Display device

Abstract

The present invention relates to a display device. The display device includes: a substrate; a display area disposed on the substrate and including a plurality of pixels and data lines; a peripheral area disposed on the substrate outside the display area; a pad portion disposed in the peripheral area; an encapsulation layer disposed in the peripheral area and the display area and disposed on the plurality of pixels in the display area; a crack detection circuit disposed in the peripheral area; and a first crack detection line connected to the pad portion and the crack detection circuit. The first crack detection line is disposed on the encapsulation layer.

Description

[0001] This application is a divisional application of the invention patent application with the application date of December 6, 2017, application number 201711278239.5, and name “Display Device”.

[0002] Cross-references to related applications

[0003] This application claims priority from Korean Patent Application No. 10-2016-0165137 filed on December 6, 2016, in the Korean Intellectual Property Office (KIPO), the disclosure of which is incorporated herein by reference in its entirety. Technical Field

[0004] Exemplary embodiments of the present inventive concept relate to a display device. Background Art

[0005] A display device such as a liquid crystal display (LCD) or a light emitting diode display may include a display panel including a plurality of pixels capable of displaying an image and a plurality of signal lines. Each pixel may include a pixel electrode capable of receiving a data signal, and the pixel electrode may be connected to at least one transistor to receive the data signal. The display panel may include a plurality of stacked layers.

[0006] During the manufacturing process of the display panel, cracks may occur in the substrate or the layers stacked on the substrate due to the impact applied to the display panel. The size of the crack may gradually increase, or the crack may propagate to another layer or another area, thereby causing defects in the display panel. For example, if a crack occurs in a signal line such as a data line or a scan line, a short circuit may occur or the resistance may increase, and moisture or the like may penetrate into the display panel, thereby reducing the reliability of the light-emitting element. As a result, the display panel may not operate normally. For example, one or more pixels of the display panel may not be turned on to emit light. In another example, one or more pixels may be turned on by mistake.

[0007] For example, a flexible display may be twisted or bent multiple times during use. Once a crack is initiated in the substrate or a layer on the substrate of the display panel, the crack may propagate further with increasing twisting and bending times, and may eventually cause the display panel to break. Summary of the Invention

[0008] According to an exemplary embodiment of the present inventive concept, a display device includes a substrate, a display area having a plurality of pixels and a data line. The display area is disposed on the substrate. The display device further includes a peripheral area disposed outside the display area of the substrate. The display device further includes a pad portion disposed in the peripheral area, and an encapsulation layer disposed in the peripheral area and the display area. The encapsulation layer is disposed over the plurality of pixels in the display area of the substrate. The display device further includes a crack detection circuit disposed in the peripheral area and a first crack detection line disposed in the peripheral area. The first crack detection line is connected to the pad portion and the crack detection circuit. The first crack detection line is disposed on the encapsulation layer.

[0009] According to an exemplary embodiment of the present inventive concept, a display device includes a substrate, a display area having a plurality of pixels and data lines. The display area is disposed on the substrate. The display device further includes a peripheral area disposed outside the display area of the substrate. The display device further includes an encapsulation layer disposed on at least one of the peripheral area and the display area. The display device further includes a crack detection circuit having a switch disposed in the peripheral area and a first crack detection line connected to the crack detection circuit. The first crack detection line is disposed on the encapsulation layer and disposed in the peripheral area. The display device further includes a cover layer extending along an edge of the encapsulation layer. The cover layer covers the edge of the encapsulation layer.

[0010] According to an exemplary embodiment of the present inventive concept, a display device includes a substrate, a display area having a plurality of pixels and a data line. The display area is disposed on the substrate. The display device further includes a peripheral area disposed outside the display area of the substrate. The display device further includes an encapsulation layer disposed between the peripheral area and the display area. The encapsulation layer is disposed over the plurality of pixels in the display area of the substrate. The display device further includes a first crack detection line disposed on the encapsulation layer and a second crack detection line disposed below the encapsulation layer. The first crack detection line and the second crack detection line are connected to each other. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] The above and other features of the present inventive concept will become more apparent by describing in detail exemplary embodiments of the present inventive concept with reference to the accompanying drawings, in which:

[0012] Figure 1 is a schematic top plan view of a display panel included in a display device according to an exemplary embodiment of the inventive concept.

[0013] Figure 2 According to an exemplary embodiment of the present invention Figure 1 1 is a cross-sectional view of the display device taken along line II-IIa.

[0014] Figure 3A display panel according to an exemplary embodiment of the inventive concept is shown in a bent state.

[0015] Figure 4 is a top plan view of a display panel included in a display device according to an exemplary embodiment of the inventive concept.

[0016] Figure 5 and Figure 6 According to one or more exemplary embodiments of the present invention Figure 4 : This is a cross-sectional view of the display device taken along line V-Va.

[0017] Figure 7 is a top plan view of a touch sensor included in a display device according to an exemplary embodiment of the inventive concept.

[0018] Figure 8 According to an exemplary embodiment of the present invention Figure 4 1 is a cross-sectional view of a display device taken along line VIII-VIIIa.

[0019] Figure 9 is a plan layout diagram of a pixel of a display device according to an exemplary embodiment of the inventive concept.

[0020] Figure 10 According to an exemplary embodiment of the present invention Figure 9 A cross-sectional view of a pixel taken along line X-Xa.

[0021] Figures 11 to 19 is a plan view of a display panel of a display device according to one or more exemplary embodiments of the inventive concept.

[0022] Figure 20 According to an exemplary embodiment of the present invention Figure 19 XX is a cross-sectional view of a display device taken along line XX-XXa.

[0023] Figure 21 is a top plan view of a display panel included in a display device according to an exemplary embodiment of the inventive concept. DETAILED DESCRIPTION

[0024] Various exemplary embodiments of the present inventive concept will be described more fully hereinafter with reference to the accompanying drawings, in which some exemplary embodiments are shown. However, the present inventive concept can be embodied in many different forms and should not be construed as limited to the exemplary embodiments set forth herein.

[0025] It will be understood that when an element, such as a layer, film, region, or substrate, is referred to as being "on" another element, it can be directly on the other element, or intervening elements may be present. Conversely, when an element is referred to as being "directly on" another element, there are no intervening elements. Furthermore, throughout this specification, the term "on..." means to be placed above or below an object portion, but does not inherently mean to be placed on the upper side of an object portion based on the direction of gravity.

[0026] Will refer to Figures 1 to 3 A display device according to one or more exemplary embodiments of the inventive concept is described.

[0027] refer to Figure 1 and Figure 2 The display panel 1000 according to the exemplary embodiment includes a display area DA and a peripheral area PA. The peripheral area PA may be disposed outside the display area DA. The peripheral area PA may include a left peripheral area PA, a right peripheral area PA, a top peripheral area PA, and a bottom peripheral area PA. The peripheral area PA may further include, for example, an upper left peripheral area PA and an upper right peripheral area PA.

[0028] The display area DA may include a plurality of pixels PX and a plurality of signal lines arranged on a plane extending along the x-axis and the y-axis. The display area DA may display an image on a plane parallel to the x-axis and the y-axis. Hereinafter, a structure viewed perpendicular to the x-axis and the y-axis will be referred to as a planar structure, and a structure viewed perpendicular to the x-axis and the y-axis will be referred to as a cross-sectional structure.

[0029] The signal lines may include a plurality of gate lines (not shown) transmitting gate signals and a plurality of data lines 171 transmitting data signals. Each data line 171 may extend substantially in the y-axis direction in the display area DA and may be connected to a pad portion PDA provided in the peripheral area PA by extending each data line 171 to the peripheral area PA.

[0030] Each pixel PX may include at least one switch (not shown) and a pixel electrode (not shown) connected to the switch. The switch may be a three-terminal element, such as a transistor integrated with the display panel 1000. The switch may selectively transmit a data signal to the pixel electrode by turning on or off according to a gate signal transmitted by a gate line.

[0031] To achieve color display, each pixel PX can display one of the given colors, and an image of a desired color can be recognized by the sum of the given colors. Examples of specific colors represented by the plurality of pixels PX include the three primary colors of red, green, and blue, or the three primary colors of yellow, cyan, and magenta, and in addition to the three primary colors, at least one other color, such as white, can be further included.

[0032] The display panel 1000 may further include a substrate 110 in which pixels PX and signal lines may be formed. The substrate 110 may include glass, plastic, or the like, and may be flexible. For example, the substrate 110 may include: various types of plastics, such as polyethylene terephthalate (PET), polyethylene naphthalate (PEN), polycarbonate (PC), polyarylate (PAR), polyetherimide (PEI), polyethersulfone (PES), polyimide (PI), or the like; a metal film; or ultra-thin glass.

[0033] refer to Figure 2 , a plurality of layers TFS may be provided on the substrate 110, and the plurality of layers TFS may include a plurality of pixels PX. Figure 2 Although not schematically illustrated in FIG. 1 , the plurality of layers TFS may include a plurality of insulating layers and a plurality of conductive layers forming the pixels PX and the signal lines. A specific cross-sectional structure of the plurality of layers TFS will be exemplarily described later.

[0034] An encapsulation layer (which may be referred to as an encapsulation portion) EnC may be provided on the plurality of layers TFS, which encapsulates the plurality of layers TFS including the pixel PX to prevent moisture and / or oxygen from penetrating into the display panel from the outside. The encapsulation layer EnC may be provided on at least one of the peripheral area PA and the display area DA. The encapsulation layer EnC may include at least one inorganic layer and at least one organic layer, and the organic layer and the inorganic layer may be stacked alternately. The topmost surface of the encapsulation layer EnC may be substantially flat. The encapsulation layer EnC is not limited to the present exemplary embodiment, but may have various structures, such as an organic polymer layer (such as polyester) stacked on a plurality of layers TFS, a sealed encapsulation substrate, and the like.

[0035] Return Reference Figure 1 , the edge of the encapsulation layer EnC may be disposed inside the edge of the substrate 110 . Alternatively, the edge of the encapsulation layer EnC may substantially match the edge of the substrate 110 .

[0036] Continue to return to reference Figure 1 , the peripheral area PA may include a pad portion PDA, a bending area BDA, first crack detection lines TCDa and TCDb, and a crack detection circuit CDA.

[0037] The pad portion PDA may be provided at one edge of the display panel 1000 and may include a plurality of pads that may be electrically connected to a driver chip (not shown) or a pad (not shown) of a circuit film. Although not shown, the display device according to one or more exemplary embodiments of the present invention may further include a driver chip or a circuit film that may be electrically connected to the display panel 1000 through the pad portion PDA. The circuit film may be provided as a film and may include a driver chip attached thereto. The driver chip provided on the display panel 1000 or on the circuit film may include a data driver, a timing controller, etc. for generating a data signal for driving the pixel PX, and may transmit various drive voltages to the display panel 1000.

[0038] The bending area BDA may extend substantially across the display panel 1000 in the x-axis direction. Figure 1 The display panel 1000 includes a bending area BDA in an unfolded state, and Figure 3 The bending area BDA of the display panel 1000 is shown in a bent state. When the display panel 1000 is bent in a predetermined direction in the bending area BDA, a portion of the peripheral area PA disposed outside the bending area BDA may also be bent. For example, Figure 3 As shown, when the edge portion of the display panel 1000 is bent downward, a portion of the peripheral area PA outside the bending area BDA may also bend and may not be visible when viewed from the front side in the z-axis direction. A plurality of conductive lines may be disposed in the bending area BDA, and the plurality of conductive lines in the bending area BDA may be substantially stretched in the y-axis direction in the bending area BDA. At least a portion of the plurality of layers TFS disposed on the substrate 110 may not be formed in the bending area BDA.

[0039] According to another exemplary embodiment of the present inventive concept, the bending area BDA may be omitted.

[0040] The first crack detection lines TCDa and TCDb may be disposed in the peripheral area PA and may extend along the edge of the display area DA while surrounding the left, right, and top portions of the display area DA. For example, the first crack detection line TCDa may include a portion that may extend substantially in the y-axis direction in the left peripheral area PA and a portion that may extend substantially in the x-axis direction in the upper left peripheral area PA. The first crack detection line TCDb may include a portion that may extend substantially in the y-axis direction in the right peripheral area PA and a portion that may extend substantially in the x-axis direction in the upper right peripheral area PA.

[0041] like Figure 1As shown, the first crack detection lines TCDa and TCDb can each be illustrated as a line. In other embodiments, they can include portions formed by one or more round trips in the peripheral area PA. For example, each of the first crack detection lines TCDa and TCDb can extend along substantially the entire peripheral area PA outside the display area DA, forming at least one curved portion extending in the front-to-back direction in the left and right peripheral areas PA and / or the upper peripheral area PA, and then connecting to the crack detection circuit CDA after passing through the curved area BDA. The crack detection circuit CDA may include multiple switches (not shown).

[0042] and Figure 1 Unlike the example shown, the first crack detection lines TCDa and TCDb may be connected to each other. For example, the first crack detection lines TCDa and TCDb may be connected to each other in the upper peripheral area PA.

[0043] Although Figure 1 Not shown, but in another embodiment, the first crack detection lines TCDa and TCDb may be connected to the pad portion PDA and receive a test voltage.

[0044] The first crack detection lines TCDa and TCDb may include at least one contact portion CNTa and CNTb, respectively, disposed outside the periphery of the bending area BDA. In one example, each of the first crack detection lines TCDa and TCDb may include multiple portions that may be connected via the contact portions CNTa and CNTb. The multiple portions of the first crack detection lines TCDa and TCDb may be disposed in different layers. The contact portions CNTa and CNTb may include at least one contact hole.

[0045] refer to Figure 1 and Figure 2 , the first crack detection lines TCDa and TCDb may extend along the peripheral area PA, and for example, as Figure 1 As shown, the first crack detection lines TCDa and TCDb may overlap with the encapsulation layer EnC in a plan view, and for example, as shown in FIG. Figure 2As shown, it can be set on the encapsulation layer EnC in the cross-sectional view. Defects may occur in the encapsulation layer EnC. For example, a crack may occur in the encapsulation layer EnC. Alternatively, the layer of the encapsulation layer EnC may be delaminated or lifted from the substrate 110. A portion of the first crack detection lines TCDa and TCDb may be damaged by the defect in the encapsulation layer EnC. For example, a portion of the first crack detection lines TCDa and TCDb on the cracked encapsulation layer EnC may be damaged, which may cause the wire resistance of the first crack detection lines TCDa and TCDb to increase. By detecting a sudden change in the wire resistance of the first crack detection lines TCDa and TCDb, the presence of defects in the encapsulation layer EnC can be basically accurately detected. When the encapsulation layer EnC is lifted or a crack occurs in the encapsulation layer EnC, impurities may penetrate into the display panel 1000, and the crack may spread to other layers, thereby causing damage to several components. Therefore, it is possible to sensitively and accurately detect defects in the encapsulation layer EnC.

[0046] The contact portions CNTa and CNTb may be disposed outside the periphery of the encapsulation layer EnC. Figure 1 As shown, when viewed from the z direction, the contact portions CNTa and CNTb may be disposed on portions that do not overlap with the encapsulation layer EnC. For example, the contact portions CNTa and CNTb may be disposed on Figure 1 The outer side of the lower periphery of the encapsulation layer EnC.

[0047] like Figure 1 As shown, the crack detection circuit CDA can be provided between the pad portion PDA and the display area DA, but this is not restrictive. For example, the crack detection circuit CDA can be provided in the peripheral area PA, as marked by the dotted rectangle. In another example, for a display panel 1000 having a bending area BDA, the crack detection circuit CDA can be provided between the display area DA and the bending area BDA, for example, as shown in FIG. Figure 1 As shown, the dotted rectangle below the display area DA is marked.

[0048] The first crack detection lines TCDa and TCDb and the crack detection circuit CDA can detect defects such as cracks and lifting that may occur in the encapsulation layer EnC or a layer at the periphery of the encapsulation layer EnC through a change in the wire resistance in the peripheral area PA of the display panel 1000. The change in the wire resistance of the first crack detection lines TCDa and TCDb can be determined by testing the on state of the display area DA through the crack detection circuit CDA.

[0049] Now, refer to Figures 4 to 10 Combined with the above Figures 1 to 3A detailed structure of a display device according to an exemplary embodiment of the present inventive concept is described. Hereinafter, the same elements in the above exemplary embodiments may be given the same reference numerals, and corresponding descriptions may be omitted.

[0050] refer to Figure 4 , the planar structure of the display device will be described, and reference will be made to Figure 5 and Figure 6 Describe the cross-sectional structure of a display device.

[0051] refer to Figure 4 , the plurality of pixels PX arranged in the display area DA can display specific colors, such as red, green, and blue. In one example, four pixels adjacent to each other in a quadrilateral shape may include two green pixels G, one red pixel R, and one blue pixel B. In another example, pixel columns including only green pixels G and pixel columns including red pixels R and blue pixels B may be arranged alternately in the x-axis direction for each pixel column. However, the arrangement of the plurality of pixels PX is not limited to the above arrangement, and various arrangements may be used.

[0052] The plurality of signal lines provided in the display area DA may further include a plurality of gate lines 121 for transmitting gate signals. Each of the plurality of gate lines 121 may extend substantially in the x-axis direction and thus may intersect with the data line 171. Each of the pixels R, G, and B may be connected to one data line 171 and at least one gate line 121.

[0053] The display panel 1000 may further include gate drivers 400a and 400b that may be provided in the peripheral area PA, and the gate drivers 400a and 400b may be connected to the plurality of gate lines 121 to apply gate signals. The gate drivers 400a and 400b may be provided on the substrate 110 together with the plurality of signal lines and the switching elements that may be provided in the display area DA. Therefore, the gate drivers 400a and 400b may include the same layers as those included in the plurality of layers TFS described above. Figure 4 In the embodiment, the gate drivers 400a and 400b may be disposed on the left and right sides relative to the display area DA, but this is not restrictive. For example, one of the gate drivers 400a and 400b disposed on one side relative to the display area DA may be omitted, and only one gate driver may be provided.

[0054] refer to Figure 4, the first crack detection lines TCDa and TCDb may include curved portions formed by extending in the front-to-back direction in the peripheral area PA outside the display area DA, specifically in the left and right peripheral areas PA and / or the upper peripheral area PA. For example, the first crack detection lines TCDa and TCDb may have curved portions at the lower portions of the left and right peripheral areas PA. The first crack detection lines TCDa and TCDb may further extend in the y-axis direction, bend at a predetermined angle, and extend in the upper peripheral area PA to a substantially central portion of the upper peripheral area PA in the x-axis direction. Subsequently, the extending directions of the first crack detection lines TCDa and TCDb may be changed so that the first crack detection lines TCDa and TCDb extend in a predetermined manner in the upper left peripheral area PA and the left peripheral area PA. In another example, each curved portion may have a zigzag shape by extending in the front-to-back direction.

[0055] The opposite ends of each of the first crack detection lines TCDa and TCDb may be arranged without overlapping with the encapsulation layer EnC. For example, one end of each of the first crack detection lines TCDa and TCDb may be connected to the crack detection circuit CDA through the contact portions CNT1 and CNT3. The other end of each of the first crack detection lines TCDa and TCDb may be connected to the contact portions CNT2 and CNT4. The contact portions CNT1 and CNT2 may be the opposite ends of the first crack detection line TCDa, and the contact portions CNT3 and CNT4 may be the opposite ends of the second crack detection line TCDb. Figure 4 As shown, in a plan view, all the contact portions CNT1 , CNT2 , CNT3 , and CNT4 may not overlap with the encapsulation layer EnC.

[0056] The second crack detection lines MCDa and MCDb may be further provided in the peripheral area PA. The second crack detection lines MCDa and MCDb may also be arranged around the display area DA. The configuration of the second crack detection lines MCDa and MCDb may be substantially the same as that of the first crack detection lines TCDa and TCDb, but this is not restrictive.

[0057] Still refer to Figure 4The second crack detection lines MCDa and MCDb can be connected to one end of each of the first crack detection lines TCDa and TCDb via contact portions CNT2 and CNT4, respectively. The second crack detection line MCDa is electrically connected to the first crack detection line TCDa via the contact portion CNT2, and the second crack detection line MCDb is electrically connected to the first crack detection line TCDb via the contact portion CNT4. Therefore, the first crack detection line TCDa and the second crack detection line MCDa can bend multiple times in the left peripheral area PA and the upper peripheral area PA to form a curved portion. Additionally, the first crack detection line TCDb and the second crack detection line MCDb can bend multiple times in the right peripheral area PA and the upper peripheral area PA to form a curved portion.

[0058] The first crack detection line TCDa and the second crack detection line MCDa connected to each other, or the first crack detection line TCDb and the second crack detection line MCDb connected to each other, can form a connecting line and can be referred to as a crack detection path. In another embodiment, one of the first crack detection lines TCDa or TCDb can form the crack detection path. In still another embodiment, one of the second crack detection lines MCDa and MCDb can form the crack detection path. For example, the crack detection path can be provided in the left peripheral area PA. The crack detection path can begin at the contact portion CNT1 or the pad portion PDA that receives the test voltage. For example, the first crack detection line TCDb can bend multiple times in the peripheral area PA surrounding the display area DA before reaching the contact portion CN2 or the crack detection circuit CDA to connect with the second crack detection line MCDb to form the crack detection path.

[0059] like Figure 4 As shown, one end of each of the second crack detection lines MCDa and MCDb may be connected to a test signal line TD2 disposed on the left and right portions of the substrate 110, respectively. For example, one end of the test signal line TD2 connected to the second crack detection line MCDa may be disposed opposite to one end of the test signal line TD2 connected to the second crack detection line MCDb, and the test signal lines TD2 may not be electrically connected to each other because they are disposed separately from each other. The test signal line TD2 may extend substantially in the x-axis direction in the region between the pad portion PDA and the display area DA and may intersect the data line 171 in an insulated manner.

[0060] At least a portion of the second crack detection lines MCDa and MCDb may be disposed between the first crack detection lines TCDa and TCDb in the display area DA and the peripheral area PA, but the second crack detection lines MCDa and MCDb may be positioned elsewhere. For example, the positions of the first crack detection lines TCDa and TCDb and the positions of the second crack detection lines MCDa and MCDb may be interchanged.

[0061] The crack detection circuit CDA may include a test signal line TD1 . The test signal line TD1 may extend substantially in the x-axis direction in a region between the pad portion PDA and the display area DA, and may intersect the data line 171 in an insulated manner.

[0062] The test signal line TD1 may be connected to the pad portion PDA through connection conductors CL1 and CL2 to receive a test voltage. The first crack detection lines TCDa and TCDb and the test signal line TD1 may receive substantially the same test voltage from the pad portion PDA through connection conductors CL1 and CL2.

[0063] The crack detection circuit CDA may further include a plurality of switches Q1 and Q2 and a test gate line TG. In one example, the switch Q1 may be different from the switch Q2. The plurality of switches Q1 and Q2 may be arranged in a row substantially in the x-axis direction, and each of the switches Q1 and Q2 may correspond to each of the plurality of data lines 171. The test gate line TG may extend substantially in the x-axis direction.

[0064] Also like Figure 4 As shown, the gate terminals of switches Q1 and Q2 can be connected to the test gate line TG, and the output terminals of switches Q1 and Q2 can be connected to the corresponding data line 171. The input terminal of switch Q1 can be connected to the test signal line TD2, and the input terminal of switch Q2 can be connected to the test signal line TD1. Switch Q1 can be set in a part of the crack detection circuit CDA, for example, in a part of the left edge of the crack detection circuit CDA, but this is not restrictive. In another embodiment, as Figure 4 As shown, the switches Q1 and the switches Q2 may be alternately arranged in the x-axis direction in at least a portion of the crack detection circuit CDA, but this is not limitative.

[0065] Pixels R, G, and B may be connected to data line 171 connected to switch Q1 to include specific colors. Figure 4 As shown, the first pixel array connected to the data line 171 connected to the switch Q1 may include green pixels G, but this is not limiting. The color represented by the pixel connected to the switch Q2 adjacent to the switch Q1 may be different from the color represented by the pixel connected to the switch Q1. For example, Figure 4As shown, the data line 171 connected to the switch Q2 adjacent to the switch Q1 can be connected to a second pixel array including red pixels R and blue pixels B. In an area where the switch Q2 is provided, for example, in an area where a plurality of switches Q2 are consecutively provided adjacent to each other, the color represented by the pixel connected to the data line 171 connected to the switch Q2 may not be limited to a specific color. For example, the colors represented by the pixels connected to the plurality of adjacent switches Q2 may include red, blue, and green.

[0066] Still refer to Figure 4 Matching resistors R1 and R2 can be connected between the pad portion PDA and the test signal line TD1. A test voltage applied through the pad portion PDA can be reduced by a first voltage difference via the matching resistors R1 and R2. The reduced test voltage is then transmitted through the test signal line TD1 and applied to the input terminal of the switch Q2. Simultaneously, the test voltage applied through the pad portion PDA can be transmitted to a crack detection path. For example, the test voltage can be transmitted through a crack detection path that includes a first crack detection line TCDa and a second crack detection line MCDa connected to each other and / or a first crack detection line TCDb and a second crack detection line MCDb connected to each other.

[0067] A voltage that is lower by a second voltage difference than the wire resistance of the crack detection path can be applied to the input terminal of the switch Q1 of the crack detection circuit CDA via the test signal line TD2. The resistance of the matching resistors R1 and R2 can be equal to or similar to the wire resistance. For example, the first voltage difference and the second voltage difference can be set to be substantially the same or correspond to each other by the resistance values of the matching resistors R1 and R2 in a normal state, which is a state in which damage such as cracks or lift does not occur in the crack detection path.

[0068] However, it is noted that the resistance values of the matching resistors R1 and R2 are not limited thereto and can be set to appropriate values as necessary. For example, the resistance values of the matching resistors R1 and R2 can be set to be equal to the crack detection sensitivity or the like.

[0069] According to another exemplary embodiment of the present inventive concept, the positions of the first crack detection lines TCDa and TCDb and the positions of the second crack detection lines MCDa and MCDb may be interchanged. For example, the second crack detection lines MCDa and MCDb may receive a test voltage by being connected to the connection wires CL1 and CL2, and the first crack detection lines TCDa and TCDb may be connected to the test signal line TD2.

[0070] Next, refer to Figure 5 and Figure 6 Combine Figure 4A cross-sectional structure of a display device according to an exemplary embodiment is described. Figure 5 and Figure 6 , the barrier layer 120 may be disposed on the substrate 110. Figure 5 As shown, barrier layer 120 may include multiple layers, or may be provided as a single layer.

[0071] Active patterns may be provided on the barrier layer 120. The active patterns may include a first active pattern 130, which may be provided in the display area DA, and a second active pattern 130d, which may be provided in the peripheral area PA. Each of the first active pattern 130 and the second active pattern 130d may include a source region, a drain region, and a channel region provided between the source region and the drain region. One of the first active pattern 130 and the second active pattern 130d may include amorphous silicon, polycrystalline silicon, an oxide semiconductor, or the like.

[0072] A first insulating layer 141 may be disposed on the first active pattern 130 and the second active pattern 130d, and a first conductive layer may be disposed on the first insulating layer 141. The first conductive layer may include a first conductor 155 that may overlap with the first active pattern 130 disposed in the display area DA, a conductor 150d that may overlap with the second active pattern 130d disposed in the peripheral area PA, the plurality of gate lines 121, and a test gate line TG.

[0073] The transistor TRa may include a first active pattern 130 and a first conductor 155 that may overlap with the first active pattern 130. The transistor TRd may include a second active pattern 130d and a conductor 150d that may overlap with the second active pattern 130d. The transistor TRa may function as a switch included in the pixel PX (e.g., R, G, and B pixels provided in the display area DA). The transistor TRd may function as, for example, a switch (not shown) included in the gate drivers 400a and 400b, or as switches Q1 and Q2 included in the crack detection circuit CDA. The specific structure of the pixel PX will be described later.

[0074] The second insulating layer 142 may be disposed on the first conductive layer (e.g., the first conductor 155) and the first insulating layer 141, and the second conductive layer may be disposed on the second insulating layer 142. The second conductive layer may be the second crack detection lines MCDa and MCDb described above. In other embodiments, the second crack detection lines MCDa and MCDb may be disposed in the same layer as the first conductive layer and may include the same material as the first conductive layer.

[0075] The second conductive layer may further include the test signal lines TD1 and TD2 described above. In other embodiments, at least one of the test signal lines TD1 and TD2 may be provided in the first conductive layer.

[0076] The third insulating layer 160 may be provided on the second conductive layer and the second insulating layer 142. At least one of the first insulating layer 141, the second insulating layer 142, and the third insulating layer 160 may include an organic insulating material and / or a silicon nitride (SiN) x ), silicon oxide (SiO x ) etc. At least one of the first insulating layer 141, the second insulating layer 142, and the third insulating layer 160 may be at least partially removed in the bending area BDA.

[0077] The first insulating layer 141 , the second insulating layer 142 , and the third insulating layer 160 may include contact holes 165 that may be disposed on source and / or drain regions of the transistors TRa and TRd.

[0078] A third conductive layer may be provided on the third insulating layer 160. The third conductive layer may include a conductor 170 that may be connected to the source region or drain region of the transistors TRa and TRd through the contact hole 165. The third conductive layer may also include a voltage transmission line 177 and the aforementioned data line 171. The voltage transmission line 177 may be provided in the peripheral area PA and may transmit a constant voltage, such as a common voltage ELVSS.

[0079] At least one of the first conductive layer, the second conductive layer and the third conductive layer may include a metal such as copper (Cu), aluminum (Al), molybdenum (Mo), titanium (Ti), alloys thereof, etc., and may be provided as a multilayer (e.g., Ti / Al / Ti) or a single layer formed of such multiple metal materials.

[0080] A passivation layer 180 may be provided on the third conductive layer and the third insulating layer 160. The passivation layer 180 may include an inorganic insulating material and / or an organic insulating material such as a polyacrylic resin, a polyimide resin, etc., and the upper surface of the passivation layer 180 may be substantially flat. The passivation layer 180 may include a contact hole (not shown) that may be provided on the voltage transmission line 177 provided in the peripheral area PA.

[0081] The pixel electrode layer may be disposed on the passivation layer 180. The pixel electrode layer may include a pixel electrode 191 corresponding to each pixel PX and a voltage transmission electrode 197 that may be disposed in the peripheral area PA. The voltage transmission electrode 197 may be electrically and physically connected to the voltage transmission line 177 through a contact hole of the passivation layer 180 and may thus receive a common voltage ELVDD. The pixel electrode layer may include a semi-transparent conductive material or a reflective conductive material.

[0082] The pixel defining layer 350 may be disposed on the passivation layer 180 and the pixel electrode layer. The pixel defining layer 350 may include an opening 351 disposed on the pixel electrode 191 and may further include at least one dam portion 350d disposed in the peripheral area PA. The at least one dam portion 350d may extend in a direction perpendicular to the surface of the substrate 110. A spacer 360d may be further disposed on the dam portion 350d.

[0083] The voltage transmission electrode 197 may include a portion that is not covered by the pixel defining layer 350. The pixel defining layer 350 may include a photosensitive material such as polyacrylate resin, polyimide resin, or the like.

[0084] The emission layer 370 is disposed on the pixel electrode 191. The emission layer 370 may include a portion disposed inside the opening 351 of the pixel defining layer 350. The emission layer 370 may further include at least one dummy emission layer 370d disposed in the peripheral area PA and on the pixel defining layer 350. The emission layer 370 may include an organic emission material or an inorganic emission material.

[0085] The common electrode 270 may be disposed on the emission layer 370. The common electrode 270 may also be disposed on the pixel defining layer 350 and thus may be continuously formed across a plurality of pixels PX. The common electrode 270 may be physically and electrically connected to the voltage transmission electrode 197 in the peripheral area PA and may receive a common voltage ELVSS. The common electrode 270 may include a conductive transparent material.

[0086] The pixel electrode 191 , the emission layer 370 , and the common electrode 270 of each pixel PX form an emission diode ED, and one of the pixel electrode 191 and the common electrode 270 may be a cathode and the other may be an anode.

[0087] The encapsulation layer 380 can protect the emitting diode ED by encapsulating the emitting diode ED and can be provided on the common electrode 270. The encapsulation layer 380 can be the same as the encapsulation layer EnC described above. The encapsulation layer 380 can include at least one inorganic layer 381 and 383 and at least one organic layer 382, and the at least one inorganic layer 381 and 383 and the at least one organic layer 383 can be alternately stacked. The organic layer 382 can include an organic material and can have a planarization property. The inorganic layers 381 and 383 can include, for example, aluminum oxide (AlO x ), silicon oxide (SiO x ), silicon nitride (SiN x ) and other inorganic materials.

[0088] The planar area of the inorganic layers 381 and 383 may be wider than the planar area of the organic layer 382, so the two different inorganic layers 381 and 383 may contact each other in the peripheral area PA. One of the two inorganic layers 381 and 383 may contact the upper surface of the third insulating layer 160 in the peripheral area PA. On the other hand, in other embodiments, one of the two inorganic layers 381 and 383 may not contact the upper surface of the third insulating layer 160. In a plan view, in the peripheral area PA, the inorganic layers 381 and 383 of the encapsulation layer 380 may overlap with the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb.

[0089] The edge of the organic layer 382 may be disposed between the dam portion 350d and the display area DA. The dam portion 350d may be used to prevent the organic material from flowing to the outside when the organic layer 382 of the encapsulation layer 380 is formed, and thus the edge of the organic layer 382 of the encapsulation layer 380 may be disposed closer to the display area DA than the dam portion 350d.

[0090] The buffer layer 389 may include an inorganic insulating material and / or an organic insulating material and may be disposed on the encapsulation layer 380. In other embodiments, the buffer layer 389 may be omitted.

[0091] The touch sensor may be provided on the buffer layer 389 .

[0092] The touch sensor may include at least one conductive layer and at least one insulating layer disposed on the buffer layer 389. In some embodiments, the touch sensor may include a fourth conductive layer. The fourth conductive layer may include a first touch conductor TEa. The touch sensor may further include a first touch insulating layer 391 disposed on the fourth conductive layer and a fifth conductive layer disposed on the first touch insulating layer 391. The fifth conductive layer may include a second touch conductor TEb. The touch sensor may further include a second touch insulating layer 392 disposed on the fifth conductive layer. At least one of the first touch insulating layer 391 and the second touch insulating layer 392 may include an inorganic insulating material and / or an organic insulating material.

[0093] refer to Figure 7Each first touch conductor TEa may include: a plurality of first touch electrodes 151a that may be arranged substantially in a matrix form, a first connection portion 151b connecting the first touch electrodes 151a arranged in the x-axis direction, and a first touch wire w10 that may be connected to the plurality of first touch electrodes 151a and transmit signals. Each second touch conductor TEb may include: a plurality of second touch electrodes 152a that may be arranged substantially in a matrix form, a second connection portion 152b connecting the second touch electrodes 152a arranged in the y-axis direction, and a second touch wire w20 that may be connected to the plurality of second touch electrodes 152a and transmit signals.

[0094] The first touch electrodes 151a and the second touch electrodes 152a may be disposed in a touch sensing area TA. The touch sensing area TA is an area where a touch by an external object can be sensed and may be substantially the same as the display area DA described above. On the other hand, in other embodiments, the touch sensing area TA may not coincide with the display area DA.

[0095] The first touch electrodes 151a and the second touch electrodes 152a adjacent to each other may form a common sensing capacitor to sense a capacitance change caused by a touch of an external object, thereby sensing touch information such as whether a touch is made, a touch position, etc. A capacitance change signal according to the touch may be transmitted to a touch controller (not shown) through the first touch wire w10 and the second touch wire w20.

[0096] The first touch wire w10 and the second touch wire w20 may be substantially disposed outside the touch sensing area TA. In other embodiments, the first touch wire w10 and the second touch wire w20 may not be disposed outside the touch sensing area TA. For example, at least a portion of the first touch wire w10 and the second touch wire w20 may be disposed inside the touch sensing area TA.

[0097] The first touch electrodes 151a and the second touch electrodes 152a may be formed in a mesh shape. Figure 7 As shown, the mesh portions of the first and second touch electrodes 151a and 152a may surround the emitting diode ED and may not overlap with the emitting diode ED in a plan view.

[0098] The first touch conductor TEa and the second touch conductor TEb may include a metal such as silver (Ag), aluminum (Al), copper (Cu), molybdenum (Mo), chromium (Cr), nickel (Ni), titanium (Ti), or alloys thereof, and may be provided as a multilayer (e.g., Ti / Al / Ti) or a single layer of a plurality of such metal materials. According to another exemplary embodiment, the first touch conductor TEa and the second touch conductor TEb may include a conductive nanomaterial such as silver nanowires or carbon nanotubes. The positions of the layers of the first touch conductor TEa and the second touch conductor TEb in the cross-sectional view may be interchanged.

[0099] The fourth conductive layer or the fifth conductive layer may include the first crack detection lines TCDa and TCDb. Figure 5 and Figure 6 In the embodiment, the first crack detection lines TCDa and TCDb may be exemplarily provided in the fourth conductive layer.

[0100] As previously described, the first crack detection lines TCDa and TCDb can detect defects such as whether a crack has occurred in the encapsulation layer 380 or whether a layer of the encapsulation layer 380 has been lifted. For example, the first crack detection lines TCDa and TCDb can be positioned closer to the encapsulation layer 380 than the second crack detection lines MCDa and MCDb. Furthermore, the first crack detection lines TCDa and TCDb can be positioned above the encapsulation layer 380. Therefore, the first crack detection lines TCDa and TCDb can accurately and sensitively detect defects such as cracks and lifting in the encapsulation layer 380. Consequently, the risk of erroneously determining whether the encapsulation layer 380 is defective or whether a defect may have occurred in an element located outside the encapsulation layer 380 can be reduced. Furthermore, the second crack detection lines MCDa and MCDb can detect defects such as cracks and lifting that may have occurred in layers below the encapsulation layer 380. Therefore, according to one or more exemplary embodiments of the present inventive concepts, the accuracy of detecting defects such as cracks in a display panel can be improved.

[0101] refer to Figure 4 and Figure 5 , the first crack detection lines TCDa and TCDb may be disposed between the dam portion 350d and the edge of the substrate 110. Alternatively, the first crack detection lines TCDa and TCDb may be disposed between the edge of the substrate 110 and the second crack detection lines MCDa and MCDb, but this is not restrictive. In another embodiment, the first crack detection lines TCDa and TCDb may include portions that may overlap with at least a portion of the second crack detection lines MCDa and MCDb in a plan view.

[0102] refer to Figures 4 to 6, at least a portion of the first crack detection lines TCDa and TCDb may be disposed between the dam portion 350d and the display area DA. Figure 6 , it is exemplarily illustrated that the first crack detection line TCDa is partially provided outside the dam portion 350d and partially provided between the dam portion 350d and the display area DA. Alternatively, as Figure 6 As marked by dotted lines in , the first crack detection lines TCDa and TCDb may include a portion disposed on the dam portion 350 d and a portion disposed on the organic layer 382 of the encapsulation layer 380 .

[0103] In the following, reference will be made to Figures 4 to 8 The specific structures of the above-mentioned contact portions CNT1 , CNT2 , CNT3 , and CNT4 are described. Figure 8 A contact portion CNT2 that may connect the first crack detection line TCDa and the second crack detection line MCDa to each other is representatively illustrated.

[0104] In the contact portion CNT2, the third insulating layer 160 may include a contact hole 169 formed on the second crack detection line MCDa. A conductor 178 connected to the second crack detection line MCDa through the contact hole 169 may be further provided on the third insulating layer 160. The conductor 178 may be provided in the third conductive layer. The passivation layer 180 may further include a contact hole 189 formed on the conductor 178. The buffer layer 389 and the first touch insulating layer 391 provided on the passivation layer 180 may include a contact hole 397. When viewed in a direction perpendicular to the surface of the substrate 110, the contact hole 397 may overlap with the contact hole 189 of the passivation layer 180. For example, when viewed in a direction perpendicular to the surface of the substrate 110, the contact hole 397 may include an edge surrounding the periphery of the contact hole 189 of the passivation layer 180 and may have a wider area than the contact hole 189. When the first crack detection line TCDa is provided in the fourth conductive layer, the first touch insulating layer 391 may include a contact hole 399 formed on the first crack detection line TCDa. The connection member BG may be connected to the first crack detection line TCDa through the contact hole 399 and may be connected to the conductor 178 through the contact holes 189 and 397. The connection member BG may be provided on the first touch insulating layer 391. The connection member BG may be provided in the fifth conductive layer where the second touch conductor TEb is provided.

[0105] As described above, in the contact portion CNT2 , the second crack detection line MCDa may be electrically connected to the first crack detection line TCDa through the conductor 178 and the connection member BG.

[0106] Next, we will refer to Figure 9 and Figure 10 Combined with the above Figures 1 to 8 An example of a detailed structure of a pixel PX included in a display device according to an exemplary embodiment of the inventive concept is described. Descriptions of elements that have been previously described above may be omitted.

[0107] First, refer to Figure 9 , the plurality of pixels PX included in the display device according to the exemplary embodiment of the present inventive concept may be red pixels R, green pixels G, or blue pixels B. The display device according to the exemplary embodiment of the present inventive concept may include a first scan line 151 transmitting a first scan signal, a second scan line 152 transmitting a second scan signal, a third scan line 154 transmitting a third scan signal, and a control line 153 transmitting a light emission control signal. The plurality of scan lines 151, 152, and 154 and the control line 153 may be included in the gate line 121 described above, and in the first conductive layer described above in a cross-sectional view.

[0108] The display device according to one or more exemplary embodiments of the present inventive concept may further include a storage line 156 and an initialization voltage line 159, and the storage line 156 and the initialization voltage line 159 may be included in the second conductive layer. The storage line 156 may include an expansion portion 157 provided in each pixel PX. The initialization voltage line 159 may transmit an initialization voltage.

[0109] The display device according to the exemplary embodiment of the present invention may further include a data line 171 and a driving voltage line 172, and the data line 171 and the driving voltage line 172 may be included in the third conductive layer. The data line 171 and the driving voltage line 172 may be substantially in the same direction (e.g., Figure 9 The storage line 156 extends in a vertical direction (in a vertical direction) and may intersect the plurality of scan lines 151, 152, and 154. The expansion portion 157 of the storage line 156 may be electrically connected to the driving voltage line 172 through the contact hole 68 and may receive the driving voltage ELVDD.

[0110] Each pixel PX may include a plurality of transistors T1, T2, T3_1, T3_2, T4_1, T4_2, T5, T6, and T7, and a capacitor Cst, which may be connected to scan lines 151, 152, and 154, a control line 153, a data line 171, a driving voltage line 172, and an emission diode ED. The plurality of transistors T1, T2, T3_1, T3_2, T4_1, T4_2, T5, T6, and T7 may correspond to the aforementioned transistor TRa. A channel of each of the plurality of transistors T1, T2, T3_1, T3_2, T4_1, T4_2, T5, T6, and T7 may be formed in the aforementioned first active pattern 130. The first active pattern 130 may include channel regions 131a, 131b, 131c_1, 131c_2, 131d_1, 131d_2, 131e, 131f, and 131g and a conductive region. The channel regions 131a, 131b, 131c_1, 131c_2, 131d_1, 131d_2, 131e, 131f, and 131g may form channels of the transistors T1, T2, T3_1, T3_2, T4_1, T4_2, T5, T6, and T7, respectively. The conductive region of the first active pattern 130 may be disposed at a side of each of the channel regions 131a, 131b, 131c_1, 131c_2, 131d_1, 131d_2, 131e, 131f, and 131g and may have a higher carrier concentration than the channel regions 131a, 131b, 131c_1, 131c_2, 131d_1, 131d_2, 131e, 131f, and 131g. A pair of conductive regions set at the side of each of the channel regions 131a, 131b, 131c_1, 131c_2, 131d_1, 131d_2, 131e, 131f and 131g of the transistors T1, T2, T3_1, T3_2, T4_1, T4_2, T5, T6 and T7 can be the source region and drain region of the corresponding transistors T1, T2, T3_1, T3_2, T4_1, T4_2, T5, T6 and T7, respectively, and can be used as the source and drain, respectively.

[0111] The first transistor T1 may include a channel region 131a, a source region 136a, a drain region 137a, and a driving gate electrode 155a that may overlap with the channel region 131a in a plan view. Figure 10 As shown, the driving gate electrode 155a may be included in the first conductive layer and may be connected to the connection member 174 through the contact hole 61. In the cross-sectional view, the connection member 174 may be included in the third conductive layer. The contact hole 61 may be provided in the contact hole 51 included in the expansion portion 157.

[0112] The second transistor T2 may include a channel region 131b, a source region 136b, a drain region 137b, and a gate electrode 155b that may overlap with the channel region 131b in a plan view. The gate electrode 155b may be a portion of the first scan line 151. The source region 136b may be connected to the data line 171 through the contact hole 62, and the drain region 137b may be connected to the source region 136a of the first transistor T1.

[0113] The third transistors T3_1 and T3_2 may include an upper third transistor T3_1 and a lower third transistor T3_2, which may be connected to each other. The upper third transistor T3_1 may include a channel region 131c_1, a source region 136c_1, a drain region 137c_1, and a gate electrode 155c_1 that may overlap with the channel region 131c_1. The gate electrode 155c_1 may be part of the first scan line 151. The drain region 137c_1 may be connected to the connection member 174 through the contact hole 63. The lower third transistor T3_2 may include a channel region 131c_2, a source region 136c_2, a drain region 137c_2, and a gate electrode 155c_2 that may overlap with the channel region 131c_2. The gate electrode 155c_2 may be part of the first scan line 151.

[0114] The fourth transistors T4_1 and T4_2 may include a left fourth transistor T4_1 and a right fourth transistor T4_2, which may be connected to each other. The left fourth transistor T4_1 may include a channel region 131d_1, a source region 136d_1, a drain region 137d_1, and a gate electrode 155d_1 that may overlap with the channel region 131d_1. The gate electrode 155d_1 may be part of the second scan line 152. The drain region 137d_1 may be connected to the drain region 137c_1 of the upper third transistor T3_1 and may be connected to the connection member 174 through the contact hole 63. The right fourth transistor T4_2 may include a channel region 131d_2, a source region 136d_2, a drain region 137d_2, and a gate electrode 155d_2 that may overlap with the channel region 131d_2. The gate electrode 155d_2 may be part of the second scan line 152. The drain region 137 d_2 may be connected to the source region 136 d_1 of the left fourth transistor T4_1 , and the source region 136 d_2 may be connected to the connection member 175 through the contact hole 65 .

[0115] The connection member 175 may be included in the second conductive layer or the third conductive layer. When the connection member 175 is included in the third conductive layer, the connection member 175 may be electrically connected to the initialization voltage line 159 through the contact hole 64.

[0116] The fifth transistor T5 may include a channel region 131e, a source region 136e, a drain region 137e, and a gate electrode 155e that may overlap with the channel region 131e. The gate electrode 155e may be part of the control line 153. The source region 136e may be connected to the driving voltage line 172 through the contact hole 67, and the drain region 137e may be connected to the source region 136a of the first transistor T1.

[0117] The sixth transistor T6 includes a channel region 131f, a source region 136f, a drain region 137f, and a gate electrode 155f that may overlap with the channel region 131f. The gate electrode 155f may be part of the control line 153. The source region 136f may be connected to the drain region 137a of the first transistor T1, and the drain region 137f of the sixth transistor T6 may be connected to the connection member 179 through the contact hole 69. In the cross-sectional view, the connection member 179 may be included in the third conductive layer.

[0118] The seventh transistor T7 may include a channel region 131g, a source region 136g, a drain region 137g, and a gate electrode 155g that may overlap with the channel region 131g. The gate electrode 155g may be a portion of the third scan line 154. The source region 136g may be connected to the drain region 137f of the sixth transistor T6, and the drain region 137g may be connected to the connection member 175 through the contact hole 65 and thus receive an initialization voltage.

[0119] The transistors T1, T2, T3_1, T3_2, T4_1, T4_2, T5, T6, and T7 may be P-type transistors. Alternatively, at least one of the transistors T1, T2, T3_1, T3_2, T4_1, T4_2, T5, T6, and T7 may be an N-type transistor.

[0120] The capacitor Cst may include the driving gate electrode 155 a and the expansion portion 157 of the storage line 156 as two terminals, and the two terminals may overlap each other while interposing the second insulating layer 142 therebetween.

[0121] The pixel electrode layer may include a pixel electrode 191 and a pixel conductive pattern 192. The pixel electrode 191 may be connected to the connection member 179 through the contact hole 89 and receive a data voltage. The pixel conductive pattern 192 may be bent along the edge of the adjacent pixel electrode 191. The pixel conductive pattern 192 may transmit an initialization voltage.

[0122] right Figure 9 and Figure 10 The description of the constituent elements shown in may be the same as the description provided above, and thus a detailed description will not be provided.

[0123] Next, we will refer to the above Figure 4A method for detecting defects such as cracks in a display device according to an exemplary embodiment of the inventive concept will be described.

[0124] A test voltage can be applied to the test signal line TD1 via the pad portion PDA and the connecting conductors CL1 and CL2. In this case, when a gate signal of a gate-on voltage is also applied to the test gate line TG, switches Q1 and Q2 of the crack detection circuit CDA can be turned on. The test voltage applied to the test signal line TD1 can then be applied to the data line 171 via the turned-on switch Q2. The test voltage can be a predetermined voltage and can be, for example, a voltage for displaying the lowest grayscale among the pixels R, G, and B. In this case, the test voltage can be approximately 7V. Therefore, the pixels R, G, and B connected to the turned-on switch Q2 can display a low grayscale, such as black.

[0125] If no crack or lift occurs in the peripheral area PA and no corresponding damage is applied to the first and second crack detection lines TCDa and TCDb, respectively, such that the first and second crack detection lines TCDa and TCDb and MCDa and MCDb are in a normal state, the test voltage applied from the pad portion PDA to the test signal line TD2 of the crack detection circuit CDA via the crack detection path of the first and second crack detection lines TCDa and TCDb and MCDa and MCDb can be substantially the same as the voltage applied to the test signal line TD1. To this end, matching resistors R1 and R2 can be controlled. Consequently, the pixels R, G, and B connected to the switch Q1 can display a predetermined grayscale, such as black, which can be substantially the same as the grayscale of the pixels R, G, and B connected to the switch Q2.

[0126] However, when a crack or lift occurs in the peripheral area PA of the display panel 1000 and the first crack detection lines TCDa and TCDb and / or the second crack detection lines MCDa and MCDb are short-circuited or damaged, the wire resistance may increase. Consequently, a black data voltage may not be applied to the pixels G that may be connected to the switch Q1, or a sufficient black data voltage may not be applied to the pixels G. Consequently, a strong or weak bright line may be observed along a column of pixels G connected to the switch Q1. Therefore, defects such as cracks or lift that may have occurred in the peripheral area PA of the display panel 1000 can be detected based on the bright light from the display panel 1000.

[0127] When the pixel array connected to switch Q1 is a first pixel array consisting only of green pixels G, a bright green line can be observed when a defect, such as a crack, occurs in the peripheral area PA. When the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb are respectively arranged in the left peripheral area PA and the right peripheral area PA, a bright green line extending vertically across the display area DA can be observed. Furthermore, the location of the bright green line can indicate the location of the defect in the peripheral area PA. For example, if a defect occurs in the left peripheral area PA, a bright green line can be observed in the left half of the display area DA. If a defect occurs in the right peripheral area PA, a bright green line can be observed in the right half of the display area DA.

[0128] Next, we will refer to Figures 11 to 18 The display device according to the exemplary embodiment is described with reference to the above-mentioned drawings.

[0129] First, refer to Figure 11 The display device according to the exemplary embodiment of the present inventive concept is almost the same as the display device of the exemplary embodiment described above, except that at least one of the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb may include a plurality of blocks UB, and each of the plurality of blocks UB may include a curved portion formed by extending the first crack detection lines TCDa and TCDb or the second crack detection lines MCDa and MCDb in the front-to-back direction. As described above, when the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb include a plurality of blocks UB, the wire resistance of the crack detection path may increase.

[0130] In one embodiment, Figure 11 As shown, multiple blocks UB may be placed on the right side of the substrate 1000, where the first crack detection line TCDb and the second crack detection line MCDb include multiple blocks UB. On the other hand, the location of the multiple blocks UB is not limited. In another embodiment, the first crack detection line TCDb and the second crack detection line MCDb including multiple blocks UB may be placed on the left side of the substrate 1000. In yet another embodiment, only a portion of the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb may include multiple blocks UB. As described, the wire resistance of the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb may be controlled to improve the sensitivity for detecting defects such as cracks.

[0131] Next, refer to Figure 12The display device according to the exemplary embodiment of the present inventive concept is substantially the same as the display device of the exemplary embodiment described above, except for the arrangement or shape of the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb. For example, the first crack detection lines TCDa and TCDb may be connected to each other in the upper peripheral area PA, thereby forming a single conductive line that may extend substantially along the longitudinal direction of the display area DA. The second crack detection lines MCDa and MCDb may be connected to each other in the upper peripheral area PA, thereby forming a single conductive line that may extend along the display area DA.

[0132] In one peripheral area PA (e.g., the left peripheral area PA), one end of each of the first crack detection lines TCDa and TCDb and one end of each of the second crack detection lines MCDa and MCDb may be connected to each other through a contact portion CNT3. In the opposite peripheral area PA (e.g., the right peripheral area PA), the other ends of the first crack detection lines TCDa and TCDb may be connected to the test signal line TD1 through a contact portion CNT4. The other ends of the second crack detection lines MCDa and MCDb may be connected to the test signal line TD2 only on one side of the display panel 1000. For example, Figure 12 As shown, the test signal line TD2 may be provided only in the right peripheral area PA of the display panel 1000 .

[0133] As described above, the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb may be connected to each other to form a crack detection path. The crack detection path may be a connecting line that may extend at least once from the contact portion CNT4 along the right periphery, the top periphery, and the left periphery of the display area DA, and then terminate at a point connected to the test signal line TD2. The first crack detection lines TCDa and TCDb of the crack detection path may receive a test voltage from the pad portion PDA via the contact portion CNT4, which may be provided on one side of the display panel 1000.

[0134] According to exemplary embodiments of the inventive concept, the area occupied by the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb in the peripheral area PA may be reduced, thereby further reducing the area of the peripheral area PA.

[0135] refer to Figure 13 , the display device according to the exemplary embodiment of the present inventive concept is the same as the above Figure 12 The display device is almost the same as that of the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb, except that at least one of the first crack detection lines TCDa and TCDb may include the same as previously described. Figure 11In the exemplary embodiment shown in FIG. , several blocks UB are provided, and each block may include a curved portion formed by extending the first crack detection lines TCDa and TCDb or the second crack detection lines MCDa and MCDb multiple times in the front-to-back direction. As described above, by including multiple blocks UB, the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb can increase the wire resistance of the crack detection path.

[0136] Figure 13 As an example, the first crack detection line TCDb and the second crack detection line MCDb including a plurality of blocks UB may be provided in the right peripheral area PA. In another embodiment, the first crack detection line TCDb and the second crack detection line MCDb including a plurality of blocks UB may be provided in the left peripheral area PA. In yet another embodiment, a portion of the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb may include a plurality of blocks UB.

[0137] Next, refer to Figure 14 , a display device according to an exemplary embodiment of the present inventive concept and Figure 4 The display device of the exemplary embodiment is almost the same as that of Figure 14 The second crack detection lines MCDa and MCDb are omitted. Figure 14 In the embodiment of the present invention, each of the first crack detection lines TCDa and TCDb can be connected at one end to the detection data line TD1 of the crack detection circuit CDA via contact portions CNT1 and CNT3, respectively, and at the other end to the test signal line TD2 via contact portions CNT5 and CNT6, respectively. Specifically, the first crack detection line TCDa disposed in the left peripheral area PA can be formed by extending the first crack detection line TCDa at least once in the front-to-back direction along the left and top portions of the display area DA from the contact portion CNT1, thereby forming a crack detection path that ends at the contact portion CNT5. The first crack detection line TCDb disposed in the right peripheral area PA can be formed by extending the first crack detection line TCDb at least once in the front-to-back direction along the right and top peripheral areas PA from the contact portion CNT3, which receives the test voltage, thereby forming a crack detection path that ends at the contact portion CNT6.

[0138] In one embodiment, the contact portions CNT1 , CNT3 , CNT5 , and CNT6 may be disposed at positions where the contact portions CNT1 , CNT3 , CNT5 , and CNT6 do not overlap with the encapsulation layer EnC in a plan view.

[0139] According to the present exemplary embodiment, defects can be detected through the first crack detection lines TCDa and TCDb. For example, cracks in the encapsulation layer EnC or lifting of the encapsulation layer EnC can be detected through the first crack detection lines TCDa and TCDb.

[0140] Next, refer to Figure 15 , a display device according to an exemplary embodiment of the present inventive concept and Figure 12 The display device of the exemplary embodiment of the present invention is almost the same, except that Figure 14 As omitted in the exemplary embodiment of Figure 15 The second crack detection lines MCDa and MCDb are omitted, and a single first crack detection line TCDc is included. One end of the first crack detection line TCDc can be connected to the detection data line TD1 of the crack detection circuit CDA via a contact portion CNT7, and the other end can be connected to the test signal line TD2 via a contact portion CNT8. The first crack detection line TCDc can be extended at least once in the front-to-back direction along the right, top, and left peripheral areas PA from the contact portion CNT7, which receives the test voltage, to form a crack detection path that ends at the contact portion CNT8.

[0141] Next, refer to Figure 16 , a display device according to an exemplary embodiment of the present invention includes the above-mentioned Figure 1 The bending area BDA in the exemplary embodiment of the present invention. The crack detection circuit CDA can be arranged between the bending area BDA and the pad portion PDA. As shown, the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb can be arranged outside the periphery of the display area DA and can further include a portion that can overlap with the bending area BDA when viewed in a direction perpendicular to the substrate surface. In this case, the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb can be connected to the test signal line TD2. In addition, the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb can be connected to the connecting wires CL1 and CL2 respectively through the contact portions CNT12, CNT13, CNT32, and CNT33. The contact portions CNT12, CNT13, CNT32, and CNT33 can be arranged outside the periphery of the bending area BDA.

[0142] The first crack detection lines TCDa and TCDb can each further include connecting conductors CL3 and CL4, respectively, connecting between contact portions CNT11 and CND31 and contact portions CNT12 and CNT32. The first crack detection lines TCDa and TCDb, as well as the second crack detection lines MCDa and MCDb, can each further include connecting conductors CB1, which can connect contact portions CNT12 and CNT13 and / or CNT32 and CNT33. Contact portions CNT12 and CNT32 can be positioned outside the upper periphery of the bending area BDA, while contact portions CNT13 and CNT33 can be positioned outside the lower periphery of the bending area BDA. Each connecting conductor CB1 can be connected to test signal line TD1 and test signal line TD2 of the crack detection circuit CDA via contact portions CNT13 and CNT33. Therefore, one of the first crack detection lines TCDa and TCDb may receive a test voltage from the pad portion PDA through one of the connection wires CL1 and CL2, one of the contact portions CNT12 / CNT13 and CNT32 / CNT33, one of the connection wires CL3 and CL4, and one of the contact portions CNT11 and CNT31, respectively.

[0143] As described, the contact portions CNT12, CNT13, CNT32, and CNT33 can be disposed outside the periphery of the bending area BDA and can include at least one contact hole. Furthermore, the conductive lines of different layers can be connected to each other via the corresponding contact portions CNT12, CNT13, CNT32, and CNT33. For example, the connecting conductive line CB1 can be disposed in the third conductive layer described above. In other examples, the connecting conductive lines CL3 and CL4, the second crack detection lines MCDa and MCDb, and the test signal lines TD1 and TD2, which can be connected to each other via the contact portions CNT12, CNT13, CNT32, and CNT33, can be disposed in the second conductive layer or the first conductive layer described above.

[0144] In addition, the display panel 1000 according to an exemplary embodiment of the present invention may further include a common voltage transmission line ELS that extends along the peripheral area PA around at least three sides of the display area DA and transmits a common voltage. The common voltage transmission line ELS may further include a connecting wire CB2 that overlaps the bending area BDA when viewed in a direction perpendicular to the substrate surface, and may receive a common voltage from the pad portion PDA through the connecting wire CB2. The connecting wire CB2 may be respectively connected to contact portions CNT9 and CNT10 that may be provided outside the periphery of the bending area BDA. Conductors of different layers may be connected to each other through the contact portions CNT9 and CNT10.

[0145] Next, refer to Figure 17 , a display device according to an exemplary embodiment of the present inventive concept and Figure 16 The display device of the exemplary embodiment is nearly identical, except that the crack detection circuit CDA and the test signal line TD2 may be disposed between the bending area BDA and the display area DA. In this case, the test gate line TG may further include a connecting conductor CB3 that connects two contact portions CNT41 and two contact portions CNT42, which may be disposed outside the periphery of the bending area BDA. When viewed perpendicular to the substrate surface, the connecting conductor CB3 may be disposed so as to overlap the bending area BDA. Conductive lines on different layers may be connected to each other via the contact portions CNT41 and CNT42.

[0146] Similarly, the connection conductors CL1 and CL2 connecting the test signal line TD1 to the pad portion PDA may include a connection conductor CB4 that connects two contact portions CNT43 and two contact portions CNT44, which may be disposed outside the periphery of the bend area BDA. The connection conductor CB4 may be disposed so as to overlap the bend area BDA when viewed in a direction perpendicular to the substrate surface. Conductors of different layers may be connected to each other via the contact portions CNT43 and CNT44.

[0147] Next, refer to Figure 18 , except for the configuration and position of the crack detection circuit CDA, the display device according to the exemplary embodiment of the present inventive concept is Figure 4 The display devices of the exemplary embodiments are almost the same.

[0148] The crack detection circuit CDA may include a plurality of test signal lines DC1, DC2, and DC3, a plurality of test gate lines DC_G1, DC_G2, and DC_G3, and a plurality of switches Q3, Q4, and Q5. The plurality of test signal lines DC1, DC2, and DC3 and the plurality of test gate lines DC_G1, DC_G2, and DC_G3 may extend in the x-axis direction and may be arranged substantially parallel to one another. The plurality of test signal lines DC1, DC2, and DC3 and the plurality of test gate lines DC_G1, DC_G2, and DC_G3 may be connected to the pad portion PDA and receive signals.

[0149] Each of the switches Q3 may include a gate terminal connected to the test gate line DC_G1, an input terminal connected to one of a pair of test signal lines DC1 and DC3, and an output terminal connected to the corresponding data line 171. Each of the switches Q4 may include a gate terminal connected to the test gate line DC_G2, an input terminal connected to the test signal lines DC1 and DC3, which may not be shared by the switch Q3, and an output terminal connected to the corresponding data line 171. Each of the switches Q5 may include a gate terminal connected to the test gate line DC_G3, an input terminal connected to the test signal line DC2, and an output terminal connected to the corresponding data line 171. When a first pixel array having only green pixels G and a second pixel array having alternating red pixels R and blue pixels B are alternately arranged in the x-axis direction in the display area DA, the data line 171 connected to the first pixel array may be connected to the test signal line DC2 through the switch Q5, and the data line 171 connected to the second pixel array may be connected to the pair of test signal lines DC1 and DC3 through each pair of switches Q3 and Q4.

[0150] The plurality of switches Q3 , Q4 , and Q5 may be alternately arranged in this order in the x-axis direction.

[0151] like Figure 18 As shown, one end of each of the first crack detection lines TCDa and TCDb can be connected to at least one switch Q5, and one end of each of the second crack detection lines MCDa and MCDb can be connected to the test signal line DC2 via contact portions CNT2 and CNT4, respectively. For example, a crack detection path including one of the first crack detection lines TCDa and TCDb and a corresponding one of the second crack detection lines MCDa and MCDb can be connected to at least one switch Q5 and the test signal line DC2. Figure 18 The switch Q5 is exemplarily illustrated to be connected to the test signal line DC2 through the first and second crack detection lines TCDa and MCDa and the first and second crack detection lines TCDb and MCDb in each of the left and right peripheral areas of the display panel 1000 , respectively.

[0152] refer to Figure 18 The display panel 1000 may further include a plurality of test signal lines Test_D1 and Test_D2, a test gate line Test_G, and a plurality of switches Q8. The plurality of test signal lines Test_D1 and Test_D2 and the plurality of test gate lines Test_G may extend in the x-axis direction and may be disposed parallel to each other.

[0153] Each of the plurality of switches Q8 may be arranged to correspond to each data line 171. Each switch Q8 may include: a gate terminal connected to a test gate line Test_G, an input terminal connected to one of the test signal lines Test_D1 and Test_D2, and an output terminal connected to the corresponding data line 171. A first pair of adjacent switches Q8 may be connected to the test signal line Test_D1, and a second pair of adjacent switches Q8 may be connected to the test signal line Test_D2. The first pair of adjacent switches Q8 and the second pair of adjacent switches Q8 may be arranged alternately in the x-axis direction, but this arrangement is not limited. In another embodiment, one of the pair of test signal lines Test_D1 and Test_D2 may be omitted, and all switches Q8 may be connected to one test signal line.

[0154] A high voltage line GHL, a low voltage line GLL, and a plurality of switches Q6 and Q7 may be further provided between the plurality of switches Q8 and the display area DA. The plurality of switches Q6 and Q7 may be connected to the high voltage line GHL and the data line 171, or to the low voltage line GLL and the data line 171. Each of the plurality of switches Q6 and each of the plurality of switches Q7 may be diode-connected to each other. In other embodiments, the high voltage line GHL, the low voltage line GLL, and the switches Q6 and Q7 may be omitted.

[0155] exist Figure 18 In the illustrated exemplary embodiment, the crack detection circuit CDA may be disposed in the upper peripheral area PA outside the upper portion of the display area DA. In other embodiments, the crack detection circuit CDA may be disposed elsewhere. For example, the crack detection circuit CDA may be disposed between the display area DA and the pad portion PDA. In another example, the crack detection circuit CDA may be disposed in a region that may be opposite the pad portion PDA relative to the display area.

[0156] Next, we will refer to Figure 18 A method for detecting a defect in a display device according to an exemplary embodiment of the inventive concept is described.

[0157] First, a first test voltage may be applied to the test signal lines Test_D1 and Test_D2, and a gate signal of a gate-on voltage may be applied to the test gate line Test_G. Then, the switch Q8 may be turned on, and the first test voltage may be applied to the plurality of data lines 171 through the turned-on switch Q8. The first test voltage may be a predetermined voltage, and may be, for example, a voltage at which pixels R, G, and B display the highest grayscale. Therefore, the pixels R, G, and B connected to the turned-on switch Q8 may display the highest grayscale, such as white.

[0158] Next, when a gate-on voltage is applied to the test gate lines DC_G1, DC_G2, and DC_G3 after a gate-off voltage is applied to the test gate line Test_G, the plurality of switches Q3, Q4, and Q5 may be turned on. In this case, when a second test voltage is applied to the test signal lines DC1, DC2, and DC3, the second test voltage may be applied to the plurality of data lines 171 through the turned-on switches Q3, Q4, and Q5. The second test voltage may be a predetermined voltage and may be, for example, a voltage at which pixels R, G, and B display the lowest grayscale. Therefore, the pixels R, G, and B connected to the turned-on switches Q3, Q4, and Q5 that are not connected to the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb may display the lowest grayscale, such as black.

[0159] If no crack or lift occurs in the peripheral area PA of the display panel 1000 and no damage is applied to the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb, the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb may be in a normal state. The switch Q5 may be connected to the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb, and the pixel G may display the lowest grayscale, such as black.

[0160] However, when a crack or lift occurs in the peripheral area PA of the display panel 1000 and the first crack detection lines TCDa and TCDb and / or the second crack detection lines MCDa and MCDb are short-circuited or damaged, the wire resistance may increase. As described above, the switch Q5 may be connected to the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb. When the wire resistance increases, the pixels G connected to the switch Q5 may not receive a black data voltage or may not receive a sufficient black data voltage. As a result, a strong or weak bright line may be observed along the array of pixels G connected to the switch Q5, which in turn may be connected to the defective first crack detection lines TCDa and TCDb and / or second crack detection lines MCDa and MCDb. Defects such as cracks or lift that may occur in the peripheral area P of the display panel 1000 can be detected based on bright light from the display panel 1000.

[0161] Next, we will refer to Figure 19 and Figure 20 A display device according to an exemplary embodiment of the present inventive concept is described with reference to the above-mentioned drawings.

[0162] refer to Figure 19 and Figure 20A display device according to one or more exemplary embodiments of the present inventive concept is almost the same as the display device of the above-described embodiment, except that the display device further includes a cover layer CAP that may be disposed in a peripheral area PA outside a periphery of a display area DA. The cover layer CAP may include a portion that covers an edge of the encapsulation layer EnC while extending along the edge of the encapsulation layer EnC.

[0163] For example, the cover layer CAP may include at least one cover portion CPA1, which may be disposed in the left peripheral area PA of the display panel 1000 and extend while overlapping the left edge of the encapsulation layer EnC. At least one cover portion CAP2 and CAP3 may be disposed in the upper peripheral area PA and extend while overlapping the upper edge of the encapsulation layer EnC. At least one cover portion CAP4 may be disposed in the right peripheral area PA of the display panel 1000 and extend while overlapping the right edge of the encapsulation layer EnC. In other embodiments, each of the two cover portions CAP1 and CAP4 may include a plurality of separate portions, and the cover portions CPA2 and CAP3 may be connected to each other.

[0164] refer to Figure 20 The cover layer CAP may include cover portions CAP1, CAP2, CAP3, and CAP4 overlapping the edge of the encapsulation layer EnC. Therefore, cracks generated from the edge of the substrate 110 may be prevented from spreading to the encapsulation layer EnC and the layers at the periphery of the encapsulation layer EnC.

[0165] The cover layer CAP may be provided in the fourth conductive layer provided with the first touch conductor TEa. In another exemplary embodiment, the cover layer CAP may be provided in the fifth conductive layer provided with the second touch conductor TEb. According to another exemplary embodiment, the cover layer CAP may include both the fourth conductive layer and the fifth conductive layer.

[0166] Return Reference Figure 19 , the cover layer CAP may be connected to the pad portion PDA and thus may transmit a predetermined voltage, such as a common voltage, etc. When the display panel 1000 includes the bending area BDA, the cover layer CAP may be connected to the pad portion PAD through at least one of the contact portions CNTc and CNTd and at least one of the connection conductors CL5 and CL6, which are disposed to overlap the bending area BDA when viewed in a direction perpendicular to the substrate surface. Although Figure 19 Although not shown in the drawings, the connection conductive lines CL5 and CL6 may be connected to the pad portion PDA through a contact portion (not shown) provided at an outer side or a lower periphery of the bending area BDA.

[0167] According to another exemplary embodiment, Figure 19 and Figure 20 As shown, the cover layer CAP may prevent cracks from occurring in one or more exemplary embodiments of the present inventive concept. Therefore, at least one of the first crack detection lines TCDa and TCDb and the second crack detection lines MCDa and MCDb may be omitted.

[0168] Now refer to Figure 21 A display device according to an exemplary embodiment of the present inventive concept is described with reference to the above-mentioned drawings.

[0169] refer to Figure 21 The display device according to the exemplary embodiment of the present inventive concept is almost the same as the display device of the exemplary embodiment described above, except that the display device may further include strain gauges GAU1 and GAU2, which may include resistor lines disposed in the bending area BDA. The resistor lines of the strain gauges GAU1 and GAU2 may be disposed in the end areas of the bending area BDA. For example, Figure 21 As shown, the resistor wires may be provided in the left and / or right end regions of the bending area BDA. The resistance of the resistor wires of the strain gauges GAU1 and GAU2 may vary depending on the degree of bending of the bending area BDA, and the corresponding stress applied to the bending area BDA may be detected by sensing the resistance variation.

[0170] The resistor lines of the strain gauges GAU1 and GAU2 may include bent portions of the resistor lines formed by extending in the front-to-rear direction in the bent area BDA and may be connected to the pad portion PDA via a plurality of connection wires CL7 and CL8. The connection wires CL7 and CL8 may be connected to other portions of the resistor lines of the strain gauges GAU1 and GAU2, respectively.

[0171] The resistor wires of the strain gauges GAU1 and GAU2 may be provided on the same layer as one of the first conductive layer, the second conductive layer, and the third conductive layer.

[0172] refer to Figure 21 , the display device according to an exemplary embodiment of the inventive concept may further include a printed circuit film 700 connected to the display panel 1000. A plurality of signal wires may be provided in the printed circuit film 700, and at least one driver, a timing controller, etc. may be installed in the printed circuit film 700. The signal wires of the printed circuit film 700 may be connected to the pad portion PDA of the display panel 1000.

[0173] In another embodiment, the printed circuit film 700 may include a pad portion (not shown) that may overlap with the pad portion PDA while being electrically connected to the pad portion PDA.

[0174] While the invention has been described in connection with what are presently considered to be practical example embodiments, it is to be understood that the invention is not limited to the disclosed embodiments, but on the contrary is intended to cover various modifications and equivalent arrangements included within the spirit and scope of the appended claims.

Claims

1. A display device comprising: substrate; a display area including a plurality of pixels on the substrate; a peripheral area disposed outside the display area of the substrate and including a pad portion; an encapsulation layer disposed on the peripheral area and the display area; a buffer layer disposed on the encapsulation layer; a crack detection circuit disposed in the peripheral region; a plurality of touch conductors disposed on the buffer layer and in the display area; as well as A crack detection line is provided on the buffer layer and in the peripheral region, the crack detection line being connected to the crack detection circuit, wherein The crack detection line includes the same material as that of at least one touch conductor among the plurality of touch conductors, wherein The crack detection line is electrically connected to the pad portion for receiving a voltage and includes a first line portion and a second line portion adjacent to each other, extending parallel to each other and electrically connected to each other, and one end of the crack detection line is connected to the crack detection circuit through a matching resistor.

2. The display device according to claim 1, wherein The crack detection line is provided on the same layer as at least one touch conductor among the plurality of touch conductors.

3. The display device according to claim 1, further comprising: At least one dam portion is provided in the peripheral region, wherein The crack detection line is provided between the at least one dam portion and the display area.

4. The display device according to claim 3, wherein The encapsulation layer includes an organic layer and a first inorganic layer, and The first inorganic layer covers the at least one dam portion.

5. The display device according to claim 4, wherein The encapsulation layer further includes a second inorganic layer disposed between the organic layer and the substrate, and The second inorganic layer covers the at least one dam portion. The display device according to claim 1 , wherein: The encapsulation layer includes an organic layer and a first inorganic layer, and The crack detection line overlaps the organic layer in a direction perpendicular to a surface of the substrate.

7. The display device according to claim 1, wherein The plurality of touch conductors include a first touch conductor and a second touch conductor, A touch insulating layer is further included between the first touch conductor and the second touch conductor, and The crack detection line and the first touch conductor or the second touch conductor are provided in the same layer.

8. A display device comprising: substrate; a display area including a plurality of pixels on the substrate; a peripheral area disposed outside the display area of the substrate and including a pad portion; an encapsulation layer disposed on the peripheral area and the display area; a buffer layer disposed on the encapsulation layer; a crack detection circuit disposed in the peripheral region; a plurality of touch conductors disposed on the buffer layer and in the display area; as well as A crack detection line is provided on the buffer layer and in the peripheral region, the crack detection line being connected to the crack detection circuit, wherein The crack detection line and at least one touch conductor among the plurality of touch conductors are provided on the same layer, wherein The crack detection line is electrically connected to the pad portion for receiving a voltage and includes a first line portion and a second line portion adjacent to each other, extending parallel to each other and electrically connected to each other, and one end of the crack detection line is connected to the crack detection circuit through a matching resistor.

9. The display device according to claim 8, wherein The crack detection line and the at least one touch conductor among the plurality of touch conductors contact a same layer.

10. The display device according to claim 8, further comprising: At least one dam portion is provided in the peripheral region, wherein The crack detection line is provided between the at least one dam portion and the display area.

11. The display device according to claim 10, wherein: The encapsulation layer includes an organic layer and a first inorganic layer, and The first inorganic layer covers the at least one dam portion.

12. The display device according to claim 11, wherein The encapsulation layer further includes a second inorganic layer disposed between the organic layer and the substrate, and The second inorganic layer covers the at least one dam portion.

13. The display device according to claim 8, wherein The encapsulation layer includes an organic layer and a first inorganic layer, and The crack detection line overlaps the organic layer in a direction perpendicular to a surface of the substrate.

14. The display device according to claim 8, wherein The plurality of touch conductors include a first touch conductor and a second touch conductor, A touch insulating layer is further included between the first touch conductor and the second touch conductor, and The crack detection line and the first touch conductor or the second touch conductor are provided in the same layer.

15. A display device comprising: substrate; a display area including a plurality of pixels on the substrate; a peripheral area disposed outside the display area of the substrate and including a pad portion; an encapsulation layer disposed on the peripheral area and the display area; a buffer layer disposed on the encapsulation layer; a crack detection circuit disposed in the peripheral region; a crack detection line provided on the buffer layer, the crack detection line being connected to the crack detection circuit; an insulating layer provided on the crack detection line; as well as At least one dam portion is provided in the peripheral region, wherein The crack detection line is provided between the at least one dam portion and an edge of the substrate, and The crack detection line is electrically connected to the pad portion for receiving a voltage and includes a first line portion and a second line portion adjacent to each other, extending parallel to each other and electrically connected to each other, and one end of the crack detection line is connected to the crack detection circuit through a matching resistor.

16. The display device according to claim 15, further comprising: A plurality of touch conductors are provided on the buffer layer and in the display area, wherein The crack detection line and at least one touch conductor among the plurality of touch conductors are disposed on the same layer as each other and include the same material as each other.

17. The display device according to claim 15, wherein: The insulating layer covers the at least one dam portion.

18. The display device according to claim 17, wherein: The buffer layer covers the at least one dam portion.

19. The display device according to claim 18, wherein The crack detection line is surrounded by and contacts the insulating layer and the buffer layer.

20. The display device according to claim 15, wherein The encapsulation layer includes an organic layer and a first inorganic layer, and The first inorganic layer covers the at least one dam portion.

21. The display device according to claim 20, wherein The encapsulation layer further includes a second inorganic layer disposed between the organic layer and the substrate, and The second inorganic layer covers the at least one dam portion.

22. A display device comprising: substrate; a display area including a plurality of pixels on the substrate; a peripheral area disposed outside the display area of the substrate and including a pad portion; an encapsulation layer disposed on the peripheral area and the display area; a buffer layer disposed on the encapsulation layer; a crack detection circuit disposed in the peripheral region; a crack detection line provided on the buffer layer, the crack detection line being connected to the crack detection circuit; an insulating layer provided on the crack detection line; as well as At least one dam portion is provided in the peripheral region, wherein The crack detection line is provided between the at least one dam portion and the display area, wherein The crack detection line is electrically connected to the pad portion for receiving a voltage and includes a first line portion and a second line portion adjacent to each other, extending parallel to each other and electrically connected to each other, and one end of the crack detection line is connected to the crack detection circuit through a matching resistor.

23. The display device according to claim 22, further comprising: A plurality of touch conductors are provided on the buffer layer and in the display area, wherein The crack detection line and at least one touch conductor among the plurality of touch conductors are disposed on the same layer as each other and include the same material as each other.

24. The display device according to claim 22, wherein: The encapsulation layer includes an organic layer and a first inorganic layer, and The first inorganic layer covers the at least one dam portion.

25. The display device according to claim 24, wherein The encapsulation layer further includes a second inorganic layer disposed between the organic layer and the substrate, and The second inorganic layer covers the at least one dam portion.

26. The display device according to claim 22, wherein The encapsulation layer includes an organic layer and a first inorganic layer, and The crack detection line overlaps the organic layer in a direction perpendicular to a surface of the substrate.

27. The display device according to claim 23, wherein The plurality of touch conductors include a first touch conductor and a second touch conductor, A touch insulating layer is further included between the first touch conductor and the second touch conductor, and The crack detection line and the first touch conductor or the second touch conductor are provided in the same layer.

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