Chip testing fixture

Abstract

The application provides a chip testing fixture and relates to the technical field of chip testing fixtures, which comprises a fixing seat, a clamping part, a first supporting part and a power-on testing part, the middle part of the fixing seat is provided with a placing groove, the clamping part is slidably connected to the two sides of the fixing seat and faces the placing groove, the first supporting part is slidably connected to the fixing seat and is located on the two sides of the placing groove, the other end of the first supporting part is in transmission connection with the clamping part, the power-on testing part is detachably connected to the bottom of the fixing seat and extends to the center of the placing groove, when the clamping part clamps the chip in the placing groove, the first supporting part can be driven to move away from the two sides of the placing groove, so that the chip sinks into the placing groove and is clamped and in conductive contact with the power-on testing part; the application can clamp and press the chip at the same time during chip testing, is favorable for the rapid testing of the chip, and when different chips are tested, only the power-on testing part needs to be replaced, so that the material consumption of enterprises is reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to chip testing fixture technical field, especially to a kind of chip testing fixture. BACKGROUND

[0002] The classification of fixture, fixture can be divided into process assembly type fixture, project test type fixture and circuit board test type fixture three categories, and project test type fixture is as the fixture of chip testing.

[0003] And chip has multiple models, the thickness of different models of chip is different, and pin length is also different, when power-on test is carried out to chip, chip needs to be placed in fixture, and in order to ensure that the contact point at the bottom of chip is connected with test pin on fixture, chip needs to be pressed during testing, to ensure that test pin and contact point on chip form electrical connection, and then power-on performance of chip is successfully tested, but such pressing mode, if worker is pressed, then one more work station needs to be added, it is time-consuming and laborious, not conducive to saving labor cost, and if mechanical hand is pressed, then one more control equipment of mechanical hand needs to be added, equipment cost is increased, and time cost is also increased.

[0004] Therefore, it is necessary to provide a kind of chip testing fixture to clamp and press chip simultaneously, so that chip can be smoothly power-on tested, and production cost is also saved. SUMMARY

[0005] In order to solve the above problems, the present application provides a kind of chip testing fixture to clamp and press chip simultaneously, so that chip can be smoothly power-on tested, and production cost is also saved.

[0006] The present application is realized by the following technical scheme:

[0007] The present application provides a kind of chip testing fixture, including fixed seat, clamping part, first support part, power-on test part, the middle part of the fixed seat is equipped with placement slot, the clamping part is slidably connected to the two sides of the fixed seat and towards the placement slot, the first support part is slidably connected in the fixed seat and is located at the two sides of the placement slot, one side of the first support part forms elastic abutment with the fixed seat, one end of the first support part extends into the placement slot, the other end of the first support part forms transmission connection with the clamping part, the power-on test part is detachably connected to the bottom of the fixed seat and extends to the center of the placement slot, when the clamping part clamps chip in the placement slot, it can drive the first support part to move away from the two sides of the placement slot, so that chip sinks into the placement slot and is clamped and forms conductive contact with the power-on test part.

[0008] Further, the clamping part comprises two symmetrically arranged clamping assemblies, the fixed seat is symmetrically provided with two connecting grooves, two clamping assemblies are respectively one-to-one corresponding to two connecting grooves, a part of the clamping assembly is accommodated in the connecting groove and forms a sliding connection with the groove wall of the connecting groove, one end of the clamping assembly extends to the upper side of one side of the placing groove, and the other end of the clamping assembly forms a transmission connection with the first supporting part.

[0009] Further, the clamping assembly comprises a clamping block and a pushing plate, a part of the clamping block is accommodated in the connecting groove, one end of the clamping block extends to the upper side of one side of the placing groove, one end of the pushing plate is fixedly connected to the other end of the clamping block, and the other end of the pushing plate is towards the first supporting part and forms a transmission connection with the first supporting part.

[0010] Further, one end of the clamping block is provided with a pressing end, and the pressing end is located above one side of the placing groove.

[0011] Further, one side of the clamping block is provided with a connecting boss for fixed connection with the outside.

[0012] Further, the first supporting part comprises two supporting assemblies, the two supporting assemblies are symmetrically arranged, the fixed seat is symmetrically provided with sliding grooves, two supporting assemblies are respectively one-to-one corresponding to two sliding grooves and are accommodated in the sliding grooves, one end of the supporting assembly extends into the placing groove, the other end of the supporting assembly forms a transmission connection with the clamping assembly, and one side of the supporting assembly forms a resilient abutment with the groove wall of the sliding groove.

[0013] Further, the supporting assembly comprises a supporting block and two elastic members, one end of the supporting block extends into the placing groove, the other end of the supporting block forms a transmission connection with the clamping assembly, one end of each of the two elastic members is fixedly connected to one side of the supporting block, and the other end of each of the two elastic members abuts with the groove wall of the sliding groove.

[0014] Further, one end of the supporting block is provided with a supporting inclined table, the supporting inclined table extends into the placing groove, and the supporting inclined table is provided with an inclined surface for supporting the edge of the chip.

[0015] Further, the power test part comprises a pin seat and two clamping assemblies, the top of the pin seat is provided with a pin row part, the pin row part extends to the center of the placing groove, the two clamping assemblies are symmetrically arranged and fixedly connected to the bottom of the pin seat, the bottom of the fixed seat is provided with two clamping positions, and two clamping assemblies are respectively one-to-one corresponding to two clamping positions and form clamping connection.

[0016] Further, the chip testing fixture further comprises a second supporting part, the second supporting part is rotationally connected with the fixing base, the second supporting part is located on both sides of the power-on testing part, one end of the second supporting part extends into the placing groove, the other end of the second supporting part is transmissionally connected with the clamping part, and one side of the second supporting part is elastically abutted with the fixing base.

[0017] The present application has the following advantages:

[0018] The first supporting part supports the chip after the chip is placed in the placing groove, and the clamping part clamps and presses the two ends of the chip, so that the chip is completely sunk into the placing groove and is in contact with the power-on testing part to form an electrical connection. At this time, the power-on test can be started. After the chip test is completed, the clamping part is loosened, and the first supporting part is reset under the action of its elasticity. When the first supporting part is reset, it extends from both sides of the placing groove and gradually holds up the two sides of the chip. The chip is floated from the placing groove, and the external picking mechanical arm can pick up the chip. Therefore, the chip can be automatically clamped and fixed during testing, which is beneficial to rapid testing of the chip.

[0019] The power-on testing part is detachably connected with the fixing base. When testing different chips, the power-on testing part can be quickly replaced, which is multi-purpose and beneficial to saving the production cost of the testing fixture and reducing the material consumption of the enterprise.

[0020] In summary, the chip testing fixture can clamp and press the chip simultaneously during testing, which is beneficial to rapid testing of the chip. In addition, the power-on testing part is detachably connected with the fixing base. When testing different chips, only the power-on testing part needs to be replaced, which is multi-purpose and reduces the material consumption of the enterprise. BRIEF DESCRIPTION OF DRAWINGS

[0021] Figure 1 It is an overall schematic view of the chip testing fixture of the present application.

[0022] Figure 2 It is an exploded view of the chip testing fixture of the present application.

[0023] Figure 3 It is a bottom view of the chip testing fixture of the present application.

[0024] Figure 4A sectional view of the chip testing fixture of the present application;

[0025] Figure 5 Another angle sectional view of the chip testing fixture of the present application;

[0026] Figure 6 A schematic view of the power-on testing part of the chip testing fixture of the present application;

[0027] Figure 7 A schematic view of the supporting block of the chip testing fixture of the present application;

[0028] Figure 8 A Figure 3 A partial enlarged schematic view of the reference sign A;

[0029] Figure 9 A Figure 4 A partial enlarged schematic view of the reference sign B.

[0030] The reference signs are as follows:

[0031] The fixed seat 1, the placing groove 11, the mounting groove 111, the connecting groove 12, the sliding groove 13, the clamping position 14, the fixed groove 15;

[0032] The clamping part 2, the clamping assembly 21, the clamping block 211, the pressing end 2111, the connecting boss 2112, the pushing plate 212, the sliding inclined surface 2121;

[0033] The first supporting part 3, the supporting assembly 31, the supporting block 311, the supporting inclined table 3111, the inclined surface 31111, the elastic member 312;

[0034] The power-on testing part 4, the pin seat 41, the pin row part 411, the wire connecting part 412, the clamping assembly 42, the fixed frame 421, the clamping column 422, the clamping convex block 4221, the moving plate 4222, the spring 423;

[0035] The second supporting part 5, the supporting frame 51, the V-shaped elastic plate 52. DETAILED DESCRIPTION

[0036] In order to more clearly and completely illustrate the technical solutions of the present application, the present application will be further described below in combination with the drawings.

[0037] Please refer to Figures 1-9The chip testing fixture comprises a fixing seat 1, a clamping part 2, a first supporting part 3 and a power-on testing part 4. The middle part of the fixing seat 1 is provided with a placing groove 11. The clamping part 2 is slidably connected to the two sides of the fixing seat 1 and faces the placing groove 11. The first supporting part 3 is slidably connected to the fixing seat 1 and is located on the two sides of the placing groove 11. One side of the first supporting part 3 elastically abuts against the fixing seat 1. One end of the first supporting part 3 extends into the placing groove 11. The other end of the first supporting part 3 is in transmission connection with the clamping part 2. The power-on testing part 4 is detachably connected to the bottom of the fixing seat 1 and extends to the center of the placing groove 11. When the clamping part 2 clamps the chip in the placing groove 11, the first supporting part 3 is driven to move away from the two sides of the placing groove 11, so that the chip sinks into the placing groove 11 and is clamped and in conductive contact with the power-on testing part 4.

[0038] In the embodiment,

[0039] The fixing seat 1 is used for providing a stable mounting structure for the clamping part 2, the first supporting part 3 and the power-on testing part 4. The two sides of the fixing seat 1 are provided with fixing grooves 15 for clamping and fixing an external fixing structure.

[0040] The placing groove 11 is used for providing a space for placing and testing the chip. The placing groove 11 is slightly larger than the chip to be tested.

[0041] The clamping part 2 is used for clamping the chip placed in the placing groove 11.

[0042] The first supporting part 3 is used for supporting the chip placed in the placing groove 11.

[0043] The power-on testing part 4 is used for electrically connecting with the contact point at the bottom of the chip.

[0044] Specifically, when the chip is powered on for testing, the external pickup mechanical arm places the chip on the placement slot 11, and after the chip is placed in the placement slot 11, the first support part 3 supports the chip. The external pushing device applies force to the clamping part 2, and as the clamping part 2 clamps the chip, the clamping part 2 also drives the first support part 3 to slide. The first support part 3 gradually retreats from both sides of the placement slot 11. During the retreat, the chip gradually sinks, and the clamping part 2 clamps and presses both ends. After the first support part 3 is completely out of contact with the chip, the chip completely sinks into the placement slot 11 and contacts the power-on testing part 4 to form an electrical connection under the clamping and pressing of the clamping part 2. At this time, the chip is firmly fixed in the placement slot 11, and the chip can start the power-on test. After the chip is tested, the external pushing device is unloaded, and the clamping part 2 is released. During the release of the clamping part 2, the clamping part 2 also releases the force acting on the first support part 3, that is, the clamping part 2 no longer pushes the first support part 3 to slide. The first support part 3 is reset under the action of its own elasticity and extends into the placement slot 11 from both sides during the reset. During the extension, the first support part 3 gradually lifts the two sides of the chip, and the chip floats up from the placement slot 11. The external pickup mechanical arm can pick up the chip. In this way, the chip can be automatically clamped and fixed during testing, which is conducive to rapid testing of the chip.

[0045] Further, the clamping part 2 includes two symmetrical clamping assemblies 21, and the fixed seat 1 is symmetrically provided with two connecting grooves 12. The two clamping assemblies 21 correspond to the two connecting grooves 12 one by one. A part of the clamping assembly 21 is accommodated in the connecting groove 12 and forms a sliding connection with the groove wall of the connecting groove 12. One end of the clamping assembly 21 extends above one side of the placement slot 11. The other end of the clamping assembly 21 forms a transmission connection with the first support part 3. The clamping assembly 21 includes a clamping block 211 and a pushing plate 212. A part of the clamping block 211 is accommodated in the connecting groove 12, and one end of the clamping block 211 extends above one side of the placement slot 11. One end of the pushing plate 212 is fixedly connected to the other end of the clamping block 211, and the other end of the pushing plate 212 faces the first support part 3 and forms a transmission connection with the first support part 3. One end of the clamping block 211 is provided with a pressing end 2111, which is located above one side of the placement slot 11. One side of the clamping block 211 is provided with a connecting boss 2112 for fixed connection with the outside.

[0046] In the present embodiment:

[0047] The clamping assembly 21 is used to clamp and press the chip placed in the placement slot 11.

[0048] The clamping block 211 is used to clamp and press both ends of the chip.

[0049] The pressing end 2111 is used for pressing the chip during clamping the chip by the clamping block 211;

[0050] The connecting boss 2112 is used for providing a structure for the clamping block 211 to be fixedly connected with the external pushing device;

[0051] The pushing plate 212 is used for pushing the first supporting part 3 to slide, so that the first supporting part 3 is withdrawn from the placing groove 11, and the pushing plate 212 is provided with a sliding slope 2121 which is in connection with the bottom of the supporting block 311;

[0052] The connecting groove 12 is used for providing a sliding space for the clamping assembly 21;

[0053] Specifically, after the chip is placed in the placing groove 11, the first supporting part 3 first supports the left and right sides of the chip, and when the external pushing device pushes the clamping assembly 21 towards the chip, the pushing plate 212 also slides, so that the sliding slope 2121 pushes the first supporting part 3 to slide in the opposite direction of the chip, so that the first supporting part 3 gradually withdraws from the placing groove 11. When the first supporting part 3 is withdrawn, the chip sinks, and at the same time, the two pressing ends 2111 abut against the two ends of the chip. With the sliding of the clamping block 211 towards the chip, the pressing end 2111 also presses the chip. After the first supporting part 3 is completely withdrawn from the placing groove 11, the chip completely sinks into the placing groove 11 and contacts the power-on test part 4 to form an electrical connection. At this time, the pressing end 2111 completely clamps and presses the two ends of the chip stably. After the chip is tested, the clamping block 211 is reversely slid by the external pushing device, and the pushing plate 212 releases the pressing of the first supporting part 3, so that the first supporting part 3 is reset and the chip floats up.

[0054] Further, the first supporting part 3 includes two supporting assemblies 31 which are symmetrically arranged. The fixed seat 1 is provided with two sliding grooves 13 symmetrically, and the two supporting assemblies 31 are respectively corresponded to and accommodated in the two sliding grooves 13. One end of the supporting assembly 31 extends into the placing groove 13, and the other end of the supporting assembly 31 is in transmission connection with the clamping assembly 21. One side of the supporting assembly 31 is in elastic abutment with the groove wall of the sliding groove 13. The supporting assembly 31 includes a supporting block 311 and two elastic members 312. One end of the supporting block 311 extends into the placing groove 11, and the other end of the supporting block 311 is in transmission connection with the clamping assembly 21. One end of each of the two elastic members 312 is fixedly connected with one side of the supporting block 311, and the other end of each of the two elastic members 312 is in abutment with the groove wall of the sliding groove 13. One end of the supporting block 311 is provided with a supporting inclined platform 3111 which extends into the placing groove 11, and the supporting inclined platform 3111 is provided with an inclined surface 31111 for supporting the edge of the chip.

[0055] In the embodiment, the support assembly 31 is used to support the two sides of the chip placed in the placing groove 11.

[0056] The support assembly 31 is used to support the two sides of the chip placed in the placing groove 11.

[0057] The support block 311 is used to support the chip.

[0058] The support inclined table 3111 is used to provide a supporting structure for the edge of the chip.

[0059] The inclined surface 31111 is used to provide a supporting structure for the edge of the chip.

[0060] The elastic member 312 is used to provide a reset elastic structure for the support block 311.

[0061] The sliding groove 13 is used to provide a sliding space for the support block 311.

[0062] Specifically, when the chip is placed in the placing groove 11, the two sides of the chip are supported by the support inclined table 3111, and when the two clamping assemblies 21 start to clamp and press the chip, the two support blocks 311 are simultaneously pushed by the push plate 212 and slide towards the opposite direction of the placing groove 11, at this time the elastic member 312 is extruded, and the support inclined table 3111 gradually withdraws from the placing groove 11, during the withdrawal process, the edge of the chip is supported by the inclined surface 31111, so that the chip forms a gradual sinking process, and after the support inclined table 3111 completely withdraws from the placing groove 11, the chip is completely sunk into the placing groove 11, at this time the chip can be tested for power-on.

[0063] After the chip test is completed, the push plate 212 no longer exerts force on the support block 311, and the support block 311 is reset under the elastic force of the elastic member 312, at this time the support inclined table 3111 gradually extends into the placing groove 11, and the extension of the support inclined table 3111 causes the inclined surface 31111 to first contact the two sides of the chip, during the extension of the support inclined table 3111, the chip is lifted, and after the support block 311 is reset, the support inclined table 3111 supports the chip again, and the chip is lifted.

[0064] Further, the power-on test part 4 includes a pin seat 41 and two clamping assemblies 42, the top of the pin seat 41 is provided with a pin row part 411, the pin row part 411 extends to the center of the placing groove 11, and the two clamping assemblies 42 are symmetrically arranged and fixedly connected to the bottom of the pin seat 41, the bottom of the fixed seat 1 is provided with two clamping positions 14, and the two clamping assemblies 42 correspond to the two clamping positions 14 one by one and form clamping connection.

[0065] In the embodiment, the support assembly 31 is used to support the two sides of the chip placed in the placing groove 11.

[0066] The pin seat 41 is used to form an electrical connection with the bottom of the chip. The bottom of the pin seat 41 is provided with a wire connecting portion 412 for welding with an external conductive wire. The wire connecting portion 412 is electrically connected with the pin portion 411.

[0067] The pin portion 411 is used to form an electrical connection with the contact points on the bottom of the chip.

[0068] The clamping assembly 42 is shared by two, which is used to provide a clamping structure for the pin seat 41 and the fixed seat 1. The clamping assembly 42 includes a fixed frame 421, a clamping column 422, and a spring 423. The fixed frame 421 is fixedly connected to the bottom of the pin seat 41. The clamping column 422 penetrates the spring 423 and the fixed frame 421 in sequence. The clamping column 422 is in sliding connection with the fixed frame 421. One end of the spring 423 is in abutment with the clamping column 422, and the other end of the spring 423 is in abutment with the fixed frame 421. One end of the clamping column 422 is provided with a clamping protrusion 4221, which is in clamping connection with the clamping position 14. The other end of the clamping column 422 is provided with a bending plate 4222, which is used to bend when replacing the pin seat 41, so that the clamping protrusion 4221 is disconnected from the clamping connection with the clamping position 14.

[0069] The clamping position 14 is used to form a clamping connection with the clamping assembly 42.

[0070] Specifically, during assembly, the worker aligns the power-on test portion 4 with the clamping position 14 on the bottom of the fixed seat 1 and then clamps it in. At this time, the pin seat 41 is fixed on the bottom of the fixed seat 1. The clamping assembly 42 is in clamping connection with the clamping position 14. The pin portion 411 extends to the center of the placement groove 11. When replacing the pin seat 41, the two bending plates 4222 are manually bent. After bending, the clamping column 422 slides backward. The spring 423 is compressed, so that the clamping protrusion 4221 is disconnected from the clamping connection with the clamping position 14. At this time, the pin seat 41 can be taken out for replacement. In this way, the power-on test portion 4 can be quickly replaced when testing different chips. One object has multiple uses, which is beneficial to save the production cost of the test fixture and reduce the material consumption of the enterprise.

[0071] Further, the chip test fixture further includes a second support portion 5. The second support portion 5 is in rotational connection with the fixed seat 1. The second support portion 5 is located on both sides of the power-on test portion 4. One end of the second support portion 5 extends into the placement groove 11. The other end of the second support portion 5 is in transmission connection with the clamping portion 2. One side of the second support portion 5 is in elastic abutment with the fixed seat 1.

[0072] In the embodiment:

[0073] The second supporting part 5 is used for providing a supporting structure for the chip placed in the placing groove 11, which has the same function as the first supporting part 3, but provides support for the central part of the chip, so that the chip can sink stably;

[0074] Specifically, the second supporting part 5 comprises a lifting frame 51 and a V-shaped elastic plate 52, the bottom wall of the placing groove 11 is provided with a mounting groove 111, the lifting frame 51 is rotationally connected with the groove wall of the mounting groove 111 and is partially accommodated in the mounting groove 111, one end of the V-shaped elastic plate 52 is fixedly connected with one side of the lifting frame 51, the other end of the V-shaped elastic plate 52 elastically abuts against the rear groove wall of the mounting groove 111, the top of the lifting frame 51 extends into the placing groove 11, and the bottom of the lifting frame 51 is aligned with the pushing plate 212;

[0075] After the chip is placed in the placing groove 11, the top of the lifting frame 51 also supports the bottom of the chip, when the clamping assembly 21 clamps the chip, the pushing plate 212 pushes the supporting assembly 31 and also pushes the bottom of the lifting frame 51, the lifting frame 51 is rotated under the pushing of the pushing plate 212, so that the top of the lifting frame 51 is gradually rotated towards the direction of the mounting groove 111, that is, the top of the lifting frame 51 is gradually retracted into the mounting groove 111, and the V-shaped elastic plate 52 is compressed, and the chip sinks, after the chip is tested, the pushing plate 212 no longer pushes the bottom of the lifting frame 51, the V-shaped elastic plate 52 is released and drives the lifting frame 51 to rotate and reset, at this time, the top of the lifting frame 51 rotates and extends out of the placing groove 11, and the chip is lifted.

[0076] In summary, the chip testing fixture can clamp and press the chip at the same time during testing, which is beneficial to rapid testing of the chip, and the power-on testing part is connected with the fixing seat in a detachable manner, so that different chips can be tested by only replacing the power-on testing part, one object has multiple uses, and material consumption of enterprises is reduced.

[0077] Of course, the present application can have other various embodiments, and based on the embodiments, other embodiments obtained by those skilled in the art without any creative labor are within the scope of the present application.

Claims

1. A chip testing fixture, characterized in that, The device includes a fixed base, a clamping part, a first support part, and a power-on testing part. The fixed base has a placement groove in the middle. The clamping part is slidably connected to both sides of the fixed base and faces the placement groove. The first support part is slidably connected inside the fixed base and located on both sides of the placement groove. One side of the first support part forms an elastic abutment with the fixed base. One end of the first support part extends into the placement groove, and the other end of the first support part forms a transmission connection with the clamping part. The power-on testing part is detachably connected to the bottom of the fixed base and extends to the center of the placement groove. When the clamping part clamps the chip in the placement groove, it can drive the first support part to move away towards both sides of the placement groove, so that the chip sinks into the placement groove and is clamped and forms a conductive contact with the power-on testing part. The clamping part includes two symmetrically arranged clamping components. The fixed base is symmetrically provided with two connecting slots. The two clamping components correspond one-to-one with the two connecting slots. A part of the clamping component is received in the connecting slot and forms a sliding connection with the slot wall. One end of the clamping component extends to the upper side of the placement slot, and the other end of the clamping component forms a transmission connection with the first support part. The clamping assembly includes a clamping block and a push plate. A portion of the clamping block is housed in the connecting groove, and one end of the clamping block extends above one side of the placement groove. One end of the push plate is fixedly connected to the other end of the clamping block, and the other end of the push plate faces the first support portion and forms a transmission connection with the first support portion. The first support part includes two support components, which are symmetrically arranged. The fixed base is symmetrically provided with sliding grooves. The two support components correspond one-to-one with the two sliding grooves and are housed in the sliding grooves. One end of the support component extends into the placement groove, and the other end of the support component forms a transmission connection with the clamping component. One side of the support component forms an elastic abutment with the groove wall of the sliding groove. The power-on testing unit includes a pin base and two snap-fit ​​components. The pin base has a pin row section on its top, which extends to the center of the placement slot. The two snap-fit ​​components are symmetrically arranged and fixedly connected to the bottom of the pin base. The bottom of the fixed base has two engagement positions. The two snap-fit ​​components correspond one-to-one with the two engagement positions and form an engagement connection.

2. The chip testing fixture according to claim 1, characterized in that, One end of the clamping block is provided with a pressing end, which is located above one side of the placement groove.

3. The chip testing fixture according to claim 2, characterized in that, One side of the clamping block is provided with a connecting boss for forming a fixed connection with the outside.

4. The chip testing fixture according to claim 3, characterized in that, The support assembly includes a support block and two elastic members. One end of the support block extends into the placement groove, and the other end of the support block forms a transmission connection with the clamping assembly. One end of each of the two elastic members is fixedly connected to one side of the support block, and the other end of each of the two elastic members abuts against the groove wall of the sliding groove.

5. The chip testing fixture according to claim 4, characterized in that, One end of the support block is provided with a support ramp, which extends into the placement groove, and the support ramp is provided with a slope for supporting the edge of the chip.

6. The chip testing fixture according to claim 5, characterized in that, The chip testing fixture also includes a second support portion, which is rotatably connected to the fixed base. The second support portion is located on both sides of the power-on testing portion. One end of the second support portion extends into the placement groove, and the other end of the second support portion is connected to the clamping portion. One side of the second support portion elastically abuts against the fixed base.

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