A low-mid precision MEMS inertial measurement unit rapid test system
By combining a MEMS inertial navigation system integrated tester with an inclined fixture, rapid multi-axis testing of medium- and low-precision MEMS inertial navigation systems has been achieved, solving the problems of high testing costs and low efficiency in existing technologies and providing an efficient and low-cost testing solution.
CN122408823APending Publication Date: 2026-07-17BEIJING AEROSPACE FEITENG EQUIPMENT TECHNOLOGY CO LTD
View PDF 0 Cites 0 Cited by
Patent Information
- Application Number
- CN202512051309.4
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- Filing Date
- 2025-12-31
- Publication Date
- 2026-07-17
AI Technical Summary
Technical Problem
Existing MEMS inertial navigation testing systems are costly and inefficient, especially in environmental testing, which is costly and makes it difficult to achieve rapid and efficient multi-axis testing.
Method used
Using a MEMS inertial group integrated tester, test cables, and a tilting fixture, the MEMS inertial group is rotated at different positions to test, achieving multi-axial data acquisition. Combined with the power supply and data acquisition functions of the MEMS inertial group integrated tester, test reports are generated.
Benefits of technology
It significantly improves the testing efficiency of MEMS inertial navigation systems, reduces costs, has high equipment integration, is suitable for rapid outdoor testing, and is scalable and portable.
✦ Generated by Eureka AI based on patent content.
Smart Images

Figure CN122408823A_ABST
Abstract
本发明涉及一种中低精度MEMS惯性测量单元快速测试系统,属于MEMS惯组的测试技术领域;包括MEMS惯组综合测试仪、测试线缆、斜置工装和待测MEMS惯组;其中,待测MEMS惯组安装在斜置工装上;MEMS惯组综合测试仪通过测试线缆与待测MEMS惯组连接;测试过程中,MEMS惯组综合测试仪通过测试线缆给待测MEMS惯组供电,并按照设定方法摆放斜置工装,使斜置工装处于不同的测试位置进行测试;同时MEMS惯组综合测试仪采集待测MEMS惯组的惯组数据;本发明可显著提高测试效率,具有可操作性强、成本低、功能丰富易于扩展的特点。
Need to check novelty before this filing date? Find Prior Art