Analog-to-digital conversion detection device and data acquisition system

Abstract

The present application relates to an analog-to-digital conversion detection device and a data acquisition system. The device includes a signal input unit, a signal control unit, an acquisition module, an adjustment unit, and a processing unit. One end of the signal input unit is used to connect to an ion detector, and the other end is connected to the signal control unit. The signal control unit is connected to the acquisition module and the processing unit. The signal control unit receives configuration information transmitted by the processing unit and, based on the configuration information, instructs the acquisition module to enter a corresponding acquisition mode, which includes an ADC acquisition mode and a TDC acquisition mode. The processing unit is connected to the acquisition module for receiving and processing acquired data. The adjustment unit is respectively connected to the processing unit, the acquisition module, and the signal control unit. The present application switches the acquisition mode through the signal control unit in a segmented conversion manner to achieve a wide range of current counting detection. At the same time, it can flexibly adapt to application scenarios such as single-mode and dual-mode ion detectors, with high compatibility, low hardware cost, and strong reliability.

Description

Technical Field

[0001] The present application relates to the field of electronic technology, and in particular to an analog-to-digital conversion detection device and a data acquisition system. Background Art

[0002] Mass spectrometers are crucial tools used in modern physics and chemistry. They consist of a sample injection system, an ion source, a mass analyzer, and a detector. Data acquisition systems collect, detect, and analyze the ion signals output by the detector.

[0003] However, traditional data acquisition solutions have poor compatibility with different detectors and high development costs. Summary of the Invention

[0004] Based on this, it is necessary to provide an analog-to-digital conversion detection device and a data acquisition system with high compatibility and low development cost to address the above technical problems.

[0005] To achieve the above-mentioned objectives, on the one hand, the present application provides an analog-to-digital conversion detection device, the system including a signal input unit, a signal control unit, an acquisition module, an adjustment unit, and a processing unit; wherein:

[0006] The input end of the signal input unit is used to connect to the ion detector and receive the current signal output by the ion detector; the output end of the signal input unit is connected to the signal control unit;

[0007] The signal control unit is connected to the processing unit and is used to receive configuration information transmitted by the processing unit and instruct the acquisition module to enter a corresponding acquisition mode based on the configuration information to acquire the current signal and output the acquired data; the acquisition mode includes one of an ADC acquisition mode and a TDC acquisition mode;

[0008] The processing unit is connected to the acquisition module and is used to receive and process the collected data and output control signals and feedback information;

[0009] The adjustment unit is connected to the processing unit, the acquisition module and the signal control unit respectively; the adjustment unit is used to receive feedback information and adjust the acquisition parameters of the acquisition module in the ADC acquisition mode according to the feedback information; the adjustment unit is also used to receive a control signal and transmit the control signal to the signal control unit to instruct the signal control unit to control the acquisition module to enter the ADC acquisition mode or the TDC acquisition mode.

[0010] In one embodiment, the acquisition parameter includes a magnification; the acquisition module includes an ADC acquisition unit and a TDC count acquisition unit;

[0011] The input end of the ADC acquisition unit is connected to the signal control unit, the output end of the ADC acquisition unit is connected to the processing unit, and the control end of the ADC acquisition unit is connected to the adjustment unit;

[0012] The input end of the TDC counting and collecting unit is connected to the signal control unit, and the output end of the TDC counting and collecting unit is connected to the processing unit.

[0013] In one embodiment, the ADC acquisition unit includes an amplifier, a first amplifying circuit, a filtering circuit, and an ADC acquisition circuit connected in sequence; wherein the amplifier is connected to the signal control unit, the first amplifying circuit is connected to the regulating unit, and the ADC acquisition circuit is connected to the processing unit;

[0014] The TDC counting acquisition unit includes a sampling resistor, a second amplifying circuit, a comparator and a TDC counting module which are connected in sequence; wherein the sampling resistor is connected to the signal control unit, and the TDC counting module is connected to the processing unit.

[0015] In one embodiment, the amplifier includes a transimpedance amplifier; the first amplifying circuit includes a secondary amplifying circuit; the filtering circuit includes a second-order filtering circuit; and the comparator includes a high-speed comparator.

[0016] The second amplifier circuit includes a primary amplifier circuit and a secondary amplifier circuit; one end of the primary amplifier circuit is connected to the sampling resistor, the other end of the primary amplifier circuit is connected to one end of the secondary amplifier circuit, and the other end of the secondary amplifier circuit is connected to the comparator.

[0017] In one embodiment, the system further includes a host computer and an overvoltage protection module; the overvoltage protection module is connected between the output end of the signal input unit and the signal control unit; the processing unit includes a signal analyzer and a processor;

[0018] The signal analyzer is connected to the ADC acquisition unit, the TDC counting acquisition unit and the adjustment unit respectively;

[0019] The processor is respectively connected to the ADC acquisition unit, the TDC count acquisition unit, the adjustment unit and the signal control unit; and the processor is connected to the host computer.

[0020] In one embodiment, the configuration information is a configuration parameter for an ADC acquisition unit; the feedback information includes a value of an amplification factor;

[0021] The signal analyzer is used to receive and analyze the collected data transmitted by the ADC acquisition unit, obtain the intensity of the current signal, and determine the value of the amplification factor based on the intensity of the current signal. The signal analyzer is also used to output a stop signal to the signal control unit through the adjustment unit when the intensity of the current signal is greater than the protection threshold, thereby instructing the signal control unit to control the ADC acquisition unit to stop the signal acquisition action.

[0022] The processor is used to receive and analyze the acquisition data transmitted by the ADC acquisition unit, and receive the value of the amplification factor fed back by the adjustment unit, and when the value of the amplification factor is the maximum value and the intensity of the current signal is less than the threshold, output a first acquisition signal to the signal control unit to instruct the signal control unit to control the ADC acquisition unit to stop the signal acquisition action, and control the TDC count acquisition unit to perform the signal acquisition action.

[0023] In one embodiment, the signal analyzer is used to output a second acquisition signal to the signal control unit through the adjustment unit when the value of the amplification factor is the maximum value and the intensity of the current signal is less than the threshold value, so as to instruct the signal control unit to control the ADC acquisition unit to stop the signal acquisition action and control the TDC count acquisition unit to perform the signal acquisition action.

[0024] In one embodiment, the configuration information is a configuration parameter for an ADC acquisition unit, or a configuration parameter for a TDC count acquisition unit; the feedback information includes a value of an amplification factor;

[0025] The processor receives the acquisition mode information transmitted by the host computer, and outputs configuration information to the signal control unit according to the acquisition mode information, so as to instruct the signal control unit to control the ADC acquisition unit to perform the signal acquisition action, or to control the TDC count acquisition unit to perform the signal acquisition action;

[0026] The processor receives and analyzes the collected data, obtains the intensity of the current signal, and determines the value of the amplification factor according to the intensity of the current signal;

[0027] When the processor determines that the acquisition mode needs to be switched according to the acquisition logic, it outputs a switching instruction to the signal control unit to instruct the signal control unit to control the switching between the ADC acquisition unit and the TDC count acquisition unit.

[0028] On the other hand, the present application also provides a data acquisition system, which includes an ion detector and the above-mentioned analog-to-digital conversion detection device; the analog-to-digital conversion detection device is connected to the ion detector.

[0029] In one embodiment, the ion detector includes a discrete dynode ion detector, a continuous dynode ion detector, and an MCP detector.

[0030] The analog-to-digital conversion detection device in the present application includes a signal input unit, a signal control unit, an acquisition module, an adjustment unit and a processing unit. The input end of the signal input unit is used to connect to the ion detector, and the output end is connected to the signal control unit; the signal control unit is connected to the processing unit; the processing unit is connected to the acquisition module; the adjustment unit is respectively connected to the processing unit, the acquisition module and the signal control unit; in the present application, the signal control unit instructs the acquisition module to enter the corresponding acquisition mode based on the configuration information transmitted by the processing unit, the processing unit receives and processes the acquisition data output by the acquisition module, and switches the acquisition mode through the signal control unit to achieve a wide range of current counting detection. At the same time, the present application can be flexibly adapted to application scenarios such as single-mode and dual-mode ion detectors, with high compatibility, low hardware cost and strong reliability. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 is a structural block diagram of an analog-to-digital conversion detection device in one embodiment;

[0032] Figure 2 Schematic diagram of the structure of the acquisition module in one embodiment;

[0033] Figure 3 is a schematic diagram of a collection module in one embodiment;

[0034] Figure 4 Schematic diagram of the structure of an analog-to-digital conversion detection device in one embodiment;

[0035] Figure 5 A schematic diagram of the working process of an analog-to-digital conversion detection device in one embodiment;

[0036] Figure 6 Schematic diagram of the working process of the analog-to-digital conversion detection device in another embodiment. DETAILED DESCRIPTION

[0037] To facilitate understanding of the present application, the present application will be described in more detail below with reference to the relevant drawings. Embodiments of the present application are provided in the drawings. However, the present application can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, the purpose of providing these embodiments is to make the disclosure of the present application more thorough and comprehensive. Unless otherwise defined, all technical and scientific terms used herein have the same meaning as those commonly understood by those skilled in the art to which the present application belongs. The terms used herein in the specification of the present application are only for the purpose of describing specific embodiments and are not intended to limit the present application. It will be understood that the terms "first", "second", etc. used in the present application can be used herein to describe various elements, but these elements are not limited by these terms. These terms are only used to distinguish a first element from another element.

[0038] Spatially relative terms such as "under," "beneath," "beneath," "under," "above," "above," etc., may be used herein to describe the relationship of an element or feature shown in the figures to other elements or features. It should be understood that in addition to the orientations shown in the figures, spatially relative terms also include different orientations of the device in use and operation. For example, if the device in the drawings is turned over, the element or feature described as "under" or "beneath" or "beneath" the other elements will be oriented as "above" the other elements or features. Thus, the exemplary terms "under" and "under" can include both upper and lower orientations. In addition, the device can also include alternative orientations (e.g., rotated 90 degrees or other orientations), and the spatial descriptors used herein are interpreted accordingly.

[0039] It should be noted that when an element is considered to be "connected" to another element, it can be directly connected to another element, or connected to another element through an intermediate element. In addition, the "connection" in the following embodiments should be understood as "electrical connection", "communication connection" and the like if there is a transmission of electrical signals or data between the connected objects. When used herein, the singular forms "one", "an" and " / the" may also include plural forms, unless the context clearly indicates otherwise. It should also be understood that the terms "include / comprise" or "have" etc. specify the existence of stated features, wholes, steps, operations, components, parts or combinations thereof, but do not exclude the possibility of the existence or addition of one or more other features, wholes, steps, operations, components, parts or combinations thereof. Meanwhile, the terms "and / or" used in this manual include any and all combinations of the relevant listed items.

[0040] Currently, there are two main types of data acquisition devices on the market: analog-to-digital converters (ADCs) and time-to-digital converters (TDCs). In the embodiments of the present application, an ADC may refer to a device or apparatus that converts a continuously changing analog signal into a historical digital signal, and a TDC may refer to an instrument in electronic instrumentation or signal processing that converts an analog signal into a digital signal represented by time.

[0041] Traditional data acquisition devices have at least the following problems: ① Common acquisition schemes are incompatible with both TDC counting and ADC current acquisition, and they also have poor compatibility with different ion detectors, resulting in high development costs. ② When using a single ADC or TDC as a data acquisition device, the operational amplifiers and high-speed comparators in the high-frequency signal acquisition circuit must maintain extremely high bandwidth and high slew rate, while the power supply module must also ensure ultra-low voltage noise, resulting in excessively high hardware costs. ③ When using a single TDC as a data acquisition device, operating in digital counting output mode, high-concentration signal counts place very high demands. Once the counting frequency reaches a certain upper limit, the TDC counting module in the MCU (Microcontroller Unit) faces challenges. On the one hand, as the number of counter bits increases, it becomes difficult to maintain low signal jitter between corresponding registers. On the other hand, as the clock frequency increases, the clock jitter effect increases dramatically. These two factors together lead to an increase in the number of registers with metastable states, which in turn increases the probability of counting errors.

[0042] It should be noted that a microcontroller unit (MCU), also known as a single-chip microcomputer or single-chip microcomputer, is a computer that reduces the frequency and specifications of a central processing unit (CPU) and integrates peripheral interfaces such as memory, counters, USB (Universal Serial Bus), A / D conversion (analog-to-digital conversion), UART (Universal Asynchronous Receiver / Transmitter), PLC (Programmable Logic Controller), DMA (Direct Memory Access), and even LCD (Liquid Crystal Display) driver circuits on a single chip to form a chip-level computer that provides different control combinations for different applications.

[0043] This application relates to an analog-to-digital conversion detection device that can convert digital / analog current signals generated by an ion detector into detection signals. It also supports user-selectable detection modes, enabling the acquisition and conversion of digital and analog micro-signals. Embodiments of this application can be applied to discrete dynode ion detectors, continuous dynode ion detectors, MCP (Micro Channel Plate) detectors, and other types of ion detectors. To further clarify the objectives, technical solutions, and advantages of this application, the application is described in further detail below in conjunction with the accompanying drawings and examples. It should be understood that the specific embodiments described herein are intended solely to illustrate this application and are not intended to limit it.

[0044] In one embodiment, Figure 1 As shown, an analog-to-digital conversion detection device is provided. Taking the application of the device in a data acquisition system as an example, the device may include a signal input unit 100, a signal control unit 102, an acquisition module 200, an adjustment unit 104 and a processing unit 300; wherein:

[0045] The input end of the signal input unit 100 is used to connect to the ion detector and receive the current signal output by the ion detector; the output end of the signal input unit 100 is connected to the signal control unit 102;

[0046] The signal control unit 102 is connected to the processing unit 300 and is used to receive configuration information transmitted by the processing unit 300 and, based on the configuration information, instruct the acquisition module 200 to enter a corresponding acquisition mode to acquire the current signal and output the acquired data; the acquisition mode includes one of an ADC acquisition mode and a TDC acquisition mode;

[0047] The processing unit 300 is connected to the acquisition module 200 and is used to receive and process the collected data and output control signals and feedback information;

[0048] The adjustment unit 104 is respectively connected to the processing unit 300, the acquisition module 200 and the signal control unit 102; the adjustment unit 104 is used to receive feedback information and adjust the acquisition parameters of the acquisition module 200 in the ADC acquisition mode according to the feedback information; the adjustment unit 104 is also used to receive a control signal and transmit the control signal to the signal control unit 102 to instruct the signal control unit 102 to control the acquisition module 200 to enter the ADC acquisition mode or the TDC acquisition mode.

[0049] Specifically, if Figure 1 As shown, the signal input unit 100 can serve as a module for connecting to the output of the ion detector, and the current signal output by the ion detector is connected to the analog-to-digital conversion detection device through the signal input unit 100.

[0050] The signal control unit 102 receives the current signal output by the signal input unit 100 and the configuration information transmitted by the processing unit 300, respectively, and instructs the acquisition module 200 to enter the corresponding acquisition mode based on the configuration information; in an embodiment of the present application, the acquisition mode is an ADC acquisition mode or a TDC acquisition mode. At the same time, the signal control unit 102 can feedback the acquisition mode currently used by the acquisition module 200 to the processing unit 300; the present application can freely switch the post-stage acquisition mode, and provide real-time feedback on the current acquisition unit type.

[0051] After entering the corresponding acquisition mode (ADC acquisition mode or TDC acquisition mode), the acquisition module 200 performs an acquisition operation and executes an acquisition task. Specifically, the acquisition module 200 acquires the current signal and outputs the acquired data to the processing unit 300. In some examples, the acquisition module 200 can be implemented using a corresponding acquisition unit, such as an ADC acquisition unit, a TDC counter acquisition unit, etc.

[0052] Furthermore, the processing unit 300 receives the collected data transmitted by the acquisition module 200, processes the collected data, and outputs a control signal and feedback information. In some examples, the control signal may refer to any one or a combination of control instructions, control commands, etc.; the feedback information may refer to information used to adjust the acquisition parameters of the acquisition module 200; and the acquisition parameters may refer to parameters that can be adjusted in the acquisition module 200.

[0053] Adjustment unit 104 receives feedback information and adjusts acquisition parameters of acquisition module 200 in ADC acquisition mode based on the feedback information. Adjustment unit 104 also receives a control signal and transmits the control signal to signal control unit 102 to instruct signal control unit 102 to control acquisition module 200 to enter ADC acquisition mode or TDC acquisition mode. In some examples, adjustment unit 104 can be implemented using a switching device such as an analog switch.

[0054] As described above, the present application can realize the acquisition and conversion function of digital and analog micro signals. The present application has high applicability, low hardware cost and high reliability.

[0055] In one embodiment, Figure 2 As shown, the acquisition parameters may include amplification; the acquisition module 200 includes an ADC acquisition unit 202 and a TDC count acquisition unit 204;

[0056] The input end of the ADC acquisition unit 202 is connected to the signal control unit 102 , the output end of the ADC acquisition unit 202 is connected to the processing unit 300 , and the control end of the ADC acquisition unit 202 is connected to the adjustment unit 104 ;

[0057] An input end of the TDC count acquisition unit 204 is connected to the signal control unit 102 , and an output end of the TDC count acquisition unit 204 is connected to the processing unit 300 .

[0058] Specifically, the acquisition module 200 in the present application may include an ADC acquisition unit 202 and a TDC count acquisition unit 204; it can be understood that the ADC acquisition mode in the acquisition mode of the present application can be implemented using the ADC acquisition unit 202; the TDC acquisition mode in the acquisition mode of the present application can be implemented using the TDC count acquisition unit 204.

[0059] The control end of the ADC acquisition unit 202 is connected to the adjustment unit 104 , and the adjustment unit 104 adjusts the amplification factor of the ADC acquisition unit 202 .

[0060] In one embodiment, Figure 2 As shown, the ADC acquisition unit 202 includes an amplifier, a first amplifying circuit, a filtering circuit, and an ADC acquisition circuit connected in sequence; wherein the amplifier is connected to the signal control unit 102, the first amplifying circuit is connected to the regulating unit 104, and the ADC acquisition circuit is connected to the processing unit 300;

[0061] The TDC counting acquisition unit 204 includes a sampling resistor, a second amplifying circuit, a comparator, and a TDC counting module connected in sequence; wherein the sampling resistor is connected to the signal control unit 102 , and the TDC counting module is connected to the processing unit 300 .

[0062] Specifically, an amplifier may refer to a device that can amplify an input signal (current, voltage, etc.), such as an operational amplifier, a voltage amplifier, etc.; in some examples, the first amplification circuit and the second amplification circuit may be implemented using corresponding amplification circuits; further, an amplification circuit may refer to a circuit that can amplify an input signal (current, voltage, etc.) without distortion, such as a first-stage amplification circuit, a second-stage amplification circuit, etc.

[0063] In addition, the filter circuit in the embodiments of the present application may refer to a circuit that only allows signals within a certain frequency range to pass normally, while preventing signals in another frequency range from passing through, such as a first-order filter circuit, a second-order filter circuit, etc. The comparator in the embodiments of the present application may refer to a device that can compare two or more signals to determine whether they are equal, or to determine the size relationship and arrangement order between them. The device that can perform such a comparison function can generally be divided into low-power comparators and high-speed comparators.

[0064] In one embodiment, Figure 3 As shown, the amplifier includes a transimpedance amplifier; the first amplifying circuit includes a secondary amplifying circuit; the filtering circuit includes a second-order filtering circuit; and the comparator includes a high-speed comparator;

[0065] The second amplifier circuit includes a primary amplifier circuit and a secondary amplifier circuit; one end of the primary amplifier circuit is connected to the sampling resistor, the other end of the primary amplifier circuit is connected to one end of the secondary amplifier circuit, and the other end of the secondary amplifier circuit is connected to the comparator.

[0066] Specifically, if Figure 3As shown, when the signal control unit 102 is connected to the ADC acquisition unit 202 in the acquisition module 200, the current signal flows into the transimpedance amplifier and the secondary amplifier circuit for amplification, and then flows into the second-order filter circuit for filtering. After the filtering is completed, it flows into the ADC acquisition circuit. After the ADC acquisition circuit completes the acquisition action, it outputs the acquired data to the processing unit 300; when the signal control unit 102 is connected to the TDC counting acquisition unit 204 in the acquisition module 200, the current signal flows through the sampling resistor for sampling. After the sampling is completed, it flows into the primary amplifier circuit and the secondary amplifier circuit for amplification, and then flows into the high-speed comparator for comparison. After the comparison is completed, it flows into the TDC counting module for acquisition. After the TDC counting module completes the acquisition action, it outputs the acquired data to the processing unit 300.

[0067] In one embodiment, Figure 4 As shown, the system further includes a host computer 400 and an overvoltage protection module 106; the overvoltage protection module 106 is connected between the output end of the signal input unit and the signal control unit; the processing unit 300 includes a signal analyzer 302 and a processor 304;

[0068] The signal analyzer 302 is connected to the ADC acquisition unit 202, the TDC count acquisition unit 204 and the adjustment unit 104 respectively;

[0069] The processor 304 is connected to the ADC acquisition unit 202 , the TDC count acquisition unit 204 , the adjustment unit 104 and the signal control unit 102 respectively; the processor 304 is connected to the host computer 400 .

[0070] Specifically, the host computer 400 provides a window for the operator to configure the acquisition mode information. There is a transmission protocol between the host computer 400 and the processor 304. The host computer 400 can transmit the configured acquisition mode information to the processor 304 through the protocol. The acquisition mode information includes acquisition mode information and acquisition parameter information. In addition, the host computer 400 also reads the processed acquisition data output by the processor 304 and displays it on the interface.

[0071] The overvoltage protection module 106 is used for protection. When the current signal flowing into the overvoltage protection module 106 exceeds a predetermined maximum value, the overvoltage protection module 106 quickly responds to protect the subsequent circuit modules. The signal analyzer 302 can output a signal to the adjustment unit 104 based on the collected data output by the ADC acquisition unit 202 or the TDC count acquisition unit 204, thereby quickly switching the acquisition mode and providing hardware protection in special circumstances.

[0072] In some examples, the processor 304 is a microcontroller unit that integrates functional modules such as memory, timer, USB, A / D conversion, and UART. The processor 304 can be any one or a combination of a CPU, an MCU, etc. In the embodiment of the present application, the processor 304 serves as a data acquisition and processing hub and is connected to the host computer 400. In addition, in the embodiment of the present application, a storage unit for storing acquisition parameters is also designed in the internal logic resources of the processor 304.

[0073] Furthermore, the signal control unit 102 receives a control signal output by the signal analyzer 302 or the processor 304 . The signal control unit 102 receives the control signal and switches the connection with the ADC acquisition unit 202 or the TDC count acquisition unit 204 by controlling a switch-like device.

[0074] As described above, this application proposes an analog-to-digital conversion detection device, which is compatible with TDC counting and ADC current acquisition to achieve current counting detection in a wide range. At the same time, it can be flexibly adapted to application scenarios such as single-mode and dual-mode ion detectors. It has high applicability, low hardware cost and strong reliability.

[0075] To further illustrate the solution of the present application, a specific example is provided below. In one embodiment, the configuration information is a configuration parameter for an ADC acquisition unit; the feedback information includes a value of an amplification factor.

[0076] The signal analyzer is used to receive and analyze the collected data transmitted by the ADC acquisition unit, obtain the intensity of the current signal, and determine the value of the amplification factor based on the intensity of the current signal. The signal analyzer is also used to output a stop signal to the signal control unit through the adjustment unit when the intensity of the current signal is greater than the protection threshold, thereby instructing the signal control unit to control the ADC acquisition unit to stop the signal acquisition action.

[0077] The processor is used to receive and analyze the acquisition data transmitted by the ADC acquisition unit, and receive the value of the amplification factor fed back by the adjustment unit, and when the value of the amplification factor is the maximum value and the intensity of the current signal is less than the threshold, output a first acquisition signal to the signal control unit to instruct the signal control unit to control the ADC acquisition unit to stop the signal acquisition action, and control the TDC count acquisition unit to perform the signal acquisition action.

[0078] Specifically, if Figure 5 As shown, the processor is an MCU processor as an example. When the host computer does not provide the acquisition mode information to the processor, the processor first performs pre-configuration and outputs the configuration information to the signal control unit.

[0079] At this time, the signal control unit preferentially chooses to connect to the ADC acquisition unit and configures the acquisition mode to the ADC acquisition mode;

[0080] The ADC acquisition unit operates, performs acquisition tasks, and outputs the acquired data to the signal analyzer and processor;

[0081] The signal analyzer receives the collected data output by the ADC acquisition unit, performs collection and analysis on the collected data, and outputs feedback information to the adjustment unit;

[0082] After receiving the feedback information output by the signal analyzer, the adjustment unit automatically configures the amplification factor of the secondary amplifier circuit in the ADC acquisition unit;

[0083] The signal analyzer and the processor receive the collected data output by the ADC collection unit, and determine whether the collection unit needs to be switched according to the collection logic. If switching is required, the processor outputs a first collection signal to the signal control unit to instruct the signal control unit to control the ADC collection unit to stop the signal collection action and control the TDC counter collection unit to perform the signal collection action, or the signal analyzer outputs a second collection signal to the signal control unit through the adjustment unit to instruct the signal control unit to control the ADC collection unit to stop the signal collection action and control the TDC counter collection unit to perform the signal collection action;

[0084] When there is no need to switch the acquisition unit or the acquisition unit has been switched, the processor records and stores the collected data and uploads it to the host computer;

[0085] The host computer receives the collected data and displays it in the window.

[0086] Furthermore, the threshold value can be adjusted according to the intensity of the current signal output by the ion detector, and there is no specific value range; the protection threshold value can refer to the maximum current intensity that the signal analyzer can withstand;

[0087] The feedback information includes a numerical value for the amplification factor, wherein the signal analyzer adjusts the amplification factor based on the strength of the current signal output by the ADC acquisition unit. When the current signal strength increases, the amplification factor is reduced so that the adjusted current signal strength output by the ADC acquisition unit remains within a certain range. This range can refer to the range of current signal strengths that the signal analyzer can measure. Furthermore, the amplification factor in this application can be adjusted based on the current signal strength. The greater the current signal strength, the smaller the amplification factor, so that the final output remains within a standard range.

[0088] The acquisition logic is that when the value of the amplification factor is the maximum value and the intensity of the current signal is less than the threshold, it is necessary to switch to the TDC counting acquisition unit; when the value of the amplification factor is the minimum value and the intensity of the current signal is greater than the threshold, it is necessary to switch to the ADC counting unit.

[0089] In one embodiment, the signal analyzer is used to output a second acquisition signal to the signal control unit through the adjustment unit when the value of the amplification factor is the maximum value and the intensity of the current signal is less than the threshold value, so as to instruct the signal control unit to control the ADC acquisition unit to stop the signal acquisition action and control the TDC count acquisition unit to perform the signal acquisition action.

[0090] Specifically, when the current signal strength of the received acquisition data is greater than the protection threshold, the signal analyzer can also output a stop signal to the signal control unit through the adjustment unit to instruct the signal control unit to control the ADC acquisition unit or the TDC counting acquisition unit to stop the signal acquisition action, thereby playing a role in hardware protection.

[0091] To further illustrate the solution of the present application, a specific example is provided below. In one embodiment, the configuration information is a configuration parameter for an ADC acquisition unit or a configuration parameter for a TDC count acquisition unit. The feedback information includes a value of an amplification factor.

[0092] The processor receives the acquisition mode information transmitted by the host computer, and outputs configuration information to the signal control unit according to the acquisition mode information, so as to instruct the signal control unit to control the ADC acquisition unit to perform the signal acquisition action, or to control the TDC count acquisition unit to perform the signal acquisition action;

[0093] The processor receives and analyzes the collected data, obtains the intensity of the current signal, and determines the value of the amplification factor according to the intensity of the current signal;

[0094] When the processor determines that the acquisition mode needs to be switched according to the acquisition logic, it outputs a switching instruction to the signal control unit to instruct the signal control unit to control the switching between the ADC acquisition unit and the TDC count acquisition unit.

[0095] Specifically, if Figure 6 As shown, when the host computer provides the acquisition mode information to the processor, the processor records and stores the acquisition requirements and outputs the configuration information to the signal control unit;

[0096] The signal control unit receives the configuration information of the processor and controls the adjustment to the corresponding acquisition mode;

[0097] The adjustment unit receives feedback information from the processor and controls the amplification factor of the secondary amplifier in the ADC acquisition unit if necessary;

[0098] The relevant collection unit performs the collection action;

[0099] The processor receives the collected data and determines whether the collection mode needs to be switched based on the collection logic. If the collection mode needs to be switched, the processor stores the record and feeds the information back to the host computer, which then re-issues the collection configuration information. If the collection mode does not need to be switched, the relevant collection unit performs the collection action.

[0100] This application uses a segmented conversion method. The signal control unit instructs the acquisition module to enter the corresponding acquisition mode based on the configuration information transmitted by the processing unit. The processing unit receives and processes the acquisition data output by the acquisition module, and determines whether the acquisition mode needs to be switched according to the acquisition logic. The acquisition mode is switched by the signal control unit to achieve a wide range of current counting detection. At the same time, this application can be flexibly adapted to application scenarios such as single-mode and dual-mode ion detectors, with high compatibility, low hardware cost and strong reliability.

[0101] In one embodiment, the present application further provides a data acquisition system, which includes an ion detector and the above-mentioned analog-to-digital conversion detection device; the analog-to-digital conversion detection device is connected to the ion detector.

[0102] In one embodiment, the ion detector includes a discrete dynode ion detector, a continuous dynode ion detector, and an MCP detector.

[0103] In some examples, the mass spectrometer in the present application includes a time-of-flight mass spectrometer (TOF-MS), which has advantages over other mass spectrometers such as good sensitivity, high resolution, and fast analysis speed.

[0104] The above describes the application of the device to the data acquisition system in the embodiment of the present application and the previous embodiment, wherein the ion detector in the mass spectrometer also includes single-mode, dual-mode ion detection, etc. The present application uses a segmented conversion method, which is compatible with TDC counting and ADC current acquisition at the same time, to achieve a wide range of current counting detection, and can be flexibly adapted to application scenarios such as single-mode and dual-mode ion detectors, with high applicability, low hardware cost, and strong reliability.

[0105] It should be understood that, although the steps in the flowcharts of the above embodiments are shown in sequence as indicated by the arrows, these steps are not necessarily performed in the order indicated by the arrows. Unless otherwise specified herein, there is no strict order restriction on the execution of these steps, and these steps can be performed in other orders. Moreover, at least a portion of the steps in the flowcharts of the above embodiments may include multiple steps or multiple stages, and these steps or stages are not necessarily performed at the same time, but can be performed at different times. The execution order of these steps or stages is not necessarily to be performed in sequence, but can be performed in turn or alternately with other steps or at least a portion of steps or stages in other steps.

[0106] The technical features of the above embodiments can be combined arbitrarily. To make the description concise, not all possible combinations of the technical features in the above embodiments are described. However, as long as there is no contradiction in the combination of these technical features, they should be considered to be within the scope of this specification.

[0107] The above embodiments merely illustrate several implementation methods of the present application. While the descriptions are relatively specific and detailed, they should not be construed as limiting the scope of the present invention. It should be noted that a person skilled in the art may make various modifications and improvements without departing from the spirit of the present invention, all of which fall within the scope of protection of the present application. Therefore, the scope of protection of the present application shall be determined by the appended claims.

Claims

1. An analog-to-digital conversion detection device, characterized in that: The analog-to-digital conversion detection device includes a signal input unit, a signal control unit, an acquisition module, an adjustment unit and a processing unit; wherein: The input end of the signal input unit is used to connect to the ion detector and receive the current signal output by the ion detector; the output end of the signal input unit is connected to the signal control unit; The signal control unit is connected to the processing unit, and is used to receive configuration information transmitted by the processing unit, and instruct the acquisition module to enter a corresponding acquisition mode based on the configuration information to acquire the current signal and output acquired data; the acquisition mode includes one of an ADC acquisition mode and a TDC acquisition mode; The processing unit is connected to the acquisition module and is used to receive and process the collected data and output control signals and feedback information; The adjustment unit is respectively connected to the processing unit, the acquisition module, and the signal control unit; the adjustment unit is used to receive the feedback information and adjust the acquisition parameters of the acquisition module in the ADC acquisition mode according to the feedback information; the adjustment unit is also used to receive the control signal and transmit the control signal to the signal control unit to instruct the signal control unit to control the acquisition module to enter the ADC acquisition mode or the TDC acquisition mode; Wherein, the acquisition parameters include amplification factors; the acquisition module includes an ADC acquisition unit and a TDC count acquisition unit; the configuration information is a configuration parameter for the ADC acquisition unit; the feedback information includes the value of the amplification factor; The processing unit includes a signal analyzer, which is respectively connected to the ADC acquisition unit, the TDC count acquisition unit and the adjustment unit; the signal analyzer is used to receive and analyze the acquisition data transmitted by the ADC acquisition unit, obtain the intensity of the current signal, and determine the value of the amplification factor based on the intensity of the current signal; the signal analyzer is also used to output a stop signal to the signal control unit through the adjustment unit when the intensity of the current signal is greater than a protection threshold, so as to instruct the signal control unit to control the ADC acquisition unit to stop the signal acquisition action.

2. The analog-to-digital conversion detection device according to claim 1, characterized in that: The input end of the ADC acquisition unit is connected to the signal control unit, the output end of the ADC acquisition unit is connected to the processing unit, and the control end of the ADC acquisition unit is connected to the adjustment unit; An input end of the TDC count acquisition unit is connected to the signal control unit, and an output end of the TDC count acquisition unit is connected to the processing unit.

3. The analog-to-digital conversion detection device according to claim 2, characterized in that: The ADC acquisition unit includes an amplifier, a first amplifying circuit, a filtering circuit, and an ADC acquisition circuit connected in sequence; wherein the amplifier is connected to the signal control unit, the first amplifying circuit is connected to the regulating unit, and the ADC acquisition circuit is connected to the processing unit; The TDC counting acquisition unit includes a sampling resistor, a second amplifying circuit, a comparator and a TDC counting module connected in sequence; wherein the sampling resistor is connected to the signal control unit, and the TDC counting module is connected to the processing unit.

4. The analog-to-digital conversion detection device according to claim 3, characterized in that: The amplifier includes a transimpedance amplifier; the first amplifying circuit includes a secondary amplifying circuit; the filtering circuit includes a second-order filtering circuit; and the comparator includes a high-speed comparator; The second amplifier circuit includes a primary amplifier circuit and a secondary amplifier circuit; one end of the primary amplifier circuit is connected to the sampling resistor, the other end of the primary amplifier circuit is connected to one end of the secondary amplifier circuit, and the other end of the secondary amplifier circuit is connected to a comparator.

5. The analog-to-digital conversion detection device according to any one of claims 2 to 4, characterized in that: The analog-to-digital conversion detection device further includes a host computer and an overvoltage protection module; the overvoltage protection module is connected between the output end of the signal input unit and the signal control unit; the processing unit further includes a processor; The processor is respectively connected to the ADC acquisition unit, the TDC count acquisition unit, the adjustment unit and the signal control unit; and the processor is connected to the host computer.

6. The analog-to-digital conversion detection device according to claim 5, characterized in that: The processor is used to receive and analyze the acquisition data transmitted by the ADC acquisition unit, and receive the value of the amplification factor fed back by the adjustment unit, and when the value of the amplification factor is a maximum value and the intensity of the current signal is less than a threshold, output a first acquisition signal to the signal control unit to instruct the signal control unit to control the ADC acquisition unit to stop the signal acquisition action and control the TDC count acquisition unit to perform the signal acquisition action.

7. The analog-to-digital conversion detection device according to claim 6, characterized in that: The signal analyzer is used to output a second acquisition signal to the signal control unit through the adjustment unit when the value of the amplification factor is the maximum value and the intensity of the current signal is less than a threshold value, so as to instruct the signal control unit to control the ADC acquisition unit to stop the signal acquisition action and control the TDC count acquisition unit to perform the signal acquisition action.

8. The analog-to-digital conversion detection device according to claim 5, characterized in that: The configuration information is a configuration parameter for the ADC acquisition unit, or a configuration parameter for the TDC count acquisition unit; the feedback information includes a value of the amplification factor; The processor receives the acquisition mode information transmitted by the host computer, and outputs the configuration information to the signal control unit according to the acquisition mode information, so as to instruct the signal control unit to control the ADC acquisition unit to perform a signal acquisition action, or to control the TDC count acquisition unit to perform a signal acquisition action; The processor receives and analyzes the collected data, obtains the intensity of the current signal, and determines the value of the amplification factor according to the intensity of the current signal; When the processor determines that the acquisition mode needs to be switched according to the acquisition logic, the processor outputs a switching instruction to the signal control unit to instruct the signal control unit to control the switching between the ADC acquisition unit and the TDC count acquisition unit.

9. A data acquisition system, characterized in that: The data acquisition system includes an ion detector and the analog-to-digital conversion detection device according to any one of claims 1 to 8; the analog-to-digital conversion detection device is connected to the ion detector.

10. The data acquisition system according to claim 9, characterized in that: The ion detectors include discrete dynode ion detectors, continuous dynode ion detectors and MCP detectors.

Images