Display device and its testing method

Abstract

The display device and its detection method include a plurality of adapter pads, a plurality of first scan lines, a plurality of second scan lines, a plurality of data lines, a plurality of select lines, connecting lines, and an electrostatic discharge (ESD) protection device. Each first scan line is connected to a corresponding adapter pad along a first axis. Each second scan line extends from its corresponding adapter pad along a second axis. The plurality of data lines extend along the first axis. The select lines extend along the first axis and are disconnected from the first scan lines. The connecting lines connect the select lines. The ESD protection device is electrically connected to the connecting lines.

Description

Technical Field

[0001] This invention relates to a display device and a detection method for detecting it. Background Technology

[0002] Electronic paper displays (EPDs) offer numerous advantages, such as eliminating the need for a backlight, providing a display quality close to that of regular paper, saving power, and being lightweight. However, in the trend towards thinner and smaller designs, EPDs feature densely packed circuitry, making them prone to circuit defects (such as short circuits). Therefore, detecting these defects is one of the key goals for manufacturers in this field. Summary of the Invention

[0003] The present invention relates to a display device and a detection method thereon, which can improve the aforementioned problems.

[0004] According to an embodiment of the present invention, a display device is provided. The display device includes a plurality of adapter pads, a plurality of first scan lines, a plurality of second scan lines, a plurality of data lines, a plurality of thin-film transistors, a plurality of select lines, a connecting line, and a first electrostatic discharge (ESD) protection element. Each first scan line is connected to a corresponding adapter pad along a first axial direction. Each second scan line extends from a corresponding adapter pad along a second axial direction. The plurality of data lines extend along the first axial direction. Each thin-film transistor connects a corresponding data line to a second scan line. The select lines extend along the first axial direction and are disconnected from the first scan lines. The connecting line connects the select lines. The first ESD protection element is electrically connected to the connecting line.

[0005] According to an embodiment of the present invention, a detection method for a display device is provided. The detection method includes the following steps: providing a display device, the display device including a plurality of adapter pads, a plurality of first scan lines, a plurality of second scan lines, a plurality of data lines, a plurality of thin-film transistors, a plurality of select lines, a connecting line, and a first electrostatic discharge (ESD) shield; each first scan line is connected to a corresponding adapter pad along a first axial direction; each second scan line extends from a corresponding adapter pad along a second axial direction; the data lines extend along the first axial direction; each thin-film transistor connects a corresponding data line to a second scan line; the select lines extend along the first axial direction and are disconnected from the first scan lines; the connecting line connects the select lines; and the first ESD shield is electrically connected to the connecting line; a detection device outputs a first conduction signal to the connecting line; the detection device outputs a second conduction signal to a first test subject of the first scan lines; the detection device outputs a third conduction signal to a second test subject of the data lines; and, based on the cutoff of the thin-film transistors coupling the first test subject and the second test subject, the detection device generates a defect detection signal.

[0006] To provide a better understanding of the above and other aspects of the present invention, specific embodiments are described below in conjunction with the accompanying drawings: Attached Figure Description

[0007] Figure 1 A top view of a display device according to an embodiment of the present invention is shown.

[0008] Figure 2 A top view of a display device according to another embodiment of the present invention is shown.

[0009] Figure 3 Show detection Figure 2 The test signal diagram of the display device.

[0010] Figure 4 Show detection Figure 2 Flowchart of the testing method for the display device.

[0011] Explanation of reference numerals in the attached figures:

[0012] 10: Detection device

[0013] 11: Detection Circuit

[0014] 100, 200: Display devices

[0015] 105: Substrate

[0016] 105A: Display Area

[0017] 105B: Non-display area

[0018] 105B1: Section 1

[0019] 105B2: Second Section

[0020] 105B3: Third Section

[0021] 105B4: Section 4

[0022] 110: Adapter pad

[0023] 120: First scan segment

[0024] 130: Second scan segment

[0025] 135: Thin-film transistor

[0026] 140: Data cable

[0027] 150: Select line

[0028] 155: Common Electrode

[0029] 160: Connecting cable

[0030] 161A: First line segment

[0031] 161B: Second line segment

[0032] 161B1: First sub-segment

[0033] 161B2: Second sub-segment

[0034] 161C: Third segment

[0035] 161D: Fourth line segment

[0036] 170A: First electrostatic discharge protection component

[0037] 170B: Second electrostatic discharge protection component

[0038] 180: Circuit board

[0039] C1: First Turn

[0040] C2: Second Turn

[0041] L COM Common electrode detection circuit

[0042] L G1 First scan line detection circuit

[0043] L G2 Second scan line detection circuit

[0044] L D1 First data cable test line

[0045] L D Second data cable testing line

[0046] L EE Switch circuit

[0047] PX: Pixel area

[0048] SE: Enable signal

[0049] S11, S21, S32, S42: On / off signals

[0050] S12, S12, S31, S41: Cutoff signals

[0051] S5: Defect detection signal

[0052] T1: First test signal

[0053] T2: Second test signal

[0054] T3: Third test signal

[0055] T4: Fourth Test Signal

[0056] X: Second axis

[0057] Y: First axis Detailed Implementation

[0058] In the accompanying drawings, the thicknesses of layers, films, panels, regions, etc., are enlarged for clarity. Throughout the specification, the same reference numerals denote the same elements. It should be understood that when an element such as a layer, film, region, or substrate is referred to as being "on" or "connected" to another element, it may be directly on or connected to the other element, or intermediate elements may also be present. Conversely, when an element is referred to as being "directly on" or "directly connected" to another element, no intermediate elements are present. As used herein, "connection" can refer to physical and / or electrical connection. Furthermore, "electrical connection" or "coupling" may mean that other elements exist between the two elements.

[0059] The terminology used herein is for the purpose of describing particular embodiments only and is not restrictive. As used herein, unless the content clearly indicates otherwise, the singular forms “a,” “an,” and “the” are intended to include multiple forms, including “at least one.” “Or” means “and / or.” As used herein, the term “and / or” includes any and all combinations of one or more of the associated listed items. It should also be understood that, when used in this specification, the terms “comprising” and / or “comprising” specify the presence of the stated features, areas, integrals, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, areas, integrals, steps, operations, elements, components, and / or combinations thereof.

[0060] Furthermore, relative terms such as “down” or “bottom” and “up” or “top” may be used herein to describe the relationship between one element and another, as illustrated in the figures. It should be understood that relative terms are intended to include different orientations of the device beyond those shown in the figures. For example, if a device in one figure is flipped, an element described as being “down” to other elements will be oriented “up” to other elements. Thus, the exemplary term “down” can include both “down” and “up” orientations, depending on the specific orientation of the figure. Similarly, if a device in one figure is flipped, an element described as being “below” or “under” other elements will be oriented “above” other elements. Thus, the exemplary term “below” or “under” can include both “up” and “down” orientations.

[0061] As used herein, “about,” “approximately,” or “substantially” includes the value and the average value within an acceptable range of deviations from a particular value as determined by one of ordinary skill in the art, taking into account the measurement under discussion and a particular number of errors associated with the measurement (i.e., limitations of the measurement system). For example, “about” may mean within one or more standard deviations of the value, or within ±30%, ±20%, ±10%, ±5%. Furthermore, the use of “about,” “approximately,” or “substantially” herein may be chosen based on the optical, etched, or other properties to select a more acceptable range of deviations or standard deviations, and may not require a single standard deviation to apply to all properties.

[0062] Unless otherwise defined, all terms used herein (including technical and scientific terms) have the same meaning as commonly understood by one of ordinary skill in the art to which this invention pertains. It will be further understood that terms such as those defined in commonly used dictionaries should be interpreted as having meanings consistent with their meanings in the context of the relevant technology and this invention, and will not be interpreted as having idealized or overly formal meanings unless expressly defined herein.

[0063] Please refer to Figure 1 This diagram shows a top view of a display device 100 according to an embodiment of the present invention. The display device 100 includes a substrate 105, a plurality of transfer data pads (TDPs) 110, a plurality of first scan lines 120, a plurality of second scan lines 130, a plurality of thin-film transistors (TFTs) 135, a plurality of data lines 140, a plurality of select lines 150, at least one common electrode 155, a connecting line 160, a first electrostatic discharge (ESD) shield 170A, a second ESD shield 170B, and a circuit board 180. Each first scan line 120 is connected to a corresponding transfer pad 110 along a first axial direction Y. Each second scan line 130 extends from its corresponding transfer pad 110 along a second axial direction X. The data lines 140 extend along the first axial direction Y. Each thin-film transistor 135 connects its corresponding data line 140 to the second scan line 130. These select lines 150 extend along a first axis Y and are disconnected from these first scan lines 120. Connecting lines 160 connect these select lines 150. In a defect detection (described later), by connecting the select lines 150 via connecting lines 160, defects in adjacent lines of the select lines 150 can be detected; for example, defects in lines that are short-circuited (continuous) with the select lines 150 can be detected.

[0064] like Figure 1As shown, substrate 105 is, for example, a light-transmitting substrate, and its material is, for example, glass or other light-transmitting materials. Substrate 105 has a display area 105A and a non-display area 150B. Display area 105A is, for example, an active area, and non-display area 150B is, for example, a non-active area. Non-display area 150B is an edge area of ​​substrate 105, which connects to the outer surface of substrate 105. Non-display area 150B surrounds at least one side of display area 105A, for example, non-display area 150B surrounds the entire display area 105A. These adapter pads 110, these first scan segments 120, these second scan segments 130, these data lines 140, and these select lines 150 are disposed in display area 105A, while connection lines 160 and first electrostatic discharge protection members 170A and second electrostatic discharge protection members 170B are disposed in non-display area 105B.

[0065] like Figure 1 As shown, the non-display area 105B has opposing first segments 105B1 and second segments 105B2, and opposing third segments 105B3 and fourth segments 105B4, wherein the third segments 105B3 and fourth segments 105B4 connect the first segments 105B1 and second segments 105B2. The first segments 105B1, second segments 105B2, third segments 105B3, and fourth segments 105B4 are connected to form a closed ring, enclosing the display area 105A.

[0066] like Figure 1 As shown, these adapter pads 110 can be arranged diagonally along the display device 100. The adapter pads 110 are coupled to the corresponding first scan line segment 120 and second scan line segment 130 to convert the signal transmitted along the Y-axis (via the first scan line segment 120) into a signal transmitted along the X-axis (via the second scan line segment 130). Through the signal conversion design of the adapter pads 110, the width of the non-display areas on both sides of the substrate 105 (e.g., the third segment 105B3 and the fourth segment 105B4) can be reduced, so that the display device 100 has the technical effect of "narrow bezels on both sides".

[0067] like Figure 1 As shown, in this embodiment, the first scan line segment 120, the second scan line segment 130, and the 0 data line 140 define several pixel regions PX. In another embodiment, pixel regions PX can be defined in other ways, not limited to using data lines and scan lines.

[0068] like Figure 1 As shown, at least one of all select lines 150 is coupled to the connection line 160. Select lines 150 are in a floating state; for example, select lines 150 are physically disconnected from the adapter pad 110.

[0069] Furthermore, the selection line 150 is not electrically connected to the first scan line segment 120, the second scan line segment 130, the data line 140, and the common electrode 155.

[0070] like Figure 1 As shown, each common electrode 155 is located in the corresponding pixel area PX and is electrically coupled to each other.

[0071] The common electrode 155 can provide a reference potential for the pixel area PX for voltage regulation purposes.

[0072] Furthermore, the aforementioned first scan segment 120, second scan segment 130, data line 140, select line 150, and common electrode 155 can be of different layer structures. In this embodiment, the first scan segment 120, data line 140, select line 150, and common electrode 155 may be of the same layer structure (same process).

[0073] The second scan segment 130 is a different layer structure (different process). The second scan segment 130, located in different layers, is electrically connected to the first scan segment 120 through an adapter pad 110, which is, for example, a conductive via of the insulating layer between the two layers, connecting the two layers.

[0074] like Figure 1 As shown, connecting line 160 connects these select lines 150 in parallel. Connecting line 160 is configured in the non-display area 105B. For example, connecting line 160 includes a first segment 161A and a second segment 161B arranged opposite each other, and a third segment 161C and a fourth segment 161D arranged opposite each other, wherein the third segment 161C and the fourth segment 161D connect the first segment 161A and the second segment 161B. Connecting line 160 is configured in the first segment 105B1, the second segment 105B2, and the third segment 105B3 of the non-display area 105B.

[0075] And the fourth segment 105B4. For example, the first segment 161A, the second segment 161B, the third segment 161C0, and the fourth segment 161D are respectively disposed in the first segment 105B1, the second segment 105B2, the third segment 105B3, and the fourth segment 105B4 of the non-display area 105B. In addition, the second segment 161B includes a first sub-segment 161B1 and a second sub-segment 161B2, which are respectively connected to the third segment 161C and the fourth segment 161D.

[0076] like Figure 1As shown, a first electrostatic discharge (ESD) shield 170A is electrically connected to the connecting line 160 to prevent electrostatic discharge from damaging electronic components and / or circuits on the substrate 105. The first ESD shield 170A is positioned at a first corner C1 of the substrate 105, such as the connection point between the first segment 105B1 and the third segment 105B3. Furthermore, the first ESD shield 170A can be, for example, a diode, a transient voltage suppressor diode array (TVS array), or other electronic components capable of blocking or dissipating static electricity. The first ESD shield 170A has an electron channel width and an electron channel length, wherein a larger ratio of electron channel width to electron channel length allows for the dissipation of static electricity with a larger voltage value.

[0077] like Figure 1 As shown, the second electrostatic discharge (ESD) shield 170B is electrically connected to the connecting line 160 to prevent electrostatic discharge from damaging electronic components and / or circuits on the substrate 105. The second ESD shield 170B is positioned at a second corner C2 of the substrate 105, such as the junction of the first segment 105B1 and the fourth segment 105B4. Furthermore, the second ESD shield 170B can be, for example, a diode, a transient voltage suppressor diode array, or other electronic components capable of blocking or dissipating static electricity.

[0078] By using two electrostatic discharge (ESD) protection components, the ESD protection range of the display device 100 can be expanded. In another embodiment, the number of ESD protection components can be three or more, which are arranged at different positions or different corners of the non-display area 105B. In another embodiment, the display device 100 may also omit one of the first ESD protection component 170A and the second ESD protection component 170B, and selectively omit the corresponding connecting lines. For example, if the second ESD protection component 170B is omitted, the fourth line segment 161D and the second sub-line segment 161B2 can also be selectively omitted.

[0079] like Figure 1 As shown, circuit board 180 is, for example, a flexible printed circuit (FPC), but this is not intended to limit the embodiments of the present invention. Circuit board 180 is electrically connected to substrate 105. For example, the aforementioned data line 140 and the first scan line segment 120 may extend to the second segment 105B and be coupled to circuit board 180. In addition, the second line segment 161B may be electrically connected to circuit board 180. For example, the first sub-segment 161B1 of the second line segment 161B may extend from the third segment 105B3 to circuit board 180, and the second sub-segment 161B2 of the second line segment 161B may extend from the fourth segment 105B4 to circuit board 180, so as to be electrically connected to circuit board 180.

[0080] Please refer to Figure 2This diagram shows a top view of a display device 200 according to another embodiment of the present invention. The display device 200 includes a substrate 105, a plurality of transition pads 110, a plurality of first scan lines 120, a plurality of second scan lines 130, a plurality of data lines 140, a plurality of select lines 150, a connecting line 160, a first electrostatic discharge (ESD) shield 170A, and a second ESD shield 170B. The display device 200 has the same or similar features as the aforementioned display device 100, except that the circuit board 180 may be omitted in the display device 200. In one embodiment, the display device 200 is a display panel before cutting (simplification), at which stage the circuit board 180 has not yet been assembled. After testing, the display panel can be simplified, and then the circuit board 180 can be assembled to form a display as shown in the diagram. Figure 1 The display device 100 shown.

[0081] like Figure 2 As shown, the display device 200 is connected to a detection device 10. The detection device 10 is, for example, a voltage imaging optical subsystem (VIOS), but this is not intended to limit the embodiments of the present invention. The detection device 10 includes a plurality of detection lines and a detection circuit 11, wherein these detection lines may be formed on the substrate 105 and, for example, include a common electrode detection line L. COM First scan line detection line L G1 Second scan line detection line L G2 First data cable test line L D1 Second data line detection line L D2 and switch circuit L EE After cutting, the common electrode detection circuit L... COM First scan line detection line L G1 Second scan line detection line L G2 First data cable detection line L D1 Second data line detection line L D2 With switch line L EE Removed from display device 200 after cutting.

[0082] like Figure 2 As shown, the common electrode detection circuit L COM Electrically connected to the common electrode 155, the first scan line detection circuit L G1 Electrically connected to one or more of these first scan line segments 120 (e.g., the 2nth first scan line segment 120, where n is a positive integer equal to or greater than 1), the second scan line detection circuit L G2 Electrically connected to one or more of these first scan segments 120 (e.g., the (2n-1)th first scan segment 120), the first data line detection line L D1Electrically connected to one or more of these data lines 140 (e.g., the 2nth data line 140), the second data line detection line L D2 Electrically connected to another or some others (e.g., the (2n-1)th data line 140) and the switching line L EE Electrically connected to connection line 160. Detection circuit 11 can provide detection signals to these detection lines and determine whether a line defect has occurred by observing the conduction state of thin-film transistor 135 of display device 200.

[0083] like Figure 2 As shown, the first scan line segment 120, data line 140, and connecting line 160 of the display device 200 can extend to the switch line L. EE And switch line L EE Connect the first scan line detection line L G1 Second scan line detection line L G2 First data cable detection line L D1 and the second data line detection line L D2 This serves as a switch for signal transmission between these lines and the display device 200. In one embodiment, the switch line L... EE It can also be called GGTFT.

[0084] like Figure 2 As shown, switch circuit L EE It can be used as a display device 200 and a detection line (e.g., a first scan line detection line L). G1 Second scan line detection line L G2 First data cable detection line L D1 and the second data line detection line L D2 The switching of the transmission channel between the two circuits. When the detection circuit 11 outputs an enable signal (e.g., a high-level voltage) to the switching line L... EE This allows the transmission channel between the display device 200 and the detection circuit to be opened. When the detection circuit 11 outputs a shutdown signal (e.g., a low-level voltage) to the switching circuit L... EE The transmission channel between the display device 200 and the detection circuit can be shut down. When a defect is detected in the detection circuit, the detection circuit 11 can output an enable signal to the switch circuit L. EE and output a reference signal (e.g., a low-level voltage) to the common electrode detection circuit L. COM Furthermore, for the thin-film transistor to be turned on, a turn-on signal (e.g., high-level voltage) is output to the corresponding first scan line segment 120 and data line 140 to turn on the corresponding thin-film transistor, and the circuit defect is determined based on whether the thin-film transistor is turned on or not.

[0085] The following is a further explanation of the testing method for the display device 200, illustrated in Figures 3 and 4. Figure 3 Show detection Figure 2 The test signal diagram of the display device 200, and Figure 4 Show detection Figure 2 Flowchart of the detection method for display device 200.

[0086] In step S110, provide as follows Figure 2 The display device 200 shown.

[0087] In step S120, please also refer to Figures 2-4 The detection circuit 11 outputs an enable signal SE to the connection line 160 of the display device 200. The enable signal SE is, for example, a high-level voltage, which is transmitted, for example, through the switch line L. EE Transmitted to connection line 160. When switching line L... EE Upon receiving the enable signal SE, the switch line L... EE The transmission channel between the display device 200 and the detection circuit is opened, allowing the signal generated by the detection circuit 11 to pass through the switching circuit L. EE The signal is transmitted to the display device 200. Additionally, the detection circuit 11 outputs a reference signal S. C (e.g., low-level voltage) is applied to the common electrode 155. Reference signal S C Detection circuit L via common electrode COM Transmitted to common electrode 155.

[0088] In step S130, please also refer to the following: Figures 2-4 The detection circuit 11 outputs a first conduction signal S11 to the first subject of the first scan line segment 120. The first conduction signal S11 is, for example, a high-level voltage. The first subject is, for example, connected to the first scan line detection circuit L. G1 The first scan line segment 120 is coupled, and the first conduction signal S11 is detected by the first scan line detection line L. G1 Transmitted to the first test subject.

[0089] Furthermore, the detection circuit 11 can output a first cutoff signal S31 to a first cutoff point. The first cutoff signal S31 is, for example, a low-level voltage. The first cutoff point is the first scan line segment 120 other than the first measured segment. The first cutoff signal S31 can be detected by the second scan line detection line L. G2 Transmitted to the first cutoff point.

[0090] In step S140, please also refer to Figures 2-4 The detection circuit 11 outputs a second conduction signal S21 to the second test subject of the data lines 140. The second conduction signal S21 is, for example, a high-level voltage. The second test subject is, for example, connected to the first data line detection circuit L. D1The coupled data line 140, the second conduction signal S21 detects the line L through the first data line. D1 It is transmitted to the second subject.

[0091] Furthermore, the detection circuit 11 can output a second cutoff signal S41 to the second cutoff point. The second cutoff signal S41 is, for example, a low-level voltage. The second cutoff point is a data line 140 other than the second data line being tested. The second cutoff signal S41 can detect line L through the second data line. D2 Transmitted to the second cutoff point.

[0092] In step S150, based on the cutoff of the thin-film transistor 135 coupled to the first and second test subjects, the detection device 10 generates a defect detection signal S5. Specifically, based on the conduction of the first and second test subjects, the thin-film transistor 135 coupled to the first and second test subjects should be conducting to be in a normal state. However, if the thin-film transistor 135 coupled to the first and second test subjects is cut off, it indicates a circuit abnormality. For example, at least one of the following is short-circuited: at least one select line 150 and adjacent lines on the same layer, such as the common electrode 155 at a low potential (e.g., receiving a cutoff signal), the data line 140 at a low potential (e.g., receiving a cutoff signal), and the first scan line segment 120 at a low potential (e.g., receiving a cutoff signal). Therefore, the switching circuit L... EE The potential is forced to drop to a low potential (switching circuit L) EE The device is turned off, causing the thin-film transistor 135 of the display device 200, which should be turned on, to be forced off. This is an abnormal state. The detection device 10 generates a defect detection signal S5 to alert the tester to this abnormality.

[0093] Furthermore, the detection device 10 can simulate the on / off state of the thin-film transistor 135, making it easy for inspection personnel or inspection equipment to determine whether a defect has occurred. As a further example, the detection device 10 also includes a simulation panel (not shown), which can be positioned directly above the display device 200. The aforementioned simulation panel includes several pixel areas, which correspond in position to pixel areas PX of the display device 200. Each pixel area of ​​the aforementioned simulation panel contains liquid crystal. When the underlying thin-film transistor 135 is turned on, the liquid crystal state changes, allowing light to pass through (emitting light). Conversely, when the underlying thin-film transistor 135 is turned off, the liquid crystal state changes, blocking light from passing through (not emitting light). Therefore, by judging the bright or dark state of the pixel areas of the simulation panel, inspection personnel or inspection equipment can determine the on / off state of the corresponding thin-film transistor 135.

[0094] In addition, such as Figure 3As shown, the first test signal T1 includes a first on signal S11 and an off signal S12 (low-level voltage); the second test signal T2 includes a second on signal S21 and an off signal S22 (low-level voltage); the third test signal T3 includes a first off signal S31 and an on signal S32 (high-level voltage); and the fourth test signal T4 includes a second off signal S41 and an on signal S42 (high-level voltage). The first test signal T1 is detected by the first scan line detection circuit L. G1 The second test signal T2 is transmitted to the display device 200 and detected by the second scan line L. G2 The third test signal T3 is transmitted to the display device 200 and detected through the first data line L. D1 The signal is transmitted to the display device 200, while the fourth test signal T4 is detected through the second data line L. D2 Transmitted to display device 200. By properly designing the timing and / or duration of the high and low voltage levels of the turn-on signal SE, the high and / or duration of the high and low voltage levels of the second test signal T2, the high and / or duration of the high and low voltage levels of the third test signal T3, and the high and / or duration of the high and low voltage levels of the fourth test signal T4, it is possible to turn on any one or some of all thin-film transistors and turn off the other one or some of all thin-film transistors at a test point.

[0095] In summary, embodiments of the present invention provide a display device and a detection method therefor. The display device includes a plurality of selection lines connected by a connecting line. Thus, in a line defect detection, a defect in a line adjacent to a selection line (e.g., an adjacent line on the same layer as the selection line) can be detected; for example, a line that is short-circuited (continuous) with the selection line can be detected.

[0096] In summary, although the present invention has been disclosed above with reference to embodiments, it is not intended to limit the invention. Those skilled in the art to which this invention pertains can make various modifications and variations without departing from the concept and scope of the invention. Therefore, the scope of protection of this invention shall be determined by the claims.

Claims

1. A display device, comprising: Multiple adapter pads; Multiple first scan lines, each of which is connected to the corresponding adapter pad along a first axis; Multiple second scan lines, each of which extends from the corresponding adapter pad along a second axial direction; Multiple data lines extend along this first axis; Multiple thin-film transistors, each of which is connected to the corresponding data line and the second scan line segment; Multiple selection lines extend along the first axis and are disconnected from the first scan line segments; A connecting line connects these select lines; and A first electrostatic discharge protection component is electrically connected to the connecting line.

2. The display device as claimed in claim 1, further comprising: A substrate having a display area and a non-display area; The adapter pads, the first scan segments, the second scan segments, the data lines, and the selection lines are disposed in the display area, while the connecting lines and the first electrostatic discharge protection device are disposed in the non-display area.

3. The display device of claim 2, wherein the non-display area has a first segment and a second segment opposite to each other, and the connecting line is disposed in the first segment and the second segment.

4. The display device as claimed in claim 1, further comprising: One substrate; The first electrostatic protection component is configured at a first corner of the substrate.

5. The display device as claimed in claim 4, further comprising: A second electrostatic discharge protection component is electrically connected to the connection line and is configured at a second corner of the substrate.

6. The display device as claimed in claim 5, wherein the first electrostatic discharge protection member and the second electrostatic discharge protection member are disposed on the same side of the display device.

7. The display device of claim 1, wherein the adapter pads are arranged along a diagonal of the display device.

8. The display device of claim 1, wherein the display device further comprises a switch circuit, and the connecting line, the first scan lines and the data lines are connected to the switch circuit.

9. A detection method, comprising: A display device is provided, comprising a plurality of adapter pads, a plurality of first scan lines, a plurality of second scan lines, a plurality of data lines, a plurality of thin-film transistors, a plurality of select lines, a connecting line, and a first electrostatic discharge (ESD) protection device. Each of the first scan lines is connected to a corresponding adapter pad along a first axial direction, each of the second scan lines extends from a corresponding adapter pad along a second axial direction, the data lines extend along the first axial direction, each thin-film transistor connects a corresponding data line to a second scan line, the select lines extend along the first axial direction and are disconnected from the first scan lines, the connecting line connects the select lines, and the first ESD protection device is electrically connected to the connecting line. A detection device outputs an activation signal to the connection line; The detection device outputs a first conduction signal to a first subject of the first scan lines; The detection device outputs a second conduction signal to a second subject of the data lines; as well as Based on the cutoff of the thin-film transistor coupling the first test subject and the second test subject, the detection device generates a defect detection signal.

10. The detection method of claim 9, wherein the connecting line, the first scanning lines and the data lines are connected to a switch line, and the first conduction signal and the second conduction signal are transmitted to the display device through the switch line.

Images