Rdt result dumping method and apparatus, terminal device, and storage medium

Abstract

The application discloses a RDT result dumping method and device, terminal equipment and computer storage medium, the method comprises the following steps: obtaining the RDT result data of the first master chip, decoding the RDT result data according to the first master chip, and obtaining the original RDT result information of the first master chip; the original RDT result information is converted into RDT result sharing data, and the RDT result sharing data is burned into the second master chip. The application can improve the compatibility of RDT result.

Description

Technical Field

[0001] This invention relates to the field of flash memory chip technology, and in particular to an RDT result dumping method, apparatus, terminal device, and computer storage medium. Background Technology

[0002] The quality of memory chips directly affects memory performance; therefore, it can be said that memory chips are the most important core component of memory.

[0003] Currently, memory chips undergo various parameter tests before production to determine whether the quality of the wafers composed of these memory chips is up to standard. However, most reliability verification tests for the memory chip selection process on the market currently use solid-state drive controller chips (SATA controller chips) and mass production tools (MPTool) to burn RDT (Reliability Demonstration Testing) code into the flash memory chips on a PC host. However, existing flash memory chips can usually only meet the compatibility requirements of a certain main controller chip for the memory chip selection process test. That is, the RDT results obtained by the flash memory chips cannot be shared because different chips have different decoding rules. Summary of the Invention

[0004] The main objective of this invention is to provide an RDT result dumping method, apparatus, terminal device, and computer storage medium, aiming to solve the problem that RDT results obtained from different chips cannot be shared, resulting in poor compatibility of RDT results.

[0005] To achieve the above objectives, the present invention provides an RDT result dumping method, which includes the following steps:

[0006] Obtain the RDT result data of the first main control chip, and decode the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip;

[0007] The original RDT result information is converted into RDT result shared data, and the RDT result shared data is burned into the second main control chip.

[0008] Further, the step of decoding the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip includes:

[0009] Determine the preset decoding algorithm and preset verification matrix for the decoding application of the first main control chip;

[0010] The RDT result data is verified according to the preset decoding algorithm and the preset verification matrix. After the verification is completed, the original RDT result information of the first main control chip is obtained.

[0011] Furthermore, the RDT result dumping method also includes the following steps:

[0012] The particle quality grade of the first main control chip is determined based on the RDT result data;

[0013] If the particle quality grade is lower than the preset particle qualification grade, the first main control chip will be removed, and the processing of the RDT result data will end.

[0014] Further, the step of converting the original RDT result information into RDT result shared data includes:

[0015] The original RDT result information is re-encoded according to a preset encoding algorithm to obtain RDT result shared data, wherein the RDT result shared data is compatible with at least one main control chip.

[0016] Further, the step of re-encoding the original RDT result information according to the preset encoding algorithm to obtain RDT result shared data includes:

[0017] Redundant information is added to the original RDT result information according to the preset encoding algorithm;

[0018] Error information is identified from the original RDT result information using the redundant information;

[0019] The error information is corrected according to the preset encoding algorithm to obtain the RDT result sharing data after error correction encoding.

[0020] Furthermore, the RDT result dumping method also includes the following steps:

[0021] Detect the particle quality grade of the second main control chip;

[0022] If the particle quality level in the shared data of the RDT results does not meet the particle quality level of the second main control chip, then the processing of the RDT result data ends.

[0023] The step of burning the shared data of the RDT results to the second main control chip includes:

[0024] If the particle quality level in the shared RDT results meets the particle quality level of the second main control chip, then the shared RDT results are burned into the second main control chip.

[0025] Furthermore, the RDT result dumping method also includes the following steps:

[0026] When it is detected that the shared data of the RDT results has been written to the main control chip that meets the first chip standard, the main control chip and the shared data of the RDT results are used for the production test of the main control chip that meets the second chip standard, wherein the first chip standard is compatible with the second chip standard.

[0027] Furthermore, to achieve the above objectives, the present invention also provides an RDT result dumping device, the RDT result dumping device comprising:

[0028] The data decoding module is used to acquire the RDT result data of the first main control chip, and decode the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip.

[0029] The result re-encoding module is used to convert the original RDT result information into RDT result shared data, and to burn the RDT result shared data into the second main control chip.

[0030] Each functional module of the RDT result dumping device of the present invention implements the steps of the RDT result dumping method described above during operation.

[0031] In addition, to achieve the above objectives, the present invention also provides a terminal device, the terminal device comprising: a memory, a processor, and an RDT result dumping program stored in the memory and executable on the processor, wherein when the RDT result dumping program is executed by the processor, it implements the steps of the RDT result dumping method as described above.

[0032] In addition, to achieve the above objectives, the present invention also provides a computer storage medium storing a computer program, which, when executed by a processor, implements the steps of the RDT result dumping method described above.

[0033] The RDT result dumping method, apparatus, terminal device, and computer storage medium proposed in this invention obtain RDT result data from a first main control chip, decode the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip, convert the original RDT result information into shared RDT result data, and burn the shared RDT result data into a second main control chip.

[0034] This invention decodes the RDT result data obtained from the first master control chip to obtain the original RDT result information. Then, the original RDT result information is converted into shared RDT result data that can be used on different master control chips through a unified algorithm. The obtained shared RDT result data is not limited by the type of master control chip, so that the RDT result data obtained on one master control chip can be written to any other type of master control chip. This overcomes the problem that RDT results cannot be shared due to the decoding rules of different chips, and improves the compatibility of RDT results.

[0035] Furthermore, this invention uses the information carried in the RDT results to perform compatibility checks on the main control chip for newly written RDT results in advance, improving the efficiency of RDT result dumping. It establishes a general rule for downward application for main control chips that meet the bus standard conditions. There is no need to perform multiple checks between main control chips that meet the bus standard conditions. Main control chips with RDT results carried by the upper standard can be directly applied to the production testing of the lower standard, reducing the production cost of multiple test checks and improving the efficiency of the RDT process. Attached Figure Description

[0036] Figure 1 This is a schematic diagram of the hardware operation of the terminal device involved in the embodiment of the present invention;

[0037] Figure 2 This is a flowchart illustrating an embodiment of an RDT result dumping method according to the present invention;

[0038] Figure 3 This is a schematic diagram of the structural relationship of an RDT result dumping system according to the present invention.

[0039] The objectives, features, and advantages of this invention will be further explained in conjunction with the embodiments and with reference to the accompanying drawings. Detailed Implementation

[0040] It should be understood that the specific embodiments described herein are merely illustrative of the invention and are not intended to limit the invention.

[0041] like Figure 1 As shown, Figure 1 This is a schematic diagram of the hardware operating environment of the terminal device involved in the embodiment of the present invention.

[0042] It should be noted that, Figure 1 This can be a schematic diagram of the hardware operating environment of the terminal device. In this embodiment of the invention, the terminal device can be a device that executes the RDT result dumping method provided by this invention for a memory based on NAND flash as the storage medium. Specifically, the terminal device can be a mobile terminal, a data storage control terminal, a PC, or a portable computer, etc.

[0043] like Figure 1 As shown, the terminal device may include: a processor 1001, such as a CPU; a network interface 1004; a user interface 1003; a memory 1005; and a communication bus 1002. The communication bus 1002 is used to enable communication between these components. The user interface 1003 may include a display screen and an input unit such as a keyboard. Optionally, the user interface 1003 may also include a standard wired interface or a wireless interface. The network interface 1004 may optionally include a standard wired interface or a wireless interface (such as a Wi-Fi interface). The memory 1005 may be non-volatile memory (such as Flash memory), high-speed RAM, or stable memory (such as disk storage). Optionally, the memory 1005 may also be a storage device independent of the aforementioned processor 1001.

[0044] Those skilled in the art will understand that Figure 1 The terminal device structure shown does not constitute a limitation on the terminal device and may include more or fewer components than shown, or combine certain components, or have different component arrangements.

[0045] like Figure 1 As shown, the memory 1005, which serves as a computer storage medium, may include an operating system, a network communication module, a user interface module, and an RDT result dumping program. The operating system is a program that manages and controls the hardware and software resources of the sample terminal device, supporting the operation of the RDT result dumping program and other software or programs.

[0046] exist Figure 1 In the terminal device shown, the user interface 1003 is mainly used for data communication with various terminals; the network interface 1004 is mainly used for connecting to the backend server and communicating with the backend server; and the processor 1001 can be used to call the RDT result dump program stored in the memory 1005 and perform the following operations:

[0047] Obtain the RDT result data of the first main control chip, and decode the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip;

[0048] The original RDT result information is converted into RDT result shared data, and the RDT result shared data is burned into the second main control chip.

[0049] Furthermore, the processor 1001 can call the RDT result dump program stored in memory 1005 and also perform the following operations:

[0050] Determine the preset decoding algorithm and preset verification matrix for the decoding application of the first main control chip;

[0051] The RDT result data is verified according to the preset decoding algorithm and the preset verification matrix. After the verification is completed, the original RDT result information of the first main control chip is obtained.

[0052] Furthermore, the processor 1001 can call the RDT result dump program stored in memory 1005 and also perform the following operations:

[0053] The particle quality grade of the first main control chip is determined based on the RDT result data;

[0054] If the particle quality grade is lower than the preset particle qualification grade, the first main control chip will be removed, and the processing of the RDT result data will end.

[0055] Furthermore, the processor 1001 can call the RDT result dump program stored in memory 1005 and also perform the following operations:

[0056] The original RDT result information is re-encoded according to a preset encoding algorithm to obtain RDT result shared data, wherein the RDT result shared data is compatible with at least one main control chip.

[0057] Furthermore, the processor 1001 can call the RDT result dump program stored in memory 1005 and also perform the following operations:

[0058] Redundant information is added to the original RDT result information according to the preset encoding algorithm;

[0059] Error information is identified from the original RDT result information using the redundant information;

[0060] The error information is corrected according to the preset encoding algorithm to obtain the RDT result sharing data after error correction encoding.

[0061] Furthermore, the processor 1001 can call the RDT result dump program stored in memory 1005 and also perform the following operations:

[0062] Detect the particle quality grade of the second main control chip;

[0063] If the particle quality level in the shared data of the RDT results does not meet the particle quality level of the second main control chip, then the processing of the RDT result data ends.

[0064] The step of burning the shared data of the RDT results to the second main control chip includes:

[0065] If the particle quality level in the shared RDT results meets the particle quality level of the second main control chip, then the shared RDT results are burned into the second main control chip.

[0066] Furthermore, the processor 1001 can call the RDT result dump program stored in memory 1005 and also perform the following operations:

[0067] When it is detected that the shared data of the RDT results has been written to the main control chip that meets the first chip standard, the main control chip and the shared data of the RDT results are used for the production test of the main control chip that meets the second chip standard, wherein the first chip standard is compatible with the second chip standard.

[0068] Based on the above structure, various embodiments of the RDT result dumping method of the present invention are proposed.

[0069] It should be noted that in this embodiment, the quality of the memory chips directly affects the performance of the memory, and can be said to be the most important core component of the memory. Before production, memory chips must undergo various parameter tests to determine whether the quality of the wafer is up to standard. Currently, the reliability verification test rack of the chip selection process in the market uses the solid-state drive control chip (SATA controller chip) and mass production tool (MPTool) to burn the RDT (Reliability Demonstration Testing) code into the flash memory chip on the PC host. However, the existing chip selection process can only meet the compatibility of a certain main control chip. The obtained RDT results cannot be shared because different chips have different decoding rules, resulting in poor compatibility of RDT results.

[0070] To address the above issues, this application provides an RDT result dumping method. This method involves acquiring RDT result data from a first main control chip, decoding the RDT result data using the first main control chip to obtain the original RDT result information of the first main control chip, converting the original RDT result information into shared RDT result data, and then burning the shared RDT result data to a second main control chip.

[0071] This invention decodes the RDT result data obtained from the first master control chip to obtain the original RDT result information. Then, the original RDT result information is converted into shared RDT result data that can be used on different master control chips through a unified algorithm. The obtained shared RDT result data is not limited by the type of master control chip, so that the RDT result data obtained on one master control chip can be written to any other type of master control chip. This overcomes the problem that RDT results cannot be shared due to the decoding rules of different chips, and improves the compatibility of RDT results.

[0072] Furthermore, this invention uses the information carried in the RDT results to perform compatibility checks on the main control chip for newly written RDT results in advance, improving the efficiency of RDT result dumping. It establishes a general rule for downward application for main control chips that meet the bus standard conditions. There is no need to perform multiple checks between main control chips that meet the bus standard conditions. Main control chips with RDT results carried by the upper standard can be directly applied to the production testing of the lower standard, reducing the production cost of multiple test checks and improving the efficiency of the RDT process.

[0073] Please refer to Figure 2 , Figure 2 This is a flowchart illustrating the first embodiment of the RDT result dumping method of the present invention.

[0074] This invention provides an embodiment of an RDT result dumping method, which is applied in the aforementioned terminal device to dump RDT results for a memory based on NAND flash as the storage medium. It should be noted that although the logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different order than that shown here.

[0075] In this embodiment, the RDT result dumping method of the present invention includes:

[0076] Step S100: Obtain the RDT result data of the first main control chip, and decode the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip.

[0077] The terminal device obtains the RDT result data burned on the first main control chip through a tool, and automatically decodes the RDT result data into the original RDT result information of the first main control chip according to the preset error correction algorithm, corresponding matrix and other input parameters applied by the first main control chip when burning the original RDT result information.

[0078] It should be noted that in this embodiment, the process of selecting chips for the main control chip and performing RDT testing results in the obtained RDT result data includes the chip quality grade information and bad block information of the main control chip. The RDT result data is then burned into the first main control chip, which is usually a main control chip that has completed the chip selection process and has the corresponding RDT result data. Due to the conversion by the preset error correction algorithm, it can only meet the compatibility of the first main control chip and cannot be directly dumped and burned into other types of main control chips. The RDT result data usually contains information such as the number of bad blocks and chip quality grade of the chip. After decoding, it becomes the original RDT result information. The preset error correction algorithm is usually different for different types of main control chips, so RDT results cannot be shared between different types of main control chips.

[0079] In one feasible embodiment, the step of "decoding the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip" in step S100 above may include:

[0080] Step S101: Determine the preset decoding algorithm and preset verification matrix for the decoding application of the first main control chip;

[0081] Step S102: Verify each codeword in the RDT result data according to the preset decoding algorithm and the preset verification matrix. After the verification is completed, obtain the original RDT result information of the first main control chip.

[0082] The preset decoding algorithm and corresponding preset verification matrix to be applied during the decoding of the first main control chip are determined; each codeword in the RDT result data is iteratively verified in turn according to the preset decoding algorithm and the preset verification matrix; after the verification is completed, the decoding is successful, and the original RDT result information of the first main control chip after decoding is obtained.

[0083] It should be noted that in this embodiment, the preset decoding algorithm is usually the LDPC (Low Density Parity Check Code) algorithm. Different types of master control chips have different preset parity check matrices. The LDPC decoding method is to multiply the received codeword with the parity check matrix. If the result is a 0 matrix, it means that the received codeword is correct; otherwise, it is incorrect. Further error correction decoding is then performed based on the multiplication result. Due to the rules of LDPC decoding, the RDT result information between different types of master control chips cannot be shared.

[0084] Specifically, after determining the preset decoding algorithm and preset parity matrix to be used when decoding a certain master control chip, the RDT result data is first hard decoded. Information is passed between the parity nodes and the variable nodes, and the process is iterated until all parity checks return to 0, in which case the decoding is successful. If the decoding fails, the RDT result data is soft decoded. Different read levels are adjusted, and the probability of a bit being 1 or 0 is determined based on the read result. Then, soft decoding is performed based on the probability of 1 or 0.

[0085] In one feasible embodiment, the RDT result dumping method of the present invention may further include:

[0086] Step S001: Determine the particle quality grade of the first main control chip based on the RDT result data;

[0087] Step S002: If the particle quality grade is lower than the preset particle qualification grade, the first main control chip is removed, and the processing of the RDT result data ends.

[0088] Based on the obtained RDT result data, the particle quality level and bad block count of the first main control chip are directly determined. The first main control chip with a particle quality level lower than the preset particle qualification level, that is, a particle quality failure, is directly removed, and the RDT result dump ends.

[0089] Based on the particle information in the RDT result data, the first main control chip is screened to remove the first main control chip with unqualified particles, without performing subsequent re-encoding and burning steps, thereby improving the efficiency of RDT result dumping.

[0090] It should be noted that, in this embodiment, the RDT result data obtained through the chip selection process carries the chip quality grade and bad block data of the first main control chip. The chip selection process is originally intended to select qualified chips from each chip. After determining that a chip is unqualified, the unqualified chip is directly discarded to save production costs and improve the efficiency of the process. In this embodiment, the chip quality grade can be divided into 1-9 levels, where the lower the chip quality grade number, the higher the quality grade of the flash memory chip. That is, the quality of the flash memory chip with a value of 1 is higher than that of the flash memory chip with a value of 9.

[0091] Step S200: Convert the original RDT result information into RDT result shared data, and burn the RDT result shared data into the second main control chip.

[0092] The terminal re-encodes the original RDT result information into shared RDT result data that can be shared by other main control chips using a preset tool, and then burns the shared RDT result data into the second main control chip.

[0093] It should be noted that, in this embodiment, the shared data of the RDT results is re-encoded by a common error correction algorithm and can be shared by other different types of master control chips; the second master control chip can be any type of master control chip.

[0094] In one feasible embodiment, the step of "converting the original RDT result information into RDT result shared data" in step S200 above may include:

[0095] Step S201: The original RDT result information is re-encoded according to a preset encoding algorithm to obtain RDT result shared data, wherein the RDT result shared data is compatible with at least one main control chip.

[0096] The preset encoding algorithm set in the preset encoding software is obtained, and the original RDT result information is re-encoded according to the preset encoding algorithm to obtain the encoded RDT result shared data. Since the RDT result shared software obtained through the common preset encoding algorithm in the same preset encoding software can be shared between different types of master control chips.

[0097] It should be noted that in this embodiment, the preset encoding algorithm is typically a redundant error correction algorithm based on ECC (Error Correcting Code) results. ECC is an error detection and correction algorithm used in NAND flash memory. ECC error correction technology requires additional space to store the correction code (ECC code). The ECC code encodes information in 8 bits, which can recover a 1-bit error. Whenever data is written to memory, the ECC code uses a special algorithm to calculate the data, and the result becomes the check bits. The sum of all check bits is the checksum, which is stored along with the data. When the data is read from memory, the same algorithm is used to calculate the checksum again, and it is compared with the previous calculation result. If the results are the same, the data is correct; otherwise, it is incorrect. ECC can logically separate errors and notify the system. When only a single-bit error occurs, ECC can correct the error without affecting system operation.

[0098] In one feasible embodiment, the step of "re-encoding the original RDT result information according to the preset encoding algorithm to obtain RDT result shared data" in step S201 above may include:

[0099] Step A100: Add redundant information to the original RDT result information according to the preset encoding algorithm;

[0100] Step A200: Identify error information from the original RDT result information using the redundant information;

[0101] Step A300: Correct the error information according to the preset encoding algorithm to obtain the RDT result sharing data after error correction encoding.

[0102] According to a preset encoding algorithm, redundant information is added to the original RDT result information. The original RDT result information is then verified based on the redundant information to identify erroneous information. The identified erroneous information is then corrected according to the preset encoding algorithm to obtain the corrected RDT result shared data.

[0103] It should be noted that in this embodiment, the ECC redundancy algorithm is applied to correct and encode the error information in the obtained original RDT result information. Since the same preset encoding algorithm results in the obtained RDT shared data having the same RDT result format, which is different from the RDT result data of the first main control chip, the RDT result shared data can be written to different main control chips.

[0104] In one feasible embodiment, the RDT result dumping method of the present invention may further include:

[0105] Step B100: Detect the particle quality grade of the second main control chip;

[0106] Step B200: If the particle quality level in the shared RDT result data does not meet the particle quality level of the second main control chip, then the processing of the RDT result data ends.

[0107] The step of burning the shared data of the RDT results to the second main control chip includes:

[0108] Step B300: If the particle quality level in the RDT result shared data meets the particle quality level of the second main control chip, then the RDT result shared data is burned into the second main control chip.

[0109] The system tools detect the particle quality level of the second master control chip whose data is to be dumped, and determine whether the quality of the first master control chip meets the quality requirements of the second master control chip, so as to ensure that the RDT result sharing data written into the second master control chip meets the requirements of the second master control chip; if it meets the requirements, it can be written and the next step is directly executed: the RDT result sharing data is burned into the second master control chip; if it does not meet the requirements, it means that the second master control chip does not meet the standards in the RDT result sharing data, and the RDT result dumping is directly terminated.

[0110] It should be noted that, in this embodiment, the particle quality level of the second main control chip can be directly detected by the system tools. When the particle selection results in the first main control chip are transferred to the second main control chip, the second main control chip also needs to meet the requirements in the transferred particle selection results; otherwise, the programming and writing cannot be successfully completed.

[0111] In one feasible embodiment, the RDT result dumping method of the present invention may further include:

[0112] Step S300: When it is detected that the RDT result shared data has been written to the main control chip that meets the first chip standard, the main control chip and the RDT result shared data are used for the production test of the main control chip that meets the second chip standard, wherein the first chip standard is compatible with the second chip standard.

[0113] When it is detected that the RDT result sharing data has been successfully written into the main control chip, and the main control chip meets the first chip standard, and the first chip standard is compatible with the second chip standard, the main control chip can be considered to directly meet the second chip standard, and the main control chip can be directly subjected to production testing related to the second chip standard.

[0114] Specifically, for example, if the RDT result sharing data in a certain main control chip meets the PCIE (Peripheral Component Interconnect Express) standard, the main control chip can be used for PCIE testing. The PCIE standard is compatible with the SATA (Serial Advanced Technology Attachment) standard, which is superior to the SATA standard. Therefore, the main control chip used for PCIE testing can be directly used for SATA surface mount production testing, and the RDT result sharing data carried by the main control chip is universal.

[0115] It should be noted that in this embodiment, the main control chip can be any type of chip. The first chip standard and the second chip standard are both bus standards. The unified RDT result sharing data enables the RDT results to be mutually compatible when the main control chip is used by each bus standard. A general rule for downward application is established for the main control chip that meets the bus standard conditions. There is no need to perform multiple judgments between main control chips that meet the bus standard conditions. The main control chip carrying the RDT result of the upper standard can be directly applied to the production test of the lower standard, saving the production cost of multiple test judgments and improving the efficiency of the RDT process.

[0116] In this embodiment, the present invention obtains the RDT result data of the first main control chip, decodes the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip, converts the original RDT result information into RDT result shared data, and burns the RDT result shared data into the second main control chip.

[0117] This invention decodes the RDT result data obtained from the first master control chip to obtain the original RDT result information. Then, the original RDT result information is converted into shared RDT result data that can be used on different master control chips through a unified algorithm. The obtained shared RDT result data is not limited by the type of master control chip, so that the RDT result data obtained on one master control chip can be written to any other type of master control chip. This overcomes the problem that RDT results cannot be shared due to the decoding rules of different chips, and improves the compatibility of RDT results.

[0118] Furthermore, this invention uses the information carried in the RDT results to perform compatibility checks on the main control chip for newly written RDT results in advance, improving the efficiency of RDT result dumping. It establishes a general rule for downward application for main control chips that meet the bus standard conditions. There is no need to perform multiple checks between main control chips that meet the bus standard conditions. Main control chips with RDT results carried by the upper standard can be directly applied to the production testing of the lower standard, reducing the production cost of multiple test checks and improving the efficiency of the RDT process.

[0119] In addition, please refer to Figure 3 The present invention also proposes an RDT result dumping device, which includes:

[0120] The data decoding module 10 is used to acquire the RDT result data of the first main control chip, and decode the RDT result data according to the first main control chip to obtain the original RDT result information of the first main control chip.

[0121] The result re-encoding module 20 is used to convert the original RDT result information into RDT result shared data, and to burn the RDT result shared data into the second main control chip;

[0122] Preferably, the data decoding module 10 further includes:

[0123] Determine the preset decoding algorithm and preset verification matrix for the decoding application of the first main control chip;

[0124] The RDT result data is verified according to the preset decoding algorithm and the preset verification matrix. After the verification is completed, the original RDT result information of the first main control chip is obtained.

[0125] Preferably, the RDT result dumping device further includes:

[0126] The particle quality grade of the first main control chip is determined based on the RDT result data;

[0127] If the particle quality grade is lower than the preset particle qualification grade, the first main control chip will be removed, and the processing of the RDT result data will end.

[0128] Preferably, the result re-encoding module 20 further includes:

[0129] The original RDT result information is re-encoded according to a preset encoding algorithm to obtain RDT result shared data, wherein the RDT result shared data is compatible with at least one main control chip.

[0130] Preferably, the result re-encoding module 20 further includes:

[0131] Redundant information is added to the original RDT result information according to the preset encoding algorithm;

[0132] Error information is identified from the original RDT result information using the redundant information;

[0133] The error information is corrected according to the preset encoding algorithm to obtain the RDT result sharing data after error correction encoding.

[0134] Preferably, the result re-encoding module 20 further includes:

[0135] Detect the particle quality grade of the second main control chip;

[0136] If the particle quality level in the shared data of the RDT results does not meet the particle quality level of the second main control chip, then the processing of the RDT result data ends.

[0137] The step of burning the shared data of the RDT results to the second main control chip includes:

[0138] If the particle quality level in the shared RDT results meets the particle quality level of the second main control chip, then the shared RDT results are burned into the second main control chip.

[0139] Preferably, the RDT result dumping device further includes:

[0140] When it is detected that the shared data of the RDT results has been written to the main control chip that meets the first chip standard, the main control chip and the shared data of the RDT results are used for the production test of the main control chip that meets the second chip standard, wherein the first chip standard is compatible with the second chip standard.

[0141] The steps implemented by each functional module of the RDT result dumping device of the present invention during controller operation can be referred to the embodiments of the RDT result dumping method of the present invention described above, and will not be repeated here.

[0142] Furthermore, this embodiment of the invention also proposes a terminal device, which includes: a memory, a processor, and an RDT result dumping program stored in the memory and executable on the processor. When the RDT result dumping program is executed by the processor, it implements the steps of the RDT result dumping method as described above.

[0143] The steps implemented when the RDT result dumping program running on the processor is executed can be referred to in various embodiments of the RDT result dumping method of the present invention, and will not be repeated here.

[0144] Furthermore, this embodiment of the invention also proposes a computer storage medium for use in a computer. The computer storage medium can be a non-volatile computer-readable storage medium, which stores an RDT result dumping program. When the RDT result dumping program is executed by the processor, it implements the steps of the RDT result dumping method described above.

[0145] The steps implemented when the RDT result dumping program running on the processor is executed can be referred to in various embodiments of the RDT result dumping method of the present invention, and will not be repeated here.

[0146] It should be noted that, in this document, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or system that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or system. Unless otherwise specified, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or system that includes that element.

[0147] The sequence numbers of the above embodiments of the present invention are for descriptive purposes only and do not represent the superiority or inferiority of the embodiments.

[0148] Through the above description of the embodiments, those skilled in the art can clearly understand that the methods of the above embodiments can be implemented by means of software plus necessary general-purpose hardware platforms. Of course, they can also be implemented by hardware, but in many cases the former is a better implementation method. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, can be embodied in the form of a software product. This computer software product is stored in a computer storage medium (such as Flash memory, ROM / RAM, magnetic disk, optical disk), and includes several instructions to cause a controller in a terminal device (which may be a mobile phone, computer, server, or network device, etc.) to control the data read and write operations of the storage medium to execute the methods described in the various embodiments of the present invention.

[0149] The above are merely preferred embodiments of the present invention and do not limit the scope of the patent. Any equivalent structural or procedural transformations made based on the description and drawings of the present invention, or direct or indirect applications in other related technical fields, are similarly included within the scope of patent protection of the present invention.

Claims

1. A method for dumping RDT results, characterized in that, The RDT result dumping method includes the following steps: Obtain the RDT result data of the first main control chip, and determine the preset decoding algorithm and preset verification matrix of the decoding application of the first main control chip; According to the preset verification matrix, each codeword in the RDT result data is iteratively verified sequentially. After verification, each codeword in the RDT result data is decoded sequentially according to the preset decoding algorithm. After successful decoding, the original RDT result information of the first main control chip is obtained. The preset decoding algorithm is the LDPC low-density parity check algorithm. First, the RDT result data is iteratively verified by hard decoding until all parity checks are zero, then the decoding is successful. If the decoding is unsuccessful, the RDT result data is then software decoded by adjusting different read levels to complete the decoding. The original RDT result information is converted into RDT result shared data, and the RDT result shared data is burned into the second main control chip; When it is detected that the shared data of the RDT results has been written to the main control chip that meets the first chip standard, the main control chip and the shared data of the RDT results are used for the production test of the main control chip that meets the second chip standard. The first chip standard is compatible with the second chip standard. The first chip standard is the PCIE high-speed serial computer expansion bus standard, and the second chip standard is the SATA serial advanced technology accessory standard.

2. The RDT result dumping method as described in claim 1, characterized in that, Before the step of determining the preset decoding algorithm and preset parity matrix of the first main control chip decoding application, the RDT result dumping method further includes: The particle quality grade of the first main control chip is determined based on the RDT result data; If the particle quality grade is lower than the preset particle qualification grade, the first main control chip will be removed, and the processing of the RDT result data will end.

3. The RDT result dumping method as described in claim 1, characterized in that, The step of converting the original RDT result information into shared RDT result data includes: The original RDT result information is re-encoded according to a preset encoding algorithm to obtain RDT result shared data, wherein the RDT result shared data is compatible with at least one main control chip.

4. The RDT result dumping method as described in claim 3, characterized in that, The step of re-encoding the original RDT result information according to a preset encoding algorithm to obtain RDT result shared data includes: Redundant information is added to the original RDT result information according to the preset encoding algorithm; Error information is identified from the original RDT result information using the redundant information; The error information is corrected according to the preset encoding algorithm to obtain the RDT result sharing data after error correction encoding.

5. The RDT result dumping method as described in claim 1, characterized in that, Before the step of burning the shared RDT result data to the second main control chip, the RDT result dumping method further includes: Detect the particle quality grade of the second main control chip; If the particle quality level in the shared data of the RDT results does not meet the particle quality level of the second main control chip, then the processing of the RDT result data ends. The step of burning the shared data of the RDT results to the second main control chip includes: If the particle quality level in the shared RDT results meets the particle quality level of the second main control chip, then the shared RDT results are burned into the second main control chip.

6. An RDT results dumping device, characterized in that, The RDT result dumping device includes: A data decoding module is used to acquire the RDT result data of the first main control chip, decode the RDT result data according to the first main control chip, and obtain the original RDT result information of the first main control chip. Specifically, the data decoding module is used to determine the preset decoding algorithm and preset parity check matrix for the decoding application of the first main control chip; iteratively verify each codeword in the RDT result data according to the preset parity check matrix; after verification, it decodes each codeword in the RDT result data according to the preset decoding algorithm; and obtains the decoded original RDT result information of the first main control chip after successful decoding. The preset decoding algorithm is the LDPC low-density parity check algorithm, which first performs hard decoding iterative verification on the RDT result data until all parity checks are zero, indicating successful decoding; if decoding fails, it then performs soft decoding on the RDT result data, adjusting different read levels to complete the decoding. The result re-encoding module is used to convert the original RDT result information into RDT result shared data, and then program the RDT result shared data into the second main control chip. The RDT result dumping device further includes: when it is detected that the shared RDT result data has been written to a main control chip that meets the first chip standard, the main control chip and the shared RDT result data are used for production testing of a main control chip that meets the second chip standard, wherein the first chip standard is compatible with the second chip standard, wherein the first chip standard is the PCIE high-speed serial computer expansion bus standard, and the second chip standard is the SATA serial advanced technology accessory standard.

7. A terminal device, characterized in that, The terminal device includes: a memory, a processor, and an RDT result dumping program stored in the memory and executable on the processor. When the RDT result dumping program is executed by the processor, it implements the steps of the RDT result dumping method as described in any one of claims 1 to 5.

8. A storage medium, characterized in that, The storage medium stores a computer program, which, when executed by a processor, implements the steps of the RDT result dumping method as described in any one of claims 1 to 5.

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