receive user instructions through wireless means such as remote control. On the other hand, it is used to transmit the received user instructions to the main control module for the main control module to control each module inside the time delay calibration device according to the user instructions.

[0121] Before starting the time delay calibration, the time delay calibration device 100 can first receive user instructions, which may include at least one of the following: selecting whether to generate the source signal by the voltage-controlled oscillator or access the source signal generated by an external signal source; selecting a single-frequency calibration mode or a multi-frequency calibration mode. In addition, the user instructions may also include starting the time delay calibration. The component in the time delay calibration device 100 for receiving user instructions can be a part of the human-computer interaction module.

[0122] Next, please refer to Figure 7 . In an optional embodiment, the time delay calibration device 100 further includes: a time delay calibration communication module 140 and a time delay calibration control module 150. Among them, the time delay calibration communication module 140 is used to receive the time delay data sent by the oscilloscope 400; the time delay data characterizes: after at least one of the multiple output signals is detected by the probe and transmitted to the oscilloscope 400, the time delay situation after the oscilloscope 400 performs time delay calibration on the signal received through the probe; the time delay calibration control module 150 is used to determine whether the time delay calibration is completed according to the time delay data. In this way, automatic calibration of the probe time delay can be realized, saving the user's operation time.

[0123] It should be noted that this application does not exclude the situation where the oscilloscope 400 does not feedback the time delay data to the time delay calibration device 100, but the user judges whether the time delay calibration is completed by himself.

[0124] The time delay calibration communication module 140 can be a module for implementing wireless communication or a module for implementing wired communication. Thus, the time delay data can be transmitted wirelessly to the time delay calibration device 100 or transmitted wiredly to the time delay calibration device 100. The communication methods of the time delay calibration communication module 140 include but are not limited to wireless wide area network (WWAN, such as one or more cellular networks), wireless local area network (WLAN, such as being configured for one or more standards, such as IEEE802.11 (Wi-Fi)), Bluetooth, data transmission cables, etc.

[0125] Before receiving the time delay data sent by the oscilloscope 400, the time delay calibration communication module 140 is further configured to establish a communication connection with the oscilloscope 400.

[0126] The time delay calibration control module 150 can specifically be configured to: determine that the time delay calibration is completed corresponding to the time delay data satisfying a preset condition; determine that the time delay calibration is not completed corresponding to the time delay data not satisfying the preset condition. After determining that the time delay calibration is not completed, the time delay calibration control module 150 can further be configured to: control the time delay calibration communication module 140 to send information to the oscilloscope 400, where the information is used to instruct the oscilloscope 400 to perform time delay calibration again; after the time delay calibration communication module 140 receives the time delay data corresponding to the time delay calibration performed again sent by the oscilloscope 400, determine whether the time delay calibration is completed according to the time delay data corresponding to the time delay calibration performed again. The preset condition can be set by an engineer before the time delay calibration device 100 leaves the factory or can be set or changed by the user before use. In this way, the automatic calibration of the probe time delay is completed according to the preset condition, and when the time delay data does not satisfy the preset condition, the oscilloscope 400 is automatically controlled to perform time delay calibration again, saving the user operation time.

[0127] The embodiment of the present application further provides an oscilloscope; please refer to Figure 8 , the oscilloscope 400 includes: a plurality of channels for connecting to a probe, an oscilloscope communication module 440 for communicating with the time delay calibration device 100 provided in any one of the above embodiments, and an oscilloscope control module 450.

[0128] The oscilloscope control module 450 is configured to obtain a calibration instruction sent by the time delay calibration device 100 through the oscilloscope communication module 440 and control the progress of the time delay calibration process, and control the oscilloscope communication module 440 to send time delay data to the time delay calibration device 100.

[0129] It can be understood that the oscilloscope 400 provided in this embodiment can establish a communication connection with the delay calibration device 100 through the oscilloscope communication module 440, and control the progress of the delay calibration process according to the calibration instruction sent by the delay calibration device 100 through the oscilloscope control module 450, and control the oscilloscope communication module 440 to send delay data to the delay calibration device 100 through the oscilloscope control module 450, thereby providing an oscilloscope that can be used in cooperation with the delay calibration device 100 to achieve automatic calibration, saving the user operation time.

[0130] It can be understood that the oscilloscope control module 450 controls the progress of the delay calibration process, which can be specifically implemented by the delay calibration unit in the oscilloscope 400. The oscilloscope control module 450 controls the delay calibration unit to execute or stop the delay calibration.

[0131] The oscilloscope communication module 440 can be a module for implementing wireless communication or a module for performing wired communication; thus, information can be exchanged with the delay calibration device 100 through a wireless transmission method or through a wired transmission method. The communication methods of the oscilloscope communication module 440 include but are not limited to wireless wide area network (WWAN, such as one or more cellular networks), wireless local area network (WLAN, such as being configured for one or more standards, such as IEEE802.11 (Wi-Fi)), Bluetooth, data transmission cables, etc.

[0132] The other structures and functions of the oscilloscope 400 can be the same as those of a general oscilloscope in the art and will not be described in detail here.

[0133] In an alternative embodiment, the oscilloscope control module 450 is further configured to obtain the information sent by the delay calibration device 100 through the oscilloscope communication module 440, where the information is used to instruct the oscilloscope 400 to perform delay calibration again; the oscilloscope control module 450 controls the delay calibration unit to perform delay calibration again according to the information; the oscilloscope control module 450 is further configured to obtain the delay situation after the delay calibration unit performs the delay calibration, and generate delay data corresponding to the repeated delay calibration according to the delay situation, and send the delay data corresponding to the repeated delay calibration to the delay calibration device 100 through the oscilloscope communication module 440.

[0134] In an alternative embodiment, the delay calibration unit is further configured to: in a first time period, receive multiple signals, and perform delay calibration on each channel of the received multiple signals; the oscilloscope control module 450 is further configured to obtain the delay condition after the delay calibration performed by the delay calibration unit, generate delay data corresponding to the second output signal according to the delay condition, and send the delay data corresponding to the second output signal to the delay calibration device 100 through the oscilloscope communication module 440; wherein, the multiple signals received in the first time period are signals that are input to the oscilloscope 400 after being transmitted from the second output signal output by the delay calibration device 100, and the second output signal is a signal obtained by frequency dividing the source signal by a first frequency division ratio by the delay calibration device 100 and then performing shaping and fan-out processing.

[0135] The delay calibration unit is further configured to: in a second time period, receive multiple signals, and perform delay calibration on each channel of the received multiple signals; the oscilloscope control module 450 is further configured to obtain the delay condition after the delay calibration performed by the delay calibration unit, generate delay data corresponding to the third output signal according to the delay condition, and send the delay data corresponding to the third output signal to the delay calibration device 100 through the oscilloscope communication module 440; wherein, the multiple signals received in the second time period are signals that are input to the oscilloscope 400 after being transmitted from the third output signal output by the delay calibration device 100, and the third output signal is a signal obtained by frequency dividing the source signal by a second frequency division ratio by the delay calibration device 100 and then performing shaping and fan-out processing, and the second frequency division ratio is different from the first frequency division ratio; the second time period starts after it is determined that the delay data corresponding to the second output signal meets a preset condition.

[0136] The embodiment of the present application further provides a delay calibration system; please refer to Figure 9 , the delay calibration system 800 includes: an oscilloscope, a probe, and the delay calibration device 100 described in any of the foregoing embodiments.

[0137] It should be noted that the oscilloscope may be the oscilloscope 400 described in any of the foregoing embodiments, or other existing oscilloscopes in the art.

[0138] In addition, the embodiment of the present application further provides a delay calibration system; in this delay calibration system, the delay calibration device and the oscilloscope are integrated into one. Specifically, the delay calibration system includes: an oscilloscope 100 and the delay calibration device 400 described in any of the foregoing embodiments; wherein, the delay calibration device 400 and the oscilloscope 100 are encapsulated in the same housing; the housing is provided with a port of the delay calibration device for connecting one end of the probe, and is also provided with a socket of the channel of the oscilloscope for connecting the other end of the probe.

[0139] It can be understood that the entire time delay calibration system can also be referred to as an oscilloscope, or an oscilloscope with time delay calibration function, and the above-mentioned oscilloscope 100 is a component that provides the core functions of the oscilloscope. Of course, the time delay calibration device 400 is also a component of the time delay calibration system.

[0140] An embodiment of the present application also provides a time delay calibration method, which is applied to a time delay calibration device; please refer to Figure 12 , the time delay calibration method includes:

[0141] Step 1201, generate a time delay calibration signal based on a source signal;

[0142] Step 1202, perform fan-out processing on the time delay calibration signal to obtain multiple output signals and output the multiple output signals outside the time delay calibration device;

[0143] Step 1203, receive the time delay data sent by the oscilloscope;

[0144] Here, the time delay data is: after at least one of the multiple output signals is detected by a probe and transmitted to the oscilloscope, the time delay data after the oscilloscope performs time delay calibration on the channel where the signal received via the probe is located; Step 1204, determine whether the time delay calibration is completed according to the time delay data.

[0145] It can be understood that through the time delay calibration method provided by the embodiment of the present application, multiple output signals can be provided outside the time delay calibration device, so that simultaneous calibration of multiple probes can be realized; moreover, the time delay calibration process can be completed under the control of the time delay calibration device, saving the user's operation time.

[0146] Here, the time delay calibration device can be the time delay calibration device 100 provided in any of the foregoing embodiments.

[0147] It should be noted that although Figure 12 the steps in are shown in sequence according to the indication of the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless otherwise clearly stated in this article, there is no strict order limit for the execution of each step in the flowcharts of the present application, and these steps can be executed in other orders. Moreover, at least a part of the steps in the flowcharts of the present application may include multiple steps or multiple stages, and these steps or stages are not necessarily executed at the same moment, but can be executed at different moments, and the execution order of these steps or stages is not necessarily sequential, but can be executed alternately or alternately with at least a part of other steps or steps or stages in other steps.

[0148] In an alternative embodiment, before generating the delay calibration signal based on the source signal, the method may further include: generating the source signal based on a voltage-controlled oscillator provided inside the delay calibration device; or receiving the source signal generated by an external signal source provided outside the delay calibration device.

[0149] In an alternative embodiment, before generating the delay calibration signal based on the source signal, the method may further include: selecting, according to a user instruction, to provide the source signal generated by the voltage-controlled oscillator to the source signal processing module, or providing the source signal generated by the external signal source accessed through the source signal input interface to the source signal processing module.

[0150] In an alternative embodiment, generating the delay calibration signal based on the source signal may include: dividing the source signal to generate a divided signal; shaping the divided signal to generate the delay calibration signal.

[0151] In an alternative embodiment, the delay calibration signal is a square wave signal, and the rising edge time of the square wave signal is less than a preset duration threshold; wherein, the preset duration threshold is set according to the delay calibration requirement.

[0152] In an alternative embodiment, determining whether the delay calibration is completed according to the delay data may include: corresponding to receiving a first instruction from the user, determining whether the delay calibration is completed according to the delay data sent by the oscilloscope corresponding to the first output signal; wherein, the first output signal is a signal obtained by dividing the source signal with an unchanged frequency division ratio, followed by shaping and fan-out processing; corresponding to receiving a second instruction from the user, determining whether the delay calibration is completed at least according to the delay data sent by the oscilloscope corresponding to the second output signal in the first time period and the delay data sent by the oscilloscope corresponding to the third output signal in the second time period; wherein, the second output signal is a signal obtained by dividing the source signal with a first frequency division ratio, followed by shaping and fan-out processing, the third output signal is a signal obtained by dividing the source signal with a second frequency division ratio, the second frequency division ratio is different from the first frequency division ratio, and the second time period starts after determining that the delay data corresponding to the second output signal meets the preset conditions.

[0153] In an alternative embodiment, the obtained multiplexed output signals include at least a pair of differential signals; performing fan-out processing on the delay calibration signal may include: converting a single-ended delay calibration signal into at least a pair of differential signals through fan-out processing.

[0154] In an alternative embodiment, determining whether the delay calibration is completed according to the delay data may include: corresponding to the delay data meeting the preset conditions, determining that the delay calibration is completed; corresponding to the delay data not meeting the preset conditions, determining that the delay calibration is not completed.

[0155] After determining that the delay calibration is not completed, the method may further include: sending information to an oscilloscope, where the information is used to instruct the oscilloscope to perform delay calibration again; receiving delay data corresponding to the delay calibration performed again sent by the oscilloscope; and determining whether the delay calibration is completed according to the delay data corresponding to the delay calibration performed again.

[0156] An embodiment of this application also provides a delay calibration method, which is applied to an oscilloscope; please refer to Figure 13 , and this delay calibration method includes:

[0157] Step 1301: Obtain a calibration instruction sent by a delay calibration device, and perform delay calibration on each channel of the oscilloscope according to the calibration instruction; where each channel is used to receive multiple signals output by the delay calibration device and transmitted to the oscilloscope, and at least one of the multiple signals is detected by a probe and transmitted to the oscilloscope;

[0158] Step 1302: Send delay data to the delay calibration device.

[0159] In an optional implementation manner, the received multiple signals are square wave signals, and the rising edge time of the square wave signals is less than a preset duration threshold; where the preset duration threshold is set according to the delay calibration requirement.

[0160] In an optional implementation manner, the received multiple signals include at least a pair of differential signals.

[0161] In an optional implementation manner, the method may further include: obtaining information sent by the delay calibration device, performing delay calibration again according to the information; and sending delay data corresponding to the delay calibration performed again to the delay calibration device.

[0162] In an optional implementation manner, the method may further include:

[0163] In a first time period, receive multiple signals, and perform delay calibration on each channel of the received multiple signals to obtain delay data corresponding to a second output signal, and send the delay data corresponding to the second output signal to the delay calibration device; where the multiple signals received in the first time period are signals obtained by the second output signal output by the delay calibration device after being transmitted and input into the oscilloscope, and the second output signal is a signal obtained by the delay calibration device after frequency-dividing a source signal by a first frequency division ratio, performing shaping and fan-out processing.

[0164] In a second time period, multiple signals are received, and time delay calibration is performed on each channel of the received multiple signals to obtain time delay data corresponding to a third output signal, and the time delay data corresponding to the third output signal is sent to a time delay calibration device; wherein, the multiple signals received in the second time period are signals that are input to an oscilloscope after being transmitted from the third output signal output by the time delay calibration device, and the third output signal is a signal obtained by frequency dividing a source signal by a second frequency division ratio by the time delay calibration device and then performing shaping and fan-out processing, and the second frequency division ratio is different from the first frequency division ratio;

[0165] The second time stage starts after it is determined that the time delay data corresponding to the second output signal meets a preset condition.

[0166] It should be noted that the time delay calibration device embodiment, oscilloscope embodiment, time delay calibration system embodiment, and time delay calibration method embodiment provided in the embodiments of the present application belong to the same concept; among the technical features in the technical solutions recorded in each embodiment, they can be arbitrarily combined without conflict.

[0167] It should be understood that the above embodiments are all exemplary and are not used to cover all possible implementation manners included in the claims. Without departing from the scope of the present disclosure, various deformations and changes can also be made on the basis of the above embodiments. Similarly, the various technical features of the above embodiments can also be arbitrarily combined to form additional embodiments of the present invention that may not be clearly described. Therefore, the above embodiments only represent several implementation manners of the present invention and do not limit the protection scope of the present invention patent.

Claims

1. A time delay calibration system, characterized in that, Comprising: An oscilloscope, a probe, and a time delay calibration device; The time delay calibration device is used to calibrate the time delay of the probe, and includes: a source signal supply module, a source signal processing module, and a fan-out module; wherein, The source signal supply module is connected to the source signal processing module and is used to provide a source signal to the source signal processing module; The source signal processing module is used to generate a time delay calibration signal based on the source signal and output the time delay calibration signal to the fan-out module; The fan-out module is used to perform fan-out processing on the time delay calibration signal to obtain a plurality of output signals for output to the outside of the time delay calibration device; wherein, at least one of the plurality of output signals is detected by the probe and transmitted to the oscilloscope; The oscilloscope includes: a plurality of channels for connecting to the probe, an oscilloscope communication module for communicating with the time delay calibration device, and an oscilloscope control module; wherein, The oscilloscope control module is used to obtain a calibration instruction sent by the time delay calibration device through the oscilloscope communication module and control the progress of the time delay calibration process, and control the oscilloscope communication module to send time delay data to the time delay calibration device.

2. The time delay calibration system according to claim 1, characterized in that, The source signal supply module includes a voltage-controlled oscillator and / or a source signal input interface; wherein, The voltage-controlled oscillator is used to generate the source signal; The source signal input interface is used to connect to an external signal source provided outside the time delay calibration device to provide the source signal generated by the external signal source to the source signal processing module.

3. The time delay calibration system according to claim 2, characterized in that, The source signal supply module includes the voltage-controlled oscillator and the source signal input interface; The time delay calibration device further includes: A first control switch for selecting to provide the source signal generated by the voltage-controlled oscillator to the source signal processing module or the source signal generated by the external signal source accessed through the source signal input interface to the source signal processing module based on a user instruction.

4. The time delay calibration system according to claim 1, characterized in that, The source signal processing module includes a frequency division circuit and a shaping circuit; wherein, The frequency division circuit is used to perform frequency division on the source signal to generate a frequency division signal; The shaping circuit is used to shape the frequency division signal to generate the time delay calibration signal.

5. The time delay calibration system according to claim 1 or 4, characterized in that, The time delay calibration signal is a square wave signal, and the rising edge time of the square wave signal is less than a preset duration threshold; wherein, the preset duration threshold is set according to time delay calibration requirements.

6. The time delay calibration system according to claim 4, characterized in that, The time delay calibration device further includes: A second control switch for controlling the frequency division circuit to operate in a single frequency calibration mode or a multi-frequency calibration mode based on a user instruction; In the single frequency calibration mode, the frequency division ratio of the frequency division circuit remains unchanged during one time delay calibration of the time delay calibration device; In the multi-frequency calibration mode, the frequency division ratio of the frequency division circuit is switched at least once during one time delay calibration of the time delay calibration device.

7. The time delay calibration system according to claim 1, characterized in that, The obtained plurality of output signals include at least a pair of differential signals; The fan-out module is specifically used to convert a single-ended time delay calibration signal into at least a pair of differential signals through fan-out processing.

8. The time delay calibration system according to claim 1, characterized in that, The time delay calibration device further includes: a time delay calibration communication module and a time delay calibration control module; wherein, the time delay calibration communication module is configured to receive the time delay data sent by the oscilloscope; the time delay calibration control module is configured to determine whether the time delay calibration is completed according to the time delay data.

9. The time delay calibration system according to claim 8, characterized in that, Specifically, the time delay calibration control module is configured to: determine that the time delay calibration is completed corresponding to the time delay data satisfying a preset condition; determine that the time delay calibration is not completed corresponding to the time delay data not satisfying the preset condition; after determining that the time delay calibration is not completed, the time delay calibration control module is further configured to: control the time delay calibration communication module to send a message to the oscilloscope, and the message is used to instruct the oscilloscope to perform time delay calibration again; after the time delay calibration communication module receives the time delay data corresponding to performing time delay calibration again sent by the oscilloscope, determine whether the time delay calibration is completed according to the time delay data corresponding to performing time delay calibration again.

10. The time delay calibration system according to claim 1, characterized in that, The time delay calibration device and the oscilloscope are encapsulated in the same housing; a port of the time delay calibration device for connecting to one end of the probe is provided on the housing, and a socket of a channel of the oscilloscope for connecting to the other end of the probe is also provided.

11. A time delay calibration method, characterized in that, The method includes: The time delay calibration device generates a time delay calibration signal based on a source signal; The time delay calibration device performs fan-out processing on the time delay calibration signal to obtain multiple output signals and outputs the multiple output signals outside the time delay calibration device; The time delay calibration device receives the time delay data sent by the oscilloscope; The time delay calibration device determines whether the time delay calibration is completed according to the time delay data to perform time delay calibration on the probe; The oscilloscope obtains a calibration instruction sent by the time delay calibration device and performs time delay calibration on each channel of the oscilloscope according to the calibration instruction; wherein, each channel is used to receive multiple signals output by the time delay calibration device and transmitted to the oscilloscope, and at least one of the multiple signals is detected by the probe and transmitted to the oscilloscope; The oscilloscope sends the time delay data to the time delay calibration device.

12. The time delay calibration method according to claim 11, characterized in that, Before the time delay calibration device generates a time delay calibration signal based on a source signal, the method further includes: The time delay calibration device generates a source signal based on a voltage-controlled oscillator provided inside the time delay calibration device; or, The time delay calibration device receives a source signal generated by an external signal source provided outside the time delay calibration device.

13. The time delay calibration method according to claim 12, characterized in that, Before the time delay calibration device generates a time delay calibration signal based on a source signal, the method further includes: The time delay calibration device selects, based on a user instruction, to provide the source signal generated by the voltage-controlled oscillator to the source signal processing module, or to provide the source signal generated by the external signal source accessed through the source signal input interface to the source signal processing module.

14. The time delay calibration method according to claim 11, characterized in that, The time delay calibration device generating a time delay calibration signal based on a source signal includes: The time delay calibration device divides the frequency of the source signal to generate a frequency-divided signal; The time delay calibration device shapes the frequency-divided signal to generate the time delay calibration signal.

15. The time delay calibration method according to claim 11 or 14, characterized in that, The delay calibration signal is a square wave signal, and the rising edge time of the square wave signal is less than a preset duration threshold; wherein, the preset duration threshold is set according to the delay calibration requirement.

16. The time delay calibration method according to claim 14, characterized in that, The delay calibration device determines whether the delay calibration is completed according to the delay data, including: The delay calibration device, in response to receiving a first instruction from the user, determines whether the delay calibration is completed according to the delay data corresponding to the first output signal sent by the oscilloscope; wherein, the first output signal is a signal obtained by frequency-dividing the source signal with an unchanged frequency division ratio and then passing through the shaping and fan-out processing. The delay calibration device, in response to receiving a second instruction from the user, determines whether the delay calibration is completed at least according to the delay data corresponding to the second output signal sent by the oscilloscope in the first time stage and the delay data corresponding to the third output signal sent by the oscilloscope in the second time stage; wherein, the second output signal is a signal obtained by frequency-dividing the source signal with a first frequency division ratio and then passing through the shaping and fan-out processing, the third output signal is a signal obtained by frequency-dividing the source signal with a second frequency division ratio and then passing through the shaping and fan-out processing, the second frequency division ratio is different from the first frequency division ratio, and the second time stage starts after determining that the delay data corresponding to the second output signal meets the preset conditions.

17. The time delay calibration method according to claim 11, characterized in that, The obtained multiplexed output signals include at least one pair of differential signals. The delay calibration device performs fan-out processing on the delay calibration signal, including: The delay calibration device converts a single-ended delay calibration signal into at least one pair of differential signals through fan-out processing.

18. The time delay calibration method according to claim 11, characterized in that, The delay calibration device determines whether the delay calibration is completed according to the delay data, including: If the delay data meets the preset conditions, the delay calibration device determines that the delay calibration is completed; If the delay data does not meet the preset conditions, the delay calibration device determines that the delay calibration is not completed; After determining that the delay calibration is not completed, the method further includes: The delay calibration device sends information to the oscilloscope, and the information is used to instruct the oscilloscope to perform delay calibration again; The delay calibration device receives the delay data corresponding to performing the delay calibration again sent by the oscilloscope; The delay calibration device determines whether the delay calibration is completed according to the delay data corresponding to performing the delay calibration again.

19. The time delay calibration method according to claim 11, wherein, The multiplexed signals received by the oscilloscope are square wave signals, and the rising edge time of the square wave signals is less than a preset duration threshold; wherein, the preset duration threshold is set according to the delay calibration requirement.

20. The time delay calibration method according to claim 11, wherein, The received multiplexed signals include at least one pair of differential signals.

21. The time delay calibration method according to claim 11, wherein, The method further includes: The oscilloscope obtains the information sent by the delay calibration device and performs delay calibration again according to the information; The oscilloscope sends the delay data corresponding to performing the delay calibration again to the delay calibration device.

22. The time delay calibration method according to claim 11, wherein, The method further includes: During a first time period, the oscilloscope receives multiple signals, performs time delay calibration on each channel of the received multiple signals to obtain time delay data corresponding to a second output signal, and sends the time delay data corresponding to the second output signal to the time delay calibration device; wherein, the multiple signals received during the first time period are signals that are input to the oscilloscope after being transmitted from the second output signal output by the time delay calibration device, and the second output signal is a signal obtained by frequency dividing a source signal by a first frequency division ratio by the time delay calibration device and then performing shaping and fan-out processing; During a second time period, the oscilloscope receives multiple signals, performs time delay calibration on each channel of the received multiple signals to obtain time delay data corresponding to a third output signal, and sends the time delay data corresponding to the third output signal to the time delay calibration device; wherein, the multiple signals received during the second time period are signals that are input to the oscilloscope after being transmitted from the third output signal output by the time delay calibration device, and the third output signal is a signal obtained by frequency dividing the source signal by a second frequency division ratio by the time delay calibration device and then performing shaping and fan-out processing, and the second frequency division ratio is different from the first frequency division ratio; The second time period starts after it is determined that the time delay data corresponding to the second output signal meets a preset condition.

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