Method, device, equipment and medium for determining equipment health parameters

Abstract

The present application discloses a method, apparatus, device, and medium for determining device health parameters. The device includes a board, the board includes a functional circuit, and the functional circuit includes components. The method includes: determining a first parameter that affects the failure mode of the component based on the failure mechanism of the component; determining a target parameter from the first parameter with a reference degree score greater than a preset score, the reference degree score being obtained by scoring objective data, and the reference degree score being positively correlated with the number of dimensions of the objective data; determining a second parameter from the target parameter based on the impact of the target parameter on the failure mode of the functional circuit; and determining the health parameter from the second parameter based on the impact of the second parameter on the failure mode of the board. In this way, the method can accurately determine device health parameters at a low cost.

Description

Technical Field

[0001] The present application relates to the field of nuclear power detection technology, and in particular to a method, apparatus, computing device, and computer-readable storage medium for determining equipment health parameters. Background Art

[0002] Health parameters are parameters that affect the health status of a device. For example, for a device, these parameters affect its health status. In a nuclear power control scenario, the device might be a distributed control system (DCS). Over time, the health status of a DCS may gradually deteriorate until it ceases to operate properly, and the health parameters of the DCS will also change accordingly.

[0003] In related technical solutions, device health parameters can be obtained through testing. Specifically, to obtain device health parameters, staff conduct accelerated aging tests on the device to determine the parameters that affect the device's health as its health deteriorates. These parameters are then used to predict the device's health.

[0004] However, these testing methods rely heavily on subjective experience, making the parameters derived from these methods of testing less valuable as a reference. For example, based on subjective experience, a worker might determine that parameter A affects the health of a device, while the actual parameter affecting the device's health is parameter B. This means that parameter A has a poor reference value. Furthermore, these testing methods are costly, and for electronic products, it often takes months of testing to detect deviations from normal values.

[0005] Based on this, the industry urgently needs a low-cost and accurate method to determine equipment health parameters. Summary of the Invention

[0006] In order to solve the above technical problems, the present application provides a method for determining equipment health parameters, which can determine relatively accurate health parameters at low cost.

[0007] The embodiments of this application disclose the following technical solutions:

[0008] In a first aspect, the present application provides a method for determining health parameters of a device, wherein the device includes a board, the board includes a functional circuit, and the functional circuit includes components; the method includes:

[0009] Determining a first parameter affecting a failure mode of the component according to a failure mechanism of the component;

[0010] Determining a target parameter whose reference degree score is greater than a preset score from the first parameter, wherein the reference degree score is obtained by scoring objective data, and the reference degree score is positively correlated with the number of dimensions of the objective data;

[0011] determining a second parameter from the target parameter according to an effect of the target parameter on a failure mode of the functional circuit;

[0012] The health parameter is determined from the second parameter according to the influence of the second parameter on the failure mode of the board.

[0013] Optionally, the health parameter is used to indicate the health status of the device, and the method further includes:

[0014] When the difference between the health parameter of the device and the reference value is greater than a preset difference threshold, feedback information is generated.

[0015] Optionally, determining from the first parameter that the score of the reference degree is greater than a target parameter of a preset score includes:

[0016] Sorting the parameters in the first parameters according to the scores of the reference degrees of the parameters in the first parameters to obtain a sorting result;

[0017] Determining a preset score according to the sorting result;

[0018] The parameter whose reference degree score among the first parameters is greater than the preset score is determined as the target parameter.

[0019] Optionally, determining a preset score according to the ranking result includes:

[0020] Determining a target number according to a preset ratio and the number of parameters in the first parameter;

[0021] Determining a target sequence number according to the number of targets;

[0022] The score of the reference degree of the parameter corresponding to the target sequence number in the sorting result is determined as a preset score.

[0023] Optionally, determining the second parameter from the target parameter according to the influence of the target parameter on the failure mode of the functional circuit includes:

[0024] When a parameter in the target parameter affects the first failure mode of the functional circuit, determining whether the parameter affecting the first failure mode has been determined as a parameter in the second parameter;

[0025] If not, the parameter affecting the first failure mode is determined as a parameter in the second parameter.

[0026] Optionally, determining the parameter affecting the first failure mode as a parameter in the second parameter includes:

[0027] According to the collectability of the parameters affecting the first failure mode, the parameters affecting the first failure mode are determined as parameters in the second parameters.

[0028] Optionally, determining the health parameter from the second parameter according to the influence of the second parameter on the failure mode of the board includes:

[0029] When a parameter in the second parameter affects the second failure mode of the board, determining whether the parameter affecting the second failure mode has been determined as a parameter in the healthy parameter;

[0030] If not, the parameter affecting the second failure mode is determined as a parameter in the health parameter.

[0031] In a second aspect, the present application provides an apparatus for determining health parameters of a device, wherein the device includes a board, the board includes a functional circuit, and the functional circuit includes components; the apparatus includes:

[0032] A first-level parameter determination module is configured to determine, based on the failure mechanism of the component, a first parameter that affects the failure mode of the component; and determine, from the first parameter, a target parameter having a reference degree score greater than a preset score, wherein the reference degree score is obtained by scoring objective data and is positively correlated with the number of dimensions of the objective data;

[0033] a second-level parameter determination module, configured to determine a second parameter from the target parameter according to an effect of the target parameter on a failure mode of the functional circuit;

[0034] A health parameter determination module is configured to determine the health parameter from the second parameter according to the influence of the second parameter on the failure mode of the board.

[0035] In a third aspect, the present application provides a computing device, the computing device comprising a processor and a memory;

[0036] The processor is configured to execute instructions stored in the memory, so that the computing device executes the method described in any one of the first aspects above.

[0037] In a fourth aspect, the present application provides a computer-readable storage medium comprising instructions, wherein the instructions instruct the computing device in the third aspect to execute any one of the methods in the first aspect.

[0038] It can be seen from the above technical solution that this application has the following advantages:

[0039] The present application provides a method for determining the health parameters of a device, wherein the device includes a board, the board includes a functional circuit, and the functional circuit includes components. In this method, a first parameter that affects the failure mode of the component is determined by the failure mechanism of the component, and then the reference degree of the first parameter is scored based on objective data. The score of the reference degree is positively correlated with the number of dimensions using objective data, and the parameter with a reference degree score greater than a preset score is used as the target parameter. Based on the impact of the target parameter on the failure mode of the functional circuit, a second parameter is determined from the target parameter, and based on the impact of the second parameter on the failure mode of the board, a health parameter is determined from the second parameter. Since the health parameter is obtained through the target parameter with a higher reference degree, the health parameter has a better reference value.

[0040] Furthermore, this method determines a second parameter from the target parameter based on the impact of component failure modes on the failure modes of functional circuits. The health parameter is then determined from the second parameter based on the impact of the functional circuit failure modes on the failure modes of the board. This method can accurately determine device health parameters without incurring high costs. BRIEF DESCRIPTION OF THE DRAWINGS

[0041] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present application. For ordinary technicians in this field, other drawings can be obtained based on these drawings without any creative work.

[0042] Figure 1 A schematic diagram of a PF curve provided in an embodiment of the present application;

[0043] Figure 2 A flow chart of a method for determining device health parameters provided in an embodiment of the present application;

[0044] Figure 3 A flow chart of a method for determining target parameters provided in an embodiment of the present application;

[0045] Figure 4 A flow chart of a method for determining a second parameter from a target parameter provided in an embodiment of the present application;

[0046] Figure 5 A flow chart of a method for determining a health parameter from a second parameter provided in an embodiment of the present application;

[0047] Figure 6A schematic diagram of an apparatus for determining equipment health parameters provided in an embodiment of the present application. DETAILED DESCRIPTION

[0048] In order to help those skilled in the art better understand the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative work are within the scope of protection of this application.

[0049] To facilitate understanding by those skilled in the art, the technical terms involved in this application are first introduced below.

[0050] Health parameters are parameters that affect the health status of a device. For example, for a device, these parameters affect its health status. In a nuclear power control scenario, the device might be a distributed control system (DCS). Over time, the health status of a DCS may gradually deteriorate until it ceases to operate properly, and the health parameters of the DCS will also change accordingly.

[0051] like Figure 1 The figure shows a schematic diagram of a PF curve. As can be seen from the figure, as the health status of a device (e.g., functionality, lifespan, and performance) gradually deteriorates, the device's health parameters will also change accordingly. By monitoring the device's health parameters, the device's health status can be determined, allowing for timely and adaptive repair or maintenance of the device to prevent it from entering a faulty state.

[0052] In related technical solutions, the health parameters of the equipment can be obtained through experimental methods. Specifically, an accelerated aging test is performed on the equipment. First, a basic test is conducted on the equipment to find out the extreme environment (such as temperature, humidity, vibration, etc.) in which the equipment can operate normally. Secondly, a long-term accelerated aging test is performed using test conditions slightly lower than the extreme environment. In this process, some parameters of the equipment are determined based on the subjective experience of the staff, and then these parameters are monitored until the equipment fails.

[0053] However, these testing methods rely heavily on subjective experience, making the parameters derived from these methods of testing less valuable as a reference. For example, based on subjective experience, a worker might determine that parameter A affects the health of a device, while the actual parameter affecting the device's health is parameter B. This means that parameter A has a poor reference value. Furthermore, these testing methods are costly, and for electronic products, it often takes months of testing to detect deviations from normal values.

[0054] In view of this, the present application provides a method for determining the health parameters of a device, which can be executed by an evaluation device. Specifically, the device includes a board, the board includes a functional circuit, and the functional circuit includes components. The method includes: the evaluation device determines a first parameter that affects the failure mode of the component based on the failure mechanism of the component, and then determines a target parameter from the first parameter whose reference degree score is greater than a preset score, wherein the reference degree score is obtained by scoring objective data, and the more dimensions of the objective data, the higher the reference degree score. The evaluation device determines a second parameter from the target parameter based on the impact of the target parameter on the failure mode of the functional circuit, and then determines a health parameter from the second parameter based on the impact of the second parameter on the failure mode of the board. In this way, the reference degree of the health parameter is higher, and there is no need to spend a high cost to determine the health parameter.

[0055] The method for determining equipment health parameters provided in the embodiments of the present application can be applied to nuclear power control scenarios. In nuclear power control scenarios, the evaluation device can determine the health parameters of the distributed control system through the above method, and characterize the health status of the distributed control system through the health parameters. In this way, fault status warning, remaining life prediction, future health status prediction, and maintenance strategy formulation of the distributed control system can be achieved. This method can realize the repair and maintenance of the distributed control system based on the specific operating conditions (such as health parameters) of the distributed control system.

[0056] In order to make the technical solution of the present application clearer and easier for those skilled in the art to understand, the method for determining the health parameters of the device provided in the embodiment of the present application is introduced below, taking the evaluation device to determine the health parameters of the distributed control system as an example.

[0057] like Figure 2 As shown, the figure shows a flow chart of a method for determining health parameters of a device, which may be a distributed control system. In some embodiments, the distributed control system includes a board, the board includes a functional circuit, and the functional circuit includes components. The method includes the following steps:

[0058] S201: The evaluation device determines a first parameter that affects a failure mode of the component according to the failure mechanism of the component.

[0059] Components refer to electronic components, such as but not limited to: resistors, capacitors, inductors, potentiometers, electron tubes, radiators, electromechanical components, connectors, discrete semiconductor devices, electroacoustic devices, laser devices, electronic display devices, optoelectronic devices, sensors, power supplies, switches, micro motors, electronic transformers, relays, printed circuit boards, integrated circuits, various circuits, piezoelectrics, crystals, quartz, ceramic magnetic materials, substrates for printed circuits, special materials for electronic functional processes, electronic adhesive (tape) products, electronic chemical materials and components, etc.

[0060] Failure mechanisms are the causes of failure modes. For components, failure mechanisms are factors that influence the failure mode. For electronic products, failure mechanisms include electromigration, silver ion migration, corrosion, dendrite growth, hot carriers, and more.

[0061] Failure mode refers to the way in which failure occurs, such as overvoltage, overcurrent, etc.

[0062] Components are the foundation of functional circuits, and functional circuits are the foundation of boards. Therefore, the evaluation equipment must first determine the health parameters of the components. These health parameters can be performance-related or fault-related, and this application does not limit them.

[0063] In some implementations, such as Figure 3 The method for determining target parameters shown in the flowchart includes the following steps:

[0064] S301: The evaluation device determines the failure mode of the component.

[0065] In some embodiments, the evaluation device may determine the failure mode of the component by means of failure mode and effects analysis (FMEA), for example, parameters of IEC61508 may be used.

[0066] S302: Evaluate the failure mechanism of components obtained by the device.

[0067] In some embodiments, the evaluation device can determine the failure mechanism of the component through EPRI 1018534.

[0068] S303: The evaluation device determines a first parameter that affects the failure mode of the component.

[0069] In some embodiments, the evaluation device may determine the cause of the failure mode of the component based on the failure mechanism of the component, and further determine the parameter affecting the failure mode of the component, ie, the first parameter.

[0070] S202: The evaluation device determines from the first parameter that the score of the reference degree is greater than the target parameter of the preset score.

[0071] The reference degree refers to the confidence level of the first parameter's influence on the existence of a component failure mode, and this confidence level can be represented by a score. For example, a higher reference degree score indicates a higher confidence level of the parameter's influence on the existence of the component failure mode. In some implementations, the reference degree score can be a percentage, with a preset score of 80 points. When the reference degree score exceeds 80 points, the parameter is considered to have an influence on the component failure mode.

[0072] In some embodiments, the referenceability score can be obtained by scoring objective data, and the referenceability score is positively correlated with the number of objective data dimensions. Objective data includes, but is not limited to, failure mechanism compliance, technical literature disclosure, testing, and current operating conditions. For ease of understanding, the following example uses four objective data dimensions, including, for example, failure mechanism compliance, technical literature disclosure, testing, and current operating conditions.

[0073] The evaluation device can use objective data to analyze and verify the parameters in the first parameter. For example, if the verification is passed from the failure mechanism compliance dimension and the technical literature disclosure dimension, the reference degree of the parameter can be 85 points. For another example, if the verification is passed from the failure mechanism compliance dimension, the technical literature disclosure dimension, the test dimension, and the current operating status dimension, the reference degree of the parameter can be 100 points. For another example, if the verification is passed only from the current operating status dimension, the reference degree of the parameter can be 50 points.

[0074] In some implementations, the evaluation device may sort the parameters in the first parameters according to scores of their reference degrees to obtain a sorting result, and then determine a preset score according to the sorting result.

[0075] Specifically, the evaluation device determines the target number according to the preset ratio and the number of parameters in the first parameter, determines the target serial number according to the target number, and uses the reference degree score of the parameter corresponding to the target serial number as the preset score.

[0076] For example, if the first parameter includes 10 parameters and the preset ratio is 60%, then the target number is 10 * 60% = 6. The target number is the number at the target number position in the sorting result. In this embodiment, the target number is 6. The reference score of the parameter with the target number 6 is then used as the preset score.

[0077] In this way, the preset score is obtained by scoring the parameters in the first parameter, rather than a fixed value set subjectively, thereby increasing the rationality of screening the target parameter from the first parameter.

[0078] The above description of the reference degree scores and preset scores is merely an example and does not constitute a limitation to this application.

[0079] After the evaluation device determines the target parameter whose reference score is greater than the preset score from the first parameter, the parameters in the target parameter are all parameters that have an impact on the failure mode of the component and have a high degree of credibility. In this way, the evaluation device determines the health parameters of the equipment based on the parameters with higher credibility, and the credibility of the obtained health parameters is also higher. Furthermore, since the parameters in the target parameter are all parameters that have been verified and passed by objective data in multiple dimensions, the true health status of the equipment can be better reflected through the parameters, so as to achieve true condition-based maintenance (maintenance based on the actual operating conditions of the equipment).

[0080] S203: The evaluation device determines a second parameter from the target parameter according to the influence of the target parameter on the failure mode of the functional circuit.

[0081] After the evaluation device determines the target parameter, the evaluation device determines a second parameter from the target parameter according to the influence of the target parameter on the failure mode of the functional circuit. The second parameter is a parameter that affects the failure mode of the functional circuit.

[0082] like Figure 4 As shown in the figure, a flow chart of a method for determining a second parameter from a target parameter is shown, the method comprising the following steps:

[0083] S401: The evaluation device determines whether a parameter in the target parameter has an impact on the first failure mode of the functional circuit. If so, execute S402.

[0084] In some embodiments, the evaluation device first determines parameters among the target parameters that have an impact on the first failure mode of the functional circuit.

[0085] S402: The evaluation device determines whether the parameter affecting the first failure mode of the functional circuit has been determined as a parameter in the second parameter. If not, execute S403.

[0086] After the evaluation device determines the parameter that affects the first failure mode of the functional circuit, it is also necessary to determine whether the parameter has been determined as a parameter in the second parameter. If not, it indicates that the parameter is the first parameter that affects the first failure mode of the functional circuit, and then execute S403; if so, it indicates that the parameter is not the first parameter that affects the first failure mode of the functional circuit, that is, the parameter that affects the first failure mode of the functional circuit already exists in the second parameter, and therefore, there is no need to determine the parameter again as a parameter in the second parameter.

[0087] In some embodiments, if so, the evaluation device may further determine a parameter from multiple parameters that have an impact on the first failure mode of the functional circuit as a parameter in the second parameter. For example, a parameter that is easy to collect from the multiple parameters may be used as a parameter in the second parameter.

[0088] In other embodiments, if so, the evaluation device may further compare the reference degree scores of the parameters affecting the first failure mode, and determine the parameter affecting the first failure mode with the highest reference degree score as the parameter in the second parameter.

[0089] S403: The evaluation device determines the parameter affecting the first failure mode as a parameter in the second parameter according to the collectability of the parameter affecting the first failure mode.

[0090] When the evaluation device determines that the parameter affecting the first failure mode of the functional circuit is not determined as a parameter in the second parameter, the evaluation device will continue to determine whether the parameter affecting the first failure mode of the functional circuit is easy to collect, such as the high or low collection cost, the feasibility of the collection technology, etc. If it is easy to collect, the parameter will be used as a parameter in the second parameter.

[0091] S204: The evaluation device determines a health parameter from the second parameter according to the influence of the second parameter on the failed module of the board.

[0092] After the evaluation device determines the second parameter, the evaluation device determines a health parameter from the second parameter according to the influence of the second parameter on the failure mode of the board. The health parameter is a parameter that affects the failure mode of the board.

[0093] like Figure 5 As shown in the figure, a flow chart of a method for determining a health parameter from a second parameter is shown, the method comprising the following steps:

[0094] S501: The evaluation device determines whether the parameters in the second parameter have an impact on the second failure mode of the board. If so, execute S502.

[0095] In some embodiments, the evaluation device first determines the parameters among the second parameters that have an impact on the second failure mode of the board.

[0096] S502: The evaluation device determines whether the parameters affecting the second failure mode of the board have been determined as parameters in the healthy parameters. If not, execute S503.

[0097] After the evaluation device determines the parameter that affects the second failure mode of the board, it is necessary to determine whether the parameter has been determined as a parameter in the healthy parameters. If not, it indicates that the parameter is the first parameter that affects the second failure mode of the board, and then execute S503. If so, it indicates that the parameter is not the first parameter that affects the second failure mode of the board, that is, the parameter that affects the second failure mode of the board already exists in the healthy parameters, and therefore, there is no need to determine the parameter again as a parameter in the healthy parameters.

[0098] In some embodiments, if so, the evaluation device may further determine a parameter from multiple parameters that have an impact on the second failure mode of the board as a parameter in the health parameter. For example, a parameter that is easy to collect from multiple parameters may be used as a parameter in the health parameter.

[0099] In other embodiments, if so, the evaluation device may also compare the reference degree scores of the parameters affecting the second failure mode, and determine the parameter affecting the second failure mode with the highest reference degree score as the parameter in the health parameters.

[0100] S503: The evaluation device determines the parameters that affect the second failure mode of the board as parameters in the health parameters.

[0101] In some embodiments, after determining the health parameter, the evaluation device may also compare the health parameter of the distributed control system with a reference value. If the difference between the health parameter and the reference value exceeds a preset difference threshold, feedback information is generated. This feedback information includes, but is not limited to, forecast information, repair information, and maintenance information.

[0102] Based on the above description, the present application provides a method for determining the health parameters of a device, wherein the device includes a board, the board includes a functional circuit, and the functional circuit includes components. In this method, a first parameter that affects the failure mode of the component is determined by the failure mechanism of the component, and then the reference degree of the first parameter is scored based on objective data. The score of the reference degree is positively correlated with the number of dimensions using objective data, and the parameter with a reference degree score greater than a preset score is used as the target parameter. Based on the influence of the target parameter on the failure mode of the functional circuit, a second parameter is determined from the target parameter, and based on the influence of the second parameter on the failure mode of the board, a health parameter is determined from the second parameter. Since the health parameter is obtained through a target parameter with a higher reference degree, the health parameter has a better reference value.

[0103] Furthermore, this method determines a second parameter from the target parameter based on the impact of component failure modes on the failure modes of functional circuits. The health parameter is then determined from the second parameter based on the impact of the functional circuit failure modes on the failure modes of the board. This method can accurately determine device health parameters without incurring high costs.

[0104] The embodiment of the present application also provides a device for determining health parameters of a device, wherein the device includes a board, the board includes a functional circuit, and the functional circuit includes components. Figure 6 As shown, the device includes:

[0105] A first-level parameter determination module 601 is configured to determine, based on the failure mechanism of the component, a first parameter that affects the failure mode of the component; and determine, from the first parameter, a target parameter having a reference degree score greater than a preset score, wherein the reference degree score is obtained by scoring objective data and is positively correlated with the number of dimensions of the objective data;

[0106] a second-level parameter determination module 602 for determining a second parameter from the target parameter according to the influence of the target parameter on the failure mode of the functional circuit;

[0107] The health parameter determination module 603 is configured to determine the health parameter from the second parameter according to the influence of the second parameter on the failure mode of the board.

[0108] Optionally, the device further includes: a feedback module;

[0109] The feedback module is configured to generate feedback information when a difference between a health parameter of the device and a reference value is greater than a preset difference threshold.

[0110] Optionally, the first-level parameter determination module 601 is specifically used to sort the parameters in the first parameters according to the scores of the reference degree of the parameters in the first parameters to obtain a sorting result; determine a preset score based on the sorting result; and determine the parameters in the first parameters whose scores of the reference degree of the parameters are greater than the preset score as target parameters.

[0111] Optionally, the first-level parameter determination module 601 is specifically used to determine the target number based on a preset ratio and the number of parameters in the first parameter; determine the target serial number based on the target number; and determine the reference degree score of the parameter corresponding to the target serial number in the sorting result as the preset score.

[0112] Optionally, the second-level parameter determination module 602 is specifically used to determine whether the parameters affecting the first failure mode of the functional circuit have been determined as parameters in the second parameters when the parameters in the target parameters have an impact on the first failure mode of the functional circuit; if not, determine the parameters affecting the first failure mode as parameters in the second parameters.

[0113] Optionally, the second-level parameter determination module 602 is specifically configured to determine the parameter affecting the first failure mode as a parameter in the second parameter according to collectability of the parameter affecting the first failure mode.

[0114] The embodiment of the present application further provides a computing device, the computing device including a processor and a memory;

[0115] The processor is configured to execute instructions stored in the memory, so that the computing device executes any one of the methods described above.

[0116] An embodiment of the present application further provides a computer-readable storage medium, which includes instructions, and the instructions instruct the above-mentioned computing device to execute any one of the methods in the above-mentioned method embodiments.

[0117] Each embodiment in this specification is described in a progressive manner, and the same or similar parts between the embodiments can be referred to each other, and each embodiment focuses on the differences from other embodiments. In particular, for the device embodiment, since it is basically similar to the method embodiment, the description is relatively simple, and the relevant parts can be referred to the partial description of the method embodiment. The device embodiment described above is merely illustrative, and the units and modules described as separate components may or may not be physically separated. In addition, some or all of the units and modules can be selected according to actual needs to achieve the purpose of the scheme of this embodiment. A person of ordinary skill in the art can understand and implement it without paying any creative work.

[0118] It should be understood that in this application, "at least one (item)" means one or more, and "plurality" means two or more. "And / or" is used to describe the association relationship of associated objects, indicating that three relationships may exist. For example, "A and / or B" can mean: only A exists, only B exists, and A and B exist at the same time, where A and B can be singular or plural. The character " / " generally indicates that the previous and next associated objects are in an "or" relationship. "At least one of the following items" or similar expressions refers to any combination of these items, including any combination of single items or plural items. For example, at least one of a, b or c can mean: a, b, c, "a and b", "a and c", "b and c", or "a and b and c", where a, b, c can be single or multiple.

[0119] The above are only preferred embodiments of the present application and are not intended to limit the present application in any form. Although the present application has been disclosed as above with preferred embodiments, it is not intended to limit the present application. Any technician familiar with the art can use the above-disclosed methods and technical contents to make many possible changes and modifications to the technical solution of the present application without departing from the scope of the technical solution of the present application, or modify it into an equivalent embodiment with equivalent changes. Therefore, any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present application without departing from the content of the technical solution of the present application are still within the scope of protection of the technical solution of the present application.

Claims

1. A method for determining equipment health parameters, characterized in that: The device includes a board, the board includes a functional circuit, and the functional circuit includes components; the method includes: Determining a first parameter affecting a failure mode of the component according to a failure mechanism of the component; Determining a target parameter from the first parameter having a reference degree score greater than a preset score, wherein the reference degree score is obtained by scoring objective data, the reference degree score is positively correlated with the number of dimensions of the objective data, and the reference degree score is used to indicate the credibility of the influence of the first parameter on the failure mode of the component; determining a second parameter from the target parameter according to an effect of the target parameter on a failure mode of the functional circuit; The health parameter is determined from the second parameter according to the influence of the second parameter on the failure mode of the board.

2. The method according to claim 1, characterized in that The method further comprises: When the difference between the health parameter of the device and the reference value is greater than a preset difference threshold, feedback information is generated.

3. The method according to claim 1, characterized in that The step of determining, from the first parameter, a target parameter whose score of the reference degree is greater than a preset score includes: sorting the parameters in the first parameters according to the scores of the reference degrees of the parameters in the first parameters to obtain a sorting result; Determining a preset score according to the sorting result; The parameter whose reference degree score among the first parameters is greater than the preset score is determined as the target parameter.

4. The method according to claim 3, characterized in that Determining a preset score according to the sorting result includes: Determining a target number according to a preset ratio and the number of parameters in the first parameter; Determining a target sequence number according to the number of targets; The score of the reference degree of the parameter corresponding to the target sequence number in the sorting result is determined as a preset score.

5. The method according to claim 1, wherein Determining the second parameter from the target parameter according to the influence of the target parameter on the failure mode of the functional circuit includes: When a parameter in the target parameter affects the first failure mode of the functional circuit, determining whether the parameter affecting the first failure mode has been determined as a parameter in the second parameter; If not, the parameter affecting the first failure mode is determined as a parameter in the second parameter.

6. The method according to claim 5, characterized in that Determining the parameter affecting the first failure mode as a parameter in the second parameter includes: According to the collectability of the parameters affecting the first failure mode, the parameters affecting the first failure mode are determined as parameters in the second parameters.

7. The method according to claim 1, characterized in that Determining the health parameter from the second parameter according to the influence of the second parameter on the failure mode of the board includes: When a parameter in the second parameter affects the second failure mode of the board, determining whether the parameter affecting the second failure mode has been determined as a parameter in the healthy parameter; If not, the parameter affecting the second failure mode is determined as a parameter in the health parameter.

8. A device for determining equipment health parameters, characterized in that: The device includes a board, the board includes a functional circuit, and the functional circuit includes components; the apparatus includes: a first-level parameter determination module, configured to determine, based on the failure mechanism of the component, a first parameter that affects the failure mode of the component; and determine, from the first parameter, a target parameter having a reference degree score greater than a preset score, wherein the reference degree score is obtained by scoring objective data, the reference degree score is positively correlated with the number of dimensions of the objective data, and the reference degree score is used to indicate the credibility of the influence of the first parameter on the failure mode of the component; a second-level parameter determination module, configured to determine a second parameter from the target parameter according to an effect of the target parameter on a failure mode of the functional circuit; A health parameter determination module is configured to determine the health parameter from the second parameter according to the influence of the second parameter on the failure mode of the board.

9. A computing device, characterized in that The computing device includes a processor and a memory; The processor is configured to execute instructions stored in the memory, so that the computing device performs the method according to any one of claims 1 to 7.

10. A computer-readable storage medium, characterized in that The method comprises instructions for instructing a computing device to execute the method according to any one of claims 1 to 7.

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