Hardware-in-the-loop testing method, device, and electronic equipment for operating machinery

Abstract

The present invention relates to the field of information processing technology, and provides a hardware-in-the-loop testing method, device, and electronic device for operating machinery. By calling pre-stored historical parameters of the operating machinery and a preset initial test script, the initial test script is obtained based on a hardware-in-the-loop test HIL model. An initial hardware-in-the-loop test is performed based on the historical parameters and the test script to obtain initial test parameters, thereby realizing the characteristics of the historical parameters of the operating machinery, i.e., the historical working conditions of the operating machinery. The optimal historical parameters are determined based on the initial test parameters and the historical parameters, and the test is performed based on the optimal historical parameters, the preset calibration targets, and the HIL model to obtain the hardware-in-the-loop test results. The hardware-in-the-loop test is performed based on the optimal historical parameters to obtain a test result with high reference value.

Description

Technical Field

[0001] The present invention relates to the field of information processing technology, and in particular to a hardware-in-the-loop testing method, device, and electronic equipment for an operating machine. Background Art

[0002] Hardware-in-the-Loop (HIL) testing is widely used in the development of operating machine controllers. HIL testing is performed on operating machines based on HIL models. Existing HIL model parameters are primarily set by consulting relevant standards and using manual experience. These parameters are idealized and fail to accurately reflect the actual characteristics of the operating machine. This results in significant discrepancies between test results and actual results, making them ineffective as a reference.

[0003] Therefore, proposing a hardware-in-the-loop testing method that combines the actual characteristics of the operating machinery to obtain test results with high reference value is an urgent problem to be solved. Summary of the Invention

[0004] The present invention provides a hardware-in-the-loop testing method for an operating machine, which is used to solve the defect in the prior art that it is impossible to test according to the characteristics of the operating machine, resulting in a large difference between the test results and the actual situation and a low reference value. The hardware-in-the-loop testing method is implemented in combination with the actual characteristics of the operating machine to obtain test results with high reference value.

[0005] The present invention provides a hardware-in-the-loop testing method for an operating machine, comprising:

[0006] Calling pre-stored historical parameters of the operating machine and a preset initial test script, wherein the initial test script is obtained based on a hardware-in-the-loop test HIL model;

[0007] Performing an initial hardware-in-the-loop test according to the historical parameters and the initial test script to obtain initial test parameters;

[0008] Determining optimal historical parameters based on the initial test parameters and the historical parameters;

[0009] Testing is performed according to the optimal historical parameters, the preset calibration target and the HIL model to obtain a hardware-in-the-loop test result.

[0010] According to the present invention, a hardware-in-the-loop testing method for an operating machine further includes, before calling pre-stored historical parameters of the operating machine and a preset initial test script:

[0011] The operating machine transmits the historical parameters and identification information to the cloud platform via a telematics processor;

[0012] The cloud platform saves the historical parameters to a database based on the identification information.

[0013] According to the present invention, a hardware-in-the-loop testing method for an operating machine is provided, wherein the calling of pre-stored historical parameters of the operating machine and a preset initial test script includes:

[0014] acquiring historical parameters of the working machine in the database according to the identification information;

[0015] Generate an initial test script based on the preset first calibration target and the preset HIL model.

[0016] According to the hardware-in-the-loop testing method for an operating machine provided by the present invention, the historical parameters include historical control parameters and historical environmental parameters;

[0017] The performing of the initial hardware-in-the-loop test according to the historical parameters and the initial test script to obtain initial test parameters includes:

[0018] Performing data processing on the historical control parameters and the historical environmental parameters to obtain a historical parameter matrix;

[0019] The historical parameter matrix is input into the initial test script to obtain initial test parameters.

[0020] According to the hardware-in-the-loop testing method for an operating machine provided by the present invention, the historical parameters further include historical operating parameters, and the historical operating parameters are determined by the operating machine based on the historical control parameters and the historical environmental parameters;

[0021] The determining of the optimal historical parameters according to the initial test parameters and the historical parameters includes:

[0022] Under the condition of the same historical control parameters and the same historical environmental parameters, determining the similarity between the initial test parameters and the historical operating parameters;

[0023] The historical control parameters and historical environment parameters corresponding to the highest similarity are determined as the optimal historical parameters.

[0024] According to the present invention, a hardware-in-the-loop testing method for a working machine is provided, wherein the testing is performed according to the optimal historical parameters, the preset calibration target, and the HIL model to obtain a hardware-in-the-loop test result, including:

[0025] Determining the historical parameter matrix corresponding to the optimal historical parameter as the optimal historical parameter matrix;

[0026] generating a test script according to a preset second calibration target and the HIL model;

[0027] The optimal historical parameter matrix is input into the test script to obtain a hardware-in-the-loop test result.

[0028] The present invention also provides a hardware-in-the-loop testing device for an operating machine, comprising:

[0029] A calling unit, configured to call pre-stored historical parameters of the operating machine and a preset initial test script, wherein the initial test script is obtained based on a hardware-in-the-loop test HIL model;

[0030] a screening unit, configured to perform an initial hardware-in-the-loop test based on the historical parameters and the test script to obtain initial test parameters; and determine optimal historical parameters based on the initial test parameters and the historical parameters;

[0031] The testing unit is used to perform testing according to the optimal historical parameters, the preset calibration target and the HIL model to obtain a hardware-in-the-loop test result.

[0032] According to the hardware-in-the-loop testing device for an operating machine provided by the present invention, the historical parameters include historical control parameters and historical environmental parameters;

[0033] The screening unit is specifically used for:

[0034] Performing data processing on the historical control parameters and the historical environmental parameters to obtain a historical parameter matrix;

[0035] The historical parameter matrix is input into the initial test script to obtain initial test parameters.

[0036] The present invention also provides an electronic device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, wherein when the processor executes the program, the steps of the hardware-in-the-loop testing method for an operating machine as described above are implemented.

[0037] The present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon. When the computer program is executed by a processor, the steps of the hardware-in-the-loop testing method for the operating machine as described in any one of the above are implemented.

[0038] The hardware-in-the-loop testing method, device, and electronic device for a working machine provided by the present invention call pre-stored historical parameters of the working machine and a preset initial test script. The initial test script is obtained based on a hardware-in-the-loop test HIL model. An initial hardware-in-the-loop test is performed based on the historical parameters and the test script to obtain initial test parameters, thereby realizing the characteristics of the historical parameters of the working machine, i.e., the historical working conditions of the working machine. The optimal historical parameters are determined based on the initial test parameters and the historical parameters. The test is performed based on the optimal historical parameters, the preset calibration targets, and the HIL model to obtain the hardware-in-the-loop test results. The hardware-in-the-loop test is performed based on the optimal historical parameters, and a test result with high reference value is obtained. BRIEF DESCRIPTION OF THE DRAWINGS

[0039] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0040] Figure 1 It is a flowchart of the hardware-in-the-loop testing method of the operating machinery provided by the present invention;

[0041] Figure 2 This is a flow chart of obtaining a test script provided by the present invention;

[0042] Figure 3 It is a schematic diagram of a process for determining optimal historical parameters provided by the present invention;

[0043] Figure 4 It is a schematic diagram of the hardware-in-the-loop test process provided by the present invention;

[0044] Figure 5 It is a structural schematic diagram of the hardware-in-the-loop testing device for an operating machine provided by the present invention;

[0045] Figure 6 It is a structural schematic diagram of the electronic device provided by the present invention. DETAILED DESCRIPTION

[0046] To make the objectives, technical solutions, and advantages of the present invention more clear, the technical solutions of the present invention will be clearly and completely described below in conjunction with the accompanying drawings. Obviously, the embodiments described are only some of the embodiments of the present invention, not all of them. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts shall fall within the scope of protection of the present invention.

[0047] The present invention provides a hardware-in-the-loop testing method for an operating machine, such as Figure 1 As shown, including:

[0048] S11 . Calling pre-stored historical parameters of the operating machine and a preset initial test script, wherein the initial test script is obtained based on a hardware-in-the-loop test HIL model.

[0049] S12. Perform an initial hardware-in-the-loop test according to the historical parameters and the initial test script to obtain initial test parameters.

[0050] S13. Determine optimal historical parameters according to the initial test parameters and the historical parameters.

[0051] S14. Perform testing according to the optimal historical parameters, the preset calibration target, and the HIL model to obtain hardware-in-the-loop test results.

[0052] Specifically, the historical parameters of the operating machine have been pre-stored. Based on the Hardware-in-the-Loop (HIL) model, virtual input and output interfaces have been pre-designed to form an initial test script. Optionally, the historical parameters of the operating machine can be pre-stored in the cloud platform's database.

[0053] The historical parameters include, but are not limited to, historical control parameters for controlling the operating machine, historical environmental parameters of the environment in which the operating machine is located, and historical operating parameters of the operating machine during operation based on the control parameters and environmental parameters.

[0054] The above-mentioned control parameters, environmental parameters and operating parameters can be divided according to actual needs. In one example, the working machine is a vehicle, the control parameter can be the engine power of the vehicle, the environmental parameter can be the altitude, slope and ambient temperature of the vehicle, and the operating parameter can be the fuel consumption parameter of the vehicle.

[0055] Initial hardware-in-the-loop testing can be performed based on historical parameters and initial test scripts to achieve simulation based on historical parameters, simulate the working conditions of the operating machinery under historical parameters, and obtain initial test parameters.

[0056] Analyze and compare the initial test parameters and historical parameters, and then compare the test results with the actual historical results to determine the optimal historical parameters with greater reference value.

[0057] Based on the pre-set calibration target as the final indicator, hardware-in-the-loop testing is performed in combination with the most historical parameters and HIL model. The final hardware-in-the-loop test results are more in line with the actual characteristics of the operating machinery and have a higher reference value.

[0058] In an embodiment of the present invention, by calling pre-stored historical parameters of the operating machine and a preset initial test script, the initial test script is derived based on a hardware-in-the-loop (HIL) model. Initial hardware-in-the-loop testing is performed based on the historical parameters and the test script to obtain initial test parameters, thereby achieving a combination of the historical parameters of the operating machine, i.e., the characteristics of the historical operating conditions of the operating machine. Optimal historical parameters are determined based on the initial test parameters and the historical parameters. Testing is performed based on the optimal historical parameters, preset calibration targets, and the HIL model to obtain hardware-in-the-loop test results. This allows hardware-in-the-loop testing to be performed based on the optimal historical parameters, resulting in test results with high reference value.

[0059] According to a hardware-in-the-loop testing method for an operating machine provided by the present invention, the method further includes, before step S11:

[0060] S15. The operating machine transmits the historical parameters and identification information to the cloud platform via the telematics processor.

[0061] S16. The cloud platform saves the historical parameters to a database based on the identification information.

[0062] Specifically, the operating machinery can transmit historical parameters and identification information to the cloud platform through the T-Box (telematics processor). The identification information can be set according to actual needs. Taking the operating machinery as a vehicle as an example, it includes but is not limited to the vehicle model and frame number and other information used to distinguish the vehicle.

[0063] Continuing with the previous example, the cloud platform can determine the primary database based on the vehicle model, and within that database, determine a sub-database within the primary database based on the vehicle frame number, i.e., the secondary database. Historical parameters are saved to the corresponding secondary database, enabling storage and management of historical parameters for the operating machinery.

[0064] In this embodiment of the present invention, a work machine transmits historical parameters and identification information to a cloud platform via a telematics processor, enabling high-speed data transmission. Based on the identification information, the cloud platform saves the work machine's historical parameters to a corresponding database, enabling categorized management of the work machine based on identification information. This ensures the security of the database data and facilitates rapid subsequent access.

[0065] According to a hardware-in-the-loop testing method for an operating machine provided by the present invention, step S11 includes:

[0066] S111. Obtain historical parameters of the operating machine from the database based on the identification information.

[0067] S112 : Generate an initial test script according to a preset first calibration target and a preset HIL model.

[0068] Optionally, the technician may determine the identification information of the operating machine according to the needs of the hardware-in-the-loop test, and determine the corresponding operating machine to perform the hardware-in-the-loop test based on the specified identification information.

[0069] Continuing with the previous example, based on the pre-determined model and frame number of the operating machinery, the primary database can be determined based on the model in the cloud platform, and the corresponding secondary database can be determined in the primary database based on the frame number, from which the historical parameters of the operating machinery can be obtained.

[0070] According to the preset first calibration target, adjust the parameters and data interface of the preset HIL model, and use the obtained HIL model as the initial test script. In an example, Figure 2 As shown in the figure. Variable parsing is performed based on the calibration target to determine the parameter matrix variables that need to be input into the HIL model. Through engineering calls, variable mapping and logic generation are performed on the HIL model to enable the corresponding parameter matrix to be input and generate a test script. Optionally, after the parameter matrix is input into the test script, the test results can be recorded and saved locally or uploaded to the cloud platform.

[0071] In this embodiment of the present invention, historical parameters of the operating machine are retrieved from a cloud platform database based on the machine's identification information, enabling rapid and efficient acquisition of the machine's historical parameters. An initial test script is generated based on a preset first calibration target and a preset HIL model, initializing the initial test script and facilitating subsequent execution of the initial test script.

[0072] According to a hardware-in-the-loop testing method for an operating machine provided by the present invention, the historical parameters include historical control parameters and historical environmental parameters;

[0073] Step S12 includes:

[0074] S121 . Process the historical control parameters and the historical environment parameters to obtain a historical parameter matrix.

[0075] S122. Input the historical parameter matrix into the initial test script to obtain initial test parameters.

[0076] Specifically, the historical parameters include historical control parameters and historical environment parameters. The historical control parameters and historical environment parameters have been explained in the previous text and will not be explained again here.

[0077] To facilitate subsequent input of the initial test script, historical control parameters and historical environmental parameters can be processed and converted into a parameter matrix to obtain the corresponding historical parameter matrix. The historical parameter matrix is then input into the initial test script to perform an initial hardware-in-the-loop test based on the historical control parameters and historical environmental parameters, simulating the operating conditions of the operating machine under historical conditions.

[0078] In an embodiment of the present invention, historical control parameters and historical environmental parameters are matrixed to obtain a historical control parameter matrix and a historical environmental parameter matrix, which facilitates input of an initial test script for an initial hardware-in-the-loop test, thereby realizing simulation of the working conditions of the operating machinery under historical circumstances.

[0079] According to a hardware-in-the-loop testing method for an operating machine provided by the present invention, the historical parameters further include historical operating parameters, and the historical operating parameters are determined by the operating machine based on the historical control parameters and the historical environmental parameters;

[0080] Step S13 includes:

[0081] S131 . Under the conditions of identical historical control parameters and identical historical environmental parameters, determine the similarity between the initial test parameters and the historical operating parameters.

[0082] S132: Determine the historical control parameters and historical environment parameters corresponding to the highest similarity as the optimal historical parameters.

[0083] Specifically, historical operating parameters are parameters derived from the machine's historical operation under operating conditions corresponding to historical control parameters and historical environmental parameters. Initial test parameters are derived from hardware-in-the-loop test simulations under operating conditions based on a matrix of historical control parameters and historical environmental parameters. Therefore, initial test parameters may differ from historical operating parameters.

[0084] When the initial test parameters are close to the historical operating parameters under the same conditions (i.e., the same historical control parameters and the same historical environmental parameters), the corresponding historical control parameters and historical environmental parameters will reach a higher reference value.

[0085] Under the condition of the same historical control parameters and the same historical environment parameters, the similarity between the initial test parameters and the historical operating parameters is determined, and the similarity is used to represent the degree of similarity between the initial test parameters and the historical operating parameters.

[0086] The historical control parameters and historical environment parameters corresponding to the situation with the highest similarity are determined as the optimal historical parameters, and the most valuable historical parameters are obtained among the historical parameters.

[0087] In this embodiment of the present invention, under the same historical control parameters and historical environmental parameters, the similarity between the initial test parameters and the historical operating parameters is determined, and the historical control parameters and historical environmental parameters with the highest similarity are determined as the optimal historical parameters. This allows the historical parameters with the most reference value to be determined based on similarity, facilitating further hardware-in-the-loop testing and obtaining final hardware-in-the-loop test results with high reference value.

[0088] In an example based on the above embodiment, Figure 3 As shown in the figure, the historical parameters of the operating machine are retrieved from the cloud platform database. A historical parameter matrix is generated based on the historical environmental parameters and historical control parameters. The historical parameter matrix is input into the initial test script through engineering call to obtain the initial test parameters. The initial test parameters are compared with the historical operating parameters for similarity to determine the optimal historical parameters.

[0089] According to a hardware-in-the-loop testing method for an operating machine provided by the present invention, step S14 includes:

[0090] S141. Determine the historical parameter matrix corresponding to the optimal historical parameter as the optimal historical parameter matrix.

[0091] S142: Generate a test script according to the preset second calibration target and the HIL model.

[0092] S143. Input the optimal historical parameter matrix into the test script to obtain a hardware-in-the-loop test result.

[0093] Specifically, the historical parameter matrix corresponding to the optimal historical parameters is determined as the optimal historical parameter matrix. The parameters and data interface of the HIL model are adjusted according to the preset second calibration target to obtain a test script. The optimal historical parameter matrix is input into the test script to perform hardware-in-the-loop testing, obtaining the final hardware-in-the-loop test results. Hardware-in-the-loop testing is performed on the second calibration target based on the optimal historical parameters, resulting in hardware-in-the-loop test results with high reference value.

[0094] In an embodiment of the present invention, after determining the optimal historical parameter matrix, a test script is generated based on the second calibration target and the HIL model, and the optimal historical parameter matrix is input into the test script to implement hardware-in-the-loop testing of the second calibration target based on the optimal historical parameters. Since the parameter matrix corresponding to the optimal historical parameters is used, the obtained hardware-in-the-loop test results are closest to the actual working conditions of the operating machinery, and the obtained hardware-in-the-loop test results have a high reference value.

[0095] In an example based on the above embodiments, Figure 4As shown in the figure, the controller of the working machine sends historical parameters to the cloud platform via a T-Box. The HIL test bench host computer uses the historical parameters and initial test script in the cloud platform to perform an initial hardware-in-the-loop test. After obtaining the initial test parameters, it determines the optimal historical parameters based on the historical parameters and the initial test parameters. Using the optimal historical parameters and the calibrated target HIL model, the hardware-in-the-loop test is then performed. During the initial and subsequent hardware-in-the-loop tests, the HIL test bench host computer transmits the operating instructions to the SCALEXIO cabinet. The cabinet sends electrical signals to the controller and actuators of the test machine, completing the initial and subsequent hardware-in-the-loop tests and sending feedback signals to the cabinet and HIL test bench host computer. The HIL test bench host computer generates the hardware-in-the-loop test results based on the feedback signals. The HIL test bench host computer uploads the hardware-in-the-loop test results to the cloud platform, which in turn sends the hardware-in-the-loop test results to the working machine host computer. Based on the hardware-in-the-loop test results received by the working machine host computer, technicians can adjust the working machine.

[0096] The hardware-in-the-loop testing device for a working machine provided by the present invention is described below. The hardware-in-the-loop testing device for a working machine described below and the hardware-in-the-loop testing method for a working machine described above can refer to each other.

[0097] The present invention also provides a hardware-in-the-loop testing device for an operating machine, such as Figure 5 As shown, including:

[0098] The calling unit 51 is used to call pre-stored historical parameters of the working machine and a preset initial test script, wherein the initial test script is obtained based on a hardware-in-the-loop test HIL model.

[0099] The screening unit 52 is configured to perform an initial hardware-in-the-loop test according to the historical parameters and the test script to obtain initial test parameters; and determine optimal historical parameters according to the initial test parameters and the historical parameters.

[0100] The testing unit 53 is configured to perform testing according to the optimal historical parameters, the preset calibration target and the HIL model to obtain a hardware-in-the-loop test result.

[0101] By calling pre-stored historical parameters of the operating machine and a preset initial test script (derived from the hardware-in-the-loop (HIL) model), an initial HIL test is performed based on the historical parameters and test script to obtain initial test parameters. This combines the historical parameters of the operating machine, i.e., the characteristics of the operating machine's historical operating conditions. Based on the initial test parameters and historical parameters, the optimal historical parameters are determined. Testing is then performed based on the optimal historical parameters, preset calibration targets, and the HIL model to obtain HIL test results. This allows HIL testing to be performed based on the optimal historical parameters, resulting in test results with high reference value.

[0102] According to a hardware-in-the-loop testing device for an operating machine provided by the present invention, the calling unit 51 is further configured to:

[0103] controlling the operating machine to transmit the historical parameters and identification information to the cloud platform via a telematics processor;

[0104] The control cloud platform saves the historical parameters to a database based on the identification information.

[0105] According to a hardware-in-the-loop testing device for an operating machine provided by the present invention, the calling unit 51 is specifically configured to:

[0106] acquiring historical parameters of the working machine in the database according to the identification information;

[0107] Generate an initial test script based on the preset first calibration target and the preset HIL model.

[0108] According to a hardware-in-the-loop testing device for an operating machine provided by the present invention, the historical parameters include historical control parameters and historical environmental parameters;

[0109] The screening unit 52 is specifically used for:

[0110] Performing data processing on the historical control parameters and the historical environmental parameters to obtain a historical parameter matrix;

[0111] The historical parameter matrix is input into the initial test script to obtain initial test parameters.

[0112] According to a hardware-in-the-loop testing device for an operating machine provided by the present invention, the historical parameters further include historical operating parameters, which are determined by the operating machine based on the historical control parameters and the historical environmental parameters; the screening unit 52 is specifically configured to:

[0113] Under the condition of the same historical control parameters and the same historical environmental parameters, determining the similarity between the initial test parameters and the historical operating parameters;

[0114] The historical control parameters and historical environment parameters corresponding to the highest similarity are determined as the optimal historical parameters.

[0115] According to a hardware-in-the-loop testing device for an operating machine provided by the present invention, the testing unit 53 is specifically configured to:

[0116] Determining the historical parameter matrix corresponding to the optimal historical parameter as the optimal historical parameter matrix;

[0117] generating a test script according to a preset second calibration target and the HIL model;

[0118] The optimal historical parameter matrix is input into the test script to obtain a hardware-in-the-loop test result.

[0119] Figure 6 An example of a physical structure diagram of an electronic device is shown below. Figure 6 As shown, the electronic device may include: a processor 610, a communication interface 620, a memory 630, and a communication bus 640, wherein the processor 610, the communication interface 620, and the memory 630 communicate with each other via the communication bus 640. The processor 610 may call the logic instructions in the memory 630 to execute a hardware-in-the-loop test method for the operating machine, the method comprising: calling pre-stored historical parameters of the operating machine and a preset initial test script, the initial test script being obtained based on a hardware-in-the-loop test HIL model; performing an initial hardware-in-the-loop test based on the historical parameters and the initial test script to obtain initial test parameters; determining optimal historical parameters based on the initial test parameters and the historical parameters; and performing a test based on the optimal historical parameters, a preset calibration target, and the HIL model to obtain hardware-in-the-loop test results.

[0120] In addition, the logic instructions in the above-mentioned memory 630 can be implemented in the form of a software functional unit and can be stored in a computer-readable storage medium when sold or used as an independent product. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or the part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0121] On the other hand, the present invention also provides a computer program product, which includes a computer program stored on a non-transitory computer-readable storage medium, and the computer program includes program instructions. When the program instructions are executed by a computer, the computer can execute the hardware-in-the-loop testing method of the operating machinery provided by the above methods. The method includes: calling pre-stored historical parameters of the operating machinery and a preset initial test script, and the initial test script is obtained based on the hardware-in-the-loop test HIL model; performing an initial hardware-in-the-loop test according to the historical parameters and the initial test script to obtain initial test parameters; determining the optimal historical parameters according to the initial test parameters and the historical parameters; and performing testing according to the optimal historical parameters, the preset calibration target and the HIL model to obtain hardware-in-the-loop test results.

[0122] On the other hand, the present invention also provides a non-transitory computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, is implemented to perform the hardware-in-the-loop testing method of the operating machinery provided above, the method comprising: calling pre-stored historical parameters of the operating machinery and a preset initial test script, the initial test script being obtained based on a hardware-in-the-loop test HIL model; performing an initial hardware-in-the-loop test according to the historical parameters and the initial test script to obtain initial test parameters; determining optimal historical parameters according to the initial test parameters and the historical parameters; performing a test according to the optimal historical parameters, the preset calibration target and the HIL model to obtain hardware-in-the-loop test results.

[0123] The device embodiments described above are merely illustrative. The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, i.e., they may be located in one location or distributed across multiple network units. Some or all of the modules may be selected based on actual needs to achieve the objectives of the present embodiment. Persons of ordinary skill in the art will be able to understand and implement the present invention without inventive effort.

[0124] Through the description of the above embodiments, those skilled in the art can clearly understand that each embodiment can be implemented by means of software plus a necessary general hardware platform, or of course, by hardware. Based on this understanding, the essence of the above technical solution or the part that contributes to the existing technology can be embodied in the form of a software product. The computer software product can be stored in a computer-readable storage medium, such as ROM / RAM, a magnetic disk, an optical disk, etc., and includes a number of instructions for enabling a computer device (which can be a personal computer, a server, or a network device, etc.) to execute the methods described in each embodiment or certain parts of the embodiments.

[0125] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the aforementioned embodiments, or make equivalent replacements for some of the technical features therein. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the various embodiments of the present invention.

Claims

1. A hardware-in-the-loop testing method for an operating machine, characterized in that: include: Calling pre-stored historical parameters of the operating machine and a preset initial test script, wherein the initial test script is obtained based on a hardware-in-the-loop test HIL model; Performing an initial hardware-in-the-loop test according to the historical parameters and the initial test script to obtain initial test parameters; the historical parameters include historical control parameters and historical environment parameters; Determining optimal historical parameters based on the initial test parameters and the historical parameters; Performing a test based on the optimal historical parameters, the preset calibration target, and the HIL model to obtain a hardware-in-the-loop test result; The historical parameters further include historical operating parameters, which are determined by the working machine based on the historical control parameters and the historical environmental parameters; The determining of the optimal historical parameters according to the initial test parameters and the historical parameters includes: Under the condition of the same historical control parameters and the same historical environmental parameters, determining the similarity between the initial test parameters and the historical operating parameters; The historical control parameters and historical environment parameters corresponding to the highest similarity are determined as the optimal historical parameters.

2. The hardware-in-the-loop testing method for an operating machine according to claim 1, characterized in that: Before calling the pre-stored historical parameters of the operating machine and the preset initial test script, it also includes: The operating machine transmits the historical parameters and identification information to the cloud platform via a telematics processor; The cloud platform saves the historical parameters to a database based on the identification information.

3. The hardware-in-the-loop testing method for an operating machine according to claim 2, characterized in that: The calling of pre-stored historical parameters of the operating machine and the preset initial test script includes: acquiring historical parameters of the working machine in the database according to the identification information; Generate an initial test script based on the preset first calibration target and the preset HIL model.

4. The hardware-in-the-loop testing method for an operating machine according to claim 1, wherein: The performing of the initial hardware-in-the-loop test according to the historical parameters and the initial test script to obtain initial test parameters includes: Performing data processing on the historical control parameters and the historical environmental parameters to obtain a historical parameter matrix; The historical parameter matrix is input into the initial test script to obtain initial test parameters.

5. The hardware-in-the-loop testing method for a working machine according to claim 4, characterized in that: The testing is performed according to the optimal historical parameters, the preset calibration target and the HIL model to obtain a hardware-in-the-loop test result, including: Determining the historical parameter matrix corresponding to the optimal historical parameter as the optimal historical parameter matrix; generating a test script according to a preset second calibration target and the HIL model; The optimal historical parameter matrix is input into the test script to obtain a hardware-in-the-loop test result.

6. A hardware-in-the-loop testing device for an operating machine, characterized in that: include: A calling unit, configured to call pre-stored historical parameters of the operating machine and a preset initial test script, wherein the initial test script is obtained based on a hardware-in-the-loop test HIL model; a screening unit, configured to perform an initial hardware-in-the-loop test based on the historical parameters and the test script to obtain initial test parameters, wherein the historical parameters include historical control parameters and historical environment parameters; and determine optimal historical parameters based on the initial test parameters and the historical parameters; A testing unit, configured to perform testing based on the optimal historical parameters, a preset calibration target, and the HIL model to obtain a hardware-in-the-loop test result; The historical parameters also include historical operating parameters, which are determined by the operating machine based on the historical control parameters and the historical environmental parameters; the screening unit is specifically configured to: Under the condition of the same historical control parameters and the same historical environmental parameters, determining the similarity between the initial test parameters and the historical operating parameters; The historical control parameters and historical environment parameters corresponding to the highest similarity are determined as the optimal historical parameters.

7. The hardware-in-the-loop testing device for a working machine according to claim 6, characterized in that: The historical parameters include historical control parameters and historical environment parameters; The screening unit is specifically used for: Performing data processing on the historical control parameters and the historical environmental parameters to obtain a historical parameter matrix; The historical parameter matrix is input into the initial test script to obtain initial test parameters.

8. An electronic device comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein: When the processor executes the program, the steps of the hardware-in-the-loop testing method for the working machine as claimed in any one of claims 1 to 4 are implemented.

9. A non-transitory computer-readable storage medium having a computer program stored thereon, characterized in that: When the computer program is executed by a processor, the steps of the hardware-in-the-loop testing method for a working machine as claimed in any one of claims 1 to 4 are implemented.

10. A computer program product comprising a computer program, characterized in that When the computer program is executed by a processor, the steps of the hardware-in-the-loop testing method for a working machine as described in any one of claims 1 to 4 are implemented.

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