A spect detection method for a movable bias probe

Abstract

A spect detection method for a movable bias probe is implemented using a SPECT system (1), the SPECT system comprising one or more detection groups (11), each detection group comprising a detector (21), a coincidence circuit (22), and a computer (23), wherein: (1) the detector is arranged with a detection surface facing the detection area, and is first located at a first position, at which time the normal at the center of the detection surface is on one side relative to the center point of the region of interest; (2) a scan is performed once, and a first batch of detection signals is transmitted to the computer; (3) all detectors are translated relative to the region of interest to a second position, at which time the normal at the center of the detection surface is on the other side relative to the center point of the region of interest; one side of the detector at the second position coincides with the side at the first position; (4) a scan is performed again, and a second batch of detection signals is transmitted to the computer; (5) the first batch of detection signals and the second batch of detection signals are combined into one data as signals obtained from the left and right parts of the same batch, and the SPECT system controls all computers to complete image reconstruction.

Description

Technical Field

[0001] The present invention relates to the technical field of SPECT detection probe technology improvement, and in particular to a spect detection method of a movable bias probe. Background Art

[0002] A SPECT machine is a nuclear medicine imaging device developed from the gamma camera. Its basic structure consists of three main components: a detector, a rotating gantry, and a computer and its auxiliary equipment. The detector is the core of the SPECT imaging process. The main imaging components of a gamma camera are a collimator, a large-area NaI(Tl) scintillation crystal, a light guide, and a PM tube array. Two features that distinguish it from traditional NaI(Tl) counting detectors are crucial for image formation. The first is that the imaging collimator defines the direction of the detected gamma rays. The collimator most commonly consists of a lead plate containing a large number of holes. By controlling which gamma rays are received, the collimator forms a projection image of the gamma ray distribution on the surface of the NaI(Tl) crystal. The second is that the NaI(Tl) crystal is observed through an array of PM tubes rather than a single PM tube. The signals from the PM tubes are fed into electronic or digital position logic circuits, which determine the XY position of each scintillation event by using a weighted average of the PM tube signals as they occur.

[0003] The output of each photomultiplier tube is amplified and digitized using an analog-to-digital converter (ADC). The XY position of each gamma ray interacting in the NaI(Tl) crystal is calculated from the digitized signal. The energy E deposited by the gamma ray, which is proportional to the total measured pulse amplitude, is also calculated by summing the individual PM tube signals. If E falls within the selected energy window, the event is accepted and placed at the appropriate XY position in the image.

[0004] By summing the signals from all PM tubes, the energy E of individual events can also be analyzed. When the pulse amplitude of an event falls within a selected energy window, it is accepted, and the X and Y values are combined into a discrete two-dimensional array of image elements, or pixels. The image is formed by a histogram of the number of events at each possible XY position. A large number of events is required to form an interpretable image, as each pixel must have a sufficient number of counts to achieve an acceptable signal-to-noise ratio.

[0005] The image is displayed on a computer monitor where image brightness and contrast can be controlled and different colors can be used for representation.

[0006] However, a problem with existing technologies is that it is difficult to reduce the price of a SPECT system. For example, using a four-probe rotating setup, which is a typical Spectrum system with high image quality, each probe's detection surface area must generally be significantly larger than the cross-sectional area of the central region of interest. For example, if a person's waist is placed on the region of interest, which is at least a rectangular area of 50cm*30cm*30cm, the probe must generally have an area of at least 60*60cm to basically meet the detection needs. With four probes, various costs must be multiplied by four, especially scintillation crystals, which are extremely expensive. With this setup, the cost of the entire SPECT system is relatively high.

[0007] How can we effectively reduce instrument costs? Reducing the probe's cross-sectional area is a straightforward approach. However, if the probe is still used in the same manner, aiming at the center of the area of interest, the effective detection area will be significantly reduced. Even if the probe side length is reduced by 10 cm, the effective detection volume may be reduced by 1 / 3 or even more. This is because a typical reduction in probe area is equivalent to reducing the detection area on all four sides (due to symmetrical distribution). Although simply reducing the probe area may reduce costs, it will significantly reduce the effective detection volume.

[0008] The existing technology does not have such a technology, that is, although the probe area is reduced, how to assist through other means or adjust the detection method so that the adverse effects of the probe area reduction can be offset or partially offset, so that detection can be achieved with a lower-cost instrument configuration for the same detection area. Summary of the Invention

[0009] The purpose of the present invention is to solve the problem in the prior art that there is no other technology to assist in reducing the probe area and alleviate the adverse effects of the probe area reduction. The device of the present application enables detection to be achieved in the same detection area using a lower-cost instrument configuration and operation method. That is, even if the area of the probe is reduced, the quality of the detection image is not significantly reduced, and this method does not require an increase in the instrument cost to be completed. In other words, the present application can enable a detector with only half the cost to fully perform the functions of a detector and obtain images of basically the same quality.

[0010] A spect detection method for a movable bias probe is characterized in that it is implemented using a SPECT system (1), the SPECT system comprising one or more detection groups (11), each detection group comprising a detector (21), a coincidence circuit (22), and a computer (23).

[0011] (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located at a first position. When located at the first position, the normal at the center of the detection surface is opposite to one side of the center point of the region of interest.

[0012] (2) Perform a scan and transmit the first batch of detection signals received to the computer through the compliance circuit.

[0013] (3) All detectors are translated to a second position relative to the region of interest. When at the second position, the normal at the center of the detection surface is on the other side of the center point of the region of interest; one side of the detector at the second position coincides with the side at the first position.

[0014] (4) Scan the image again and transmit the second batch of detection signals received to the computer through the coincidence circuit.

[0015] (5) The first batch of detection signals and the second batch of detection signals are considered to be the signals obtained from the left and right parts of the same detector, and are merged into one detection data. The SPECT system controls all computers to complete image reconstruction.

[0016] Furthermore, the detector is composed of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; the detection surface of the detector is planar and all are rectangular in shape.

[0017] There are 1-4 detection groups. When there is one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniformly distributed manner with the detection surfaces facing the detection area, and the angles between adjacent detectors are approximately 180°, 120°, or 90° respectively.

[0018] The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector.

[0019] The collimator layer is a parallel hole collimator, a pinhole collimator, a diverging hole collimator or a focusing hole collimator with holes evenly arranged.

[0020] The material of the scintillator crystal layer is NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

[0021] Furthermore, the detection surfaces of all detectors are squares with the same area; when there are 2-4 detectors, the detectors are arranged with the detection surfaces facing the detection area in a circumferentially uniform distribution manner, specifically, 4 detectors are evenly distributed circumferentially, and the angle between adjacent detectors is 90°; the distance from the first position to the second position is specifically 45-55 cm.

[0022] A spect detection method for a movable bias probe is characterized in that it is implemented using a SPECT system (1), the SPECT system comprising one or more detection groups (11), each detection group comprising a detector (21), a coincidence circuit (22), and a computer (23).

[0023] (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located at a first position. When located at the first position, the normal at the center of the detection surface is opposite to one side of the center point of the region of interest.

[0024] (2) Perform a scan and transmit the first batch of detection signals received to the computer through the compliance circuit.

[0025] (3) All detectors are translated to a second position relative to the region of interest, wherein when in the second position, the normal at the center of the detection surface is on the other side of the center point of the region of interest, and when in the second position, the A' column of detectors in the detector overlaps with the position of the A column of detectors when in the first position.

[0026] (4) Scan the image again and transmit the second batch of detection signals received to the computer through the coincidence circuit.

[0027] (5) For the first batch of detection signals and the second batch of detection signals, the signals obtained by the detectors other than the A column detector at the first position and the signals obtained by the detectors other than the A' column detector at the second position are considered to be the signals obtained by the left and right parts of the same detector. The signals obtained by the A column detector at the first position and the A' column detector at the second position are combined as the middle part signal. The left and right middle part signals are combined into one detection data, and the SPECT system controls all computers to complete the image reconstruction.

[0028] Furthermore, the detector is composed of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; the detection surface of the detector is planar and all are rectangular in shape.

[0029] There are 1-4 detection groups. When there is one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniformly distributed manner with the detection surfaces facing the detection area, and the angles between adjacent detectors are approximately 180°, 120°, or 90° respectively.

[0030] The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector.

[0031] The collimator layer is a parallel hole collimator, pinhole collimator, diverging hole collimator or focusing hole collimator with evenly arranged holes; the scintillation crystal layer is made of NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

[0032] Furthermore, the detection surfaces of all detectors are squares with the same area; when there are 2-4 detectors, the detectors are arranged with the detection surfaces facing the detection area in a circumferentially uniform distribution manner, specifically, 4 detectors are evenly distributed circumferentially, and the angle between adjacent detectors is 90°.

[0033] The distance from the first position to the second position is specifically 45-55 cm.

[0034] A spect detection method for a movable bias probe is characterized in that it is implemented using a SPECT system (1), the SPECT system comprising one or more detection groups (11), each detection group comprising a detector (21), a coincidence circuit (22), and a computer (23).

[0035] (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located at the first position. When located at the first position, the normal at the center of the detection surface is on one side relative to the center point of the region of interest; (2) A scan is performed, and the first batch of detection signals received are transmitted to the computer through the coincidence circuit; (3) All detectors are translated to the second position relative to the region of interest. When located at the second position, the normal at the center of the detection surface is on the other side relative to the center point of the region of interest, and when located at the second position, the A' column detectors in the detector overlap with the A column detectors in the first position; (4) An image scan is performed again, and the second batch of detection signals received are transmitted to the computer through the coincidence circuit; (5) For the first batch of detection signals and the second batch of detection signals, the signals obtained by the detectors other than the A column detectors at the first position and the signals obtained by the detectors other than the A' column detectors at the second position are considered to be the signals obtained by the left and right parts of the same detector, and one of the signals obtained by the A column detectors at the first position and the A' column detectors at the second position is selected as the middle part signal, and the left and right middle part signals are merged into one detection data, and the SPECT system controls all computers to complete image reconstruction.

[0036] Furthermore, the detector is composed of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; the detection surface of the detector is planar and all are rectangular in shape.

[0037] There are 1-4 detection groups. When there is one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniformly distributed manner with the detection surfaces facing the detection area, and the angles between adjacent detectors are approximately 180°, 120°, or 90° respectively.

[0038] The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector.

[0039] The collimator layer is a parallel hole collimator, a pinhole collimator, a diverging hole collimator or a focusing hole collimator with holes evenly arranged.

[0040] The material of the scintillator crystal layer is NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

[0041] Furthermore, the detection surfaces of all detectors are squares with the same area; when there are 2-4 detectors, the detectors are arranged with the detection surfaces facing the detection area in a circumferentially uniform distribution manner, specifically, 4 detectors are evenly distributed circumferentially, and the angle between adjacent detectors is 90°; the distance from the first position to the second position is specifically 45-55 cm.

[0042] Multiple detection groups are all carried by an integral rotating frame (4). For each detection group, the rotating frame has a corresponding positioning frame (41). The positioning frame is in the shape of a rectangular frame. Each positioning frame has a pair of relatively arranged (42) sliding grooves on the inner side. The detector can slide left and right in the positioning frame. The position of the detector is adjusted in the positioning frame.

[0043] The advantages of the present invention can be mainly divided into the following points. First, it effectively reduces costs. For the SPECT detection required, the device of the present application enables detection to be achieved with an instrument configuration of half or 60% of the cost for the same detection area. The setting method of the present application does not reduce the image clarity, but only requires two detection times and the operation of changing the position of the detector. Second, it proposes a solution to the problem that is different from the general existing technology. The existing technology generally does not believe that the detector area can be significantly reduced, or believes that once the area is significantly reduced, its effective detection area will inevitably be significantly reduced or even unusable, because it is placed in a centrally symmetrical manner by default. Therefore, it does not provide inspiration for the setting of the present application. The setting method of the present application has been carefully considered and repeatedly tested, and only requires some algorithmic coordination to ensure that although the cost is reduced by half, the detection effect is not reduced, and the effective detection area is not reduced (compared to the case of a detector with twice the width of the present application). BRIEF DESCRIPTION OF THE DRAWINGS

[0044] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0045] Figure 1 This is a schematic diagram of the general SPECT setup.

[0046] Figure 2 1 and 2 are effect diagrams of the first and second positions of the method of the present invention.

[0047] Figure 3 Here is another rendering of the first and second positions.

[0048] Figure 4 These are schematic diagrams of two ways to facilitate fixing the detection group of the present application after it is moved.

[0049] Figure numerals: SPECT system, 1, detection group, 11, detector, 21, compliance circuit, 22, computer, 23, straightener layer, rotating rack, 4, positioning frame, 41, slide groove, 42, groove lining, 43, groove recess, 44, groove positioning part, 45, fixing bolt, 5, region of interest, 6, first position, P1, second position P2, overlapping part P3. DETAILED DESCRIPTION

[0050] The preferred embodiments of the present invention are described in detail below with reference to the accompanying drawings so that the advantages and features of the present invention can be more easily understood by those skilled in the art, thereby making a clearer and more precise definition of the protection scope of the present invention.

[0051] Figure 1 The figure shows the general SPECT setting method, which is the most common and general SPECT setting method. First, a cube (or a square region of interest when viewed from the side) is set up so that the object to be detected is basically in the center of the region of interest. Here, for example, there are four detection groups on four sides, and the region of interest is exactly the area of a cube. The data of the four detection groups are also reconstructed in a manner corresponding to the cube area. This method has guaranteed detection effect, but the instrument is expensive. On the one hand, if it is changed to three probes or two probes, such as three probes spaced 120° apart and two probes spaced 180° apart, the quality of the generated image will be greatly reduced. If the area of the detection surface is reduced, for example, by reducing the side length by 20%, the effective monitoring area will be reduced by 36%, which will also have a particularly large impact on the clarity of the detection image. In summary, the existing technology has not considered how to better control costs and ensure that the image detection area or quality does not decrease significantly.

[0052] Figure 2 A typical implementation example of the present application is provided. All detectors are arranged with their detection surfaces facing the detection area. Initially, they are positioned in a first position. In the first position, the normal at the center of the detection surface is on one side of the center point of the region of interest. A scan is performed, and the first batch of received detection signals is transmitted to a computer via a coincidence circuit. All detectors are then translated relative to the region of interest to a second position. In the second position, the normal at the center of the detection surface is on the other side of the center point of the region of interest; one side of the detector in the second position coincides with the side in the first position. Another image scan is performed, and the second batch of received detection signals is transmitted to a computer via a coincidence circuit. The first and second batches of detection signals are considered to be signals from the left and right sides of the same detector and are combined into a single batch of detection data. The SPECT system controls all computers to perform image reconstruction. This approach utilizes only detectors of comparable price, yet achieves the detection performance of detectors twice the price or twice the area. This demonstrates the positive value of the present invention. A disadvantage is that scanning both sides takes twice as long, and subsequent calculations require initial summation according to a pre-set algorithm. However, this algorithmic impact is minimal, and the computational time for this portion is not significant. This corresponds roughly to Example 1.

[0053] Figure 3 Another typical implementation example of this application is given. Figure 2 The main difference is that part of the detector may overlap front and back. This may be due to various reasons, such as the site not allowing the probe to move too much, or by overlapping some signals to obtain a stronger signal and image in the overlapping part. When the signal is too strong, it can also be selected to ensure uniform image intensity and brightness. This corresponds to Example 2 and Example 3 respectively.

[0054] Example 1

[0055] A spect detection method for a movable bias probe is characterized in that it is implemented using a SPECT system (1), the SPECT system comprising one or more detection groups (11), each detection group comprising a detector (21), a coincidence circuit (22), and a computer (23).

[0056] (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located at a first position. When located at the first position, the normal at the center of the detection surface is opposite to one side of the center point of the region of interest.

[0057] (2) Perform a scan and transmit the first batch of detection signals received to the computer through the compliance circuit.

[0058] (3) All detectors are translated to a second position relative to the region of interest. When at the second position, the normal at the center of the detection surface is on the other side of the center point of the region of interest; one side of the detector at the second position coincides with the side at the first position.

[0059] (4) Scan the image again and transmit the second batch of detection signals received to the computer through the coincidence circuit.

[0060] (5) The first batch of detection signals and the second batch of detection signals are considered to be the signals obtained from the left and right parts of the same detector, and are merged into one detection data. The SPECT system controls all computers to complete image reconstruction.

[0061] Furthermore, the detector is composed of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; the detection surface of the detector is planar and all are rectangular in shape.

[0062] There are 1-4 detection groups. When there is one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniformly distributed manner with the detection surfaces facing the detection area, and the angles between adjacent detectors are approximately 180°, 120°, or 90° respectively.

[0063] The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector.

[0064] The collimator layer is a parallel hole collimator, a pinhole collimator, a diverging hole collimator or a focusing hole collimator with holes evenly arranged.

[0065] The material of the scintillator crystal layer is NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

[0066] Furthermore, the detection surfaces of all detectors are squares with the same area; when there are 2-4 detectors, the detectors are arranged with the detection surfaces facing the detection area in a circumferentially uniform distribution manner, specifically, 4 detectors are evenly distributed circumferentially, and the angle between adjacent detectors is 90°; the distance from the first position to the second position is specifically 45-55 cm.

[0067] The main setting principle of this embodiment is that through position switching, the positions before and after the switching are exactly adjacent, so that a detector can play the same role as a detector with twice the area. It only needs to be assisted in the position so that it can obtain the same detection results as a detector with twice the area in the first and second positions. In this way, the two parts of data are merged and treated as data for one detection, and the same detection results and image data as a detector with twice the area can be obtained. The only disadvantage is that two scans and movements are required.

[0068] Example 2

[0069] A spect detection method for a movable bias probe is characterized in that it is implemented using a SPECT system (1), the SPECT system comprising one or more detection groups (11), each detection group comprising a detector (21), a coincidence circuit (22), and a computer (23).

[0070] (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located at a first position. When located at the first position, the normal at the center of the detection surface is opposite to one side of the center point of the region of interest.

[0071] (2) Perform a scan and transmit the first batch of detection signals received to the computer through the compliance circuit.

[0072] (3) All detectors are translated to a second position relative to the region of interest, wherein when in the second position, the normal at the center of the detection surface is on the other side of the center point of the region of interest, and when in the second position, the A' column of detectors in the detector overlaps with the position of the A column of detectors when in the first position.

[0073] (4) Scan the image again and transmit the second batch of detection signals received to the computer through the coincidence circuit.

[0074] (5) For the first batch of detection signals and the second batch of detection signals, the signals obtained by the detectors other than the A column detector at the first position and the signals obtained by the detectors other than the A' column detector at the second position are considered to be the signals obtained by the left and right parts of the same detector. The signals obtained by the A column detector at the first position and the A' column detector at the second position are combined as the middle part signal. The left and right middle part signals are combined into one detection data, and the SPECT system controls all computers to complete the image reconstruction.

[0075] Furthermore, the detector is composed of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; the detection surface of the detector is planar and all are rectangular in shape.

[0076] There are 1-4 detection groups. When there is one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniformly distributed manner with the detection surfaces facing the detection area, and the angles between adjacent detectors are approximately 180°, 120°, or 90° respectively.

[0077] The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector.

[0078] The collimator layer is a parallel hole collimator, pinhole collimator, diverging hole collimator or focusing hole collimator with evenly arranged holes; the scintillation crystal layer is made of NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

[0079] Furthermore, the detection surfaces of all detectors are squares with the same area; when there are 2-4 detectors, the detectors are arranged with the detection surfaces facing the detection area in a circumferentially uniform distribution manner, specifically, 4 detectors are evenly distributed circumferentially, and the angle between adjacent detectors is 90°.

[0080] The distance from the first position to the second position is specifically 45-55 cm.

[0081] The main setting principle of this embodiment is that through position switching, and the positions before and after the switching are partially overlapped, a detector can play the same role as a detector with twice the area, and only needs to be assisted in position. In addition, the signal in the middle part is particularly strong, which can reflect a better image effect. In this way, the two parts of data are merged and treated as data for one detection, and the same detection results and image data as a detector with about twice the area can be obtained. The only disadvantage is that two scans and movements are required, and the image signal in the middle part is very strong, the development is very clear, and more information can be seen.

[0082] Example 3

[0083] A spect detection method for a movable bias probe is characterized in that it is implemented using a SPECT system (1), the SPECT system comprising one or more detection groups (11), each detection group comprising a detector (21), a coincidence circuit (22), and a computer (23).

[0084] (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located in the first position. When located in the first position, the normal at the center of the detection surface is on one side relative to the center point of the region of interest; (2) A scan is performed, and the first batch of detection signals received are transmitted to the computer through the coincidence circuit; (3) All detectors are translated to the second position relative to the region of interest. When located in the second position, the normal at the center of the detection surface is on the other side relative to the center point of the region of interest, and when located in the second position, the A' column detectors in the detector overlap with the A column detectors in the first position; (4) An image scan is performed again, and the second batch of detection signals received are transmitted to the computer through the coincidence circuit; (5) For the first batch of detection signals and the second batch of detection signals, the signals obtained by the detectors other than the A column detectors at the first position and the signals obtained by the detectors other than the A' column detectors at the second position are considered to be the signals obtained by the left and right parts of the same detector, and one of the signals obtained by the A column detectors at the first position and the A' column detectors at the second position is selected as the middle part signal, and the left and right middle part signals are merged into one detection data, and the SPECT system controls all computers to complete image reconstruction.

[0085] Furthermore, the detector is composed of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; the detection surface of the detector is planar and all are rectangular in shape.

[0086] There are 1-4 detection groups. When there is one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniformly distributed manner with the detection surfaces facing the detection area, and the angles between adjacent detectors are approximately 180°, 120°, or 90° respectively.

[0087] The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector.

[0088] The collimator layer is a parallel hole collimator, a pinhole collimator, a diverging hole collimator or a focusing hole collimator with holes evenly arranged.

[0089] The material of the scintillator crystal layer is NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

[0090] Furthermore, the detection surfaces of all detectors are squares with the same area; when there are 2-4 detectors, the detectors are arranged with the detection surfaces facing the detection area in a circumferentially uniform distribution manner, specifically, 4 detectors are evenly distributed circumferentially, and the angle between adjacent detectors is 90°; the distance from the first position to the second position is specifically 45-55 cm.

[0091] Multiple detection groups are all carried by an integral rotating frame (4). For each detection group, the rotating frame has a corresponding positioning frame (41). The positioning frame is in the shape of a rectangular frame. Each positioning frame has a pair of relatively arranged (42) sliding grooves on the inner side. The detector can slide left and right in the positioning frame. The position of the detector is adjusted in the positioning frame.

[0092] The main setting principle of this embodiment is that through position switching, and the positions before and after the switching are partially overlapped, a detector can play the same role as a detector with twice the area. It only needs to be assisted in position, and the overlapping part in the middle can be selected. In this way, the image brightness and resolution will not change. In this way, the two parts of data are merged and treated as data for one detection, and the same detection results and image data as a detector with about twice the area can be obtained. The only disadvantage is that two scans and movements are required. Compared with Example 2, although the signal in the middle part is not strong, this method is relatively simple in algorithm and easy to operate.

[0093] Example 4

[0094] In terms of detection methods, this embodiment can be the same as embodiments 1-3, and mainly describes the problem of position fixing of the positioning frame.

[0095] Multiple detection groups are all carried by an integral rotating frame 4. For each detection group, there is a corresponding positioning frame 41 on the rotating frame. The positioning frame is in the shape of a rectangular frame. Each positioning frame has a pair of relatively arranged slide grooves 42 on the inside. The detector can slide left and right in the positioning frame, and the position of the detector is adjusted in the positioning frame.

[0096] In this embodiment, the positioning of the detection group can be completed by the groove lining 42 and the groove recess 43, so as to achieve relatively simple and easy fixation. In fact, this application requires the switching back and forth of two determined positions, that is, the detection group moves to the left to a fixed position and then moves to the right to a fixed position, which is completed by the groove lining 42 and the groove recess 43. It is relatively simple. The groove lining is made of polytetrafluoroethylene or polyurethane, polycarbonate, and is pasted in the slide groove to limit the slide groove gap to be narrower. In most parts, the groove lining and the sliding column are closely matched to prevent slipping and shaking, and the groove recess 43 is a pair of recessed positions on the left and right. At these two positions, the sliding column will be relatively loosely abutted against the groove lining, naturally forming a position that is easy to position. This will be very simple when the operating method of Examples 1-3 is implemented.

[0097] Example 5

[0098] In terms of detection methods, this embodiment can be the same as embodiments 1-3, and mainly describes the problem of position fixing of the positioning frame.

[0099] Multiple detection groups are all carried by an integral rotating frame 4. For each detection group, there is a corresponding positioning frame 41 on the rotating frame. The positioning frame is in the shape of a rectangular frame. Each positioning frame has a pair of relatively arranged slide grooves 42 on the inside. The detector can slide left and right in the positioning frame, and the position of the detector is adjusted in the positioning frame.

[0100] In this embodiment, the positioning of the detection group can be completed by the groove positioning part 44 and the fixing bolt 45, thereby achieving relatively simple and easy fixation. In fact, this application requires the switching back and forth of the two predetermined positions, that is, the detection group moves to a certain fixed position to the left and to a certain fixed position to the right, which is completed by the groove positioning part 44 and the fixing bolt 45. It is relatively simple. The groove positioning part 44 is one on the left and one on the right of the slide. The slide will be recessed upward and downward respectively. At the same time, there will be one or more blind holes on the side of the detection group to cooperate with it. When a predetermined blind hole moves to the groove positioning part 44 on the left or right, a fixing bolt 45 that is significantly wider than the slide and adapted to the groove positioning part and the blind hole is passed through the groove positioning part and inserted into the blind hole. In this way, simple positioning of the two predetermined positions on the left and right is achieved. At these two positions, it will just correspond to the position where the detection group needs to be moved. In this way, when the operation method of Examples 1-3 is implemented, it will be very simple.

[0101] The above description is merely a specific embodiment of the present invention, but the scope of protection of the present invention is not limited thereto. Any changes or substitutions that are not conceived through creative work should be included within the scope of protection of the present invention. Therefore, the scope of protection of the present invention should be based on the scope of protection defined in the claims.

Claims

1. A spect detection method for a movable bias probe, characterized in that: The method is implemented by using a SPECT system (1), which includes one or more detection groups (11), each of which includes a detector (21), a coincidence circuit (22), and a computer (23). (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located in a first position. When located in the first position, the normal at the center of the detection surface is on one side relative to the center point of the region of interest; (2) Perform a scan and transmit the first batch of received detection signals to the computer through the coincidence circuit; (3) translating all detectors relative to the region of interest to a second position, wherein when in the second position, the normal at the center of the detection surface is on the other side of the center point of the region of interest; and one side of the detector in the second position coincides with one side of the detector in the first position; (4) Scan the image again and transmit the second batch of detection signals received to the computer through the coincidence circuit; (5) The first batch of detection signals and the second batch of detection signals are considered to be the signals obtained from the left and right parts of the same detector, and are merged into one detection data. The SPECT system controls all computers to complete image reconstruction.

2. The spect detection method of a movable bias probe according to claim 1, wherein: The detector consists of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; The detection surface of the detector is flat and all are rectangular in shape; There are 1-4 detection groups. When there is only one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniform manner with the detection surfaces facing the detection area. The angle between adjacent detectors is 180°, 120°, or 90° respectively. The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector; The collimator layer is a parallel hole collimator, a pinhole collimator, a diverging hole collimator or a focusing hole collimator with holes evenly arranged; The material of the scintillator crystal layer is NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

3. The spect detection method of a movable bias probe according to claim 2, wherein: The detection surfaces of all detectors are squares with the same area; The four detectors are evenly distributed around the circumference, with the angle between adjacent detectors being 90°; The distance from the first position to the second position is specifically 45-55 cm.

4. A spect detection method for a movable bias probe, characterized in that: The method is implemented by using a SPECT system (1), which includes one or more detection groups (11), each of which includes a detector (21), a coincidence circuit (22), and a computer (23). (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located in a first position. When located in the first position, the normal at the center of the detection surface is on one side relative to the center point of the region of interest; (2) Perform a scan and transmit the first batch of received detection signals to the computer through the coincidence circuit; (3) translating all detectors relative to the region of interest to a second position, wherein when in the second position, the normal at the center of the detection surface is on the other side of the center point of the region of interest, and when in the second position, the detectors in column A' of the detectors overlap with the detectors in column A when in the first position; (4) Scan the image again and transmit the second batch of detection signals received to the computer through the coincidence circuit; (5) For the first batch of detection signals and the second batch of detection signals, the signals obtained by the detectors other than the A column detector at the first position and the signals obtained by the detectors other than the A' column detector at the second position are considered to be the signals obtained by the left and right parts of the same detector. The signals obtained by the A column detector at the first position and the A' column detector at the second position are combined as the middle part signal. The left and right middle part signals are combined into one detection data, and the SPECT system controls all computers to complete the image reconstruction.

5. The spect detection method of a movable bias probe according to claim 4, wherein: The detector consists of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; The detection surface of the detector is flat and all are rectangular in shape; There are 1-4 detection groups. When there is only one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniform manner with the detection surfaces facing the detection area. The angle between adjacent detectors is 180°, 120°, or 90° respectively. The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector; The collimator layer is a parallel hole collimator, a pinhole collimator, a diverging hole collimator or a focusing hole collimator with holes evenly arranged; The material of the scintillator crystal layer is NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

6. The spect detection method of a movable bias probe according to claim 5, wherein: The detection surfaces of all detectors are squares with the same area; The four detectors are evenly distributed around the circumference, with the angle between adjacent detectors being 90°; The distance from the first position to the second position is specifically 45-55 cm.

7. A spect detection method for a movable bias probe, characterized in that: The method is implemented by using a SPECT system (1), which includes one or more detection groups (11), each of which includes a detector (21), a coincidence circuit (22), and a computer (23). (1) All detectors are arranged with their detection surfaces facing the detection area, and are first located in a first position. When located in the first position, the normal at the center of the detection surface is on one side relative to the center point of the region of interest; (2) Perform a scan and transmit the first batch of received detection signals to the computer through the coincidence circuit; (3) translating all detectors relative to the region of interest to a second position, wherein when in the second position, the normal at the center of the detection surface is on the other side of the center point of the region of interest, and when in the second position, the detectors in column A' of the detectors overlap with the detectors in column A when in the first position; (4) Scan the image again and transmit the second batch of detection signals received to the computer through the coincidence circuit; (5) For the first batch of detection signals and the second batch of detection signals, the signals obtained by the detectors other than the A column detector at the first position and the signals obtained by the detectors other than the A' column detector at the second position are considered to be the signals obtained by the left and right parts of the same detector. One of the signals obtained by the A column detector at the first position and the A' column detector at the second position is selected as the middle part signal, and the left and right middle part signals are merged into one detection data. The SPECT system controls all computers to complete image reconstruction.

8. The spect detection method of a movable bias probe according to claim 7, wherein: The detector consists of a collimator layer, a scintillation crystal layer, a light guide layer, and a PMT array layer in sequence; The detection surface of the detector is flat and all are rectangular in shape; There are 1-4 detection groups. When there is only one detection group, the detectors are arranged parallel to the surface of the detection bed. When there are 2-4 detectors, the detectors are arranged in a circumferentially uniform manner with the detection surfaces facing the detection area. The angle between adjacent detectors is 180°, 120°, or 90° respectively. The distance from the first position to the second position is 25-70 cm, or the distance from the first position to the second position is the same as the width of the detection surface of the detector; The collimator layer is a parallel hole collimator, a pinhole collimator, a diverging hole collimator or a focusing hole collimator with holes evenly arranged; The material of the scintillator crystal layer is NaI(Tl) or CsI(Tl), and the PMT array layer is SiPMT; each PMT in the PMT array layer is connected to a coincidence circuit.

9. The spect detection method of a movable bias probe according to claim 8, wherein: The detection surfaces of all detectors are squares with the same area; The four detectors are evenly distributed around the circumference, with the angle between adjacent detectors being 90°; The distance from the first position to the second position is specifically 45-55 cm.

10. A spect detection method for a movable bias probe according to any one of claims 1 to 9, characterized in that: Multiple detection groups are all carried by an integral rotating frame (4). For each detection group, there is a corresponding positioning frame (41) on the rotating frame. The positioning frame is in the shape of a rectangular frame. Each positioning frame has a pair of relatively arranged (42) slide grooves on the inner side. The detector slides left and right in the positioning frame. The position positioning of the detector in claims 1-9 is all adjusted in the positioning frame.

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