Method and apparatus for generating a test profile for a durability test

Abstract

The application provides a method and device for generating a test spectrum of a durability test, the method comprising: obtaining an electric machine acceleration factor of an electric machine under a typical working condition according to a temperature distribution of a winding of the electric machine under the typical working condition, and determining a high-temperature test duration based on the electric machine acceleration factor; distributing the high-temperature test duration to each working condition point under the typical working condition, associating each working condition point to a corresponding test period, and the distribution result making an estimated mechanical fatigue damage reach a preset mechanical durability test requirement, wherein a sum of the test periods of the each working condition point is equal to the high-temperature test duration; and determining a test spectrum based on the distribution result.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of durability test, and in particular to a method and device for generating a test spectrum for durability test, an equipment and a computer readable storage medium. BACKGROUND

[0002] The electric drive assembly system is an integrated electric drive system integrating motor, reducer, controller and other components, and is applied to mechanical equipment using electric drive, which can be a car, a ship, a subway, etc. The reliability of the electric drive assembly directly determines the reliability of the mechanical equipment in use, which will affect the user experience. The reliability of the electric drive assembly is based on important life durability test in the production and development stage.

[0003] In the prior art, some manufacturers will perform mechanical fatigue durability test on the electric drive assembly to test whether the mechanical structure can meet the application requirements; some manufacturers will perform high-temperature durability test on the electric drive assembly to test the insulation and demagnetization failure risk caused by the accumulation of thermal damage of the motor winding under long-period high-temperature environment. Any durability test cannot be separated from the test spectrum, and the test spectrum generated by the prior art can only meet the needs of test personnel for a single durability test, and cannot test the high-temperature durability and mechanical fatigue damage at the same time through one test. If the above two single durability test spectra are used independently for testing, the test cost and development cycle are increased, and at the same time, the failure risk of the electric drive assembly caused by the coupling of thermal damage and mechanical damage cannot be fully verified, resulting in insufficient product verification. SUMMARY

[0004] To overcome the problems in the related art, the present application provides a method and device for generating a test spectrum for durability test, an equipment and a computer readable storage medium, which can solve the above problems.

[0005] According to a first aspect of an embodiment of the present application, a method for generating a test spectrum for durability test is provided, the method comprising:

[0006] obtaining a motor acceleration factor of the motor under a typical working condition according to the temperature distribution of the motor winding under the typical working condition, and determining a high-temperature test duration based on the motor acceleration factor;

[0007] allocating the high-temperature test duration to each working condition point under the typical working condition, associating each working condition point to a corresponding test period, and the allocation result makes the estimated mechanical fatigue damage meet the preset mechanical durability test requirement, wherein the sum of the test periods of each working condition point is equal to the high-temperature test duration;

[0008] determining a test spectrum based on the allocation result.

[0009] According to a second aspect of the embodiments of the present application, a method for durability test is provided, comprising:

[0010] obtaining the test spectrum in the method for generating a test spectrum for durability test according to the first aspect;

[0011] performing a test according to the test spectrum, wherein the result of the test comprises data of mechanical durability test and data of high-temperature durability test.

[0012] According to a third aspect of the embodiments of the present application, a device for generating a test spectrum for durability test is provided, comprising:

[0013] a determination unit configured to obtain an acceleration factor of a motor under a typical working condition according to a temperature distribution of a motor winding under the typical working condition, and determine a high-temperature test duration based on the acceleration factor of the motor;

[0014] an allocation unit configured to allocate the high-temperature test duration to each working point under the typical working condition, associate each working point to a corresponding test period, and the result after the allocation is that an estimated mechanical fatigue damage reaches a preset mechanical durability test requirement, wherein the sum of the test periods of the working points is equal to the high-temperature test duration;

[0015] a test spectrum unit configured to determine a test spectrum based on the result after the allocation.

[0016] According to a fourth aspect of the embodiments of the present application, a device for durability test is provided, comprising:

[0017] an obtaining unit configured to obtain the test spectrum in the method for generating a test spectrum for durability test according to the first aspect;

[0018] a test unit configured to perform a test according to the test spectrum, wherein the result of the test comprises data of mechanical durability test and data of high-temperature durability test.

[0019] According to a fifth aspect of the embodiments of the present application, an electronic device is provided, comprising: a processor, a memory;

[0020] the memory is configured to store a computer program;

[0021] the processor is configured to execute the method according to the first and second aspects by calling the computer program.

[0022] According to a sixth aspect of the embodiments of the present application, a computer readable storage medium is provided, which stores a computer program, and the program is executed by a processor to implement the method according to the first and second aspects.

[0023] The technical scheme provided by the embodiment of the present application can include the following beneficial effects:

[0024] The present application first determines the high-temperature test duration that can meet the high-temperature test requirement, then allocates the high-temperature test duration to each working condition point, and makes the estimated mechanical fatigue damage calculated according to the allocated result meet the requirement of mechanical durability test, and generates a test spectrum. Because the test duration of high-temperature durability in the technical scheme of the present application is the same as the total test duration of mechanical fatigue durability, testing according to the test spectrum of the present application can simultaneously test high-temperature durability and mechanical durability, saving test cost, shortening development cycle, and at the same time, the failure risk of the electric drive assembly caused by coupling of thermal damage and mechanical damage can be fully verified, and the product can be fully verified.

[0025] It should be understood that the above general description and the following detailed description are only exemplary and explanatory, and cannot limit the present application. BRIEF DESCRIPTION OF DRAWINGS

[0026] The accompanying drawings, which are incorporated into the specification and constitute a part of the present application, illustrate embodiments consistent with the present application and, together with the specification, serve to explain the principles of the present application.

[0027] Figure 1 is a flowchart of a method for generating a test spectrum of a durability test according to an exemplary embodiment of the present application.

[0028] Figure 2 is a schematic diagram of a typical working condition of a mechanical device according to an exemplary embodiment of the present application.

[0029] Figure 3 is a schematic diagram of motor operating data under a typical working condition according to an exemplary embodiment of the present application.

[0030] Figure 4 is a schematic diagram of winding temperature distribution of a motor under a typical working condition according to an exemplary embodiment of the present application.

[0031] Figure 5 is a schematic diagram of a test spectrum of a durability working condition according to an exemplary embodiment of the present application.

[0032] Figure 6 is a schematic diagram of winding temperature distribution under a test spectrum of a durability working condition according to an exemplary embodiment of the present application.

[0033] Figure 7 is a flowchart of a method for generating a test spectrum of a durability test according to an exemplary embodiment of the present application.

[0034] Figure 8is a structural schematic diagram of an electronic device according to an exemplary embodiment of the present application.

[0035] Figure 9 is a block diagram of a test profile generation device for durability testing according to an exemplary embodiment of the present application.

[0036] Figure 10 is a block diagram of a device for durability testing according to an exemplary embodiment of the present application. DETAILED DESCRIPTION

[0037] The exemplary embodiments will now be described in detail with reference to the accompanying drawings. The following description is made with reference to the accompanying drawings, in which like reference numerals refer to like elements, and is made in the order of described in the following description. The following exemplary embodiments are not representative of all embodiments consistent with the present application. Rather, they are merely examples of apparatuses and methods consistent with some aspects of the present application, as detailed in the appended claims.

[0038] The terminology used in the present application is for the purpose of describing particular embodiments only and is not intended to be limiting of the present application. As used in the present application and the appended claims, the singular forms "a," "an" and "the" are intended to include the plural forms as well, unless the context clearly indicates otherwise. It will be further understood that the terms "comprises" and / or "comprising," when used in this specification, specify the presence of stated features, integers, steps, operations, elements, and / or components, but do not preclude the presence or addition of one or more other features, integers, steps, operations, elements, components, and / or groups thereof.

[0039] It will be understood that, although the terms first, second, third, etc. can be used herein to describe various information, the information should not be limited to these terms. These terms are used only to distinguish one piece of information from another piece of information. For example, a first information can also be termed a second information, and similarly, a second information can also be termed a first information without departing from the scope of the present application. Depending on the context, the word "if' as used herein can be interpreted as meaning "when" or "in response to determining" or "in response to ascertaining."

[0040] The test spectrum generated by the prior art can only test one aspect of the electric drive assembly, for example, only mechanical durability test or only high temperature durability test. Different manufacturers have different needs, and such single test test spectrum can meet the basic single test needs of manufacturers for electric drive assemblies. However, with the development of the industry, some manufacturers have higher requirements for their own products and need to test mechanical durability and high temperature durability, but the prior art cannot realize a test spectrum covering both durability tests, so these manufacturers can only use two bench tests to test the mechanical durability and high temperature durability reliability respectively. However, two tests in succession increase the test cost, prolong the development cycle, and also cannot fully verify the failure risk of the electric drive assembly caused by the coupling of thermal damage and mechanical damage, that is, the verification of the product is not enough.

[0041] In order to solve the above problems existing in the prior art, the application provides a method for generating a durability test spectrum. The method can be used to generate a test spectrum for an electric drive assembly used in a mechanical equipment equipped with an electric drive assembly, and the test spectrum can be used to test the high temperature durability and mechanical durability of the electric drive assembly at the same time to verify whether the electric drive assembly can meet the requirements of high temperature durability and mechanical durability.

[0042] Figure 1 A flowchart of a method for generating a durability test spectrum according to an example embodiment is shown in FIG. 1. As shown in FIG. 1, the method can include the following steps: Figure 1

[0043] S101: According to the motor winding temperature distribution under the typical working condition, the motor acceleration factor of the motor under the typical working condition is obtained, and the high temperature test duration is determined based on the motor acceleration factor.

[0044] The working condition of the mechanical equipment in the normal use process is called working condition, the typical working condition can be a preset target working condition, or can be an industry standard working condition of the mechanical equipment, or can be a working condition that can represent the main application scene of the mechanical equipment, for example, for the automobile driving, eighty percent of the working condition is the working condition of driving on urban roads, and twenty percent of the working condition is the working condition of driving in rural areas or on highways. The working condition of the main application scene of the automobile is the working condition corresponding to the driving on urban roads, so the working condition can be a typical working condition, which can be a corresponding relationship between the speed and time of driving on urban roads.

[0045] ​The above mechanical equipment all uses an electric drive assembly. Based on a typical working condition of the mechanical equipment, combined with specific mechanical equipment model information, etc., a typical working condition of the electric drive assembly corresponding to the typical working condition of the mechanical equipment on the mechanical equipment can be obtained, the typical working condition of the electric drive assembly including working parameters of the electric drive assembly under the typical working condition of the corresponding mechanical equipment, the working parameters including but not limited to the rotating speed and torque of the electric drive assembly. The working parameters corresponding to a specific moment can be referred to as a working condition point. When a test spectrum involving testing of the electric drive assembly is actually involved, the working parameters of the electric drive assembly need to be specified at a specific moment, that is, the test spectrum specifies a plurality of specific working condition points and the running time of the working condition points.

[0046] According to the typical working condition of the electric drive assembly, the temperature of the motor winding and the time relationship can be determined by calculation, that is, the motor winding temperature distribution can be determined. The motor winding temperature distribution can indicate the winding temperature corresponding to a moment under the typical working condition.

[0047] Based on the motor acceleration factor, the high-temperature test duration is determined. In an embodiment, the test spectrum can include a plurality of cycles of typical working conditions, each cycle being a complete typical working condition as described above. Based on the high-temperature test duration of each cycle, the total high-temperature test duration corresponding to the test spectrum can be determined. Running the electric drive assembly for the total high-temperature test duration according to the typical working condition can complete the test of high-temperature durability in the test.

[0048] How to finally determine the high-temperature test duration according to the typical working condition will be described below.

[0049] Figure 2 The typical working condition diagram of a car including an electric drive assembly shown in an embodiment of the present application includes the corresponding relationship between the vehicle speed and time of the car in two cycle periods under the typical working condition. According to the corresponding relationship between the vehicle speed and time shown in the typical working condition, combined with the air resistance coefficient, vehicle weight, gear ratio, tire rolling radius, etc. of the car, the running data of the motor under the typical working condition can be determined, that is, the typical working condition of the electric drive assembly. In an embodiment, the corresponding relationship between the motor rotating speed, torque and time under the typical working condition of the electric drive assembly determined can be as shown in Figure 3 Figure 3 The motor running data shown in Figure 2 is obtained based on the typical working condition shown in the figure. The corresponding relationship between any moment and rotating speed and torque can be regarded as a working condition point, for example Figure 3 T0, T1, T2, T3 and T4 shown in

[0050] ​According to the motor speed, torque and other operating data under the typical working condition, the corresponding relationship between the winding temperature and time can be obtained. In an embodiment, the winding temperature-time relationship shown in FIG. 3 can be obtained according to the operating data shown in FIG. 2. Figure 3 Figure 4 The winding temperature-time relationship shown in FIG. 3 can be obtained according to the operating data shown in FIG. 2.

[0051] Table 1

[0052] Temperature (°C) Distribution (%) 60 3 70 7 80 15 90 15 100 3 110 29 120 21 130 6 140 1

[0053] In an embodiment, the target test temperature of the electric drive assembly to be tested can be set in advance, for example, the target test temperature of the electric drive assembly to be tested can be set in advance according to the temperature resistance grade of the magnetic steel, and the maximum test temperature is set to 155℃. Based on the above motor winding temperature distribution, the motor acceleration factor of the motor to be tested under the above working condition is calculated by the Arrhenius model. The specific calculation formula is as follows:

[0054] Formula 1

[0055]

[0056] In the formula, A T，i is the acceleration factor of the i th working condition point under the Arrhenius model; e is the natural logarithm; E A is the activation energy, E A = 0.45eV; k is the Boltzmann constant, k = 8.617 x 10 -5 eV; T test is the test temperature, that is, the target test temperature, which is usually the maximum value, for example, the maximum test temperature 155℃; T Field，i is the field temperature of the i th working condition point, which is obtained based on the above motor winding temperature distribution curve.

[0057] Based on the calculated motor acceleration factor, the high-temperature test duration is determined by calculation. The specific calculation formula is as follows:

[0058] Formula 2

[0059]

[0060] In the formula, t Test is the total duration of high-temperature test, which is calculated by the above formula, including multiple cycles of typical working conditions, and the duration of each single cycle is equal to the total duration of high-temperature test divided by the number of cycles; A T，i is the acceleration factor of the i th working condition point under the Arrhenius model, which is calculated by formula 1; p i is the temperature distribution ratio, which is calculated by Figure 4 the curve.​operation is the field working duration of the electric drive assembly, which is calculated by dividing the driving life mileage (e.g. 300,000 km) by the mileage of the typical working condition, and then multiplying the time of the typical working condition, i.e. first calculating the number of periods of the typical working condition required to reach the life mileage, and then calculating the total high-temperature test duration.

[0061] In an embodiment, the above data can be summarized in Table 2.

[0062] Table 2

[0063] Ttest(°C) Tfield,i(°C) Ati pi tTest(h) 155 60 32.39868 0.032609 4.025929302 155 70 20.51817 0.068562 13.36608074 155 80 13.33476 0.154682 46.39971027 155 90 8.874404 0.150502 67.83629808 155 100 6.036311 0.02592 17.17587499 155 110 4.189291 0.291806 278.6209365 155 120 2.961959 0.207358 280.0279582 155 130 2.130527 0.05602 105.1760021 155 140 1.557119 0.012542 32.2179848

[0064] In the table, tTest is the duration of a single high-temperature test calculated by Formula 2. The data of tTest in the table is added to obtain a total high-temperature test duration of about 844.8 h.

[0065] There are various ways to finally determine the high-temperature test duration based on the typical working condition, and the above illustration and textual description are only one specific method. The application does not limit the specific formula or way of finally determining the high-temperature test duration through the typical working condition.

[0066] S102: distributing the high-temperature test duration to each working condition point under the typical working condition, associating each working condition point to a corresponding test period, and the result after distribution is that the estimated mechanical fatigue damage reaches the preset mechanical durability test requirement, wherein the sum of the test periods of each working condition point is equal to the high-temperature test duration.

[0067] S103: determining a test spectrum based on the result after distribution.

[0068] After the above calculation, the high-temperature test duration has been obtained. The high-temperature test duration is distributed to each selected working condition point, so that each selected working condition point in the test spectrum continuously runs for a test period. The electric drive assembly will generate mechanical fatigue damage when continuously running according to each working condition point. Therefore, after distributing the test period, the mechanical fatigue damage of the typical working condition in a period can be estimated based on the distribution result and each working condition point. Only when the estimated total mechanical fatigue damage reaches the requirement of the mechanical durability test, the corresponding generated test spectrum can complete the mechanical durability test. In order to complete the test of high-temperature durability and mechanical durability at the same time in one test, it is necessary to further make the sum of the test periods of each working condition point equal to the total high-temperature test duration based on the basis that the estimated mechanical fatigue damage reaches the requirement of the mechanical durability test, i.e. to make the electric drive assembly start the test of high-temperature durability and mechanical durability at the same time in one test, and also end the test of the two at the same time.

[0069] Based on the allocated results, the test spectrum is determined, which can specifically include some or all of the following: specific operating parameters of each operating point, such as speed, torque, etc.; test period of continuous operation at each operating point parameter; total duration of high temperature test; duration of one operating cycle; number of cycles of operating cycle, etc.

[0070] The following will be described in detail through an exemplary embodiment.

[0071] In the above embodiment of determining the motor winding temperature and the total duration of high temperature test, the high temperature test duration is allocated, and the test period of each operating point after allocation can be as shown in Table 3. Figure 5 As can be seen, the speed and torque corresponding to each operating point are continuously operated for a test period, and the estimated mechanical fatigue damage calculated using the allocated results can meet the demand of mechanical durability test, so Figure 5 The test spectrum of mechanical durability test under the above typical operating conditions can also be represented. Table 3 shows the mechanical durability test spectrum generated by the total value of the estimated mechanical fatigue damage and the demand value of the mechanical fatigue damage test within the operating time of the total duration of the high temperature test (i.e. 844.8h). Figure 5 As can be seen, the speed and torque corresponding to each operating point are continuously operated for a test period, and the estimated mechanical fatigue damage calculated using the allocated results can meet the demand of mechanical durability test, so

[0072] Table 3

[0073] Bearing mechanical damage Gear tooth mechanical damage Required value of mechanical fatigue damage 2.30 x 10 17 ]]> 5.90 x 10 27 ]]> Total value of estimated mechanical fatigue damage 2.77 x 10 17 ]] 5.90 x 10 27 ]]

[0074] In the case where the total value of the estimated mechanical fatigue damage meets the demand of the mechanical fatigue damage test, the test spectrum is generated according to the allocation results, and the test test using the test spectrum can simultaneously test the high temperature durability and mechanical durability of the electric drive assembly.

[0075] In an embodiment, after the high temperature test duration is allocated to each operating point, the estimated mechanical fatigue damage calculated based on the test period allocated to each operating point at this time and the speed and torque of each operating point itself may not meet the demand of the mechanical durability test, and then the operating point needs to be adjusted to make the mechanical fatigue damage calculated after adjustment meet the test demand, and then the test spectrum is determined.

[0076] In an embodiment, the first adjustment of the operating point for not meeting the demand of the mechanical durability test, the estimated mechanical fatigue damage calculated may still not meet the demand of the mechanical durability test, and then the operating point can be adjusted on the basis of the first adjustment until the estimated mechanical fatigue damage can meet the demand of the mechanical durability test.

[0077] In an embodiment, the above adjustment process is described because the mechanical endurance test requirements are not met, and the operating point is adjusted so that the estimated mechanical fatigue damage after adjustment can meet the mechanical endurance test requirements, but because the operating point is adjusted, it may cause the winding temperature rise to change, so that the target test temperature cannot be reached. Therefore, in the case that the winding temperature rise after adjusting the operating point cannot reach the target test temperature, at least one operating point can be adjusted again so that the winding temperature can reach the target test temperature. For example, on the basis of the above embodiment of the test spectrum generation, the operating point is further adjusted so that the operating test spectrum after adjustment can meet the motor winding temperature reaching the target test temperature, and meet the high temperature endurance test requirements. For example, Figure 6 The winding temperature distribution of the adjusted test spectrum is shown, and it can be seen that the calculated motor winding temperature in the operating condition can be stabilized at 155°C or more, and the winding temperature reaches the target test temperature (155°C), which can meet the high temperature endurance test requirements.

[0078] In an embodiment, the above adjustment of the operating point can include adjusting at least one of the speed, torque and corresponding test period of at least one operating point. For example, in the adjustment of the operating point to meet the mechanical test requirements, the speed and torque of at least one operating point can be changed based on the linear fatigue damage accumulation theory to change the calculated estimated mechanical fatigue damage; the test period of a certain operating point can also be shortened, and the test period of another operating point can be correspondingly increased, so that the total mechanical test time remains equal to the high temperature test time, and the estimated mechanical fatigue damage is affected.

[0079] In an embodiment, in the case that the winding temperature rise cannot reach the target test temperature, and at least one operating point needs to be adjusted, in order to avoid the case that adjusting the speed and torque of the operating point causes the estimated mechanical fatigue damage to change again and cannot meet the mechanical test requirements, the high temperature test total time can include multiple cycle periods, each cycle period has the same length, and the sum of the lengths of the multiple cycle periods is the high temperature test total time. The above adjustment of the operating point can be to increase the length of a single cycle period, so that the test period corresponding to each operating point in a single cycle period is also increased in proportion, so that the winding temperature rises, and the target test temperature is reached.

[0080] The application keeps the mechanical endurance test duration consistent with the high-temperature endurance test duration, and adjusts the working condition points so that the test spectrum can meet the mechanical endurance test requirement and the high-temperature endurance test requirement at the same time. The test spectrum can be used to simultaneously test mechanical fatigue endurance and high-temperature endurance. For manufacturers with both test requirements, the test cost is saved, the development cycle is shortened, the failure risk of the electric drive assembly caused by the coupling of thermal damage and mechanical damage can be verified, and the product can be verified more fully.

[0081] The application also provides a durability test method, as shown in Figure 7 , the method comprises the following steps.

[0082] S701: obtaining the test spectrum in the durability test spectrum generation method in any of the above embodiments.

[0083] S702: testing according to the test spectrum, and the test result contains mechanical endurance test data and high-temperature endurance test data.

[0084] In an embodiment, the test result is compared with the mechanical endurance test requirement and the high-temperature endurance test requirement. In the case that the test result does not meet the mechanical endurance test requirement or / and the high-temperature endurance test requirement, the test spectrum is adjusted again, and the test is performed.

[0085] Corresponding to the above-mentioned method embodiments, the application also provides corresponding device embodiments.

[0086] Please refer to Figure 8 , Figure 8 is a structural schematic diagram of an electronic device in which the device in an embodiment of the application is located. On the hardware level, the device includes a processor 810, a network interface 820, a memory 830, and a non-volatile memory 840, and of course, other hardware required by the business. One or more embodiments of the application can be implemented in a software manner, such as reading the corresponding computer program from the non-volatile memory 840 into the memory 830 by the processor 810 and then running. Of course, in addition to the software implementation, one or more embodiments of the application do not exclude other implementation manners, such as logic devices or a combination of software and hardware, etc. That is, the execution subject of the following processing flow is not limited to the logical units, but can also be hardware or logic devices.

[0087] Please refer to Figure 9 , Figure 9 is a block diagram of a durability test spectrum generation device in an embodiment of the application. The durability test spectrum generation device can be applied to, for example Figure 8The electronic device shown is used to implement the technical solutions of the application. The device for generating a test spectrum of a durability test can include:

[0088] The determination duration unit 910 is configured to obtain a motor acceleration factor of the motor under a typical working condition according to a motor winding temperature distribution under the typical working condition, and determine a high-temperature test duration based on the motor acceleration factor.

[0089] The distribution unit 920 is configured to distribute the high-temperature test duration to each working condition point under the typical working condition, associate each working condition point to a corresponding test period, and distribute the result so that the estimated mechanical fatigue damage reaches a preset mechanical durability test requirement, wherein the sum of the test periods of the working condition points is equal to the high-temperature test duration.

[0090] The test spectrum unit 930 is configured to determine a test spectrum based on the distributed result.

[0091] Optionally, the device further includes:

[0092] The adjustment working condition point unit is configured to

[0093] calculate the estimated mechanical fatigue damage based on the distributed result.

[0094] In a case where the estimated mechanical fatigue damage cannot reach the preset mechanical durability test requirement, the working condition points are adjusted through at least one iteration until the preset mechanical durability test requirement is met.

[0095] Optionally, the adjustment working condition point unit further includes:

[0096] In a case where the estimated winding temperature rise cannot reach the target test temperature, at least one working condition point is adjusted so that the winding temperature reaches the target test temperature.

[0097] Optionally, the operation of adjusting the working condition points by the adjustment working condition point unit includes:

[0098] at least one of the rotational speed, the torque, and the corresponding test period of at least one working condition point is adjusted.

[0099] Optionally, the test spectrum includes a plurality of cycles of the durability test, the high-temperature test duration corresponds to the sum of the durations of the plurality of cycles, and the adjustment of at least one working condition point so that the winding temperature reaches the target test temperature includes:

[0100] the duration of a single cycle is increased, and the test periods corresponding to the working condition points are proportionally increased so that the winding temperature reaches the target test temperature.

[0101] Please refer to Figure 10 ,Figure 10 is a block diagram of a device for durability test in an embodiment of the present application. The device for durability test can be applied in an electronic device as shown in Figure 8 to implement the technical solution of the present application. The device for durability test can include:

[0102] The acquisition unit 1010 is configured to acquire the test spectrum in the method for generating a test spectrum for durability test according to the first aspect of the embodiment.

[0103] The test unit 1020 is configured to perform a test according to the test spectrum, and the result of the test includes data of mechanical durability test and data of high-temperature durability test.

[0104] Optionally, the device further includes:

[0105] The result of the test is compared with the mechanical durability test requirement and the high-temperature durability test requirement, and in the case that the result of the test does not meet the mechanical durability test requirement or / and the high-temperature durability test requirement, the test spectrum is readjusted and the test is performed.

[0106] The implementation process of the functions and roles of each unit in the above device is specifically described in the implementation process of the corresponding steps in the above method, which will not be described here.

[0107] For the device embodiment, since it basically corresponds to the method embodiment, the relevant part is described in the method embodiment. The above-described device embodiment is only illustrative, and the units described as separate components can or can not be physically separated, and the components displayed as units can or can not be physical units, i.e., they can be located in one place or distributed on multiple network units. According to actual needs, some or all of the modules can be selected to achieve the purpose of the present application. Those skilled in the art can understand and implement without creative labor.

[0108] In the 1990s, the improvement of a technology can be clearly distinguished as an improvement in hardware (for example, improvement in circuit structure such as diode, transistor, switch, etc.) or improvement in software (improvement in method flow). However, with the development of technology, many improvements in method flow today can be considered as direct improvement in hardware circuit structure. Designers almost all get the corresponding hardware circuit structure by programming the improved method flow into the hardware circuit. Therefore, it cannot be said that the improvement of a method flow cannot be implemented by a hardware entity module. Those skilled in the art should also know that only a little logical programming of the method flow in the above-mentioned hardware description languages and programming into an integrated circuit can easily obtain a hardware circuit that implements the logical method flow.

[0109] The controller can be implemented in any suitable manner. Those skilled in the art will appreciate that, in addition to being implemented in pure computer readable program code, the controller can be implemented to perform the same functions by means of logic gates, switches, application specific integrated circuits, programmable logic controllers and embedded microcontrollers, by means of logical programming of the method steps. The controller can thus be considered as a hardware component, and the means comprised therein for performing the various functions can be considered as structures within the hardware component. Alternatively, the means for performing the various functions can even be considered as both a software module implementing the method and a structure within a hardware component.

[0110] The systems, apparatuses, modules or units illustrated by the above embodiments can be implemented by computer chips or entities, or by products with certain functions. A typical implementation device is a server system. Of course, the present application does not exclude that with the development of computer technology in the future, the computer for implementing the functions of the above embodiments can be, for example, a personal computer, a laptop computer, an in-vehicle human-computer interaction device, a cellular phone, a camera phone, a smart phone, a personal digital assistant, a media player, a navigation device, an electronic mail device, a game console, a tablet computer, a wearable device, or a combination of any of these devices.

[0111] Although one or more embodiments of the present application provide method operation steps as described in the embodiments or flowcharts, more or fewer operation steps can be included based on conventional or non-inventive means. The order of steps listed in the embodiments is only one of the many execution orders of the steps, and does not represent the only execution order. When the device or terminal product is executed in practice, the method order shown in the embodiments or the drawings can be executed in sequence or in parallel (for example, in a parallel processor or a multi-thread processing environment, or even in a distributed data processing environment). The term "comprise", "include" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, product or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or further includes elements inherent to such a process, method, product or device. Without more limitations, it does not exclude the presence of other same or equivalent elements in the process, method, product or device including the elements. For example, if the first, second, etc. terms are used to represent names, they do not represent any particular order.

[0112] For ease of description, the above apparatus is described in various modules with functions respectively. Of course, functions of the modules can be implemented in one or more software and / or hardware in implementing one or more of the present application, and the modules with the same function can be implemented by a combination of a plurality of sub-modules or sub-units, etc. The apparatus embodiments described above are only schematic, for example, the division of the units is only a logical function division, and there can be another division manner in actual implementation, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the coupling or direct coupling or communication connection between the units shown or discussed can be indirect coupling or communication connection through some interfaces, devices or units, and can be electrical, mechanical or other forms.

[0113] The present application is described with reference to flowcharts and / or block diagrams of the methods, apparatus (system) and computer program products according to embodiments of the present application. It should be understood that each flow and / or block in the flowcharts and / or block diagrams, and a combination of flows and / or blocks in the flowcharts and / or block diagrams can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device produce a device implemented in the flowcharts and / or block diagrams. Figure 1 The functions specified in one or more flows and / or blocks. Figure 1 The functions specified in one or more flows and / or blocks.

[0114] These computer program instructions can also be stored in a computer readable memory capable of directing the computer or other programmable data processing device to work in a specific way, so that the instructions stored in the computer readable memory produce a manufactured product including instruction devices, which implement the functions specified in one or more flows and / or blocks. Figure 1 The functions specified in one or more flows and / or blocks. Figure 1 The functions specified in one or more flows and / or blocks.

[0115] These computer program instructions can also be loaded into a computer or other programmable data processing device, so that a series of operation steps are performed on the computer or other programmable device to produce a computer implemented process, so that the instructions executed on the computer or other programmable device provide a process for implementing the functions specified in one or more flows and / or blocks. Figure 1 The functions specified in one or more flows and / or blocks. Figure 1 The functions specified in one or more flows and / or blocks.

[0116] In a typical configuration, the computing device includes one or more processors (CPU), input / output interface, network interface and memory.

[0117] Memory can include, without limitation, non- persistent memory, random access memory (RAM), and / or non-volatile memory, etc. such as read only memory (ROM), or flash memory. Memory is an example of computer readable media.

[0118] Computer readable media includes permanent and non-permanent, removable and non-removable media implemented in any method or technology for storage of information such as computer readable instructions, data structures, program modules or other data. Examples of computer storage media include, without limitation, phase change memory (PRAM), static random access memory (SRAM), dynamic random access memory (DRAM), other types of random access memory (RAM), read only memory (ROM), electrically erasable programmable read only memory (EEPROM), flash memory or other memory technology, compact disc read only memory (CD-ROM), digital versatile disks (DVDs) or other optical storage, magnetic cassettes, magnetic tapes, magnetic disk storage or other magnetic storage devices, graphene memory or other magnetic storage devices, or any other non-transmission medium that can be used to store information accessible to a computing device. According to the definition herein, computer readable media does not include transitory media, such as modulated data signals and carrier waves.

[0119] Those skilled in the art will appreciate that one or more embodiments of the application can be provided as a method, system or computer program product. Accordingly, one or more embodiments of the application can take the form of an entirely hardware embodiment, an entirely software embodiment or an embodiment combining software and hardware aspects. Furthermore, one or more embodiments of the application can take the form of a computer program product on one or more computer-usable storage media (including, without limitation, magnetic disks, CD-ROMs, optical storage media, etc.) embodying computer readable program code.

[0120] One or more embodiments of the application can be described in the general context of computer-executable instructions, such as program modules, being executed by a computer. Generally, program modules include routines, programs, objects, components, data structures, etc. that perform particular tasks or implement particular abstract data types. One or more embodiments of the application can also be practiced in distributed computing environments where tasks are performed by remote processing devices that are linked through a communications network. In a distributed computing environment, program modules can be located in both local and remote computer storage media including memory storage devices.

[0121] The various embodiments in the present application are described in a progressive manner, and the same or similar parts among the various embodiments can be referred to each other. Each embodiment focuses on the difference from other embodiments. In particular, the system embodiments are described simply because they are basically similar to the method embodiments. The relevant parts can be referred to the description of the method embodiments. In the description of the present application, the description of the terms "one embodiment", "some embodiments", "an example", "a specific example", or "some examples" means that the specific features, structures, materials or characteristics described in connection with the embodiment or example are included in at least one embodiment or example of the present application. The illustrative description of the above terms in the present application does not necessarily refer to the same embodiment or example. Moreover, the specific features, structures, materials or characteristics described can be combined in any appropriate manner in any one or more embodiments or examples. In addition, those skilled in the art can combine and combine the features of different embodiments or examples described in the present application without contradiction.

[0122] The above merely describes one or more embodiments of the present application and is not intended to limit the one or more embodiments of the present application. Those skilled in the art can make various modifications and changes to the one or more embodiments of the present application. Any modification, equivalent replacement, improvement, etc. made within the spirit and principle of the present application shall be included in the scope of claims.

Claims

1. A method of generating a test profile for a durability test, characterized by, The method comprises: obtaining a motor acceleration factor of the motor under typical operating conditions according to a motor winding temperature distribution under the typical operating conditions, and determining a high-temperature test duration based on the motor acceleration factor; allocating the high-temperature test duration to each operating point under the typical operating conditions, associating each operating point to a corresponding test period, and the allocated result being such that an estimated mechanical fatigue damage reaches a preset mechanical durability test requirement, wherein the sum of the test periods of each operating point is equal to the high-temperature test duration, and the allocated result comprises a test period of continuous operation under each operating point parameter, and the estimated mechanical fatigue damage is calculated based on the allocated result; determining a test spectrum based on the allocated result.

2. The method of claim 1, wherein, Further comprising: in the case that the estimated mechanical fatigue damage cannot reach the preset mechanical durability test requirement, adjusting the operating points through at least one iteration until the preset mechanical durability test requirement is met.

3. The method of claim 2, wherein, Further comprising: in the case that the estimated winding temperature rise cannot reach a target test temperature, adjusting at least one operating point to make the winding temperature reach the target test temperature.

4. The method according to claim 2 or 3, characterized in that, The adjustment of the operating points comprises: adjusting at least one of the rotational speed, the torque and the corresponding test period of at least one operating point.

5. The method of claim 3, wherein, The test spectrum comprises a plurality of cycles of the durability test, the high-temperature test duration corresponds to the sum of the durations of the plurality of cycles, and the adjustment of at least one operating point to make the winding temperature reach the target test temperature comprises: increasing the duration of a single cycle and proportionally increasing the test periods corresponding to the operating points so that the winding temperature reaches the target test temperature.

6. A method of durability testing, characterized by Comprising: obtaining the test spectrum in the generation method of the test spectrum of the durability test according to any one of claims 1-5; performing a test according to the test spectrum, and the result of the test comprising data of the mechanical durability test and data of the high-temperature durability test.

7. The method of claim 6, wherein, Further comprising: comparing the result of the test with the mechanical durability test requirement and the high-temperature durability test requirement, and readjusting the test spectrum and performing a test in the case that the result of the test does not meet the mechanical durability test requirement or / and the high-temperature durability test requirement.

8. An apparatus for generating a test profile for a durability test, characterized by Comprising: a determination unit configured to obtain a motor acceleration factor of the motor under typical operating conditions according to a motor winding temperature distribution under the typical operating conditions, and determine a high-temperature test duration based on the motor acceleration factor; an allocation unit configured to allocate the high-temperature test duration to each operating point under the typical operating conditions, associate each operating point to a corresponding test period, and the allocated result being such that an estimated mechanical fatigue damage reaches a preset mechanical durability test requirement, wherein the sum of the test periods of each operating point is equal to the high-temperature test duration, and the allocated result comprises a test period of continuous operation under each operating point parameter, and the estimated mechanical fatigue damage is calculated based on the allocated result; a test spectrum unit configured to determine a test spectrum based on the allocated result.

9. A device for endurance testing, characterized in that Comprising: An acquisition unit is configured to acquire the test spectrum in the method for generating a test spectrum for a durability test according to any one of claims 1-5; A test unit is configured to perform a test according to the test spectrum, and the result of the test includes data of a mechanical durability test and data of a high-temperature durability test.

10. An electronic device, comprising: comprising: a processor, a memory; the memory is configured to store a computer program; the processor is configured to execute the method according to any one of claims 1-7 by calling the computer program.

11. A computer readable storage medium having stored thereon a computer program, characterized in that, The program is executed by the processor to implement the method according to any one of claims 1-7.

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