A magnetic property measuring device and a magnetic property measuring method

Abstract

The application provides a magnetic performance measuring device and a magnetic performance measuring method, the magnetic performance measuring device comprises a measurement control module, an integral amplification module, a feedback module and a test square; the feedback module is used for obtaining a secondary voltage signal of the test square and generating a feedback voltage signal according to the secondary voltage signal; the measurement control module is used for generating a sinusoidal voltage signal; the integral amplification module is used for comparing waveforms of the feedback voltage signal and the sinusoidal voltage signal; the measurement control module is further used for obtaining a primary current signal of the test square and the secondary voltage signal when the comparison result is that the waveforms of the feedback voltage signal and the sinusoidal voltage signal are consistent, and obtaining a magnetic performance measurement result according to the primary current signal and the secondary voltage signal. The application corrects the secondary voltage signal of the test square through the feedback module and the integral amplification module, so that a more accurate magnetic performance measurement result is obtained.

Description

Technical Field

[0001] This invention relates to the field of magnetic material measurement, and more particularly to a magnetic property measuring device and a magnetic property measuring method. Background Technology

[0002] In recent years, with the rapid development of the power industry and new energy vehicles, the requirements for measuring the magnetic properties of electrical steel have become increasingly stringent. In particular, the increased testing operating point of electrical steel has made it difficult for testing institutions to control the secondary voltage waveform, leading to deviations in testing the same electrical steel sample by different institutions. Current methods using digital control of the secondary voltage waveform cannot achieve a perfectly sinusoidal waveform when the sample itself has poor performance and the testing operating point is high, thus compromising the accuracy of iron loss measurement at high testing operating points. Summary of the Invention

[0003] The main technical problem solved by the embodiments of the present invention is to provide a magnetic property measuring device and a magnetic property measuring method, which corrects the secondary voltage signal of the test square ring through a feedback module and an integral amplification module to obtain more accurate magnetic property measurement results.

[0004] To solve the above-mentioned technical problems, one technical solution adopted in the embodiments of the present invention is: to provide a magnetic property measuring device, the magnetic property measuring device comprising:

[0005] Measurement and control module, integral amplification module, feedback module, and test square;

[0006] The integral amplification module is connected to the measurement control module, the primary winding of the test coil, and the feedback module, respectively. The feedback module is connected to the secondary winding of the test coil, and the measurement control module is connected to the primary winding and the secondary winding, respectively.

[0007] The feedback module is used to acquire the secondary voltage signal of the test square and generate a feedback voltage signal based on the secondary voltage signal.

[0008] The measurement and control module is used to generate a sinusoidal voltage signal;

[0009] The integrating amplifier module is used to compare the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal;

[0010] The measurement control module is further configured to, when the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, acquire the secondary voltage signal and the primary current signal of the test square, and acquire the magnetic performance measurement result based on the primary current signal and the secondary voltage signal.

[0011] In some embodiments, the integrating amplification module includes: an integrating comparison unit, a transistor driving unit, and a power amplification unit;

[0012] The integration comparison unit is connected to the measurement control module and the transistor driving unit respectively, and the power amplification unit is connected to the transistor driving unit and the primary winding of the test coil respectively.

[0013] The integration comparison unit is used to compare the waveform of the feedback voltage signal and the waveform of the sinusoidal voltage signal, and outputs an integration comparison signal to the transistor driving unit according to the feedback voltage signal and the sinusoidal voltage signal;

[0014] The transistor driving unit outputs a driving signal to the power amplifier unit according to the integral comparison signal;

[0015] The power amplification unit outputs a power amplifier voltage signal to the primary winding of the test coil according to the drive signal.

[0016] In some embodiments, the magnetic property measuring device further includes:

[0017] A servo zero-stabilization module is connected to the power amplifier unit and the integral comparator unit, respectively.

[0018] The servo zero-stabilization module is used to acquire the power amplifier voltage signal output by the power amplifier unit, and output a zero-stabilization voltage signal to the integration and comparison unit according to the power amplifier voltage signal, so that the output of the power amplifier unit is DC zero.

[0019] In some embodiments, the servo zero-stabilization module includes: a high-frequency filtering unit, a servo integration unit, a two-stage amplification unit, and a filtering feedback unit;

[0020] The high-frequency filtering unit is used to acquire the power amplifier voltage signal. The servo integration unit is connected to the high-frequency filtering unit and the secondary amplification unit respectively. The secondary amplification unit is also connected to the filter feedback unit. The filter feedback unit is used to output the zero-stable voltage signal.

[0021] In some embodiments, the feedback module includes: a first filtering unit, a proportional amplification unit, and a high-frequency noise filtering unit;

[0022] The first filtering unit is used to connect to the secondary voltage signal. The first filtering unit is connected to the proportional amplification unit, and the proportional amplification unit outputs the feedback voltage signal through the high-frequency noise filtering unit.

[0023] In some embodiments, the integration comparison unit includes a filtering subunit, a voltage divider subunit, and an integration comparison subunit;

[0024] The filtering subunit is used to connect to the sinusoidal voltage signal, the voltage divider subunit is used to connect to the zero-stable voltage signal, the integral comparator subunit is connected to the filtering subunit, the integral comparator subunit and the feedback module, and the integral comparator subunit is also connected to the transistor driving unit;

[0025] The integral comparison subunit is used to send an integral comparison signal to the transistor driving unit based on the sinusoidal voltage signal, the feedback voltage signal, and the zero-stability voltage signal.

[0026] In some embodiments, the magnetic property measuring device further includes: a transformer, the primary winding of which is connected to the power amplification unit, and the secondary winding of which is connected to the primary winding of the test coil.

[0027] In some embodiments, the measurement control module includes a control unit, a digital-to-analog converter, an analog-to-digital converter, a signal conditioning unit, and a sampling resistor;

[0028] The control unit sends a sinusoidal voltage signal to the integrating amplifier module through the digital-to-analog converter unit;

[0029] The signal conditioning unit obtains the primary current signal of the test coil through a sampling resistor connected to the primary winding of the test coil. The signal conditioning unit is also connected to the secondary winding of the test coil to obtain the secondary voltage signal of the test coil, and sends a conditioning current signal and a conditioning voltage signal to the analog-to-digital conversion unit according to the primary current signal and the secondary voltage signal.

[0030] The analog-to-digital conversion unit is connected to the signal conditioning unit and is used to convert the conditioning current signal and the conditioning voltage signal into digital voltage signal and digital current signal;

[0031] The control unit is connected to the analog-to-digital conversion unit and is used to obtain the magnetic property measurement results based on the digital voltage signal and the digital current signal.

[0032] To solve the above-mentioned technical problems, another technical solution adopted in the embodiments of the present invention is: to provide a magnetic property measurement method, applied to the magnetic property measurement device as described above, wherein the magnetic property measurement device includes: a measurement control module, an integration amplification module, a feedback module, and a test coil, wherein the integration amplification module is connected to the measurement control module, the primary winding of the test coil, and the feedback module, respectively, the feedback module is connected to the secondary winding of the test coil, and the measurement control module is connected to the primary winding and the secondary winding, respectively.

[0033] The magnetic property measurement method includes:

[0034] Acquire the secondary voltage signal of the test square, and generate a feedback voltage signal based on the secondary voltage signal;

[0035] Compare the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal generated by the measurement and control module, and obtain the comparison result;

[0036] When the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, the primary current signal and the secondary voltage signal of the test square are acquired, and the magnetic performance measurement result is obtained based on the primary current signal and the secondary voltage signal.

[0037] In some embodiments, the method further includes:

[0038] When the comparison result shows that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, the adjustment parameters of the integral amplifier module and the adjustment parameters of the feedback module are obtained.

[0039] The secondary voltage signal of the test square is obtained according to the adjustment parameters of the integral amplification module and the adjustment parameters of the feedback module, and a feedback voltage signal is generated according to the secondary voltage signal.

[0040] Compare the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal generated by the measurement and control module, and obtain the comparison result;

[0041] When the comparison result shows that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, the step of obtaining the adjustment parameters of the integral amplifier module and the adjustment parameters of the feedback module is executed until the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal.

[0042] Unlike related technologies, the present invention has the following advantages:

[0043] This invention provides a magnetic property measuring device and a magnetic property measuring method. The magnetic property measuring device includes a measurement control module, an integrating amplification module, a feedback module, and a test coil. The integrating amplification module is connected to the measurement control module, the primary winding of the test coil, and the feedback module. The feedback module is connected to the secondary winding of the test coil. The measurement control module is connected to both the primary winding and the secondary winding. The feedback module acquires the secondary voltage signal of the test coil and generates a feedback voltage signal based on the secondary voltage signal. The measurement control module generates a sinusoidal voltage signal. The integrating amplification module compares the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal. The measurement control module further acquires the secondary voltage signal and the primary current signal of the test coil when the comparison result shows that the waveform of the feedback voltage signal matches the waveform of the sinusoidal voltage signal, and obtains the magnetic property measurement result based on the primary current signal and the secondary voltage signal. This invention uses the feedback module and the integrating amplification module to correct the secondary voltage signal of the test coil to obtain a more accurate magnetic property measurement result. Attached Figure Description

[0044] One or more embodiments are illustrated by way of example with reference to the accompanying drawings. These illustrations do not constitute a limitation on the embodiments. Elements having the same reference numerals in the drawings are denoted as similar elements. Unless otherwise stated, the figures in the drawings are not to be limited by scale.

[0045] Figure 1 This is a schematic diagram of the structure of a magnetic property measuring device provided in an embodiment of the present invention;

[0046] Figure 2 This is a schematic diagram of another magnetic property measuring device provided in an embodiment of the present invention;

[0047] Figure 3 This is a schematic diagram of the structure of the integration comparison unit provided in an embodiment of the present invention;

[0048] Figure 4 This is a schematic diagram of the circuit structure of the integration comparison unit provided in an embodiment of the present invention;

[0049] Figure 5 This is a schematic diagram of the feedback module provided in an embodiment of the present invention;

[0050] Figure 6 This is a schematic diagram of the circuit structure of the feedback module provided in an embodiment of the present invention;

[0051] Figure 7 This is a schematic diagram of the servo zero-stabilization module provided in an embodiment of the present invention;

[0052] Figure 8 This is a schematic diagram of the circuit structure of the servo zero-stabilization module provided in an embodiment of the present invention;

[0053] Figure 9 This is a flowchart illustrating a magnetic property measurement method provided in an embodiment of the present invention;

[0054] Figure 10 This is a schematic flowchart of another magnetic property measurement method provided in an embodiment of the present invention. Detailed Implementation

[0055] To make the objectives, technical solutions, and advantages of this invention clearer, the invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative and not intended to limit the invention.

[0056] It should be noted that, unless otherwise specified, the various features in the embodiments of the present invention can be combined with each other, and all are within the protection scope of the present invention. Furthermore, although functional modules are divided in the device schematic diagram and a logical order is shown in the flowchart, in some cases, the steps shown or described may be performed in a different module division or in a different order than that shown in the device schematic diagram or the flowchart.

[0057] Unless otherwise defined, all technical and scientific terms used in this specification have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. The terminology used in this specification is for the purpose of describing particular embodiments only and is not intended to limit the invention. The term "and / or" as used in this specification includes any and all combinations of one or more of the associated listed items.

[0058] Please see Figure 1 , Figure 1 This is a schematic diagram of a magnetic performance measuring device provided in an embodiment of the present invention. The magnetic performance measuring device 100 includes: a measurement control module 10, an integrating amplification module 20, a feedback module 30, and a test coil 40. The integrating amplification module 20 is connected to the measurement control module 10, the primary winding N1 of the test coil 40, and the feedback module 30. The feedback module 30 is connected to the secondary winding N2 of the test coil 40. The measurement control module 10 is connected to both the primary winding N1 and the secondary winding N2.

[0059] The measurement control module 10 is used to generate a sinusoidal voltage signal. The feedback module 30 is used to acquire the secondary voltage signal of the test circle 40 and generate a feedback voltage signal based on the secondary voltage signal. The integrating amplification module 20 is used to compare the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal. The measurement control module 10 is also used to acquire the secondary voltage signal and the primary current signal of the test circle 40 when the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, and to obtain the magnetic performance measurement result based on the primary current signal and the secondary voltage signal.

[0060] The comparison results include two types: the first is that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, and the second is that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal.

[0061] The test square 40 is an Epstein square, and the sample is placed inside it. The sample is made of silicon steel to be measured, cut according to standards. The sample is inserted into the test square 40 for magnetic property measurement.

[0062] Specifically, firstly, the measurement control module 10 generates a sinusoidal voltage signal with a standard sinusoidal waveform. Secondly, the sinusoidal voltage signal is amplified by the integrating amplifier module 20 and then output to the test coil 40. Then, the feedback module 30 processes the secondary voltage signal of the secondary winding of the test coil 40 appropriately and sends a feedback voltage signal to the integrating amplifier module 20. The integrating amplifier module 20 compares the feedback voltage signal with the sinusoidal voltage signal to obtain the comparison result.

[0063] When the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, the measurement control module 10 acquires the secondary voltage signal and the primary current signal of the test circle 40, and calculates the magnetic performance measurement result based on the primary current signal and the secondary voltage signal.

[0064] When the comparison result shows that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, the parameters of the integrating amplifier module 20 and the feedback module 30 need to be adjusted to make the waveform of the feedback voltage signal consistent with the waveform of the sinusoidal voltage signal. After the waveforms are consistent, the measurement control module 10 acquires the secondary voltage signal and the primary current signal of the test circle 40, and calculates the magnetic performance measurement result based on the primary current signal and the secondary voltage signal.

[0065] Specifically, the measurement control module 10 can draw a hysteresis loop based on the primary current signal and the secondary voltage signal, and calculate the magnetic performance test results based on the hysteresis loop. The measurement control module 10 can also be connected to an external display to show the hysteresis loop and the magnetic performance test results.

[0066] The magnetic property measuring device provided in this embodiment of the invention corrects the secondary voltage signal of the test square through a feedback module and an integral amplification module, so that the waveform of the secondary voltage signal is consistent with the waveform of the sinusoidal voltage signal, thereby obtaining more accurate magnetic property measurement results.

[0067] Please see Figure 2 , Figure 2 This is a schematic diagram of another magnetic property measuring device provided in an embodiment of the present invention.

[0068] In some embodiments, the magnetic property measuring device 100 further includes a transformer 60, the primary winding of which is connected to the power amplification unit 23, and the secondary winding of which is connected to the primary winding N1 of the 40 test square ring. The transformer 60 is used to match different samples and maintain a suitable output range for the transformer 60, thereby ensuring the reliability of the measurement.

[0069] In some embodiments, the magnetic property measuring device 100 further includes a servo zero-stabilization module 50, which is connected to the power amplifier unit 23 and the integration and comparison unit 21, respectively. The servo zero-stabilization module 50 is used to acquire the power amplifier voltage signal output by the power amplifier unit 23, and output a zero-stabilization voltage signal to the integration and comparison unit 21 according to the power amplifier voltage signal, so that the output of the power amplifier unit 23 is a DC zero point.

[0070] It should be noted that, in existing technologies, firstly, the existing technology simply filters out the DC signal from the voltage signal of the secondary winding of the test coil before feedback comparison, and then performs a simple proportional superposition with the signal input to the test coil, without integrating and amplifying the signal input to the test coil. Therefore, it cannot guarantee that the waveform of the voltage signal of the secondary winding of the test coil is a standard sine wave. Secondly, because the existing technology uses feedback superposition after filtering out the DC signal from the secondary winding voltage signal, it cannot guarantee that the signal input to the primary winding of the transformer is a DC zero point, and therefore cannot guarantee that the signal output from the transformer to the test coil is free from DC bias, thus failing to guarantee that the signal of the primary winding of the test coil is completely symmetrical. Therefore, the servo zero-stabilization module 50 proposed in this embodiment of the invention is used to adjust circuit parameters to ensure that the waveform of the secondary voltage signal of the test coil is sinusoidal while ensuring that the circuit does not oscillate.

[0071] In some embodiments, the measurement control module 10 includes a control unit 11, a digital-to-analog converter (DAC) unit 12, an analog-to-digital converter (ADC) unit 13, a signal conditioning unit 14, and a sampling resistor 15. The control unit 11 sends a sinusoidal voltage signal to the integration and comparison unit 21 via the DAC unit 12. The signal conditioning unit 14 acquires the primary current signal of the test coil 40 via the sampling resistor 15 connected to the primary winding N1 of the test coil 40. The signal conditioning unit 14 is also connected to the secondary winding N2 of the test coil 40 to acquire the secondary voltage signal of the test coil 40, and sends a conditioning current signal and a conditioning voltage signal to the ADC unit 13 based on the primary current signal and the secondary voltage signal. The ADC unit 13 is connected to the signal conditioning unit 14 and is used to convert the conditioning current signal and the conditioning voltage signal into digital voltage signals and digital current signals. The control unit 11 is connected to the ADC unit 13 and is used to acquire the magnetic performance measurement results based on the digital voltage signals and digital current signals.

[0072] In some embodiments, the integrating amplification module 20 includes an integrating comparison unit 21, a transistor driving unit 22, and a power amplification unit 23. The integrating comparison unit 21 is connected to the measurement control module 10 and the transistor driving unit 22, respectively. The power amplification unit 23 is connected to the transistor driving unit 22 and the primary winding of the test coil 40, respectively. The integrating comparison unit 21 compares the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal, and outputs an integrating comparison signal to the transistor driving unit 22 based on the feedback voltage signal and the sinusoidal voltage signal. The transistor driving unit 22 outputs a driving signal to the power amplification unit 23 based on the integrating comparison signal. The power amplification unit 23 outputs a power amplifier voltage signal to the primary winding of the test coil 40 based on the driving signal.

[0073] Specifically, the transistor driving unit 22 is used to ensure high-frequency characteristics. Since the waveform output by the power amplifier unit 23 in this embodiment will be distorted and there are high-order harmonics in the waveform output by the power amplifier unit 23, the transistor driving unit 22 is set to ensure that the high-frequency characteristics of the power amplifier unit 23 are good.

[0074] The power amplifier unit 23 is composed of a large number of transistor circuits to ensure that the power amplifier voltage signal is a high-power signal.

[0075] Please see Figure 7 , Figure 7This is a schematic diagram of the servo zero-stabilization module provided in an embodiment of the present invention. In some embodiments, the servo zero-stabilization module 50 includes: a high-frequency filtering unit 501, a servo integration unit 502, a secondary amplification unit 503, and a filter feedback unit 504. The high-frequency filtering unit 501 is used to acquire the power amplifier voltage signal. The servo integration unit 502 is connected to both the high-frequency filtering unit 501 and the secondary amplification unit 503. The secondary amplification unit 503 is also connected to the filter feedback unit 504, which is used to output a zero-stabilized voltage signal.

[0076] Please see Figure 8 , Figure 8 This is a schematic diagram of the circuit structure of the servo zero-stabilization module provided in an embodiment of the present invention.

[0077] like Figure 8 As shown, the high-frequency filtering unit 501 in the servo zero-stability module 50 includes resistors R12, R14, R15, R16, R17, and R18, capacitors C7 and C8, diodes D1 and D2. The G port of the high-frequency filtering unit 501 is connected to the output terminal of the power amplifier unit 23 for receiving the power amplifier voltage signal. Specifically, the high-frequency filtering unit 501 filters out high-frequency signals from the power amplifier voltage signal output by the power amplifier unit 23 through R12, C7, and C9, retaining the DC bias voltage.

[0078] The servo integrator unit 502 in the servo zero-stability module 50 includes amplifier U3, resistors R19, R20, R21, R22, R23, and capacitor C10. The servo integrator unit 502 rapidly amplifies the DC bias voltage through R19, R21, R23, R22, and amplifier U3.

[0079] The secondary amplification unit 503 in the servo zero-stabilization module 50 includes amplifier U4, resistors R24, R25, R26, R27, R28, R29, R30, capacitors C11 and C12. Amplifier U4 in the secondary amplification unit 503 appropriately buffers and amplifies the signal output from the servo integrator unit 502.

[0080] The filter feedback unit 504 in the servo zero-stability module 50 includes a resistor R31 and a capacitor C13. Port A of the filter feedback unit 504 is connected to the integration and comparison unit 21 and is used to output a zero-stability voltage signal. The resistor R31 and capacitor C13 in the filter feedback unit 504 filter the signal output from the amplifier U4 and output a zero-stability voltage signal to the integration and comparison unit 21. After comparison and balancing by the integration and comparison unit 21, the power amplifier voltage signal output by the power amplifier unit 23 can be made to DC zero, thereby eliminating the bias voltage.

[0081] The servo zero-stabilization module 50 proposed in this embodiment of the invention can ensure that the waveform of the secondary voltage signal of the test square is sinusoidal while adjusting the circuit parameters, and can also ensure that the circuit does not oscillate.

[0082] Please see Figure 3 , Figure 3 This is a schematic diagram of the structure of the integration comparison unit provided in an embodiment of the present invention. In some embodiments, the integration comparison unit 21 includes a filtering subunit 203, a voltage divider subunit 202, and an integration comparison subunit 201.

[0083] The filter subunit 203 is used to connect to the sinusoidal voltage signal, the voltage divider subunit 202 is used to connect to the zero-stable voltage signal, the integral comparison subunit 201 is connected to the filter subunit 203, the integral comparison subunit 201 and the feedback module 30, and the integral comparison subunit 201 is also connected to the transistor drive unit 22.

[0084] The integration comparison subunit 201 is used to send an integration comparison signal to the transistor driving unit 22 based on the sinusoidal voltage signal, the feedback voltage signal, and the zero-stability voltage signal.

[0085] Please see Figure 4 , Figure 4 This is a schematic diagram of the circuit structure of the integration and comparison unit provided in an embodiment of the present invention.

[0086] like Figure 4 As shown, the filtering subunit 203 in the integration and comparison unit 21 includes a resistor R3 and a capacitor C1. Port B of the filtering subunit 203 is connected to the digital-to-analog converter unit 12 and is used to receive a sinusoidal voltage signal. The filtering subunit 203 filters the sinusoidal voltage signal through the resistor R3 and capacitor C1.

[0087] The voltage divider subunit 202 in the integral comparator unit 21 includes resistors R1 and R2. Port A of the integral comparator unit 21 is connected to the servo zero-stability module 50 and is used to receive the zero-stability voltage signal.

[0088] The integration comparison subunit 201 in the integration comparison unit 21 includes an amplifier U1, a resistor R4, and a capacitor C2. In the integration comparison unit 21, the non-inverting input of amplifier U1 is connected to the output of the voltage divider subunit 202. The inverting input of amplifier U1 is connected to both the output of the filter subunit 203 and, through port C of the integration comparison subunit 201, to the output of the feedback module 30 to receive the feedback voltage signal. The output port D of amplifier U1 is connected to the input of the transistor driver unit 22 for outputting the integration comparison signal.

[0089] The parameters of capacitor C2 in the integral comparison subunit 201 affect the feedback degree of the waveform of the secondary voltage signal of the test square 40, and also affect the degree of correction and oscillation of the integral comparison signal.

[0090] Specifically, when there is no sinusoidal voltage signal input at port B of the integrator / comparator unit 21, the power amplifier voltage signal output by the subsequent power amplifier unit 23 has a zero-point bias voltage. Then, the servo zero-stabilization module 50 acquires the power amplifier voltage signal output by the power amplifier unit 23, performs servo feedback and amplification on the zero-point bias voltage in the power amplifier voltage signal, and applies it to port A of the integrator / comparator unit 21. The integrator / comparator unit 21 rapidly amplifies the signal through capacitor C2 until no current flows through C2, thereby forcing the zero point of the power amplifier voltage signal to disappear.

[0091] When a sinusoidal voltage signal is input to port B of the integration and comparison unit 21, the integration and comparison subunit 201 quickly amplifies the signal and then processes it through the transistor driver unit 22, power amplifier unit 23, and transformer 60 before outputting it to the test circle 40. Then, the feedback module 30 acquires the secondary voltage signal of the test circle 40. After processing by the feedback module 30, it outputs a feedback voltage signal to port C. The integration and comparison unit 21 compares the feedback voltage signal with the sinusoidal voltage signal at port B. Until no current flows through capacitor C2, the waveform of the secondary voltage signal of the test circle 40 is the same as the waveform of the sinusoidal voltage signal input to port B.

[0092] Please see Figure 5 , Figure 5 This is a schematic diagram of the feedback module provided in an embodiment of the present invention.

[0093] In some embodiments, the feedback module 30 includes: a first filtering unit 301, a proportional amplification unit 302, and a high-frequency noise filtering unit 303. The first filtering unit 301 is used to connect to the secondary voltage signal. The first filtering unit 301 is connected to the proportional amplification unit 302, and the proportional amplification unit 302 outputs a feedback voltage signal through the high-frequency noise filtering unit 303.

[0094] When testing silicon steel samples using a test ring, the primary winding N1 of the test ring 40 outputs a sinusoidal signal. However, due to the presence of copper resistance and inductance, the waveform of the secondary voltage signal of the test ring 40 is not sinusoidal. The feedback module 30 acquires the secondary voltage signal of the test ring 40, amplifies it to an appropriate level, and then feeds it back to the integration and comparison unit 21. This matches the waveform of the secondary voltage signal of the test ring 40 with the waveform of the sinusoidal voltage signal output by the digital-to-analog converter unit 12, causing the waveform of the power amplifier voltage signal output by the power amplifier unit 23 to be distorted, thereby maintaining the consistency between the waveform of the secondary voltage signal and the waveform of the sinusoidal voltage signal.

[0095] Please see Figure 6 , Figure 6 This is a schematic diagram of the circuit structure of the feedback module provided in an embodiment of the present invention.

[0096] like Figure 6 As shown, the first filtering unit 301 in the feedback module 30 includes resistors R5, R6, R7, R8, and R9, and capacitors C3, C4, and C5. Ports E and F of the first filtering unit 301 are connected to the secondary winding of the test coil 40, respectively, for receiving the secondary voltage signal from the test coil 40. The first filtering unit 301 filters the secondary voltage signal through resistors R5 and R6, and capacitors C3 and C5.

[0097] The proportional amplifier unit 302 in the feedback module 30 includes a resistor R10 and an amplifier U2. The proportional amplifier unit 302 proportionally amplifies the filtered secondary voltage signal. The amplifier U2 can be an AD8421A amplifier.

[0098] The high-frequency noise filtering unit 303 includes a resistor R11 and a capacitor C6. Port C of the high-frequency noise filtering unit 303 is connected to port C of the integration comparator subunit 201 and is used to output a feedback voltage signal. The high-frequency noise filtering unit 303 filters out high-frequency noise in the secondary voltage signal through the resistor R11 and capacitor C6, thereby reducing the possibility of oscillation.

[0099] Please refer to the following for details. Figure 2 , Figure 4 , Figure 6 and Figure 8When the waveform of the secondary voltage signal in test circle 40 is inconsistent with the waveform of the sinusoidal voltage signal output by digital-to-analog converter unit 12, it is necessary to adjust capacitor C2 in integration comparison unit 21, resistors R10 and R11 and capacitor C6 in feedback module 30, and capacitor C9 in servo zero-stabilization module 50. A balance needs to be struck between the degree of oscillation and the degree of sinusoidality in the waveform of the secondary voltage signal. Reducing the capacitance of capacitor C2, the resistance of resistor R10, the resistance of resistor R11, and the capacitance of capacitor C6, while increasing the capacitance of capacitor C9, can ensure that the waveform of the secondary voltage signal is closer to the waveform of the sinusoidal voltage signal, but it is also more prone to oscillation; the reverse is also true.

[0100] This invention provides a magnetic property measuring device 100, which includes a measurement control module 10, an integrating amplification module 20, a feedback module 30, and a test coil 40. The integrating amplification module 20 is connected to the measurement control module 10, the primary winding of the test coil 40, and the feedback module 30. The feedback module 30 is connected to the secondary winding of the test coil 40. The measurement control module 10 is connected to both the primary and secondary windings. The feedback module 30 acquires the secondary voltage signal of the test coil 40 and generates a feedback voltage signal based on the secondary voltage signal. The measurement control module 10 generates a sinusoidal voltage signal. The integrating amplification module 20 compares the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal. The measurement control module 10 further acquires the secondary voltage signal and the primary current signal of the test coil 40 when the comparison result shows that the waveform of the feedback voltage signal matches the waveform of the sinusoidal voltage signal, and obtains the magnetic property measurement result based on the primary current signal and the secondary voltage signal. In this embodiment of the invention, the secondary voltage signal of the test square is corrected by the feedback module 30 and the integral amplification module 20 to obtain more accurate magnetic property measurement results.

[0101] Please see Figure 9 , Figure 9 This is a flowchart illustrating a magnetic property measurement method provided in an embodiment of the present invention. The magnetic property measurement method is applied to the magnetic property measurement device described above. The magnetic property measurement device includes: a measurement control module, an integrating amplification module, a feedback module, and a test coil. The integrating amplification module is connected to the measurement control module, the primary winding of the test coil, and the feedback module, respectively. The feedback module is connected to the secondary winding of the test coil, and the measurement control module is connected to both the primary and secondary windings. The magnetic property measurement method includes the following steps:

[0102] Step S1: Obtain the secondary voltage signal of the test square and generate a feedback voltage signal based on the secondary voltage signal.

[0103] Step S2: Compare the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal generated by the measurement control module, and obtain the comparison result.

[0104] Step S3: When the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, acquire the primary current signal and secondary voltage signal of the test square, and obtain the magnetic performance measurement result based on the primary current signal and secondary voltage signal.

[0105] Please see Figure 10 , Figure 10 This is a schematic flowchart of another magnetic property measurement method provided in an embodiment of the present invention.

[0106] In some embodiments, the magnetic property measurement method further includes the following steps:

[0107] Step S4: When the comparison result shows that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, obtain the adjustment parameters of the integral amplifier module and the adjustment parameters of the feedback module.

[0108] The adjustment parameters of the integral amplification module and the feedback module can be set by the R&D personnel or automatically set by electronic devices such as the measurement control module.

[0109] Step S5: Obtain the secondary voltage signal of the test square according to the adjustment parameters of the integral amplification module and the feedback module, and generate a feedback voltage signal based on the secondary voltage signal.

[0110] Step S6: Compare the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal generated by the measurement control module, and obtain the comparison result. If the comparison result shows that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, execute step S4 until the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal.

[0111] Specifically, as described in the embodiment of the magnetic performance measuring device, when the waveform of the secondary voltage signal of the test square 40 is inconsistent with the waveform of the sinusoidal voltage signal output by the digital-to-analog converter unit 12, it is necessary to adjust the capacitor C2 of the integration comparison unit 21, the resistors R10 and R11 and the capacitor C6 of the feedback module 30, and the capacitor C9 of the servo zero-stabilization module 50. Therefore, the adjustment parameters of the amplification module include the capacitance of capacitor C2, and the adjustment parameters of the feedback module include the resistance values ​​of resistors R10 and R11 and the capacitance of capacitor C6.

[0112] In some embodiments, the adjustment parameters of the servo zero-stabilization module can be obtained to make the output of the adjustment power discharge voltage signal DC zero. The adjustment parameters of the servo zero-stabilization module include the capacitance of capacitor C9.

[0113] The magnetic property measurement method provided in this invention first acquires the secondary voltage signal of a test ring and generates a feedback voltage signal based on the secondary voltage signal. Then, the waveform of the feedback voltage signal is compared with the waveform of a sinusoidal voltage signal generated by a measurement control module, and the comparison result is obtained. Finally, when the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, the primary current signal and secondary voltage signal of the test ring are acquired, and the magnetic property measurement result is obtained based on the primary current signal and secondary voltage signal. When the comparison result shows that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, the adjustment parameters of the integrating amplification module and the feedback module are acquired to make the waveform of the feedback voltage signal consistent with the waveform of the sinusoidal voltage signal. This invention improves the accuracy of magnetic property measurement by comparing the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal through the integrating amplification module and the feedback module, and by acquiring the adjustment parameters of the integrating amplification module and the feedback module when the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, thereby making the waveform of the feedback voltage signal consistent with the waveform of the sinusoidal voltage signal.

[0114] It should be noted that the above-described magnetic property measurement method is applied to the magnetic property measurement device provided in the embodiments of the present invention, and the magnetic property measurement device has the corresponding functional modules and beneficial effects for performing the method. Technical details not described in detail in the embodiments of the magnetic property measurement method can be found in the magnetic property measurement device provided in the embodiments of the present invention.

[0115] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, and not to limit them; under the concept of the present invention, the technical features of the above embodiments or different embodiments can also be combined, the steps can be implemented in any order, and there are many other variations of different aspects of the present invention as described above, which are not provided in detail for the sake of brevity; although the present invention has been described in detail with reference to the foregoing embodiments, those skilled in the art should understand that modifications can still be made to the technical solutions described in the foregoing embodiments, or equivalent substitutions can be made to some of the technical features; and these modifications or substitutions do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of this application.

Claims

1. A magnetic property measuring device, characterized in that, The magnetic property measuring device includes: Measurement and control module, integral amplification module, feedback module, servo zero-stabilization module, and test square; The integral amplification module is connected to the measurement control module, the servo zero-stabilization module, the primary winding of the test coil, and the feedback module, respectively. The feedback module is connected to the secondary winding of the test coil, and the measurement control module is connected to both the primary winding and the secondary winding. The integral amplification module includes an integral comparison unit, a transistor driving unit, and a power amplification unit. The servo zero-stabilization module is connected to the power amplification unit and the integral comparison unit respectively. The integral comparison unit is also connected to the measurement control module and the transistor driving unit respectively. The power amplification unit is also connected to the transistor driving unit and the primary winding of the test coil respectively. The servo zero-stabilization module includes: a high-frequency filtering unit, a servo integration unit, a secondary amplification unit, and a filter feedback unit; the servo integration unit is connected to the high-frequency filtering unit and the secondary amplification unit respectively, and the secondary amplification unit is also connected to the filter feedback unit; The feedback module is used to acquire the secondary voltage signal of the test square and generate a feedback voltage signal based on the secondary voltage signal. The measurement and control module is used to generate a sinusoidal voltage signal; The integration comparison unit is used to compare the waveform of the feedback voltage signal and the waveform of the sinusoidal voltage signal, and outputs an integration comparison signal to the transistor driving unit according to the feedback voltage signal and the sinusoidal voltage signal; the transistor driving unit outputs a driving signal to the power amplification unit according to the integration comparison signal; the power amplification unit outputs a power amplifier voltage signal to the primary winding of the test coil according to the driving signal. The high-frequency filtering unit is used to acquire the power amplifier voltage signal output by the power amplifier unit, and the filtering feedback unit is used to output a stable zero voltage signal to the integration and comparison unit according to the power amplifier voltage signal, so that the output of the power amplifier unit is DC zero. The measurement control module is further configured to, when the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, acquire the secondary voltage signal and the primary current signal of the test square, and acquire the magnetic performance measurement result based on the primary current signal and the secondary voltage signal.

2. The magnetic property measuring device according to claim 1, characterized in that, The feedback module includes: a first filtering unit, a proportional amplification unit, and a high-frequency noise filtering unit; The first filtering unit is used to connect to the secondary voltage signal. The first filtering unit is connected to the proportional amplification unit, and the proportional amplification unit outputs the feedback voltage signal through the high-frequency noise filtering unit.

3. The magnetic property measuring device according to claim 2, characterized in that, The integral comparison unit includes a filtering subunit, a voltage divider subunit, and an integral comparison subunit; The filtering subunit is used to connect to the sinusoidal voltage signal, the voltage divider subunit is used to connect to the zero-stable voltage signal, the integral comparator subunit is connected to the filtering subunit, the integral comparator subunit and the feedback module, and the integral comparator subunit is also connected to the transistor driving unit; The integral comparison subunit is used to send an integral comparison signal to the transistor driving unit based on the sinusoidal voltage signal, the feedback voltage signal, and the zero-stability voltage signal.

4. The magnetic property measuring device according to any one of claims 1-3, characterized in that, The magnetic performance measuring device further includes: a transformer, the primary winding of which is connected to the power amplification unit, and the secondary winding of which is connected to the primary winding of the test coil.

5. The magnetic property measuring device according to claim 4, characterized in that, The measurement and control module includes a control unit, a digital-to-analog converter, an analog-to-digital converter, a signal conditioning unit, and a sampling resistor; The control unit sends a sinusoidal voltage signal to the integrating amplifier module through the digital-to-analog converter unit; The signal conditioning unit obtains the primary current signal of the test coil through a sampling resistor connected to the primary winding of the test coil. The signal conditioning unit is also connected to the secondary winding of the test coil to obtain the secondary voltage signal of the test coil, and sends a conditioning current signal and a conditioning voltage signal to the analog-to-digital conversion unit according to the primary current signal and the secondary voltage signal. The analog-to-digital conversion unit is connected to the signal conditioning unit and is used to convert the conditioning current signal and the conditioning voltage signal into digital voltage signal and digital current signal; The control unit is connected to the analog-to-digital conversion unit and is used to obtain the magnetic property measurement results based on the digital voltage signal and the digital current signal.

6. A method for measuring magnetic properties, characterized in that, The magnetic property measuring device as described in any one of claims 1-5 includes: a measurement control module, an integration amplification module, a feedback module, and a test coil. The integration amplification module is connected to the measurement control module, the primary winding of the test coil, and the feedback module. The feedback module is connected to the secondary winding of the test coil. The measurement control module is connected to the primary winding and the secondary winding. The magnetic property measurement method includes: Acquire the secondary voltage signal of the test square, and generate a feedback voltage signal based on the secondary voltage signal; Compare the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal generated by the measurement and control module, and obtain the comparison result; When the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal, the primary current signal and the secondary voltage signal of the test circle are acquired, and the magnetic performance measurement result is obtained based on the primary current signal and the secondary voltage signal. When the comparison result shows that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, the adjustment parameters of the integral amplifier module and the adjustment parameters of the feedback module are obtained, and the adjustment parameters of the servo zero-stabilization module are also obtained, so that the output of the adjusted power discharge voltage signal is DC zero.

7. The magnetic property measurement method according to claim 6, characterized in that, When the comparison result indicates that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, the method further includes: The secondary voltage signal of the test square is obtained according to the adjustment parameters of the integral amplification module and the adjustment parameters of the feedback module, and a feedback voltage signal is generated according to the secondary voltage signal. Compare the waveform of the feedback voltage signal with the waveform of the sinusoidal voltage signal generated by the measurement and control module, and obtain the comparison result; When the comparison result shows that the waveform of the feedback voltage signal is inconsistent with the waveform of the sinusoidal voltage signal, the step of obtaining the adjustment parameters of the integral amplifier module and the adjustment parameters of the feedback module is executed until the comparison result shows that the waveform of the feedback voltage signal is consistent with the waveform of the sinusoidal voltage signal.

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