Automatic inspection methods and automatic inspection devices
By dividing the computer cluster into management areas and conducting inspections according to inspection plans and rules, the problem of lack of automatic inspection tools in the existing technology is solved, and regular monitoring and fault detection of the computer cluster is realized, and management efficiency is improved.
Patent Information
- Application Number
- CN202211719158.5
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2022-12-23
- Publication Date
- 2025-03-07
- Estimated Expiration
- 2042-12-23
AI Technical Summary
The lack of automatic inspection tools in the prior art has led to increased difficulty in managing and maintaining computer clusters, and regular monitoring and fault detection cannot be achieved.
By dividing the target system into multiple management areas, and inspecting the subsystem according to the inspection plan and inspection rules, and obtaining inspection information, regular monitoring and fault detection of the target system can be achieved.
It realizes automated inspection of computer clusters, can regularly monitor system status, timely detect faults and hidden dangers, and improves the efficiency and accuracy of management and maintenance.
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Figure CN115862180B_ABST
Abstract
Description
Technical Field
[0001] The present disclosure relates to the field of data processing, and in particular to an automatic inspection method and an automatic inspection device. Background Art
[0002] As the demand for computing power continues to increase, the use of computer clusters to provide services for computing-intensive applications has become a mainstream trend. As computer clusters continue to grow, the difficulty of managing and maintaining computer clusters is increasing.
[0003] This section is intended to provide a background or context to the embodiments of the present disclosure that are recited in the claims. No admission is made that anything herein is prior art by virtue of its inclusion in this section. Summary of the Invention
[0004] The inventors have discovered that currently computer clusters are mainly monitored manually, and there is no tool for automatic inspection of computer clusters.
[0005] In order to solve at least one of the above problems or other similar problems, embodiments of the present disclosure provide an automatic inspection method and an automatic inspection device.
[0006] An embodiment of the present disclosure provides an automatic inspection method, which includes: dividing a target system containing multiple processors into multiple management areas, each management area containing at least one subsystem, and the subsystem is a system containing at least one processor in the management area; inspecting at least one subsystem in the inspection area according to an inspection plan and inspection rules, and obtaining inspection information of the at least one subsystem, the inspection area including at least one management area, the inspection plan including at least one inspection area, an inspection time corresponding to the at least one inspection area, and at least one inspection period corresponding to the at least one inspection area, and the inspection rules including an operation sequence for obtaining relevant information of the subsystem, a data type, and data corresponding to the data type.
[0007] An embodiment of the present disclosure also provides an automatic inspection device, which includes: an area management unit, which divides a target system containing multiple processors into multiple management areas, each management area contains at least one subsystem, and the subsystem is a system containing at least one processor in the management area; an inspection unit, which inspects at least one subsystem in the inspection area according to an inspection plan and inspection rules, and obtains inspection information of the at least one subsystem, the inspection area includes at least one management area, the inspection plan includes at least one inspection area, an inspection time corresponding to the at least one inspection area, and at least one inspection period corresponding to the at least one inspection area, and the inspection rule includes an operation sequence, a data type, and data corresponding to the data type for obtaining relevant information of the subsystem.
[0008] An embodiment of the present disclosure further provides a computer device, comprising a memory, a processor, and a computer program stored in the memory and executable on the processor, wherein the processor implements the above-mentioned automatic inspection method when executing the computer program.
[0009] An embodiment of the present disclosure further provides a computer-readable storage medium, wherein the computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the above-mentioned automatic inspection method is implemented.
[0010] In the embodiment of the present disclosure, the target system can be regularly monitored by dividing the target system into areas and performing inspections according to an inspection plan. BRIEF DESCRIPTION OF THE DRAWINGS
[0011] In order to more clearly illustrate the technical solutions in the embodiments of the present disclosure or related technologies, the following briefly introduces the drawings required for the embodiments or related technical descriptions. Obviously, the drawings described below are only some embodiments of the present disclosure. For those skilled in the art, other drawings can be obtained based on these drawings without creative work. In the drawings:
[0012] Figure 1 It is a schematic diagram of the automatic inspection method of an embodiment of the first aspect of the present disclosure.
[0013] Figure 2 It is a schematic diagram of the inspection rules of the embodiment of the first aspect of the present disclosure.
[0014] Figure 3 It is another schematic diagram of the automatic inspection method of the embodiment of the first aspect of the present disclosure.
[0015] Figure 4 It is another schematic diagram of the automatic inspection method of the embodiment of the first aspect of the present disclosure.
[0016] Figure 5 It is a schematic diagram of hidden danger detection rules of an embodiment of the first aspect of the present disclosure.
[0017] Figure 6 It is another schematic diagram of the automatic inspection method of the embodiment of the first aspect of the present disclosure.
[0018] Figure 7 It is a schematic diagram of an automatic inspection device according to an embodiment of the second aspect of the present disclosure. DETAILED DESCRIPTION
[0019] To make the purpose, technical solutions and advantages of the embodiments of the present disclosure more clear, the embodiments of the present disclosure are further described in detail below with reference to the accompanying drawings. Here, the illustrative embodiments of the present disclosure and their descriptions are used to explain the present disclosure, but are not intended to limit the present disclosure.
[0020] Embodiments of the first aspect
[0021] The embodiment of the first aspect of the present disclosure provides an automatic inspection method, Figure 1 It is a schematic diagram of the automatic inspection method of an embodiment of the first aspect of the present disclosure.
[0022] like Figure 1 As shown, the method 100 includes:
[0023] Step 101: Divide a target system including multiple processors into multiple management areas, each management area including at least one subsystem, wherein the subsystem is a system including at least one processor in the management area;
[0024] Step 103: Inspect at least one subsystem within the inspection area according to the inspection plan and inspection rules, and obtain inspection information of the at least one subsystem, the inspection area includes at least one management area, the inspection plan includes at least one inspection area, an inspection opportunity corresponding to the at least one inspection area, and at least one inspection cycle corresponding to the at least one inspection area, and the inspection rules include an operation sequence, a data type, and data corresponding to the data type for obtaining relevant information of the subsystem.
[0025] Therefore, by dividing the target system into areas and performing inspections according to the inspection plan, the target system can be monitored regularly.
[0026] In the disclosed embodiments, the inspection plan can be pre-defined based on user needs or adjusted in real time based on actual conditions, and the disclosed embodiments are not limited thereto. Furthermore, the inspection timing can be, for example, a predetermined inspection start time, such as the first day of each month, or a predetermined inspection trigger condition, such as automatically executing the corresponding inspection plan when the predetermined condition is met, such as triggering the relevant inspection plan after a version with significant changes is released, thereby ensuring the correctness and security of the version and being able to scan for potential problems.
[0027] In addition, in the embodiments of the present disclosure, the target system can be, for example, any system including a processor, such as a graphics processor cluster. Furthermore, for example, the target system can be a system within a certain organization, or a system consisting of a predetermined number of systems within a certain region (e.g., North China, a certain province, a certain city, etc.), and the embodiments of the present disclosure are not limited thereto. Furthermore, the processor can be, for example, a central processing unit and / or a graphics processing unit.
[0028] Figure 2 It is a schematic diagram of the inspection rules of the embodiment of the first aspect of the present disclosure.
[0029] like Figure 2 As shown, the inspection rule 200 includes, for example, at least one data type, such as system log, firmware log, fault log, etc.; at least one predetermined data, such as environmental parameters, firmware version information, hardware information, etc., and the target data is, for example, environmental parameters, firmware version, and other data of the target system.
[0030] In addition, if Figure 2 As shown, the inspection rule 200 may also include at least one operation sequence, which specifies the order of extracting predetermined data, for example, extracting corresponding data in the order of predetermined data (2) of data type (1) → predetermined data (1) of data type (1) → predetermined data (3) of data type (2). However, the embodiment of the present disclosure is not limited to this. For example, for the inspection of version upgrade, only version information may be obtained. In addition, for the inspection of risk situations, the inspection content obtained may be different according to different inspection rules.
[0031] In at least one embodiment, in step 101, the target system can be divided into the multiple management areas according to predetermined parameters, and the predetermined parameters include at least one of the following: the location of the multiple processors, the type of the multiple processors, the factory time or batch of the multiple processors, and the user's predetermined needs.
[0032] In some embodiments, the processor is a graphics processor (GPU).
[0033] In the embodiments of the present disclosure, the predetermined parameters can be designed according to actual needs, and the embodiments of the present disclosure are not limited thereto. In addition, the predetermined parameters can include, for example, only the location of the processor, or can include the location of the processor and the user's predetermined needs, etc., and the embodiments of the present disclosure are not limited thereto.
[0034] In at least one embodiment, in step 101, the target system may be divided according to at least one of the geographical location, spatial location, and network location of the multiple processors. In the disclosed embodiment, the geographical location may be, for example, North China, South China, a province, a city, a street, a building, etc.; the spatial location may be, for example, a row in a computer room, a floor in a building, etc.; and the network location may be, for example, a local area network, a predetermined network address, etc., although the disclosed embodiment does not limit this.
[0035] In at least one embodiment, the types of the multiple processors include, for example, functional types and / or market types. The functional types of the processors are, for example, AI computing, general office use, etc.; the market types of the processors are, for example, high-configuration processors, low-configuration processors, high-end products, low-end products, etc., and the embodiments of the present disclosure do not limit this.
[0036] In at least one embodiment, the user's predetermined requirements include at least one of the following: the geographic locations corresponding to the multiple processors, the computing power of the multiple processors, the batches of the multiple processors, the services provided by the multiple processors, and the users corresponding to the multiple processors. In the disclosed embodiment, the computing power of the processor can be evaluated according to relevant technologies, for example, and the disclosed embodiment is not limited to this; the production time or batch of the processor can be obtained according to relevant technologies, for example, and the disclosed embodiment is not limited to this; the services provided by the processor can be, for example, video services, game services, etc.; and the users corresponding to the processor can be, for example, automobile factories, clothing retailers, etc.
[0037] Those skilled in the art should be aware that the above is merely an example to make the present disclosure clearer and should not be construed as limiting the embodiments of the present disclosure.
[0038] Figure 3 It is another schematic diagram of the automatic inspection method of the embodiment of the first aspect of the present disclosure.
[0039] In at least one embodiment, Figure 3 As shown, method 300 may include:
[0040] Step 301: Divide the management area into multiple sub-management areas according to the user's predetermined needs;
[0041] Step 303: Select at least one sub-management area or select a system where at least one processor in the sub-management area is located for inspection.
[0042] This makes it easier for users to perform more detailed management.
[0043] In addition, the embodiment of the present disclosure may further include, for example, further dividing the sub-management areas according to predetermined requirements.
[0044] In step 301, the user's predetermined requirements include at least one of the following: the geographical locations corresponding to the multiple processors, the computing power of the multiple processors, the batches of the multiple processors, the services provided by the multiple processors, and the users corresponding to the multiple processors.
[0045] Figure 4 It is another schematic diagram of the automatic inspection method of the embodiment of the first aspect of the present disclosure.
[0046] In at least one embodiment, Figure 4 As shown, method 400 may include:
[0047] Step 401: Determine the inspection status of the corresponding subsystem based on the acquired inspection information. Inspection statuses include, for example, normal and faulty. The disclosed embodiments do not limit the specific determination process. For example, if the inspection information contains a fault indication, the subsystem's inspection status is determined to be faulty. If the inspection information does not contain a fault indication, the subsystem is determined to be normal.
[0048] In at least one embodiment, Figure 4 As shown, the method 400 may further include:
[0049] Step 403: If the inspection status of the subsystem is a fault state, collect fault information of the subsystem. For example, collect information such as the fault log of the subsystem, but the embodiment of the disclosure is not limited thereto. For example, environmental parameters, version information, hardware information, etc. may also be collected according to predetermined needs.
[0050] In at least one embodiment, Figure 4 As shown, the method 400 may further include:
[0051] Step 405: If the inspection status of the subsystem is normal, determine whether there is information in the inspection plan indicating that the hidden danger of the subsystem is to be inspected;
[0052] Step 407: If the inspection plan contains information indicating that the hidden danger of the subsystem is to be inspected, the hidden danger of the subsystem is inspected according to the hidden danger detection rule to obtain hidden danger information, wherein the hidden danger detection rule includes a predetermined data type, predetermined data corresponding to the predetermined type, a judgment rule, an operation sequence for extracting data, and a time sequence of data;
[0053] Step 409: Output a list of possible hidden dangers in the subsystem according to the hidden danger information and the hidden danger detection rules.
[0054] In the embodiment of the present disclosure, hidden danger information may include, for example, hardware conditions, manufacturer conditions, software matching conditions, special use conditions, special version conditions, production batches and dates, etc. The embodiment of the present disclosure does not limit this. As long as the information or data may cause hidden dangers, it can be obtained as hidden danger information.
[0055] Figure 5 It is a schematic diagram of hidden danger detection rules of an embodiment of the first aspect of the present disclosure.
[0056] The hidden danger detection rules 500 may, for example, include at least one predetermined data type, such as system logs, firmware logs, fault logs, etc.; at least one predetermined data, such as environmental parameters, version information of firmware, hardware information, manufacturer conditions, software matching conditions, special use conditions, special version conditions, production batches and dates, etc.
[0057] In addition, if Figure 5 As shown, the hidden danger detection rule 500 may also include at least one operation sequence, at least one timing sequence, at least one judgment rule, etc.
[0058] For example, judgment rule (1) is used to judge hidden danger (1). Judgment rule (1) stipulates that corresponding operations are performed in the order specified by operation sequence (1), and corresponding conditions are obtained in the time sequence specified by time sequence (2). Operation sequence (1) stipulates the order of extracting predetermined data, for example, predetermined data y of data type Z → predetermined data x of data type X → predetermined data z of data type Y... etc. Time sequence (2) stipulates the order of conditions, for example: predetermined data y of data type Z is within the predetermined range → predetermined data x of data type X is not within the predetermined range → predetermined data z of data type Y is equal to the predetermined value... etc. If the corresponding operation is performed according to operation sequence (1) and the conditions of time sequence (2) are satisfied, then it is determined that hidden danger (1) exists.
[0059] For another example, judgment rule (2) is used to judge hidden danger (2). Judgment rule (2) specifies, for example, that corresponding operations are performed in the order specified by operation sequence (2), and corresponding conditions are obtained in the time sequence specified by time sequence (n). Operation sequence (2) specifies, for example, the order of extracting predetermined data, for example, predetermined data m of data type M → predetermined data n of data type N → predetermined data x of data type Z, etc., and time sequence (n) specifies, for example, the order of conditions: predetermined data m of data type M is equal to a predetermined value → predetermined data n is not obtained → predetermined data x of data type Z is within a predetermined range, etc. If the corresponding operation is performed according to operation sequence (2) and the conditions of time sequence (n) are satisfied, then it is determined that hidden danger (2) exists.
[0060] In at least one embodiment, Figure 4 As shown, the method 400 may further include:
[0061] Step 411: Update the hidden danger detection rules.
[0062] In step 411, for example, the hidden danger detection rules are added and / or deleted and / or modified. For example, this can be achieved by importing hidden danger detection rules or editing hidden danger detection rules. The embodiment of the present disclosure does not limit how to update hidden danger detection rules.
[0063] In at least one embodiment, Figure 4 As shown, the method 400 may further include:
[0064] Step 413: Query the hidden danger detection rules. This facilitates the user to quickly obtain the hidden danger detection rules of interest.
[0065] Figure 6 It is another schematic diagram of the automatic inspection method of the embodiment of the first aspect of the present disclosure.
[0066] In at least one embodiment, Figure 6 As shown, method 600 may include:
[0067] Step 601: limiting the inspection area that the user can access and / or operate according to the user's authority level; and / or
[0068] Step 603: Limit the inspection plans and / or inspection rules that the user can access and / or operate based on the user's authority level.
[0069] This makes it easier to carry out hierarchical management of inspection areas, inspection plans and inspection rules.
[0070] In the disclosed embodiment, for example, a predetermined number of permission levels are set, and when a user is created, the user is assigned the corresponding permission level. In addition, the inspection areas, inspection plans, and inspection rules that can be accessed and / or operated by each permission level can also be pre-defined.
[0071] In at least one embodiment, Figure 6 As shown, the method 600 may further include:
[0072] Step 605: Receive a user's login request;
[0073] Step 607: If the login request meets the login conditions, obtain the user's permission level.
[0074] In addition, in the embodiments of the present disclosure, user management and user login query may also be included. User management may include, for example, user creation, user deletion, user modification, etc. For details, please refer to relevant technologies, and the embodiments of the present disclosure do not limit this.
[0075] In at least one embodiment, in step 103, the subsystems in the corresponding inspection area are inspected according to the inspection plan and / or inspection rules corresponding to the user's authority level to obtain inspection information of the subsystems.
[0076] In at least one embodiment, Figure 6 As shown, the method 600 may further include:
[0077] Step 609: Update the inspection plan and / or the inspection rules.
[0078] In step 609, for example, the inspection plan and / or the inspection rules are added and / or deleted and / or modified. This can be achieved, for example, by importing the inspection plan and / or the inspection rules or editing the inspection plan and / or the inspection rules. The present embodiment does not limit how to update the inspection plan and / or the inspection rules.
[0079] In at least one embodiment, Figure 6 As shown, the method 600 may further include:
[0080] Step 611: Query the inspection plan and / or the inspection rules. This facilitates the user to quickly obtain the inspection plan and / or inspection rules of interest.
[0081] In at least one embodiment, Figure 6 As shown, the method 600 may further include:
[0082] Step 613: Push information related to the inspection information of the at least one subsystem according to a predetermined path.
[0083] In at least one embodiment, the information related to the inspection information of the at least one subsystem includes at least one of the following: the inspection information of the at least one subsystem, the inspection status of the at least one subsystem, fault information of the at least one subsystem, and hidden danger information of the at least one subsystem. For example, information indicating a result such as "normal" or "faulty" or a list of faults or hidden dangers may be pushed, although this is not limited in the present embodiment.
[0084] In at least one embodiment, the predetermined path includes at least one of display on a display device, email, WeChat, and text message. This facilitates timely access to inspection results by users, thereby enabling timely response to faults, hidden dangers, and risks in the target system.
[0085] According to the embodiment of the first aspect of the present disclosure, the target system can be regularly monitored by dividing the target system into areas and performing inspections according to an inspection plan.
[0086] Embodiments of the second aspect
[0087] The second aspect of the present disclosure provides an automatic inspection device. The principle of solving the problem by the automatic inspection device of the present disclosure is similar to that of the above-mentioned automatic inspection method. Therefore, the implementation of the automatic inspection device can refer to the implementation of the above-mentioned automatic inspection method, and the repeated parts will not be repeated.
[0088] Figure 7 It is a schematic diagram of an automatic inspection device according to an embodiment of the second aspect of the present disclosure.
[0089] like Figure 7 As shown, the automatic inspection device 700 includes an area management unit 701 and an inspection unit 702. The area management unit 701 divides the target system containing multiple processors into multiple management areas, each management area contains at least one subsystem, and the subsystem is a system containing at least one processor in the management area; the inspection unit 702 inspects at least one subsystem in the inspection area according to the inspection plan and inspection rules, and obtains inspection information of the at least one subsystem. The inspection area includes at least one management area, and the inspection plan includes at least one inspection area, an inspection time corresponding to the at least one inspection area, and an inspection period corresponding to the at least one inspection area. The inspection rules include an operation sequence, a data type, and data corresponding to the data type for obtaining relevant information of the subsystem.
[0090] In at least one embodiment, the area management unit 701 divides the target system into the multiple management areas according to predetermined parameters, and the predetermined parameters include at least one of the following: the location of the multiple processors, the type of the multiple processors, the factory time or batch of the multiple processors, and the user's predetermined needs.
[0091] In at least one embodiment, the user's predetermined requirements include at least one of the following: the geographical locations corresponding to the multiple processors, the computing power of the multiple processors, the batches of the multiple processors, the services provided by the multiple processors, and the users corresponding to the multiple processors.
[0092] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 can also include a sub-area management unit 703 and a selection unit 704. The sub-area management unit 703 divides the management area into multiple sub-management areas according to the user's predetermined needs, and the selection unit 704 selects at least one sub-management area or selects the system where at least one processor in the sub-management area is located for inspection.
[0093] In at least one embodiment, the user's predetermined requirements include at least one of the following: the geographical locations corresponding to the multiple processors, the computing power of the multiple processors, the batches of the multiple processors, the services provided by the multiple processors, and the users corresponding to the multiple processors.
[0094] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may further include a first judgment unit 705 , which judges the inspection status of the corresponding subsystem according to the obtained inspection information.
[0095] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may further include a fault collection unit 706. The fault collection unit 706 collects fault information of the subsystem when the inspection status of the subsystem is a fault status.
[0096] In at least one embodiment, Figure 7As shown, the automatic inspection device 700 may further include a second judgment unit 707, a hidden danger detection unit 708 and an output unit 709. When the inspection status of the subsystem is normal, the second judgment unit 707 judges whether there is information in the inspection plan indicating that the hidden dangers of the subsystem are to be inspected; when there is information in the inspection plan indicating that the hidden dangers of the subsystem are to be inspected, the hidden danger detection unit 708 inspects the hidden dangers of the subsystem according to the hidden danger detection rules to obtain hidden danger information. The hidden danger detection rules include a predetermined type of data, predetermined data corresponding to the predetermined type, a judgment rule, an operation sequence for extracting data and a time series sequence of data; the output unit 709 outputs a list of possible hidden dangers of the subsystem according to the hidden danger information and the hidden danger detection rules.
[0097] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may further include a first updating unit 710, which updates the hidden danger detection rule.
[0098] In at least one embodiment, the first updating unit 710 adds and / or deletes and / or modifies the hidden danger detection rules.
[0099] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may further include a first query unit 711, and the first query unit 711 queries the hidden danger detection rule.
[0100] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may also include a first permission management unit 712 and / or a second permission management unit 713. The first permission management unit 712 limits the inspection areas that the user can access and / or operate according to the user's permission level; the second permission management unit 713 limits the inspection plans and / or inspection rules that the user can access and / or operate according to the user's permission level.
[0101] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may further include a login unit 714 and a permission acquisition unit 715. The login unit 714 receives a login request from a user; if the login request meets the login conditions, the permission acquisition unit 715 acquires the permission level of the user.
[0102] In at least one embodiment, the inspection unit 702 inspects the subsystems within the corresponding inspection area according to the inspection plan and / or inspection rules corresponding to the user's authority level, and obtains inspection information of the subsystems.
[0103] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may further include a second updating unit 716 , which updates the inspection plan and / or the inspection rules.
[0104] In at least one embodiment, the second updating unit 716 adds and / or deletes and / or modifies the inspection plan and / or the inspection rule.
[0105] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may further include a second query unit 717, and the second query unit 717 queries the inspection plan and / or the inspection rule.
[0106] In at least one embodiment, Figure 7 As shown, the automatic inspection device 700 may further include a pushing unit 718, which pushes information related to the inspection information of the at least one subsystem along a predetermined path.
[0107] In at least one embodiment, the information related to the inspection information of the at least one subsystem includes at least one of the following information: the inspection information of the at least one subsystem, the inspection status of the at least one subsystem, the fault information of the at least one subsystem, and the hidden danger information of the at least one subsystem.
[0108] In at least one embodiment, the predetermined path includes at least one of display by a display device, email, WeChat, and text message.
[0109] In at least one embodiment, the region management unit 701 divides the target system according to at least one of geographical locations, spatial locations, and network locations of the multiple processors.
[0110] According to an embodiment of the second aspect of the present disclosure, the target system can be regularly monitored by dividing the target system into areas and performing inspections according to an inspection plan.
[0111] An embodiment of the present disclosure also provides a computer device, including a memory, a processor, and a computer program stored in the memory and executable on the processor. When the processor executes the computer program, the automatic inspection method of the embodiment of the first aspect described above is implemented.
[0112] An embodiment of the present disclosure further provides a computer-readable storage medium storing a computer program. When the computer program is executed by a processor, the automatic inspection method of the embodiment of the first aspect described above is implemented.
[0113] An embodiment of the present disclosure further provides a computer program product, which includes a computer program. When the computer program is executed by a processor, it implements the automatic inspection method of the embodiment of the first aspect described above.
[0114] The embodiment of the present disclosure marks the number of each step in the automatic inspection method, but the order of the numbers does not represent the execution order of the steps. The execution order of the steps can be arbitrarily combined according to actual conditions, and the embodiment of the present disclosure is not limited to this.
[0115] Those skilled in the art will appreciate that the embodiments of the present disclosure may be provided as methods, systems, or computer program products. Therefore, the present disclosure may take the form of a complete hardware embodiment, a complete software embodiment, or an embodiment combining software and hardware. Furthermore, the present disclosure may take the form of a computer program product implemented on one or more computer-usable storage media (including but not limited to magnetic disk storage, CD-ROM, optical storage, etc.) containing computer-usable program code.
[0116] The present disclosure is described with reference to the flowcharts and / or block diagrams of the methods, devices (systems), and computer program products according to the embodiments of the present disclosure. It should be understood that each process and / or box in the flowchart and / or block diagram, as well as the combination of the processes and / or boxes in the flowchart and / or block diagram, can be implemented by computer program instructions. These computer program instructions can be provided to a processor of a general-purpose computer, a special-purpose computer, an embedded processor, or other programmable data processing device to produce a machine, so that the instructions executed by the processor of the computer or other programmable data processing device generate instructions for implementing the processes in the flowchart and / or block diagram. Figure 1 a process or multiple processes and / or boxes Figure 1 A device that provides the functions specified in a block or multiple blocks.
[0117] These computer program instructions may also be stored in a computer readable memory that can direct a computer or other programmable data processing device to work in a specific manner, so that the instructions stored in the computer readable memory produce an article of manufacture comprising an instruction device, which implements the process Figure 1 a process or multiple processes and / or boxes Figure 1 The function specified in one or more boxes.
[0118] These computer program instructions can also be loaded onto a computer or other programmable data processing device so that a series of operational steps are executed on the computer or other programmable device to produce a computer-implemented process, thereby providing the instructions executed on the computer or other programmable device for implementing the process. Figure 1 a process or multiple processes and / or boxes Figure 1 A step that specifies a function in one or more boxes.
[0119] The specific embodiments described above further illustrate the purpose, technical solutions and beneficial effects of the present disclosure. It should be understood that the above description is only a specific embodiment of the present disclosure and is not intended to limit the scope of protection of the present disclosure. Any modifications, equivalent substitutions, improvements, etc. made within the spirit and principles of the present disclosure should be included in the scope of protection of the present disclosure.
Claims
1. An automatic inspection method, characterized in that: The automatic inspection method comprises: Dividing a target system including multiple processors into multiple management areas, each management area including at least one subsystem, wherein the subsystem is a system including at least one processor in the management area; Inspect at least one subsystem in an inspection area according to an inspection plan and an inspection rule, and obtain inspection information of the at least one subsystem, wherein the inspection area includes at least one management area, the inspection plan includes at least one inspection area, an inspection opportunity corresponding to the at least one inspection area, and at least one of an inspection period corresponding to the at least one inspection area, and the inspection rule includes an operation sequence, a data type, and data corresponding to the data type for obtaining relevant information of the subsystem; When the inspection status of the subsystem is normal, determining whether there is information in the inspection plan indicating that the hidden dangers of the subsystem are to be inspected; In the case where the inspection plan contains information indicating that the hidden dangers of the subsystem are to be inspected, the hidden dangers of the subsystem are inspected according to the hidden danger detection rule to obtain hidden danger information, wherein the hidden danger detection rule includes a predetermined type of data, predetermined data corresponding to the predetermined type, a judgment rule, an operation sequence for extracting data, and a time sequence sequence of data; A list of possible hidden dangers of the subsystem is outputted according to the hidden danger information and the hidden danger detection rule.
2. The automatic inspection method according to claim 1, characterized in that: In the step of dividing a target system comprising multiple processors into multiple management areas, the multiple processors of the target system are divided into corresponding management areas according to predetermined parameters, and the predetermined parameters include at least one of the following: the location of the multiple processors, the type of the multiple processors, the factory time or batch of the multiple processors, and the user's predetermined requirements.
3. The automatic inspection method according to claim 2, characterized in that: The user's predetermined requirements include at least one of the following: geographical locations corresponding to the multiple processors, computing power of the multiple processors, batches of the multiple processors, services provided by the multiple processors, and users corresponding to the multiple processors.
4. The automatic inspection method according to claim 1, characterized in that: The automatic inspection method also includes: Divide the management area into multiple sub-management areas according to the user's predetermined needs, At least one sub-management area or a system where at least one processor in the sub-management area is located is selected for inspection.
5. The automatic inspection method according to claim 4, characterized in that: The user's predetermined requirements include at least one of the following: geographical locations corresponding to the multiple processors, computing power of the multiple processors, batches of the multiple processors, services provided by the multiple processors, and users corresponding to the multiple processors.
6. The automatic inspection method according to claim 1, characterized in that: The automatic inspection method also includes: The inspection status of the corresponding subsystem is determined according to the acquired inspection information.
7. The automatic inspection method according to claim 6, characterized in that: The automatic inspection method also includes: When the inspection state of the subsystem is a fault state, fault information of the subsystem is collected.
8. The automatic inspection method according to claim 1, characterized in that: The automatic inspection method also includes: The hidden danger detection rule is updated.
9. The automatic inspection method according to claim 8, characterized in that: The step of updating the hidden danger detection rules includes: adding and / or deleting and / or modifying the hidden danger detection rules.
10. The automatic inspection method according to claim 1, characterized in that: The automatic inspection method also includes: The hidden danger detection rule is queried.
11. The automatic inspection method according to any one of claims 1 to 10, characterized in that: The automatic inspection method also includes: Limit the inspection areas that users can access and / or operate based on their authority levels; and / or The inspection plans and / or inspection rules that a user can access and / or operate are restricted according to the user's authority level.
12. The automatic inspection method according to claim 11, characterized in that: The automatic inspection method also includes: Receive the user's login request; When the login request meets the login conditions, the permission level of the user is obtained.
13. The automatic inspection method according to claim 12, characterized in that: In the step of inspecting at least one subsystem within the inspection area according to the inspection plan and inspection rules and obtaining the inspection information of the at least one subsystem, the subsystem within the corresponding inspection area is inspected according to the inspection plan and / or inspection rules corresponding to the user's authority level to obtain the inspection information of the subsystem.
14. The automatic inspection method according to any one of claims 1 to 10, characterized in that: The automatic inspection method also includes: The inspection plan and / or the inspection rule are updated.
15. The automatic inspection method according to claim 14, characterized in that: The step of updating the inspection plan and / or the inspection rules includes: adding and / or deleting and / or modifying the inspection plan and / or the inspection rules.
16. The automatic inspection method according to any one of claims 1 to 10, characterized in that: The automatic inspection method also includes: Query the inspection plan and / or the inspection rules.
17. The automatic inspection method according to any one of claims 1 to 10, characterized in that: The automatic inspection method also includes: Information related to the inspection information of the at least one subsystem is pushed according to a predetermined path.
18. The automatic inspection method according to claim 17, characterized in that: The information related to the inspection information of the at least one subsystem includes at least one of the following information: the inspection information of the at least one subsystem, the inspection status of the at least one subsystem, the fault information of the at least one subsystem, and the hidden danger information of the at least one subsystem.
19. The automatic inspection method according to claim 17, characterized in that: The predetermined path includes at least one of display by a display device, email, WeChat and text message.
20. The automatic inspection method according to any one of claims 1 to 10, characterized in that: In the step of dividing the target system including a plurality of processors into a plurality of management areas, The target system is divided according to at least one of geographical locations, spatial locations, and network locations where the multiple processors are located.
21. An automatic inspection device, characterized in that: The automatic inspection device comprises: A region management unit, which divides a target system including a plurality of processors into a plurality of management regions, each management region including at least one subsystem, wherein the subsystem is a system including at least one processor in the management region; an inspection unit, which inspects at least one subsystem in an inspection area according to an inspection plan and an inspection rule, and obtains inspection information of the at least one subsystem, wherein the inspection area includes at least one management area, the inspection plan includes at least one inspection area, an inspection opportunity corresponding to the at least one inspection area, and at least one of an inspection period corresponding to the at least one inspection area, and the inspection rule includes an operation sequence, a data type, and data corresponding to the data type for obtaining relevant information of the subsystem; a second judgment unit, which, when the inspection state of the subsystem is normal, judges whether there is information in the inspection plan indicating that the hidden dangers of the subsystem are to be inspected; a hidden danger detection unit, which, when the inspection plan contains information indicating that the hidden dangers of the subsystem are to be inspected, inspects the hidden dangers of the subsystem according to hidden danger detection rules to obtain hidden danger information, wherein the hidden danger detection rules include a predetermined type of data, predetermined data corresponding to the predetermined type, a judgment rule, an operation sequence for extracting data, and a time sequence sequence of data; An output unit is configured to output a list of possible hidden dangers of the subsystem according to the hidden danger information and the hidden danger detection rule.
22. A computer device comprising a memory, a processor and a computer program stored in the memory and executable on the processor, characterized in that: When the processor executes the computer program, the automatic inspection method according to any one of claims 1 to 20 is implemented.
23. A computer-readable storage medium, characterized in that: The computer-readable storage medium stores a computer program, and when the computer program is executed by a processor, the automatic inspection method according to any one of claims 1 to 20 is implemented.
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