Test flow analysis method and device, electronic equipment and storage medium

Abstract

Embodiments of the present application provide a test flow parsing method, a test flow parsing device, an electronic device and a storage medium. The method comprises: determining a parsing order of nodes in a test flow based on a connection relationship between the nodes; obtaining service information of the nodes in the test flow, wherein the service information of the nodes comprises pre-set node information and node information set when the test flow is built; and configuring the service information of the nodes to the corresponding nodes according to the determined parsing order, so as to parse the test flow into a plurality of ordered operations. According to the above technical solution, automatic parsing of the test flow can be realized. Therefore, after the user builds the test flow, the user does not need to perform manual parsing operation, and the test flow can be automatically executed based on the parsing result after automatic parsing of the test flow. This greatly reduces the workload of the user and provides a strong guarantee for the smooth and accurate implementation of the test flow.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of automatic control, and more particularly, to a test flow parsing method, a test flow parsing device, an electronic device and a storage medium. BACKGROUND

[0002] At present, many technical fields are constantly being automated to achieve the purpose of liberating manpower and improving efficiency. Whether it is automatic manufacturing, automatic detection or automatic testing, etc., automatic systems will be used a lot. Users can use the interface provided by the automatic system to build the overall automatic process.

[0003] For the built automatic test flow, it needs to be parsed before execution, so as to disassemble the entire automatic test flow into multiple minimum execution operations, and respectively allocate each device to perform the task of these minimum execution operations. By letting each device complete its own task to ensure that each minimum execution operation is successfully executed, the overall automatic process is completed.

[0004] In the prior art, the above parsing process mostly needs user participation, that is, the user manually parses the automatic test flow. This significantly increases the workload of the user, and the accuracy of the manual parsing result is difficult to guarantee, and thus the built automatic process may not be able to execute normally. SUMMARY

[0005] The present application is proposed in view of the above problems. According to one aspect of the present application, a test flow parsing method is provided, comprising: determining a parsing order of nodes in a test flow based on a connection relationship between the nodes in the test flow; obtaining business information of the nodes in the test flow, wherein the business information of the nodes includes pre-set node information and node information set when the test flow is built; and configuring the business information of the nodes to the corresponding nodes according to the determined parsing order, to parse the test flow into a plurality of ordered operations.

[0006] Exemplarily, configuring the business information of the nodes to the corresponding nodes according to the determined parsing order, to parse the test flow into a plurality of ordered operations, comprises: determining a dependency relationship between a current node and a previous adjacent node according to the determined parsing order; and configuring the current node using the business information of the previous adjacent node and the business information of the current node according to the dependency relationship, to determine one or more ordered operations corresponding to the current node.

[0007] Exemplarily, the business information of the nodes in the test flow is acquired, including: for the adjacent connected device nodes in the test flow, acquiring the pre-operation and / or post-operation information of the device nodes; and according to the determined parsing order, configuring the business information of the nodes to the corresponding nodes to parse the test flow into a plurality of ordered operations, including: determining the execution order of the pre-operation and / or post-operation of the device nodes and the self-operation of the device nodes based on the adjacent connection relationship between the different device nodes in the test flow and the pre-operation and / or post-operation information of the device nodes.

[0008] Exemplarily, the execution order of the pre-operation and / or post-operation of the device nodes and the self-operation of the device nodes is determined based on the adjacent connection relationship between the different device nodes in the test flow and the pre-operation and / or post-operation information of the device nodes, including: for the case that there is at least one repeated operation in the post-operation of a previous device node and the pre-operation of a next device node in the adjacent connected device nodes, the repeated operations in the post-operation of the previous device node and the pre-operation of the next device node are correspondingly merged to make each merged operation appear as an operation in the execution order.

[0009] Exemplarily, the repeated operations in the post-operation of the previous device node and the pre-operation of the next device node are correspondingly merged, including: for the case that the post-operation of the previous device node includes a first carrying operation from the previous device to the next device and the pre-operation of the next device node includes a second carrying operation from the previous device to the next device, it is determined that the first carrying operation and the second carrying operation are repeated, and the first carrying operation and the second carrying operation are merged into the same operation.

[0010] Exemplarily, the method further includes: providing a user interface, the user interface being used to display an information template of the device, and the information template being provided with an operable control, the operable control being used to acquire the business information of the device nodes in the test flow.

[0011] Exemplarily, the nodes include flow control nodes, and the parsing order of the nodes in the test flow is determined based on the connection relationship between the nodes in the test flow, including: starting from a starting node of the test flow, a next node is determined based on the connection relationship between the nodes in the test flow in sequence until all the nodes in the test flow are traversed; and for each of the flow control nodes, the nodes between the starting position and the ending position of the flow control node are parsed as one parsing unit.

[0012] Exemplarily, the nodes include device nodes and consumable nodes; the service information of the device nodes includes one or more of the following: device attribute information of a device corresponding to the device node, operation instruction information, execution duration information, and pre-operation and / or post-operation information; and the service information of the consumable nodes includes one or more of the following: consumable information of a consumable corresponding to the consumable node, end position information at the end of a test procedure, and error position information when an error occurs in the test procedure.

[0013] According to another aspect of the present application, there is also provided a test procedure analysis apparatus, comprising:

[0014] a node analysis module configured to determine an analysis order of the nodes in the test procedure based on the connection relationship between the nodes in the test procedure;

[0015] an acquisition module configured to acquire service information of the nodes in the test procedure, wherein the service information of the nodes includes pre-set node information and node information set when the test procedure is built;

[0016] an operation analysis module configured to configure the service information of the nodes to the corresponding nodes according to the determined analysis order, so as to analyze the test procedure into a plurality of ordered operations.

[0017] According to still another aspect of the present application, there is also provided an electronic device comprising a processor and a memory, wherein the memory stores computer program instructions, and the computer program instructions are used to execute the test procedure analysis method as described above when executed by the processor.

[0018] According to yet another aspect of the present application, there is also provided a storage medium, wherein the storage medium stores program instructions, and the program instructions are used to execute the test procedure analysis method as described above when executed.

[0019] According to the above technical solution, automatic analysis of the test procedure can be realized. Thus, after the user builds the test procedure, the user does not need to perform manual analysis operation, and the test procedure can be automatically executed based on the analysis result of the automatic analysis of the test procedure. This greatly reduces the workload of the user and provides a powerful guarantee for the smooth and accurate implementation of the test procedure.

[0020] The above description is only a summary of the technical solution of the present application. In order to more clearly understand the technical means of the present application, the present application can be implemented according to the content of the description, and in order to make the above and other purposes, features and advantages of the present application more obvious and easy to understand, the following specific embodiments of the present application are described. BRIEF DESCRIPTION OF DRAWINGS

[0021] The above and other objects, features and advantages of the present application will become more apparent from the following detailed description when taken in conjunction with the accompanying drawings in which:

[0022] Figure 1 A schematic flowchart of a test flow parsing method according to one embodiment of the present application is shown;

[0023] Figure 2 A schematic diagram of a built test flow according to one embodiment of the present application is shown;

[0024] Figure 3 A schematic diagram of execution timing of operations in a parsing result according to one embodiment of the present application is shown;

[0025] Figure 4 A schematic flowchart of configuring service information of nodes to corresponding nodes according to a determined parsing order to parse a test flow into an ordered plurality of operations according to one embodiment of the present application is shown;

[0026] Figure 5 A schematic block diagram of a test flow parsing apparatus according to one embodiment of the present application is shown; and

[0027] Figure 6 A schematic block diagram of an electronic device according to one embodiment of the present application is shown. DETAILED DESCRIPTION

[0028] In order to make the objects, technical solutions and advantages of the present application more apparent, the following will describe example embodiments according to the present application in detail with reference to the accompanying drawings. Obviously, the described embodiments are only some of the embodiments of the present application, rather than all the embodiments of the present application, and it should be understood that the present application is not limited to the example embodiments described herein. Based on the embodiments of the present application described in the present application, all other embodiments obtained by those skilled in the art without creative effort should fall within the protection scope of the present application.

[0029] As described above, with the continuous development of automation technology, automation systems are utilized in multiple fields to realize automation transformation. Users can build an overall automation process by means of an interface provided by the automation system. For the built automation process, it needs to be parsed before execution. For example, the built test process includes: the sample plate is transferred from the liquid handling workstation to the incubator. Correspondingly, it is parsed as: first, the mechanical arm of the automation system transfers the sample plate to the entrance plate position of the liquid handling workstation; then, the transfer module inside the liquid handling workstation transfers the sample plate from the entrance plate position to the liquid handling operation area, and the liquid handling workstation performs the liquid handling operation; then, the transfer module inside the liquid handling workstation transfers the sample plate from the liquid handling operation area to the exit plate position; finally, the mechanical arm of the automation system transfers the sample plate from the exit plate position of the liquid handling workstation to the entrance of the incubator. If the above parsing process is realized by manual operation of the user, it not only increases the workload of the user, but also makes the process parsing time-consuming and difficult to ensure the accuracy of the parsing result.

[0030] To solve the above technical problems, the present application provides a test process parsing method. Based on the parsing method, the test process can be automatically and quickly parsed before execution.

[0031] Figure 1 A schematic flowchart of a test process parsing method 100 according to an embodiment of the present application is shown. As shown in the figure, the parsing method 100 can include the following steps. Figure 1

[0032] Step S110, based on the connection relationship between the nodes in the test process, the parsing order of the nodes in the test process is determined.

[0033] It can be understood that for the nodes in the test process other than the starting node and the ending node, these nodes can have at least one input node and at least one output node respectively. In other words, these nodes are connected with at least two other nodes respectively. And these input nodes and output nodes can be respectively regarded as the current node, and have their own input nodes and output nodes. Among them, the input or output relationship can be determined by the direction of the connection between each node, that is, the connection relationship between the nodes. According to the connection relationship between the nodes, each node can be sequentially sorted. For example, for a node in the test process, its order is after its input node and before its output node. The nodes with earlier order are parsed first, and the nodes with later order are parsed later. Thus, the parsing order of the nodes in the test process can be determined.

[0034] Step S120, the business information of the nodes in the test process is obtained. Among them, the business information of the nodes includes the pre-set node information and the node information set when the test process is built.​

[0035] Exemplarily, the host computer can receive the service information of the nodes from the user. For example, the host computer can provide a visual interface to the user. Based on the visual interface, the user can input the service information of the nodes by using the input device (e.g. mouse, keyboard, etc.) of the host computer. Alternatively, the service information of the nodes can be pre-stored in the storage device of the host computer. The service information of the nodes can include pre-set node information and node information set when the test procedure is built. The service information of the nodes includes attribute information and operation information related to operations, etc., wherein the attribute information can be the name, function, identifier information of the device node, etc. of the nodes; the operation information includes operation instructions corresponding to the execution of the nodes, execution time, information related to the pre-operation and / or post-operation of the device node, etc.; the service information of the nodes can include the name, function, operation instructions corresponding to the execution, and execution time, etc. of the nodes. In a specific embodiment, the user can input the node information set when the test procedure is built by using the input device when the test procedure is built. The node information set when the test procedure is built specifically includes, for example, the identifier information of the device node, the pre-operation and / or post-operation information, the loop number information and loop jump condition information of the loop node, etc. The pre-operation of the device node is used to be executed by the execution device of the pre-operation before the device corresponding to the device node executes its own operation, and the post-operation of the device node is used to be executed by the execution device of the post-operation after the device corresponding to the device node executes its own operation. The execution device of the pre-operation and / or post-operation can be the same device as the device corresponding to the device node, or can be a different device. For the nodes corresponding to the pre-set node information, if the nodes are involved in the test procedure built, the host computer can retrieve the pre-set node information from the storage device. The pre-set node information includes, for example, the service information of the device node in the test procedure, such as the function, location, and other parameter information of the device corresponding to the device node. It can be understood that the pre-set node information can be pre-set by the user through the input device and the visual interface before the test procedure is built, or can be set by the device or device corresponding to the node, etc. when it is shipped. Here, the pre-set can refer to the process before the test procedure is built.

[0036] In step S130, the service information of the nodes is configured to the corresponding nodes according to the determined analysis sequence, so as to analyze the test procedure into a plurality of ordered operations.

[0037] Exemplarily, after the analysis order of the nodes determined in step S110, the service information of the nodes obtained in step S120 can be filled into each corresponding node, thereby a sequence of nodes with certain analysis order and containing service information can be obtained. According to the order of the nodes in the sequence, the nodes are analyzed in sequence, and step information corresponding to each node can be obtained, such as what operation the device corresponding to the node is to perform and the execution time of the operation. Then, according to the order of the nodes in the sequence, the step information corresponding to all nodes in the obtained analysis of the test process is concatenated to obtain a plurality of operations in an ordered arrangement. Based on the plurality of operations in an ordered arrangement, the test process can be executed in order.

[0038] According to the above technical solution, automatic analysis of the test process can be realized. Thus, after the user sets up the test process, the user does not need to perform manual analysis operation, and the test process can be automatically executed based on the analysis result after automatic analysis of the test process. This greatly reduces the workload of the user and provides a strong guarantee for the smooth and accurate execution of the test process.

[0039] Exemplarily, the nodes can include device nodes and consumable nodes. The service information of the device node includes one or more of the following: device attribute information of the device corresponding to the device node, operation instruction information, execution time information, and pre-operation and / or post-operation information. The device corresponding to the device node can include a pipetting workstation, a centrifuge, an incubator, an enzyme marker, etc. The device attribute information of the device can be the name, function, model, location, etc. of the device.

[0040] The service information of the consumable node includes one or more of the following: consumable information of the consumable corresponding to the consumable node, end position information at the end of the test process, and error position information when an error occurs in the test process. The consumable information of the consumable can include the name, type, etc. of the consumable. For example, the test process is a chemical test process, and the consumable corresponding to the consumable node can include test tubes, glass sheets, hole plates for batch placing of test tubes, etc. The end position information at the end of the test process can indicate the final position of the consumable after the entire test process is completed. The error position information when an error occurs in the test process can indicate that the consumable is transported to a predetermined error position when an error occurs during the execution of the test process.

[0041] Thus, for the service information of the above-mentioned nodes, the user can customize it. This greatly meets the needs of different users. And the service information of the nodes is subdivided into the above-mentioned, which provides a strong guarantee for automatic analysis, and further guarantees the execution accuracy of the test process.

[0042] Exemplarily, the method 100 can further include: providing a user interface, the user interface being configured to display an information template of the device. The information template is provided with an operable control, the operable control being configured to acquire the service information of the device node in the test procedure.

[0043] It can be understood that, in order to facilitate user operation, a user interface can be provided for the user to perform human-computer interaction. The user interface is configured to display an information template of the device. The information template can include system default parameters of each device and information of allowed operations, etc. The information template is provided with an operable control. The operable control can acquire the service information of the device node in the test procedure in response to user operation. The operable control can be a text input box or a filter box, etc.

[0044] The information template on the user interface provides a framework for the user to set the service information of the device node. The user can directly input the service information of the device node in the test procedure under the guidance and assistance thereof, which not only facilitates user operation but also effectively avoids omission of the service information of the device node by the user, and improves user experience.

[0045] Exemplarily, the node can include a flow control node. In this embodiment, the step S110 of determining the analysis order of the nodes in the test procedure based on the connection relationship between the nodes in the test procedure can include: starting from a starting node of the test procedure, determining a next node based on the connection relationship between the nodes in the test procedure, until all the nodes in the test procedure are traversed. Wherein, for each of the flow control nodes, the nodes between the starting position and the ending position of the flow control node are taken as an analysis unit for analysis.

[0046] Figure 2 A schematic diagram of a built test procedure according to one embodiment of the present application is shown. As shown in the figure, the starting node of the test procedure is a consumable node, and the node after the starting node is a “cell plate” node. Figure 2 As shown in the figure, the starting node of the test procedure is a consumable node, and the node after the starting node is a “cell plate” node. Figure 2 The “cell plate” node. Starting from the “cell plate” node, the next node is determined according to the direction of the connection line between the nodes. In the figure, the next node of the “cell plate” node is a “cell plate” node. Figure 2In the illustrated embodiment, the next node after the "cell plate" is the centrifuge node. The next node after the centrifuge node is the process control node. In this embodiment, the process control node may include decision nodes and loop nodes. Therefore, the next node after the centrifuge node is the node "Decision" at the starting position of the decision node. The search continues from the starting node "Decision" to the ending node "Decision End". When parsing decision nodes, all nodes between "Decision" and "Decision End" are treated as a single parsing unit. The nodes following the decision node are loop nodes. For loop nodes in the experimental process, their starting position is... Figure 2 The “LoopStart” shown here terminates at the following position: Figure 2 The "LoopEnd" is shown. When parsing loop nodes, all nodes between "LoopStart" and "LoopEnd" are parsed as a single unit. The next node after the loop node is the end point of the test procedure. It can be understood that the end point node may not perform any operation; it is only used to place consumables at the end of the test procedure.

[0047] In the above technical solution, all nodes in the experimental process are traversed, thereby determining the parsing order of the nodes. This ensures that the parsing order includes all nodes in the experimental process and guarantees the accuracy of the parsing order. Furthermore, parsing the process control nodes as a single parsing unit ensures the logical accuracy of the experimental process parsing, thus guaranteeing the accuracy of the parsing results.

[0048] Exemplarily, the step S120 of acquiring the service information of the nodes in the test procedure can include: a step S121 of acquiring, for the adjacent connected device nodes in the test procedure, the pre-operation and / or post-operation information of the device nodes. In this embodiment, the service information of the device nodes can include the pre-operation and / or post-operation information of the device nodes. The pre-operation information can include the name of the execution device performing the pre-operation and the pre-operation instruction. The post-operation information can include the name of the execution device performing the post-operation and the post-operation instruction. Specifically, for example, the device corresponding to the device node is a pipetting workstation, which can have pre-operation and / or post-operation information. Specifically, before the pipetting workstation performs its own pipetting operation, the sample plate needs to be placed in the pipetting operation area, i.e., the working area, in the pipetting workstation. Therefore, a pre-operation, i.e., sample plate in, can be set. The sample plate in can refer to the operation of moving the sample plate from the entrance plate position to the pipetting operation area by the transfer module inside the pipetting workstation. Then, the pipetting workstation performs the pipetting operation. After the pipetting operation is completed, the pipetting workstation can be set with a post-operation, i.e., sample plate out, in a similar manner. The sample plate out can refer to the operation of moving the sample plate from the pipetting operation area to the exit plate position of the pipetting workstation by the transfer module inside the pipetting workstation.

[0049] The step S130 of configuring the service information of the nodes to the corresponding nodes according to the determined parsing order can include: a step S131 of determining the execution order of the pre-operation and / or post-operation of the device nodes and the self-operation of the device nodes based on the adjacent connection relationship between the different device nodes in the test procedure and the pre-operation and / or post-operation information of the device nodes.

[0050] According to the foregoing, after the parsing order of the nodes is determined in the step S110, the service information of the nodes acquired in the step S120 can be configured to the respective corresponding nodes to obtain the sequence of the nodes. Then, based on the sequence of the nodes, the nodes therein can be parsed in sequence. For one of the nodes, the execution order of all the operations contained in the node can be obtained after parsing. For example, for the device node A, the pre-operation and the post-operation are set. After the device node A is parsed, the execution order of the operations can be obtained: the pre-operation of the device node A→the self-operation of the device node A→the post-operation of the device node A. After all the device nodes and other nodes in the test procedure are parsed, the test procedure can be parsed into a plurality of ordered operations according to the determined parsing order, and each operation has its respective execution device.

[0051] Thus, when the node is a device node and is provided with a pre-operation and / or a post-operation, all the operations contained in the node can be parsed out and sorted. This guarantees the accuracy of the parsing result, and is further conducive to the smooth execution of the test procedure.

[0052] Exemplarily, the step S131 can determine the execution sequence of the pre-operation and / or post-operation of the device node and the self-operation of the device node based on the adjacent connection relationship between different device nodes in the test flow and the pre-operation and / or post-operation information of the device nodes, including: for a case that there is at least one repeated operation in the post-operation of a previous device node and the pre-operation of a next device node which are adjacently connected, the step S131a can correspondingly merge the repeated operation in the post-operation of the previous device node and the pre-operation of the next device node, so that each merged operation appears in the execution sequence as an operation. The repeated operation can refer to an operation with the same execution device, operation instruction and execution time.

[0053] Exemplarily, the device node A and the device node B are two device nodes which are adjacently connected. The device node A is referred to as a previous device node and the device node B is referred to as a next device node. It is assumed that the device node A has four post-operations, which are a, b, c and d respectively. The device node B has three pre-operations, which are c, d and e respectively. The post-operation c of the device node A and the pre-operation c of the device node B and the post-operation d of the device node A and the pre-operation d of the device node B can be regarded as repeated operations respectively. Therefore, the post-operation c of the device node A and the pre-operation c of the device node B can be merged, and the post-operation d of the device node A and the pre-operation d of the device node B can be merged. Further, in this embodiment, the execution sequence of the determined pre-operation and / or post-operation can be: the post-operation a of the device node A→the post-operation b of the device node A→the post-operation c of the device node A (the pre-operation c of the device node B)→the post-operation d of the device node A (the pre-operation d of the device node B)→the pre-operation e of the device node B for the device node A and the device node B.

[0054] Therefore, for a case that there is a repeated operation in the post-operation of a previous device node and the pre-operation of a next device node, the repeated operation can be merged into one operation. The number of operations in the analysis result is effectively reduced, and the analysis result is simplified. The problem of mutual conflict in the analysis result due to the repeated operation is avoided. The accuracy of the analysis result is ensured.

[0055] In one specific embodiment, the step S131a can correspondingly merge the repeated operation in the post-operation of the previous device node and the pre-operation of the next device node, including:

[0056] For a case that the post-operation of the previous device node includes a first carrying operation from the previous device to the next device and the pre-operation of the next device node includes a second carrying operation from the previous device to the next device, it is determined that the first carrying operation and the second carrying operation are repeated, and the first carrying operation and the second carrying operation are merged into the same operation.

[0057] Figure 3 A schematic diagram showing the execution timing of operations in the parsing result according to one embodiment of the present application is shown.

[0058] In the table, the horizontal direction to the right represents the passage of time. Figure 3 Only for showing the order of each operation in the parsing result, the horizontal length of each square in the table does not represent the length of the actual execution time of the operation. In this embodiment, the device node A and the device node B are two device nodes connected adjacently. The device corresponding to the device node A is the previous device, i.e., the centrifuge, and the device corresponding to the device node B is the next device, i.e., the enzyme label instrument. The post-operation of the centrifuge includes the sample plate output and the sample plate transport. The pre-operation of the enzyme label instrument includes the door opening, the sample plate transport and the door closing. According to the foregoing description, when there is a repeated operation in the post-operation of the previous device and the pre-operation of the next device, the repeated operations can be combined. In this embodiment, the sample plate transport in the post-operation of the centrifuge and the pre-operation of the enzyme label instrument can both represent the transport operation of the sample plate from the outlet plate position of the centrifuge to the inlet plate position of the enzyme label instrument. It can be understood that the sample plate transport operation in the automation system is performed by a mechanical arm in the automation system. There is one or more mechanical arms in the automation system. When the sample plate transport operation in the centrifuge and the sample plate transport operation in the enzyme label instrument are both implemented by the same mechanical arm, the two transport operations can be regarded as repeated operations. Further, the sample plate transport operation in the centrifuge and the sample plate transport operation in the enzyme label instrument are combined into one transport operation. In addition, it can be determined whether the pre-operation and the post-operation of different devices in the test process can be performed simultaneously; the pre-operation and the post-operation that can be performed simultaneously are planned to be performed simultaneously. It can be understood that the sample plate output operation of the centrifuge is performed by a transfer module inside the centrifuge. The door opening operation of the enzyme label instrument is performed by a mechanical arm in the automation system. The execution devices of the two operations are not the same and the operations are not performed simultaneously, which does not affect the execution of the test process. Therefore, in the parsing, the sample plate output operation of the centrifuge and the door opening operation of the enzyme label instrument can be determined as operations that can be performed simultaneously. In the embodiment shown in Figure 3 , the operations that can be performed simultaneously, i.e., the sample plate output operation of the centrifuge and the door opening operation of the enzyme label instrument, have the same execution time. Therefore, in the embodiment shown in Figure 3 , the execution order of the operations can be: the centrifuge outputs the sample plate and simultaneously the enzyme label instrument opens the door → the sample plate transport → the enzyme label instrument closes the door.

[0059] Therefore, for the case that there is a repeated transport operation in the post-operation of the previous device node and the pre-operation of the next device node, the repeated transport operations can be combined into one transport operation. The parsing result can be simplified and the accuracy of the parsing result is ensured.

[0060] Figure 4A schematic flowchart illustrating step S130 of configuring the service information of the nodes to the corresponding nodes according to the determined parsing order to parse the test procedure into a plurality of ordered operations is shown. As Figure 4 As shown, step S130 can include the following steps.

[0061] Step S132, determining the dependency relationship between the current node and the previous adjacent node according to the determined parsing order.

[0062] As mentioned above, the parsing order can contain the ordering information of each node in the test procedure. And this ordering information is determined based on the connection relationship between each node. For a node in the test procedure other than the start node and the end node, for example, node Y, it can have at least one input node X and at least one output node Z. It can be determined that node Y (the current node) depends on its input node X. And for the output node Z, when it is the current node, node Y is the input node of node Z. It can be determined that node Z (the current node) depends on its input node Y. It can be understood that in this embodiment, the dependency relationship between the nodes is direct. Here, "direct" can mean that for node Z, although node X is also in front of node Z in the parsing order. But node X and node Z are not adjacent, there is a node Y between them, so this dependency relationship is indirect dependency.

[0063] Step S133, configuring the current node according to the dependency relationship using the service information of the previous adjacent node and the service information of the current node to determine one or more ordered operations corresponding to the current node.

[0064] After the dependency relationship between the nodes is determined according to step S132, the service information of the current node and its previous adjacent node (the node on which the current node depends) obtained in step S120 can be filled into the current node without filling the service information of other nodes. Thus, the current node can be parsed based on the service information of the current node and the service information of its previous adjacent node, and one or more ordered operations corresponding to the current node are determined.

[0065] Thus, the nodes are parsed using the direct dependency relationship between the nodes, effectively reducing the amount of data in the parsing process, avoiding the interference of other nodes other than the previous adjacent node on the parsing result of the current node, and ensuring the accuracy of the parsing result.

[0066] According to another aspect of the present application, a test procedure parsing device is also provided. Figure 5 A schematic block diagram of a test procedure parsing device 500 according to an embodiment of the present application is shown. As Figure 5As shown, the apparatus 500 includes a node parsing module 510, an obtaining module 520, and an operation parsing module 530.

[0067] The node parsing module 510 is configured to determine a parsing order of the nodes in the test flow based on the connection relationship between the nodes in the test flow.

[0068] The obtaining module 520 is configured to obtain service information of the nodes in the test flow. The service information of the nodes includes pre-set node information and node information set when the test flow is built.

[0069] The operation parsing module 530 is configured to configure the service information of the nodes to the corresponding nodes according to the determined parsing order, so as to parse the test flow into a plurality of ordered operations.

[0070] Exemplarily, the test flow parsing apparatus can further include a display module. The display module is configured to provide a user interface. The user interface is configured to display an information template of the device. The information template is provided with an operable control. The operable control is configured to obtain the service information of the device node in the test flow.

[0071] Exemplarily, the node parsing module 510 can include a traversal node parsing module. The traversal node parsing module is configured to start from a starting node of the test flow, determine a next node based on the connection relationship between the nodes in the test flow, and traverse all the nodes in the test flow. For each of the flow control nodes, the nodes between the starting position and the ending position of the flow control node are parsed as a parsing unit.

[0072] Exemplarily, the obtaining module 520 can include a pre-operation and / or post-operation information obtaining module. The pre-operation and / or post-operation information obtaining module is configured to obtain pre-operation and / or post-operation information of the device nodes for the adjacent connected device nodes in the test flow.

[0073] The operation parsing module 530 can include a pre-operation and / or post-operation execution order determining module. The pre-operation and / or post-operation execution order determining module is configured to determine the execution order of the pre-operation and / or post-operation of the device nodes and the self-operation of the device nodes based on the adjacent connection relationship between the different device nodes in the test flow and the pre-operation and / or post-operation information of the device nodes.

[0074] Exemplarily, the pre-operation and / or post-operation execution order determining module can comprise a repeated operation merging module. The repeated operation merging module is configured to, in the case that there is at least one repeated operation in the post-operation of a previous device node and the pre-operation of a next device node in the adjacent connected device nodes, merge the repeated operations in the post-operation of the previous device node and the pre-operation of the next device node correspondingly, so that each of the merged operations appears as one operation in the execution order.

[0075] In one specific embodiment, the repeated operation module is specifically configured to, in the case that the post-operation of the previous device node comprises a first handling operation from the previous device to the next device and the pre-operation of the next device node comprises a second handling operation from the previous device to the next device, determine that the first handling operation and the second handling operation are repeated, and merge the first handling operation and the second handling operation into one operation.

[0076] Exemplarily, the operation analyzing module 530 can comprise a dependency relationship determining module and a current node operation analyzing module. The dependency relationship determining module is configured to determine the dependency relationship between the current node and the previous adjacent node according to the determined analysis order. The current node operation analyzing module is configured to configure the current node by using the service information of the previous adjacent node and the service information of the current node according to the dependency relationship, so as to determine one or more ordered operations corresponding to the current node.

[0077] According to yet another aspect of the present application, an electronic device is also provided. Figure 6 A schematic block diagram of an electronic device 600 according to one embodiment of the present application is shown. As shown, the electronic device 600 comprises a processor 610 and a memory 620. The memory 620 stores computer program instructions which, when executed by the processor 610, are configured to perform the above-mentioned test procedure analysis method. Figure 6

[0078] According to still another aspect of the present application, a storage medium is also provided. The storage medium stores program instructions which, when executed, are configured to perform the above-mentioned test procedure analysis method. The storage medium can comprise, for example, a storage component of a tablet computer, a hard disk of a personal computer, a read-only memory (ROM), an erasable programmable read-only memory (EPROM), a portable compact disc read-only memory (CD-ROM), a USB memory, or any combination of the above-mentioned storage media. The computer-readable storage medium can be any combination of one or more computer-readable storage media.

[0079] Those skilled in the art can understand the specific implementation schemes of the above-mentioned test procedure analysis apparatus, electronic device and storage medium by reading the above-mentioned related description of the test procedure analysis method. For brevity, the specific implementation schemes will not be described here again.​

[0080] Although example embodiments have been described herein with reference to the accompanying drawings, it is to be understood that the example embodiments are only exemplary and are not intended to limit the scope of the present disclosure. Those of ordinary skill in the art can make various changes and modifications of the example embodiments without departing from the scope and spirit of the present disclosure. All such changes and modifications are intended to be within the scope of the present disclosure as claimed.

[0081] Those skilled in the art can realize the units and algorithm steps of each example described in connection with the embodiments disclosed herein can be realized by electronic hardware, or a combination of computer software and electronic hardware. Whether the functions are performed in hardware or software depends on the particular application and design constraints. Those skilled in the art can realize the described functions by various methods, and the present disclosure is not limited to a specific method for realizing the functions.

[0082] In several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative, and for example, the division of the units is merely a logical function division, and actual implementation can have another division manner, for example, multiple units or components can be combined or integrated into another device, or some features can be omitted or not executed.

[0083] In the specification provided herein, a large number of specific details are described. However, it can be understood that the embodiments of the present disclosure can be practiced without these specific details. In some examples, well-known methods, structures and techniques are not described in detail in order not to obscure the understanding of the specification.

[0084] Similarly, it should be appreciated that, in the description of the example embodiments of the present disclosure, various features of the present disclosure are sometimes grouped together in a single embodiment, figure, or description of a related group of embodiments, for the purpose of streamlining the disclosure and aiding in the understanding of one or more of the various aspects, features and embodiments of the present disclosure. However, this method of disclosure should not be interpreted as reflecting an intention that the claimed disclosure requires more features than are explicitly recited in each claim. Rather, inventive aspects lie in less than all features of any single disclosed embodiment. Thus, the claims following the detailed description are hereby expressly incorporated into this detailed description, with each claim acting as a separate embodiment of the claimed disclosure.

[0085] Those skilled in the art will appreciate that all features described herein (including all features and processes described in the accompanying claims, abstract and drawings) can be combined in any combination. Each feature disclosed in this specification (including any "means for" feature disclosed by an "apparatus comprising a means for" claim), in the claims, abstract and drawings can be replaced by alternative features that are both equivalent in terms of the functionality for which the features are described to perform. This applies no matter whether the alternative is prior art, newly developed, or some combination of both.

[0086] Furthermore, those skilled in the art will appreciate that the features described herein, although characterized as being included in some embodiments and not others, are combinable in different embodiments to form different embodiments. For example, in the claims, any of the claimed embodiments can be used in any combination.

[0087] Embodiments of various components of the present application can be implemented in hardware, software, or a combination thereof. Those skilled in the art will appreciate that some or all of the functionality of some of the modules in the test flow parsing apparatus according to embodiments of the present application can be implemented in practice using a microprocessor or a digital signal processor (DSP). The present application can also be implemented as a program (for example, a computer program and a computer program product) for executing some or all of the methods described herein. Such a program implementing the present application can be stored on a computer readable medium, or can be in the form of one or more signals. Such a signal can be downloaded from an Internet website, or provided on a carrier signal, or in any other form.

[0088] It is noted that the foregoing examples have been provided merely for the purpose of explanation and are in no way to be construed as limiting of the present application. While the present application has been described with reference to specific embodiments, it is apparent that various modifications and changes can be made by those skilled in the art without departing from the scope of the appended claims. In its broadest form, the present application is defined by the appended claims and equivalents thereof and all of the additional benefits of the application become apparent upon consideration of the application when interpreted in its broadest form. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. The word "comprising" does not exclude the presence of elements or steps other than those listed in a claim. The word "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The application can be implemented by means of hardware comprising several distinct elements, and by means of a programmed computer. In the unitary or integrated claims enumerating several means, several of these means can be embodied by one and the same item of hardware. The mere fact that certain measures are recited in mutually different dependent claims does not indicate that a combination of these measures cannot be used to advantage. The objectives of the application can be achieved with a combination of features not specifically recited in the claims. It is specifically intended that all such modifications, changes and variations that fall within the bounds of the prior art should be included within the scope of the present application as defined herein and in the appended claims.

[0089] The above merely describes specific embodiments or specific implementation of the present application, and the protection scope of the present application is not limited thereto, any person skilled in the art can easily think of changes or replacements within the technical range disclosed by the present application, which should be covered in the protection scope of the present application. The protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A test procedure parsing method, characterized by, The method comprises: determining an analysis order of the nodes in the test flow based on a connection relationship between the nodes in the test flow; obtaining service information of the nodes in the test flow, comprising: for adjacent connected device nodes in the test flow, obtaining pre-operation and / or post-operation information of the device nodes, wherein the service information of the nodes comprises pre-set node information and node information set when the test flow is built; configuring the service information of the nodes to the corresponding nodes according to the determined analysis order, so as to parse the test flow into a plurality of ordered operations performed by the devices corresponding to the nodes, comprising: determining the execution order of the pre-operation and / or post-operation of the device nodes and the self-operation of the device nodes based on the adjacent connection relationship between different device nodes in the test flow and the pre-operation and / or post-operation information of the device nodes.

2. The method of claim 1, wherein, The method further comprises: determining the dependency relationship between the current node and the previous adjacent node according to the determined analysis order; configuring the current node by using the service information of the previous adjacent node and the service information of the current node according to the dependency relationship, so as to determine one or more ordered operations corresponding to the current node.

3. The method of claim 1, wherein, The method further comprises: for the case that there is at least one repeated operation in the post-operation of the previous device node and the pre-operation of the next device node in the adjacent connected device nodes, corresponding merging is performed on the repeated operations in the post-operation of the previous device node and the pre-operation of the next device node, so that each merged operation appears as an operation in the execution order.

4. The method of claim 3, wherein, The method further comprises: for the case that the post-operation of the previous device node comprises a first carrying operation from the previous device to the next device and the pre-operation of the next device node comprises a second carrying operation from the previous device to the next device, it is determined that the first carrying operation and the second carrying operation are repeated, and the first carrying operation and the second carrying operation are merged into the same operation.

5. The method of any one of claims 1 to 4, wherein, The method further comprises: providing a user interface for displaying an information template of the device, wherein the information template is provided with an operable control for obtaining the service information of the device nodes in the test flow.

6. The method of any one of claims 1 to 4, wherein, The nodes comprise flow control nodes, The method further comprises: starting from the starting node of the test flow, determining the next node based on the connection relationship between the nodes in the test flow, and sequentially determining all nodes in the test flow until all nodes in the test flow are traversed. The nodes in the test flow are parsed as one parsing unit between the start position and the end position of each of the flow control nodes.

7. The method of any one of claims 1 to 4, wherein, The nodes include device nodes and consumable nodes; The service information of the device nodes includes one or more of the following: device attribute information of the device corresponding to the device node, operation instruction information, execution duration information, and pre-operation and / or post-operation information; The service information of the consumable nodes includes one or more of the following: consumable information of the consumable corresponding to the consumable node, end position information at the end of the test flow, and error position information when an error occurs in the test flow.

8. An assay protocol resolving apparatus characterized by comprising: The nodes include device nodes and consumable nodes; The node parsing module is configured to determine a parsing order of the nodes in the test flow based on the connection relationship between the nodes in the test flow; The obtaining module is configured to obtain service information of the nodes in the test flow, including: for adjacent connected device nodes in the test flow, obtaining pre-operation and / or post-operation information of the device nodes, wherein the service information of the nodes includes pre-set node information and node information set when the test flow is built; The operation parsing module is configured to configure the service information of the nodes to the corresponding nodes according to the determined parsing order, so as to parse the test flow into a plurality of operations in order which are executed by the devices corresponding to the nodes, including: determining the execution order of the pre-operation and / or post-operation of the device nodes and the operation of the device nodes themselves based on the adjacent connection relationship between different device nodes in the test flow and the pre-operation and / or post-operation information of the device nodes.

9. An electronic device comprising a processor and a memory, wherein, The memory stores computer program instructions, and the computer program instructions are run by the processor to execute the test flow parsing method according to any one of claims 1 to 7.

10. A storage medium, on which program instructions are stored, the program instructions being run to execute the test flow parsing method according to any one of claims 1 to 7.

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