A centering method for a system for measuring geometric parameters of a test piece of the rotary body type

By using a three-point method to determine the center of a circle in a rotating specimen measurement system, the position and angle of the probe were adjusted, solving the measurement distortion problem caused by probe installation deviation. This enabled rapid and accurate probe alignment, reducing costs and improving measurement accuracy.

CN115451898BActive Publication Date: 2026-04-21NINGBO UNIV
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Patent Information

Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
NINGBO UNIV
Filing Date
2022-09-26
Publication Date
2026-04-21

AI Technical Summary

Technical Problem

During the precision machining of rotating specimens, deviations in the installation position of the probe can lead to distortion of the measurement results, making it difficult to achieve rapid and accurate centering.

Method used

By recording the position information of the probe at three points during the rotation of the turntable, and using the principle of determining the center of a circle by three points, the coordinate position of the probe's rotating shaft end to the center of the circle is adjusted, and the angle is adjusted to achieve the alignment of the probe.

Benefits of technology

It achieves probe alignment that is easy to operate and highly accurate without the need for special equipment, reducing costs and improving measurement speed and accuracy.

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Abstract

This invention discloses a centering method for a geometric parameter measurement system for a rotating specimen. The method involves centering the probe on the test specimen or a turntable using a probe. Taking the probe-to-test-piece centering method as an example: S01, the test specimen is concentrically mounted on the turntable, and the probe is initially installed; S02, during the turntable rotation, the positions of the probe's free end on the test specimen at the initial position, angles φ1 and φ2 are recorded as a, b, and c, respectively; S03, using the probe's rotating shaft as the origin O of the fixed reference system, the corresponding position points A, B, and C of the test specimen are obtained; S04, the center O′ of the circumcircle of the triangle formed by points A, B, and C is obtained; S05, the rotating shaft is adjusted to the position of the center O′; S06, the probe is rotated to adjust the angle until the probe's free end is aligned with the rotation center of the test specimen. This invention enables rapid and accurate probe centering.
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Description

Technical Field

[0001] This invention belongs to the field of precision measurement technology, specifically relating to a centering method for a geometric parameter measurement system for a rotating specimen. Background Technology

[0002] Rotating specimens are important components of precision instruments and equipment. Typical examples include the flexures and rigid gears in harmonic reducers and the gears in RV reducers. To ensure the performance requirements of rotating specimens, precise measurement methods are needed to guarantee their machining quality. For measuring the geometric parameters of rotating specimens, such as the tooth profile, span distance, and radial deformation of the flexure in harmonic reducers, and the individual tooth pitch deviation, cumulative tooth pitch deviation, and radial runout of the cycloidal gear in RV reducers, a rotary table measurement method is typically used.

[0003] There are laser probes and mechanical probes for measuring rotating specimens.

[0004] Chinese patent application CN109540032A, entitled "A Non-Contact Laser Detection Device for the Profile and Topography Error of a Rotating Body Cross-Section," discloses a non-contact laser detection device for the profile and topography error of a rotating body cross-section. This device mainly consists of a vertical lifting platform, a horizontal slide, a slide mounting plate, a precision turntable, a laser displacement sensor, an encoder, and various connecting components. By adjusting the position of the slide mounting plate, the laser displacement sensor is positioned within its optimal measuring range. The angle of the laser displacement sensor is adjusted according to the optical reflection of the workpiece surface. The vertical lifting platform is controlled by a computer to adjust the position of the measured cross-section of the workpiece, and the precision slide is controlled by a computer to adjust the horizontal position of the laser displacement sensor. The data collected by the sensor is transmitted to a computer via a data acquisition card for processing, thereby obtaining the profile roughness, waviness, and shape error of the measured cross-section of the workpiece.

[0005] In Chinese patent application CN114812480A, entitled "Precision Measurement Device for the External Surface Morphology of Large-Diameter Workpieces," a similar device is disclosed, belonging to the field of precision measurement of rotating workpieces. It comprises a power assembly, an encoder assembly, a support assembly, a workpiece clamping assembly, a sensor assembly, and a base plate. The power assembly is fixed to the front left of the base plate, the encoder assembly is fixed to the middle left side of the base plate, the support assembly is fixed to the middle of the base plate, the workpiece clamping assembly is fixed to the support assembly via a key, and the sensor assembly is fixed to the rear right of the base plate. The accompanying drawings show that the probe's head and tail are fixed with bolts, allowing the probe to move up and down and rotate around one of the bolts.

[0006] During the measurement of the geometric parameters of a rotating specimen, deviations in the installation position of the probe can lead to distortions in the measurement results. Therefore, after installation, the probe needs to be aligned. Traditional alignment methods rely on the operator's experience to repeatedly adjust the probe angle or the spatial position of the test specimen. The difficulty lies in adjusting the position of the probe's rotating shaft and, secondly, ensuring the probe's angle is correctly aligned. Summary of the Invention

[0007] The technical problem to be solved by the present invention is a centering method for a geometric parameter measurement system for rotating specimens, which aims to achieve rapid and accurate centering of the probe when measuring the geometric parameters of rotating specimens after machining in precision manufacturing.

[0008] The technical solution adopted by the present invention to solve the above-mentioned technical problems is as follows: a centering method for a geometric parameter measurement system for a rotating specimen, comprising a test specimen concentrically mounted on a turntable, and a probe located on the side of the test specimen. The probe includes a rotating shaft end and a free end, the free end being used for measurement. The centering method is as follows:

[0009] S01, the test piece is concentrically mounted on the turntable, and the probe is initially installed;

[0010] S02, During the rotation of the turntable, record the positions of the free end of the probe on the test piece at the initial position, angle 1, and angle 2 when the turntable rotates one revolution: first measurement point a, second measurement point b, and third measurement point c, respectively.

[0011] S03, with the rotating end of the probe as the fixed reference origin O, the corresponding position points A, B, and C are obtained. The values ​​of points A, B, and C are the same as those of points a, b, and c, that is, the rotating end is set to remain stationary, and the other three points a, b, and c are distributed around O to obtain the positions of points A, B, and C;

[0012] S04, obtain the center O of the circumcircle of the triangle formed by points A, B, and C. ' Location;

[0013] S05, Adjust the shaft end to the center O ' The coordinate position is determined to complete the position adjustment of the probe shaft end;

[0014] S06, rotate the probe to adjust the angle until the free end of the probe is aligned with the rotation center of the test piece, thus completing the probe alignment. Steps S01 to S05 are for adjusting the position of the probe shaft end, while step S06 is for straightening the probe angle to complete the probe alignment.

[0015] In the preferred embodiment, in step S04, the center O 'The position is obtained as follows: the intersection of the perpendicular bisectors of line segments AB and BC is the center O of the circle. ' .

[0016] In the preferred embodiment, in step S06, the probe is aligned by rotating the probe at a certain angle and recording the measurement data during the process to obtain the position where the probe is closest to the test piece.

[0017] In the preferred scheme, the coordinates of points a, b, and c are the same as the coordinates of points A, B, and C.

[0018] In another approach, centering is achieved using a probe and a turntable. Specifically, this is a centering method for a geometric parameter measurement system for a rotating specimen. The turntable has a standard cylindrical outer contour, and a probe is located on the side of the turntable. The probe includes a rotating shaft end and a free end, with the free end used for measurement. The centering method is as follows:

[0019] S01, Initially install the probe and align it with the turntable;

[0020] S02, During the rotation of the turntable, record the positions of the free end of the probe on the turntable at the initial position, angle 1, and angle 2 when the turntable rotates one revolution: first measurement point a, second measurement point b, and third measurement point c, respectively.

[0021] S03, with the rotating end of the probe as the fixed reference origin O, obtain the corresponding turntable position points A, B, and C;

[0022] S04, obtain the center O of the circumcircle of the triangle formed by points A, B, and C. ' Location;

[0023] S05, Adjust the shaft end to the center O ' The coordinate position is determined to complete the position adjustment of the probe shaft end;

[0024] S06, rotate the probe to adjust the angle until the free end of the probe is aligned with the rotation center of the turntable, thus completing the probe alignment;

[0025] S07, Adjust the turntable to move it along its own axis so that the probe faces the test piece.

[0026] Steps S01 to S05 are to adjust the position of the probe shaft end, while step S06 is to straighten the probe angle so that the probe is centered. Step S07 is to align the probe with the test piece on the turntable.

[0027] In the preferred embodiment, in step S04, the center O ' The position is obtained as follows: the intersection of the perpendicular bisectors of line segments AB and BC is the center O of the circle. ' .

[0028] In the preferred embodiment, in step S06, the probe is aligned by rotating the probe at a certain angle and recording the measurement data during the process to obtain the position where the probe is closest to the turntable.

[0029] In the preferred scheme, the coordinates of points a, b, and c are the same as the coordinates of points A, B, and C.

[0030] In summary, probe alignment is achieved by aligning the probe with the test piece or the turntable. Compared with existing technologies, the alignment method of this invention has the following advantages:

[0031] 1) This invention eliminates the need for specialized equipment to center the probe in the measurement system, saving costs. The overall structure is simple and easy to operate.

[0032] 2) This invention only requires measuring the radial position information of three points of the test piece during the rotation of the turntable to achieve probe alignment, and the alignment speed is fast;

[0033] 3) Based on the theoretical knowledge that the center of a standard circle can be determined by three points, this invention derives a centering method for a geometric parameter measurement system for rotating specimens, which has high probe centering accuracy. Attached Figure Description

[0034] Figure 1 This is a schematic diagram showing the positions of the probe at the first measurement point a, the second measurement point b, and the third measurement point c on the test piece in step S02 of Embodiment 1 of the present invention.

[0035] Figure 2 This is a schematic diagram of the positions of the corresponding turntable positions A, B, and C, obtained by taking the rotating shaft end of the probe as the fixed reference system origin O in step S03 of Example 1.

[0036] Figure 3 The center O obtained in step S04 of Example 1 ' Location diagram;

[0037] Figure 4 The center O in step S04 of Example 1 ' A diagram illustrating the method for obtaining the location;

[0038] Figure 5 In step S05 of Example 1, the distance from the shaft end to the center O is... ' A schematic diagram of the coordinate position;

[0039] Figure 6 This is a schematic diagram of the angle adjustment by rotating the probe in step S06 of Example 1;

[0040] Figure 7This is a schematic diagram showing the positions of the first measurement point a, the second measurement point b, and the third measurement point c on the turntable during step S02 of Embodiment 2 of the present invention.

[0041] Figure 8 This is a schematic diagram of the positions of the corresponding turntable positions A, B, and C, obtained by taking the rotating shaft end of the probe as the fixed reference system origin O in step S03 of Example 2.

[0042] Figure 9 The center O obtained in step S04 of Example 2 ' Location diagram;

[0043] Figure 10 The center O in step S04 of Example 2 ' A diagram illustrating the method for obtaining the location;

[0044] Figure 11 In step S05 of Example 2, the distance from the shaft end to the center O is... ' A schematic diagram of the coordinate position;

[0045] Figure 12 This is a schematic diagram of the angle adjustment by rotating the probe in step S06 of Example 2.

[0046] The attached diagrams are labeled as follows: turntable 1, probe 2, free end 21, shaft end 22, and test piece 3. Detailed Implementation

[0047] To enable those skilled in the art to better understand the present application, the technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present application, and not all embodiments. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative effort should fall within the scope of protection of the present application.

[0048] It should be noted that the terms in the specification, claims, and accompanying drawings of this application, including and any variations thereof, are intended to cover non-exclusive inclusion. For example, a product comprising a series of units is not necessarily limited to those units explicitly listed, but may include other units not explicitly listed or inherent to such products.

[0049] In this application, the terms "up," "down," "left," and "right," etc., indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings. These terms are primarily for the purpose of better describing the invention and its embodiments, and are not intended to limit the indicated devices, elements, or components to having a specific orientation, or to be constructed and operated in a specific orientation.

[0050] Furthermore, in addition to indicating location or positional relationships, some of the aforementioned terms may also have other meanings, such as indicating a dependency or connection relationship in certain circumstances. Those skilled in the art can understand the specific meaning of these terms in this invention based on the specific circumstances.

[0051] Furthermore, the terms "set" and "connection" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral structure; they can refer to a direct connection, an indirect connection via an intermediate medium, or an internal connection between two devices, components, or parts. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0052] It should be noted that, unless otherwise specified, the embodiments and features described in this application can be combined with each other. This application will now be described in detail with reference to the accompanying drawings and embodiments.

[0053] Example 1, as Figures 1 to 6 As shown, a centering method for a geometric parameter measurement system for a rotating specimen includes a test specimen 3 concentrically mounted on a turntable 1, and a probe 2 located on the side of the test specimen 3. The probe 2 includes a rotating shaft end 22 and a free end 21, the free end 21 being used for measurement. The centering method is as follows:

[0054] S01, the test piece 3 is concentrically mounted on the turntable 1, and the probe 2 is initially installed;

[0055] S02, such as Figure 1 As shown, during the rotation of the turntable 1, the positions of the free end 21 of the probe 2 on the test piece 3 at the initial position, angle 1, and angle 2 when the turntable 1 rotates one revolution are recorded as: first measurement point a, second measurement point b, and third measurement point c.

[0056] S03, such as Figure 2 As shown, with the rotating end 22 of probe 2 as the fixed reference origin O, the corresponding position points A, B, and C are obtained. The values ​​of points A, B, and C are the same as those of points a, b, and c.

[0057] S04, such as Figure 3 As shown, obtain the center O of the circumcircle of the triangle formed by points A, B, and C. ' Location;

[0058] S05, such as Figure 5 As shown, adjust the shaft end 22 to the center O. ' The coordinate position is determined to complete the position adjustment of the probe 2 shaft end 22;

[0059] S06, such as Figure 6As shown, rotate probe 2 to adjust the angle until the free end 21 of probe 2 is aligned with the rotation center of the test piece 3, thus completing the alignment of probe 2. Steps S01 to S05 are to adjust the position of the rotating shaft end 22 of probe 2, while step S06 is to straighten the angle of probe 2, so that probe 2 is aligned.

[0060] In the embodiments, such as Figure 4 As shown, in step S04, the center O ' The position is obtained as follows: the intersection of the perpendicular bisectors of line segments AB and BC is the center O of the circle. ' .

[0061] In the embodiment, in step S06, the probe 2 is aligned by rotating the probe 2 at a certain angle and recording the measurement data during the process to obtain the position where the probe 2 is closest to the test piece 3.

[0062] In the embodiment, the coordinates of points a, b, and c are the same as the coordinates of points A, B, and C, which facilitates calculation.

[0063] Example 2, as Figures 7 to 12 As shown, Embodiment 2 uses probe 2 and turntable 1 for centering. Specifically, it is a centering method for a geometric parameter measurement system for a rotating specimen. The turntable 1 has a standard cylindrical outer contour, and probe 2 is located on the side of the turntable 1. Probe 2 includes a rotating shaft end 22 and a free end 21. The free end 21 is used for measurement. The centering method is as follows:

[0064] S01, Initially install probe 2 and align it with turntable 1;

[0065] S02, such as Figure 7 As shown, during the rotation of the turntable 1, the positions of the free end 21 of the probe 2 on the turntable 1 at the initial position, angle 1, and angle 2 when the turntable 1 rotates one revolution are recorded as: first measurement point a, second measurement point b, and third measurement point c.

[0066] S03, such as Figure 8 As shown, with the rotating shaft end 22 of probe 2 as the fixed reference system origin O, the corresponding position points A, B, and C of turntable 1 are obtained;

[0067] S04, such as Figure 9 As shown, obtain the center O of the circumcircle of the triangle formed by points A, B, and C. ' Location;

[0068] S05, such as Figure 11 As shown, adjust the shaft end 22 to the center O. ' The coordinate position is determined to complete the position adjustment of the probe 2 shaft end 22;

[0069] S06, such as Figure 12As shown, rotate probe 2 to adjust the angle until the free end 21 of probe 2 is aligned with the rotation center of turntable 1, thus completing the alignment of probe 2;

[0070] S07, adjust the turntable 1 so that it moves along its own axis and the probe 2 faces the test piece 3.

[0071] Steps S01 to S05 are to adjust the position of the rotating end 22 of probe 2, while step S06 is to straighten the angle of probe 2 so that probe 2 is aligned. Step S07 is to make probe 2 face the test piece 3 on the turntable 1.

[0072] In the embodiments, such as Figure 9 As shown, in step S04, the center O ' The position is obtained as follows: the intersection of the perpendicular bisectors of line segments AB and BC is the center O of the circle. ' .

[0073] In the embodiment, in step S06, the probe 2 is oriented by rotating the probe 2 at a certain angle and recording the measurement data during the process to obtain the position where the probe 2 is closest to the turntable 1.

[0074] In the embodiment, the coordinates of points a, b, and c are the same as the coordinates of points A, B, and C.

[0075] The preferred embodiments of the present invention have been described, and various changes or modifications made by those skilled in the art will not depart from the scope of the present invention.

Claims

1. A centering method for a geometric parameter measurement system for a rotating specimen, comprising a test specimen (3) concentrically mounted on a turntable (1), and a probe (2) located on the side of the test specimen (3), wherein the probe (2) comprises a rotating shaft end (22) and a free end (21), the free end (21) being used for measurement, wherein, The alignment method is as follows: S01, the test piece (3) is concentrically mounted on the turntable (1), and the probe (2) is initially installed; S02, during the rotation of the turntable (1), the positions of the free end (21) of the probe (2) on the test piece (3) at the initial position, angle 1, and angle 2 when the turntable (1) rotates one revolution are recorded as: first measurement point a, second measurement point b, and third measurement point c; S03, with the rotating shaft end (22) of the probe (2) as the fixed reference system origin O, the corresponding position points A, B, and C of the test piece (3) are obtained; S04, the position of the center O of the circumcircle of the triangle formed by the three points A, B, and C is obtained; S05, the coordinate position of the rotating shaft end (22) to the center O is adjusted; S06, the probe (2) is rotated to adjust the angle until the free end (21) of the probe (2) is aligned with the rotation center of the test piece (3), thus completing the alignment of the probe (2).

2. The centering method of the geometric parameter measurement system for a rotating specimen according to claim 1, characterized in that: In step S04, the position of the center O is obtained as follows: the intersection of the perpendicular bisectors of line segments AB and BC is the center O.

3. The centering method of the geometric parameter measurement system for a rotating specimen according to claim 2, characterized in that: In step S06, the probe (2) is aligned by rotating the probe (2) at a certain angle and recording the measurement data during the process to obtain the position where the probe (2) is closest to the test piece (3).

4. The centering method of the geometric parameter measurement system for a rotating specimen according to any one of claims 1 to 3, characterized in that: The coordinates of points a, b, and c are the same as the coordinates of points A, B, and C.

5. A centering method for a geometric parameter measurement system for a rotating specimen, comprising a turntable (1) with an outer contour of a standard cylinder, and a probe (2) located on the side of the turntable (1), wherein the probe (2) includes a rotating shaft end (22) and a free end (21), the free end (21) being used for measurement, wherein, The alignment method is as follows: S01, initially install the probe (2) and align it with the turntable (1); S02, during the rotation of the turntable (1), record the positions of the free end (21) of the probe (2) on the turntable (1) at the initial position, angles 1 and 2 when the turntable (1) rotates one revolution: first measurement point a, second measurement point b and third measurement point c; S03, with the rotating shaft end (22) of the probe (2) as the fixed reference system origin O, obtain the corresponding position of the turntable (1). Points A, B, and C; S04, obtain the position of the center O of the circumcircle of the triangle formed by points A, B, and C; S05, adjust the coordinate position of the rotating shaft end (22) to the center O; S06, rotate the probe (2) to adjust the angle until the free end (21) of the probe (2) is aligned with the rotation center of the turntable (1), thus completing the alignment of the probe (2); S07, adjust the turntable (1) to move the turntable (1) along its own axis so that the probe (2) faces the test piece (3).

6. The centering method of the geometric parameter measurement system for a rotating specimen according to claim 5, characterized in that: In step S04, the position of the center O is obtained as follows: the intersection of the perpendicular bisectors of line segments AB and BC is the center O.

7. The centering method of the geometric parameter measurement system for a rotating specimen according to claim 6, characterized in that: In step S06, the probe (2) is oriented by rotating the probe (2) at a certain angle and recording the measurement data during the process to obtain the position where the probe (2) is closest to the turntable (1).

8. The centering method of the geometric parameter measurement system for a rotating specimen according to any one of claims 5 to 7, characterized in that: The coordinates of points a, b, and c are the same as the coordinates of points A, B, and C.

Citation Information

Patent Citations

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