Flash memory screening method, device, storage medium and computer equipment

Abstract

The present invention discloses a flash memory screening method, device, storage medium and computer equipment, which relates to the field of information technology, and is mainly capable of improving the efficiency and accuracy of flash memory screening. The method includes: receiving a screening instruction corresponding to a flash memory to be screened, the screening instruction containing identification information corresponding to the flash memory to be screened; based on the identification information, determining a screening template corresponding to the flash memory to be screened; based on the screening template, obtaining various screening requirement information corresponding to the flash memory to be screened; generating a requirement list corresponding to the flash memory to be screened according to the various screening requirement information; sending the requirement list to a flash memory storage end, so that the flash memory storage end can screen out a target flash memory from multiple flash memories based on the requirement list, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information. The present invention is suitable for screening flash memories.

Description

Technical Field

[0001] The present invention relates to the technical field of data storage, and in particular to a flash memory screening method, device, storage medium and computer equipment. Background Art

[0002] Flash memory is an important component of storage devices, and its main function is to reliably store data. SSD solid-state drives and other related storage manufacturers need to use a large number of finished storage devices for testing during the product design process. After the test is completed, these storage devices cannot be sold, but can be reused on storage testing equipment. The storage devices contain a large amount of flash memory. If they are scrapped directly, there will be a huge waste. If they are dismantled and used directly, a large amount of flash memory may not work properly. The dismantled flash memory has undergone different tests, and the characteristics at this time are very different from those when it leaves the factory. Based on this, it is particularly important to screen out flash memory that meets the needs.

[0003] Currently, flash memory is typically classified into different levels, and users select flash memory based on the level they require. However, flash memory levels do not reflect all of the flash memory's parameters. If a user only requires a flash memory with strong write capabilities and has lower requirements for other flash memory performance, the user will not know what level of flash memory to obtain. A careful search in the flash memory level table is required to select the required flash memory, resulting in low flash memory screening efficiency. Furthermore, due to user negligence, the flash memory level table may be incorrectly searched, resulting in the selection of the wrong flash memory, which in turn leads to low flash memory screening accuracy. Summary of the Invention

[0004] The present invention provides a flash memory screening method, device, storage medium and computer equipment, which are mainly capable of improving the efficiency and accuracy of flash memory screening.

[0005] According to a first aspect of the present invention, a method for screening flash memory is provided, comprising:

[0006] receiving a screening instruction corresponding to the flash memory to be screened, wherein the screening instruction includes identification information corresponding to the flash memory to be screened;

[0007] Determining a screening template corresponding to the flash memory to be screened based on the identification information;

[0008] Based on the screening template, obtaining various screening requirement information corresponding to the flash memory to be screened;

[0009] Generate a demand sheet corresponding to the flash memory to be screened according to the various screening demand information;

[0010] The demand list is sent to a flash memory storage end so that the flash memory storage end can screen out a target flash memory from a plurality of flash memories based on the demand list, wherein the flash memory storage end stores the plurality of flash memories and their corresponding basic information and performance information.

[0011] According to a second aspect of the present invention, there is provided a flash memory screening device, comprising:

[0012] A receiving unit, configured to receive a screening instruction corresponding to the flash memory to be screened, wherein the screening instruction includes identification information corresponding to the flash memory to be screened;

[0013] a determining unit, configured to determine a screening template corresponding to the flash memory to be screened based on the identification information;

[0014] an acquiring unit, configured to acquire, based on the screening template, various screening requirement information corresponding to the flash memory to be screened;

[0015] A generating unit, configured to generate a demand sheet corresponding to the flash memory to be screened according to the various screening demand information;

[0016] A sending unit is used to send the demand form to the flash memory storage end so that the flash memory storage end can screen out a target flash memory from multiple flash memories based on the demand form, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information.

[0017] According to a third aspect of the present invention, there is provided a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the following steps:

[0018] receiving a screening instruction corresponding to the flash memory to be screened, wherein the screening instruction includes identification information corresponding to the flash memory to be screened;

[0019] Determining a screening template corresponding to the flash memory to be screened based on the identification information;

[0020] Based on the screening template, obtaining various screening requirement information corresponding to the flash memory to be screened;

[0021] Generate a demand sheet corresponding to the flash memory to be screened according to the various screening demand information;

[0022] The demand list is sent to a flash memory storage end so that the flash memory storage end can screen out a target flash memory from a plurality of flash memories based on the demand list, wherein the flash memory storage end stores the plurality of flash memories and their corresponding basic information and performance information.

[0023] According to a fourth aspect of the present invention, there is provided a computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the following steps are implemented:

[0024] receiving a screening instruction corresponding to the flash memory to be screened, wherein the screening instruction includes identification information corresponding to the flash memory to be screened;

[0025] Determining a screening template corresponding to the flash memory to be screened based on the identification information;

[0026] Based on the screening template, obtaining various screening requirement information corresponding to the flash memory to be screened;

[0027] Generate a demand sheet corresponding to the flash memory to be screened according to the various screening demand information;

[0028] The demand list is sent to a flash memory storage end so that the flash memory storage end can screen out a target flash memory from a plurality of flash memories based on the demand list, wherein the flash memory storage end stores the plurality of flash memories and their corresponding basic information and performance information.

[0029] According to a flash memory screening method, apparatus, storage medium and computer device provided by the present invention, compared with the current method of classifying flash memories and screening flash memories according to the flash memory grade required by the user, the present invention receives a screening instruction corresponding to a flash memory to be screened, the screening instruction including identification information corresponding to the flash memory to be screened; determines a screening template corresponding to the flash memory to be screened based on the identification information; obtains various screening requirement information corresponding to the flash memory to be screened based on the screening template; generates a demand sheet corresponding to the flash memory to be screened based on the various screening requirement information; and sends the demand sheet to a flash memory storage end so that the flash memory storage end screens out a target flash memory from multiple flash memories based on the demand sheet, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information. Thus, the screening template corresponding to the flash memory to be screened is determined based on the identification information in the screening instruction, and the various screening requirement information corresponding to the flash memory to be screened is obtained based on the screening template. Finally, the target flash memory is screened out from the multiple flash memories in the flash memory storage end based on the various screening requirement information, thereby improving the efficiency of flash memory screening and avoiding the error flash memory being queried due to user negligence, thereby improving the accuracy of flash memory screening. BRIEF DESCRIPTION OF THE DRAWINGS

[0030] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0031] Figure 1 A flow chart of a flash memory screening method provided by an embodiment of the present invention is shown;

[0032] Figure 2 A flow chart of another flash memory screening method provided by an embodiment of the present invention is shown;

[0033] Figure 3 A schematic structural diagram of a flash memory screening device provided by an embodiment of the present invention is shown;

[0034] Figure 4 A schematic structural diagram of another flash memory screening device provided by an embodiment of the present invention is shown;

[0035] Figure 5 A schematic diagram of the physical structure of a computer device provided by an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0036] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments. It should be noted that, unless there is a conflict, the embodiments and features in the embodiments of the present application can be combined with each other.

[0037] Currently, the method of screening flash memories according to the flash memory level required by the user requires the user to query a flash memory level table, resulting in low flash memory screening efficiency. At the same time, due to user negligence, the wrong flash memory may be queried, resulting in low flash memory screening accuracy.

[0038] In order to solve the above problems, an embodiment of the present invention provides a flash memory screening method, such as Figure 1 As shown, the method includes:

[0039] 101. Receive a screening instruction corresponding to a flash memory to be screened, where the screening instruction includes identification information corresponding to the flash memory to be screened.

[0040] The identification information may be flash memory icon information, the flash memory to be screened may be a used flash memory, and the flash memory to be screened is composed of various flash memory blocks.

[0041] For the embodiments of the present invention, in order to overcome the problems of low screening efficiency and low screening accuracy of flash memories in the prior art, the embodiments of the present invention determine the screening template corresponding to the flash memory to be screened through the identification information in the screening instruction, and based on the screening template, obtain the various screening requirement information corresponding to the flash memory to be screened, and finally screen out the target flash memory from the multiple flash memories in the flash memory storage end according to the various screening requirement information, thereby improving the efficiency of flash memory screening, and at the same time avoiding the query of the wrong flash memory due to user negligence, thereby improving the accuracy of flash memory screening.

[0042] Specifically, the flash memory screening software is opened in the query operation platform, and the flash memory screening software can also be a web page. After opening the flash memory screening software, click the flash memory screening button in the displayed main interface, which triggers the screening instruction corresponding to the flash memory to be screened. At this time, the query operation platform receives the flash memory screening instruction of the flash memory to be screened, wherein the screening instruction contains icon information corresponding to the flash memory, and any flash memory to be screened corresponds to unified icon information. Based on the icon information, the query operation platform determines the screening template corresponding to the flash memory to be screened and displays the screening template. The user fills in various screening requirement information in the corresponding position of the screening template. Finally, the query operation platform transmits the various screening requirement information filled in by the user to the flash memory storage end. The flash memory storage end screens out the target flash memory from multiple flash memories based on the various screening requirement information, thereby improving the efficiency of flash memory screening. At the same time, it can avoid the user personally querying the flash memory level table, which leads to the problem of flash memory query errors, thereby improving the accuracy of flash memory screening.

[0043] 102. Determine a screening template corresponding to the flash memory to be screened based on the identification information.

[0044] Each flash memory to be screened corresponds to a unified screening template, and the screening template is pre-built.

[0045] For an embodiment of the present invention, after receiving the flash memory screening instruction corresponding to the flash memory to be screened, in order to screen out the target flash memory, it is necessary to determine the screening template corresponding to the flash memory to be screened based on the identification information corresponding to the flash memory to be screened. The screening template contains content to be filled in. The user fills in the various demand data information corresponding to the required flash memory into the corresponding position in the screening template. After filling in, click the OK button at the preset position in the screening template filling interface to generate a demand form corresponding to the flash memory to be screened, and send the demand form to the flash memory storage end. The flash memory storage form screens out the target flash memory from multiple flash memories based on the various flash memory demand data information recorded in the demand form, thereby improving the efficiency of flash memory screening. At the same time, the screening conditions can be set according to actual usage needs to select the flash memory to be used.

[0046] 103. Based on the screening template, obtain various screening requirement information corresponding to the flash memory to be screened.

[0047] The various items of screening requirement information are determined according to user needs, and may include one item of screening requirement information, two items of screening requirement information, or multiple items of screening requirement information, which is not specifically limited in the embodiment of the present invention.

[0048] For an embodiment of the present invention, after determining the screening template corresponding to the flash memory to be screened based on the identification information, the screening template is displayed in the main interface of the flash memory query operation platform. There are various title items in the screening operation template displayed in the main interface of the query operation platform, including required title items, such as the screening time title item. The screening time title item corresponds to the screening time, and the screening time is automatically generated. The required title item also includes a screening purpose title item. The user needs to fill in the purpose of obtaining the flash memory in the corresponding blank position of the screening purpose title item. In addition, the required title item also includes a department title item. The user fills in the department in the corresponding blank position of the department title item. The department can be set as a drop-down order. The user clicks the drop-down menu identifier to display a drop-down menu containing various departments. The user can select the user's department in the drop-down menu. At the same time, the flash memory screening template also includes various screening requirement data information title items, such as flash memory model title item, flash memory working status title item, flash memory write time information title item, Flash memory read time information title item, flash memory erase time information title item, etc., for each screening requirement data information title item, the user can fill in as needed. For example, the user only needs the write time information corresponding to the flash memory to be: the write time average is 20s, then the user only needs to fill in "the write time average is 20s" in the blank position corresponding to the write time information title item. If the user needs the write time information corresponding to the flash memory to be: the write time average is 20s, and the erase time information is: the erase time average is 10s, and the erase time variance is 15s, then the user only needs to fill in "the write time average is 20s" in the blank position corresponding to the write time information title item, and fill in "the erase time average is 10s, and the erase time variance is 15s" in the blank position corresponding to the erase time information title item. Therefore, after filling in the corresponding information in the flash memory screening template, the various screening requirement information corresponding to the flash memory to be screened can be obtained. Finally, based on the various screening requirement information, the flash memory storage end screens out the target flash memory from multiple flash memories, thereby improving the efficiency of flash memory screening.

[0049] 104. Generate a demand sheet corresponding to the flash memory to be screened according to the various screening requirement information.

[0050] Among them, the screening requirement list records various screening requirement information corresponding to the flash memory to be screened. For an embodiment of the present invention, after obtaining the various screening requirement information corresponding to the flash memory to be screened, the query operation platform generates a requirement list corresponding to the flash memory to be screened based on the screening requirement information, and sends the requirement list to the flash memory storage end. The flash memory storage end screens out the target flash memory from the multiple flash memories based on the various screening requirement information recorded in the requirement list, which can avoid the situation where the user queries the wrong flash memory when querying the flash memory level table personally, thereby improving the accuracy of flash memory screening.

[0051] 105. Send the demand form to the flash memory storage end so that the flash memory storage end can screen out a target flash memory from multiple flash memories based on the demand form, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information.

[0052] Among them, the flash memory storage end specifically includes a test hardware platform, a test operation platform and a data storage server. The test operation platform sets the test temperature to the test hardware platform and sends test instructions to the test hardware platform at the same time. After receiving the test instructions, the test hardware platform performs basic tests and performance tests on each flash memory, and then determines the model information, operating temperature information, capacity information, write data time information, read data time information, erase data time information, etc. corresponding to each flash memory. The test hardware platform also feeds back the various information obtained from the test to the test operation platform. The test operation platform stores the information obtained from various tests corresponding to each flash memory in the data storage server. Each flash memory stored in the data storage server has a unique identification number, that is, the data storage server stores each numbered flash memory, that is, the basic information and performance information corresponding to each flash memory.

[0053] In an embodiment of the present invention, after generating a demand sheet corresponding to the flash memory to be screened, the query operation platform sends the demand sheet to the flash memory storage end. After receiving the demand sheet, the flash memory storage end queries the various flash memory demand information recorded in the demand sheet, and based on the flash memory demand information, screens out the target flash memory from the various flash memories stored in the data storage server. The specific method for screening the target flash memory can be to perform similarity matching on the various demand information recorded in the demand sheet with the basic information and performance information corresponding to the various flash memories stored in the data storage server, and determine the target flash memory from the various flash memories based on the similarity matching result, thereby determining the flash memory to be screened through the identification information in the screening instruction. A screening template corresponding to the flash memory is selected, and based on the screening template, various screening requirement information corresponding to the flash memory to be screened is obtained, and finally, based on the various screening requirement information, the target flash memory is screened out from the multiple flash memories in the flash memory storage end, thereby improving the efficiency of flash memory screening and avoiding the wrong flash memory being queried due to user negligence, thereby improving the accuracy of flash memory screening. At the same time, the test system of the flash memory storage end has a high degree of automation, and automatically completes the test of each flash memory after setting the test parameters, and stores the test data in the database. After the test is completed, there is no need to classify the tested flash memory immediately, but dynamically set the screening conditions according to usage needs to screen the required flash memory.

[0054] According to a flash memory screening method provided by the present invention, compared with the current method of classifying flash memories and screening flash memories according to the flash memory level required by the user, the present invention receives a screening instruction corresponding to the flash memory to be screened, the screening instruction including identification information corresponding to the flash memory to be screened; determines a screening template corresponding to the flash memory to be screened based on the identification information; obtains various screening requirement information corresponding to the flash memory to be screened based on the screening template; generates a demand sheet corresponding to the flash memory to be screened based on the various screening requirement information; sends the demand sheet to a flash memory storage end so that the flash memory storage end screens out a target flash memory from a plurality of flash memories based on the demand sheet, wherein the flash memory storage end stores the plurality of flash memories and their corresponding basic information and performance information, thereby determining the screening template corresponding to the flash memory to be screened based on the identification information in the screening instruction, and obtaining various screening requirement information corresponding to the flash memory to be screened based on the screening template, and finally screening out the target flash memory from the plurality of flash memories in the flash memory storage end based on the various screening requirement information, thereby improving the efficiency of flash memory screening and avoiding the error flash memory being queried due to the user's negligence, thereby improving the accuracy of flash memory screening.

[0055] Furthermore, in order to better illustrate the above process of screening the flash memory, as a refinement and extension of the above embodiment, the embodiment of the present invention provides another method for screening the flash memory, such as Figure 2As shown, the method includes:

[0056] 201. Receive a screening instruction corresponding to a flash memory to be screened, where the screening instruction includes identification information corresponding to the flash memory to be screened.

[0057] For an embodiment of the present invention, in order to filter out a target flash memory from multiple flash memories, it is first necessary to open a query operation platform, which displays login options such as an account number and a password. The login account number is filled in the blank space corresponding to the account number, and the login password is filled in the blank space corresponding to the password. After the account number and password are filled in, click the login button to log in to the main interface of the query operation platform. Click the filter button in the main interface of the query operation platform to trigger the flash memory filtering instruction corresponding to the flash memory to be filtered. At this time, the processing system of the query operation platform will receive the flash memory filtering instruction, and based on the identification information carried in the flash memory filtering instruction, determine the filtering template corresponding to the flash memory to be filtered, and based on the filtering template, determine the demand sheet corresponding to the flash memory to be filtered, and finally send the demand sheet to the flash memory storage end. The flash memory storage end filters out the target flash memory from the multiple flash memories based on the demand sheet.

[0058] 202. Determine a screening template corresponding to the flash memory to be screened based on the identification information.

[0059] For an embodiment of the present invention, after the processing system of the query operation platform receives the filtering instruction corresponding to the flash memory to be filtered, it deciphers the identification information carried in the filtering instruction and determines the filtering template corresponding to the identification information based on the identification information. Specifically, the processing system of the query operation platform may also include other work templates, such as log templates, work report templates and other templates. Different templates correspond to different identification information. Therefore, it is necessary to determine the filtering template corresponding to the flash memory to be filtered based on the flash memory icon corresponding to the flash memory to be filtered, and write the filtering requirement information in the filtering template. Finally, based on the filtering requirement information, the target flash memory is filtered out from multiple flash memories.

[0060] 203. Determine each item of screening title information corresponding to the flash memory to be screened in the screening template.

[0061] For an embodiment of the present invention, after determining the screening template corresponding to the flash memory to be screened, it is necessary to determine the various title information in the screening template, wherein the title information includes basic title information and screening title information, the basic title information is a required item, and the screening title information is an optional item, the basic title information includes a screening time title item, a screening purpose title item, and a department title item, etc., the screening title information includes a write time information title item, a read time title item, an erase time title item, a model title item, a capacity title item, a working mode title item, etc.

[0062] 204. Based on the various items of screening title information, obtain various items of screening requirement information corresponding to the flash memory to be screened.

[0063] For an embodiment of the present invention, after determining the various items of filtering title information in the filtering template, it is necessary to obtain the various items of filtering requirement information corresponding to the flash memory to be filtered based on the various items of filtering title information. Based on this, step 204 specifically includes: based on the various items of filtering title information, obtaining the model information, manufacturer information, capacity information, working mode information, working temperature information, data reading time information, data writing time information, and data erasing time information corresponding to the flash memory to be filtered.

[0064] Specifically, after filling in the basic information in the corresponding position of the basic information title item in the screening template, you also need to fill in the required requirement information in the corresponding position of each screening title item. For example, if the user only needs to obtain a flash memory with model 288 and has no requirements for other parameter information of the flash memory, the user only needs to fill in 288 in the blank position corresponding to the signal information title item. If the user only wants to obtain a flash memory produced by manufacturer A and has no requirements for other parameter information of the flash memory, the user only needs to fill in A in the blank position corresponding to the manufacturer title item. If the user wants to obtain model 288, manufacturer A, capacity 50G, operating temperature between 30 and 60 degrees, and the average time to erase data is between 10 and 15ms, then fill in the above information respectively after the corresponding title item. Therefore, based on the information filled in by the user in each title item, you can obtain the model information, manufacturer information, capacity information, working mode information, working temperature information, read data time information, write data time information, erase data time information and other information corresponding to the flash memory to be screened.

[0065] 205. Generate a demand sheet corresponding to the flash memory to be screened according to the various screening requirement information.

[0066] For an embodiment of the present invention, after the user fills in the screening requirement information at the corresponding positions of each screening title item in the screening template, the user clicks the OK button in the query operation platform operation interface, and the query operation platform generates a requirement list corresponding to the flash memory to be screened based on the various requirement information. The requirement list will automatically generate unique corresponding numbering information. After that, the query operation platform will send the numbered requirement list to the flash memory client end. The flash memory storage end will search for a target flash memory that matches the requirement information in multiple flash memories based on the various requirement information recorded in the requirement list.

[0067] 206. Send the demand form to the flash memory storage end so that the flash memory storage end selects a target flash memory from multiple flash memories based on the demand form, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information.

[0068] For the embodiment of the present invention, in order to be able to screen out the target flash memory required by the user, the flash memory storage end needs to test each flash memory before screening to determine the parameter information corresponding to each flash memory. Based on this, the method includes: performing basic tests on the multiple flash memories respectively to obtain basic information corresponding to the multiple flash memories, wherein the basic information includes model information, manufacturer information, capacity information, working mode information, and working temperature information; performing performance tests on the multiple flash memories respectively to obtain performance information corresponding to the multiple flash memories, wherein the performance information includes reading data time information, writing data time information, and erasing data time information.

[0069] Among them, the flash memory storage end includes a test operation platform, a test hardware platform and a data storage server. The test operation platform is software running on a computer host, mainly including issuing test command operations and a test result display interface, such as displaying the ID, UID, status of the test flash memory and other information; the data storage server configuration operation interface, the data storage server configuration operation interface can save the relevant test data to the data storage server, facilitating the flash memory screening operation; the flash memory test hardware platform communication interface, the test incubator control interface, the test incubator fan speed, etc. The test hardware platform is a microprocessor platform that can operate flash memory, connected to the flash memory through a physical fixture, supports Toggle and ONFI protocols and various working modes, such as SDR, NVDDR2, NVDDR3, etc., performs basic tests on the flash memory by automatically configuring the flash memory controller interface, obtains the flash memory ID, and thus determines the basic information such as the manufacturer of the flash memory particles and the flash memory type, and transmits the ID and the UID information of each Target to the test operation platform. The test operation platform saves the test results in the data storage server.

[0070] Specifically, the flash memory to be tested is placed in the hardware fixture of the test hardware platform, the power is turned on, the test operation platform and the test hardware platform are turned on, and the test operation platform is connected to the test hardware platform and the data storage server respectively. After the connection is successful, click the detection button in the test operation platform. At this time, the test operation platform sends a flash memory scan command to the test hardware platform, that is, the basic test instructions of the flash memory. When the test hardware platform receives the basic test instructions, it is necessary to format the flash memory. Based on this, the method includes: formatting the multiple flash memories separately to obtain multiple formatted flash memories; performing basic tests on the multiple formatted flash memories separately to obtain basic information corresponding to the multiple formatted flash memories; performing performance tests on the multiple formatted flash memories separately to obtain performance information corresponding to the multiple formatted flash memories.

[0071] Specifically, when the test hardware platform receives the test instruction, it first formats the flash memory to be tested, that is, the test hardware platform configures the NAND bus communication mode and instruction, that is, ONFI or Toggle, and sends a Reset command, that is, a formatting command, to the flash memory in SDR mode. Based on the formatting operation, the formatting of the flash memory to be tested is realized. After the flash memory is formatted, it is also necessary to determine whether the working status of the formatted flash memory is normal. Specifically, the formatted flash memory can be read, written and erased. According to the read operation status, write operation status and other conditions corresponding to the formatted flash memory, the formatted flash memory can be formatted. Enter the operation state and erase the operation state, determine whether the formatted flash memory is a normal state flash memory, if the formatted flash memory is a normal state flash memory, continue to perform basic tests and performance tests on the formatted flash memory, if the formatted flash memory is an abnormal state, change the bus communication mode and instructions, send a Reset command to the flash memory again, and then determine whether the working state corresponding to the formatted flash memory is a normal working state, if it is a normal working state, perform basic tests and performance tests on the formatted flash memory, if the formatted flash memory is an abnormal working state, determine that the formatted flash memory is abnormal and cannot be used normally, and discard the flash memory.

[0072] Furthermore, if the formatted flash memory is a normal flash memory, the test hardware platform checks whether the flash memory supports DDR, DDR2, DDR4 and other modes based on the detected bus support mode by changing the instruction, and then obtains the ID, UID and other signal information of the flash memory, checks the support status of Lun according to the ID information, and scans the number of CE (Target inside the particle), so as to achieve basic testing of the formatted flash memory. At the same time, the test operation platform periodically requests the test status and test results of the scan, that is, the basic test information, from the test hardware platform. At this time, the test hardware platform feeds back the test status and test results of the scan to the test operation platform. After the test operation platform obtains the basic information of the flash memory, it displays the information of the flash memory particles on the interface of the test operation platform, such as ID, UID ID, manufacturer, capacity and other information. If the scanned flash memory is normal, the indicator light on the test operation platform will light up green. If the tested flash memory has an abnormality, the flash memory needs to be replaced and retested until the tested flash memory is normal. Next, select the test temperature and test data pattern. The temperature can be one group or multiple groups of temperatures. After determining the temperature, the test operation platform actively sets the temperature of the incubator. When the temperature reaches the test requirements, it automatically sends basic test instructions to the test hardware platform. Finally, the test hardware platform feeds back all the basic information obtained from the test to the test operation platform. After the test operation platform obtains the basic information of the flash memory, it numbers the tested flash memory. The number is unique and consistent with the physical flash memory mark. Finally, the basic information and number of the flash memory are stored in the data storage server.

[0073] Furthermore, the test operation platform sends a performance test instruction to the test hardware platform. When the test hardware platform receives the performance test instruction, it performs a performance test on the formatted flash memory. After the performance test is completed, the test hardware platform feeds back the performance test results to the test operation platform, and the test operation platform stores the received performance information to the data storage server. The method for the test hardware platform to perform a performance test on the flash memory is: using the flash memory blocks corresponding to the multiple flash memories to perform a read operation on the test data, obtain the data reading status corresponding to the each flash memory block, and record the data reading time corresponding to the each flash memory block; calculate the first time mean and the first time variance value corresponding to each data reading time, and determine the multiple first time mean and the multiple first time variance values ​​as the reading data time information corresponding to the multiple flash memories. ; Use the flash memory blocks corresponding to the multiple flash memories to write test data, obtain the data writing status corresponding to the flash memory blocks, and record the data writing time corresponding to the flash memory blocks; calculate the second time mean and the second time variance value corresponding to the data writing time, and determine the multiple second time mean and the multiple second time variance values ​​as the write data time information corresponding to the multiple flash memories; perform an erase operation on the test data in the flash memory blocks corresponding to the multiple flash memories, obtain the data erasure status corresponding to the flash memory blocks, and record the data erasure time corresponding to the flash memory blocks; calculate the third time mean and the third time variance value corresponding to the data erasure time, and determine the multiple third time mean and the multiple third time variance values ​​as the erase data time information corresponding to the multiple flash memories.

[0074] Specifically, when the test hardware platform receives the performance test instruction sent by the test operation platform, the test hardware platform performs a data read operation on the formatted flash memory, that is, reads the data on the flash memory, and performs data verification according to the pattern, and records the ERROR that occurs during the data reading process. The distribution of bits is recorded at this time, and the data read time corresponding to each flash memory block in the flash memory is recorded, and the data read times are added to obtain the total read time corresponding to the flash memory. The total read time is then divided by the number of flash memory blocks to obtain a first time mean, that is, the read latency mean. At the same time, based on the data read time corresponding to each flash memory block, a first time variance, that is, the read latency variance is calculated. At the same time, a write operation is performed on the formatted flash memory, and the write latency mean and write latency variance are obtained and recorded according to the above calculation method. Then, an erase operation is performed on the formatted flash memory, and the erase latency mean and erase latency variance are recorded. Write data is generated according to the pattern type and written to the flash memory. If a fail or UNC occurs during the read, write, or erase operation, the corresponding flash memory block needs to be recorded as a bad block. Then, the performance test result is returned to the test operation platform, and the next test instruction is continued to be waited for.

[0075] Furthermore, during the performance test of the formatted flash memory, the test hardware platform also needs to determine in real time whether the flash memory is a damaged flash memory based on various test states. Based on this, the method also includes: determining whether the data read state corresponding to each flash memory block is normal; if the data read state corresponding to any one of the flash memory blocks is abnormal, marking the first flash memory corresponding to the any one flash memory block as a damaged flash memory, and stopping recording the data read time corresponding to each flash memory block in the first flash memory; determining whether the data write state corresponding to each flash memory block is normal; if the data write state corresponding to any one of the flash memory blocks is abnormal, marking the second flash memory corresponding to the any one flash memory block as a damaged flash memory, and stopping recording the data write time corresponding to each flash memory block in the second flash memory; determining whether the data erase state corresponding to each flash memory block is normal; if the data erase state corresponding to any one of the flash memory blocks is abnormal, marking the third flash memory corresponding to the any one flash memory block as a damaged flash memory, and stopping recording the data erase time corresponding to each flash memory block in the third flash memory.

[0076] Specifically, the flash memory is composed of various flash memory blocks. When the test hardware platform performs a read operation on each flash memory block in the flash memory, it determines whether the reading of each flash memory block is normal. If any one of the flash memory blocks cannot achieve a normal read operation, it determines that the flash memory corresponding to the arbitrary flash memory block is a damaged flash memory, and marks the damaged flash memory as damaged, and stops performing other test operations on the flash memory, that is, abandons the flash memory. Similarly, when the test hardware platform performs a write operation on each flash memory block in the flash memory, it determines whether the writing of each flash memory block is normal. If any one of the flash memory blocks cannot achieve a normal write operation, it determines that the flash memory corresponding to the arbitrary flash memory block is a damaged flash memory, and marks the damaged flash memory as damaged, and stops performing other test operations on the flash memory, that is, abandons the flash memory. At the same time, the test hardware When the platform performs an erasing operation on each flash memory block in the flash memory, it determines whether the erasure of each flash memory block is normal. If any flash memory block in the flash memory cannot perform a normal erasing operation, the flash memory corresponding to the arbitrary flash memory block is determined to be a damaged flash memory, and the damaged flash memory is marked as damaged, and other test operations on the flash memory are stopped, that is, the flash memory is discarded. It can be seen that the flash memory storage end in the embodiment of the present invention can perform testing and screening operations on secondary applicable flash memories, and the entire flash memory storage end can realize automated testing of the flash memory, that is, automatically complete the test after setting the test parameters, and then automatically obtain the basic information and performance information corresponding to the flash memory, and can store the basic information and performance information corresponding to the flash memory in the database. There is no need to immediately classify the flash memory in the database, but dynamically set the screening conditions according to the use needs to screen the flash memory.

[0077] According to another flash memory screening method provided by the present invention, compared with the current method of classifying flash memories and screening flash memories according to the flash memory level required by the user, the present invention receives a screening instruction corresponding to the flash memory to be screened, the screening instruction including identification information corresponding to the flash memory to be screened; based on the identification information, determines a screening template corresponding to the flash memory to be screened; based on the screening template, obtains various screening requirement information corresponding to the flash memory to be screened; generates a demand sheet corresponding to the flash memory to be screened according to the various screening requirement information; sends the demand sheet to a flash memory storage end so that the flash memory storage end screens out a target flash memory from a plurality of flash memories based on the demand sheet, wherein the flash memory storage end stores the plurality of flash memories and their corresponding basic information and performance information, thereby determining the screening template corresponding to the flash memory to be screened through the identification information in the screening instruction, and obtaining various screening requirement information corresponding to the flash memory to be screened based on the screening template, and finally screening out the target flash memory from the plurality of flash memories in the flash memory storage end according to the various screening requirement information, thereby improving the efficiency of flash memory screening and avoiding the error flash memory being queried due to the user's negligence, thereby improving the accuracy of flash memory screening.

[0078] Further, as Figure 1 The specific implementation of the present invention provides a flash memory screening device, such as Figure 3 As shown, the device includes: a receiving unit 31, a determining unit 32, an acquiring unit 33, a generating unit 34 and a sending unit 35.

[0079] The receiving unit 31 may be configured to receive a screening instruction corresponding to the flash memory to be screened, where the screening instruction includes identification information corresponding to the flash memory to be screened.

[0080] The determining unit 32 may be configured to determine a screening template corresponding to the flash memory to be screened based on the identification information.

[0081] The obtaining unit 33 may be configured to obtain various screening requirement information corresponding to the flash memory to be screened based on the screening template.

[0082] The generating unit 34 may be configured to generate a requirement list corresponding to the flash memory to be screened according to the various screening requirement information.

[0083] The sending unit 35 can be used to send the demand form to the flash memory storage end so that the flash memory storage end can screen out the target flash memory from multiple flash memories based on the demand form, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information.

[0084] In a specific application scenario, in order to obtain the various screening requirement information corresponding to the flash memory to be screened based on the screening template, such as Figure 4 As shown, the acquisition unit 33 includes a determination module 331 and an acquisition module 332 .

[0085] The determining module 331 may be configured to determine various items of screening title information corresponding to the flash memory to be screened in the screening template.

[0086] The acquisition module 332 may be configured to acquire various items of screening requirement information corresponding to the flash memory to be screened based on the various items of screening title information.

[0087] In a specific application scenario, in order to obtain the various filtering requirement information corresponding to the flash memory to be screened based on the various filtering title information, the acquisition module 332 can be specifically used to obtain the model information, manufacturer information, capacity information, working mode information, working temperature information, data reading time information, data writing time information, and data erasing time information corresponding to the flash memory to be screened based on the various filtering title information.

[0088] In a specific application scenario, in order to determine the basic information and performance information corresponding to the multiple flash memories, the apparatus further includes a testing unit 36 ​​.

[0089] The testing unit 36 ​​can be used to perform basic tests on the multiple flash memories respectively to obtain basic information corresponding to the multiple flash memories, wherein the basic information includes model information, manufacturer information, capacity information, working mode information, and working temperature information.

[0090] The test unit 36 ​​can also be used to perform performance tests on the multiple flash memories respectively to obtain performance information corresponding to the multiple flash memories, wherein the performance information includes data reading time information, data writing time information, and data erasing time information.

[0091] In a specific application scenario, in order to obtain the performance information corresponding to the multiple flash memories, the testing unit 36 ​​includes a reading module 361 , a calculation module 362 , a writing module 363 and an erasing module 364 .

[0092] The reading module 361 can be used to use the flash memory blocks corresponding to the multiple flash memories to perform a reading operation on the test data, obtain the data reading status corresponding to the flash memory blocks, and record the data reading time corresponding to the flash memory blocks.

[0093] The calculation module 362 can be used to calculate the first time mean and the first time variance value corresponding to each data reading time, and determine multiple first time mean and multiple first time variance values ​​as the reading data time information corresponding to the multiple flash memories respectively.

[0094] The writing module 363 may be configured to write test data using the flash memory blocks corresponding to the plurality of flash memories, obtain the data writing status corresponding to the flash memory blocks, and record the data writing time corresponding to the flash memory blocks.

[0095] The calculation module 362 can also be used to calculate the second time mean and second time variance value corresponding to each data writing time, and determine multiple second time mean and multiple second time variance values ​​as the writing data time information corresponding to the multiple flash memories respectively.

[0096] The erasing module 364 may be configured to perform an erasing operation on the test data in each flash memory block corresponding to each of the plurality of flash memories, obtain a data erasure status corresponding to each flash memory block, and record a data erasure time corresponding to each flash memory block.

[0097] The calculation module 362 can also be used to calculate the third time mean and third time variance value corresponding to each data erasure time, and determine multiple third time mean and multiple third time variance values ​​as the erasure data time information corresponding to the multiple flash memories respectively.

[0098] In a specific application scenario, in order to determine whether the flash memory is a damaged flash memory, the testing unit 36 ​​further includes a judgment module 365 and a marking module 366 .

[0099] The judgment module 365 may be configured to judge whether the data reading status corresponding to each flash memory block is normal.

[0100] The marking module 366 can be used to determine that the first flash memory corresponding to any one of the flash memory blocks is a damaged flash memory if the data reading status corresponding to any one of the flash memory blocks is an abnormal state, mark the first flash memory as a damaged flash memory, and stop recording the data reading time corresponding to each flash memory block in the first flash memory.

[0101] The judgment module 365 may also be used to judge whether the data writing status corresponding to each flash memory block is normal.

[0102] The marking module 366 can also be used to determine that the second flash memory corresponding to any one of the flash memory blocks is a damaged flash memory if the data writing status corresponding to any one of the flash memory blocks is an abnormal state, mark the second flash memory as a damaged flash memory, and stop recording the data writing time corresponding to each flash memory block in the second flash memory.

[0103] The judgment module 365 may also be used to judge whether the data erasure status corresponding to each flash memory block is normal.

[0104] The marking module 366 can also be used to determine that the third flash memory corresponding to any one of the flash memory blocks is a damaged flash memory if the data erasure status corresponding to any one of the flash memory blocks is an abnormal state, mark the third flash memory as a damaged flash memory, and stop recording the data erasure time corresponding to each flash memory block in the third flash memory.

[0105] In a specific application scenario, in order to format the flash memory, the device further includes a formatting unit 37 .

[0106] The formatting unit 37 may be configured to format the plurality of flash memories respectively to obtain a plurality of formatted flash memories.

[0107] It should be noted that for other corresponding descriptions of the functional modules involved in the flash memory screening device provided in the embodiment of the present invention, reference can be made to Figure 1 The corresponding description of the method shown will not be repeated here.

[0108] Based on the above Figure 1 The method shown, accordingly, an embodiment of the present invention also provides a computer-readable storage medium, on which a computer program is stored, which implements the following steps when executed by a processor: receiving a screening instruction corresponding to the flash memory to be screened, the screening instruction including identification information corresponding to the flash memory to be screened; determining a screening template corresponding to the flash memory to be screened based on the identification information; obtaining various screening requirement information corresponding to the flash memory to be screened based on the screening template; generating a requirement list corresponding to the flash memory to be screened based on the various screening requirement information; sending the requirement list to the flash memory storage end, so that the flash memory storage end can screen out a target flash memory from multiple flash memories based on the requirement list, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information.

[0109] Based on the above Figure 1 The method shown and Figure 3 The embodiment of the device shown in the figure, the embodiment of the present invention also provides a physical structure diagram of a computer device, such as Figure 5As shown, the computer device includes: a processor 41, a memory 42, and a computer program stored in the memory 42 and executable on the processor, wherein the memory 42 and the processor 41 are both arranged on a bus 43, and when the processor 41 executes the program, the following steps are implemented: based on the identification information, determining the screening template corresponding to the flash memory to be screened; based on the screening template, obtaining various screening requirement information corresponding to the flash memory to be screened; generating a requirement list corresponding to the flash memory to be screened according to the various screening requirement information; and sending the requirement list to the flash memory storage end, so that the flash memory storage end can screen out a target flash memory from a plurality of flash memories based on the requirement list, wherein the flash memory storage end stores the plurality of flash memories and their corresponding basic information and performance information.

[0110] Through the technical solution of the present invention, the present invention receives a screening instruction corresponding to the flash memory to be screened, the screening instruction includes identification information corresponding to the flash memory to be screened; based on the identification information, determines the screening template corresponding to the flash memory to be screened; based on the screening template, obtains various screening requirement information corresponding to the flash memory to be screened; generates a demand list corresponding to the flash memory to be screened according to the various screening requirement information; sends the demand list to the flash memory storage end, so that the flash memory storage end can screen out the target flash memory from multiple flash memories based on the demand list, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information, thereby determining the screening template corresponding to the flash memory to be screened through the identification information in the screening instruction, and obtaining various screening requirement information corresponding to the flash memory to be screened based on the screening template, and finally screening out the target flash memory from the multiple flash memories in the flash memory storage end according to the various screening requirement information, thereby improving the efficiency of flash memory screening, and at the same time avoiding the query of the wrong flash memory due to user negligence, thereby improving the accuracy of flash memory screening.

[0111] Obviously, those skilled in the art will appreciate that the various modules or steps of the present invention described above can be implemented using a general-purpose computing device, centralized on a single computing device, or distributed across a network of multiple computing devices. Alternatively, they can be implemented using program code executable by a computing device, which can then be stored in a storage device and executed by the computing device. In some cases, the steps shown or described can be performed in a different order than that shown, or can be fabricated as separate integrated circuit modules, or multiple modules or steps can be fabricated as a single integrated circuit module. Thus, the present invention is not limited to any particular combination of hardware and software.

[0112] The foregoing description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Those skilled in the art will readily appreciate that various modifications and variations of the present invention are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention shall be included within the scope of protection of the present invention.

Claims

1. A flash memory screening method, characterized in that: include: receiving a screening instruction corresponding to the flash memory to be screened, wherein the screening instruction includes identification information corresponding to the flash memory to be screened; Determining a screening template corresponding to the flash memory to be screened based on the identification information; Based on the screening template, obtaining various screening requirement information corresponding to the flash memory to be screened; The obtaining of each item of screening requirement information corresponding to the flash memory to be screened based on the screening template includes: determining each item of screening title information corresponding to the flash memory to be screened in the screening template; obtaining each item of screening requirement information corresponding to the flash memory to be screened based on the each item of screening title information; wherein, the obtaining of each item of screening requirement information corresponding to the flash memory to be screened based on the each item of screening title information includes: obtaining requirement information selected and filled in by the user in each item of screening title information, thereby obtaining each item of screening requirement information corresponding to the flash memory to be screened; Generate a demand sheet corresponding to the flash memory to be screened according to the various screening demand information; The demand list is sent to a flash memory storage end so that the flash memory storage end can screen out a target flash memory from a plurality of flash memories based on the demand list, wherein the flash memory storage end stores the plurality of flash memories and their corresponding basic information and performance information.

2. The method according to claim 1, characterized in that The obtaining, based on the various items of screening title information, various items of screening requirement information corresponding to the flash memory to be screened includes: Based on the various screening title information, the model information, manufacturer information, capacity information, working mode information, working temperature information, data reading time information, data writing time information, and data erasing time information corresponding to the flash memory to be screened are obtained.

3. The method according to claim 1, characterized in that Before the flash memory storage end selects a target flash memory from a plurality of flash memories based on the demand list, the method further includes: Performing basic tests on the multiple flash memories to obtain basic information corresponding to the multiple flash memories, wherein the basic information includes model information, manufacturer information, capacity information, operating mode information, and operating temperature information; Performance tests are performed on the multiple flash memories respectively to obtain performance information corresponding to the multiple flash memories respectively, wherein the performance information includes data reading time information, data writing time information, and data erasing time information.

4. The method according to claim 3, characterized in that The performing performance tests on the plurality of flash memories to obtain performance information corresponding to the plurality of flash memories respectively includes: Performing a read operation on test data using the flash memory blocks corresponding to the plurality of flash memories, obtaining a data read status corresponding to each flash memory block, and recording a data read time corresponding to each flash memory block; Calculating a first time mean value and a first time variance value commonly corresponding to each data reading time, and determining a plurality of first time mean values ​​and a plurality of first time variance values ​​as data reading time information respectively corresponding to the plurality of flash memories; Using the flash memory blocks corresponding to the plurality of flash memories to write test data, obtain the data writing status corresponding to the flash memory blocks, and record the data writing time corresponding to the flash memory blocks; Calculating a second time mean value and a second time variance value commonly corresponding to each data writing time, and determining the plurality of second time mean values ​​and the plurality of second time variance values ​​as data writing time information respectively corresponding to the plurality of flash memories; Performing an erasing operation on the test data in each flash memory block corresponding to each of the plurality of flash memories, obtaining a data erasure status corresponding to each flash memory block, and recording a data erasure time corresponding to each flash memory block; A third time mean value and a third time variance value commonly corresponding to each data erasure time are calculated, and a plurality of third time mean values ​​and a plurality of third time variance values ​​are determined as data erasure time information respectively corresponding to the plurality of flash memories.

5. The method according to claim 4, characterized in that After performing a read operation on the test data using the flash memory blocks corresponding to the plurality of flash memories to obtain a data read status corresponding to each flash memory block, the method further includes: Determining whether the data reading status corresponding to each flash memory block is normal; If the data reading state corresponding to any one of the flash memory blocks is an abnormal state, determining that a first flash memory corresponding to the any one of the flash memory blocks is a damaged flash memory, marking the first flash memory as a damaged flash memory, and stopping recording the data reading time corresponding to each flash memory block in the first flash memory; After performing a write operation on the test data using the flash memory blocks corresponding to the plurality of flash memories to obtain data write status corresponding to the flash memory blocks, the method further includes: Determining whether the data writing status corresponding to each flash memory block is normal; If the data writing state corresponding to any one of the flash memory blocks is an abnormal state, determining that the second flash memory corresponding to the any one of the flash memory blocks is a damaged flash memory, marking the second flash memory as a damaged flash memory, and stopping recording the data writing time corresponding to each flash memory block in the second flash memory; After performing an erasing operation on the test data in each flash memory block corresponding to each of the plurality of flash memories to obtain a data erasure status corresponding to each flash memory block, the method further includes: Determining whether the data erasure status corresponding to each flash memory block is normal; If the data erasure status corresponding to any one of the flash memory blocks is an abnormal state, the third flash memory corresponding to the any one flash memory block is determined to be a damaged flash memory, and the third flash memory is marked as a damaged flash memory, and the recording of the data erasure time corresponding to each flash memory block in the third flash memory is stopped.

6. The method according to claim 3, characterized in that Before performing basic tests on the multiple flash memories to obtain basic information corresponding to the multiple flash memories, the method further includes: formatting the plurality of flash memories respectively to obtain a plurality of formatted flash memories; The performing basic tests on the multiple flash memories to obtain basic information corresponding to the multiple flash memories respectively includes: Performing basic tests on the multiple formatted flash memories respectively to obtain basic information corresponding to the multiple formatted flash memories respectively; The performing performance tests on the plurality of flash memories to obtain performance information corresponding to the plurality of flash memories respectively includes: Performance tests are performed on the multiple formatted flash memories to obtain performance information corresponding to the multiple formatted flash memories.

7. A flash memory screening device, characterized in that: include: A receiving unit, configured to receive a screening instruction corresponding to the flash memory to be screened, wherein the screening instruction includes identification information corresponding to the flash memory to be screened; a determining unit, configured to determine a screening template corresponding to the flash memory to be screened based on the identification information; an acquiring unit, configured to acquire, based on the screening template, various screening requirement information corresponding to the flash memory to be screened; The acquisition unit includes a determination module and an acquisition module; The determining module is used to determine each item of screening title information corresponding to the flash memory to be screened in the screening template; The acquisition module is configured to acquire various items of screening requirement information corresponding to the flash memory to be screened based on the various items of screening title information; Wherein, based on the various screening title information, obtaining the various screening requirement information corresponding to the flash memory to be screened includes: obtaining the requirement information selected and filled in by the user in the various screening title information, and obtaining the various screening requirement information corresponding to the flash memory to be screened; A generating unit, configured to generate a demand sheet corresponding to the flash memory to be screened according to the various screening demand information; A sending unit is used to send the demand form to the flash memory storage end so that the flash memory storage end can screen out a target flash memory from multiple flash memories based on the demand form, wherein the flash memory storage end stores the multiple flash memories and their corresponding basic information and performance information.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

9. A computer device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the computer program is executed by a processor, the steps of the method according to any one of claims 1 to 6 are implemented.

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