Method and system for measuring single point efficiency of perovskite solar module
By directly measuring the single-point efficiency of perovskite solar modules using the P1, P2, and P3 scribing method and the IV tester, the problem of large measurement errors in existing technologies is solved, and high-precision module efficiency evaluation and uniformity judgment are achieved.
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- QUZHOU MICROQUANTA RENEWABLE ENERGY TECHN CO LTD
- Filing Date
- 2021-09-17
- Publication Date
- 2026-06-02
AI Technical Summary
In the current perovskite solar module manufacturing process, the measurement error of the effect of the P2 scribing on the module efficiency is large, lacks quantitative indicators, and the judgment is inaccurate.
The bottom electrode, light-absorbing layer and top electrode are divided by the P1, P2 and P3 line marking method, respectively. The single-point power generation efficiency of the efficiency test area is directly measured by the IV tester, and the test results are recorded to plot the efficiency uniformity of the module.
It improves measurement accuracy and efficiency, provides guidance for the fabrication of high-efficiency components, and offers convenient and precise measurements.
Smart Images

Figure CN115831787B_ABST
Abstract
Description
Technical Field
[0001] This invention belongs to the field of perovskite solar cell fabrication technology, and specifically relates to a method and system for measuring the single-point efficiency of perovskite solar modules. Background Technology
[0002] In existing perovskite solar module manufacturing processes, the impact of the P2 scribing on module efficiency is initially assessed by measuring the contact resistance of the P2 scribing and then relying on experience. This existing method suffers from drawbacks such as large errors and inaccurate judgments. Furthermore, it only provides qualitative assessments and lacks quantitative indicators. Summary of the Invention
[0003] The technical problem to be solved by the present invention is to provide a method and system for measuring the efficiency of perovskite solar modules, which can directly measure the effect of the P2 scribing contact resistance on the efficiency, and at the same time test the uniformity of the module, providing guidance for the preparation of high-efficiency modules. Moreover, it is convenient to use, has high measurement accuracy, and high measurement efficiency.
[0004] This invention is implemented by providing a method for measuring the efficiency of a perovskite solar module. The perovskite solar module includes a substrate, a bottom electrode, a light-absorbing layer, and a top electrode stacked sequentially from bottom to top. The measurement method includes a method for preparing a perovskite solar module for measurement and a method for measuring the efficiency of the perovskite solar module.
[0005] The method for preparing perovskite solar modules for measurement includes the following steps:
[0006] Step 1: Fabricate the bottom electrode on the substrate. Perform P1 scribing on the bottom electrode. The P1 scribing divides the bottom electrode into a front unit region, a rear unit region, and a middle connecting region that are separated from each other. The P1 scribing cuts through the bottom electrode to expose the substrate underneath. The middle connecting region is located between the front unit region and the rear unit region. In the front unit region and the rear unit region, multiple front sub-units and rear sub-units are symmetrically arranged vertically and are separated from each other and arranged side by side.
[0007] Step 2: Prepare a perovskite light-absorbing layer on the bottom electrode. Perform P2 scribing on the perovskite light-absorbing layer to expose the bottom electrode underneath. In each front sub-unit and rear sub-unit, at least two vertically arranged sub-unit P2 scribings are symmetrically arranged relative to the position of the P1 scribing. The sub-unit P2 scribings do not coincide with or intersect the P1 scribings. In the middle connection area corresponding to each front sub-unit and rear sub-unit, a vertically arranged middle P2 scribing is set. The middle P2 scribings do not intersect the P1 scribings, and adjacent middle P2 scribings are equidistant.
[0008] Step 3: Fabricate a top electrode on the light-absorbing layer. Perform P3 scribing on the top electrode, severing both the top electrode and the light-absorbing layer to expose the underlying bottom electrode. The P3 scribing divides the top electrode into multiple vertically arranged, spaced-apart test units. The outer frame P3 scribing of each test unit coincides with the corresponding P1 scribing. Furthermore, each test unit also includes a front P3 scribing, a middle P3 scribing, and a rear P3 scribing. The front P3 scribing corresponds to the front sub-unit. The P1 line of the unit coincides with the P3 line of the rear unit area, and the P3 line of the middle unit area coincides with the P1 line of the corresponding rear sub-unit area. The P3 line of the middle unit area connects the tail ends of the front P3 line and the rear P3 line respectively. The P3 line divides each column of test units into an upper test area and a lower test area. The area where the P2 line of the sub-unit is located is the test area. The P2 line of the middle unit area is located in the area of the upper test area or the lower test area. Another area in the middle connection area that is located in the same area as the area where the P2 line of the middle unit area is located is the efficiency test area.
[0009] The method for measuring the single-point efficiency of perovskite solar modules includes the following steps:
[0010] Step 4: Place the prepared perovskite solar module for measurement under AM1.5G standard steady-state light source illumination. Select any column of test cells on the top electrode, and make conductive contact between the positive and negative test heads of the IV tester and the front and rear sub-cells of the test area within that test cell, respectively. Directly test the single-point efficiency value of the sub-cell in the efficiency test area. Then, use the above method to measure the single-point efficiency of each other test cell in sequence, thereby obtaining the single-point efficiency distribution of the entire perovskite solar module.
[0011] This invention is implemented as follows, and also provides a measurement system for the efficiency of a perovskite solar module, including a perovskite solar module for measurement, an AM1.5G standard steady-state light source, an IV tester, and a test head with a wire. The test head is connected to the IV tester via the wire. The perovskite solar module for measurement includes a substrate, a bottom electrode, a light-absorbing layer, and a top electrode stacked sequentially from bottom to top. A P1 scribe line is provided on the bottom electrode, a P2 scribe line is provided on the light-absorbing layer, and a P3 scribe line is provided on the top electrode. The P1 scribe line cuts through the bottom electrode, exposing the underlying electrode. The substrate, wherein the P1 scribe line divides the bottom electrode into mutually separated front unit areas, rear unit areas, and a middle connecting area, with the middle connecting area located between the front and rear unit areas. Within each front and rear unit area, multiple mutually separated and side-by-side front and rear sub-units are vertically arranged. The P2 scribe line cuts through the light-absorbing layer to expose the underlying bottom electrode. Within each front and rear sub-unit, at least two vertically arranged sub-unit P2 scribe lines are provided relative to the P1 scribe line position. These sub-unit P2 scribe lines do not overlap with or intersect with the P1 scribe line. In each front and rear subunit, a vertically arranged central P2 scribe line is set in the central connection area. The central P2 scribe line does not intersect with the P1 scribe line, and adjacent central P2 scribe lines are equidistant. The P3 scribe line divides the top electrode into multiple vertically arranged test units that are separated from each other. The P3 scribe line cuts through the top electrode and the light-absorbing layer to expose the underlying bottom electrode. The outer frame P3 scribe line of each test unit coincides with the corresponding P1 scribe line. At the same time, a front P3 scribe line, a central P3 scribe line, and a rear P3 scribe line are also set in each test unit. The P3 markings are defined as follows: the front P3 marking coincides with the corresponding P1 marking of the front sub-unit; the rear P3 marking coincides with the corresponding P1 marking of the rear sub-unit area; the middle P3 marking connects the ends of the front and rear P3 markings; the P3 markings divide each column of test units into an upper test area and a lower test area; the area where the sub-unit P2 marking is located is the test area; the middle P2 marking is located within the area of the upper or lower test area; and another area within the middle connecting area, which is the same as the area where the middle P2 marking is located, is the efficiency test area.
[0012] Compared with existing technologies, the method and system for measuring the efficiency of perovskite solar modules of this invention utilizes conventional methods to prepare the bottom electrode, light-absorbing layer, and top electrode functional layers of the perovskite solar module. Special P1, P2, and P3 lines are sequentially scribed on the bottom electrode, light-absorbing layer, and top electrode, respectively. Then, a commonly used IV meter is used to directly measure the IV data of the sub-unit in the efficiency test area to obtain the single-point power generation efficiency of that area. By sequentially measuring the power generation efficiency of each efficiency test area and recording the test results, the efficiency uniformity of a large-area perovskite solar module can be plotted, thereby judging the quality of the module. This invention is convenient to use, has high measurement accuracy, and high measurement efficiency. Attached Figure Description
[0013] Figure 1 This is a schematic diagram of the internal structure of a preferred embodiment of the perovskite solar module of the present invention.
[0014] Figure 2 This is a schematic diagram of the perovskite solar module P1 of the present invention with lines drawn.
[0015] Figure 3 This is a schematic diagram of the perovskite solar module P2 of the present invention.
[0016] Figure 4 This is a schematic diagram of the perovskite solar module P3 of the present invention. Detailed Implementation
[0017] To make the technical problems to be solved, the technical solutions, and the beneficial effects of the present invention clearer, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are merely illustrative of the present invention and are not intended to limit the present invention.
[0018] A preferred embodiment of the method for measuring the efficiency of perovskite solar modules of the present invention, such as... Figure 1 As shown, the perovskite solar module includes a substrate 1, a bottom electrode 2, a light-absorbing layer 3, and a top electrode 4, stacked sequentially from bottom to top. The measurement method includes a method for preparing the perovskite solar module for measurement and a method for measuring the efficiency of the perovskite solar module.
[0019] The method for preparing perovskite solar modules for measurement includes the following steps:
[0020] Please refer to Figure 2As shown, step one involves fabricating a bottom electrode 2 on the substrate 1. A line P1 5 is scribed on the bottom electrode 2, dividing it into a front unit region 21, a rear unit region 22, and a middle connecting region 23, all separated from each other. The scribe line P1 5 exposes the substrate 1 beneath the bottom electrode 2. The middle connecting region 23 is located between the front unit region 21 and the rear unit region 22. Within the front unit region 21 and the rear unit region 22, multiple mutually separated and side-by-side front sub-unit regions 24 and rear sub-units 25 are vertically arranged.
[0021] like Figure 2 As shown, the front sub-unit area 24 includes regions A2, A4, A6, A8, ..., A n The rear subunit 25 includes regions A1, A3, A5, A7, ..., A n-1 .
[0022] Please refer to Figure 3 As shown, step two involves fabricating a perovskite light-absorbing layer 3 on the bottom electrode 2. A P2 scribing 6 is made on the perovskite light-absorbing layer 3, cutting through the layer to expose the underlying bottom electrode 2. At least two vertically arranged sub-unit P2 scribings 61 are symmetrically arranged relative to the P1 scribing 5 position within each front sub-unit 24 and rear sub-unit 25. These sub-unit P2 scribings 61 do not overlap with or intersect with the P1 scribing 5. A vertically arranged central P2 scribing 62 is provided within the central connection area 23 corresponding to each front sub-unit 24 and rear sub-unit 25. This central P2 scribing 62 does not intersect with the P1 scribing 5, and adjacent central P2 scribings 62 are equidistant. In this embodiment, ten sub-unit P2 scribings 61 are provided in each location of the front sub-unit 24 and rear sub-unit 25.
[0023] Please refer to Figure 4As shown, in step three, a top electrode 4 is fabricated on the light-absorbing layer 3. A P3 scribing 7 is made on the top electrode 4, severing the top electrode 4 and the light-absorbing layer 3 to expose the underlying bottom electrode 2. The P3 scribing 7 divides the top electrode 4 into multiple vertically arranged, mutually spaced-apart test units 41. The outer frame P3 scribing 7 of each test unit 41 coincides with the corresponding P1 scribing 5. Furthermore, within each test unit 41, a front P3 scribing 71, a middle P3 scribing 72, and a rear P3 scribing 73 are respectively provided. The front P3 scribe line 71 coincides with the corresponding front sub-unit P1 scribe line 5 of the front sub-unit 24, and the rear P3 scribe line 73 coincides with the corresponding rear sub-unit area P1 scribe line 5 of the rear sub-unit area 24. The middle P3 scribe line 72 connects the ends of the front P3 scribe line 71 and the rear P3 scribe line 73 respectively. The P3 scribe line 7 divides each column of test units 41 into an upper test area 42 and a lower test area 43. The area where the sub-unit P2 scribe line 61 is located is the test area 44. The two middle P2 scribe lines 62 are located in the areas of the upper test area 42 and the lower test area 43 respectively. Another area located in the middle connection area 23, along with the area where the middle P2 scribe line is located, is the efficiency test area 45.
[0024] like Figure 4 As shown, the test area 44 of the front sub-unit 24 includes areas A2, A4, A6, A8, ..., A n The test area 44 of the rear subunit 25 includes areas A1, A3, A5, A7, ..., A n-1 The central connecting area 23 is successively divided into regions a, b, c, d, e, f, g, h, ... by the central P3 line 72.
[0025] The method for measuring the single-point efficiency of perovskite solar modules includes the following steps:
[0026] Step 4: Place the prepared perovskite solar module for measurement under AM1.5G standard steady-state light source illumination. Select any column of test units 41 on the top electrode 4. Make conductive contact between the positive and negative test heads of the IV tester and the front sub-unit 24 and rear sub-unit 25 of the test area 44 within that test unit 41, respectively, to directly test the single-point efficiency value of the sub-unit in the area where the efficiency test area 45 is located. Then, use the above method to measure the single-point efficiency of each other test unit in sequence, thereby obtaining the single-point efficiency distribution of the entire perovskite solar module.
[0027] Specifically, the P1 scribing, P2 scribing, and P3 scribing are processed using laser cutting methods.
[0028] In this embodiment, picosecond and nanosecond lasers are used to perform P1 scribing, P2 scribing, and P3 scribing on the perovskite solar module, with laser wavelengths of 355nm, 532nm, or 1064nm.
[0029] In another embodiment, the P1 scribing, P2 scribing, or P3 scribing is processed using a mask template.
[0030] The present invention also discloses a single-point efficiency testing system for perovskite solar modules, including a perovskite solar module for measurement, an AM1.5G standard steady-state light source, an IV tester, and a test head with wires (not shown in the figure). The test head is connected to the IV tester through wires.
[0031] Please refer to Figure 1 As shown, the perovskite solar module used for measurement comprises, from bottom to top, a substrate 1, a bottom electrode 2, a light-absorbing layer 3, and a top electrode 4. The perovskite solar module used for measurement can be manufactured under existing normal production conditions.
[0032] Please refer to the following at the same time Figures 2 to 4 As shown, a P1 scribe line 5 is provided on the bottom electrode 2, a P2 scribe line 6 is provided on the light-absorbing layer 3, and a P3 scribe line 7 is provided on the top electrode 4. The processing patterns or paths of the P1 scribe line 5, P2 scribe line 6, and P3 scribe line 7 of the perovskite solar module used for measurement are different from those of existing perovskite solar modules in normal production.
[0033] The P1 scribe line 5 cuts through the bottom electrode 2, exposing the substrate 1 beneath it. The P1 scribe line 5 divides the bottom electrode 2 into a front unit area 21, a rear unit area 22, and a middle connecting area 23, which are separated from each other. The middle connecting area 23 is located between the front unit area 21 and the rear unit area 22. Within the front unit area 21 and the rear unit area 22, multiple mutually separated and side-by-side front sub-units 24 and rear sub-units 25 are respectively arranged vertically.
[0034] like Figure 2 As shown, the front sub-unit 24 includes regions A2, A4, A6, A8, ..., A n The rear subunit 25 includes regions A1, A3, A5, A7, ..., A n-1 .
[0035] The P2 scribe line 6 cuts through the light-absorbing layer 3, exposing the underlying electrode 2. At least two vertically arranged sub-unit P2 scribe lines 61 are respectively provided in each front sub-unit 24 and rear sub-unit 25 relative to the position of the P1 scribe line 5. The sub-unit P2 scribe lines 61 do not overlap with or intersect the P1 scribe line 5. A vertically arranged central P2 scribe line 62 is provided in the central connection area 23 corresponding to each front sub-unit 24 and rear sub-unit 25. The central P2 scribe line 62 does not intersect the P1 scribe line 5, and adjacent central P2 scribe lines 62 are equidistant.
[0036] In this embodiment, ten vertically arranged sub-units P2 lines 61 are respectively set in the positions of each front sub-unit 24 and rear sub-unit 25.
[0037] The P3 scribe line 7 divides the top electrode 4 into multiple vertically arranged test units 41 that are separated from each other. The P3 scribe line 7 cuts through the top electrode 4 and the light-absorbing layer 3 to expose the underlying bottom electrode 2. The outer frame P3 scribe line 7 of each test unit 41 coincides with the corresponding P1 scribe line 5. At the same time, a front P3 scribe line 71, a middle P3 scribe line 72, and a rear P3 scribe line 73 are respectively set in each test unit 41. The front P3 scribe line 71 coincides with the P1 scribe line 5 of the corresponding front sub-unit 24, the rear P3 scribe line 73 coincides with the P1 scribe line 5 of the corresponding rear sub-unit area 25, and the middle P3 scribe line 72 connects the tail ends of the front P3 scribe line 71 and the rear P3 scribe line 73. The P3 scribe line 7 divides each test unit 41 into an upper test area 42 and a lower test area 43. The area where the subunit P2 line 61 is located is the test area 44. The middle P2 line 62 is located in the area where the upper test area 42 or the lower test area 43 is located. Another area in the middle connection area 23, which is the same as the area where the middle P2 line 62 is located, is the efficiency test area 45.
[0038] The lengths of the front P3 scribe line 71 and the rear P3 scribe line 73 are each half the width of each column of test units 41.
[0039] like Figure 4 As shown, the test area 44 of the front sub-unit 24 includes areas A2, A4, A6, A8, ..., A n The test area 44 of the rear subunit 25 includes areas A1, A3, A5, A7, ..., A n-1 The central connecting area 23 is sequentially divided into regions a, b, c, d, e, f, g, h, ... by the central P3 line 72. Among them, the mutually spaced regions b, d, f, h, ... are the efficiency test areas 45.
[0040] The above description is only a preferred embodiment of the present invention and is not intended to limit the present invention. Any modifications, equivalent substitutions, and improvements made within the spirit and principles of the present invention should be included within the protection scope of the present invention.
Claims
1. A method of single point efficiency measurement of a perovskite solar module, characterized in that, The perovskite solar module includes a substrate, a bottom electrode, a light-absorbing layer, and a top electrode stacked from bottom to top. The measurement method includes a method for preparing a perovskite solar module for measurement and a method for measuring the efficiency of the perovskite solar module. The method for preparing perovskite solar modules for measurement includes the following steps: Step 1: Fabricate the bottom electrode on the substrate. Perform P1 scribing on the bottom electrode. The P1 scribing divides the bottom electrode into a front unit region, a rear unit region, and a middle connecting region that are separated from each other. The P1 scribing cuts through the bottom electrode to expose the substrate underneath. The middle connecting region is located between the front unit region and the rear unit region. In the front unit region and the rear unit region, multiple front sub-units and rear sub-units are symmetrically arranged vertically and are separated from each other and arranged side by side. Step 2: Prepare a perovskite light-absorbing layer on the bottom electrode. Perform P2 scribing on the perovskite light-absorbing layer to expose the bottom electrode underneath. In each front sub-unit and rear sub-unit, at least two vertically arranged sub-unit P2 scribings are symmetrically arranged relative to the position of the P1 scribing. The sub-unit P2 scribings do not coincide with or intersect the P1 scribings. In the middle connection area corresponding to each front sub-unit and rear sub-unit, a vertically arranged middle P2 scribing is set. The middle P2 scribings do not intersect the P1 scribings, and adjacent middle P2 scribings are equidistant. Step 3: Fabricate a top electrode on the light-absorbing layer. Perform P3 scribing on the top electrode, severing both the top electrode and the light-absorbing layer to expose the underlying bottom electrode. The P3 scribing divides the top electrode into multiple vertically arranged, spaced-apart test units. The outer frame P3 scribing of each test unit coincides with the corresponding P1 scribing. Furthermore, each test unit also includes a front P3 scribing, a middle P3 scribing, and a rear P3 scribing. The front P3 scribing corresponds to the front sub-unit. The P1 line of the unit coincides with the P3 line of the rear unit area, and the P3 line of the middle unit area coincides with the P1 line of the corresponding rear sub-unit area. The P3 line of the middle unit area connects the tail ends of the front P3 line and the rear P3 line respectively. The P3 line divides each column of test units into an upper test area and a lower test area. The area where the P2 line of the sub-unit is located is the test area. The P2 line of the middle unit area is located in the area of the upper test area or the lower test area. Another area in the middle connection area that is located in the same area as the area where the P2 line of the middle unit area is located is the efficiency test area. The method for measuring the single-point efficiency of perovskite solar modules includes the following steps: The prepared perovskite solar module for measurement is placed under the illumination of an AM1.5G standard steady-state light source. Any column of test units is selected on the top electrode. The test heads of the positive and negative electrodes of the IV tester are made into conductive contact with the front and rear sub-units of the test area within the test unit, respectively. The single-point efficiency value of the sub-unit in the efficiency test area is directly tested. Then, the single-point efficiency of each other test unit is measured in sequence using the above method to obtain the single-point efficiency distribution of the entire perovskite solar module.
2. The method of single point efficiency measurement of a perovskite solar assembly of claim 1, wherein, The P1, P2, and P3 lines are processed using laser cutting methods.
3. The method for measuring the single-point efficiency of a perovskite solar module as described in claim 2, characterized in that, Picosecond and nanosecond lasers were used to scribing P1, P2, and P3 lines on perovskite solar modules, with laser wavelengths of 355nm, 532nm, or 1064nm.
4. The method for measuring the single-point efficiency of a perovskite solar module as described in claim 1, characterized in that, The P1, P2, or P3 lines are processed using a mask template.
5. A single-point efficiency testing system for perovskite solar modules, characterized in that, The measurement equipment includes a perovskite solar module, an AM1.5G standard steady-state light source, an IV tester, and a test head with connecting wires. The test head is connected to the IV tester via connecting wires. The perovskite solar module includes a substrate, a bottom electrode, a light-absorbing layer, and a top electrode stacked from bottom to top. A P1 scribe line is provided on the bottom electrode, a P2 scribe line is provided on the light-absorbing layer, and a P3 scribe line is provided on the top electrode. The P1 scribe line cuts through the bottom electrode, exposing the substrate beneath it, and divides the bottom electrode into mutually isolated sections. The system comprises a front unit area, a rear unit area, and a middle connecting area, with the middle connecting area located between the front and rear unit areas. Within each of the front and rear unit areas, multiple mutually separated and side-by-side front and rear sub-units are vertically arranged. The P2 scribe line cuts through the light-absorbing layer, exposing the underlying electrode. Within each front and rear sub-unit, at least two vertically arranged sub-unit P2 scribe lines are provided relative to the P1 scribe line. These sub-unit P2 scribe lines do not overlap with or intersect with the P1 scribe line. A vertically arranged central P2 scribe line is set within the central connection area corresponding to the element. The central P2 scribe line does not intersect with the P1 scribe line, and adjacent central P2 scribe lines are equidistant from each other. The P3 scribe line divides the top electrode into multiple vertically arranged test units that are separated from each other. The P3 scribe line cuts through the top electrode and the light-absorbing layer, exposing the underlying bottom electrode. The outer frame P3 scribe line of each test unit coincides with the corresponding P1 scribe line. Furthermore, within each test unit, a front P3 scribe line, a middle P3 scribe line, and a rear P3 scribe line are also provided. The front P3 line coincides with the corresponding front sub-unit P1 line, and the rear P3 line coincides with the corresponding rear sub-unit area P1 line. The middle P3 line connects the ends of the front P3 line and the rear P3 line respectively. The P3 line divides each column of test units into an upper test area and a lower test area. The area where the sub-unit P2 line is located is the test area. The middle P2 line is located within the area of the upper test area or the lower test area. Another area in the middle connecting area, which is the same as the area where the middle P2 line is located, is the efficiency test area.
6. The single-point efficiency testing system for perovskite solar modules as described in claim 5, characterized in that, Ten vertically arranged sub-units P2 are drawn within each of the front and rear sub-units.
7. The single-point efficiency testing system for perovskite solar modules as described in claim 5, characterized in that, The lengths of the front P3 scribe line and the rear P3 scribe line are each half the width of each column of test units.