Display device, sensorless compensation system and data compression and application method

Abstract

A display device, a sensorless compensation system, and a method for compressing and applying data are disclosed. A method for compressing and applying data of a sensorless compensation system can be provided for a display device having sub-pixels. Since the system can update the accumulated stress data of the sub-pixels accumulated according to the display drive data signal in real time and perform compensation, real-time compensation for degradation of the sub-pixels can be performed without sensing the sub-pixels. In addition, when the accumulated stress data is lossily compressed, since the system can provide bit size information for recovery according to the comparison result of the data subjected to lossy compression with the loss reference value, the loss rate of the lossy compressed data can be reduced.

Description

Technical Field

[0001] The present disclosure relates to devices and methods, and more particularly to, for example but not limited to, a display device, a sensorless compensation system, and a method for compressing data of the sensorless compensation system. Background Art

[0002] The development of the information society has led to an increase in demand for display devices that display images and the use of various types of display devices, such as liquid crystal display devices, organic light emitting display devices, and other types of display devices.

[0003] The display device may include a display panel provided with a plurality of sub-pixels and various driving circuits for driving the plurality of sub-pixels. In addition, at least one circuit element may be provided on each of the plurality of sub-pixels.

[0004] As the driving time of the display device increases, degradation of the circuit elements provided in the sub-pixels may occur. In addition, the degradation degrees of the circuit elements provided in different sub-pixels may be different from each other.

[0005] In the case where the degrees of degradation of circuit elements provided in different sub-pixels are different from each other, a driving deviation (or variation) between sub-pixels may occur, and display quality may be degraded due to the driving deviation between sub-pixels.

[0006] Therefore, there is a need for a method of preventing degradation of display quality due to degradation of a circuit element provided in a sub-pixel and variation (or deviation) in degradation between circuit elements provided in different sub-pixels.

[0007] The description provided in the discussion of the background section should not be considered to be the only prior art because it is mentioned in or related to this section. The discussion of the background section may include information describing one or more aspects of the subject technology. Summary of the invention

[0008] The inventors of the present disclosure have recognized the problems and disadvantages of the related art and have conducted extensive research and experiments. Therefore, the inventors of the present disclosure have invented a new method that substantially eliminates one or more problems caused by limitations and disadvantages of the related art.

[0009] One or more example embodiments of the present disclosure may provide a method of compensating for degradation of a circuit element provided in a sub-pixel of a display panel in real time.

[0010] One or more example embodiments of the present disclosure may provide a method of reducing a loss rate when compressing accumulated stress data of a circuit element, and compressing and storing the accumulated stress data.

[0011] One or more example embodiments of the present disclosure may provide a display device, comprising: a plurality of sub-pixels, in which a light-emitting element and a driving transistor for driving the light-emitting element are provided; a data driving circuit, configured to provide a data voltage to each of the plurality of sub-pixels; and a degradation management circuit, configured to calculate accumulated stress data of each of the plurality of sub-pixels, classify and compress the accumulated stress data into a first type of data that is losslessly compressed and a second type of data that is losslessly compressed, and provide bit size information for recovery that matches the lossy compressed data.

[0012] One or more example embodiments of the present disclosure may provide a non-sensing compensation system for a device having a data driving circuit and a plurality of sub-pixels. The non-sensing compensation system includes: a data signal output unit configured to receive an image data signal, generate a driving data signal based on the image data signal and compensation data, and output the driving data signal to the data driving circuit; and a degradation management unit configured to calculate cumulative stress data updated based on input stress data corresponding to the driving data signal and pre-stored cumulative stress data, lossily compress a portion of the updated cumulative stress data, and provide bit size information for recovery that matches the lossy compressed data. The data driving circuit may provide a data voltage to a sub-pixel among the plurality of sub-pixels based on a second driving data signal. The data voltage provided to the sub-pixel may be based on the updated cumulative stress data.

[0013] One or more example embodiments of the present disclosure may provide a method for compressing data of a senseless compensation system and applying it to a device having a plurality of sub-pixels. The method includes the following steps: classifying the accumulated stress data into a first type of data for lossless compression and a second type of data for lossy compression; comparing the second type of data with a loss reference value determined based on the first type of data; and generating bit size information for recovery that matches the lossy compressed data according to the comparison result of the second type of data with the loss reference value. A data voltage generated based on the accumulated stress data may be provided to drive a sub-pixel in a plurality of sub-pixels.

[0014] According to various example embodiments of the present disclosure, degradation of a circuit element provided in a sub-pixel of a display panel may be compensated in real time based on accumulated stress data of each of the sub-pixels.

[0015] According to various example embodiments of the present disclosure, since bit size information for restoration is provided according to a comparison result of lossy compressed data and a loss reference value when compressing accumulated stress data, a loss rate of lossy compressed data may be reduced.

[0016] Additional features, advantages, and aspects of the present disclosure are set forth in part in the following description, and in part will become apparent from the present disclosure, or may be learned by practicing the inventive concepts provided herein. Other features, advantages, and aspects of the present disclosure may be realized and obtained by the description provided in the present disclosure or that may be derived from the present disclosure, the claims of the present disclosure, and the accompanying drawings. It is intended that all of these features, advantages, and aspects are included in this specification, within the scope of the present disclosure, and protected by the appended claims. Nothing in this section shall be construed as a limitation on these claims. Other aspects and advantages are discussed below in conjunction with the embodiments of the present disclosure.

[0017] It is to be understood that both the foregoing description and the following description of the present disclosure are exemplary and explanatory and are intended to provide further explanation of the disclosure as claimed. BRIEF DESCRIPTION OF THE DRAWINGS

[0018] The accompanying drawings, which are included to provide a further understanding of the present disclosure, are included in and constitute a part of the present disclosure, illustrate embodiments of the present disclosure, and together with the description, serve to explain the principles of the present disclosure. In the drawings:

[0019] Figure 1 is a diagram schematically illustrating a configuration of a display device according to an exemplary embodiment of the present disclosure;

[0020] Figure 2A and Figure 2B is a diagram illustrating an example of a circuit structure of a sub-pixel included in a display device according to an exemplary embodiment of the present disclosure;

[0021] Figure 3 is a diagram illustrating a schematic configuration of a sensorless compensation system according to an example embodiment of the present disclosure;

[0022] Figure 4 is a diagram illustrating an example of real-time compensation by a sensorless compensation system according to an example embodiment of the present disclosure;

[0023] Figure 5 is a diagram illustrating a schematic configuration of a degradation management unit of a sensorless compensation system according to an example embodiment of the present disclosure;

[0024] Figure 6 is a diagram illustrating an example of processing of compressive accumulated stress data of a sensorless compensation system according to an example embodiment of the present disclosure;

[0025] Figure 7 is a diagram illustrating an example of a process in which a sensorless compensation system according to an exemplary embodiment of the present disclosure performs lossless compression and lossy compression;

[0026] Figure 8 is a diagram illustrating an example of a process in which a sensorless compensation system performs lossy compression according to an example embodiment of the present disclosure;

[0027] Fig. 9 is a diagram illustrating an example of lossy compressed data on which the sensorless compensation system performs lossy compression and restored data on which the lossy compressed data is restored according to an exemplary embodiment of the present disclosure; and

[0028] Fig.10 is a diagram illustrating an example of a process in which the sensorless compensation system updates accumulated stress data according to an example embodiment of the present disclosure. DETAILED DESCRIPTION

[0029] Reference is now made in detail to embodiments of the present disclosure, examples of which may be illustrated in the accompanying drawings. In the following description, detailed descriptions of well-known functions or configurations may be omitted when they may unnecessarily obscure aspects of the present disclosure. The described progression of processing steps and / or operations are examples; however, the order of steps and / or operations is not limited to the order set forth herein and may vary, except for steps and / or operations that must occur in a specific order.

[0030] Unless otherwise specified, the same reference numerals always refer to the same elements even if they are shown in different figures. In one or more aspects, the same elements (or elements with the same names) in different figures may have the same or substantially the same functions and characteristics unless otherwise specified. The names of the elements used in the following description are selected for convenience only and may therefore differ from the names used in the actual product.

[0031] The advantages and features of the present disclosure and their implementation methods are explained by referring to the embodiments described in the accompanying drawings. However, the present disclosure can be implemented in different forms and should not be interpreted as being limited to the embodiments described herein. On the contrary, these embodiments are provided to make the present disclosure clear and complete and to fully convey the scope of the present disclosure to those skilled in the art. In addition, the present disclosure is limited only by the claims and their equivalents.

[0032] The shapes, sizes, areas, ratios, angles, numbers and the like disclosed in the drawings for describing the embodiments of the present disclosure are merely examples, and thus the present disclosure is not limited to the details shown.

[0033] When the terms "comprising," "having," "including," "containing," "consisting of," "composed of," "formed of," etc. are used, one or more other elements may be added, unless terms such as "only" are used. The terms used in this disclosure are only for describing specific embodiments and are not intended to limit the scope of the disclosure. Unless the context clearly indicates otherwise, terms in the singular may include plural forms. The word "exemplary" is used to mean used as an example or illustration. Any implementation described herein as an "example" is not necessarily to be construed as being preferred or advantageous over other implementations.

[0034] In one or more aspects, elements, features, or corresponding information (e.g., levels, ranges, dimensions, sizes, etc.) are interpreted as including such errors or tolerance ranges even if no explicit description of the error or tolerance range is provided. The error or tolerance range may be caused by various factors (e.g., process factors, internal or external impacts, noise, etc.). In addition, the term "may" fully encompasses all meanings of the term "can".

[0035] When describing a positional relationship, in the case where, for example, "on", "above", "under", "above", "under", "below", "near", "close to", or "adjacent", "beside", "near the", etc. are used to describe the positional relationship between two parts, one or more other parts may be located between the two parts, unless more restrictive terms such as "immediately", "directly", or "close to" are used. For example, when a structure is described as being positioned "on", "above", "below", "under", "below", "below", or "close to", "close to", or "adjacent" another structure or "beside" or "near" another structure, the description should be interpreted as including situations in which the structures are in contact with each other and situations in which one or more additional structures are disposed or interposed therebetween. In addition, the terms "front", "back", "rear", "left", "right", "top", "bottom", "downward", "upward", "upper", "lower", "above", "below", "column", "row", "vertical", "horizontal", etc. refer to an arbitrary reference system.

[0036] When describing temporal relationships, when the time order is described as, for example, "after", "subsequently", "next", "before", "previous", "before...", etc., incoherent or discontinuous situations may be included, unless more restrictive terms such as "just", "immediately" or "directly" are used.

[0037] It should be understood that although the terms "first", "second", etc. may be used herein to describe various elements, these elements should not be limited by these terms. These terms are only used to distinguish one element from another element. For example, without departing from the scope of the present disclosure, the first element may be the second element, and similarly, the second element may be the first element. In addition, without departing from the scope of the present disclosure, the first element, the second element, etc. can be arbitrarily named according to the convenience of those skilled in the art. The terms "first", "second", etc. can be used to distinguish components from each other, but the function or structure of the component is not limited by the ordinal number or component name in front of the component.

[0038] When describing elements of the present disclosure, terms such as "first", "second", "A", "B", "(a)", "(b)", etc. may be used. These terms are intended to identify corresponding elements relative to other elements, and these terms are not used to define the nature, basis, order or number of the elements.

[0039] Regarding the statement that an element or layer is “connected,” “coupled,” or “adhered” to another element or layer, unless otherwise stated, the element or layer may not only be directly connected, coupled, or adhered to the other element or layer but also be indirectly connected, coupled, or adhered to the other element or layer with one or more intermediate elements or layers disposed or interposed therebetween.

[0040] When an element or layer is “contacted,” “overlapped,” etc. with another element or layer, the element or layer may not only be directly in contact with, overlapped, etc. with the other element or layer, but may also be indirectly in contact with, overlapped, etc. with the other element or layer with one or more intermediate elements or layers disposed or interposed between the elements or layers.

[0041] The term "at least one" should be understood to include any and all combinations of one or more of the related listed items. For example, the meaning of "at least one of the first, second, and third items" indicates a combination of items proposed from two or more of the first, second, and third items and only one of the first, second, or third items.

[0042] The expression of the first element, the second element “and / or” the third element should be understood as one of the first element, the second element, and the third element, or any or all combinations of the first element, the second element, and the third element. For example, A, B, and / or C may refer to only A; only B; only C; any one or some combination of A, B, and C; or all of A, B, and C.

[0043] In one or more aspects, unless otherwise specified, the terms "between" and "among" may be used interchangeably for convenience. For example, the expression "between a plurality of elements" may be understood as among a plurality of elements. In another example, the expression "among a plurality of elements" may be understood as between a plurality of elements. In one or more examples, the number of elements may be two. In one or more examples, the number of elements may be more than two.

[0044] In one or more aspects, unless otherwise specified, the terms "each other" and "mutually" may be used interchangeably for convenience. For example, the expression "different from each other" may be understood as different from each other. In another example, the expression "different from each other" may be understood as different from each other. In one or more examples, the number of elements involved in the above statements may be two. In one or more examples, the number of elements involved in the above statements may be more than two.

[0045] The features of the various embodiments of the present disclosure may be partially or completely connected or combined with each other, and may be mutually operated, linked or driven together in different ways. The embodiments of the present disclosure may be performed independently of each other, or may be performed together in a mutually dependent or related relationship. In one or more aspects, the components of each device according to the various embodiments of the present disclosure may be operationally connected and configured.

[0046] Unless otherwise defined, the terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art to which the exemplary embodiments belong. It should also be understood that terms such as those defined in commonly used dictionaries should be interpreted as having, for example, a meaning consistent with their meaning in the context of the relevant art, and should not be interpreted as an idealized or overly formal meaning unless otherwise explicitly defined herein. For example, the term "portion" may apply to, for example, a separate circuit or structure, an integrated circuit, a computing block of a circuit device, or any structure configured to perform a described function, as should be understood by one of ordinary skill in the art.

[0047] Hereinafter, various exemplary embodiments of the present disclosure will be described in detail with reference to the accompanying drawings. For ease of description, the proportions, dimensions, sizes, and thicknesses of each of the elements illustrated in the accompanying drawings may be different from the actual proportions, dimensions, sizes, and thicknesses, and therefore the embodiments of the present disclosure are not limited to the proportions, dimensions, sizes, and thicknesses illustrated in the accompanying drawings.

[0048] Figure 1 1 is a diagram schematically illustrating a configuration of a display device 100 according to an exemplary embodiment of the present disclosure. All components of the display device 100 according to all embodiments of the present disclosure are operatively connected and configured.

[0049] Reference Figure 1 The display device 100 may include a display panel 110 , and a gate driving circuit 120 , a data driving circuit 130 , and a controller 140 for driving the display panel 110 .

[0050] The display panel 110 may include an active area AA where a plurality of sub-pixels SP are disposed and a non-active area NA located outside the active area AA.

[0051] A plurality of gate lines GL and a plurality of data lines DL may be arranged on the display panel 110. A plurality of sub-pixels SP may be located in a region where the gate lines GL and the data lines DL cross each other.

[0052] The gate driving circuit 120 is controlled by the controller 140 and sequentially outputs scan signals to a plurality of gate lines GL arranged on the display panel 110 , thereby controlling driving timing of a plurality of sub-pixels SP.

[0053] The gate driving circuit 120 may include one or more gate driver integrated circuits GDIC, and may be located only on one side of the display panel 110, or may be located on both sides of the display panel 110 according to a driving method.

[0054] Each gate driver integrated circuit GDIC may be connected to a bonding pad of the display panel 110 by a tape automated bonding TAB method or a chip on glass COG method. Alternatively, each gate driver integrated circuit GDIC may be implemented by a gate in panel GIP method and then directly arranged on the display panel 110. Alternatively, the gate driver integrated circuit GDIC may be integrated and arranged on the display panel 110. Alternatively, each gate driver integrated circuit GDIC may be implemented by a chip on film COF method in which components are mounted on a film connected to the display panel 110.

[0055] The data driving circuit 130 may receive image data from the controller 140 and convert the image data into an analog data voltage Vdata. Then, the data driving circuit 130 outputs the data voltage Vdata to each data line DL according to the timing of applying a scan signal through the gate line GL, so that each of the plurality of sub-pixels SP emits light having a brightness according to the image data.

[0056] The data driving circuit 130 may include one or more source driver integrated circuits SDIC.

[0057] Each source driver integrated circuit SDIC may include a shift register, a latch circuit, a digital-to-analog converter, an output buffer, and the like.

[0058] Each source driver integrated circuit SDIC may be connected to a bonding pad of the display panel 110 by a tape automated bonding TAB method or a chip on glass COG method. Alternatively, each source driver integrated circuit SDIC may be directly disposed on the display panel 110. Alternatively, the source driver integrated circuit SDIC may be integrated and arranged on the display panel 110. Alternatively, each source driver integrated circuit SDIC may be implemented by a chip on film COF method. In this case, each source driver integrated circuit SDIC may be mounted on a film connected to the display panel 110, and may be electrically connected to the display panel 110 by wiring on the film.

[0059] The controller 140 may provide various control signals to the gate driving circuit 120 and the data driving circuit 130 , and may control operations of the gate driving circuit 120 and the data driving circuit 130 .

[0060] The controller 140 may be mounted on a printed circuit board, a flexible printed circuit board, or the like, and may be electrically connected to the gate driving circuit 120 and the data driving circuit 130 through the printed circuit board, the flexible printed circuit board, or the like.

[0061] The controller 140 may allow the gate driving circuit 120 to output a scan signal according to the timing implemented in each frame. The controller 140 may convert a data signal received from the outside to conform to a data signal format used in the data driving circuit 130, and then output the converted image data to the data driving circuit 130.

[0062] The controller 140 may receive various timing signals including a vertical synchronization signal VSYNC, a horizontal synchronization signal HSYNC, an input data enable DE signal, a clock signal CLK, etc., and image data from the outside (eg, a host system).

[0063] The controller 140 may generate various control signals using various timing signals received from the outside, and may output the control signals to the gate driving circuit 120 and the data driving circuit 130 .

[0064] For example, in order to control the gate driving circuit 120 , the controller 140 may output various gate control signals GCS including a gate start pulse GSP, a gate shift clock GSC, a gate output enable signal GOE, and the like.

[0065] The gate start pulse GSP may control the operation start timing of one or more gate driver integrated circuits GDIC constituting the gate driving circuit 120. The gate shift clock GSC is a clock signal commonly input to one or more gate driver integrated circuits GDIC, which may control the shift timing of the scan signal. The gate output enable signal GOE may specify timing information about one or more gate driver integrated circuits GDIC.

[0066] In addition, in order to control the data driving circuit 130 , the controller 140 may output various data control signals DCS including a source start pulse SSP, a source sampling clock SSC, a source output enable signal SOE, and the like.

[0067] The source start pulse SSP may control the data sampling start timing of one or more source driver integrated circuits SDIC constituting the data driving circuit 130. The source sampling clock SSC may be a clock signal for controlling the timing of sampling data in each source driver integrated circuit SDIC. The source output enable signal SOE may control the output timing of the data driving circuit 130.

[0068] The display device 100 may further include a power management integrated circuit for providing various voltages or currents to the display panel 110, the gate driving circuit 120, the data driving circuit 130, etc., or controlling various voltages or currents to be provided to the display panel 110, the gate driving circuit 120, the data driving circuit 130, etc.

[0069] Each sub-pixel SP may be a region defined by the intersection of the gate line GL and the data line DL, and at least one circuit element including a light emitting element may be disposed on the sub-pixel SP.

[0070] For example, when the display device 100 is an organic light emitting display device, the organic light emitting diode OLED and various circuit elements may be provided in a plurality of sub-pixels SP. By controlling the current supplied to the organic light emitting diode OLED by the various circuit elements, each sub-pixel may generate (or represent) brightness corresponding to image data.

[0071] Alternatively, in some cases, a light emitting diode LED or a micro light emitting diode μLED may be provided in the sub-pixel SP.

[0072] Figure 2A and Figure 2B is a diagram illustrating an example of a circuit structure of a sub-pixel SP included in the display device 100 according to an exemplary embodiment of the present disclosure.

[0073] Reference Figure 2A and Figure 2B, a light emitting element ED and a driving transistor DRT for driving the light emitting element ED may be provided in the sub-pixel SP. In addition, at least one circuit element other than the light emitting element ED and the driving transistor DRT may be provided in the sub-pixel SP.

[0074] For example, Figure 2A As illustrated in FIG. 1 , a switching transistor SWT and a storage capacitor Cstg may also be provided in the sub-pixel SP.

[0075] For another example, Figure 2B As illustrated in FIG. 1 , a switching transistor SWT, a sensing transistor SENT, and a storage capacitor Cstg may also be provided in the sub-pixel SP.

[0076] So, as an example, Figure 2A It is illustrated that two thin film transistors and one capacitor (which may be referred to as a 2T1C structure) in addition to the light emitting element ED are provided in the sub-pixel SP. Figure 2B It is illustrated that three thin film transistors and one capacitor (which may be referred to as a 3T1C structure) in addition to the light emitting element ED are provided in the sub-pixel SP, but the embodiments of the present disclosure are not limited thereto.

[0077] also, Figure 2A and Figure 2B The example shown in exemplifies that all thin film transistors are of N type, but in some cases, the thin film transistors provided in the sub-pixel SP may be of P type.

[0078] Reference Figure 2A The switch transistor SWT may be electrically connected between the data line DL and the first node N1. The data voltage Vdata may be provided to the sub-pixel SP through the data line DL. The first node N1 may be a gate node of the driving transistor DRT.

[0079] The switching transistor SWT may be controlled by a scan signal supplied to the gate line GL. The switching transistor SWT may provide control such that a data voltage Vdata supplied through the data line DL is applied to a gate node of the driving transistor DRT.

[0080] The driving transistor DRT may be electrically connected between the driving voltage line DVL and the light emitting element ED.

[0081] The second node N2 of the driving transistor DRT may be electrically connected to the light emitting element ED. The second node N2 may be a source node or a drain node of the driving transistor DRT.

[0082] The third node N3 of the driving transistor DRT may be electrically connected to the driving voltage line DVL. The third node N3 may be a drain node or a source node of the driving transistor DRT. The first driving voltage EVDD may be provided to the third node N3 of the driving transistor DRT through the driving voltage line DVL. The first driving voltage EVDD may be a high potential driving voltage.

[0083] The driving transistor DRT may be controlled by a voltage applied to the first node N1. The driving transistor DRT may control a driving current supplied to the light emitting element ED.

[0084] The storage capacitor Cstg may be electrically connected between the first node N1 and the second node N2. The storage capacitor Cstg may maintain the data voltage Vdata applied to the first node N1 during one frame.

[0085] The light emitting element ED may be electrically connected between the second node N2 and a line providing a second driving voltage EVSS. The second driving voltage EVSS may be a low potential driving voltage.

[0086] The light emitting element ED may generate (or indicate) brightness according to a driving current supplied through the driving transistor DRT.

[0087] In this regard, the sub-pixel SP may further include a switching transistor SWT in addition to the driving transistor DRT, and may generate (or represent) brightness according to image data by driving the light emitting element ED.

[0088] Alternatively, if Figure 2B As illustrated, the sub-pixel SP may further include a sensing transistor SENT.

[0089] The sensing transistor SENT may be electrically connected between a reference voltage line RVL and a second node N2. A reference voltage Vref may be provided to the second node N2 through the reference voltage line RVL.

[0090] The sensing transistor SENT may be controlled by a scan signal supplied to the gate line GL. The gate line GL controlling the sensing transistor SENT may be the same as or different from the gate line GL controlling the switching transistor SWT.

[0091] The sensing transistor SENT may control the reference voltage Vref to be applied to the second node N2. In addition, the sensing transistor SENT may control sensing the voltage of the second node N2 through the reference voltage line RVL in some cases.

[0092] In this regard, in a structure in which a sensing transistor SENT is further provided in the sub-pixel SP, the brightness according to the image data can be generated (or indicated) by controlling the driving of the light-emitting element ED. In addition, the change of the characteristic value of the circuit element provided in the sub-pixel SP can be detected by the sensing transistor SENT and the reference voltage line RVL.

[0093] In order for the sub-pixel SP to generate (or represent) brightness according to image data, the driving transistor DRT and the light emitting element ED need to be accurately controlled. However, as the driving time increases, the characteristic value of the driving transistor DRT or the light emitting element ED may change due to degradation.

[0094] For example, the threshold voltage or mobility of the driving transistor DRT may vary. In addition, the threshold voltage of the light emitting element ED may vary.

[0095] Due to the variation of the characteristic values ​​of the driving transistor DRT and the light emitting element ED, variation (or deviation) of the characteristic values ​​between the sub-pixels SP may occur. The variation (or deviation) of the characteristic values ​​between the sub-pixels SP may affect the quality of the image generated (or represented) by the display panel 110.

[0096] When the sensing transistor SENT and the reference voltage line RVL are set in the subpixel SP, the change of the characteristic value of the subpixel SP can be sensed by the reference voltage line RVL and the change of the characteristic value can be compensated, but real-time compensation may be difficult due to the period required for sensing.

[0097] In addition, if Figure 2A As illustrated, in the case where the structure in which the reference voltage line RVL is not provided, it may be difficult to detect a change in the characteristic value of the sub-pixel SP.

[0098] One or more exemplary embodiments of the present disclosure provide a method for compensating in real time for changes in characteristic values ​​of circuit elements disposed in a sub-pixel SP and preventing degradation of display quality due to degradation of the circuit elements. In this regard, one or more exemplary embodiments of the present disclosure provide a sensorless compensation system (e.g., including Figure 3 The sensing-free compensation system can compensate for the change in the characteristic value of the circuit element in the sub-pixel SP without using the sensing transistor SENT or the reference voltage line RVL to sense or detect the change in the characteristic value of the circuit element in the sub-pixel SP. In one or more examples, the sensing-free compensation can compensate for the change in the characteristic value of the circuit element in the sub-pixel SP without sensing the sub-pixel SP to compensate for the change.

[0099] In one or more aspects of the present disclosure, the amount of change in the characteristic value of the sub-pixel SP may indicate (or may be) the amount of degradation of the sub-pixel SP. In addition, the amount of degradation of the sub-pixel SP may indicate (or may be) the amount of change in the characteristic value of at least one of the driving transistor DRT or the light-emitting element ED provided in the sub-pixel SP.

[0100] Figure 3 is a diagram illustrating a schematic configuration of a sensorless compensation system according to an example embodiment of the present disclosure. Figure 4 is a diagram illustrating an example of real-time compensation by a sensorless compensation system according to an example embodiment of the present disclosure.

[0101] Reference Figure 3 , the sensorless compensation system according to an example embodiment of the present disclosure may include a degradation management circuit 300 and a storage unit 400. At least one of the degradation management circuit 300 or the storage unit 400 may be included in the controller 140. Alternatively, at least one of the degradation management circuit 300 or the storage unit 400 may be provided outside the controller 140. Alternatively, in some cases, some of the components included in the degradation management circuit 300 and some of the components included in the storage unit 400 may be included in the controller 140.

[0102] The degradation management circuit 300 may include a data signal output unit 310 , a degradation compensator 320 , and a degradation management unit 330 .

[0103] The data signal output unit 310 may receive an image data signal from the outside. The data signal output unit 310 may output a driving data signal to the data driving circuit 130. The driving data signal may be generated by adding compensation data to the image data signal.

[0104] The data signal output unit 310 may check (or obtain) compensation data to be added to the image data signal using the degradation compensator 320 .

[0105] The degradation compensator 320 may determine a degree of degradation of a circuit element disposed in each of the plurality of sub-pixels SP based on the data stored in the storage unit 400. The degradation compensator 320 may check (or determine or obtain) a compensation value corresponding to the degree of degradation of the circuit element, and may output the compensation value to the data signal output unit 310.

[0106] The storage unit 400 may store data indicating a degree of degradation of a circuit element provided in each of the plurality of sub-pixels SP. In addition, the storage unit 400 may store data related to a compensation value corresponding to the degree of degradation.

[0107] For example, the storage unit 400 may include a first storage unit 410 and a second storage unit 420 .

[0108] The first storage unit 410 may store data related to the degradation degree of the circuit element accumulated in real time according to driving of the subpixel SP. The data stored in the first storage unit 410 and related to the real-time degradation degree of each subpixel SP may be referred to as accumulated stress data.

[0109] The second storage unit 420 may store compensation data corresponding to the accumulated stress data. The second storage unit 420 may store compensation data corresponding to the accumulated stress data using, for example, a lookup table.

[0110] The data signal output unit 310 may use the degradation compensator 320 to check (or determine or obtain) compensation data for the accumulated stress data of the sub-pixel SP, and may output a drive data signal to the data driving circuit 130, the drive data signal being a signal generated by adding the compensation data to the image data signal. In this regard, the drive data signal is based on the compensation data and the image data signal. In one aspect, the compensation data is reflected in the drive data signal, and the image data signal is reflected in the drive data signal.

[0111] The data driving circuit 130 may provide a data voltage Vdata to the sub-pixel SP according to the driving data signal. Therefore, the data voltage Vdata may be provided to the sub-pixel SP. In one or more aspects, compensation data according to the degradation degree of the sub-pixel SP is reflected in the data voltage Vdata. In one or more aspects, the data voltage Vdata is based on the degradation degree of the sub-pixel SP and the compensation data.

[0112] For example, Figure 4 As illustrated, if the accumulated stress data is a first stress value Vstr1, a driving data signal in which a first compensation value Vcomp1 corresponding to the first stress value Vstr1 is reflected may be input to the data driving circuit 130. If the accumulated stress data is a second stress value Vstr2, a driving data signal in which a second compensation data Vcomp2 corresponding to the second stress value Vstr2 is reflected may be input to the data driving circuit 130. In this regard, in one or more aspects, the driving data signal is based on the first compensation value Vcomp1 corresponding to the first stress value Vstr1. In one or more aspects, the driving data signal is based on the second compensation data Vcomp2 corresponding to the second stress value Vstr2.

[0113] The data driving circuit 130 may provide a data voltage Vdata in which compensation data according to the accumulated stress data of the sub-pixel SP is reflected in real time to the sub-pixel SP. In this regard, in one or more aspects, the data voltage Vdata is based on the compensation data according to the accumulated stress data of the sub-pixel SP. Deterioration of a circuit element provided in the sub-pixel SP may be compensated in real time, and driving of the sub-pixel SP may be performed.

[0114] In the process of driving the sub-pixel SP, the accumulated stress data of the sub-pixel SP may be updated in real time.

[0115] The degradation management unit 330 may receive the driving data signal output by the data signal output unit 310 .

[0116] Since the data voltage Vdata according to the driving data signal is supplied to the sub-pixel SP, degradation of the sub-pixel SP corresponding to the driving data signal may continue.

[0117] The degradation management unit 330 may update the accumulated stress data of the sub-pixel SP stored in the storage unit 400 according to the driving data signal.

[0118] Since the accumulated stress data of the sub-pixel SP is updated by the degradation management unit 330 during driving of the sub-pixel SP, information related to degradation of the circuit elements provided in the sub-pixel SP may be updated and managed in real time.

[0119] The degradation management unit 330 may compress and store at least some of the accumulated stress data of the sub-pixel SP.

[0120] Figure 5 is a diagram illustrating a schematic configuration of a degradation management unit 330 of a sensorless compensation system according to an example embodiment of the present disclosure.

[0121] Reference Figure 5 The degradation management unit 330 may include a decoding module 331 , a processing module 332 , and an encoding module 333 .

[0122] When driving of the sub-pixel SP is performed, the processing module 332 of the degradation management unit 330 may receive input stress data according to the driving of the sub-pixel SP. The input stress data may be data corresponding to the above-mentioned driving data signal, or data calculated based on the driving data signal.

[0123] The processing module 332 may update the accumulated stress data by adding the input stress data to the pre-stored accumulated stress data.

[0124] The pre-stored accumulated stress data may be stored in the storage unit 400 as compressed data.

[0125] The decoding module 331 may restore the pre-stored accumulated stress data in the storage unit 400 and output it to the processing module 332 .

[0126] The processing module 332 may generate updated cumulative stress data by adding the restored cumulative stress data to the input stress data. The processing module 332 may output the updated cumulative stress data to the encoding module 333.

[0127] The encoding module 333 may compress the updated accumulated stress data and store the compressed accumulated stress data in the storage unit 400 .

[0128] The encoding module 333 may losslessly compress at least some of the accumulated stress data. The encoding module 333 may losslessly compress at least some of the accumulated stress data.

[0129] Since the encoding module 333 performs lossless compression and lossy compression together, the storage efficiency of the accumulated stress data can be improved while minimizing the loss of the accumulated stress data.

[0130] Reference Figure 3 and Figure 5 In one or more aspects, the data signal output unit 310 may obtain compensation data based on (or corresponding to) the accumulated stress data of the sub-pixel SP. The accumulated stress data may sometimes be referred to as pre-stored accumulated stress data. The data signal output unit 310 may generate a drive data signal based on the image data signal and the compensation data for the sub-pixel SP. The data signal output unit 310 may provide the drive data signal to the data drive circuit 130. The data drive circuit 130 may generate a data voltage Vdata based on the drive data signal, and may provide the data voltage Vdata to the sub-pixel SP so as to drive the sub-pixel SP. In addition, the degradation management unit 330 may receive input stress data for the sub-pixel SP corresponding to the drive data signal, and may determine updated accumulated stress data for the sub-pixel SP based on the input stress data and the pre-stored accumulated stress data. The updated accumulated stress data may sometimes be referred to as updated accumulated stress data.

[0131] Thereafter, the operations of the data signal output unit 310 and the data driving circuit 130 described in the preceding paragraphs may be repeated using the updated cumulative stress data. That is, in this example, the data signal output unit 310 may obtain updated compensation data based on (or corresponding to) the updated cumulative stress data of the sub-pixel SP. The data signal output unit 310 may generate a second drive data signal based on the image data signal and the updated compensation data for the sub-pixel SP. The data signal output unit 310 may provide the second drive data signal to the data driving circuit 130. The data driving circuit 130 may generate a second data voltage Vdata based on the second drive data signal, and may provide the second data voltage Vdata to the sub-pixel SP so as to drive the sub-pixel SP.

[0132] In this regard, in one or more aspects, the data voltage Vdata for the sub-pixel SP may be based on a driving data signal for the sub-pixel SP. The driving data signal for the sub-pixel SP may be based on compensation data for the sub-pixel SP. The compensation data for the sub-pixel SP may be based on the accumulated stress data of the sub-pixel SP. Therefore, in one or more aspects, the data voltage Vdata may be generated based on the accumulated stress data of the sub-pixel SP.

[0133] In this regard, in one or more aspects, the second data voltage Vdata for the sub-pixel SP may be based on the second drive data signal for the sub-pixel SP. The second drive data signal for the sub-pixel SP may be based on the updated compensation data for the sub-pixel SP. The updated compensation data for the sub-pixel SP may be based on the updated cumulative stress data of the sub-pixel SP. Therefore, in one or more aspects, the second data voltage Vdata may be generated based on the updated cumulative stress data of the sub-pixel SP.

[0134] Figure 6 is a diagram illustrating an example of processing of compressive cumulative stress data of a sensorless compensation system according to an example embodiment of the present disclosure. Figure 7 is a diagram illustrating an example of a process in which a sensorless compensation system according to an example embodiment of the present disclosure performs lossless compression and lossy compression.

[0135] Reference Figure 6 At S600 , the encoding module 333 of the degradation management unit 330 may receive the updated accumulated stress data to compress the updated accumulated stress data.

[0136] The encoding module 333 may obtain data for lossless compression and data for lossy compression from the accumulated stress data. For example, at S610, the encoding module 333 may calculate average stress data to obtain data of each type. The average stress data may be a value obtained by dividing the accumulated stress data by the number of accumulations (e.g., the number of times the accumulation operation is performed).

[0137] At S620, the encoding module 333 may obtain first type data (which may be referred to as first type data) to be losslessly compressed from the average stress data. The first type data may be, for example, data obtained by cropping a portion of the average stress data.

[0138] At S621 , the encoding module 333 may losslessly compress the first type of data.

[0139] At S630 , the encoding module 333 may obtain second-type data (which may be referred to as second-type data) for lossy compression based on the average stress data and the first-type data, etc.

[0140] At S631, the encoding module 333 may compare the second type data with a loss reference level for lossy compression of the second type data. At S632, the encoding module 333 may quantize the second type data and generate bit size information for recovery for recovering the compressed second type data. At S633, the encoding module 333 may perform lossy compression on the quantized second type data.

[0141] At this point, the encoding module 333 can perform lossless compression and lossy compression on the accumulated stress data. Figure 8 and Fig. 9 An example of lossy compression performed by encoding module 33 is described below.

[0142] The encoding module 333 may store the losslessly compressed first type data and the lossily compressed second type data in the storage unit 400 .

[0143] In the process of updating the accumulated stress data, at S650 , the decoding module 331 may restore the compressed data.

[0144] At S651 , the processing module 332 may receive input stress data, and at S652 , the accumulated stress data may be updated by adding the input stress data to the recovered data.

[0145] Since lossless compression and lossy compression are performed, the storage efficiency of the accumulated stress data can be improved while minimizing the loss of the accumulated stress data. The degree of loss of lossy compressed data in the accumulated stress data can be determined according to a loss reference level. The loss reference level can be determined based on the data that is losslessly compressed.

[0146] Reference Figure 7 At S700, the encoding module 333 may receive X bits of accumulated stress data for compression. X may be a positive integer.

[0147] At S710, the encoding module 333 may obtain average stress data, which may be obtained by dividing the accumulated stress data by the number of accumulations. The average stress data may include, for example, an integer part and a decimal part.

[0148] At S720, the integer part included in the average stress data may be losslessly compressed. The integer part included in the average stress data may be regarded as first type data. The encoding module 333 may classify a certain number of sub-pixels SP into a block, and may extract a minimum value in the integer part of the average stress data included in a block. The encoding module 333 may extract a block rest based on the block minimum value, and obtain a bit size of the block rest.

[0149] At S730 , the encoding module 333 may use the above process to calculate the bit size required for lossless compression of the first type of data.

[0150] At S740, the encoding module 333 may calculate a bit margin based on the bit size used for lossless compression of the first type of data. The bit margin may indicate (or may be) a bit size that may be used for lossy compressed data.

[0151] At S750, the encoding module 333 may calculate a loss reference level based on the bit margin to quantize the second type data, and may use the calculated loss reference level to lossily compress the second type data. The encoding module 333 for obtaining the second type data may, for example, calculate the reconstruction data by multiplying the first type data and the accumulation number. The encoding module 333 may calculate a value obtained by subtracting the reconstruction data from the X-bit accumulated stress data as the second type data.

[0152] The loss reference level calculated by the encoding module 333 based on the bit margin may be constant according to (or within) a region. For example, the loss reference level for compressing the accumulated stress data of the sub-pixels SP disposed on the same line may be constant.

[0153] The accumulated stress data of the sub-pixel SP may be different according to the driving method of the sub-pixel SP, and there may be a deviation between the second type data obtained from the accumulated stress data and lossy compressed. Therefore, if lossy compression is performed by using the same loss reference level, the deviation of the loss rate may increase according to the size of the second type data.

[0154] Embodiments of the present disclosure may provide a method of reducing a loss rate when lossy compression is performed on second type data acquired from accumulated stress data.

[0155] Figure 8 is a diagram illustrating an example of a process in which a sensorless compensation system according to an example embodiment of the present disclosure performs lossy compression. Fig. 9 is a diagram illustrating an example of lossy compressed data on which a sensorless compensation system performs lossy compression and restored data on which the lossy compressed data is restored according to an exemplary embodiment of the present disclosure.

[0156] Reference Figure 8 At S800, when acquiring the second type of data from the accumulated stress data, the encoding module 333 may compare the second type of data with a loss reference value. The loss reference value may be a value calculated based on a loss reference level acquired in a process of losslessly compressing the first type of data acquired from the accumulated stress data. For example, the loss reference value may be 2^ (损失参考水平) .

[0157] At S810, when the second type data is equal to or greater than the loss reference value, the encoding module 333 may quantize the second type data based on the loss reference level. At S820, the encoding module 333 may lossily compress the second type data quantized based on the loss reference level. At S830, the decoding module 331 may perform recovery based on the lossy compressed data.

[0158] Since the second type data is greater than the loss reference value, even if the second type data is quantized based on the loss reference level and lossily compressed, the loss rate may not be large.

[0159] Therefore, if the second type data is equal to or greater than the loss reference value, by lossily compressing the second type data quantized based on the loss reference level, the compression efficiency can be improved while minimizing the loss rate.

[0160] At S811 , if the second type data is less than the loss reference value, the encoding module 333 may quantize the second type data based on the loss reference level and generate bit size information for restoration.

[0161] In the case where the second type data is less than the loss reference value, the second type data quantized based on the loss reference level may be “0.” Therefore, when lossy compression is performed, the loss rate may be large.

[0162] The encoding module 333 may generate bit size information for restoration when lossy compression is performed on the second type data smaller than the loss reference value to reduce the loss rate.

[0163] The bit size information for restoration may be determined based on the most significant bit of the second type data. The bit size information for restoration may be calculated based on the bit size of the second type data and the bit size of the loss reference value.

[0164] For example, when the bit size information for restoration is n, n may be equal to the bit size of the loss reference value - the bit size of the second type data + 1. In this example, n may be a positive integer.

[0165] When restoring the lossily compressed second type data, the bit size information for restoration may be used.

[0166] At S821 , the encoding module 333 may perform lossy compression on the second type of data quantized based on the loss reference level.

[0167] The bit size information for recovery may be stored in a separate space associated with the lossy compressed second type data. Alternatively, the bit size information for recovery may be stored in a specific space, such as a spare space of a header of a format of the lossy compressed second type data. The type of space in which the bit size information for recovery is stored and managed is not limited to a specific type, and the bit size information for recovery may be stored and managed in various types of spaces that may be used for recovery of the lossy compressed second type data.

[0168] At S831 , the decoding module 331 may restore the lossy-compressed second type data based on the bit size information for restoration and the loss reference value.

[0169] For example, the decoding module 331 may restore the lossy compressed second type data by shifting the loss reference value by bits according to the bit size information for restoration when restoring the lossy compressed second type data.

[0170] At this point, in the case of restoring the lossy compressed second type data, restoration can be performed by a value corresponding to the most significant bit of the second type data. Therefore, according to the quantization based on the loss reference level and the lossy compression, data output can be prevented from being "0" during restoration.

[0171] Fig. 9 A specific example of performing lossy compression differently according to a comparison result of the second type data and the loss reference value is illustrated.

[0172] Reference Fig. 9 , the size of the second type data to be lossily compressed may be different according to the area of ​​the display panel 110. At this point, the loss reference level applied to the corresponding area may be the same. For example, Q_level as the loss reference level may be constant to 11.

[0173] Case A illustrates an example of lossy compression of the second type data obtained from the accumulated stress data of the sub-pixels SP of the region with a large degree of degradation (eg, region A).

[0174] The second type data obtained from area A is 8187, and it may be greater than the loss reference value 2^ calculated based on the loss reference level 11. 11 Therefore, the second type data can be compressed into "0 0011", which is quantized based on the loss reference level 11. When restoring, the lossy compressed data "0 0011" and the loss reference value 2^ 11 Multiply to generate the recovered data.

[0175] Case B illustrates an example where the second type data acquired from region B is 2048. The second type data is equal to the loss reference value 2^ 11 , the second type of data can be quantized based on the loss reference level 11 such as case A. Therefore, the lossy compressed data in case B can be "0 0001". In addition, when restoring, the lossy compressed data "0 0001" and the loss reference value 2^ 11 Multiply to generate the recovered data.

[0176] Case C illustrates an example where the second type data acquired from region C is 831. Since the second type data is less than the loss reference value 2^ 11 , in the case of quantization based on the lossy reference level 11, the lossy compressed data may be “00000”.

[0177] In this case, bit size information for restoration for restoring the lossy compressed data "0 0000" may be generated.

[0178] The bit size information for restoration may be a value obtained by subtracting 10, which is the bit size of the second type data, from 11, which is the bit size of the loss reference value, and then adding 1. Therefore, the bit size information for restoration may be "2". The bit size information for restoration may indicate (or may be) a gap between the most significant bit of the loss reference value and the most significant bit of the second type data.

[0179] The bit size information for recovery may be included in a specific space of the format of the lossy compressed data, or may be stored in a separate space. And even in the case where the second type data is equal to or greater than the loss reference value, when the bit size information for recovery is provided in the same format, the bit size information for recovery in Case A and Case B may be "0".

[0180] In the case of case C, when the lossy compressed data is restored, the restored data may be generated based on the bit size information for restoration and the loss reference value. For example, in the case where the bit size information for restoration is 2, the restored data may be 2^ -2 *2^ Q_level Therefore, the restored data may be "512", and the degree of loss relative to the second type data 831 before compression may be reduced.

[0181] At this point, according to an exemplary embodiment of the present disclosure, when the second type data as a lossy compression object is compared with a loss reference value and bit size information for restoration is provided according to the comparison result, the loss rate can be reduced in lossy compression.

[0182] Furthermore, since restoration is performed by compensating for the prediction loss in the restoration process for updating the accumulated stress data, the loss occurring in the process of repeatedly compressing and restoring the accumulated stress data can be reduced.

[0183] Fig.10 is a diagram illustrating an example of a process in which the sensorless compensation system updates accumulated stress data according to an example embodiment of the present disclosure.

[0184] Reference Fig.10 When the input stress data occurs at time T, the processing module 332 may generate the cumulative stress data at time T by adding the input stress data at time T to the stored cumulative stress data at time T-1.

[0185] The processing module 332 may predict the loss of the accumulated stress data based on the current input stress data in the process of restoring the accumulated stress data at time T-1.

[0186] For example, the processing module 332 may compare the current input stress data at each time T-4, T-3, T-2, T-1 with the loss reference value. It can be seen that the processing module 332 may compare the bit size of the current input stress data with the loss reference level Q_level.

[0187] If the current input stress data is greater than the loss reference value, the processing module 332 may determine that the cumulative loss is equal to or greater than the minimum loss reference value. In this case, a carry of loss may occur.

[0188] When a loss of carry occurs, the processing module 332 can accumulate the input stress data for time T by adding 2^ Q_levelThe processing module 332 may generate the cumulative stress data at time T by adding the current input stress data to the cumulative stress data at time T-1 for performing the recovery.

[0189] Since the loss reference value is added to the cumulative stress data at time T-1 in the restoration process, compensation for the loss predicted in the cumulative stress data at time T-1 can be performed.

[0190] Therefore, in the process of updating the accumulated stress data, the loss caused by repeatedly compressing and restoring the accumulated stress data can be reduced.

[0191] For convenience, various example embodiments and aspects of the present disclosure are described below. These are provided as examples and do not limit the subject technology. Some of the examples described below are illustrated with respect to the drawings disclosed herein, which are only used for illustrative purposes and do not limit the scope of the subject technology.

[0192] In one or more examples, the expression lossless compressed data may refer to data that is compressed without loss of data. In one or more examples, the expression lossy compressed data may refer to data that is compressed with some loss of data due to the compression. For example, according to lossy compression, some bits of the data may be sheared, while the remaining bits of the data may be compressed. In one or more examples, lossy compression results in a greater amount of data loss than lossless compression.

[0193] In one or more examples, the host system may be a computer, a computer system, or a system having a processor. In one or more examples, the host system may not be included in the display panel 110. In one or more examples, the host system may be included in the display device 100. In some cases, the host system may not be included in the display device 100. In one or more examples, the host system does not include the controller 140. In one or more examples, the host system does not include the degradation management circuit 300 or the storage unit 400.

[0194] In one or more examples, the degradation management circuit 300 and / or its components may include (or may be) a processor that may be configured to execute code or instructions to perform the operations and functions described herein, and to perform calculations and generate commands. In one or more examples, each processing component of the degradation management circuit 300 (e.g., each of the data signal output unit 310, the degradation compensator 320, the degradation management unit 330, the decoding module 331, the processing module 332, and the encoding module 333) may include (or may be) a processor or one or more components of a processor. The processor of the degradation management circuit 300 and / or its components may be configured to monitor and / or control the operation of components in the display device 100.

[0195] The processor may be, for example, a general-purpose microprocessor, a microcontroller or a digital signal processor. The processor may be implemented using, for example, a dedicated integrated circuit, a field programmable gate array, a programmable logic device, a state machine, a logic gate or a component or some combination thereof.

[0196] One or more sequences of instructions may be stored in the degradation management circuit 300, the storage unit 400, and / or some of its components. The storage unit 400 may include, for example, one or more memories. One or more sequences of instructions may be software or firmware stored and read from the degradation management circuit 300, the storage unit 400, or some of its components (e.g., its processor) or received from a host system. The storage unit 400 may be an example of a non-transitory computer-readable medium on which instructions or codes executable by the degradation management circuit 300 and / or its components (e.g., its processor) may be stored. A computer-readable medium may refer to a non-transitory medium for providing instructions to the degradation management circuit 300 and / or its components (e.g., its processor). The medium may include one or more media. The processor may include one or more processors or one or more sub-processors. The processor of the degradation management circuit 300 and / or components thereof may be configured to execute code, may be programmed to execute code, or may be operable to execute code, wherein such code may be stored in the degradation management circuit 300 , the memory unit 400 , and / or some components thereof.

[0197] In one or more examples, the degradation management circuit 300 and / or its components (eg, its processor) may perform or may cause the performance of the various figures (eg, Figures 3 to 10 ) described herein. For example, the degradation management circuit 300 and / or its components (e.g., its processors) may perform or may cause the performance of the methods (e.g., processes, steps, and operations) described herein or described below.

[0198] For example, the degradation management circuit 300 and / or its components (e.g., its processor) may perform or may cause the following to be performed: calculating cumulative stress data for each sub-pixel of a plurality of sub-pixels; classifying and compressing the cumulative stress data into a first type of data that is losslessly compressed and a second type of data that is lossily compressed; providing bit size information for recovery that matches the lossy compressed data; determining the bit size information for recovery based on a comparison result of the second type of data with a loss reference value for lossy compression; calculating the bit size information for recovery based on the bit size of the second type of data and the bit size of the loss reference value; recovering the lossy compressed data based on the bit size information for recovery and the bit size of the loss reference value; determining the loss reference value based on a bit margin calculated based on the bit size of the data to which the first type of data is losslessly compressed; updating the cumulative stress data by adding the input stress data to the pre-stored cumulative stress data; updating the cumulative stress data by adding the loss reference value and the input stress data to the pre-stored cumulative stress data; calculating a bit size information based on the input stress data corresponding to the driving data signal and the pre-stored cumulative data; The invention relates to a method for recovering a pre-stored accumulated stress data based on the input stress data; performing lossy compression on a part of the updated accumulated stress data; providing bit size information for recovery that matches the lossy compressed data; recovering the pre-stored accumulated stress data; generating updated accumulated stress data by adding the recovered accumulated stress data and the input stress data; classifying and compressing the updated accumulated stress data into first type data that is losslessly compressed and second type data that is lossily compressed; recovering the lossy compressed data based on a loss reference value for lossy compression of the lossy compressed data and the bit size information for recovery; if the input stress data is greater than the loss reference value, generating accumulated stress data that is updated by adding the input stress data after adding the loss reference value to the pre-stored accumulated stress data; determining compensation data based on the accumulated stress data; classifying the accumulated stress data into first type data for lossless compression and second type data for lossy compression; comparing the second type data with a loss reference value determined based on the first type data; and / or generating bit size information for recovery that matches the lossy compressed data based on the comparison result of the second type data with the loss reference value.

[0199] In one or more examples, the degradation management circuit 300 and / or its components may be included in the controller 140. In one or more examples, the controller 140 and / or its components may include (or may be) a processor that may be configured to execute code or instructions to perform the operations and functions described herein, and to perform calculations and generate commands. In one or more examples, the components of the controller 140 may include (or may be) a processor. The processor of the controller 140 may be configured to monitor and / or control the operation of the components in the display device 100.

[0200] A display device 100 according to an example embodiment of the present disclosure includes: a plurality of sub-pixels SP, in which a light-emitting element ED and a driving transistor DRT for driving the light-emitting element ED are provided; a data driving circuit 130, which is configured to provide a data voltage to each of the plurality of sub-pixels SP; and a degradation management circuit 300, which is configured to calculate accumulated stress data of each of the plurality of sub-pixels SP, classify and compress the accumulated stress data into losslessly compressed first type data and lossily compressed second type data, and provide bit size information for recovery that matches the lossy compressed data.

[0201] The degradation management circuit 300 may determine the bit size information for restoration according to a comparison result between the second type data and a loss reference value for lossy compression.

[0202] If the second type data is equal to or greater than the loss reference value, the bit size information for restoration may be zero.

[0203] If the second type data is smaller than the loss reference value, the bit size information for restoration may be greater than zero.

[0204] The degradation management circuit 300 may calculate bit size information for restoration based on the bit size of the second type data and the bit size of the loss reference value.

[0205] The degradation management circuit 300 may restore the lossy compressed data based on the bit size information for restoration and the bit size of the loss reference value.

[0206] When the bit size information for restoration is greater than 0, the lossy compressed data may be 0.

[0207] The loss reference value applied to the sub-pixels SP disposed on the same line among the plurality of sub-pixels SP may be constant.

[0208] The degradation management circuit 300 may determine the loss reference value according to a bit margin calculated based on a bit size of data in which the first type data is losslessly compressed.

[0209] The degradation management circuit 300 may update the accumulated stress data by adding the input stress data to the pre-stored accumulated stress data. If the input stress data is greater than the loss reference value, the accumulated stress data may be updated by adding the loss reference value and the input stress data to the pre-stored accumulated stress data.

[0210] The first type of data may be a portion of average stress data obtained by dividing the accumulated stress data by the number of accumulations.

[0211] The second type data may be a value obtained by subtracting reconstruction data based on the first type data and the accumulation number from the accumulated stress data.

[0212] The accumulated stress data of each of the plurality of sub-pixels may be related to a respective data voltage provided to a corresponding sub-pixel of the plurality of sub-pixels.

[0213] The senseless compensation system according to an example embodiment of the present disclosure may be provided for a device 100 having a data driving circuit 130 and a plurality of sub-pixels SP. The senseless compensation system may include: a data signal output unit 310 configured to receive an image data signal (from the outside), generate a driving data signal based on the image data signal and compensation data, and output the driving data signal to the data driving circuit 130; and a degradation management unit 330 configured to calculate cumulative stress data updated based on input stress data corresponding to the driving data signal and pre-stored cumulative stress data, lossily compress a portion of the updated cumulative stress data, and provide bit size information for recovery matching the lossy compressed data. The data driving circuit 130 may provide a data voltage to a sub-pixel among the plurality of sub-pixels based on a second driving data signal. The data voltage provided to the sub-pixel may be based on the updated cumulative stress data.

[0214] The degradation management unit 330 may include: a decoding module 331 configured to restore pre-stored cumulative stress data; a processing module 332 configured to generate updated cumulative stress data by adding the restored cumulative stress data and input stress data; and an encoding module 333 configured to classify and compress the updated cumulative stress data into a first type of data that is losslessly compressed and a second type of data that is losslessly compressed.

[0215] The decoding module 331 may be configured to restore the lossy compressed data based on a loss reference value for loss-compressing the lossy compressed data and bit size information for restoration.

[0216] The processing module 332 may be configured to generate cumulative stress data updated by adding the input stress data after adding the loss reference value to pre-stored cumulative stress data if the input stress data is greater than the loss reference value.

[0217] Compensation data may be determined based on the accumulated stress data.

[0218] The method for compressing and applying data of the senseless compensation system according to an example embodiment of the present disclosure may be provided for a device 100 having a plurality of sub-pixels SP. The method may include the following steps: classifying the accumulated stress data into a first type of data for lossless compression and a second type of data for lossy compression; comparing the second type of data with a loss reference value determined based on the first type of data; and generating bit size information for restoration matching the lossy compressed data according to the comparison result of the second type of data with the loss reference value. The data voltage generated based on the accumulated stress data may be provided to drive the sub-pixels in the plurality of sub-pixels SP.

[0219] If the second type data is equal to or greater than the loss reference value, the bit size information for restoration may be 0, and if the second type data is less than the loss reference value, the bit size information for restoration may be greater than 0.

[0220] According to an example embodiment of the present disclosure, by updating the accumulated stress data of the sub-pixel SP in real time based on the driving data signal output to the data driving circuit 130 , a method of performing real-time compensation for degradation of the sub-pixel SP may be provided.

[0221] Furthermore, by providing bit size information for restoration according to a comparison result of lossy compressed data with a loss reference value when compressing accumulated stress data, and using the bit size information for restoration during restoration, the loss rate of lossy compressed data can be reduced.

[0222] Furthermore, by performing restoration of predicting and compensating for accumulated loss based on a loss reference value in a restoration process of pre-stored accumulated stress data for updating of the accumulated stress data, loss occurring in a process of repeatedly compressing and restoring the accumulated stress data can be reduced.

[0223] The above description is proposed to enable those skilled in the art to realize, use and practice the technical features of the present disclosure, and is provided as an example in the context of a specific application and its requirements. Various modifications, additions and substitutions to the described embodiments will be apparent to those skilled in the art, and the principles described herein may be applied to other embodiments and applications without departing from the scope of the present disclosure. The above description and the accompanying drawings provide examples of the technical features of the present invention for illustrative purposes. In other words, the disclosed embodiments are intended to illustrate the scope of the technical features of the present disclosure. Therefore, the scope of the present disclosure is not limited to the embodiments shown, but conforms to the widest scope consistent with the claims. The scope of protection of the present disclosure should be interpreted based on the attached claims, and all technical features within their equivalent ranges should be interpreted as included within the scope of the present disclosure.

[0224] CROSS-REFERENCE TO RELATED APPLICATIONS

[0225] This application claims the benefit of and priority to Korean Patent Application No. 10-2021-0114216, filed on August 27, 2021, which is hereby incorporated by reference in its entirety for all purposes.

Claims

1. A display device, comprising: a plurality of sub-pixels, wherein light-emitting elements and driving transistors for driving the light-emitting elements are provided in the plurality of sub-pixels; a data driving circuit configured to provide a data voltage to each of the plurality of sub-pixels; as well as a degradation management circuit configured to calculate cumulative stress data of each of the plurality of sub-pixels, classify and compress the cumulative stress data into losslessly compressed first type data and lossily compressed second type data, and provide bit size information for restoration matched with the lossy compressed data, wherein the degradation management circuit is configured to determine the bit size information for restoration according to a comparison result between the second type data and a loss reference value for lossy compression, and The degradation management circuit is configured to determine the loss reference value according to a bit margin, wherein the bit margin is calculated based on a bit size of data into which the first type of data is losslessly compressed.

2. The display device according to claim 1, wherein: If the second type data is equal to or greater than the loss reference value, the bit size information for restoration is 0.

3. The display device according to claim 1, wherein: If the second type data is smaller than the loss reference value, the bit size information for restoration is greater than 0.

4. The display device according to claim 3, wherein: The degradation management circuit is configured to calculate the bit size information for restoration based on a bit size of the second type data and a bit size of the loss reference value.

5. The display device according to claim 3, wherein: The degradation management circuit is configured to restore the lossy compressed data based on the bit size information for restoration and a bit size of the loss reference value.

6. The display device according to claim 3, wherein: When the bit size information for restoration is greater than 0, the lossy compressed data is 0.

7. The display device according to claim 1, wherein: The loss reference value applied to sub-pixels disposed on the same line among the plurality of sub-pixels is constant.

8. The display device according to claim 1, wherein: The degradation management circuit is configured to update the accumulated stress data by adding input stress data to pre-stored accumulated stress data, and if the input stress data is greater than the loss reference value, the degradation management circuit is configured to update the accumulated stress data by adding the loss reference value and the input stress data to the pre-stored accumulated stress data.

9. The display device according to claim 1, wherein: The first type of data is a portion of average stress data obtained by dividing the accumulated stress data by the number of accumulations.

10. The display device according to claim 9, wherein: The second type data is a value obtained by subtracting reconstruction data based on the first type data and the accumulation number from the accumulated stress data.

11. The display device according to claim 1, wherein: The accumulated stress data of each of the plurality of sub-pixels is related to a respective data voltage provided to a corresponding sub-pixel of the plurality of sub-pixels.

12. A senseless compensation system for a device having a data driving circuit and a plurality of sub-pixels, the senseless compensation system comprising: a data signal output unit configured to receive an image data signal, generate a driving data signal based on the image data signal and compensation data, and output the driving data signal to the data driving circuit; as well as a degradation management unit configured to calculate cumulative stress data updated based on input stress data corresponding to the driving data signal and pre-stored cumulative stress data, lossily compress a portion of the updated cumulative stress data, and provide bit size information for restoration matching the lossy compressed data, in, The data driving circuit is configured to provide a data voltage to a sub-pixel of the plurality of sub-pixels based on a second driving data signal; The data voltage provided to the sub-pixel is based on the updated accumulated stress data, The degradation management unit includes a decoding module configured to restore the pre-stored accumulated stress data, and The decoding module is configured to restore the lossy compressed data based on a loss reference value used for lossy compressing the lossy compressed data and the bit size information for restoration.

13. The sensorless compensation system according to claim 12, wherein: The degradation management unit comprises: a processing module configured to generate updated cumulative stress data by adding the restored cumulative stress data to the input stress data; and An encoding module is configured to classify and compress the updated accumulated stress data into losslessly compressed first type data and lossily compressed second type data.

14. The sensorless compensation system according to claim 13, wherein: The processing module is configured to generate cumulative stress data updated by adding the input stress data after adding the loss reference value to the pre-stored cumulative stress data if the input stress data is greater than the loss reference value.

15. The sensorless compensation system according to claim 13, wherein: The compensation data is determined based on the accumulated stress data.

16. A method for compressing data of a sensorless compensation system and applying it to a device having a plurality of sub-pixels, the method comprising the steps of: classifying the accumulated stress data into a first type of data for lossless compression and a second type of data for lossy compression; comparing the second type of data with a loss reference value determined based on the first type of data; as well as generating bit size information for restoration matching the lossy compressed data according to a comparison result between the second type data and the loss reference value, in, A data voltage generated based on the accumulated stress data is provided to drive a sub-pixel among the plurality of sub-pixels.

17. The method according to claim 16, wherein: If the second type data is equal to or greater than the loss reference value, the bit size information for restoration is 0, and if the second type data is smaller than the loss reference value, the bit size information for restoration is greater than 0.

18. A display device, comprising: a plurality of sub-pixels, wherein light-emitting elements and driving transistors for driving the light-emitting elements are provided in the plurality of sub-pixels; a data driving circuit configured to provide a data voltage to each of the plurality of sub-pixels; as well as a degradation management circuit configured to calculate cumulative stress data of each of the plurality of sub-pixels, classify and compress the cumulative stress data into losslessly compressed first type data and lossily compressed second type data, and provide bit size information for restoration matched with the lossy compressed data, The first type of data is a part of the average stress data obtained by dividing the cumulative stress data by the cumulative number of times, and The second type data is a value obtained by subtracting reconstruction data based on the first type data and the accumulation number from the accumulated stress data.

19. A senseless compensation system for a device having a data driving circuit and a plurality of sub-pixels, the senseless compensation system comprising: a data signal output unit configured to receive an image data signal, generate a driving data signal based on the image data signal and compensation data, and output the driving data signal to the data driving circuit; as well as a degradation management unit configured to calculate cumulative stress data updated based on input stress data corresponding to the driving data signal and pre-stored cumulative stress data, lossily compress a portion of the updated cumulative stress data, and provide bit size information for restoration matching the lossy compressed data, in, The data driving circuit is configured to provide a data voltage to a sub-pixel of the plurality of sub-pixels based on a second driving data signal; The data voltage provided to the sub-pixel is based on the updated accumulated stress data, and The lossy compression data is a value obtained by subtracting reconstruction data from the updated cumulative stress data, the reconstruction data being based on a number of accumulations and a portion of average stress data obtained by dividing the updated cumulative stress data by the number of accumulations.

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