Method and apparatus for sub-energizing power flow measurement based on electron accelerator

Abstract

The application provides an electron accelerator-based electric current sub-energy measurement method and device, which is applied to a quantum current measurement system, and the strength of a magnetic field is determined by the energy of a reference electron beam emitted by a microwave electron gun and the deflection amount of the reference electron beam on a secondary iron; the energy of a to-be-measured electron beam is obtained by analyzing a beam spot image of the to-be-measured electron beam on a fluorescent screen captured by a CCD camera; the energy of the to-be-measured electron beam is compared with the energy of the reference electron beam, and the energy of the to-be-measured electron beam is adjusted according to the comparison result. The existing quantum current reference device counts based on single electrons, resulting in a narrow range of counting values, and there is uncertainty in the electron parameters in the generation, transmission and counting process of the electron beam. The scheme introduces the technology in the field of particle accelerators, generates and counts the electron beam by using the accelerator technology, can overcome the problem of small range caused by counting based on single electrons, and can use the magnetic deflection method to measure the energy of the electron beam in real time and adjust the experimental parameters in time.

Description

Technical Field

[0001] This invention relates to energy measurement methods, and more particularly to a method and apparatus for measuring the quantized energy of electric current based on an electron accelerator. Background Technology

[0002] With the rapid development of the power Internet of Things industry, traditional physical, hierarchical, and long-chain methods of traceability can no longer meet the needs of such large-scale ubiquitous applications. Establishing quantum benchmarks has become a hot topic in the development of electrical metrology. Therefore, the accuracy and reliability of measurement are particularly important.

[0003] Current common quantum current metering devices are designed based on single-electron counting, resulting in a narrow measurement range. Furthermore, the electron parameters exhibit uncertainties during electron beam generation, transmission, and counting, which affects the accuracy of electron beam energy measurements. Summary of the Invention

[0004] To address the aforementioned shortcomings, this solution provides a method and apparatus for measuring the quantized energy of electric current based on an electron accelerator, further improving the range of electron counting.

[0005] The first aspect of this application provides a method for measuring the quantized energy of electric current based on an electron accelerator, comprising:

[0006] The magnetic field strength is determined by the energy of the reference electron beam emitted by the microwave electron gun and the deflection of the reference electron beam in the secondary iron; wherein, the energy of the reference electron beam is a preset reference value;

[0007] The energy of the electron beam under test is obtained by analyzing the beam spot image of the electron beam under test captured on the fluorescent screen by the CCD camera.

[0008] The energy of the electron beam under test is compared with the energy of the reference electron beam, and the energy of the electron beam under test is adjusted according to the comparison result.

[0009] Optionally, the magnetic field strength is determined by the energy of the reference electron beam emitted by the microwave electron gun and the deflection of the reference electron beam in the secondary iron, including:

[0010] The deflection of the reference electron beam in the secondary iron is determined by the deflection effect of the reference electron beam.

[0011] Optionally, the energy of the electron beam under test is obtained by analyzing the beam spot image of the electron beam under test captured on the fluorescent screen by the CCD camera, including:

[0012] Analyze the deviation in the beam spot center position between the electron beam under test and the reference electron beam.

[0013] Based on the deviation and the horizontal deviation-energy deviation relationship curve, the energy of the electron beam under test is obtained;

[0014] In the multi-particle model, the center position of the electron beam under test is the average of the particle positions of each electron beam under test.

[0015] Optionally, comparing the energy of the electron beam under test with the energy of the reference electron beam, and adjusting the energy of the electron beam under test based on the comparison result, includes:

[0016] The energy of the electron beam under test is adjusted so that its energy approaches that of the reference electron beam.

[0017] Optionally, adjusting the energy of the electron beam under test includes:

[0018] The energy of the electron beam under test is adjusted by changing the cathode material and laser frequency of the microwave electron gun.

[0019] A second aspect of this application provides an apparatus for measuring the quantized energy of electric current based on an electron accelerator, the apparatus comprising:

[0020] A determining unit is used to determine the magnetic field strength based on the energy of the reference electron beam emitted by the microwave electron gun and the deflection of the reference electron beam in the secondary iron; wherein the energy of the reference electron beam is a preset reference value;

[0021] The analysis unit is used to obtain the energy of the electron beam under test by analyzing the beam spot image of the electron beam under test captured on the fluorescent screen by the CCD camera;

[0022] An adjustment unit is used to compare the energy of the electron beam under test with the energy of the reference electron beam, and adjust the energy of the electron beam under test according to the comparison result.

[0023] Optionally, the determining unit is further configured to:

[0024] The deflection of the reference electron beam in the secondary iron is determined by the deflection effect of the reference electron beam.

[0025] Optionally, the analysis unit is also used for;

[0026] The deviation of the beam spot center position between the electron beam under test and the reference electron beam is analyzed, and the energy of the electron beam under test is obtained based on the deviation and the horizontal deviation-energy deviation relationship curve; wherein, in the multi-particle model, the center position of the electron beam under test is the average value of the particle positions of each electron beam under test.

[0027] Optionally, the adjustment unit is further configured to;

[0028] The energy of the electron beam under test is adjusted so that its energy approaches that of the reference electron beam.

[0029] Optionally, the adjustment unit is further configured to;

[0030] The energy of the electron beam under test is adjusted by changing the cathode material and laser frequency of the microwave electron gun.

[0031] This application provides a method for measuring the quantized energy of electrical current based on an electron accelerator, applied to a quantum current metering system. The magnetic field strength is determined by the energy of a reference electron beam emitted from a microwave electron gun and the deflection of the reference electron beam in a secondary iron column. The energy of the reference electron beam is a preset reference value. The energy of the electron beam under test is obtained by analyzing the beam spot image of the electron beam under test captured on a fluorescent screen by a CCD camera. The energy of the electron beam under test is compared with the energy of the reference electron beam, and the energy of the electron beam under test is adjusted based on the comparison result. This scheme introduces technology from the field of particle accelerators, utilizing accelerator technology to generate and count electron beams, overcoming the problem of small measurement range caused by single-electron counting. The magnetic deflection method allows for real-time measurement of the electron beam energy, enabling timely adjustment of experimental parameters. Attached Figure Description

[0032] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are only embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on the provided drawings without creative effort.

[0033] Figure 1 A flowchart of a method for measuring the quantized energy of electric current based on an electron accelerator is provided for this embodiment;

[0034] Figure 2 This is the overall design diagram of the quantum current metering system provided in this embodiment;

[0035] Figure 3 This is a schematic diagram of the energy dispersive spectrometer provided in this embodiment;

[0036] Figure 4 This is a three-dimensional model diagram of secondary iron provided in this embodiment;

[0037] Figure 5 This is a two-dimensional distribution diagram of the internal magnetic field of a secondary iron provided in this embodiment;

[0038] Figure 6This is a diagram showing the horizontal displacement of the electron beam spot center on the fluorescent screen provided in this embodiment;

[0039] Figure 7 The trajectory diagram of different particles in the electron beam passing through the energy spectrometer provided in this embodiment;

[0040] Figure 8 This is a schematic diagram of a device for measuring the quantized energy of electric current based on an electron accelerator, as provided in this embodiment. Detailed Implementation

[0041] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0042] First, it should be noted that the method provided in this embodiment can be executed by a terminal, which can be any terminal device suitable for quantum current metering systems, including but not limited to computers and tablets. In this embodiment, the electron beam includes, but is not limited to, a reference electron beam and a test electron beam.

[0043] Please see Figure 1 The flowchart below shows a method for measuring the quantized energy of electric current based on an electron accelerator, as provided in this embodiment.

[0044] To facilitate understanding of the method provided in this embodiment, a brief introduction to the system used to implement the method is provided below. Please refer to [link to relevant documentation]. Figure 2 This is the overall design diagram of the quantum current metering system provided in this embodiment. The system includes a microwave electron gun, a CCD camera, a secondary iron plate, and a fluorescent screen.

[0045] Please see Figure 3 The diagram shows the energy spectrometer provided in this embodiment. The energy spectrometer is part of the overall design of the quantum current metering system and consists of a secondary iron, a fluorescent screen, and a CCD camera, used to measure the energy of the electron beam.

[0046] in, Figure 4The diagram shows a three-dimensional model of the secondary iron in this system. This secondary iron has a certain deflection angle, providing a suitable magnetic field for electron beam deflection. The deflection angle of the secondary iron is determined by the energy of the electron beam and its actual trajectory. Appropriate offset segments are left before and after the secondary iron, allowing the electron beam to continue drifting after leaving its magnetic field. This increases the resolution of electron beam energy measurement. The length of the drift segment is determined by the required resolution for measuring the electron beam energy and the resolution of the fluorescent screen. The resolution of the fluorescent screen and CCD camera meets the experimental observation requirements, and the CCD camera resolution should be as small as possible, at least 30 μm.

[0047] The lengths of the two drift segments before and after the secondary iron stage can be determined as follows:

[0048] The microwave electron gun emits a test electron beam. The beam's path near the secondary iron is divided into three segments: a drift segment before entering the secondary iron, a deflection segment near the secondary iron, and a drift segment after leaving the secondary iron. The lengths of the drift segment before and after leaving the secondary iron are 'a' and 'b', respectively. After exiting the drift segment near the secondary iron, the test electron beam continues to move in a straight line along different divergence angles until it lands on the fluorescent screen. The position where the test electron beam lands on the fluorescent screen can be calculated using the transfer matrix. The transfer matrix for the three-segment model is calculated using Equation 2.

[0049]

[0050] in,

[0051]

[0052]

[0053] Therefore, Equation 3 can be obtained, which is used to calculate the lateral position of the electron beam.

[0054] X = m 11 x0+m 12 x'0+m 13 δ-(2)

[0055] in,

[0056] m 11 =cosθ-bsinθρ

[0057] m 12 =(a+b)cosθ-absinθρ+ρsinθ

[0058] m 13 =ρ(1-cosθ)+bsinθ

[0059] In Equations 1 and 2, θ is the angle at which the electron beam deflects in the secondary iron, and X is related to the resolution of the CCD camera.

[0060] The following uses specific structural parameters as an example to illustrate the process of measuring the electron beam under test using the energy spectrometer of this embodiment, wherein the structural parameters include the aforementioned deflection angle and drift segment length.

[0061] When appropriate deflection angle θ and drift segment lengths a and b are selected, the lateral position and energy shift of the electron beam spot exhibit good linearity. In this embodiment, the deflection angle θ is 60°, and the drift segment lengths a and b are 30 cm each.

[0062] The method includes the following steps.

[0063] S101 determines the magnetic field strength by the energy of the reference electron beam emitted by the microwave electron gun and the deflection of the reference electron beam in the second-order iron.

[0064] The energy of the reference electron beam is a preset reference value.

[0065] The following is a method for determining magnetic induction intensity provided in this embodiment.

[0066] In this embodiment, the preset energy of the reference electron beam is 3 MeV. The terminal uses a microwave electron gun to emit the reference electron beam. The reference electron beam is deflected when it passes through the secondary iron. Since the energy of the reference electron beam is in the low-energy range in this embodiment, a C-type magnet is used for the secondary iron. After leaving the secondary iron, the reference electron beam moves in a straight line and eventually falls on the fluorescent screen connected to the secondary iron. The terminal uses a CCD camera to observe the beam spot image of the reference electron beam on the fluorescent screen.

[0067]

[0068] Formula 3 above is the equation of motion for the deflection of electrons in a magnetic field. Where E is the total energy of the electron beam, E0 is the rest energy of the electron beam, ρ is the deflection of the reference electron beam in the secondary iron, and B is the magnetic field strength of the secondary iron. In this embodiment, the rest energy E0 of the electron beam is 0.511 MeV, and the energy of the reference electron beam is E... k The total energy of the electron beam is 3 MeV, which equals the rest energy of the electron beam plus the energy of the electron beam.

[0069] When the terminal observes, using a CCD camera, that the reference electron beam leaves the secondary iron and eventually lands at the preset landing position, then the deflection of the reference electron beam is equal to the deflection of the secondary iron. However, if the reference electron beam does not land at the preset landing position, the terminal will adjust the magnetic field strength of the secondary iron to ensure that the reference electron beam eventually lands at the preset landing position. At this point, the terminal can obtain the deflection ρ of the reference electron beam in the secondary iron by measuring the offset of the reference electron beam between the landing position on the fluorescent screen and the preset landing position. Since E k Since E0 is known, the magnetic field strength of the second-order iron can be calculated according to Equation 1.

[0070] To make the magnetic field within the good field area more even, magnetic field padding technology should be used to optimize the magnetic field within the good field area. Here, the good field area refers to... Figure 3 The region in which the uniformity of the magnetic field in the horizontal direction of the secondary iron reaches a certain index. The uniformity of the magnetic field refers to the root of the uniformity of the deviation between the magnetic field sample value and the magnetic field center value. Figure 5 This is a two-dimensional distribution diagram of the magnetic field inside a secondary iron anode, which is an optimized schematic diagram of the magnetic field.

[0071] The above method uses magnetic deflection to determine the magnetic flux density of a second-order iron. Compared with other methods for determining magnetic flux density, the magnetic deflection method has the advantage of accurate measurement.

[0072] S102 obtains the energy of the electron beam under test by analyzing the beam spot image of the electron beam under test captured on the fluorescent screen by the CCD camera.

[0073] In this embodiment, the electron beam to be tested is the electron beam whose energy needs to be measured.

[0074] By observing the positions of different electron beams landing on the fluorescent screen after passing through a secondary iron anode using a CCD camera, and calculating the deviations between the landing positions of different electron beams and the reference electron beam, and combining these deviations with the energy differences of the different electron beams and the reference electron beam, we can obtain... Figure 6 .from Figure 6 It can be seen that the lateral position and energy shift of the electron beam spot have good linearity.

[0075] from Figure 6 The formula for the relationship between horizontal deviation and energy deviation can be obtained as follows:

[0076] Δx[mm]=147.2818·ΔE[MeV]+0.0531-(4)

[0077] In Formula 4, Δx represents the horizontal deviation between the center of the electron beam under test and the center of the reference electron beam, and ΔE represents the energy deviation between the electron beam under test and the reference electron beam. In the multi-particle model, the center positions of the electron beam under test and the reference electron beam are the average positions of each particle in the electron beam. When the CCD camera resolution reaches 30 μm, the energy measurement accuracy can reach 0.0002 MeV.

[0078] The process of the electron beam to be tested falling on the fluorescent screen can be referred to in step S101. The terminal uses a CCD camera to observe the beam spot of the electron beam to be tested on the fluorescent screen, and can obtain the horizontal deviation Δx between the center of the electron beam to be tested and the center of the reference electron beam. Then, it is substituted into Equation 4 for calculation, and the deflection ΔE of the energy of the electron beam to be tested and the energy of the reference electron beam can be obtained. Since the energy of the reference electron beam is 3MeV, the energy of the electron beam to be tested can be calculated accordingly.

[0079] The following is a method for determining the energy of the electron beam to be tested, provided in this embodiment.

[0080] In the same magnetic field, electrons of different energies in the electron beam are deflected with different radii, resulting in different divergence angles at the secondary iron exit. After passing through the drift segment b, the transverse direction of the electron beam is significantly elongated. The length of the drift segment b affects the resolution of the quantum current measurement system; the longer b is, the higher the resolution. However, b cannot be extended indefinitely. This is because the experimental space is finite, and also because as the length of b increases, the beam spot size of the electron beam falling on the fluorescent screen increases, causing beam loss. To ensure that the electrons in the test beam are deflected in a good field region and to reduce beam loss on the fluorescent screen, the energy deviation between the test electron beam and the reference electron beam needs to be less than or equal to 10%.

[0081] The following is another method for determining the energy of the electron beam to be tested, provided in this embodiment.

[0082] Please see Figure 7 This embodiment provides the trajectory diagram of different particles in the electron beam after passing through the energy dispersive spectrometer. Electron beams of different energies will move along different paths after passing through the secondary iron. When the energy of the electron beam under test deviates from that of the reference electron beam by more than 10%, the terminal needs to adjust the excitation current of the energy dispersive spectrometer to change the magnetic field strength of the secondary iron, causing the electron beam under test to deflect along a preset deflection radius until the CCD camera observes that the center position of the beam spot of the electron beam under test is the preset landing point. At this time, the energy of the electron beam under test can be calculated based on the one-to-one correspondence between the excitation current and the magnetic field, and between the magnetic field and the energy. Specific correspondences can be found in the excitation current-magnetic field and magnetic field-energy calculation formulas.

[0083] During the acceleration, transmission, and measurement of an electron beam, the interaction between the electron beam and external electromagnetic fields, as well as the Coulomb repulsion force within the electron beam, affects the parameters of the electron beam, increasing the uncertainty in the measurement and thus reducing statistical accuracy. The magnetic deflection method described above, used to determine the energy of the electron beam, allows for real-time observation of beam changes, timely adjustment of experimental parameters, and improvement of the quality of the electron beam bundle.

[0084] S103 compares the energy of the electron beam to be tested with the energy of the reference electron beam, and adjusts the energy of the electron beam to be tested based on the comparison result.

[0085] The terminal compares the energy of the electron beam under test with the energy of the reference electron beam, obtains the comparison result, and adjusts the energy of the electron beam under test based on the comparison result. The terminal adjusts the energy of the electron beam under test by changing the cathode material of the microwave electron gun or changing the laser frequency, so that the energy of the electron beam under test approaches the energy of the reference electron beam. When the electron beam energy changes, the magnetic induction intensity of the second-order iron should also change accordingly. Specific changes can be found in the magnetic field-electron beam energy table. This ensures that the trajectory of the electron beam under test is close to the central magnetic field trajectory of the second-order iron, thus keeping the electron beam under test within a good field region and improving the accuracy of energy measurement.

[0086] This application provides a method for measuring the quantized energy of electrical current based on an electron accelerator, applied to a quantum current metering system. The method includes: determining the magnetic field strength using the energy of a reference electron beam emitted by a microwave electron gun and the deflection of the reference electron beam in a second-order iron column; wherein the energy of the reference electron beam is a preset reference value; obtaining the energy of the electron beam to be measured by analyzing the beam spot image of the electron beam to be measured captured on a fluorescent screen by a CCD camera; comparing the energy of the electron beam to be measured with the energy of the reference electron beam, and adjusting the energy of the electron beam to be measured based on the comparison result. This scheme introduces technology from the field of particle accelerators, utilizing accelerator technology to generate and count electron beams, overcoming the problem of small measurement range caused by single-electron counting. The use of magnetic deflection allows for real-time measurement of the electron beam energy, enabling timely adjustment of experimental parameters.

[0087] Based on the electron accelerator-based power current quantization energy measurement method provided in this application, this application also provides an electron accelerator-based power current quantization energy measurement device. Please refer to [link to relevant documentation]. Figure 8 The diagram below shows the structure of the device, which includes the following units.

[0088] The determining unit 801 is used to determine the magnetic field strength by the energy of the reference electron beam emitted by the microwave electron gun and the deflection of the reference electron beam in the secondary iron; wherein, the energy of the reference electron beam is a preset reference value;

[0089] Analysis unit 802 is used to obtain the energy of the electron beam under test by analyzing the beam spot image of the electron beam under test captured on the fluorescent screen by the CCD camera;

[0090] The adjustment unit 803 is used to compare the energy of the electron beam under test with the energy of the reference electron beam, and adjust the energy of the electron beam under test according to the comparison result.

[0091] Optionally, the determining unit 801 is also used for:

[0092] The deflection of the reference electron beam in secondary iron is determined by the deflection effect of the reference electron beam.

[0093] Optionally, the analysis unit 802 is also used for;

[0094] The deviation of the beam spot center position between the electron beam to be tested and the reference electron beam is analyzed. Based on the deviation and the relationship curve between the horizontal deviation and the energy deviation, the energy of the electron beam to be tested is obtained. In the multi-particle model, the center position of the electron beam to be tested is the average value of the particle positions of each electron beam to be tested.

[0095] Optionally, the adjustment unit 803 is also used for;

[0096] Adjust the energy of the electron beam under test so that it approaches the energy of the reference electron beam.

[0097] Optionally, the adjustment unit 803 is also used for;

[0098] The energy of the electron beam under test can be adjusted by changing the cathode material and laser frequency of the microwave electron gun.

[0099] The specific working principle of the power current quantization energy measurement device based on electron accelerator provided in this embodiment can be found in the relevant steps of the power current quantization energy measurement method based on electron accelerator provided in any embodiment of this application, and will not be repeated here.

[0100] This application provides a quantum energy measurement device for electric current based on an electron accelerator, applied to a quantum current metering system. The device includes: a determination unit 801 that determines the magnetic field strength by the energy of a reference electron beam emitted by a microwave electron gun and the deflection of the reference electron beam in a second-order iron column; wherein the energy of the reference electron beam is a preset reference value; an analysis unit 802 that obtains the energy of the electron beam under test by analyzing the beam spot image of the electron beam under test captured on a fluorescent screen by a CCD camera; and an adjustment unit 803 that compares the energy of the electron beam under test with the energy of the reference electron beam and adjusts the energy of the electron beam under test according to the comparison result. This scheme utilizes accelerator technology to generate and count electron beams, which can overcome the problem of small measurement range caused by single-electron counting. The use of magnetic deflection method can measure the energy of the electron beam in real time and adjust experimental parameters in a timely manner.

[0101] Finally, it should be noted that in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0102] It should be noted that the concepts of "first" and "second" mentioned in this application are only used to distinguish different devices, modules or units, and are not used to limit the order of functions performed by these devices, modules or units or their interdependencies.

[0103] Those skilled in the art will be able to implement or use this application. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the general principles defined herein may be implemented in other embodiments without departing from the spirit or scope of this application. Therefore, this application is not to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An electron accelerator-based power current sub-quantum energy measurement method, characterized by, The method is applied to a quantum current measurement system, the quantum current measurement system comprising a microwave electron gun, a charge-coupled device (CCD) camera, a fluorescent screen and a secondary iron, and the method comprises the following steps. The energy of the reference electron beam emitted by the microwave electron gun and the deflection amount of the reference electron beam on the secondary iron are used to determine the magnetic field strength, including: after the reference electron beam is observed to leave the secondary iron by using the CCD camera, if the reference electron beam falls on a preset landing position, the deflection amount of the reference electron beam is taken as the deflection amount of the secondary iron; if the reference electron beam does not fall on the preset landing position, the magnetic field strength of the secondary iron is adjusted so that the reference electron beam falls on the preset landing position, and the offset between the landing position of the reference electron beam on the fluorescent screen and the preset landing position is taken as the deflection amount of the reference electron beam on the secondary iron; the magnetic field strength of the secondary iron is calculated according to the deflection amount of the secondary iron; wherein the energy of the reference electron beam is a preset reference value; The energy of the electron beam under test is obtained by analyzing the beam spot image of the electron beam under test captured on the fluorescent screen by the charge-coupled device camera, including: observing the beam spot of the electron beam under test on the fluorescent screen using the charge-coupled device camera, and obtaining the horizontal deviation between the center of the electron beam under test and the center of the reference electron beam. According to the formula for the relationship between horizontal deviation and energy deviation The deflection of the energy of the electron beam under test and the energy of the reference electron beam was calculated. The energy of the electron beam under test is calculated based on the deflection of the energy of the electron beam under test and the energy of the reference electron beam. The energy of the reference electron beam emitted by the microwave electron gun and the deflection amount of the reference electron beam on the secondary iron are used to determine the magnetic field strength, including:

2. The method of claim 1, wherein, The deflection amount of the reference electron beam on the secondary iron is determined through the deflection effect of the reference electron beam. The device is applied to a quantum current measurement system, the quantum current measurement system comprising a microwave electron gun, a charge-coupled device (CCD) camera, a fluorescent screen and a secondary iron, and the device comprises:

3. An electron accelerator-based power current sub-quantum energy measurement device, characterized by, A determination unit is configured to determine the magnetic field strength by using the energy of the reference electron beam emitted by the microwave electron gun and the deflection amount of the reference electron beam on the secondary iron, including: after the reference electron beam is observed to leave the secondary iron by using the CCD camera, if the reference electron beam falls on a preset landing position, the deflection amount of the reference electron beam is taken as the deflection amount of the secondary iron; if the reference electron beam does not fall on the preset landing position, the magnetic field strength of the secondary iron is adjusted so that the reference electron beam falls on the preset landing position, and the offset between the landing position of the reference electron beam on the fluorescent screen and the preset landing position is taken as the deflection amount of the reference electron beam on the secondary iron; the magnetic field strength of the secondary iron is calculated according to the deflection amount of the secondary iron; wherein the energy of the reference electron beam is a preset reference value; An adjustment unit is configured to adjust the energy of the to-be-measured electron beam by changing the cathode material and the laser frequency of the microwave electron gun, so that the energy of the to-be-measured electron beam approaches the energy of the reference electron beam. The analysis unit is used to obtain the energy of the electron beam under test by analyzing the beam spot image of the electron beam under test captured on the fluorescent screen by the charge-coupled device camera, including: observing the beam spot of the electron beam under test on the fluorescent screen using the charge-coupled device camera to obtain the horizontal deviation between the center of the electron beam under test and the center of the reference electron beam. According to the formula for the relationship between horizontal deviation and energy deviation The deflection of the energy of the electron beam under test and the energy of the reference electron beam was calculated. The energy of the electron beam under test is calculated based on the deflection of the energy of the electron beam under test and the energy of the reference electron beam. The determination unit is specifically configured to:

4. The apparatus of claim 3, wherein, The deflection amount of the reference electron beam on the secondary iron is determined through the deflection effect of the reference electron beam. ​

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