Terminal device remote testing method and system, and electronic device

Abstract

The application discloses a terminal device remote testing method and system and electronic equipment, the method comprises the following steps: obtaining the device parameters and test configuration parameters of at least one terminal device to be tested; controlling the power supply equipment to supply power to the terminal device to be tested according to the device parameters, and adjusting the parameters of the test box according to the test configuration parameters; obtaining the environment measured parameters in the test box and the power supply measured parameters of the power supply equipment, and transmitting the environment measured parameters and the power supply measured parameters to the cloud server; using the cloud server to judge the test exception according to the environment measured parameters, the power supply measured parameters and the received test message value, and executing automatic intervention and / or notifying the test personnel to execute manual intervention according to the test exception judgment result. The application remotely monitors and manages the data of multiple terminal devices and test boxes through the cloud server, reduces the test cost, timely investigates the test exception through data monitoring, and improves the test efficiency and the effectiveness of the test data.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of terminal device testing, in particular to a terminal device remote testing method and system and electronic equipment. BACKGROUND

[0002] Terminal device is the general term of T-box, vehicle-mounted terminal, network-connected terminal and the like, which is usually installed on a vehicle and used for communication connection between the vehicle and a monitoring and management cloud server to realize remote monitoring and management of the vehicle, vehicle data acquisition, fault diagnosis, remote upgrading and the like, and is an important tool of the vehicle networking system. If the vehicle-mounted terminal device fails, the background server and the vehicle will lose contact, and the vehicle cannot be remotely monitored and managed, which will bring many inconveniences to automobile early warning, upgrading and maintenance, and therefore, it is crucial to test the performance and reliability of the terminal device and evaluate its working life in different environments.

[0003] Due to the differences in working environment and operating conditions of vehicles, the environment of the vehicle-mounted terminal device is different, and environmental factors such as temperature, humidity, vibration, impact, air pressure, illumination and dust will have different degrees of influence on the life of the terminal device, and it is necessary to simulate different working environments and operating conditions in the laboratory.

[0004] The existing terminal device testing method usually artificially designs different test groups, records the test results of different test groups, and screens abnormal devices through the test results, which has the following problems: in order to simulate different working environments and operating conditions, the test data, test time, sample quantity and program version of each test group are different, resulting in a large number of samples and test power required for the test, a long test time, repeated recording of data, repeated checking of whether the test data is valid, the need for special manpower for maintenance, and most of the work is repetitive, and batch testing cannot be realized. SUMMARY

[0005] The present application provides a terminal device remote testing method and system and electronic equipment to realize remote monitoring and management of test data in the terminal device testing process and improve testing efficiency.

[0006] According to an aspect of the present application, a terminal device remote testing method is provided, comprising the following steps:

[0007] Obtaining device parameters and test configuration parameters of at least one terminal device to be tested;

[0008] Controlling a power supply device to supply power to at least one terminal device to be tested according to the device parameters, and adjusting parameters of a test box according to the test configuration parameters;

[0009] Obtaining environment measured parameters in the test box and power supply measured parameters of the power supply device, and transmitting the environment measured parameters and the power supply measured parameters to a cloud server;

[0010] Adopting the cloud server to perform test abnormality judgment according to the environment measured parameters, the power supply measured parameters and received test message values, and performing automatic intervention and / or notifying a test personnel to perform manual intervention according to a test abnormality judgment result.

[0011] According to another aspect of the present application, a terminal device remote test system is provided, comprising a cloud server and a test end, the test end comprising a master control unit, a test box, an environment monitoring unit and a power supply device, the test box being used for testing a terminal device to be tested; the cloud server is in communication connection with at least one master control unit, and the cloud server is used for obtaining device parameters and test configuration parameters of at least one terminal device to be tested; the master control unit is used for controlling the power supply device to supply power to at least one terminal device to be tested according to the device parameters, and adjusting parameters of the test box according to the test configuration parameters; the environment monitoring unit is used for collecting environment measured parameters in the test box, and transmitting the environment measured parameters to the cloud server; the power supply device is used for independently supplying power to each terminal device to be tested, and transmitting power supply measured parameters of the power supply device to the cloud server; the cloud server is further used for performing test abnormality judgment according to the environment measured parameters, the power supply measured parameters and received test message values, and performing automatic intervention and / or notifying a test personnel to perform manual intervention according to a test abnormality judgment result.

[0012] Optionally, the power supply device comprises a power supply body and a multi-way switch, the multi-way switch being provided with at least one power supply channel, the power supply channel being electrically connected between the power supply body and the terminal device to be tested; the multi-way switch is used for receiving a power supply control signal of the master control unit, and controlling the terminal device to be tested to be powered on or powered off according to the power supply control signal.

[0013] According to another aspect of the present application, an electronic device is provided, comprising at least one processor, and a memory in communication connection with the at least one processor; wherein the memory stores a computer program which can be executed by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to execute the terminal device remote test method in any one of claims 1-7.

[0014] The technical scheme of the embodiment of the present application is characterized in that the cloud server is arranged to be in communication connection with at least one test terminal master control unit, the cloud server is used to acquire the device parameters and test configuration parameters of at least one terminal device to be tested, at the test terminal, the power supply device is controlled to supply power to the at least one terminal device to be tested according to the device parameters, and the test box is adjusted according to the test configuration parameters; the environment measured parameters in the test box and the power supply measured parameters of the power supply device are acquired, and the environment measured parameters and the power supply measured parameters are transmitted to the cloud server; the cloud server is used to make test exception judgment according to the environment measured parameters, the power supply measured parameters and the received test message values, and automatic intervention and / or manual intervention of the test personnel is executed according to the test exception judgment result, thereby solving the problem of high test labor cost and time cost caused by the fact that the existing terminal device test method cannot take into account batch automatic test and remote monitoring and management, and remote monitoring and management of the data of multiple terminal devices and test boxes can be simultaneously realized, the test labor cost and time cost are reduced, test exceptions are timely investigated through data monitoring, and the test efficiency and effectiveness of test data are improved.

[0015] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present application, nor is it intended to limit the scope of the present application. Other features of the present application will become apparent from the following description. BRIEF DESCRIPTION OF DRAWINGS

[0016] In order to more clearly illustrate the technical solutions in the embodiments of the present application, the drawings needed in the embodiment description will be briefly introduced below. Obviously, the drawings in the following description are only some embodiments of the present application, and other drawings can be obtained by those skilled in the art without creative labor.

[0017] Figure 1 is a flowchart of a terminal device remote test method provided by the first embodiment of the present application;

[0018] Figure 2 is a flowchart of another terminal device remote test method provided by the first embodiment of the present application;

[0019] Figure 3 is a flowchart of a terminal device remote test method provided by the second embodiment of the present application;

[0020] Figure 4 is a flowchart of a terminal device remote test method provided by the third embodiment of the present application;

[0021] Figure 5 is a flowchart of a terminal device remote test method provided by the fourth embodiment of the present application;

[0022] Figure 6is a flow chart of a terminal device remote testing method provided by the embodiment five of the present application;

[0023] Figure 7 is a flow chart of a terminal device remote testing method provided by the embodiment six of the present application;

[0024] Figure 8 is a structural schematic diagram of a terminal device remote testing system provided by the embodiment seven of the present application;

[0025] Figure 9 is a structural schematic diagram of an electronic device provided by the embodiment of the present application. DETAILED DESCRIPTION

[0026] In order to make the personnel in the art better understand the present application, the technical solutions in the embodiments of the present application will be described clearly and completely below in conjunction with the drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. Based on the embodiments in the present application, all other embodiments obtained by the person of ordinary skill in the art without creative labor should belong to the protection scope of the present application.

[0027] It should be noted that the terms "first", "second" and the like in the specification and claims of the present application and the above-described drawings are used to distinguish similar objects, and do not necessarily indicate a specific order or a chronological sequence. It should be understood that the data thus used can be interchanged under appropriate circumstances, so that the embodiments of the present application described herein can be implemented in an order other than that illustrated or described herein. In addition, the terms "include" and "have" and any variations thereof are intended to cover non-exclusive inclusion, for example, a process, method, system, product or device that includes a series of steps or units does not necessarily have to be limited to those steps or units clearly listed, but can include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0028] Embodiment one

[0029] Figure 1 is a flow chart of a terminal device remote testing method provided by the embodiment one of the present application. The embodiment can be applicable to the application scenarios of batch testing of multiple terminal devices, automatic recording of data, remote monitoring of devices and test boxes, and intervention in the middle of the test execution process. The method can be executed by a terminal device remote testing device, which can be realized in the form of hardware and / or software, and can be configured in a computer device.

[0030] In the embodiment of the present application, the terminal device remote testing device comprises a testing end and a cloud server. The testing end is provided with a master control unit, a test box and a power supply device. The cloud server is in communication connection with the master control unit of the testing end and the terminal device to be tested. The master control unit of the testing end is used to control the power supply device to supply power to the terminal device to be tested, control the test box to perform reliability test and conventional function test on the terminal device, read the test data in the power supply device and the test box, and send the relevant test data to the cloud server. The terminal device to be tested can be set one by one, or one master control unit can control the test process of multiple terminal devices to be tested of the same type.

[0031] As shown in Figure 1 the terminal device remote testing method specifically comprises the following steps:

[0032] Step S1: Obtain the device parameters and test configuration parameters of at least one terminal device to be tested.

[0033] In the embodiment of the present application, the terminal device to be tested can be a vehicle-mounted terminal device (for example, a T-box), a network-connected terminal or a remote terminal. The terminal device to be tested supports wireless communication function and is used to connect the cloud server, so that the terminal device to be tested receives the device parameters and test configuration parameters issued by the cloud server and periodically uploads the messages to the cloud server.

[0034] The device parameters refer to the parameters used for identity recognition and firmware upgrade of the terminal device to be tested. Typically, the device parameters include but are not limited to the preset power supply parameters, terminal model, software version, manufacturer and production batch, etc.

[0035] The test configuration parameters refer to the test group data used for simulating different working environments and operating conditions. Typically, the test configuration parameters include but are not limited to the test name, sample quantity, preset environment parameter, test time and data display. The test name used in the terminal device remote testing includes at least one of the following: high-temperature aging test, high-low temperature alternating test, high-low temperature and humidity test, high-low temperature impact test, dust test, rain test, salt spray corrosion test, ultraviolet aging test and vibration test.

[0036] In this step, the device parameters and test configuration parameters are stored in the cloud server before formal testing. During the entire test period, the cloud server issues the device parameters and test configuration parameters to the testing end, and remotely monitors and manages the terminal device to be tested and the test box based on the pre-stored parameters. The cloud server can be in communication connection with multiple testing ends at the same time, realizing simultaneous multi-channel data access and batch testing.

[0037] Step S2: Control the power supply device to supply power to the at least one terminal device to be tested according to the device parameters, and adjust the parameters of the test box according to the test configuration parameters.

[0038] In an embodiment of the present invention, a power supply device can simultaneously supply power to multiple terminal devices under test and independently control the power-on and power-off status of each terminal device under test. Controlling the power supply device to supply power to at least one terminal device under test based on device parameters includes: determining the terminal device under test that requires remote testing based on parameters such as the terminal model, manufacturer, and production batch sent by a cloud server, and controlling the power supply device to supply power to the terminal device under test that requires testing based on preset power supply parameters. The power supply device supports both voltage and current output. During the power supply process, the power supply device can adjust the power output type for each terminal device under test based on the preset power supply parameters.

[0039] In an embodiment of the present invention, the test chamber is used to change environmental parameters such as temperature, humidity, vibration, shock, air pressure, light, and dust. Adjusting the test chamber parameters according to the test configuration parameters includes setting the test parameters in the test chamber according to the test name and preset environmental parameters sent by the cloud server, so that the test chamber performs the corresponding test.

[0040] Step S3: Obtain the measured environmental parameters in the test box and the measured power supply parameters of the power supply equipment, and transmit the measured environmental parameters and the measured power supply parameters to the cloud server.

[0041] In one embodiment, the measured environmental parameters may include but are not limited to: test running time, temperature, humidity, air pressure, altitude and illumination. The measured power supply parameters may include but are not limited to: measured power supply voltage parameters and measured power supply current parameters.

[0042] In an embodiment of the present invention, an environmental monitoring module can be used to collect test parameters in the test chamber in real time and transmit the measured environmental parameters to a cloud server. The environmental monitoring module can directly transmit the measured environmental parameters to the cloud server, or the environmental monitoring module can transmit the measured environmental parameters to a test end main control unit, which then transmits the measured environmental parameters to the cloud server.

[0043] In an embodiment of the present invention, the power supply device may have a built-in monitoring module, which can record in real time the measured total power supply voltage value and the measured total power supply current value of all terminal devices under test connected to the power supply device, as well as the measured sub-power supply voltage and the measured sub-power supply current of each terminal device under test, and transmit the collected voltage value and current value to the test end main control unit, and the test end main control unit transmits the above-mentioned measured power supply parameters to the cloud server.

[0044] Step S4: The cloud server is used to perform test abnormality judgment based on the measured environmental parameters, the measured power supply parameters and the received test message values, and automatically intervenes and / or notifies the tester to perform manual intervention based on the test abnormality judgment result.

[0045] In this step, the test exception judgment includes judging whether the environment measured parameters of the test chamber are abnormal, judging whether the to-be-tested terminal device is abnormal, and judging whether the communication channel between the test terminal and the cloud server is abnormal.

[0046] Specifically, the cloud server can be in communication connection with at least one test terminal master control unit and the to-be-tested terminal device, and each to-be-tested terminal device can be placed in the same or different test environment to perform remote testing.

[0047] Before performing remote testing, the tester can configure the system according to the test requirements, and store the device parameters (such as terminal model, software version, manufacturer, and production batch) and test configuration parameters (such as test name, sample quantity, environment parameter, test time, and data display) of the devices participating in the test in the cloud server. The device parameters can be the device parameters of one or more to-be-tested terminal devices, and the test configuration parameters can be the test data of one or more different test chambers, and no limitation is made thereto.

[0048] When performing testing, the to-be-tested device parameters are placed in the test chamber, the cloud server sends the device parameters and the test configuration parameters to the corresponding to-be-tested terminal device and the test terminal master control unit, the master control unit controls the power supply device to supply power to the to-be-tested terminal device that needs to perform testing according to the device parameters, and adjusts the test parameters in the test chamber according to the test configuration parameters, so that the test chamber performs corresponding test testing on the to-be-tested device parameters, such as high-temperature aging test, high-low temperature alternating test, high-low temperature impact test, dust test, rain test, salt spray corrosion test, ultraviolet aging test, or vibration test. When performing testing, the power supply device collects the power supply measured parameters (such as power supply voltage value, power supply current value, total power supply voltage value, and total power supply current value) of each to-be-tested terminal device in real time, and the environment monitoring module collects the environment measured parameters in the test chamber in real time. The cloud server acquires and stores all the power supply measured parameters and the environment measured parameters uploaded by the devices, compares the environment measured parameters with the preset environment parameters of the test, judges whether the environment parameters of the test chamber are abnormal, compares the power supply measured parameters with the preset power supply parameters, judges whether the to-be-tested terminal device is abnormal, and judges whether the communication channel between the test terminal and the cloud server is abnormal according to the communication message value. When the environment measured parameters in the test chamber or the test data of the to-be-tested terminal device are abnormal, an exception alarm is given, automatic intervention or notification of the tester is realized.

[0049] The technical solution of the embodiment of the present invention acquires, stores, processes and displays test data of multiple test chambers and terminal devices to be tested through a cloud server, and realizes remote monitoring and test automation management of multiple terminal devices and test chamber data by improving the test data anomaly analysis algorithm. It solves the problem of high testing labor costs and time costs caused by the inability of existing terminal equipment testing methods to take into account both batch automatic testing and remote monitoring and management. It can reduce the labor costs and time costs of testing, and timely detect test anomalies through data monitoring, which is conducive to improving test efficiency and the effectiveness of test data.

[0050] Optionally, Figure 2 This is a flowchart of another terminal device remote testing method provided by the first embodiment of the present invention. Figure 1 Based on this, a specific implementation of the above step S4 is exemplarily shown.

[0051] like Figure 2 As shown, the above step S4 includes the following steps:

[0052] Step S401: Obtain preset environmental parameters, preset power supply parameters, and preset message parameters.

[0053] Among them, the preset environmental parameters, preset power supply parameters and preset message parameters can be stored in the cloud server by the tester before the test is executed.

[0054] Step S402: Obtain the environmental parameter type of the preset environmental parameter, where the environmental parameter type includes a zero environmental parameter, a single-variable environmental parameter, and a multi-variable environmental parameter.

[0055] Zero environmental parameters refer to environmental parameters that do not need to be monitored during the test. Typically, these include temperature parameters used in normal tests, as well as difficult-to-monitor environmental parameters such as dust, rain, and smoke.

[0056] Single-variable environmental parameters refer to setting only one environmental parameter as a variable in the test process. For example, only one of the environmental parameters such as temperature, humidity, vibration, shock, dust, light, and air pressure in the test chamber is changed.

[0057] Multivariable environmental parameters refer to setting multiple environmental parameters as variables in the test process. Typically, 2-3 environmental parameter variables can be set. For example, the ambient temperature and ambient humidity in the test chamber can be changed at the same time.

[0058] Step S403: matching the corresponding parameter anomaly judgment strategy according to the environmental parameter type, and performing an anomaly analysis on the environmental measured parameters, the power supply measured parameters and the test message values ​​according to the parameter anomaly judgment strategy.

[0059] In this step, for the single variable environmental parameter and the multi-variable environmental parameter, the environmental parameter type can be a constant variable environmental parameter or a variable variable environmental parameter, wherein the constant variable environmental parameter refers to an environmental parameter set to a single value during the test process, for example, the temperature in the test chamber can be set to a constant 85℃; the variable variable environmental parameter refers to an environmental parameter that cyclically changes within a set range during the test process, for example, the test chamber can be set to perform temperature cycling or temperature shock between -40℃ and 85℃.

[0060] In an embodiment, when the environmental parameter type is a single variable environmental parameter or a multi-variable environmental parameter, a corresponding parameter abnormality judgment strategy is matched according to the environmental parameter type, including: judging whether the preset environmental parameter is a constant variable environmental parameter or a variable variable environmental parameter, and executing a corresponding parameter abnormality judgment strategy according to the judgment result.

[0061] Step S404: performing automatic intervention and / or notifying the test personnel to perform manual intervention according to the test abnormality judgment result.

[0062] Specifically, the cloud server pre-stores a plurality of parameter abnormality judgment strategies, and the parameter abnormality judgment strategies correspond one-to-one to the environmental parameter types. After obtaining the environmental parameter type (for example, zero environmental parameter, single variable environmental parameter or multi-variable environmental parameter) set by the test personnel and the parameter abnormality judgment strategy corresponding to the environmental parameter type, the environmental measured parameter, the power measured parameter and the test message value are sequentially analyzed for abnormality. When the environmental measured parameter in the test chamber or the test data of the terminal device under test is abnormal, an abnormal alarm is performed to realize automatic intervention or notify the test personnel to perform manual intervention. By matching different abnormality analysis mechanisms for different test types, the test data abnormality analysis algorithm is improved, and the test data is remotely monitored through the cloud server, which is conducive to improving the test efficiency and the effectiveness of the test data.

[0063] Embodiment Two

[0064] Optionally, Figure 3 is a flowchart of a terminal device remote test method provided by the embodiment two of the present application, which exemplarily shows a test parameter abnormality analysis strategy on the basis of the embodiment one. In the embodiment, Figure 3 the environmental parameter type is a zero environmental parameter.

[0065] As Figure 3 shown, the terminal device remote test method specifically includes the following steps:

[0066] Step S1: obtaining device parameters and test configuration parameters of at least one terminal device under test.

[0067] Step S2: According to the device parameter, the power supply device supplies power to at least one terminal device to be tested, and the test box is adjusted according to the test configuration parameter.

[0068] Step S3: Obtain the environment measured parameter in the test box and the power supply measured parameter of the power supply device, and transmit the environment measured parameter and the power supply measured parameter to the cloud server.

[0069] Step S431: Execute the zero environment parameter abnormality judgment strategy. Wherein, the zero environment parameter abnormality judgment strategy refers to the parameter abnormality judgment strategy corresponding to the zero environment parameter.

[0070] Step S432: Shield the environment parameter abnormality judgment.

[0071] Wherein, shielding the environment parameter abnormality judgment refers to not executing the environment parameter abnormality judgment when the environment parameter type is the zero environment parameter.

[0072] Step S433: Calculate the difference between the preset power supply parameter and the power supply measured parameter, and determine whether the power supply measured parameter is abnormal according to the comparison result of the difference and the preset power supply deviation threshold.

[0073] In this step, taking the power supply measured parameter as the power supply current and the preset power supply deviation threshold as the preset power supply current deviation threshold as an example, the cloud server can first calculate the difference ΔI between the measured total power supply current of all terminal devices to be tested connected to the power supply device and the preset total power supply current. If the difference ΔI is greater than the preset power supply current deviation threshold, the power supply device is controlled to individually power on and power off each terminal device to be tested, and the measured power supply current of each terminal device to be tested is collected in turn. The difference Δi between the measured power supply current and the preset power supply current is calculated. If the difference Δi is greater than the preset power supply current deviation threshold, it is determined that the corresponding terminal device to be tested is abnormal, and the cloud server sends a terminal device abnormality alarm to the test personnel.

[0074] Step S434: Calculate the bit error rate between the preset message parameter and the test message value, and determine whether the test message value is abnormal according to the comparison result of the bit error rate and the preset bit error rate threshold.

[0075] In this step, the cloud server obtains the message value carrying test data uploaded by each terminal device to be tested, compares the actual received message value with the preset message parameter, calculates the message bit error rate ΔDw, and if the bit error rate ΔDw is greater than the preset bit error rate threshold, it is determined that the communication channel between the terminal device to be tested and the cloud server is abnormal, and the cloud server sends a terminal device abnormality alarm to the test personnel.

[0076] Specifically, the steps S431 to S434 are applicable to application scenarios in which the test environment does not need to monitor the environmental parameters. After obtaining the environmental measured parameters in the test box and the power supply measured parameters of the power supply device, no environmental parameter abnormality judgment is performed. The specific time of the occurrence of the device abnormality is obtained through the mutation time point of the total power supply current; the specific terminal device in which the abnormality occurs is located through the analysis of the power supply current; the abnormal device is further identified through the remote message value of the cloud server, the precise positioning of the abnormal terminal device is realized, and the abnormal alarm is performed, which can reduce the labor cost and time cost of the test, the test abnormality is timely investigated through the data monitoring, and the test efficiency and the effectiveness of the test data are improved.

[0077] Embodiment Three

[0078] Optionally, Figure 4 is a flowchart of a terminal device remote test method provided by Embodiment Three of the present application, which exemplarily shows another test parameter abnormality analysis strategy on the basis of Embodiment One. Figure 4 In the embodiment, the environmental parameter type is a constant variable environmental parameter.

[0079] As Figure 4 shown, the terminal device remote test method specifically includes the following steps:

[0080] Step S1: Obtain the device parameters and test configuration parameters of at least one terminal device to be tested.

[0081] Step S2: Control the power supply device to supply power to the at least one terminal device to be tested according to the device parameters, and adjust the parameters of the test box according to the test configuration parameters.

[0082] Step S3: Obtain the environmental measured parameters in the test box and the power supply measured parameters of the power supply device, and transmit the environmental measured parameters and the power supply measured parameters to the cloud server.

[0083] Step S441: Perform a constant variable environmental parameter abnormality judgment strategy. The constant variable environmental parameter abnormality judgment strategy refers to a parameter abnormality judgment strategy corresponding to a constant variable environmental parameter.

[0084] Step S442: Determine the environmental parameter fluctuation threshold according to the mean μ and the standard deviation σ of the multiple environmental measured parameters, and perform environmental parameter abnormality judgment according to the environmental parameter fluctuation threshold.

[0085] In this step, the environmental parameter fluctuation threshold includes the upper threshold μ+σ and the lower threshold μ-σ, and it is judged whether the environmental measured parameter exceeds the environmental parameter fluctuation threshold range (μ-σ, μ+σ). If the environmental measured parameter exceeds the environmental parameter fluctuation threshold range (μ-σ, μ+σ), it is determined that the test box has an environmental parameter abnormality.

[0086] In an embodiment, the tester can adjust the theoretical value of the environmental parameter and the abnormal triggering condition through the cloud server, which is conducive to optimizing the abnormality detection algorithm.

[0087] Step S443: Calculate the difference between the preset power supply parameter and the measured power supply parameter, and determine whether the measured power supply parameter is abnormal according to the comparison result of the difference and the preset power supply deviation threshold.

[0088] Step S444: Calculate the bit error rate between the preset message parameter and the test message value, and determine whether the test message value is abnormal according to the comparison result of the bit error rate and the preset bit error rate threshold.

[0089] Specifically, the above steps S441 to S444 are applicable to the application scenario where the test process adopts constant variable environmental parameters, for example, the environmental variable is set to maintain 85℃. After obtaining the environmental measured parameter in the test box and the power supply measured parameter of the power supply device, first calculate the mean μ and the standard deviation σ of the measured temperature currently collected, the environmental parameter fluctuation threshold includes the upper threshold μ+σ and the lower threshold μ-σ, judge whether the measured temperature exceeds the environmental parameter fluctuation threshold range (μ-σ, μ+σ), if the measured temperature exceeds the environmental parameter fluctuation threshold range (μ-σ, μ+σ), it is determined that the test box has environmental parameter abnormality. After completing the environmental parameter abnormality judgment, whether the terminal device is abnormal is judged by the power supply measured parameter and the message value, which is the same as the above embodiment, and will not be described here. Through the monitoring and abnormality judgment strategy of the new test environment, the remote monitoring and control of the test box itself are realized, which is conducive to improving the effectiveness of the test data.

[0090] In an embodiment, when sampling the environmental parameters of the test box, the environmental monitoring module (such as a temperature sensor) can be arranged on the surface of the terminal device under test. For example, when the terminal device under test works in an 85℃ environment, the actual working temperature of the core components of the terminal device under test can be determined by testing the surface temperature of the terminal device shell or the circuit board temperature, and the temperature rise information is obtained, which provides a basis for optimizing heat dissipation and designing structure.

[0091] Embodiment Four

[0092] Optionally, Figure 5 is a flowchart of a terminal device remote test method provided by Embodiment Four of the present application, which exemplarily shows another test parameter abnormality analysis strategy on the basis of Embodiment One. In Figure 5 In the embodiment, the environmental parameter type is a variable variable environmental parameter.

[0093] As Figure 5 shown, the terminal device remote test method specifically includes the following steps:

[0094] Step S1: Obtain device parameters and test configuration parameters of at least one terminal device to be tested.

[0095] Step S2: Control the power supply device to supply power to the at least one terminal device to be tested according to the device parameters, and adjust the parameters of the test chamber according to the test configuration parameters.

[0096] Step S3: Obtain the environment measured parameters in the test chamber and the power supply measured parameters of the power supply device, and transmit the environment measured parameters and the power supply measured parameters to the cloud server.

[0097] Step S451: Execute the variable variable environment parameter abnormality judgment strategy. The variable variable environment parameter abnormality judgment strategy refers to the parameter abnormality judgment strategy corresponding to the variable variable environment parameter.

[0098] Step S452: Perform polynomial fitting on the environment measured parameters and the power supply measured parameters, and perform environment parameter abnormality judgment according to the deviation rate of the environment measured parameters relative to the fitting curve.

[0099] Step S453: Calculate the difference between the preset power supply parameters and the power supply measured parameters, and determine whether the power supply measured parameters are abnormal according to the comparison result of the difference and the preset power supply deviation threshold.

[0100] Step S454: Calculate the bit error rate between the preset message parameters and the test message value, and determine whether the test message value is abnormal according to the comparison result of the bit error rate and the preset bit error rate threshold.

[0101] Specifically, the above steps S451 to S454 are applicable to application scenarios where the test process uses variable variable environment parameters, for example, the test chamber is set to perform temperature cycling or temperature impact between-40℃ and 85℃. The environment measured parameters are variable parameters, and the trend of the environment measured parameters (such as temperature) changing with time has relevance with the trend of the power supply measured parameters (such as the measured total power supply current) changing with time. When performing polynomial fitting, the temperature can be used as the horizontal coordinate, and the measured total power supply current can be used as the vertical coordinate to draw a curve, and the fitting curve can be obtained based on the polynomial fitting method. Calculate the deviation rate between the measured temperature and the fitting curve, if the deviation rate exceeds the preset deviation rate threshold, it is determined that the environment parameter abnormality occurs. After completing the environment parameter abnormality judgment, whether the terminal device is abnormal is determined through the power supply measured parameters and the message value, which is consistent with the above embodiment, and will not be repeated here. By adding the monitoring and abnormality judgment strategy of the test environment, the remote monitoring and control of the test chamber itself are realized, which is conducive to improving the effectiveness of the test data.

[0102] It should be noted that any environment measured parameter can be used as the vertical coordinate, and the time can be used as the horizontal coordinate to establish the fitting curve, and the deviation rate of the environment measured parameter relative to the fitting curve is calculated, which is not limited.

[0103] Embodiment Five

[0104] In the embodiments of the present application, if the measured power supply parameters or test message values are abnormal, the cloud server can alarm the abnormal to-be-tested terminal equipment and perform automatic intervention. If the environment measured parameters are abnormal, the cloud server can inform the tester to perform manual intervention

[0105] Optionally, Figure 6 is a flowchart of a terminal equipment remote testing method provided by Embodiment Five of the present application, which shows a specific implementation of intervening in the middle of the testing execution process on the basis of Embodiment One.

[0106] As Figure 6 shown, the automatic intervention according to the test abnormality judgment result includes:

[0107] Step S601: Obtain the measured power supply parameters of each to-be-tested terminal equipment.

[0108] Step S602: Perform abnormality positioning on the to-be-tested terminal equipment according to the measured power supply parameters.

[0109] Step S603: Control the power supply equipment to perform power-off or power-on processing on the to-be-tested terminal equipment according to the abnormality positioning result.

[0110] Specifically, the cloud server issues the equipment parameters to the master control unit, so that the master control unit controls the power supply equipment to individually power on and power off each to-be-tested terminal equipment, obtains the measured power supply parameters of each to-be-tested terminal equipment, sequentially collects the measured power supply current of each to-be-tested terminal equipment, calculates the difference Δi between the measured power supply current and the preset power supply current, if the difference Δi is greater than the preset power supply current deviation threshold, determines that the corresponding to-be-tested terminal equipment is an abnormal equipment; if the difference Δi is less than or equal to the preset power supply current deviation threshold, determines that the corresponding to-be-tested terminal equipment is a normal equipment. Further, the cloud server obtains the equipment parameters of the normal equipment and the equipment parameters of the abnormal equipment, controls the corresponding to-be-tested terminal equipment to be powered on according to the equipment parameters of the normal equipment, and controls the corresponding to-be-tested terminal equipment to be powered off according to the equipment parameters of the abnormal equipment, realizes automatic power-off intervention of the abnormal equipment, avoids the influence of the abnormal equipment on other equipment testing, ensures the overall testing of multiple terminal equipments to be effectively performed, and improves the testing efficiency.

[0111] As Figure 6 shown, the manual intervention according to the test abnormality judgment result includes:

[0112] Step S604: Generate alarm information according to the abnormal environment parameters in the environment measured parameters.

[0113] Step S605: The alarm information is sent to the tester, and the tester uploads the update parameter of the test configuration parameter.

[0114] Step S606: The update parameter is sent to the test end, and the terminal equipment under test is tested.

[0115] Specifically, the terminal equipment under test can be upgraded and parameterized through the cloud server, and the terminal equipment under test periodically sends messages to the cloud server, realizes human intervention through the cloud server, changes test variables, conducts comparative test and quantitative analysis, realizes batch test and intervention, and improves test efficiency.

[0116] It should be noted that for multi-variable environmental parameters, the cloud server device can be alarmed, for example, when any or multiple environmental parameters are abnormal, the environmental parameter abnormality alarm is performed.

[0117] Embodiment six

[0118] Optionally, Figure 7 is a flowchart of a terminal equipment remote test method provided by the embodiment six of the present application, which adds a running time detection function on the basis of the embodiment one.

[0119] As Figure 7 shown, before step S4 is executed, the terminal equipment remote test method further comprises:

[0120] Step S701: Obtain the preset running time and the actual running time of the test box.

[0121] Step S702: Determine whether the actual running time reaches the preset running time.

[0122] If the actual running time reaches the preset running time, step S703 is executed; otherwise, step S4 is continuously executed.

[0123] Step S703: Terminate the abnormality determination.

[0124] Exemplarily, the preset running time can be set as 1000 hours. After the remote test is started, the actual running time of the test box is recorded. If the actual running time does not reach the preset running time, the subsequent abnormality determination and remote test are continuously executed; if the actual running time reaches the preset running time, the parameter abnormality determination is terminated, so as to avoid the waste of memory resources caused by the program running empty after the test is completed.

[0125] Embodiment seven

[0126] Based on any of the above embodiments, the seventh embodiment of the present application provides a terminal device remote testing system, which can execute the terminal device remote testing method provided by any of the embodiments of the present application, and has the corresponding function modules and beneficial effects of the execution method.

[0127] Figure 8 is a structural schematic diagram of a terminal device remote testing system provided by the seventh embodiment of the present application.

[0128] As shown in Figure 8 , the terminal device remote testing system 100 comprises a cloud server 110 and a test end 120, the test end 120 comprises a master control unit 121, a test box 122, an environment monitoring unit 123 and a power supply device 124, the test box 122 is used for testing the terminal device to be tested 200; the cloud server 110 is in communication connection with at least one master control unit 121, and the cloud server 110 is used for acquiring the device parameters and the test configuration parameters of at least one terminal device to be tested 200; the master control unit 121 is used for controlling the power supply device 124 to supply power to at least one terminal device to be tested 200 according to the device parameters, and adjusting the parameters of the test box 122 according to the test configuration parameters; the environment monitoring unit 123 is used for collecting the environment actually measured parameters in the test box 122, and transmitting the environment actually measured parameters to the cloud server 110; the power supply device 124 is used for independently supplying power to each terminal device to be tested 200, and transmitting the power supply actually measured parameters of the power supply device 124 to the cloud server 110; the cloud server 110 is further used for judging the test abnormality according to the environment actually measured parameters, the power supply actually measured parameters and the test message values received, and executing automatic intervention and / or notifying the test personnel to execute artificial intervention according to the test abnormality judgment result.

[0129] Optionally, as shown in Figure 8 , the power supply device 124 comprises a power supply body 124A and a multi-way switch 124K, the multi-way switch 124K is provided with at least one power supply channel, the power supply channel is electrically connected between the power supply body 124A and the terminal device to be tested 200; the multi-way switch 124K is used for receiving the power supply control signal of the master control unit 121, and controlling the terminal device to be tested 200 to be powered on or powered off according to the power supply control signal.

[0130] Among them, the power supply device 124 supports voltage output and current output, in the power supply process, the power supply device 124 can determine the power supply output type according to the terminal model of the terminal device to be tested 200.

[0131] In an embodiment, the multi-way switch 124K can be a relay assembly, a control end of the relay assembly is used to receive a power supply control signal sent by the master control unit 121, and each terminal device to be tested 200 is electrically connected to the power supply body 124A through a group of independent relay contacts. The power supply body 124A is internally provided with a monitoring module, which can collect voltage and current values in real time and transmit them to the master control unit 121. One set of power supply body 124A can supply power to n terminal devices to be tested at the same time, where n is a positive integer greater than or equal to 1, and n includes but is not limited to 4, 8, 16, 32, 64 and 80.

[0132] Optionally, when performing the test exception judgment, the cloud server 110 is configured to acquire preset environment parameters, preset power supply parameters and preset message parameters; acquire an environment parameter type of the preset environment parameters, the environment parameter type including zero environment parameters, single-variable environment parameters and multi-variable environment parameters; and match a corresponding parameter exception judgment strategy according to the environment parameter type, and perform exception analysis on the environment measured parameters, the power supply measured parameters and the test message values according to the parameter exception judgment strategy.

[0133] Optionally, when the environment parameter type is zero environment parameters, the parameter exception judgment strategy includes: shielding the environment parameter exception judgment; calculating a difference value between the preset power supply parameters and the power supply measured parameters, and determining whether the power supply measured parameters are abnormal according to a comparison result of the difference value and a preset power supply deviation threshold; and calculating a bit error rate between the preset message parameters and the test message values, and determining whether the test message values are abnormal according to a comparison result of the bit error rate and a preset bit error rate threshold.

[0134] Optionally, when the environment parameter type is single-variable environment parameters or multi-variable environment parameters, the parameter exception judgment strategy includes: determining an environment parameter fluctuation threshold according to a mean value and a standard deviation of the multiple environment measured parameters, and performing environment parameter exception judgment according to the environment parameter fluctuation threshold; or performing polynomial fitting on the environment measured parameters and the power supply measured parameters, and performing environment parameter exception judgment according to a deviation rate of the environment measured parameters relative to the fitting curve.

[0135] Optionally, automatic intervention is performed according to the test exception judgment result, including: acquiring the measured power supply parameters of each terminal device to be tested; performing exception positioning on the terminal device to be tested according to the measured power supply parameters; and controlling the power supply equipment to perform power-off or power-on processing on the terminal device to be tested according to the exception positioning result.

[0136] Optionally, human intervention is performed by a tester according to the test exception judgment result, including: generating alarm information according to the abnormal environment parameters in the environment measured parameters; sending the alarm information to the tester, and receiving updated parameters of the test configuration parameters uploaded by the tester; and sending the updated parameters to the test terminal to test the terminal device to be tested.

[0137] In an embodiment, the terminal device remote test system 100 further comprises a timing unit configured to obtain a preset running time and an actual running time of the test chamber; and the cloud server 110 is further configured to determine whether the actual running time reaches the preset running time, and terminate the abnormality determination when the actual running time reaches the preset running time.

[0138] Embodiment Eight

[0139] According to another aspect of the present application, an electronic device is provided, comprising: at least one processor; and a memory connected with the at least one processor in communication; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to perform the terminal device remote test method.

[0140] Figure 9 is a structural schematic diagram of an electronic device provided by an embodiment of the present application. The electronic device 10 is intended to represent various forms of digital computers, such as laptops, desktops, tablets, personal digital assistants, servers, blade servers, mainframes, and other appropriate computers. The electronic device can also represent various forms of mobile devices, such as personal digital processors, cellular telephones, smart phones, wearable devices (such as headsets, glasses, watches, etc.), and other similar computing devices. The components shown here, their connections, and their functions, are meant to be examples only, and are not intended to limit the implementations of the present application described and / or claimed in this document.

[0141] As shown in Figure 9 The electronic device 10 includes at least one processor 11, and a memory, such as a read-only memory (ROM) 12, a random access memory (RAM) 13, etc., connected with the at least one processor 11 in communication, wherein the memory stores a computer program executable by the at least one processor, and the processor 11 can perform various appropriate actions and processes according to the computer program stored in the read-only memory (ROM) 12 or loaded into the random access memory (RAM) 13 from the storage unit 18. In the RAM 13, various programs and data required for the operation of the electronic device 10 can also be stored. The processor 11, the ROM 12, and the RAM 13 are connected with each other through a bus 14. An input / output (I / O) interface 15 is also connected to the bus 14.

[0142] A plurality of components in the electronic device 10 are connected to the I / O interface 15, including: an input unit 16, such as a keyboard, a mouse, etc.; an output unit 17, such as various types of displays, speakers, etc.; a storage unit 18, such as a magnetic disk, an optical disk, etc.; and a communication unit 19, such as a network card, a modem, a wireless communication transceiver, etc. The communication unit 19 allows the electronic device 10 to exchange information / data with other devices through a computer network, such as the Internet, and / or various telecommunication networks.

[0143] The processor 11 can be various general and / or special purpose processing components with processing and computing capabilities. Some examples of the processor 11 include, but are not limited to, a central processing unit (CPU), a graphics processing unit (GPU), various special-purpose artificial intelligence (AI) computing chips, various processors running machine learning model algorithms, a digital signal processor (DSP), and any appropriate processor, controller, microcontroller, etc. The processor 11 performs various methods and processes described above, such as the terminal device remote testing method.

[0144] In some embodiments, the terminal device remote testing method can be implemented as a computer program tangibly embodied in a computer readable storage medium, such as the storage unit 18. In some embodiments, part or all of the computer program can be loaded and / or installed onto the electronic device 10 via the ROM 12 and / or the communication unit 19. When the computer program is loaded onto the RAM 13 and executed by the processor 11, one or more steps of the terminal device remote testing method described above can be performed. Alternatively, in other embodiments, the processor 11 can be configured to perform the terminal device remote testing method by any other appropriate means, such as by means of firmware.

[0145] Various implementations of the systems and techniques described above can be realized in digital electronic circuitry, integrated circuitry, a field programmable gate array (FPGA), an application specific integrated circuit (ASIC), a system on a chip (SOC), a programmable logic device (PLD), a computer hardware, firmware, software, and / or combinations thereof. These various implementations can include implementation in one or more computer programs that are executable and / or interpretable on a programmable system including at least one programmable processor, which can be special or general purpose, coupled to receive data and instructions from, and to transmit data and instructions to, a storage system, at least one input device, and at least one output device.

[0146] Computer programs for implementing the methods of the present application can be written in any combination of one or more programming languages. These computer programs can be provided to a processor of a general purpose computer, special purpose computer, or other programmable data processing apparatus, such that the computer program, when executed, can cause instructions defined in the flow charts and / or block diagrams to be implemented. The computer program can be executed entirely on a machine, partially on a machine, partially on a machine as a stand-alone software package, and partially on a remote machine or entirely on a remote machine or server.

[0147] In the context of the present application, a computer-readable storage medium can be a tangible medium that can contain or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. A computer-readable storage medium can include, but is not limited to, an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, apparatus, or device, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium can be a machine-readable signal medium. More specific examples of a machine-readable storage medium will include one or more lines of a program of instructions in a transitory signal, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0148] To provide for interaction with a user, the systems and techniques described here can be implemented on an electronic device having a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the electronic device. Other kinds of devices can be used to provide for interaction with a user as well; for example, feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form, including acoustic, speech, or tactile input.

[0149] The systems and techniques described herein can be implemented in a computing system that includes a back end component, e.g., as a data server, or that includes a middleware component, e.g., an application server, or that includes a front end component, e.g., a user computer having a graphical user interface or a Web browser through which a user can interact with an implementation of the systems and techniques described herein, or any combination of such back end, middleware, or front end components. The components of the system can be interconnected by any form or medium of digital data communication, e.g., a communication network. Examples of communication networks include a local area network (LAN), a wide area network (WAN), a blockchain network, and the Internet.

[0150] The computing system can include clients and servers. A client and server are generally remote from each other and typically interact through a communication network. The relationship of client and server arises by virtue of computer programs running on the respective computers and having a client-server relationship to each other. A server can be a cloud server, also known as a cloud computing server or cloud host, which is a host product in the cloud computing service system, to solve the defects of large management difficulty and weak business scalability in traditional physical host and VPS service.

[0151] It should be understood that the various forms of flow shown above can be re-ordered, added to, or deleted from without departing from the scope of the present disclosure. For example, the steps recited in the present disclosure can be performed in parallel, in series, or in a different order, and the present disclosure is not limited herein as long as the desired results of the technical solutions of the present disclosure can be achieved.

[0152] The specific embodiments described above are not intended to limit the scope of the present disclosure. Those skilled in the art will understand that various modifications, combinations, sub-combinations, and alternatives can be made to the specific embodiments without departing from the spirit and principles of the present disclosure. Any further modifications, equivalents, and / or alternatives come within the scope of the present disclosure as set forth in the following claims.

Claims

1. A terminal device remote testing method, characterized by, The method comprises the following steps: obtaining device parameters and test configuration parameters of at least one terminal device to be tested; controlling a power supply device to supply power to at least one terminal device to be tested according to the device parameters, and adjusting parameters of a test box according to the test configuration parameters; obtaining environment measured parameters in the test box and power supply measured parameters of the power supply device, and transmitting the environment measured parameters and the power supply measured parameters to a cloud server; performing test exception judgment according to the environment measured parameters, the power supply measured parameters and received test message values by the cloud server, and executing automatic intervention and / or notifying a tester to perform manual intervention according to the test exception judgment result; performing test exception judgment according to the environment measured parameters, the power supply measured parameters and received test message values by the cloud server, comprising: obtaining preset environment parameters, preset power supply parameters and preset message parameters; obtaining an environment parameter type of the preset environment parameters, wherein the environment parameter type comprises zero environment parameters, single variable environment parameters and multi-variable environment parameters; matching a corresponding parameter exception judgment strategy according to the environment parameter type, and performing exception analysis on the environment measured parameters, the power supply measured parameters and the test message values according to the parameter exception judgment strategy; when the environment parameter type is zero environment parameters, the parameter exception judgment strategy comprises: shielding environment parameter exception judgment; calculating a difference value between the preset power supply parameters and the power supply measured parameters, and determining whether the power supply measured parameters are abnormal according to a comparison result of the difference value and a preset power supply deviation threshold value; calculating a bit error rate between the preset message parameters and the test message values, and determining whether the test message values are abnormal according to a comparison result of the bit error rate and a preset bit error rate threshold value; when the environment parameter type is single variable environment parameters or multi-variable environment parameters, the parameter exception judgment strategy comprises: determining an environment parameter fluctuation threshold value according to a mean value and a standard deviation of a plurality of environment measured parameters, and performing environment parameter exception judgment according to the environment parameter fluctuation threshold value; or, performing polynomial fitting on the environment measured parameters and the power supply measured parameters, and performing environment parameter exception judgment according to a deviation rate of the environment measured parameters relative to the fitting curve.

2. The method of claim 1, wherein, executing automatic intervention according to the test exception judgment result, comprising: obtaining power supply measured parameters of each terminal device to be tested; performing exception positioning on the terminal device to be tested according to the power supply measured parameters; controlling the power supply device to perform power-off processing or power-on processing on the terminal device to be tested according to the exception positioning result.

3. The method of claim 1, wherein, notifying a tester to perform manual intervention according to the test exception judgment result, comprising: generating alarm information according to an abnormal environment parameter in the environment measured parameters; downloading the alarm information to the tester, and receiving an uploaded update parameter of the test configuration parameter; downloading the update parameter to a test terminal, and testing the terminal device to be tested.

4. The method according to any one of claims 1 to 3, characterized in that, Before the cloud server performs test exception judgment according to the environment measured parameters, the power supply measured parameters and the received test message values, the method further comprises: acquiring a preset running time and an actual running time of the test box; determining whether the actual running time reaches the preset running time; if the actual running time reaches the preset running time, terminating the exception judgment.

5. A terminal device remote testing system, characterized by, comprise: a cloud server and a test end, the test end comprising a master control unit, a test box, an environment monitoring unit and a power supply device, the test box being used for testing a terminal device to be tested; the cloud server is in communication connection with at least one master control unit, and is used for acquiring device parameters and test configuration parameters of at least one terminal device to be tested; the master control unit is used for controlling the power supply device to supply power to at least one terminal device to be tested according to the device parameters, and adjusting parameters of the test box according to the test configuration parameters; the environment monitoring unit is used for collecting environment measured parameters in the test box and transmitting the environment measured parameters to the cloud server; the power supply device is used for independently supplying power to each terminal device to be tested and transmitting power supply measured parameters of the power supply device to the cloud server; the cloud server is further used for performing test exception judgment according to the environment measured parameters, the power supply measured parameters and the received test message values, and performing automatic intervention and / or notifying a test personnel to perform manual intervention according to a test exception judgment result; when performing test exception judgment, the cloud server is used for acquiring preset environment parameters, preset power supply parameters and preset message parameters; acquiring an environment parameter type of the preset environment parameters, the environment parameter type comprising zero environment parameters, single variable environment parameters and multi-variable environment parameters; and matching a corresponding parameter exception judgment strategy according to the environment parameter type, and performing exception analysis on the environment measured parameters, the power supply measured parameters and the test message values according to the parameter exception judgment strategy; when the environment parameter type is zero environment parameters, the parameter exception judgment strategy comprises: shielding environment parameter exception judgment; calculating a difference value between the preset power supply parameters and the power supply measured parameters, and determining whether the power supply measured parameters are abnormal according to a comparison result of the difference value and a preset power supply deviation threshold; calculating a bit error rate between the preset message parameters and the test message values, and determining whether the test message values are abnormal according to a comparison result of the bit error rate and a preset bit error rate threshold; when the environment parameter type is single variable environment parameters or multi-variable environment parameters, the parameter exception judgment strategy comprises: determining an environment parameter fluctuation threshold according to a mean value and a standard deviation of multiple environment measured parameters, and performing environment parameter exception judgment according to the environment parameter fluctuation threshold; or performing polynomial fitting on the environment measured parameters and the power supply measured parameters, and performing environment parameter exception judgment according to a deviation rate of the environment measured parameters relative to the fitting curve.

6. The terminal device remote testing system of claim 5, wherein, the power supply device comprises a power supply body and a multi-way switch, the multi-way switch being provided with at least one power supply channel, the power supply channel being electrically connected between the power supply body and the terminal device to be tested; The multi-way switch is configured to receive a power supply control signal of the master unit and control power-on or power-off of the terminal device under test according to the power supply control signal.

7. An electronic device, comprising: The electronic device comprises: at least one processor; and a memory connected to the at least one processor in communication; wherein the memory stores a computer program executable by the at least one processor, and the computer program is executed by the at least one processor to enable the at least one processor to perform the terminal device remote testing method according to any one of claims 1-4.

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