Processing method and device of flicker pulse, equipment and storage medium

Abstract

This application discloses a method, apparatus, device, and storage medium for processing flicker pulses. The method includes obtaining a first expression function corresponding to the flicker pulse, the first expression function including one or more first parameters to be fitted; digitally sampling the flicker pulse to obtain first sampled data; converting the first expression function into a first objective function, and converting the first sampled data into first target data, wherein the first objective function includes first target parameters corresponding to the parameters to be fitted; determining the first target parameters based on the first target data using a non-iterative solution method; determining the first parameters to be fitted based on the first target parameters; and obtaining first valid information carried by the flicker pulse based on the first expression function determined by the parameters. This application enables real-time processing of flicker pulses with minimal computational resource consumption.

Description

TECHNICAL FIELD

[0001] The present application relates to the field of data processing, and in particular to a method and device for processing scintillation pulses, an apparatus and a storage medium. BACKGROUND

[0002] In a series of applications of high-energy rays, such as positron emission tomography (PET), radiation detection, geological resource exploration, and security inspection, high-energy rays, such as gamma rays, are converted into visible light signals by a scintillation crystal, the visible light signals are further converted into scintillation pulse signals by a photoelectric conversion device, and then a series of application images or spectral information can be obtained by sampling and processing the scintillation pulse signals. The sampling of the scintillation pulse and the processing of the sampled data are very critical.

[0003] A current method for processing the sampled data of the scintillation pulse is based on prior scintillation pulse shape information, and the sampled data is processed by pulse fitting to achieve accurate acquisition of particle energy deposition information. The Levenberg-Marquardt method is the current pulse fitting optimization algorithm and the most widely used nonlinear least squares iteration algorithm. It is a nonlinear optimization method that uses gradient to find the maximum (minimum) value, and is between the Newton method and the gradient descent method, and has the advantages of both gradient method and Newton method.

[0004] However, this method requires setting an iteration of usually 100-1000 times. In the algorithm process, the parameter value calculated after each iteration needs to be evaluated, and the result of the current iteration is sent to the next iteration. Therefore, 100-1000 iterations will undoubtedly slow down the calculation speed, and cannot be applied in some scenarios that require calculation time. The fitting method cannot further improve the fitting rate by using hardware or software methods. Even using a higher speed CPU or multi-thread processing cannot make up for the time consumption caused by the large number of iterations. If FPGA, ASIC, or other hardware circuits are used for fitting, it will be difficult to complete due to excessive hardware resource consumption and excessive clock cycle calculation.

[0005] At the same time, due to the limitation that the current fitting algorithm must be implemented on the software side, the sampled data obtained by sampling is output by a hardware circuit, and then transmitted to a computer through a serial port, Ethernet, Bluetooth, Wi-Fi, or other transmission channels for software processing. The transmission of these data will occupy more transmission bandwidth. In some application scenarios that require ultra-long distance information transmission, in order to ensure stable and reliable transmission of information, the sampling information must be sent to the computer through carrier communication or other methods. At this time, the bandwidth for transmitting information is very limited. The existing method will result in a low count rate due to the limitation of transmission bandwidth. SUMMARY

[0006] The technical problem to be solved by the embodiments of the present application is how to realize real-time processing of flicker pulses under low computing resources.

[0007] To solve the above problems, the present application discloses a processing method, device and equipment for flicker pulses and a storage medium.

[0008] According to a first aspect of the present application, a processing method for flicker pulses is provided. The processing method comprises: obtaining a first expression function corresponding to the flicker pulses, the first expression function comprising one or more first to-be-fitted parameters; digitally sampling the flicker pulses to obtain first sampling data; converting the first expression function into a first target function, and converting the first sampling data into first target data, wherein the first target function comprises one or more first target parameters corresponding to the first to-be-fitted parameters respectively; determining the first target parameters based on the first target data by using a non-iterative solving method; determining the first to-be-fitted parameters based on the first target parameters; and obtaining first effective information carried by the flicker pulses based on the first expression function determined based on the parameters.

[0009] According to some embodiments of the present application, the first sampling data comprises a quantity-time pair, and the quantity comprises at least a voltage quantity, a current quantity, an energy quantity or a sound intensity quantity.

[0010] According to some embodiments of the present application, the first expression function is a quantity-time function, and the conversion of the first expression function into the first target function comprises: obtaining first standard reference data, the first standard reference data comprising a first quantity reference value and a first time reference value; performing quantity reference transformation and time reference transformation on the first expression function based on the first quantity reference and the first time reference to obtain the first target function.

[0011] According to some embodiments of the present application, the first time reference value is determined based on a first sampling time in the first sampling data, and the first quantity reference value is determined based on a quantity corresponding to the first sampling time in the first sampling data or a property of the flicker pulses.

[0012] According to some embodiments of the present application, the conversion of the first sampling data into the first target data comprises: performing quantity reference transformation and time reference transformation on the first sampling data based on the first standard reference data.

[0013] According to some embodiments of the present application, the converting the first sampling data further comprises: obtaining first correction data, the first correction data comprising a first metrology value correction value and a first time correction value; performing metrology value correction and time correction on the first sampling data after the reference transformation based on the first metrology value correction value and the first time correction value to obtain the first target data.

[0014] According to some embodiments of the present application, the first correction data is determined based on prior information of the scintillation pulse.

[0015] According to some embodiments of the present application, the determining the first to-be-fitted parameter based on the first target parameter comprises: obtaining a first conversion relationship between the first to-be-fitted parameter and the first target parameter in the process of converting the first expression function into the first target function; and determining the first to-be-fitted parameter based on the first conversion relationship and the determined first target parameter.

[0016] According to some embodiments of the present application, the first effective information at least comprises a first energy value of the scintillation pulse, and the obtaining the first energy value of the scintillation pulse comprises: integrating the parameter-determined first expression function to obtain the first energy value.

[0017] According to some embodiments of the present application, the non-iterative solution mode comprises a direct solution method.

[0018] According to some embodiments of the present application, the first expression function is determined based on prior information of the scintillation pulse, and the prior information is obtained based on a digital oscilloscope.

[0019] According to some embodiments of the present application, the digitizing sampling of the scintillation pulse comprises: performing multi-threshold sampling or ADC sampling on the scintillation pulse.

[0020] According to a second aspect of the present application, another method for processing a scintillation pulse is provided. The method comprises: obtaining a first prior waveform corresponding to the scintillation pulse and a second expression function, wherein the second expression function comprises one or more second parameters to be fitted; obtaining second sampling data obtained by digitizing the scintillation pulse; selecting a first initial correction data, and converting at least the second sampling data into second target data based on the first initial correction data; solving the second parameters to be fitted based on the second target data; comparing whether a difference between the first prior waveform and spectral information of the scintillation pulse presented by the second expression function determined by the parameters is within a preset error; if yes, determining that the first initial correction data is first target correction data; if no, adjusting the first initial correction data, and repeating the solving of the second expression function and the comparison operation until the difference between the first prior waveform and the spectral information of the scintillation pulse presented by the second expression function determined by the parameters is within the preset error.

[0021] According to some embodiments of the present application, the first prior waveform and the second expression function are determined based on prior information of the scintillation pulse, and the prior information is obtained based on a digital oscilloscope.

[0022] According to some embodiments of the present application, the first initial correction data comprises a first initial metrology value correction value and a first initial time correction value; and the converting at least the second sampling data into the second target data based on the first initial correction data comprises: obtaining second standard reference data, wherein the second standard reference data comprises a second metrology value reference value and a second time reference value; performing metrology value reference transformation and time reference transformation on the second sampling data based on the second metrology value reference value and the second time reference value; and performing metrology value correction and time correction on the second sampling data after the reference transformation based on the first initial metrology value correction value and the first initial time correction value, to obtain the second target data.

[0023] According to some embodiments of the present application, the second time reference value is determined based on a first sampling time in the second sampling data, and the second metrology value reference value is determined based on a metrology value corresponding to the first sampling time in the second sampling data or a property of the scintillation pulse.

[0024] According to some embodiments of the present application, the solving the second parameters to be fitted based on the second target data comprises fitting the second expression function based on the second target data to determine the second parameters to be fitted.

[0025] According to some embodiments of the present application, the solving the second to-be-fitted parameter based on the second target data comprises: converting the second expression function into a second target function, the second target function comprising one or more second target parameters corresponding to the one or more second to-be-fitted parameters respectively; solving the second target parameters based on the second target data; and determining the second to-be-fitted parameter based on the determined second target parameters to determine the second expression function.

[0026] According to some embodiments of the present application, the converting the second expression function into a second target function comprises: performing a reference transformation on the second expression function based on the second reference data to obtain the second target function.

[0027] According to some embodiments of the present application, the determining the second to-be-fitted parameter based on the second target parameters comprises: obtaining a second conversion relationship between the second to-be-fitted parameter and the second target parameter in the process of converting the second expression function into the second target function; and determining the second to-be-fitted parameter based on the second conversion relationship and the determined second target parameters.

[0028] According to some embodiments of the present application, the second sampling data is determined based on a multi-threshold sampling operation or an ADC sampling operation performed on the scintillation pulse.

[0029] According to a third aspect of the present application, another method for processing a scintillation pulse is provided. The method comprises: obtaining a third expression function corresponding to the scintillation pulse and a third target function, wherein the third target function is obtained by converting the third expression function based on a first parameter transformation formula, the third expression function comprising one or more third to-be-fitted parameters, and the third target function comprising one or more third target parameters corresponding to the one or more third to-be-fitted parameters respectively; performing digital sampling on the scintillation pulse to obtain third sampling data; converting the third sampling data based on a first preset reference transformation correction formula to obtain third target data; determining the third target parameters based on the third target data by using a non-iterative solving method; determining the third to-be-fitted parameters based on the parameter-determined third target function by using the first parameter transformation formula; and obtaining second effective information carried by the scintillation pulse based on the parameter-determined third expression function.

[0030] According to some embodiments of the present application, the third sampling data comprises a quantity-time pair, and the quantity comprises at least a voltage quantity, a current quantity, an energy quantity, or an acoustic intensity quantity.

[0031] According to some embodiments of the present application, the first preset reference transformation correction formula is used for reference transformation of third standard reference data, the third standard reference data comprising a third metrological value reference value and a third time reference value.

[0032] According to some embodiments of the present application, the third time reference value is determined based on a first sampling time in the third sampling data, and the third metrological value reference value is determined based on a metrological value corresponding to the first sampling time in the third sampling data or a property of the scintillation pulse.

[0033] According to some embodiments of the present application, the first preset reference transformation correction formula is used for correction of third correction data, the third correction data comprising a third metrological value correction value and a third time correction value.

[0034] According to some embodiments of the present application, the third correction data is determined based at least on prior information of the scintillation pulse.

[0035] According to some embodiments of the present application, the second effective information at least comprises a second energy value of the scintillation pulse, and the second energy value of the scintillation pulse is obtained by integrating the third expression function determined by the parameter.

[0036] According to some embodiments of the present application, the non-iterative solution method comprises a direct solution method.

[0037] According to some embodiments of the present application, the third expression function is determined based on prior information of the scintillation pulse, and the prior information is obtained based on digital oscilloscope acquisition.

[0038] According to some embodiments of the present application, the digital sampling of the scintillation pulse comprises a multi-threshold sampling operation or an ADC sampling operation performed on the scintillation pulse.

[0039] According to a fourth aspect of the present application, another method for processing a scintillation pulse is provided. The method comprises: obtaining a second prior waveform corresponding to the scintillation pulse and a fourth expression function, wherein the fourth expression function comprises one or more fourth to-be-fitted parameters; obtaining fourth sampling data obtained by digitizing and sampling the scintillation pulse; selecting second initial correction data, and obtaining a second preset reference transformation correction formula and a second parameter transformation formula; solving the fourth to-be-fitted parameters based on the second initial correction data, the fourth sampling data, the second preset reference transformation correction formula, and the second parameter transformation formula; comparing whether a difference between the second prior waveform and spectral information of the scintillation pulse presented by the fourth expression function determined by the parameters is within a preset error; if yes, determining that the second initial correction data is second target correction data; if no, adjusting the second initial correction data, and repeating the solving of the fourth expression function and the comparison operation until the difference between the second prior waveform and the spectral information of the scintillation pulse presented by the fourth expression function determined by the parameters is within the preset error.

[0040] According to some embodiments of the present application, the second prior waveform and the fourth expression function are determined based on prior information of the scintillation pulse, and the prior information is obtained based on a digital oscilloscope.

[0041] According to some embodiments of the present application, the solving of the fourth to-be-fitted parameters comprises: performing reference transformation and correction on the fourth sampling data based on the second preset reference transformation correction formula and the second initial correction data to obtain fourth target data; solving a fourth target function corresponding to the scintillation pulse based on the fourth target data, wherein the fourth target function comprises one or more fourth target parameters corresponding to the fourth to-be-fitted parameters respectively; and converting the fourth target function into the fourth expression function based on the second parameter transformation formula, so as to determine the fourth to-be-fitted parameters based on the fourth target parameters.

[0042] According to a fifth aspect of the present application, a processing device for a scintillation pulse is provided. The processing device comprises: a first obtaining module configured to obtain a first expression function corresponding to the scintillation pulse, the first expression function comprising one or more first to-be-fitted parameters; a first sampling module configured to digitally sample the scintillation pulse to obtain first sampling data; a first converting module configured to convert the first expression function into a first target function, and convert the first sampling data into first target data, wherein the first target function comprises one or more first target parameters corresponding to the to-be-fitted parameters respectively; a first calculating module configured to determine the first target parameters by using a non-iterative solving method based on the first target data; a first determining module configured to determine the first to-be-fitted parameters based on the first target parameters; and a first extracting module configured to obtain first effective information carried by the scintillation pulse based on the first expression function with the determined parameters.

[0043] According to some embodiments of the present application, the first sampling data comprises a quantity-time pair, and the quantity comprises at least a voltage quantity, a current quantity, an energy quantity, or an acoustic intensity quantity.

[0044] According to some embodiments of the present application, the first expression function is a quantity-time function, and the first converting module is configured to: obtain first standard reference data comprising a first quantity reference value and a first time reference value; and perform quantity reference transformation and time reference transformation on the first expression function based on the first quantity reference value and the first time reference value to obtain the first target function.

[0045] According to some embodiments of the present application, the first converting module is further configured to: obtain first correction data comprising a first quantity correction value and a first time correction value; and perform quantity correction and time correction on the first sampling data after the reference transformation based on the first quantity correction value and the first time correction value to obtain the first target data.

[0046] According to some embodiments of the present application, the first correction data is determined based at least on prior information of the scintillation pulse.

[0047] According to some embodiments of the present application, the first determining module is configured to: obtain a first conversion relationship between the first to-be-fitted parameters and the first target parameters in the process of converting the first expression function into the first target function; and determine the first to-be-fitted parameters based on the first conversion relationship and the determined first target parameters.

[0048] According to some embodiments of the present application, the first effective information at least includes a first energy value of the scintillation pulse, and the first extraction module is configured to: integrate the first expression function with the determined parameters to obtain the first energy value.

[0049] According to some embodiments of the present application, the first calculation module determines the first target parameter by using a direct solution method.

[0050] According to some embodiments of the present application, the first expression function is determined based on prior information of the scintillation pulse, and the prior information is obtained based on digital oscilloscope acquisition.

[0051] According to some embodiments of the present application, the first sampling module uses a multi-threshold sampling method or an ADC sampling method to digitally sample the scintillation pulse.

[0052] According to a sixth aspect of the present application, another processing device for scintillation pulse is provided. The processing device comprises: a second acquisition module configured to acquire a first prior waveform corresponding to the scintillation pulse and a second expression function, wherein the second expression function includes one or more second parameters to be fitted; a second sampling module configured to acquire second sampling data obtained by digitally sampling the scintillation pulse; a second conversion module configured to select a first initial correction data and convert at least the second sampling data into second target data based on the first initial correction data; a second calculation module configured to solve the second parameters to be fitted based on the second target data; and a second determination module configured to compare whether a difference between the first prior waveform and energy spectrum information of the scintillation pulse presented by the second expression function with the determined parameters is within a preset error; if yes, determining that the first initial correction data is a first target correction data; if no, adjusting the first initial correction data, and repeating the solving of the second expression function and the comparison operation until the difference between the first prior waveform and the energy spectrum information of the scintillation pulse presented by the second expression function with the determined parameters is within the preset error.

[0053] According to some embodiments of the present application, the first prior waveform and the second expression function are determined based on prior information of the scintillation pulse, and the prior information is obtained based on digital oscilloscope acquisition.

[0054] According to some embodiments of the present application, the first initial correction data includes a first initial metrology value correction value and a first initial time correction value; the second conversion module is configured to: acquire second standard reference data, the second standard reference data including a second metrology value reference value and a second time reference value; perform metrology value reference conversion and time reference conversion on the second sampling data based on the second metrology value reference value and the second time reference value; perform metrology value correction and time correction on the second sampling data after reference conversion based on the first initial metrology value correction value and the first initial time correction value, to obtain the second target data.

[0055] According to some embodiments of the present application, the second time reference value is determined based on a first sampling time in the second sampling data, and the second metrology value reference value is determined based on a metrology value corresponding to the first sampling time in the second sampling data or a property of the scintillation pulse.

[0056] According to some embodiments of the present application, the second calculation module is configured to: perform iterative fitting on the second expression function based on the second target data, to determine the second to-be-fitted parameter.

[0057] According to some embodiments of the present application, the second calculation module is configured to: convert the second expression function into a second target function, the second target function including one or more second target parameters corresponding to the one or more second to-be-fitted parameters respectively; solve the second target parameters based on the second target data; and determine the second to-be-fitted parameter based on the determined second target parameters, to determine the second expression function.

[0058] According to some embodiments of the present application, the second calculation module is configured to: perform reference conversion on the second expression function based on the second standard reference data, to obtain the second target function.

[0059] According to some embodiments of the present application, the second calculation module is configured to: acquire a second conversion relationship between the second to-be-fitted parameter and the second target parameter in the process of converting the second expression function into the second target function; and determine the second to-be-fitted parameter based on the second conversion relationship and the determined second target parameters.

[0060] According to some embodiments of the present application, the second sampling module determines the second sampling data by a multi-threshold sampling method or an ADC sampling method.

[0061] According to a seventh aspect of the present application, another scintillation pulse processing apparatus is provided. The processing apparatus comprises: a third obtaining module configured to obtain a third expression function corresponding to a scintillation pulse and a third target function, wherein the third target function is obtained by converting the third expression function based on a first parameter transformation formula, the third expression function comprises one or more third fitting parameters, and the third target function comprises one or more third target parameters corresponding to the third fitting parameters respectively; a third sampling module configured to digitally sample the scintillation pulse to obtain third sampling data; a third converting module configured to convert the third sampling data based on a first preset reference transformation correction formula to obtain third target data; a third calculating module configured to determine the third target parameters based on the third target data by using a non-iterative solving method; a third determining module configured to determine the third fitting parameters based on the parameter-determined third target function by using the first parameter transformation formula; and a second extracting module configured to obtain second effective information carried by the scintillation pulse based on the parameter-determined third expression function.

[0062] According to some embodiments of the present application, the third sampling data comprises a plurality of magnitude-time pairs, and the plurality of magnitudes comprises at least a voltage magnitude, a current magnitude, an energy magnitude, or an acoustic intensity magnitude.

[0063] According to some embodiments of the present application, the first preset reference transformation correction formula is used to perform reference transformation on third reference data, and the third reference data comprises a third magnitude reference value and a third time reference value.

[0064] According to some embodiments of the present application, the third time reference value is determined based on a first sampling time in the third sampling data, and the third magnitude reference value is determined based on a magnitude corresponding to the first sampling time in the third sampling data or a property of the scintillation pulse.

[0065] According to some embodiments of the present application, the first preset reference transformation correction formula is used to perform correction on third correction data, and the third correction data comprises a third magnitude correction value and a third time correction value.

[0066] According to some embodiments of the present application, the second effective information comprises at least a second energy value of the scintillation pulse, and the second extracting module is configured to integrate the parameter-determined third expression function to obtain the second energy value.

[0067] According to some embodiments of the present application, the third sampling module digitally samples the scintillation pulse by using a multi-threshold sampling method or an ADC sampling method.

[0068] According to an eighth aspect of the present application, another processing device of scintillation pulses is provided. The processing device comprises: a fourth obtaining module configured to obtain a second prior waveform corresponding to a scintillation pulse and a fourth expression function, wherein the fourth expression function comprises one or more fourth parameters to be fitted; a fourth sampling module configured to obtain fourth sampling data obtained by digitizing sampling of the scintillation pulse; a fourth converting module configured to select second initial correction data, and obtain a second preset reference transformation correction formula and a second parameter transformation formula; a fourth calculating module configured to solve the fourth parameters to be fitted based on the second initial correction data, the fourth sampling data, the second preset reference transformation correction formula and the second parameter transformation formula; and a fourth determining module configured to compare whether a difference between the second prior waveform and spectral information of the scintillation pulse presented by the fourth expression function determined by parameters is within a preset error; if yes, determining that the second initial correction data is second target correction data; and if no, adjusting the second initial correction data, and repeating the solving of the fourth expression function and the comparison operation until the difference between the second prior waveform and the spectral information of the scintillation pulse presented by the fourth expression function determined by parameters is within the preset error.

[0069] According to some embodiments of the present application, the second prior waveform and the fourth expression function are determined based on prior information of the scintillation pulse, and the prior information is obtained based on a digital oscilloscope.

[0070] According to some embodiments of the present application, the fourth calculating module is configured to: perform reference transformation and correction on the fourth sampling data based on the second preset reference transformation correction formula and the second initial correction data, to obtain fourth target data; solve a fourth target function corresponding to the scintillation pulse based on the fourth target data, wherein the fourth target function comprises one or more fourth target parameters corresponding to the fourth parameters to be fitted respectively; and convert the fourth target function into the fourth expression function based on the second parameter transformation formula, to determine the one or more fourth parameters to be fitted based on the one or more fourth target parameters.

[0071] According to a ninth aspect of the present application, a processing device is provided. The processing device comprises the processing device of scintillation pulses as described above.

[0072] According to a tenth aspect of the present application, a processing device is provided. The processing device comprises a memory, a processor, and a computer program stored in the memory and executable on the processor. The computer program is executed by the processor to implement the processing method as described above.

[0073] According to an eleventh aspect of the present application, a computer readable storage medium is provided. The storage medium stores a computer program which, when executed by a processor, implements the processing method as described above.

[0074] The processing method, device, equipment and storage medium of the scintillation pulse disclosed in the present application can complete the solving processing of the complex function online under the condition of extremely few resource occupation, so that the result can be obtained without a large amount of computing resources and a large amount of time, and the strong requirement for hardware resources in similar applications is reduced. BRIEF DESCRIPTION OF DRAWINGS

[0075] The present application will be further illustrated in the form of exemplary embodiments, which will be described in detail with reference to the accompanying drawings. These embodiments are not limiting, and in these embodiments, the same numbers represent the same structures, in which:

[0076] Figure 1 is an exemplary flow chart of the processing method of the scintillation pulse according to some embodiments of the present application;

[0077] Figure 2 is an exemplary flow chart of another processing method of the scintillation pulse according to some embodiments of the present application;

[0078] Figure 3 is an exemplary flow chart of another processing method of the scintillation pulse according to some embodiments of the present application;

[0079] Figure 4 is an exemplary flow chart of another processing method of the scintillation pulse according to some embodiments of the present application;

[0080] Figure 5A is an exemplary schematic diagram of the scintillation pulse according to some embodiments of the present application;

[0081] Figure 5B is an exemplary relationship diagram of the threshold value and the scintillation pulse according to some embodiments of the present application;

[0082] Figure 6 is an exemplary module diagram of the data processing system of the scintillation pulse according to some embodiments of the present application;

[0083] Figure 7 is an exemplary module diagram of another data processing system according to some embodiments of the present application;

[0084] Figure 8 is an exemplary module diagram of another data processing system according to some embodiments of the present application;

[0085] Figure 9is an exemplary functional block diagram of another data processing system according to some embodiments of the present application. DETAILED DESCRIPTION

[0086] In order to make the above objectives, features and advantages of the present application more clear, specific embodiments of the present application are described in detail below with reference to the accompanying drawings. In the following description, numerous specific details are set forth in order to provide a thorough understanding of the present application. It will be apparent, however, to one skilled in the art, that the present application can be practiced without using these specific details. In other instances, well-known methods have not been described in detail in order to avoid obscuring the present application. Therefore, the specific embodiments described herein are not intended to limit the scope of the present application, but rather, the scope of the present application is to be measured by the broad meanings conveyed by the claims.

[0087] It is to be noted that when an element is referred to as being "on" another element, it can be directly on the other element or intervening elements can also be present. When an element is referred to as being "connected" to another element, it can be directly connected to the other element or intervening elements can also be present. As used herein the terms "vertical", "horizontal", "left", "right" and similar expressions are for illustrative purposes only.

[0088] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by one of ordinary skill in the art to which this application belongs. The terminology used in the description of the application herein is for the purpose of describing particular embodiments only and is not intended to be limiting of the application. As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0089] Some preferred embodiments of the present application are described below with reference to the accompanying drawings. It should be noted that the following description is for illustrative purposes only and is not intended to limit the scope of protection of the present application.

[0090] Figure 1 is an exemplary flowchart of a processing method of a flicker pulse according to some embodiments of the present application. In some embodiments, the processing method of a flicker pulse 100 can be performed by the first data processing system 600. For example, the processing method of a flicker pulse 100 can be stored in the form of a program or instructions in a storage device (such as a storage unit of the first data processing system 600 or an external storage device), which when executed, can implement the processing method of a flicker pulse 100. As shown in Figure 1 The processing method of a flicker pulse 100 can include the following steps.

[0091] At step 210, a first expression function corresponding to the flicker pulse is obtained.

[0092] It can be known that the waveform of any flicker pulse can be characterized by shape. Referring to Figure 5A ,Figure 5A A waveform of an exemplary scintillation pulse is shown. As shown in FIG. 5, the waveform of the scintillation pulse 500 can be characterized by a fast rising edge 510 and a slow falling edge 520. The waveform of the scintillation pulse can be described by a mathematical function, such as a linear exponential function, a double exponential function, a triangular wave function, a sine wave function, a cosine wave function, etc. As shown in FIG. 5, the scintillation pulse 500 can be represented by a double exponential function, which describes a waveform closer to the real waveform of the scintillation pulse, thus facilitating a higher time resolution. Figure 5A A waveform of an exemplary scintillation pulse is shown. As shown in FIG. 5, the waveform of the scintillation pulse 500 can be characterized by a fast rising edge 510 and a slow falling edge 520. The waveform of the scintillation pulse can be described by a mathematical function, such as a linear exponential function, a double exponential function, a triangular wave function, a sine wave function, a cosine wave function, etc. As shown in FIG. 5, the scintillation pulse 500 can be represented by a double exponential function, which describes a waveform closer to the real waveform of the scintillation pulse, thus facilitating a higher time resolution.

[0093] In some embodiments, the first expression function can be a function for representing the waveform of the scintillation pulse as described above, which can contain one or more first fitting parameters. By solving the first fitting parameters, the first expression function after parameter determination can be obtained. Thus, the first expression function can be further processed to obtain various effective information carried by the scintillation pulse, such as time, position, energy information. As an example, the first expression function can be represented as the following equation 1:

[0094] y(t) = f(a1, a2, …, a, t) (1)

[0095] wherein t is a variable, representing a sampling time, y(t) is a function of t, representing a measurement value of the scintillation pulse at the sampling time. a1, a2, …, a n represent the one or more first fitting parameters. The measurement value of the scintillation pulse can be determined according to its form. It can be known that the form of the pulse signal can be an electrical pulse signal, an acoustic pulse signal, a thermal pulse signal, or a pressure wave signal, etc. For example, when the pulse signal is an electrical pulse signal, its corresponding features can be voltage, current, energy of the electrical pulse signal. Therefore, the measurement value of the scintillation pulse can be voltage, current, energy; when the pulse signal is an acoustic pulse signal, its corresponding features can be acoustic intensity of the acoustic pulse signal. Therefore, the measurement value of the scintillation pulse can be acoustic intensity. By analogy, they are not described here. In addition, the scintillation pulse signal in the present application can be extended to a continuous signal, which can be generally regarded as a pulse signal arranged in a certain period, and the pulse signal in the present application is not limited to the sampling signal.

[0096] In some embodiments, the first expression function can be determined based on prior information of the scintillation pulse. The prior information can be obtained after the scintillation pulse is sampled by a digital oscilloscope. The prior information can include a waveform of the scintillation pulse. By comparing whether the waveform of the scintillation pulse conforms to a certain type of function model, the first expression function can be determined based on the function model that conforms. For example, assuming that the waveform of the scintillation pulse sampled by the digital oscilloscope conforms to a double exponential function model, the first expression function can be determined as a double exponential function. When the prior information of the scintillation pulse is sampled by the digital oscilloscope, the noise can be filtered out by a low-frequency filter circuit, and the noise that cannot be filtered out can be converted into white noise by a high-frequency filter circuit, so that the prior information sampled is more accurate.

[0097] In some embodiments, the first expression function can also be predetermined. For example, the first expression function can be determined before the processing method 100 is executed and stored in a self-provided storage unit or an external storage device of the first data processing system 600. The first expression function can be obtained or called through communication and transmission.

[0098] At step 120, the scintillation pulse is digitally sampled to obtain first sampling data.

[0099] In some embodiments, the scintillation pulse that is digitally sampled can be obtained by a radiation detection device, such as a scintillation detector. The scintillation detector can include a scintillation crystal and a photoelectric conversion device that are coupled to each other. The scintillation crystal (e.g., BGO, PWO, LYSO:Ce, GAGG:Ce, NaI:TI, CsI:TI, LaBr3:Ce, BaF2, etc.) is used to convert the detected high-energy rays (such as gamma rays, neutron rays, etc.) into visible light signals, and the photoelectric conversion device (e.g., a photomultiplier tube PMT, a silicon photomultiplier SiPM, etc.) is used to convert the visible light signals into electrical signals, which are output in the form of scintillation pulse signals through the electronics connected to the photoelectric conversion device.

[0100] In some embodiments, the exemplary digital sampling can be implemented by using a multi-threshold sampling method. When the multi-threshold sampling method is used, the time when the scintillation pulse crosses (including from bottom to top and from top to bottom) a preset threshold (the size of the threshold is within the amplitude of the scintillation pulse) can be obtained by comparing the preset threshold with the scintillation pulse, and a threshold-time pair can be formed by the time and the corresponding threshold, thereby forming the first sampling data. It should be noted that the threshold can have various forms, such as when the pulse signal is an electrical pulse signal, the corresponding threshold can be a voltage threshold, a current threshold or an energy threshold; when the pulse signal is an acoustic pulse signal, the corresponding threshold can be a sound intensity threshold, and so on, which will not be described here.

[0101] Reference Figure 5B , Figure 5B is an exemplary schematic diagram of exemplary relationships between thresholds and scintillation pulses according to some embodiments of the present application. As shown in FIG. 5, 530-1, 530-2, 530-3, and 530-4 represent four different voltage thresholds, respectively. Over time, in the rising phase, the scintillation pulse 500 first crosses the voltage threshold V1=530-1 from bottom to top, at which time t1. Subsequently, the scintillation pulse 500 crosses the voltage threshold V2=530-2 from bottom to top, at which time t2. By analogy, the scintillation pulse 500 crosses the voltage threshold V3=530-3 from bottom to top at t3, and crosses the voltage threshold V4=530-4 from bottom to top at t4. In the falling phase, the scintillation pulse 500 first crosses the voltage threshold V5=530-4 from top to bottom, at which time t5. Subsequently, the scintillation pulse 500 crosses the voltage threshold V6=530-3 from top to bottom, at which time t6. By analogy, the scintillation pulse 500 crosses the voltage threshold V7=530-2 from top to bottom at t7, and crosses the voltage threshold V8=530-1 from top to bottom at t8. The voltage threshold-time pairs consisting of the above voltage thresholds and corresponding times can be represented as (y(t1),t1), (y(t2),t2),…,(y(t8),t8). Wherein, y(t1)=V1, y(t2)=V2,…,y(t8)=V8. The above series of data can be referred to as the first sampling data.

[0102] It should be understood that, in actual sampling, the pulse waveform is not as smooth as shown in FIG. 5, but rather has more fluctuations, which actually manifests as fluctuations within the range of the waveforms shown in FIG. 6 or FIG. 7. Figure 5A Figure 5B It should be understood that, in actual sampling, the pulse waveform is not as smooth as shown in FIG. 5, but rather has more fluctuations, which actually manifests as fluctuations within the range of the waveforms shown in FIG. 6 or FIG. 7. Figure 5A Figure 5B It should be understood that, in actual sampling, the pulse waveform is not as smooth as shown in FIG. 5, but rather has more fluctuations, which actually manifests as fluctuations within the range of the waveforms shown in FIG. 6 or FIG. 7. Figure 5B Figure 5B It should be understood that, in actual sampling, the pulse waveform is not as smooth as shown in FIG. 5, but rather has more fluctuations, which actually manifests as fluctuations within the range of the waveforms shown in FIG. 6 or FIG. 7.

[0103] In some embodiments, exemplary digitization sampling can be implemented using ADC sampling. When using the ADC sampling method, a plurality of preset sampling points (i.e., sampling times) can be used to sample the scintillation pulse at the preset sampling points, and the measurement values of the scintillation pulse corresponding to the sampling points can be obtained. The measurement values obtained at the plurality of preset sampling points and the corresponding sampling times can constitute a plurality of measurement value-time pairs, which can be used to constitute the first sampling data. ​​​

[0104] Step 130, converting the first expression function into a first target function, and converting the first sampling data into first target data.

[0105] It can be known that the sampling data usually needs a standard reference, for example, the zero level of the voltage reference (which can be denoted as y0 in the present application) and the zero time of the time reference (which can be denoted as t0 in the present application). However, the sampling process will always cause the sampling reference to be inconsistent with the standard reference due to various factors. Therefore, the sampling point data (y(t), t) of the signal needs to be transformed to obtain the sampling data under the standard reference, so as to facilitate calculation and improve calculation efficiency. At the same time, in order to achieve faster equation solving, the first expression function can be transformed.

[0106] In some embodiments, the first standard reference data can be obtained. The first standard reference data includes a first metrology value reference value and a first time reference value. The first time reference value can be determined based on the first sampling time in the first sampling data. Taking the metrology value of the scintillation pulse as the voltage as an example, the time when the scintillation pulse first crosses the preset lowest voltage threshold in the multi-threshold sampling can be taken as the first time reference value. Referring back Figure 2 The time tl when the scintillation pulse 500 first crosses the voltage threshold 530-1 from bottom to top can be taken as the first time reference value. For another example, the earliest sampling time preset in the ADC sampling can be taken as the first time reference value.

[0107] In some embodiments, the first metrology value reference value can be determined based on the metrology value corresponding to the first sampling time in the first sampling data. Taking the metrology value of the scintillation pulse as the voltage as an example, the first time when the scintillation pulse crosses the preset lowest voltage threshold in the multi-threshold sampling can be taken as the first metrology value reference value. Referring back Figure 1 The voltage threshold V1 = 530-1 = y0 first crossed by the scintillation pulse 500 from bottom to top can be taken as the first metrology value reference value. For another example, the metrology value of the scintillation pulse corresponding to the earliest sampling time preset in the ADC sampling can be taken as the first metrology value reference value. The first metrology value reference value can also be determined based on the properties of the scintillation pulse. For example, the first metrology value reference value can be set to y0 = 0 or other values according to specific requirements in combination with the properties of the scintillation pulse such as the amplitude range.

[0108] In some embodiments, the first sampling data can be reference transformed based on the first magnitude reference value and the first time reference value. As an example, the first sampling data (y(t), t) can be reference transformed in magnitude and time, and the transformed first sampling data can be represented as (y'(t), t') = (y(t) - y0, t - t0). That is, the magnitude in each magnitude-time pair in the first sampling data is subtracted by the first magnitude reference value, and the time is subtracted by the first time reference value.

[0109] In some embodiments, the first expression function can also be reference transformed based on the first magnitude reference value and the first time reference value, and the following equation 2 is obtained:

[0110] y(t) - y0 = f(a1, a2, …, a n , t - t0) (2)

[0111] According to the form of equation 2, it is not easy to solve. Therefore, equation 2 can be transformed to obtain an easily solvable equation represented by the following equation 3:

[0112] Y(T) = F(A1, A2, …, A n , T) (3)

[0113] where Y(T) = y(t) - y0, T = t - t0, {A1, A2, …, A n} are the parameters of {a1, a2, …, a n} after transformation, and there is a certain mathematical relationship between them. Depending on the function model corresponding to equation 1 of the specific scintillation pulse coincidence, the mathematical relationship is different. By solving equation 3, {A1, A2, …, A n} can be obtained. Based on the mathematical relationship between {A1, A2, …, A n} and {a1, a2, …, a n}, equation 1 can be solved to obtain {a1, a2, …, a n}.

[0114] The determination of the mathematical relationship between the parameters after equation transformation is described below by way of example.

[0115] Example 1. Taking the first expression function as a sine function as an example, the expression is:

[0116] y = a + b × sin(c × (t - t0)) (E1)

[0117] where a = y0, y is the actual sampling magnitude value, b = a1, and c = a2.

[0118] After reference transformation, the following is obtained:

[0119] Y = B x sin(C x T) (E2) where Y = y - a, T = t - t0, B = A1, C = A2.

[0120] Since Y = y - y0, T = t - t0, i.e. y = Y + y0, since a = y0, then y = Y + a, substituting into formula E1, then

[0121] Y + a = a + b x sin(c x (t - t0)),

[0122] i.e.

[0123] Y + a = a + b x sin(c x T)

[0124] Y = b x sin(c x T) (E3)

[0125] Comparing formula E3 with formula E2, the mathematical relationship between the parameters after equation transformation can be obtained,

[0126] i.e. B = b, C = c, i.e. A1 = B = b = a1, A2 = C = c = a2.

[0127] Example two: taking the first expression function as an exponential function as an example, the expression is:

[0128] y = a x exp(b x (t - t0)) + c (E4)

[0129] where c = y0, y is the actual sampling obtained measurement value, a = a1, b = a2.

[0130] After the reference transformation, we get:

[0131] Y = A + B x T (E5) where Y = ln(y - c), T = t - t0, A = A1, B = A2.

[0132] Transforming formula E4, we get

[0133] y - c = a x exp(b x (t - t0))

[0134] Substituting T = t - t0 into the above formula, we get

[0135] y - c = a x exp(b x T)

[0136] Taking the logarithm of both sides, we get

[0137] ln(y - c) = a + b x T (E6)

[0138] Comparing formula E6 with formula E5, the mathematical relationship between the parameters after equation transformation can be obtained,

[0139] That is, A=a, B=b, that is, A1=A=a=a1, A2=B=b=a2.

[0140] Example three: taking the first expression function as an exponential function, the expression is:

[0141] y=a×(t-t0) b ×exp(c×(t-t0))+d (E7)

[0142] Wherein, d=y0, y is the actual sampling obtained measurement value, a=a1, b=a2, c=a3.

[0143] After the benchmark conversion, we get:

[0144] Y=A+B×ln(T)+C×T (E8) Wherein, Y=ln(y-y0)=ln(y-d), T=t-t0, A=A1, B=A2, C=A3.

[0145] Transforming the formula E7, we get

[0146] y-d=a×(t-t0) b ×exp(c×(t-t0))

[0147] Substituting T=t-t0 into the above formula, we get

[0148] y-d=a×T b ×exp(c×T)

[0149] Taking the logarithm of both sides, we get

[0150] ln(y-d)=lna+b×lnT+c×lnT (E9)

[0151] Comparing formula E9 with formula E8,

[0152] Then A=lna, B=b, C=c, that is, A1=A=lna=lna1, A2=B=b=a2, A3=C=c=a3.

[0153] In some embodiments, the first sampling data after benchmark conversion can also be corrected to obtain the first target data. It can be understood that even if the first sampling data after benchmark conversion is used to solve the equation, the function of the waveform of the scintillation pulse obtained finally may not be consistent with the actual situation. In order to avoid this situation, the first expression function after benchmark conversion can be corrected based on the first correction data. The first correction data can include a first measurement value correction value and a first time correction value, which are used to correct the sampling measurement value and the sampling time corresponding to the sampling measurement value, respectively. Taking g and h to represent the first measurement value correction value and the first time correction value respectively, the first sampling data can be converted according to the following formula 4:

[0154] Y(T) = y(t) - y0+ g, T = t - t0+ h (4)

[0155] Wherein, the first sampling data (y(t), t) is converted (including reference transformation and correction) to obtain the first target data (Y(T), T). The first target data can be used to solve the equation, for example, equation 3. And then determine equation 1.

[0156] In some embodiments, the first correction data can be predetermined. For example, the first correction data can be 0. That is, the first metrology value correction value and the first time correction value are both 0, and the first sampling data does not change in the correction process. The first correction data can also be other values set according to requirements.

[0157] In some embodiments, the first correction data can be determined based at least on prior information of the scintillation pulse. As an example, the first correction data can be determined based on sampling data of the scintillation pulse and prior information. The sampling data can be the first sampling data, or new sampling data obtained by a new detection and sampling of the radiation detection device. The prior information of the scintillation pulse collected by the digital oscilloscope can be used to determine the prior waveform of the scintillation pulse. And the sampling data of the scintillation pulse can be used to solve the waveform function of the scintillation pulse. For example, by transforming the sampling data with the preset reference transformation data (for example, the same as or similar to the standard reference data described in the present application) and the correction data (for example, the same as or similar to the first correction data described in the present application), the above-mentioned waveform function of the scintillation pulse is solved. By comparing the prior waveform of the scintillation pulse and the waveform expressed by the function, it can be determined whether the reference transformation data or the correction data used in the function solving process meets the requirements. If it meets the requirements, the correction data used in this process can be used as the first correction data. Other descriptions about determining the first correction data can be referred to the description of the present application Figure 1 partially described herein.

[0158] In some embodiments, the first correction data can also be determined in advance. For example, the first correction data has been determined before the execution of the processing method 100, and is stored in the self-provided storage unit or external storage device of the first data processing system 600. The first correction data can be obtained or called through communication and transmission.

[0159] Step 140, based on the first target data, one or more first target parameters of the first target function are determined by using a non-iterative solving method.

[0160] In some embodiments, the non-iterative solution can include a direct solution. For example, a method of solving a system of equations, using greater than or equal to N sampling data to solve a system of equations including N parameters. The first target data can be directly brought into equation 3 for solving equation 3. After the aforementioned steps (step 120, step 130, etc.) of equation conversion and data transformation, and using the non-iterative solution to perform the calculation, a large amount of computing resources and time can be saved. Using a small number of computing resources, the calculation can be completed in real time to obtain the result. When the solution is completed, the solved {A1, A2, …, A n} can be the one or more first target parameters.

[0161] Step 150, determining the first to-be-fitted parameters based on the first target parameters.

[0162] In some embodiments, in the process of converting the first expression function into the first target function, for example, in the process of converting equation 1 into equation 3, the mathematical relationship between the one or more first to-be-fitted parameters {a1, a2, …, a n} and the one or more first target parameters {A1, A2, …, A n} is also determined. For specific examples, please refer to the related content in step 130. The mathematical relationship can be the first conversion relationship. The one or more first target parameters {A1, A2, …, A n} determined can be used to determine the one or more first to-be-fitted parameters {a1, a2, …, a n}.

[0163] Step 160, obtaining the first effective information carried by the scintillation pulse based on the parameter-determined first expression function.

[0164] In some embodiments, the first effective information can include a first energy value of the scintillation pulse. The first energy value can be obtained by integrating the parameter-determined first expression function. The first energy value can be used for image reconstruction (for example, PET image reconstruction) or substance confirmation (for example, confirming the element composition of a geological layer in geological exploration).

[0165] It should be noted that the above description of each step in Figure 2 is only for example and illustration, and does not limit the scope of the present specification. Those skilled in the art can make various modifications and changes to each step in Figure 2 under the guidance of the present specification. However, these modifications and changes are still within the scope of the present specification.

[0166] In addition, the first data processing system 600 for implementing the example processing method 100 disclosed in the present application can be a device with a large amount of computing resources (for example, a computer, a server, cloud computing, etc.), or a device with limited computing resources (for example, an FPGA chip board, an ASIC chip board, etc.).

[0167] The processing method of the scintillation pulse disclosed in the present application can realize online solving of a complex function with extremely low computing resource occupation. The computing result can be obtained without a large amount of computing resources and a large amount of computing time, which can reduce the strong requirement for hardware resources and time resources in such applications.

[0168] Figure 2 is an example flowchart of the processing method of the scintillation pulse according to some embodiments of the present application. In some embodiments, the processing method 200 of the scintillation pulse can be executed by the second data processing system 700. For example, the processing method 200 of the scintillation pulse can be stored in the form of a program or an instruction in a storage device (such as a self-provided storage unit or an external storage device of the first data processing system 700), which can implement the processing method 200 of the scintillation pulse when executed. As shown in Figure 2 The processing method 200 of the scintillation pulse can include the following steps.

[0169] Step 210, obtaining a first prior waveform corresponding to the scintillation pulse and a second expression function.

[0170] In some embodiments, the first prior waveform and the second expression function can be determined based on prior information of the scintillation pulse. The prior information can be obtained by information collection of the scintillation pulse by a digital oscilloscope. After processing and presentation by the digital oscilloscope, the prior information can be a waveform for representing the shape of the scintillation pulse. The waveform can be the first prior waveform.

[0171] In some embodiments, the second expression function can be similar to the first expression function, and specific descriptions can be referred to the description of the step 110 in the processing method 100. In some embodiments, the second expression function can be the same as or similar to the first expression function. For example, the second expression function can also be as shown in the formula 1, {a1, a2, …, a n} can also represent one or more second to-be-fitted parameters.

[0172] Step 220, obtaining second sampling data obtained by digitizing sampling of the scintillation pulse.

[0173] Similar to the first sampled data, the second sampled data can also be implemented with a multi-threshold sampling or an ADC sampling. The description of the multi-threshold sampling and the ADC sampling can refer to the description of the related content of the step 120 of the processing method 100. Similarly or identically, the second sampled data can be a plurality of magnitude-time pairs including a sampling time and a magnitude value (e.g., a voltage value, a current value, an energy value, a sound intensity value, etc.) of the scintillation pulse corresponding to the sampling time.

[0174] At step 230, a first initial correction data is selected, and the second sampled data is converted into second target data based on the first initial correction data.

[0175] In some embodiments, the first initial correction data can include a first initial magnitude correction value and a first initial time correction value. The first initial magnitude correction value and the first initial time correction value can be preset. For example, the first initial magnitude correction value and the first initial time correction value can be preset as 0, or other values such as 1, 2, 3, etc.

[0176] In some embodiments, a second standard reference data can be obtained, and the second sampled data can be converted in combination with the first initial correction data. The second standard reference data can include a second magnitude reference value and a second time reference value. Similar to the first standard reference data, the second time reference value can be determined based on a first sampling time in the second sampled data. For example, taking a scintillation pulse as an electrical pulse and its magnitude value as a voltage value, the first time reference value can be the time when the scintillation pulse first crosses a preset lowest voltage threshold in the multi-threshold sampling. For another example, the second time reference value can be the preset earliest sampling time in the ADC sampling. The second magnitude reference value can be determined based on a magnitude value corresponding to the first sampling time in the second sampled data. For example, taking a scintillation pulse as an electrical pulse and its magnitude value as a voltage value, the second magnitude reference value can be the magnitude value of the scintillation pulse when it first crosses the preset lowest voltage threshold in the multi-threshold sampling. For another example, the second magnitude reference value can be the magnitude value of the scintillation pulse corresponding to the preset earliest sampling time in the ADC sampling. The second magnitude reference value can also be determined based on the properties of the scintillation pulse. For example, the second magnitude reference value can be set as y0=0 or other values according to the properties of the scintillation pulse such as the amplitude range.

[0177] In some embodiments, the second sampled data can be subjected to a magnitude reference transformation and a time reference transformation based on the second magnitude reference value and the second time reference value. For example, the magnitude value in each magnitude-time pair in the second sampled data can be subtracted by the second magnitude reference value, and the time can be subtracted by the second time reference value.

[0178] In some embodiments, the second sampling data after the reference transformation can be corrected based on the first initial correction data. For example, the metrology values in the second sampling data after the metrology value reference transformation can be corrected using the first initial metrology value correction value, and the time in the second sampling data after the time reference transformation can be corrected using the first initial time correction value. For example, the first initial metrology value correction value and the first initial time correction value can be added to the metrology values and the time after the reference transformation. The second sampling data after the reference transformation and the correction is the second target data. The above reference transformation and the correction can be represented by equation 4.

[0179] At step 240, one or more second to-be-fitted parameters of the second expression function can be solved based on the second target data.

[0180] In some embodiments, the second target data can be used to fit the second expression function, and after the fitting, the one or more second to-be-fitted parameters of the second expression function can be determined. For example, the one or more second to-be-fitted parameters can be initially assigned, and then the second target data and the second expression function with the assigned parameters can be substituted into the Levenberg-Marquardt fitting function for fitting, and after the fitting, the second to-be-fitted parameters can be determined.

[0181] In some embodiments, the second expression function can be converted into a second target function. The conversion of the second expression function can be a reference transformation based on the second standard reference data, and the function obtained after the transformation can be the second target function. The reference transformation can be the same as or similar to the process of converting the first expression function into the first target function. For example, the second target function can also be represented by equation 3. In some embodiments, the second target function can include one or more second target parameters corresponding to the one or more second to-be-fitted parameters, respectively. There is a mathematical relationship between the second target parameters and the second to-be-fitted parameters. The mathematical relationship can be described with reference to the description of step 130 in processing method 100.

[0182] In some embodiments, the second target parameters of the second target function can be solved based on the second target data. For example, a non-iterative solving method such as direct solving method can be used. The second target data can be substituted into the second target function, and the second target parameters can be determined by solving the equation set.

[0183] In some embodiments, the second target parameters can be used to determine the second to-be-fitted parameters, and then determine the second expression function. In some embodiments, in the process of converting the second expression function into the second target function, the mathematical relationship between the second to-be-fitted parameters and the second target parameters is also determined. The mathematical relationship can be the second conversion relationship. Based on the second conversion relationship, the second to-be-fitted parameters can be determined by changing the second target parameters.

[0184] Step 250, compare whether the difference between the energy spectrum information of the scintillation pulse presented by the first prior waveform and the second expression function determined by the parameters is within a preset error.

[0185] In some embodiments, the energy spectrum information of the scintillation pulse presented by the first prior waveform and the energy spectrum information of the scintillation pulse presented by the second expression function determined by the parameters can be obtained by integrating the first prior waveform and the second expression function determined by the parameters respectively.

[0186] When the difference between the energy spectrum information of the scintillation pulse presented by the first prior waveform and the energy spectrum information of the scintillation pulse presented by the second expression function determined by the parameters is within a preset error, it indicates that the second expression function obtained based on the second sampling data corrected by the first initial correction data is consistent with the prior information of the scintillation pulse, and the processing effect of the second expression function is good. At this time, the processing method 200 can proceed to step 260. Otherwise, it indicates that the second expression function obtained based on the second sampling data corrected by the first initial correction data is not consistent with the prior information of the scintillation pulse, and the processing effect of the second expression function is not good. In this case, it indicates that the correction of the second sampling data does not meet the expectation, and needs to be adjusted to make the processing effect of the second expression function good. At this time, the flow 200 can proceed to step 230.

[0187] Step 260, determine the first initial correction data as the first target correction data.

[0188] In some embodiments, the first target correction data can be used for the correction of the sampling data. For example, the first target correction data can be used for the correction of the first sampling data in the processing method 100. That is, the first correction data can be the first target correction data determined by the processing method 200.

[0189] When the first initial correction data needs to be adjusted, the solving of the second expression function according to steps 230-250 and the comparison operation according to step 260 can be repeated until the difference between the energy spectrum information of the scintillation pulse presented by the first prior waveform and the second expression function determined by the parameters is within a preset error.

[0190] In some embodiments, the first initial correction data can be adjusted to obtain new correction data. For example, assuming that both the first initial metrology value correction value and the second initial time correction value in the first initial correction data are 0, the adjusted new metrology value correction value can be 10 mV and the new time correction value can be 5 ns. After obtaining the new correction data, steps 230 to 250 can be executed again to determine whether the second expression function solved based on the second sampling data corrected by the new correction data conforms to the prior information of the scintillation pulse. If it conforms, that is, the effect of processing the second expression function based on the new correction data is good, the new correction data can be determined as the first target correction data. If it does not conform, the new correction data can be continuously adjusted, for example, the metrology value correction value is continuously increased to 15 mV and the time correction value is continuously increased to 10 ns. Of course, the metrology value correction value can also be reduced to 5 mV and the time correction value can also be reduced to 3 ns. The present application is not limited. After the second adjustment, steps 230 to 250 can be repeated again. Until the difference between the first prior waveform and the scintillation pulse spectrum information presented by the second expression function determined by the parameters is within the preset error.

[0191] It should be noted that the above description of each step in Figure 3 is only for example and illustration, and does not limit the scope of the present application. Those skilled in the art can make various modifications and changes to each step in Figure 3 under the guidance of the present application. However, these modifications and changes are still within the scope of the present application.

[0192] The second data processing system 700 disclosed in the present application for implementing the exemplary processing method 200 can be a device with a large amount of computing resources (for example, a computer, a server, cloud computing, etc.), or a device with limited computing resources (for example, an FPGA chip board, an ASIC chip board, etc. hardware circuit).

[0193] In some embodiments of the present application, the second expression function involved in the processing method 200 and the first target correction data can be transmitted. For example, it can be transmitted between devices or transmitted between different modules inside a device. For the purpose of illustration, assuming that the processing method 100 is executed by a chip board and the processing method 200 is executed by a server, the server can transmit the unsolved second expression function to the chip board for use as the first expression function in the processing method 100. The first target correction data can also be transmitted to the chip board for use as the first correction data in the processing method 100. Assuming that both the processing method 100 and 200 are executed by a server, the above data can be transmitted between processing modules for executing the two processing methods.

[0194] Figure 2is an exemplary flowchart of a processing method of a flicker pulse according to some embodiments of the present application. In some embodiments, the processing method of a flicker pulse 300 can be executed by the third data processing system 800. For example, the processing method of a flicker pulse 300 can be stored in the form of a program or instructions in a storage device (such as a self-storage unit or an external storage device of the third data processing system 800), which, when executed, can implement the processing method of a flicker pulse 300. As shown, the processing method of a flicker pulse 300 can include the following steps. Figure 3

[0195] Step 310, obtaining a third expression function corresponding to the flicker pulse and a third objective function.

[0196] In some embodiments, the third expression function can be similar to the first expression function. For example, the third expression function can also be determined based on prior information of the flicker pulse. The prior information can be based on acquisition by a digital oscilloscope. For specific descriptions, reference can be made to the description of the related content of step 110 in the processing method 100. In some embodiments, the third expression function can be the same as the first expression function. For example, the third expression function can also be as shown in equation 1, {a1, a2, …, a n} can also represent the one or more third to-be-fitted parameters.

[0197] In some embodiments, the third objective function can be obtained by converting the third expression function based on a first parameter transformation formula. The third objective function can include third target parameters corresponding to the third to-be-fitted parameters, respectively. The first parameter transformation formula can achieve parameter transformation of the third expression function. For example, reference can be made to the conversion between the first expression function and the first objective function in the processing method 100. The first parameter transformation formula can achieve the conversion. The converted third objective function can be as shown in equation 3. At the same time, the first parameter transformation formula can also reflect the conversion relationship between the converted third to-be-fitted parameters and the third target parameters. The conversion relationship can be the relationship between {a1, a2, …, a n} and {A1, A2, …, A n}. For other descriptions, reference can be made to the description of the related content of step 130 in the processing method 100.

[0198] In some embodiments, the third expression function and the third objective function can be predetermined. For example, the third expression function and the third objective function can be determined before the execution of the processing method 300 and stored in the self-storage unit or the external storage device of the third data processing system 800. The third expression function and the third objective function can be obtained through communication and transmission. The first parameter transformation formula can also be predetermined and stored.

[0199] ​At step 320, the scintillation pulse is digitally sampled to obtain third sampling data.

[0200] In some embodiments, step 320 is the same as or similar to step 120, and reference can be made to the relevant description of step 120. For example, the digital sampling can also be implemented by multi-threshold sampling or by ADC sampling. Depending on the form of the scintillation pulse, the magnitude in the magnitude-time pair used to constitute the third sampling data can be a voltage magnitude, a current magnitude, an energy magnitude, an acoustic intensity magnitude, etc.

[0201] At step 330, the third sampling data is converted based on a first preset reference transformation correction formula to obtain third target data.

[0202] In some embodiments, the first preset reference transformation correction formula can be used to perform reference transformation on the third standard reference data. The third standard reference data can include a third magnitude reference value and a third time reference value, which can be the same as or similar to the first magnitude reference value and the first time reference value in the first standard reference data. For example, the third time reference value can be determined based on the first sampling time in the third sampling data. Taking the scintillation pulse as an electric pulse and its magnitude as voltage as an example, the time at which the scintillation pulse first crosses a preset lowest voltage threshold in multi-threshold sampling can be taken as the third time reference value. For another example, the earliest sampling time preset in ADC sampling can be taken as the third time reference value. The third magnitude reference value can be determined based on the magnitude corresponding to the first sampling time in the third sampling data. Taking the scintillation pulse as an electric pulse and its magnitude as voltage as an example, the magnitude of the scintillation pulse at which the scintillation pulse first crosses a preset lowest voltage threshold in multi-threshold sampling can be taken as the second magnitude reference value. For another example, the magnitude of the scintillation pulse corresponding to the earliest sampling time preset in ADC sampling can be taken as the third magnitude reference value. The third magnitude reference value can also be determined based on the properties of the scintillation pulse. For example, the third magnitude reference value can be set to y0=0 or other values according to specific requirements in combination with the properties of the scintillation pulse such as amplitude range.

[0203] In some embodiments, the third sampling data can be reference-transformed based on the first preset reference transformation correction formula. The magnitude in each magnitude-time pair in the third sampling data will be reduced by the third magnitude reference value, and the time will be reduced by the third time reference value.

[0204] In some embodiments, the first preset reference transformation correction formula can also be used to correct the third correction data. The third correction data can include a third metrology value correction value and a third time correction value. The third metrology value correction value can be used to correct the metrology value after reference transformation, and the third time correction value can be used to correct the time after reference transformation. Similarly or analogously, the reference transformation and correction of the third sampling data can be performed according to Formula 4. For example, Formula 4 can be the first preset reference transformation correction formula, and the third sampling data can be directly substituted into Formula 4 to obtain the third target data.

[0205] In some embodiments, the third correction data can be predetermined. For example, the third correction data can be 0. That is, the third metrology value correction value and the third time correction value are both 0, and the third sampling data does not change during the correction process. The third correction data can also be other values set according to requirements.

[0206] In some embodiments, the third correction data can be determined based at least on the prior information of the scintillation pulse. As an example, the third correction data can be determined based on the sampling data of the scintillation pulse and the prior information. As shown in the processing method 200 of the present application, the first correction data can be determined according to the following steps. Figure 3

[0207] In some embodiments, the third correction data can also be determined in advance. For example, the third correction data can be determined before the processing method 300 is executed and stored in the self-provided storage unit or external storage device of the third data processing system 800. The third correction data can be obtained through communication and transmission.

[0208] At step 340, one or more third target parameters of the third target function are determined based on the third target data by using a non-iterative solving method.

[0209] In some embodiments, step 340 can be the same as or similar to step 140 of the processing method 100. The non-iterative solving method can also include a direct solving method. Through the non-iterative solving method, the complete expression of the third target function can be determined, for example, {A1, A2, …, A n} in Formula 3 are determined. That is, the one or more third target parameters are determined.

[0210] At step 350, one or more third to-be-fitted parameters of the third expression function are determined based on the third target function determined by the parameters by using the first parameter transformation formula.

[0211] ​In some embodiments, the third to-be-fitted parameter can be determined based on one or more third target parameters according to a conversion relationship between the third to-be-fitted parameter and the third target parameter reflected by the first parameter transformation formula. For example, based on the relationship between the function conversion {a1, a2, …, aN} and {A1, A2, …, AN}, {a1, a2, …, aN} can be obtained based on {A1, A2, …, AN}. n} and {A1, A2, …, AN}. n} and {A1, A2, …, AN}. n} and {A1, A2, …, AN}. n} and {A1, A2, …, AN}.

[0212] At step 360, the second effective information carried by the scintillation pulse is obtained based on the third expression function determined by the parameter.

[0213] In some embodiments, the second effective information can include a second energy value of the scintillation pulse. The second energy value can be obtained by integrating the third expression function determined by the parameter. The second energy value can be used for image reconstruction (e.g., PET image reconstruction) or substance confirmation (e.g., confirming the element composition of a geological layer in geological exploration).

[0214] It should be noted that the above description of each step in the method 300 is only for example and illustration, and does not limit the scope of the present application. Those skilled in the art can make various modifications and changes to each step in the method 300 under the guidance of the present application. However, these modifications and changes are still within the scope of the present application. Figure 4 Figure 4 In addition, the exemplary processing method 300 disclosed in the present application can be implemented on a device with a large amount of computing resources (e.g., a computer, a server, a cloud computing device, etc.), or on a device with limited computing resources (e.g., an FPGA chip board, an ASIC chip board, etc. hardware circuit). Compared with the processing method 100, the processing method 300 can further omit the function transformation process, and thus the computing resources required for the implementation of the entire process will be less, and the computing speed will be faster.

[0215] In addition, the exemplary processing method 300 disclosed in the present application can be implemented on a device with a large amount of computing resources (e.g., a computer, a server, a cloud computing device, etc.), or on a device with limited computing resources (e.g., an FPGA chip board, an ASIC chip board, etc. hardware circuit). Compared with the processing method 100, the processing method 300 can further omit the function transformation process, and thus the computing resources required for the implementation of the entire process will be less, and the computing speed will be faster.

[0216] Figure 4 is an exemplary flowchart of a scintillation pulse processing method according to some embodiments of the present application. In some embodiments, the scintillation pulse processing method 400 can be executed by a fourth data processing system 900. For example, the scintillation pulse processing method 400 can be stored in the form of a program or instruction in a storage device (such as a self-contained storage unit of the fourth data processing system 900 or an external storage device), which when executed, can implement the scintillation pulse processing method 400. As shown in Figure 4 the scintillation pulse processing method 400 can include the following steps. ​

[0217] Step 410, obtaining a second prior waveform corresponding to the scintillation pulse and a fourth expression function.

[0218] In some embodiments, the second prior waveform is the same as or similar to the first prior waveform, which can be determined based on the prior information of the scintillation pulse collected by the digital oscilloscope. The fourth expression function can be the same as or similar to the second expression function, and can also be expressed in the form of equation 1. {a1, a2, …, a n} can represent one or more fourth to-be-fitted parameters.

[0219] Step 420, obtaining fourth sampling data obtained by digitizing sampling of the scintillation pulse.

[0220] In some embodiments, the fourth sampling data can be the same as or similar to the aforementioned first sampling data, second sampling data, and third sampling data, and can be obtained based on multi-threshold sampling or ADC sampling.

[0221] Step 430, selecting second initial correction data, and obtaining a second preset reference transformation correction formula and a second parameter transformation formula.

[0222] In some embodiments, the second initial correction data can include a second initial metrology value correction value and a second initial time correction value, which can be preset. For example, 0, 1, 2, 3, etc.

[0223] In some embodiments, the second preset reference transformation correction formula can be the same as or similar to the first preset reference transformation correction, and can be used for reference transformation and correction of the fourth sampling data. For example, the second preset reference transformation correction can be expressed as equation 4.

[0224] In some embodiments, the second parameter transformation formula is used to indicate the relationship between the parameters of the fourth expression function after the function is converted into another expression form. For example, the fourth expression function can be expressed as equation 1, and the converted function can be expressed as equation 3. The second parameter transformation formula can be used to indicate the conversion relationship between {a1, a2, …, a n} in equation 1 and {A1, A2, …, A n} in equation 3.

[0225] Step 440, based on the second initial correction data, the fourth sampling data, the second preset reference transformation correction formula, and the second parameter transformation formula, solving one or more fourth to-be-fitted parameters of the fourth expression function.

[0226] In some embodiments, the second preset reference transformation correction formula and the second initial correction data can be used to correct the reference transformation of the fourth sampling data. For example, in the formula 4 used to represent the second preset reference transformation correction formula, (y(t), t) can represent the fourth sampling data, y0and t0may represent the data used for reference transformation, and g and h can be the data used for correction. After the fourth sampling data is substituted into the formula 4, (Y(T), T) can be obtained, and the fourth target data can be obtained.

[0227] In some embodiments, the fourth target data can be used to solve the fourth target function corresponding to the scintillation pulse. The fourth target function can be obtained by transforming the fourth expression function. For example, as described in the step 410, the formula 3 can be used to represent the fourth target function. The fourth target function includes one or more fourth target parameters corresponding to the fourth to-be-fitted parameters, respectively. For example, in the formula 3, {A1, A2, …, A n} can represent the fourth target parameters.

[0228] In some embodiments, the fourth target function can be converted based on the second parameter transformation formula to determine one or more fourth fitting functions in the fourth expression function. The second parameter transformation formula can indicate the conversion relationship between the fourth fitting function and the fourth target parameter. For example, the conversion relationship between {a1, a2, …, a n} in the formula 1 and {A1, A2, …, A n} in the formula 3 is indicated. When {A1, A2, …, A n} is determined, {a1, a2, …, a n} can be determined.

[0229] In step 450, whether the difference between the second prior waveform and the spectral information of the scintillation pulse presented by the fourth expression function determined by the parameters is within a preset error is compared.

[0230] In some embodiments, the step 450 is the same as or similar to the step 250, and the description of the step 250 can be referred to. That is, when the difference between the spectral information of the scintillation pulse presented by the second prior waveform and the spectral information of the scintillation pulse presented by the fourth expression function determined by the parameters is within a preset error, it is indicated that the processing effect of the fourth expression function is good. At this time, the processing method 400 can proceed to the step 460. Otherwise, it is indicated that the processing effect of the data obtained by processing the fourth sampling data with the second initial correction data on the fourth expression function is not good. At this time, the flow 400 can proceed to the step 430.

[0231] In step 460, the second initial correction data is determined as the second target correction data.

[0232] In some embodiments, the second target correction data can be used for the correction of the sampling data. For example, the second target correction data can be used for the correction of the first sampling data in the processing method 100 or the correction of the third sampling data in the processing method 300. That is, the first correction data and / or the third correction data can be the second target correction data determined by the processing method 400.

[0233] If the second initial correction data needs to be adjusted, the solving of the fourth expression function and the comparison operation according to steps 430-440 and 450 can be repeated until the difference between the second prior waveform and the spectral information of the scintillation pulse presented by the fourth expression function determined by the parameters is within the preset error.

[0234] In some embodiments, the second initial correction data can be adjusted to obtain new correction data. The adjustment of the second initial correction data can refer to the adjustment of the first initial correction data in the processing method 200. After the adjustment, steps 430-450 can be repeated until the difference between the second prior waveform and the spectral information of the scintillation pulse presented by the fourth expression function determined by the parameters is within the preset error.

[0235] It should be noted that the above description of each step in the processing method 400 is only for example and illustration, and does not limit the scope of the present disclosure. Those skilled in the art can make various modifications and changes to each step in the processing method 400 under the guidance of the present disclosure. However, these modifications and changes are still within the scope of the present disclosure. Figure 6 The above description of each step in the processing method 400 is only for example and illustration, and does not limit the scope of the present disclosure. Those skilled in the art can make various modifications and changes to each step in the processing method 400 under the guidance of the present disclosure. However, these modifications and changes are still within the scope of the present disclosure. Figure 6 The above description of each step in the processing method 400 is only for example and illustration, and does not limit the scope of the present disclosure. Those skilled in the art can make various modifications and changes to each step in the processing method 400 under the guidance of the present disclosure. However, these modifications and changes are still within the scope of the present disclosure.

[0236] The fourth data processing system 900 disclosed in the present disclosure for implementing the exemplary processing method 400 can be a device with a large amount of computing resources (e.g., a computer, a server, cloud computing, etc.), or a device with limited computing resources (e.g., an FPGA chip board, an ASIC chip board, etc. hardware circuit).

[0237] In some embodiments of the present application, the fourth expression function, the fourth objective function, the second target correction data, the second function transformation formula and the second reference transformation correction formula involved in the processing method 400 can be transmitted. For example, the transmission can be between devices or between different modules within a device. For the purpose of illustration, it is assumed that the processing method 300 is performed by a chip board and the processing method 400 is performed by a server, the server can transmit the unsolved fourth expression function to the chip board as the third expression function in the processing method 300. The unsolved fourth objective function can also be transmitted to the chip board as the fourth objective function in the processing method 300. The second target correction data can also be transmitted to the chip board as the third correction data in the processing method 300. In addition, the second function transformation formula and the second reference transformation correction formula can also be transmitted to the chip board as the first parameter transformation formula and the first preset reference transformation correction formula. It is assumed that the processing method 100 and the processing method 200 are both performed by the server, the above-mentioned data can be transmitted between the processing modules for performing the two processes.

[0238] Figure 7 is an exemplary module diagram of a data processing system according to some embodiments of the present disclosure. The data processing system can realize real-time processing of scintillation pulses under low computing resources. As shown in Figure 7 The first data processing system 600 can include a first acquisition module 610, a first sampling module 620, a first conversion module 630, a first calculation module 640, a first determination module 650 and a first extraction module 660.

[0239] The first acquisition module 610 can be used to acquire the first expression function corresponding to the scintillation pulse as described in step 110. The waveform of any scintillation pulse can be characterized by shape. The first expression function can be a function for representing the waveform of the scintillation pulse as described above, which can include one or more first fitting parameters. By solving the first fitting parameters, the first expression function after parameter determination can be obtained. Thus, the first expression function can be further processed to obtain various types of effective information carried by the scintillation pulse, such as time, position and energy information. As an example, the first expression function can be expressed as: y(t) = f(a1, a2, …, an) where t represents time, y represents the waveform of the scintillation pulse, f represents the first expression function, and a1, a2, …, an represent the first fitting parameters. nThe first expression function can be determined based on prior information about the flicker pulse. This prior information can be obtained by acquiring information about the flicker pulse using a digital oscilloscope. This prior information may include the waveform of the flicker pulse. By comparing whether the waveform of the flicker pulse conforms to a certain type of function model, the first expression function can be determined based on the conforming function model. The first expression function can also be predetermined. For example, the first expression function may be determined before the processing method 100 is executed and stored in the built-in storage unit of the first data processing system 600 or in an external storage device. The first acquisition module 610 can acquire or call the first expression function through communication and transmission.

[0240] The first sampling module 620 can be used to digitally sample the flicker pulse as described in step 120 above to obtain first sampling data. Exemplary digital sampling can be implemented using multi-threshold sampling. When using the multi-threshold sampling method, a preset threshold (the value of which is within the amplitude of the flicker pulse) can be used, and the preset threshold can be compared with the flicker pulse to collect the time when the flicker pulse crosses (including crossing from bottom to top and from top to bottom) the threshold, and a threshold-time pair can be formed with the corresponding threshold to form the first sampling data. Exemplary digital sampling can be implemented using ADC sampling. When using the ADC sampling method, multiple preset sampling points (i.e., sampling times) can be used to sample the flicker pulse at the preset sampling points to obtain the measurement value of the flicker pulse corresponding to the sampling point. The measurement values ​​obtained at the multiple preset sampling points and the corresponding sampling times can form multiple measurement value-time pairs to constitute the first sampling data.

[0241] The first conversion module 630 can be used to convert the first expression function into a first objective function and the first sampled data into first objective data as described in step 130 above. The sampled data typically requires a standard reference, such as the zero level of a voltage reference (represented by y0 in this application) and the zero time of a time reference (represented by t0 in this application). However, due to various factors, the sampling reference and the standard reference may become inconsistent during the sampling process. Therefore, the sampled data (y(t), t) of the signal needs to be transformed to obtain sampled data under the standard reference, which facilitates calculation and improves computational efficiency. Simultaneously, the first expression function can be transformed to achieve faster equation solving. To achieve the above conversion, the first conversion module 630 can acquire first standard reference data. The first standard reference data includes a first measurement reference value and a first time reference value. The first time reference value can be determined based on the first sampling time in the first sampled data. The first measurement reference value can be determined based on the measurement value corresponding to the first sampling time in the first sampled data. The first conversion module 630 can subtract a first measurement reference value from the measurement value in each measurement-time pair in the first sampled data, and subtract a first time reference value from the time to obtain the reference-transformed first sampled data (y′(t), t′) = (y(t) - y0, t - t0). The first conversion module 630 can also correct the reference-transformed first sampled data to obtain the first target data. The first conversion module 630 can obtain first corrected data. The first corrected data can include a first measurement correction value g and a first time correction value h, used to correct the sampled measurement value and the sampling time corresponding to that measurement value, respectively. Based on the first measurement correction value and the first time correction value, the first conversion module 630 can correct the reference-transformed first sampled data to determine the first target data: Y(T) = y(t) - y0 + g, T = t - t0 + h.

[0242] The first conversion module 630 can also convert the first expression function into a first objective function based on the first measurement reference value and the first time reference value: y(t)-y0=f(a1,a2,…,a…) n After transformation, we can obtain Y(T) = F(A1, A2, ..., A0). n ,T). Among them, Y(T)=y(t)-y0, T=t-t0, {A1, A2,...,A n} is {a1, a2, ..., a n The parameters after transformation.

[0243] The first calculation module 640 can be used to determine one or more first target parameters of the first objective function based on the first target data, as described in step 140 above, using a non-iterative solution method. The non-iterative solution method can include a direct solution method. For example, a method for solving a system of equations, using more than or equal to N sampled data to solve a system of equations including N parameters. The first determination module 650 can substitute the first target data into the first objective function to solve the system of equations, determining the solved {A1, A2, ..., A...} n} can be the first target parameter.

[0244] The first determining module 650 can be used to determine the first fitting parameters based on the first target parameters as described in step 150 above. During the process of converting the first expression function into the first target function, one or more first fitting parameters {a1, a2, ..., a...} are used. n} and one or more first target parameters {A1, A2, ..., A n The mathematical relationships between them are also determined. The first determining module 650 can be based on the determined first target parameters {A1, A2, ..., A}. n Determine the first parameters to be fitted {a1, a2, ..., a}. n}

[0245] The first extraction module 660 can be used to obtain first valid information carried by the scintillation pulse based on the first expression function determined by the parameters as described in step 160 above. The first valid information may include a first energy value of the scintillation pulse. The first extraction module 660 can obtain the first energy value by integrating the first expression function determined by the parameters. The first energy value can be used for image reconstruction (e.g., PET image reconstruction) or material identification (e.g., identifying the elemental composition of geological layers in geological exploration).

[0246] Figure 8 This is an exemplary block diagram of a data processing system according to some embodiments of this specification. This data processing system can achieve real-time processing of scintillation pulses with low computing resources. For example... Figure 8 As shown, the second data processing system 700 may include a second acquisition module 710, a second sampling module 720, a second conversion module 730, a second calculation module 740, and a second determination module 750.

[0247] The second acquisition module 710 can be used to acquire the first prior waveform and the second expression function corresponding to the flicker pulse as described in step 210 above. The first prior waveform and the second expression function can be determined based on the prior information of the flicker pulse. The prior information can be obtained by acquiring information about the flicker pulse using a digital oscilloscope. After processing and presentation by the digital oscilloscope, the prior information can be a waveform used to represent the shape of the flicker pulse. This waveform can be the first prior waveform. The second expression function can be similar to the first expression function; for example, the second expression function can also be y(t) = f(a1, a2, ..., a...). n As shown in t). {a1, a2, ..., a n} can also represent one or more second parameters to be fitted.

[0248] The second sampling module 720 can be used to acquire second sampling data obtained by digitally sampling the scintillation pulse as described in step 220 above. Similar to the first sampling data, the second sampling data can also be implemented using multi-threshold sampling or ADC sampling. The second sampling data can be multiple measurement value-time pairs including the sampling time and the measurement value of the scintillation pulse corresponding to the sampling time (e.g., voltage value, current value, energy value, sound intensity value, etc.).

[0249] The second conversion module 730 can be used to select first initial calibration data as described in step 230 above, and to convert the second sampled data into at least second target data based on the first initial calibration data. The first initial calibration data may include a first initial measurement value calibration value and a first initial time calibration value. The first initial measurement value calibration value and the first initial time calibration value may be preset. For example, the first initial measurement value calibration value and the first initial time calibration value may be preset to 0, or other values ​​such as 1, 2, 3, etc. The second conversion module 730 can acquire second standard reference data and convert the second sampled data in combination with the first initial calibration data. The second standard reference data may include a second measurement value reference value and a second time reference value. Similar to the first standard reference data, the second time reference value may be determined based on the first sampling time in the second sampled data. The second measurement value reference value may be determined based on the measurement value corresponding to the first sampling time in the second sampled data. The second conversion module 730 can subtract the second measurement value reference value from the measurement value in each measurement value-time pair in the second sampled data, and subtract the second time reference value from the time to determine the second sampled data after reference transformation. The second conversion module 730 can correct the second sampled data after reference transformation based on the first initial correction data. For example, the second conversion module 730 can use the first initial measurement value correction value to correct the measurement values ​​in the second sampled data after reference transformation, and use the first initial time correction value to correct the time in the second sampled data after time reference transformation. For instance, the second conversion module 730 can add the first initial measurement value correction value and the first initial time correction value to the reference-transformed measurement values ​​and time. The second sampled data after reference transformation and correction is the second target data.

[0250] The second calculation module 740 can be used to solve for one or more second fitting parameters of the second expression function based on the second target data, as described in step 240 above. The second calculation module 740 can fit the second expression function using the second target data, and after fitting, it can determine one or more second fitting parameters of the second expression function. The second expression function can be transformed into a second target function. The transformation of the second expression function can be based on a benchmark transformation using second standard benchmark data. The function obtained after transformation can be the second target function, which may include one or more second target parameters corresponding to the second fitting parameters. The second calculation module 740 can use a non-iterative solution method, such as a direct solution method, to substitute the second target data into the second target function and determine the second target parameters by solving a system of equations. During the transformation of the second expression function into the second target function, the mathematical relationship between the second fitting parameters and the second target parameters is also determined. This mathematical relationship can be a second transformation relationship. The second calculation module 740 can determine the second fitting parameters based on the second transformation relationship and the second target parameters.

[0251] The second determining module 750 can be used to compare, as described in step 250 above, whether the difference between the energy spectrum information of the scintillation pulse presented by the first prior waveform and the second expression function after parameter determination is within a preset error. The energy spectrum information of the scintillation pulse presented by the first prior waveform and the energy spectrum information of the scintillation pulse presented by the second expression function after parameter determination can be obtained by integrating the first prior waveform and the second expression function respectively. When the difference between the energy spectrum information of the scintillation pulse presented by the first prior waveform and the energy spectrum information of the scintillation pulse presented by the second expression function after parameter determination is within a preset error, it indicates that the second expression function obtained based on the second sampled data after correction using the first initial correction data matches the prior information of the scintillation pulse, and the processing effect of the second expression function is good. At this time, the second determining module 750 can determine that the first initial correction data is the first target correction data. Conversely, it indicates that the second expression function obtained based on the second sampled data after correction using the first initial correction data does not match the prior information of the scintillation pulse, and the processing effect of the second expression function is poor. In this case, it indicates that the correction of the second sampled data does not meet expectations and needs adjustment to improve the processing effect of the second expression function. The second conversion module 730 can add or subtract the first initial correction data to obtain new correction data. The second calculation module 740 and the second determination module 750 can repeat the operation based on the new correction data to determine whether the second expression function obtained based on the second sampled data after correction with the new correction data matches the prior information of the scintillation pulse. If they match, that is, the processing effect of the second expression function based on the new correction data is good, then the new correction data can be determined as the first target correction data. If they do not match, the new correction data can be further adjusted. The second conversion module 730, the second calculation module 740, and the second determination module 750 will repeat the operation again until the difference between the energy spectrum information of the scintillation pulse presented by the first prior waveform and the parameter-determined second expression function is within a preset error.

[0252] The second data processing system 700 may further include a first transmission module 760. The first transmission module 760 can transmit the second expression function and the first target correction data. For example, this transmission can occur between devices or between different modules within a device. For illustrative purposes, assuming the first data processing system 600 executing processing method 100 is a chip board and the second data processing system 700 executing processing method 200 is a server, the first transmission module 760 can transmit the unsolved second expression function to the chip board as the first expression function in processing method 100. Similarly, the first transmission module 760 can also transmit the first target correction data to the chip board as the first correction data in processing method 100. Assuming both the first data processing system 600 and the second data processing system 700 executing processing methods 100 and 200 are servers, the first transmission module 760 can transmit the aforementioned data between processing modules executing the two processing methods.

[0253] Figure 9 This is an exemplary block diagram of a data processing system according to some embodiments of this specification. This data processing system can achieve real-time processing of scintillation pulses with low computing resources. For example... Figure 9 As shown, the third data processing system 800 may include a third acquisition module 810, a third sampling module 820, a third conversion module 830, a third calculation module 840, a third determination module 850, and a second extraction module 860.

[0254] The third acquisition module 810 can be used to acquire the third expression function and the third target function corresponding to the flashing pulse as described in step 310 above. The third expression function can be similar to the first expression function. The third target function can be obtained by transforming the third expression function based on the first parameter transformation formula, and can include the third target parameters corresponding to the third parameters to be fitted. The first parameter transformation formula can realize the parameter transformation of the third expression function. The transformation relationship can be as follows: {a1, a2, ..., a...} n} and {A1, A2, ..., A n The relationship between the third expression function and the third objective function can be predetermined, and the first parameter transformation formula can also be predetermined and stored, for example, stored in the built-in storage unit of the third data processing system 800 or an external storage device. The third acquisition module 810 can communicate with the storage unit or external storage device to acquire the above data.

[0255] The third sampling module 820 can be used to digitally sample the flicker pulse as described in step 320 above, to obtain third sampled data. Digital sampling can also be implemented using multi-threshold sampling or ADC sampling. The third sampling module 830 can be the same as or similar to the first sampling module 620.

[0256] The third conversion module 830 can be used to convert the third sampled data based on the first preset benchmark transformation correction formula as described in step 330 above, to obtain the third target data. The first preset benchmark transformation correction formula can be used to perform benchmark transformation on the third standard benchmark data. The third standard benchmark data may include a third measurement value benchmark value and a third time benchmark value, which may be the same as or similar to the first measurement value benchmark value and the first time benchmark value in the first standard benchmark data. The third time benchmark value may be determined based on the first sampling time in the third sampled data. The third measurement value benchmark value may be determined based on the measurement value corresponding to the first sampling time in the third sampled data. The third sampled data can be benchmark transformed based on the first preset benchmark transformation correction formula. The third conversion module 830 can subtract the third measurement value benchmark value from the measurement value and the third time benchmark value from the time in each measurement value-time pair in the third sampled data. The first preset benchmark transformation correction formula can also be used to correct the third correction data. The third correction data may include a third measurement value correction value and a third time correction value. The third measurement value correction value can be used to correct the measurement value after benchmark transformation, and the third time correction value can be used to correct the time after benchmark transformation. The third conversion module 830 can correlate the reference-converted measurement value and time with the third measurement correction value and the third time correction value, respectively, for correction. The third correction data can be predetermined, or determined based at least on prior information of the scintillation pulse, or pre-stored in the built-in storage unit of the third data processing system 800 or an external storage device. The third conversion module 830 can obtain the third correction data through communication and transmission.

[0257] The third calculation module 840 can be used to determine one or more third objective parameters of the third objective function based on the third objective data, as described in step 340 above, using a non-iterative solution method. The non-iterative solution method can also include direct solution methods. The third calculation module 840 can determine the complete expression of the third objective function through a non-iterative solution method, for example, {A1, A2, ..., A...} n All of these parameters have been determined. That is, one or more third target parameters have been determined.

[0258] The third determining module 850 can be used to determine one or more third fitting parameters of the third expression function based on the parameter determination as described in step 350 above, using the first parameter transformation formula. The third determining module 850 can determine the third fitting parameter based on one or more third target parameters, according to the transformation relationship between the third fitting parameter and the third target parameter reflected in the first parameter transformation formula.

[0259] The second extraction module 840 can be used to obtain second valid information carried by the scintillation pulse based on the parameter-determined third expression function as described in step 360 above. The second valid information may include the second energy value of the scintillation pulse. The second extraction module 840 can obtain the second energy value by integrating the parameter-determined third expression function. The second energy value can be used for image reconstruction (e.g., PET image reconstruction) or material identification (e.g., identifying the elemental composition of geological layers in geological exploration).

[0260] Figures 1-4 This is an exemplary block diagram of a data processing system according to some embodiments of this specification. This data processing system can achieve real-time processing of scintillation pulses with low computing resources. For example... Figures 6-9 As shown, the fourth data processing system 900 may include a fourth acquisition module 910, a fourth sampling module 920, a fourth conversion module 930, a fourth calculation module 940, and a fourth determination module 950.

[0261] The fourth acquisition module 910 can be used to acquire the second prior waveform and the fourth expression function corresponding to the flicker pulse as described in step 410 above. The second prior waveform is the same as or similar to the first prior waveform, and can be determined based on the prior information of the flicker pulse acquired by the digital oscilloscope. The fourth expression function can be the same as or similar to the second expression function, or it can be expressed as y(t) = f(a1, a2, ..., a n As shown in t). {a1, a2, ..., a n} can also represent one or more fourth parameters to be fitted.

[0262] The fourth sampling module 920 can be used to acquire the fourth sampling data obtained by digitally sampling the flicker pulse as described in step 420 above. The fourth sampling data can be the same as or similar to the aforementioned first sampling data, second sampling data, and third sampling data, and can be acquired based on multi-threshold sampling or ADC sampling.

[0263] The fourth conversion module 930 can be used to select the second initial correction data as described in step 430 above, and to obtain the second preset benchmark transformation correction formula and the second parameter transformation formula. The second initial correction data may include a second initial measurement value correction value and a second initial time correction value, which can be preset, for example, 0, 1, 2, 3, etc. The second preset benchmark transformation correction formula can be the same as or similar to the first preset benchmark transformation correction formula, and can be used to perform benchmark transformation and correction on the fourth sampled data. The second parameter transformation formula is used to indicate the relationship between the parameters of the two functions after the fourth expression function is converted into another expression form. For example, the function after the fourth expression function is converted can be like Y(T)=F(A1, A2, …, A…). nThe formula for the change of the second parameter can be used to indicate {a1, a2, ..., a...} n} and {A1, A2, ..., A n The conversion relationship between}.

[0264] The fourth calculation module 940 can be used, as described in step 440 above, to solve for one or more fourth fitting parameters of the fourth expression function based on the second initial correction data, the fourth sampled data, the second preset benchmark transformation correction formula, and the second parameter transformation formula. The second preset benchmark transformation correction formula and the second initial correction data can be used for benchmark transformation and correction of the fourth sampled data. The fourth calculation module 940 can use the second preset benchmark transformation correction formula to determine the fourth sampled data as the fourth target data, and use the fourth target data to solve for the fourth target parameter in the fourth target function. The fourth calculation module 940 can use a representation such as {a1, a2, ..., a...} n} and {A1, A2, ..., A n The second parameter transformation relationship between the two parameters determines the fourth fitting parameter of the fourth expression function based on the fourth objective parameter.

[0265] The fourth determining module 950 can be used to determine whether the difference between the energy spectrum information of the scintillation pulse presented by the second prior waveform and the fourth expression function determined by the parameters, as described in step 450 above, is within a preset error. The fourth determining module 950 can be the same as or similar to the second determining module 750.

[0266] The energy spectrum information of the scintillation pulse presented by the second prior waveform and the energy spectrum information of the scintillation pulse presented by the parameter-determined fourth expression function can be obtained by integrating the second prior waveform and the parameter-determined fourth expression function respectively. When the difference between the energy spectrum information of the scintillation pulse presented by the second prior waveform and the energy spectrum information of the scintillation pulse presented by the parameter-determined fourth expression function is within a preset error, it indicates that the fourth expression function obtained by solving based on the fourth sampled data after correction using the second initial correction data matches the prior information of the scintillation pulse, and the processing effect of the fourth expression function is good. At this time, the fourth determination module 950 can determine the second initial correction data as the third target correction data. Conversely, it indicates that the fourth expression function obtained by solving based on the fourth sampled data after correction using the second initial correction data does not match the prior information of the scintillation pulse, and the processing effect of the fourth expression function is poor. In this case, it indicates that the correction of the fourth sampled data does not meet expectations and needs to be adjusted to improve the processing effect of the fourth expression function. The fourth conversion module 930 can add or subtract the second initial correction data to obtain new correction data. The fourth calculation module 940 and the fourth determination module 950 can repeat the operation based on the new correction data to determine whether the fourth expression function obtained by solving the fourth sampled data after correction with the new correction data matches the prior information of the scintillation pulse. If they match, that is, the processing effect of the fourth expression function based on the new correction data is good, then the new correction data can be determined as the third target correction data. If they do not match, the new correction data can be further adjusted. The fourth conversion module 930, the fourth calculation module 940, and the fourth determination module 950 will repeat the operation again until the difference between the energy spectrum information of the scintillation pulse presented by the second prior waveform and the parameter-determined fourth expression function is within the preset error range.

[0267] The fourth data processing system 900 may further include a second transmission module 960. The second transmission module 960 may transmit the fourth expression function, the fourth objective function, the second objective correction data, the second function transformation formula, and the second benchmark transformation correction formula.

[0268] For example, data can be transmitted between devices or between different modules within a device. For illustrative purposes, assuming the third data processing system 800 executing processing method 300 is a chip board and the fourth data processing system 900 executing processing method 400 is a server, the second transmission module 960 can transmit the unsolved fourth expression function to the chip board as the fourth expression function in processing method 300. Similarly, the second transmission module 960 can also transmit the second target correction data to the chip board as the third correction data in processing method 100. Furthermore, the second transmission module 960 can transmit the second function transformation formula and the second reference transformation correction formula to the chip board as the first parameter transformation formula and the first preset reference transformation correction formula. Assuming that both the third data processing system 800 and the fourth data processing system 900 executing processing methods 300 and 400 are servers, the second transmission module 960 can transmit the aforementioned data between the processing modules executing the two processing methods.

[0269] For further descriptions of the above modules, please refer to the flowchart section of this application, for example... ​ .

[0270] It should be understood that ​ The systems and modules shown can be implemented in various ways. For example, in some embodiments, the systems and modules can be implemented by hardware, software, or a combination of both. The hardware portion can be implemented using dedicated logic; the software portion can be stored in memory and executed by an appropriate instruction execution system, such as a microprocessor or dedicated-design hardware. Those skilled in the art will understand that the methods and systems described above can be implemented using computer-executable instructions and / or included in processor control code, for example, on a carrier medium such as a disk, CD, or DVD-ROM, a programmable memory such as read-only memory (firmware), or a data carrier such as an optical or electronic signal carrier. The systems and modules of this specification can be implemented not only by hardware circuits such as very large-scale integrated circuits or gate arrays, semiconductors such as logic chips, transistors, or programmable hardware devices such as field-programmable gate arrays, programmable logic devices, etc., but also by software, for example, executed by various types of processors, or by a combination of the aforementioned hardware circuits and software (e.g., firmware).

[0271] It should be noted that the above description of the modules is for convenience only and should not be construed as limiting this specification to the embodiments described. It is understood that those skilled in the art, after understanding the principles of the system, may arbitrarily combine the modules or construct subsystems connected to other modules without departing from these principles. For example, modules may share a single storage module, or each module may have its own separate storage module. Such modifications are all within the scope of this specification.

[0272] The scintillation pulse processing method provided in this application can be specifically used in photon detection and is applicable to various fields, such as medical imaging technology, high-energy physics, lidar, autonomous driving, precision analysis, and optical communication. In a specific example, the scintillation pulse processing method, apparatus, detector, electronic device, and storage medium provided in this application can be applied to positron emission tomography (PET). In a PET system, photon data can be acquired using the scheme described in the embodiments of this application, followed by image reconstruction. In other specific examples of this application, the scintillation pulse processing method, apparatus, detector, electronic device, and storage medium provided in this application can be applied to various digital devices, such as CT equipment, MRI equipment, radiation detection equipment, oil exploration equipment, low-light detection equipment, SPECT equipment, security inspection equipment, gamma cameras, X-ray equipment, DR equipment, and other devices utilizing the principle of high-energy ray conversion, as well as other photoelectric conversion application devices, or a combination of the above devices.

[0273] The basic concepts have been described herein. It is obvious that the detailed disclosure above is merely illustrative and does not constitute a limitation of this specification. Although not explicitly stated herein, various modifications, improvements, and corrections may be made to this specification by those skilled in the art. Such modifications, improvements, and corrections are suggested in this specification and therefore remain within the spirit and scope of the exemplary embodiments described herein.

[0274] Furthermore, this specification uses specific terms to describe embodiments thereof. For example, "an embodiment," "one embodiment," and / or "some embodiments" refer to a particular feature, structure, or characteristic associated with at least one embodiment of this specification. Therefore, it should be emphasized and noted that references to "an embodiment," "one embodiment," or "an alternative embodiment" in different locations throughout this specification do not necessarily refer to the same embodiment. Moreover, certain features, structures, or characteristics in one or more embodiments of this specification can be appropriately combined.

[0275] Furthermore, those skilled in the art will understand that various aspects of this specification can be described and illustrated in several patentable ways or situations, including any new and useful combination of processes, machines, products, or substances, or any new and useful improvements thereof. Accordingly, various aspects of this specification can be implemented entirely by hardware, entirely by software (including firmware, resident software, microcode, etc.), or by a combination of hardware and software. All of the above hardware or software may be referred to as a “data block,” “module,” “engine,” “unit,” “component,” or “system.” Furthermore, various aspects of this specification may be represented as a computer product located on one or more computer-readable media, including computer-readable program code.

[0276] Computer storage media may contain a propagated data signal containing computer program code, for example, on baseband or as part of a carrier wave. This propagated signal may take various forms, including electromagnetic, optical, and suitable combinations thereof. Computer storage media can be any computer-readable medium other than a computer-readable storage medium, which can be connected to an instruction execution system, apparatus, or device to enable communication, propagation, or transmission of a program for use. The program code located on the computer storage medium can be propagated through any suitable medium, including radio, cable, fiber optic cable, RF, or similar media, or any combination of the above media.

[0277] The computer program code required for the operation of each part of this manual can be written in any one or more programming languages, including object-oriented programming languages ​​such as Java, Scala, Smalltalk, Eiffel, JADE, Emerald, C++, C#, VB.NET, Python, etc.; conventional procedural programming languages ​​such as C, Visual Basic, Fortran 3003, Perl, COBOL 3002, PHP, ABAP; dynamic programming languages ​​such as Python, Ruby, and Groovy; or other programming languages. This program code can run entirely on the user's computer, or as a standalone software package on the user's computer, or partially on the user's computer and partially on a remote computer, or entirely on a remote computer or server. In the latter case, the remote computer can be connected to the user's computer through any network, such as a local area network (LAN) or wide area network (WAN), or connected to an external computer (e.g., via the Internet), or in a cloud computing environment, or used as a service such as Software as a Service (SaaS).

[0278] Furthermore, unless expressly stated in the claims, the order of processing elements and sequences, the use of numbers and letters, or other names described in this specification are not intended to limit the order of the processes and methods described herein. Although various examples have been discussed in the foregoing disclosure of some embodiments of the invention that are currently considered useful, it should be understood that such details are for illustrative purposes only, and the appended claims are not limited to the disclosed embodiments; rather, the claims are intended to cover all modifications and equivalent combinations that conform to the spirit and scope of the embodiments described herein. For example, while the system components described above can be implemented using hardware devices, they can also be implemented solely using software solutions, such as installing the described system on existing servers or mobile devices.

[0279] Similarly, it should be noted that, in order to simplify the description disclosed herein and thus aid in the understanding of one or more embodiments of the invention, the foregoing description of embodiments in this specification may sometimes combine multiple features into a single embodiment, drawing, or description thereof. However, this method of disclosure does not imply that the subject matter of this specification requires more features than those mentioned in the claims. In fact, the embodiments contain fewer features than all the features of a single embodiment disclosed above.

[0280] In some embodiments, numbers describing the quantity of components and attributes are used. It should be understood that such numbers used in the description of embodiments are modified in some examples with the terms "approximately," "approximately," or "generally." Unless otherwise stated, "approximately," "approximately," or "generally" indicates that the numbers are allowed to vary by ±20%. Accordingly, in some embodiments, the numerical parameters used in the specification and claims are approximate values, which may be changed depending on the characteristics required by individual embodiments. In some embodiments, numerical parameters should take into account specified significant digits and employ a general method of digit reservation. Although the numerical ranges and parameters used to confirm their breadth of range in some embodiments of this specification are approximate values, in specific embodiments, such values ​​are set as precisely as feasible.

[0281] For each patent, patent application, patent application publication, and other material, such as articles, books, specifications, publications, and documents, referenced in this specification, the entire contents of which are incorporated herein by reference. This excludes historical application documents that are inconsistent with or conflict with the content of this specification, as well as documents that limit the broadest scope of the claims in this specification (currently or subsequently appended to this specification). It should be noted that in the event of any inconsistency or conflict between the descriptions, definitions, and / or terminology used in the supplementary materials to this specification and the content of this specification, the descriptions, definitions, and / or terminology used in this specification shall prevail.

[0282] Finally, it should be understood that the embodiments described in this specification are merely illustrative of the principles of the embodiments described herein. Other variations may also fall within the scope of this specification. Therefore, alternative configurations of the embodiments described herein are intended to be illustrative rather than limiting, and are considered consistent with the teachings of this specification. Accordingly, the embodiments described herein are not limited to those explicitly introduced and described herein.

Claims

1. A method of digitizing a scintillation pulse, comprising: The digital method comprises: obtaining a first expression function corresponding to the scintillation pulse, the first expression function comprising one or more first to-be-fitted parameters; digitally sampling the scintillation pulse to obtain first sampling data; converting the first expression function into a first target function, and converting the first sampling data into first target data, wherein the first target function comprises one or more first target parameters corresponding to the first to-be-fitted parameters respectively; determining the first target parameters based on the first target data by using a non-iterative solving method; determining the first to-be-fitted parameters based on the first target parameters; obtaining first effective information carried by the scintillation pulse based on the first expression function determined based on the parameters. The conversion of the first sampling data comprises: obtaining first correction data, the first correction data comprising a first measurement value correction value and a first time correction value; performing measurement value correction and time correction on the first sampling data after reference transformation based on the first measurement value correction value and the first time correction value to obtain the first target data.

2. The method of digitizing a scintillation pulse according to claim 1, wherein, The first sampling data comprises measurement value-time pairs, and the measurement value at least comprises a voltage measurement value, a current measurement value, an energy measurement value or a sound intensity measurement value.

3. The method of digitizing a scintillation pulse according to claim 1, wherein, The first expression function is a measurement value-time function, and the conversion of the first expression function into the first target function comprises: obtaining first standard reference data, the first standard reference data comprising a first measurement value reference value and a first time reference value; performing measurement value reference transformation and time reference transformation on the first expression function based on the first measurement value reference and the first time reference to obtain the first target function.

4. The method of digitizing a scintillation pulse according to claim 3, wherein, The first time reference value is determined based on a first sampling time in the first sampling data, and the first measurement value reference value is determined based on a measurement value corresponding to the first sampling time in the first sampling data or a property of the scintillation pulse.

5. The method of digitizing a scintillation pulse according to claim 3, wherein, The conversion of the first sampling data into the first target data comprises: performing measurement value reference transformation and time reference transformation on the first sampling data based on the first standard reference data.

6. The method of digitizing a scintillation pulse of claim 1, wherein, The first correction data is determined based on prior information of the scintillation pulse.

7. The method of digitizing a scintillating pulse according to claim 1, wherein, The determination of the first to-be-fitted parameters based on the first target parameters comprises: obtaining a first conversion relationship between the first to-be-fitted parameters and the first target parameters in the conversion of the first expression function into the first target function; determining the first to-be-fitted parameters based on the first target parameters determined by using the first conversion relationship.

8. The method of digitizing a scintillation pulse of claim 1, wherein, The first effective information at least comprises a first energy value of the scintillation pulse, and the first energy value of the scintillation pulse is obtained by: integrating the first expression function determined based on the parameters to obtain the first energy value.

9. The method of digitizing a scintillation pulse of claim 1, wherein, The non-iterative solving method comprises a direct solving method.

10. The method of digitizing a scintillation pulse of claim 1, wherein, The first expression function is determined based on prior information of the scintillation pulse, and the prior information is obtained based on a digital oscilloscope.

11. The method of digitizing a scintillation pulse of claim 1, wherein, The digital sampling of the scintillation pulse comprises performing multi-threshold sampling or ADC sampling on the scintillation pulse.

12. A method of digitizing a scintillation pulse, comprising: The digital method comprises: obtaining a first prior waveform corresponding to the scintillation pulse and a second expression function, wherein the second expression function comprises one or more second to-be-fitted parameters; obtaining second sampling data obtained by digitally sampling the scintillation pulse; selecting first initial correction data, and converting at least the second sampling data into second target data based on the first initial correction data; solving the second to-be-fitted parameters based on the second target data; comparing whether a difference between the first prior waveform and spectral information of the scintillation pulse presented by the second expression function determined by the parameters is within a preset error; if yes, determining that the first initial correction data is first target correction data; if no, adjusting the first initial correction data, and repeating the solving of the second expression function and the comparison operation until the difference between the first prior waveform and the spectral information of the scintillation pulse presented by the second expression function determined by the parameters is within the preset error wherein the first initial correction data comprises a first initial quantity value correction value and a first initial time correction value; and the conversion of at least the second sampling data into the second target data based on the first initial correction data comprises: obtaining second standard reference data comprising a second quantity value reference value and a second time reference value; performing quantity value reference transformation and time reference transformation on the second sampling data based on the second quantity value reference value and the second time reference value; performing quantity value correction and time correction on the second sampling data after the reference transformation based on the first initial quantity value correction value and the first initial time correction value, to obtain the second target data.

13. The method of digitizing a scintillation pulse according to claim 12, wherein, The first prior waveform and the second expression function are determined based on prior information of the scintillation pulse, and the prior information is obtained based on a digital oscilloscope.

14. The method of digitizing a scintillation pulse of claim 12, wherein, The second time reference value is determined based on a first sampling time in the second sampling data, and the second quantity value reference value is determined based on a quantity value corresponding to the first sampling time in the second sampling data or a property of the scintillation pulse.

15. The method of digitizing a scintillation pulse of claim 12, wherein, The solving of the second to-be-fitted parameters based on the second target data comprises: fitting the second expression function based on the second target data to determine the second to-be-fitted parameters.

16. The method of digitizing a scintillation pulse of claim 12, wherein, The solving of the second to-be-fitted parameters based on the second target data comprises: converting the second expression function into a second target function, wherein the second target function comprises one or more second target parameters corresponding to the one or more second to-be-fitted parameters respectively; solving the second target parameters based on the second target data; determining the second to-be-fitted parameters based on the determined second target parameters to determine the second expression function.

17. The method of digitizing a scintillation pulse according to claim 16, wherein, The conversion of the second expression function into the second target function comprises: reference transforming the second expression function based on the second standard reference data to obtain the second target function.

18. The method of digitizing a scintillation pulse of claim 16, wherein, The determination of the second to-be-fitted parameters based on the second target parameters comprises: obtaining a second conversion relationship between the second to-be-fitted parameters and the second target parameters in the process of converting the second expression function into the second target function; Based on the second conversion relationship, the second target parameter determined is used to determine the second to-be-fitted parameter.

19. The method of digitizing a scintillating pulse of claim 12, wherein, The second sampling data is determined based on a multi-threshold sampling operation or an ADC sampling operation performed on the scintillation pulse.

20. A method of digitizing a scintillation pulse, comprising: The digitization method comprises: A third expression function corresponding to the scintillation pulse is obtained, and a third target function is obtained, wherein the third target function is obtained by converting the third expression function based on a first parameter transformation formula, the third expression function comprises one or more third to-be-fitted parameters, and the third target function comprises one or more third target parameters corresponding to the third to-be-fitted parameters respectively; The scintillation pulse is digitally sampled to obtain third sampling data; The third sampling data is converted based on a first preset reference transformation correction formula to obtain third target data; Based on the third target data, the third target parameter is determined by using a non-iterative solving method; Based on the third target function determined by the parameter, the third to-be-fitted parameter is determined by using the first parameter transformation formula; Based on the third expression function determined by the parameter, the second effective information carried by the scintillation pulse is obtained. The first preset reference transformation correction formula is used for reference transformation of third standard reference data, and the third standard reference data comprises a third metrological value reference value and a third time reference value. The third time reference value is determined based on a first sampling time in the third sampling data, and the third metrological value reference value is determined based on a metrological value corresponding to the first sampling time in the third sampling data or a property of the scintillation pulse.

21. The method of digitizing a scintillation pulse according to claim 20, wherein, The third sampling data comprises a metrological value-time pair, and the metrological value comprises at least a voltage metrological value, a current metrological value, an energy metrological value or a sound intensity metrological value.

22. The method of digitizing a scintillation pulse of claim 20, wherein, The first preset reference transformation correction formula is used for correction of third correction data, and the third correction data comprises a third metrological value correction value and a third time correction value.

23. The method of digitizing a scintillation pulse according to claim 22, wherein, The third correction data is determined based on at least prior information of the scintillation pulse.

24. The method of digitizing a scintillation pulse of claim 20, wherein, The second effective information comprises at least a second energy value of the scintillation pulse, and the second energy value of the scintillation pulse is obtained by: Integrating the third expression function determined by the parameter to obtain the second energy value.

25. The method of digitizing a scintillation pulse of claim 20, wherein, The non-iterative solving method comprises a direct solving method.

26. The method of digitizing a scintillation pulse of claim 20, wherein, The third expression function is determined based on prior information of the scintillation pulse, and the prior information is obtained based on a digital oscilloscope.

27. The method of digitizing a scintillation pulse of claim 20, wherein, The digital sampling of the scintillation pulse comprises: A multi-threshold sampling operation or an ADC sampling operation is performed on the scintillation pulse.

28. A method of digitizing a scintillation pulse, comprising: The digitization method comprises: A second prior waveform corresponding to the scintillation pulse and a fourth expression function are obtained, wherein the fourth expression function comprises one or more fourth to-be-fitted parameters; Fourth sampling data obtained by digitally sampling the scintillation pulse is obtained; Second initial correction data is selected, and a second preset reference transformation correction formula and a second parameter transformation formula are obtained; Based on the second initial correction data, the fourth sampling data, the second preset reference transformation correction formula and the second parameter transformation formula, the fourth to-be-fitted parameter is solved; comparing whether a difference between the second prior waveform and spectral information of the scintillation pulse presented by the fourth expression function determined by parameters is within a preset error; if yes, determining the second initial correction data as second target correction data; if no, adjusting the second initial correction data, and repeating the solving of the fourth expression function and the comparing operation until the difference between the second prior waveform and spectral information of the scintillation pulse presented by the fourth expression function determined by parameters is within a preset error; the second initial correction data includes a second initial metrology value correction value and a second initial time correction value.

29. The method of digitizing a scintillation pulse of claim 28, wherein, The second prior waveform and the fourth expression function are determined based on prior information of the scintillation pulse, and the prior information is acquired based on a digital oscilloscope.

30. The method of digitizing a scintillation pulse of claim 28, wherein, The solving of the fourth to-be-fitted parameter includes: performing reference transformation and correction on the fourth sampling data based on a second preset reference transformation correction formula and the second initial correction data to obtain fourth target data; solving a fourth target function corresponding to the scintillation pulse based on the fourth target data, the fourth target function including one or more fourth target parameters corresponding to the fourth to-be-fitted parameter respectively; transforming the fourth target function into the fourth expression function based on the second parameter transformation formula to determine the fourth to-be-fitted parameter based on the fourth target parameter.

31. A scintillation pulse digitizer comprising: The digitizing device includes: a first obtaining module configured to obtain a first expression function corresponding to the scintillation pulse, the first expression function including one or more first to-be-fitted parameters; a first sampling module configured to perform digital sampling on the scintillation pulse to obtain first sampling data; a first converting module configured to transform the first expression function into a first target function and transform the first sampling data into first target data, wherein the first target function includes one or more first target parameters corresponding to the to-be-fitted parameter respectively; a first calculating module configured to determine the first target parameter based on the first target data by using a non-iterative solving method; a first determining module configured to determine the first to-be-fitted parameter based on the first target parameter; a first extracting module configured to obtain first effective information carried by the scintillation pulse based on the first expression function determined by parameters; The first converting module is further configured to: obtain first correction data, the first correction data including a first metrology value correction value and a first time correction value; perform metrology value correction and time correction on the first sampling data after reference transformation based on the first metrology value correction value and the first time correction value to obtain the first target data.

32. The scintillation pulse digitizing device of claim 31, wherein, The first sampling data includes a metrology value-time pair, and the metrology value at least includes a voltage metrology value, a current metrology value, an energy metrology value, or a sound intensity metrology value.

33. The scintillation pulse digitizing device of claim 31, wherein, The first expression function is a metrology value-time function, and the first converting module is configured to: obtain first standard reference data, the first standard reference data including a first metrology value reference value and a first time reference value; The first expression function is subjected to metrological value reference conversion and time reference conversion based on the first metrological value reference value and the first time reference value, so as to obtain the first target function.

34. The scintillation pulse digitizing device of claim 31, wherein, The first correction data is determined based on at least prior information of the scintillation pulse.

35. The device of claim 31, wherein, The first determining module is configured to: obtain a first conversion relationship between the first to-be-fitted parameter and the first target parameter in the conversion of the first expression function into the first target function; determine the first to-be-fitted parameter based on the determined first target parameter based on the first conversion relationship.

36. The scintillation pulse digitizing device of claim 31, wherein, The first effective information at least includes a first energy value of the scintillation pulse, and the first extracting module is configured to: integrate the first expression function with the determined parameter, so as to obtain the first energy value.

37. The scintillation pulse digitizing device of claim 31, wherein, The first calculating module determines the first target parameter by using a direct solution method.

38. The device of claim 31, wherein, The first expression function is determined based on prior information of the scintillation pulse, and the prior information is obtained based on digital oscilloscope acquisition.

39. The device of claim 31, wherein, The first sampling module digitizes and samples the scintillation pulse by using a multi-threshold sampling method or an ADC sampling method.

40. A scintillation pulse digitizer comprising: The digitizing device comprises: a second obtaining module configured to obtain a first prior waveform corresponding to the scintillation pulse and a second expression function, wherein the second expression function includes one or more second to-be-fitted parameters; a second sampling module configured to obtain second sampling data obtained by digitizing and sampling the scintillation pulse; a second converting module configured to select first initial correction data and convert at least the second sampling data into second target data based on the first initial correction data; a second calculating module configured to solve the second to-be-fitted parameter based on the second target data; a second determining module configured to compare whether a difference between the first prior waveform and energy spectrum information of the scintillation pulse presented by the second expression function with the determined parameter is within a preset error; if yes, the first initial correction data is determined as first target correction data; if no, the first initial correction data is adjusted, and the solving of the second expression function and the comparison operation are repeated until the difference between the first prior waveform and the energy spectrum information of the scintillation pulse presented by the second expression function with the determined parameter is within the preset error; wherein the first initial correction data includes a first initial metrological value correction value and a first initial time correction value; and the second converting module is configured to: obtain second standard reference data including a second metrological value reference value and a second time reference value; subject the second sampling data to metrological value reference conversion and time reference conversion based on the second metrological value reference value and the second time reference value; subject the second sampling data after the reference conversion to metrological value correction and time correction based on the first initial metrological value correction value and the first initial time correction value, so as to obtain the second target data.

41. The scintillation pulse digitizing device of claim 40, wherein, The first prior waveform and the second expression function are determined based on prior information of the scintillation pulse, and the prior information is obtained based on digital oscilloscope acquisition.

42. The scintillation pulse digitizing device of claim 40, wherein, The second time reference value is determined based on a first sampling time in the second sampling data, and the second quantity reference value is determined based on a quantity corresponding to the first sampling time in the second sampling data or a property of the scintillation pulse.

43. The scintillation pulse digitizing device of claim 42, wherein, The second calculation module is configured to: iteratively fit the second expression function based on the second target data to determine the second to-be-fitted parameter.

44. The device of claim 42, wherein, The second calculation module is configured to: convert the second expression function into a second target function, the second target function including one or more second target parameters corresponding to the one or more second to-be-fitted parameters respectively; solve the second target parameters based on the second target data; determine the second to-be-fitted parameter based on the determined second target parameters to determine the second expression function.

45. The scintillation pulse digitizing device of claim 44, wherein, The second calculation module is configured to: perform reference transformation on the second expression function based on the second standard reference data to obtain the second target function.

46. The scintillation pulse digitizing device of claim 45, wherein, The second calculation module is configured to: obtain a second conversion relationship between the second to-be-fitted parameter and the second target parameter in the process of converting the second expression function into the second target function; determine the second to-be-fitted parameter based on the second conversion relationship and the determined second target parameters.

47. The device of claim 40, wherein, The second sampling module determines the second sampling data by a multi-threshold sampling method or an ADC sampling method.

48. A scintillation pulse digitizer comprising: The digitizing device includes: a third obtaining module configured to obtain a third expression function corresponding to the scintillation pulse and a third target function, the third target function being obtained by converting the third expression function based on a first parameter transformation formula, the third expression function including one or more third to-be-fitted parameters, and the third target function including one or more third target parameters corresponding to the one or more third to-be-fitted parameters respectively; a third sampling module configured to perform digital sampling on the scintillation pulse to obtain third sampling data; a third conversion module configured to convert the third sampling data based on a first preset reference transformation correction formula to obtain third target data; a third calculation module configured to determine the third target parameters based on the third target data by using a non-iterative solving method; a third determination module configured to determine the third to-be-fitted parameters based on the parameter-determined third target function and the first parameter transformation formula; a second extraction module configured to obtain second effective information carried by the scintillation pulse based on the parameter-determined third expression function. The first preset reference transformation correction formula is used to perform reference transformation on third standard reference data, and the third standard reference data includes a third quantity reference value and a third time reference value. The third time reference value is determined based on a first sampling time in the third sampling data, and the third quantity reference value is determined based on a quantity corresponding to the first sampling time in the third sampling data or a property of the scintillation pulse.

49. The scintillation pulse digitizing device of claim 48, wherein, The third sampling data includes a quantity-time pair, and the quantity includes at least a voltage quantity, a current quantity, an energy quantity, or an acoustic intensity quantity.

50. The scintillation pulse digitizing device of claim 48, wherein, The first preset reference transformation correction formula is used to correct third correction data, and the third correction data includes a third metrological value correction value and a third time correction value.

51. The device of claim 48, wherein, The second effective information at least includes a second energy value of the scintillation pulse, and the second extraction module is used to: Integrate the third expression function with the determined parameters to obtain the second energy value.

52. The device of claim 48, wherein, The third adoption module adopts a multi-threshold sampling method or an ADC sampling method to digitally sample the scintillation pulse.

53. A scintillation pulse digitizing device, comprising: The digital device includes: A fourth acquisition module is configured to acquire a second prior waveform corresponding to the scintillation pulse and a fourth expression function, wherein the fourth expression function includes one or more fourth to-be-fitted parameters; A fourth sampling module is configured to acquire fourth sampling data obtained by digitally sampling the scintillation pulse; A fourth conversion module is configured to select second initial correction data, acquire a second preset reference transformation correction formula, and acquire a second parameter transformation formula; A fourth calculation module is configured to solve the fourth to-be-fitted parameters based on the second initial correction data, the fourth sampling data, the second preset reference transformation correction formula, and the second parameter transformation formula; A fourth determination module is configured to compare whether a difference between the second prior waveform and energy spectrum information of the scintillation pulse presented by the fourth expression function with the determined parameters is within a preset error; If yes, the second initial correction data is determined as second target correction data; If no, the second initial correction data is adjusted, and the solving of the fourth expression function and the comparison operation are repeated until the difference between the second prior waveform and the energy spectrum information of the scintillation pulse presented by the fourth expression function with the determined parameters is within the preset error; The second initial correction data includes a second initial metrological value correction value and a second initial time correction value.

54. The scintillation pulse digitizing device of claim 53, wherein, The second prior waveform and the fourth expression function are determined based on prior information of the scintillation pulse, and the prior information is acquired based on a digital oscilloscope.

55. The scintillation pulse digitizing device of claim 54, wherein, The fourth calculation module is configured to: Perform reference transformation and correction on the fourth sampling data based on the second preset reference transformation correction formula and the second initial correction data to obtain fourth target data; Solve a fourth target function corresponding to the scintillation pulse based on the fourth target data, wherein the fourth target function includes one or more fourth target parameters corresponding to the fourth to-be-fitted parameters respectively; Convert the fourth target function into the fourth expression function based on the second parameter transformation formula to determine the one or more fourth to-be-fitted parameters based on the one or more fourth target parameters.

56. A digitizing device, comprising: The digital device of the scintillation pulse includes: The digital device of the scintillation pulse includes:

57. A digitizer device, comprising: A memory, a processor, and a computer program stored on the memory and executable on the processor, wherein the computer program is executed by the processor to implement the digital method in any one of claims 1-30. The storage medium stores a computer program, and the computer program is executed by the processor to implement the digital method in any one of claims 1-30.

58. A computer-readable storage medium, characterized in that, ​

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