System for evaluating scanning quality of a scanner and method thereof

Abstract

A system for evaluating the scanning quality of a scanner on a test piece is provided. The system includes a processor and a memory, the memory and processor being communicative for storing instructions executable by the processor, such that the processor is configured to: receive a scanned image of the test piece from the scanner; display the scanned image; generate a first score value based on the scanned image; display an evaluation input interface configured to receive user evaluation input based on an evaluation of the scanned image; and generate a second score value based on the user evaluation input, such that the first score value and the second score value are used to evaluate the scanning quality of the scanner. Furthermore, a method for evaluating the scanning quality of a scanner is also provided.

Description

[0001] Cross-reference to related applications

[0002] This application claims the benefit of Singapore Patent Application No. 10201913527R, filed on 27 December 2019, and Singapore Patent Application No. 10202008028P, filed on 20 August 2020, the entire contents of which are incorporated herein by reference. Technical Field

[0003] This invention relates to a system and method for evaluating the scanning quality of a scanner. Background Technology

[0004] Scanners are widely used in customs in many countries to identify items passing through customs. For example, CT scanners and X-ray scanners are used to scan cargo and baggage to detect illegal or dangerous goods entering or leaving the country and boarding transport vehicles (e.g., airplanes, ships). Today, with the continuous increase in logistics and passenger flow, the ability of scanners to scan items faster and more accurately has become crucial. Therefore, it is important to regularly maintain and test scanners to ensure their performance is at its best and exceeds required standards.

[0005] Several systems exist capable of testing scanners. These systems typically involve a test piece passing through the scanner, allowing for the capture and subsequent evaluation of a scanned image of the test piece. However, these test pieces are large and bulky, making them difficult to operate. Furthermore, for multi-view... Figure X X-ray scanners require the test piece to be adjusted to face and pass through the scanner for each view that must be tested. Therefore, testing multi-view scanners can be quite time-consuming. For customs with high 24-hour traffic, any extended downtime of the scanner reduces customs efficiency. Furthermore, the test piece may not provide a scanned image useful for accurately evaluating the scanner, thus preventing it from properly testing the scanner.

[0006] When test specimens are scanned, the scanned images are typically visually inspected and evaluated by inspection officials or testers. Therefore, test results can be highly inconsistent, as one inspection official's opinion may differ from another. When multiple scanners are tested, inconsistent results can lead to inaccurate scanner calibration and performance. Although systems exist that automatically evaluate scanned images to assess test results, their evaluations may be inaccurate due to system limitations (e.g., poor evaluation procedures, test specimens). Therefore, currently available systems cannot efficiently and accurately test scanners.

[0007] Therefore, it is important to have a system that can overcome the above problems. Summary of the Invention

[0008] According to various embodiments, a system for evaluating the scanning quality of a scanner on a test piece is provided. The system includes a processor and a memory, the memory being communicative with the processor to store instructions executable by the processor, such that the processor is configured to: receive a scanned image of the test piece from the scanner; display the scanned image; generate a first score value based on the scanned image; display an evaluation input interface configured to receive user evaluation input based on an evaluation of the scanned image; and generate a second score value based on the user evaluation input, such that the first score value and the second score value are used to evaluate the scanning quality of the scanner.

[0009] According to various embodiments, the processor may be configured to determine at least one region of interest (ROI) in the scanned image and analyze the at least one ROI to generate the first score value.

[0010] According to various embodiments, the processor may be configured to retrieve a template including at least one predetermined ROI, map the template onto the scanned image to determine the at least one ROI in the scanned image.

[0011] According to various embodiments, the processor may be configured to extract image data from the at least one ROI of the scanned image and generate statistical data from the extracted image data to analyze the image data of the at least one ROI.

[0012] According to various embodiments, the at least one ROI can be determined based on the test specimen.

[0013] According to various embodiments, the template may be determined based on the test piece.

[0014] According to various embodiments, the test piece can be optimized for CT image quality analysis.

[0015] According to various embodiments, the scanner may include a field of view ranging from 100mm × 100mm to 2000mm × 2000mm.

[0016] According to various embodiments, the scanned image may include an image resolution in the range of reconstructed voxels from 0.5 mm to 10.0 mm.

[0017] According to various embodiments, the scanner may include a helical scanning system with a scanning speed ranging from 0.01 m / s to 10.00 m / s.

[0018] According to various embodiments, the test specimen can be optimized for transmission X-ray image quality analysis.

[0019] According to various embodiments, the scanner may include a field of view ranging from 300mm × 300mm to 4500mm × 6000mm.

[0020] According to various embodiments, the scanned image may include an image resolution in the spatial resolution range of 0.3 mm to 10 mm.

[0021] According to various embodiments, the scanner may include a linear X-ray system with a scanning speed ranging from 0.01 m / s to 100 km / h.

[0022] According to various embodiments, the test specimen can be optimized for backscattered X-ray image quality analysis.

[0023] According to various embodiments, the scanner may include a field of view ranging from a spatial resolution of 300mm × 300mm to 5000mm × 12000mm.

[0024] According to various embodiments, the scanner may include a linear backscattering scanning system with a scanning speed ranging from 0.01 m / s to 20 km / h.

[0025] According to various embodiments, the scanned image may include an image resolution ranging from 0.5 mm to 20 mm.

[0026] According to various embodiments, the scanner may be an X-ray scanner.

[0027] According to various embodiments, a computer-implemented method is provided for evaluating the scanning quality of a scanner on a test piece. The method includes: receiving a scanned image of the test piece from the scanner; displaying the scanned image; generating a first score value for the scanned image; displaying an evaluation input interface configured to receive user evaluation input based on an evaluation of the scanned image; and generating a second score value based on the user evaluation input, such that the first score value and the second score value are used to evaluate the scanning quality of the scanner.

[0028] According to various embodiments, the method may further include determining at least one region of interest (ROI) in the scanned image and analyzing the at least one ROI to generate the first score value.

[0029] According to various embodiments, the method may further include retrieving a template comprising at least one predetermined ROI, mapping the template onto the scanned image to determine the at least one ROI in the scanned image.

[0030] According to various embodiments, the method may further include extracting image data from the at least one ROI of the scanned image and generating statistical data from the extracted image data to analyze the image data of the at least one ROI.

[0031] According to various embodiments, a non-transitory computer-readable storage medium is provided. The non-transitory computer-readable storage medium includes instructions that, when executed by a processor in a system, cause the system to: receive a scanned image of a test specimen from a scanner; display the scanned image; generate a first score value based on the scanned image; display a score input interface configured to receive user input; and receive a second score value via the score input interface, the first score value and the second score value being used to evaluate the scanning quality of the scanner.

[0032] According to various embodiments, a testing system is provided, the testing system including the system described above and a test piece for evaluating the scanning quality of a scanner.

[0033] According to various embodiments, the test piece may include a plurality of test panels spaced apart from each other along a longitudinal axis, each of the plurality of test panels being perpendicular to the longitudinal axis.

[0034] According to various embodiments, the test piece may include a base panel and a rotatable panel, the base panel including a first plurality of test elements and a longitudinal axis, the rotatable panel including a second plurality of test elements and pivotally connected to the base panel along the longitudinal axis, the rotatable panel being rotatable about the longitudinal axis. Attached Figure Description

[0035] Figure 1 An exemplary embodiment of a system for evaluating the scanning quality of a scanner on a test piece is shown.

[0036] Figure 2 A flowchart is shown of a computer-implemented method for evaluating the scanning quality of a test piece by a scanner.

[0037] Figure 3 A perspective view showing an exemplary embodiment of a test piece used to test the scanning quality of a scanner.

[0038] Figure 3A Show Figure 3 The front view of the test piece.

[0039] Figure 3B Show Figure 3 A top view of the test piece.

[0040] Figure 4 A perspective view showing an exemplary embodiment of the first test panel among a plurality of test panels.

[0041] Figure 4A An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0042] Figure 5 A perspective view showing an exemplary embodiment of a second test panel among a plurality of test panels.

[0043] Figure 5A Show Figure 5 A top view of the second test panel.

[0044] Figure 5B An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0045] Figure 6 A perspective view showing an exemplary embodiment of a third test panel among a plurality of test panels.

[0046] Figure 6A Show Figure 6 Top view of the third test panel.

[0047] Figure 6B Show Figure 6 The front view of the third test panel.

[0048] Figure 6C A top view of a section of the third test panel is shown.

[0049] Figure 6D An exemplary example is shown of the matrix used to calculate the first and second score values ​​for the third test panel.

[0050] Figure 6E An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0051] Figure 7 A perspective view showing an exemplary embodiment of the fourth test panel among a plurality of test panels.

[0052] Figure 7A Show Figure 7 Top view of the fourth test panel.

[0053] Figure 7B Show Figure 7 A schematic diagram of multiple hole sections and ROI.

[0054] Figure 7C An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0055] Figure 8A perspective view showing an exemplary embodiment of the fifth test panel among a plurality of test panels.

[0056] Figure 8A A top view showing multiple slender elements is shown.

[0057] Figure 8B An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0058] Figure 9 A perspective view showing an exemplary embodiment of the sixth test panel among a plurality of test panels.

[0059] Figure 9A Show Figure 9 Top view of the sixth test panel.

[0060] Figure 9B An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0061] Figure 10 A perspective view showing an exemplary embodiment of the seventh test panel among a plurality of test panels.

[0062] Figure 10A and Figure 10B Show Figure 10 A top view of the upper and lower base panels of the substrate.

[0063] Figure 10C An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0064] Figure 10D An exemplary embodiment of the total score summary table is shown.

[0065] Figure 11A A top view showing an exemplary embodiment of the test piece.

[0066] Figure 11B The front view of the test piece in a rotated position is shown.

[0067] Figure 11C The front view of the test specimen in the closed position is shown.

[0068] Figure 11D Showing the open position Figure 11A The front view of the test piece.

[0069] Figure 11E The front view of the test specimen used in the dual-view scanner is shown.

[0070] Figure 12 A perspective view showing an exemplary embodiment of the substrate of the base panel and / or rotatable panel.

[0071] Figure 13A A top view schematic diagram showing an exemplary embodiment of the first test element among a plurality of test elements.

[0072] Figure 13B Show Figure 13A A cross-sectional schematic diagram of the first test piece.

[0073] Figure 13C An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0074] Figure 14A A top view schematic diagram showing an exemplary embodiment of the second test element among a plurality of test elements.

[0075] Figure 14B An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0076] Figure 15 A top view showing an exemplary embodiment of a third test element among a plurality of test elements.

[0077] Figure 15A An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0078] Figure 16 A top view showing an exemplary embodiment of the fourth test element among a plurality of test elements.

[0079] Figure 16A An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0080] Figure 17 A perspective view showing an exemplary embodiment of the fifth test element among a plurality of test elements.

[0081] Figure 17A Show Figure 17 A front view of multiple layers in the image.

[0082] Figure 17B An exemplary embodiment of a user evaluation interface for a test piece is shown.

[0083] Figure 17C The matrix used to calculate the first and second score values ​​of the fifth test element is shown.

[0084] Figure 18 A perspective view showing an exemplary embodiment of the sixth test element among a plurality of test elements.

[0085] Figure 18A Show Figure 18 A top view of the base panel.

[0086] Figure 18CAn exemplary embodiment of a user evaluation interface for a test piece is shown.

[0087] Figure 18 D shows the matrix used to calculate the first and second score values ​​for the fifth test element.

[0088] Figure 19 An exemplary embodiment of the total score summary table is shown. Detailed Implementation

[0089] In the following examples, reference will be made to the accompanying drawings, wherein the same features are indicated by the same reference numerals.

[0090] Figure 1 An exemplary embodiment of a system 100 for evaluating the scan quality of a test specimen by a scanner 10 is shown. The system 100 may be configured to communicate with the scanner 10. The system 100 may include a processor 100P and a memory 100M communicating with the processor 100P for storing instructions executable by the processor 100P. The processor 100P is configured to: receive a scanned image of a test specimen from the scanner 10; display the scanned image; generate a first score value based on the scanned image; display an evaluation input interface configured to receive user evaluation input based on an evaluation of the scanned image; and generate a second score value based on the user evaluation input, such that the first and second score values ​​are used to evaluate the scan quality of the scanner 10. The processor 100P may be configured to determine the scan quality of the scanner based on the first and second score values. The system 100 can be used to evaluate the scan quality of different types of scanners (e.g., CT scanners, X-ray scanners including linear X-ray scanners, backscatter X-ray scanners, etc.).

[0091] System 100 may include at least one of a multimedia module 100U, an audio module 100A, an input / output (I / O) interface 100N, and a communication module 100C. The multimedia module 100U is configured to display scanned images and a scoring input interface and to receive user input. The audio module 100A is configured to input / output audio signals. The input / output (I / O) interface 100N is configured to provide an interface between the processor 100P and a peripheral interface module (e.g., a keyboard). The communication module 100C is configured to facilitate communication between system 100 and other devices or servers. System 100 may include a storage module (e.g., a database, a cloud server) configured to store data.

[0092] System 100 is capable of performing both objective and subjective evaluations of scanned images. Based on the scanned images, system 100 can automatically generate a first score value for at least one aspect of the test (e.g., spatial resolution) based on the quality of the scanned images. Simultaneously, the scanned images are displayed on the multimedia module 100U for user viewing, and based on the user's evaluation of the scanned image quality, the user inputs evaluation data into the evaluation input interface by inputting input data into the system via the multimedia module 100U or an I / O interface. System 100 can generate a second score value from the user's evaluation input data. System 100 can obtain both the objective first score value generated by system 100 and the subjective second score value generated by the user. Both the first and second score values ​​can be used to evaluate the scanning quality of scanner 10. System 100 can retrieve predetermined first and second threshold score values ​​from the storage module and compare the first and second threshold score values ​​with the first and second score values, respectively. If the first score is lower than a first threshold score or the second score is lower than a second threshold score, the system 100 may generate a fault signal and send it to the user via a user device (e.g., a tablet, laptop, or multimedia module 100U). The system 100 may generate an alarm via an audio module 100A. The system 100 may calculate both the first and second score values ​​and generate a total score. The system 100 may retrieve a predetermined total threshold score and compare it with the total score. If the total score is lower than the total threshold score, the system 100 may generate a fault signal and send it to the user via a user device or multimedia module 100U. The system 100 may generate an alarm via an audio module 100A. The system 100 may store the predetermined total threshold score, the first threshold score, and the second threshold score in a storage module.

[0093] Figure 2 A flowchart illustrates a computer-implemented method for evaluating the scanning quality of a test piece by a scanner 10. The method includes: receiving a scanned image of the test piece from the scanner 10 in block 202; displaying the scanned image in block 204; generating a first score value for the scanned image in block 206; displaying an evaluation input interface in block 208, the evaluation input interface being configured to receive user evaluation input based on an evaluation of the scanned image; and generating a second score value based on the user evaluation input in block 210, such that the first and second score values ​​are used to evaluate the scanning quality of the scanner 10.

[0094] To obtain an objective score for the scanned image, system 100 can be configured to perform the following methods. When processor 100P receives a scanned image of a test piece, processor 100P can be configured to determine at least one region of interest (ROI) in the scanned image and analyze the at least one ROI to generate a first score value. The at least one ROI is determined based on the test piece. System 100 can be configured to retrieve a template having the at least one predetermined ROI to determine the at least one ROI in the scanned image. System 100 can be configured to store multiple templates having the at least one predetermined ROI in a storage module. Processor 100P can retrieve the template having the at least one predetermined ROI and map the template onto the scanned image to determine the at least one ROI in the scanned image. Processor 100P can be configured to transform the template to map it onto the scanned image. By transforming the template, processor 100P can rotate, translate, and / or scale the template onto the scanned image. To map the template onto the scanned image, processor 100P can perform techniques including pattern matching, least squares fitting minimization, etc. Once the transformation is performed, the processor 100P can be configured to use transformation factors (e.g., rotation factor, translation factor, and / or scaling factor) to map the at least one ROI in the template onto the scanned image to determine the at least one ROI in the scanned image.

[0095] Once the at least one Region of Interest (ROI) in the scanned image is identified, the processor 100P can be configured to extract image data from the at least one ROI in the scanned image and generate statistical data from the extracted image data to analyze the image data of the at least one ROI. The processor 100P can be configured to calculate parameters (e.g., a set of statistical properties) including the average and standard deviation of the individual pixel or voxel values ​​contained within each of the at least one ROI in the scanned image. Based on these parameters, the processor 100P can calculate quantities characterizing the scan quality of the scanner 10 (e.g., contrast, uniformity, feature detection, etc.). For example, the processor 100P can calculate a quality factor among the statistical properties of the at least one ROI. The processor 100P can generate a score value based on the parameters of each of the at least one ROI. For example, the processor 100P can return a binary value of the scan quality (e.g., true or false, yes or no), and assign a score value if the binary value is true. The system 100 can store the score table in a storage module. The scoring table may include multiple ROIs and their corresponding scoring values, whereby the binary value of each of the at least one ROI is used to generate the scoring value. System 100 can retrieve the scoring table of the test piece to retrieve the scoring value for each of the multiple ROIs. Processor 100P can use the scoring table to assign a scoring value to each of the at least one ROI. Processor 100P can sum the scoring values ​​of the at least one ROI to generate a first scoring value.

[0096] To obtain a subjective rating of the scanned image, system 100 can be configured to perform the following methods: Processor 100P can display the scanned image on a multimedia module (e.g., a display, touchscreen) for user viewing. Processor 100P can display a user evaluation interface on the multimedia module for user viewing. System 100 can store the evaluation input interface in a storage module. The evaluation input interface may include a rating sheet. Instances of the user evaluation interface can be stored in... Figure 4AThe processor 100P can display a schematic diagram of the test piece having the at least one ROI, allowing a user to identify the at least one ROI and input the binary value of each of the at least one ROI via a multimedia module or I / O interface (e.g., keyboard). If the features in the ROI of the scanned image are visible, the user can input "Yes" in the user evaluation interface. Otherwise, the user can input "No". The processor 100P can receive the binary value of at least one of the at least one ROI and assign a score value to each of the at least one ROI based on a scoring table. Optionally, the user can use a matrix to directly input the score value into the user evaluation interface. The processor 100P can receive the score values ​​and sum the score values ​​of the at least one ROI to generate a second score value. The score values ​​can be weighted so that more difficult-to-identify designed ROIs can be scored higher. The first and second scores of the scanned image are stored in a server. The analysis results of the scanned image are stored in a server. The stored data, forming historical data, can be stored for future analysis.

[0097] Scanned images can be converted into a unified format with predetermined image coordinates and data types. In this way, scanned images of various formats from various types of scanners can be standardized into a single format.

[0098] Figure 1 A testing system is shown, which may include system 100 and test pieces as described below.

[0099] Figure 3This is a perspective view illustrating an exemplary embodiment of a test piece 300 used to test the scan quality of a scanner 10. The test piece 300 may be adapted to a CT scanner. The test piece 300 may be optimized for CT image quality analysis. The scanner 10 may have a field of view ranging from 100mm × 100mm to 2000mm × 2000mm. The scanner 10 may have a helical scanning system 100 with a scan speed ranging from 0.01m / s to 10.00m / s. The scanned image may have an image resolution ranging from 0.5mm to 10.0mm in reconstructed voxels. The test piece 300 may include a plurality of test panels 310. The plurality of test panels 310 may be spaced apart from each other along a longitudinal axis 300L. Each of the plurality of test panels 310 may form an angle with the longitudinal axis 300L. The plurality of test panels 310 may be perpendicular to the longitudinal axis 300L, such that the plurality of test panels 310 may be parallel to each other. A longitudinal axis 300L may pass through each of the plurality of test panels 310. Each of the plurality of test panels 310 may include a central axis. The longitudinal axis 300L may pass through the center of each of the plurality of test panels 310. The central axis of each of the plurality of test panels 310 may be parallel to the longitudinal axis 300L. Each of the plurality of test panels 310 may have a circular profile. When the plurality of test panels 310 are arranged parallel to each other along the longitudinal axis 300L, the plurality of test panels 310 may form a tubular profile. The test piece 300 may include a tubular housing adapted to accommodate the plurality of test panels 310. The test piece 300 may be 600 mm long and 300 mm wide.

[0100] Figure 3A Show Figure 3 The front view of test piece 300. Figure 3B Show Figure 3 A top view of test piece 300. (See attached image.) Figure 3A and Figure 3B As shown, the plurality of test panels 310 may be parallel to each other. Each of the plurality of test panels 310 may be designed to test a specific scan quality of the scanner 10. (Refer to...) Figure 3B This embodiment of test piece 300 may include seven test panels 310. Test piece 300 may include at least one of any combination of the seven test panels 310, or may include other test panels 310 if necessary. Test piece 300 having the plurality of test panels 310 allows for multiple tests in a single scan.

[0101] Figure 4 This is a perspective view showing an exemplary embodiment of the first test panel 410 of the plurality of test panels 310. The first test panel 410 may be adapted to test the contrast, effective nuclear charge (Z-C) of the scanner 10. effectiveThe first test panel 410 may include a substrate 410B having a top side 410BT and a bottom side 410BB opposite to the top side 410BT. The substrate 410B may be mounted to a substrate panel 410P. The substrate 410B may include a plurality of elongated elements 410E extending from and out of the substrate 410B. The plurality of elongated elements 410E may be parallel to the central axis 410 of the first test panel 410. The plurality of elongated elements 410E may have the same or different lengths. The plurality of elongated elements 410E may be made of different materials, such that the plurality of elongated elements 410E have different densities. The materials of the plurality of elongated elements 410E may be selected from a density range within the organic range, so that the scanning quality and sensitivity of the scanner 10 within this range can be tested. For example, the material may include polypropylene, polyamide 12, or polypropylene 10% glass, polypropylene 30% glass, polyetheretherketone (PEEK), acetal homopolymer (e.g., Delrin™), chlorinated PVC, polyvinylidene fluoride, or polytetrafluoroethylene (e.g., Teflon™). The substrate 410B may be made of acrylic (e.g., Perspex™ plexiglass). The substrate 410B can be used as a scattering substrate to scatter electron waves emitted by the scanner 10. Multiple elongated elements 410E may be divided into multiple groups of elongated elements 410E. (Refer to...) Figure 4 There can be two sets of elongated elements. The width of the elongated element 410E in one set can be different from the width of the elongated element 410E in the other set. (Refer to...) Figure 4 The first set of elongated elements 410E1 may be wider than the second set of elongated elements 410E2. The first set of elongated elements 410E1 may be arranged concentrically to form a ring around the central axis 410 and be equidistant from each other. The second set of elongated elements 410E2 may be arranged concentrically to form a ring around the central axis 410 and be equidistant from each other. The second set of elongated elements 410E2 may be disposed within the first set of elongated elements 410E1. The plurality of elongated elements 410E may be rods. The substrate 410B may be circular, square, or any suitable shape. The first test panel 410 allows the user to view the visibility of the elongated elements 410E in air (i.e., extending from the substrate 410B) and within the scattering material (i.e., within the substrate 410B).

[0102] Figure 4AAn exemplary embodiment of a user evaluation interface 412 for test piece 300 is shown. The user evaluation interface 412 may be a scoring table for a first test panel 410. The scoring table may include multiple Regions of Interest (ROIs) (e.g., step size 1, step size 2, etc.) and a score (e.g., a fraction) for each of the multiple ROIs. A processor 100P may receive and evaluate a scanned image of the first test panel 410. For objective evaluation, a template of the first test panel 410 may be retrieved by the processor 100P and mapped onto the scanned image of the first test panel 410. Multiple ROIs of the scanned image may be determined based on the template. For example, if the diameter of the elongated element in the first group of elongated elements 410E1 is 20 mm, then the ROI may be determined to be a circle with a radius of 16 mm, which includes the elongated element. Voxels or pixels completely contained within the ROI may be extracted for analysis. For example, parameters (e.g., mean and standard deviation) of the pixels within the ROI may be calculated. Individual ROIs of the same region may be calculated at the center of the scanned image within the substrate 410B. If the interval between the average values ​​of two step sizes in the air is greater than one standard deviation, the step size can be considered distinguishable. If the average value between the step size and the average value of the substrate 410B is greater than one standard deviation, the step size can be considered distinguishable in the substrate 410B. The processor 100P can assign the corresponding score value to the ROI based on the scoring table. Once the scoring table is completed, the system 100 can assign each performance characteristic of the scanner 10 (i.e., contrast, Z-axis) to the ROI. effective The scanner generates a first score and a second score (based on density resolution) to evaluate the scanning quality of the scanner 10.

[0103] For subjective evaluation, system 100 can prompt the user via multimedia module 100U to distinguish gray levels between different materials of multiple elongated elements 410E in the air and substrate 410B. For example, referring to... Figure 4 If the user can identify a discernible contrast between step size 1 (represented as 1 on substrate 410B) and step size 2 (represented as 2 on substrate 410B) in the scanned image, the user can input "Yes" in "Step Size 1" under "Subjective, Air" via the multimedia module 100U and / or I / O interface 100N. Therefore, if step size 1 and step size 2 are indistinguishable, the user can input "No". The same steps can be taken for steps 1 to 8 in air and on substrate 410B.

[0104] Figure 5 This is a perspective view showing an exemplary embodiment of a second test panel 510 of the plurality of test panels 310. The second test panel 510 is adapted to test the degree of beam hardening effect on the scanner 10. The second test panel 510 may include a triangular plate 510T having a base portion 510TB and a vertex opposite to the base. Figure 5 (Not shown in the image). The base portion 510TB and its vertex may be along the central axis 510L. The second test panel 510 may include a substrate 510P and a top plate 510A spaced apart from the substrate 510P. A triangular plate 510T may extend from the substrate 510P to the top plate 510A along the central axis 510L. The triangular plate 510T may be made of acrylic.

[0105] Figure 5A Show Figure 5 A top view of the second test panel 510. (See diagram below.) Figure 5A As shown, a triangular plate 510T can extend from a base plate 510P to a top plate 510A, such that the base portion 510TB of the triangular plate 510T is connected to the base plate 510P and the vertex is connected to the top plate 510A. Figure 5A A schematic diagram of a second test panel 510 having at least one ROI is also shown. For example, for the second test piece 300, there may be eight ROIs (i.e., test areas 1 to 8).

[0106] Figure 5B An exemplary embodiment of a user evaluation interface 512 for test piece 300 is shown. The user evaluation interface 512 may include a scoring table for a second test panel 510. The scoring table may include multiple Regions of Interest (ROIs), such as test areas 1 and 2, test areas 3 and 4, etc., corresponding to a schematic diagram and a corresponding score (e.g., a score) for each of the multiple ROIs. A processor 100P may receive and evaluate a scanned image of the second test panel 510. For objective evaluation, the processor 100P may retrieve a template of the second test panel 510 and map it onto the scanned image of the second test panel 510. Multiple ROIs of the scanned image may be determined based on the template. For example, a triangular plate 510T may be divided into eight ROI strips. The processor 100P may extract voxels or pixels from each of the multiple ROIs. The system 100 may calculate parameters for each of the multiple ROIs. For example, if the variance is less than the mean a predetermined number of times (e.g., 2 ×), the processor 100P may assign the corresponding score to the ROI according to the scoring table.

[0107] For subjective evaluation, system 100 can prompt the user via multimedia module 100U to identify any changes in the color of each ROI. For example, refer to... Figure 5AThe second test panel 510 (i.e., the triangle) with uniform color will indicate that the scan quality of scanner 10 is acceptable. If the user can identify uniform color in the ROI (e.g., test areas 1 and 2) of the scanned image, the user can enter "Yes" in "Test Areas 1 and 2" via multimedia module 100U and / or I / O interface 100N. Therefore, if there is color variation in the ROI, the user can enter "No". The same steps can be taken for test areas 1 to 8. Once the scoring sheet is completed, system 100 can generate a first score value and a second score value for each performance characteristic (i.e., beam hardening effect) of scanner 10 to evaluate the scan quality of scanner 10.

[0108] Figure 6 This is a perspective view showing an exemplary embodiment of a third test panel 610 of the plurality of test panels 310. The third test panel 610 is adapted to test the spatial resolution of the scanner 10. The third test panel 610 may include a substrate 610P, a central axis 610L perpendicular to the substrate 610P, and a plurality of elongated ridges 610R extending along the substrate 610P. The plurality of ridges 610R may be spaced apart from each other. The plurality of ridges 610R may have different heights ranging from 5 mm to 20 mm. The heights of the plurality of ridges 610R may be spaced apart, for example, 5 mm, 10 mm, 15 mm, 20 mm. The plurality of ridges 610R may be arranged sequentially from highest to lowest. The plurality of ridges 610R may be divided into multiple groups of ridges 610R. The ridges 610R in each of the multiple groups of ridges 610R may have the same height. The height of the ridge 610R in one of the multiple groups of ridges 610R may be different from the height of the ridge 610R in another of the multiple groups of ridges 610R. Each of the plurality of ridges 610R may be wedge-shaped and have a tip when viewed from top view. The plurality of ridges 610R may be arranged such that the tips of the plurality of ridges 610R converge at the central axis 610L.

[0109] Figure 6A Show Figure 6 A top view of the third test panel 610. Multiple ridges 610R extend outward from the central axis 610L and are spaced apart from each other. (As shown...) Figure 6A As shown, the first group of ridges 610R1 can be 5 mm high, the second group of ridges 610R2, spaced apart from the first group of ridges, can be 10 mm high, the third group of ridges 610R3, spaced apart from the second group of ridges, is 15 mm high, and the fourth group of ridges 610R4, spaced apart from the third group of ridges, is 20 mm high. From the top view, the plurality of ridges 610R radiate from the central axis 610L of the substrate 610P.

[0110] Figure 6B Show Figure 6 The front view of the third test panel 610. (See attached image.) Figure 6BAs shown, the plurality of ridges 610 may have different heights extending from the substrate 610P. The fourth group of ridges 610R4 may be higher than the third group of ridges 610R3, the third group of ridges 610R3 may be higher than the second group of ridges 610R2, and the second group of ridges 610R2 may be higher than the first group of ridges 610R1.

[0111] Figure 6C A top view of a section of the third test panel 610 is shown. Figure 6C The diagram shows a segment of multiple ridges 610R at a certain height. The system 100 is configured to identify points where the multiple ridges 610R are no longer indistinguishable for each height. For example, such as... Figure 6C As shown, if the points where the plurality of ridges 610R are no longer indistinguishable are represented by L2 from the edges of the plurality of ridges 610R, then L1, which is an indistinguishable region, can be calculated by subtracting the length of the plurality of ridges 610R from L2.

[0112] Figure 6D An exemplary example of a matrix 612M for calculating a first and a second score value for a third test panel 610 is shown. System 100 may include a matrix 612M for test panels with more than one dimension. For example, the third test panel 610 may have a first dimension of height of the plurality of ridges 610R and a second dimension of width of the plurality of ridges 610R. Matrix 612M may include dimensions and corresponding score values ​​for the dimensions. As shown in matrix 612M, the score value with the lowest resolution (e.g., 1 mm) may have the highest weight or score value.

[0113] Figure 6E An exemplary embodiment of a user evaluation interface 612 for test piece 300 is shown. The user evaluation interface 612 may be a scoring table for a third test panel 610. The scoring table may include multiple Regions of Interest (ROIs) (e.g., 5mm test area, 10mm test area, etc.) and blank fields for the user to input the measurement length L2 of each of the multiple ROIs. A processor 100P may receive and evaluate a scanned image of the third test panel 610. For objective evaluation, the processor 100P may retrieve a template of the third test panel 610 and map it onto the scanned image of the third test panel 610. The processor 100P may identify multiple ROIs based on the template of the third test panel 610. For example, the processor 100P may obtain... Figure 6CThe test area shown is defined by a set of rings spaced 5 mm apart, extending outward from the central axis 610L to the edge of the segments of the plurality of ridges 610R. For each ring, the processor 100P can be configured to extract voxels or pixels and calculate the maximum and minimum values ​​of voxels or pixels around the ring. If the minimum value of a voxel or pixel is below a threshold (e.g., 20% of the maximum value), the processor 100P can identify the ring as "visible". The processor 100P can determine the "visible" ring with the smallest diameter as the resolution limit of the segment. The same calculation can be performed for each segment of the plurality of ridges 610R at other heights. For subjective evaluation, the system 100 can prompt the user via the multimedia module 100U to identify the widths of the plurality of ridges 610R that are distinguishable from each other in each segment. For example, referring to... Figure 6C and Figure 6D If the user can identify that the width of the 5mm test area is 3mm, the user can input the assigned score value via the multimedia module 100U and / or the I / O interface 100N. The processor 100P can assign the corresponding score value to the ROI based on the matrix 612M. The same steps can be taken for other segments of multiple ridges 610R with different heights. Once the scoring table is completed, the system 100 can generate a first score value and a second score value for each performance characteristic (i.e., spatial resolution) of the scanner 10 to evaluate the scanning quality of the scanner 10.

[0114] Figure 7 A perspective view showing an exemplary embodiment of the fourth test panel 710 of the plurality of test panels 310 is provided. The fourth test panel 710 may be adapted to test the contrast resolution of the scanner 10. The fourth test panel 710 may also be adapted to test the spatial resolution of the scanner 10. The fourth test panel 710 may be adapted to verify the performance of spatial resolution and contrast resolution as a function of reconstructed CT slice thickness. The fourth test panel 710 may include a substrate 710B having a top side 710BT and a bottom side opposite to the top side 710BT. Figure 7 (Not shown in the image) and a central axis 710L extending through the top side 710BT and the bottom side. The fourth test panel 710 may include a plurality of holes 710H extending from the top side 710BT toward the bottom side and parallel to the central axis 710L. The plurality of holes 710H may have different depths and widths. The plurality of holes 710H may have depth values ​​ranging from 5 mm to 40 mm. The plurality of holes 710H may have depth values ​​ranging from 1 mm to 10 mm. The substrate 710B may be attached to the substrate 610P.

[0115] Figure 7A Show Figure 7A top view of the fourth test panel 710. Multiple holes 710H can be divided into multiple groups of holes 710H1. Each of the multiple groups of holes 710H1 may include holes 710H with increasing width. For example, each group of holes 710H1 may include holes 710H with widths of 1mm, 2mm, 4mm, 6mm, 8mm, and 10mm. The depth of each group of holes 710H1 may differ from each other. For example, the depth of the multiple groups of holes 710H1 may include 5mm, 10mm, 15mm, 20mm, 25mm, 30mm, 35mm, and 40mm. Each of the multiple groups of holes 710H1 may be arranged in a straight line, with the holes 710H arranged from the deepest to the shallowest. Each of the multiple groups of holes 710H1 may be arranged radially from a central axis 710L. The base 710B may be circular, square, or any suitable shape. The multiple holes 710H may be circular.

[0116] Figure 7B Show Figure 7 A schematic diagram of the segments and ROIs of the plurality of holes 710H is provided. For objective evaluation, when a scanned image of the second test piece 300 is received, the system 100 can identify multiple ROIs based on the template of the fourth test panel 710. The system 100 can identify each hole location as an ROI. The system 100 can generate parameters for each of the plurality of ROIs. For example, referring to... Figure 7B The processor 100P can identify multiple hole locations and background areas (e.g., circles with a diameter of 30 mm) between any two sets of holes 710H as Regions of Interest (ROIs). The processor 100P can calculate and compare the average value of voxels or pixels within each ROI or hole with the standard deviation of the background area. If the average value of the holes differs from the average value of the test area by at least two standard deviations, the processor 100P can designate the holes as "visible".

[0117] Figure 7C An exemplary embodiment of a user evaluation interface 712 for test piece 300 is shown. The user evaluation interface 712 may be a scoring table for a fourth test panel 710. The scoring table 712 may include the width of the holes 710H and a scoring value assigned to each hole 710H. Figure 7CAs shown, the score values ​​can be weighted so that holes 710H with smaller widths can be assigned higher score values. The processor can receive and evaluate a scanned image of the fourth test panel 710. For objective evaluation, the processor 100P can retrieve a template of the fourth test panel 710 and map it onto the scanned image of the fourth test panel 710. Multiple Regions of Interest (ROIs) of the scanned image can be determined based on the template. For example, each hole can be an ROI, and the background area between the multiple sets of holes can be an ROI. Voxels or pixels fully contained within the ROIs can be extracted for analysis. For example, parameters of the pixels within the holes (e.g., mean and standard deviation) can be compared with the standard deviation of the background area. If the mean of the holes differs from the mean of the background area by at least two standard deviations, the processor 100P can determine that the hole is "visible". The processor 100P can assign the corresponding score value to the ROI based on a scoring table. For subjective evaluation, the system 100 can prompt the user via the multimedia module 100U to identify the number of holes 710H of each width visible in the scanned image. Users can input the number of holes in the rating table via the multimedia module 100U and / or the I / O interface 100N, and the processor 100P can assign corresponding rating values ​​based on the rating table. Once the rating table is completed, the system 100 can generate a first rating value and a second rating value for each performance characteristic (i.e., contrast and resolution) of the scanner 10 to evaluate the scanning quality of the scanner 10.

[0118] Figure 8 This is a perspective view showing an exemplary embodiment of the fifth test panel 810 of the plurality of test panels 310. The fifth test panel 810 is suitable for the scanner 10 to test the sensitivity of metal articles. The fifth test panel 810 may include a substrate 810B having a top side 810BT and a bottom side opposite to the top side 810BT. Figure 8 (Not shown in the image) and a central axis 810L passing through the top side 810BT and the bottom side. A substrate 810B can be mounted to a base plate 810P. The substrate 810B may include a plurality of elongated elements 810E extending from and beyond the substrate 810B. The plurality of elongated elements 810E may be parallel to the central axis 810L. The plurality of elongated elements 810E may have the same length. The plurality of elongated elements 810E may have different widths. The width of the plurality of elongated elements 810E may be in the range of 1 mm to 6 mm. The plurality of elongated elements 810E may be divided into multiple groups of elongated elements 810E. The width of an elongated element 810E in one group may be different from the width of an elongated element 810E in another group.

[0119] Figure 8A A top view of the plurality of elongated elements 810E is shown. Figure 8AThe plurality of elongated elements 810E are shown. The plurality of elongated elements 810E may include at least one of a first group of elongated elements 810E1 having a first width (e.g., 1 mm), a second group of elongated elements 810E2 having a second width (e.g., 2 mm), a third group of elongated elements 810E3 having a third width (e.g., 6 mm), and a fourth group of elongated elements 810E4 having a fourth width (e.g., 6 mm). The plurality of elongated elements 810E may be rods. The base 810B may be circular, square, or any suitable shape. Figure 8A The scanned image also shows the multiple ROIs (i.e., rings). The processor 100P can retrieve and map the template of the fifth test panel 810 to identify the ROIs of the scanned image.

[0120] Figure 8B An exemplary embodiment of a user evaluation interface 812 for test piece 300 is shown. The user evaluation interface 812 may be a scoring table for a fifth test panel 810. The scoring table may include multiple ROIs (e.g., 1mm wiring, 2mm wiring, etc.) and a score (e.g., a fraction) for each of the multiple ROIs. A processor 100P may receive and evaluate a scanned image of the fifth test panel 810. For objective evaluation, the processor 100P may retrieve a template of the fifth test panel 810 and map it onto the scanned image of the fifth test panel 810. Multiple ROIs of the scanned image may be determined based on the template. For example, the multiple ROIs may be a ring surrounding each set of elongated elements 810E1. The processor 100P may extract voxels and pixels from the multiple ROIs and calculate parameters for the multiple ROIs. For example, the processor 100P may perform calculations on parameters such as... Figure 8AThe average value and standard deviation of voxels or pixels within the rings shown are calculated. If more than a predetermined number of voxels or pixels (e.g., five) within the rings are greater than three standard deviations of the average value, the processor 100P can designate the plurality of elongated elements 810E as "visible". The processor 100P can assign corresponding score values ​​to the plurality of ROIs based on a scoring table. The same steps can be taken for other groups of elongated elements 810E with different widths. For subjective evaluation, the system 100 can prompt the user via the multimedia module 100U to set multiple rings through the plurality of elongated elements 810E in the air and in the substrate 810B. The system 100 can prompt the user to cover the inner portion of the rings in the scanned image, and if the traces of the elongated elements 810E in a group are visible in the rings, input is provided via the multimedia module 100U and / or the I / O interface 100N. The processor 100P can be configured to assign corresponding score values ​​when the traces of the elongated elements 810E in the group are not visible. The same steps can be taken for other elongated elements 810E in air and in substrate 810B. Once the scoring table is completed, system 100 can generate a first score and a second score for each performance characteristic of scanner 10 (i.e., metal artifact sensitivity) to evaluate the scanning quality of scanner 10.

[0121] Figure 9 This is a perspective view showing an exemplary embodiment of the sixth test panel 910 of the plurality of test panels 310. The sixth test panel 910 is adapted to test the raster resolution and spatial resolution of the scanner 10. The sixth test panel 910 may include a substrate 910B having a top side 910BT and a bottom side opposite to the top side 910BT. Figure 9 (Not shown in the image) and a central axis 910L passing through the top side 910BT and the bottom side. The base 910B may include an array of elongated slots 910S parallel to the top side 910BT and recessed towards the bottom side. The array of slots 910S may include a plurality of slots 910S with different widths and / or lengths. Each of the slots 910S in the array may include transverse wiring parallel to and spaced apart from the top side 910BT of the base 910B ( Figure 9(Not shown in the image) to form an array of transverse wirings. Each transverse wiring may extend linearly in each of the arrays of slots 910S. Each of the arrays of slots 910S may include a transverse wiring with a diameter corresponding to the width and length of the slot 910S. Multiple slots 910S may be arranged parallel to each other, with gaps 910G between them, to form an array of slots 910S. The array of slots 910S may be arranged such that the widest and longest slot is at one end of the array and the narrowest and shortest slot is at the opposite end. The width of each of the gaps 910G may decrease from one end of the array to the other. The array of slots 910S may be arranged into multiple groups of slots 910S. Each of the multiple groups may include slots 910S of the same width and length, and the gaps 910G between them may have the same width as the slots 910S. Figure 9A As shown, each of the plurality of slots 910S1 may include three slots 910S. One set of slots 910S1 at one end of the array may have the widest and longest slot 910S and the widest gap 910G, while the other set of slots 910S1 at the other end of the array may have the narrowest and shortest slot 910S and the narrowest gap 910G. The sixth test panel 910 may include an array of more than one slot 910S, such as two arrays. The width of the plurality of slots 910S and the diameter of the plurality of lateral wirings may include at least one of 1mm, 2mm, 3mm, 4mm, 6mm, etc. The width of the slots and the diameter of the wirings can be determined according to the testing requirements. For example, one set of slots 910S and wirings may be 1mm, and another set may be 2mm.

[0122] The sixth test panel 910 may include rows of vertical wirings 910W. A row of vertical wirings 910W may include multiple vertical wirings 910W that are parallel to the central axis 910L (i.e., perpendicular to the top side 910BT) and extend from the top side 910BT to the bottom side, and are spaced apart from each other. The diameter of the wirings 910W in a row of vertical wirings 910W may increase from one end of the row to the other. For example, the wiring specifications of the vertical wirings may include at least one of 24AWG, 30AWG, 32AWG, and 36AWG. The sixth test panel 910 may include more than one row of vertical wirings 910W. Rows of vertical wirings 910W allow the test piece 300 to test the wiring resolution of the scanner 10. Wiring resolution determines the scanner 10's ability to resolve fine wiring at high contrast. The sixth test panel 910 allows simultaneous testing of the scanner 10's grid resolution and wiring resolution. The substrate 910B may be made of acrylic.

[0123] Figure 9A Show Figure 9A top view of the sixth test panel 910. The array of slots 910S may be arranged laterally relative to the central axis 910L. Each group of slots 910S may include three slots 910S and lateral wiring of the same length and width, equidistant from each other. The length and width of each group of slots 910S, as well as the spacing between them, decrease with each subsequent group of slots 910S. The array of slots 910S may include at least one of a first group of slots 910S1 having a first width (e.g., 6 mm), a second group of slots 910S2 having a second width (e.g., 4 mm), a third group of slots 910S3 having a third width (e.g., 3 mm), a fourth group of slots 910S4 having a fourth width (e.g., 2 mm), and a fifth group of slots 910S5 having a fifth width (e.g., 1 mm). Each slot in each group of slots 910 has lateral wiring with a diameter corresponding to its width. One or more rows of longitudinal wiring 910W may be present. Each row of vertical wiring 910W can include vertical wiring 910W with wiring specifications of 24AWG, 30AWG, 32AWG and 36AWG.

[0124] Figure 9BAn exemplary embodiment of a user evaluation interface 912 for test piece 300 is shown. The user evaluation interface 912 may be a scoring table for a sixth test panel 910. The scoring table may include multiple ROIs (e.g., 24AWG, 1mm grid, etc.) and a score (e.g., a fraction) for each of the multiple ROIs. A processor 100P may receive and evaluate a scanned image of the sixth test panel 910. For objective evaluation, the processor 100P may retrieve a template of the sixth test panel 910 and map it onto the scanned image of the sixth test panel 910. Multiple ROIs of the scanned image may be determined based on the template. The processor 100P may be configured to perform independent methods for evaluating the scanned image. The system 100 may identify multiple ROI substrates 910Bd on the template of the sixth test panel 910. For objective evaluation of the scanned images of the multiple longitudinal wirings 910W, the processor 100P may be configured to calculate a series of line profiles passing through each of the ROIs and sum a series of line profiles along the length of the longitudinal wirings 910W. Processor 100P can be configured to calculate the peak height at approximately the center of the longitudinal wiring substrate 910Bd based on a summation value, calculate the average value of voxels or pixels surrounding the longitudinal wiring 910W, and compare the peak height with the average value. If the peak height of the longitudinal wiring 910H is greater than a predetermined number of standard deviations of the noise in the surrounding average value (e.g., 3 times), processor 100P can designate the state of the longitudinal wiring 910H as "visible". For objective evaluation of the multiple sets of wirings, processor 100P can be configured to sum the values ​​of voxels or pixels in a direction parallel to the set of wirings and analyze the contours by the summation values ​​on the contours of the set of wirings. Processor 100P can be configured to calculate the maximum and minimum values ​​of voxels or pixels in each set of wirings. If the minimum value is less than a predetermined percentage (e.g., 20%) of the maximum value, processor 100P can designate the state of the set of wirings as "visible". Processor 100P is configured to assign score values ​​to multiple ROIs based on a scoring table. For subjective evaluation, system 100 can prompt the user to identify multiple vertical wirings and multiple sets of wirings via multimedia module 100U. If the user can identify them, the user can input the results into a scoring table via multimedia module 100U and / or I / O interface 100N module. Processor 100P can be configured to assign corresponding score values ​​to ROIs based on the scoring table. Once the scoring table is completed, system 100 can generate a first score value and a second score value for each performance characteristic of scanner 10 (i.e., raster resolution and spatial resolution) to evaluate the scanning quality of scanner 10.

[0125] Figure 10This is a perspective view illustrating an exemplary embodiment of the seventh test panel 1010 of the plurality of test panels 310. The seventh test panel 1010 is adapted to test the sensitivity of the scanner 10 to small inclusions. The seventh test panel 1010 may include a substrate 1010B and a central axis 1010L passing through the substrate 1010B. The substrate 1010B may include at least one substrate panel 1010P. The at least one substrate panel 1010P may include a plurality of holes 1010H. The plurality of holes 1010H may have different diameters. The plurality of holes 1010H may have diameters ranging from 1.0 mm to 3.0 mm. For example, the diameters of the plurality of holes 1010H may be 1.0 mm, 1.5 mm, 2.0 mm, 2.5 mm, and 3.0 mm. The plurality of holes 1010H may be through holes passing through the substrate panel 1010P. The substrate panel 1010P may include a pin in each of the plurality of holes 1010H. Figure 10 (Not shown in the image). The pins may be made of tin or other materials. Multiple holes 1010H may be arranged in concentric circles around the central axis 1010L and equidistant from each other. Multiple holes 1010H may be arranged in ascending or descending order counterclockwise according to the size of the holes 1010H. (e.g.) Figure 10 As shown, the substrate 1010B may include an upper substrate panel 1010UP and a lower substrate panel 1010LP.

[0126] Figure 10A and Figure 10B Show Figure 10 Top view of the upper base panel 1010UP and the lower base panel 1010LP of the base 1010B. Figure 10A The upper base panel 1010UP is shown. Figure 10B The lower base panel 1010LP is shown. The upper base panel 1010UP and the lower base panel 1010LP can be stacked on top of each other such that the plurality of holes 1010H of each base panel 1010P are misaligned. For example, refer to Figure 10A The plurality of holes 1010H can be oriented such that one of the plurality of holes 1010H forms an angle of approximately 72.0° with the reference line 1010F, and with reference to Figure 10B The plurality of holes 1010H may be oriented such that one of the plurality of holes 1010H forms an angle of approximately 36.0° with the reference line 1010F. The plurality of holes 1010H in the lower base panel 1010LP may include pins.

[0127] Figure 10CAn exemplary embodiment of a user evaluation interface 1012 for test piece 300 is shown. The user evaluation interface 1012 may be a scoring table for a seventh test panel 1010. The scoring table may include multiple Regions of Interest (ROIs) (e.g., 1.0 mm, 2.0 mm, etc.) and a score (e.g., a rating) for each of the multiple ROIs. A processor 100P may receive and evaluate scanned images of the seventh test panel 1010. The processor 100P may receive scanned images of an upper substrate panel 1010UP and a lower substrate panel 1010LP. For objective evaluation, the processor 100P may retrieve a template of the seventh test panel 1010 and map it onto the scanned image of the seventh test panel 1010. Multiple ROIs of the scanned image may be determined based on the template. For objective evaluation, the processor 100P may identify multiple ROIs as the multiple holes 1010H and the background area (e.g., a circle with a diameter of 20 mm) between the multiple holes 1010H of each substrate panel 1010P. Processor 100P can be configured to calculate the average value of voxels or pixels within each ROI (i.e., each in the substrate panel 1010P and the plurality of holes 1010H in the background area). If the average value of the plurality of holes 1010H differs from the average value of the background area of ​​each substrate panel 1010P by at least two standard deviations, processor 100P can designate that hole as "visible". For subjective evaluation, system 100 can prompt the user to identify the plurality of holes 1010H in the scanned image of the upper substrate panel 1010P without pins and the scanned image of the lower substrate panel 1010P with pins via multimedia module 100U. If the user can identify them, the user can input the results into a scoring table via multimedia module 100U and / or I / O interface 100N module. Processor 100P can assign the corresponding score value to the ROI based on the scoring table. Once the scoring sheet is completed, the system 100 can generate a first score and a second score for each performance feature of the scanner 10 (i.e., raster resolution and spatial resolution) to evaluate the scanning quality of the scanner 10.

[0128] Figure 10D An exemplary embodiment of the total score summary table 1014 is shown. When scanned images of multiple test panels 310 have been evaluated, the system 100 can generate an overall first score value and an overall second score value for the test piece 300 based on the individual first score value and individual second score value of each test panel 310, such as... Figure 10D As shown in the image.

[0129] Figure 11AA top view showing an exemplary embodiment of test piece 1100 is provided. Test piece 1100 can be optimized for transmission X-ray image quality analysis. Scanner 10 may have a field of view ranging from 300mm × 300mm to 4500mm × 6000mm. Scanner 10 may be a linear X-ray system 100 with a scanning speed ranging from 0.01m / s to 100km / h. The scanned image may have an image resolution ranging from 0.3mm to 10.0mm in spatial resolution. Test piece 1100 can be optimized for backscattered X-ray image quality analysis. Scanner 10 may have a field of view ranging from 300mm × 300mm to 5000mm × 12000mm in spatial resolution. Scanner 10 may be a linear backscattered scanning system 100 with a scanning speed ranging from 0.01m / s to 20km / h. The scanned image may have an image resolution ranging from 0.5mm to 20mm.

[0130] Test piece 1100 may include a base panel 1100A having a longitudinal axis 1102L and a rotatable panel 1100B pivotally connected to the base panel 1100A along the longitudinal axis 1102L, such that the rotatable panel 1100B is rotatable about the longitudinal axis 1102L. The base panel 1100A may include a first plurality of test elements 1100E for testing the scan quality of the scanner 10. The rotatable panel 1100B may include a second plurality of test elements 1100E for testing the scan quality of the scanner 10. The first plurality of test elements 1100E may be identical to the second plurality of test elements 1100E. When viewed from a top view, the orientation of the second plurality of test elements 1100E of the rotatable panel 1100B may be inverted compared to the orientation of the first plurality of test elements 1100E of the base panel 1100A. The base panel 1100A may include one or more test elements 1100E. Figure 11A As shown, the substrate panel 1100A may include six test elements 1100E. The test element 1100 may include a housing 1120 adapted to house the test element 1100. The housing 1120 may include a first portion 1120A adapted to encapsulate the substrate panel 1100A and a second portion 1120B adapted to encapsulate the rotatable panel 1100B. The housing 1120 may include a handle 1120H, which includes a first half connected to the first portion 1120A and a second half connected to the second portion 1120B. The test element 1100 having the first plurality of test elements 1100E allows for multiple tests in a single scan.

[0131] Reference Figure 11AThe rotatable panel 1100B is pivotally connected to the base panel 1100A along the transverse axis 1102M. The transverse axis 1102M is perpendicular to the longitudinal axis 1102L. The transverse axis 1102M and the longitudinal axis 1102L are in the same plane. Figure 11A As shown, the base panel 1100A may have a top side 1100AT, a bottom side 1100AB opposite to the top side 1100AT, a left side 1100AL and a right side 1100AR extending from the top side 1100AT to the bottom side 1100AB, and the rotatable panel 1100B may have a top side 1100BT, a bottom side 1100BB opposite to the top side 1100BT, a left side 1100BL and a right side 1100BR extending from the top side 1100BT to the bottom side 1100BB. The test piece 1100 may include a hinge 1120H attached to the right side 1100AR of the base panel 1100A and the left side 1100BL of the rotatable panel 1100B to allow the rotatable panel 1100B to rotate about a transverse axis 1102M. The hinge 1120H may be adapted to allow the rotatable panel 1100B to rotate about a longitudinal axis 1102L.

[0132] Figure 11B A front view of the test piece 1100 in its rotated position is shown. A portion of the housing 1120 has been removed to show a cross-sectional view of the base panel 1100A and the rotatable panel 1100B. The rotatable panel 1100B is rotatable to the rotated position about the longitudinal axis 1102L. The rotatable panel 1100B is rotatable about the hinge 1100H. The rotatable panel 1100B is rotatable to form an angle between the rotatable panel 1100B and the base panel 1100A. The rotatable panel 1100B is rotatable such that the angle can be between 1° and 90°.

[0133] Figure 11C This shows a front view of test piece 1100 in the closed position. A portion of housing 1120 has been removed to show a cross-sectional view of base panel 1100A and rotatable panel 1100B. Rotatable panel 1100B can rotate around transverse axis 1102M (…). Figure 11C (Not shown) Rotates between a closed position and an open position. In the closed position, the rotatable panel 1100B rotates to face the base panel 1100A, as shown. Figure 11C As shown, in the open position, the rotatable panel 1100B can be in the same plane as the base panel 1100A, such as... Figure 11A As shown in Figure 11. The test piece 1100 in Figure 11 can be considered to be in a load-bearing mode, where the user can carry the test piece 1100 via the handle 1120H.

[0134] Figure 11D Showing the open position Figure 11AThe test piece 1100 is shown in the front view. Part of the housing 1120 has been removed to show a cross-sectional view of the base panel 1100A and the rotatable panel 1100B. The base panel 1100A can be mounted onto the first portion 1120A of the housing 1120, and the rotatable panel 1100B can be mounted onto the second portion 1120B of the housing 1120.

[0135] Figure 11E A front view of a test piece 1100 used in a dual-view scanner 1020 is shown. The test piece 1100 allows a single scan by a single-view or dual-view scanner (e.g., an X-ray scanner) to produce a 2D scan image. Due to the flexibility of rotation about the longitudinal axis 1102L, the test piece 1100 can be adjusted to accommodate the view position of a dual-view scanner in any location. Figure 11E As shown in the two figures, although the position of view 1020C in the dual-view scanner 1020 may differ, the test piece 1100 can be oriented by rotating the rotatable panel 1100B and placing the base panel 1100A according to the position of view 1020C in the dual-view scanner 1020, so that the test piece 1100 is perpendicular to the beam of the scanner 10. Compared to conventional test pieces that need to be placed according to each view and scanned twice in the dual-view scanner 1020, this test piece 1100 allows for testing of both views in the dual-view scanner 1020 in a single scan. Furthermore, the test piece 1100 is compact and lightweight. Therefore, the test piece 1100 is portable and easy to use. As described above, the test piece 1100 can be carried around the housing 1120 using the handle 1120H. In use, the housing 1120 can be opened such that the second part 1120B of the housing 1120, together with the rotatable panel 1100B, can rotate from a closed position to an open position about the transverse axis 1102M. When the first portion 1120A of the housing 1120 is placed on the scanner 10 together with the base panel 1100A, the second portion 1120B of the housing 1120, together with the rotatable panel 1100B, can be angled according to the viewing angle of the scanner 10. Therefore, the scanner 10 can be tested by passing the test piece 1100 through once to obtain a scanned image; that is, the test piece 1100 allows a single pass through the dual-view scanner 1020. Each view of the scanner 10 may include an X-ray generator and multiple X-ray detection elements.

[0136] Figure 12 This is a perspective view showing an exemplary embodiment of a substrate 1200P of a base panel 1100A and / or a rotatable panel 1100B. The base panel 1100A may include a substrate 1200P adapted to mount a test element 1100E thereon. The substrate 1200P may include a top side 1200PT and a bottom side 1100AB opposite to the top side 1100PT. Figure 12(Not shown in the image). The substrate 1200P may include a plurality of recesses 1200PR adapted to receive a plurality of test elements 1100E therein.

[0137] Figure 13A This is a top view schematic diagram illustrating an exemplary embodiment of the first test element 1310 among the plurality of test elements 1100E. The first test element 1310 is adapted to test the penetration level of the scanner 10. The first test element 1310 may include a plurality of blocks 1310B of different heights. For example, the plurality of blocks 1310B may include eight blocks 1310B, each of which has a different height, such as 2mm, 4mm, 6mm, 8mm, 10mm, 12mm, 14mm, and 16mm. The plurality of blocks 1310B may be arranged in descending order of their height. The plurality of blocks 1310B may form a staircase, with the highest block at one end and the lowest block at the opposite end. Each of the plurality of blocks 1310B may be wedge-shaped, such that the plurality of blocks 1310B may be arranged to form a staircase. Figure 13A The circular blocks shown. Multiple blocks 1310B can be made of steel. Multiple blocks 1310B can be mounted on the top side 1200PT of the substrate 1200P. Figure 13A (Not shown in the image). The first test element 1310 may include a central block 1310C located beneath the plurality of blocks 1310B. The central block 1310C may have a different material than the plurality of blocks 1310B. The central block 1310C may be made of lead. The central block 1310C may be embedded in the substrate 1200P. (See reference...) Figure 12 The substrate 1200P may include a first recess 1200PR1 adapted to receive a central block 1310C. The central block 1310C may be circular.

[0138] Figure 13B Show Figure 13A A cross-sectional view of the first test element 1100 is shown. The first test element 1310 may include a bottom block 1310M located below the plurality of blocks 1310B. The bottom block 1310M may be disposed below the central block 1310C, such that the central block 1310C may be disposed between the plurality of blocks 1310B and the bottom block 1310M. The bottom block 1310M may be mounted to the bottom side of the substrate 1200P. The bottom block 1310M may be 22 mm thick. Figure 13B As shown, the plurality of blocks 1310B may have different heights. The bottom block 1310M may be circular.

[0139] Figure 13CAn exemplary embodiment of a user evaluation interface 1312 for test element 1100 is shown. The user evaluation interface 1312 may be a scoring table for the first test element 1310. The scoring table may include multiple ROIs (e.g., step size 1, step size 2, etc.) and a score (e.g., a rating) for each of the multiple ROIs. Processor 100P may receive and evaluate a scanned image of the first test element 1310. For objective evaluation, a template of the first test element 1310 may be retrieved by processor 100P and mapped onto the scanned image of the first test element 1310. Multiple ROIs of the scanned image may be determined based on the template. For example, one or more ROIs may be determined in each of multiple blocks 1310B, some having a central block 1310C and some not. Processor 100P may be configured to calculate the average and standard deviation of the multiple ROIs. If the difference between the average ROI of the block with center block 1310C and the average ROI of the block without center block 1310C is greater than one standard deviation, the processor 100P can designate the step size as "visible". The processor 100P can be configured to assign the corresponding score value to the ROI based on a scoring table. For subjective evaluation, the system 100 can prompt the user via the multimedia module 100U to distinguish the clear steps between portions of the block with center block 1310C and portions of the block without center block 1310C. The processor 100P can receive input regarding whether the step size is visible via the multimedia module 100U or an I / O module and assign the corresponding score value based on the scoring table 1312. The processor 100P can assign the corresponding score value to the ROI based on the scoring table. The same steps can be taken for multiple other blocks 1310B. Once the scoring sheet is completed, the system 100 can generate a first score and a second score for each performance characteristic (i.e., penetration level) of the scanner 10 to evaluate the scanning quality of the scanner 10.

[0140] Figure 14A This is a top view schematic diagram illustrating an exemplary embodiment of the second test element 1410 among the plurality of test elements 1100E. The second test element 1410 is adapted to test the ability of the scanner 10 to distinguish materials of different compositions. The second test element 1410 is adapted to test the effective nuclear charge (Z). effective The capability of the test element 1410 is tested. The second test element 1410 may include multiple blocks 1410B made of different materials, such that the multiple blocks 1410B have different densities. Each of the multiple blocks 1410B may be wedge-shaped, such that the multiple blocks 1410B can be arranged to form a wedge shape. Figure 14A The circular blocks shown. Multiple blocks 1410B can be mounted on the top side 1200PT of the substrate. Figure 14A(Not shown in the image). Multiple blocks 1410B may have the same height. The material of the multiple blocks 1410B may be selected from a density range within the organic spectrum, allowing the scanner 10 to be tested for scanning quality and sensitivity within said range. For example, the material may include polypropylene, polyamide 12, or polypropylene 10% glass, polypropylene 30% glass, polyetheretherketone, acetal homopolymer (e.g., pyrrolidone), chlorinated PVC, polyvinylidene fluoride, or polytetrafluoroethylene (e.g., Teflon). The substrate may be made of acrylic (e.g., plexiglass).

[0141] Figure 14B An exemplary embodiment of a user evaluation interface 1412 for test element 1100 is shown. The user evaluation interface 1412 may be a scoring table for the second test element 1410. The scoring table may include multiple Regions of Interest (ROIs) (e.g., test area 1, test area 2, etc.) and a score (e.g., a rating) for each of the multiple ROIs. Processor 100P may receive and evaluate a scanned image of the second test element 1410. For objective evaluation, a template of the second test element 1410 may be retrieved by processor 100P and mapped onto the scanned image of the second test element 1410. Multiple ROIs of the scanned image may be determined based on the template. For example, one or more ROIs may be determined in each of the multiple blocks 1410B. Processor 100P may be configured to receive Z-values ​​of each of the multiple ROIs from scanner 10. effective Value. Processor 100P can be configured to perform Z-value analysis on each of the plurality of ROIs. effective The average and standard deviation of the values ​​are calculated. Processor 100P can be configured to assign a "yes" state when the average ROI of a block (e.g., test area 1) is greater than the average of the next block (e.g., test area 2) by one standard deviation, and assign a corresponding score value based on scoring table 1312. Processor 100P can be configured to assign the corresponding score value of the ROI based on the scoring table. The same steps can be performed on multiple other blocks 1410B. For subjective evaluation, system 100 can prompt the user based on the material type (Z) of the multiple blocks 1410B. effective The system 100 sets the scanner 10 to color. The system 100 can prompt the user to determine whether a block is distinguishable from adjacent blocks. The system 100 can be configured to receive input indicating whether a block is distinguishable from adjacent blocks and assign corresponding score values ​​to two blocks 1410B based on a scoring table 1412. The processor 100P can be configured to assign corresponding score values ​​to ROIs based on the scoring table. Once the scoring table is completed, the system 100 can generate a first score value and a second score value for each performance characteristic (i.e., penetration level) of the scanner 10 to evaluate the scanning quality of the scanner 10.

[0142] Figure 15A top view showing an exemplary embodiment of the third test element 1510 of the plurality of test elements 1100E is provided. The third test element 1510 is adapted to test the spatial resolution of the scanner 10. The third test element 1510 may include a plate 1510D and a plurality of strips 1510S located on the plate 1510D. Each of the plurality of strips 1510S may be wedge-shaped, such that each has a wide end and a pointed end opposite the wide end. The pointed ends of the plurality of strips 1510S may converge at a center point 1510C, and the wide ends of the plurality of strips may be spaced apart from each other. The plurality of strips 1510S may form a truncated fan shape. The third test element 1510 may be mounted on the top side 1200PT of the substrate. Figure 15 (Not shown in the image). Multiple strips of 1510S can be made of steel.

[0143] Figure 15A An exemplary embodiment of a user evaluation interface 1512 for a test element 1100 is shown. The user evaluation interface 1512 may be a scoring table for a third test element 1510. The scoring table may include multiple ROIs (e.g., 0.5mm test area, 1.0mm test area, etc.) and a score (e.g., a rating) for each of the multiple ROIs. A processor 100P may receive and evaluate a scanned image of the third test element 1510. For objective evaluation, a template of the third test element 1510 may be retrieved by the processor 100P and mapped onto the scanned image of the third test element 1510. Multiple ROIs of the scanned image may be determined based on the template. For example, an ROI may be multiple circular lines 1510R with different radii from a center point 1510C. The processor 100P may be configured to project the circular lines 1510R from the center point 1510C with a constant radius (see [link to relevant documentation]). Figure 15The processor 100P extends through multiple strips 1510S, from one side of the truncated sector to the other. The processor 100P can be configured to calculate the intensity distribution along each circular line 1510R at predetermined radius intervals (e.g., 1 mm, 2 mm, etc.) starting from the center point 1510C. For each of the intensity distributions, the processor 100P can be configured to calculate the modulation between the peaks and troughs. For example, the processor 100P can be configured to calculate the mean and standard deviation of the peaks and troughs. The processor 100P can be configured to assign a "visible" state if the difference between the mean values ​​of the peaks and troughs is at least one standard deviation, round up to the nearest 0.5 mm radius, and assign a corresponding score value based on the scoring table 1512. The processor 100P can be configured to assign a corresponding score value for the ROI based on the scoring table. The same steps can be taken for other predetermined radii as shown in the scoring table 1512. For subjective evaluation, system 100 can prompt the user to identify the points where the plurality of strips 1510S merge into each other, making them indistinguishable. Based on the radii assigned on the sides of the plurality of strips 1510S, system 100 can receive input from the user via multimedia module 100U or I / O interface 100N module regarding the visible radii of the plurality of strips 1510S. For example, if the plurality of strips 1510S are visible at a radius of 2.0 mm, the user can input radii of 2.5 mm and 3.0 mm. Processor 100P can assign corresponding score values ​​based on a scoring table. Once the scoring table is completed, system 100 can generate a first score value and a second score value for each performance characteristic (i.e., spatial resolution) of scanner 10 to evaluate the scanning quality of scanner 10.

[0144] Figure 16 This is a top view illustrating an exemplary embodiment of the fourth test element 1610 among the plurality of test elements 1100E. The fourth test element 1610 is adapted to test the grid resolution of the scanner 10. The fourth test element 1610 may include a plate 1610D and a plurality of rods 1610S of different widths located on the plate 1610D. The plurality of rods 1610S may be grouped into multiple sets of rods 1610S of different widths. The plurality of rods 1610S in each set of rods 1610S may have the same length. The plurality of rods 1610S in each set of rods 1610S may be spaced apart from each other by gaps of the same width as the plurality of rods 1610S. The plurality of rods 1610S may be made of steel. The plurality of rods 1610S may have a width in the range of 0.5 mm to 3.0 mm. The multiple sets of rods 1610S may be grouped with widths of 0.5 mm, 1.0 mm, 1.5 mm, 2.0 mm, 2.5 mm, and 3.0 mm. Multiple sets of bars 1610S can be arranged in ascending order according to width. Multiple bars 1610S can be arranged into two sections such that multiple bars 1610S in one section are perpendicular to multiple bars 1610S in the other section.

[0145] Figure 16A An exemplary embodiment of a user evaluation interface 1612 for test element 1100 is shown. The user evaluation interface 1612 may be a scoring table for a fourth test element 1610. The scoring table may include multiple ROIs (e.g., 0.5mm test area, 1.0mm test area, etc.) and a score (e.g., a rating) for each of the multiple ROIs. Processor 100P may receive and evaluate a scanned image of the fourth test element 1610. For objective evaluation, a template of the fourth test element 1610 may be retrieved by processor 100P and mapped onto the scanned image of the fourth test element 1610. Multiple ROIs of the scanned image may be determined based on the template. For example, an ROI may be multiple straight lines 1610R spanning each set of rods 1610S. Processor 100P may be configured to map the straight lines 1610R (see...) Figure 16 The projection is onto each group of poles 1610S. The processor 100P can be configured to extract the profile along each straight line 1610R. For each of the multiple distribution maps, the processor 100P can be configured to calculate the average and standard deviation of the peaks and troughs in the distribution map. The processor 100P can be configured to assign a "visible" state when the difference between the average values ​​of the peaks and troughs is at least one standard deviation, and assign a corresponding score value based on a scoring table. The same steps can be taken for each group of poles 1610S. The processor 100P can only assign a corresponding score value when both groups of poles 1610S in two segments are "visible". For subjective evaluation, before inputting the "visible" state into the system 100 via the multimedia module 100U or the I / O interface 100N module, the system 100 can prompt the user to identify all poles 1610S in each group of poles 1610S. The processor 100P can receive the input and assign a corresponding score value based on the scoring table 1512. The processor 100P can only assign a corresponding score value when both sets of rods 1610S in the two sections are "visible". Once the scoring table is completed, the system 100 can generate a first score value and a second score value for each performance feature (i.e., raster resolution) of the scanner 10 to evaluate the scanning quality of the scanner 10.

[0146] Figure 17This is a perspective view illustrating an exemplary embodiment of the fifth test element 1710 among the plurality of test elements 1100E. The fifth test element 1710 is adapted to test the wiring resolution of the scanner 10. The fifth test element 1710 may include a substrate layer 1710B having a plurality of wirings 1710W of different diameters and a plurality of layers 1710Y located on the substrate layer 1710B. Each of the plurality of layers 1710Y above the bottom layer 1710Y may have a smaller area than the bottom layer 1710Y, such that the bottom layer 1710Y can be exposed. The lowest layer 1710Y of the plurality of layers 1710Y may have a smaller area than the substrate layer 1710B, such that the substrate layer 1710B is exposed. The substrate layer 1710B may be circular, and each of the plurality of layers 1710Y may be a circular sector. For example, the lowest layer 1710Y can be a sector with an interior angle of 320°, the next layer 1710Y below the top can be a sector with an interior angle of 280°, the next layer 1710Y below the top can be a sector with an interior angle of 240°, the next layer 1710Y below the top can be a sector with an interior angle of 200°, the next layer 1710Y below the top can be a sector with an interior angle of 160°, the next layer 1710Y below the top can be a sector with an interior angle of 120°, the next layer 1710Y below the top can be a sector with an interior angle of 80°, and the next layer 1710Y below the top can be a sector with an interior angle of 40°. These multiple layers 1710Y can be aligned along one side to form a flat surface. Figure 17 As shown, the multiple layers 1710Y can form multiple sectors of different heights. Multiple wirings 1710W can be arranged in concentric circles spaced apart from each other. The multiple wirings 1710W can be arranged in order of diameter and thickness, such that the thickest wiring 1710W is the outermost circle and the thinnest wiring 1710W is the innermost circle. The multiple wirings 1710W can have wire gauges of 30AWG, 34AWG, 36AWG, and 40AWG. A fifth test element 1710 can be mounted on the top side 1100AT of the substrate 1200P. The substrate layer can be made of acrylic.

[0147] Figure 17A Show Figure 17 A front view of multiple layers 1710Y. (See also...) Figure 17A As shown, the fifth test element 1710 may include multiple layers 1710Y.

[0148] Figure 17B An exemplary embodiment of a user evaluation interface 1712 for test element 1100 is shown. The user evaluation interface 1712 may be a scoring table for the fifth test element 1710. The scoring table may include multiple ROIs (e.g., test area 1, test area 2, etc.).

[0149] Figure 17CA matrix 1712M is shown for calculating the first and second score values ​​for the fifth test element 1710. System 100 may include matrix 1712M for test elements 1100E with more than one dimension. For example, the fifth test element 1710 may have a first dimension of the thickness of multiple layers 1710Y and a second dimension of the wiring specifications of multiple wirings 1710W. Matrix 1712M may include dimensions and corresponding score values ​​for those dimensions. As shown in matrix 1712M, the score values ​​for the thickest layer and the highest wire gauge (e.g., 40AWG and 7mm) may have the highest weight or score value.

[0150] For objective evaluation, the processor 100P can retrieve a template of the fifth test element 1710 and map it onto a scanned image of the fifth test element 1710. Multiple Regions of Interest (ROIs) of the scanned image can be determined based on the template. For example, an ROI can be multiple straight lines on multiple wirings 1710W in each of multiple sectors. The processor 100P can be configured to project the straight lines onto each of the multiple sectors. The processor 100P can be configured to extract a contour along each straight line. For each of the multiple contours, the processor 100P can be configured to calculate the average value of the line provided by multiple layers 1710Y and the average value of the line's background. The processor 100P can be configured to assign a "visible" state when the difference between the average value of the wiring and the background is at least one standard deviation, and assign a corresponding score value based on matrix 1712M. The processor 100P can be configured to assign a corresponding score value for the ROI based on a scoring table. The same steps can be taken for each of the multiple wirings 1710W in each of the multiple sectors. For subjective evaluation, system 100 may prompt the user to identify the number of visible wirings 1710W in each of the multiple sectors and input this information into system 100 via multimedia module 100U and / or I / O interface 100N. Processor 100P may be configured to receive input and assign corresponding score values ​​based on matrix 1712M. Once the scoring table is completed, system 100 may generate a first score value and a second score value for each performance characteristic of scanner 10 (i.e., wiring resolution) to evaluate the scanning quality of scanner 10.

[0151] Figure 18This is a perspective view illustrating an exemplary embodiment of the sixth test element 1810 among the plurality of test elements 1100E. The sixth test element 1810 is adapted to test the wiring resolution of the scanner 10. The sixth test element 1810 may include a base layer 1810B with a plurality of holes 1810H of different widths and a plurality of layers 1810Y located on the base layer 1810B. Each of the plurality of layers 1810Y above the bottom layer 1810Y may have a smaller area than the bottom layer 1810Y, such that the bottom layer 1810Y can be exposed. The lowest layer 1810Y of the plurality of layers 1810Y may have a smaller area than the base layer 1810B, such that the base layer 1810B is exposed. The base layer 1810B may be circular, and each of the plurality of layers 1810Y may be a circular sector. For example, the lowest layer 1810Y can be a sector with an interior angle of 320°, the next layer 1810Y below the top can be a sector with an interior angle of 280°, the next layer 1810Y below the top can be a sector with an interior angle of 240°, the next layer 1810Y below the top can be a sector with an interior angle of 200°, the next layer 1810Y below the top can be a sector with an interior angle of 160°, the next layer 1810Y below the top can be a sector with an interior angle of 120°, the next layer 1810Y below the top can be a sector with an interior angle of 80°, and the next layer 1810Y below the top can be a sector with an interior angle of 40°. Multiple layers 1810Y can be aligned along one side to form a flat surface. Figure 18 As shown, multiple layers 1810Y can form multiple sectors of different heights. The base layer can be made of acrylic.

[0152] Figure 18A Show Figure 18 A top view of the substrate 1810. Multiple holes 1810H may be arranged in a row, with their widths arranged in descending order, such that the widest hole is at one end of the row and the narrowest hole is at the other end. The multiple holes 1810H may be through holes. The substrate 1810B may include multiple rows of holes 1810H. The multiple rows of holes 1810H may extend radially from the center of the substrate 1810B and be equidistant from each other. The multiple holes 1810H may be circular. The width of the multiple holes 1810H may be between 1 mm and 3 mm. The width of the multiple holes 1810H may be 0.5 mm, 1.0 mm, 2.0 mm, or 3.0 mm.

[0153] Figure 18C An exemplary embodiment of a user evaluation interface 1812 for test element 1100 is shown. The user evaluation interface 1812 may be a scoring table for the sixth test element 1810. The scoring table may include multiple ROIs (e.g., test area 1, test area 2, etc.).

[0154] Figure 18D illustrates matrix 1812M used to calculate the first and second score values ​​for the fifth test element. System 100 may include matrix 1812M for test elements 1100E with more than one dimension. For example, a sixth test element 1810 may have a first dimension of the width of a plurality of holes 1810H and a second dimension of the thickness of a plurality of sectors. Matrix 1812M may include dimensions and corresponding score values ​​for the dimensions. As shown in matrix 1812M, the score values ​​for the thickest layer 1810Y and the widest width (e.g., 7 mm and 3.0 mm) may have the highest weight or score value.

[0155] For objective evaluation, the processor 100P can retrieve a template of the sixth test element 1810 and map it onto the scanned image of the sixth test element 1810. Multiple Regions of Interest (ROIs) of the scanned image can be determined based on the template. For example, an ROI can be a plurality of holes 1810H and the area surrounding each hole in a plurality of sectors. The processor 100P can be configured to calculate the average value of the pixels in each of the plurality of holes 1810H and the average value of the background (provided by a plurality of layers 1810Y) of each of the plurality of holes 1810H. The processor 100P can be configured to assign a "visible" state when the difference between the average value of the hole and the background is at least one standard deviation, and assign a corresponding score value based on matrix 1812M. The processor 100P can be configured to assign a corresponding score value for the ROI based on a scoring table. The same steps can be taken for each of the plurality of holes 1810H in each of the plurality of sectors. For subjective evaluation, system 100 may prompt the user to identify the number of holes 1810H visible in each of the multiple sectors and input this information into system 100 via multimedia module 100U and / or I / O interface 100N. Processor 100P may be configured to receive input and assign corresponding score values ​​based on matrix 1812M. Once the scoring table is completed, system 100 may generate a first score value and a second score value for each performance characteristic of scanner 10 (i.e., wiring resolution) to evaluate the scanning quality of scanner 10.

[0156] Figure 19 An exemplary embodiment of the total score summary table 1912 is shown. When scanned images of multiple test elements 1100E have been evaluated, the system 100 can generate an overall first score value and an overall second score value for the test piece based on the individual first score values ​​and individual second score values ​​of the multiple test elements 1100E, such as... Figure 19 As shown in the image.

[0157] System 100 may be adapted to any of the above embodiments of the test piece. The first score value and the second score value may be standardized such that the score obtained from each test piece is standardized.

[0158] System 100 may include mobile devices, such as mobile phones, tablets, laptops, computers, etc.

[0159] Processor 100P typically controls the overall operation of system 100, such as operations related to display, telephone calls, data communication, viewing, and recording. Processor 100P may include one or more processors to execute instructions to perform all or some of the steps described above. Additionally, processor 100P may include one or more modules to facilitate interaction between processor 100P and other modules. For example, processor 100P may include a multimedia module to facilitate interaction between multimedia module 100U and processor 100P. System 100 may communicate with a server via a network.

[0160] The memory 100M can be configured to store various types of data to support the operation of the system 100. For example, the data may include instructions for any application or method described above used to operate on the system, contact data, phonebook data, messages, pictures, videos, etc. The memory 100M can be implemented using any type of volatile or non-volatile memory device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic memory, flash memory, magnetic disk, or optical disk.

[0161] The multimedia module 100U may include a screen that provides an output interface between the system 100 and the user. In some embodiments, the screen may include a liquid crystal display (LCD), an organic light-emitting diode (OLED), a touch panel, etc. If the screen includes a touch panel, the screen may be implemented as a touchscreen to receive input signals from the user. The touch panel may include one or more touch sensors to sense touches, swipes, and gestures on the touch panel. The touch sensors may sense not only the boundaries of touch or swipe actions but also the time period and pressure associated with the touch or swipe action.

[0162] The audio module 100A can be configured to output and / or input audio signals. For example, the audio module 100A may include a microphone (“MIC”) configured to receive external audio signals when the system 100 is in an operating mode (such as a call mode, recording mode, and voice recognition mode). The received audio signals may be further stored in the memory 100M or transmitted via the communication module 100C. In some embodiments, the audio module 100A also includes a speaker for outputting audio signals.

[0163] The I / O interface 100N provides the interface between the processor 100P and peripheral interface modules (such as keyboard, dial wheel, buttons, etc.).

[0164] The communication module 100C can be configured to facilitate wired or wireless communication between the system 100 and other devices or servers. The system 100 can access wireless networks based on communication standards such as WiFi, 2G or 3G, LTE and 4G cellular technologies, or combinations thereof. In one exemplary embodiment, the communication module 100C can receive broadcast signals or broadcast-related information from an external broadcast management system via a broadcast channel. In one exemplary embodiment, the communication module 100C may also include a near-field communication (NFC) module for short-range communication. For example, the NFC module can be implemented based on radio frequency identification (RFID) technology, Infrared Data Association (IrDA) technology, ultra-wideband (UWB) technology, Bluetooth (BT) technology, and other technologies.

[0165] Those skilled in the art will understand that the features described in one instance are not limited to that instance and can be combined with any other instance.

[0166] This invention relates to a system and method for evaluating the scanning quality of a scanner on a test piece, as shown herein with reference to the accompanying drawings and / or those illustrated in the drawings.

Claims

1. A test system, characterized by, The system includes a system for evaluating the scan quality of an X-ray scanner used to scan cargo, and a test piece comprising multiple test panels or test elements, each of which is designed to test a specific scan quality of the scanner, the scanner being adapted to scan the test piece. The system includes: a processor configured to communicate with the scanner; and a memory communicating with the processor to store instructions executable by the processor. The processor is configured to: receive from the scanner multiple scan images of the plurality of test panels or test elements of the test piece, the plurality of scan images being used to evaluate multiple specific scan qualities of the scanner; display the plurality of scan images; generate a first plurality of score values ​​for the multiple specific scan qualities of the scanner based on the plurality of scan images; display an evaluation input interface configured to receive user evaluation input based on the evaluation of the plurality of scan images, and generate a second plurality of score values ​​for the multiple specific scan qualities of the scanner based on the user evaluation input of the plurality of scan images, the first plurality of score values ​​and the second plurality of score values ​​being used to evaluate the scan quality of the scanner; The processor is configured to retrieve a plurality of predetermined first threshold scores and a plurality of predetermined second threshold scores, compare the plurality of first scores and the plurality of second scores with the plurality of predetermined first threshold scores and the plurality of predetermined second threshold scores respectively, and generate a fault signal if one or more of the plurality of first scores are lower than the plurality of predetermined first threshold scores or one or more of the plurality of predetermined second scores are lower than the plurality of predetermined second threshold scores.

2. The test system of claim 1, wherein, The processor is configured to determine at least one region of interest (ROI) in each of the plurality of scanned images and to analyze the at least one ROI to generate the plurality of score values.

3. The testing system according to claim 2, characterized in that, The processor is configured to retrieve a template including at least one predetermined ROI, map the template onto one of the plurality of scanned images to determine at least one ROI in each of the scanned images.

4. The testing system according to claim 2, characterized in that, The processor is configured to extract image data from at least one ROI in each of the plurality of scanned images and generate statistical data from the extracted image data to analyze the image data of the at least one ROI.

5. The testing system according to claim 2, characterized in that, The at least one ROI is determined based on one of the plurality of test panels or test elements of the test piece.

6. The testing system according to claim 3, characterized in that, The template is determined based on one of the plurality of test panels or test elements of the test piece.

7. The testing system according to claim 1, characterized in that, The test piece was optimized based on CT image quality analysis.

8. The testing system according to claim 7, characterized in that, The scanner has a field of view ranging from 100 mm × 100 mm to 2000 mm × 2000 mm.

9. The testing system according to claim 7, characterized in that, Each of the plurality of scanned images has an image resolution ranging from 0.5 mm to 10.0 mm in reconstructed voxels.

10. The testing system according to claim 7, characterized in that, The scanner has a spiral scanning system with a scanning speed ranging from 0.01 m / s to 10.00 m / s.

11. The testing system according to claim 1, characterized in that, The test piece was optimized based on the quality analysis of the transmission X-ray image.

12. The testing system according to claim 11, characterized in that, The scanner has a field of view ranging from 300 mm × 300 mm to 4500 mm × 6000 mm.

13. The testing system according to claim 11, characterized in that, Each of the plurality of scanned images has an image resolution ranging from 0.3 mm to 10 mm in spatial resolution.

14. The testing system according to claim 11, characterized in that, The scanner has a linear X-ray system with a scanning speed ranging from 0.01 m / s to 100 km / h.

15. The testing system according to claim 1, characterized in that, The test specimen was optimized based on the quality analysis of the backscattered X-ray images.

16. The testing system according to claim 15, characterized in that, The scanner has a field of view ranging from 300 mm × 300 mm to 5000 mm × 12000 mm in spatial resolution.

17. The testing system according to claim 15, characterized in that, The scanner has a linear backscattering scanning system with a scanning speed ranging from 0.01 m / s to 20 km / h.

18. The testing system according to claim 15, characterized in that, The scanned image has an image resolution ranging from 0.5 mm to 20 mm.

19. The testing system according to claim 1, characterized in that, The plurality of specific scanning qualities of the scanner include at least one of contrast, effective nuclear charge, density resolution, degree of beam hardening effect on the scanner, spatial resolution, contrast resolution, spatial resolution, sensitivity to metal artifacts, grid and spatial resolution, sensitivity to small inclusions, penetration level, ability to distinguish materials of different compositions, and wiring resolution.

20. The testing system according to claim 1, characterized in that, The plurality of test panels of the test piece are spaced apart from each other along a longitudinal axis, and each of the plurality of test panels is perpendicular to the longitudinal axis.

21. The testing system according to claim 1, characterized in that, The test piece includes a base panel and a rotatable panel. The base panel includes a first plurality of test elements and a longitudinal axis. The rotatable panel includes a second plurality of test elements and is pivotally connected to the base panel along the longitudinal axis. The rotatable panel is capable of rotating about the longitudinal axis.

22. A computer-implemented method for evaluating the scan quality of an X-ray scanner used to scan cargo, characterized in that the scanner is adapted to scan a test piece comprising a plurality of test panels or test elements, each of the plurality of test panels or test elements being designed to test a specific scan quality of the scanner, the method comprising: The scanner receives multiple scanned images of the multiple test panels or test elements of the test piece, the multiple scanned images being used to evaluate multiple specific scan qualities of the scanner; displays the multiple scanned images; generates a first plurality of score values ​​for the multiple specific scan qualities of the scanner based on the multiple scanned images; displays an evaluation input interface configured to receive user evaluation input based on the evaluation of the multiple scanned images, and generates a second plurality of score values ​​for the multiple specific scan qualities based on the user evaluation input of the multiple scanned images, the first plurality of score values ​​and the second plurality of score values ​​being used to evaluate the scan quality of the scanner; A plurality of predetermined first threshold scores and a plurality of predetermined second threshold scores are retrieved, and the plurality of first scores and the plurality of second scores are compared with the plurality of predetermined first threshold scores and the plurality of predetermined second threshold scores respectively. If one or more of the plurality of first scores are lower than the plurality of predetermined first threshold scores or one or more of the plurality of predetermined second scores are lower than the plurality of predetermined second threshold scores, a fault signal is generated.

23. The method according to claim 22, characterized in that, It also includes identifying at least one region of interest (ROI) in each of the plurality of scanned images and analyzing the at least one ROI to generate the plurality of score values.

24. The method according to claim 22, characterized in that, It also includes retrieving a template comprising at least one predetermined ROI, mapping the template onto one of the plurality of scanned images to determine the at least one ROI in each of the plurality of scanned images.

25. The method according to claim 22, characterized in that, It also includes extracting image data from at least one ROI in each of the plurality of scanned images and generating statistical data from the extracted image data to analyze the image data of the at least one ROI.

26. The method according to claim 22, characterized in that, It also includes retrieving a plurality of predetermined first threshold scores and a plurality of predetermined second threshold scores, comparing the plurality of first scores and the plurality of second scores with the plurality of predetermined first threshold scores and the plurality of predetermined second threshold scores respectively, and generating a fault signal if one or more of the plurality of first scores are lower than the plurality of predetermined first threshold scores or if one or more of the plurality of predetermined second scores are lower than the plurality of predetermined second threshold scores.

27. A non-transitory computer-readable storage medium including instructions, characterized in that, When executed by a processor in the system, the instructions cause the system to: receive multiple scan images of multiple test panels or test elements of a test piece from a scanner, each of the multiple test panels or test elements being designed to test a specific scan quality of the scanner, the multiple scan images being used to evaluate multiple specific scan qualities of the scanner; display the multiple scan images; generate a first plurality of score values ​​for the multiple specific scan qualities of the scanner based on the multiple scan images; and display an evaluation input interface configured to receive user evaluation input based on the evaluation of the multiple scan images, and generate a second plurality of score values ​​for the multiple specific scan qualities based on the user evaluation input of the multiple scan images, the first plurality of score values ​​and the second plurality of score values ​​being used to evaluate the scan quality of the scanner; The processor is configured to retrieve a plurality of predetermined first threshold scores and a plurality of predetermined second threshold scores, compare the plurality of first scores and the plurality of second scores with the plurality of predetermined first threshold scores and the plurality of predetermined second threshold scores respectively, and generate a fault signal if one or more of the plurality of first scores are lower than the plurality of predetermined first threshold scores or one or more of the plurality of predetermined second scores are lower than the plurality of predetermined second threshold scores.

28. A testing system as described in claim 1, characterized in that, It includes multiple test panels spaced apart from each other along a longitudinal axis, each of the multiple test panels being perpendicular to the longitudinal axis.

29. A test piece applied to the test system as described in claim 1, characterized in that, The device includes a base panel and a rotatable panel. The base panel includes a first plurality of test elements and a longitudinal axis. The rotatable panel includes a second plurality of test elements and is pivotally connected to the base panel along the longitudinal axis. The rotatable panel is rotatable about the longitudinal axis.

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