Test vectorless integrated circuit product testing method, device and computer equipment

Abstract

The application relates to a test vector-free integrated circuit product testing method and device, computer equipment, a storage medium and a computer program product. The method comprises the following steps: for a target test item which belongs to a target integrated circuit product and depends on a test vector, acquiring a functional test case of the target test item, and storing all the functional test cases in a storage module; determining a current test item to be tested of the target integrated circuit product; judging whether the current test item to be tested is the target test item which depends on the test vector, if yes, calling the target functional test case from the storage module, testing the target integrated circuit product through the target functional test case, and obtaining a test result of the target integrated circuit product; and determining whether the current test item to be tested passes the test according to the test result. Thus, the test of the test item lacking the test vector can be realized under the condition that the integrated circuit product manufacturer is unwilling to provide or unable to provide the test vector.

Description

Technical Field

[0001] This application relates to the field of integrated circuit testing technology, and in particular to a test method, apparatus, computer equipment, storage medium, and computer program product for integrated circuit products without test vectors. Background Technology

[0002] Before being delivered to the user, integrated circuit (IC) products undergo a wide variety of tests to verify their quality and reliability. IC product testing typically includes DC parameters, AC parameters, interface parameters, functionality, and application performance. While AC and DC parameter testing requires an ATE (Automatic Test Equipment) system, other tests such as interface parameters, functionality, and application performance can be performed using either an ATE system or a board-level test system. Because IC products are often quite complex, to perform the required tests, test vectors need to be developed at the R&D stage based on the IC product's design structure and functions. These vectors are then transferred to the ATE system and used for program calls to perform the tests. Test vectors are a crucial prerequisite and foundation for the ATE system to perform the required tests on IC products.

[0003] In related technologies, for target test items that require test vectors to complete the test, the test of the target test item of the integrated circuit product under test is usually completed based on the test vectors of the integrated circuit product manufacturer. Specifically, the test vectors of the manufacturer are downloaded to the integrated circuit product under test through the ATE test system, thereby carrying out the test. All test procedures and test vector configurations are controlled and completed by the ATE test system. However, with the advancement of the localization of integrated circuit products and the increasing market application demands, more and more integrated circuit products need to be tested by users, third parties, or non-independent R&D manufacturers. Since there are situations where integrated circuit product manufacturers are unwilling or unable to provide test vectors, in this case, users, third parties, or non-independent R&D manufacturers will find it difficult to complete the complete test of the integrated circuit product's test items. Summary of the Invention

[0004] Based on this, it is necessary to address the aforementioned technical problems by providing a test vectorless integrated circuit product testing method, apparatus, computer equipment, computer-readable storage medium, and computer program product that enables testing of test items lacking test vectors when integrated circuit product manufacturers are unwilling or unable to provide test vectors.

[0005] In a first aspect, this application provides a test method for integrated circuit products without test vectors. The method is applied to an ATE test system, which includes an ATE test board, the ATE test board including a storage module; the method includes:

[0006] For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases of the target test items and store all functional test cases in the storage module;

[0007] Identify the current test items to be tested for the target integrated circuit product;

[0008] Determine whether the current test item to be tested is a target test item that depends on the test vector. If so, retrieve the target function test case from the storage module, test the target integrated circuit product through the target function test case, and obtain the test results of the target integrated circuit product.

[0009] Based on the test results, determine whether the current test item has passed the test.

[0010] In one embodiment, target function test cases are retrieved from the storage module, and the target integrated circuit product is tested using the target function test cases to obtain the test results of the target integrated circuit product, including:

[0011] Obtain the address of the target function test cases;

[0012] The target function test cases are read from the storage module based on the address and then loaded into the target integrated circuit product.

[0013] If loading is successful, the target function test cases, test modes, environmental test parameters, and test sequences are configured for the target integrated circuit product, and the target function test cases are configured; the environmental test mode, test parameters, and test sequences are all determined based on the current test item to be tested;

[0014] Based on the configured target function test cases, test modes, environmental test parameters and test sequence, the target integrated circuit product is tested and the test results are obtained.

[0015] In one embodiment, the ATE test board further includes a switch array; loading the read target functional test cases into the target integrated circuit product includes:

[0016] The test path is obtained based on the switch array.

[0017] According to the test path, load the read target function test cases into the target integrated circuit product.

[0018] In one embodiment, after determining whether the current test item to be tested is a target test item that depends on the test vector, the method further includes:

[0019] If not, configure the target integrated circuit product with the default test mode, environmental test parameters and test sequence; test the target integrated circuit product based on the default test mode, environmental test parameters and test sequence, and obtain the test results of the target integrated circuit product.

[0020] In one embodiment, determining whether the current test item passes the test based on the test results includes:

[0021] Determine whether the test result matches the preset test result. If they match, the current test item passes the test; otherwise, the current test item fails the test.

[0022] In one embodiment, obtaining functional test cases for the target test item includes:

[0023] Extract content from the datasheet and design specification documents of the target integrated circuit product to obtain functional test cases for the target test items.

[0024] Secondly, this application also provides a test apparatus for integrated circuit products without test vectors. The apparatus includes:

[0025] The acquisition module is used to acquire functional test cases for target test items that belong to the target integrated circuit product and depend on test vectors, and store all functional test cases in the storage module;

[0026] The first determining module is used to determine the current test items to be tested for the target integrated circuit product.

[0027] The judgment module is used to determine whether the current test item to be tested is a target test item that depends on the test vector. If so, the target function test case is retrieved from the storage module, and the target integrated circuit product is tested through the target function test case to obtain the test result of the target integrated circuit product.

[0028] The second determination module is used to determine whether the current test item passes the test based on the test results.

[0029] Thirdly, this application also provides a computer device. The computer device includes a memory and a processor, the memory storing a computer program, and the processor executing the computer program to perform the following steps:

[0030] For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases of the target test items and store all functional test cases in the storage module;

[0031] Identify the current test items to be tested for the target integrated circuit product;

[0032] Determine whether the current test item to be tested is a target test item that depends on the test vector. If so, retrieve the target function test case from the storage module, test the target integrated circuit product through the target function test case, and obtain the test results of the target integrated circuit product.

[0033] Based on the test results, determine whether the current test item has passed the test.

[0034] Fourthly, this application also provides a computer-readable storage medium. The computer-readable storage medium stores a computer program thereon, which, when executed by a processor, performs the following steps:

[0035] For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases of the target test items and store all functional test cases in the storage module;

[0036] Identify the current test items to be tested for the target integrated circuit product;

[0037] Determine whether the current test item to be tested is a target test item that depends on the test vector. If so, retrieve the target function test case from the storage module, test the target integrated circuit product through the target function test case, and obtain the test results of the target integrated circuit product.

[0038] Based on the test results, determine whether the current test item has passed the test.

[0039] Fifthly, this application also provides a computer program product. The computer program product includes a computer program that, when executed by a processor, performs the following steps:

[0040] For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases of the target test items and store all functional test cases in the storage module;

[0041] Identify the current test items to be tested for the target integrated circuit product;

[0042] Determine whether the current test item to be tested is a target test item that depends on the test vector. If so, retrieve the target function test case from the storage module, test the target integrated circuit product through the target function test case, and obtain the test results of the target integrated circuit product.

[0043] Based on the test results, determine whether the current test item has passed the test.

[0044] The aforementioned integrated circuit product testing method, apparatus, computer equipment, storage medium, and computer program product without test vectors obtain functional test cases for target test items that belong to the target integrated circuit product and depend on test vectors, and store all functional test cases in a storage module; determine the current test item to be tested on the target integrated circuit product; determine whether the current test item to be tested is a target test item that depends on test vectors; if so, retrieve the target functional test cases from the storage module, test the target integrated circuit product using the target functional test cases, and obtain the test results of the target integrated circuit product; based on the test results, determine whether the current test item to be tested passes the test. Because functional test cases for target test items that depend on test vectors are obtained and all functional test cases are stored in the storage module, the functional test cases of the target test items are reasonably invoked when testing target test items that depend on test vectors. This allows for testing of test items lacking test vectors when integrated circuit product manufacturers are unwilling or unable to provide test vectors, and provides high testing flexibility. Attached Figure Description

[0045] Figure 1 This is a flowchart illustrating a test method for an integrated circuit product without test vectors in one embodiment;

[0046] Figure 2 This is a schematic diagram illustrating the process of testing test items in a test method for integrated circuit products without test vectors in one embodiment;

[0047] Figure 3 This is a flowchart illustrating a test method for an integrated circuit product without test vectors in one embodiment;

[0048] Figure 4 This is a schematic diagram of the test flow for the current test item in a test method for integrated circuit products without test vectors in another embodiment.

[0049] Figure 5 This is a structural block diagram of an ATE test board in a test method for integrated circuit products without test vectors, as shown in one embodiment.

[0050] Figure 6 This is a flowchart illustrating a test method for integrated circuit products without test vectors in another embodiment;

[0051] Figure 7 This is a structural block diagram of a test apparatus for an integrated circuit product without test vectors in one embodiment.

[0052] Figure 8 This is an internal structural diagram of a computer device in one embodiment. Detailed Implementation

[0053] To make the objectives, technical solutions, and advantages of this application clearer, the following detailed description is provided in conjunction with the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the scope of this application.

[0054] Before being delivered to the user, integrated circuit (IC) products undergo a wide variety of tests to verify their quality and reliability. IC product testing typically includes DC parameters, AC parameters, interface parameters, functionality, and application performance. While AC and DC parameter testing requires an ATE (Automatic Test Equipment) system, other tests such as interface parameters, functionality, and application performance can be performed using either an ATE system or a board-level test system. Because IC products are often quite complex, to perform the required tests, test vectors need to be developed at the R&D stage based on the IC product's design structure and functions. These vectors are then transferred to the ATE system and used for program calls to perform the tests. Test vectors are a crucial prerequisite and foundation for the ATE system to perform the required tests on IC products.

[0055] In related technologies, for target test items that require test vectors to complete the test, the test of the target test item of the integrated circuit product under test is usually completed based on the test vectors of the integrated circuit product manufacturer. Specifically, the test vectors of the manufacturer are downloaded to the integrated circuit product under test through the ATE test system, thereby carrying out the test. All test procedures and test vector configurations are controlled and completed by the ATE test system. However, with the advancement of the localization of integrated circuit products and the increasing market application demands, more and more integrated circuit products need to be tested by users, third parties, or non-independent R&D manufacturers. Since there are situations where integrated circuit product manufacturers are unwilling or unable to provide test vectors, in this case, users, third parties, or non-independent R&D manufacturers will find it difficult to complete the complete test of the integrated circuit product's test items.

[0056] To address the problems existing in the aforementioned related technologies, embodiments of the present invention provide a test vectorless integrated circuit product testing method. This method can be applied to servers, terminals, and systems including terminals and servers, and is implemented through the interaction between the terminal and the server. The server can be a standalone server or a server cluster composed of multiple servers. Terminals can be, but are not limited to, various personal computers, laptops, smartphones, tablets, IoT devices, and portable wearable devices. IoT devices can include smart speakers, smart TVs, smart air conditioners, smart in-vehicle devices, etc. Portable wearable devices can include smartwatches, smart bracelets, head-mounted devices, etc. It should be noted that the quantities such as "multiple" mentioned in the embodiments of this application all refer to a quantity of "at least two," for example, "multiple" means "at least two."

[0057] In one embodiment, such as Figure 1 As shown, a test vectorless integrated circuit product testing method is provided. This embodiment illustrates the application of this method to an ATE test system, which includes an ATE test board and a storage module. The method includes the following steps:

[0058] 102. For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases of the target test items and store all functional test cases in the storage module.

[0059] The storage module can be a non-volatile memory. It should be noted that the storage module can store all functional test cases in address blocks. In practical applications, the specific model of the storage module is selected based on the capacity and read / write speed of the test items of the target integrated circuit product. Specifically, the storage module can be NAND Flash or NOR Flash; this application embodiment does not impose specific limitations on this. Furthermore, the target integrated circuit product can be a more complex integrated circuit chip such as an FPGA, DSP, MCU, SoC, or CPU. For example, if the user needs to test a specific FPGA chip, the target integrated circuit product can be that FPGA chip.

[0060] In addition, the test items for the target integrated circuit product may include DC parameters, AC parameters, interface parameters, functions and application performance. DC parameters may include input voltage, output voltage, pin current, drive voltage, drive current, short-circuit current and open-circuit current. AC parameters may include input clock, system clock, time delay and operating frequency. This application embodiment does not specifically limit these parameters.

[0061] In this context, it's important to note that input voltage, output voltage, and pin current are DC parameters that do not require test vectors for testing, while drive voltage, drive current, short-circuit current, and open-circuit current are DC parameters that do require test vectors. Input clock and system clock are AC parameters that do not require test vectors, while time delay and operating frequency are AC parameters that do require test vectors. Therefore, to improve testing efficiency, these parameters need to be categorized before testing. Specifically, input voltage, output voltage, and pin current can be considered as one test item; drive voltage, drive current, short-circuit current, and open-circuit current as another; input clock and system clock as another; time delay and operating frequency as another; functionality as another; and application performance as another.

[0062] It is understandable that among the above test items, the test items consisting of driving voltage, driving current, short-circuit current and open-circuit current, the test items consisting of time delay and operating frequency, the test items consisting of functions and the test items consisting of application performance are all target test items that depend on test vectors. Accordingly, the ATE test system obtains the functional test cases for each target test item.

[0063] 104. Determine the current test items to be tested for the target integrated circuit product.

[0064] For example, if the current test item consists of drive voltage, drive current, short-circuit current and open-circuit current, the ATE test system will determine that the current test item to be tested is this test item consisting of drive voltage, drive current, short-circuit current and open-circuit current.

[0065] 106. Determine whether the current test item to be tested is a target test item that depends on the test vector. If so, retrieve the target function test case from the storage module, test the target integrated circuit product through the target function test case, and obtain the test results of the target integrated circuit product.

[0066] Specifically, before step 106, the ATE testing system can establish a test item library based on all test items that depend on the test vector. Accordingly, it determines whether there is a test item in the test item library that matches the current test item to be tested. If there is, it is determined that the current test item to be tested is a test item that depends on the test vector; if there is no, it is determined that the current test item to be tested is not a test item that depends on the test vector.

[0067] Among them, the target function test cases refer to the functional test cases of the current test item.

[0068] The test procedures for the above-mentioned test items consisting of input voltage, output voltage, and pin current; test items consisting of drive voltage, drive current, short-circuit current, and open-circuit current; test items consisting of input clock and system clock; test items consisting of time delay and operating frequency; and test items consisting of functions can be described as follows: Figure 2 As shown. Figure 2 As shown, connectivity testing of the target integrated circuit product is required before conducting various test items.

[0069] 108. Based on the test results, determine whether the current test item has passed the test.

[0070] In the aforementioned test method for integrated circuit products without test vectors, functional test cases for target test items that belong to the target integrated circuit product and depend on test vectors are obtained and stored in a storage module. The current test item to be tested on the target integrated circuit product is determined. It is then determined whether the current test item to be tested is a target test item dependent on test vectors. If so, the target functional test cases are retrieved from the storage module, and the target integrated circuit product is tested using these test cases to obtain the test results. Based on the test results, it is determined whether the current test item to be tested passes the test. It is understandable that traditional ATE functional testing and some parameter testing require test vectors, which need to be provided by the manufacturing unit, are highly specialized, and are closely related to the design unit. This application, by obtaining functional test cases for target test items dependent on test vectors and storing all functional test cases in a storage module, allows for the reasonable retrieval of functional test cases for target test items when testing them. This enables testing of test items lacking test vectors when the integrated circuit product manufacturer is unwilling or unable to provide test vectors, and offers greater testing flexibility.

[0071] In one embodiment, such as Figure 3 As shown, the target function test cases are retrieved from the storage module, and the target integrated circuit product is tested using the target function test cases to obtain the test results of the target integrated circuit product, including:

[0072] 302. Obtain the address of the target function test case.

[0073] Each functional test case in the storage module has a corresponding address, allowing the ATE testing system to obtain the address of the target functional test case.

[0074] 304. Read the target function test cases from the storage module based on the address, and load the read target function test cases into the target integrated circuit product.

[0075] 306. If loading is successful, configure the target function test cases, test mode, environment test parameters and test sequence for the target integrated circuit product, and configure the target function test cases; the environment test mode, test parameters and test sequence are all determined based on the current test item to be tested.

[0076] 308. Based on the configured target function test cases, test modes, environmental test parameters and test sequence, test the target integrated circuit product and obtain the test results.

[0077] Specifically, the testing process for the current test item can be as follows: Figure 4 As shown. Figure 4 "Test failed" means the current test item failed the test, and "test passed" means the current test item passed the test. For example... Figure 4 As shown, before loading the target function test cases, the test pins to be tested when testing the current test item can also be determined.

[0078] In this embodiment, the address of the target function test case is obtained; the target function test case is read from the storage module based on the address and loaded into the target integrated circuit product; if the loading is successful, the target function test cases, test mode, environmental test parameters, and test sequence are configured for the target integrated circuit product, and the environmental test mode, test parameters, and test sequence are all determined based on the current test item; based on the configured target function test cases, test mode, environmental test parameters, and test sequence, the target integrated circuit product is tested to obtain test results. This allows for testing of test items lacking test vectors when integrated circuit product manufacturers are unwilling or unable to provide them, and offers high testing flexibility.

[0079] In one embodiment, the ATE test board further includes a switch array; loading the read target functional test cases into the target integrated circuit product includes:

[0080] The test path is obtained based on the switch array.

[0081] The function of a switch array is to provide a pathway for loading and configuring functional test cases for a target integrated circuit product. The switch array can be implemented using PCB routing bridging, FPGA bridging, or other dedicated configuration bridging circuits. For example, if the target integrated circuit product is an FPGA chip, the switch array can be configured as a configuration chip for the FPGA chip to enable the loading and configuration of functional test cases for the FPGA chip.

[0082] According to the test path, load the read target function test cases into the target integrated circuit product.

[0083] Specifically, the structural block diagram of the ATE test board can be as follows: Figure 5 As shown, Figure 5 The chip under test in the text refers to the target integrated circuit product, and functions 1 to 7 refer to the functional test cases of each target test item.

[0084] In this embodiment, the test path is obtained based on a switch array; according to the test path, the read target functional test cases are loaded onto the target integrated circuit product. This enables the selection and loading of functional test cases for each target test item, meeting the configuration requirements for functional test cases during testing of different target test items.

[0085] In one embodiment, after determining whether the current test item under test is a target test item that depends on the test vector, the method further includes:

[0086] If not, configure the target integrated circuit product with the default test mode, environmental test parameters and test sequence; test the target integrated circuit product based on the default test mode, environmental test parameters and test sequence, and obtain the test results of the target integrated circuit product.

[0087] In this embodiment, when the current test item to be tested is not a target test item that depends on the test vector, the target integrated circuit product is configured with a default test mode, environmental test parameters and test timing; based on the default test mode, environmental test parameters and test timing, the target integrated circuit product is tested to obtain the test results of the target integrated circuit product, thereby realizing the testing of the current test item to be tested.

[0088] In one embodiment, determining whether the current test item passes the test based on the test results includes:

[0089] Determine whether the test result matches the preset test result. If they match, the current test item passes the test; otherwise, the current test item fails the test.

[0090] The preset test results can be determined based on the design specifications of the current test item.

[0091] In one embodiment, obtaining functional test cases for the target test project includes:

[0092] Extract content from the datasheet and design specification documents of the target integrated circuit product to obtain functional test cases for the target test items.

[0093] In this embodiment, functional test cases for the target test item are obtained by extracting content from the datasheet and design specification documents of the target integrated circuit product.

[0094] like Figure 6 As shown, an embodiment of a test method for integrated circuit products without test vectors is provided. This embodiment includes:

[0095] 602. For target test items that are subordinate to the target integrated circuit product and depend on test vectors, extract the contents of the datasheet and design specification documents of the target integrated circuit product to obtain the functional test cases of the target test items, and store all functional test cases in the storage module;

[0096] 604. Determine the current test items for the target integrated circuit product;

[0097] 606. Determine whether the current test item under test is a target test item that depends on the test vector. If so, obtain the address of the target function test case; read the target function test case from the storage module based on the address, and load the read target function test case into the target integrated circuit product; if the loading is successful, configure the target function test case, test mode, environmental test parameters, and test sequence into the target integrated circuit product, and configure the target function test case; the environmental test mode, test parameters, and test sequence are all determined based on the current test item under test; based on the configured target function test case, test mode, environmental test parameters, and test sequence, test the target integrated circuit product and obtain the test results;

[0098] 608. Determine whether the test result matches the preset test result. If they match, the current test item passes the test; otherwise, the current test item fails the test.

[0099] For a detailed explanation of the terms and steps involved in steps 602 to 608, please refer to the detailed explanation of terms and steps in the above embodiments.

[0100] It should be understood that although the steps in the flowcharts of the embodiments described above are shown sequentially according to the arrows, these steps are not necessarily executed in the order indicated by the arrows. Unless explicitly stated herein, there is no strict order restriction on the execution of these steps, and they can be executed in other orders. Moreover, at least some steps in the flowcharts of the embodiments described above may include multiple steps or multiple stages. These steps or stages are not necessarily completed at the same time, but can be executed at different times. The execution order of these steps or stages is not necessarily sequential, but can be performed alternately or in turn with other steps or at least some of the steps or stages of other steps.

[0101] Based on the same inventive concept, this application also provides an integrated circuit product testing apparatus for implementing the aforementioned test vector-less integrated circuit product testing method. The solution provided by this apparatus is similar to the implementation described in the above method; therefore, the specific limitations in one or more embodiments of the integrated circuit product testing apparatus provided below can be found in the limitations of the test vector-less integrated circuit product testing method described above, and will not be repeated here.

[0102] In one embodiment, such as Figure 7 As shown, a test vectorless integrated circuit product testing device is provided, comprising: an acquisition module 702, a first determination module 704, a judgment module 706, and a second determination module 708, wherein:

[0103] The acquisition module 702 is used to acquire functional test cases for target test items that belong to the target integrated circuit product and depend on test vectors, and store all functional test cases in the storage module;

[0104] The first determining module 704 is used to determine the current test items to be tested for the target integrated circuit product;

[0105] The judgment module 706 is used to determine whether the current test item to be tested is a target test item that depends on the test vector. If so, the target function test case is retrieved from the storage module, and the target integrated circuit product is tested through the target function test case to obtain the test result of the target integrated circuit product.

[0106] The second determining module 708 is used to determine whether the current test item has passed the test based on the test results.

[0107] In one embodiment, the determination module 706 includes:

[0108] The acquisition unit is used to obtain the address of the target function test case;

[0109] The loading unit is used to read target function test cases from the storage module based on the address and load the read target function test cases into the target integrated circuit product;

[0110] The configuration unit is used to configure the target function test cases, test modes, environmental test parameters and test sequences to the target integrated circuit product if the loading is successful, and to configure the target function test cases; the environmental test mode, test parameters and test sequences are all determined based on the current test item to be tested;

[0111] The test unit is used to test the target integrated circuit product based on the configured target function test cases, test modes, environmental test parameters and test sequence, and obtain test results.

[0112] In one embodiment, the loading unit includes:

[0113] Obtain sub-units to acquire test paths based on the switch-to-switching array;

[0114] The loading subunit is used to load the read target function test cases into the target integrated circuit product according to the test path.

[0115] In one embodiment, the device further includes:

[0116] The test module is used to configure the default test mode, environmental test parameters, and test sequence for the target integrated circuit product if no; and to test the target integrated circuit product based on the default test mode, environmental test parameters, and test sequence to obtain the test results of the target integrated circuit product.

[0117] In one embodiment, the second determining module 708 includes:

[0118] The judgment unit is used to determine whether the test result matches the preset test result. If they match, the current test item passes the test; otherwise, the current test item fails the test.

[0119] In one embodiment, the acquisition module 702 includes:

[0120] The extraction unit is used to extract content from the datasheet and design specification documents of the target integrated circuit product to obtain functional test cases for the target test items.

[0121] Each module in the aforementioned integrated circuit product testing device can be implemented entirely or partially through software, hardware, or a combination thereof. These modules can be embedded in or independent of the processor in a computer device, or stored in the memory of a computer device as software, so that the processor can call and execute the operations corresponding to each module.

[0122] In one embodiment, a computer device is provided, which may be a server, and its internal structure diagram may be as follows: Figure 8As shown, the computer device includes a processor, memory, and a network interface connected via a system bus. The processor provides computing and control capabilities. The memory includes non-volatile storage media and internal memory. The non-volatile storage media stores the operating system, computer programs, and a database. The internal memory provides an environment for the operation of the operating system and computer programs in the non-volatile storage media. The database stores test items, functional test cases, and test result data. The network interface communicates with external terminals via a network connection. When the computer program is executed by the processor, it implements a test vectorless integrated circuit product testing method.

[0123] Those skilled in the art will understand that Figure 8 The structure shown is merely a block diagram of a portion of the structure related to the present application and does not constitute a limitation on the computer device to which the present application is applied. Specific computer devices may include more or fewer components than those shown in the figure, or combine certain components, or have different component arrangements.

[0124] In one embodiment, a computer device is provided, including a memory and a processor, wherein the memory stores a computer program, and the processor executes the computer program to perform the following steps:

[0125] For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases for the target test items and store all functional test cases in the storage module; determine the current test item to be tested for the target integrated circuit product; determine whether the current test item to be tested is a target test item that depends on test vectors; if so, retrieve the target functional test cases from the storage module, test the target integrated circuit product using the target functional test cases, and obtain the test results for the target integrated circuit product; based on the test results, determine whether the current test item to be tested passes the test.

[0126] In one embodiment, when the processor executes the computer program, it further performs the following steps: obtaining the address of the target function test case; reading the target function test case from the storage module based on the address, and loading the read target function test case into the target integrated circuit product; if the loading is successful, configuring the target function test case, test mode, environmental test parameters, and test timing to the target integrated circuit product, and configuring the target function test case; the environmental test mode, test parameters, and test timing are all determined based on the current test item to be tested; and testing the target integrated circuit product based on the configured target function test case, test mode, environmental test parameters, and test timing to obtain test results.

[0127] In one embodiment, when the processor executes the computer program, it also performs the following steps: obtaining a test path based on a switch array; and loading the read target function test cases into the target integrated circuit product according to the test path.

[0128] In one embodiment, when the processor executes the computer program, it further performs the following steps: if not, configures a default test mode, environmental test parameters, and test timing for the target integrated circuit product; tests the target integrated circuit product based on the default test mode, environmental test parameters, and test timing to obtain the test results of the target integrated circuit product.

[0129] In one embodiment, when the processor executes the computer program, it further performs the following steps: determining whether the test result matches the preset test result; if they match, the current test item passes the test; otherwise, the current test item fails the test.

[0130] In one embodiment, when the processor executes the computer program, it also performs the following steps: extracting the contents of the datasheet and design specification documents of the target integrated circuit product to obtain functional test cases for the target test item.

[0131] In one embodiment, a computer-readable storage medium is provided having a computer program stored thereon, the computer program performing the following steps when executed by a processor:

[0132] For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases for the target test items and store all functional test cases in the storage module; determine the current test item to be tested for the target integrated circuit product; determine whether the current test item to be tested is a target test item that depends on test vectors; if so, retrieve the target functional test cases from the storage module, test the target integrated circuit product using the target functional test cases, and obtain the test results for the target integrated circuit product; based on the test results, determine whether the current test item to be tested passes the test.

[0133] In one embodiment, when the computer program is executed by the processor, it further performs the following steps: obtaining the address of the target function test case; reading the target function test case from the storage module based on the address, and loading the read target function test case into the target integrated circuit product; if the loading is successful, configuring the target function test case, test mode, environmental test parameters, and test timing to the target integrated circuit product, and configuring the target function test case; the environmental test mode, test parameters, and test timing are all determined based on the current test item to be tested; and testing the target integrated circuit product based on the configured target function test case, test mode, environmental test parameters, and test timing to obtain test results.

[0134] In one embodiment, when the computer program is executed by the processor, it further performs the following steps: obtaining a test path based on a switch array; and loading the read target function test cases into the target integrated circuit product according to the test path.

[0135] In one embodiment, when the computer program is executed by the processor, it further performs the following steps: if not, configure a default test mode, environmental test parameters, and test timing for the target integrated circuit product; test the target integrated circuit product based on the default test mode, environmental test parameters, and test timing to obtain the test results of the target integrated circuit product.

[0136] In one embodiment, when the computer program is executed by the processor, it further performs the following steps: determining whether the test result matches the preset test result; if they match, the current test item passes the test; otherwise, the current test item fails the test.

[0137] In one embodiment, when the computer program is executed by the processor, it also performs the following steps: extracting the contents of the datasheet and design specification documents of the target integrated circuit product to obtain functional test cases for the target test item.

[0138] In one embodiment, a computer program product is provided, including a computer program that, when executed by a processor, performs the following steps:

[0139] For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases for the target test items and store all functional test cases in the storage module; determine the current test item to be tested for the target integrated circuit product; determine whether the current test item to be tested is a target test item that depends on test vectors; if so, retrieve the target functional test cases from the storage module, test the target integrated circuit product using the target functional test cases, and obtain the test results for the target integrated circuit product; based on the test results, determine whether the current test item to be tested passes the test.

[0140] In one embodiment, when the computer program is executed by the processor, it further performs the following steps: obtaining the address of the target function test case; reading the target function test case from the storage module based on the address, and loading the read target function test case into the target integrated circuit product; if the loading is successful, configuring the target function test case, test mode, environmental test parameters, and test timing to the target integrated circuit product, and configuring the target function test case; the environmental test mode, test parameters, and test timing are all determined based on the current test item to be tested; and testing the target integrated circuit product based on the configured target function test case, test mode, environmental test parameters, and test timing to obtain test results.

[0141] In one embodiment, when the computer program is executed by the processor, it further performs the following steps: obtaining a test path based on a switch array; and loading the read target function test cases into the target integrated circuit product according to the test path.

[0142] In one embodiment, when the computer program is executed by the processor, it further performs the following steps: if not, configure a default test mode, environmental test parameters, and test timing for the target integrated circuit product; test the target integrated circuit product based on the default test mode, environmental test parameters, and test timing to obtain the test results of the target integrated circuit product.

[0143] In one embodiment, when the computer program is executed by the processor, it further performs the following steps: determining whether the test result matches the preset test result; if they match, the current test item passes the test; otherwise, the current test item fails the test.

[0144] In one embodiment, when the computer program is executed by the processor, it also performs the following steps: extracting the contents of the datasheet and design specification documents of the target integrated circuit product to obtain functional test cases for the target test item.

[0145] Those skilled in the art will understand that all or part of the processes in the methods of the above embodiments can be implemented by a computer program instructing related hardware. The computer program can be stored in a non-volatile computer-readable storage medium, and when executed, it can include the processes of the embodiments of the methods described above. Any references to memory, storage, databases, or other media used in the embodiments provided in this application can include at least one of non-volatile and volatile memory. Non-volatile memory can include read-only memory (ROM), magnetic tape, floppy disk, flash memory, or optical storage, etc. Volatile memory can include random access memory (RAM) or external cache memory. By way of illustration and not limitation, RAM can be in various forms, such as static random access memory (SRAM) or dynamic random access memory (DRAM), etc.

[0146] The technical features of the above embodiments can be combined in any way. For the sake of brevity, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0147] The embodiments described above are merely illustrative of several implementation methods of this application, and while the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the invention patent. It should be noted that those skilled in the art can make various modifications and improvements without departing from the concept of this application, and these all fall within the protection scope of this application. Therefore, the protection scope of this patent application should be determined by the appended claims.

Claims

1. A test method for integrated circuit products without test vectors, characterized in that, The method is applied to an ATE test system, the ATE test system including an ATE test board, the ATE test board including a storage module; the method includes: For target test items that belong to the target integrated circuit product and depend on test vectors, obtain the functional test cases of the target test items and store all functional test cases in the storage module; Determine the current test items for the target integrated circuit product; Determine whether the current test item to be tested is a target test item that depends on the test vector. If so, retrieve the target function test case from the storage module, test the target integrated circuit product through the target function test case, and obtain the test result of the target integrated circuit product. Based on the test results, determine whether the current test item passes the test.

2. The method according to claim 1, characterized in that, The step of retrieving the target function test cases from the storage module, testing the target integrated circuit product using the target function test cases, and obtaining the test results of the target integrated circuit product includes: Obtain the address of the target function test case; The target function test case is read from the storage module based on the address, and the read target function test case is loaded into the target integrated circuit product; If loading is successful, then the target integrated circuit product is configured with target function test cases, test modes, environmental test parameters, and test sequences; the test modes, environmental test parameters, and test sequences are all determined based on the current test item to be tested. Based on the configured target function test cases, test modes, environmental test parameters, and test sequence, the target integrated circuit product is tested to obtain the test results.

3. The method according to claim 2, characterized in that, The ATE test board also includes a switch array; loading the read target function test cases into the target integrated circuit product includes: Based on the switch array, the test path is obtained; According to the test path, the read target function test cases are loaded into the target integrated circuit product.

4. The method according to claim 1, characterized in that, After determining whether the current test item to be tested is a target test item that depends on the test vector, the method further includes: If not, configure the target integrated circuit product with the default test mode, environmental test parameters and test sequence; test the target integrated circuit product based on the default test mode, environmental test parameters and test sequence, and obtain the test results of the target integrated circuit product.

5. The method according to claim 1, characterized in that, The step of determining whether the current test item passes the test based on the test results includes: Determine whether the test result matches the preset test result. If they match, the current test item passes the test; otherwise, the current test item fails the test.

6. The method according to claim 1, characterized in that, The process of obtaining the functional test cases for the target test project includes: The datasheets and design specifications of the target integrated circuit product are extracted to obtain functional test cases for the target test item.

7. A test apparatus for integrated circuit products without test vectors, characterized in that, The device includes: The acquisition module is used to acquire functional test cases for target test items that belong to the target integrated circuit product and depend on test vectors, and store all functional test cases in the storage module; The first determining module is used to determine the current test items to be tested for the target integrated circuit product; The judgment module is used to determine whether the current test item to be tested is a target test item that depends on the test vector. If so, the target function test case is retrieved from the storage module, and the target integrated circuit product is tested through the target function test case to obtain the test result of the target integrated circuit product. The second determining module is used to determine whether the current test item to be tested has passed the test based on the test results.

8. A computer device comprising a memory and a processor, wherein the memory stores a computer program, characterized in that, When the processor executes the computer program, it implements the steps of the method according to any one of claims 1 to 6.

9. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

10. A computer program product, comprising a computer program, characterized in that, When the computer program is executed by a processor, it implements the steps of the method according to any one of claims 1 to 6.

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