A method, apparatus and related device for mist detection

Abstract

The application provides an atomization detection method and device and related equipment, wherein the method comprises: detecting a reference light signal emitted by a reference device in a target reaction furnace at a current time to obtain detection signal data; determining an optical attenuation parameter according to the difference between the detection signal data and reference signal data corresponding to the reference light signal, wherein the optical attenuation parameter is used to represent the light energy attenuation amplitude of the reference light signal; in the case that the optical attenuation parameter is greater than or equal to an optical attenuation threshold, determining an adjustment parameter according to the optical attenuation parameter and a pre-set conversion coefficient; and adjusting the input amount of the input raw material of the target reaction furnace according to the adjustment parameter. Compared with the manual inspection method, the above-mentioned automatic detection and treatment method of the atomization condition can avoid the interference of human factors and improve the detection effect of the target reaction furnace in the atomization monitoring aspect.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of polysilicon production, in particular to a mist detection method and device and related equipment. BACKGROUND

[0002] The polysilicon reduction process is a key link in the production process, and the reduction workshop includes multiple reduction furnaces. In order to detect the reaction condition in each reduction furnace in a timely manner, on-site personnel need to regularly patrol and observe the furnace clarity, and judge whether there is a mist problem in the reduction furnace according to the observation and past experience.

[0003] It is found in applications that the above-mentioned manual inspection method for monitoring the mist condition in the reduction furnace is greatly disturbed by human factors, and is prone to misjudgment or omission of the mist condition, that is, the related technology has poor detection effect on the mist condition in the reaction furnace. SUMMARY

[0004] The purpose of the embodiments of the present application is to provide a mist detection method, device and related equipment, which can solve the problem of poor detection effect when monitoring the mist condition in the reaction furnace in the related technology.

[0005] In a first aspect, the embodiments of the present application provide a mist detection method, which comprises:

[0006] detecting a reference light signal emitted by a reference device in a target reaction furnace at a current time to obtain detection signal data;

[0007] determining an optical decay parameter according to the difference between the detection signal data and reference signal data corresponding to the reference light signal, wherein the optical decay parameter is used to represent the light energy attenuation amplitude of the reference light signal;

[0008] in a case where the optical decay parameter is greater than or equal to an optical decay threshold, determining an adjustment parameter according to the optical decay parameter and a pre-set conversion coefficient;

[0009] adjusting the input amount of input raw materials of the target reaction furnace according to the adjustment parameter.

[0010] Optionally, after adjusting the input amount of input raw materials of the target reaction furnace according to the adjustment parameter, the method further comprises:

[0011] obtaining a first optical decay value corresponding to the reference light signal emitted by the reference device at a first detection time, and a second optical decay value corresponding to the reference light signal emitted by the reference device at a second detection time;

[0012] determining the difference between the first optical decay value and the second optical decay value as an optical decay change parameter;

[0013] generate a atomization alarm in a case that the light attenuation change parameter is less than or equal to a change threshold, the atomization alarm being used to indicate a position of the target reaction furnace.

[0014] Optionally, after the atomization alarm is generated, the method further comprises:

[0015] obtaining a manual adjustment instruction;

[0016] adjusting an input amount of an input raw material of the target reaction furnace according to the manual adjustment instruction.

[0017] Optionally, before the reference light signal emitted by the reference device in the target reaction furnace at the current time is detected to obtain the detection signal data, the method further comprises:

[0018] detecting a reference light signal emitted by the reference device at an initial time to obtain test signal data;

[0019] updating the reference signal data according to the test signal data.

[0020] Optionally, before the reference light signal emitted by the reference device in the target reaction furnace at the current time is detected to obtain the detection signal data, the method further comprises:

[0021] sending a detection instruction to the reference device, so that the reference device emits the reference light signal based on the detection instruction.

[0022] In a second aspect, an embodiment of the present application further provides an atomization detection device, the device comprising:

[0023] a signal detection module configured to detect a reference light signal emitted by a reference device in a target reaction furnace at a current time to obtain detection signal data;

[0024] a light attenuation calculation module configured to determine a light attenuation parameter according to a difference between the detection signal data and reference signal data corresponding to the reference light signal, wherein the light attenuation parameter is used to represent an amplitude of light energy attenuation of the reference light signal;

[0025] a parameter adjustment determination module configured to determine an adjustment parameter according to the light attenuation parameter and a preset conversion coefficient in a case that the light attenuation parameter is greater than or equal to a light attenuation threshold.

[0026] an adjustment module configured to adjust an input amount of an input raw material of the target reaction furnace according to the adjustment parameter.

[0027] Optionally, the device further comprises:

[0028] The acquisition module is configured to acquire a first light attenuation value corresponding to a reference light signal emitted by the reference device at a first detection time and a second light attenuation value corresponding to a reference light signal emitted by the reference device at a second detection time.

[0029] The determination module is configured to determine a difference between the first light attenuation value and the second light attenuation value as a light attenuation change parameter.

[0030] The alarm module is configured to generate a fogging alarm in a case where the light attenuation change parameter is less than or equal to a change threshold, the fogging alarm being used to indicate a position of the target reaction furnace.

[0031] Optionally, the device further comprises:

[0032] The instruction receiving module is configured to acquire a manual adjustment instruction.

[0033] The instruction response module is configured to adjust an input amount of an input raw material of the target reaction furnace according to the manual adjustment instruction.

[0034] In a third aspect, an embodiment of the present application further provides an electronic device, including a processor, a memory, and a computer program stored in the memory and executable on the processor, and the computer program is executed by the processor to implement the steps of the fogging detection method.

[0035] In a fourth aspect, an embodiment of the present application further provides a computer readable storage medium, and the computer readable storage medium stores a computer program, and the computer program is executed by a processor to implement the steps of the fogging detection method.

[0036] In the embodiment of the present application, the reference device is arranged in the target reaction furnace, the detection signal data of the reference light signal emitted by the reference device is collected, and the difference between the detection signal data and the reference signal data is compared to determine the light attenuation parameter of the target reaction furnace at the current time. In a case where the light attenuation parameter is greater than or equal to the light attenuation threshold, it is determined that there is a fogging condition in the target reaction furnace. The conversion coefficient is applied to process the obtained light attenuation parameter to determine the adjustment parameter for adjusting the input amount of the input raw material of the target reaction furnace, so as to suppress the fogging condition in the target reaction furnace. Compared with the manual inspection mode, the application of the above-mentioned automatic detection of the fogging condition and the processing mode can avoid the interference of human factors and improve the detection effect of the target reaction furnace in the fogging monitoring aspect. BRIEF DESCRIPTION OF DRAWINGS

[0037] Figure 1 is a flowchart of a fogging detection method provided by an embodiment of the present application;

[0038] Figure 2is a structural schematic diagram of an atomization detection device provided by an embodiment of the present application.

[0039] Figure 3 is a structural schematic diagram of an electronic device provided by an embodiment of the present application. DETAILED DESCRIPTION

[0040] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the drawings in the embodiments of the present application. Obviously, the described embodiments are some of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all other embodiments obtained by those of ordinary skill in the art without creative work fall within the scope of the present application.

[0041] An atomization detection method is provided by an embodiment of the present application, referring to Figure 1 , Figure 1 is a flowchart of the atomization detection method provided by an embodiment of the present application, as shown in Figure 1 , comprising the following steps:

[0042] Step 101: detecting a reference light signal emitted by a reference device in a target reaction furnace at a current time to obtain detection signal data.

[0043] There are multiple reaction furnaces in the reduction workshop, that is, multiple silicon rod reduction furnaces, and the target reaction furnace can be understood as any one of the multiple reaction furnaces; it should be noted that for the multiple reaction furnaces, at least one reference device is arranged in each reaction furnace.

[0044] For example, the reference device can be an infrared emitter arranged in the target reaction furnace.

[0045] At least one inspection robot is arranged in the reduction workshop, and the inspection robot sequentially inspects the multiple reaction furnaces in the reduction workshop according to a pre-set inspection route. When the inspection robot moves to an inspection position of the target reaction furnace (i.e., a position at which a signal receiving assembly carried by the inspection robot is opposite to a sight glass of the target reaction furnace), the inspection robot receives a reference light signal emitted by the reference device in the target reaction furnace at a current time, and forms detection signal data based on the actually received light signal, wherein the detection signal data at least includes light energy of the received light signal of the inspection robot.

[0046] It should be noted that in addition to arranging at least one inspection robot in the reduction workshop, a central control server is also arranged, and the central control server is in communication connection with the inspection robot and constitutes an inspection system; the inspection robot uploads multiple detection signal data detected in the inspection process to the central control server for storage and data processing.

[0047] Step 102, determining an optical attenuation parameter according to a difference between the detection signal data and reference signal data corresponding to the reference light signal.

[0048] The optical attenuation parameter is used to represent an optical energy attenuation amplitude of the reference light signal.

[0049] The reference signal data at least includes optical energy of the reference light signal when the reference light signal is emitted. During the transmission of the reference light signal, the optical energy of the reference light signal will gradually attenuate due to the interference of the silicon powder in the target reaction furnace. As the dispersion degree of the silicon powder in the target reaction furnace increases, the optical energy attenuation amplitude of the reference light signal will also increase. Therefore, by using the characteristic that the optical energy attenuation amplitude of the reference light signal is positively correlated with the dispersion degree of the silicon powder in the target reaction furnace, the dispersion degree of the silicon powder in the target reaction furnace can be indirectly determined by calculating the optical attenuation parameter.

[0050] The determination of the optical attenuation parameter can be performed by the inspection robot or the central control server. In applications, the central control server is preferably used to calculate the optical attenuation parameter to reduce the energy consumption of the inspection robot and prolong the service life of the inspection robot.

[0051] Step 103, determining an adjustment parameter according to the optical attenuation parameter and a preset conversion coefficient when the optical attenuation parameter is greater than or equal to an optical attenuation threshold value.

[0052] As described above, when the optical attenuation parameter is greater than or equal to the optical attenuation threshold value, it indicates that the dispersion degree of the silicon powder in the target reaction furnace exceeds the critical standard. At this time, it can be determined that the atomization condition exists in the target reaction furnace. In this case, the adjustment parameter for regulating the input amount of the input raw material of the target reaction furnace can be obtained by multiplying the optical attenuation parameter and the conversion coefficient.

[0053] It should be noted that when the atomization condition exists, the input amount of the silicon material in the target reaction furnace can be reduced to handle the atomization condition. Therefore, the conversion coefficient should be understood as a correlation coefficient between the optical energy attenuation amplitude of the reference light signal and the reduction amplitude of the input amount of the silicon material. The conversion coefficient can be obtained by fitting the correlation between the reduction amplitude of the input amount of the silicon material and the optical energy attenuation amplitude under different atomization conditions. The aforementioned silicon material can be understood as trichlorosilane.

[0054] Step 104, adjusting the input amount of the input raw material of the target reaction furnace according to the adjustment parameter.

[0055] The process of step 104 can be to reduce the input amount of the silicon material of the target reaction furnace based on the reduction amplitude of the input amount of the silicon material indicated by the adjustment parameter, for example, to reduce the input amount of trichlorosilane in the target reaction furnace by 200 kg / h.

[0056] It should be noted that the above adjustment operation can be performed by the central control server issuing a first control instruction to the inspection robot, and the inspection robot executing the first control instruction; or the central control server issuing a second control instruction to the control component of the input raw material of the target reaction furnace, and the control component executing the second control instruction.

[0057] As described above, by setting a reference device in the target reaction furnace, collecting detection signal data of the reference light signal emitted by the reference device, and comparing the difference between the detection signal data and the reference signal data to determine the light attenuation parameter of the target reaction furnace at the current time, if the light attenuation parameter is greater than or equal to the light attenuation threshold, it can be determined that there is a fogging condition in the target reaction furnace. By applying the conversion coefficient to process the obtained light attenuation parameter, the adjustment parameter for adjusting the input amount of the input raw material of the target reaction furnace is determined to suppress the fogging condition in the target reaction furnace. Compared with the manual inspection method, the above-mentioned automatic detection and treatment method of the fogging condition can avoid the interference of human factors and improve the detection effect of the target reaction furnace in the fogging monitoring aspect.

[0058] Optionally, after adjusting the input amount of the input raw material of the target reaction furnace according to the adjustment parameter, the method further comprises:

[0059] obtaining a first light attenuation value corresponding to the reference light signal emitted by the reference device at a first detection time, and a second light attenuation value corresponding to the reference light signal emitted by the reference device at a second detection time;

[0060] determining the difference between the first light attenuation value and the second light attenuation value as a light attenuation change parameter;

[0061] if the light attenuation change parameter is less than or equal to a change threshold, generating a fogging alarm, the fogging alarm being used to indicate the position of the target reaction furnace.

[0062] As described above, after determining that there is a fogging condition in the target reaction furnace and disposing the fogging device in the target reaction furnace based on the preset logic, i.e., adjusting the input amount of the input raw material of the target reaction furnace according to the adjustment parameter, in order to observe whether the control means effectively solves the fogging condition in the target reaction furnace, the inspection robot will stay at the inspection position of the target reaction furnace for a preset time (for example, 1 minute, 3 minutes, etc.). During the staying process, the inspection robot will obtain the reference light signal emitted by the reference device at the first detection time and form first signal data, and the reference light signal emitted by the reference device at the second detection time and form second signal data.

[0063] The first light attenuation value can be determined by comparing the difference between the first signal data and the reference signal data, i.e., the light energy attenuation amplitude of the reference light signal emitted by the reference device at the first detection time; similarly, the second light attenuation value can be determined by comparing the difference between the second signal data and the reference signal data, i.e., the light energy attenuation amplitude of the reference light signal emitted by the reference device at the second detection time.

[0064] It should be noted that the first detection time and the second detection time are any two different times within the preset time.

[0065] The difference between the first light attenuation value and the second light attenuation value is determined as the light attenuation change parameter. If the light attenuation change parameter is less than or equal to the change threshold, it indicates that the improvement effect of the atomization condition of the target reaction furnace after adjustment is not good, so the inspection personnel are instructed to go to the target reaction furnace for manual disposal by generating an atomization alarm. If the light attenuation change parameter is greater than the change threshold, it indicates that the improvement effect of the atomization condition of the target reaction furnace after adjustment meets the expectation, so the inspection robot will leave the inspection position of the target reaction furnace and sequentially inspect the plurality of reaction furnaces based on the preset inspection program.

[0066] It should be noted that in application, the atomization alarm can be implemented by at least one of the following measures: buzzer buzzing, indicator light on, indicator light blinking, voice broadcast, etc., and the embodiments of the present application do not limit this.

[0067] Optionally, after the atomization alarm is generated, the method further comprises:

[0068] Obtaining a manual adjustment instruction;

[0069] Adjusting the input amount of the input raw material of the target reaction furnace according to the manual adjustment instruction.

[0070] As mentioned above, after the atomization alarm is generated, the inspection robot will collect the visible light image in the target reaction furnace in real time, and feed the collected visible light image to the central control server. The staff can view the aforementioned visible light image through the display component of the central control server, and determine the subsequent atomization disposal process based on the atomization problem displayed in the image. After the central control server receives the manual adjustment instruction input by the staff, the central control server will issue the manual adjustment instruction to the control component of the input raw material of the target reaction furnace, so that the control component responds to the manual adjustment instruction and completes the adjustment of the input amount of the input raw material of the target reaction furnace. The above measures can improve the timeliness of manual disposal and reduce the work intensity of the staff.

[0071] After the misting problem of the target reaction furnace is handled, the worker inputs a recovery inspection instruction to make the inspection robot leave the inspection position of the target reaction furnace and sequentially inspect the plurality of reaction furnaces based on a preset inspection program.

[0072] Optionally, before the detection of the reference light signal emitted by the reference device in the reaction furnace at the current time to obtain the detection signal data, the method further comprises:

[0073] detecting the reference light signal emitted by the reference device at the initial time to obtain the test signal data;

[0074] updating the reference signal data according to the test signal data.

[0075] As described above, before the target reaction furnace performs a single silicon reduction reaction, the test signal data can be collected, and the reference signal data is updated using the test signal data to adapt to the light energy attenuation caused by the mirror blurring or the light energy attenuation caused by the reference device failure in actual application, so as to ensure that the subsequent obtained light attenuation parameter has high accuracy.

[0076] It should be pointed out that the initial time and the current time are located in the time period of the same silicon reduction reaction. That is, preferably, before performing a silicon reduction reaction, a test signal data is obtained, and the latest test signal data obtained is applied as the reference signal data to ensure that each calculated light attenuation parameter has high accuracy.

[0077] Optionally, before the detection of the reference light signal emitted by the reference device in the reaction furnace at the current time to obtain the detection signal data, the method further comprises:

[0078] sending a detection instruction to the reference device to make the reference device emit the reference light signal based on the detection instruction.

[0079] As described above, the emission action of the reference light signal of the reference device is controlled by the inspection robot or the central control server to adapt to the situation that the inspection time of the inspection robot to each reaction furnace is not fixed in actual application, that is, only when the inspection robot is located at the inspection position of the target reaction furnace, the reference device emits the reference light signal. This not only avoids the problem that the inspection time of the inspection robot does not match the emission time of the reference light signal of the reference device, but also greatly reduces the number of times of emitting the reference light signal of the reference device, thereby reducing the energy consumption of the reference device and prolonging the service life of the reference device.

[0080] Referring to Figure 2 , Figure 2 is a structural schematic diagram of the misting detection device 200 provided by the embodiment of the application, as shown in Figure 2As shown, the atomization detection device 200 comprises:

[0081] a signal detection module 201, configured to detect a reference light signal emitted by a reference device in a target reaction furnace at a current time to obtain detection signal data;

[0082] a light attenuation calculation module 202, configured to determine a light attenuation parameter according to a difference between the detection signal data and reference signal data corresponding to the reference light signal, wherein the light attenuation parameter is used to represent a light energy attenuation amplitude of the reference light signal;

[0083] a parameter adjustment determination module 203, configured to determine an adjustment parameter according to the light attenuation parameter and a preset conversion coefficient in a case where the light attenuation parameter is greater than or equal to a light attenuation threshold value;

[0084] an adjustment module 204, configured to adjust an input amount of an input raw material of the target reaction furnace according to the adjustment parameter.

[0085] Optionally, the device 200 further comprises:

[0086] an acquisition module, configured to acquire a first light attenuation value corresponding to a reference light signal emitted by the reference device at a first detection time and a second light attenuation value corresponding to a reference light signal emitted by the reference device at a second detection time;

[0087] a determination module, configured to determine a difference between the first light attenuation value and the second light attenuation value as a light attenuation change parameter;

[0088] an alarm module, configured to generate an atomization alarm in a case where the light attenuation change parameter is less than or equal to a change threshold value, wherein the atomization alarm is used to indicate a position of the target reaction furnace.

[0089] Optionally, the device 200 further comprises:

[0090] an instruction receiving module, configured to acquire a manual adjustment instruction;

[0091] an instruction response module, configured to adjust the input amount of the input raw material of the target reaction furnace according to the manual adjustment instruction.

[0092] Optionally, the device 200 further comprises:

[0093] a preliminary detection module, configured to detect a reference light signal emitted by the reference device at an initial time to obtain test signal data;

[0094] an update module, configured to update the reference signal data according to the test signal data.

[0095] Optionally, the device 200 further comprises:

[0096] The instruction issuing module is configured to send a detection instruction to the reference device, so that the reference device issues the reference light signal based on the detection instruction.

[0097] The atomization detection device 200 provided by the embodiments of the present application can implement each process in the method embodiments, and thus details are not described herein again.

[0098] Please refer to Figure 3 , Figure 3 is a structural schematic diagram of an electronic device provided by the embodiments of the present application, as shown in Figure 3 The electronic device can include a processor 301, a memory 302, and a program 3021 stored in the memory 302 and executable on the processor 301.

[0099] The program 3021, when executed by the processor 301, can implement Figure 1 any step in the corresponding method embodiments and achieve the same beneficial effects, and thus details are not described herein again.

[0100] Those skilled in the art can understand that all or part of the steps of the method embodiments described above can be completed by a program instructing related hardware, and the program can be stored in a readable medium.

[0101] The embodiments of the present application also provide a readable storage medium, and the readable storage medium stores a computer program, and the computer program, when executed by a processor, can implement Figure 1 any step in the corresponding method embodiments and achieve the same technical effects, and thus details are not described herein again.

[0102] The computer readable storage medium of the embodiments of the present application can adopt any combination of one or more computer readable media. The computer readable medium can be a computer readable signal medium or a computer readable storage medium. The computer readable storage medium may, for example, be an electronic, magnetic, optical, electromagnetic, infrared, or semiconductor system, device or apparatus, or any combination thereof. More specific examples (non-exhaustive list) of the computer readable storage medium include an electrical connection having one or more wires, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or flash memory), an optical fiber, a portable compact disk read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination thereof. In this document, the computer readable storage medium can be any tangible medium containing or storing a program that can be used by or in conjunction with an instruction execution system, device or apparatus.

[0103] A computer readable signal medium can include a propagated data signal with computer executable instructions. A propagated signal can be an electromagnetic signal, an optical signal, and / or any other suitable type of signal. A computer readable storage medium can include any non-transitory medium that can be read by a computer. Examples of non-transitory storage media include magnetic disks, optical disks, random access memory, solid state RAM, cache, and / or any other suitable type of storage medium. Computer readable storage media can be used to store data that is accessible by a computer, such as computer readable instructions, data structures, program modules, and / or other data.

[0104] The program code embodied on the storage medium can be transmitted by any programmed medium including by way of example wireless, wireline, optical fiber cable, RF, etc., or any combination thereof.

[0105] The computer program code can also be implemented in one or more computer programs or one or more modules that execute on or in conjunction with the various hardware components, such as a processing unit an input device, and / or an output device.

[0106] The foregoing is a summary and thus by necessity contains simplifications, generalizations and omissions of detail. Consequently, the summary is intended to be illustrative only and not restrictive. It is intended to cover all alternatives, modifications and equivalents.​

Claims

1. A method for detecting atomization, characterized in that, The method includes: The reference light signal emitted by the reference device inside the target reactor at the current moment is detected to obtain the detection signal data; the target reactor is a silicon rod reduction furnace. The optical attenuation parameter is determined based on the difference between the detected signal data and the reference signal data corresponding to the reference optical signal, wherein the optical attenuation parameter is used to characterize the optical energy attenuation magnitude of the reference optical signal; If the light decay parameter is greater than or equal to the light decay threshold, the adjustment parameter is determined based on the light decay parameter and the preset conversion coefficient; Based on the adjustment parameters, the input amount of the raw materials to the target reactor is adjusted; After adjusting the input amount of the raw material to the target reactor according to the adjustment parameters, the method further includes: The first optical attenuation value corresponding to the reference optical signal emitted by the reference device at the first detection time and the second optical attenuation value corresponding to the reference optical signal emitted by the reference device at the second detection time are obtained. The difference between the first light decay value and the second light decay value is determined as the light decay change parameter; If the light decay change parameter is less than or equal to the change threshold, a fogging alarm is generated, which is used to indicate the location of the target reactor.

2. The method according to claim 1, characterized in that, After generating the fogging alarm, the method further includes: Receive manual adjustment instructions; According to the manual adjustment instruction, the input amount of the raw materials to the target reactor is adjusted.

3. The method according to claim 1, characterized in that, Before detecting the reference optical signal emitted by the reference device inside the target reactor at the current moment and obtaining the detection signal data, the method further includes: The reference light signal emitted by the reference device at the initial moment is detected to obtain test signal data; The reference signal data is updated based on the test signal data.

4. The method according to claim 1, characterized in that, Before detecting the reference optical signal emitted by the reference device inside the target reactor at the current moment and obtaining the detection signal data, the method further includes: A detection command is sent to the reference device, so that the reference device emits the reference light signal based on the detection command.

5. An atomization detection device, characterized in that, The device includes: The signal detection module is used to detect the reference light signal emitted by the reference device in the target reactor at the current moment and obtain the detection signal data; the target reactor is a silicon rod reduction furnace. The optical attenuation calculation module is used to determine optical attenuation parameters based on the difference between the detected signal data and the reference signal data corresponding to the reference optical signal, wherein the optical attenuation parameters are used to characterize the optical energy attenuation magnitude of the reference optical signal; The parameter adjustment determination module is used to determine the adjustment parameters based on the optical attenuation parameter and a preset conversion coefficient when the optical attenuation parameter is greater than or equal to the optical attenuation threshold. An adjustment module is used to adjust the input amount of the raw materials to the target reactor according to the adjustment parameters. The device further includes: The acquisition module is used to acquire the first light attenuation value corresponding to the reference light signal emitted by the reference device at the first detection time, and the second light attenuation value corresponding to the reference light signal emitted by the reference device at the second detection time. The determining module is used to determine the difference between the first light decay value and the second light decay value as the light decay change parameter; An alarm module is used to generate a fogging alarm when the light decay change parameter is less than or equal to a change threshold. The fogging alarm is used to indicate the location of the target reactor.

6. The apparatus according to claim 5, characterized in that, The device further includes: The instruction receiving module is used to receive manual adjustment instructions; The instruction response module is used to adjust the input amount of the raw materials to the target reactor according to the manual adjustment instruction.

7. An electronic device, characterized in that, It includes a processor, a memory, and a computer program stored in the memory and executable on the processor, wherein the computer program, when executed by the processor, implements the steps of the atomization detection method as described in any one of claims 1 to 4.

8. A readable storage medium, characterized in that, The readable storage medium stores a computer program, which, when executed by a processor, implements the steps of the atomization detection method as described in any one of claims 1 to 4.

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