Image non-uniformity correction method and device, infrared image device and storage medium
By decomposing and reconstructing infrared images using wavelet transform, the non-uniformity problem of infrared focal plane array detectors is solved, enabling fast and clear image correction and reducing ghosting and information loss.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- YANTAI IRAY TECHNOLOGY CO LTD
- Filing Date
- 2022-08-03
- Publication Date
- 2026-06-12
AI Technical Summary
Infrared focal plane array detectors (IRFPAs) suffer from severe non-uniformity issues, resulting in fixed pattern noise (FPN) in infrared images. Existing correction methods struggle to balance the convergence speed and stability of the algorithm and are prone to ghosting effects.
Wavelet transform is used to decompose the in-focus and out-of-focus images. The high-frequency components of the out-of-focus image are used to determine the noise components of the fixed image. The inverse wavelet transform is used to reconstruct the image, accurately decompose and represent the image details, and reduce the occurrence of ghosting.
It effectively protects the edge components of the target scene, reduces ghosting, and quickly and clearly obtains images after non-uniformity correction, avoiding information loss and redundancy.
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