A high-speed optical wavelength resolution device
By incorporating two optical splitters, a high-speed photodetector, and a FP interferometer into the optical wavelength resolution device, the problems of accuracy and light source adaptation under high-speed scanning were solved, achieving high-precision, low-loss optical wavelength resolution.
CN115133988BActive Publication Date: 2026-07-07SHENZHEN WEIPAI INNOVATION TECH CO LTD
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- SHENZHEN WEIPAI INNOVATION TECH CO LTD
- Filing Date
- 2022-05-30
- Publication Date
- 2026-07-07
AI Technical Summary
Technical Problem
Existing optical wavelength scanning systems struggle to achieve PM-level accuracy at high speeds, cannot adapt to the characteristics of different light sources, and suffer significant optical power loss.
Method used
By employing two optical splitters, first and second high-speed photodetectors, an FP interferometer, and an MCU processing module, a pm-level resolution is achieved in high-speed scanning mode. Different light sources are adapted by using FP interferometers of different specifications to reduce optical power loss.
Benefits of technology
Achieving pm-level resolution accuracy with microsecond delays under high-speed scanning of 40nm/s-400nm/s improves the accuracy and stability of the resolution device and reduces optical power loss.
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Smart Images
Figure CN115133988B_ABST
Abstract
The application provides a high-speed optical wavelength analysis device, and belongs to the technical field of electronic equipment.The application comprises a first optical splitter, a second optical splitter, a first power measurement module, a second power measurement module, an MCU processing module, a display unit and a signal output interface, the input end of the first optical splitter is connected with a high-speed optical wavelength signal source, the output end of the first optical splitter is connected with the second optical splitter and the signal output interface, the output end of the second optical splitter is connected with the first power measurement module and the second power measurement module, the output end of the first power measurement module and the output end of the second power measurement module are connected with the input end of the MCU processing module, the MCU processing module is connected with the display unit, the first power measurement module is provided with a first high-speed optical detector, and the second power measurement module is provided with a second high-speed optical detector and an F-P interferometer.The application has the beneficial effects of improving the accuracy, stability and measurement range of the analysis device and reducing optical power loss.
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