X-ray imaging device and method for imaging using the same

Abstract

The present application discloses an X-ray imaging device and a method for imaging using the X-ray imaging device. The X-ray imaging device includes: a scanning measurement source, emitting X-rays to irradiate an illuminant that is roughly symmetrical about the symmetry plane of the illuminant; a scattering measurement component, including a scattering measurement source; a detector; a rotation mechanism, rotating around the illuminant around a rotation axis in a vertical plane, wherein the scanning measurement source and the scattering measurement source are arranged to rotate along the same circular trajectory on a horizontal plane; and a calculation component, configured to calculate based on the scanning measurement data of the scanning measurement source at a first position on the circular trajectory and the scattering measurement data of the scattering measurement source at a second position on the circular trajectory to obtain scattering-corrected scanning data at the first position, wherein the angle between the first position and the symmetry plane of the illuminant is equal in magnitude and opposite in direction to the angle between the second position and the symmetry plane of the illuminant.

Description

Technical Field

[0001] The present application relates to the field of imaging, and more particularly to an X-ray imaging device and a method for performing imaging using the X-ray imaging device. Background Art

[0002] Imaging technologies, including X-rays and computed tomography (CT), have been widely used in numerous fields since their introduction, particularly in medical examinations. For example, oral CT can provide a three-dimensional view of tissue conditions, revealing subtle or even subtle lesions that are not visible on oral X-rays.

[0003] Scattering is a problem that must be considered in imaging technology. Conventional CT reconstruction theory assumes that x-rays propagate in straight lines, with the detected ray intensity decaying exponentially with the path integral. However, scattered photons deviate from the incident beam direction and cannot be modeled in conventional CT reconstruction theory, thus becoming a source of error in CT image reconstruction. Summary of the Invention

[0004] To address at least one of the above technical issues, the present application provides an X-ray imaging device and a method for performing imaging using the X-ray imaging device. The present application involves the following technical solutions:

[0005] Technical Solution 1. An X-ray imaging device comprising:

[0006] a scanning measurement radiation source configured to emit X-rays to irradiate an illuminant, wherein the illuminant is substantially symmetrical about a symmetry plane of the illuminant;

[0007] a scatterometry assembly configured to measure scattering of an illuminant, wherein the scatterometry assembly comprises a scatterometry source configured to emit X-rays to illuminate the illuminant so as to measure scattering of the illuminant;

[0008] a detector configured to detect the X-rays emitted by the scanning measurement source to obtain scanning measurement data of the scanning measurement source, and to detect the X-rays emitted by the scattering measurement source to obtain scattering measurement data;

[0009] a rotation mechanism configured to rotate the scanning measurement source, the detector, and the scatterometry device around an illuminant around a rotation axis in a vertical plane, wherein the scanning measurement source and the scatterometry source are arranged to rotate along the same circular trajectory in a horizontal plane; and

[0010] a calculation component configured to perform calculations based on scanning measurement data of the scanning measurement source at a first position on the circular trajectory and scattering measurement data of the scattering measurement source at a second position on the circular trajectory to obtain scattering-corrected scanning data at the first position, wherein the angle between the first position and the symmetry plane of the projection object is equal to the angle between the second position and the symmetry plane of the projection object and has an opposite direction.

[0011] Technical Solution 2. The X-ray imaging device according to Technical Solution 1, wherein the computing component is further configured to calculate the symmetry plane of the projection volume, including:

[0012] reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body;

[0013] The center of gravity of the reconstructed body is calculated by the following formula:

[0014]

[0015] Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i Represents the pixel value of the i-th pixel, x i represents the x component of the i-th pixel, yi represents the y component of the i-th pixel, z i Represents the z component of the i-th pixel;

[0016] Determine the plane passing through the center of gravity of the reconstructed body, and calculate the symmetry plane of the reconstructed body by the following formula for all planes passing through the center of gravity of the reconstructed body:

[0017]

[0018] where f(x i ,y i ,z i ) represents the pixel value of the i-th pixel, f(x i ',y i ',z i ') represents the pixel value of the ith pixel point symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i = 1 to N / 2; and

[0019] The symmetry plane of the projection volume is determined according to the symmetry plane of the reconstruction volume.

[0020] Technical Solution 3. The X-ray imaging apparatus according to Technical Solution 1 or 2, wherein the calculation component calculates based on the scanning measurement data of the scanning measurement source at the first position on the circular trajectory and the scattering measurement data of the scattering measurement source at the second position on the circular trajectory to obtain the scattering-corrected scanning data at the first position, comprising:

[0021] a calculation component calculating scattering data of the scanning measurement source at a first position on the circumferential trajectory based on the scattering measurement data of the scattering measurement source at a second position on the circumferential trajectory; and

[0022] The calculation component subtracts the scattering data of the scanning measurement source at the first position on the circumferential trajectory from the scanning measurement data of the scanning measurement source at the first position on the circumferential trajectory to obtain scattering-corrected scanning data at the first position.

[0023] Technical Solution 4. The X-ray imaging apparatus according to Technical Solution 3, wherein the calculation component calculates the scattering data of the scanning measurement source at the first position on the circumferential trajectory based on the scattering measurement data of the scattering measurement source at the second position on the circumferential trajectory, including:

[0024] The computing component determines a third position, wherein the third position is symmetrical to the second position about the symmetry plane of the projection object;

[0025] The computing component flips the scatterometry data of the scatterometry source at the second position on the circular trajectory about the vertical center axis of the detector to obtain scatterometry data at a third position;

[0026] The calculation component calculates scattering data of the scanning measurement source at the first position on the circumferential trajectory based on the scattering measurement data at the first position, the third position and the third position.

[0027] Technical Solution 5. The X-ray imaging apparatus according to Technical Solution 4, wherein the calculation component calculates the scattering data of the scanning measurement source at the first position on the circular trajectory based on the scattering measurement data at the first position, the third position, and the third position, including:

[0028] Calculation is based on the following formula

[0029]

[0030]

[0031] Among them, SAD A Indicates the distance from the first position to the plane where the rotation axis is located and parallel to the detector surface. AID indicates the distance from the rotation axis to the detector surface. SADB represents the distance from the third position to the plane parallel to the detector surface where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position, x represents the horizontal coordinate corresponding to the third position on the detector, Δx represents the difference between the distance from the first position to the rotation axis and the distance from the third position to the rotation axis, and y represents the vertical coordinate corresponding to the third position on the detector.

[0032] Technical Solution 6. The X-ray imaging device according to Technical Solution 1, wherein the scatterometry component further comprises:

[0033] A beam blocker includes a plurality of lead strips disposed between the scatterometry source and an illuminant.

[0034] Technical Solution 7. An X-ray imaging device as described in Technical Solution 1, wherein the scanning measurement source and the scattering measurement source are arranged to be symmetrical about a plane containing the rotation axis and perpendicular to the detector surface.

[0035] Technical Solution 8. A method for imaging an illuminant using an X-ray imaging device, wherein the illuminant is substantially symmetrical about a symmetry plane of the illuminant, and the X-ray imaging device comprises a scanning measurement source, a scattering measurement assembly, a detector, a rotation mechanism, and a computing assembly, wherein: the scattering measurement assembly is configured to measure scattering by the illuminant, the scattering measurement assembly comprising a scattering measurement source configured to emit X-rays to irradiate the illuminant so as to measure the scattering by the illuminant; the rotation mechanism is configured to rotate the scanning measurement source, the detector, and the scattering measurement device around the illuminant about a rotation axis in a vertical plane, wherein the scanning measurement source and the scattering measurement source are configured to rotate along the same circular trajectory in a horizontal plane; and wherein the method comprises:

[0036] Place the projection;

[0037] The X-rays are emitted by a scanning measurement source to irradiate the projection object;

[0038] The X-rays are emitted by a scattering measurement source to irradiate the projection object;

[0039] detecting the X-rays emitted by the scanning measurement source by a detector to obtain scanning measurement data of the scanning measurement source, and detecting the X-rays emitted by the scattering measurement source to obtain scattering measurement data; and

[0040] A calculation component is used to perform calculations based on the scanning measurement data of the scanning measurement source at a first position on the circular trajectory and the scattering measurement data of the scattering measurement source at a second position on the circular trajectory to obtain scattering-corrected scanning data at the first position, wherein the angle between the first position and the symmetry plane of the projection object is equal to the angle between the second position and the symmetry plane of the projection object and is opposite in direction.

[0041] Technical Solution 9. The method according to Technical Solution 8 further includes calculating the symmetry plane of the projection volume by a calculation component, including:

[0042] reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body;

[0043] The center of gravity of the reconstructed body is calculated by the following formula:

[0044]

[0045] Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i Represents the pixel value of the i-th pixel, x i Represents the x component of the i-th pixel, y i Represents the y component of the i-th pixel, z i Represents the z component of the i-th pixel;

[0046] Determine the plane passing through the center of gravity of the reconstructed body, and calculate the symmetry plane of the reconstructed body by the following formula for all planes passing through the center of gravity of the reconstructed body:

[0047]

[0048] where f(x i ,y i ,z i ) represents the pixel value of the i-th pixel, f(x i ',y i ',z i ') represents the pixel value of the ith pixel point symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i = 1 to N / 2; and

[0049] The symmetry plane of the projection volume is determined according to the symmetry plane of the reconstruction volume.

[0050] Technical Solution 10. The method of Technical Solution 8 or 9, wherein the step of performing calculation by a calculation component based on scanning measurement data of the scanning measurement source at a first position on the circular trajectory and scattering measurement data of the scattering measurement source at a second position on the circular trajectory to obtain scattering-corrected scanning data at the first position comprises:

[0051] calculating scattering data of the scanning measurement source at a first position on the circumferential trajectory based on scattering measurement data of the scattering measurement source at a second position on the circumferential trajectory; and

[0052] The scattering data of the scanning measurement source at the first position on the circumferential trajectory are subtracted from the scanning measurement data of the scanning measurement source at the first position on the circumferential trajectory to obtain scattering-corrected scanning data at the first position.

[0053] Technical Solution 11. The method of Technical Solution 10, wherein calculating the scattering data of the scanning measurement source at the first position on the circular trajectory based on the scattering measurement data of the scattering measurement source at the second position on the circular trajectory comprises:

[0054] determining a third position, wherein the third position is symmetrical to the second position about the symmetry plane of the projection object;

[0055] flipping the scatterometry data of the scatterometry source at a second position on the circular trajectory about a vertical center axis of the detector to obtain scatterometry data at a third position;

[0056] Scattering data of the scanning measurement source at the first position on the circular trajectory are calculated based on the first position, the third position and the scattering measurement data at the third position.

[0057] Technical Solution 12. The method according to Technical Solution 11, wherein calculating the scattering data of the scanning measurement source at the first position on the circular trajectory based on the scattering measurement data at the first position, the third position, and the third position comprises:

[0058] Calculation is based on the following formula

[0059]

[0060]

[0061] Among them, SAD A Indicates the distance from the first position to the plane where the rotation axis is located and parallel to the detector surface. AID indicates the distance from the rotation axis to the detector surface. SAD Brepresents the distance from the third position to the plane parallel to the detector surface where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position, x represents the horizontal coordinate corresponding to the third position on the detector, Δx represents the difference between the distance from the first position to the rotation axis and the distance from the third position to the rotation axis, and y represents the vertical coordinate corresponding to the third position on the detector.

[0062] Technical Solution 13. A method for obtaining scatter-corrected scan data, comprising:

[0063] Obtaining scanning measurement data of an illuminant, wherein the illuminant is substantially symmetrical about a symmetry plane of the illuminant;

[0064] obtaining scatterometry data of the illuminant; and

[0065] Scatter-corrected scan data at the first position is obtained by calculation based on the scan measurement data at the first position and the scatter measurement data at the second position, wherein the first position and the second position are symmetrical about a symmetry plane of the projection object.

[0066] Technical Solution 14. The method according to Technical Solution 13 further includes calculating the symmetry plane of the projection volume, including:

[0067] reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body;

[0068] The center of gravity of the reconstructed body is calculated by the following formula:

[0069]

[0070] Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i Represents the pixel value of the i-th pixel, x i Represents the x component of the i-th pixel, y i Represents the y component of the i-th pixel, z i Represents the z component of the i-th pixel;

[0071] Determine the plane passing through the center of gravity of the reconstructed body, and calculate the symmetry plane of the reconstructed body by the following formula for all planes passing through the center of gravity of the reconstructed body:

[0072]

[0073] where f(x i ,y i ,z i ) represents the pixel value of the i-th pixel, f(x i ',y i ',z i) represents the pixel value of the ith pixel point symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i = 1 to N / 2; and

[0074] The symmetry plane of the projection volume is determined according to the symmetry plane of the reconstruction volume.

[0075] Technical Solution 15. The method of Technical Solution 13 or 14, wherein calculating based on the scanning measurement data at the first position and the scattering measurement data at the second position to obtain the scattering-corrected scanning data at the first position comprises:

[0076] calculating scattering data at the first location based on scatterometry data at the second location; and

[0077] The scatter data at the first position is subtracted from the scan measurement data at the first position to obtain scatter-corrected scan data at the first position.

[0078] Technical Solution 16. The method of Technical Solution 15, wherein calculating the scattering data at the first position based on the scattering measurement data at the second position comprises:

[0079] determining a third position, wherein the third position is symmetrical to the second position about the symmetry plane of the projection object;

[0080] flipping the scatterometry data at the second position about a central axis of a detector that acquired the scatterometry data to obtain scatterometry data at a third position, wherein the central axis of the detector is substantially parallel to or included in a symmetry plane of the illuminant;

[0081] Scattering data at the first position is calculated based on the first position, the third position, and the scatterometry data at the third position.

[0082] 17. The method of claim 16, wherein calculating the scattering data at the first position based on the first position, the third position, and the scattering measurement data at the third position comprises:

[0083] Calculation is based on the following formula

[0084]

[0085]

[0086] Among them, SAD AIndicates the distance from the first position to the plane where the rotation axis is located and parallel to the detector surface. AID indicates the distance from the rotation axis to the detector surface. SAD B represents the distance from the third position to the plane parallel to the detector surface where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position, x represents the horizontal coordinate corresponding to the third position on the detector, Δx represents the difference between the distance from the first position to the rotation axis and the distance from the third position to the rotation axis, and y represents the vertical coordinate corresponding to the third position on the detector.

[0087] Technical Solution 18. An X-ray imaging device comprising:

[0088] a scanning measurement radiation source configured to emit X-rays to irradiate an illuminant, wherein the illuminant is substantially symmetrical about a symmetry plane of the illuminant;

[0089] a scatterometry assembly configured to measure scattering by an illuminant;

[0090] a detector configured to detect the X-rays emitted by the scanning measurement source to obtain scanning measurement data of the scanning measurement source, and to detect the X-rays emitted by the scattering measurement component to obtain scattering measurement data;

[0091] a rotation mechanism configured to rotate the scanning measurement source, the detector, and the scatterometry device around an illuminant about a rotation axis in a vertical plane; and

[0092] The calculation component is configured to perform calculation based on the scanning measurement data at the first position and the scattering measurement data at the second position to obtain the scattering-corrected scanning data at the first position, wherein the first position and the second position are symmetric about the symmetry plane of the projection volume.

[0093] Technical Solution 19. The X-ray imaging device according to Technical Solution 18, wherein the scatterometry component comprises:

[0094] A scatterometry source configured to emit X-rays to illuminate an illuminant so as to measure scattering by the illuminant

[0095] Technical Solution 20. The X-ray imaging device according to Technical Solution 19, wherein the scatterometry component further comprises:

[0096] A beam blocker includes a plurality of lead strips disposed between the scatterometry source and an illuminant.

[0097] Technical Solution 21. An X-ray imaging device as described in Technical Solution 19 or 20, wherein the scanning measurement source and the scattering measurement source are arranged to be located on both sides of a plane containing the rotation axis and perpendicular to the detector surface.

[0098] Technical Solution 22. An X-ray imaging device as described in Technical Solution 21, wherein the scanning measurement source and the scattering measurement source are arranged to be symmetrical about a plane containing the rotation axis and perpendicular to the detector surface.

[0099] Technical Solution 23. An X-ray imaging device as described in Technical Solution 21, wherein the scanning measurement source and the scattering measurement source are arranged to have an acute angle with a plane containing the rotation axis and perpendicular to the detector surface.

[0100] Technical Solution 24. An X-ray imaging device as described in Technical Solution 19 or 20, wherein the scanning measurement source and the scattering measurement source are the same source.

[0101] Technical Solution 25. An X-ray imaging device as described in Technical Solution 24, wherein the scanning measurement source is configured to pass through a plane containing the rotation axis and perpendicular to the detector surface.

[0102] Technical Solution 26. The X-ray imaging device according to Technical Solution 18, further comprising:

[0103] A positioning auxiliary tool is configured to position the projection object.

[0104] Technical Solution 27. An X-ray imaging device as described in Technical Solution 26, wherein the positioning auxiliary tool includes a dental tray.

[0105] By utilizing the property that the illuminant is substantially symmetrical about the symmetry plane of the illuminant, the X-ray imaging apparatus and method according to the exemplary embodiments of the present application can obtain scatter-corrected scanning measurement data, that is, scatter-corrected data. BRIEF DESCRIPTION OF THE DRAWINGS

[0106] The above and other aspects, features and advantages of the present application will become more apparent by describing in detail exemplary embodiments of the present application with reference to the accompanying drawings, in which:

[0107] Figure 1 is a schematic diagram of an X-ray imaging apparatus according to an exemplary embodiment of the present application.

[0108] Figure 2 Shown Figure 1 , a schematic perspective view of an X-ray imaging apparatus according to an exemplary embodiment of the present application, wherein the rotation mechanism and the calculation component and the beam blocker in the scatterometry component are removed (only the scatterometry radiation source in the scatterometry component is shown), Figure 2 The movement trajectories of the scanning measurement source and the scatterometry source are shown (circular dashed lines).

[0109] Figure 3Shown Figure 2 A top view of an X-ray imaging device according to an exemplary embodiment of the present application.

[0110] Figure 4 A top view of the X-ray imaging apparatus according to an exemplary embodiment of the present application is shown when the scanning measurement source is in a first position and when the scattering measurement source is in a second position.

[0111] Figure 5A A perspective view showing a scatterometry assembly of an X-ray imaging device according to an exemplary embodiment of the present application is shown. Figure 5B A front view of a scatterometry assembly of an X-ray imaging apparatus according to an exemplary embodiment of the present application is shown.

[0112] Figure 6 It shows a situation in which the calculated third position does not coincide with the first position because the projection symmetry plane of the projection does not include the rotation axis and is perpendicular to the detector surface according to an exemplary embodiment of the present application. Figure 7 A schematic diagram showing the spatial relationship between the first position, the third position, the plane where the rotation axis is located and parallel to the detector surface, and the detector surface according to an exemplary embodiment of the present application is shown. DETAILED DESCRIPTION

[0113] The present application will now be described more fully below with reference to the accompanying drawings illustrating various embodiments. However, the present application can be implemented in many different forms and should not be construed as being limited to the embodiments set forth herein. Rather, these embodiments are provided to make this disclosure thorough and complete and to fully convey the scope of the present application to those skilled in the art. Throughout the specification and all drawings, the same reference numerals represent the same elements.

[0114] It will be understood that when an element is referred to as being "on" another element, it can be directly on the other element or intervening elements may be present. In contrast, when an element is referred to as being "directly on" another element, there are no intervening elements present.

[0115] It will be understood that although the terms "first," "second," "third," etc. may be used herein to describe various elements, components, regions, layers, and / or portions, these elements, components, regions, layers, and / or portions should not be limited by these terms. These terms are only used to distinguish one element, component, region, layer, or portion from another element, component, region, layer, or portion. Thus, a first element, component, region, layer, or portion discussed below may be referred to as a second element, component, region, layer, or portion without departing from the teachings herein.

[0116] The terms used herein are for the purpose of describing specific embodiments only and are not intended to be limiting. As used herein, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are intended to include the plural forms, including "at least one". As used herein, the term "and / or" includes any and all combinations of one or more of the relevant listed items. It will also be understood that when the term "comprising" is used in this specification, it indicates the presence of the features, regions, wholes, steps, operations, elements, and / or components set forth, but does not exclude the presence or addition of one or more other features, regions, wholes, steps, operations, elements, components, and / or groups thereof.

[0117] Furthermore, spatially relative terms such as "below" or "on" and "above" may be used herein to describe the relationship of one element to another element as shown in the accompanying drawings. It will be understood that relative terms are intended to encompass different orientations of the device in addition to the orientation depicted in the accompanying drawings. For example, if the device in one of the accompanying drawings is turned over, an element described as "below" other elements would then be oriented "above" the other elements. The exemplary terms "below" or "beneath" therefore encompass both orientations of above and below.

[0118] As used herein, “about” or “approximately” includes the stated value and the average value that is within an acceptable range of deviation for the particular value as determined by one of ordinary skill in the art taking into account the measurements being made and errors associated with the measurement of the particular quantity (i.e., the limitations of the measurement system).

[0119] As used herein, “scanning measurement data at a certain position” refers to data obtained by a scanning measurement source emitting X-rays at a certain position and measured by a detector, which includes scanning data and scattered data.

[0120] As used herein, "scatterometry data at a certain location" refers to data measured by a scatterometry assembly and a detector at a certain location.

[0121] As used herein, “scattering data at a position” refers to scattering data calculated from data of scattering measurement data at a certain position, which is included in the above-mentioned “scanning measurement data”.

[0122] As used herein, “scatter-corrected scan data” refers to scan measurement data after scatter data has been removed, ie, the scan measurement data has been scatter-corrected.

[0123] As used herein, "angle between a source and a plane" means the angle between the centerline of the source and the plane.

[0124] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by one of ordinary skill in the art to which the present disclosure belongs. It will also be understood that terms, such as those defined in commonly used dictionaries, should be interpreted as having a meaning consistent with their meaning in the context of the relevant art and the present disclosure, and will not be interpreted in an idealized or overly formal sense unless expressly defined as such herein.

[0125] Figure 1 A schematic perspective view of an X-ray imaging apparatus 1000 according to an exemplary embodiment of the present application is shown.

[0126] like Figure 1 As shown, the X-ray imaging device 1000 includes: a scanning measurement radiation source 100 , a scattering measurement component 200 , a detector 300 , a rotation mechanism 400 and a calculation component 500 .

[0127] The scanning measurement source 100 is configured to emit X-rays to irradiate an illuminant, wherein the illuminant is substantially symmetrical about a plane of symmetry. In certain exemplary embodiments, the X-ray imaging device may be, for example, a CBCT, and the illuminant may be, for example, a human head. In certain exemplary embodiments, the X-ray imaging device may be, for example, a CT, and the illuminant may be, for example, a human chest. It should be noted that the scope of this application is not limited thereto and encompasses any X-ray imaging device applicable to any substantially symmetrical illuminant.

[0128] The scatterometry assembly 200 is configured to measure scattering of an illuminant, wherein the scatterometry assembly 200 includes a scatterometry radiation source 210 configured to emit X-rays to illuminate the illuminant so as to measure scattering of the illuminant. Figure 1 As shown, the scatterometry assembly 200 further includes a beam blocker 220 (hereinafter referred to as Figure 5A 、 5B Detailed description).

[0129] Figure 2 Shown Figure 1 , a schematic perspective view of an X-ray imaging apparatus according to an exemplary embodiment of the present application, wherein the rotation mechanism 400 and the calculation component 500 as well as the beam blocker 220 in the scatterometry component 200 are removed (only the scatterometry radiation source 210 in the scatterometry component 200 is shown), Figure 2 The movement trajectories of the scanning measurement source 100 and the scattering measurement source 210 are shown (circular dashed lines). Figure 3 Shown Figure 2 A top view of an X-ray imaging device according to an exemplary embodiment of the present application.

[0130] The detector 300 is configured to detect X-rays emitted by the scanning measurement source 100 to obtain scanning measurement data of the scanning measurement source 100 , and to detect X-rays emitted by the scattering measurement source 210 to obtain scattering measurement data. In certain exemplary embodiments, the detector 300 may be a two-dimensional planar detector. For example, the detector 300 may be a flat panel detector.

[0131] The rotation mechanism 400 is configured to rotate the scanning measurement source 100, the detector 300, and the scatterometry device around the projection object around a rotation axis in a vertical plane, wherein the scanning measurement source 100 and the scatterometry source 210 are configured to rotate along the same circular trajectory in a horizontal plane; Figure 1 The rotation mechanism 400 shown in the figure is merely exemplary and the present application is not limited thereto. In other embodiments, the rotation mechanism 400 may also be in any other appropriate form, for example, a floor-standing rotation mechanism. It should be noted that spatial terms such as "vertical" and "horizontal" are used herein only for the purpose of clarity and convenience of description. They express relative spatial positional relationships and are not limited to "vertical" and "horizontal" in the conventional sense. For example, "vertical" and "horizontal" in some exemplary embodiments may also be referred to as "horizontal" and "vertical" in other exemplary embodiments. It will be understood by those skilled in the art that the direction of the rotation axis of the rotation mechanism 400 is perpendicular to the plane in which the scanning measurement source 100 and the scattering measurement source 210 rotate around the illuminant, and is parallel to the plane in which the surface of the detector 300 is located. For the sake of clarity and convenience of description, in this exemplary embodiment, the direction of the rotation axis of the rotation mechanism 400 is referred to as the vertical direction, the plane in which the scanning measurement radiation source 100 and the scattering measurement radiation source 210 rotate around the projected object is referred to as the horizontal plane, and the intersection of the rotation axis of the rotation mechanism 400 and the horizontal plane in which the scanning measurement radiation source 100 and the scattering measurement radiation source 210 rotate around the projected object is referred to as the rotation center (see Figure 3 , the center of rotation (i.e., the center of the circle). The scanning measurement source 100 and the scattering measurement source 210 are arranged at the same distance from the center of rotation. The center of rotation is the center of the circle. In certain exemplary embodiments of the present application, the scanning measurement source 100 and the scattering measurement source 210 are arranged symmetrically about a plane that includes the rotation axis and is perpendicular to the surface of the detector 300. In other words, the line connecting the scanning measurement source 100 and the scattering measurement source 210 is parallel to the surface of the detector 300, or in the horizontal plane, the line connecting the midpoint of the line connecting the scanning measurement source 100 and the scattering measurement source 210 and the center of rotation (i.e., the center of the circle) is perpendicular to the surface of the detector 300. It should be noted that the scope of the present application is not limited to this, and the scanning measurement source 100 and the scattering measurement source 210 can also be arranged not to be symmetrical about a plane that includes the rotation axis and is perpendicular to the surface of the detector 300.

[0132] In some exemplary embodiments according to the present application, the scanning measurement radiation source 100 and the scattering measurement radiation source 210 emit X-rays alternately to avoid mutual interference.

[0133] Figure 4 A top view of an X-ray imaging device according to an exemplary embodiment of the present application is shown when the scanning measurement source is in a first position and when the scattering measurement source is in a second position. The calculation component 500 is configured to calculate based on the scanning measurement data of the scanning measurement source 100 at a first position P1 on the circular trajectory and the scattering measurement data of the scattering measurement source 210 at a second position P2 on the circular trajectory to obtain scattering-corrected scanning data at the first position P1, wherein the angle (-θ angle) between the first position P1 and the symmetry plane of the projection object and the angle (θ angle) between the second position P2 and the symmetry plane of the projection object are equal in magnitude and opposite in direction. Those skilled in the art will understand that the angle corresponding to each image obtained by current X-ray imaging devices is known, so that reconstruction can be performed.

[0134] In certain exemplary embodiments according to the present application, the X-ray imaging device further includes a positioning auxiliary tool configured to position the projection body. For example, the positioning auxiliary tool may be a dental tray. In theory, through the projection body positioning auxiliary tool such as a dental tray and / or through the setting of the operator, the projection body symmetry plane of the projection body can be made to contain the rotation axis and be perpendicular to the surface of the detector 300. In this article, the angle of the projection body symmetry plane of the projection body is set to 0 degrees, so that the angle of rotation around the clockwise direction is + (or -), and the corresponding angle of rotation around the counterclockwise direction is - (or +). In this way, on the horizontal plane, the intersection line of the projection body symmetry plane and the horizontal plane (called the center intersection line) passes through the rotation center O, that is, the center of the circle, and the angle of the center intersection line is 0 degrees, so that the angle of rotation around the clockwise direction is + (or -), and the corresponding angle of rotation around the counterclockwise direction is - (or +). As shown in the figure, the angle between the first position P1 and the symmetry plane of the projector (that is, the angle of the first position P1 relative to the center intersection line on the horizontal plane) is -θ, and the angle between the second position P2 and the symmetry plane of the projector (that is, the angle of the second position P2 relative to the center intersection line on the horizontal plane) is θ. That is to say, the angle between the first position P1 and the symmetry plane of the projector is equal to the angle between the second position P2 and the symmetry plane of the projector and is opposite in direction.

[0135] Generally speaking, because the illuminant is roughly symmetrical about its symmetry plane, the scattering of the scanning measurement source 100 at the first position P1 (-θ angle) and the scattering of the scattering source at the second position P2 (θ angle) are roughly symmetrical. In other words, the scattering measurement data of the scattering source at the second position P2 (θ angle) can be used to infer the influence of scattering experienced by the scanning measurement source 100 when scanning at the first position P1 (-θ angle). Therefore, by utilizing the roughly symmetric nature of the illuminant about its symmetry plane, the X-ray imaging apparatus according to the exemplary embodiment of the present application can obtain scatter-corrected scanning measurement data, that is, scatter correction is performed.

[0136] Figure 5A A perspective view showing a scatterometry assembly of an X-ray imaging device according to an exemplary embodiment of the present application is shown. Figure 5B A front view of a scatterometry assembly of an X-ray imaging apparatus according to an exemplary embodiment of the present application is shown.

[0137] As shown Figure 5A 、 5B As shown, beam blocker 220 includes a plurality of lead bars 221-225 disposed between scatterometry source 210 and an illuminant. Scatterometry source 210 emits X-rays that pass through lead bars 221-225 and the illuminant before reaching detector 300, thereby enabling calculation of scatterometry data. It should be noted that the scope of this application is not limited thereto; scatterometry assembly 200 according to exemplary embodiments of this application may be any existing scatterometry device capable of measuring scatterometry data.

[0138] Ideally, using projection object positioning aids such as dental trays and / or operator settings, the projection object's projection object symmetry plane is configured to include the rotation axis and be perpendicular to the detector 300 surface, or the positional error of the projection object symmetry plane is negligible. However, in actual operation, significant errors may sometimes occur. In such cases, calculation of the projection object symmetry plane is necessary.

[0139] In some exemplary embodiments of the present application, the calculation component 500 is further configured to calculate the symmetry plane of the illuminant, including:

[0140] reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body;

[0141] The center of gravity of the reconstructed body is calculated by the following formula:

[0142]

[0143] Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i Represents the pixel value of the i-th pixel, x i Represents the x component of the i-th pixel, yi Represents the y component of the i-th pixel, z i Represents the z component of the i-th pixel;

[0144] Determine the plane passing through the center of gravity of the reconstructed body, and calculate the symmetry plane of the reconstructed body by the following formula for all planes passing through the center of gravity of the reconstructed body:

[0145]

[0146] where f(x i ,y i ,z i ) represents the pixel value of the i-th pixel, f(x i ',y i ', z i ') represents the pixel value of the ith pixel point symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i = 1 to N / 2; and

[0147] The symmetry plane of the projection volume is determined according to the symmetry plane of the reconstruction volume.

[0148] Those skilled in the art will appreciate from the above description that the above method is a brute-force approach to determining the optimal solution. This method has the advantage of being computationally simple. In actual operation, for example, 2,000 faces can be selected at equal angular intervals for calculation to determine the optimal solution.

[0149] Those skilled in the art will appreciate that the xyz coordinate system used in the above method is only for the purpose of clear description and does not constitute any limitation.

[0150] It should also be noted that the scope of the present application is not limited thereto, and it also includes any other feasible method that can be used to determine the symmetry plane of the projection object.

[0151] In certain exemplary embodiments of the present application, the calculation component 500 calculates based on the scanning measurement data of the scanning measurement source 100 at the first position P1 on the circular trajectory and the scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory to obtain scattering-corrected scanning data at the first position P1, including: the calculation component 500 calculates the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory based on the scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory; and the calculation component 500 subtracts the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory from the scanning measurement data at the first position P1 on the circular trajectory to obtain the scattering-corrected scanning data at the first position P1.

[0152] In certain exemplary embodiments of the present application, the computing component 500 calculates the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory based on the scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory, including: the computing component 500 determines a third position, wherein the third position is symmetrical to the second position P2 about the symmetry plane of the projection object; the computing component 500 flips the scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory about the vertical center axis of the detector 300 to obtain the scattering measurement data at the third position; and the computing component 500 calculates the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory based on the first position P1, the third position, and the scattering measurement data at the third position.

[0153] Generally speaking, because the source and detector 300 at the second position P2 are mirror-symmetric with the source and detector 300 at the third position about the symmetry plane of the scanned object, the scattering data at the third position can be calculated from the scattering measurement data at the second position P2. Specifically, the direction parallel to the plane of the circular trajectory is referred to as the horizontal direction. The scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory is horizontally flipped left and right by the calculation component 500 to obtain the scattering data at the third position.

[0154] It should be noted that, under ideal circumstances, that is, through auxiliary positioning tools such as dental trays, or through the operator's settings, the projection body symmetry plane of the projection body contains the rotation axis and is perpendicular to the surface of the detector 300. At this time, the first position P1 and the second position P2 are symmetrical about the projection body symmetry plane, and thus the third position coincides with the first position P1.

[0155] However, in some cases, the projection symmetry plane of the projection object does not include the rotation axis and is perpendicular to the surface of the detector 300. In this case, the first position P1 and the second position P2 are not symmetrical about the projection symmetry plane, and the third position does not coincide with the first position P1. In this case, it is necessary to calculate the scattering data of the scanning measurement radiation source 100 at the first position P1. Figure 6 FIG. 4 shows a case where the third position does not overlap with the first position according to an exemplary embodiment of the present application. Figure 6 As shown, due to the projection body symmetry plane ( Figure 6 The dotted line through the projection volume does not include the rotation axis (including Figure 6 The first position P1 of the measurement source 100 on the circular trajectory and the second position P2 of the scattering measurement source 210 on the circular trajectory are not symmetrical about the symmetry plane of the projection object, and the third position P3 does not coincide with the first position P1.

[0156] In some exemplary embodiments of the present application, the calculation component 500 calculates the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory based on the scattering measurement data at the first position P1, the third position P3, and the third position P3, including:

[0157] Calculation is based on the following formula

[0158]

[0159]

[0160] Figure 7 Schematic diagram showing the spatial relationship between the first position, the third position, the plane where the rotation axis is located and parallel to the detector surface, and the detector surface according to an exemplary embodiment of the present application. Figure 7 As shown, SAD A represents the distance from the first position P1 to the plane where the rotation axis is located and parallel to the surface of the detector 300, AID represents the distance from the rotation axis to the surface of the detector 300, SAD B represents the distance from the third position P3 to the plane parallel to the surface of the detector 300 where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position P3, x represents the horizontal coordinate corresponding to the third position P3 on the detector 300, Δx represents the difference between the distance from the first position P1 to the rotation axis and the distance from the third position P3 to the rotation axis, and y represents the vertical coordinate corresponding to the third position P3 on the detector 300.

[0161] In some exemplary embodiments according to the present application, the scanning measurement radiation source 100 and the scattering measurement radiation source 210 are arranged to be located on both sides of a plane containing the rotation axis and perpendicular to the surface of the detector 300 .

[0162] In some exemplary embodiments according to the present application, the scanning measurement radiation source 100 and the scattering measurement radiation source 210 are arranged symmetrically with respect to a plane containing the rotation axis and perpendicular to the surface of the detector 300 .

[0163] In certain exemplary embodiments of the present application, the scanning measurement radiation source 100 and the scattering measurement radiation source 210 are disposed at an acute angle with respect to a plane that includes the rotation axis and is perpendicular to the surface of the detector 300. For example, in certain embodiments, the scanning measurement radiation source 100 and the scattering measurement radiation source 210 are disposed at an angle of less than 30 degrees with respect to a plane that includes the rotation axis and is perpendicular to the surface of the detector 300.

[0164] In certain exemplary embodiments of the present application, scanning measurement source 100 and scatterometry source 210 are the same source. It should be noted that, in this exemplary embodiment, each angle is scanned twice (once with beam blocker 220 present and the source used as scatterometry source 210; and once with beam blocker 220 removed and used as scanning measurement source 100).

[0165] In certain exemplary embodiments of the present application, the scanning measurement source 100 (i.e., the scatterometry source 210) is disposed so as to pass through a plane that includes the rotation axis and is perpendicular to the surface of the detector 300. In other words, the centerline of the scanning measurement source 100 (i.e., the scatterometry source 210) is perpendicular to the plane of the surface of the detector 300 and perpendicular to the rotation axis, and intersects therewith.

[0166] According to another aspect of the present application, a method for imaging an illuminant using an X-ray imaging device is provided, for example, the X-ray imaging device 1000. The illuminant is substantially symmetrical about a symmetry plane of the illuminant. Figure 1-5BThe X-ray imaging device includes a scanning measurement source 100, a scattering measurement component 200, a detector 300, a rotation mechanism 400, and a calculation component 500, wherein: the scattering measurement component 200 is configured to measure scattering of a projected object, and the scattering measurement component 200 includes a scattering measurement source 210, which is configured to emit X-rays to irradiate the projected object so as to measure the scattering of the projected object; the rotation mechanism 400 is configured to rotate the scanning measurement source 100, the detector 300, and the scattering measurement device around the projected object around a rotation axis in a vertical plane, wherein the scanning measurement source 100 and the scattering measurement source 210 are configured to rotate along the same circular trajectory on a horizontal plane. The method includes: placing an illuminant; emitting X-rays by a scanning measurement source 100 to irradiate the illuminant; emitting X-rays by a scattering measurement source 210 to irradiate the illuminant; detecting the X-rays emitted by the scanning measurement source 100 by a detector 300 to obtain scanning measurement data of the scanning measurement source 100, and detecting the X-rays emitted by the scattering measurement source 210 to obtain scattering measurement data; and performing calculations by a calculation component 500 based on the scanning measurement data of the scanning measurement source 100 at a first position P1 on a circular trajectory and the scattering measurement data of the scattering measurement source 210 at a second position P2 on the circular trajectory to obtain scattering-corrected scanning data at the first position P1, wherein the angle between the first position P1 and the symmetry plane of the illuminant is equal to the angle between the second position P2 and the symmetry plane of the illuminant and is opposite in direction.

[0167] As previously described, because the illuminant is roughly symmetrical about its plane of symmetry, the scattering of the scanning measurement source 100 at the first position P1 (-θ angle) and the scattering of the scattering source at the second position P2 (θ angle) are roughly symmetrical. In other words, the scattering measurement data of the scattering source at the second position P2 (θ angle) can be used to infer the influence of scattering experienced by the scanning measurement source 100 when scanning at the first position P1 (-θ angle). Therefore, by utilizing the roughly symmetrical nature of the illuminant about its plane of symmetry, the method for imaging the illuminant using an X-ray imaging device according to the exemplary embodiment of the present application can obtain scatter-corrected scanning measurement data, i.e., corrected for scattering.

[0168] Those skilled in the art will understand that since the method of imaging the projection body using the X-ray imaging device is different from the method previously described, Figure 1-Figure 7 The described X-ray imaging devices generally correspond, so that for the sake of brevity here and below, repeated details are not repeated.

[0169] In some exemplary embodiments of the present application, the method further includes calculating, by the calculation component 500, a symmetry plane of the projection volume, including:

[0170] reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body;

[0171] The center of gravity of the reconstructed body is calculated by the following formula:

[0172]

[0173] Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i Represents the pixel value of the i-th pixel, x i Represents the x component of the i-th pixel, y i Represents the y component of the i-th pixel, z i Represents the z component of the i-th pixel;

[0174] Determine the plane passing through the center of gravity of the reconstructed body, and calculate the symmetry plane of the reconstructed body by the following formula for all planes passing through the center of gravity of the reconstructed body:

[0175]

[0176] where f(x i ,y i ,z i ) represents the pixel value of the i-th pixel, f(x i ',y i ',z i ') represents the pixel value of the ith pixel point symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i = 1 to N / 2; and

[0177] The symmetry plane of the projection volume is determined according to the symmetry plane of the reconstruction volume.

[0178] In certain exemplary embodiments of the present application, calculation is performed by the calculation component 500 based on the scanning measurement data of the scanning measurement source 100 at the first position P1 on the circular trajectory and the scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory to obtain scattering-corrected scanning data at the first position P1, including: calculating the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory based on the scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory; and subtracting the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory from the scanning measurement data at the first position P1 on the circular trajectory to obtain the scattering-corrected scanning data at the first position P1.

[0179] In certain exemplary embodiments of the present application, calculating the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory based on the scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory includes: determining a third position, wherein the third position is symmetrical to the second position P2 about the symmetry plane of the projection object; flipping the scattering measurement data of the scattering measurement source 210 at the second position P2 on the circular trajectory about the vertical center axis of the detector 300 to obtain the scattering measurement data at the third position; and calculating the scattering data of the scanning measurement source 100 at the first position P1 on the circular trajectory based on the first position P1, the third position, and the scattering measurement data at the third position.

[0180] In certain exemplary embodiments of the present application, it is characterized in that calculating the scattering data of the scanning measurement radiation source 100 at the first position P1 on the circular trajectory based on the scattering measurement data at the first position P1, the third position, and the third position includes:

[0181] Calculation is based on the following formula

[0182]

[0183]

[0184] Among them, SAD A represents the distance from the first position P1 to the plane where the rotation axis is located and parallel to the surface of the detector 300, AID represents the distance from the rotation axis to the surface of the detector 300, SAD B represents the distance from the third position to the plane parallel to the surface of the detector 300 where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position, x represents the horizontal coordinate corresponding to the third position on the detector 300, Δx represents the difference between the distance from the first position P1 to the rotation axis and the distance from the third position to the rotation axis, and y represents the vertical coordinate corresponding to the third position on the detector 300.

[0185] According to another aspect of the present application, a method for obtaining scatter-corrected scan data is provided, comprising: obtaining scan measurement data of an illuminant, wherein the illuminant is substantially symmetrical about a symmetry plane of the illuminant; obtaining scatter measurement data of the illuminant; and calculating based on the scan measurement data at a first position and the scatter measurement data at a second position to obtain scatter-corrected scan data at the first position, wherein the first position and the second position are symmetrical about the symmetry plane of the illuminant.

[0186] It can be seen that the aforementioned method of imaging an illuminant using an X-ray imaging device is an exemplary embodiment of a method for obtaining scatter-corrected scan data according to the present invention. It should be noted that obtaining the scan measurement data of an illuminant and / or obtaining the scatter measurement data of an illuminant according to the present invention can be obtained by any means, and is not limited to obtaining the scan measurement data of an illuminant using the aforementioned X-ray imaging device. For example, obtaining the scan measurement data of an illuminant and / or obtaining the scatter measurement data of an illuminant according to the present invention can be obtained by two or more devices.

[0187] According to the method of this aspect, because the illuminant is approximately symmetrical about the symmetry plane of the illuminant, the scattering data at the first position and the scattering measurement data at the second position are approximately symmetrical. Therefore, by utilizing the property that the illuminant is approximately symmetrical about the symmetry plane of the illuminant, the method for obtaining scatter-corrected scan data according to the exemplary embodiment of the present application can obtain scatter-corrected scan measurement data, that is, corrected for scattering.

[0188] Since the method for obtaining scatter correction scan data according to the present invention is different from the method previously described Figure 1-Figure 7 The described X-ray imaging devices and methods for imaging an irradiated object using the X-ray imaging devices are generally corresponding, so for the sake of brevity, repeated contents will not be repeated here and below.

[0189] In certain exemplary embodiments of the present application, the method further includes calculating a symmetry plane of the projection volume, including:

[0190] reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body;

[0191] The center of gravity of the reconstructed body is calculated by the following formula:

[0192]

[0193] Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i Represents the pixel value of the i-th pixel, x i Represents the x component of the i-th pixel, y i Represents the y component of the i-th pixel, z i Represents the z component of the i-th pixel;

[0194] Determine the plane passing through the center of gravity of the reconstructed body, and calculate the symmetry plane of the reconstructed body by the following formula for all planes passing through the center of gravity of the reconstructed body:

[0195]

[0196] where f(x i ,y i ,zi ) represents the pixel value of the i-th pixel, f(x i ',y i ',z i ') represents the pixel value of the ith pixel point symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i = 1 to N / 2; and

[0197] The symmetry plane of the projection volume is determined according to the symmetry plane of the reconstruction volume.

[0198] In certain exemplary embodiments of the present application, calculating based on scanning measurement data at a first position and scattering measurement data at a second position to obtain scattering-corrected scanning data at the first position includes: calculating the scattering data at the first position based on the scattering measurement data at the second position; and subtracting the scattering data at the first position from the scanning measurement data at the first position to obtain the scattering-corrected scanning data at the first position.

[0199] In certain exemplary embodiments of the present application, calculating scattering data at a first position based on scattering measurement data at a second position includes: determining a third position, wherein the third position is symmetrical to the second position about a symmetry plane of the illuminant; flipping the scattering measurement data at the second position about a central axis of a detector that obtains the scattering measurement data to obtain scattering measurement data at the third position, wherein the central axis of the detector is substantially parallel to or included in the symmetry plane of the illuminant; and calculating the scattering data at the first position based on the first position, the third position, and the scattering measurement data at the third position.

[0200] In some exemplary embodiments according to the present application, calculating the scattering data at the first position based on the first position, the third position, and the scattering measurement data at the third position includes:

[0201] Calculation is based on the following formula

[0202]

[0203]

[0204] Among them, SAD A Indicates the distance from the first position to the plane where the rotation axis is located and parallel to the detector surface. AID indicates the distance from the rotation axis to the detector surface. SAD Brepresents the distance from the third position to the plane parallel to the detector surface where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position, x represents the horizontal coordinate corresponding to the third position on the detector, Δx represents the difference between the distance from the first position to the rotation axis and the distance from the third position to the rotation axis, and y represents the vertical coordinate corresponding to the third position on the detector.

[0205] According to another aspect of the present application, an X-ray imaging device is provided, comprising: a scanning measurement source configured to emit X-rays to irradiate an illuminant, wherein the illuminant is roughly symmetrical about a symmetry plane of the illuminant; a scattering measurement assembly configured to measure scattering passing through the illuminant; a detector configured to detect the X-rays emitted by the scanning measurement source to obtain scanning measurement data of the scanning measurement source, and to detect the X-rays emitted by the scattering measurement assembly to obtain scattering measurement data; a rotation mechanism configured to rotate the scanning measurement source, the detector, and the scattering measurement device around the illuminant around a rotation axis in a vertical plane; and a calculation assembly configured to perform calculations based on the scanning measurement data at a first position and the scattering measurement data at a second position to obtain scattering-corrected scanning data at the first position, wherein the first position and the second position are symmetrical about the symmetry plane of the illuminant.

[0206] With the X-ray imaging apparatus of this aspect, because the illuminant is substantially symmetrical about the symmetry plane of the illuminant, the scattering data at the first position and the scattering measurement data at the second position are substantially symmetrical. Therefore, by utilizing the property of the illuminant being substantially symmetrical about the symmetry plane of the illuminant, the X-ray imaging apparatus according to the exemplary embodiment of the present application can obtain scatter-corrected scanning measurement data, i.e., scatter-corrected data.

[0207] Since the X-ray imaging device according to the present invention is different from the previously mentioned Figure 1-Figure 7 The described X-ray imaging devices generally correspond, so that for the sake of brevity, repeated details are not repeated here and below.

[0208] In certain exemplary embodiments according to the present application, the scatterometry assembly includes a scatterometry source configured to emit X-rays to illuminate an illuminant so as to measure scattering by the illuminant.

[0209] In certain exemplary embodiments according to the present application, the scatterometry assembly further includes: a beam blocker comprising a plurality of lead bars disposed between the scatterometry radiation source and the illuminant.

[0210] In certain exemplary embodiments according to the present application, the scanning measurement radiation source and the scattering measurement radiation source are arranged to be located on two sides of a plane containing the rotation axis and perpendicular to the detector surface.

[0211] In certain exemplary embodiments according to the present application, the scanning measurement radiation source and the scattering measurement radiation source are arranged symmetrically with respect to a plane containing the rotation axis and perpendicular to the detector surface.

[0212] In certain exemplary embodiments according to the present application, the scanning measurement radiation source and the scattering measurement radiation source are arranged to form an acute angle with a plane containing the rotation axis and perpendicular to the detector surface.

[0213] In certain exemplary embodiments of the present application, the scanning measurement source and the scatterometry source are the same source. It should be noted that, in these exemplary embodiments, each angle is scanned twice (once with the beam blocker in place, as a scatterometry source; and once with the beam blocker removed, as a scanning measurement source).

[0214] In certain exemplary embodiments according to the present application, the scanning measurement source is arranged to pass through a plane containing the rotation axis and perpendicular to the detector surface.

[0215] In certain exemplary embodiments according to the present application, the X-ray imaging device further includes: a positioning auxiliary tool configured to position the projection object.

[0216] In certain exemplary embodiments according to the present application, the positioning aid comprises a dental tray.

[0217] Although certain exemplary embodiments and examples have been described herein, other embodiments and modifications will be apparent from the above description. Without departing from the teachings of this application, those skilled in the art may make various changes and modifications to the embodiments of this application. Therefore, the present invention is not limited to these embodiments, but is defined by the broader scope of the appended claims and various obvious modifications and equivalent arrangements.

Claims

1. An X-ray imaging device, include: A scanning measurement radiation source is configured to emit X-rays to irradiate a projection body, wherein the projection body is substantially symmetrical about a projection body symmetry plane; A scatter measurement assembly configured to measure scattering through an illuminant, wherein the scatter measurement assembly comprises a scatter measurement source configured to emit X-rays to irradiate the illuminant so as to measure scattering through the illuminant; a detector configured to detect the X-rays emitted by the scanning measurement source to obtain scanning measurement data of the scanning measurement source, and to detect the X-rays emitted by the scattering measurement source to obtain scattering measurement data; a rotation mechanism configured to rotate the scanning measurement source, the detector and the scatterometry assembly around a projection object around a rotation axis in a vertical plane, wherein the scanning measurement source and the scatterometry source are arranged to rotate along the same circular trajectory in a horizontal plane; and a calculation component configured to calculate based on the scanning measurement data of the scanning measurement source at a first position on the circular trajectory and the scattering measurement data of the scattering measurement source at a second position on the circular trajectory to obtain scattering-corrected scanning data at the first position, wherein the angle between the first position and the symmetry plane of the projection object is equal to the angle between the second position and the symmetry plane of the projection object and is opposite in direction, The computing component is further configured to compute a projection volume symmetry plane, including: Reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body; The center of gravity of the reconstructed volume is calculated by the following formula: Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i represents the pixel value of the i-th pixel, x i represents the x component of the ith pixel, yi represents the y component of the ith pixel, z i Represents the z component of the i-th pixel; Determine the plane passing through the centroid of the reconstructed body. For all planes passing through the centroid of the reconstructed body, calculate the symmetry plane of the reconstructed body using the following formula: Where f(x i ,y i ,z i ) represents the pixel value of the i-th pixel, f(x i ',y i ',z i ') represents the pixel value of the ith pixel symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i=1 to N / 2; and Determine the symmetry plane of the projection body according to the symmetry plane of the reconstruction body. The calculation component calculates according to the scanning measurement data of the scanning measurement source at the first position on the circular trajectory and the scattering measurement data of the scattering measurement source at the second position on the circular trajectory to obtain the scattering correction scanning data at the first position, including: The calculation component calculates the scattering data of the scanning measurement source at a first position on the circular trajectory based on the scattering measurement data of the scattering measurement source at a second position on the circular trajectory; and The calculation component subtracts the scattering data of the scanning measurement source at the first position on the circular trajectory from the scanning measurement data of the scanning measurement source at the first position on the circular trajectory to obtain the scattering correction scanning data at the first position. The calculating component calculates the scattering data of the scanning measurement source at the first position on the circular trajectory according to the scattering measurement data of the scattering measurement source at the second position on the circular trajectory, including: The computing component determines a third position, wherein the third position is symmetrical to the second position about the symmetry plane of the projection body; The computing component flips the scatterometry data of the scatterometry source at a second position on the circular trajectory about the vertical center axis of the detector to obtain scatterometry data at a third position; The calculation component calculates scattering data of the scanning measurement source at a first position on the circular trajectory based on the first position, the third position and the scattering measurement data at the third position.

2. The X-ray imaging device according to claim 1, in, The calculation component calculates the scattering data of the scanning measurement source at the first position on the circular trajectory based on the scattering measurement data at the first position, the third position and the third position, including: The calculation is based on the following formula Among them, SAD A It represents the distance from the first position to the plane where the rotation axis is located and parallel to the detector surface. AID represents the distance from the rotation axis to the detector surface. SAD B represents the distance from the third position to the plane parallel to the detector surface where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position, x represents the horizontal coordinate on the detector corresponding to the third position, Δx represents the difference between the distance from the first position to the rotation axis and the distance from the third position to the rotation axis, and y represents the vertical coordinate on the detector corresponding to the third position.

3. The X-ray imaging device according to claim 1, in, The scatterometry assembly further comprises: A beam blocker includes a plurality of lead strips disposed between the scatterometry radiation source and an illuminant.

4. The X-ray imaging device according to claim 1, in, The scanning measurement radiation source and the scattering measurement radiation source are arranged symmetrically with respect to a plane including the rotation axis and perpendicular to the detector surface.

5. A method for imaging an irradiated object using an X-ray imaging device, in, The irradiated body is substantially symmetrical about a symmetry plane of the irradiated body, and the X-ray imaging device comprises a scanning measurement source, a scattering measurement component, a detector, a rotation mechanism, and a computing component, wherein: the scattering measurement component is configured to measure scattering passing through the irradiated body, and the scattering measurement component comprises a scattering measurement source configured to emit X-rays to irradiate the irradiated body so as to measure the scattering passing through the irradiated body; the rotation mechanism is configured to rotate the scanning measurement source, the detector, and the scattering measurement component around the irradiated body around a rotation axis in a vertical plane, wherein the scanning measurement source and the scattering measurement source are arranged to rotate along the same circular trajectory on a horizontal plane; and wherein the method comprises: Place the projection; The X-rays are emitted by a scanning measurement source to irradiate the projection object; The X-rays are emitted by a scattering measurement source to irradiate the projection object; Detecting the X-rays emitted by the scanning measurement source by a detector to obtain scanning measurement data of the scanning measurement source, and detecting the X-rays emitted by the scattering measurement source to obtain scattering measurement data; and The calculation is performed by a calculation component according to the scanning measurement data of the scanning measurement source at the first position on the circular trajectory and the scattering measurement data of the scattering measurement source at the second position on the circular trajectory to obtain the scattering correction scanning data at the first position, wherein the angle between the first position and the symmetry plane of the projection object is equal to the angle between the second position and the symmetry plane of the projection object and is opposite in direction, It also includes calculating the symmetry plane of the projection body through the calculation component, including: Reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body; The center of gravity of the reconstructed volume is calculated by the following formula: Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i represents the pixel value of the i-th pixel, x i Represents the x component of the i-th pixel, y i represents the y component of the i-th pixel, z i Represents the z component of the i-th pixel; Determine the plane passing through the centroid of the reconstructed body. For all planes passing through the centroid of the reconstructed body, calculate the symmetry plane of the reconstructed body using the following formula: Where f(x i ,y i ,z i ) represents the pixel value of the i-th pixel, f(x i ',y i ',z i ') represents the pixel value of the ith pixel symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i=1 to N / 2; and Determine the symmetry plane of the projection body according to the symmetry plane of the reconstruction body. The step of calculating, by a calculation component, based on the scanning measurement data of the scanning measurement source at the first position on the circular trajectory and the scattering measurement data of the scattering measurement source at the second position on the circular trajectory to obtain the scattering-corrected scanning data at the first position comprises: Calculating scattering data of the scanning measurement source at a first position on the circular trajectory based on scattering measurement data of the scattering measurement source at a second position on the circular trajectory; and subtracting the scattering data of the scanning measurement source at the first position on the circular trajectory from the scanning measurement data of the scanning measurement source at the first position on the circular trajectory to obtain scattering-corrected scanning data at the first position, Wherein, calculating the scattering data of the scanning measurement source at the first position on the circular trajectory according to the scattering measurement data of the scattering measurement source at the second position on the circular trajectory comprises: Determine a third position, wherein the third position is symmetrical to the second position about the symmetry plane of the projection object; flipping the scatterometry data of the scatterometry source at a second position on the circular trajectory about the vertical center axis of the detector to obtain scatterometry data at a third position; Scattering data of the scanning measurement source at the first position on the circular trajectory are calculated based on the first position, the third position and the scattering measurement data at the third position.

6. The method according to claim 5, in, Calculating the scattering data of the scanning measurement source at the first position on the circular trajectory based on the scattering measurement data at the first position, the third position and the third position comprises: The calculation is based on the following formula Among them, SAD A It represents the distance from the first position to the plane where the rotation axis is located and parallel to the detector surface. AID represents the distance from the rotation axis to the detector surface. SAD B represents the distance from the third position to the plane parallel to the detector surface where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position, x represents the horizontal coordinate on the detector corresponding to the third position, Δx represents the difference between the distance from the first position to the rotation axis and the distance from the third position to the rotation axis, and y represents the vertical coordinate on the detector corresponding to the third position.

7. A method of obtaining scatter-corrected scan data, in, The irradiated body is roughly symmetrical about the symmetry plane of the irradiated body. The X-ray imaging device comprises a scanning measurement source, a scattering measurement component, a detector, a rotation mechanism and a computing component, wherein: the scattering measurement component is configured to measure the scattering passing through the irradiated body, the scattering measurement component comprises a scattering measurement source configured to emit X-rays to irradiate the irradiated body so as to measure the scattering passing through the irradiated body; the rotation mechanism is configured to rotate the scanning measurement source, the detector and the scattering measurement component around the irradiated body around a rotation axis in a vertical plane, wherein the scanning measurement source and the scattering measurement source are arranged to rotate along the same circular trajectory on a horizontal plane, and the method comprises: Obtaining scanning measurement data of an illuminant, wherein the illuminant is substantially symmetrical about a symmetry plane of the illuminant; obtaining scatterometry data of the illuminant; and Calculating based on the scanning measurement data at the first position and the scattering measurement data at the second position to obtain scattering-corrected scanning data at the first position, wherein the first position and the second position are symmetrical about a symmetric plane of the projection body, It also includes the calculation of the symmetry plane of the projection volume, including: Reconstructing the scanned measurement data to obtain a reconstruction volume of the projection body; The center of gravity of the reconstructed volume is calculated by the following formula: Where G represents the sum of the pixel values ​​of all pixels in the reconstructed volume; G i represents the pixel value of the i-th pixel, x i Represents the x component of the i-th pixel, y i represents the y component of the i-th pixel, z i Represents the z component of the i-th pixel; Determine the plane passing through the centroid of the reconstructed body. For all planes passing through the centroid of the reconstructed body, calculate the symmetry plane of the reconstructed body using the following formula: Where f(x i ,y i ,z i ) represents the pixel value of the i-th pixel, f(x i ',y i ',z i ) represents the pixel value of the ith pixel symmetrical to the determined plane. For the pixel outside the reconstructed volume (x i ',y i ',z i '), f(x i ',y i ',z i ') is equal to zero, N represents the total number of pixels of the entire object, where i=1 to N / 2; and Determine the symmetry plane of the projection body according to the symmetry plane of the reconstruction body. The step of calculating the scattering-corrected scan data at the first position based on the scan measurement data at the first position and the scattering measurement data at the second position comprises: calculating scattering data at the first location based on scatterometry data at the second location; and subtracting the scattering data at the first position from the scanning measurement data at the first position to obtain scattering-corrected scanning data at the first position, Wherein, calculating the scattering data at the first position according to the scattering measurement data at the second position comprises: Determine a third position, wherein the third position is symmetrical to the second position about the symmetry plane of the projection object; flipping the scatterometry data at the second position about a central axis of a detector that acquired the scatterometry data to obtain scatterometry data at a third position, wherein the central axis of the detector is substantially parallel to or included in a symmetry plane of the projection volume; Scattering data at the first position is calculated based on the first position, the third position, and the scattering measurement data at the third position.

8. The method according to claim 7, in, Calculating the scattering data at the first position based on the first position, the third position, and the scattering measurement data at the third position includes: The calculation is based on the following formula Among them, SAD A It represents the distance from the first position to the plane where the rotation axis is located and parallel to the detector surface. AID represents the distance from the rotation axis to the detector surface. SAD B represents the distance from the third position to the plane parallel to the detector surface where the rotation axis is located, F represents the corrected scattering data, f represents the scattering data corresponding to the third position, x represents the horizontal coordinate on the detector corresponding to the third position, Δx represents the difference between the distance from the first position to the rotation axis and the distance from the third position to the rotation axis, and y represents the vertical coordinate on the detector corresponding to the third position.

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